Data Sheet
AD4030-24/AD4032-24
24-Bit, 2 MSPS/500 kSPS, SAR ADCs
FEATURES
►
FUNCTIONAL BLOCK DIAGRAM
High performance
Throughput: 2 MSPS (AD4030-24) or 500 kSPS (AD4032-24)
options
► INL: ±0.9 ppm maximum from −40°C to +125°C
► SNR: 108.4 dB typical
► THD: −127 dB typical
► NSD: −169 dBFS/Hz typical
Low power
► 30 mW at 2 MSPS
► 10 mW at 500 kSPS
► 3 mW at 10 kSPS
Easy Drive™ features reduce system complexity
► Low 1.2 μA input current for dc inputs at 2 MSPS
► Wide common-mode input range: −(1/128) × VREF to
+(129/128) × VREF
Flexible external reference voltage range: 4.096 V to 5 V
► Accurate integrated reference buffer with 2 μF bypass
capacitor
Programmable block averaging filter with up to 216 decimation
► Extended sample resolution to 30 bits
► Overrange and synchronization bits
Flexi-SPI digital interface
► 1, 2, or 4 SDO lanes allows slower SCK
► Echo clock mode simplifies use of digital isolator
► Compatible with 1.2 V to 1.8 V logic
7 mm × 7 mm, 64-Ball CSP_BGA package with internal supply
and reference capacitors to help reduce system footprint
►
►
►
►
►
►
►
APPLICATIONS
►
►
►
►
►
►
Automatic test equipment
Digital control loops
Medical instrumentation
Seismology
Semiconductor manufacturing
Scientific instrumentation
Figure 1. Functional Block Diagram
GENERAL DESCRIPTION
The AD4030-24/AD4032-24 are 2 MSPS or 500 kSPS successive
approximation register (SAR), analog-to-digital converters (ADC)
with Easy Drive™. With a guaranteed maximum ±0.9 ppm integral
nonlinearity (INL) and no missing codes at 24-bits, the AD4030-24/
AD4032-24 achieve unparalleled precision from −40°C to +125°C.
Figure 1 shows the functional architecture of the AD4030-24/
AD4032-24.
A low drift, internal precision reference buffer eases voltage
reference sharing with other system circuitry. The AD4030-24/
AD4032-24 offer a typical dynamic range of 109 dB when using
a 5 V reference. The low noise floor enables signal chains requiring
less gain and lower power. A block averaging filter with programmable decimation ratio can increase dynamic range up to 155.5 dB.
The wide differential input and common mode ranges allow inputs
to use the full ±VREF range without saturating, simplifying signal
conditioning requirements and system calibration. The improved
settling of the Easy Drive analog inputs broadens the selection
of analog front-end components compatible with the AD4030-24/
AD4032-24. Both single-ended and differential signals are supported.
The versatile Flexi-SPI serial peripheral interface (SPI) eases host
processor and ADC integration. A wide data clocking window, multiple SDO lanes, and optional dual data rate (DDR) data clocking can
reduce the serial clock to 10 MHz while operating at a sample rate
of 2 MSPS or 500 kSPS. Echo clock mode and ADC host clock
mode relax the timing requirements and simplify the use of digital
isolators.
The 7 mm × 7 mm, 64-Ball CSP_BGA package of the AD4030-24/
AD4032-24 integrates all critical power supply and reference bypass capacitors, reducing the footprint and system component
count, and lessening sensitivity to board layout.
Rev. A
DOCUMENT FEEDBACK
TECHNICAL SUPPORT
Information furnished by Analog Devices is believed to be accurate and reliable "as is". However, no responsibility is assumed by Analog
Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to
change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Data Sheet
AD4030-24/AD4032-24
TABLE OF CONTENTS
Features................................................................ 1
Applications........................................................... 1
Functional Block Diagram......................................1
General Description...............................................1
Specifications........................................................ 4
Timing Specifications......................................... 6
Absolute Maximum Ratings.................................12
Thermal Resistance......................................... 12
Electrostatic Discharge (ESD) Ratings.............12
ESD Caution.....................................................12
Pin Configuration and Function Descriptions...... 13
Typical Performance Characteristics................... 15
Terminology......................................................... 20
Integral Nonlinearity Error (INL)....................... 20
Differential Nonlinearity Error (DNL).................20
Zero Error (ZE)................................................. 20
Gain Error (GE)................................................ 20
Spurious-Free Dynamic Range (SFDR)...........20
Effective Number of Bits (ENOB)..................... 20
Total Harmonic Distortion (THD)...................... 20
Dynamic Range (DR)....................................... 20
Signal-to-Noise Ratio (SNR)............................ 20
Signal-to-Noise-and-Distortion (SINAD)
Ratio............................................................... 20
Aperture Delay................................................. 20
Transient Response......................................... 20
Common-Mode Rejection Ratio (CMRR)......... 20
Power Supply Rejection Ratio (PSRR)............ 20
Theory of Operation.............................................21
Overview.......................................................... 21
Converter Operation.........................................21
Transfer Function............................................. 22
Analog Features............................................... 22
Digital Sample Processing Features................ 22
Applications Information...................................... 25
Typical Application Diagrams........................... 25
Analog Front-End Design................................. 25
Reference Circuitry Design ............................. 25
Device Reset.................................................... 27
Power Supplies................................................ 27
Serial Interface.................................................... 29
SPI Signals.......................................................29
Sample Conversion Timing and Data
Transfer.......................................................... 31
Clocking Modes ...............................................32
Data Clocking Requirements and Timing.........35
Layout Guidelines................................................39
Registers............................................................. 40
Register Details................................................... 41
Interface Configuration A Register................... 41
Interface Configuration B Register................... 41
Device Configuration Register..........................42
Chip Type Register...........................................42
Product ID Low Register.................................. 42
Product ID High Register..................................42
Chip Grade Register.........................................43
Scratch Pad Register....................................... 43
SPI Revision Register...................................... 43
Vendor ID Low Register................................... 44
Vendor ID High Register...................................44
Stream Mode Register..................................... 44
Interface Status A Register.............................. 44
Exit Configuration Mode Register.....................45
Averaging Mode Register.................................45
Offset Registers................................................46
Gain Registers..................................................46
Modes Register................................................ 47
Internal Oscillator Register............................... 47
Output Driver Register......................................48
Test Pattern Registers...................................... 48
Digital Diagnostics Register............................. 49
Digital Errors Register...................................... 49
Outline Dimensions............................................. 50
Ordering Guide.................................................50
Evaluation Boards............................................ 50
REVISION HISTORY
8/2022—Rev. 0 to Rev. A
Added AD4032-24........................................................................................................................................... 1
Changes to Features Section, Figure 1, and General Description Section..................................................... 1
Changes to Table 1.......................................................................................................................................... 4
Changes to Table 2.......................................................................................................................................... 6
Change to Table 9..........................................................................................................................................12
Changes to Figure 11.....................................................................................................................................13
Changes to Figure 25 Caption....................................................................................................................... 17
analog.com
Rev. A | 2 of 50
Data Sheet
AD4030-24/AD4032-24
TABLE OF CONTENTS
Added Figure 26; Renumbered Sequentially................................................................................................. 17
Changes to Figure 30 Caption and Figure 35................................................................................................18
Added Figure 31............................................................................................................................................ 18
Added Figure 36............................................................................................................................................ 19
Changes to Overview Section........................................................................................................................21
Changes to Figure 44 and Figure 45............................................................................................................. 25
Changes to Figure 46 and Reference Circuitry Design Section.................................................................... 26
Changes to Figure 50.................................................................................................................................... 29
Changes to Figure 54 and Figure 55............................................................................................................. 33
Changes to Table 23...................................................................................................................................... 43
Changes to Table 28...................................................................................................................................... 44
Changes to Table 29...................................................................................................................................... 45
Changes to Table 38...................................................................................................................................... 48
Updated Outline Dimensions......................................................................................................................... 50
Changes to Ordering Guide........................................................................................................................... 50
4/2022—Revision 0: Initial Version
analog.com
Rev. A | 3 of 50
Data Sheet
AD4030-24/AD4032-24
SPECIFICATIONS
VDD_5V = 5.4 V, VDD_1.8V = 1.8 V, VIO = 1.8 V, REFIN = 5 V, input common mode = 2.5 V, fS = 2 MSPS for the AD4030-24 or 500 kSPS for
the AD4032-24, and all specifications TMIN to TMAX, unless otherwise noted. Typical values are at TA = 25°C.
Table 1.
Parameter
RESOLUTION
ANALOG INPUT
Voltage Range
Absolute Input Voltage
Common-Mode Input Range
Common-Mode Rejection Ratio (CMRR)
Analog Input Current
Analog Input Capacitance
THROUGHPUT
Complete Cycle
AD4030-24
AD4032-24
Conversion Time
Acquisition Phase1
AD4030-24
AD4032-24
Throughput Rate
AD4030-24
AD4032-24
DC ACCURACY
No Missing Codes
Integral Nonlinearity Error (INL)
Differential Nonlinearity Error (DNL)
Transition Noise
Zero Error
Zero Error Drift
Gain Error
Gain Error Temperature Drift
Power Supply Sensitivity
Low Frequency Noise2
AC ACCURACY
Dynamic Range
Noise Spectral Density (NSD)
Total RMS Noise
Signal-to-Noise Ratio (SNR)
Spurious-Free Dynamic Range (SFDR)
Total Harmonic Distortion (THD)
Signal-to-Noise-and-Distortion (SINAD) Ratio
Oversampled Dynamic Range
analog.com
Test Conditions/Comments
Min
Typ
Max
24
VIN+ − VIN−
VIN+, VIN− to GND
(VIN+ + VIN−)/2
fIN = 10 kHz
Acquisition phase, T = 25°C
Converting any dc input at 2 MSPS
Acquisition phase
Outside acquisition phase (CPIN)
Bits
−(65/64) × VREF
−(1/128) × VREF
−(1/128) × VREF
132
0.8
1.2
120
4
+(65/64) × VREF
V
+(129/128) × VREF V
+(129/128) × VREF V
dB
nA
µA
pF
pF
500
2000
264
282
300
ns
ns
ns
244
1744
260
1760
275
1775
ns
ns
2
500
MSPS
kSPS
0
0
24
−0.9
−90
Buffer disabled, REF = 5 V
Buffer enabled, REFIN = 5 V
Buffer disabled, REF = 5 V
Buffer enabled, REFIN = 5 V
VDD_5V = 5.4 V ± 0.1 V
VDD_1.8V = 1.8 V ± 5%
Bandwidth = 0.1 Hz to 10 Hz
fIN = 1 kHz, −0.5 dBFS
fIN = 1 kHz, −0.5 dBFS
fIN = 1 kHz, −0.5 dBFS
fIN = 1 kHz, −0.5 dBFS
Averaging = 2
Averaging = 256
Averaging = 65536
Unit
−0.004
−0.008
105.6
105.6
±0.1
±0.5
21
0
±0.007
±0.0002
±0.0006
±0.025
±0.07
±0.1
±0.2
1.3
109
−169
12.5
108.4
127
−127
108.3
112
133
155.5
+0.9
+90
+0.004
+0.008
−115
Bits
ppm
LSB
LSB rms
μV
ppm/°C
%FS
%FS
ppm/°C
ppm/°C
ppm
ppm
µV p-p
dB
dBFS/Hz
µV rms
dB
dB
dB
dB
dB
dB
dB
Rev. A | 4 of 50
Data Sheet
AD4030-24/AD4032-24
SPECIFICATIONS
Table 1.
