Data Sheet
ADIS16477
Precision, Miniature MEMs IMU
FEATURES
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GENERAL DESCRIPTION
Triaxial, digital gyroscope
► ±125°/sec, ±500°/sec, ±2000°/sec range models
► 2°/hr in-run bias stability (ADIS16477-1)
► 0.15°/√hr angle random walk (ADIS16477-1 and
ADIS16477-2)
► ±0.1° axis-to-axis misalignment error
Triaxial, digital accelerometer, ±40 g
► 13 μg in-run bias stability
Triaxial, delta angle and delta velocity outputs
Factory calibrated sensitivity, bias, and axial alignment
► Calibration temperature range: −40°C to +85°C
SPI compatible data communications
Programmable operation and control
► Automatic and manual bias correction controls
► Data ready indicator for synchronous data acquisition
► External sync modes: direct, pulse, scaled, and output
► On demand self test of inertial sensors
► On demand self test of flash memory
Single-supply operation (VDD): 3.0 V to 3.6 V
2000 g mechanical shock survivability
Operating temperature range: −40°C to +105°C
The ADIS16477 is a precision, miniature MEMS inertial measurement unit (IMU) that includes a triaxial gyroscope and a triaxial
accelerometer. Each inertial sensor in the ADIS16477 combines
with signal conditioning that optimizes dynamic performance. The
factory calibration characterizes each sensor for sensitivity, bias,
alignment, linear acceleration (gyroscope bias), and point of percussion (accelerometer location). As a result, each sensor has dynamic compensation formulas that provide accurate sensor measurements over a broad set of conditions.
The ADIS16477 provides a simple, cost effective method for integrating accurate, multiaxis inertial sensing into industrial systems,
especially when compared with the complexity and investment
associated with discrete designs. All necessary motion testing
and calibration are part of the production process at the factory,
greatly reducing system integration time. Tight orthogonal alignment
simplifies inertial frame alignment in navigation systems. The serial
peripheral interface (SPI) and register structure provide a simple
interface for data collection and configuration control.
The ADIS16477 is available in a 44-ball, ball grid array (BGA)
package that is approximately 11 mm × 15 mm × 11 mm.
APPLICATIONS
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Navigation, stabilization, and instrumentation
Unmanned and autonomous vehicles
Smart agriculture/construction machinery
Factory/industrial automation, robotics
Virtual/augmented reality
Internet of Moving Things
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
Rev. E
DOCUMENT FEEDBACK
TECHNICAL SUPPORT
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change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Data Sheet
ADIS16477
TABLE OF CONTENTS
Features................................................................ 1
Applications........................................................... 1
General Description...............................................1
Functional Block Diagram......................................1
Specifications........................................................ 4
Timing Specifications......................................... 6
Absolute Maximum Ratings...................................8
Thermal Resistance........................................... 8
ESD Caution.......................................................8
Pin Configuration and Function Descriptions........ 9
Typical Performance Characteristics................... 11
Theory of Operation.............................................13
Introduction.......................................................13
Inertial Sensor Signal Chain.............................13
Register Structure............................................ 14
Serial Peripheral Interface (SPI).......................14
Data Ready (DR)..............................................15
Reading Sensor Data....................................... 16
Device Configuration........................................ 17
User Register Memory Map.................................19
User Register Definitions.....................................21
Status/Error Flag Indicators (DIAG_STAT).......21
Gyroscope Data...................................................22
Gyroscope Measurement Range/Scale
Factor............................................................. 22
Gyroscope Data Formatting............................. 22
X-Axis Gyroscope (X_GYRO_LOW and
X_GYRO_OUT)..............................................22
Y-Axis Gyroscope (Y_GYRO_LOW and
Y_GYRO_OUT)..............................................22
Z-Axis Gyroscope (Z_GYRO_LOW and
Z_GYRO_OUT)..............................................23
Acceleration Data............................................. 23
Accelerometer Data Formatting....................... 23
X-Axis Accelerometer (X_ACCL_LOW and
X_ACCL_OUT)...............................................23
Y-Axis Accelerometer (Y_ACCL_LOW and
Y_ACCL_OUT)...............................................23
Z-Axis Accelerometer (Z_ACCL_LOW and
Z_ACCL_OUT)...............................................24
Internal Temperature (TEMP_OUT)................. 24
Time Stamp (TIME_STAMP)............................ 24
Data Update Counter (DATA_CNTR)...............24
Delta Angles........................................................ 25
Delta Angle Measurement Range.................... 25
X-Axis Delta Angle (X_DELTANG_LOW and
X_DELTANG_OUT)........................................25
Y-Axis Delta Angle (Y_DELTANG_LOW and
Y_DELTANG_OUT)........................................25
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Z-Axis Delta Angle (Z_DELTANG_LOW and
Z_DELTANG_OUT)........................................ 25
Delta Angle Resolution.....................................26
Delta Velocity.......................................................27
X-Axis Delta Velocity (X_DELTVEL_LOW
and X_DELTVEL_OUT)................................. 27
Y-Axis Delta Velocity (Y_DELTVEL_LOW
and Y_DELTVEL_OUT)................................. 27
Z-Axis Delta Velocity (Z_DELTVEL_LOW
and Z_DELTVEL_OUT)..................................27
Delta Velocity Resolution..................................28
Calibration........................................................... 29
Calibration, Gyroscope Bias
(XG_BIAS_LOW and XG_BIAS_HIGH)......... 29
Calibration, Gyroscope Bias
(YG_BIAS_LOW and YG_BIAS_HIGH)......... 29
Calibration, Gyroscope Bias
(ZG_BIAS_LOW and ZG_BIAS_HIGH)......... 29
Calibration, Accelerometer Bias
(XA_BIAS_LOW and XA_BIAS_HIGH)..........29
