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MCP3201T-BI/SN

MCP3201T-BI/SN

  • 厂商:

    ACTEL(微芯科技)

  • 封装:

    SOIC8

  • 描述:

    IC ADC 12BIT SAR 8SOIC

  • 数据手册
  • 价格&库存
MCP3201T-BI/SN 数据手册
MCP3201 2.7V 12-Bit A/D Converter with SPI Serial Interface Features Description • • • • • • • • • • • • • • The Microchip Technology Inc. MCP3201 device is a successive approximation 12-bit Analog-to-Digital (A/D) Converter with on-board sample and hold circuitry. The device provides a single pseudo-differential input. Differential Nonlinearity (DNL) is specified at ±1 LSB, and Integral Nonlinearity (INL) is offered in ±1 LSB (MCP3201-B) and ±2 LSB (MCP3201-C) versions. Communication with the device is done using a simple serial interface compatible with the SPI protocol. The device is capable of sample rates of up to 100 ksps at a clock rate of 1.6 MHz. The MCP3201 device operates over a broad voltage range (2.7V5.5V). Low-current design permits operation with typical standby and active currents of only 500 nA and 300 µA, respectively. The device is offered in 8-pin MSOP, PDIP, TSSOP and 150 mil SOIC packages. 12-Bit Resolution ±1 LSB max DNL ±1 LSB max INL (MCP3201-B) ±2 LSB max INL (MCP3201-C) On-chip Sample and Hold SPI Serial Interface (modes 0,0 and 1,1) Single Supply Operation: 2.7V - 5.5V 100 ksps Maximum Sampling Rate at VDD = 5V 50 ksps Maximum Sampling Rate at VDD = 2.7V Low-Power CMOS Technology 500 nA Typical Standby Current, 2 µA Maximum 400 µA Maximum Active Current at 5V Industrial Temp Range: -40°C to +85°C 8-pin MSOP, PDIP, SOIC and TSSOP Packages Package Types Applications Sensor Interface Process Control Data Acquisition Battery Operated Systems MSOP, PDIP, SOIC, TSSOP Functional Block Diagram VDD VREF VSS VREF 1 IN+ 2 IN– 3 VSS 4 MCP3201 • • • • 8 VDD 7 CLK 6 DOUT 5 CS/SHDN DAC Comparator IN+ IN- 12-Bit SAR Sample and Hold Control Logic CS/SHDN CLK  1998-2011 Microchip Technology Inc. Shift Register DOUT DS21290F-page 1 MCP3201 NOTES: DS21290F-page 2  1998-2011 Microchip Technology Inc. MCP3201 1.0 ELECTRICAL CHARACTERISTICS 1.1 Maximum Ratings† †Notice: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. VDD...................................................................................7.0V All inputs and outputs w.r.t. VSS ................ -0.6V to VDD +0.6V Storage temperature .....................................-65°C to +150°C Ambient temp. with power applied ................-65°C to +125°C ESD protection on all pins (HBM) .................................> 4 kV ELECTRICAL CHARACTERISTICS Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and fCLK = 16*fSAMPLE, unless otherwise noted. Parameter Sym Min Typ Max Units tCONV — — 12 clock cycles Conditions Conversion Rate: Conversion Time 1.5 Analog Input Sample Time tSAMPLE Throughput Rate fSAMPLE — — Integral Nonlinearity INL — — Differential Nonlinearity DNL — clock cycles 100 50 ksps ksps VDD = VREF = 5V VDD = VREF = 2.7V ±0.75 ±1 ±1 ±2 LSB LSB MCP3201-B MCP3201-C ±0.5 ±1 LSB No missing codes over temperature DC Accuracy: Resolution 12 bits Offset Error — ±1.25 ±3 LSB Gain Error — ±1.25 ±5 LSB Dynamic Performance: THD — -82 — dB VIN = 0.1V to 4.9V@1 kHz Signal to Noise and Distortion (SINAD) SINAD — 72 — dB VIN = 0.1V to 4.9V@1 kHz Spurious Free Dynamic Range SFDR — 86 — dB VIN = 0.1V to 4.9V@1 kHz Total Harmonic Distortion Reference Input: Voltage Range 0.25 — VDD V Note 2 Current Drain — — 100 .001 150 3 µA µA CS = VDD = 5V — VREF+IN- V Analog Inputs: Input Voltage Range (IN+) IN+ IN- Input Voltage Range (IN-) IN- VSS-100 Leakage Current VSS+100 mV — 0.001 ±1 µA Switch Resistance RSS — 1K — W See Figure 4-1 Sample Capacitor CSAMPLE — 20 — pF See Figure 4-1 High Level Input Voltage VIH 0.7 VDD — — V Low Level Input Voltage VIL — — 0.3 VDD V Digital Input/Output: Data Coding Format Note 1: 2: 3: Straight Binary This parameter is established by characterization and not 100% tested. See graph that relates linearity performance to VREF level. Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance, especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information.  