Parameter
SNR
SFDR
THD
SINAD
SNR
THD
SINAD
−3 dB Input Bandwidth
Aperture Delay
Aperture Jitter
INTERNAL REFERENCE BUFFER
REFIN Voltage Range
REFIN Bias Current
REFIN Input Capacitance
Reference Buffer Offset Error
Reference Buffer Offset Drift
Power-On Settling Time
EXTERNALLY OVERDRIVEN REFERENCE
REF Voltage Range
REF Current
AD4030-24
AD4032-24
REF Input Capacitance
DIGITAL INPUTS
Logic Levels
Input Voltage Low (VIL)
Input Voltage High (VIH)
Input Current Low (IIL)
Input Current High (IIH)
Input Pin Capacitance
DIGITAL OUTPUTS
Pipeline Delay
Output Voltage Low (VOL)
Output Voltage High (VOH)
analog.com
Test Conditions/Comments
Min
VDD_5V = 5.0 V, fIN = 1 kHz, −0.5 dBFS,
REFIN = 4.096 V
VDD_5V = 5.0 V, fIN = 1 kHz, −0.5 dBFS,
REFIN = 4.096 V
VDD_5V = 5.0 V, fIN = 1 kHz, −0.5 dBFS,
REFIN = 4.096 V
VDD_5V = 5.0 V, fIN = 1 kHz, −0.5 dBFS,
REFIN = 4.096 V
fIN = 100 kHz, −0.5 dBFS
fIN = 100 kHz, −0.5 dBFS
fIN = 100 kHz, −0.5 dBFS
External reference drives REFIN
5.3 V ≤ VDD_5V ≤ 5.5 V
4.8 V ≤ VDD_5V ≤ 5.25 V
4.75 V ≤ VDD_5V ≤ 5.25 V
REFIN = 5 V, TA = 25°C
REFIN = 4.5 V, TA = 25°C
REFIN = 4.096 V, TA = 25°C
External reference drives REF (REFIN = 0
V)
5.3 V ≤ VDD_5V ≤ 5.5 V
4.8 V ≤ VDD_5V ≤ 5.25 V
4.75 V ≤ VDD_5V ≤ 5.25 V
4.95
4.046
−50
−100
−100
4.95
4.046
fS = 2 MSPS
fS = 500 kSPS
Typ
Max
Unit
106.7
dB
130
dB
−130
dB
106.7
dB
108.1
−113
106.9
74
0.7
1.4
dB
dB
dB
MHz
ns
ps rms
5
4.5
4.096
5
40
±25
±25
±25
±0.3
3
5
4.5
4.096
5.05
4.146
+50
+100
+100
5.05
4.146
1.8
0.5
2
V
V
V
nA
pF
µV
μV
µV
µV/°C
ms
V
V
V
µA
µA
µF
1.14 V ≤ VIO ≤ 1.89 V
−0.3
0.65 × VIO
−10
−10
+0.35 × VIO
VIO + 0.3
+10
+10
V
V
µA
µA
pF
0.25 × VIO
V
V
2
1.14 V ≤ VIO ≤ 1.89 V
ISINK = 2 mA
ISOURCE = 2 mA
Conversion
results available
immediately after
completed
conversion
0.75 × VIO
Rev. A | 5 of 50
Data Sheet
AD4030-24/AD4032-24
SPECIFICATIONS
Table 1.
Parameter
POWER SUPPLIES
VDD_5V
VDD_1.8V
VIO3
Standby Current
VDD_5V
VDD_1.8V
VIO
Shutdown Current
VDD_5V
VDD_1.8V
VIO
Operating Current, AD4030-24
VDD_5V
VDD_1.8V
VIO
Operating Current, AD4032-24
VDD_5V
VDD_1.8V
VIO
Power Dissipation
tRESET_DELAY
tRESET_PW
TEMPERATURE RANGE
Specified Performance
Test Conditions/Comments
Min
Typ
Max
Unit
REF = 5 V
REF = 4.5 V
REF = 4.096 V
5.3
4.8
4.75
1.71
1.14
5.4
5
5
1.8
5.5
5.25
5.25
1.89
1.89
V
V
V
V
V
2 MSPS
VDD_5V = 5.4 V
VDD_1.8V = 1.8 V
VIO = 1.8 V, 1-lane SDO
500 kSPS
VDD_5V = 5.4 V
VDD_1.8V = 1.8 V
VIO = 1.8 V, 1-lane SDO
2 MSPS
500 kSPS
After power-on, delay from VDD_5V and
VDD_1.8V valid to RST assertion
RST pulse width
TMIN to TMAX
−40
500
90
1.14 V
SCK Low Time
SCK High Time
SCK Falling Edge to Data Remains Valid
SCK Falling Edge to Data Valid Delay
VIO > 1.71 V
VIO > 1.14 V
CS Rising Edge to SDO High Impedance
SDI Valid Setup Time to SCK Rising Edge
SDI Valid Hold Time from SCK Rising Edge
CS Falling Edge to First SCK Rising Edge
VIO > 1.71 V
VIO > 1.14 V
Last SCK Edge to CS Rising Edge
tCSPW
tSCK
10
ns
11.6
12.3
5.2
5.2
2.1
ns
ns
ns
ns
ns
analog.com
tSCKL
tSCKH
tHSDO
tDSDO
tCSDIS
tSSDI
tHSDI
tCSSCK
tSCKCS
Typ
Max
9.4
11.8
9
Unit
1.5
1.5
ns
ns
ns
ns
ns
11.6
12.3
5.2
ns
ns
ns
Rev. A | 7 of 50
Data Sheet
AD4030-24/AD4032-24
SPECIFICATIONS
Figure 3. Register Configuration Mode Write Timing
Figure 4. Register Configuration Mode Read Timing
Figure 5. Register Configuration Mode Command Timing
Table 4. SPI-Compatible Mode Timing
Parameter
Symbol
SCK Period
VIO > 1.71 V
VIO > 1.14 V
SCK Low Time
VIO > 1.71 V
VIO > 1.14 V
SCK High Time
VIO > 1.71 V
VIO > 1.14 V
SCK Falling Edge to Data Remains Valid
SCK Falling Edge to Data Valid Delay
VIO > 1.71 V
VIO > 1.14 V
tSCK
analog.com
Min
Typ
Max
Unit
9.8
12.3
ns
ns
4.2
5.2
ns
ns
4.2
5.2
1.4
ns
ns
ns
tSCKL
tSCKH
tHSDO
tDSDO
5.6
8.1
ns
ns
Rev. A | 8 of 50
Data Sheet
AD4030-24/AD4032-24
SPECIFICATIONS
Table 4. SPI-Compatible Mode Timing
Parameter
Symbol
CS Falling Edge to SDO Valid
VIO > 1.71 V
VIO > 1.14 V
CS Falling Edge to First SCK Rising Edge
VIO > 1.71 V
VIO > 1.14 V
Last SCK Edge to CS Rising Edge
CS Rising Edge to SDO High Impedance
CS Falling Edge to BUSY Rising Edge
tCSEN
Min
Typ
Max
Unit
6.8
9.3
ns
ns
ns
tCSSCK
tSCKCS
tCSDIS
tCSBUSY
9.8
12.3
4.2
9
6
ns
ns
ns
ns
ns
Figure 6. SPI Clocking Mode 1-Lane SDR Timing
Table 5. Echo Clock Mode Timing, SDR, 1-Lane
Parameter
Symbol
SCK Period
VIO > 1.71 V
VIO > 1.14 V
SCK Low Time, SCK High Time
VIO > 1.71 V
VIO > 1.14 V
SCK Rising Edge to Data/SCKOUT Remains Valid
SCK Rising Edge to Data/SCKOUT Valid Delay
VIO > 1.71 V
VIO > 1.14 V
CS Falling Edge to First SCK Rising Edge
VIO > 1.71 V
VIO > 1.14 V
Skew Between Data and SCKOUT
Last SCK Edge to CS Rising Edge
CS Rising Edge to SDO High Impedance
tSCK
analog.com
Min
Typ
Max
Unit
9.8
12.3
ns
ns
4.2
5.2
1.1
ns
ns
ns
tSCKL, tSCKH
tHSDO
tDSDO
5.6
8.1
ns
ns
+0.4
ns
ns
ns
ns
ns
tCSSCK
tSKEW
tSCKCS
tCSDIS
9.8
12.3
−0.4
4.2
0
9
Rev. A | 9 of 50
Data Sheet
AD4030-24/AD4032-24
SPECIFICATIONS
Figure 7. Echo Clock Mode Timing, SDR, 1-Lane
Table 6. Echo Clock Mode Timing, DDR, 1-Lane
Parameter
Symbol
Min
SCK Period
SCK Low Time, SCK High Time
SCK Edge to Data/SCKOUT Remains Valid
SCK Edge to Data/SCKOUT Valid Delay
VIO > 1.71 V
VIO > 1.14 V
CS Falling Edge to First SCK Rising Edge
Skew Between Data and SCKOUT
Last SCK Edge to CS Rising Edge
CS Rising Edge to SDO High Impedance
tSCK
tSCKL, tSCKH
tHSDO
tDSDO
12.3
5.2
1.1
Typ
Max
ns
ns
ns
6.2
8.7
tCSSCK
tSKEW
tSCKCS
tCSDIS
12.3
−0.4
9
Unit
0
+0.4
9
ns
ns
ns
ns
ns
ns
Figure 8. Echo Clock Mode Timing, DDR, 1-Lane
analog.com
Rev. A | 10 of 50
Data Sheet
AD4030-24/AD4032-24
SPECIFICATIONS
Table 7. Host Clock Mode Timing
Parameter
Symbol
SCK Period
OSC_DIV = No Divide
OSC_DIV = Divide by 2
OSC_DIV = Divide by 4
SCK Low Time
SCK High Time
CS Falling Edge to First SCKOUT Rising Edge
VIO > 1.71 V
VIO > 1.14 V
Skew Between Data and SCKOUT
Last SCKOUT Edge to CS Rising Edge
CS Rising Edge to SDO High Impedance
tSCKOUT
tSCKOUTL
tSCKOUTH
tDSCKOUT
tSKEW
tSCKOUTCS
tCSDIS
Min
Typ
Max
Unit
11.8
23.6
47.4
0.45 × tSCKOUT
0.45 × tSCKOUT
12.5
25
50
13.3
26.6
53.2
0.55 × tSCKOUT
0.55 × tSCKOUT
ns
ns
ns
ns
ns
10
10
−0.4
5.2
13.6
15
0
19
21
+0.4
ns
ns
ns
ns
ns
9
Figure 9. Host Clock Mode Timing, SDR, 1-Lane
Figure 10. Host Clock Mode Timing, DDR, 1-Lane
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Rev. A | 11 of 50
Data Sheet
AD4030-24/AD4032-24
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 8.