Calibration, Accelerometer Bias
(YA_BIAS_LOW and YA_BIAS_HIGH).......... 30
Calibration, Accelerometer Bias
(ZA_BIAS_LOW and ZA_BIAS_HIGH).......... 30
Filter Control Register (FILT_CTRL)................ 30
Range Identifier (RANG_MDL).........................31
Miscellaneous Control Register
(MSC_CTRL)..................................................31
Point of Percussion ......................................... 31
Linear Acceleration Effect on Gyroscope
Bias................................................................ 31
Internal Clock Mode......................................... 32
Output Sync Mode............................................32
Direct Sync Mode............................................. 32
Pulse Sync Mode............................................. 32
Scaled Sync Mode........................................... 32
Decimation Filter (DEC_RATE)........................ 32
Data Update Rate in External Sync Modes......33
Continuous Bias Estimation (NULL_CNFG).....33
Global Commands (GLOB_CMD).................... 33
Software Reset.................................................33
Flash Memory Test .......................................... 33
Flash Memory Update ..................................... 33
Sensor Self Test .............................................. 33
Factory Calibration Restore .............................34
Bias Correction Update.................................... 34
Firmware Revision (FIRM_REV)...................... 34
Firmware Revision Day and Month
(FIRM_DM).....................................................34
Rev. E | 2 of 41
Data Sheet
ADIS16477
TABLE OF CONTENTS
Firmware Revision Year (FIRM_Y)...................34
Product Identification (PROD_ID).................... 34
Serial Number (SERIAL_NUM)........................ 34
Scratch Registers (USER_SCR_1 to
USER_SCR_3)...............................................34
Flash Memory Endurance Counter
(FLSHCNT_LOW and FLSHCNT_HIGH).......35
Applications Information...................................... 36
Assembly and Handling Tips............................36
Power Supply Considerations.......................... 36
Serial Port Operation........................................37
Digital Resolution of Gyroscopes and
Accelerometers.............................................. 37
Evaluation Tools............................................... 38
Tray Drawing....................................................... 40
Outline Dimensions............................................. 41
Ordering Guide.................................................41
Evaluation Boards............................................ 41
REVISION HISTORY
7/2022—Rev. D to Rev. E
Changes to Serial Peripheral Interface (SPI) Section, Table 6, and Table 7..................................................14
Changes to Burst Read Function Section......................................................................................................16
Added 16-Bit Burst Mode with BURST_SEL = 0 Section.............................................................................. 16
Added 16-Bit Burst Mode with BURST_SEL = 1 Section.............................................................................. 16
Added 32-Bit Burst Mode with BURST_SEL = 0 Section.............................................................................. 17
Added 32-Bit Burst Mode with BURST_SEL = 1 Section.............................................................................. 17
Changes to Table 105.................................................................................................................................... 31
Changes to Assembly Tips Section............................................................................................................... 36
Changes to Gyroscope Data Width (Digital Resolution) Section................................................................... 37
Changes to PC-Based Evaluation, EVAL-ADIS-FX3 Section........................................................................ 39
Changes to Evaluation Boards...................................................................................................................... 41
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Rev. E | 3 of 41
Data Sheet
ADIS16477
SPECIFICATIONS
Case temperature (TC) = 25°C, VDD = 3.3 V, angular rate = 0°/sec, dynamic range = ±2000°/sec ± 1 g, unless otherwise noted.
Table 1.
Parameter
GYROSCOPES
Dynamic Range
Sensitivity
Error over Temperature
Repeatability1
Misalignment Error
Nonlinearity2
Bias
Repeatability1
In-Run Bias Stability
Angular Random Walk
Error over Temperature
Linear Acceleration Effect
Vibration Rectified Error (VRE)
Output Noise
Rate Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
ACCELEROMETERS3
Dynamic Range
Sensitivity
Error over temperature
Repeatability1
Misalignment Error
Nonlinearity
Bias
Repeatability1
In-Run Bias Stability
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Test Conditions/Comments
Min
ADIS16477-1
ADIS16477-2
ADIS16477-3
ADIS16477-1, 16-bit
ADIS16477-2, 16-bit
ADIS16477-3, 16-bit
ADIS16477-1, 32-bit
ADIS16477-2, 32-bit
ADIS16477-3, 32-bit
−40°C ≤ TC ≤ +85°C, 1 σ
−40°C ≤ TC ≤ +85°C, 1 σ
Axis to axis, −40°C ≤ TC ≤ +85°C, 1 σ
ADIS16477-1, full scale (FS) = 125°/sec
ADIS16477-2, FS = 500°/sec
ADIS16477-3, FS = 2000°/sec
±125
±500
±2000
Typ
Max
Unit
160
40
10
10,485,760
2,621,440
655,360
±0.3
±0.3
±0.1
0.2
0.2
0.25
°/sec
°/sec
°/sec
LSB/°/sec
LSB/°/sec
LSB/°/sec
LSB/°/sec
LSB/°/sec
LSB/°/sec
%
%
Degrees
% FS
% FS
% FS
0.7
2
2.5
7
0.15
0.15
0.3
±0.2
0.01
0.0005
0.07
0.08
0.17
0.003
0.003
0.007
550
66
°/sec
°/hr
°/hr
°/hr
°/√hr
°/√hr
°/√hr
°/sec
°/sec/g
°/sec/g2
°/sec rms
°/sec rms
°/sec rms
°/sec/√Hz rms
°/sec/√Hz rms
°/sec/√Hz rms
Hz
kHz
32-bit data format
−40°C ≤ TC ≤ +85°C, 1 σ
−40°C ≤ TC ≤ +85°C, 1 σ
Axis to axis, −40°C ≤ TC ≤ +85°C, 1 σ
Best fit straight line, ±10 g
Best fit straight line, ±20 g
Best fit straight line, ±40 g
52,428,800
±0.1
±0.1
±0.05
0.02
0.4
1.5
g
LSB/g
%
%
Degrees
% FS
% FS
% FS
−40°C ≤ TC ≤ +85°C, 1 σ
1σ
6
13
mg
μg
−40°C ≤ TC ≤ +85°C, 1 σ
ADIS16477-1, 1 σ
ADIS16477-2, 1 σ
ADIS16477-3, 1 σ
ADIS16477-1, 1 σ
ADIS16477-2, 1 σ
ADIS16477-3, 1 σ
−40°C ≤ TC ≤ +85°C, 1 σ
Any direction, 1 σ
Random vibration, 2 grms, 50 Hz to 2 kHz
ADIS16477-1, 1 σ, no filtering
ADIS16477-2, 1 σ, no filtering
ADIS16477-3, 1 σ, no filtering
ADIS16477-1, f = 10 Hz to 40 Hz
ADIS16477-2, f = 10 Hz to 40 Hz
ADIS16477-3, f = 10 Hz to 40 Hz
Each axis
±40
Rev. E | 4 of 41
Data Sheet
ADIS16477
SPECIFICATIONS
Table 1.
