APTGF50DSK120T3G

APTGF50DSK120T3G

  • 厂商:

    ACTEL(微芯科技)

  • 封装:

    Module

  • 描述:

    IGBT 模块 NPT 双路降压斩波器 1200 V 70 A 312 W 底座安装 SP3

  • 数据手册
  • 价格&库存
APTGF50DSK120T3G 数据手册
APTGF50DSK120T3G Dual Buck chopper NPT IGBT Power Module 13 14 Q1 Application  AC and DC motor control  Switched Mode Power Supplies Q2 18 11 19 10 22 7 23 8 CR1 Features  Non Punch Through (NPT) Fast IGBT - Low voltage drop - Low tail current - Switching frequency up to 50 kHz - Soft recovery parallel diodes - Low diode VF - Low leakage current - RBSOA and SCSOA rated - Symmetrical design  Kelvin emitter for easy drive  Very low stray inductance  High level of integration  Internal thermistor for temperature monitoring CR2 29 30 31 15 32 16 R1 28 27 26 25 20 19 18 23 22 29 16 30 15 31 14 32 13 2 3 4 7 8 VCES = 1200V IC = 50A @ Tc = 80°C 10 11 12 All multiple inputs and outputs must be shorted together Example: 13/14 ; 29/30 ; 22/23 … Benefits  Outstanding performance at high frequency operation  Direct mounting to heatsink (isolated package)  Low junction to case thermal resistance  Solderable terminals both for power and signal for easy PCB mounting  Low profile  Easy paralleling due to positive TC of VCEsat  Each leg can be easily paralleled to achieve a single buck of twice the current capability  RoHS compliant Absolute maximum ratings IC ICM VGE PD RBSOA Parameter Collector - Emitter Breakdown Voltage Continuous Collector Current Pulsed Collector Current Gate – Emitter Voltage Maximum Power Dissipation Reverse Bias Safe Operating Area Tc = 25°C Tc = 80°C Tc = 25°C Tc = 25°C Tj = 150°C Max ratings 1200 70 50 150 ±20 312 100A @ 1200V Unit V A V W These Devices are sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed. See application note APT0502 on www.microsemi.com www.microsemi.com 1-8 APTGF50DSK120T3G – Rev 1 October, 2012 Symbol VCES APTGF50DSK120T3G All ratings @ Tj = 25°C unless otherwise specified Electrical Characteristics Symbol Characteristic ICES Zero Gate Voltage Collector Current VCE(sat) Collector Emitter saturation Voltage VGE(th) IGES Gate Threshold Voltage Gate – Emitter Leakage Current Test Conditions Tj = 25°C VGE = 0V VCE = 1200V Tj = 125°C Tj = 25°C VGE =15V IC = 50A Tj = 125°C VGE = VCE, IC = 1 mA VGE = 20 V, VCE = 0V Min Test Conditions VGE = 0V VCE = 25V f = 1MHz Min Typ 3.2 4.0 4.5 Max 250 500 3.7 Unit 6.5 100 V nA Max Unit µA V Dynamic Characteristics Symbol Cies Coes Cres Qg Qge Qgc Td(on) Tr Characteristic Input Capacitance Output Capacitance Reverse Transfer Capacitance Total gate Charge Gate – Emitter Charge Gate – Collector Charge Turn-on Delay Time VGS = 15V VBus = 600V IC = 50A Inductive Switching (25°C) VGE = 15V VBus = 600V IC = 50A RG = 5  Inductive Switching (125°C) VGE = ±15V VBus = 600V IC = 50A RG = 5  VGE = ±15V Tj = 125°C VBus = 600V IC = 50A Tj = 125°C RG = 5  VGE ≤15V ; VBus = 900V tp ≤ 10µs ; Tj = 125°C Rise Time Td(off) Turn-off Delay Time Tf Td(on) Tr Fall Time Turn-on Delay Time Rise Time Td(off) Turn-off Delay Time Tf Fall Time Eon Turn-on Switching Energy Eoff Turn-off Switching Energy Isc Short Circuit data Typ 3450 330 220 330 35 200 35 pF nC 65 ns 320 30 35 65 ns 360 40 6.9 mJ 3.05 300 A Chopper diode ratings and characteristics IRM IF VF Maximum Reverse Leakage Current Test Conditions VR=1200V DC Forward Current Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge IF = 60A IF = 120A IF = 60A IF = 60A