1998-2011 Microchip Technology Inc. DS21290F-page 3 MCP3201 ELECTRICAL CHARACTERISTICS (CONTINUED) Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and fCLK = 16*fSAMPLE, unless otherwise noted. Parameter Sym Min Typ Max Units Conditions High Level Output Voltage VOH 4.1 — — V IOH = -1 mA, VDD = 4.5V Low Level Output Voltage VOL — — 0.4 V IOL = 1 mA, VDD = 4.5V Input Leakage Current ILI -10 — 10 µA VIN = VSS or VDD Output Leakage Current ILO -10 — 10 µA VOUT = VSS or VDD CIN, COUT — — 10 pF VDD = 5.0V (Note 1) TA = +25°C, f = 1 MHz fCLK — — — — 1.6 0.8 MHz MHz Clock High Time tHI 312 — — ns Clock Low Time tLO 312 — — ns Pin Capacitance (all inputs/outputs) Timing Parameters: Clock Frequency CS Fall To First Rising CLK Edge VDD = 5V (Note 3) VDD = 2.7V (Note 3) tSUCS 100 — — ns CLK Fall To Output Data Valid tDO — — 200 ns See Test Circuits, Figure 1-2 CLK Fall To Output Enable tEN — — 200 ns See Test Circuits, Figure 1-2 CS Rise To Output Disable tDIS — — 100 ns See Test Circuits, Figure 1-2 (Note 1) CS Disable Time tCSH 625 — — ns DOUT Rise Time tR — — 100 ns See Test Circuits, Figure 1-2 (Note 1) DOUT Fall Time tF — — 100 ns See Test Circuits, Figure 1-2 (Note 1) Operating Voltage VDD 2.7 — 5.5 V Operating Current IDD — — 300 210 400 — µA µA VDD = 5.0V, DOUT unloaded VDD = 2.7V, DOUT unloaded Standby Current IDDS — 0.5 2 µA CS = VDD = 5.0V Power Requirements: Note 1: 2: 3: This parameter is established by characterization and not 100% tested. See graph that relates linearity performance to VREF level. Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance, especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information. TEMPERATURE CHARACTERISTICS Electrical Specifications: Unless otherwise indicated, VDD = +2.7V to +5.5V, VSS = GND. Parameters Sym Min Typ Max Units Specified Temperature Range TA -40 — +85 °C Operating Temperature Range TA -40 — +85 °C Storage Temperature Range TA -65 — +150 °C Conditions Temperature Ranges Thermal Package Resistances Thermal Resistance, 8L-MSOP JA — 211 — °C/W Thermal Resistance, 8L-PDIP JA — 89.5 — °C/W Thermal Resistance, 8L-SOIC JA — 149.5 — °C/W Thermal Resistance, 8L-TSSOP JA — 139 — °C/W DS21290F-page 4  1998-2011 Microchip Technology Inc. MCP3201 tCSH CS tSUCS tHI tLO CLK tEN HI-Z DOUT FIGURE 1-1: tDO NULL BIT tR tDIS tF MSB OUT HI-Z LSB Serial Timing. Load circuit for tDIS and tEN Load circuit for tR, tF, tDO 1.4V Test Point VDD 3 kΩ Test Point DOUT 3 kΩ DOUT 30 pF CL = 30 pF Voltage Waveforms for tR, tF VOH VOL DOUT tF tR tDIS Waveform 2 VDD /2 tEN Waveform tDIS Waveform 1 VSS Voltage Waveforms for tEN CS 1 CLK 2 3 4 B9 DOUT tEN Voltage Waveforms for tDO Voltage Waveforms for tDIS CS CLK tDO DOUT VIH DOUT Waveform 1* 90% tDIS DOUT Waveform 2† 10% * Waveform 1 is for an output with internal conditions such that the output is high, unless disabled by the output control. † Waveform 2 is for an output with internal conditions such that the output is low, unless disabled by the output control. FIGURE 1-2: Test Circuits.  1998-2011 Microchip Technology Inc. DS21290F-page 5 MCP3201 NOTES: DS21290F-page 6  1998-2011 Microchip Technology Inc. MCP3201 2.0 TYPICAL PERFORMANCE CHARACTERISTICS The graphs provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range. Note: 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 2.0 Positive INL INL (LSB) 1.0 Negative INL Positive INL 0.5 0.0 -0.5 Negative INL -1.0 -1.5 -2.0 0 25 50 75 100 Sample Rate (ksps) FIGURE 2-1: vs. Sample Rate. 125 150 Integral Nonlinearity (INL) 0 2.0 1.5 1.5 0.0 -0.5 40 60 Sample Rate (ksps) Negative INL 100 Positive INL 0.5 0.0 -0.5 -1.0 -1.0 -1.5 -1.5 -2.0 Negative INL -2.0 0 1 2 3 4 5 0.0 0.5 1.0 VREF (V) FIGURE 2-2: vs. VREF. Integral Nonlinearity (INL) 0.8 0.6 0.4 INL (LSB) 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code FIGURE 2-3: Integral Nonlinearity (INL) vs. Code (Representative Part).  1998-2011 Microchip Technology Inc. 1.5 VREF (V) 2.0 2.5 3.0 FIGURE 2-5: Integral Nonlinearity (INL) vs. VREF (VDD = 2.7V). 1.0 INL (LSB) 80 VDD = 2.7V FSAMPLE = 50 ksps 1.0 Positive INL 0.5 20 FIGURE 2-4: Integral Nonlinearity (INL) vs. Sample Rate (VDD = 2.7V). 2.0 1.0 INL (LSB) VDD = VREF = 2.7V 1.5 INL (LSB) INL (LSB) Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 VDD = VREF = 2.7V FSAMPLE = 50 ksps 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code FIGURE 2-6: Integral Nonlinearity (INL) vs. Code (Representative Part, VDD = 2.7V). DS21290F-page 7 MCP3201 Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. 1.0 1.0 0.6 0.6 0.4 0.4 0.2 0.0 Negative INL -0.2 VDD = VREF = 2.7V FSAMPLE = 50 ksps 0.8 Positive INL INL (LSB) INL (LSB) 0.8 -0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.6 -0.8 -0.8 Negative INL -1.0 -1.0 -50 -25 0 25 50 75 -50 100 -25 Integral Nonlinearity (INL) 25 50 75 100 FIGURE 2-10: Integral Nonlinearity (INL) vs. Temperature (VDD = 2.7V). 