Parameter
Velocity Random Walk
Error over Temperature
Output Noise
Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
TEMPERATURE SENSOR
Scale Factor
LOGIC INPUTS4
Input Voltage
High, VIH
Low, VIL
RST Pulse Width
Input Current
Logic 1, IIH
Logic 0, IIL
All Pins Except RST
RST Pin
Input Capacitance, CIN
DIGITAL OUTPUTS
Output Voltage
High, VOH
Low, VOL
FLASH MEMORY
Data Retention6
FUNCTIONAL TIMES7
Power-On Start-Up Time
Reset Recovery Time8
Factory Calibration Restore
Flash Memory Backup
Flash Memory Test Time
Self Test Time9
CONVERSION RATE
Initial Clock Accuracy
Sync Input Clock
POWER SUPPLY, VDD
Power Supply Current10
1
Test Conditions/Comments
Min
1σ
−40°C ≤ TC ≤ +85°C, 1 σ
No filtering
f = 10 Hz to 40 Hz, no filtering
Typ
Max
Unit
Y-axis and z-axis
X-axis
0.037
±3
2.3
100
600
5.65
5.25
m/sec/√hr
mg
mg rms
μg/√Hz rms
Hz
kHz
kHz
Output = 0x0000 at 0°C (±5°C)
0.1
°C/LSB
2.0
0.8
V
V
µs
10
µA
10
µA
mA
pF
1
VIH = 3.3 V
VIL = 0 V
0.33
10
ISOURCE = 0.5 mA
ISINK = 2.0 mA
Endurance5
TJ = 85°C
Time until data is available
2.4
0.4
10000
20
252
193
142
72
32
14
2000
3
GLOB_CMD, Bit 7 = 1 (see Table 113)
GLOB_CMD, Bit 1 = 1 (see Table 113)
GLOB_CMD, Bit 3 = 1 (see Table 113)
GLOB_CMD, Bit 4 = 1 (see Table 113)
GLOB_CMD, Bit 2 = 1 (see Table 113)
Operating voltage range
Normal mode, VDD = 3.3 V
1.9
3.0
44
2.1
3.6
55
V
V
Cycles
Years
ms
ms
ms
ms
ms
ms
SPS
%
kHz
V
mA
Bias repeatability provides an estimate for long-term drift in the bias, as observed during 500 hours of high temperature operating life (HTOL) at 105°C.
2
This measurement is based on the deviation from a best fit linear model.
3
All specifications associated with the accelerometers relate to the full-scale range of ±8 g, unless otherwise noted.
4
The digital input/output signals use a 3.3 V system.
5
Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C.
6
The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ.
7
These times do not include thermal settling and internal filter response times, which may affect overall accuracy.
8
The RST line must be in a low state for at least 10 μs to ensure a proper reset initiation and recovery.
9
The self test time can extend when using external clock rates lower than 2000 Hz.
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Rev. E | 5 of 41
Data Sheet
ADIS16477
SPECIFICATIONS
Table 1.
Parameter
10
Test Conditions/Comments
Min
Typ
Max
Unit
Power supply current transients can reach 100 mA during initial startup or reset recovery.
TIMING SPECIFICATIONS
TA = 25°C, VDD = 3.3 V, unless otherwise noted.
Table 2.
Normal Mode
Parameter
Description
Min
fSCLK
tSTALL
tREADRATE
tCS
tDAV
tDSU
tDHD
tSCLKR, tSCLKF
tDR, tDF
tSFS
t1
Serial clock
Stall period between data
Read rate
Chip select to SCLK edge
DOUT valid after SCLK edge
DIN setup time before SCLK rising edge
DIN hold time after SCLK rising edge
SCLK rise/fall times
DOUT rise/fall times
CS high after SCLK edge
Input sync positive pulse width; pulse sync mode, MSC_CTRL = 101 (binary, see Table
105)
Input sync to data ready valid transition
Direct sync mode, MSC_CTRL = 001 (binary, see Table 105)
Pulse sync mode, MSC_CTRL = 101 (binary, see Table 105)
Data invalid time
Input sync period2
0.1
16
24
200
tSTDR
tNV
t2
Typ
Burst Read Mode
Max
Min1
2
0.1
N/A
Typ
25
50
0
5
N/A means not applicable.
This specification is rounded up from the cycle time that comes from the maximum input clock frequency (2100 Hz).
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
µs
25
12.5
12.5
5
5
0
5
256
256
20
2
1
25
50
5
5
1
Unit
200
25
477
Max
256
256
20
477
12.5
12.5
µs
µs
µs
µs
Timing Diagrams
Figure 2. SPI Timing and Sequence Diagram
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Rev. E | 6 of 41
Data Sheet
ADIS16477
SPECIFICATIONS
Figure 3. Stall Time and Data Rate Timing Diagram
Figure 4. Input Clock Timing Diagram, Pulse Sync Mode, Register MSC_CTRL, Bits[4:2] = 101 (Binary)
Figure 5. Input Clock Timing Diagram, Direct Sync Mode, Register MSC_CTRL, Bits[4:2] = 001 (Binary)
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Rev. E | 7 of 41
Data Sheet
ADIS16477
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 3.
Parameter
Rating
Mechanical Shock Survivability
Any Axis, Unpowered
Any Axis, Powered
VDD to GND
Digital Input Voltage to GND
Digital Output Voltage to GND
Calibration Temperature Range
Operating Temperature Range
Storage Temperature Range1
Barometric Pressure
2000 g
2000 g
−0.3 V to +3.6 V
−0.3 V to VDD + 0.2 V
−0.3 V to VDD + 0.2 V
−40°C to +85°C
−40°C to +105°C
−65°C to +150°C
2 bar
1
Extended exposure to temperatures that are lower than −40°C or higher than
+105°C may adversely affect the accuracy of the factory calibration.
Stresses at or above those listed under Absolute Maximum Ratings
may cause permanent damage to the product. This is a stress
rating only; functional operation of the product at these or any other
conditions above those indicated in the operational section of this
specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability.
Thermal performance is directly linked to printed circuit board
(PCB) design and operating environment. Careful attention to PCB
thermal design is required.
The ADIS16477 is a multichip module that includes many active
components. The values in Table 4 identify the thermal response of
the hottest component inside of the ADIS16477, with respect to the
overall power dissipation of the module. This approach enables a
simple method for predicting the temperature of the hottest junction,
based on either ambient or case temperature.
For example, when the ambient temperature is 70°C, the hottest
junction temperature (TJ) inside of the ADIS16477 is 76.7°C.
TJ = θJA × VDD × IDD + 70°C
TJ = 158.2°C/W × 3.3 V × 0.044 A + 70°C
TJ = 93°C
Table 4. Package Characteristics
Package Type
θJA1
θJC2
Device Weight
ML-44-13
158.2°C/W
106.1°C/W
1.3 g
1
θJA is the natural convection junction to ambient thermal resistance measured
in a one cubic foot sealed enclosure.
2
θJC is the junction to case thermal resistance.
3
Thermal impedance values come from direct observation of the hottest temperature inside of the ADIS16477, when it is attached to an FR4-08 PCB that has
two metal layers and has a thickness of 0.063 inches.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Charged devices and circuit boards can discharge without detection. Although
this product features patented or proprietary protection circuitry,
damage may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to avoid
performance degradation or loss of functionality.
