EVAL-ADE9000EBZ User Guide
UG-1082
One Technology Way • P.O. Box 9106 • Norwood, MA 02062-9106, U.S.A. • Tel: 781.329.4700 • Fax: 781.461.3113 • www.analog.com
Evaluating the ADE9000 High Performance, Multiphase Energy, Power Quality
Monitoring IC
FEATURES
SOFTWARE NEEDED
Full featured evaluation board for the ADE9000
PC control in conjunction with the EVAL-SDP-CB1Z system
demonstration platform (SDP)
PC software for control and data analysis (time and
frequency domain)
Standalone capability
EVAL-ADE9000EBZ evaluation software
EVALUATION KIT CONTENTS
The EVAL-ADE9000EBZ evaluation board allows the performance
of the ADE9000 energy monitoring IC to be evaluated in a context
very similar to an actual power quality monitor. The kit requires
purchasing a second board: the controller board for the system
demonstration platform (EVAL-SDP-CB1Z) and current sensors.
The ADE9000 evaluation kit includes evaluation software, written
in LabVIEW®, which provides access to the registers and features of
the device using a PC interface.
EVAL-ADE9000EBZ evaluation board
ADDITIONAL EQUIPMENT NEEDED
EVAL-SDP-CB1Z (must be ordered separately)
Includes a mini USB cable
Current transformers or Rogowski coils for 3-phase current
channels and the neutral channel
Precision current and voltage signal source
PC running Windows XP SP2, Windows Vista, or Windows 7
with USB 2.0 port
ONLINE RESOURCES
Design and integration files
Schematics, layout files, and bill of materials
GENERAL DESCRIPTION
Consult the ADE9000 data sheet in conjunction with this user
guide when using the evaluation board.
DOCUMENTS NEEDED
ADE9000 data sheet
EVAL-ADE9000EBZ user guide
15326-001
TYPICAL EVALUATION BOARD SETUP
Figure 1. EVAL-ADE9000EBZ (Left) Connected to EVAL-SDP-CB1Z SDP Interface Board (Right)
PLEASE SEE THE LAST PAGE FOR AN IMPORTANT
WARNING AND LEGAL TERMS AND CONDITIONS.
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EVAL-ADE9000EBZ User Guide
TABLE OF CONTENTS
Features .............................................................................................. 1
Using the Evaluation Board with Another Microcontroller......6
Evaluation Kit Contents ................................................................... 1
Evaluation Board Software ...............................................................7
Additional Equipment Needed ....................................................... 1
Installing the Drivers ....................................................................7
Documents Needed .......................................................................... 1
Installing and Uninstalling the EVAL-ADE9000EBZ
Software ..........................................................................................7
Software Needed ............................................................................... 1
Online Resources .............................................................................. 1
Main Window ................................................................................7
General Description ......................................................................... 1
Evaluation Software Functions ........................................................9
Typical Evaluation Board Setup ...................................................... 1
Read/Write Registers Option .......................................................9
Revision History ............................................................................... 2
Evaluation Kit Connection Diagram ............................................. 3
Evaluation Board Hardware ............................................................ 4
Overview........................................................................................ 4
Powering Up the Evaluation Boards .......................................... 4
Powers and Energies .................................................................. 13
RMS Window .............................................................................. 16
Waveform Buffer Window ........................................................ 17
Angle Window ............................................................................ 18
Quick Startup Window .............................................................. 19
Analog Inputs ................................................................................ 4
Interrupts Window..................................................................... 20
Current Sense Inputs: IAP, IAN, IBP, IBN, ICP, ICN, INP, and
INN Test Pins ................................................................................ 4
Power Quality Window ............................................................. 21
Troubleshooting .............................................................................. 23
Using Current Sense Transformers ............................................ 4
Evaluation Board Schematics and Artwork ................................ 24
Using Rogowski Coils .................................................................. 5
Ordering Information .................................................................... 29
Phase Voltage Sense Inputs: VAP and VAN, VBP and VBN,
and VCP and VCN Test Pins ...................................................... 5
Bill of Materials ........................................................................... 29
Setting Up the Evaluation Board as an Energy Meter ............. 6
REVISION HISTORY
1/2017—Revision 0: Initial Version
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EVALUATION BOARD CONNECTION DIAGRAM
USB
CONNECTOR
SDP-B BOARD
CON A
ISOLATED SIGNALS
P2
P9
P7
NONISOLATED SIGNALS
DATA AND POWER ISOLATION
EXTERNAL POWER SUPPLY
INTERFACE CIRCUITRY
BARREL
CONNECTOR
RESET
IAP
AGND
IAN
FILTER
NETWORK
IBP
AGND
IBN
FILTER
NETWORK
ICP
AGND
ICN
FILTER
NETWORK
SPI, CFx, IRQx,
RESET, AND
PMx SIGNALS
9V
ADAPTER
VDD
AGND EXT_5V
ADE9000
ATTENUATION
NETWORK
FILTER
NETWORK
VAP VBP VCP NEUTRAL
Figure 2. Evaluation Board Connection Diagram
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EVAL-ADE9000EBZ
EVALUATION BOARD
INP
AGND
INN
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EVAL-ADE9000EBZ User Guide
EVALUATION BOARD HARDWARE
OVERVIEW
IAP
The EVAL-ADE9000EBZ and the SDP-B (also referred to as the
EVAL-SDP-CB1Z or the Blackfin® SDP board) boards are both
required to evaluate the ADE9000.
0Ω
C3A
0.022µF
0.022µF
R6A
1kΩ
IAN
15326-003
1500Ω
IAP
C4A
R4A
0.022µF
A
C
C
DNI
A
A
C
E2A
The EVAL-ADE9000EBZ board is connected to the SDP-B board
using the 120-pin connector, P9, on the EVAL-ADE9000EBZ
evaluation board. The SDP-B board consists of an ADSP-BF527
microcontroller that handles all the communications from the
PC to the ADE9000 device that populates the evaluation board.
0.022µF
1kΩ
C1A
R5A
0Ω
C2A
R3A
DNI
A
1500Ω
When ordering the EVAL-ADE9000EBZ evaluation board,
order the EVAL-SDP-CB1Z; the evaluation kit and the SDP-B
board are purchased and packaged separately, but must be used
together.
C
E1A
IAN
Figure 3. Phase A Current Input Structure on the Evaluation Board
POWERING UP THE EVALUATION BOARDS
USING CURRENT SENSE TRANSFORMERS
The ADE9000 can be powered through the USB of the SDP-B
board or an external power supply.
Figure 4 shows an example of a current transformer sensor
configuration. When using current sense transformers, populate
the R1A and R2A burden resistors according to the full-scale
current and the current transformer (CT) turns ratio of the
application. The CT turns ratio and the burden resistor values must
be chosen such that the IAP pin to AGND pin and IAN pin to
AGND pin potentials do not exceed ±0.5 V peak. The C1A and
C2A capacitors are not populated when the current transformer is
used. An example burden resistor calculation, where the maximum
expected current at current transformer primary is 50 A rms, the
CT turns ratio is 3000:1, and the secondary current at 50 A is as
follows,
Power the ADE9000 externally by connecting a 3.3 V supply to
the VDD test point, or a 5 V to 16 V dc supply to the EXT_5V test
point or barrel jack. When using an external supply, connect Pin 1
and Pin 2 at J3. Connect Pin 2 and Pin 3 to power the ADE9000
with internal isolated power from the SDP-B board.
ANALOG INPUTS
Current and voltage signals are connected at the test pins placed
on the evaluation board. All analog input signals are filtered using
the on-board antialiasing filters before the signals are connected
to the ADE9000. The components used on the board are the
recommended values to be used with the ADE9000.
