Data Sheet
Precision Four Degrees of Freedom Sensor
ADIS16305
FUNCTIONAL BLOCK DIAGRAM
AUX_
ADC
B
SO
AUX_
DAC
TEMPERATURE
SENSOR
CS
MEMS
ANGULAR RATE
SENSOR
TRIAXIS MEMS
ACCELERATION
SENSOR
SCLK
SIGNAL
CONDITIONING
AND
CONVERSION
CALIBRATION
AND
DIGITAL
PROCESSING
OUTPUT
REGISTERS
AND SPI
INTERFACE
DIN
DOUT
ALARMS
ADIS16305
POWER
MANAGEMENT
VCC
GND
RST DIO1 DIO2 DIO3 DIO4
09020-001
DIGITAL
CONTROL
SELF-TEST
LE
Digital gyroscope with range scaling
±75°/sec, ±150°/sec, ±300°/sec settings
Triaxis digital accelerometer: ±3 g
Wide sensor bandwidth: 330 Hz
Autonomous operation and data collection
No external configuration commands required
Start-up time: 180 ms
Sleep mode recovery time: 4 ms
Factory-calibrated sensitivity, bias, and alignment
Calibration temperature range: −40°C to +85°C
SPI-compatible serial interface
Embedded temperature sensor
Programmable operation and control
Automatic and manual bias correction controls
Bartlett window FIR filter length, number of taps
Digital I/O: data-ready, alarm indicator, general-purpose
Alarms for condition monitoring
Sleep mode for power management
DAC output voltage
Enable external sample clock input: up to 1.2 kHz
Single-command self-test
Single-supply operation: 4.75 V to 5.25 V
2000 g shock survivability
Operating temperature range: −40°C to +85°C
TE
FEATURES
Figure 1.
APPLICATIONS
Medical instrumentation
Robotics
Platform controls
Navigation
GENERAL DESCRIPTION
O
The iSensor® ADIS16305 is a complete inertial system that
includes a gyroscope and triaxis accelerometer. Each sensor in
the ADIS16305 combines industry-leading iMEMS® technology
with signal conditioning that optimizes dynamic performance.
The factory calibration characterizes each sensor for sensitivity,
bias, alignment, and linear acceleration (gyro bias). As a result, each
sensor has its own dynamic compensation formulas that provide
accurate sensor measurements over a variety of conditions.
The ADIS16305 provides a simple, cost-effective method for
integrating accurate, multiaxis, inertial sensing into industrial
systems, especially when compared with the complexity and
investment associated with discrete designs. All necessary motion
Rev. A
testing and calibration are part of the production process at the
factory, greatly reducing system integration time. Tight orthogonal
alignment simplifies inertial frame alignment in navigation systems.
An improved SPI interface and register structure provide faster data
collection and configuration control. The ADIS16305 uses a pinout
that is compatible with the ADIS1635x, ADIS1636x, and
ADIS1640x families, when used with an interface flex connector.
This compact module is approximately 23 mm × 31 mm × 8 mm
and provides a standard connector interface, which enables
horizontal or vertical mounting.
Document Feedback
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700 ©2010–2014 Analog Devices, Inc. All rights reserved.
Technical Support
www.analog.com
ADIS16305
Data Sheet
TABLE OF CONTENTS
Memory Map .............................................................................. 10
Applications ....................................................................................... 1
Burst Read Data Collection ...................................................... 11
Functional Block Diagram .............................................................. 1
Output Data Registers ............................................................... 11
General Description ......................................................................... 1
Orientation Angles ..................................................................... 12
Revision History ............................................................................... 2
Calibration................................................................................... 13
Specifications..................................................................................... 3
Operational Control................................................................... 13
Timing Specifications .................................................................. 5
Input/Output Functions ............................................................ 15
Absolute Maximum Ratings............................................................ 6
Diagnostics .................................................................................. 16
ESD Caution .................................................................................. 6
Product Identification................................................................ 17
Pin Configuration and Function Descriptions ............................. 7
Applications Information .............................................................. 18
Typical Performance Characteristics ............................................. 8
Interface Printed Circuit Board (PCB) .................................... 18
Theory of Operation ........................................................................ 9
Gyroscope Bias Optimization ................................................... 18
Basic Operation ............................................................................ 9
Outline Dimensions ....................................................................... 19
Reading Sensor Data .................................................................... 9
Ordering Guide .......................................................................... 19
LE
Device Configuration .................................................................. 9
REVISION HISTORY
TE
Features .............................................................................................. 1
B
SO
6/14—Rev. 0 to Rev. A
Changes to Figure 6 .......................................................................... 7
O
7/10—Revision 0: Initial Version
Rev. A | Page 2 of 20
Data Sheet
ADIS16305
SPECIFICATIONS
TA = 25°C, VCC = 5.0 V, angular rate = 0°/sec, dynamic range = ±300°/sec ± 1 g, unless otherwise noted.
Table 1.
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Velocity Random Walk
O
Bias Temperature Coefficient
Output Noise
Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
Self-Test Change in Output Response
ADC INPUT
Resolution
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Gain Error
Input Range
Input Capacitance
Min
Typ
±300
0.0495
±350
0.05
0.025
0.0125
20
±0.1
0.1
±3
0.006
1.85
0.006
0.02
0.32
0.73
0.04
330
14.5
±1400
Max
0.0505
TE