2.0 VDD = VREF = 2.7V 1.5 1.0 Positive DNL DNL (LSB) DNL (LSB) 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 0 Temperature (°C) Temperature (°C) FIGURE 2-7: vs. Temperature. Negative DNL Positive DNL 0.5 0.0 -0.5 Negative DNL -1.0 -1.5 -2.0 0 25 50 75 100 Sample Rate (ksps) 125 150 0 FIGURE 2-8: Differential Nonlinearity (DNL) vs. Sample Rate. 20 40 60 Sample Rate (ksps) 80 100 FIGURE 2-11: Differential Nonlinearity (DNL) vs. Sample Rate (VDD = 2.7V). 3.0 3.0 2.0 2.0 VDD = 2.7V FSAMPLE = 50 ksps Positive DNL 1.0 DNL (LSB) DNL (LSB) Positive INL Positive DNL 0.0 Negative DNL -1.0 1.0 0.0 -1.0 Negative DNL -2.0 -3.0 -2.0 0 1 2 3 4 VREF (V) FIGURE 2-9: (DNL) vs. VREF. DS21290F-page 8 Differential Nonlinearity 5 0.0 0.5 1.0 1.5 2.0 2.5 3.0 VREF(V) FIGURE 2-12: Differential Nonlinearity (DNL) vs. VREF (VDD = 2.7V).  1998-2011 Microchip Technology Inc. MCP3201 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 DNL (LSB) DNL (LSB) Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 FIGURE 2-16: Differential Nonlinearity (DNL) vs. Code (Representative Part, VDD = 2.7V). Positive DNL DNL (LSB) DNL (LSB) FIGURE 2-13: Differential Nonlinearity (DNL) vs. Code (Representative Part). Negative DNL -50 -25 0 25 50 Temperature (°C) 75 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 VDD = 2.7V FSAMPLE = 50ksps Positive DNL Negative DNL -50 100 FIGURE 2-14: Differential Nonlinearity (DNL) vs. Temperature. -25 0 25 50 Temperature (°C) 75 100 FIGURE 2-17: Differential Nonlinearity (DNL) vs. Temperature (VDD = 2.7V). 20 5 18 Offset Error (LSB) 4 Gain Error (LSB) 1.0 VDD = VREF = 2.7V 0.8 F SAMPLE = 50 ksps 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code VDD = 2.7V 3 FSAMPLE = 50 ksps 2 1 0 VDD = 5V -1 FSAMPLE = 100 ksps -2 16 VDD = 5V 14 FSAMPLE = 100 ksps 12 10 8 VDD = 2.7V 6 FSAMPLE = 50ksps 4 2 0 0 1 2 3 4 5 0 VREF(V) FIGURE 2-15: Gain Error vs. VREF.  1998-2011 Microchip Technology Inc. 1 2 3 4 5 VREF (V) FIGURE 2-18: Offset Error vs. VREF. DS21290F-page 9 MCP3201 Offset Error (LSB) 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.8 -1.0 VDD = VREF = 2.7V FSAMPLE = 50 ksps VDD = VREF = 5V FSAMPLE = 100 ksps -50 -25 FIGURE 2-19: 0 25 50 Temperature (°C) 75 Gain Error vs. Temperature. 100 90 80 70 60 50 40 30 20 10 0 SNR (dB) VDD = VREF = 2.7V FSAMPLE = 50 ksps 10 Input Frequency (kHz) -25 100 90 80 70 60 50 40 30 20 10 0 0 25 50 Temperature (°C) 75 100 Offset Error vs. VDD = VREF = 5V FSAMPLE = 100 ksps VDD = VREF = 2.7V FSAMPLE = 50 ksps 1 10 Input Frequency (kHz) 100 FIGURE 2-23: Signal-to-Noise and Distortion (SINAD) vs. Input Frequency. 80 VDD = VREF = 5V FSAMPLE = 100 ksps 70 SINAD (dB) THD (dB) 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 VDD = VREF = 2.7V FSAMPLE = 50 ksps FIGURE 2-22: Temperature. 100 FIGURE 2-20: Signal-to-Noise Ratio (SNR) vs. Input Frequency. VDD = VREF = 5V FSAMPLE = 100 ksps -50 VDD = VREF = 5V FSAMPLE = 100 ksps 1 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 100 SINAD (dB) Gain Error (LSB) Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. VDD = VREF = 2.7V FSAMPLE = 50 ksps 60 50 VDD = VREF = 2.7V FSAMPLE = 50 ksps 40 30 20 10 VDD = VREF = 5V, FSAMPLE = 100 ksps 0 1 10 Input Frequency (kHz) 100 FIGURE 2-21: Total Harmonic Distortion (THD) vs. Input Frequency. DS21290F-page 10 -40 -35 -30 -25 -20 -15 -10 Input Signal Level (dB) -5 0 FIGURE 2-24: Signal-to-Noise and Distortion (SINAD) vs. Input Signal Level.  1998-2011 Microchip Technology Inc. MCP3201 12.0 12.00 11.75 11.50 11.25 11.00 10.75 10.50 10.25 10.00 9.75 9.50 9.25 9.00 VDD = 5V 11.5 FSAMPLE = 100 ksps 11.0 VDD = VREF = 5V FSAMPLE =100 ksps VDD = VREF = 2.7V FSAMPLE = 50 ksps ENOB (rms) ENOB (rms) Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. 10.5 10.0 9.5 9.0 VDD = 2.7V 8.5 FSAMPLE = 50 ksps 8.0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 1 10 VREF (V) FIGURE 2-25: (ENOB) vs. VREF. Input Frequency (kHz) Effective Number of Bits FIGURE 2-28: Effective Number of Bits (ENOB) vs. Input Frequency. Power Supply Rejection (dB) 0 SFDR (dB) VDD = VREF = 5V, FSAMPLE = 100 ksps VDD = VREF = 2.7V FSAMPLE = 50 ksps 1 10 Input Frequency (kHz) FIGURE 2-26: Spurious Free Dynamic Range (SFDR) vs. Input Frequency. 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 -130 VDD = VREF = 5V FSAMPLE = 100 ksps FINPUT = 9.985kHz 4096 points 0 10000 20000 30000 Frequency (Hz) 40000 50000 FIGURE 2-27: Frequency Spectrum of 10 kHz input (Representative Part).  