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SST25VF020B-80-4I-Q3AE-T

SST25VF020B-80-4I-Q3AE-T

  • 厂商:

    ACTEL(微芯科技)

  • 封装:

    UFDFN-8

  • 描述:

    IC FLASH 2MBIT SPI 80MHZ 8USON

  • 数据手册
  • 价格&库存
SST25VF020B-80-4I-Q3AE-T 数据手册
SST25VF020B 2-Mbit SPI Serial Flash Features Packages • Single Voltage Read and Write Operations: - 2.7V-3.6V • Serial Interface Architecture: - SPI Compatible: Mode 0 and Mode 3 • High-Speed Clock Frequency: - Up to 80 MHz • Superior Reliability: - Endurance: 100,000 cycles - Greater than 100 years data retention • Low-Power Consumption: - Active Read current: 10 mA (typical) - Standby Current: 5 µA (typical) • Flexible Erase Capability: - Uniform 4-Kbyte sectors - Uniform 32-Kbyte overlay blocks - Uniform 64-Kbyte overlay blocks • Fast Erase and Byte Program: - Chip Erase time: 35 ms (typical) - Sector/Block Erase time: 18 ms (typical) - Byte Program time: 7 µs (typical) • Auto Address Increment (AAI) Programming: - Decrease total chip programming time over Byte Program operations • End-of-Write Detection: - Software polling the BUSY bit in STATUS register - Busy Status readout on SO pin in AAI mode • Hold Pin (HOLD#): - Suspends a serial sequence to the memory without deselecting the device • Write Protection (WP#): - Enables/Disables the Lock-Down function of the STATUS register • Software Write Protection: - Write protection through Block Protection bits in STATUS register • Temperature Ranges: - Commercial: 0C to +70C - Industrial (I): -40C to +85C • 8-Lead SOIC (150 mils), 8-Contact USON (3 mm x 2 mm) and 8-Contact WSON (6 mm x 5 mm) Description The 25 series Serial Flash family features a four-wire, SPI compatible interface that allows for a low pin count package which occupies less board space and ultimately lowers total system costs. The SST25VF020B devices are enhanced with improved operating frequency and even lower power consumption. SST25VF020B SPI serial Flash memories are manufactured with SST proprietary, high-performance CMOS SuperFlash® technology. The split-gate cell design and thick-oxide tunneling injector attain better reliability and manufacturability compared with alternate approaches. The SST25VF020B devices significantly improve performance and reliability, while lowering power consumption. The devices write (Program or Erase) with a single power supply of 2.7V-3.6V for SST25VF020B. The total energy consumed is a function of the applied voltage, current and time of application. Since for any given voltage range the SuperFlash technology uses less current to program and has a shorter erase time, the total energy consumed during any erase or program operation is less than alternative Flash memory technologies. See Figure 2-1 for pin assignments. • All devices are RoHS compliant  2012-2020 Microchip Technology Inc. DS20005054D-page 1 SST25VF020B TO OUR VALUED CUSTOMERS It is our intention to provide our valued customers with the best documentation possible to ensure successful use of your Microchip products. To this end, we will continue to improve our publications to better suit your needs. Our publications will be refined and enhanced as new volumes and updates are introduced. If you have any questions or comments regarding this publication, please contact the Marketing Communications Department via E-mail at docerrors@microchip.com. We welcome your feedback. Most Current Data Sheet To obtain the most up-to-date version of this data sheet, please register at our Worldwide Website at: http://www.microchip.com You can determine the version of a data sheet by examining its literature number found on the bottom outside corner of any page. The last character of the literature number is the version number, (e.g., DS30000000A is version A of document DS30000000). Errata An errata sheet, describing minor operational differences from the data sheet and recommended workarounds, may exist for current devices. As device/documentation issues become known to us, we will publish an errata sheet. The errata will specify the revision of silicon and revision of document to which it applies. To determine if an errata sheet exists for a particular device, please check with one of the following: • Microchip’s Worldwide Website; http://www.microchip.com • Your local Microchip sales office (see last page) When contacting a sales office, please specify which device, revision of silicon and data sheet (include literature number) you are using. Customer Notification System Register on our website at www.microchip.com to receive the most current information on all of our products.  