CURRENT SENSE INPUTS: IAP, IAN, IBP, IBN, ICP,
ICN, INP, AND INN TEST PINS
Figure 3 shows the structure used for the Phase A current
channel in the evaluation board. The same signal path is used
for the other current channels. Therefore, the explanation in this
section applies to other current channels on the evaluation
board, such as Phase B, Phase C, and the neutral phase.
E1A and E2A are ferrite beads that filter any high frequency noise
present on the wires. Immediately following the ferrite beads,
there are four protection diodes per current channel used for
overcurrent protection. The antialiasing filter network appears
after the protection network.
I SECONDARY =
50
= 16.66 mA
3000
To allow headroom, the input signal into the current channel
analog-to-digital converter (ADC) at maximum current is set at
half of full scale. Because the full-scale differential input is
±0.707 V rms, the total burden resistor, RB, can be calculated as
0.707
1
= 21.2 Ω
RB =
×
2
16.66 mA
Because the total burden resistor is split to have a differential
configuration,
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R1A = R2A =
RB
21.2
=
= 10.6 Ω
2
2
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PHASE VOLTAGE SENSE INPUTS: VAP AND VAN,
VBP AND VBN, AND VCP AND VCN TEST PINS
IAP
VAP
E3AP
R7A
R9A
R9A
E1A
VAN
VAN
0.022µF
0.022µF
Figure 6. Phase A Voltage Input Structure on the Evaluation Board
IAN
IAN
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1kΩ
C3A
R6A
C4A
0.022µF
0.022µF
C
100Ω
IAP
1kΩ
C1A
100Ω
R4A
1500Ω
R5A
C2A
C
C
A
A
C
E2A
A
ROGOWSKI
COIL
A
R3A
1500Ω
VAP
Figure 5. Example of a Rogowski Coil Connection
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IAP
1500Ω
R8A
330kΩ 330kΩ 330kΩ
0.022µF
PHASE A
0.022µF
Figure 5 shows an example of a configuration using a Rogowski
coil current sensor. The R1A and R2A burden resistors are not
used in this configuration, and are therefore removed from the
board. Because Rogowski coil sensors have a gain that increases
with frequency (20 dB/decade), the high frequency components
of the current signal are amplified by a larger factor. Therefore,
two stages of resistor capacitor (RC) filtering are required to
attenuate the high frequency components and to avoid aliasing.
The R3A and R4A resistors must be 100 Ω and are used in
conjunction with the 22 nF C1A and C2A capacitors to form a
low-pass filter with a cutoff frequency of 72 kHz. This first stage
is followed by the 1 kΩ/22 nF RC filter combination that provides a
cutoff frequency of 7.2 kHz. The Rogowski coil must be chosen
such that the IAP to AGND and IAN to AGND potentials do not
exceed ±0.5 V peak.
C5A
USING ROGOWSKI COILS
C6A
IAN
Figure 4. Example of a Current Transformer Connection
1kΩ
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IAN
1kΩ
1kΩ
R11A
R6A
0Ω
E3AP is a ferrite bead that filters any high frequency noise present
on the wires. There are three 330 kΩ resistors connected in series,
forming an attenuation network with a 1 kΩ resistor, R11A. This
setup provides an attenuation ratio of 990:1. The R11A and C5A
RC combination and the R10A and C6A RC combination have the
same cutoff frequency as that of the RC filters used on the current
channels. This matching is essential to avoid large phase errors
between the voltage and current signals. If a different attenuation
ratio is preferred, replace the R7A, R8A, and R9A resistors with
alternate resistors. The resistors must be chosen such that the
maximum signal at the VAP pin is ±0.5 V peak with respect to
the AGND pin. The Phase A line is connected to the VAP test
point and the neutral line (in the case of the 3-phase, 4-wire wye
configuration) is connected to the NEUTRAL test point. The
NEUTRAL test point is tied to the AGND potential of the
ADE9000.
R10A
R4A
1500Ω
Figure 6 shows the Phase A voltage channel signal path on the
evaluation board. The same signal path is also replicated on the
Phase B and Phase C channels; therefore, the description in this
section applies to the Phase B and Phase C channels.
IAP
0.022µF
1kΩ
0.022µF
R5A
0Ω
C3A
R3A
C4A
A
R1A
C
C
C
R2A
A
E2A
C
CT
A
1500Ω
A
E1A
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EVAL-ADE9000EBZ User Guide
SETTING UP THE EVALUATION BOARD AS AN
ENERGY METER
PHASE A
PHASE B
Figure 7 shows a typical setup for the EVAL-ADE9000EBZ
evaluation board. In this example, an energy meter for a
3-phase, 4-wire, wye distribution system is shown. Current
transformers sense the phase currents and are connected as
shown in Figure 7. The line voltages are connected directly to
the board as shown.
EVALUATION BOARD
TEST POINTS
PHASE C
ICP
ICN
IAP
IAN
VCP
SOURCE
PHASE B
EVALUATION BOARD
TEST POINTS
VAP
LOAD
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PHASE C
IBN
ICP
Figure 8. Typical Setup for the EVAL-ADE9000EBZ for a 3-Phase,
3-Wire, Delta Distribution System
ICN
IAP
USING THE EVALUATION BOARD WITH ANOTHER
MICROCONTROLLER
IAN
VBP
VCP
VAP
LOAD
LOAD
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NEUTRAL
LOAD
NEUTRAL
IBP
Figure 7. Typical Setup for the EVAL-ADE9000EBZ for 3-Phase,
4-Wire, Wye Distribution System
Figure 8 shows a typical setup for the EVAL-ADE9000EBZ
evaluation board as an energy meter for a 3-phase, 3-wire, delta
distribution system. The Phase B voltage is considered a
reference and therefore is tied to the NEUTRAL test point on
the evaluation board.
It is possible to manage the ADE9000 evaluation board with a
different microcontroller mounted on another board. The
evaluation board can be connected to this second board through
the P2 connector. The SDP-B board in this case is unused and not
connected. If nonisolated signals are to be used with the external
microcontroller, the P7 connector can be used. In this case, the U7,
U8, U10, and U11 isolators must be removed from the EVALADE9000EBZ evaluation board. Note that the P2 and P9
connectors have isolated signals, whereas the P7 connector is
nonisolated. It is necessary to have isolation on the host side if
signals from the P7 connector are used.
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EVALUATION BOARD SOFTWARE
The EVAL-ADE9000EBZ is supported by Windows®-based
software that allows the user to access all the functionality of
the ADE9000. The software communicates with the SDP-B
board using the USB. The SDP-B microcontroller communicates
with the ADE9000 placed on the evaluation board to process
the requests sent from the PC.
Both the EVAL-ADE9000EBZ evaluation software program and
the run-time engine are uninstalled using the Add/Remove
Programs option in the Control Panel.
Before installing a new version of the EVAL-ADE9000EBZ
evaluation software, use the following procedure:
INSTALLING THE DRIVERS
1.
2.
Make sure to have administrator privileges to install and run
the evaluation software. Disconnect the SDP-B board.
3.
1.
MAIN WINDOW
2.
Install SDPDriversNET.exe located in the SDP Drivers\
folder. This installs the SDP drivers and the .NET framework
required to install LabVIEW run-time engine. .NET 3.5 or
higher is required to install LabVIEW run-time engine.
Connect the USB cable from the PC to the SDP-B board.
Windows detects the device and locates the correct driver
automatically.
INSTALLING AND UNINSTALLING THE EVALADE9000EBZ SOFTWARE
The ADE9000 evaluation software is supplied with the evaluation
software package. It contains an installer to install the EVALADE9000EBZ evaluation software. The program to be installed is
a LabVIEW-based program that runs on the PC.