1998-2011 Microchip Technology Inc. -10 -20 -30 -40 -50 -60 -70 -80 1 100 10 100 1000 Ripple Frequency (kHz) 10000 FIGURE 2-29: Power Supply Rejection (PSR) vs. Ripple Frequency. Amplitude (dB) 100 90 80 70 60 50 40 30 20 10 0 Amplitude (dB) 100 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 -130 VDD = VREF = 2.7V FSAMPLE = 50 ksps FINPUT = 998.76 Hz 4096 points 0 5000 10000 15000 Frequency (Hz) 20000 25000 FIGURE 2-30: Frequency Spectrum of 1 kHz input (Representative Part, VDD = 2.7V). DS21290F-page 11 MCP3201 500 450 400 350 300 250 200 150 100 50 0 100 90 80 70 60 50 40 30 20 10 0 VREF = VDD All points at FCLK = 1.6 MHz, except at VREF = VDD = 2.5V, FCLK = 800 kHz VREF = VDD All points at FCLK = 1.6 MHz, except at VREF = VDD = 2.5V, FCLK = 800 kHz IREF (µA) IDD (µA) Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 2.0 2.5 3.0 3.5 V DD (V) FIGURE 2-31: IDD vs. VDD. FIGURE 2-34: 5.5 6.0 IREF vs. VDD. VDD = VREF = 5V 90 350 80 VDD = VREF = 5V 70 IREF (µA) 300 IDD (µA) 5.0 100 400 250 200 VDD = VREF = 2.7V 150 60 50 40 VDD = V REF = 2.7V 30 100 20 50 10 0 0 10 100 1000 Clock Frequency (kHz) FIGURE 2-32: 300 VDD = VREF = 2.7V FCLK = 800 kHz 50 0 -50 -25 FIGURE 2-33: DS21290F-page 12 0 25 50 Temperature (°C) 1000 10000 IREF vs. Clock Frequency. VDD = VREF = 5V FCLK = 1.6 MHz IREF (µA) 200 100 FIGURE 2-35: 100 90 80 70 60 50 40 30 20 10 0 250 150 100 Clock Frequency (kHz) IDD vs. Clock Frequency. VDD = VREF = 5V FCLK = 1.6 MHz 350 10 10000 400 IDD (µA) 4.0 4.5 VDD (V) 75 IDD vs. Temperature. 100 VDD = VREF = 2.7V FCLK = 800 kHz -50 -25 FIGURE 2-36: 0 25 50 Temperature (°C) 75 100 IREF vs. Temperature.  1998-2011 Microchip Technology Inc. MCP3201 Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. 70 Analog Input Leakage (nA) 80 VREF = CS = VDD IDDS (pA) 60 50 40 30 20 10 0 2.0 2.5 3.0 FIGURE 2-37: 3.5 4.0 4.5 VDD (V) 5.0 5.5 6.0 IDDS vs. VDD. 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 VDD = VREF = 5V FCLK = 1.6 MHz -50 -25 0 25 50 Temperature (°C) 75 100 FIGURE 2-39: Analog Input Leakage Current vs. Temperature. 100.00 VDD = VREF = CS = 5V I DDS (nA) 10.00 1.00 0.10 0.01 -50 FIGURE 2-38: -25 0 25 50 Temperature (°C) 75 100 IDDS vs. Temperature.  1998-2011 Microchip Technology Inc. DS21290F-page 13 MCP3201 NOTES: DS21290F-page 14  1998-2011 Microchip Technology Inc. MCP3201 3.0 PIN DESCRIPTIONS The descriptions of the pins are listed in Table 3-1. Additional descriptions of the device pins follows. TABLE 3-1: PIN FUNCTION TABLE MCP3201 MSOP, PDIP, SOIC, TSSOP Symbol 1 VREF 2 IN+ Positive Analog Input 3 IN- Negative Analog Input 4 VSS Ground 5 CS/SHDN 3.1 Chip Select/Shutdown Input 6 DOUT Serial Data Out CLK Serial Clock 8 VDD +2.7V to 5.5V Power Supply Positive Analog Input (IN+) Negative Analog Input (IN-) Negative analog input. This input can vary ±100 mV from VSS. 3.3 Reference Voltage Input 7 Positive analog input. This input can vary from IN- to VREF + IN-. 3.2 Description Chip Select/Shutdown (CS/SHDN) The CS/SHDN pin is used to initiate communication with the device when pulled low and will end a conversion and put the device in low power standby when pulled high. The CS/SHDN pin must be pulled high between conversions.  1998-2011 Microchip Technology Inc. 3.4 Serial Clock (CLK) The SPI clock pin is used to initiate a conversion and to clock out each bit of the conversion as it takes place. See Section 6.2 “Maintaining Minimum Clock Speed” for constraints on clock speed. 3.5 Serial Data Output (DOUT) The SPI serial data output pin is used to shift out the results of the A/D conversion. Data will always change on the falling edge of each clock as the conversion takes place. DS21290F-page 15 MCP3201 NOTES: DS21290F-page 16  1998-2011 Microchip Technology Inc. MCP3201 4.0 DEVICE OPERATION 4.2 Reference Input The MCP3201 A/D Converter employs a conventional SAR architecture. With this architecture, a sample is acquired on an internal sample/hold capacitor for 1.5 clock cycles starting on the first rising edge of the serial clock after CS has been pulled low. Following this sample time, the input switch of the converter opens and the device uses the collected charge on the internal sample and hold capacitor to produce a serial 12-bit digital output code. Conversion rates of 100 ksps are possible on the MCP3201 device. See Section 6.2 “Maintaining Minimum Clock Speed” for information on minimum clock rates. Communication with the device is done using a 3-wire SPI-compatible interface. The reference input (VREF) determines the analog input voltage range and the LSB size, as shown below. 