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8503003YC

8503003YC

  • 厂商:

    AD(亚德诺)

  • 封装:

    CDIP14

  • 描述:

    VREF, THIN FILM (AD2702SD)

  • 数据手册
  • 价格&库存
8503003YC 数据手册
REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to military drawing format. Page 8, table I; change group A subgroup for +VR and -VR; add end-point electrical limits for +VRINT and -VRINT. Page 10; change output offset adjust and temperature effect for device types 03 and 04 trim circuits. 86-12-31 W. Heckman B Add device types 05 and 06. Inactivate case outline X. Add case outlines C, Y, and 3. Add vendors CAGE 33256 and 34707. Change drawing CAGE to 67268. Editorial changes throughout. 89-08-01 W. Heckman C Changed to reflect MIL-H-38534 processing. Update document. Editorial changes throughout. 92-12-22 K. A. Cottongim D Changes in accordance with NOR 5962-R212-93. 93-08-17 K. A. Cottongim E Changes in accordance with NOR 5962-R045-93. 93-11-18 K. A. Cottongim F Changes to table I, note 1. 99-01-08 K. A. Cottongim THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHEET REV F F SHEET 15 16 REV STATUS OF SHEETS PMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE REV F F F F F F F F F F F F F F SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PREPARED BY Donald R. Osborne DEFENSE SUPPLY CENTER COLUMBUS P. O. BOX 3990 COLUMBUS, OHIO 43216-5000 CHECKED BY Ray Monnin APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, PRECISION VOLTAGE REFERENCES, THIN FILM DRAWING APPROVAL DATE 86-04-28 SIZE AMSC N/A REVISION LEVEL F A SHEET DSCC FORM 2231 APR 97 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. CAGE CODE 85030 14933 1 OF 16 5962-E502-98 1. SCOPE 1.1 Scope. This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 85030 01 X X             Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Generic number Device type 01, 02 03, 04 05, 06 Circuit function 2700 2702 2701 Precision +10.000-volt reference Precision ±10.000-volt reference Precision -10.000-volt reference 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals C X Y 3 GDIP1-T14 or CDIP1-T14 See figure 1 See figure 1 CQCC1-N28 14 14 14 28 Package style Dual-in-line Dual-in-line Dual-in-line Square leadless chip-carrier 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VS): VCC (device types 01, 02, 03, 04) . . . . . . . . . . . . . . . . . . . . VEE (device types 03, 04, 05, 06) . . . . . . . . . . . . . . . . . . . . Power dissipation (PD), TA = +25C: Device types 01, 02, 05, 06 . . . . . . . . . . . . . . . . . . . . . . . . . Device types 03, 04 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . Short circuit protection (to GND) . . . . . . . . . . . . . . . . . . . . . . . Thermal resistance: Junction-to-case (JC): Case outlines C and 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case outline X . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case outline Y . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Junction-to-ambient (JA): Case outline X . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case outline Y . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20 V dc -20 V dc 300 mW 450 mW -65C to +150C +300C Continuous See MIL-STD-1835 7C/W 8C/W 30C/W 25C/W 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 2 1.4 Recommended operating conditions. Supply voltage range (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . Supply voltage range (VEE) . . . . . . . . . . . . . . . . . . . . . . . . . . Output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ambient operating temperature range (TA) . . . . . . . . . . . . . . . +13.5 V dc to +16.5 V dc -13.5 V dc to -16.5 V dc 5 mA 1/ -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbook. The following specification, standards, and handbook form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Microcircuit Case Outlines. HANDBOOK DEPARTMENT OF DEFENSE MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for applicable device class. Therefore, the tests and inspections herein may not be performed for applicable device class (see MIL-PRF-38534). Futhermore, the manufacturers may take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 1/ With resistive load to pin 7 (common). SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 3 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Trim circuits. The trim circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked as listed in QML-38534. