AD8114ASTZ

AD8114ASTZ

  • 厂商:

    AD(亚德诺)

  • 封装:

    LQFP100

  • 描述:

    Video Switch IC 1 Channel 100-LQFP (14x14)

  • 详情介绍
  • 数据手册
  • 价格&库存
AD8114ASTZ 数据手册
Low Cost, 225 MHz, 16 × 16 Crosspoint Switches AD8114/AD8115 Data Sheet FEATURES FUNCTIONAL BLOCK DIAGRAM APPLICATIONS Routing of high speed signals, including Video (NTSC, PAL, S, SECAM, YUV, RGB) Compressed video (MPEG, wavelet) 3-level digital video (HDB3) Data communications Telecommunications GENERAL DESCRIPTION The AD8114/AD8115 are high speed, 16 × 16 video crosspoint switch matrices. They offer a −3 dB signal bandwidth greater than 200 MHz and channel switch times of less than 50 ns with 1% settling. With −70 dB of crosstalk and −98 dB isolation (at 5 MHz), the AD8114/AD8115 are useful in many high speed applications. Rev. C SER/PAR D0 D1 D2 D3 D4 A0 A1 A2 A3 CLK DATA IN 80-BIT SHIFT REGISTER WITH 5-BIT PARALLEL LOADING UPDATE CE 80 PARALLEL LATCH RESET 80 DATA OUT SET INDIVIDUAL OR RESET ALL OUTPUTS TO "OFF" DECODE 16 × 5:16 DECODERS AD8114/AD8115 256 SWITCH MATRIX OUTPUT BUFFER G = +1, G = +2 16 OUTPUTS 01070-001 16 INPUTS 16 ENABLE/DISABLE 16 × 16 high speed nonblocking switch arrays AD8114; G = 1 AD8115; G = 2 Serial or parallel programming of switch array Serial data out allows daisy-chaining of multiple 16 × 16 arrays to create larger switch arrays High impedance output disable allows connection of multiple devices without loading the output bus For smaller arrays see the AD8108/AD8109 (8 × 8) or AD8110/AD8111 (16 × 8) switch arrays Complete solution Buffered inputs Programmable high impedance outputs 16 output amplifiers, AD8114 (G = 1), AD8115 (G = 2) Drives 150 Ω loads Excellent video performance 25 MHz, 0.1 dB gain flatness 0.05%/0.05° differential gain/differential phase error (RL = 150 Ω) Excellent ac performance −3 dB bandwidth: 225 MHz Slew rate: 375 V/µs Low power of 700 mW (2.75 mW per point) Low all hostile crosstalk of −70 dB at 5 MHz Reset pin allows disabling of all outputs (connected through a capacitor to ground provides power-on reset capability) 100-lead LQFP (14 mm × 14 mm) Figure 1. The differential gain and differential phase of better than 0.05% and 0.05°, respectively, along with a 0.1 dB flatness out to 25 MHz while driving a 75 Ω back-terminated load, make the AD8114/ AD8115 ideal for all types of signal switching. The AD8114/AD8115 include 16 independent output buffers that can be placed into a high impedance state for paralleling crosspoint outputs so that off channels do not load the output bus. The AD8114 has a gain of 1, while the AD8115 offers a gain of 2. They operate on voltage supplies of ±5 V while consuming only 70 mA of idle current. The channel switching is performed via a serial digital control (which can accommodate daisy-chaining of several devices) or via a parallel control, allowing updating of an individual output without reprogramming the entire array. The AD8114/AD8115 is packaged in a 100-lead LQFP and is available over the extended industrial temperature range of −40°C to +85°C. Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©1998–2016 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com AD8114/AD8115 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Typical Performance Characteristics ........................................... 11 Applications ....................................................................................... 1 Input/Output Schematics .............................................................. 17 General Description ......................................................................... 1 Theory of Operation ...................................................................... 18 Functional Block Diagram .............................................................. 1 Applications ................................................................................ 18 Revision History ............................................................................... 2 Power-On Reset .......................................................................... 19 Specifications..................................................................................... 3 Gain Selection ............................................................................. 19 Timing Characteristics (Serial) .................................................. 5 Creating Larger Crosspoint Arrays .......................................... 19 Timing Characteristics (Parallel) ............................................... 6 Multichannel Video ................................................................... 21 Absolute Maximum Ratings ............................................................ 8 Crosstalk ...................................................................................... 21 Maximum Power Dissipation ..................................................... 8 Outline Dimensions ....................................................................... 24 ESD Caution .................................................................................. 8 Ordering Guide .......................................................................... 24 Pin Configuration and Function Descriptions ............................. 9 REVISION HISTORY 7/2016—Rev. B to Rev. C Changes to General Description Section ...................................... 1 Changes to Off Isolation, Input-to-Output Parameter, Table 1 ........ 3 Changes to Areas of Crosstalk Section ........................................ 22 Deleted PCB Layout Section and Figure 50; Renumbered Sequentially ..................................................................................... 25 Updated Outline Dimensions ....................................................... 25 Changes to Ordering Guide .......................................................... 25 Deleted Figure 51 and Figure 52................................................... 26 Deleted Figure 53 and Figure 54................................................... 27 Deleted Figure 55 and Figure 56................................................... 28 Deleted Evaluation Board Section and Figure 57....................... 29 Deleted Control the Evaluation Board from a PC Section, Figure 58, Overshoot of PC Printer Ports’ Data Lines Section, and Figure 59 ................................................................................... 30 9/2005—Rev. A to Rev. B Updated Format .................................................................. Universal Change to Figure 3 ............................................................................6 Change to Absolute Maximum Ratings .........................................8 Changes to Maximum Power Dissipation Section........................8 Updated Outline Dimensions ....................................................... 31 Changes to Ordering Guide .......................................................... 31 11/2001—Rev. 0 to Rev. A Changes to Ordering Guide .............................................................5 Updated Outline Dimensions ....................................................... 