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AD7541AJN

AD7541AJN

  • 厂商:

    AD(亚德诺)

  • 封装:

    DIP-18

  • 描述:

    IC DAC 12BIT A-OUT 18DIP

  • 数据手册
  • 价格&库存
AD7541AJN 数据手册
CMOS, 12-Bit, Monolithic Multiplying DAC AD7541A Data Sheet FEATURES FUNCTIONAL BLOCK DIAGRAM Improved version of the obsoleted product, AD7541 Full 4 quadrant multiplication 12-bit linearity (endpoint) All parts guaranteed monotonic TTL/CMOS compatible Protection Schottky diodes not required Low logic input leakage VREF 10kΩ 10kΩ 10kΩ 20kΩ 20kΩ 20kΩ 20kΩ S1 S2 S3 S12 20kΩ OUT 2 OUT 1 10kΩ BIT 3 RFEEDBACK BIT 12 (LSB) DIGITAL INPUTS (DTL/TTL/CMOS COMPATIBLE) APPLICATIONS LOGIC: A SWITCH IS CLOSED TO IOUT 1 FOR ITS DIGITAL INPUT IN A HIGH STATE. Waveform generators Analog processing Instrumentation applications Programmable amplifiers and attenuators Digitally controlled calibration Programmable filters and oscillators Composite video Ultrasound Gain, offset, and voltage trimming 00718-001 BIT 1 (MSB) BIT 2 Figure 1. GENERAL DESCRIPTION PRODUCT HIGHLIGHTS The AD7541A is a high performance, 12-bit monolithic multiplying digital-to-analog converter (DAC). It is fabricated using advanced, low noise, thin film, complementary metaloxide semiconductor (CMOS) technology. The AD7541A is available in 18-lead PDIP, 18-lead PLCC, and 18-lead SOIC packages. Compatibility—The AD7541A can be used as a direct replacement for any AD7541 type device. As with the AD7541, The digital inputs on the AD7541A are TTL/CMOS compatible. They have a ±1 µA maximum input current requirement so that they do not load the driving circuitry. The AD7541A is functionally and pin compatible with the industry standard AD7541, and it offers improved specifications and performance over the obsolete product, AD7541. The improved design ensures that the AD7541A is latch-up free; therefore, no output protection Schottky diodes are required. The AD7541A uses laser wafer trimming to provide full 12-bit endpoint linearity with several high performance grades. Improvements—The AD7541A offers the following improved specifications over the AD7541: 1. 2. 3. 4. 5. 6. Rev. C Gain error for all grades are reduced with premium grade versions having a maximum gain error of ±3 LSB. Gain error temperature coefficient are reduced to 2 ppm/°C typical and 5 ppm/°C maximum. Digital-to-analog charge injection energy for the AD7541A is typically 20% less than the standard AD7541. Latch-up proof. Laser wafer trimming provides 1/2 LSB maximum differential nonlinearity for top grade devices over the operating temperature range (vs. 1 LSB on previous AD7541 devices). All grades are guaranteed monotonic to 12 bits over the operating temperature range. Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©2017 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com AD7541A Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Terminology .......................................................................................7 Applications ....................................................................................... 1 Theory of Operation .........................................................................8 Functional Block Diagram .............................................................. 1 Equivalent Circuit Analysis .........................................................8 General Description ......................................................................... 