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 4 TABLE I. Electrical performance characteristics. Test Selection output error 2/ Interim output error Output adjust range for trim circuits (see figure 3) Quiescent current  Symbol    +VR            -VR        +VRINT    -VRINT    +VRADJ   -VRADJ   ICC         IEE          Conditions 1/  -55C < TA < +125C  unless otherwise specified  +10.000 V output    +10.000 V output    +10.000 V output    -10.000 V output    -10.000 V output     +10.000 V output  Initial TA = +25C    End-point   -10.000 V output  Initial TA = +25C    End-point  +10.000 V output, TA = +25C   -10.000 V output, TA = +25C   VCC = +15 V, no load, TA = +25C   VCC = +15 V VEE = -15 V, no load TA = +25C   VCC = +15 V, no load VEE = -15 V TA = +25C   VEE = -15 V, no load TA = +25C   Group A subgroups    4   5, 6   4   5, 6   4   5, 6   4   5, 6   4   5, 6   1     1     1    1    1     1      1      1    Device type    01     02, 04     03     03, 05     04, 06     01, 02,  03, 04    03, 04,  05, 06    01, 02,  03, 04   03, 04,  05, 06   01, 02     03, 04      03, 04      05, 06                                                           Limits Min -5.0 -8.0 -2.5 -5.5 -5.0 -10 +5.0 +10 +2.5 +5.5 -5 -10 +5 +10 -20 +20                                                       Max +5.0 +8.0 +2.5 +5.5 +5.0 +10 -5.0 -10 -2.5 -5.5 +5 +10 -5 -10 +20 -20 +14 +17 -4 -14   Unit     mV                                   mA                 See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Line regulation Load regulation Output current Output noise 3/ 1/ 2/ 3/  Symbol    +VRL    -VRL    +VRLOAD    -VRLOAD    +IL    -IL          Conditions 1/  -55C < TA < +125C  unless otherwise specified  +10 V output, TA = +25C, +13.5 V < VCC < +16.5 V   -10.000 V output, TA = +25C, -13.5 V < VEE < -16.5 V   +10.000 V output, TA = +25C, 0 < IL < 10 mA   -10.000 V output, TA = +25C, 0 < IL < 10 mA           VOUT = 10 V, no load, 0.1 Hz < BW < 10 Hz, TA = +25C   Group A subgroups    1     1     1     1     1   2, 3   1   2, 3   4     Device type    01, 02,  03, 04    03, 04,  05, 06    01, 02,  03, 04    03, 04,  05, 06    01, 02,  03, 04    03, 04,  05, 06    01, 02,  03, 04,  05, 06                                   Limits Min -900 +900 -500 +500 10 5                                Max +900 -900 +500 -500 10 5 150                                  Unit µV µV mA µV/ p-p Unless otherwise specified, VIN = +15 V, RL = 2 k to pin 7 (common). Output voltage change as a function of temperature is determined using the box method. Each device is tested at -55C, +25C, and +125C. At each temperature the output voltage (VOUT) must fall within the rectangular area bounded by the minimum and maximum temperatures. This method gives a maximum temperature coefficient of 9 ppm/C and a typical value of 3 ppm/C. Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to limits specified in table I for all lots not specifically tested. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 6 Case outline X. FIGURE 1. Case outline(s). SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 7 Case outline X - Continued.     