When running the software on a PC that does not have
LabVIEW 2014 for the first time, run the installer. The installer
installs a LabVIEW run-time engine that enables the PC to open
the evaluation software executable without any issues. This
installer is available in the LabVIEW\InstallationFiles folder. If
LabVIEW 2014 is available on the PC, the executable can be
directly opened from the Executable\ folder.
Uninstall the previous version of the evaluation software.
Select the add/remove programs option in the Windows
Control Panel.
Select the program to uninstall and click Add/Remove.
When the software executable opens, the main window of the
evaluation software appears, as shown in Figure 9. When opened
for the first time, the software searches for two files: the register file,
ADE9000_reg_map.bin, and the SDP microcontroller code file,
ADE9000.ldr. These files can be found in the \Executable\data
folder. After manually choosing the location of these files the first
time, the ADE9000coms.ini file is updated with their file paths.
This update allows the software to find the files correctly during
the next run.
The software recognizes the device on the evaluation board,
(the ADE9000) and displays the device features in the IC being
evaluated: box of the window. The SDP code version and the
version register value of the IC are displayed in their
corresponding boxes in the window.
1.
2.
Double click InstallationFiles\setup.exe to launch the
setup program that automatically installs all the software
components, including the uninstall program, and creates
the required directories.
To launch the software, click Start, All Programs,
ADE9000 and click ADE9000_Evaluation_Software.
When the software runs for the first time, right-click
ADE9000_Evaluation_Software.exe and select run as the
administrator.
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15326-010
To install and launch the EVAL-ADE9000EBZ evaluation
software, use the following procedure:
Figure 9. Main Window of the Evaluation Software
EVAL-ADE9000EBZ User Guide
Three different operations can be performed using the options
present in the left pane of the main window (see Figure 9).
These operations are enacted using the following buttons:
1.
2.
3.
Set SCLK. Click this option to open the Select SPI
Frequency window, as shown in Figure 10. Set the serial
peripheral interface (SPI) clock frequency for communication
between the ADE9000 and the SDP-B board using this
window. Enter the intended SCLK frequency value on the
SCLK control and click Check if Valid. The Check if Valid
option rounds off the clock frequency to the closest setting
that is possible in the SDP-B board. Finally, click Set SCLK
to set the SCLK frequency in the SDP-B board. The
window closes automatically. The default SPI clock rate is
10 MHz.
Software reset. Click this option to perform a software
reset on the ADE9000. A dialog box appears confirming
the completion of the reset operation.
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Hardware reset. Click this option to perform a hardware
reset on the ADE9000. A dialog box appears confirming
the completion of the reset operation.
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Figure 10. Set SCLK Option on the SDP-B Board
EVAL-ADE9000EBZ User Guide
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EVALUATION SOFTWARE FUNCTIONS
The right pane of the main window (see Figure 9) consists of
eight options, each of which can be used to evaluate a particular
functionality of the ADE9000. The functionalities that can be
evaluated are represented by the following options:
Read/Write registers
Powers and Energies
RMS
Waveform buffer
Angle
Quick Startup
Interrupts
Power Quality
READ/WRITE REGISTERS OPTION
The first option in the right pane of the main window is
Read/Write registers. Click this option to open the Read/Write
registers window, as shown in Figure 11. There are four tabs
available within this window: Single access, Sequential access,
All register access, and Read on Interrupt.
Each tab helps perform read/write operations to the ADE9000
at different capacities.
Single Access Tab
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Clicking any of these eight options opens a corresponding window.
To close any of these windows, the same option must be clicked
again in the main window. Multiple windows can be left open
on the monitor to evaluate different features at the same time.
The Single access tab contains a Name selection box. Click the
down arrow in the selection box to open a list of all the registers
within ADE9000. Any of the registers can be selected for
communication purposes. After the registers are selected, the
Address box and Length box are updated on the screen.
Alternatively, the address of the register can be written first,
which updates the register name and the length fields. The
individual bit fields within the register can be accessed via the
Bitfield box. Data can be written to and read from the IC using
the Write and Read options. The white boxes in the window
denote the description of the register and the corresponding bit
fields. Figure 11 shows the window when the Single access tab is
selected.
Figure 11. Single access Tab in the Read/Write registers Window
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Sequential Access Tab
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The Sequential access tab allows the user to perform read or
write operations on four different registers, in a particular
order. The Enable checkboxes at the beginning of each of the steps
(Step 1 through Step 4) can be selected to enable that particular
step. When all the required settings are entered, click Execute
Sequence to perform the operations in sequence. Figure 12 shows
the window when the Sequential access tab is selected.
Figure 12. Sequential access Tab in the Read/Write registers Window
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All Register Access Tab
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The All register access tab allows the user to read from all the
registers on the device and to write all writable registers by
clicking a single option. Click Read and display all registers to
read the registers and output the results to the Register values
table. Enter the file path for saving the register values and click
Save data to file to generate a text file with all the register values.
Any notes for reference can be added to the file using the Notes
field. The saved text file can also be edited and used to write back to
the registers. When attempting to write back to the registers, edit
the hexadecimal register value in the text file and specify the file
path next to the Read from file and update display option
(perform this action before clicking this option). Click Read
from file and update display to update the table in the window
with the values from the file. At this point, clicking the Write
register values from display option writes to all the writable
registers within the ADE9000. Figure 13 shows the window
with the All register access tab selected.
Figure 13. All register access Tab in the Read/Write registers Window
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EVAL-ADE9000EBZ User Guide
Read on Interrupt Tab
The Read on Interrupt tab allows the user to read any particular
register on any particular interrupt event. Examples of cases
where using this tab may be useful are as follows:
Reading the AVRMS register result on each DREADY
interrupt.
Reading the AWATTHR_HI register result at every
EGYRDY interrupt.
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The register and the interrupt can be selected from their respective
boxes in the window. The number of desired register reads is
entered in the No. of interrupts field. Click Read on interrupts at
this point to perform the read operation. The results are available in
the Read-back values table. Click Save data to a file to save the
readback values. Figure 14 shows the window when the Read on
Interrupt tab is selected.
Figure 14. Read on Interrupt Tab in the Read/Write registers Window
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POWERS AND ENERGIES
The next functionality available in the evaluation software is
powers and energies, located in the Powers and Energies
window. This window contains the Powers, Energies, and CF
tabs.
Powers Tab
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The Powers tab allows the user to read from all the instantaneous
powers and accumulated powers available in the ADE9000.
Before evaluating the accumulated powers, it is recommended
to set the Power update rate (ms) field and click Set. This action
writes to the PWR_TIME register accordingly. Figure 15 shows
the window when the Powers tab is selected in the evaluation
software. The signal path for the independent current and voltage
channels is found in the RMS Window section. Note that the
update continuously option must be disabled before writing a
value to any register.
Figure 15. Powers Tab in the Powers and Energies Window
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EVAL-ADE9000EBZ User Guide
Energies Tab
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The Energies tab allows the user to set the EP_CFG register
and the EGY_TIME register correctly and to read the energy
results from the ADE9000. Figure 16 shows the Energies tab. In
the ENERGY SETTINGS pane, there are different options
available for the user, such as the Accumulation Setting, which,
when turned on, can be further specified using the Sample-based
or Half-Line Cycle options. Select the Enable accumulation box to
overwrite the user energy register at every EGYRDY bit interval
(EGY_LD_ACCUM = 1). After all inputs are populated, click Set
to write to the registers appropriately. Then, select the Enable
energy/power calculations box and click Set. The ENERGY pane
displays the energy results. Note that the Update continuously
option must be disabled before writing a value to any register.
Figure 16. Energies Tab in the Powers and Energies Window
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CF Tab
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The CF tab allows the user to configure the CF1 to CF4 pins of
the ADE9000. There is a wide range of configurability available
in the ADE9000 with respect to the functionality of the CF1 to CF4
pins. Some of the major settings that affect the CF1 to CF4 pins
results include the phases enabled in each CF1 to CF4 pin, the type
of energy represented, and the CF1DEN to CF4DEN register
values. These settings can be set using the CF tab, as shown in
Figure 17. There are additional functionalities muxed onto the
CF3 and CF4 pins, which can also be controlled using this tab.