TA = 25°C, dynamic range = ±300°/sec
TA = 25°C, dynamic range = ±150°/sec
TA = 25°C, dynamic range = ±75°/sec
−40°C ≤ TA ≤ +85°C
Reference to z-axis accelerometer, TA = 25°C
Best-fit straight line
TA = 25°C, ±1 σ
TA = 25°C, 1 σ, SMPL_PRD = 0x01
TA = 25°C, 1 σ, SMPL_PRD = 0x01
−40°C ≤ TA ≤ +85°C
Any axis, 1 σ (MSC_CTRL Bit[7] = 1)
VCC = 4.75 V to 5.25 V
TA = 25°C, ±300°/sec range, no filtering
TA = 25°C, f = 25 Hz, ±300°/sec, no filtering
±300°/sec range setting
Each axis
25°C
−40°C ≤ TA ≤ +85°C
Axis-to-axis, TA = 25°C, Δ = 90° ideal
Axis-to-frame (package), TA = 25°C
Best-fit straight line
TA = 25°C, ±1 σ
TA = 25°C, 1 σ, SMPL_PRD = 0x01
TA = 25°C, 1 σ, X axis and Y axis
TA = 25°C, 1 σ, Z axis
−40°C ≤ TA ≤ +85°C
TA = 25°C, no filtering, X axis and Y axis
TA = 25°C, no filtering, Z axis
TA = 25°C, no filtering, X axis and Y axis
TA = 25°C, no filtering, Z axis
B
SO
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Angular Random Walk
Bias Temperature Coefficient
Linear Acceleration Effect on Bias
Voltage Sensitivity
Output Noise
Rate Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
Self-Test Change in Output Response
ACCELEROMETERS
Dynamic Range
Initial Sensitivity
Sensitivity Temperature Coefficient
Misalignment
Test Conditions
LE
Parameter
GYROSCOPE
Dynamic Range
Initial Sensitivity
X axis and Y axis
Z axis
±696
±3
0.594
500
90
±3.6
0.6
25
±0.1
±0.5
±0.3
±60
0.037
0.1
0.16
0.3
4.25
6.5
225
340
330
5.5
1100
450
±2449
0.606
1700
860
12
±2
±1
±4
±2
0
During acquisition
Rev. A | Page 3 of 20
3.3
20
Unit
°/sec
°/sec/LSB
°/sec/LSB
°/sec/LSB
ppm/°C
Degrees
% of FS
°/sec
°/sec
°/√hr
°/sec/°C
°/sec/g
°/sec/V
°/sec rms
°/sec/√Hz rms
Hz
kHz
LSB
g
mg/LSB
ppm/°C
Degrees
Degrees
% of FS
mg
mg
m/sec/√hr
m/sec/√hr
mg/°C
mg rms
mg rms
µg/√Hz rms
µg/√Hz rms
Hz
kHz
LSB
LSB
Bits
LSB
LSB
LSB
LSB
V
pF
ADIS16305
Data Sheet
Test Conditions
5 kΩ/100 pF to GND
Min
Typ
12
±4
±1
±5
±0.5
For Code 101 to Code 4095
0
3.3
2
10
2.0
0.8
0.55
CS signal to wake up from sleep mode
20
LE
VIH = 3.3 V
VIL = 0 V
ISOURCE = 1.6 mA
ISINK = 1.6 mA
Endurance 2
TJ = 85°C
Time until data is available
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
B
SO
CS Wake-Up Pulse Width
Logic 1 Input Current, IINH
Logic 0 Input Current, IINL
All Pins Except RST
RST Pin
Input Capacitance, CIN
DIGITAL OUTPUTS1
Output High Voltage, VOH
Output Low Voltage, VOL
FLASH MEMORY
Data Retention 3
FUNCTIONAL TIMES 4
Power-On Start-Up Time
Reset Recovery Time
Sleep Mode Recovery Time
Flash Memory Test Time
O
Automatic Self-Test Time
CONVERSION RATE
Clock Accuracy
Sync Input Clock
POWER SUPPLY
Power Supply Current
Max
TE
Parameter
DAC OUTPUT
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Gain Error
Output Range
Output Impedance
Output Settling Time
LOGIC INPUTS 1
Input High Voltage, VINH
Input Low Voltage, VINL
±0.2
±10
−40
−1
10
−60
2.4
0.4
10,000
20
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
SMPL_PRD = 0x01 to 0xFF
0.413
Operating voltage range, VCC
Low power mode at 25°C
Normal mode at 25°C
Sleep mode at 25°C
4.75
180
250
55
120
4
20
90
12
5.0
18
42
500
819.2
±3
1.2
5.25
Unit
Bits
LSB
LSB
mV
%
V
Ω
µs
V
V
V
µs
µA
µA
mA
pF
V
V
Cycles
Years
ms
ms
ms
ms
ms
ms
ms
ms
SPS
%
kHz
V
mA
mA
µA
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
3
The retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.
4
These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may impact overall accuracy.
1
2
Rev. A | Page 4 of 20
Data Sheet
ADIS16305
TIMING SPECIFICATIONS
TA = 25°C, VCC = 5 V, unless otherwise noted.
Table 2.
Normal Mode
(SMPL_PRD ≤ 0x09)
Min 1
Typ
Max
0.01
2.0
9
40
48.8
tDAV
tDSU
tDHD
tSCLKR, tSCLKF
tDR, tDF
tSFS
t1
tx
t2
t3
DOUT valid after SCLK edge
DIN setup time before SCLK rising edge
DIN hold time after SCLK rising edge
SCLK rise/fall times (not shown in figures)
DOUT rise/fall times (not shown in figures)
CS high after SCLK edge
Input sync positive pulse width
Input sync low time
Input sync to data-ready output
Input sync period
1
100
24.4
48.8
Burst Read
Min1
Typ Max
0.01
1.0
1/fSCLK
48.8
100
100
24.4
48.8
5
5
5
5
100
24.4
48.8
TE
Description
Serial clock
Stall period between data
Read rate
Chip select to clock edge
12.5
12.5
5
5
12.5
12.5
5
5
5
12.5
12.5
5
5
100
600
LE
Parameter
fSCLK
tSTALL
tREADRATE
tCS
Low Power Mode
(SMPL_PRD ≥ 0x0A)
Min1
Typ
Max
0.01
0.3
75
100
48.8
833
600
833
Guaranteed by design and characterization, but not tested in production.
Timing Diagrams
B
SO
CS
tCS
1
2
3
4
5
tSFS
6
15
16
SCLK
tDAV
MSB
DB14
DB13
tDSU
DIN
R/W
A6
DB12
DB11
A4
A3
DB10
DB2
DB1
LSB
tDHD
A5
D2
A2
D1
09020-002
DOUT
LSB
Figure 2. SPI Timing and Sequence
O
tREADRATE
tSTALL
09020-003
CS
SCLK
Figure 3. Stall Time and Data Rate
t3
t2
t1
tX
09020-004
SYNC
CLOCK (DIO4)
DATA
READY
Figure 4. Input Clock Timing Diagram
Rev. A | Page 5 of 20
Unit
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
µs
µs
µs
µs
ADIS16305
Data Sheet
ABSOLUTE MAXIMUM RATINGS
Parameter
Acceleration
Any Axis, Unpowered
Any Axis, Powered
VCC to GND
Digital Input Voltage to GND
Digital Output Voltage to GND
Analog Input to GND
Operating Temperature Range
Storage Temperature Range
Rating
2000 g
2000 g
−0.3 V to +6.0 V
−0.3 V to +5.3 V
−0.3 V to VCC + 0.3 V
−0.3 V to +3.6 V
−40°C to +85°C
−65°C to +125°C 1, 2
Extended exposure to temperatures outside the specified temperature
range of −40°C to +85°C can adversely affect the accuracy of the factory
calibration. For best accuracy, store the parts within the specified operating
range of −40°C to +85°C.
2
Although the device is capable of withstanding short-term exposure to
150°C, long-term exposure threatens internal mechanical integrity.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 4. Package Characteristics
Package Type
24-Lead Module
1
θJA
39.8°C/W
O
B
SO
LE
ESD CAUTION
Rev. A | Page 6 of 20
θJC
14.2°C/W
Device Weight
6.1 grams (max)
TE
Table 3.
Data Sheet
ADIS16305
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
ADIS16305
SCLK
DIN
DIO1
DIO2
VCC
GND
GND
DNC
DNC
AUX_ADC
DNC
3
5
7
9
11
13
15
17
19
21
23
2
4
6
8
10
12
14
16
18
20
22
24
DOUT
CS
RST
VCC
VCC
GND
DNC
DNC
AUX_DAC
DNC
DNC
NOTES
1. MATING CONNECTOR: SAMTEC FTSH-112-03
OR EQUIVALENT.
2. DNC = DO NOT CONNECT.
09020-005
TE
DIO3
1
DIO4/CLKIN
TOP VIEW
(Not to Scale)
Figure 5. ADIS16305 Pin Configuration
Z-AXIS
LE
aZ
gZ
aX
B
SO
aY
X-AXIS
PIN 1
NOTES
1. THE ARROW DIRECTION ASSOCIATED WITH aZ, aY, AND gZ INDICATES
THE DIRECTION OF MOTION THAT PRODUCES A POSITIVE RESPONSE IN
EACH ACCELEROMETER AND GYROSCOPE OUTPUT REGISTER.