Symbol     A   A1    b   b    D   E   E1    e   L   L1    Q   S   S1     Dimensions                                      Inches Min .215 .175 .016 .016 .860 .490 .295                    Max .250 .215 .020 .020 .885 .520 .305 .100 BSC .130 .150 .020 .100 .080               .255 .290 .035 .160 .180                                                                           Millimeters Min 5.46 4.44 0.41 0.41 21.84 12.45 7.49                    Max 6.35 5.46 0.51 0.51 22.48 13.21 7.75 2.54 BSC 3.30 3.81 0.51 2.54 2.03               6.48 7.37 0.89 4.07 4.57 Notes 8 4 4 7 5, 8 3                                        0 15 0 15 NOTES: 1. Index area: A notch, square-package corner, or a pin one index point shall be located adjacent to pin one and within the shaded area shown. The manufacturer's identification shall not be used as a pin one identification mark. 2. Dimension Q shall be measured from the seating plane to the base plane. 3. This dimension allows for off-center lid, meniscus, and weld squash. 4. The basic pin spacing is .100 inch (2.54 mm) between centerlines. Each pin centerline shall be located within ±.010 inch (0.25 mm) of its exact longitudinal position relative to pins 1 and 14. 5. Dimension S1 is not used. 6. Lead center when a = 0. E1 shall be measured at the centerline of the leads (see MIL-STD-1835). 7. All leads: Increase maximum limit by .003 inch (0.08 mm) measured at the widest diameter when lead finish A or B is applied. 8. If this configuration is used, no polymer or organic materials shall be applied or molded to the bottom of the package or cover the leads. FIGURE 1. Case outline(s) - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 8 Case outline Y. FIGURE 1. Case outline(s) - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 9 Case outline Y - Continued.     Symbol     A   b   b1    c   D   E   E1    e   L   L1    Q   S   S1  Dimensions                                   Inches Min .140 .014 .030 .008 .770 .480 .295                   Max .200 .023 .070 .015 .810 .510 .305 0.100 BSC .150 .180 .015 --.060             .200 --.035 .137 ---                                                                     Millimeters Min 3.56 0.36 0.76 0.20 19.56 12.19 7.49                   Max 5.08 0.58 1.78 0.38 20.57 12.95 7.75 2.54 BSC   5.08   --   0.89   3.48   -- 3.81 4.57 0.38 --1.52 Notes 2 6 4, 7 3 5 5                                     NOTES: 1. Index area: A notch or a lead one identification mark is located adjacent to lead one. 2. The minimum limit for dimension b1 may be .023 inch (0.58 mm) for all four corner leads only. 3. Dimension Q shall be measured from the seating plane to the base plane. 4. The basic pin spacing is .100 inch (2.54 mm) between centerlines. 5. Applies to all four corners. 6. E1 shall be measured at the centerline of all the leads. FIGURE 1. Case outline(s) - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 10 Device types 01 and 02.                                     2700 Terminal number Case outlines 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27  28                                    Terminal symbol   C, X, Y   NC  NC  NC  NC  NC  NC  GND  NC  NC  TEST POINT  VCC  +10 V ADJ  +10 V OUT  +10 V ADJ               Z Device types 03 and 04.                                    VO SEN -IN REF GND GND SEN NC NC NC NC NC NC NC NC NC NC NC NC NC VZ ZENER GND NC NC VOS VOS POWER GND VCC +IN VO FORCE   +10 V REF OUT                                     2702 Terminal number Case outlines 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26  27  28                                    Terminal symbol   C, X, Y   -10 V ADJ  -10 V OUT  -10 V ADJ  VEE  NC  NC  GND  NC  NC  TEST POINT  VCC  +10 V ADJ  +10 V OUT  +10 V ADJ              Z VO SEN -IN REF GND GND SEN NC NC -VOS -VOS VEE +IN VCC NC -IN VO FORCE -10 V REF OUT VO SENSE +10 V IN VZ ZENER GND NC NC VOS VOS POWER GND VCC +IN  VO FORCE  +10 V REF OUT                                      FIGURE 2. Terminal connections. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 11 Device types 05 and 06.                                         