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Rev. E | 8 of 41
Data Sheet
ADIS16477
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 7. Pin Assignments, Package Level View
Figure 6. Pin Assignments, Bottom View
Table 5. Pin Function Descriptions
Pin No.
Mnemonic
Type
Description
A1
A2
A3
A4
A5
A6
A7
A8
B3
B4
B5
B6
C2
C3
C6
C7
D3
D6
E2
E3
E6
E7
F1
F3
F6
F8
G2
G3
G6
G7
H1
H3
H6
H8
J2
J3
J4
J5
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
DNC
GND
VDD
GND
VDD
GND
VDD
GND
GND
GND
RST
GND
GND
GND
CS
DIN
GND
VDD
DOUT
SCLK
GND
GND
SYNC
VDD
VDD
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Not applicable
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Input
Supply
Supply
Supply
Input
Input
Supply
Supply
Output
Input
Supply
Supply
Input
Supply
Supply
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Power Ground
Do Not Connect
Power Ground
Power Supply
Power Ground
Power Supply
Power Ground
Power Supply
Power Ground
Power Ground
Power Ground
Reset
Power Ground
Power Ground
Power Ground
SPI, Chip Select
SPI, Data Input
Power Supply
Power Supply
SPI, Data Output
SPI, Serial Clock
Power Ground
Power Ground
Sync (External Clock)
Power Supply
Power Supply
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Rev. E | 9 of 41
Data Sheet
ADIS16477
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Table 5. Pin Function Descriptions
Pin No.
Mnemonic
Type
Description
J6
J7
K1
K3
K6
K8
DR
GND
GND
GND
VDD
GND
Output
Supply
Supply
Supply
Supply
Supply
Data Ready
Power Ground
Power Ground
Power Ground
Power Supply
Power Ground
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Rev. E | 10 of 41
Data Sheet
ADIS16477
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 8. Gyroscope Allan Deviation, TC = 25°C, ADIS16477-1
Figure 11. Accelerometer Allan Deviation, TC = 25°C
Figure 9. Gyroscope Allan Deviation, TC = 25°C, ADIS16477-2
Figure 12. ADIS16477-1 Gyroscope Sensitivity Error vs. Ambient
Temperature
Figure 10. Gyroscope Allan Deviation, TC = 25°C, ADIS16477-3
Figure 13. ADIS16477-2 Gyroscope Sensitivity Error vs. Ambient
Temperature
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Rev. E | 11 of 41
Data Sheet
ADIS16477
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 14. ADIS16477-3 Gyroscope Sensitivity Error vs. Ambient
Temperature
Figure 17. ADIS16477-3 Gyroscope Bias Error vs. Ambient Temperature
Figure 15. ADIS16477-1 Gyroscope Bias Error vs. Ambient Temperature
Figure 16. ADIS16477-2 Gyroscope Bias Error vs. Ambient Temperature
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Rev. E | 12 of 41
Data Sheet
ADIS16477
THEORY OF OPERATION
INTRODUCTION
Inertial Sensor Calibration
When using the factory default configuration for all user configurable control registers, the ADIS16477 initializes itself and automatically starts a continuous process of sampling, processing, and
loading calibrated sensor data into its output registers at a rate of
2000 SPS.
The inertial sensor calibration function for the gyroscopes and the
accelerometers has two components: factory calibration and user
calibration (see Figure 21).
INERTIAL SENSOR SIGNAL CHAIN
Figure 18 provides the basic signal chain for the inertial sensors in
the ADIS16477. This signal chain produces an update rate of 2000
SPS in the output data registers when it operates in internal clock
mode (default, see Register MSC_CTRL, Bits[4:2] in Table 105).
Figure 18. Signal Processing Diagram, Inertial Sensors
Gyroscope Data Sampling
The three gyroscopes produce angular rate measurements around
three orthogonal axes (x, y, and z). Figure 19 shows the data
sampling plan for each gyroscope when the ADIS16477 operates
in internal clock mode (default, see Register MSC_CTRL, Bits[4:2]
in Table 105). Each gyroscope has an analog-to-digital converter
(ADC) and sample clock (fSG) that drives data sampling at a rate
of 4100 Hz (±5%). The internal processor reads and processes this
data from each gyroscope at a rate of 2000 Hz (fSM).
Figure 19. Gyroscope Data Sampling
Accelerometer Data Sampling
The three accelerometers produce linear acceleration measurements along the same orthogonal axes (x, y, and z) as the
gyroscopes. Figure 20 shows the data sampling plan for each
accelerometer when the ADIS16477 operates in internal clock
mode (default, see Register MSC_CTRL, Bits[4:2] in Table 105).
Figure 20. Accelerometer Data Sampling
External Clock Options
The ADIS16477 provides three different modes of operation that
support the device using an external clock to control the internal
processing rate (fSM in Figure 19 and Figure 20) through the
SYNC pin. The MSC_CTRL register (see Table 105) provides the
configuration options for these external clock modes in Bits[4:2].
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Figure 21. Inertial Sensor Calibration Processing
The factory calibration of the gyroscope applies the following correction formulas to the data of each gyroscope:
ωXC
m11 m12 m13
ωYC = m21 m22 m23 ×
ωZC
m31 m32 m33
l11 l12 l13
aXC
l21 l22 l23 × aYC
l31 l32 l33
ωX
bX
ωY + bY
ωZ
bZ
+
aZC
where:
ωXC, ωYC, and ωZC are the gyroscope outputs (post calibration).
m11, m12, m13, m21, m22, m23, m31, m32, and m33 provide scale and
alignment correction.
ωX, ωY, and ωZ are the gyroscope outputs (precalibration).
bX, bY, and bZ provide bias correction.
l11, l12, l13, l21, l22, l23, l31, l32, and l33 provide linear g correction.
aXC, aYC, and aZC are the accelerometer outputs (post calibration).
All of the correction factors in this relationship come from direct
observation of the response of each gyroscope at multiple temperatures over the calibration temperature range (−40°C ≤ TC ≤
+85°C). These correction factors are stored in the flash memory
bank, but they are not available for observation or configuration.
Register MSC_CTRL, Bit 7 (see Table 105) provides the only user
configuration option for the factory calibration of the gyroscopes: an
on/off control for the linear g compensation. See Figure 44 for more
details on the user calibration options available for the gyroscopes.
The factory calibration of the accelerometer applies the following
correction formulas to the data of each accelerometer:
aXC
m11 m12 m13
aYC = m21 m22 m23 ×
aZC
m31 m32 m33
aX
bX
aY + bY
aZ
ω2XC
0 p12 p13
2
p21 0 p23 × ωYC
2
p31 p32 0
ωZC
bZ
+
where:
aXC, aYC, and aZC are the accelerometer outputs (post calibration).