09020-006
Y-AXIS
Figure 6. Axial Orientation
Table 5. Pin Function Descriptions
Mnemonic
DIO3
DIO4/CLKIN
SCLK
DOUT
DIN
CS
DIO1, DIO2
RST
VCC
GND
DNC
AUX_DAC
AUX_ADC
O
Pin No.
1
2
3
4
5
6
7, 9
8
10, 11, 12
13, 14, 15
16, 17, 18, 19, 22, 23, 24
20
21
1
Type 1
I/O
I/O
I
O
I
I
I/O
I
S
S
N/A
O
I
Description
Configurable Digital Input/Output.
Configurable Digital Input/Output or Sync Clock Input.
SPI Serial Clock.
SPI Data Output. Clocks output on SCLK falling edge.
SPI Data Input. Clocks input on SCLK rising edge.
SPI Chip Select.
Configurable Digital Input/Output.
Reset.
Power Supply.
Power Ground.
Do Not Connect.
Auxiliary, 12-Bit DAC Output.
Auxiliary, 12-Bit ADC Input.
I/O is input/output, I is input, O is output, S is supply, and N/A is not applicable.
Rev. A | Page 7 of 20
ADIS16305
Data Sheet
TYPICAL PERFORMANCE CHARACTERISTICS
0.01
ROOT ALLAN VARIANCE (g)
0.1
+1σ
0.01
MEAN
0.001
Z-AXIS
0.0001
X- AND YAXES
10
100
Tau (sec)
1k
10k
1
10
100
1k
Tau (sec)
Figure 8. Accelerometer Allan Variance
B
SO
LE
Figure 7. Gyroscope Allan Variance
0.00001
0.1
Rev. A | Page 8 of 20
10k
09020-008
1
TE
0.001
0.1
09020-007
–1σ
O
ROOT ALLAN VARIANCE (°/sec)
1
Data Sheet
ADIS16305
THEORY OF OPERATION
BASIC OPERATION
The ADIS16305 is an autonomous sensor system that starts up
after it has a valid power supply voltage and begins producing
inertial measurement data. After each sample cycle, the sensor
data is loaded into the output registers, and DIO1 pulses high,
which provides a new data-ready control signal for driving
system-level interrupt service routines. In a typical system, a
master processor accesses the output data registers through the
SPI interface, using the connection diagram shown in Figure 9.
Table 6 provides a generic functional description for each pin on
the master processor. Table 7 describes the typical master processor
settings for communicating with the ADIS16305.
15
CS
SCLK
3
SCLK
MOSI
5
DIN
MISO
4
DOUT
IRQ
7
DIO1
12
09020-009
B
SO
15
Function
Slave select
Interrupt request
Master output, slave input
Master input, slave output
Serial clock
O
Table 7. Generic Master Processor SPI Settings
5
4
3
2
Description
ADIS16305 is a slave
Normal mode, SMPL_PRD[7:0] ≤ 0x09
CPOL = 1 (polarity), CHPA = 1 (phase)
Bit sequence
Shift register/data length
The master processor initiates the backup function by setting
GLOB_CMD[3] = 1 (DIN = 0xBE04). This command copies
the user registers into their assigned flash memory locations
and requires the power supply to stay within its normal operating
range for the entire 50 ms process. The FLASH_CNT register
provides a running count of these events for monitoring the
long-term reliability of the flash memory.
CS
SCLK
DOUT
R/W
D15
0
The user register memory map (see Table 8) identifies configuration
registers with either a W or R/W. Configuration commands also
use the bit sequence shown in Figure 11. If the MSB = 1, the last
eight bits (DC7 to DC0) in the DIN sequence are loaded into the
memory address associated with the address bits (A6 to A0).
For example, if DIN = 0xA11F, 0x1F is loaded into Address 0x21
(XACCL_OFF, upper byte) at the conclusion of the data frame.
For burst read, SCLK rate ≤ 1 MHz. For low power mode, SCLK rate ≤ 300 kHz.
DIN
1
LOWER BYTE
A6
A5
A4
A3
A2
A1
A0
DC7
DC6
DC5
DC4
DC3
DC2
DC1
DC0
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
NOTES
1. DOUT BITS ARE PRODUCED ONLY WHEN THE PREVIOUS 16-BIT DIN SEQUENCE STARTS WITH R/W = 0.
Figure 11. SPI Communication Bit Sequence
Rev. A | Page 9 of 20
R/W
D15
A6
A5
D14
D13
09020-011
1
6
DEVICE CONFIGURATION
14
Table 6. Generic Master Processor Pin Names and Functions
Processor Setting
Master
SCLK Rate ≤ 2 MHz1
SPI Mode 3
MSB First Mode
16-Bit Mode
7
The SPI operates in full-duplex mode, which means that the master
processor can read the output data from DOUT while using the
same SCLK pulses to transmit the next target address on DIN.
Figure 9. Electrical Connection Diagram
Pin Name
SS
IRQ
MOSI
MISO
SCLK
8
LE
SPI SLAVE
13
9
TE
6
10
Although the ADIS16305 produces data independently, it operates
as an SPI slave device that communicates with system (master)
processors using the 16-bit segments displayed in Figure 11.
Individual register reads require two of these 16-bit sequences. The
first 16-bit sequence provides the read command bit (R/W = 0)
and the target register address (A6 to A0). The second sequence
transmits the register contents (D15 to D0) on the DOUT line.
For example, if DIN = 0x0A00, the contents of XACCL_OUT are
shifted out on the DOUT line during the next 16-bit sequence.
ADIS16305
SS
11
READING SENSOR DATA
5V
11
12
Figure 10. Generic Register Bit Assignments
VDD
10
13
UPPER BYTE
I/O LINES ARE COMPATIBLE WITH
3.3V OR 5V LOGIC LEVELS
SYSTEM
PROCESSOR
SPI MASTER
14
09020-010
The user registers provide addressing for all input/output
operations on the SPI interface. Each 16-bit register has two
7-bit addresses: one for its upper byte and one for its lower byte.
Table 8 lists the lower byte address for each register, and Figure 10
shows the generic bit assignments.