2012-2020 Microchip Technology Inc. DS20005054D-page 2 SST25VF020B 1.0 BLOCK DIAGRAM FIGURE 1-1: FUNCTIONAL BLOCK DIAGRAM SuperFlashŠ Memory X - Decoder Address Buffers and Latches Y - Decoder I/O Buffers and Data Latches Control Logic Serial Interface CE#  2012-2020 Microchip Technology Inc. SCK SI SO WP# HOLD# DS20005054D-page 3 SST25VF020B 2.0 PIN DESCRIPTION FIGURE 2-1: PIN DESCRIPTIONS Pin Assignment for 8-Lead SOIC CE# 1 SO 2 8 VDD 7 HOLD# Top View WP# 3 6 SCK VSS 4 5 SI Pin Assignment for 8-Contact USON CE# 1 8 VDD SO 2 7 HOLD# WP# 3 6 SCK VSS 4 5 SI Top View TABLE 2-1: Symbol Pin Assignment for 8-Contact WSON CE# 1 8 VDD 7 HOLD# SO 2 WP# 3 6 SCK VSS 4 5 SI Top View PIN DESCRIPTION Pin Name Functions CE# Chip Enable SO Serial Data Output Transfer data serially out of the device. Data is shifted out on the falling edge of the serial clock. Outputs Flash busy status during AAI Programming when reconfigured as RY/BY# pin. See Section 5.5 “End-of-Write Detection” for details. WP# Write-Protect The Write-Protect (WP#) pin is used to enable/disable BPL bit in the STATUS register. SI Serial Data Input Transfer commands, addresses or data serially into the device. Inputs are latched on the rising edge of the serial clock. SCK Serial Clock Provide the timing of the serial interface. Commands, addresses or input data are latched on the rising edge of the input, while output data is shifted out on the falling edge of the clock input. HOLD# Hold Temporarily stop serial communication with SPI Flash memory without resetting the device. VDD Power Supply Provide power supply voltage: 2.7V-3.6V. VSS Ground  2012-2020 Microchip Technology Inc. The device is enabled by a high-to-low transition on CE#. CE# must remain low for the duration of any command sequence. DS20005054D-page 4 SST25VF020B 3.0 MEMORY ORGANIZATION The difference between the two modes, as shown in Figure 4-1, is the state of the SCK signal when the bus master is in Standby mode and no data is being transferred. The SCK signal is low for Mode 0 and SCK signal is high for Mode 3. For both modes, the Serial Data Input (SI) is sampled at the rising edge of the SCK clock signal and the Serial Data Output (SO) is driven after the falling edge of the SCK clock signal. The SST25VF020B SuperFlash memory array is organized in uniform 4-Kbyte erasable sectors with 32-Kbyte overlay blocks and 64-Kbyte overlay erasable blocks. 4.0 DEVICE OPERATION The SST25VF020B is accessed through the Serial Peripheral Interface (SPI) bus compatible protocol. The SPI bus consists of four control lines: Chip Enable (CE#) is used to select the device and data is accessed through the Serial Data Input (SI), Serial Data Output (SO) and Serial Clock (SCK). The SST25VF020B supports both Mode 0 (0,0) and Mode 3 (1,1) of SPI bus operations. FIGURE 4-1: SPI PROTOCOL CE# SCK MODE 3 MODE 3 MODE 0 MODE 0 SI Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 MSb High-Impedance Don't Care Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 SO MSb 4.1 Hold Operation The HOLD# pin is used to pause a serial sequence underway with the SPI Flash memory without resetting the clocking sequence. To activate the HOLD# mode, CE# must be in active-low state. The HOLD# mode begins when the SCK active-low state coincides with the falling edge of the HOLD# signal. The HOLD mode ends when the HOLD# signal’s rising edge coincides with the SCK active-low state. If the falling edge of the HOLD# signal does not coincide with the SCK active-low state, then the device enters Hold mode when the SCK next reaches the active-low state. FIGURE 4-2: Similarly, if the rising edge of the HOLD# signal does not coincide with the SCK active-low state, then the device exits in Hold mode when the SCK next reaches the active-low state (see Figure 4-2). Once the device enters Hold mode, SO will be in high-impedance state while SI and SCK can be VIL or VIH. If CE# is driven high during a Hold condition, the device returns to Standby mode. As long as HOLD# signal is low, the memory remains in the Hold condition. To resume communication with the device, HOLD# must be driven active-high and CE# must be driven active-low (see Figure 4-2). HOLD CONDITION WAVEFORM SCK HOLD# Active  2012-2020 Microchip Technology Inc. Hold Active Hold Active DS20005054D-page 5 SST25VF020B 4.2 Write Protection TABLE 4-1: SST25VF020B provides software write protection. The Write-Protect pin (WP#) enables or disables the lock-down function of the STATUS register. The Block Protection bits (BP1, BP0 and BPL) in the STATUS register and the Top/Bottom Sector Protection STATUS bits (TSP and BSP) in STATUS register 1 provide write protection to the memory array and the STATUS register. See Table 4-4 for the Block Protection description. 4.2.1 WRITE-PROTECT PIN (WP#) The Write-Protect (WP#) pin enables the lock-down function of the BPL bit (bit 7) in the STATUS register. When WP# is driven low, the execution of the Write STATUS Register (WRSR) instruction is determined by the value of the BPL bit (see Table 4-1). When WP# is high, the lock-down function of the BPL bit is disabled. TABLE 4-2: Bit Name 0 BUSY 1 WEL 2 BP0 WP# BPL Execute WRSR Instruction L 1 Not allowed X Allowed L 4.3 STATUS Register The software STATUS register provides status on whether the Flash memory array is available for any read or write operation, whether the device is write enabled and the state of the memory write-protected. During an internal erase or program operation, the STATUS register may be read only to determine the completion of an operation in progress. Table 4-2 describes the function of each bit in the software STATUS register. SOFTWARE STATUS REGISTER Default at