1 Applications Information .................................................................9 Product Highlights ........................................................................... 1 Unipolar Binary Operation (Two Quadrant Multiplication) ......9 Revision History ............................................................................... 2 Bipolar Operation (Four Quadrant Multiplication) .............. 10 Specifications..................................................................................... 3 Applications Hints ...................................................................... 11 AC Performance Characteristics ................................................ 4 Single-Supply Operation ........................................................... 11 Absolute Maximum Ratings ............................................................ 5 Supplemental Application Material ......................................... 11 ESD Caution .................................................................................. 5 Outline Dimensions ....................................................................... 12 Pin Configurations ........................................................................... 6 Ordering Guide .......................................................................... 13 REVISION HISTORY 3/2017—Rev. B to Rev. C Updated Format .................................................................. Universal Deleted E-20A and Q-18 .............................................. Throughout Added Applications Section ............................................................ 1 Changes to the General Description Section ................................ 1 Changes to Figure 7 .......................................................................... 9 Changes to Bipolar Operation (Four Quadrant Multiplication) Section, Figure 8, and Figure 9 ..................................................... 10 Changes to Figure 10 ...................................................................... 11 Changes to Output Offset Section, Temperature Coefficient Section, Single-Supply Operation Section, and Supplemental Application Material Section ........................................................ 11 Update Outline Dimensions ......................................................... 13 Changes to Ordering Guide .......................................................... 14 Rev. C | Page 2 of 13 Data Sheet AD7541A SPECIFICATIONS VDD = 15 V, VREF = 10 V, OUT 1 = OUT 2 = GND = 0 V, unless otherwise noted. Temperature range is as follows for the J version and the K version: 0°C to +70°C. Table 1. Parameter ACCURACY Resolution Relative Accuracy Differential Nonlinearity Gain Error Gain TC 1 ΔGain/ΔTemperature Output Leakage Current OUT 1 (Pin 1) OUT 2 (Pin 2) REFERENCE INPUT Input Resistance (Pin 17 to GND) DIGITAL INPUTS Input Voltage High, VIH Low, VIL Input Current, IIN Input Capacitance, CIN1 POWER SUPPLY REJECTION ΔGain/ΔVDD POWER SUPPLY VDD Range IDD 1 Version TA = 25°C TA = TMIN, TMAX Unit All J K J K J K 12 ±1 ±1/2 ±1 ±1/2 ±6 ±3 12 ±1 ±1/2 ±1 ±1/2 ±8 ±5 Bits LSB max LSB max LSB max LSB max LSB max LSB max All 5 5 ppm/°C max Typical value is 2 ppm/°C J, K J, K ±5 ±5 ±10 ±10 nA max nA max All digital inputs = 0 V All digital inputs = VDD All 7 to 18 7 to 18 kΩ min/max Typical input resistance = 11 kΩ; typical input resistance TC = −300 ppm/°C All All All 2.4 0.8 ±1 2.4 0.8 ±1 V min V max µA max All 8 8 pF max Logic inputs are MOS gates; IIN typical (25°C) = 1 nA VIN = 0 V All ±0.01 ±0.02 % per % max ΔVDD = ±5% All All 5 to 16 2 