ADIS16305
Data Sheet
MEMORY MAP
Table 8. User Register Memory Map
1
2
Default
N/A 2
N/A2
N/A2
N/A2
N/A2
N/A2
N/A2
N/A2
N/A2
N/A2
N/A2
N/A2
N/A2
0x0000
N/A2
N/A2
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0006
0x0001
0x0402
0x0000
0x0000
0x0000
N/A2
N/A2
N/A2
0x3FB1
N/A2
Register Description
Flash memory write count
Power supply measurement
Gyroscope output
Reserved
Reserved
X-axis accelerometer output
Y-axis accelerometer output
Z-axis accelerometer output
Gyroscope temperature measurement
Pitch angle output (x-axis)
Roll angle output (y-axis)
Auxiliary ADC output
Reserved
Gyroscope bias offset factor
Pitch angle offset factor
Roll angle offset factor
X-axis acceleration bias offset factor
Y-axis acceleration bias offset factor
Z-axis acceleration bias offset factor
Alarm 1 amplitude threshold
Alarm 2 amplitude threshold
Alarm 1 sample size
Alarm 2 sample size
Alarm control
Auxiliary DAC data
Auxiliary digital input/output control
Miscellaneous control: data-ready, self-test
Internal sample period (rate) control
Dynamic range and digital filter control
Sleep mode control
System status
System command
Reserved
Lot Identification Code 1
Lot Identification Code 2
Product identification
Serial number
TE
Address 1
0x00
0x02
0x04
0x06
0x08
0x0A
0x0C
0x0E
0x10
0x12
0x14
0x16
0x18
0x1A
0x1C
0x1E
0x20
0x22
0x24
0x26
0x28
0x2A
0x2C
0x2E
0x30
0x32
0x34
0x36
0x38
0x3A
0x3C
0x3E
0x40 to 0x51
0x52
0x54
0x56
0x58
LE
Flash Backup
Yes
No
No
N/A2
N/A2
No
No
No
No
No
No
No
N/A2
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
No
No
Yes
Yes
Yes
No
No
N/A2
N/A2
Yes
Yes
Yes
Yes
B
SO
R/W
R
R
R
N/A2
N/A2
R
R
R
R
R
R
R
N/A2
R/W
R
R
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
W
R
W
N/A2
R
R
R
R
O
Name
FLASH_CNT
SUPPLY_OUT
GYRO_OUT
Reserved
Reserved
XACCL_OUT
YACCL_OUT
ZACCL_OUT
TEMP_OUT
PITCH_OUT
ROLL_OUT
AUX_ADC
Reserved
GYRO_OFF
PITCH_OFF
ROLL_OFF
XACCL_OFF
YACCL_OFF
ZACCL_OFF
ALM_MAG1
ALM_MAG2
ALM_SMPL1
ALM_SMPL2
ALM_CTRL
AUX_DAC
GPIO_CTRL
MSC_CTRL
SMPL_PRD
SENS_AVG
SLP_CNT
DIAG_STAT
GLOB_CMD
Reserved
LOT_ID1
LOT_ID2
PROD_ID
SERIAL_NUM
Bit Function
See Table 28
See Table 9
See Table 9
N/A2
N/A2
See Table 9
See Table 9
See Table 9
See Table 9
See Table 9
See Table 9
See Table 9
N/A2
See Table 16
See Table 18
See Table 18
See Table 17
See Table 17
See Table 17
See Table 30
See Table 30
See Table 31
See Table 31
See Table 32
See Table 25
See Table 23
See Table 24
See Table 20
See Table 22
See Table 21
See Table 29
See Table 19
N/A2
See Table 35
See Table 35
See Table 35
See Table 35
Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte plus 1.
N/A stands for not applicable.
Rev. A | Page 10 of 20
Data Sheet
ADIS16305
BURST READ DATA COLLECTION
Gyroscopes
Burst read data collection is a process-efficient method for collecting
data from the ADIS16305. In burst read, all output registers are
clocked out on DOUT, 16 bits at a time, in sequential data cycles
(each separated by one SCLK period). To start a burst read sequence,
set DIN = 0x3E00. The contents of each output register are then
shifted out on DOUT, starting with SUPPLY_OUT and ending with
AUX_ADC (see Figure 13). The addressing sequence shown in
Table 8 determines the order of the outputs in burst read.
The gyroscope output register, GYRO_OUT, uses a 14-bit, twos
complement digital format. When using the factory-default range
of ±300°/sec, each LSB translates into 0.05°/sec. Table 10 offers
some examples for translating the digital data into rotation rate
measurements. When the dynamic rage is set to ±150°/sec,
divide the rotation rate numbers in Table 10 by a factor of two.
When the dynamic rage is set to ±75°/sec, divide the rotation
rate numbers in Table 10 by a factor of four.
OUTPUT DATA REGISTERS
Table 10. Rotation Rate, Twos Complement Format
Each output data register uses the format in Figure 12 and Table 9.
Figure 6 shows the positive direction for each inertial sensor. The
ND bit is equal to 1 when the register contains unread data. The
EA bit is high when any error/alarm flag in the DIAG_STAT
register is equal to 1.
MSB FOR 14-BIT OUTPUT
09020-012
ND EA
MSB FOR 12-BIT OUTPUT
Table 9. Output Data Register Formats
2
Scale
Power supply
Gyroscope
Acceleration (x)
Acceleration (y)
Acceleration (z)
Temperature
Pitch angle
Roll angle
ADC measurement
The accelerometer output registers, XACCL_OUT, YACCL_OUT,
and ZACCL_OUT, use a 14-bit, twos complement digital format.
Table 11 offers some examples for translating the digital data
into linear acceleration measurements
Reference
Table 13
Table 10
Table 11
Table 11
Table 11
Table 14
Table 12
Table 12
Table 15
Table 11. Acceleration, Twos Complement Format
Assumes that the scaling is set to ±300°/sec. This factor scales with the range.
0x0000 = 25°C (±5°C).
O
Note that the codes in Table 10, Table 11, Table 12, Table 13,
Table 14, and Table 15 assume typical sensitivity values.
CS
1
2
Acceleration
+3.3 g
+1.2 mg
+0.6 mg
0g
−0.6 mg
−1.2 mg
−3.3 g
Decimal
+5500 LSB
+2 LSB
+1 LSB
0 LSB
−1 LSB
−2 LSB
−5500 LSB
Hex
0x157C
0x0002
0x0001
0x0000
0x3FFF
0x3FFE
0x2A84
3
4
5
9
GYRO_OUT
XACCL_OUT
YACCL_OUT
ROLL_OUT
Binary
XX01 0101 0111 1100
XX00 0000 0000 0010
XX00 0000 0000 0001
XX00 0000 0000 0000
XX11 1111 1111 1111
XX11 1111 1111 1110
XX10 1010 1000 0100
10
SCLK
DIN
DOUT
0x3E00
PREVIOUS
DON’T CARE
SUPPLY_OUT
Figure 13. Burst Read Sequence
Rev. A | Page 11 of 20
AUX_ADC
09020-013
1
Address
0x02
0x04
0x0A
0x0C
0x0E
0x10
0x12
0x14
0x16
Binary
XX01 0111 0111 0000
XX00 0000 0000 0010
XX00 0000 0000 0001
XX00 0000 0000 0000
XX11 1111 1111 1111
XX11 1111 1111 1110
XX10 1000 1001 0000
Accelerometers
B
SO
Name
SUPPLY_OUT
GYRO_OUT1
XACCL_OUT
YACCL_OUT
ZACCL_OUT
TEMP_OUT2
PITCH_OUT
ROLL_OUT
AUX_ADC
Hex
0x1770
0x0002
0x0001
0x0000
0x3FFF
0x3FFE
0x2890
LE
Figure 12. Output Register Bit Assignments
Decimal
+6000 LSB
+2 LSB
+1 LSB
0 LSB
−1 LSB
−2 LSB
−6000 LSB
TE
Rotation Rate
+300°/sec
+0.1°/sec
+0.05°/sec
0°/sec
−0.05°/sec
−0.1°/sec
−300°/sec
ADIS16305
Data Sheet
ORIENTATION ANGLES
Table 13. Power Supply, Offset Binary Format
The ROLL_OUT and PITCH_OUT registers provide a tilt
angle calculation based on the accelerometer measurements.