Rev. E | 13 of 41
Data Sheet
ADIS16477
THEORY OF OPERATION
m11, m12, m13, m21, m22, m23, m31, m32, and m33 provide scale and
alignment correction.
aX, aY, and aZ are the accelerometer outputs (precalibration).
bX, bY, and bZ provide bias correction.
p12, p13, p21, p23, p31 and p32 provide a point of percussion alignment correction (see Figure 47).
ω2XC, ω2YC, and ω2ZC are the square of the gyroscope outputs
(post calibration).
All of the correction factors in this relationship come from direct
observation of the response of each accelerometer at multiple
temperatures, over the calibration temperature range (−40°C ≤ TC
≤ +85°C). These correction factors are stored in the flash memory
bank, but they are not available for observation or configuration.
MSC_CTRL, Bit 6 (see Table 105) provides the only user configuration option for the factory calibration of the accelerometers: an
on/off control for the point of percussion, alignment function. See
Figure 45 for more details on the user calibration options available
for the accelerometers.
Figure 24. Basic Operation of the ADIS16477
SERIAL PERIPHERAL INTERFACE (SPI)
The SPI provides access to the user registers (see Table 8). Figure
25 shows the most common connections between the ADIS16477
and a SPI host device which is often an embedded processor that
has a SPI-compatible interface. In this example, the SPI host uses
an interrupt service routine to collect data every time the data ready
(DR) signal pulses.
Additional information on the ADIS16477 SPI can be found in the
Serial Port Operation section of this data sheet.
Bartlett Window FIR Filter
The Bartlett window finite impulse response (FIR) filter (see Figure
22) contains two averaging filter stages, in a cascade configuration.
The FILT_CTRL register (see Table 101) provides the configuration
controls for this filter.
Figure 25. Electrical Connection Diagram
Figure 22. Bartlett Window FIR Filter Signal Path
Averaging/Decimating Filter
The second digital filter averages multiple samples together to
produce each register update. In this type of filter structure, the
number of samples in the average is equal to the reduction in the
update rate for the output data registers. The DEC_RATE register
(see Table 109) provides the configuration controls for this filter.
Figure 23. Averaging/Decimating Filter Diagram
REGISTER STRUCTURE
All communication between the ADIS16477 and an external processor involves either reading the contents of an output register or
writing configuration/command information to a control register. The
output data registers include the latest sensor data, error flags, and
identification information. The control registers include sample rate,
filtering, calibration, and diagnostic options. Each user accessible
register has two bytes (upper and lower), each of which has its own
unique address. See Table 8 for a detailed list of all user registers,
along with their addresses.
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Table 6. Generic SPI Host Pin Names and Functions
Mnemonic
Function
SS
SCLK
MOSI
MISO
IRQ
Peripheral select
Serial clock
Host output, peripheral input
Host input, peripheral output
Interrupt request
Embedded processors typically use control registers to configure
their serial ports for communicating with SPI peripheral devices
such as the ADIS16477. Table 7 provides a list of settings that
describe the SPI protocol of the ADIS16477. The initialization
routine of the host processor typically establishes these settings
using firmware commands to write them into the control registers.
Table 7. Generic Host Processor SPI Settings
Processor Setting
Description
Host
Maximum SCLK
Frequency1
SPI Mode 3
MSB First Mode
16-Bit Mode
ADIS16477 operates as peripheral
Maximum serial clock rate
1
CPOL = 1 (polarity), CPHA = 1 (phase)
Bit sequence, see Figure 30 for coding
Shift register and data length
See Table 2 for the maximum SCLK frequency.
Rev. E | 14 of 41
Data Sheet
ADIS16477
THEORY OF OPERATION
DATA READY (DR)
The factory default configuration provides users with a DR signal on
the DR pin (see Table 5), which pulses when the output data registers are updating. Connect the DR pin to a pin on the embedded
processor, which triggers data collection, on the second edge of this
pulse. The MSC_CTRL register, Bit 0 (see Table 105), controls the
polarity of this signal. In Figure 26, Register MSC_CTRL, Bit 0 = 1,
which means that data collection must start on the rising edges of
the DR pulses.
Figure 28. Data Ready Response During Reset (Register GLOB_CMD, Bit 7 =
1) Recovery
Figure 26. Data Ready When Register MSC_CTRL, Bit 0 = 1 (Default)
During the start-up and reset recovery processes, the DR signal
may exhibit some transient behavior before data production begins.
Figure 27 shows an example of the DR behavior during startup,
and Figure 28 and Figure 29 provide examples of the DR behavior
during recovery from reset commands.
Figure 29. Data Ready Response During Reset (RST = 0) Recovery
Figure 27. Data Ready Response During Startup
Figure 30. SPI Communication Bit Sequence
Figure 31. Burst Read Sequence
Figure 32. SPI Signal Pattern Showing a Read of the PROD_ID Register
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Rev. E | 15 of 41
Data Sheet
ADIS16477
THEORY OF OPERATION
READING SENSOR DATA
Reading a single register requires two 16-bit cycles on the SPI:
one to request the contents of a register and another to receive
those contents. The 16-bit command code (see Figure 30) for a
read request on the SPI has three parts: the read bit (R/W = 0),
either address of the register, [A6:A0], and eight don’t care bits,
[DC7:DC0]. Figure 33 shows an example that includes two register
reads in succession. This example starts with DIN = 0x0C00, to request the contents of the Z_GYRO_LOW register, and follows with
0x0E00, to request the contents of the Z_GYRO_OUT register. The
sequence in Figure 33 also shows full duplex mode of operation,
which means that the ADIS16477 can receive requests on DIN
while also transmitting data out on DOUT within the same 16-bit
SPI cycle.
Figure 33. SPI Read Example
Figure 32 provides an example of the four SPI signals when reading the PROD_ID register (see Table 121) in a repeating pattern.
This pattern can be helpful when troubleshooting the SPI interface
setup and communications because the signals are the same for
each 16-bit sequence, except during the first cycle.
Burst Read Function
The burst read function provides a way to read a batch of output
data registers, using a continuous stream of bits, at a rate of up to
1 MHz (SCLK). This method does not require a stall time between
each 16-bit segment (see Figure 3). As shown in Figure 31, start
this mode by setting DIN = 0x6800, and then read each of the
registers in the sequence out of DOUT while keeping CS low for the
entire sequence.