Common threshold settings such as WTHR, VARTHR, and
VATHR can also be set in the COMMON SETTINGS pane of the
CF tab. The CF1 to CF4 low pulse widths can be fixed at a
particular value by enabling the corresponding check boxes for
each of the CF1 to CF4 pins and setting a value for the
CF_LTMR[18:0] bit field to execute this pulse width setting.
Figure 17. CF Tab in the Powers and Energies Window
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EVAL-ADE9000EBZ User Guide
RMS WINDOW
There are individual tabs present for each of the voltage and current
channels. Under each of these tabs, there are multiple subtabs. The
IA and VA tabs are shown in Figure 19 and Figure 20, respectively.
The VB and VC datapaths are very similar to the VA datapath; the
IB and IC datapaths are very similar to the IA datapath. To enable
or disable the Multi-point Gain and Phase calibration, click
Disabled. The state of this option controls the multi-point gain
and phase register accessibility.
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The RMS window allows the user to visualize the datapath
inside the ADE9000, configure the high-pass filter, integrator,
programmable gain amplifier (PGA) gain levels, ADC_REDIRECT
register values, VCONSEL and ICONSEL settings, and view the
results. To perform the configuration changes, enter the changes
to the respective boxes in the window and click Write, located in
the bottom right corner of the signal path, as shown in Figure 19.
The different gain and offset registers can also be accessed via
the tabs within this window.
There are several tabs within the RMS window. The first tab is
the Continuous monitor tab, shown in Figure 18. The current
and voltage rms results are shown separately on the screen.
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Figure 18. Continuous monitor Tab in the RMS Window
Figure 19. IA Tab (Total RMS Subtab) in the RMS Window
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EVAL-ADE9000EBZ User Guide
Figure 20. VA Tab (Total RMS Subtab) in the RMS Window
WAVEFORM BUFFER WINDOW
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The Waveform Buffer window has two panes. The upper pane of
the window controls the different settings of the waveform
buffer. Settings such as the operation mode, specifying which
channels burst, the source of the waveforms, and the number of
samples to be collected are selected from this upper pane of the
window. After all the settings are entered, click Run to start the
filling process of the buffer. When the filling is complete, the buffer
samples are plotted in the time domain under the Waveforms
tab. Figure 21 shows the Waveform Buffer window with the
Waveforms tab selected.
Figure 22. FFT Tab in the Waveform Buffer Window
15326-022
When the FFT tab is selected, the window appears as shown in
Figure 22. The FFT of all the waveforms is computed and plotted
automatically based on the waveforms. The window allows the
user to save the waveform and FFT data into a text file. The
waveform and FFT display images can be saved to a .bmp file as
well.
Figure 21. Waveforms Tab in the Waveform Buffer Window
Rev. 0 | Page 17 of 31
UG-1082
EVAL-ADE9000EBZ User Guide
ANGLE WINDOW
15326-024
The Angle window is shown in Figure 23. This window allows the
user to visualize the angles of three voltage and three current
channels with respect to each other. In the Angle register
readings pane, all nine angle register values are displayed. Using
these register results, the angles are computed in degrees and
displayed in their respective boxes. The dial to the right of the
screen provides a phasor-like representation of the six signals.
The frequency values are displayed below the dial. These values
are computed from the COM PERIOD and APERIOD register
values. The Angle window does not require the user to perform
a write. The user can save the values in the window to a file,
perform a single read of the screen quantities, or perform a
continuous update of the quantities using the respective options
in the window.
Figure 23. Angle Window
Rev. 0 | Page 18 of 31
EVAL-ADE9000EBZ User Guide
UG-1082
QUICK STARTUP WINDOW
The Configuration tab accepts the user response on a few
parameters and selects the appropriate VCONSEL[2:0] and
ICONSEL[0] settings for the user. The Input circuitry tab can
be used as a quick calculator for determining if the input signal
exceeds the current channel and the voltage channel ADCs inside
the ADE9000. By feeding in the system parameters and input
signals, along with the PGA setting, the software calculates the
signal level at the ADCs. If the signal level exceeds the full-scale
range of the ADCs, the indicator turns red. This indication signals
to the user that the system parameters must be adjusted.
15326-025
There are three tabs within the Quick Startup window: the
Configuration tab, the Input circuitry tab, and the Startup
procedure tab. The Startup procedure tab is the main tab that
performs the quick start-up routine, as well as all the necessary
initializations. However, before the start-up routine and the
initializations, make sure that the inputs are operating in the correct
3-phase configuration and that they are not overranging the ADCs.
Figure 24. Configuration Tab in the Quick Startup Window
1.
2.
3.
4.
5.
6.
7.
8.
Sets the PGA for all channels.
Sets SELFREQ and VLEVEL.
Enables the integrator and sets DICOEFF. This step is skipped
for everything except the di/dt sensor.
Enables the DSP.
Disables the CF1 to CF4 pin outputs, enables the energy and
powers functionality, and reads all the energy registers on
reset.
Performs a quick gain calibration and obtains calibration
conversion constants, such as V/LSB, A/LSB, and Wh/LSB.
Obtains the CF1DEN to CF4DEN values from the Meter
constant and writes these values to the registers.
Enables the CF1 and CF2 pins and configures them such that
the CF1 pin denotes the sum of all the total active energy
of the phases and the CF2 pin denotes the sum of all the
total reactive energy phases.
15326-026
The Startup procedure tab performs the following initialization
steps, which must be completed sequentially (see Figure 26):
Figure 25. Input Circuitry Tab in the Quick Startup Window
15326-027
These steps must be performed sequentially. The user must click
the options in each step to perform the operation.
Figure 26. Startup Procedure Tab in the Quick Startup Window
Rev. 0 | Page 19 of 31
UG-1082
EVAL-ADE9000EBZ User Guide
INTERRUPTS WINDOW
To view the IRQ0 and IRQ1 pin logic level, click Check IRQx
pin logic state. If the LED is lit, this means that the pin is in a logic
low state. Click Auto Clear to reset the interrupts available on the
pins on the fly. The IRQ0 and IRQ1 pins can be monitored on a
scope to understand the rate at which the interrupts are being set.
The Route all events to IRQ1 pin option sets the configuration bit
that routes all interrupt events to be accessible via the IRQ1 pin.
15326-028
The Interrupts window displays the status of all the interrupt
events. The individual bits of the STATUS0 and STATUS1 registers
are shown as green LEDs in the window (see Figure 27). If the
LED is lit, it indicates that the corresponding status bit is set to 1.
Next to each of the LEDs, a checkbox represents the corresponding
MASK0 and MASK1 bits. If the MASK1 and MASK0 bits must
be set, select the corresponding checkbox and click Write Mask
Registers. Click Write ‘1’ to all set status bits to reset all status
bits simultaneously. If specific values must be written to the
status bits, write to the bits using the controls under the Write
to STATUSx registers option on the screen.
Figure 27. Interrupts Window
Rev. 0 | Page 20 of 31
EVAL-ADE9000EBZ User Guide
UG-1082
POWER QUALITY WINDOW
The Power Quality window allows the user to access all the power
quality features of the ADE9000. The window is subdivided into
the Voltage monitor, Current monitor, and Power Factor and
THD tabs.
Voltage Monitor Tab
Current Monitor Tab
The Current monitor tab is shown in Figure 29. This tab is
organized in the same way as the Voltage monitor tab. The
IPEAK, ZX, and OI power quality features are accessible in
this tab.