The zero reference is the point at which the z-axis faces gravity
for a north-east-down (NED) configuration. Table 12 displays
a number of examples for the 13-bit, twos complement digital
format in both of these registers. Figure 14 provides the physical
references and formulas that produce these orientation angles.
Supply Voltage
5.25 V
5.002418 V
5V
4.997582 V
4.75 V
Table 12. Orientation Angles, Twos Complement Format
The TEMP_OUT register provides an internal measurement for
temperature and uses 12-bit, twos complement for its digital format.
Table 14 provides several numerical examples of this format.
This is an internal temperature measurement, which can vary
from ambient conditions outside of the package.
Hex
0x0FFB
0x07FD
0x0002
0x0001
0x0000
0x1FFF
0x1FFE
0x1803
0x1006
Binary
XXX0 1111 1111 1011
XXX0 0111 1111 1101
XXX0 0000 0000 0010
XXX0 0000 0000 0001
XXX0 0000 0000 0000
XXX1 1111 1111 1111
XXX1 1111 1111 1110
XXX1 1000 0000 0011
XXX1 0000 0000 0110
Table 14. Temperature, Twos Complement Format
Temperature
+105°C
+85°C
+25.272°C
+25.136°C
+25°C
+24.864°C
+24.728°C
−40°C
Z-AXIS
aZ
aY
φROLL = ROLL_OUT = a TAN
aY
aZ
Z-AXIS
VCC
D
R1 C2
C1
Figure 15. Equivalent Analog Input Circuit
(Conversion Phase: Switch Open,
Track Phase: Switch Closed)
09020-014
φPITCH = PITCH_OUT = a TAN
–aX
aY × SIN (ΦROLL) + aZ COS (ΦROLL)
D
09020-015
O
aX
SIDE VIEW
X-AXIS
Binary
XXXX 0010 0100 1100
XXXX 0001 1011 1001
XXXX 0000 0000 0010
XXXX 0000 0000 0001
XXXX 0000 0000 0000
XXXX 1111 1111 1111
XXXX 1111 1111 1110
XXXX 1110 0010 0010
The AUX_ADC register provides access to the auxiliary ADC
input channel measurements and uses 12-bit, offset binary as its
digital format. The ADC is a 12-bit successive approximation
converter that has an input circuit equivalent to the one shown
in Figure 15. The maximum input is 3.3 V. The ESD protection
diodes can handle 10 mA without causing irreversible damage.
The on resistance (R1) of the switch has a typical value of 100 Ω.
The sampling capacitor, C2, has a typical value of 16 pF.
aZ
φPITCH
Hex
0x24C
0x1B9
0x002
0x001
0x000
0xFFF
0xFFE
0xE22
Analog Input (ADC)
FRONT VIEW
Y-AXIS
Decimal
+588 LSB
+441 LSB
+2 LSB
+1 LSB
0 LSB
−1 LSB
−2 LSB
−478 LSB
B
SO
φROLL
Binary
XXXX 1000 0111 1011
XXXX 1000 0001 0101
XXXX 1000 0001 0100
XXXX 1000 0001 0011
XXXX 0111 1010 1100
TE
Decimal
+4091
+2045
+2 LSB
+1 LSB
0 LSB
−1
−2
−2045
−4090
Hex
0x87B
0x815
0x814
0x813
0x7AC
Internal Temperature
LE
Angle
+180°
+90
+0.088°
+0.044°
0°
−0.044°
−0.088°
−90°
−179.96°
Decimal
2171 LSB
2069 LSB
2068 LSB
2067 LSB
1964 LSB
Figure 14. Orientation for PITCH_OUT and ROLL_OUT Angles
Power Supply
Table 15. ADC Measurement, Offset Binary Format
The SUPPLY_OUT register provides an internal measurement
for the power supply voltage and uses a 12-bit, offset binary
digital format. Table 13 provides several numerical examples
of this format.
Input Voltage
3.3 V
1V
1.6118 mV
805.9 µV
0V
Rev. A | Page 12 of 20
Decimal
4095 LSB
1241 LSB
2 LSB
1 LSB
0 LSB
Hex
0xFFF
0x4D9
0x002
0x001
0x000
Binary
XXXX 1111 1111 1111
XXXX 0100 1101 1001
XXXX 0000 0000 0010
XXXX 0000 0000 0001
XXXX 0000 0000 0000
Data Sheet
ADIS16305
CALIBRATION
Linear Acceleration Bias Compensation (Gyroscope)
Manual Bias Calibration
Set MSC_CTRL[7] = 1 (DIN = 0xB486) to enable correction for
low frequency acceleration influences on gyroscope bias. Note
that the DIN sequence also preserves the factory default condition
for the data-ready function (see Table 24).
The bias offset registers in Table 16 and Table 17 provide a manual
adjustment function for the output of each sensor. For example,
if GYRO_OFF = 0x1FF6 (DIN = 0x9B1F, 0x9AF6), the GYRO_OUT
offset shifts by −10 LSBs, or −0.125°/sec.
Global Commands
Table 16. GYRO_OFF Bit Descriptions
Bits
[15:13]
[12:0]
The GLOB_CMD register provides trigger bits for several useful
functions. Setting the assigned bit to 1 starts each operation,
which returns the bit to 0 after completion. For example, set
GLOB_CMD[7] = 1 (DIN = 0xBE80) to execute a software reset,
which stops the sensor operation and runs the device through
its start-up sequence. This sequence includes loading the control
registers with their respective flash memory locations prior to
producing new data. Reading the GLOB_CMD register
(DIN = 0x3E00) starts the burst read sequence.
Description (Default = 0x0000)
Not used.
Data bits. Twos complement, 0.0125°/sec per LSB.
Typical adjustment range = ±50°/sec.
TE
Table 17. XACCL_OFF, YACCL_OFF, ZACCL_OFF
Bit Descriptions
Bits
[15:12]
[11:0]
Description (Default = 0x0000)
Not used.
Data bits. Twos complement, 0.6 mg/LSB. Typical
adjustment range = ±1.22 g.
Table 19. GLOB_CMD Bit Descriptions
The PITCH_OFF and ROLL_OFF registers (see Table 18) provide
the angular orientation difference between the inertial frame
(internal) and the external frame (package). They follow the same
orientation as PITCH_OUT and ROLL_OUT, as shown in Figure 14.
Table 18. PITCH_OFF, ROLL_OFF Bit Descriptions
B
SO
Description
Not used.
Data bits. Twos complement, 0.014°/LSB.
Bit(s)
[15:8]
[7]
[6:5]
[4]
[3]
[2]
[1]
[0]
Description
Not used
Software reset command
Not used
Precision autonull command
Flash update command
Auxiliary DAC data latch
Factory calibration restore command
Autonull command
LE
Frame Alignment
Bits
[15:10]
[9:0]
OPERATIONAL CONTROL
Gyroscope Automatic Bias Null Calibration
Set GLOB_CMD[0] = 1 (DIN = 0xBE01) to execute the automatic
bias null calibration function. This function measures the
gyroscope output register and then loads the gyroscope offset
register with the opposite value to provide a quick bias calibration.
All sensor data is then reset to 0, and the flash memory is updated
automatically within 50 ms (see Table 19).