100 5 to 16 2 500 V min/V max mA max µA max Accuracy is not guaranteed over this range All digital inputs VIL or VIH All digital inputs 0 V or VDD Guaranteed by design but not production tested. Rev. C | Page 3 of 13 Test Conditions/Comments ±1 LSB = ±0.024% of full scale ±1/2 LSB = ±0.012% of full scale All grades guaranteed monotonic to 12 bits, TMIN to TMAX. Measured using internal RFEEDBACK and includes effect of leakage current and gain temperature coefficient (TC); gain error can be trimmed to zero AD7541A Data Sheet AC PERFORMANCE CHARACTERISTICS These characteristics are included for design guidance only and are not subject to test. VDD = 15 V, VIN = 10 V, and OUT 1 = OUT 2 = GND = 0 V, unless otherwise noted. Temperature range is as follows for the J version and the K version: 0°C to +70°C. Table 2. Parameter PROPAGATION DELAY (FROM DIGITAL INPUT CHANGE TO 90% OF FINAL ANALOG OUTPUT) DIGITAL-TO-ANALOG GLITCH IMPULSE TA = 25°C 100 1000 nV-sec typ MULTIPLYING FEEDTHROUGH ERROR (VREF to OUT 1) OUTPUT CURRENT SETTLING TIME 1.0 mV p-p typ 0.6 µs typ To 0.01% of full-scale range; OUT 1 load = 100 Ω, CEXT = 13 pF; digital inputs = 0 V to VDD or VDD to 0 V pF max pF max pF max pF max Digital inputs = VIH Digital inputs = VIL Digital inputs = VIH Digital inputs = VIL OUTPUT CAPACITANCE COUT 1 (Pin 1) COUT 2 (Pin 2) 200 70 70 200 TA = TMIN,TMAX 200 70 70 200 Rev. C | Page 4 of 13 Unit ns typ Test Conditions/Comments OUT 1 load = 100 Ω, CEXT = 13 pF; digital inputs = 0 V to VDD or VDD to 0 V VREF = 0 V; all digital inputs 0 V to VDD or VDD to 0 V; measured using Model 50K as output amplifier VREF = ±10 V, 10 kHz sine wave Data Sheet AD7541A ABSOLUTE MAXIMUM RATINGS TA = 25°C, unless otherwise noted. Table 3. Parameter VDD to GND VREF to GND VRFEEDBACK to GND Digital Input Voltage to GND OUT 1, OUT 2 to GND Power Dissipation (Any Package) To 75°C Derates Above 75°C Operating Temperature Range Commercial (J Version/K Version) Storage Temperature Lead Temperature (Soldering, 10 secs) Rating 17 V ±25 V ±25 V −0.3 V, VDD + 0.3 V −0.3 V, VDD + 0.3 V Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability. ESD CAUTION 450 mW 6 mW/°C 0°C to 70°C −65°C to +150°C 300°C Rev. C | Page 5 of 13 AD7541A Data Sheet PIN CONFIGURATIONS OUT 1 1 18 RFEEDBACK OUT 2 2 17 VREF IN GND 3 BIT 1 (MSB) 4 AD7541A BIT 2 5 16 VDD (+) 15 BIT 12 (LSB) BIT 4 7 12 BIT 8 BIT 5 8 11 BIT 8 BIT 6 9 10 BIT 7 00718-002 14 BIT 11 TOP VIEW (Not to Scale) 13 BIT 10 BIT 3 6 NC RFEEDBACK 3 2 1 20 19 GND 4 BIT 1 (MSB) 5 AD7541A BIT 2 6 TOP VIEW (Not to Scale) BIT 3 7 VDD BIT 12 (LSB) 16 BIT 11 15 BIT 10 14 BIT 9 BIT 8 BIT 6 NC 10 11 12 13 BIT 7 9 BIT 5 BIT 4 8 18 17 NOTES 1. NC = NO CONNECT. Figure 3. 20-Lead PLCC Pin Configuration Rev. C | Page 6 of 13 00718-003 VREF OUT 2 OUT 1 Figure 2. 18-Lead PDIP and 18-Lead SOIC Pin Configuration Data Sheet AD7541A TERMINOLOGY Relative Accuracy Relative accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after adjusting for zero scale and full scale, and it is expressed in % of full-scale range or (sub) multiples of 1 LSB. Output Leakage Current Current that appears at OUT I with the DAC loaded to all 0s or at OUT 2 with the DAC loaded to all 1s. Differential Nonlinearity Differential nonlinearity is the difference between the measured change and the ideal l LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum over the operating temperature range ensures monotonicity. Output Current Settling Time Time required for the output function of the DAC to settle to within 1/2 LSB