The sequence of registers (and checksum value) in the burst
read response depends on which sample clock mode that the
ADIS16477 is operating in Register MSC_CTRL, Bits[4:2] (see Table 105). In all clock modes, except when operating in scaled
sync mode (Register MSC_CTRL, Bits[4:2] = 010), the burst read
response ends with the DATA_CNTR, Bits[7:0] register contents,
followed by the checksum value. Checksum value computations for
the various burst modes are described in the following sections.
Scaled sync mode (Register MSC_CTRL, Bits[4:2] = 010) uses
an identical format to that described in the previous paragraph,
except that the DATA_CNTR, Bits[7:0] register is replaced by
the TIME_STAMP, Bits[7:0] register. In scaled sync mode, the
TIME_STAMP, Bits[7:0] register always replaces the DATA_CNTR,
Bits[7:0] register for all combinations of the BURST_SEL and
BURST32 settings. Refer to the Miscellaneous Control Register
(MSC_CTRL) section for more details.
Note that the 32-bit burst modes and BURST_SEL function are
only available in Firmware Version 1.34 and newer. Older firmware
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versions only have 16-bit burst transfer with BURST_SEL = 0. See
the FIRM_REV, Bits[7:0] for the firmware revision.
16-Bit Burst Mode with BURST_SEL = 0
In 16-bit burst mode with BURST_SEL = 0, a burst contains calibrated gyroscope and accelerometer data in 16-bit format. This
mode is particularly appropriate for cases where there is no decimation nor filtering. Not only is the sample rate high (~2 kSPS), the
lower 16 bits are not used unless the user is averaging or filtering.
Note that when using this mode, the linear g compensation must be
disabled because the linear g compensation relies on 32-bit data to
perform optimally.
The sequence of registers (and checksum value) in the burst
read includes the following registers and value: DIAG_STAT,
X_GYRO_OUT, Y_GYRO_OUT, Z_GYRO_OUT, X_ACCL_ OUT,
Y_ACCL_OUT, Z_ACCL_OUT, TEMP_OUT, DATA_ CNTR, and the
checksum value.
In these cases, use the following formula to verify the 16-bit checksum value, treating each byte in the formula as an independent,
unsigned, 8-bit number:
Checksum = DIAG_STAT, Bits[15:8] + DIAG_STAT, Bits[7:0]
+ X_GYRO_OUT, Bits[15:8] + X_GYRO_OUT, Bits[7:0] +
Y_GYRO_OUT, Bits[15:8] + Y_GYRO_OUT, Bits[7:0] + Z_GYRO_OUT, Bits[15:8] + Z_GYRO_OUT, Bits[7:0] + X_ACCL_OUT,
Bits[15:8] + X_ACCL_OUT, Bits[7:0] + Y_ACCL_OUT, Bits[15:8]
+ Y_ACCL_OUT, Bits[7:0] + Z_ACCL_OUT, Bits[15:8] +
Z_ACCL_OUT, Bits[7:0] + TEMP_OUT, Bits[15:8] + TEMP_OUT,
Bits[7:0] + DATA_CNTR, Bits[15:8] + DATA_CNTR, Bits[7:0]
16-Bit Burst Mode with BURST_SEL = 1
In 16-bit burst mode with BURST_SEL = 1, a burst contains calibrated delta angle and delta velocity data in 16-bit format. This
mode is particularly appropriate for cases where there is no decimation nor filtering. Not only is the sample rate high (~2 kSPS), the
lower 16 bits are not used.
The sequence of registers (and checksum value) in the burst read
includes the following registers and value: DIAG_STAT, X_DELTANG_OUT, Y_DELTANG_OUT, Z_DELTANG_OUT, X_DELTVEL_OUT, Y_DELTVEL_OUT, Z_DELTVEL_OUT, TEMP_OUT, DATA_ CNTR, and the checksum value.
In these cases, use the following formula to verify the 16-bit checksum value, treating each byte in the formula as an independent,
unsigned, 8-bit number:
Checksum = DIAG_STAT, Bits[15:8] + DIAG_STAT, Bits[7:0] +
X_DELTANG_OUT, Bits[15:8] + X_DELTANG_OUT, Bits[7:0] +
Y_DELTANG_OUT, Bits[15:8] + Y_DELTANG_OUT, Bits[7:0] +
Z_DELTANG_OUT, Bits[15:8] + Z_DELTANG_OUT, Bits[7:0] +
X_DELTVEL_OUT, Bits[15:8] + X_DELTVEL_OUT, Bits[7:0] +
Y_DELTVEL_OUT, Bits[15:8] + Y_DELTVEL_OUT, Bits[7:0] +
Z_DELTVEL_OUT, Bits[15:8] + Z_DELTVEL_OUT, Bits[7:0] +
Rev. E | 16 of 41
Data Sheet
ADIS16477
THEORY OF OPERATION
TEMP_OUT, Bits[15:8] + TEMP_OUT, Bits[7:0] + DATA_CNTR,
Bits[15:8] + DATA_CNTR, Bits[7:0]
32-Bit Burst Mode with BURST_SEL = 0
In 32-bit burst mode with BURST_SEL = 0, a burst contains calibrated gyroscope and accelerometer data in 32-bit format. This
mode is appropriate for cases where there is averaging (decimation) and/or low-pass filtering of the data. This mode is also the
recommended burst mode if the application depends on optimal
performance of the linear g compensation feature.
The sequence of registers (and checksum value) in the burst
read includes the following registers and value: DIAG_STAT,
X_GYRO_LOW, X_GYRO_OUT, Y_GYRO_LOW, Y_GYRO_OUT,
Z_GYRO_LOW, Z_GYRO_OUT, X_ACCL_LOW, X_ACCL_OUT,
Y_ACCL_LOW, Y_ACCL_OUT, Z_ACCL_LOW, Z_ACCL_OUT,
TEMP_OUT, DATA_ CNTR, and the checksum value. In these cases, use the following formula to verify the 16-bit checksum value,
treating each byte in the formula as an independent, unsigned, 8-bit
number:
Checksum = DIAG_STAT, Bits[15:8] + DIAG_STAT, Bits[7:0]
+ X_GYRO_LOW, Bits[15:8] + X_GYRO_LOW, Bits[7:0] +
X_GYRO_OUT, Bits[15:8] + X_GYRO_OUT, Bits[7:0] + Y_GYRO_LOW, Bits[15:8] + Y_GYRO_LOW, Bits[7:0] + Y_GYRO_OUT,
Bits[15:8] + Y_GYRO_OUT, Bits[7:0] + Z_GYRO_LOW, Bits[15:8]
+ Z_GYRO_LOW, Bits[7:0] + Z_GYRO_OUT, Bits[15:8] + Z_GYRO_OUT, Bits[7:0] + X_ACCL_LOW, Bits[15:8] + X_ACCL_LOW,
Bits[7:0] + X_ACCL_OUT, Bits[15:8] + X_ACCL_OUT, Bits[7:0]
+ Y_ACCL_LOW, Bits[15:8] + Y_ACCL_LOW, Bits[7:0]
+ Y_ACCL_OUT, Bits[15:8] + Y_ACCL_OUT, Bits[7:0] +
Z_ACCL_LOW, Bits[15:8] + Z_ACCL_LOW, Bits[7:0] +
Z_ACCL_OUT, Bits[15:8] + Z_ACCL_OUT, Bits[7:0] + TEMP_OUT,
Bits[15:8] + TEMP_OUT, Bits[7:0] + DATA_CNTR, Bits[15:8] +
DATA_CNTR, Bits[7:0]
32-Bit Burst Mode with BURST_SEL = 1
In 32-bit burst mode with BURST_SEL = 1, a burst contains calibrated delta angle and delta velocity data in 32-bit format. This
mode is appropriate for cases where there is averaging (decimation) and/or low-pass filtering of the data.