26 10/1998—Revision 0: Initial Version Rev. C | Page 2 of 25 Data Sheet AD8114/AD8115 SPECIFICATIONS VS = ±5 V, TA = +25°C, RL = 1 kΩ, unless otherwise noted. Table 1. Parameter DYNAMIC PERFORMANCE −3 dB Bandwidth Gain Flatness Propagation Delay Settling Time Slew Rate NOISE/DISTORTION PERFORMANCE Differential Gain Error Differential Phase Error Crosstalk, All Hostile Off Isolation, Input-to-Output Input Voltage Noise DC PERFORMANCE Gain Error Gain Matching Gain Temperature Coefficient OUTPUT CHARACTERISTICS Output Impedance Output Disable Capacitance Output Leakage Current Output Voltage Range Voltage Range INPUT CHARACTERISTICS Input Offset Voltage Input Voltage Range Input Capacitance Input Resistance Input Bias Current SWITCHING CHARACTERISTICS Enable On Time Switching Time, 2 V Step Switching Transient (Glitch) Test Conditions/Comments Min Typ 200 mV p-p, RL = 150 Ω 2 V p-p, RL = 150 Ω 0.1 dB, 200 mV p-p, RL = 150 Ω 0.1 dB, 2 V p-p, RL = 150 Ω 2 V p-p, RL = 150 Ω 0.1%, 2 V step, RL = 150 Ω 2 V step, RL = 150 Ω 150/125 225/200 100/125 25/40 20/40 5 40 375/450 MHz MHz MHz MHz ns ns V/µs NTSC or PAL, RL = 1 kΩ NTSC or PAL, RL = 150 Ω NTSC or PAL, RL = 1 kΩ NTSC or PAL, RL = 150 Ω f = 5 MHz f = 10 MHz f = 5 MHz, RL = 150 Ω, one channel 0.01 MHz to 50 MHz 0.05 0.05 0.05 0.05 −70/−64 −60/−52 −98 16/18 % % Degrees Degrees dB dB dB nV/√Hz No load RL = 1 kΩ RL = 150 Ω No load, channel-to-channel RL = 1 kΩ channel-to-channel 0.05/0.2 0.05/0.2 0.2/0.35 0.01/0.5 0.01/0.5 0.75/1.5 DC, enabled Disabled Disabled Disabled No load IOUT = 20 mA Short-circuit current 0.2 10 5 1 ±3.3 ±3 65 Worst case (all configurations) Temperature coefficient No load Any switch configuration ±3.0 ±2.5 ±3/±1.5 1 Per output selected 50% UPDATE to 1% settling Rev. C | Page 3 of 25 3 10 ±3.5 5 10 2 60 50 20/30 Max 0.08/0.6 0.04/1 Unit % % % % % ppm/°C Ω MΩ pF µA V V mA 15 5 mV µV/°C V pF MΩ µA ns ns mV p-p AD8114/AD8115 Parameter POWER SUPPLIES Supply Current Supply Voltage Range PSRR OPERATING TEMPERATURE RANGE Temperature Range θJA Data Sheet Test Conditions/Comments Min AVCC, outputs enabled, no load AVCC, outputs disabled AVEE, outputs enabled, no load AVEE, outputs disabled DVCC, outputs enabled, no load DC f = 100 kHz f = 1 MHz 64 Operating (still air) Operating (still air) Rev. C | Page 4 of 25 Typ Max Unit 70/80 27/30 70/80 27/30 16 ±4.5 to ±5.5 80 66 46 mA mA mA mA mA V dB dB dB −40 to +85 40 °C °C/W Data Sheet AD8114/AD8115 TIMING CHARACTERISTICS (SERIAL) Table 2. Timing Characteristics Parameter Serial Data Setup Time CLK Pulse Width Serial Data Hold Time CLK Pulse Separation, Serial Mode CLK to UPDATE Delay UPDATE Pulse Width CLK to DATA OUT Valid, Serial Mode Propagation Delay, UPDATE to Switch On or Off Data Load Time, CLK = 5 MHz, Serial Mode CLK, UPDATE Rise and Fall Times RESET Time Symbol t1 t2 t3 t4 t5 t6 t7 Min 20 100 20 100 0 50 Typ Max 200 50 16 100 200 Unit ns ns ns ns ns ns ns ns µs ns ns Table 3. Logic Levels VIL RESET, SER/PAR CLK, DATA IN, CE, UPDATE 0.8 V max VOH DATA OUT VOL DATA OUT 2.7 V min 0.5 V max t2 IIH RESET, SER/PAR CLK, DATA IN, CE, UPDATE 20 µA max IIL RESET, SER/PAR CLK, DATA IN, CE, UPDATE −400 µA min IOH DATA OUT IOL DATA OUT −400 µA max 3.0 mA min t4 1 CLK 0 t1 LOAD DATA INTO SERIAL REGISTER ON FALLING EDGE t3 1 DATA IN OUT7 (D4) OUT00 (D0) OUT7 (D3) 0 t5 t6 1 = LATCHED UPDATE 0 = TRANSPARENT TRANSFER DATA FROM SERIAL REGISTER TO PARALLEL LATCHES DURING LOW LEVEL t7 01070-002 VIH RESET, SER/PAR CLK, DATA IN, CE, UPDATE 2.0 V min DATA OUT Figure 2. Timing Diagram, Serial Mode Rev. C | Page 5 of 25 AD8114/AD8115 Data Sheet TIMING CHARACTERISTICS (PARALLEL) Table 4. Timing Characteristics Parameter Data Setup Time CLK Pulse Width Data Hold Time CLK Pulse Separation CLK to UPDATE Delay UPDATE Pulse Width Propagation Delay, UPDATE to Switch On or Off CLK, UPDATE Rise and Fall Times RESET Time Symbol t1 t2 t3 t4 t5 t6 Min 20 100 20 100 0 50 Typ Max 50 100 200 Unit ns ns ns ns ns ns ns ns ns Table 5. Logic Levels VIH RESET, SER/PAR, CLK, D0, D1, D2, D3, D4, A0, A1, A2, A3, CE, UPDATE VIL RESET, SER/PAR, CLK, D0, D1, D2, D3, D4, A0, A1, A2, A3, CE, UPDATE VOH DATA OUT VOL DATA OUT IIH RESET, SER/PAR, CLK, D0, D1, D2, D3, D4, A0, A1, A2, A3, CE, UPDATE IIL RESET, SER/PAR, CLK, D0, D1, D2, D3, D4, A0, A1, A2, A3, CE, UPDATE IOH DATA OUT IOL DATA OUT 2.0 V min 0.8 V max 2.7 V min 0.5 V max 20 µA max −400 µA min −400 µA max 3.0 mA min t2 t4 1 CLK 0 t1 D0–D3 A0–A2 t3 1 0 t5 01070-003 1 = LATCHED t6 UPDATE 0 = TRANSPARENT Figure 3. Timing Diagram, Parallel Mode Rev. C | Page 6 of 25 Data Sheet AD8114/AD8115 Table 6. Operation Truth Table CE 1 0 UPDATE X 1 CLK X f DATA IN X Datai DATA OUT X Datai-80 RESET X 1 SER/ PAR 0 1 f 1 0 X Not applicable in parallel mode X 1 0 D0…D4, A0… A3 X 1 X X X X X X 0 X PARALLEL DATA (OUTPUT ENABLE) X 0 Operation/Comment No change in logic. The data on the serial DATA IN line is loaded into serial register. The first bit clocked into the serial register appears at DATA OUT 80 clocks later. The data on the parallel data lines, D0 to D4, are loaded into the 80 bit serial shift register location addressed by A0 to A3. Data in the 80-bit shift register transfers into the parallel latches that control the switch array. Latches are transparent. Asynchronous operation. All outputs are disabled. Remainder of logic is unchanged. D0 D1 D2 D3 D4 SER/PAR S D1 Q D0 DATA IN (SERIAL) S D1 S D1 D Q Q D0 CLK D Q Q D0 CLK S D1 D Q Q D0 CLK D Q CLK S D1 S D1 Q D Q D0 CLK Q D0 D Q CLK S D1 S D1 Q D Q D0 CLK Q D0 S D1 D Q Q D0 CLK S D1 D Q Q D0 CLK S D1 D Q Q D0 CLK S D1 D Q Q D0 CLK D Q DATA OUT CLK CLK CE UPDATE OUTPUT ADDRESS OUT0 EN OUT1 EN OUT2 EN OUT3 EN OUT4 EN A1 OUT5 EN A2 A3 4 TO 16 DECODER A0 OUT6 EN OUT7 EN OUT8 EN OUT9 EN OUT10 EN OUT11 EN OUT12 EN OUT13 EN OUT14 EN OUT15 EN LE D LE D LE D LE D LE D LE D LE D LE D LE D LE D LE D LE D OUT0 B0 OUT0 B1 OUT0 B2 OUT0 B3 OUT0 EN OUT1 B0 OUT14 EN OUT15 B0 OUT15 B1 OUT15 B2 OUT15 B3 OUT15 EN Q Q Q Q Q CLR Q CLR Q Q Q Q Q CLR Q RESET (OUTPUT ENABLE) SWITCH MATRIX Figure 4. Logic Diagram Rev. C | Page 7 of 25 16 OUTPUT ENABLE 01070-011 DECODE 256 AD8114/AD8115 Data Sheet ABSOLUTE MAXIMUM RATINGS While the AD8114/AD8115 are internally short-circuit protected, this may not be sufficient to guarantee that the maximum junction temperature (125°C) is not exceeded under all conditions. To ensure proper operation, it is necessary to observe the maximum power derating curves shown in Figure 5. Table 7. Rating 12.0 V 2.6 W 5 TJ = 125°C Specification is for device in free air (TA = 25°C). 100-lead plastic LQFP (ST): θJA = 40°C/W. 2 Maximum reflow temperatures are to JEDEC industry standard J-STD-020. 1 Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability. MAXIMUM POWER DISSIPATION 4 3 2 1 0 –50 –40 –30 –20 –10 0 10 20 30 40 50 60 AMBIENT TEMPERATURE (°C) 01070-004 ±VS Observe power derating curves −65°C to +125°C MAXIMUM POWER DISSIPATION (Ω) Parameter Supply Voltage Internal Power Dissipation1 AD8114/AD8115 100-Lead Plastic LQFP (ST) Input Voltage Output Short-Circuit Duration Storage Temperature Range2 70 80 Figure 5. Maximum Power Dissipation vs. Temperature ESD CAUTION The maximum power that can be safely dissipated by the AD8114/AD8115 is limited by the associated rise in junction temperature. The maximum safe junction temperature for plastic encapsulated devices is determined by the glass transition temperature of the plastic, approximately 125°C. Temporarily exceeding this limit may cause a shift in parametric performance due to a change in the stresses exerted on the die by the package. Exceeding a junction temperature of 125°C for an extended period can result in device failure. Rev. C | Page 8 of 25 90 Data Sheet AD8114/AD8115 CE DATA OUT CLK DATA IN UPDATE SER/PAR NC NC NC NC NC NC NC NC NC A0 A1 A2 A3 D0 D1 D2 D3 D4 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 RESET 100 99 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS 75 DVCC 74 DGND DVCC 1 DGND 2 AGND 3 73 AGND