15326-029
The Voltage monitor tab is shown in Figure 28. This tab
evaluates the DIP, SWELL, ZX & ZXTOUT, VPEAK, and
PHASE SEQUENCE ERROR DETECTION features. This tab
allows the user to configure all the control inputs for the features
and to monitor the status bits as LEDs. The corresponding
mask bits can also be set using the checkboxes in the tab.
Figure 29. Current monitor Tab in the Power Quality Window
Rev. 0 | Page 21 of 31
15326-030
14345-031
Figure 28. Voltage monitor Tab in the Power Quality Window
UG-1082
EVAL-ADE9000EBZ User Guide
14345-031
The Power Factor and THD tab is shown in Figure 30. This
window reads all the power factor and total harmonic distortion
(THD) register results from the device, converts these results to
meaningful results, and displays them.
Figure 30. Power Factor and THD Tab in the Power Quality Window
Rev. 0 | Page 22 of 31
15326-031
Power Factor and THD Tab
EVAL-ADE9000EBZ User Guide
UG-1082
TROUBLESHOOTING
If this message appears, take the following steps:
If the software does not detect the SDP-B board, the message
shown in Figure 31 is displayed.
1.
15326-033
2.
3.
Verify that the SDP-B board is connected to the PC using the
USB cable. The window in Figure 32 appears on the task bar;
Windows then installs any other necessary drivers.
After the installation is complete, click Rescan.
When another window appears, check if the LED on the
board is flashing; if so, click Select.
15326-032
Figure 32. Installing device driver software Message
Figure 31. Hardware Select Message
Rev. 0 | Page 23 of 31
C6
A
A
C
Figure 33. Evaluation Board Schematic—ADE9000
CF2
750ΩΩ
CF2
C3
C
CF3/ZX
R1
DS3
CF4/EVENT
1
2
3
IRQ0B
AGND
AGND
1 BLK
IRQ1B
AGND9
BLK
LDO_5.0V_ISO
VDD_5.0V_ISO
1
AGND
VDD
JP3
22-03-2031
EXT_VDD_5.0V_ISO
EXT_5V
ORG
1
C
IRQ1B
1
AGND
AGND6
C
IRQ0B
CF4/EVENT
PJ-002AH-SMT
DC BARREL JACK
16V MAX
P1
CF3/ZX
A
CF1
C7
OUTPUT LED CIRCUIT
R3
CF1
R2
0.1µF
AGND
750Ω
C4
4.7µF
R4
DVDD
AGND
0.1µF
DIGITAL LDO DECOUPLING
750Ω
1
R6
4.7µF
750Ω
1.5SMC15AT3G
AGND
750Ω
AVDD
750Ω
CR2
A
C
R7
1
2
3
VDD
1
AGND
BLK
AGND5
DS4
C
DS2
DS1
C
LDO_5.0V_ISO
LDO_ISO
ORG
JP6
2
DNI
AGND
69157-102HLF
1
AGND
RESET
PM0
DUT SIDE LDO
1
AGND
PM1
1
1µF
AGND8
BLK
C11
1
AGND
C13
AGND7
BLK
10µF
4
PAD
EP
AGND
VDD
VDD
RED
AGND
1
AGND
0Ω
R11
AGND
0.1µF
ADR3412ARJZ
DS5
1
GND_FORCE
4
VIN
3
ENABLE
CLKOUT
CLKIN
GND
VDD
AGND
AVDDOUT
VCP
VCN
VBP
VBN
AGND
GND_SENSE
2
U2
DNI
AGND
0Ω
R10
CLKOUT
CLKIN
S1
3
4
B3S1000
1
2
1
0
JP1
0.1µF
2
DNI
RESET CIRCUIT
AGND
AVDD
VCP
VCN
VBP
VBN
MCU_VDD
AGND
1 IRQ0B
1 IRQ1B
1 CF1
1 CF2
VDD
1 CF3/ZX
PLACE C35, C36 AS CLOSE TO DUT PIN 17 AS POSSIBLE
0.1µF
6
VOUT_FORCE
5
VOUT_SENSE
DNI
MCU_VDD
30
29
28
27
26
25
24
23
22
21
ADE9000
U9
IRQ0B
IRQ1B
CF1
CF2
CF3/ZX
AGND
REFERENCE DECOUPLING AND EXTERNAL REF
AGND
GND
U1
ADM7150ACPZ-3.3
1
VREG
2
3
BYP
VOUT
5
7
EN REF_SENSE
8
6
VIN
REF
VPP
DGND
DVDDOUT
PM0
PM1
RESET
IAP
IAN
IBP
IBN
CSB
MOSI
1
2
DVDD 3
PM0 4
PM1 5
RESET 6
IAP 7
IAN 8
IBP 9
IBN 10
1
1
MCU_VDD
AGND
CSB
MOSI
C15
MISO
1µF
ANALOG LDO DECOUPLING
10µF
C12
1
1µF
C9
ICP
ICN
INP
INN
10µF
REFIN
0.1µF
MISO
C2
1
C14
PAD
40
39
38
37
36
35
34
33
32
31
PAD
CSB
MOSI
MISO
SCLK
CF4/EVENT
CF3/EVENT
CF2
CF1
IRQ1
IRQ0
ICP
ICN
INP
INN
REFGND
REFIN
NC1
NC2
VAN
VAP
VAN
VAP
10µF
C26
499
R5
A
DNI
A
C8
A
DNI
0.1µF
SCLK
DNI
1
R15
SCLK
10kΩ
11
12
13
14
15
16
17
18
19
20
C5
Rev. 0 | Page 24 of 31
C17
CLKOUT
CLKIN
4.7µF
REFIN
RESET
1µF
VDD
C18
0Ω
R12
1
1
24.576MHz
XTAL CIRCUIT
16PF
C20
16PF
C19
AGND
AGND2
BLK
AGND
AGND4
BLK
1
1
AGND
AGND1
BLK
AGND
AGND3
BLK
EXTRA GROUND
TP FOR PROBING
Y1
CF4/EVENT
0Ω
CF4/EVENT
1
DNI
R13
PS CONNECTIONS
C16
1 2
C
AGND
C1
0.1µF
VDD
C21
CMD28-21VGCTR8T1
AGND
AGND
TP5
CF3/ZX
CF3/ZX
CF4/EVENT
10µF
CR1
ADUC
IRQ0B
MISO
RESET
CF1
CF2
VDD
MOSI
IRQ1B
CSB
SCLK
INTERFACE
TP6
PM0
PM1
1
A
1
1
2
C10
P7
PEC10DAAN
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
UG-1082
EVAL-ADE9000EBZ User Guide
EVALUATION BOARD SCHEMATICS AND ARTWORK
DS6
15326-038
IAN_IN
BLU
R1A
IBN_IN
BLU
IBN
YEL
IBP_IN
1
NEUTRAL
AGND
WHT
E3AP
1500Ω
1
VIOLET
VAP_IN
1
VAP
2
VOLTAGE CHANNELS
1
1
IBP