Parameter
Analog Inputs
IN+, IN−, REFIN to GND
Supply Voltage
VDD_5V, REF to GND
VDD_1.8V, VIO to GND
Digital Inputs to GND
CNV to GND
Digital Outputs to GND
Storage Temperature Range
Operating Junction Temperature Range
Maximum Reflow (Package Body)
Temperature
Rating
−0.3 V to VDD_5V + 0.3 V
−0.3 V to +6.0 V
−0.3 V to +2.1 V
−0.3 V to VIO + 0.3 V
−0.3 V to VIO + 0.3 V
−0.3 V to VIO + 0.3 V
−55°C to +150°C
−40°C to +125°C
260°C
Stresses at or above those listed under Absolute Maximum Ratings
may cause permanent damage to the product. This is a stress
rating only; functional operation of the product at these or any other
conditions above those indicated in the operational section of this
specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability.
Thermal performance is directly linked to printed circuit board
(PCB) design and operating environment. Careful attention to PCB
thermal design is required.
Table 9. Thermal Resistance
Package Type
θJA
θJC
Unit
05-08-1797
35
16
°C/W
ELECTROSTATIC DISCHARGE (ESD) RATINGS
The following ESD information is provided for handling of ESD-sensitive devices in an ESD protected area only.
Human body model (HBM) per ANSI/ESDA/JEDEC JS-001.
Field induced charged device model (FICDM) per ANSI/ESDA/JEDEC JS-002.
ESD Ratings for AD4030-24/AD4032-24
Table 10. AD4030-24/AD4032-24, 64-Ball CSP_BGA
ESD Model
Withstand Threshold (kV)
Class
HBM
FICDM
4
1.25
3A
C3
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Charged devices and circuit boards can discharge without detection. Although
this product features patented or proprietary protection circuitry,
damage may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to avoid
performance degradation or loss of functionality.
analog.com
Rev. A | 12 of 50
Data Sheet
AD4030-24/AD4032-24
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 11. Pin Configuration
Table 11. Pin Function Descriptions
Type1
Description
A1, A4, A5, B2, B4, B5, C2 to GND
C5, D1, D4, D5, E1, E4, E5,
F2 to F5, G2, G4, G5, H1, H2,
H4
A2
REFIN
P
Power Supply Ground.
AI
A3, B3
VDD_5V
P
A6
CNV
DI
A7
A8, B8
RST
VIO
DI
P
B1
B6, B7, C6, D6, E6, E7, F6,
G6, H8
C1
C7
C8
D2, D3, E2, E3
IN+
IOGND
AI
P
Buffered Reference Input. When using the internal reference buffer, drive REFIN with 4.096 V to 5 V
(referred to ground). To disable the reference buffer, tie REFIN to ground and drive REF with 4.096 V to
5 V.
5 V Power Supply. The range of VDD_5V depends on the reference value, 5.3 V to 5.5 V for a 5 V
reference, and 4.75 V to 5.25 V for a 4.096 V reference. This pin has a 1 μF bypass capacitor inside the
package.
Convert Input. A rising edge on this input powers up the device and initiates a new conversion. This
signal must have low jitter to achieve the specified performance of the ADC. Logic levels are determined
by the VIO pin.
Reset Input (Active Low). Asynchronous device reset.
Input/Output Interface Digital Power. Nominally, this pin is at the same supply as the host interface (1.8
V, 1.5 V, or 1.2 V). This pin has a 0.2 μF bypass capacitor inside the package. For VIO < 1.4 V, Bit IO2X
of the output driver register must be set to 1.
Positive Analog Input.
VIO Ground. Connect to the same ground plane as all GND pins.
IN−
SDO3
SDO1
REF
AI
DO
DO
AI
D7
D8
E8
SDO2
SDO0
BUSY_SCKOUT
DO
DO
DO
Pin No.
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Mnemonic
Negative Analog Input.
Serial Data Output. The conversion result is output on this pin. It is synchronized to SCK.
Serial Data Output. The conversion result is output on this pin. It is synchronized to SCK.
Optional Unbuffered Reference Input. Drive REF with 4.096 V to 5 V (referred to ground). This pin has a
2 μF bypass capacitor inside the package. When using the internal reference buffer, do not connect REF.
Serial Data Output. The conversion result is output on this pin. It is synchronized to SCK.
Serial Data Output. The conversion result is output on this pin. It is synchronized to SCK.
BUSY Indicator in SPI Clocking Mode. This pin goes high at the start of a new conversion and returns
low when the conversion has finished. Logic levels are determined by the VIO pin. When SCKOUT is
enabled, this pin function is either an echo of the incoming SCK from the host controller or a clock
sourced by the internal oscillator.
Rev. A | 13 of 50
Data Sheet
AD4030-24/AD4032-24
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Table 11. Pin Function Descriptions
Type1
Pin No.
Mnemonic
F1
F7, F8, G7, G8
G1
G3, H3
NIC
DNC
NIC
VDD_1.8V
P
H5
H6
H7
CS
SDI
SCK
DI
DI
DI
1
Description
Not Internally Connected. These pins are not connected internally.
Do Not Connect to These Pins. They are internally connected to digital output drivers in high-Z mode.
Not Internally Connected. These pins are not connected internally.
1.8 V Power Supply. The range of VDD_1.8V is 1.71 V to 1.89 V. This pin has a 1 μF bypass capacitor
inside the package.
Chip Select Input (Active Low).
Serial Data Input.
Serial Data Clock Input. When the device is selected (CS = low), the conversion result is shifted out by
this clock.
AI is analog input, P is power, DI is digital input, and DO is digital output.
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Rev. A | 14 of 50
Data Sheet
AD4030-24/AD4032-24
TYPICAL PERFORMANCE CHARACTERISTICS
VDD_5V = 5.4 V, VDD_1.8V = 1.8 V, VIO = 1.8V, REFIN = 5 V, input common mode = 2.5 V, fS = 2 MSPS for the AD4030-24 or 500 kSPS for
the AD4032-24, and all specifications TMIN to TMAX, unless otherwise noted. Typical values are at TA = 25°C.
Figure 12. INL Error vs. Output Code, Differential Input
Figure 13. INL Error vs. Output Code, Single-Ended Input
Figure 14. Code Histogram for Shorted Inputs
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Figure 15. FFT, 2 MSPS, fIN = 1 kHz, VREF = 5 V
Figure 16. SNR, SINAD vs. Input Frequency
Figure 17. THD vs. Input Frequency, Various Amplitudes
Rev. A | 15 of 50
Data Sheet
AD4030-24/AD4032-24
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 18. SNR, SINAD vs. Input Amplitude, fIN = 1 kHz
Figure 21. INL vs. Temperature
Figure 19. SNR, SINAD vs. Temperature, fIN = 1 kHz
Figure 22. Zero Error and Gain Error vs. Temperature
Figure 20. THD vs. Temperature, fIN = 1 kHz
Figure 23. Dynamic Range vs. Number of Averages
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Rev. A | 16 of 50
Data Sheet
AD4030-24/AD4032-24
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 24. Low Frequency Noise (Output Data Rate = 19.5 SPS After
Averaging Blocks of 2048 Samples)
Figure 27. Reference Buffer Offset vs. Temperature
Figure 28. Error During Conversion Burst After Long Idle Time
Figure 25. Analog Input Current vs. Differential Input Voltage, AD4030-24, 2
MSPS
Figure 29. REFIN Current Normal Operation and REFIN Current Shutdown
Mode vs. Temperature
Figure 26. Analog Input Current vs. Differential Input, AD4032-24, 500 kSPS
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Rev. A | 17 of 50
Data Sheet
AD4030-24/AD4032-24
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 30. REF Current vs. Analog Input, AD4030-24, 2 MSPS
Figure 33. REF Current vs. Temperature
Figure 31. REF Current vs. Analog Input, AD4032-24, 500 kSPS
Figure 34. Supply Current vs. Sample Rate
Figure 32. Common-Mode Rejection Ratio (CMRR) vs. Input Frequency
Figure 35. Supply Current vs. Temperature, AD4030-24, 2 MSPS
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Rev. A | 18 of 50
Data Sheet
AD4030-24/AD4032-24
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 36. Supply Current vs. Temperature, AD4032-24, 500 kSPS
Figure 37. Standby Current vs. Temperature
Figure 38. Shutdown Current vs. Temperature
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Rev. A | 19 of 50
Data Sheet
AD4030-24/AD4032-24
TERMINOLOGY
INTEGRAL NONLINEARITY ERROR (INL)
INL is the deviation of each individual code from a line drawn from
negative full scale through positive full scale. The point used as
negative full scale occurs ½ LSB before the first code transition.
Positive full scale is defined as a level 1½ LSB beyond the last
code transition. The deviation is measured from the middle of each
code to the true straight line (see Figure 40).
DIFFERENTIAL NONLINEARITY ERROR (DNL)
In an ideal ADC, code transitions are 1 LSB apart. DNL is the
maximum deviation from this ideal value. It is often specified in
terms of resolution for which no missing codes are guaranteed.
ZERO ERROR (ZE)
Zero error is the difference between the ideal midscale voltage, 0 V,
and the actual voltage producing the midscale output code, 0 LSB.
GAIN ERROR (GE)
The first transition (from 100 ... 00 to 100 ... 01) occurs at a level ½
LSB above nominal negative full scale. The last transition (from 011
… 10 to 011 … 11) occurs for an analog voltage 1½ LSB below the
nominal full scale. The gain error is the deviation of the difference
between the actual level of the last transition and the actual level of
the first transition from the difference between the ideal levels.
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
SFDR is the difference, in decibels (dB), between the rms amplitude
of a full-scale input signal and the peak spurious signal.
EFFECTIVE NUMBER OF BITS (ENOB)
ENOB is a measurement of the resolution with a sine wave input.
It is related to SINAD as follows: ENOB = (SINADdB − 1.76)/6.02.
ENOB is expressed in bits.
TOTAL HARMONIC DISTORTION (THD)
THD is the ratio of the rms sum of the first five harmonic components to the rms value of a full-scale input signal and is expressed
in decibels.
SIGNAL-TO-NOISE-AND-DISTORTION (SINAD)
RATIO
SINAD is the ratio of the rms voltage of a full-scale sine wave to
the rms sum of all other spectral components that are less than the
Nyquist frequency, including harmonics but excluding dc. The value
of SINAD is expressed in decibels.
APERTURE DELAY
Aperture delay is the measure of the acquisition performance and
is the time between the rising edge of the CNV input and when the
input signal is held for a conversion.