IN08 4 72 IN07 AGND PIN 1 AGND 5 71 IN09 6 70 IN06 AGND 7 69 AGND IN05 IN10 8 68 AGND 9 67 AGND IN11 10 AD8114/AD8115 66 IN04 AGND 11 IN12 12 TOP VIEW (Not to Scale) 65 AGND 64 IN03 AGND 13 63 AGND IN13 14 62 IN02 AGND 15 61 AGND IN14 16 60 IN01 AGND AGND 17 59 IN15 18 58 IN00 AGND 19 57 AGND AVEE AVEE 20 56 AVCC 21 55 AVCC AVCC15 22 54 AVCC00 OUT00 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 OUT11 AVEE10/11 OUT10 AVCC09/10 OUT09 AVEE08/09 OUT08 AVCC07/08 OUT07 AVEE06/07 OUT06 AVCC05/06 OUT05 AVEE04/05 OUT04 AVCC03/04 OUT03 AVEE02/03 OUT02 AVCC01/02 01070-005 30 AVCC11/12 NC = NO CONNECT 29 OUT01 OUT12 51 28 25 AVEE12/13 AVEE00/01 OUT14 27 52 26 53 24 OUT13 23 AVCC13/14 OUT15 AVEE14/15 Figure 6. Pin Configuration Table 8. Pin Function Descriptions Pin No. 58, 60, 62, 64, 66, 68, 70, 72, 4, 6, 8, 10, 12, 14, 16, 18 96 97 98 95 Mnemonic INxx Description Analog Inputs. xx = Channel 00 through Channel 15. DATA IN CLK DATA OUT UPDATE 100 99 94 53, 51, 49, 47, 45, 43, 41, 39, 37, 35, 33, 31, 29, 27, 25, 23 3, 5, 7, 9, 11, 13, 15, 17, 19, 57, 59, 61, 63, 65, 67, 69, 71, 73 1, 75 2, 74 20, 56 21, 55 54, 50, 46, 42, 38, 34, 30, 26, 22 52, 48, 44, 40, 36, 32, 28, 24 84 83 82 RESET CE SER/PAR OUTyy Serial Data Input, TTL Compatible. Clock, TTL Compatible. Falling edge triggered. Serial Data Out, TTL Compatible. Enable (Transparent) Low. Allows serial register to connect directly to switch matrix. Data latched when high. Disable Outputs, Active Low. Chip Enable, Enable Low. Must be low to clock in and latch data. Selects Serial Data Mode, Low or Parallel Data Mode, High. Must be connected. Analog Outputs. yy = Channel 00 through Channel 15. AGND Analog Ground for Inputs and Switch Matrix. Must be connected. DVCC DGND AVEE AVCC AVCCxx/yy AVEExx/yy A0 A1 A2 +5 V for Digital Circuitry. Ground for Digital Circuitry. −5 V for Inputs and Switch Matrix. +5 V for Inputs and Switch Matrix. +5 V for Output Amplifier that is Shared by Channels xx and yy. Must be connected. −5 V for Output Amplifier that is Shared by Channels xx and yy. Must be connected. Parallel Data Input, TTL Compatible (output select LSB). Parallel Data Input, TTL Compatible (output select). Parallel Data Input, TTL Compatible (output select). Rev. C | Page 9 of 25 AD8114/AD8115 Pin No. 81 80 79 78 77 76 85 to 93 Data Sheet Mnemonic A3 D0 D1 D2 D3 D4 NC Description Parallel Data Input, TTL Compatible (output select MSB). Parallel Data Input, TTL Compatible (input select LSB) Parallel Data Input, TTL Compatible (input select). Parallel Data Input, TTL Compatible (input select). Parallel Data Input, TTL Compatible (input select MSB). Parallel Data Input, TTL Compatible (output enable). No Connect. Rev. C | Page 10 of 25 Data Sheet AD8114/AD8115 TYPICAL PERFORMANCE CHARACTERISTICS 2 0.2 GAIN 0.1 200mV p-p 0.3 0 FLATNESS –1 0 –2 –0.1 –3 –0.2 GAIN –0.4 –5 0.2 0.1 –2 FLATNESS 0 –3 –0.1 –4 200mV p-p 2V p-p –5 –0.2 –7 0.1 –0.5 1 10 FREQUENCY (MHz) –0.6 1000 100 01070-012 –6 VO AS SHOWN RL = 150Ω –6 –8 0.1 Figure 7. AD8114 Frequency Response, RL = 150 Ω –0.4 1 10 FREQUENCY (MHz) –0.5 1000 100 Figure 10. AD8115 Frequency Response, RL = 150 Ω 3 0.4 3 0.5 2 0.3 2 0.4 0.2 1 1 200mV p-p GAIN –0.1 2V p-p GAIN (dB) 0 –2 FLATNESS (dB) –1 FLATNESS –4 –4 –5 –0.4 –5 1 10 FREQUENCY (MHz) –0.6 1000 100 01070-013 –0.2 –0.5 0.1 –1 –0.3 0 –0.1 –3 200mV p-p 2V p-p –7 0.1 Figure 8. AD8114 Frequency Response, RL = 1 kΩ 8 VO = 200mV p-p RL AS SHOWN CL = 18pF RL = 1kΩ 6 4 0 2 –1 GAIN (dB) 1 RL = 150Ω –2 10 FREQUENCY (MHz) 100 –4 –6 1 10 100 RL = 1kΩ RL = 150Ω –2 –4 –5 VO = 200mV p-p RL AS SHOWN CL = 18pF 0 –3 –6 0.1 1 10 01070-014 GAIN (dB) 2 –0.4 –0.5 1000 Figure 11. AD8115 Frequency Response, RL = 1 kΩ 4 3 –0.3 2V p-p VO AS SHOWN RL = 1kΩ –6 –0.2 01070-017 –6 0.2 –2 –3 –7 0.1 0.3 0 FLATNESS VO AS SHOWN RL = 1kΩ 200mV p-p GAIN 0.1 0 GAIN (dB) –0.3 2V p-p VO AS SHOWN RL = 150Ω� –7 FLATNESS (dB) –0.3 GAIN (dB) 2V p-p FLATNESS (dB) GAIN (dB) –1 –4 0.4 01070-015 200mV p-p –8 –10 0.1 1000 FREQUENCY (MHz) 1 10 100 1000 FREQUENCY (MHz) Figure 9. AD8114 Frequency Response vs. Load Impedance Figure 12. AD8115 Frequency Response vs. Load Impedance Rev. C | Page 11 of 25 FLATNESS (dB) 0 0.5 1 01070-016 1 AD8114/AD8115 Data Sheet 0 0 RL = 1kΩ RT = 37.5Ω –20 –20 –30 –30 –40 ALL HOSTILE –50 RL = 1kΩ RT = 37.5Ω –10 CROSSTALK (dB) –60 –70 –40 ALL HOSTILE –50 ADJACENT –60 –70 ADJACENT –80 01070-018 –80 –90 –100 0.1 1 10 100 01070-021 CROSSTALK (dB) –10 –90 –100 0.1 1000 1 FREQUENCY (MHz) Figure 13. AD8114 Crosstalk vs. Frequency 100 1000 Figure 16. AD8115 Crosstalk vs. Frequency 0 0 VO = 2V p-p RL = 150Ω –10 –20 –20 –30 –30 –40 –50 2ND HARMONIC –60 VO = 2V p-p RL = 150Ω –10 DISTORTION (dBC) DISTORTION (dBc) 10 FREQUENCY (MHz) –70 –40 –50 2ND HARMONIC –60 –70 3RD HARMONIC –80 01070-019 3RD HARMONIC –90 –100 1 10 01070-022 –80 –90 –100 1 50 10 FUNDAMENTAL FREQUENCY (MHz) 50 FUNDAMENTAL FREQUENCY (MHz) Figure 14. AD8114 Distortion vs. Frequency Figure 17. AD8115 Distortion vs. Frequency VO = 2V STEP RL = 150Ω 0 5 10 15 20 25 5ns/DIV 30 35 40 01070-023 01070-020 0.1%/DIV 0.1%/DIV VO = 2V STEP RL = 150Ω 45 0 5 10 15 20 25 5ns/DIV 30 35 Figure 18. AD8115 Settling Time Figure 15. AD8114 Settling Time Rev. C | Page 12 of 25 40 45 Data Sheet AD8114/AD8115 1M 1M 100k 1k 100 0.1 1 10 100 10k 1k 01070-027 INPUT IMPEDANCE (Ω) 10k 01070-024 INPUT IMPEDANCE (Ω) 100k 100 0.1 500 1 FREQUENCY (MHz) 100 100 10 01070-025 1 10 FREQUENCY (MHz) 100 500 10 1 0.1 0.1 1000 01070-028 OUTPUT IMPEDANCE (Ω) 1000 OUTPUT IMPEDANCE (Ω) 1000 1 100 Figure 22. AD8115 Input Impedance vs. Frequency Figure 19. AD8114 Input Impedance vs. Frequency 0.1 0.1 10 FREQUENCY (MHz) 1 10 FREQUENCY (MHz) 100 1000 1M 1M 100k 100k OUTPUT IMPEDANCE (Ω) Figure 23. AD8115 Output Impedance, Enabled vs. Frequency 10k 1k 1k 1 10 FREQUENCY (MHz) 100 10 0.1 1000 01070-029 10 0.1 10k 100 100 01070-026 OUTPUT IMPEDANCE (Ω) Figure 20. AD8114 Output Impedance, Enabled vs. Frequency 1 10 FREQUENCY (MHz) 100 1000 Figure 24. AD8115 Output Impedance, Disabled vs. Frequency Figure 21. AD8114 Output Impedance, Disabled vs. Frequency Rev. C | Page 13 of 25 Data Sheet –40 –40 –50 –50 –60 –60 –70 –70 OFF ISOLATION (dB) –80 –90 –100 –110 –120 –80 –90 –100 –110 –140 0.1 1 10 100 01070-033 01070-030 –120 –130 –130 –140 0.1 500 1 FREQUENCY (MHz) Figure 25. AD8114 Off Isolation, Input-to-Output –20 –30 –30 –40 –40 –PSRR –60 +PSRR –70 –PSRR –60 –80 –90 –90 01070-031 –80 1 0.1 –100 0.03 10 01070-034 –70 Figure 29. AD8115 PSRR vs. Frequency 170 150 150 130 130 VOLTAGE NOISE (nV/√Hz) 170 110 90 70 01070-032 50 16nV/√Hz 100 1k 10k 100k 10 FREQUENCY (MHz) Figure 26. AD8114 PSRR vs. Frequency 30 1 0.1 FREQUENCY (MHz) VOLTAGE NOISE (nV/√Hz) 500 +PSRR –50 PSRR (dB) PSRR (dB) –50 10 10 100 Figure 28. AD8115 Off Isolation, Input-to-Output –20 –100 0.03 10 FREQUENCY (MHz) 1M 110 90 70 50 30 10 10 10M FREQUENCY (Hz) 01070-035 OFF ISOLATION (dB) AD8114/AD8115 18nV/√Hz 100 1k 10k 100k 1M FREQUENCY (Hz) Figure 27. AD8114 Voltage Noise vs. Frequency Figure 30. AD8115 Voltage Noise vs. Frequency Rev. C | Page 14 of 25 10M Data Sheet AD8114/AD8115 VO = 200mV STEP RL = 150Ω 0.10V 0.10V 0.05V 0.05V 0V 0V –0.05V –0.05V –0.10V –0.10V 25ns –0.15V Figure 34. AD8115 Pulse Response, Small Signal VO = 2V STEP RL = 150Ω 1.5V 1.0V 0.5V 0.5V 0V 0V –0.5V –0.5V –1.0V –1.0V 01070-037 –1.5V 25ns VO = 200mV STEP RL = 150Ω 1.5V 1.0V 500mV 25ns 50mV Figure 31. AD8114 Pulse Response, Small Signal –1.5V 500mV Figure 32. AD8114 Pulse Response, Large Signal 20ns Figure 35. AD8115 Pulse Response, Large Signal +5V UPDATE 01070-039 50mV 