Power-Up Read/Write 1 = Internal write operation is in progress 0 = No internal write operation is in progress 0 R 1 = Device is memory write enabled 0 = Device is not memory write enabled 0 R Indicate current level of block write protection (see ) 1 R/W 1 R/W Function 3 BP1 Indicate current level of block write protection (see ) RES Reserved for future use 6 AAI 7 BPL Auto Address Increment Programming status 1 = AAI programming mode 0 = Byte Program mode 1 = BP1, BP0 are read-only bits 0 = BP1, BP0 are read/writable Software STATUS Register 1 The Software STATUS Register 1 is an additional register that contains Top Sector and Bottom Sector Protection bits. These register bits are read/writable and TABLE 4-3: Allowed 0 H 4:5 4.4 CONDITIONS TO EXECUTE WRSR INSTRUCTION 0 N/A 0 R 0 R/W determine the lock and unlock status of the top and bottom sectors. Table 4-3 describes the function of each bit in the Software STATUS Register 1. SOFTWARE STATUS REGISTER 1 Bit Name Function 0:1 RES Reserved for future use 2 TSP 3 BSP Top Sector Protection status 1 = Indicates higher sector is write-locked 0 = Indicates highest sector is write-accessible 4:7 RES Bottom Sector Protection status 1 = Indicates lowest sector is write-locked 0 = Indicates lowest sector is write-accessible Reserved for future use  2012-2020 Microchip Technology Inc. Default at Power-Up 0 Read/Write N/A 0 R/W 0 R/W 0 N/A DS20005054D-page 6 SST25VF020B 4.4.1 BUSY 4.4.3 The BUSY bit determines whether there is an internal erase or program operation in progress. A ‘1’ for the BUSY bit indicates the device is busy with an operation in progress. A ‘0’ indicates the device is ready for the next valid operation. 4.4.2 WRITE ENABLE LATCH (WEL) The Write Enable Latch bit indicates the status of the internal memory Write Enable Latch. If the Write Enable Latch bit is set to ‘1’, it indicates the device is write enabled. If the bit is set to ‘0’ (Reset), it indicates the device is not write enabled and does not accept any memory write (program/erase) commands. The Write Enable Latch bit is automatically reset under the following conditions: • • • • • • • • Power-Up Write Disable (WRDI) instruction completion Byte Program instruction completion Auto Address Increment (AAI) programming is completed or reached its highest unprotected memory address Sector Erase instruction completion Block Erase instruction completion Chip Erase instruction completion Write STATUS Register instructions Protection Level 4.4.4 BLOCK PROTECTION (BP1, BP0) The Block Protection (BP1, BP0) bits define the size of the memory area, as defined in Table 4-4, to be software protected against any memory write (program or erase) operation. The Write STATUS Register (WRSR) instruction is used to program the BP1 and BP0 bits as long as WP# is high or the Block Protect Lock (BPL) bit is ‘0’. Chip Erase can only be executed if Block Protection bits are all ‘0’. After power-up, BP1 and BP0 are set to ‘1’. 4.4.5 BLOCK PROTECTION LOCK-DOWN (BPL) WP# pin driven low (VIL) enables the Block Protection Lock Down (BPL) bit. When BPL is set to ‘1’, it prevents any further alteration of the BPL, BP1 and BP0 bits of the STATUS register and BSP and TSP of STATUS register 1. When the WP# pin is driven high (VIH), the BPL bit has no effect and its value is “don’t care”. After power-up, the BPL bit is reset to ‘0’. STATUS Register Bit(2) 0 1 (1/4 Memory Array) 1 (1/2 Memory Array) 1 (Full Memory Array) 4.4.6 The Auto Address Increment Programming Status bit provides status on whether the device is in AAI programming mode or Byte Program mode. The default at power-up is Byte Program mode. SOFTWARE STATUS REGISTER BLOCK PROTECTION(1) TABLE 4-4: Note 1: 2: AUTO ADDRESS INCREMENT (AAI) BP1 Protected Memory Address BP0 0 0 2 Mbit None 0 1 030000H-03FFFFH 1 1 000000H-03FFFFH 1 0 020000H-03FFFFH x = “don’t care” (RESERVED) default is ‘0’ Default at power-up for BP1 and BP0 is ‘11’ (all blocks protected) TOP SECTOR PROTECTION/BOTTOM SECTOR PROTECTION The Top Sector Protection (TSP) and Bottom Sector Protection (BSP) bits independently indicate whether the highest and lowest sector locations are write locked or write accessible. When TSP or BSP is set to ‘1’, the respective sector is write locked; when set to ‘0,’ the respective sector is write accessible. If TSP or BSP is set to ‘1’ and if the top or bottom sector is within the boundary of the target address range of the program or erase instruction, the initiated instruction (Byte program, AAI Word program, Sector Erase, Block Erase and Chip Erase) will not be executed. Upon power-up, the TSP and BSP bits are automatically reset to ‘0’.  