4.1 EQUATION 4-2: Analog Inputs The MCP3201 device provides a single pseudo-differential input. The IN+ input can range from IN- to VREF (VREF + IN-). The IN- input is limited to ±100 mV from the VSS rail. The IN- input can be used to cancel small signal common-mode noise which is present on both the IN+ and IN- inputs. For the A/D Converter to meet specification, the charge holding capacitor (CSAMPLE) must be given enough time to acquire a 12-bit accurate voltage level during the 1.5 clock cycle sampling period. The analog input model is shown in Figure 4-1. In this diagram, it is shown that the source impedance (RS) adds to the internal sampling switch (RSS) impedance, directly affecting the time that is required to charge the capacitor (CSAMPLE). Consequently, a larger source impedance increases the offset, gain, and integral linearity errors of the conversion. EQUATION 4-1: V REF LSB Size = ------------4096 As the reference input is reduced, the LSB size is reduced accordingly. The theoretical digital output code produced by the A/D Converter is a function of the analog input signal and the reference input as shown below. 4096*VIN Digital Output Code = ------------------------VREF Where: VIN = Analog Input Voltage = V(IN+) - V(IN-) VREF = Reference Voltage When using an external voltage reference device, the system designer should always refer to the manufacturer’s recommendations for circuit layout. Any instability in the operation of the reference device will have a direct effect on the operation of the A/D Converter. Ideally, the impedance of the signal source should be near zero. This is achievable with an operational amplifier such as the MCP601, which has a closed loop output impedance of tens of ohms. The adverse affects of higher source impedances are shown in Figure 4-2. If the voltage level of IN+ is equal to or less than IN-, the resultant code will be 000h. If the voltage at IN+ is equal to or greater than {[VREF + (IN-)] - 1 LSB}, then the output code will be FFFh. If the voltage level at IN- is more than 1 LSB below VSS, then the voltage level at the IN+ input will have to go below VSS to see the 000h output code. Conversely, if IN- is more than 1 LSB above VSS, then the FFFh code will not be seen unless the IN+ input level goes above VREF level.  1998-2011 Microchip Technology Inc. DS21290F-page 17 MCP3201 VDD RSS VT = 0.6V CHx CPIN 7 pF VA Sampling Switch VT = 0.6V SS ILEAKAGE ±1 nA RS = 1 k CSAMPLE = DAC capacitance = 20 pF VSS Legend: VA RSS CHx CPIN VT ILEAKAGE SS RS CSAMPLE = = = = = = = = = FIGURE 4-1: Signal Source Source Impedance Input Channel Pad Input Pin Capacitance Threshold Voltage Leakage Current At The Pin Due To Various Junctions Sampling Switch Sampling Switch Resistor Sample/hold Capacitance Analog Input Model. Clock Frequency (MHz) 1.8 1.6 VDD = VREF = 5V 1.4 1.2 1.0 0.8 0.6 VDD = VREF = 2.7V 0.4 0.2 0.0 100 1000 10000 Input Resistance (Ohms) FIGURE 4-2: Maximum Clock Frequency vs. Input Resistance (RS) to maintain less than a 0.1 LSB deviation in INL from nominal conditions. DS21290F-page 18  1998-2011 Microchip Technology Inc. MCP3201 5.0 SERIAL COMMUNICATIONS Communication with the device is done using a standard SPI-compatible serial interface. Initiating communication with the MCP3201 device begins with the CS going low. If the device was powered up with the CS pin low, it must be brought high and back low to initiate communication. The device will begin to sample the analog input on the first rising edge after CS goes low. The sample period will end in the falling edge of the second clock, at which time the device will output a low null bit. The next 12 clocks will output the result of the conversion with MSB first, as shown in Figure 5-1. Data is always output from the device on the falling edge of the clock. If all 12 data bits have been transmitted and the device continues to receive clocks while the CS is held low, the device will output the conversion result LSB first, as shown in Figure 5-2. If more clocks are provided to the device while CS is still low (after the LSB first data has been transmitted), the device will clock out zeros indefinitely. tCYC TCSH CS POWER DOWN TSUCS CLK TSAMPLE HI-Z DOUT tDATA** tCONV NULL B11 B10 B9 BIT B8 B7 B6 B5 B4 B3 B2 B1 B0* HI-Z NULL B11 B10 B9 BIT B8 * After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output LSB first data, followed by zeros indefinitely. See Figure 5-2 below. ** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance node, leaving the CLK running to clock out the LSB-first data or zeros. FIGURE 5-1: Communication with MCP3201 device using MSB first Format. tCYC tCSH CS tSUCS POWER DOWN CLK tSAMPLE DOUT HI-Z tCONV tDATA** NULL B11B10B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 B1 B2 B3 B4 B5 B6 B7 B8 B9 B10B11* BIT HI-Z * After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely. ** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance node, leaving the CLK running to clock out the LSB-first data or zeros. FIGURE 5-2: Communication with MCP3201 device using LSB first Format.  