TRANSIENT RESPONSE
Transient response is the time required for the ADC to acquire a
full-scale input step to ±1 LSB accuracy.
COMMON-MODE REJECTION RATIO (CMRR)
CMRR is the ratio of the power in the ADC output at the frequency,
f, to the power of a 4.5 V p-p sine wave applied to the input
common-mode voltage of frequency, f.
CMRR (dB) = 10× log(PADC_IN/PADC_OUT)
where:
PADC_IN is the common-mode power at the frequency, f, applied to
the inputs.
PADC_OUT is the power at the frequency, f, in the ADC output.
POWER SUPPLY REJECTION RATIO (PSRR)
PSRR is the ratio of the power in the ADC output at the frequency,
f, to the power of a 200 mV p-p sine wave applied to the ADC VDD
supply of frequency, f.
PSRR (dB) = 10 × log(PVDD_IN/PADC_OUT)
where:
PVDD_IN is the power at the frequency, f, at the VDD pin.
PADC_OUT is the power at the frequency, f, in the ADC output.
DYNAMIC RANGE (DR)
Dynamic range is the rms voltage of a full-scale sine wave to the
total rms voltage of the noise measured. The value for dynamic
range is expressed in decibels. It is measured with a signal at −60
dBFS so that it includes all noise sources and DNL artifacts.
SIGNAL-TO-NOISE RATIO (SNR)
SNR is the ratio of the rms voltage of a full-scale sine wave to
the rms sum of all other spectral components below the Nyquist
frequency, excluding harmonics and dc. The value for SNR is
expressed in decibels.
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Rev. A | 20 of 50
Data Sheet
AD4030-24/AD4032-24
THEORY OF OPERATION
Figure 39 shows the basic functions of the AD4030-24/AD4032-24 .
Figure 39. AD4030-24/AD4032-24 Functional Block Diagram and Signal Processing Architecture
OVERVIEW
The AD4030-24/AD4032-24 are low noise, low power, high
speed, 24-bit successive approximation register (SAR) ADCs. The
AD4030-24 is capable of converting 2,000,000 samples per second
(2 MSPS), and the AD4032-24 is capable of converting 500,000
samples per second (500 kSPS). It offers several analog and digital
features to ease system design. The analog features include a wide
common-mode range that eases level shifting requirements as well
as an extended fully differential input range of ±(65/64) × VREF,
easing the margin requirements on signal conditioning.
The AD4030-24/AD4032-24 have an integrated reference buffer
with an integrated decoupling capacitor to minimize the external
components on board. The on-chip track-and-hold circuitry does
not exhibit any pipeline delay or latency, making this circuitry ideal
for control loops and high speed applications. The digital features
include offset correction, gain adjustment, and averaging, which
offload the host processor. The user can configure the device for
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one of several output code formats (see the Summary of Selectable
Output Data Formats section).
The AD4030-24/AD4032-24 use a Flexi-SPI, allowing the data
to be accessed via multiple SPI lanes, which relaxes clocking
requirements for the host SPI controller. An echo clock mode is
also available to assist in data clocking, simplifying the use of
isolated data interfaces. The AD4030-24/AD4032-24 has a valid
first conversion after exiting power-down mode. The architecture
achieves ±0.9 ppm INL maximum, with no missing codes at 24 bits
and 108.4 dB SNR. The AD4030-24 dissipates only 30 mW at 2
MSPS.
CONVERTER OPERATION
The AD4030-24/AD4032-24 operate in two phases, acquisition
phase and conversion phase. In the acquisition phase, the internal
track-and-hold circuitry is connected to each input pin (IN+, IN−)
and samples the voltage on each pin independently. Issuing a
Rev. A | 21 of 50
Data Sheet
AD4030-24/AD4032-24
THEORY OF OPERATION
rising edge pulse on the CNV pin initiates a conversion. The rising
edge pulse on the CNV pin also asserts the BUSY signal to
indicate a conversion in progress. At the end of the conversion,
the BUSY signal is deasserted. The conversion result is a 24-bit
code representing the input voltage difference and an 8-bit code
representing the input common-mode voltage. Depending on the
device configuration, this conversion result can be processed digitally and latched into the internal output register. The acquisition
circuit on each input pin is also precharged to the previous sample
voltage, which minimizes the kick-back charge to the input driver.
The host processor retrieves the output code via the SDO pins that
are internally connected to the internal output register.
TRANSFER FUNCTION
In the default configuration, the AD4030-24/AD4032-24 digitizes the
full-scale difference voltage of 2 × VREF into 224 levels, resulting in
an LSB size of 0.596 µV with VREF = 5 V. Note that 1 LSB at 24
bits is approximately 0.06 ppm. The ideal transfer function is shown
in Figure 40. The differential output data is in twos complement
format. Table 12 summarizes the mapping of input voltages to
differential output codes.
analog input of the AD4030-24/AD4032-24 easier to drive than other conventional SAR ADCs. The reduced kickback, combined with
a longer acquisition phase, means reduced settling requirements on
the driving amplifier. This combination also allows the use of larger
resistor values, which are beneficial for improving amplifier stability.
Furthermore, the bandwidth of the RC filter is reduced, resulting in
lower noise and/or power consumption of the signal chain.
The common-mode voltage is not restricted except by the absolute
voltage range for each input (from −1/128 × VREF to 129/128 ×
VREF). The analog inputs can be modeled by the equivalent circuit
shown in Figure 41. In the acquisition phase, each input pin has
approximately 116 pF input capacitance (CIN) from the sampling
capacitor in series with 19 Ω on resistance (RON) of the sampling
switch. During conversion phase, each input has the capacitance
of the input pin (CPIN), which is about 4 pF. Any signal that is
common to both inputs is reduced by the common-mode rejection
of the ADC. During conversion, the analog inputs draw only a small
leakage current.
Figure 41. Equivalent Circuit for the AD4030-24/AD4032-24 Differential
Analog Input
Figure 40. ADC Ideal Transfer Function for the Differential Output Codes
(FSR Is Full-Scale Range)
Table 12. Input Voltage to Output Code Mapping
Description
Analog Input Voltage
Difference
Digital Output Code (Twos
Complement, Hex)
FSR − 1LSB
Midscale + 1LSB
Midscale
Midscale − 1LSB
−FSR + 1LSB
−FSR
(8388607 × VREF)/(8388608)
VREF/(8388608)
0V
−VREF/(8388608)
−(8388607 × VREF)/(8388608)
− VREF
0x7FFFFF
0x000001
0x000000
0xFFFFFF
0x800001
0x800000
ANALOG FEATURES
The AD4030-24/AD4032-24 has a precharging circuit as part of
the internal track-and-hold circuitry, which charges the internal
sampling capacitors to the previously sampled input voltage. This
reduces the charge kickback, making the precharge circuit on the
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Each input is sampled independently. The conversion results do
not saturate assuming each of the inputs are within the specified
full-scale input range. Note that digital domain saturation occurs
if the digital offset and digital gain parameters are configured
to map the conversion result to numeral values that exceed the
full-scale digital range (−223 to +223− 1 for the 24-bit word). An
input voltage difference up to ±(65/64) × VREF can be captured and
converted without saturation by setting the digital gain parameter to
a value < 1.
The slew rate at the analog input pins must be less than 400 V/µs
during the acquisition phase and less than 30 V/µs at the sampling
moment to ensure good performance. This can be ensured by
choosing values for the external RC circuit that allow the RC
time-constant to be more than 12.5 ns (R × C > 12.5e-9).
DIGITAL SAMPLE PROCESSING FEATURES
The AD4030-24/AD4032-24 supports several digital and data processing features that can be applied to the signal samples. These
features are enabled and disabled via the control registers of the
AD4030-24/AD4032-24. Figure 39 contains a signal processing
architecture block diagram showing the available digital and data
processing features.
Rev. A | 22 of 50
Data Sheet
AD4030-24/AD4032-24
THEORY OF OPERATION
Full-Scale Saturation
The conversion results saturate digitally (before any post-processing) when either or both inputs exceed the analog limits specified
herein. After applying offset and gain scaling, the results are truncated to 24-bit representation (saturating at maximum 0x7FFFFF
and minimum 0x800000). Care must be taken to avoid unintentional
saturation, especially when applying digital offset and/or gain scaling. See the Digital Offset Adjust and Digital Gain sections for more
details on the use of these features.
Common-Mode Output
When the host controller writes 0x1 or 0x2 to the OUT_DATA_MD
bit field of the modes register (see the Modes Register section),
an 8-bit code representing the input common-mode voltage is
appended to the 16-bit or 24-bit code representing the input voltage
difference. The LSB size of the 8-bit code is VREF/256. The 8-bit
code saturates at 0 and 255 when the common mode input voltage
is 0 V and VREF, respectively. The 8-bit code is not affected by
digital offset and gain scaling, which is applied only to the code
representing the input voltage difference.
Block Averaging
The AD4030-24/AD4032-24 provide a block averaging filter
(SINC1) with programmable block length 2N, N = 1, 2, 3, …, 16.
The filter is reset after processing each block of 2N samples. The
filter is enabled by writing 0x3 to the OUT_DATA_MD bit field of
the modes register (see the Modes Register section) as well as
a value (1 ≤ N ≤ 16) to the AVG_VAL bit field in the averaging
mode register (see the Averaging Mode Register section). In this
configuration, the output sample word is 32 bits. The 30 most
significant bits (MSBs) represent the numerical value of the 24-bit
codes averaged in blocks of 2N samples. The automatic scaling
allows the 24 MSBs of the 30-bit code are equal to the 24-bit codes
when averaging blocks of constant values. The 31st bit (OR) is an
overrange warning bit that is high when one or more samples in the
block are subject to saturation. The 32nd bit (SYNC) is high once
every 2N conversion cycles to indicate when the average values
are updated at the end of each block of samples. See the Digital
Sample Processing Features section for more information.
The effective data rate in averaging mode is fCNV/2N. The reset
value of N in the AVG_VAL bit field is 0x00 (no averaging). Figure
57 shows an example timing diagram in averaging mode. Figure 42
shows the frequency response of the filter for an N = 1, 2, 3, 4, 5.
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Figure 42. Frequency Response Examples for the Block Averaging Filter
Digital Offset Adjust
The ADC can be programmed to add a 24-bit signed offset value
to the sample data (see the Register Details section). When adding
an offset to the samples, it is possible to cause the sample data
to saturate numerically. The user must take this into account when
using the offset feature. The default value is 0x000000. See the
Offset Registers section for more details.
Digital Gain
The ADC can be programmed to apply a 16-bit unsigned digital
gain (Register 0x1C and Register 0x1D) to the digital samples (see
the Register Details section). The gain is applied to each sample
based on the following equation:
CodeOUT = CodeIN × (USER_GAIN/0x8000)
where:
0x0000 ≤ USER_GAIN ≤ 0xFFFF.
The effective gain range is 0 to 1.99997. Note that applying gain to
the samples may cause numerical saturation. The default value is
0x8000 (gain = 1). To measure input voltage differences exceeding
±VREF, set the gain less than the unity to avoid the numerical
saturation of the 24-bit, 16-bit, or 30-bit output differential codes.