for a given digital input stimulus, that is, 0 to full scale. Gain Error Gain error is a measure of the output error between an ideal DAC and the actual device output. For the AD7541A, ideal maximum output is −(4095/4096)(VREF) Gain error is adjustable to zero using external trims, as shown in Figure 7, Figure 8, and Figure 9. Multiplying Feedthrough Error AC error due to capacitive feedthrough from the VREF terminal to OUT 1 with the DAC loaded to all 0s. Propagation Delay The propagation delay is a measure of the internal delay of the circuit, and it is measured from the time a digital input changes to the point at which the analog output at OUT 1 reaches 90% of its final value. Digital-to-Analog Glitch Impulse (QDA) The QDA is a measure of the amount of charge injected from the digital inputs to the analog outputs when the inputs change state. It is usually specified as the area of the glitch in nV-sec and is measured with VREF = GND and a Model 50K as the output op amp, C1 (phase compensation) = 0 pF. Rev. C | Page 7 of 13 AD7541A Data Sheet THEORY OF OPERATION The simplified digital-to-analog circuit is shown in Figure 4. An inverted R-2R ladder structure was used, meaning the binarily weighted currents are switched between the OUT 1 and OUT 2 bus lines, thus maintaining a constant current in each ladder leg independent of the switch state. 10kΩ 10kΩ 20kΩ 20kΩ 20kΩ 20kΩ S1 S2 S3 S12 20kΩ OUT 2 OUT 1 10kΩ BIT 3 RFEEDBACK BIT 12 (LSB) DIGITAL INPUTS (DTL/TTL/CMOS COMPATIBLE) LOGIC: A SWITCH IS CLOSED TO IOUT 1 FOR ITS DIGITAL INPUT IN A HIGH STATE. R 00718-005 BIT 1 (MSB) BIT 2 RFEEDBACK OUT 1 Figure 4. Functional Diagram (Inputs High) The input resistance at VREF (see Figure 4) is always equal to RLDR, which is the R-2R ladder characteristic resistance and is equal to value R. Because RIN at the VREF pin is constant, the reference terminal can be driven by a reference voltage or a reference current, ac or dc, of positive or negative polarity. If a current source is used, a low temperature coefficient external RFEEDBACK is recommended to define the scale factor. VREF ILEAKAGE 70pF ILEAKAGE 200pF R ≈ 15kΩ IREF OUT 2 I/4096 00718-006 10kΩ The equivalent circuits for all digital inputs low and all digital inputs high are shown in Figure 5 and Figure 6. In Figure 5 with all digital inputs low, the reference current is switched to OUT 2. The current source, ILEAKAGE, is composed of surface and junction leakages to the substrate, while the I/4096 current source represents a constant 1-bit current drain through the termination resistor on the R-2R ladder. The on capacitance of the output N-channel switch is 200 pF, as shown on the OUT 2 terminal. The off switch capacitance is 70 pF, as shown on the OUT 1 terminal. Analysis of the circuit for all digital inputs high, as shown in Figure 5, is similar to Figure 4; however, the on switches are now on the OUT 1 terminal; therefore, 200 pF at that terminal. Figure 5. DAC Equivalent Circuit, All Digital Inputs Low R VREF RFEEDBACK R ≈ 15kΩ IREF OUT 1 I/4096 ILEAKAGE 200pF ILEAKAGE 70pF OUT 2 Figure 6. DAC Equivalent Circuit All Digital Inputs High Rev. C | Page 8 of 13 00718-007 VREF EQUIVALENT CIRCUIT ANALYSIS Data Sheet AD7541A APPLICATIONS INFORMATION UNIPOLAR BINARY OPERATION (TWO QUADRANT MULTIPLICATION) Figure 7 shows the analog circuit connections required for unipolar binary (two quadrant multiplication) operation. With a dc reference voltage or current (positive or negative polarity) applied at Pin 17, the circuit is a unipolar