1998-2011 Microchip Technology Inc. DS21290F-page 19 MCP3201 NOTES: DS21290F-page 20  1998-2011 Microchip Technology Inc. MCP3201 6.0 APPLICATIONS INFORMATION 6.1 Using the MCP3201 Device with Microcontroller SPI Ports device, the microcontroller’s receive buffer will contain two unknown bits (the output is at high-impedance for the first two clocks), the null bit and the highest order five bits of the conversion. After the second eight clocks have been sent to the device, the MCU receive register will contain the lowest-order seven bits and the B1 bit repeated as the A/D Converter has begun to shift out LSB first data with the extra clock. Typical procedure would then call for the lower-order byte of data to be shifted right by one bit to remove the extra B1 bit. The B7 bit is then transferred from the high-order byte to the lower-order byte, and then the higher-order byte is shifted one bit to the right as well. Easier manipulation of the converted data can be obtained by using this method. With most microcontroller SPI ports, it is required to clock out eight bits at a time. If this is the case, it will be necessary to provide more clocks than are required for the MCP3201. As an example, Figure 6-1 and Figure 6-2 show how the MCP3201 device can be interfaced to a microcontroller with a standard SPI port. Since the MCP3201 always clocks data out on the falling edge of clock, the MCU SPI port must be configured to match this operation. SPI Mode 0,0 (clock idles low) and SPI Mode 1,1 (clock idles high) are both compatible with the MCP3201. Figure 6-1 depicts the operation shown in SPI Mode 0,0, which requires that the CLK from the microcontroller idles in the ‘low’ state. As shown in the diagram, the MSB is clocked out of the A/D Converter on the falling edge of the third clock pulse. After the first eight clocks have been sent to the Figure 6-2 shows the same thing in SPI Mode 1,1 which requires that the clock idles in the high state. As with mode 0,0, the A/D Converter outputs data on the falling edge of the clock and the MCU latches data from the A/D Converter in on the rising edge of the clock. CS MCU latches data from A/D Converter on rising edges of SCLK CLK 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Data is clocked out of A/D Converter on falling edges DOUT HI-Z NULL B11 B10 BIT B9 B7 B8 B6 B5 B4 B3 B2 B1 B0 B1 B2 HI-Z LSB first data begins to come out ? ? 0 B11 B10 B9 B8 B7 B6 Data stored into MCU receive register after transmission of first 8 bits FIGURE 6-1: B5 B4 B3 B2 B1 B0 B1 Data stored into MCU receive register after transmission of second 8 bits SPI Communication using 8-bit segments (Mode 0,0: SCLK idles low). CS MCU latches data from A/D Converter on rising edges of SCLK CLK 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Data is clocked out of A/D Converter on falling edges DOUT HI-Z NULL B11 B10 B9 BIT B8 B7 B6 B5 B4 B3 B2 B1 B0 B1 HI-Z LSB first data begins to come out ? ? 0 B11 B10 B9 B8 B7 Data stored into MCU receive register after transmission of first 8 bits FIGURE 6-2: B6 B5 B4 B3 B2 B1 B0 B1 Data stored into MCU receive register after transmission of second 8 bits SPI Communication using 8-bit segments (Mode 1,1: SCLK idles high).  1998-2011 Microchip Technology Inc. DS21290F-page 21 MCP3201 6.2 Maintaining Minimum Clock Speed When the MCP3201 initiates the sample period, charge is stored on the sample capacitor. When the sample period is complete, the device converts one bit for each clock that is received. It is important for the user to note that a slow clock rate will allow charge to bleed off the sample cap while the conversion is taking place. At 85°C (worst-case condition), the part will maintain proper charge on the sample capacitor for at least 1.2 ms after the sample period has ended. This means that the time between the end of the sample period and the time that all 12 data bits have been clocked out must not exceed 1.2 ms (effective clock frequency of 10 kHz). Failure to meet this criteria may induce linearity errors into the conversion outside the rated specifications. It should be noted that during the entire conversion cycle, the A/D Converter does not require a constant clock speed or duty cycle, as long