2012-2020 Microchip Technology Inc. DS20005054D-page 7 SST25VF020B 5.0 INSTRUCTIONS Instructions are used to read, write (erase and program) and configure the SST25VF020B. The instruction bus cycles are 8 bits each for commands (Op Code), data and addresses. Prior to executing any Byte program, Auto Address Increment (AAI) programming, Sector Erase, Block Erase, Write STATUS Register or Chip Erase instructions, the Write Enable (WREN) instruction must be executed first. The complete list of instructions is provided in Table 5-1. All instructions are synchronized from a high-to-low transition of CE#. Inputs will be accepted on the rising edge of SCK starting with the Most Significant bit (MSb). CE# must be driven low before an instruction is entered and must be driven high after the last bit of the instruction has been shifted in (except for Read, Read-ID and Read STATUS Register instructions). Any low-to-high transition on CE#, before receiving the last bit of an instruction bus cycle, will terminate the instruction in progress and return the device to Standby mode. Instruction commands (Op Code), addresses and data are all input from the Most Significant bit first. TABLE 5-1: DEVICE OPERATION INSTRUCTIONS Instruction Description Op Code Cycle(1) Address Cycle(s)(2) Dummy Data Cycle(s) Cycle(s) Read Read Memory 0000 0011b (03H) 3 0 1 to ∞ High-Speed Read Read Memory at Higher Speed 0000 1011b (0BH) 3 1 1 to ∞ Erase 4 Kbytes of Memory Array 0010 0000b (20H) 3 0 0 0101 0010b (52H) 3 0 0 1101 1000b (D8H) 3 0 0 Erase Full Memory Array 0110 0000b (60H) or 1100 0111b (C7H) 0 0 0 Program One Data Byte 0000 0010b (02H) 3 0 1 Auto Address Increment Programming 1010 1101b (ADH) 3 0 2 to ∞ (3) 4-Kbyte Sector-Erase 32-Kbyte Block Erase(4) Erase 32-Kbyte Block of Memory Array 64-Kbyte Block Erase(5) Erase 64-Kbyte Block of Memory Array Chip Erase Byte Program AAI Word Program RDSR(7) (6) Read STATUS Register 0000 0101b (05H) 0 0 1 to ∞ RDSR1 Read STATUS Register 1 0011 0101b (35H) 0 0 1 to ∞ EWSR Enable Write STATUS Register 0101b 0000b (50H) 0 0 0 WRSR Write STATUS Register 0000 0001b (01H) 0 0 1 or 2 WREN Write Enable 0000 0110b (06H) 0 0 0 WRDI Write Disable 0000 0100b (04H) 0 0 0 1001 0000b (90H) or 1010 1011b (ABH) 3 0 1 to ∞ JEDEC ID Read 1001 1111b (9FH) 0 0 3 to ∞ EBSY Enable SO to Output RY/BY# Status during AAI Programming 0111 0000b (70H) 0 0 0 DBSY Disable SO as RY/BY# Status during AAI Programming 1000 0000b (80H) 0 0 0 RDID(8) Read ID JEDEC ID  2012-2020 Microchip Technology Inc. DS20005054D-page 8 SST25VF020B TABLE 5-1: DEVICE OPERATION INSTRUCTIONS (CONTINUED) Instruction Note 1: 2: 3: 4: 5: 6: 7: 8: 5.1 Address Cycle(s)(2) Op Code Cycle(1) Description Dummy Data Cycle(s) Cycle(s) One bus cycle is eight clock periods. Address bits above the Most Significant bit of each density can be VIL or VIH. 4-Kbyte Sector Erase addresses: use AMS-A12, remaining addresses are “don’t care” but must be set either at VIL or VIH. 32-Kbyte Block Erase addresses: use AMS-A15, remaining addresses are “don’t care” but must be set either at VIL or VIH. 64-Kbyte Block Erase addresses: use AMS-A16, remaining addresses are “don’t care” but must be set either at VIL or VIH. To continue programming to the next sequential address location, enter the 8-bit command, ADH, followed by 2 bytes of data to be programmed. Data Byte 0 will be programmed into the initial address [A23-A1] with A0 = 0, Data Byte 1 will be programmed into the initial address [A23-A1] with A0 = 1. The Read STATUS Register is continuous with ongoing clock cycles until terminated by a low-to-high transition on CE#. Manufacturer’s ID is read with A0 = 0 and Device ID is read with A0 = 1. All other address bits are 00H. The Manufacturer’s ID and device ID output stream is continuous until terminated by a low-to-high transition on CE#. Read (33 MHz) The Read instruction, 03H, supports up to 33 MHz Read. The device outputs the data starting from the specified address location. The data output stream is continuous through all addresses until terminated by a low-to-high transition on CE#. The internal Address Pointer will automatically increment until the highest memory address is reached. Once the highest memory address is reached, the Address Pointer will automatically increment to the beginning (wrap-around) of the address space. Once the data from address location 3FFFFH has been read, the next output will be from address location 000000H. The Read instruction is initiated by executing an 8-bit command, 03H, followed by address bits [A23-A0]. CE# must remain active-low for the duration of the Read cycle. See Figure 5-1 for the Read sequence. FIGURE 5-1: READ SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 ADD. 03 SI MSb MSb SO 15 16 23 24 31 32 39 40 47 48 55 56 63 64 70 MODE 0 High-Impedance ADD. ADD. N DOUT N+1 DOUT N+2 DOUT N+3 DOUT N+4 DOUT MSb  2012-2020 Microchip Technology Inc. DS20005054D-page 9 SST25VF020B 5.2 High-Speed Read (80 MHz) The High-Speed Read instruction supporting up to 80 MHz Read is initiated by executing an 8-bit command, 0BH, followed by address bits [A23-A0] and a dummy byte. CE# must remain active-low for the duration of the High-Speed Read cycle. See Figure 5-2 for the High-Speed Read sequence. Following a dummy cycle, the High-Speed Read instruction outputs the data starting from the specified address location. The data output stream is continuous through all addresses until terminated by a low-to-high transition on CE#. The internal Address Pointer will automatically increment until the highest memory address is reached. Once the highest memory address is reached, the Address