See the Gain Registers section for more details.
Test Pattern
To facilitate functional testing and debugging of the SPI, the
host controller can write a 32-bit test pattern to the AD4030-24/
AD4032-24 (see the Test Pattern Registers section). The value
written to the test pattern registers is output using the normal
sample cycle timing. The 32-bit test pattern output mode is enabled
by writing 0x4 to the OUT_DATA_MD bit field of the modes register
(see the Modes Register section). The default value stored in the
test pattern registers is 0x5A5A0F0F.
Rev. A | 23 of 50
Data Sheet
AD4030-24/AD4032-24
THEORY OF OPERATION
Summary of Selectable Output Data Formats
Figure 43 summarizes the output data formats that are available
on the AD4030-24/AD4032-24, which are selected in the modes
register (see the Modes Register section). Note that the OR and
SYNC flags are each 1-bit.
Figure 43. Summary of Selectable Output Sample Formats
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Rev. A | 24 of 50
Data Sheet
AD4030-24/AD4032-24
APPLICATIONS INFORMATION
TYPICAL APPLICATION DIAGRAMS
Figure 44. Differential Driver Analog Front End
Figure 45. Unity Gain Dual Buffer Configuration
ANALOG FRONT-END DESIGN
Driver Amplifier Choice
Figure 44 shows two examples for driving the AD4030-24/
AD4032-24. Either can be combined with an upstream stage that
provides additional signal conditioning. Both can accommodate
single-ended or differential inputs. To take advantage of the SNR
and THD performance of the AD4030-24/AD4032-24, it is important
to choose a driver amplifier that has low enough noise and THD
sufficient to meet the application requirements. In addition to the
amplifiers shown in Figure 44, the LTC6227 is another driver option.
Analog Devices offers several companion driver amplifiers that can
be found on the ADC drivers web page.
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REFERENCE CIRCUITRY DESIGN
The AD4030-24/AD4032-24 require an external reference to define
its input range. This reference must be 4.096 V to 5 V. An optimal
choice for the reference is the ADR4550 or ADR4540. These
ADCs have several features that reduce the charge pulled from
the reference, making the AD4030-24/AD4032-24 much easier to
use than other ADCs. For most applications, the reference can
drive the REFIN pin, which has an internal precision buffer that
isolates the reference from the ADC circuitry. The buffer has a
high input impedance and small input current (5 nA typical) that
allows multiple ADCs to share a common reference. An RC circuit
between the reference and the REFIN pin can be used to filter
Rev. A | 25 of 50
Data Sheet
AD4030-24/AD4032-24
APPLICATIONS INFORMATION
reference noise (see Figure 46). Suggested values are 100 Ω < R <
1 kΩ, and C ≥ 10 μF.
Figure 46. Reference with Noise Filter
For the best possible gain error, the internal buffer can be disabled
(REFIN = 0 V) and an external reference can be used to drive the
REF pins. The current drawn by the REF pins is small ( 1.71 V, and 81 MHz for 1.14 V ≤ the VIO
pins < 1.71 V.
► SDO0 through SDO3 (outputs). Data lanes to the host controller.
The number of active data lanes can be either 1, 2, or 4 lanes
(see Table 14). The number of data lanes is configured in the
Modes Register section.
► BUSY_SCKOUT (output). The behavior of the BUSY_SCKOUT
pin is dependent on the selected clocking mode. Table 13 defines the behavior of the BUSY_SCKOUT pin for each clocking
mode.
►
Table 13. BUSY_SCKOUT Pin Behavior vs. Clocking Mode
Clocking Mode
Behavior
SPI Clocking Mode
Valid BUSY_SCKOUT pin signal for the ADC
conversion status. The busy signal on the
BUSY_SCKOUT pin goes high when a conversion is
triggered by the CNV signal. The busy signal on the
BUSY_SCKOUT pin goes low when the conversion is
complete.
Bit clock. The BUSY_SCKOUT pin is a delayed version
of SCK input.
Bit clock. The BUSY_SCKOUT pin sources the clock
signal from the internal oscillator.
Echo Clock Mode
Host Clock Mode
Register Access Mode
Figure 50. AD4030-24/AD4032-24 Multilane SPI
SPI SIGNALS
The SPI is a multilane interface that is used to both configure the
ADC as well as retrieve sampled data. It consists of the following
signals:
CS (input) (chip select). CS must be set to low to initiate and
enable a data transfer to or from the SDI pins or SDOx pins of
the ADC. CS timing for reading sample data can be moderated
by observing the state of the BUSY pin. For echo clock mode
and host clock mode, CS timing must be controlled by the host
processor because the BUSY_SCKOUT pin is used as the bit
clock output for these clocking modes.
► SDI (input). Serial data input stream from the host controller to
the ADC. The SDI signal is only used when writing data into one
of the user registers of the AD4030-24/AD4032-24.
► CNV (input). The CNV signal is sourced by the host controller
and initiates a sample conversion. The frequency of the CNV signal determines the sampling rate of the AD4030-24/AD4032-24.
The maximum frequency of the CNV clock is 2 MSPS.
►
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The AD4030-24/AD4032-24 offer programmable user registers that
are used to configure the device as outlined in the Registers
section. By default, at power-up, the device is in conversion mode.
Therefore, to access the user registers, a special access command
must be sent by the host controller over the SPI, as shown in Figure
5. When this register access command is sent over the SPI, the
device enters the register configuration mode. To read back the
values from one of the user registers listed in the Registers section,
the host controller must send the pattern shown in Figure 4. To
write to one of the user registers, the host controller must send
the pattern shown in Figure 3. In either case (read/write), the host
controller must always issue 24 clock pulses on SCK line and pull
CS low for the entire transaction.
After writing to/reading from the appropriate user registers, the host
controller must exit the register configuration mode by writing 0x01
to register address 0x0014 as detailed in the EXIT configuration
mode register. An algorithm for register read/write access is as
follows:
1. Perform a read back from a dummy register address 0x3FFF, to
enter the register configuration mode.
2. Read back from or write to the desired user register addresses.
3. Exit the register configuration mode by writing 0x01 to register
address 0x0014. Exiting register configuration mode causes the
register updates to take effect.
Rev. A | 29 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
Stream Mode
The AD4030-24/AD4032-24 also offer a way to perform bulk register read/write transactions, while the AD4030-24/AD4032-24 is in
register configuration mode. To perform bulk read/write registers
transactions, CS must be kept low and SCK pulses must be issued
in multiples of 8 as each register is only one byte (8 bits) wide.
In stream mode, only address decrementing is allowed, meaning
that the user can read back from/write to the initial register address
and register addresses that are directly below the initial register
address. It is recommended that register accesses in stream mode
be applied to register blocks with contiguous addresses. However, it
is possible to address registers that are not present in the register
map. To do so, simply write all zeros to these registers, or, when
reading back, simply discard the contents read from these registers,
since it is random data. See the Registers section to see which
register address is valid and continuous. For example, to read back
a 24-bit offset value in one shot, the user must issue 24 SCK pulses
starting from Register Address 0x0018. Figure 51 shows timing
diagram for bulk read starting at a given address.
Figure 51. Stream Mode Bulk Register Read Back Operation
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Rev. A | 30 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
SAMPLE CONVERSION TIMING AND DATA
TRANSFER
A conversion is started on the rising edge of the CNV signal, as
shown in Figure 52. Once the conversion is complete, CS can be
asserted, which causes the current conversion result to be loaded
into the output shift register.
Referring to Figure 52, there are two optional data transfer zones
for sample N. Zone 1 represents the use case where CS is asserted immediately following the de-assertion of BUSY signal for the
sample N conversion (in SPI conversion mode), or after 300 ns for
echo and host clock modes. For Zone 1, the available time to read
out sample N is given by the following:
Zone 1 Data Read Window = tCYC – tCONV – tQUIET_CNV_ADV
For example, if fCNV is 2 MSPS (tCYC = 500 ns) and using the typical
value of tCONV (282 ns), the available window width is 198.4 ns (=
500 ns – 282 ns – 19.6 ns).
Zone 2 represents the case where assertion of CS to read Sample
N is delayed until after the conversion for Sample N + 1 is initiated.
To prevent data corruption, a quiet zone must be observed before
and after each rising edge of the CNV signal, as shown in Figure
52. The quiet zone immediately before the rising edge of CNV is
tQUIET_CNV_ADV and is equal to 19.6 ns. The quiet zone immediately
after the rising edge of CNV is tQUIET_CNV_DELAY and is equal to 9.8
ns. Assuming that the CS is asserted immediately after the quiet
zone around the rising edge of CNV, the amount of time available to
clock out the data is the following:
Zone 2 Data Read Window = tCYC – tQUIET_CNV_DELAY –
tQUIET_CNV_ADV
For example, if fCNV is 2 MSPS (tCYC = 500 ns) and using the typical
value of tCONV (282 ns), the available window width is 470.6 ns (=
500 ns – 9.8 ns – 19.6 ns). The Zone 2 transfer window is longer
than the Zone 1 window, which can enable the use of a slower
SCK on the SPI and ease the timing requirements for the interface.
When using Zone 2 for the data transfer, it is recommended to
assert CS immediately after the quiet zone. However, Zone 2 must
be asserted at least 25 ns before the falling edge of BUSY for
Sample N + 1. If not, Sample N is overwritten with Sample N + 1.
Figure 52. Example Timing for Data Transfer Zones
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Rev. A | 31 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
CLOCKING MODES
This section covers the various clocking modes supported by the
AD4030-24/AD4032-24 SPI. These modes are available for 1-lane,
2-lanes, and 4-lanes. The clocking mode is configured in the modes
register (see Table 16 for register descriptions).
SPI Clocking Mode
SPI clocking mode is the default clocking mode of the AD4030-24/
AD4032-24 and is equivalent to a host-sourced bit clock (SCK),
in which the host controller uses its own clock to latch the output
data. The SPI-compatible clocking mode is enabled by writing 0x0
to the CLK_MD bit field of the modes register (see the Modes
Register section). The interface connection is as shown in Figure
50. In this mode, the BUSY_SCKOUT pin signal is valid and
indicates the completion of a conversion (high to low transition of
the BUSY_SCKOUT pin). A simplified sample cycle is shown in
Figure 53. When not in averaging mode, if the host controller does
not use the BUSY_SCKOUT pin signal to detect the completion
of a conversion and instead uses an internal timer to retrieve the
data, the host controller must wait at least 300 ns after the rising
edge of the CNV pulse before asserting CS low. When operating in
block averaging mode, the host controller must assert CS low no
sooner than 300 ns after the rising edge of the CNV pulse for the
last sample in the block.
Figure 53. Typical Sample Cycle for SPI Clocking Mode
analog.com
Rev. A | 32 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
Echo Clock Mode
Figure 54 shows the signal connections for the echo clock mode.