as all timing specifications are met. 6.3 Buffering/Filtering the Analog Inputs VDD 10 µF 4.096V Reference 0.1 µF 10 µF MCP1541 CL VREF IN+ 1 µF MCP3201 VIN R1 C1 MCP601 IN- + R2 - C2 R3 R4 FIGURE 6-3: The MCP601 Operational Amplifier is used to implement a 2nd order antialiasing filter for the signal being converted by the MCP3201 device. If the signal source for the A/D Converter is not a lowimpedance source, it will have to be buffered or inaccurate conversion results may occur. See Figure 4-2. It is also recommended that a filter be used to eliminate any signals that may be aliased back into the conversion results. This is illustrated in Figure 6-3 where an op amp is used to drive the analog input of the MCP3201 device. This amplifier provides a low-impedance source for the converter input and a low-pass filter, which eliminates unwanted highfrequency noise. Low-pass (anti-aliasing) filters can be designed using Microchip’s interactive FilterLab® software. FilterLab will calculate capacitor and resistor values, as well as determine the number of poles that are required for the application. For more information on filtering signals, see application note AN699 “Anti-Aliasing Analog Filters for Data Acquisition Systems.” DS21290F-page 22  1998-2011 Microchip Technology Inc. MCP3201 6.4 Layout Considerations When laying out a printed circuit board for use with analog components, care should be taken to reduce noise wherever possible. A bypass capacitor should always be used with this device and should be placed as close as possible to the device pin. A bypass capacitor value of 1 µF is recommended. Digital and analog traces should be separated as much as possible on the board and no traces should run underneath the device or the bypass capacitor. Extra precautions should be taken to keep traces with highfrequency signals (such as clock lines) as far as possible from analog traces. Use of an analog ground plane is recommended in order to keep the ground potential the same for all devices on the board. Providing VDD connections to devices in a “star” configuration can also reduce noise by eliminating current return paths and associated errors. See Figure 6-4. For more information on layout tips when using A/D Converter, refer to AN688 “Layout Tips for 12-Bit A/D Converter Applications”. VDD Connection Device 4 Device 1 Device 3 Device 2 FIGURE 6-4: VDD traces arranged in a ‘Star’ configuration in order to reduce errors caused by current return paths.  1998-2011 Microchip Technology Inc. DS21290F-page 23 MCP3201 NOTES: DS21290F-page 24  1998-2011 Microchip Technology Inc. MCP3201 7.0 PACKAGING INFORMATION 7.1 Package Marking Information 8-Lead MSOP (3x3 mm) Example 3201CI 130256 8-Lead PDIP (300 mil) XXXXXXXX XXXXXNNN YYWW 8-Lead SOIC (3.90 mm) NNN 8-Lead TSSOP (4.4 mm) Example 3201-B e3 256 I/P ^^ 1130 Example 3201-BI e3 SN ^^1130 256 Example 201C I130 256 Legend: XX...X Y YY WW NNN e3 * Note: Customer-specific information Year code (last digit of calendar year) Year code (last 2 digits of calendar year) Week code (week of January 1 is week ‘01’) Alphanumeric traceability code Pb-free JEDEC designator for Matte Tin (Sn) This package is Pb-free. The Pb-free JEDEC designator ( e3 ) can be found on the outer packaging for this package. In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information.  1998-2011 Microchip Technology Inc. DS21290F-page 25 MCP3201           1 % & %! % 2" ) '   %    2 $%  %"% %% 033)))&    &3 2 D N E E1 NOTE 1 1 2 e b A2 A c φ L L1 A1 4% &  5&% 6!&(  $ 55* * 6 6 67 8 9 %  7 ; %  < :+./ <  ""2 2  + 9+ + %" $$   < +  7 ="% *  ""2="% * ,./ 7 5%  ,./ 1 %5% 5 1 % % 5 ./  : 9 +*1 1 %  > < 9> 5" 2  9 < , 5"="% (  <       !"#$%! & '(!%&! %( %")% %  % "   &   "*"  %!"& "$   % !    "$   % !     %#"+&&   " , &  "%    *-+ ./0 . &    %#%! ))% !%%    *10 $ &  '! !)% !%%  '$ $ &%  !            ) /. DS21290F-page 26  1998-2011 Microchip Technology Inc. MCP3201 Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging  1998-2011 Microchip Technology Inc. DS21290F-page 27 MCP3201       !"## $%     1 % & %! % 2" ) '   %    2 $%  %"% %% 033)))&    &3 2 N NOTE 1 E1 1 3 2 D E A2 A L A1 c e eB b1 b 4% &  5&% 6!&(  $ 6/;* 6 6 67 8 9 %  % %  < <   ""2 2  + , + . % %  + < <  !" %  !" ="% *  , ,+  ""2="% *  + 9 7 5%  ,9 ,:+   % % 5 + , + 5" 2  9  + (  :  (  9  . < < 4  5"="% 5 ) 5"="% 7  ) ? ./ ,      !"#$%! & '(!%&! %( %")% %  % "   ?$%/  %  % , &   "*"  %!"& "$   % !    "$   % !     %#"@   "  &  "%    *-+ ./0. &    %#%! ))% !