The sequence of registers (and checksum value) in the burst read
includes the following registers and value: DIAG_STAT, X_DELTANG_LOW, X_DELTANG_OUT, Y_DELTANG_LOW, Y_DELTANG_OUT, Z_DELTANG_LOW, Z_DELTANG_OUT, X_DELTVEL_LOW, X_DELTVEL_OUT, Y_DELTVEL_LOW, Y_DELTVEL_OUT, Z_DELTVEL_LOW, Z_DELTVEL_OUT, TEMP_OUT,
DATA_ CNTR, and the checksum value. In these cases, use the
following formula to verify the 16-bit checksum value, treating each
byte in the formula as an independent, unsigned, 8-bit number:
Y_DELTANG_LOW, Bits[15:8] + Y_DELTANG_LOW, Bits[7:0] +
Y_DELTANG_OUT, Bits[15:8] + Y_DELTANG_OUT, Bits[7:0] +
Z_DELTANG_LOW, Bits[15:8] + Z_DELTANG_LOW, Bits[7:0] +
Z_DELTANG_OUT, Bits[15:8] + Z_DELTANG_OUT, Bits[7:0] +
X_DELTVEL_LOW, Bits[15:8] + X_DELTVEL_LOW, Bits[7:0] +
X_DELTVEL_OUT, Bits[15:8] + X_DELTVEL_OUT, Bits[7:0] +
Y_DELTVEL_LOW, Bits[15:8] + Y_DELTVEL_LOW, Bits[7:0] +
Y_DELTVEL_OUT, Bits[15:8] + Y_DELTVEL_OUT, Bits[7:0] +
Z_DELTVEL_LOW, Bits[15:8] + Z_DELTVEL_LOW, Bits[7:0] +
Z_DELTVEL_OUT, Bits[15:8] + Z_DELTVEL_OUT, Bits[7:0] +
TEMP_OUT, Bits[15:8] + TEMP_OUT, Bits[7:0] + DATA_CNTR,
Bits[15:8] + DATA_CNTR, Bits[7:0]
DEVICE CONFIGURATION
Each configuration register contains 16 bits (two bytes). Bits[7:0]
contain the low byte, and Bits[15:8] contain the high byte of each
register. Each byte has its own unique address in the user register
map (see Table 8). Updating the contents of a register requires
writing to both of its bytes in the following sequence: low byte first,
high byte second. There are three parts to coding a SPI command
(see Figure 30) that write a new byte of data to a register: the write
bit (R/W = 1), the address of the byte, [A6:A0], and the new data
for that location, [DC7:DC0]. Figure 34 shows a coding example
for writing 0x0004 to the FILT_CTRL register (see Table 101). In
Figure 34, the 0xDC04 command writes 0x04 to Address 0x5C
(lower byte) and the 0xDD00 command writes 0x00 to Address
0x5D (upper byte).
Figure 34. SPI Sequence for Writing 0x0004 to FILT_CTRL
Memory Structure
Figure 35 provides a functional diagram for the memory structure
of the ADIS16477. The flash memory bank contains the operational
code, unit specific calibration coefficients and user configuration
settings. During initialization (power application or reset recover),
this information loads from the flash memory into the static random
access memory (SRAM), which supports all normal operation,
including register access through the SPI port. Writing to a configuration register using the SPI updates the SRAM location of
the register but does not automatically update its settings in the
flash memory bank. The manual flash memory update command
(Register GLOB_CMD, Bit 3, see Table 113) provides a convenient
method for saving all of these settings to the flash memory bank at
one time. A yes in the flash backup column of Table 8 identifies the
registers that have storage support in the flash memory bank.
Checksum = DIAG_STAT, Bits[15:8] + DIAG_STAT, Bits[7:0] +
X_DELTANG_LOW, Bits[15:8] + X_DELTANG_LOW, Bits[7:0] +
X_DELTANG_OUT, Bits[15:8] + X_DELTANG_OUT, Bits[7:0] +
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Rev. E | 17 of 41
Data Sheet
ADIS16477
THEORY OF OPERATION
Figure 35. SRAM and Flash Memory Diagram
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Rev. E | 18 of 41
Data Sheet
ADIS16477
USER REGISTER MEMORY MAP
Table 8. User Register Memory Map (N/A Means Not Applicable)
Name
R/W
Flash Backup
Address
Default
Register Description
Reserved
DIAG_STAT
X_GYRO_LOW
X_GYRO_OUT
Y_GYRO_LOW
Y_GYRO_OUT
Z_GYRO_LOW
Z_GYRO_OUT
X_ACCL_LOW
X_ACCL_OUT
Y_ACCL_LOW
Y_ACCL_OUT
Z_ACCL_LOW
Z_ACCL_OUT
TEMP_OUT
TIME_STAMP
Reserved
DATA_CNTR
X_DELTANG_LOW
X_DELTANG_OUT
Y_DELTANG_LOW
Y_DELTANG_OUT
Z_DELTANG_LOW
Z_DELTANG_OUT
X_DELTVEL_LOW
X_DELTVEL_OUT
Y_DELTVEL_LOW
Y_DELTVEL_OUT
Z_DELTVEL_LOW
Z_DELTVEL_OUT
Reserved
XG_BIAS_LOW
XG_BIAS_HIGH
YG_BIAS_LOW
YG_BIAS_HIGH
ZG_BIAS_LOW
ZG_BIAS_HIGH
XA_BIAS_LOW
XA_BIAS_HIGH
YA_BIAS_LOW
YA_BIAS_HIGH
ZA_BIAS_LOW
ZA_BIAS_HIGH
Reserved
FILT_CTRL
RANG_MDL
MSC_CTRL
UP_SCALE
DEC_RATE
N/A
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
N/A
R
R
R
R
R
R
R
R
R
R
R
R
R
N/A
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
N/A
R/W
R
R/W
R/W
R/W
N/A
No
No
No
No
No
No
No
No
No
No
No
No
No
No
No
N/A
No
No
No
No
No
No
No
No
No
No
No
No
No
N/A
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
N/A
Yes
No
Yes
Yes
Yes
0x00, 0x01
0x02, 0x03
0x04, 0x05
0x06, 0x07
0x08, 0x09
0x0A, 0x0B
0x0C, 0x0D
0x0E, 0x0F
0x10, 0x11
0x12, 0x13
0x14, 0x15
0x16, 0x17
0x18, 0x19
0x1A, 0x1B
0x1C, 0x1D
0x1E, 0x1F
0x20, 0x21
0x22, 0x23
0x24, 0x25
0x26, 0x27
0x28, 0x29
0x2A, 0x2B
0x2C, 0x2D
0x2E, 0x2F
0x30, 0x31
0x32, 0x33
0x34, 0x35
0x36, 0x37
0x38, 0x39
0x3A, 0x3B
0x3C to 0x3F
0x40, 0x41
0x42, 0x43
0x44, 0x45
0x46, 0x47
0x48, 0x49
0x4A, 0x4B