DAC. With an ac reference voltage or current, the circuit provides two quadrant multiplication (digitally controlled attenuation). The input/output relationship is shown in Table 5. VDD R21 16 R11 VDD RFEEDBACK OUT 1 1 17 VREF IN AD7541A PIN 4 TO PIN 15 4 1REFER VOUT OUT 2 2 GND DIGITAL GROUND ANALOG COMMON TO TABLE 4 JN 100 Ω 47 Ω KN 100 Ω 33 Ω Table 5. Unipolar Binary Code Table for Circuit of Figure 7 2 15 BIT 1 TO BIT 12 Trim Resistor R1 R2 00718-008 VIN Amplifier A1 must be selected or trimmed to provide VOS ≤ 10% of the voltage resolution at VOUT. Additionally, the amplifier must exhibit a bias current that is low over the temperature range of interest (bias current causes output offset at VOUT equal to IB times the DAC feedback resistance, nominally 11 kΩ). Table 4. Recommended Trim Resistor Values vs. Grades C1 33pF 18 C1 phase compensation (10 pF to 25 pF) may be required for stability when using high speed amplifiers. C1 is used to cancel the pole formed by the DAC internal feedback resistance and output capacitance at OUT 1. Figure 7. Unipolar Binary Operation R1 provides full-scale trim capability (that is, load the DAC register to 1111 1111 1111, adjust R1 for VOUT = –VREF (4095/4096)). Alternatively, full scale can be adjusted by omitting R1 and R2 and trimming the reference voltage magnitude. Binary Number in DAC MSB LSB 1111 1111 1000 0000 0000 0000 0000 0001 0000 0000 0000 Rev. C | Page 9 of 13 Analog Output, VOUT −VIN(4095/4096) −VIN(2048/4096) = −1/2VIN −VIN(1/4096) 0V AD7541A Data Sheet BIPOLAR OPERATION (FOUR QUADRANT MULTIPLICATION) Figure 9 and Table 7 show an alternative method of achieving bipolar output. The circuit operates with sign plus magnitude code and has the advantage of giving 12-bit resolution in each quadrant, compared with 11-bit resolution per quadrant for the circuit of Figure 8. The ADG5436F is a dual SPDT, latch-up immune switch. R4 and R5 must match each other to 0.01% to maintain the accuracy of the DAC. Mismatch between R4 and R5 introduces a gain error. Figure 8 and Table 6 illustrate the circuitry and code relationship for bipolar operation. With a dc reference (positive or negative polarity), the circuit provides offset binary operation. With an ac reference, the circuit provides full four quadrant multiplication. With the DAC loaded to 1000 0000 0000, adjust R1 for VOUT = 0 V (alternatively, omit R1 and R2 and adjust the ratio of R3 to R4 for VOUT = 0 V). To accomplish, full-scale trimming, adjust the amplitude of VREF or vary the R5 value. Table 7. 12-Bit Plus Sign Magnitude Code Table for Circuit of Figure 9 As in unipolar operation, A1 must be chosen for low VOS and low IB. R3, R4, and R5 must be selected for matching and tracking. Mismatch of R3 to R4 causes both offset and full-scale error. Mismatch of R5 to R4 or R3 causes full-scale error. C1 phase compensation (10 pF to 50 pF) may be required for stability, depending on amplifier used. 1 Table 6. Bipolar Code Table for Offset Binary Circuit of Figure 8 Binary Number in DAC MSB LSB 1111 1111 1111 1000 0000 0001 1000 0000 0000 0111 1111 1111 0000 0000 0000 Binary Number in DAC MSB LSB 1111 1111 1111 0000 0000 0000 0000 0000 0000 1111 1111 1111 Sign Bit1 0 0 1 1 When the sign bit equals 0, it connects R3 to GND. Analog Output, VOUT +VIN(2047/2048) +VIN(1/2048) 0V −VIN(1/2048) −VIN(2048/2048) R21 VDD 16 VIN 17 VREF R11 R4 20kΩ C1 33pF 18 VDD RFEEDBACK OUT 1 1 4 R6 5kΩ 2 15 VOUT A2 OUT 2 2 DGND PIN 4 TO PIN 15 R5 20kΩ R3 10kΩ A1 AD7541A 10% DIGITAL GROUND ANALOG COMMON 00718-009 BIT 1 TO BIT 12 1FOR VALUES OF R1 AND R2, SEE TABLE 4. Figure 8. Bipolar Operation (Four-Quadrant Multiplication) R21 VDD R11 17 VREF VDD RFEEDBACK OUT 1 1 AD7541A A2 A1 OUT 2 2 DGND PIN 4 TO PIN 15 4 R5 20kΩ 2 15 1/2 ADG5436F DIGITAL GROUND BIT 1 TO BIT 12 VOUT R3 10kΩ 10% ANALOG COMMON 1FOR VALUES OF R1 AND R2, SEE TABLE 4. Figure 9. 