AT 8MHZ 60.87 DB ATTEN
AT 4MHZ 54.80 DB ATTEN
AT 2MHZ 48.83 DB ATTEN
AT 1MHZ 42.81 DB ATTEN
1kΩ AND .022µF = 7.234KHZ CORNER
1
IAN
IAP_IN
TBD1206
TBD1206
1
E1A
1
330kΩ
330kΩ
BRN
VAN
R8A
R7A
330kΩ
R9A
PHASE A VOLTAGE
1500Ω
2
TS4148 RZ
DNI E2B
1
2
TS4148 RZ
E1B
1500Ω
DNI
1
1500Ω
2
TS4148 RZ
DNI E2A
1
2
TS4148 RZ
1500Ω
DNI
TBD1206
R2A
R1B
R2B
C
VAN
VAP
TS4148 RZ
TS4148 RZ
PHASE B CURRENT
TS4148 RZ
TS4148 RZ
1
R6A
AGND
0Ω
R4B
1kΩ
0Ω
VBP_IN
E3BP
1500Ω
1
VIOLET
VBP
1kΩ
R6B
2
AGND
R5B
R3B
0Ω
R4A
1kΩ
0Ω
AGND
R5A
R3A
PHASE A CURRENT
R11A
R10A
TBD1206
D4A
D3A
A
C
C
A
C
A
C1A
C2A
C1B
C2B
A
D3B
D4B
1kΩ
1kΩ
0.022µF
0.022µF
0.022µF
0.022µF
0.022µF
1
330kΩ
330kΩ
BRN
VBN
R8B
R7B
1
1
1
ICP
INN_IN
BLU
INN
YEL
INP_IN
INP
ICN_IN
BLU
ICN
YEL
ICP_IN
330kΩ
R9B
PHASE B VOLTAGE
IBN
AGND
IBP
IAN
AGND
IAP
1
1
TS4148 RZ
E1N
2
2
E2N
VBN
AGND
VBP
1
VIOLET
VCP
VCP_IN
2
TS4148 RZ
TS4148 RZ
1500Ω
1
DNI
DNI
1500Ω
1
1500Ω
1
2
TS4148 RZ
DNI E2C
DNI
1500Ω
E1C
D3C
C
A
D4C
IAP
C5A
C6A
1kΩ
E3CP
1500Ω
1
2
0Ω
R4C
1kΩ
0Ω
R7C
330kΩ
0
R4N
R8C
1
BRN
VCN
330kΩ
R9C
330kΩ
1kΩ
R6N
AGND
1kΩ
0
PHASE C VOLTAGE
TS4148 RZ
TS4148 RZ
R5N
R3N
1kΩ
R6C
AGND
R5C
R3C
NEUTRAL CURRENT
TS4148 RZ
TS4148 RZ
PHASE C CURRENT
C3C
C4C
YEL
0.022µF
0.022µF
DNI
DNI
DNI
DNI
C3A
C4A
C3B
C4B
0.022µF
0.022µF
0.022µF
R1C
R2C
R1N
R2N
TBD1206
TBD1206
TBD1206
TBD1206
0.022µF
0.022µF
1
1kΩ
Rev. 0 | Page 25 of 31
R11B
C
1kΩ
Figure 34. Evaluation Board Schematic—Current and Voltage Channels
C5B
A
R10B
D2B
C
C6B
D1B
0.022µF
C
0.022µF
C1C
C2C
C1N
C2N
C
D4N
0.022µF
DNI
0.022µF
DNI
0.022µF
DNI
0.022µF
DNI
A
D3N
C
A
C
A
A
C
1kΩ
D2A
A
R11C
A
D2N
C
1kΩ
D1N
R10C
C
A
C5C
D1A
C3N
A
C
C6C
D2C
C4N
A
0.022µF
C
0.022µF
D1C
0.022µF
A
0.022µF
CURRENT CHANNELS
AGND
VCN
VCP
INN
AGND
INP
ICN
AGND
ICP
EVAL-ADE9000EBZ User Guide
UG-1082
15326-037
EEPROM_A0
PM0_ISO
CF3_ISO
CF1_ISO
IRQ0B_ISO
RESET_ISO
SSB_SDP
USB_VBUS
117
4
114
113
112
111
110
109
108
107
106
105
104
7
8
9
10
11
12
13
14
15
16
17
100
99
98
97
96
95
94
93
21
22
23
24
25
26
27
28
R33
EEPROM_A0
R34
R31
R35
R32
DNI
ID EEPROM
PM1_ISO
CF4_ISO
CF2_ISO
IRQ1B_ISO
SCL
SDA
SCLK_SDP
MISO_SDP
MOSI_SDP
SCLK_ISO
MOSI_ISO
SSB_ISO
SPORT_RFS/PPI_D1
VIO_SDP
60
FX8-120S-SV(21)
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
DNI
SSB_ISO 1
WP
SCL
SDA
A1
A2
VSS
VCC
PAD
U3
R36
R37
5
6
7
8
4
D_FRAME
Y
U5
D_FRAME_SYNC
SSB_ISO
D_FRAME
DNI
VIO_SDP
SPORT_RSCLK/PPI_D2
A0
PAD
GND
3
5
VCC
TAP5
TAP4
TAP3
TAP2
TAP1
5
3
6
2
7
U4
D
GND
CLK
SDA
SCL
VIO_SDP
0Ω
Q
VCC
DNI
0Ω
R46
0Ω
R45 DNI
0Ω
R23
0Ω
R22
DNI
0Ω
R21
D_FRAME
4
5
DCLK_ISO
SCLK_ISO
SPORT_RFS/PPI_D1
D_FRAME_SYNC
6 LDO_3.3V_SDP
0Ω
R20
0Ω
R19
0Ω
R18
0Ω
R17
R16
CLR_N
U6
DNI
DNI
DNI
DNI
SN74LVC1G175DCKR
3
2
1
GND
4 DS1100LU-30+
8
VCC
BYPASS DELAYED FRAME IF NEEDED
NC7SZ04P5X
DCLK_ISO
2
A
IN
LDO_3.3V_SDP
LDO_3.3V_SDP
24LC32A-I/MC
4
3
2
1
FX8-120S-SV(21)
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
101
20
MISO_ISO
102
19
29
103
18
SPORT_RSCLK/PPI_D2
115
6
116
118
3
VIO_SDP
119
2
5
P9
120
USB_VBUS
10µF
C24
0.1µF
C25
.1µF
C23
0
DNI R24
8
7
6
5
4
3
2
LDO_3.3V_SDP
LDO_3.3V_SDP
LDO_3.3V_SDP
C27
0.1µF
C29
0.1µF
C28
0.1µF
13
12
11
CF2_ISO
CF1_ISO
PM0_ISO
PM1_ISO
9
10
11
12
13
IRQ1B_ISO
IRQ0B_ISO
14
15
16
CF4_ISO
SI
GND2
DCLK
GND1
VIB
GND2
VIB
VE1
GND1
VE2
GND2
11
12
13
14
15
16
17
18
19
20
8
7
5 IRQ0B
6 PM1
DUT SIDE
AGND
10µF
C31
VDD_5.0V_ISO
AGND
AGND
AGND
VDD
10µF
C34
AGND
AGND
AGND
0.1µF
C37
VDD
VDD FROM SHEET 3
AGND
VDD
0.1µF
C36
VDD FROM SHEET 3
AGND
0.1µF
C35
VDD FROM SHEET 3
AGND
AGND
VDD_5.0V_ISO
VDD_5.0V_ISO TO SHEET 3
AGND
0.1µF
C30
VDD_5.0V_ISO TO SHEET 3
RESET
CSB
MISO
MOSI
SCLK
3 CF4/EVENT
4 IRQ1B
2
1
8
7
5 CF1
6 PM0
3 CF3/ZX
4 CF2
2
1
ADUM3401CRWZ
VOD
VIC
VID
VOC
VOB
VIA
VDD1
GND1
GND2
VOA
VDD2
ADUM3401CRWZ
VE1
GND1
VE2
VIC
VOD
VID
VOC
VOB
VIA
GND1
GND2
VOA
VDD1
VDD2
ADUM3150ARSZ
VIB
NIC
VOB
VOA
SSS_N
SO
VIA
MSS_N
MI
MO
SCLK
GND2
GND1
MCLK
9
10
11
12
13
14
15
U8
VDD2
U11
9
10
14
15
CF3_ISO
GNDISO
VISO
NC
NC
VSEL
NC
VDD1
U10
16
10
9
8
7
RESET_ISO
DCLK_ISO
6
5
4
3
SSB_ISO
MISO_ISO
MOSI_ISO
SCLK_ISO
2
1
*IMPLEMENT MULTIPLE VIAS FROM THE EXPANDED GND PADS
TO THE GROUND PLANE.