The echo clock mode is enabled by writing 0x1 to the CLK_MD
bit field of the modes register (see the Modes Register section).
In this mode, the BUSY_SCKOUT pin cannot be used to detect
a conversion completion. The BUSY_SCKOUT pin becomes a bit
clock output and is sourced by looping through the SCK of the
host controller to the BUSY_SCKOUT pin (with some fixed delay,
5.4 ns to 7.9 ns, depending on the voltage of the VIO pins). To
begin retrieving the conversion data in nonaveraging mode, the
host controller must assert CS low no sooner than 300 ns after
the rising edge of the CNV pulse. When the ADC is configured for
block averaging mode, the host controller must assert CS low no
sooner than 300 ns after the rising edge of the CNV pulse for the
last sample in the block. Example timing diagrams are shown in
the Data Clocking Requirements and Timing section. When echo
clock mode is enabled, the BUSY_SCKOUT pin is aligned with the
SDOx pins transitions, making the data and clock timing insensitive
to asymmetric propagation delays in the paths of the SDOx pins
and SCK pins.
the rising edge of the CNV pulse. When the ADC is configured in
averaging mode for 2N averages, the host must not assert CS low
sooner than 300 ns after the rising edge of the CNV pulse for the
last sample in the block.
Figure 55. Host Clock Mode Signal Path Example
Single Data Rate
Single data rate clocking (SDR), in which one bit (per active lane)
is clocked out during a single clock cycle, is supported for all
output configurations and sample formats (see Table 14). The SDR
clocking mode is enabled by default at power-up or can be enabled
by writing 0 to the DDR_MD bit of the modes register (see the
Modes Register section).
Dual Data Rate
Dual data rate (DDR) mode (two data bit transitions per clock cycle
per active lane) is available only for host clock mode and echo
clock mode.
Figure 54. Echo Clock Mode Signal Path Diagram
The DDR clocking mode is enabled by writing 1 to the DDR_MD bit
of the modes register (see the Modes Register section). The DDR
mode uses half the number of SCK pulses to clock out conversion
data in comparison to SDR mode.
Host Clock Mode
1-Lane Output Data Clocking Mode
When enabled, host clock mode uses the internal oscillator as the
bit clock source. The host clock mode is enabled by writing 0x2 to
the CLK_MD bit field of the modes register. The bit clock frequency
can be programmed in the OSC_DIV bit field in the internal oscillator register, with available divisor values of 1, 2, or 4 (see the Internal Oscillator Register section). Figure 55 shows the signal connections for the host clock mode. In this mode, the BUSY_SCKOUT
pin provides the bit clock output and cannot be used to detect a
conversion completion. The AD4030-24/AD4032-24 automatically
calculate the number of clock pulses required to clock out the
conversion data based on word size, number of active lanes, and
choice of single data rate mode or dual data rate mode. The
number of clock pulses can be read from the OSC_LIMIT bit field
of the internal oscillator register. The SCK_IN from the host must
not be active. When retrieving the conversion data in nonaveraging
mode, the host must not assert CS low sooner than 300 ns after
1-lane is the default output data clocking mode at power-up. The
1-lane output data clocking mode is enabled by writing 0x0 to
the LANE_MD bit of the modes register (see the Modes Register
section). The active lane is SDO0. Example timing diagrams for
1-lane mode using SPI clocking mode, echo clock mode, and host
clock mode are in the Data Clocking Requirements and Timing
section.
analog.com
2-Lane Output Data Clocking Mode
When 2-lane output data clocking mode is enabled, the sample
word bits are split between two SDO lanes. Figure 58 shows how
the bits are allocated between the lanes for 2-lane mode. The bit
arrangement is the same for SPI clock mode, echo clock mode,
and host clock mode. 2-lane output data clocking mode is enabled
by writing 0x1 to the LANE_MD bit of the modes register (see
Rev. A | 33 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
the Modes Register section). The host controller must recombine
the data coming from the SDO lanes to reconstruct the original
sample word. The number of SCK pulses required to clock out
the conversion data is reduced by one-half with respect to the
1-lane mode. Table 14 lists the active SDO lanes for 2-lane mode.
Example timing diagrams for 2-lane mode using SPI clock mode,
echo clock mode, and host clock mode are in the Data Clocking
Requirements and Timing section.
4-Lane Output Data Clocking Mode
When 4-lane output data clocking mode is enabled, the sample
word bits are split between four SDO lanes. Figure 59 shows how
the bits are allocated between the lanes for 4-lane mode. The bit
arrangement is the same for SPI clock mode, echo clock mode,
and host clock mode. 4-lane output data clocking mode is enabled
by writing 0x2 to the LANE_MD bit of the modes register (see
the Modes Register section). The host controller must recombine
the data coming from the SDO lanes to reconstruct the original
sample word. The number of SCK pulses required to clock out the
conversion data is reduced by one-fourth with respect to the 1-lane
output data clocking. The active SDO lanes for 4-lane mode are
shown in Table 14. Example timing diagrams for 4-lane mode using
SPI clock mode, echo clock mode, and host clock mode are in the
Data Clocking Requirements and Timing section.
Data Output Modes Summary
Table 14 is a summary of the supported data output modes of the
AD4030-24/AD4032-24.
Table 14. AD4030-24/AD4032-24 Supported Data Output Modes
Number of Lanes
Active SDO Lanes
Clock Mode
Supported Data Clocking Mode
Output Sample Data-Word Length
1
SDO0
2
SDO0, SDO1
4
SDO0, SDO1, SDO2, SDO3
SPI
Echo
Host
SPI
Echo
Host
SPI
Echo
Host
SDR only
SDR and DDR
SDR and DDR
SDR only
SDR and DDR
SDR and DDR
SDR only
SDR and DDR
SDR and DDR
24 or 32
24 or 32
24 or 32
24 or 32
24 or 32
24 or 32
24 or 32
24 or 32
24 or 32
analog.com
Rev. A | 34 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
DATA CLOCKING REQUIREMENTS AND
TIMING
Basic and Averaging Conversion Cycles
Figure 56 shows the basic conversion cycle for a single sample.
This cycle applies to SPI clocking mode. When using echo clock
mode and host clock mode, the BUSY_SCKOUT pin function is
disabled and the bit clock is sourced on the BUSY_SCKOUT pin.
The data transfer must meet the requirements described in the
Sample Conversion Timing and Data Transfer section.
Table 15 contains the minimum and maximum values for the conversion timing parameters, which apply to all clocking modes.
Table 15. Conversion Cycle Timing Parameters
Parameter
Min
Max
tCNVH
tCNVL
tCONV
10 ns
20 ns
264 ns
No specific maximum
No specific maximum
300 ns
The duration of the data transfer period is dependent on the sample
resolution, number of active lanes, SCK frequency, and data clocking mode (SDR or DDR). The nominal value of the transfer duration
is given by
Data Transfer Duration = tTRANS =
×
1
fSCK
×
1
K
seconds
NBITS
MLANES
where:
NBITS = number of bits to clock out
MLANES = number of lanes used to clock out the data (1, 2, or 4)
fSCK = SCK clock frequency, in Hz
K = 1 (SDR only, DDR not available for SPI mode clocking)
For a given fSCK, number of data lanes, sample word size, and
SDR/DDR mode, the minimum sample period when using Zone 1
for the data transfer is as follows:
Minimum Zone 1 Sample Period:
tCYC ≥
NBITS
MLANES × fSCK × K
+ tCONV + tQUIET_CNV_ADV
The minimum sample period when using Zone 2 for data transfer is
as follows:
tCYC ≥
NBITS
MLANES × fSCK × K
+ tQUIET_CNV_ADV
+ tQUIET_CNV_DELAY
Figure 57 shows a typical conversion cycle when the averaging
mode is active and SPI clocking mode is being used. The BUSY
signal is asserted for a number of CNV clock periods that are
equal to the configured number of samples to be averaged. The
averaged sample is available when the BUSY signal is deasserted.
Like nonaveraged mode, if the configured clocking mode is either
echo clock or host clock, the BUSY signal is replaced by the output
bit clock (SCKOUT). The host controller must manage the timing for
asserting CS.
Figure 56. Basic Single Sample Conversion Cycle
Figure 57. Example Conversion Cycle for Averaging Mode
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Rev. A | 35 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
SPI Clocking Mode Timing Diagrams
1-Lane, SDR Mode
Figure 6 shows a conversion cycle for single lane data output, SDR
mode (1-bit per clock cycle).
2-Lane, SDR Mode
Figure 58 shows a conversion cycle for 2-lane data output using
SDR clocking mode. See the 2-Lane Output Data Clocking Mode
section for more information.
Figure 58. 2-Lane Mode, SDR Timing Diagram
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Rev. A | 36 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
4-Lane, SDR Mode
Figure 59 shows a conversion cycle for 4-lane data output using
SDR clocking mode. See the 4-Lane Output Data Clocking Mode
section for more information.
Figure 59. 4-Lane, SDR Timing Diagram
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Rev. A | 37 of 50
Data Sheet
AD4030-24/AD4032-24
SERIAL INTERFACE
Echo Clock Timing Diagrams
Host Clock Mode Timing
1-Lane, SDR Mode, Echo Clock Mode
1-Lane, Host Clock Mode, SDR
Figure 7 shows the timing relationships for SDR mode (1-bit per
SCK period) in 1-lane echo clock mode. The timing relationships
between the signals apply to both 24-bit and 32-bit sample word
formats.
Figure 9 shows the timing relationships for host clock mode when
using SDR mode and 1-lane mode. Similar to echo clock mode,
the clock rising edges are aligned to the data bit transitions. The
frequency of SCKOUT signal is controlled by the OSC_DIV value
programmed in the internal oscillator register (see the Internal
Oscillator Register section).
SCKOUT is a delayed version of the incoming SCK. The delay
(tDSDO) has a maximum value of 5.6 ns (at VIO > 1.71 V). Changes
in SDOx logic states are aligned to the rising edges of SCKOUT.
The clock and data edge alignments are the same for 1-lane,
2-lane, and 4-lane output data modes.
1-Lane, DDR Mode, Echo Clock Mode
Figure 8 shows the timing relationships for DDR mode (2-bit transitions per SCKOUT period) in 1-lane mode echo clock mode. The
timing relationships between the signals apply to both 24-bit and
32-bit sample word formats.
1-Lane, Host Clock Mode, DDR
Figure 10 shows the timing relationships for host clock mode when
using DDR. Similar to echo clock mode, the rising and falling clock
edges are aligned to the data bit transitions. The frequency of
SCKOUT signal is controlled by the OSC_DIV value programmed
in the internal oscillator register (see the Internal Oscillator Register
section).
Similar to SDR mode, SCKOUT is a delayed version of the incoming SCK. Changes in SDOx logic states are aligned to both rising
and falling edges of SCKOUT.
analog.com
Rev. A | 38 of 50
Data Sheet
AD4030-24/AD4032-24
LAYOUT GUIDELINES
The following layout guidelines are recommended to achieve maximum performance of the AD4030-24/AD4032-24:
The AD4030-24/AD4032-24 contain internal 1 μF bypass capacitors for VDD_5V and VDD_1.8V, and VIO contains an internal
0.2 μF capacitor. Therefore, no external bypass capacitors are
required, which saves on board space, bill of materials count,
and reduces layout sensitivity.