VR = 800V di/dt =200A/µs Min 1200 Tj = 25°C Tj = 125°C Tc = 80°C Typ 100 500 Tj = 125°C 60 2.5 3 1.8 Tj = 25°C 265 Tj = 125°C Tj = 25°C Tj = 125°C 350 560 2890 www.microsemi.com Max Unit V µA A 3 V ns nC 2-8 APTGF50DSK120T3G – Rev 1 October, 2012 Symbol Characteristic VRRM Maximum Peak Repetitive Reverse Voltage APTGF50DSK120T3G Thermal and package characteristics Symbol Characteristic RthJC VISOL TJ TSTG TC Torque Wt Min Junction to Case Thermal Resistance RMS Isolation Voltage, any terminal to case t =1 min, 50/60Hz Operating junction temperature range Storage Temperature Range Operating Case Temperature Mounting torque Package Weight Typ IGBT Diode To heatsink M4 4000 -40 -40 -40 2 Max 0.4 0.9 Unit °C/W V 150 125 100 3 110 °C N.m g Temperature sensor NTC (see application note APT0406 on www.microsemi.com for more information). Symbol R25 ∆R25/R25 B25/85 ∆B/B Characteristic Resistance @ 25°C Min T25 = 298.15 K TC=100°C RT  R25 Typ 50 5 3952 4 Max Unit k % K % T: Thermistor temperature   1 1  RT: Thermistor value at T exp  B25 / 85    T T  25   See application note 1901 - Mounting Instructions for SP3 Power Modules on www.microsemi.com www.microsemi.com 3-8 APTGF50DSK120T3G – Rev 1 October, 2012 SP3 Package outline (dimensions in mm) APTGF50DSK120T3G Typical IGBT Performance Curve Output characteristics (VGE=15V) 120 TJ=25°C TJ=125°C 80 40 30 TJ=25°C 20 TJ=125°C 10 2 4 6 VCE, Collector to Emitter Voltage (V) 0 8 1 2 3 VCE, Collector to Emitter Voltage (V) Gate Charge 250µs Pulse Test < 0.5% Duty cycle 200 VGE, Gate to Emitter Voltage (V) Transfer Characteristics 250 TJ=25°C 150 100 TJ=125°C 50 TJ=25°C 0 0 4 8 12 VGE, Gate to Emitter Voltage (V) 4 18 VCE=240V IC = 50A TJ = 25°C 16 14 VCE=600V 12 10 VCE=960V 8 6 4 2 0 0 16 50 100 150 200 250 300 350 Gate Charge (nC) Breakdown Voltage vs Junction Temp. DC Collector Current vs Case Temperature 70 Ic, DC Collector Current (A) 1.20 1.15 1.10 1.05 1.00 0.95 0.90 0.85 0.80 60 50 40 30 20 10 0 25 50 75 100 125 25 TJ, Junction Temperature (°C) www.microsemi.com 50 75 100 125 TC, Case Temperature (°C) 150 4-8 APTGF50DSK120T3G – Rev 1 October, 2012 0 Ic, Collector Current (A) 250µs Pulse Test < 0.5% Duty cycle 0 0 Collector to Emitter Breakdown Voltage (Normalized) Output Characteristics (VGE=10V) 40 250µs Pulse Test < 0.5% Duty cycle Ic, Collector Current (A) Ic, Collector Current (A) 160 APTGF50DSK120T3G Turn-Off Delay Time vs Collector Current td(off), Turn-Off Delay Time (ns) td(on), Turn-On Delay Time (ns) Turn-On Delay Time vs Collector Current 45 VCE = 600V RG = 5Ω 40 VGE = 15V 35 30 25 0 25 50 75 100 400 VGE=15V, TJ=125°C 350 300 VGE=15V, TJ=25°C 250 VCE = 600V RG = 5Ω 200 125 0 ICE, Collector to Emitter Current (A) Current Rise Time vs Collector Current 50 75 100 125 Current Fall Time vs Collector Current 50 180 VCE = 600V RG = 5Ω 140 tf, Fall Time (ns) tr, Rise Time (ns) 25 ICE, Collector to Emitter Current (A) 100 VGE=15V 60 TJ = 125°C 40 30 TJ = 25°C VCE = 600V, VGE = 15V, RG = 5Ω 20 20 125 VCE = 600V RG = 5Ω 24 TJ=125°C, VGE=15V 20 16 12 TJ=25°C, VGE=15V 8 4 0 25 50 75 100 ICE, Collector to Emitter Current (A) 12 Eon, 50A 10 Eoff, 50A 8 6 Eon, 25A 4 2 6 Eoff, 25A 0 TJ = 125°C 4 TJ = 25°C 2 0 0 Switching Energy Losses (mJ) 14 VCE = 600V VGE = 15V RG = 5Ω 25 50 75 100 ICE, Collector to Emitter Current (A) 125 Switching Energy Losses vs Junction Temp. 8 VCE = 600V VGE = 15V TJ= 125°C 125 8 125 