VISO
16
U7
GNDISO
ADUM5000ARWZ
GND1
VDD1
RCSEL
RCOUT
RCIN
NC
GND1
VDD1
*IMPLEMENT EXPANDED GND PADS. CONNECT PINS 2,3 TO A BIG
GND PAD TO DISSIPATE HEAT THROUGH GND PLANE. SAME WITH 14, 15.
*DECOUPLING CAPS LESS THAN 10mm FAR FROM POWER PINS
USB_VBUS
10µF
C22
10kΩ
10kΩ
1
1
SPI ISOLATOR
R27
USB_VBUS
R25
R26
10kΩ
SDP SIDE
R28
P9
0Ω
100kΩ
LDO_3.3V_SDP
SDP SIDE LDO
USB_VBUS
RED
VBUS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
TSW-116-08-G-D
P2
1
USB_VBUS
10µF
C39
DELAY FRAME
10kΩ
499Ω
499Ω
1µF
C40
SDP INTERFACE
100kΩ
0Ω
100kΩ
Rev. 0 | Page 26 of 31
0Ω
Figure 35. Evaluation Board Schematic—SDP-B Interface and Isolation
100kΩ
C38
DEVICE INTERFACE HEADER
R29
R30
C
RESET_ISO
IRQ0B_ISO
IRQ1B_ISO
CF4_ISO
CF1_ISO
CF2_ISO
CF3_ISO
EP
1
1
1µF
BLK
DGND3
BLK
CF4_ISO
CF1_ISO
CF2_ISO
CF3_ISO
BLK 1
DGND1 DGND2
PAD
SCLK_ISO
MISO_ISO
MOSI_ISO
SSB_ISO
PM1_ISO
PM0_ISO
4
GND
U12
ADM7150ACPZ-3.3
1
VREG
3
2
BYP
VOUT
7
5
EN
REF_SENSE
8
6
VIN
REF
10µF
CMD67-21UBC/TR8 (BLUE)
1
CR9
1
CMD28-21VGCTR8T1
A
1
C
C41
CR8
3.3V
1
DGND
BLK
1 ORG
LDO_3.3V_SDP
10µF
A
1
UG-1082
EVAL-ADE9000EBZ User Guide
15326-039
C42
UG-1082
15326-034
EVAL-ADE9000EBZ User Guide
15326-035
Figure 36. Evaluation Board Silkscreen
Figure 37. Layout of the Top Layer of the Evaluation Board
Rev. 0 | Page 27 of 31
EVAL-ADE9000EBZ User Guide
15326-036
UG-1082
Figure 38. Layout of the Bottom Layer of the Evaluation Board
Rev. 0 | Page 28 of 31
EVAL-ADE9000EBZ User Guide
UG-1082
ORDERING INFORMATION
BILL OF MATERIALS
Table 1.
1
Reference
Designator
Not applicable
3.3 V, EXT_5V,
LDO_ISO
DGND, AGND1 to
AGND9, DGND1 to
DGND3
C1, C5 to C7, C26
C2, C11, C13, C15,
C21, C22, C24, C31,
C34, C38, C40, C42
C12, C14, C16, C39,
C41
C17
3
C3, C4, C18
2
C19, C20
9
C23, C25, C27 to
C30, C35 to C37
C3A to C6A, C3B to
C6B, C3C to C6C,
C3N, C4N
CF1, CF2, CS, PM0,
PM1, TP5, TP6, MISO,
MOSI, SCLK, IRQ0,
IRQ1, CF3/ZX, RESET
, CF1_ISO to
CF4_ISO,
CF4/EVENT
CR1, CR8
CR2
CR9
Qty
1
3
13
5
12
5
14
19
2
1
1
16
4
4
1
D1A to D4A, D1B
to D4B, D1C to
D4C, D1N to D4N
DS1 to DS6
E1A, E1B, E1C, E1N,
E2A, E2B, E2C, E2N,
E3AP, E3BP, E3CP
IAN, IBN, ICN, INN
IAP, IBP, ICP, INP
JP3
1
1
NEUTRAL
P1
1
P7
6
11
Description
Printed circuit board (PCB)
Connector; PCB test point, orange
Value1
N/A
Orange
Tolerance
(Ω)1
N/A
N/A
Voltage
(V)1
N/A
N/A
Part Number
08_039712c
TP104-01-03
Connector; PCB test point, black
Black
N/A
N/A
TP-104-01-00
Capacitor, ceramic, chip, X8R
Capacitor, ceramic, monolithic,
X7R
0.1 µF
10 µF
10
10
25
25
C1608X8R1E104K
GRM31CR71E106KA12L
Capacitor, ceramic, chip, 1206,
X7R
Capacitor, ceramic, X7R, 0402
1 µF
10
35
GMK316B7105KL-T
0.1 µF
10
16
Capacitor, monolithic, ceramic,
X5R
Capacitor, chip, monolithic,
ceramic, C0G, 0402
Capacitor, ceramic, X7R
4.7 µF
10
6.3
GRM155R71C104KA88D
GRM188R60J-475KE19
16 pF
5
50
GJM1555C1H160JB01D
0.1 µF
10
10
0306ZC104KAT2A
Capacitor, ceramic, multilayer,
C0G
0.022 µF
5
50
C2012C0G1H223J
Connector; PCB test point, gray
Gray
N/A
N/A
TP104-01-08
Diode, LED, green, SMD
Diode, Zener TVS
LED, blue, surface-mount
N/A
N/A
N/A
2.1
15
4.5
CMD28-21VGCTR8T1
1.5SMC15AT3G
CMD67-21UBC/TR8
Diode, high speed switching
CMD28-21VGCTR8T1
1.5SMC15AT3G
CMD67-21UBC/TR8
(blue)
TS4148 RZ
N/A
100
TS4148 RZ
LED red, surface-mount
Inductor, chip, ferrite bead, 0805
LNJ208R8ARA (red)
1500 Ω
N/A
25
2.5
N/A
LNJ208R8ARA
BLM21BD152SN1D
Connector; PCB test point, blue
Connector; PCB test point, yellow
Connector; PCB header, 2.54 mm,
3 position, vertical
Connector; PCB test point, white
Connector; PCB, use E022246 for
4-pin power jack from the
CN4P_V6 folder
Connector; PCB BERG header, ST
male, 20-pin
Blue
Yellow
22-03-2031
N/A
N/A
N/A
N/A
N/A
N/A
TP104-01-06
TP-104-01-04
22-03-2031
White
PJ-002AH-SMT
N/A
N/A
N/A
N/A
TP-104-01-09
PJ-002AH-SMT
PEC10DAAN
N/A
N/A
PEC10DAAN
Rev. 0 | Page 29 of 31
UG-1082
Qty
1
Reference
Designator
P9
3
R1, R29, R30
6
4
5
R10A, R10B, R10C,
R11A, R11B, R11C
R11, R12, R19, R23
R15, R25 to R28
6
R2 to R7
4
R33 to R35, R37
9
1
2
R3A, R3B, R3C, R3N,
R46, R4A, R4B, R4C,
R4N
R5A, R5B, R5C, R5N,
R6A, R6B, R6C, R6N
R7A to R9A, R7B to
R9B, R7C to R9C
S1
U1, U12
2
U10, U11
1
1
U3
U4
1
1
U5
U6
1
U7
1
U8
1
U9
3
3
2
1
VAN, VBN, VCN
VAP, VBP, VCP
VDD, VBUS
Y1
8
9
1
EVAL-ADE9000EBZ User Guide
Value1
FX8-120S-SV(21)
Tolerance
(Ω)1
N/A
Voltage
(V)1
N/A
Part Number
FX8-120S-SV(21)
499
1
N/A
ERJ-8ENF4990V
1 kΩ
0.1
N/A
ERA-3YEB102V
Resistor, thick film, chip
Resistor, precision, thick film,
chip, R0805
Resistor, precision, thick film,
chip, R0805
Resistor, precision, thick film,
chip, R0805
Resistor, film, SMD, 0603
0
10 kΩ
1
N/A
N/A
ERJ-6GEY0R00V
ERJ-6ENF1002V
750
1
N/A
ERJ-6ENF7500V
100 kΩ
1
N/A
ERJ-6ENF1003V
0
5
N/A
ERJ-3GEY0R00V
Resistor, precision, thick film, chip,
R0603
Resistor, high voltage, thin film,
flat chip
SW SM mechanical keyswitch
Analog Devices, Inc. IC, 800 mA,
ultralow noise, high PSRR, RF
linear regulator (3.3 V output)
Analog Devices IC, quad-channel
digital isolator
IC, 32 kB, I2C serial EEPROM
IC, 3.3 V to 5-tap economy timing
element
IC, tiny logic UHS inverter
IC-TTL, single D-type flip-flop
with asynchronous clear
Analog Devices IC, 2.5 kV,
isolated dc-to-dc converter
Analog Devices IC, 3.75 kV, 6channel, SPIsolator® digital
isolator for SPI with delay clock
Analog Devices IC, high
performance, polyphase, energy
metering AFE
Connector; PCB test point, brown
Connector; PCB test point, violet
Connector; PCB test point, red
IC, crystal SMD, low profile
1 kΩ
1
N/A
ERJ-3EKF1001V
33 kΩ
0.1
N/A
TNPV1206330KBEEN
B3S1000
N/A
N/A
N/A
N/A
N/A
B3S1000
ADM7150ACPZ-3.3
N/A
N/A
ADuM3401CRWZ
24LC32A-I/MC