► It is recommended to have all the analog signals flow in from
the left side of the AD4030-24/AD4032-24 and all the digital
signals to flow in and out from the right side of the AD4030-24/
AD4032-24 because this helps isolate analog signals from digital
signals.
► Use a solid ground plane under the AD4030-24/AD4032-24 and
connect all the analog ground (GND) pins and digital ground
(IOGND) pins to the shared ground plane to avoid formation of
ground loops.
► Traces routed to either the REFIN pin or REF pins must be
isolated and shielded from other signals. Avoid routing signals
beneath the reference trace (REFIN or REF). The REF pins are
connected to an internal 2 µF capacitor, eliminating the need
to place a decoupling capacitor on the output of the external
reference buffer. If a noise reduction filter is placed between
the output of the reference (or buffer) and the chosen reference
input, it must be placed as close as possible to the AD4030-24/
AD4032-24.
►
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Rev. A | 39 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTERS
The AD4030-24/AD4032-24 have programmable user registers that are used to configure the device. These registers can be accessed while
the AD4030-24/AD4032-24 is in register configuration mode. Table 16 contains the complete list of the AD4030-24/AD4032-24 user registers
and bit fields in the registers. The Register Details section contains details about the functions of each of the bit fields. The access mode
specifies whether the register is comprised only of read-only bits (R) or a mix of read-only and read/write bits (R/W). Read-only bits cannot be
overwritten by an SPI write transaction, but read/write bits can.
Table 16. AD4030-24/AD4032-24 Register Summary
Reg
Name
Bits
Bit 7
Bit 6
Bit 5
0x00
INTERFACE_CONFIG
_A
INTERFACE_CONFIG
_B
DEVICE_CONFIG
[7:0]
SW_RESET
RESERVED
[7:0]
SINGLE_INST
STALLING
ADDR_ASC SDO_EN
ENSION
ABLE
RESERVED
0x03
0x04
0x05
0x06
0x0A
0x0B
0x0C
0x0D
0x0E
0x11
CHIP_TYPE
PRODUCT_ID_L
PRODUCT_ID_H
CHIP_GRADE
SCRATCH_PAD
SPI_REVISION
VENDOR_L
VENDOR_H
STREAM_MODE
INTERFACE_STATUS
_A
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
0x14
EXIT_CFG_MD
[7:0]
0x15
0x16
0x17
0x18
0x19
0x1A
0x1B
0x1C
0x1D
0x1E
0x1F
0x20
0x21
0x22
0x23
0x24
0x25
0x26
0x34
AVG
OFFSET_LB
OFFSET_MB
OFFSET_HB
UNUSED1_LB
UNUSED1_MB
UNUSED1_HB
GAIN_LB
GAIN_HB
UNUSED2_LB
UNUSED2_HB
MODES
OSCILLATOR
IO
TEST_PAT_BYTE0
TEST_PAT_BYTE1
TEST_PAT_BYTE2
TEST_PAT_BYTE3
DIG_DIAG
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
0x35
DIG_ERR
[7:0]
0x01
0x02
analog.com
[7:0]
Reset
R/W
0x10
R/W
0x00
R/W
OPERATING_MO 0x00
DES
RESERVED
CHIP_TYPE
0x07
PRODUCT_ID[7:0]
0x00
PRODUCT_ID[15:8]
0x20
GRADE
DEVICE_REVISION
0x00
SCRATCH_VALUE
0x00
SPI_TYPE
VERSION
0x81
VID[7:0]
0x56
VID[15:8]
0x04
LOOP_COUNT
0x00
RESERVED
CLOCK_C
RESERVED
0x00
OUNT_ER
R
RESERVED
EXIT_CO 0x00
NFIG_MD
AVG_SYNC
RESERVED
AVG_VAL
0x00
USER_OFFSET[7:0]
0x00
USER_OFFSET[15:8]
0x00
USER_OFFSET[23:16]
0x00
UNUSED1[7:0]
0x00
UNUSED1[15:8]
0x00
UNUSED1[23:16]
0x00
USER_GAIN[7:0]
0x00
USER_GAIN[15:8]
0x80
UNUSED2[7:0]
0x00
UNUSED2[15:8]
0x80
LANE_MD
CLK_MD
DDR_MD
OUT_DATA_MD
0x00
OSC_LIMIT
OSC_DIV
0x00
RESERVED
IO2X
0x00
TEST_DATA_PAT[7:0]
0x0F
TEST_DATA_PAT[15:8]
0x0F
TEST_DATA_PAT[23:16]
0x5A
TEST_DATA_PAT[31:24]
0x5A
POWERUP_CO RESET_OC
RESERVED
FUSE_CR 0x40
MPLETED
CURRED
C_EN
RESERVED
FUSE_CR 0x00
C_ERR
R/W
RESERVED
Bit 4
Bit 3
Bit 2
RESERVED
SHORT_INST
RUCTION
Bit 1
Bit 0
SW_RES
ETX
RESERVED
R
R
R
R
R/W
R
R
R
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
Rev. A | 40 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
INTERFACE CONFIGURATION A REGISTER
Address: 0x00, Reset: 0x10, Name: INTERFACE_CONFIG_A
Interface configuration settings.
Table 17. Bit Descriptions for INTERFACE_CONFIG_A
Bits
Bit Name
Description
Reset
Access
7
SW_RESET
0x0
R/W
6
5
RESERVED
ADDR_ASCENSION
0x0
0x0
R
R
4
[3:1]
0
SDO_ENABLE
RESERVED
SW_RESETX
First of Two SW_RESET Bits. This bit appears in two locations in this register. Both locations must be written
at the same time to trigger a software reset of the device. All registers except for this register are reset to
their default values.
Reserved.
Determines Sequential Addressing Behavior.
0: address accessed is decremented by one for each data byte when streaming.
1: not a valid option.
SDOx Pin Enable.
Reserved.
Second of Two SW_RESET Bits. This bit appears in two locations in this register. Both locations must be
written at the same time to trigger a software reset of the device. All registers except for this register are
reset to their default values.
0x1
0x0
0x0
R
R
R/W
INTERFACE CONFIGURATION B REGISTER
Address: 0x01, Reset: 0x00, Name: INTERFACE_CONFIG_B
Additional interface configuration settings.
Table 18. Bit Descriptions for INTERFACE_CONFIG_B
Bits
Bit Name
Description
Reset
Access
7
SINGLE_INST
0x0
R/W
6
[5:4]
3
STALLING
RESERVED
SHORT_INSTRUCTION
Select Streaming or Single Instruction Mode.
0: streaming mode is enabled. The address decrements as successive data bytes are received.
1: single instruction mode is enabled.
Reserved for Stalling Feature.
Reserved.
Set the Instruction Phase Address to 7 Bits or 15 Bits.
0: 15-bit addressing.
1: 7-bit addressing.
0x0
0x0
0x0
R/W
R
R
analog.com
Rev. A | 41 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
Table 18. Bit Descriptions for INTERFACE_CONFIG_B
Bits
Bit Name
Description
Reset
Access
[2:0]
RESERVED
Reserved.
0x0
R
DEVICE CONFIGURATION REGISTER
Address: 0x02, Reset: 0x00, Name: DEVICE_CONFIG
Table 19. Bit Descriptions for DEVICE_CONFIG
Bits
Bit Name
Description
Reset
Access
[7:2]
[1:0]
RESERVED
OPERATING_MODES
Reserved.
Power Modes
00: normal operating mode.
11: shutdown mode.
0x0
0x0
R
R/W
CHIP TYPE REGISTER
Address: 0x03, Reset: 0x07, Name: CHIP_TYPE
The chip type is used to identify the family of Analog Devices products a given device belongs to. Use the chip type with the product ID to
uniquely identify a given product.
Table 20. Bit Descriptions for CHIP_TYPE
Bits
Bit Name
Description
Reset
Access
[7:4]
[3:0]
RESERVED
CHIP_TYPE
Reserved.
Precision ADC.
0x0
0x7
R
R
PRODUCT ID LOW REGISTER
Address: 0x04, Reset: 0x00, Name: PRODUCT_ID_L
Low byte of the product ID.
Table 21. Bit Descriptions for PRODUCT_ID_L
Bits
Bit Name
Description
Reset
Access
[7:0]
PRODUCT_ID[7:0]
Device Chip Type/Family. Use the product ID with the chip type to identify a product.
0x0
R
PRODUCT ID HIGH REGISTER
Address: 0x05, Reset: 0x20, Name: PRODUCT_ID_H
High byte of the product ID.
analog.com
Rev. A | 42 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
Table 22. Bit Descriptions for PRODUCT_ID_H
Bits
Bit Name
Description
Reset
Access
[7:0]
PRODUCT_ID[15:8]
Device Chip Type/Family. Use the product ID with the chip type to identify a product.
0x20
R
CHIP GRADE REGISTER
Address: 0x06, Reset: 0x81, Name: CHIP_GRADE
Identifies product variations and device revisions.
Table 23. Bit Descriptions for CHIP_GRADE
Bits
Bit Name
Description
Reset
Access
[7:3]
GRADE
This is the Device Performance Grade.
AD4030-24: 0b10000.
AD4032-24: 0b10010.
This is the Device Hardware Revision.
0x10
0x12
0x1
R
R
R
[2:0]
DEVICE_REVISION
SCRATCH PAD REGISTER
Address: 0x0A, Reset: 0x00, Name: SCRATCH_PAD
This register can be used to test writes and reads.
Table 24. Bit Descriptions for SCRATCH_PAD
Bits
Bit Name
Description
Reset
Access
[7:0]
SCRATCH_VALUE
Software Scratchpad. Software can write to and read from this location without any device side effects.
0x0
R/W
SPI REVISION REGISTER
Address: 0x0B, Reset: 0x81, Name: SPI_REVISION
Indicates the SPI revision.
Table 25. Bit Descriptions for SPI_REVISION
Bits
Bit Name
Description
Reset
Access
[7:6]
SPI_TYPE
Always Reads as 0x2.
0x2
R
analog.com
Rev. A | 43 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
Table 25. Bit Descriptions for SPI_REVISION
Bits
Bit Name
Description
Reset
Access
[5:0]
VERSION
SPI Version.
0x1
R
VENDOR ID LOW REGISTER
Address: 0x0C, Reset: 0x56, Name: VENDOR_L
Low byte of the vendor ID.
Table 26. Bit Descriptions for VENDOR_L
Bits
Bit Name
Description
Reset
Access
[7:0]
VID[7:0]
Analog Devices Vendor ID.
0x56
R
VENDOR ID HIGH REGISTER
Address: 0x0D, Reset: 0x04, Name: VENDOR_H
High byte of the vendor ID.