12-Bit Plus Sign Magnitude Operation Rev. C | Page 10 of 13 00718-010 VIN R4 20kΩ C1 33pF 18 16 Analog Output, VOUT +VIN × (4095/4096) 0V 0V −VIN × (4095/4096) Data Sheet AD7541A APPLICATIONS HINTS SINGLE-SUPPLY OPERATION Output Offset Figure 10 shows the AD7541A connected in a voltage switching mode. OUT 1 is connected to the reference voltage, and OUT 2 is connected to GND. The output voltage of the DAC is available at the VREF pin (Pin 17) and has a constant output impedance equal to RLDR. The feedback resistor, RFEEDBACK, is not used in this circuit. VDD = 15V NOT USED 16 18 VREF 2.5V RFEEDBACK VDD 1 OUT 1 VREF 17 V+ AD7541A 2 OUT 2 GND 2 VOUT = 0V TO 10V PIN 4 TO PIN 15 4 15 BIT 1 TO BIT 12 V– R2 30kΩ R1 10kΩ SYSTEM GROUND VOUT ± VREF D (1 + R2/R1) WHERE 0 ≤ D ≤ 1, THAT IS, D IS A FRACTIONAL REPRESENTATION OF THE DIGITAL INPUT Digital Glitches 00718-011 The CMOS DACs exhibit a code dependent, output resistance that can cause a code dependent error voltage at the output of the amplifier. The maximum amplitude of this offset, which adds to the nonlinearity of the DAC, is 0.67 VOS, where VOS is the amplifier input offset voltage. To maintain monotonic operation, it is recommended that VOS be no greater than (25 × 10–6) × VREF over the temperature range of operation. Suitable op amps include the following: OP27, OP177, and OP777. The OP27 is best suited for fixed reference applications with low bandwidth requirements. The OP27 has extremely low offset (25 µV), and does not require an offset trim in most applications. The AD711 has a much wider bandwidth and higher slew rate and is recommended for multiplying and other applications that require fast settling. Figure 10. Single Supply Operation Using Voltage Switching Mode One cause of digital glitches is capacitive coupling from the digital lines to the OUT 1 and OUT 2 terminals. This coupling can be minimized by screening the analog pins of the AD7541A (Pin 1, Pin 2, Pin 17, and Pin 18) from the digital pins by a ground track run between Pin 2 and Pin 3 and between Pin 16 and Pin 17 of the AD7541A. Note how the analog pins are at one end of the package and are separated from the digital pins by VDD and GND to aid screening at the board level. On-chip capacitive coupling can also give rise to crosstalk from the digital to analog sections of the AD7541A, particularly in circuits with high currents and fast rise and fall times. Temperature Coefficients The gain temperature coefficient of the AD7541A has a maximum value of 5 ppm/°C and a typical value of 2 ppm/°C. This coefficient corresponds to worst case gain shifts of 2 LSB and 0.8 LSB, respectively, over a 100°C temperature range. When trim resistors, R1 and R2, are used to adjust the full-scale range, the temperature coefficients of R1 and R2 must also be taken into account. The reference voltage must always be positive. If OUT 1 goes more than 0.3 V less than GND, an internal diode is turned on and a heavy current may flow, causing device damage (the AD7541A is protected from the SCR latch-up phenomenon prevalent in many CMOS devices). Suitable references include the ADR431, the ADR441, and the REF192. The loading on the reference voltage