01070-036 –0.15V VO = 200mV STEP RL = 150Ω 0.15V 01070-040 0.15V +5V UPDATE 0V 0V +2V VOUT –0V –1V 10ns VOUT 01070-038 INPUT 0 AT –1V INPUT 0 AT –1V –2V 10ns Figure 33. AD8114 Switching Time Figure 36. AD8115 Switching Time Rev. C | Page 15 of 25 –0V 01070-041 +1V INPUT 1 AT +1V INPUT 1 AT +1V AD8114/AD8115 Data Sheet 5V 5V UPDATE UPDATE 0V 0V 0.05V 0.05V 0V 0V 50ns 50ns Figure 37. AD8114 Switching Transient (Glitch) Figure 40. AD8115 Switching Transient (Glitch) 260 240 240 220 220 200 200 180 160 FREQUENCY 160 140 120 100 140 120 100 60 40 40 01070-043 60 20 –10 –8 –6 –4 0 4 –2 2 OFFSET VOLTAGE (mV) 8 6 20 0 –14 –12 –10 –8 –6 –4 –2 0 2 4 6 8 10 12 14 16 18 OFFSET VOLTAGE (mV) 10 Figure 41. AD8115 Offset Voltage Distribution 44 40 40 36 36 32 32 28 28 FREQUENCY 44 24 20 16 24 20 16 12 12 8 8 01070-044 FREQUENCY Figure 38. AD8114 Offset Voltage Distribution 4 0 –20 –16 –12 –8 –4 0 4 8 12 OFFSET VOLTAGE DRIFT (µV/°C) 16 01070-046 80 80 01070-047 FREQUENCY 180 0 –12 01070-045 –0.05V 01070-042 –0.05V 4 0 –12 20 Figure 39. AD8114 Offset Voltage Drift Distribution (−40°C to +85°C) –8 –4 0 4 8 12 OFFSET VOLTAGE DRIFT (µV/°C) 16 20 Figure 42. AD8115 Offset Voltage Drift Distribution (−40°C to +85°C) Rev. C | Page 16 of 25 Data Sheet AD8114/AD8115 INPUT/OUTPUT SCHEMATICS VCC VCC ESD ESD INPUT INPUT ESD AVEE 01070-009 01070-006 ESD DGND Figure 43. Analog Input Figure 46. Logic Input VCC VCC ESD 2kΩ ESD OUTPUT OUTPUT AVEE DGND Figure 44. Analog Output Figure 47. Logic Output VCC ESD 20kΩ ESD DGND 01070-008 RESET Figure 45. Reset Input Rev. C | Page 17 of 25 01070-010 ESD 01070-007 ESD AD8114/AD8115 Data Sheet THEORY OF OPERATION The AD8114 (G = 1) and AD8115 (G = 2) are crosspoint arrays with 16 outputs, each of which can be connected to any one of 16 inputs. Organized by output row, 16 switchable transconductance stages are connected to each output buffer in the form of a 16-to-1 multiplexer. Each of the 16 rows of transconductance stages are wired in parallel to the 16 input pins, for a total array of 256 transconductance stages. Decoding logic for each output selects one (or none) of the transconductance stages to drive the output stage. The transconductance stages are NPN-input differential pairs, sourcing current into the folded cascode output stage. The compensation network and emitter follower output buffer are in the output stage. Voltage feedback sets the gain, with the AD8114 configured as a unity gain follower, and the AD8115 configured as a gain-of-2 amplifier with a feedback network. This architecture provides drive for a reverse-terminated video load (150 Ω), with low differential gain and phase error for relatively low power consumption. Power consumption is further reduced by disabling outputs and transconductance stages that are not in use. The user notices a small increase in input bias current as each transconductance stage is enabled. Features of the AD8114 and AD8115 simplify the construction of larger switch matrices. The unused outputs of both devices can be disabled to a high impedance state, allowing the outputs of multiple ICs to be bused together. In the case of the AD8115, a feedback isolation scheme is used so that the impedance of the gain-of-2 feedback network does not load the output. Because no additional input buffering is necessary, high input resistance and low input capacitance are easily achieved without additional signal degradation. To control enable glitches, it is recommended that the disabled output voltage be maintained within its normal enabled voltage range (±3.3 V). If necessary, the disabled output can be kept from drifting out of range by applying an output load resistor to ground. A flexible TTL-compatible logic interface simplifies the programming of the matrix. Both parallel and serial loading into a first rank of latches programs each output. A global latch simultaneously updates all outputs. A power-on reset pin is available to avoid bus conflicts by disabling all outputs. APPLICATIONS The AD8114/AD8115 have two options for changing the programming of the crosspoint matrix. In the first option a serial word of 80 bits can be provided that updates the entire matrix each time. The second option allows for changing the programming of a single output via a parallel interface. The serial option requires fewer signals, but more time (clock cycles) for changing the programming, while the parallel programming technique requires more signals, but can change a single output at a time and requires fewer clock cycles to complete programming. Serial Programming The serial programming mode uses the CE, CLK, DATA IN, UPDATE, and SER/PAR device pins. The first step is to assert a low on SER/PAR to enable the serial programming mode. CE for the chip must be low to allow data to be clocked into the device. The CE signal can be used to address an individual device when devices are connected in parallel. The UPDATE signal should be high during the time that data is shifted into the serial port of the device. Although the data still shifts in when UPDATE is low, the transparent, asynchronous latches allow the shifting data to reach the matrix. This causes the matrix to try to update to every intermediate state as defined by the shifting data. The data at DATA IN is clocked in at every down edge of CLK. A total of 80 bits must be shifted in to complete the programming. For each of the 16 outputs, there are four bits (D0 to D3) that determine the source of its input followed by one bit (D4) that determines the enabled state of the output. If D4 is low (output disabled), the four associated bits (D0 to D3) do not matter because no input is switched to that output. The most significant output address data is shifted in first, and then following in sequence until the least significant output address data is shifted in. At this point UPDATE can be taken low, which causes the programming of the device according to the data that was just shifted in. The UPDATE registers are asynchronous, and when UPDATE is low (and CE is low), they are transparent. If more than one AD8114/AD8115 device is to be serially programmed in a system, the DATA OUT signal from one device can be connected to the DATA IN of the next device to form a serial chain. All of the CLK, CE, UPDATE, and SER /PAR pins should be connected in parallel and operated as described above. The serial data is input to the DATA IN pin of the first device of the chain, and it ripples on through to the last. Therefore, the data for the last device in the chain should come at the beginning of the programming sequence. The length of the programming sequence (80 bits) is multiplied by the number of devices in the chain. Parallel Programming While using the parallel programming mode, it is not necessary to reprogram the entire device when making changes to the matrix. In fact, parallel programming allows the modification of a single output at a time. Since this takes only one CLK/UPDATE cycle, significant time savings can be realized by using parallel programming. Rev. C | Page 18 of 25 Data Sheet AD8114/AD8115 One important consideration in using parallel programming is that the RESET signal does not reset all registers in the AD8114/ AD8115. When taken low, the RESET signal only sets each output to the disabled state. This is helpful during power-up to ensure that two parallel outputs are not active at the same time. After initial power-up, the internal registers in the device generally have random data, even though the RESET signal was asserted. If parallel