Pointer will automatically increment to the beginning (wrap-around) of the address space. Once the data from address location 3FFFH has been read, the next output will be from address location 00000H. FIGURE 5-2: HIGH-SPEED READ SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 15 16 23 24 31 32 39 40 47 48 55 56 63 64 71 72 80 MODE 0 0B SI ADD. MSb MSb ADD. High-Impedance SO ADD. X N DOUT N+1 DOUT N+2 DOUT N+3 DOUT N+4 DOUT MSb 5.3 Byte Program The Byte Program instruction programs the bits in the selected byte to the desired data. The selected byte must be in the erased state (FFH) when initiating a Program operation. A Byte Program instruction applied to a protected memory area will be ignored. Prior to any Write operation, the Write Enable (WREN) instruction must be executed. CE# must remain active-low for the duration of the Byte Program instruction. The Byte Program instruction is initiated by executing an 8-bit command, 02H, followed by address bits [A23-A0]. Following the address, the data is input in order from MSb (bit 7) to LSb (bit 0). CE# must be driven high before the instruction is executed. The user may poll the BUSY bit in the software STATUS register or wait TBP for the completion of the internal self-timed Byte Program operation. See Figure 5-3 for the Byte Program sequence.  2012-2020 Microchip Technology Inc. DS20005054D-page 10 SST25VF020B FIGURE 5-3: BYTE PROGRAM SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 02 SI MSb SO 5.4 15 16 23 24 31 32 39 MODE 0 Auto Address Increment (AAI) Word Program The AAI program instruction allows multiple bytes of data to be programmed without reissuing the next sequential address location. This feature decreases total programming time when multiple bytes or entire memory array is to be programmed. An AAI Word program instruction pointing to a protected memory area will be ignored. The selected address range must be in the erased state (FFH) when initiating an AAI Word Program operation. While within AAI Word Programming sequence, only the following instructions are valid: • for software end-of-write detection – AAI Word (ADH), WRDI (04H) and RDSR (05H) • for hardware end-of-write detection – AAI Word (ADH) and WRDI (04H) There are three options to determine the completion of each AAI Word program cycle: hardware detection by reading the Serial Output, software detection by polling the BUSY bit in the software STATUS register or wait TBP (see Section 5.5 “End-of-Write Detection” for details). Prior to any write operation, the Write Enable (WREN) instruction must be executed. Initiate the AAI Word Program instruction by executing an 8-bit command, ADH, followed by address bits [A23-A0]. Following the addresses, two bytes of data are input sequentially, each one from MSb (Bit 7) to LSb (Bit 0). The first byte of data (D0) is programmed into the initial address [A23-A1] with A0 = 0, the second byte of data (D1) is programmed into the initial address [A23-A1] with A0 = 1. CE# must be driven high before executing the AAI Word Program instruction. Check the Busy status before entering the next valid command. Once the device indicates it is no longer busy, data for the next two sequential addresses may be programmed, followed by the next two, and so on. When programming the last desired word or the highest unprotected memory address, check the Busy status using either the hardware or software (RDSR instruction) method to check for program completion.  2012-2020 Microchip Technology Inc. ADD. ADD. MSb ADD. DIN MSb LSb High-Impedance Once programming is complete, use the applicable method to terminate AAI. If the device is in Software End-of-Write Detection mode, execute the Write Disable (WRDI) instruction, 04H. If the device is in AAI Hardware End-of-Write Detection mode, execute the Write Disable (WRDI) instruction, 04H, followed by the 8-bit DBSY command, 80H. There is no wrap mode during AAI programming once the highest unprotected memory address is reached. See Figures 5-6 and 5-7 for the AAI Word programming sequence. 5.5 End-of-Write Detection There are three methods to determine completion of a program cycle during AAI Word programming: hardware detection by reading the Serial Output, software detection by polling the BUSY bit in the Software STATUS register or wait TBP. The Hardware End-of-Write detection method is described in Section 5.6 “Hardware End-of-Write Detection” 5.6 Hardware End-of-Write Detection The Hardware End-of-Write detection method eliminates the overhead of polling the BUSY bit in the Software STATUS register during an AAI Word program operation. The 8-bit command, 70H, configures the Serial Output (SO) pin to indicate Flash Busy status during AAI Word programming (see Figure 5-4). The 8-bit command, 70H, must be executed prior to initiating an AAI Word-Program instruction. Once an internal programming operation begins, asserting CE# will immediately drive the status of the internal Flash status on the SO pin. A ‘0’ indicates the device is busy and a ‘1’ indicates the device is ready for the next instruction. De-asserting CE# will return the SO pin to tri-state. While in