%%            ) /9. DS21290F-page 28  1998-2011 Microchip Technology Inc. MCP3201 Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging  1998-2011 Microchip Technology Inc. DS21290F-page 29 MCP3201 Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging DS21290F-page 30  1998-2011 Microchip Technology Inc. MCP3201     !&'"()#$% *   1 % & %! % 2" ) '   %    2 $%  %"% %% 033)))&    &3 2  1998-2011 Microchip Technology Inc. DS21290F-page 31 MCP3201   +, ,   +!-(-$%+    1 % & %! % 2" ) '   %    2 $%  %"% %% 033)))&    &3 2 D N E E1 NOTE 1 1 2 b e c A φ A2 A1 L L1 4% &  5&% 6!&(  $ 55* * 6 6 67 8 9 %  7 ; %  < :+./ <  ""2 2  9  + %" $$  + < +  7 ="% *  ""2="% * , :./   ""25%   , , 1 %5% 5 + : + 1 % % 5 + *1 1 %  > < 9> 5" 2   <  5"="% (  < ,      !"#$%! & '(!%&! %( %")% %  % "   &   "*"  %!"& "$   % !    "$   % !     %#"+&&   " , &  "%    *-+ ./0 . &    %#%! ))% !%%    *10 $ &  '! !)% !%%  '$ $ &%  !            ) /9:. DS21290F-page 32  1998-2011 Microchip Technology Inc. MCP3201 Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging  1998-2011 Microchip Technology Inc. DS21290F-page 33 MCP3201 NOTES: DS21290F-page 34  1998-2011 Microchip Technology Inc. MCP3201 APPENDIX A: REVISION HISTORY Revision F (August 2011) • Updated Product Identification System section. - Corrected marking drawings for MSOP packages. - Updated PDIP, SOIC, and TSSOP package specification drawings. Revision E (November 2008) The following is the list of modifications: 1. 2. Updated Section 7.0 “Packaging Information”. Updated Product Identification System section. Revision D (January 2007) The following is the list of modifications: 1. This revision includes updates to the packaging diagrams. Revision C (August 2001) The following is the list of modifications: 1. This revision includes undocumented changes. Revision B (August 1999) The following is the list of modifications: 1. This revision includes undocumented changes. Revision A (September 1998) • Original release of this document.  1998-2011 Microchip Technology Inc. DS21290F-page 35 MCP3201 NOTES: DS21290F-page 36  1998-2011 Microchip Technology Inc. MCP3201 PRODUCT IDENTIFICATION SYSTEM To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office. PART NO. X X /XX Device Grade Temperature Range Package Device: MCP3201: MCP3201T: 12-Bit A/D Converter w/SPI Interface 12-Bit A/D Converter w/SPI Interface (Tape and Reel) Grade: B: C: = ± LSB max INL (MSOP and TSSOP not available) = ± LSB max INL Temperature Range: I = -40°C to+85°C(Industrial) Package: MS P SN ST = = = = Plastic Micro Small Outline (MSOP), 8-lead Plastic DIP (300 mil Body), 8-lead Plastic SOIC (150 mil Body), 8-lead Plastic TSSOP (4.4 mm), 8-lead  1998-2011 Microchip Technology Inc. Examples: a) MCP3201-BI/P: B Grade, Industrial Temperature, 8LD PDIP package. b) MCP3201-BI/SN: B Grade, Industrial Temperature, 8LD SOIC package. c) MCP3201-CI/P: C Grade, Industrial Temperature, 8LD PDIP package. d) MCP3201-CI/MS: C Grade, Industrial Temperature, 8LD MSOP package. e) MCP3201-CI/SN: C Grade, Industrial Temperature, 8LD SOIC package. f) MCP3201-CI/ST: C Grade, Industrial Temperature, 8LD TSSOP package. g) MCP3201T-BI/SN: Tape and Reel, B Grade, Industrial Temperature, 8LD SOIC package. h) MCP3201T-CI/MS: Tape and Reel, C Grade, Industrial Temperature, 8LD MSOP package. i) MCP3201T-CI/SN: Tape and Reel, C Grade, Industrial Temperature, 8LD SOIC package. j) MCP3201T-CI/ST: Tape and Reel, C Grade, Industrial Temperature, 8LD TSSOP package. DS21290F-page 37 MCP3201 NOTES: DS21290F-page 38  1998-2011 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, dsPIC, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART, PIC32 logo, rfPIC and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor, MXDEV, MXLAB, SEEVAL and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Analog-for-the-Digital Age, Application Maestro, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP, Mindi, MiWi, MPASM, MPLAB Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE, rfLAB, Select Mode, Total Endurance, TSHARC, UniWinDriver, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. © 1998-2011, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. ISBN: 978-1-61341-572-6 Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified.  1998-2011 Microchip Technology Inc. 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MCP3201T-BI/SN 价格&库存

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MCP3201T-BI/SN
    •  国内价格
    • 1000+26.18000

    库存:2000

    MCP3201T-BI/SN
      •  国内价格
      • 1+17.93459
      • 10+17.11962
      • 30+16.62747
      • 100+16.21469

      库存:11