programming is used to program one output, then that output is properly programmed, but the rest of the device has a random program state depending on the internal register content at power-up. Therefore, when using parallel programming, it is essential that all outputs be programmed to a desired state after power-up. This ensures that the programming matrix is always in a known state. From then on, parallel programming can be used to modify a single output or more at a time. In similar fashion, if both CE and UPDATE are taken low after initial power-up, the random power-up data in the shift register is programmed into the matrix. Therefore, to prevent the crosspoint from being programmed into an unknown state, do not apply low logic levels to both CE and UPDATE after power is initially applied. Programming the full shift register one time to a desired state by either serial or parallel programming after initial power-up eliminates the possibility of programming the matrix to an unknown state. To change the programming of an output via parallel programming, SER/PAR and UPDATE should be taken high and CE should be taken low. The CLK signal should be in the high state. The 4-bit address of the output to be programmed should be put on A0 to A3. The first four data bits (D0 to D3) should contain the information that identifies the input that gets programmed to the output that is addressed. The fourth data bit (D4) determines the enabled state of the output. If D4 is low (output disabled), then the data on D0 to D3 does not matter. After the desired address and data signals have been established, they can be latched into the shift register by a high to low transition of the CLK signal. The matrix is not programmed, however, until the UPDATE signal is taken low. It is thus possible to latch in new data for several or all of the outputs first via successive negative transitions of CLK while UPDATE is held high, and then have all the new data take effect when UPDATE goes low. This technique should be used when programming the device for the first time after power-up when using parallel programming. POWER-ON RESET When powering up the AD8114/AD8115, it is usually desirable to have the outputs come up in the disabled state. When taken low, the RESET pin causes all outputs to be in the disabled state. However, the RESET signal does not reset all registers in the AD8114/AD8115. This is important when operating in the parallel programming mode. Please refer to that section for information about programming internal registers after power-up. Serial programming programs the entire matrix each time, so no special considerations apply. Since the data in the shift register is random after power-up, it should not be used to program the matrix, or the matrix can enter unknown states. To prevent this, do not apply logic low signals to both CE and UPDATE initially after power-up. The shift register should first be loaded with the desired data, and then UPDATE can be taken low to program the device. The RESET pin has a 20 kΩ pull-up resistor to DVDD that can be used to create a simple power-up reset circuit. A capacitor from RESET to ground holds RESET low for some time while the rest of the device stabilizes. The low condition causes all the outputs to be disabled. The capacitor then charges through the pull-up resistor to the high state, thus allowing full programming capability of the device. GAIN SELECTION The 16 × 16 crosspoints come in two versions, depending on the gain of the analog circuit paths that is desired. The AD8114 device is unity gain and can be used for analog logic switching and other applications where unity gain is desired. The AD8114 can also be used for the input and interior sections of larger crosspoint arrays where termination of output signals is not usually used. The AD8114 outputs have very high impedance when their outputs are disabled. The AD8115 can be used for devices that are used to drive a terminated cable with its outputs. This device has a built-in gain of 2 that eliminates the need for a gain-of-2 buffer to drive a video line. Its high output disabled impedance minimizes signal degradation when paralleling additional outputs. CREATING LARGER CROSSPOINT ARRAYS The AD8114/AD8115 are high density building blocks for creating crosspoint arrays of dimensions larger than 16 × 16. Various features, such as output disable, chip enable, and gainof-1 and gain-of-2 options, are useful for creating larger arrays. When required for customizing a crosspoint array size, they can be used with the AD8108 and AD8109, a pair of (unity gain and gain-of-2) 8 × 8 video crosspoint switches, or with the AD8110 and AD8111, a pair of (unity gain and gain-of-2) 16 × 8 video crosspoint switches. The first consideration in constructing a larger crosspoint is to determine the minimum number of devices required. The 16 × 16 architecture of the AD8114/AD8115 contains 256 points, which is a factor of 64 greater than a 4 × 1 crosspoint (or multiplexer). The printed circuit board area, power consumption, and design effort savings are readily apparent when compared to using these smaller devices. Rev. C | Page 19 of 25 AD8114/AD8115 Data Sheet For a nonblocking crosspoint, the number of points required is the product of the number of inputs multiplied by the number of outputs. Nonblocking requires that the programming of a given input to one or more outputs does not restrict the availability of that input to be a source for any other outputs. AD8114 OR AD8115 16 IN 00–15 16 16 AD8114 OR AD8115 RTERM 16 16 Some nonblocking crosspoint architectures require more than this minimum as calculated above. Also, there are blocking architectures that can be constructed with fewer devices than this minimum. These systems have connectivity available on a statistical basis that is determined when designing the overall system. Figure 48. 32 × 32 Crosspoint Array Using Four AD8114 or AD8115 Devices The basic concept in constructing larger crosspoint arrays is to connect inputs in parallel in a horizontal direction and to wireOR the outputs together in the vertical direction. The meaning of horizontal and vertical can best be understood by looking at a diagram. Figure 48 illustrates this concept for a 32 × 32 crosspoint array that uses four AD8114 or AD8115 devices. The inputs are each uniquely assigned to each of the 32 inputs of the two devices and terminated appropriately. The outputs are wired-OR’ed together in pairs. The output from only one of a wire-OR’ed pair should be enabled at any given time. The device programming software must be properly written to cause this to happen. 