O
Gyroscope Precision Automatic Bias Null Calibration
Set GLOB_CMD[4] = 1 (DIN = 0xBE10) to execute the precision
automatic bias null calibration function. This function takes the
sensor offline for 30 sec while it collects a set of data and calculates
more accurate bias correction factors for each gyroscope. After
this function is executed, the newly calculated correction factor
is loaded into the gyroscope offset registers, all sensor data is
reset to 0, and the flash memory is updated automatically within
50 ms (see Table 19).
Restoring Factory Calibration
Set GLOB_CMD[1] = 1 (DIN = 0xBE02) to execute the factory
calibration restore function. This function resets each user calibration
register to 0x0000 (see Table 16 and Table 17), resets all sensor
data to 0, and automatically updates the flash memory within
50 ms (see Table 19).
Internal Sample Rate
The SMPL_PRD register provides discrete sample rate settings
using the bit assignments in Table 20 and the following equation:
tS = tB × (NS + 1)
For example, when SMPL_PRD[7:0] = 0x0A, the sample rate is
149 SPS.
Table 20. SMPL_PRD Bit Descriptions
Bit(s)
[15:8]
[7]
[6:0]
Description (Default = 0x0001)
Not used
Time base (tB)
0 = 0.61035 ms, 1 = 18.921 ms
Increment setting (NS)
Internal sample period = tS = tB × (NS + 1)
The default sample rate setting of 819.2 SPS provides optimal
performance. For systems that value slower sample rates, keep the
internal sample rate at 819.2 SPS. Use the programmable filter
(SENS_AVG) to reduce the bandwidth, which helps to prevent
aliasing. The data-ready function (MSC_CTRL) can drive an
interrupt routine that uses a counter to help ensure data coherence
at reduced rates.
Rev. A | Page 13 of 20
ADIS16305
Data Sheet
Power Management
0
Setting SMPL_PRD ≥ 0x0A also sets the sensor to low power
mode. For systems that require lower power dissipation, insystem characterization helps users to quantify the associated
performance trade-offs. In addition to sensor performance, this
mode affects SPI data rates (see Table 2). Set SLP_CNT[8] = 1
(DIN = 0xBB01) to start the indefinite sleep mode, which requires
a CS assertion (high to low), reset, or power cycle to wake up.
Use SLP_CNT[7:0] to put the device into sleep mode for a specified
period. For example, SLP_CNT[7:0] = 0x64 (DIN = 0xBA64)
puts the ADIS16305 to sleep for 50 sec.
–20
MAGNITUDE (dB)
–40
Table 22. SENS_AVG Bit Descriptions
Bit(s)
[15:11]
[10:8]
09020-016
N
LPF
330Hz
N = 2m
m = SENS_AVG[2:0]
Figure 16. MEMS Analog and Digital Filters
Digital Filtering
09020-017
TE
The SENS_AVG[10:8] bits provide three dynamic range settings
for this gyroscope. The lower dynamic range settings (±75°/sec and
±150°/sec) limit the minimum filter tap sizes to maintain resolution.
For example, set SENS_AVG[10:8] = 010 (DIN = 0xB902) for
a measurement range of ±150°/sec. Because this setting can
influence the filter settings, program SENS_AVG[10:8] and
then SENS_AVG[2:0] if more filtering is required.
LE
N
LPF
757Hz
N
1
Dynamic Range
B
SO
FROM
ACCELERATION
SENSOR
0.1
Figure 17. Bartlett Window, FIR Filter Frequency Response
(Phase Delay = N Samples)
The signal chain for each MEMS sensor has several filter stages,
which shape their frequency response. Figure 16 provides a block
diagram for both gyroscope and accelerometer signal paths.
Table 22 provides additional information for digital filter
configuration.
N
0.01
FREQUENCY (Ratio)
Sensor Bandwidth
LPF
404Hz
N=2
N=4
N = 16
N = 64
–120
–140
0.001
Description
Not used
Indefinite sleep mode; set to 1
Programmable sleep time bits, 0.5 sec/LSB
FROM
GYROSCOPE
SENSOR
–80
–100
Table 21. SLP_CNT Bit Descriptions
Bit(s)
[15:9]
[8]
[7:0]
–60
O
The N blocks in Figure 16 are part of the programmable lowpass filter, which provides additional noise reduction on the
inertial sensor outputs. This filter contains two cascaded averaging
filters that provide a Bartlett window, FIR filter response (see
Figure 17). For example, set SENS_AVG[2:0] = 100 (DIN = 0xB804)
to set each stage to 16 taps. When used with the default sample
rate of 819.2 SPS, this value reduces the sensor bandwidth to
approximately 16 Hz.
[7:3]
[2:0]
Rev. A | Page 14 of 20
Description
Not used
Measurement range (sensitivity) selection
100 = ±300°/sec (default condition)
010 = ±150°/sec, filter taps ≥ 4 (Bits[2:0] ≥ 0x02)
001 = ±75°/sec, filter taps ≥ 16 (Bits[2:0] ≥ 0x04)
Not used
Number of taps in each stage, N = 2M;
maximum setting = 6 (110), N = 26 = 64 taps/stage
Data Sheet
ADIS16305
INPUT/OUTPUT FUNCTIONS
Table 24. MSC_CTRL Bit Descriptions
General-Purpose I/O
DIO1, DIO2, DIO3, and DIO4 are configurable, general-purpose
I/O lines that serve multiple purposes according to the following
control register priority: MSC_CTRL, ALM_CTRL, and
GPIO_CTRL. For example, set GPIO_CTRL = 0x080C
(DIN = 0xB20C, and then 0xB308) to configure DIO1 and
DIO2 as inputs and DIO3 and DIO4 as outputs, with DIO3
set low and DIO4 set high.
In this configuration, read GPIO_CTRL (DIN = 0x3200) to
monitor the digital state of DIO1 and DIO2.
[0]
[8]
TE
Description
Not used
Memory test (cleared upon completion)
(1 = enabled, 0 = disabled)
Internal self-test enable (cleared upon completion)
(1 = enabled, 0 = disabled)
Manual self-test, negative stimulus
(1 = enabled, 0 = disabled)
Manual self-test, positive stimulus
(1 = enabled, 0 = disabled)
Linear acceleration bias compensation for gyroscopes
(1 = enabled, 0 = disabled)
Point of percussion alignment, accelerometer
(1 = enabled, 0 = disabled)
Not used
Data ready enable
(1 = enabled, 0 = disabled)
Data ready polarity
(1 = active high, 0 = active low)
Data ready line select
(1 = DIO2, 0 = DIO1)
[5:3]
[2]
[1]
LE
[1]
[9]
[6]
Description
Not used
General-Purpose I/O Line 4 (DIO4) data level
General-Purpose I/O Line 3 (DIO3) data level
General-Purpose I/O Line 2 (DIO2) data level
General-Purpose I/O Line 1 (DIO1) data level
Not used
General-Purpose I/O Line 4 (DIO4) direction control
(1 = output, 0 = input)
General-Purpose I/O Line 3 (DIO3) direction control
(1 = output, 0 = input)
General-Purpose I/O Line 2 (DIO2) direction control
(1 = output, 0 = input)
General-Purpose I/O Line 1 (DIO1) direction control
(1 = output, 0 = input)
[0]
Auxiliary DAC
B
SO
[2]
[10]
[7]
Table 23. GPIO_CTRL Bit Descriptions
Bit(s)
[15:12]
[11]
[10]
[9]
[8]
[7:4]
[3]
Bit(s)
[15:12]
[11]
Input Clock Configuration
The input clock function allows for external control oversampling in the ADIS16305. Set SMPL_PRD[7:0] = 0x00 (DIN
= 0xB600) to enable this function. See Table 2 and Figure 4 for
timing information.
