APT35GP120B
APT35GP120BG
*G Denotes RoHS Compliant, Pb Free Terminal Finish.
POWER MOS 7 IGBT
®
TO-247
The POWER MOS 7® IGBT is a new generation of high voltage power IGBTs.
Using Punch Through Technology this IGBT is ideal for many high frequency,
high voltage switching applications and has been optimized for high frequency
switchmode power supplies.
• Low Conduction Loss
• 100 kHz operation @ 800V, 14A
• Low Gate Charge
• 50 kHz operation @ 800V, 25A
• Ultrafast Tail Current shutoff
• RBSOA rated
MAXIMUM RATINGS
Symbol
G
C
E
G
E
All Ratings: TC = 25°C unless otherwise specified.
Parameter
APT35GP120B(G)
VCES
Collector-Emitter Voltage
1200
VGE
Gate-Emitter Voltage
±20
Gate-Emitter Voltage Transient
±30
VGEM
I C1
Continuous Collector Current @ TC = 25°C
96
I C2
Continuous Collector Current @ TC = 110°C
46
I CM
Pulsed Collector Current
RBSOA
PD
TJ,TSTG
TL
C
1
UNIT
Volts
Amps
140
@ TC = 25°C
Reverse Bias Safe Operating Area @ TJ = 150°C
140A @ 960V
Watts
543
Total Power Dissipation
-55 to 150
Operating and Storage Junction Temperature Range
Max. Lead Temp. for Soldering: 0.063" from Case for 10 Sec.
°C
300
STATIC ELECTRICAL CHARACTERISTICS
Characteristic / Test Conditions
VGE(TH)
Gate Threshold Voltage
VCE(ON)
I CES
I GES
4.5
6
3.3
3.9
UNIT
1200
3
(VCE = VGE, I C = 1mA, Tj = 25°C)
Collector-Emitter On Voltage (VGE = 15V, I C = 35A, Tj = 25°C)
Collector-Emitter On Voltage (VGE = 15V, I C = 35A, Tj = 125°C)
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 25°C)
MAX
3
2
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 125°C)
Volts
250
2
Gate-Emitter Leakage Current (VGE = ±20V)
±100
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
Microsemi Website - http://www.microsemi.com
µA
2500
nA
12-2006
Collector-Emitter Breakdown Voltage (VGE = 0V, I C = 250µA)
TYP
Rev E
BVCES
MIN
050-7406
Symbol
APT35GP120B(G)
DYNAMIC CHARACTERISTICS
Symbol
Characteristic
Test Conditions
3240
VGE = 0V, VCE = 25V
248
Reverse Transfer Capacitance
f = 1 MHz
31
Gate-to-Emitter Plateau Voltage
Gate Charge
VGE = 15V
7.5
150
VCE = 600V
21
I C = 35A
62
Input Capacitance
Coes
Output Capacitance
Cres
VGEP
Qge
Qgc
RBSOA
TYP
Capacitance
Cies
Qg
MIN
Total Gate Charge
3
Gate-Emitter Charge
Gate-Collector ("Miller ") Charge
Reverse Bias Safe Operating Area
TJ = 150°C, R G = 5Ω, VGE =
MAX
UNIT
pF
V
nC
140
A
15V, L = 100µH,VCE = 960V
td(on)
tr
td(off)
tf
Turn-on Delay Time
Current Rise Time
4
Eoff
Turn-off Switching Energy
td(on)
Turn-on Delay Time
Eon2
Eoff
1305
16
VGE = 15V
147
20
I C = 35A
Current Fall Time
5
ns
75
R G = 5Ω
4
Turn-on Switching Energy (Diode)
µJ
680
Inductive Switching (125°C)
VCC = 600V
Turn-off Delay Time
Turn-off Switching Energy
750
TJ = +25°C
6
Current Rise Time
Turn-on Switching Energy
ns
40
R G = 5Ω
Turn-on Switching Energy (Diode) 5
Eon1
94
20
I C = 35A
Eon2
tf
VGE = 15V
Current Fall Time
Turn-on Switching Energy
td(off)
16
Turn-off Delay Time
Eon1
tr
Inductive Switching (25°C)
VCC = 600V
750
TJ = +125°C
2132
6
µJ
1744
THERMAL AND MECHANICAL CHARACTERISTICS
Symbol
Characteristic
MIN
TYP
MAX
RΘJC
Junction to Case (IGBT)
.23
RΘJC
Junction to Case (DIODE)
N/A
Package Weight
5.90
WT
UNIT
°C/W
gm
1 Repetitive Rating: Pulse width limited by maximum junction temperature.
2 For Combi devices, Ices includes both IGBT and FRED leakages
3 See MIL-STD-750 Method 3471.
4 Eon1 is the clamped inductive turn-on-energy of the IGBT only, without the effect of a commutating diode reverse recovery current
adding to the IGBT turn-on loss. (See Figure 24.)
5 Eon2 is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching
loss. (See Figures 21, 22.)
6 Eoff is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 23.)
050-7406
Rev E
12-2006
Microsemi reserves the right to change, without notice, the specifications and information contained herein.
TYPICAL PERFORMANCE CURVES
VGE = 15V.
250µs PULSE TEST
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