AAI and Hardware End-of-Write detection mode, the only valid instructions are AAI Word (ADH) and WRDI (04H). To exit AAI Hardware End-of-Write detection, first execute WRDI instruction, 04H, to reset the Write Enable Latch bit (WEL = 0) and AAI bit. Then execute the 8-bit DBSY command, 80H, to disable RY/BY# status during the AAI command (see Figures 5-5 and 5-6). DS20005054D-page 11 SST25VF020B FIGURE 5-4: ENABLE SO AS HARDWARE RY/BY# DURING AAI PROGRAMMING CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 70 SI MSb High-Impedance SO FIGURE 5-5: DISABLE SO AS HARDWARE RY/BY# DURING AAI PROGRAMMING CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 80 SI MSb High-Impedance SO FIGURE 5-6: AUTO ADDRESS INCREMENT (AAI) WORD PROGRAM SEQUENCE WITH HARDWARE END-OF-WRITE DETECTION CE# MODE 3 0 7 0 7 0 7 8 15 16 23 24 31 32 39 40 47 0 7 8 15 16 23 SCK MODE 0 SI EBSY WREN AD A A A D0 D1 AD D2 D3 Load AAI command, Address, 2 bytes data SO Check for Flash Busy Status to load next valid(1) command CE# cont. 0 7 8 15 16 23 0 7 0 7 0 7 8 15 SCK cont. SI cont. AD Dn-1 Last 2 data bytes Dn WRDI DBSY RDSR WRDI followed by DBSY to exit AAI mode DOUT SO cont. Check for Flash Busy Status to load next valid ( 1) command Note: 1. Valid commands during AAI programming: AAI command or WRDI command 2. User must configure the SO pin to output Flash Busy status during AAI programming  2012-2020 Microchip Technology Inc. DS20005054D-page 12 SST25VF020B FIGURE 5-7: AUTO ADDRESS INCREMENT (AAI) WORD PROGRAM SEQUENCE WITH SOFTWARE END-OF-WRITE DETECTION Wait TBP or poll Software STATUS register to load next valid(1) command CE# MODE 3 0 7 8 15 16 23 24 31 32 39 40 47 0 7 8 15 16 23 0 7 8 15 16 23 0 7 0 7 8 15 SCK MODE 0 SI AD A A A D0 D1 AD D2 D3 AD Dn-1 Dn WRDI Last 2 data bytes Load AAI command, Address, 2 bytes data RDSR WRDI to exit AAI mode SO DOUT Note: 1. Valid commands during AAI programming: AAI command, RDSR command, or WRDI command 5.7 4-Kbyte Sector Erase The Sector Erase instruction clears all bits in the selected 4-Kbyte sector to FFH. A Sector Erase instruction applied to a protected memory area will be ignored. Prior to any write operation, the Write-Enable (WREN) instruction must be executed. CE# must remain active-low for the duration of any command sequence. The Sector Erase instruction is initiated by executing an 8-bit command, 20H, followed by address bits [A23-A0]. Address bits [AMS-A12] (AMS = Most Significant address) are used to determine the sector address (SAX), remaining address bits can be VIL or VIH. CE# must be driven high before the instruction is executed. The user may poll the BUSY bit in the software STATUS register or wait TSE for the completion of the internal self-timed Sector Erase cycle. See Figure 5-8 for the Sector Erase sequence. FIGURE 5-8: SECTOR ERASE SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 15 16 23 24 31 MODE 0 20 SI MSb SO  2012-2020 Microchip Technology Inc. ADD. ADD. ADD. MSb High-Impedance DS20005054D-page 13 SST25VF020B 5.8 32-Kbyte and 64-Kbyte Block Erase The 32-Kbyte Block Erase instruction clears all bits in the selected 32-Kbyte block to FFH. A Block Erase instruction applied to a protected memory area will be ignored. The 64-Kbyte Block Erase instruction clears all bits in the selected 64-Kbyte block to FFH. A Block Erase instruction applied to a protected memory area will be ignored. Prior to any write operation, the Write Enable (WREN) instruction must be executed. CE# must remain active-low for the duration of any command sequence. The 32-Kbyte Block Erase instruction is initiated by executing an 8-bit command, 52H, followed by address bits [A23-A0]. Address bits [AMS-A15] (AMS = Most Significant Address) are used to determine block address (BAX), remaining address bits can be VIL or VIH. CE# must be driven high before the instruction is executed. The 64-Kbyte Block Erase instruction is initiated by executing an 8-bit command D8H, followed by address bits [A23-A0]. Address bits [AMS-A15] are used to determine block address (BAX), remaining address bits can be VIL or VIH. CE# must be driven high before the instruction is executed. The user may poll the BUSY bit in the software STATUS register or wait TBE for the completion of the internal self-timed 32-Kbyte Block Erase or 64-Kbyte Block Erase cycles. See Figures 5-9 and 5-10 for the 32-Kbyte Block Erase and 64-Kbyte Block Erase sequences. FIGURE 5-9: 32-KBYTE BLOCK ERASE SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 52 SI MSb 31 ADDR ADDR ADDR MSb High-Impedance SO FIGURE 5-10: 23 24 15 16 MODE 0 64-KBYTE BLOCK ERASE SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 15 16 23 24 31 MODE 0 D8 SI MSb SO  2012-2020 Microchip Technology Inc. ADDR ADDR ADDR MSb High-Impedance DS20005054D-page 14 SST25VF020B 5.9 Chip Erase The Chip Erase instruction clears all bits in the device to FFH. A Chip Erase instruction will be ignored if any of the memory area is protected. Prior to any write operation, the Write Enable (WREN) instruction must be executed. CE# must remain active-low for the duration of the Chip Erase instruction sequence. The Chip Erase instruction