16 16 RTERM 16 16 RANK 1 (8 × AD8114) 128:32 8 IN 00–15 AD8114 16 8 RTERM 8 IN 16–31 AD8114 16 8 RTERM 8 IN 32–47 AD8114 16 8 RANK 2 32:16 NONBLOCKING (32:32 BLOCKING) RTERM 8 8 IN 48–63 AD8114 16 8 8 1kΩ RTERM 8 IN 64–79 AD8114 16 8 IN 80–95 AD8114 16 AD8115 8 OUT 00Ð15 NONBLOCKING 8 1kΩ 8 RTERM 8 1kΩ 8 AD8115 8 8 ADDITIONAL 16 OUTPUTS (SUBJECT TO BLOCKING) 8 1kΩ RTERM 8 IN 96–111 AD8114 16 8 RTERM 8 IN 112–127 AD8114 AD8114 OR AD8115 8 01070-049 16 RTERM Figure 49. Nonblocking 128 × 16 Array (128 × 32 Blocking) Rev. C | Page 20 of 25 01070-048 AD8114 OR AD8115 16 IN 16–31 Data Sheet AD8114/AD8115 Using additional crosspoint devices in the design can lower the number of outputs that must be wire-OR’ed together. Figure 49 shows a block diagram of a system using eight AD8114 devices and two AD8115 devices to create a nonblocking, gain-of-2, 128 × 16 crosspoint that restricts the wire-OR’ing at the output to only four outputs. Additionally, by using the lower eight outputs from each of the two Rank 2 AD8115 devices, a blocking 128 × 32 crosspoint array can be realized. There are, however, some drawbacks to this technique. The offset voltages of the various cascaded devices accumulates, and the bandwidth limitations of the devices compound. In addition, the extra devices consume more current and take up more board space. Once again, the overall system design specifications determine how to make the various tradeoffs. MULTICHANNEL VIDEO The excellent video specifications of the AD8114/AD8115 make them ideal candidates for creating composite video crosspoint switches. These can be made quite dense by taking advantage of the high level of integration of the AD8114/AD8115 and the fact that composite video requires only one crosspoint channel per system video channel. There are, however, other video formats that can be routed with the AD8114/AD8115 requiring more than one crosspoint channel per video channel. Some systems use twisted-pair wiring to carry video signals. These systems utilize differential signals and can lower costs because they use lower cost cables, connectors and termination methods. They also have the ability to lower crosstalk and reject commonmode signals, which can be important for equipment that operates in noisy environments or where common-mode voltages are present between transmitting and receiving equipment. In such systems, the video signals are differential; there is a positive and negative (or inverted) version of the signals. These complementary signals are transmitted onto each of the two wires of the twisted pair, yielding a first-order zero commonmode voltage. At the receive end, the signals are differentially received and converted back into a single-ended signal. When switching these differential signals, two channels are required in the switching element to handle the two differential signals that make up the video channel. Thus, one differential video channel is assigned to a pair of crosspoint channels, both input and output. For a single AD8114/AD8115, eight differential video channels can be assigned to the 16 inputs and 16 outputs. This effectively forms an 8 × 8 differential crosspoint switch. Programming such a device requires that inputs and outputs be programmed in pairs. This information can be deduced by inspection of the programming format of the AD8114/AD8115 and the requirements of the system. There are other analog video formats requiring more than one analog circuit per video channel. One 2-circuit format that is commonly being used in systems such as satellite TV, digital cable boxes, and higher quality VCRs is called S-video or Y/C video. This format carries the brightness (luminance or Y) portion of the video signal on one channel and the color (chrominance, chroma, or C) on a second channel. Since S-video also uses two separate circuits for one video channel, creating a crosspoint system requires assigning one video channel to two crosspoint channels, as in the case of a differential video system. Aside from the nature of the video format, other aspects of these two systems are the same. There are yet other video formats using three channels to carry the video information. Video cameras produce RGB (red, green, blue) directly from the image sensors. RGB is also the usual format used by computers internally for graphics. RGB can be converted to Y, R-Y, B-Y format, sometimes called YUV format. These 3-circuit video standards are referred to as component analog video. The component video standards require three crosspoint channels per video channel to handle the switching function. In a fashion similar to the 2-circuit video formats, the inputs and outputs are assigned in groups of three, and the appropriate logic programming is performed to route the video signals. CROSSTALK Many systems, such as broadcast video, that handle numerous analog signal channels have strict requirements for keeping the various signals from influencing any of the others in the system. Crosstalk is the term used to describe the coupling of the signals of other nearby channels to a given channel. When there are many signals in close proximity in a system, as is undoubtedly the case in a system that uses the AD8114/ AD8115, the crosstalk issues can be quite complex. A good understanding of the nature of crosstalk and some definition of terms is required to specify a system that uses one or more AD8114/AD8115 devices. Types of Crosstalk Crosstalk can be propagated by means of any of three methods. These fall into the categories of electric field, magnetic field, and sharing of common impedances. This section explains these effects. Every conductor can be both a radiator of electric fields and a receiver of electric fields. The electric field crosstalk mechanism occurs when the electric field created by the transmitter propagates across a stray capacitance (for example, free space) and couples with the receiver and induces a voltage. This voltage is an unwanted crosstalk signal in any channel that receives it. Currents flowing in conductors create magnetic fields that circulate around the currents. These magnetic fields then generate voltages in any other conductors whose paths they link. The undesired induced voltages in these other channels are crosstalk signals. The channels that crosstalk can be said to have a mutual inductance that couples signals from one channel to another. Rev. C | Page 21 of 25 AD8114/AD8115 Data Sheet The power supplies, grounds, and other signal return paths of a multichannel system are generally shared by the various channels. When a current from one channel flows in one of these paths, a voltage that is developed across the impedance becomes an input crosstalk signal for other channels that share the common impedance. All these sources of crosstalk are vector quantities, so the magnitudes cannot simply be added together to obtain the total crosstalk. In fact, there are conditions where driving additional circuits in parallel in a given configuration can actually reduce the crosstalk. Areas of Crosstalk For a practical AD8114/AD8115 circuit, it is required that the device be mounted to some sort of circuit board to connect it to the power supplies and the measurement equipment. This requirement, however, raises the issue that the crosstalk of a system is a combination of the intrinsic crosstalk of the devices in addition to the circuit board to which they are mounted. It is important to try to separate these two areas of crosstalk when attempting to minimize its effect. In addition, crosstalk can occur among the inputs to a crosspoint and among the output. It can also occur from input to output. Techniques are discussed for diagnosing which part of a system is contributing to crosstalk. Measuring Crosstalk Crosstalk is measured by applying a signal to one or more channels and measuring the relative strength of that signal on a desired selected channel. The measurement is usually expressed as dB down from the magnitude of the test signal. The crosstalk is expressed by XT = 20 log 10 ( Asel ( s ) Atest ( s )) First, we can measure the crosstalk terms associated with driving a test signal into each of the other 15 inputs one at a time while applying no signal to IN00. We can then measure the crosstalk terms associated with driving a parallel test signal into all 15 other inputs taken two at a time in all possible combinations, then three at a time, and so on, until there