Table 27. Bit Descriptions for VENDOR_H
Bits
Bit Name
Description
Reset
Access
[7:0]
VID[15:8]
Analog Devices Vendor ID.
0x4
R
STREAM MODE REGISTER
Address: 0x0E, Reset: 0x00, Name: STREAM_MODE
Defines the length of the loop when streaming data.
Table 28. Bit Descriptions for STREAM_MODE
Bits
Bit Name
Description
Reset
Access
[7:0]
LOOP_COUNT
Sets the Data Byte Count Before Looping to Start Address. Not enabled in the AD4030-24.
0x0
R/W
INTERFACE STATUS A REGISTER
Address: 0x11, Reset: 0x00, Name: INTERFACE_STATUS_A
Status bits are set to 1 to indicate an active condition. The status bits can be cleared by writing a 1 to the corresponding bit location.
analog.com
Rev. A | 44 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
Table 29. Bit Descriptions for INTERFACE_STATUS_A
Bits
Bit Name
Description
Reset
Access
[7:5]
4
RESERVED
CLOCK_COUNT_ERR
0x0
0x0
R
R/W1C
[3:0]
RESERVED
Reserved.
Incorrect Number of Clocks Detected in a Transaction.
0 = no error.
1 = incorrect number of clocks detected in a transaction. Write 1 to clear.
Reserved.
0x0
R
EXIT CONFIGURATION MODE REGISTER
Address: 0x14, Reset: 0x00, Name: EXIT_CFG_MD
Table 30. Bit Descriptions for EXIT_CFG_MD
Bits
Bit Name
Description
Reset
Access
[7:1]
0
RESERVED
EXIT_CONFIG_MD
Reserved.
Exit Register Config Mode. Write 1 to exit register configuration mode. Self clearing upon CS = 1.
0x0
0x0
R
R/W
AVERAGING MODE REGISTER
Address: 0x15, Reset: 0x00, Name: AVG
Table 31. Bit Descriptions for AVG
Bits
Bit Name
Description
Reset
Access
7
[6:5]
[4:0]
AVG_SYNC
RESERVED
AVG_VAL
Averaging Filter Reset. 1 = reset, self clearing.
Reserved.
Averaging Filter Block Length, 2N.
0x00 = no averaging.
0x01 = 21 samples.
0x02 = 22 samples.
0x03 = 23 samples.
0x04 = 24 samples.
0x05 = 25 samples.
…
0x0F = 215 samples.
0x10 = 216 samples.
0x11 through 0x1F = invalid.
0x0
0x0
0x0
R/W
R
R/W
analog.com
Rev. A | 45 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
OFFSET REGISTERS
Address: 0x16, Reset: 0x00, Name: OFFSET_LB
Table 32. Bit Descriptions for OFFSET_LB
Bits
Bit Name
Description
Reset
Access
[7:0]
USER_OFFSET[7:0]
24-Bit Offset. Twos complement (signed).
0x0
R/W
V
1 LSB = REF
/GAIN.
223
Address: 0x17, Reset: 0x00, Name: OFFSET_MB
Table 33. Bit Descriptions for OFFSET_MB
Bits
Bit Name
Description
Reset
Access
[7:0]
USER_OFFSET[15:8]
24-Bit Offset. Twos complement (signed).
0x0
R/W
V
1 LSB = REF
/GAIN.
223
Address: 0x18, Reset: 0x00, Name: OFFSET_HB
Table 34. Bit Descriptions for OFFSET_HB
Bits
Bit Name
Description
Reset
Access
[7:0]
USER_OFFSET[23:16]
24-Bit Offset. Twos complement (signed).
0x0
R/W
Reset
Access
V
1 LSB = REF
/GAIN.
223
GAIN REGISTERS
Address: 0x1C, Reset: 0x00, Name: GAIN_LB
Table 35. Bit Descriptions for GAIN_LB
Bits
Bit Name
Description
[7:0]
USER_GAIN[7:0]
Gain Word (Unsigned). Multiplier Output = Input × Gain Word/0x8000. Maximum Effective Gain = 0xFFFF/ 0x0
0x8000 = 1.99997.
R/W
Address: 0x1D, Reset: 0x80, Name: GAIN_HB
analog.com
Rev. A | 46 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
Table 36. Bit Descriptions for GAIN_HB
Bits
Bit Name
Description
Reset
Access
[7:0]
USER_GAIN[15:8]
Gain Word (Unsigned). Multiplier Output = Input × Gain Word/0x8000. Maximum Effective Gain =
0xFFFF/0x8000 = 1.99997.
0x80
R/W
MODES REGISTER
Address: 0x20, Reset: 0x00, Name: MODES
Table 37. Bit Descriptions for MODES
Bits
Bit Name
Description
Reset
Access
[7:6]
LANE_MD
0x0
R/W
[5:4]
CLK_MD
0x0
R/W
3
DDR_MD
0x0
R/W
[2:0]
OUT_DATA_MD
Lane Mode Select.
00 = one lane.
01 = two lanes.
10 = four lanes.
11 = invalid setting.
Clock Mode Select.
00 = SPI clocking mode.
01 = echo clock mode.
10 = host clock mode.
11 = invalid setting.
DDR Mode Enable/Disable.
0 = SDR.
1 = DDR (only valid for echo clock mode and host clock mode).
Output Data Mode Select.
000 = 24-bit differential data.
001 = 16-bit differential data + 8-bit common-mode data.
010 = 24-bit differential data + 8-bit common-mode data.
011 = 30-bit averaged differential data + OR bit + SYNC bit.
100 = 32-bit test data pattern (TEST_DATA_PAT).
0x0
R/W
INTERNAL OSCILLATOR REGISTER
Address: 0x21, Reset: 0x00, Name: OSCILLATOR
analog.com
Rev. A | 47 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
Table 38. Bit Descriptions for OSCILLATOR
Bits
Bit Name
Description
Reset
Access
[7:2]
OSC_LIMIT
0x0
R
[1:0]
OSC_DIV
Oscillator Limit Setting. Oscillator is limited to this number of clock pulses plus one. Automatically calculated by the
AD4030-24 based on the data-word size, number of active SDO lanes, and data rate mode (SDR or DDR).
Oscillator Divider Setting.
00 = no divide (divide by 1).
01 = divide by 2.
10 = divide by 4.
11 = invalid setting.
0x0
R/W
OUTPUT DRIVER REGISTER
Address: 0x22, Reset: 0x00, Name: IO
Table 39. Bit Descriptions for IO
Bits
Bit Name
Description
Reset
Access
[7:1]
0
RESERVED
IO2X
Reserved.
Double Output Driver Strength.
1 = double output driver strength.
0 = normal output driver strength.
0x0
0x0
R
R/W
TEST PATTERN REGISTERS
Address: 0x23, Reset: 0x0F, Name: TEST_PAT_BYTE0
Table 40. Bit Descriptions for TEST_PAT_BYTE0
Bits
Bit Name
Description
Reset
Access
[7:0]
TEST_DATA_PAT[7:0]
32-Bit Test Pattern. Applied when OUT_DATA_MD = 4.
0xF
R/W
Address: 0x24, Reset: 0x0F, Name: TEST_PAT_BYTE1
Table 41. Bit Descriptions for TEST_PAT_BYTE1
Bits
Bit Name
Description
Reset
Access
[7:0]
TEST_DATA_PAT[15:8]
32-Bit Test Pattern. Applied when OUT_DATA_MD = 4.
0xF
R/W
Address: 0x25, Reset: 0x5A, Name: TEST_PAT_BYTE2
analog.com
Rev. A | 48 of 50
Data Sheet
AD4030-24/AD4032-24
REGISTER DETAILS
Table 42. Bit Descriptions for TEST_PAT_BYTE2
Bits
Bit Name
Description
Reset
Access
[7:0]
TEST_DATA_PAT[23:16]
32-Bit Test Pattern. Applied when OUT_DATA_MD = 4.
0x5A
R/W
Address: 0x26, Reset: 0x5A, Name: TEST_PAT_BYTE3
Table 43. Bit Descriptions for TEST_PAT_BYTE3
Bits
Bit Name
Description
Reset
Access
[7:0]
TEST_DATA_PAT[31:24]
32-Bit Test Pattern. Applied when OUT_DATA_MD = 4.
0x5A
R/W
DIGITAL DIAGNOSTICS REGISTER
Address: 0x34, Reset: 0x40, Name: DIG_DIAG
Table 44. Bit Descriptions for DIG_DIAG
Bits
Bit Name
Description
Reset
Access
7
POWERUP_COMPLETED
0x0
R
6
RESET_OCCURRED
0x1
R/W1C
[5:1]
0
RESERVED
FUSE_CRC_EN
Power-Up Completed.
1 = power-up completed. Self clearing.
Reset Occurred. This bit is set to 1 upon a reset event. Write 1 to clear (useful for detecting
brownouts).
Reserved.
Fuse CRC Enable. Write a 1 to force recheck of CRC.
0x0
0x0
R
R/W
DIGITAL ERRORS REGISTER
Address: 0x35, Reset: 0x00, Name: DIG_ERR
Table 45. Bit Descriptions for DIG_ERR
Bits
Bit Name
Description
Reset
Access
[7:1]
0
RESERVED
FUSE_CRC_ERR
Reserved.
Fuse CRC Error. This bit is set to 1 upon a fuse CRC error. Write 1 to clear.
0x0
0x0
R
R/W1C
analog.com
Rev. A | 49 of 50
Data Sheet
AD4030-24/AD4032-24
OUTLINE DIMENSIONS
Figure 60. 64-Ball Chip Scale Package Ball Grid Array [CSP_BGA]
(05-08-1797)
Dimensions shown in millimeters
Updated: May 10, 2022
ORDERING GUIDE
Model1
Temperature Range
Package Description
Packing Quantity
Package Option
AD4030-24BBCZ
AD4030-24BBCZ-RL
AD4032-24BBCZ
AD4032-24BBCZ-RL
-40°C to +125°C
-40°C to +125°C
-40°C to +125°C
-40°C to +125°C
64-Ball CSP-BGA (7 mm x 7 mm x 1.72 mm)
64-Ball CSP-BGA (7 mm x 7 mm x 1.72 mm)
64-Ball CSP-BGA (7 mm x 7 mm x 1.72 mm)
64-Ball CSP-BGA (7 mm x 7 mm x 1.72 mm)
Tray, 260
Reel, 2000
Tray, 260
Reel, 2000
05-08-1797
05-08-1797
05-08-1797
05-08-1797
1
Z = RoHS Compliant Part.
EVALUATION BOARDS
Evaluation Board1, 2
Description
EVAL-AD4030-24-KTZ
EVAL-AD4030-24FMCZ
Evaluation Kit
Evaluation Board
1
Z = RoHS Compliant Part.
2
The EVAL-AD4030-24-KTZ and EVAL-AD4030-24FMCZ can be used to evaluate the AD4032-24.
©2022 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
One Analog Way, Wilmington, MA 01887-2356, U.S.A.
Rev. A | 50 of 50