Data-Ready I/O Indicator
O
The factory default sets DIO1 as a positive data-ready indicator
signal. The MSC_CTRL[2:0] bits provide configuration options
for changing the default. For example, set MSC_CTRL[2:0] = 100
(DIN = 0xB404) to change the polarity of the data-ready signal
on DIO1 for interrupt inputs that require negative logic inputs
for activation. The pulse width is between 100 µs and 200 µs
over all conditions.
The 12-bit AUX_DAC line can drive its output to within 5 mV
of the ground reference when it is not sinking current. As the
output approaches 0 V, the linearity begins to degrade (~100 LSB
beginning point). As the sink current increases, the nonlinear
range increases. The DAC latch command moves the values of
the AUX_DAC register into the DAC input register, enabling
both bytes to take effect at the same time.
Table 25. AUX_DAC Bit Descriptions
Bits
[15:12]
[11:0]
Description
Not used
Data bits, scale factor = 0.8059 mV/LSB
Offset binary format, 0 V = 0 LSB
Table 26. Setting AUX_DAC = 1 V
DIN
0xB0D9
0xB104
0xBE04
Rev. A | Page 15 of 20
Description
AUX_DAC[7:0] = 0xD9 (217 LSB).
AUX_DAC[15:8] = 0x04 (1024 LSB).
GLOB_CMD[2] = 1.
Move values into the DAC input register, resulting in
a 1 V output level.
ADIS16305
Data Sheet
DIAGNOSTICS
Table 28. FLASH_CNT Bit Descriptions
0x0400
0xB501
0x0400
450
300
0
30
40
55
70
85
100
125
135
JUNCTION TEMPERATURE (°C)
150
09020-018
150
Checksum Test
LE
Description
SMPL_PRD[7:0] = 0x01, sample rate = 819.2 SPS
SENS_AVG[15:8] = 0x04, gyro range = ±300°/sec
SENS_AVG[7:0] = 0x02, four-tap averaging filter
Delay = 50 ms
Read GYRO_OUT
MSC_CTRL[9] = 1, gyroscope negative self-test
Delay = 50 ms
Read GYRO_OUT
Determine whether the bias in the gyroscope
output changed according to the self-test
response specified in Table 1
MSC_CTRL[9:8] = 01, gyroscope/accelerometer
positive self-test
Delay = 50 ms
Read GYRO_OUT
Determine whether the bias in the gyroscope
output changed according to the self-test
response specified in Table 1
MSC_CTRL[15:8] = 0x00
O
0xB500
600
Set MSC_CTRL[11] = 1 (DIN = 0x9D08) to verify the flash
memory integrity against the factory check sum and read
DIAG_STAT[6] to check the results 20 ms after the command.
Status
The error flags provide indicator functions for common system
level issues. All of the flags are cleared (set to 0) after each
DIAG_STAT register read cycle. If an error condition remains,
the error flag returns to 1 during the next sample cycle. The
DIAG_STAT[1:0] bits do not require a read of this register to
return to 0. If the power supply voltage goes back into range,
these two flags are cleared automatically.
B
SO
0x0400
0xB502
Description
Binary counter for writing to flash memory
Figure 18. Flash/EE Memory Data Retention
Table 27. Manual Self-Test Example Sequence
DIN
0xB601
0xB904
0xB802
Bits
[15:0]
TE
The self-test function allows the user to verify the mechanical
integrity of each MEMS sensor. It applies an electrostatic force to
each sensor element, which results in mechanical displacement
that simulates a response to actual motion. Table 1 lists the
expected response for each sensor, which provides pass/fail
criteria. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the
internal self-test routine, which exercises all inertial sensors,
measures each response, makes pass/fail decisions, and reports
them to error flags in the DIAG_STAT register. This process takes
35 ms to complete and report the results to DIAG_STAT[5],
DIAG_STAT[10], and DIAG_STAT[15:13]. MSC_CTRL[10]
resets itself to 0 after completing the routine. The MSC_CTRL[9:8]
bits provide manual control over the self-test function for
investigation of potential failures. Table 27 outlines an example
test flow for using this option to verify the gyroscope function.
RETENTION (Years)
Self-Test
While the self-test still functions when the device is in motion,
zero motion typically produces the most reliable results. The
settings in Table 27 are flexible and allow for optimization
around speed and noise influence. For example, using fewer
filtering taps decreases delay times but increases the possibility
of noise influence.
Flash Memory Management
The FLASH_CNT register (see Table 28) provides a tool for
managing the flash memory’s endurance. The FLASH_CNT
register increments every time there is a write to the flash
memory. Figure 18 quantifies the relationship between data
retention and junction temperature.
Table 29. DIAG_STAT Bit Descriptions
Bit(s)
[15]
[14]
[13]
[12:11]
[10]
[9]
[8]
[7]
[6]
[5]
[4]
[3]
[2]
[1]
[0]
1
Description
Z-axis accelerometer self-test failure (1 = fail, 0 = pass)
Y-axis accelerometer self-test failure (1 = fail, 0 = pass)
X-axis accelerometer self-test failure (1 = fail, 0 = pass)
Not used
Gyroscope self-test failure (1 = fail, 0 = pass)
Alarm 2 status (1 = active, 0 = inactive)
Alarm 1 status (1 = active, 0 = inactive)
Not used
Flash test, checksum flag (1 = fail, 0 = pass)
Self-test diagnostic error flag (1 = fail, 0 = pass)
Sensor overrange (1 = fail, 0 = pass)
SPI communication failure (1 = fail, 0 = pass)1
Flash update failure (1 = fail, 0 = pass)
Power supply > 5.25 V (1 = power supply > 5.25 V,
0 = power supply ≤ 5.25 V)
Power supply < 4.75 V (1 = power supply < 4.75 V,
0 = power supply ≥ 4.75 V)
The SPI error flag in DIAG_STAT[3] goes to 1 when the number of SCLKs is
not equal to an integer multiple of 16.
Rev. A | Page 16 of 20
Data Sheet
ADIS16305
The alarm function provides monitoring for two independent
conditions. The ALM_CTRL register provides control inputs
for trigger source, data filtering (prior to comparison), static
comparison, dynamic rate-of-change comparison, and output
indicator configurations. The ALM_MAGx registers establish
the trigger threshold and polarity configurations. Table 33 gives
an example of how to configure a static alarm. The ALM_SMPLx
registers provide the number of samples to use in the dynamic
rate-of-change configuration. The period equals the number in
the ALM_SMPLx register multiplied by the sample period time,
which is established by the SMPL_PRD register. See Table 34 for
an example of how to configure the sensor for this type of function.