is only one way to drive a test signal into all 15 other inputs in parallel. Each of these cases is legitimately different from the others and might yield a unique value depending on the resolution of the measurement system, but it is hardly practical to measure all these terms and then to specify them. In addition, this describes the crosstalk matrix for just one input channel. A similar crosstalk matrix can be proposed for every other input. In addition, if the possible combinations and permutations for connecting inputs to the other (not used for measurement) outputs are taken into consideration, the numbers rather quickly grow to astronomical proportions. If a larger crosspoint array of multiple AD8114/ AD8115 devices is constructed, the numbers grow larger still. Some subset of all these cases must be selected to be used as a guide for a practical measure of crosstalk. One common method is to measure all hostile crosstalk. This term means that the crosstalk to the selected channel is measured while all other system channels are driven in parallel. In general, this yields the worst crosstalk number, but this is not always the case due to the vector nature of the crosstalk signal. Other useful crosstalk measurements are those created by one nearest neighbor or by the two nearest neighbors on either side. These crosstalk measurements are generally higher than those of more distant channels, so they can serve as a worst-case measure for any other 1-channel or 2-channel crosstalk measurements. Input and Output Crosstalk where: s = jω is the Laplace transform variable. Asel(s) is the amplitude of the crosstalk-induced signal in the selected channel. Atest(s) is the amplitude of the test signal. It can be seen that crosstalk is a function of frequency, but not a function of the magnitude of the test signal (to first order). In addition, the crosstalk signal has a phase relative to the test signal associated with it. A network analyzer is most commonly used to measure crosstalk over a frequency range of interest. It can provide both magnitude and phase information about the crosstalk signal. As a crosspoint system or device grows larger, the number of theoretical crosstalk combinations and permutations can become extremely large. For example, in the case of the 16 × 16 matrix of the AD8114/AD8115, we can examine the number of crosstalk terms that can be considered for a single channel, say IN00 input. IN00 is programmed to connect to one of the AD8114/AD8115 outputs where the measurement can be made. The flexible programming capability of the AD8114/AD8115 can be used to diagnose whether crosstalk is occurring more on the input side or the output side. Some examples are illustrative. A given input channel (IN07 in the middle for this example) can be programmed to drive OUT07 (also in the middle). The input to IN07 is just terminated to ground (via 50 Ω or 75 Ω) and no signal is applied. All the other inputs are driven in parallel with the same test signal (practically that is provided by a distribution amplifier), with all other outputs except OUT07 disabled. Since grounded IN07 is programmed to drive OUT07, no signal should be present. Any signal that is present can be attributed to the other 15 hostile input signals because no other outputs are driven. (They are all disabled.) Thus, this method measures the all-hostile input contribution to crosstalk into IN07. Of course, the method can be used for other input channels and combinations of hostile inputs. Rev. C | Page 22 of 25 Data Sheet AD8114/AD8115 For output crosstalk measurement, a single input channel is driven (IN00, for example) and all outputs other than a given output (IN07 in the middle) are programmed to connect to IN00. OUT07 is programmed to connect to IN15 (far away from IN00), which is terminated to ground. Thus OUT07 should not have a signal present since it is listening to a quiet input. Any signal measured at the OUT07 can be attributed to the output crosstalk of the other 16 hostile outputs. Again, this method can be modified to measure other channels and other crosspoint matrix combinations. Effect of Impedances on Crosstalk The input side crosstalk can be influenced by the output impedance of the sources that drive the inputs. The lower the impedance of the drive source, the lower the magnitude of the crosstalk. The dominant crosstalk mechanism on the input side is capacitive coupling. The high impedance inputs do not have significant current flow to create magnetically induced crosstalk. However, significant current can flow through the input termination resistors and the loops that drive them. Thus, the printed circuit board on the input side can contribute to magnetically coupled crosstalk. From a circuit standpoint, the input crosstalk mechanism looks like a capacitor coupling to a resistive load. For low frequencies, the magnitude of the crosstalk is given by XT = 20 log10 ((RS CM ) × s ) where: RS is the source resistance. CM is the mutual capacitance between the test signal circuit and the selected circuit. s is the Laplace transform variable. From the equation, it can be observed that this crosstalk mechanism has a high-pass nature; it can be minimized by reducing the coupling capacitance of the input circuits and lowering the output impedance of the drivers. If the input is driven from a 75 Ω terminated cable, the input crosstalk can be reduced by buffering this signal with a low output impedance buffer. On the output side, the crosstalk can be reduced by driving a lighter load. Although the AD8114/AD8115 is specified with excellent differential gain and phase when driving a standard 150 Ω video load, the crosstalk is higher than the minimum obtainable due to the high output currents. These currents induce crosstalk via the mutual inductance of the output pins and bond wires of the AD8114/AD8115. From a circuit standpoint, this output crosstalk mechanism looks like a transformer, with a mutual inductance between the windings, that drives a load resistor. For low frequencies, the magnitude of the crosstalk is given by XT = 20 log 10 ( Mxy × s / R L ) where: Mxy is the mutual inductance of Output X to Output Y. RL is the load resistance on the measured output. This crosstalk mechanism can be minimized by keeping the mutual inductance low and increasing RL. The mutual inductance can be kept low by increasing the spacing of the conductors and minimizing their parallel length. Rev. C | Page 23 of 25 AD8114/AD8115 Data Sheet OUTLINE DIMENSIONS 16.20 16.00 SQ 15.80 1.60 MAX 0.75 0.60 0.45 100 1 76 75 PIN 1 14.20 14.00 SQ 13.80 TOP VIEW (PINS DOWN) 0.15 0.05 SEATING PLANE 0.20 0.09 7° 3.5° 0° 0.08 COPLANARITY VIEW A ROTATED 90° CCW 51 50 25 26 VIEW A 0.50 BSC LEAD PITCH 0.27 0.22 0.17 COMPLIANT TO JEDEC STANDARDS MS-026-BED 051706-A 1.45 1.40 1.35 Figure 50. 100-Lead Low Profile Quad Flat Package [LQFP] (ST-100-1) Dimension shown in millimeters ORDERING GUIDE Model 1, 2 AD8114ASTZ AD8115ASTZ 1 2 Temperature Range −40°C to +85°C −40°C to +85°C Package Description 100-Lead Low Profile Quad Flat Package [LQFP] 100-Lead Low Profile Quad Flat Package [LQFP] Package Option ST-100-1 ST-100-1 Details of the lead finish composition can be found on the Analog Devices website at www.analog.com by reviewing the Material Description of each relevant package. Z = RoHS Compliant Part. Rev. C | Page 24 of 25 Data Sheet AD8114/AD8115 NOTES ©1998–2016 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D01070-0-7/16(C) Rev. C | Page 25 of 25
AD8114ASTZ
物料型号:AD8114/AD8115