0x4C, 0x4D
0x4E, 0x4F
0x50, 0x51
0x52, 0x53
0x54, 0x55
0x56, 0x57
0x58 to 0x5B
0x5C, 0x5D
0x5E, 0x5F
0x60, 0x61
0x62, 0x63
0x64, 0x65
N/A
0x0000
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
N/A
0x0000
N/A1
0x00C1
0x07D0
0x0000
Reserved
Output, system error flags
Output, x-axis gyroscope, low word
Output, x-axis gyroscope, high word
Output, y-axis gyroscope, low word
Output, y-axis gyroscope, high word
Output, z-axis gyroscope, low word
Output, z-axis gyroscope, high word
Output, x-axis accelerometer, low word
Output, x-axis accelerometer, high word
Output, y-axis accelerometer, low word
Output, y-axis accelerometer, high word
Output, z-axis accelerometer, low word
Output, z-axis accelerometer, high word
Output, temperature
Output, time stamp
Reserved
New data counter
Output, x-axis delta angle, low word
Output, x-axis delta angle, high word
Output, y-axis delta angle, low word
Output, y-axis delta angle, high word
Output, z-axis delta angle, low word
Output, z-axis delta angle, high word
Output, x-axis delta velocity, low word
Output, x-axis delta velocity, high word
Output, y-axis delta velocity, low word
Output, y-axis delta velocity, high word
Output, z-axis delta velocity, low word
Output, z-axis delta velocity, high word
Reserved
Calibration, offset, gyroscope, x-axis, low word
Calibration, offset, gyroscope, x-axis, high word
Calibration, offset, gyroscope, y-axis, low word
Calibration, offset, gyroscope, y-axis, high word
Calibration, offset, gyroscope, z-axis, low word
Calibration, offset, gyroscope, z-axis, high word
Calibration, offset, accelerometer, x-axis, low word
Calibration, offset, accelerometer, x-axis, high word
Calibration, offset, accelerometer, y-axis, low word
Calibration, offset, accelerometer, y-axis, high word
Calibration, offset, accelerometer, z-axis, low word
Calibration, offset, accelerometer, z-axis, high word
Reserved
Control, Bartlett window FIR filter
Measurement range (model specific) identifier
Control, input/output and other miscellaneous options
Control, scale factor for input clock, pulse per second (PPS) mode
Control, decimation filter (output data rate)
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Rev. E | 19 of 41
Data Sheet
ADIS16477
USER REGISTER MEMORY MAP
Table 8. User Register Memory Map (N/A Means Not Applicable)
Name
R/W
Flash Backup
Address
Default
Register Description
NULL_CNFG
GLOB_CMD
Reserved
FIRM_REV
FIRM_DM
FIRM_Y
PROD_ID
SERIAL_NUM
USER_SCR_1
USER_SCR_2
USER_SCR_3
FLSHCNT_LOW
FLSHCNT_HIGH
R/W
W
N/A
R
R
R
R
R
R/W
R/W
R/W
R
R
Yes
No
N/A
No
No
No
No
No
Yes
Yes
Yes
No
No
0x66, 0x67
0x68, 0x69
0x6A to 0x6B
0x6C, 0x6D
0x6E, 0x6F
0x70, 0x71
0x72, 0x73
0x74, 0x75
0x76, 0x77
0x78, 0x79
0x7A, 0x7B
0x7C, 0x7D
0x7E, 0x7E
0x070A
N/A
N/A
N/A
N/A
N/A
0x405D
N/A
N/A
N/A
N/A
N/A
N/A
Control, bias estimation period
Control, global commands
Reserved
Identification, firmware revision
Identification, date code, day and month
Identification, date code, year
Identification, device number
Identification, serial number
User Scratch Register 1
User Scratch Register 2
User Scratch Register 3
Output, flash memory write cycle counter, lower word
Output, flash memory write cycle counter, upper word
1
See Table 102 for the default value in this register, which is model specific.
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Rev. E | 20 of 41
Data Sheet
ADIS16477
USER REGISTER DEFINITIONS
STATUS/ERROR FLAG INDICATORS
(DIAG_STAT)
Table 9. DIAG_STAT Register Definition
Addresses
Default
Access
Flash Backup
0x02, 0x03
0x0000
R
No
Table 10. DIAG_STAT Bit Assignments
Bits
Description
[15:8]
7
Reserved.
Clock error. A 1 indicates that the internal data sampling clock (fSM,
see Figure 19 and Figure 20) does not synchronize with the external
clock, which only applies when using scaled sync mode (Register
MSC_CTRL, Bits[4:2] = 010, see Table 105). When this error occurs,
adjust the frequency of the clock signal on the SYNC pin to operate
within the appropriate range.
Memory failure. A 1 indicates a failure in the flash memory test
(Register GLOB_CMD, Bit 4, see Table 113), which involves a
comparison between a cyclic redundancy check (CRC) calculation
of the present flash memory and a CRC calculation from the same
memory locations at the time of initial programming (during the
production process). If this error occurs, repeat the same test. If this
error persists, replace the ADIS16477 device.
Sensor failure. A 1 indicates failure of at least one sensor, at the
conclusion of the self test (Register GLOB_CMD, Bit 2, see Table 113).
If this error occurs, repeat the same test. If this error persists, replace
the ADIS16477. Motion, during the execution of this test, can cause a
false failure.
Standby mode. A 1 indicates that the voltage across VDD and GND
is
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