Table 30. ALM_MAG1, ALM_MAG2 Bit Descriptions
Bit(s)
[15]
[14]
[13:0]
Description
Comparison polarity (1 = greater than, 0 = less than)
Not used
Data, matches the format of the trigger source
Table 31. ALM_SMPL1, ALM_SMPL2 Bit Descriptions
Value
Description
Alarm 2 trigger source selection
Disable
Power supply output
Gyroscope output
Not used
Not used
X-axis accelerometer output
Y-axis accelerometer output
Z-axis accelerometer output
Temperature output
Pitch angle output
Roll angle output
Auxiliary ADC measurement
Alarm 1 trigger source selection (see Bits[15:12])
Rate of change (ROC) enable for Alarm 2
1 = rate of change, 0 = static level
Rate of change (ROC) enable for Alarm 1
1 = rate of change, 0 = static level
Not used
Comparison data filter setting1
1 = filtered data, 0 = unfiltered data
Not used
Alarm output enable (1 = enable, 0 = disable)
Alarm output polarity (1 = high, 0 = low)
Alarm output line select (1 = DIO2, 0 = DIO1)
O
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
[11:8]
[7]
[6]
[5]
[4]
[3]
[2]
[1]
[0]
1
Description
ALM_CTRL = 0x5517
Alarm 1 input = XACCL_OUT
Alarm 2 input = XACCL_OUT
Static level comparison, filtered data
DIO2 output indicator, positive polarity
ALM_MAG1 = 0x8341
Alarm 1 is true if XACCL_OUT > +0.5 g
ALM_MAG2 = 0x3CBF
Alarm 2 is true if XACCL_OUT < −0.5 g
Table 34. Alarm Configuration Example 2
DIN
0xAF76,
0xAEC7
0xAA08
0xAC50
B
SO
Bits
[15:12]
0xA783,
0xA641
0xA93C,
0xA8BF
0xB601
Description
Not used
Data bits: number of samples (both 0x00 and 0x01 = 1)
Table 32. ALM_CTRL Bit Designations
DIN
0xAF55,
0xAE17
Description
ALM_CTRL = 0x76C7
Alarm 1 input = YACCL_OUT
Alarm 2 input = ZACCL_OUT
Rate-of-change comparison, unfiltered data
DIO2 output indicator, positive polarity
SMPL_PRD = 0x0001
Sample rate = 819.2 SPS
ALM_SMPL1 = 0x0008
Alarm 1 rate-of-change period = 9.77 ms
ALM_SMPL2 = 0x0050
Alarm 2 rate-of-change period = 97.7 ms
ALM_MAG1 = 0x8341
Alarm 1 is true when Δ XACCL_OUT > 0.5 g over a
period of 9.77 ms
ALM_MAG2 = 0x3CBF
Alarm 1 is true when Δ XACCL_OUT < −0.5 g over a
period of 97.7 ms
LE
Bits
[15:8]
[7:0]
Table 33. Alarm Configuration Example 1
TE
Alarm Registers
0xA783,
0xA641
0xA93C,
0xA8BF
PRODUCT IDENTIFICATION
Table 35 provides a summary of the registers that identify the
product: PROD_ID, which identifies the product type; LOT_ID1
and LOT_ID2, the 32-bit lot identification code; and SERIAL_NUM,
which displays the 12-bit serial number. All four registers are
two bytes in length. When using the SERIAL_NUM value to
calculate the serial number, mask off the upper four bits and
convert the remaining 12 bits to a decimal number.
Table 35. Identification Registers
Register Name
LOT_ID1
LOT_ID2
PROD_ID
SERIAL_NUM
Incline outputs (pitch, roll) always use filtered data in this comparison.
Rev. A | Page 17 of 20
Address
0x52
0x54
0x56
0x58
Description
Lot Identification Code 1
Lot Identification Code 2
ADIS16305: 0x3FB1 (16,305)
Serial number, 0 to 4095
ADIS16305
Data Sheet
APPLICATIONS INFORMATION
GYROSCOPE BIAS OPTIMIZATION
The ADIS16305/PCBZ includes one ADIS16305ALMZ, one
interface PCB, and one interface flex. This combination simplifies
the process of prototype connections of the ADIS16305AMLZ
with an existing processor system.
The factory calibration addresses initial bias errors along with
temperature-dependent bias behaviors. Installation and certain
environmental conditions can introduce modest bias errors. The
precision autonull command provides a simple predeployment
method for correcting these errors to an accuracy of approximately
0.008°/sec, using an average of 30 sec. Set GLOB_CMD[4] = 1
(DIN = BE10) to start this operation. Averaging the sensor output
data for 100 sec can provide incremental performance gains, as
well. Controlling device rotation, power supply, and temperature
during these averaging times helps to ensure optimal accuracy
during this process. Refer to the AN-1041 Application Note for
more information about optimizing performance.
J1 and J2 are dual-row, 2 mm (pitch) connectors that work with
a number of ribbon cable systems, including 3M Part Number
152212-0100-GB (ribbon crimp connector) and 3M Part Number
3625/12 (ribbon cable). Figure 19 provides a hole pattern design
for installing the ADIS16305/PCBZ so that the flex fits well in
between the ADIS16305AMLZ and the interface PCB. Figure 20
provides the pin assignments for each connector, and the pin
descriptions match those listed in Table 5. The ADIS16305 does
not require external capacitors for normal operation; therefore,
the interface PCB does not use the C1/C2 pads (not shown in
Figure 19).
33.77
23.75
3.30 × 4
27.00
12
11
2
1
J1
12
11
2
1
J2
15.05
30.10
SCF-140379-01
09020-019
B
SO
13.50
ADIS16305AMLZ
LE
2.20 × 2
INTERFACE PCB
Figure 19. Physical Diagram for Mounting the ADIS16305/PCBZ
J2
RST
1
2
SCLK
AUX_ADC
1
2
GND
CS
3
4
DOUT
AUX_DAC
3
4
DIO3
DNC
5
6
DIN
GND
5
6
DIO4
GND
7
8
GND
DNC
7
8
DNC
GND
9
10
VCC
DNC
9
10
DNC
VCC
11
12
VCC
DIO2
11
12
DIO1
09020-020
J1
TE
INTERFACE PRINTED CIRCUIT BOARD (PCB)
O
Figure 20. J1/J2 Pin Assignments for Interface PCB
Rev. A | Page 18 of 20
Data Sheet
ADIS16305
OUTLINE DIMENSIONS
31.25
31.00
30.75
13.60
13.50
13.40
13.60
13.50
13.40
9.13
8.88
8.63
TE
2.20 THRU HOLE
(2 PLACES)
23.25
23.00
22.75
15.24
TOP VIEW
DETAIL A
13.97
LE
7.82
1.27
6.55
6.30
6.05
8.00 MAX
3.05
0.64
2.55
2.30
2.05
END VIEW
DETAIL A
04-06-2010-A
B
SO
1.27 BSC
CONNECTOR PITCH
Figure 21. 24-Lead Module with Connector Interface
(ML-24-4)
Dimensions shown in millimeters
ORDERING GUIDE
Temperature Range
−40°C to +85°C
O
Model 1
ADIS16305AMLZ
ADIS16305/PCBZ
1
Package Description
24-Lead Module with Connector Interface
Interface Board
Z = RoHS Compliant Part.
Rev. A | Page 19 of 20
Package Option
ML-24-4
ADIS16305
Data Sheet
O
B
SO
LE
TE
NOTES
©2010–2014 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D09020-0-6/14(A)
Rev. A | Page 20 of 20