DS1100LU-30+
N/A
N/A
2.7 to
5.5
N/A
N/A
NC7SZ04P5X
SN74LVC1G175DCKR
N/A
N/A
N/A
N/A
NC7SZ04P5X
SN74LVC1G175-DCKR
N/A
N/A
N/A
ADuM5000ARWZ
N/A
N/A
N/A
ADuM3150ARSZ
N/A
N/A
N/A
ADE9000
Brown
Violet
Red
24.576 MHz
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
TP104-01-01
TP104-01-07
TP-104-01-02
ABLS-24.576MHZ-8-L4QF-T
Description
Connector; PCB, board to board
receptacle, ST, 0.6 mm pitch
Resistor, precision, thick film,
chip, R1206
Resistor, film, SMD, 0603
N/A means not applicable.
Rev. 0 | Page 30 of 31
24LC32A-I/MC
DS1100LU-30+
EVAL-ADE9000EBZ User Guide
UG-1082
NOTES
I2C refers to a communications protocol originally developed by Philips Semiconductors (now NXP Semiconductors).
ESD Caution
ESD (electrostatic discharge) sensitive device. Charged devices and circuit boards can discharge without detection. Although this product features patented or proprietary protection
circuitry, damage may occur on devices subjected to high energy ESD. Therefore, proper ESD precautions should be taken to avoid performance degradation or loss of functionality.
Legal Terms and Conditions
By using the evaluation board discussed herein (together with any tools, components documentation or support materials, the “Evaluation Board”), you are agreeing to be bound by the terms and conditions
set forth below (“Agreement”) unless you have purchased the Evaluation Board, in which case the Analog Devices Standard Terms and Conditions of Sale shall govern. Do not use the Evaluation Board until you
have read and agreed to the Agreement. Your use of the Evaluation Board shall signify your acceptance of the Agreement. This Agreement is made by and between you (“Customer”) and Analog Devices, Inc.
(“ADI”), with its principal place of business at One Technology Way, Norwood, MA 02062, USA. Subject to the terms and conditions of the Agreement, ADI hereby grants to Customer a free, limited, personal,
temporary, non-exclusive, non-sublicensable, non-transferable license to use the Evaluation Board FOR EVALUATION PURPOSES ONLY. Customer understands and agrees that the Evaluation Board is provided
for the sole and exclusive purpose referenced above, and agrees not to use the Evaluation Board for any other purpose. Furthermore, the license granted is expressly made subject to the following additional
limitations: Customer shall not (i) rent, lease, display, sell, transfer, assign, sublicense, or distribute the Evaluation Board; and (ii) permit any Third Party to access the Evaluation Board. As used herein, the term
“Third Party” includes any entity other than ADI, Customer, their employees, affiliates and in-house consultants. The Evaluation Board is NOT sold to Customer; all rights not expressly granted herein, including
ownership of the Evaluation Board, are reserved by ADI. CONFIDENTIALITY. This Agreement and the Evaluation Board shall all be considered the confidential and proprietary information of ADI. Customer may
not disclose or transfer any portion of the Evaluation Board to any other party for any reason. Upon discontinuation of use of the Evaluation Board or termination of this Agreement, Customer agrees to
promptly return the Evaluation Board to ADI. ADDITIONAL RESTRICTIONS. Customer may not disassemble, decompile or reverse engineer chips on the Evaluation Board. Customer shall inform ADI of any
occurred damages or any modifications or alterations it makes to the Evaluation Board, including but not limited to soldering or any other activity that affects the material content of the Evaluation Board.
Modifications to the Evaluation Board must comply with applicable law, including but not limited to the RoHS Directive. TERMINATION. ADI may terminate this Agreement at any time upon giving written notice
to Customer. Customer agrees to return to ADI the Evaluation Board at that time. LIMITATION OF LIABILITY. THE EVALUATION BOARD PROVIDED HEREUNDER IS PROVIDED “AS IS” AND ADI MAKES NO
WARRANTIES OR REPRESENTATIONS OF ANY KIND WITH RESPECT TO IT. ADI SPECIFICALLY DISCLAIMS ANY REPRESENTATIONS, ENDORSEMENTS, GUARANTEES, OR WARRANTIES, EXPRESS OR IMPLIED, RELATED
TO THE EVALUATION BOARD INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, TITLE, FITNESS FOR A PARTICULAR PURPOSE OR NONINFRINGEMENT OF INTELLECTUAL
PROPERTY RIGHTS. IN NO EVENT WILL ADI AND ITS LICENSORS BE LIABLE FOR ANY INCIDENTAL, SPECIAL, INDIRECT, OR CONSEQUENTIAL DAMAGES RESULTING FROM CUSTOMER’S POSSESSION OR USE OF
THE EVALUATION BOARD, INCLUDING BUT NOT LIMITED TO LOST PROFITS, DELAY COSTS, LABOR COSTS OR LOSS OF GOODWILL. ADI’S TOTAL LIABILITY FROM ANY AND ALL CAUSES SHALL BE LIMITED TO THE
AMOUNT OF ONE HUNDRED US DOLLARS ($100.00). EXPORT. Customer agrees that it will not directly or indirectly export the Evaluation Board to another country, and that it will comply with all applicable
United States federal laws and regulations relating to exports. GOVERNING LAW. This Agreement shall be governed by and construed in accordance with the substantive laws of the Commonwealth of
Massachusetts (excluding conflict of law rules). Any legal action regarding this Agreement will be heard in the state or federal courts having jurisdiction in Suffolk County, Massachusetts, and Customer hereby
submits to the personal jurisdiction and venue of such courts. The United Nations Convention on Contracts for the International Sale of Goods shall not apply to this Agreement and is expressly disclaimed.
©2017 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
UG15326-0-1/17(0)
Rev. 0 | Page 31 of 31