Switching Energy Losses vs Gate Resistance 18 16 25 50 75 100 ICE, Collector to Emitter Current (A) Turn-Off Energy Loss vs Collector Current Turn-On Energy Loss vs Collector Current 28 0 Switching Energy Losses (mJ) 0 VCE = 600V VGE = 15V RG = 5Ω 6 Eon, 50A 4 Eoff, 50A Eon, 25A 2 Eoff, 25A 0 0 10 20 30 40 Gate Resistance (Ohms) 50 25 www.microsemi.com 50 75 100 TJ, Junction Temperature (°C) 125 5-8 APTGF50DSK120T3G – Rev 1 October, 2012 25 50 75 100 ICE, Collector to Emitter Current (A) Eoff, Turn-off Energy Loss (mJ) Eon, Turn-On Energy Loss (mJ) 0 APTGF50DSK120T3G IC, Collector Current (A) Cies 1000 Coes 0 10 20 30 40 VCE, Collector to Emitter Voltage (V) 80 60 40 20 0 50 0 400 800 1200 VCE, Collector to Emitter Voltage (V) Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration 0.45 0.4 100 Cres 100 0.9 0.35 0.3 0.25 0.7 0.5 0.2 0.3 0.15 0.1 0.05 0.1 Single Pulse 0.05 0 0.00001 0.0001 0.001 0.01 0.1 1 10 Rectangular Pulse Duration (Seconds) Operating Frequency vs Collector Current 120 100 80 ZVS VCE = 600V D = 50% RG = 5Ω TJ = 125°C TC= 75°C 60 ZCS 40 20 Hard switching 0 10 www.microsemi.com 20 30 40 50 IC, Collector Current (A) 60 6-8 APTGF50DSK120T3G – Rev 1 October, 2012 Thermal Impedance (°C/W) Reverse Bias Safe Operating Area 120 Fmax, Operating Frequency (kHz) C, Capacitance (pF) Capacitance vs Collector to Emitter Voltage 10000 APTGF50DSK120T3G Typical diode Performance Curve Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration Thermal Impedance (°C/W) 1 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.05 Single Pulse 0 0.00001 0.0001 0.001 0.01 0.1 1 10 Rectangular Pulse Duration (Seconds) Forward Current vs Forward Voltage Trr vs. Current Rate of Charge trr, Reverse Recovery Time (ns) 125 100 TJ=125°C 75 50 TJ=25°C 25 0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 400 TJ=125°C VR=800V 300 120 A 200 60 A 30 A 100 0 0 3.5 200 TJ=125°C VR=800V 6 60 A 4 30 A 3 2 1 0 0 200 400 600 800 -diF/dt (A/µs) 1000 1200 800 1000 1200 50 TJ=125°C VR=800V 40 120 A 60 A 30 A 30 20 10 0 0 200 400 600 800 1000 1200 -diF/dt (A/µs) Capacitance vs. Reverse Voltage 400 Max. Average Forward Current vs. Case Temp. 100 Duty Cycle = 0.5 TJ=175°C 80 300 IF(AV) (A) C, Capacitance (pF) 120 A 5 600 IRRM vs. Current Rate of Charge QRR vs. Current Rate Charge 7 400 -diF/dt (A/µs) IRRM, Reverse Recovery Current (A) QRR, Reverse Recovery Charge (µC) VF, Anode to Cathode Voltage (V) 200 100 60 40 20 0 0 1 10 100 VR, Reverse Voltage (V) 1000 25 50 75 100 125 150 175 Case Temperature (ºC) www.microsemi.com 7-8 APTGF50DSK120T3G – Rev 1 October, 2012 IF, Forward Current (A) 150 APTGF50DSK120T3G DISCLAIMER The information contained in the document (unless it is publicly available on the Web without access restrictions) is PROPRIETARY AND CONFIDENTIAL information of Microsemi and cannot be copied, published, uploaded, posted, transmitted, distributed or disclosed or used without the express duly signed written consent of Microsemi. If the recipient of this document has entered into a disclosure agreement with Microsemi, then the terms of such Agreement will also apply. This document and the information contained herein may not be modified, by any person other than authorized personnel of Microsemi. No license under any patent, copyright, trade secret or other intellectual property right is granted to or conferred upon you by disclosure or delivery of the