器件简介: - AD8114/AD8115是高速16×16模拟交叉点开关矩阵,提供大于200 MHz的-3 dB信号带宽和小于50 ns的通道切换时间。

- 低功耗、高性能、低串扰和高隔离度使其适用于高速信号路由。


引脚分配: - AD8114/AD8115采用100引脚LQFP封装,包括模拟输入/输出引脚、数字控制引脚、电源引脚等。


参数特性: - 动态性能参数包括-3 dB带宽、增益平坦度、传播延迟、稳定时间、转换速率等。

- 噪声/失真性能参数包括差分增益误差、串扰、增益误差匹配等。

- 直流性能参数包括增益温度系数、输出特性、输入特性、开关特性等。


功能详解: - AD8114/AD8115支持高速信号路由,包括视频信号、压缩视频、数据通信和电信信号。

- 设备内置16个独立输出缓冲器,可以并联交叉点输出,允许通过串行数字控制或并行控制进行通道切换。


应用信息: - 适用于高速信号路由,如视频信号(NTSC、PAL、S、SECAM、YUV、RGB)、压缩视频(MPEG、小波)、3级数字视频(HDB3)等。


封装信息: - AD8114/AD8115采用100引脚LQFP封装,符合工业温度范围-40°C至+85°C。


以上信息摘自PDF文档,详细规格和应用指南请参考数据手册全文。
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