Terminal  symbol      C, X, Y  Z    NC  NC  NC  NC  NC  REF GND  NC  GND SENSE  NC  NC  NC  NC  GND  -VOS  NC  -VOS  NC  VEE  TEST POINT  +IN  VEE  NC  -10 V ADJ  PWR GND  -10 V OUT  -IN  -10 V ADJ  VO FORCE   VO SENSE   VO SENSE   NC   VZ   ZENER GND   NC   NC   NC   NC   NC   NC   NC   NC   NC  2701 Terminal number Case outlines 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28                                    FIGURE 2. Terminal connections - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 12 Device types 01 and 02. Device types 03 and 04. FIGURE 3. Trim circuit(s). SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 13 Device types 05 and 06. NOTES: 1. External 10 k potentiometer provides a ±20 mV minimum output offset adjust. Temperature effect is 4 µV/C per mV of offset correction (external adjustment optional). 2. Dual-in-line package only. FIGURE 3. Trim circuit(s) - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 14 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters ---- Final electrical parameters 1*, 2, 3, 4 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1 * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 15 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-7603. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, P. O. Box 3990, Columbus, Ohio 43216-5000, or telephone (614) 692-0676. 6.6 Sources of supply. Sources of supply are listed in QML-38534. The vendors listed in QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 85030 A REVISION LEVEL F SHEET 16 STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN DATE: 99-01-08 Approved sources of supply for SMD 85030 are listed below for immediate acquisition only and shall be added to QML-38534 during the next revision. QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next dated revision of QML-38534. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 8503001CA 8505001CC 8503001XX 8503001YA 8503001YC 8503001YX 8503001YA 85030013A 33256 33256 3/ 33256 33256 3/ 34707 34707 HS2700SD HS2700SD 2700SD/883B HS2700SD HS2700SD 2700SD/883B HC2700SD/883B HC2700SLCC/883B 8503002CA 8503002CC 8503002XX 8503002YA 8503002YC 8503002YX 8503002YA 85030023A 33256 33256 3/ 33256 33256 3/ 34707 34707 HS2700UD HS2700UD 2700UD/883B HS2700UD HS2700UD 2700UD/883B HC2700UD/883B HC2700ULCC/883B 8503003CA 8503003CC 8503003XX 8503003YA 8503003YC 8503003YX 8503003YA 85030033A 33256 33256 3/ 33256 33256 3/ 34707 34707 HS2702SD HS2702SD 2702SD/883B HS2702SD HS2702SD 2702SD/883B HC2702SD/883B HC2702SLCC/883B 8503004CA 8503004CC 8503004XX 8503004YA 8503004YC 8503004YX 8503004YA 85030043A 33256 33256 3/ 33256 33256 3/ 34707 34707 HS2702UD HS2702UD 2702UD/883B HS2702UD HS2702UD 2702UD/883B HC2702UD/883B HC2702ULCC/883B 1/ The lead finish shown for each PIN, representing a hermetic package, is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from a QML source. 1 of 2 STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN - Continued. DATE: 99-01-08 Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 8503005CA 8503005CC 8503005XX 8503005YA 8503005YC 8503005YA 8503005YC 8503005YA 85030053A 33256 33256 3/ 33256 33256 34031 34031 34707 34707 HS2701SD HS2701SD 2701SD/883B HS2701SD HS2701SD 2701SD/883B 2701SD/883B HC2701SD/883B HC2701SLCC/883B 8503006CA 8503006CC 8503006XX 8503006YA 8503006YC 8503006YA 8503006YC 8503006YA 85030063A 33256 33256 3/ 33256 33256 34031 34031 34707 34707 HS2701UD HS2701UD 2701UD/883B HS2701UD HS2701UD 2701UD/883B 2701UD/883B HC2701UD/883B HC2701ULCC/883B 1/ The lead finish shown for each PIN, representing a hermetic package, is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from a QML source. Vendor CAGE number Vendor name and address 33256 Sipex Corporation Hybrid Systems Division 22 Linnell Circle Billerica, CA 01821-3985 34031 Analog Devices, Incorporated 7910 Triad Center Drive Greensboro, NC 27409-9605 34707 Hycomp, Incorporated 165 Cedar Hill Street Marlborough, MA 01752-3035   The information contained herein is disseminated for convenience only and  the Government assumes no liability whatsoever for any inaccuracies in this  information bulletin.  2 of 2     
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