is initiated by executing an 8-bit command, 60H or C7H. CE# must be driven high before the instruction is executed. The user may poll the BUSY bit in the software STATUS register or wait TCE for the completion of the internal self-timed Chip Erase cycle (see Figure 5-11). FIGURE 5-11: CHIP-ERASE SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 60 or C7 SI MSb High-Impedance SO 5.10 Read STATUS Register (RDSR) The Read STATUS Register (RDSR) instruction allows reading of the STATUS register. The STATUS register may be read at any time even during a write (program/erase) operation. When a write operation is in progress, the BUSY bit may be checked before sending any new commands to assure that the new commands are properly received by the device. CE# must be driven low before the RDSR instruction is entered and remain low until the status data is read. Read STATUS Register is continuous with ongoing clock cycles until it is terminated by a low-to-high transition of the CE# (see Figure 5-12). FIGURE 5-12: READ STATUS REGISTER (RDSR) SEQUENCE CE# MODE 3 SCK SI 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 MODE 0 05 MSb High-Impedance SO Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 MSb  2012-2020 Microchip Technology Inc. STATUS Register Out DS20005054D-page 15 SST25VF020B 5.11 Read STATUS Register (RDSR1) The Read STATUS Register 1 (RDSR1) instruction allows reading of the STATUS register 1. CE# must be driven low before the RDSR instruction is entered and remain low until the status data is read. Read STATUS Register 1 is continuous with ongoing clock cycles until it is terminated by a low-to-high transition of the CE# (see Figure 5-13). FIGURE 5-13: READ STATUS REGISTER 1 (RDSR1) SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 9 SI 11 12 13 14 35 MSb High-Impedance Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 SO MSb 5.12 10 MODE 0 STATUS Register Out Write Enable (WREN) The Write Enable (WREN) instruction sets the Write Enable Latch bit in the STATUS register to 1 allowing write operations to occur. The WREN instruction must be executed prior to any write (program/erase) operation. The WREN instruction may also be used to allow execution of the Write STATUS Register (WRSR) instruction; however, the Write Enable Latch bit in the STATUS register will be cleared upon the rising edge CE# of the WRSR instruction. CE# must be driven high before the WREN instruction is executed. FIGURE 5-14: WRITE ENABLE (WREN) SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 06 SI MSb SO 5.13 Write Disable (WRDI) The Write Disable (WRDI) instruction resets the Write Enable Latch bit and AAI bit to ‘0’ disabling any new write operations from occurring. The WRDI instruction will not terminate any programming operation in progress.  2012-2020 Microchip Technology Inc. High-Impedance Any program operation in progress may continue up to TBP after executing the WRDI instruction. CE# must be driven high before the WRDI instruction is executed. DS20005054D-page 16 SST25VF020B FIGURE 5-15: WRITE DISABLE (WRDI) SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 04 SI MSb SO 5.14 High-Impedance Enable Write STATUS Register (EWSR) The Enable Write STATUS Register (EWSR) instruction arms the Write STATUS Register (WRSR) instruction and opens the STATUS register for alteration. The Write STATUS Register instruction must be executed immediately after the execution of the Enable Write STATUS Register instruction. This two-step instruction sequence of the EWSR instruction followed by the WRSR instruction works like Software Data Protection (SDP) command structure which prevents any accidental alteration of the STATUS register values. CE# must be driven low before the EWSR instruction is entered and must be driven high before the EWSR instruction is executed. 5.15 Executing the Write STATUS Register instruction will be ignored when WP# is low and BPL bit is set to ‘1’. When the WP# is low, the BPL bit can only be set from ‘0’ to ‘1’ to lock down the STATUS register, but cannot be reset from ‘1’ to ‘0’. When WP# is high, the lock-down function of the BPL bit is disabled and the BPL, BP0, and BP1 bits in the STATUS register can all be changed. As long as BPL bit is set to ‘0’ or WP# pin is driven high (VIH) prior to the low-to-high transition of the CE# pin at the end of the WRSR instruction, the bits in the STATUS register can all be altered by the WRSR instruction. In this case, a single WRSR instruction can set the BPL bit to ‘1’ to lock down the STATUS register as well as altering the BP0, BP1, and BP2 bits at the same time. See Table 4-1 for a summary description of WP# and BPL functions. Write STATUS Register (WRSR) The Write STATUS Register instruction writes new values to the BP1, BP0, and BPL bits of the STATUS register. CE# must be driven low before the command sequence of the WRSR instruction is entered and driven high before the WRSR instruction is executed. See Figure 5-16 for EWSR or WREN and WRSR for byte data input sequences. FIGURE 5-16: ENABLE WRITE STATUS REGISTER (EWSR) OR WRITE ENABLE (WREN) AND WRITE STATUS REGISTER (WRSR) BYTE DATA