source is code dependent, and the behavior of the reference voltage with changing load conditions often determines the response time of the circuit. To maintain linearity, the voltage at OUT 1 must remain within 2.5 V of GND for a VDD of 15 V. If VDD is reduced from 15 V, or if the reference voltage at OUT 1 is increased to more than 2.5 V, the differential nonlinearity of the DAC increases, and the linearity of the DAC degrades. SUPPLEMENTAL APPLICATION MATERIAL For further information on CMOS multiplying DACs, refer to the following: Analog-Digital Conversion Handbook, 1972, Analog Devices, Inc. CMOS DAC Application Guide, 1984, Analog Devices Analog-Digital Conversion Handbook, 1986, Analog Devices Rev. C | Page 11 of 13 AD7541A Data Sheet OUTLINE DIMENSIONS 0.180 (4.57) 0.165 (4.19) 0.048 (1.22 ) 0.042 (1.07) 3 0.048 (1.22) 0.042 (1.07) 4 0.056 (1.42) 0.042 (1.07) 0.20 (0.51) MIN 19 PIN 1 IDENTIFIER 18 TOP VIEW 0.021 (0.53) 0.013 (0.33) 0.050 (1.27) BSC 0.330 (8.38) 0.032 (0.81) 0.290 (7.37) 0.026 (0.66) (PINS DOWN) 14 8 9 0.020 (0.51) R 0.020 (0.50) R BOTTOM VIEW (PINS UP) 13 0.045 (1.14) R 0.025 (0.64) 0.356 (9.04) SQ 0.350 (8.89) 0.120 (3.04) 0.090 (2.29) 0.395 (10.03) SQ 0.385 (9.78) COMPLIANT TO JEDEC STANDARDS MO-047-AA CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. Figure 11. 20-Lead Plastic Leadless Chip Carrier [PLCC] (P-20) Dimensions shown in inches and (millimeters) 0.920 (23.37) 0.900 (22.86) 0.880 (22.35) 18 10 1 9 0.280 (7.11) 0.250 (6.35) 0.240 (6.10) 0.325 (8.26) 0.310 (7.87) 0.300 (7.62) 0.100 (2.54) BSC 0.060 (1.52) MAX 0.210 (5.33) MAX 0.195 (4.95) 0.130 (3.30) 0.115 (2.92) 0.015 (0.38) MIN 0.150 (3.81) 0.130 (3.30) 0.115 (2.92) 0.015 (0.38) GAUGE PLANE SEATING PLANE 0.022 (0.56) 0.018 (0.46) 0.014 (0.36) 0.005 (0.13) MIN 0.014 (0.36) 0.010 (0.25) 0.008 (0.20) 0.430 (10.92) MAX COMPLIANT TO JEDEC STANDARDS MS-001 CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. CORNER LEADS MAY BE CONFIGURED AS WHOLE OR HALF LEADS. Figure 12. 18-Lead Plastic Dual In-Line Package [PDIP] (N-18) Dimensions shown in inches and (millimeters) Rev. C | Page 12 of 13 070706-A 0.070 (1.78) 0.060 (1.52) 0.045 (1.14) Data Sheet AD7541A 11.75 (0.4626) 11.35 (0.4469) 10 18 7.60 (0.2992) 7.40 (0.2913) 9 0.75 (0.0295) 0.25 (0.0098) 2.65 (0.1043) 2.35 (0.0925) 0.30 (0.0118) 0.10 (0.0039) COPLANARITY 0.10 10.65 (0.4193) 10.00 (0.3937) 1.27 (0.0500) BSC 0.51 (0.0201) 0.31 (0.0122) SEATING PLANE 45° 8° 0° 0.33 (0.0130) 0.20 (0.0079) COMPLIANT TO JEDEC STANDARDS MS-013-AB CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. 1.27 (0.0500) 0.40 (0.0157) 060706-A 1 Figure 13. 18-Lead Standard Small Outline Package [SOIC_W] (RW-18) Dimensions shown in millimeters and (inches) ORDERING GUIDE Model 1 AD7541AJNZ AD7541AKNZ AD7541AJPZ-REEL AD7541AKPZ-REEL AD7541AKR AD7541AKRZ AD7541AKRZ-REEL AD7541AKRZ–REEL7 AD7541AACHIPS 1 Temperature Range 0°C to +70°C 0°C to +70°C 0°C to +70°C 0°C to +70°C 0°C to +70°C 0°C to +70°C 0°C to +70°C 0°C to +70°C Relative Accuracy, TMIN to TMAX ±1 LSB ±1/2 LSB ±1 LSB ±1/2 LSB ±1/2 LSB ±1/2 LSB ±1/2 LSB ±1/2 LSB Z = RoHS Compliant Part. ©2017 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D00718-0-3/17(C) Rev. C | Page 13 of 13 Error, TA = 25°C ±6 LSB ±3 LSB ±6 LSB ±3 LSB ±3 LSB ±3 LSB ±3 LSB ±3 LSB Package Description 18-Lead PDIP 18-Lead PDIP 20-Lead PLCC 20-Lead PLCC 18-Lead SOIC_W 18-Lead SOIC_W 18-Lead SOIC_W 18-Lead SOIC_W DIE Package Option N-18 N-18 P-20 P-20 RW-18 RW-18 RW-18 RW-18
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