information, either expressly, by implication, inducement, estoppels or otherwise. Any license under such intellectual property rights must be approved by Microsemi in writing signed by an officer of Microsemi. Microsemi reserves the right to change the configuration, functionality and performance of its products at anytime without any notice. This product has been subject to limited testing and should not be used in conjunction with lifesupport or other mission-critical equipment or applications. Microsemi assumes no liability whatsoever, and Microsemi disclaims any express or implied warranty, relating to sale and/or use of Microsemi products including liability or warranties relating to fitness for a particular purpose, merchantability, or infringement of any patent, copyright or other intellectual property right. Any performance specifications believed to be reliable but are not verified and customer or user must conduct and complete all performance and other testing of this product as well as any user or customers final application. User or customer shall not rely on any data and performance specifications or parameters provided by Microsemi. It is the customer’s and user’s responsibility to independently determine suitability of any Microsemi product and to test and verify the same. The information contained herein is provided “AS IS, WHERE IS” and with all faults, and the entire risk associated with such information is entirely with the User. Microsemi specifically disclaims any liability of any kind including for consequential, incidental and punitive damages as well as lost profit. The product is subject to other terms and conditions which can be located on the web at http://www.microsemi.com/legal/tnc.asp Life Support Application Seller's Products are not designed, intended, or authorized for use as components in systems intended for space, aviation, surgical implant into the body, in other applications intended to support or sustain life, or for any other application in which the failure of the Seller's Product could create a situation where personal injury, death or property damage or loss may occur (collectively "Life Support Applications"). Buyer agrees not to use Products in any Life Support Applications and to the extent it does it shall conduct extensive testing of the Product in such applications and further agrees to indemnify and hold Seller, and its officers, employees, subsidiaries, affiliates, agents, sales representatives and distributors harmless against all claims, costs, damages and expenses, and attorneys' fees and costs arising, directly or directly, out of any claims of personal injury, death, damage or otherwise associated with the use of the goods in Life Support Applications, even if such claim includes allegations that Seller was negligent regarding the design or manufacture of the goods. www.microsemi.com 8-8 APTGF50DSK120T3G – Rev 1 October, 2012 Buyer must notify Seller in writing before using Seller’s Products in Life Support Applications. Seller will study with Buyer alternative solutions to meet Buyer application specification based on Sellers sales conditions applicable for the new proposed specific part.
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APTGF50DSK120T3G
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  • 50+332.4490250+42.65697

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