INPUT SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 MODE 3 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 MODE 0 01 50 or 06 SI MSb SO  2012-2020 Microchip Technology Inc. MSb STATUS Register In 7 6 5 4 3 2 1 0 MSb High-Impedance DS20005054D-page 17 SST25VF020B The Write STATUS Register instruction also writes new values to the STATUS Register 1. To write values to STATUS Register 1, the WRSR sequence needs a word data input – the first byte being the STATUS register bits, followed by the second byte STATUS Register 1 bits. CE# must be driven low before the command sequence of the WRSR instruction is entered and driven high before the WRSR instruction is executed. See Figure 5-17 for EWSR or WREN and WRSR instruction word data input sequences. Executing the Write STATUS Register instruction will be ignored when WP# is low and BPL bit is set to ‘1’. When the WP# is low, the BPL bit can only be set from ‘0’ to ‘1’ to lock down the status registers, but cannot be reset from ‘1’ to ‘0’. When WP# is high, the lock-down function of the BPL bit is disabled and the BPL, BP0, BP1, TSP, and BSP bits in the STATUS register can all be changed. As long as BPL bit is set to ‘0’ or WP# pin is driven high (VIH) prior to the low-to-high transition of the CE# pin at the end of the WRSR instruction, the bits in the STATUS register can all be altered by the WRSR instruction. In this case, a single WRSR instruction can set the BPL bit to ‘1’ to lock down the STATUS register as well as altering the BPL, BP0, BP1, TSP and BSP bits at the same time. See Table 4-1 for a summary description of WP# and BPL functions. ENABLE WRITE STATUS REGISTER (EWSR) OR WRITE ENABLE (WREN) AND WRITE STATUS REGISTER (WRSR) WORD DATA INPUT SEQUENCE FIGURE 5-17: CE# 0 1 2 3 4 5 6 7 MODE 3 SCK MODE 3 MODE 0 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 MODE 0 50 or 06 SI 01 MSb MSb MSb MSb High-Impedance SO The WRSR instruction can either execute a byte data or a word data input. Extra data/clock input or within byte data/word data input will not be executed. The reason for the byte support is for backward compatibility to products where WRSR instruction sequence is followed by only a byte data. 5.16 STATUS STATUS Register Register 1 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 JEDEC Read ID The JEDEC Read ID instruction identifies the device as SST25VF020B and the manufacturer as SST. The device information can be read from executing the 8-bit command, 9FH. FIGURE 5-18: Following the JEDEC Read ID instruction, the 8-bit manufacturer’s ID, BFH, is output from the device. After that, a 16-bit device ID is shifted out on the SO pin. Byte 1, BFH, identifies the manufacturer as SST. Byte 2, 25H, identifies the memory type as SPI Serial Flash. Byte 3, 8CH, identifies the device as SST25VF020B. The instruction sequence is shown in Figure 5-18. The JEDEC Read ID instruction is terminated by a low-to-high transition on CE# at any time during data output. JEDEC READ ID SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 MODE 0 9F SI SO High-Impedance BF MSb  2012-2020 Microchip Technology Inc. 25 8C MSb DS20005054D-page 18 SST25VF020B JEDEC READ ID DATA TABLE 5-2: Device ID Manufacturer’s ID 5.17 Memory Type Memory Capacity Byte 1 Byte 2 Byte 3 BFH 25H 8CH Read ID (RDID) The Read ID (RDID) instruction identifies the devices as SST25VF020B and manufacturer as SST. The device information can be read from executing an 8-bit command, 90H or ABH, followed by address bits [A23-A0]. Following the Read ID instruction, the manufacturer’s ID is located in address 00000H and the device ID is located in address 00001H. Once the device is in Read ID mode, the manufacturer’s and device ID output data toggles between address 00000H and 00001H until terminated by a low-to-high transition on CE#. Refer to Tables 5-2 and 5-3 for device identification data. FIGURE 5-19: READ ID SEQUENCE CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 23 24 15 16 31 32 39 40 47 48 55 56 63 MODE 0 90 or AB SI 00 00 MSb ADD(1) MSb High-Impedance SO BF Device ID BF Device ID High-Impedance MSb Note: 1. 00H will output the manfacturer's ID first and 01H will output device ID first before toggling between the two. 2. The manufacturer's and device ID output stream is continuous until terminated by a low-to-high transition on CE#. Device ID = 8CH for SST25VF020B TABLE 5-3: PRODUCT IDENTIFICATION Address Data Manufacturer’s ID 00000H BFH Device ID 00001H 8CH  2012-2020 Microchip Technology Inc. DS20005054D-page 19 SST25VF020B 6.0 ELECTRICAL SPECIFICATIONS Absolute Maximum Ratings (†) Temperature under bias ..........................................................................................................................-55°C to +125°C Storage temperature ...............................................................................................................................-65°C to +150°C DC voltage on any pin to ground potential ...........................................................................................-0.5V to VDD+0.5V Transient voltage (
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