EVAL-ADuCM355QSPZ Evaluation Board
UG-1308
One Technology Way • P.O. Box 9106 • Norwood, MA 02062-9106, U.S.A. • Tel: 781.329.4700 • Fax: 781.461.3113 • www.analog.com
Evaluating the ADuCM355 Precision Analog Microcontroller
with Chemical Sensor Interface
FEATURES
GENERAL DESCRIPTION
Debug and programming capability of the ADuCM355
Evaluation capability with electrochemical gas sensors
ADT7420 ±0.25°C accurate temperature sensor via I2C
MicroUSB power option and connection to PC
The ADuCM355 on-chip system provides the features needed
to bias and to measure a range of different electrochemical
sensors. The EVAL-ADuCM355QSPZ allows users to evaluate
the performance of the ADuCM355 when implementing a
range of different electrochemical techniques, including
chronoamperometry, voltammetry, and electrochemical
impedance spectroscopy (EIS).
EQUIPMENT NEEDED
PC running Windows® 7 or later
Electrochemical gas sensor or resistor star network
Complete specifications for the ADuCM355 are available in the
ADuCM355 data sheet, which must be consulted in conjunction
with this user guide when using the EVAL-ADuCM355QSPZ.
DOCUMENTS NEEDED
ADuCM355 hardware reference manual
ADuCM355 data sheet
SOFTWARE NEEDED
IAR Embedded Workbench or Keil μVision
ADuCM355 GitHub Repository
Terminal program such as RealTerm
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EVALUATION BOARD PHOTOGRAPH
Figure 1.
PLEASE SEE THE LAST PAGE FOR AN IMPORTANT
WARNING AND LEGAL TERMS AND CONDITIONS.
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EVAL-ADuCM355QSPZ Evaluation Board
TABLE OF CONTENTS
Features .............................................................................................. 1
Running a GPIO Example in IAR Embedded Workbench ....8
Equipment Needed........................................................................... 1
Running a GPIO Example in Keil μVision............................. 11
Documents Needed .......................................................................... 1
Application Examples .................................................................... 13
Software Needed ............................................................................... 1
Cyclic Voltammetry Example .................................................. 13
General Description ......................................................................... 1
EIS Example ................................................................................ 14
Evaluation Board Photograph ........................................................ 1
Chronoamperometry Example ................................................ 14
Revision History ............................................................................... 2
DC Current Example ................................................................. 15
Power Configurations ...................................................................... 4
4-Lead Electrochemical Sensor Example ................................ 16
MicroUSB Direct Power via P4 and ADP7158 LDO
Regulator ....................................................................................... 4
Connecting an External Gain Resistor Across the High Speed
TIA ............................................................................................... 17
Direct 3.3 V Power via the AVDD and DVDD Connectors .. 6
AFE Die Watchdog Timer Example ........................................ 17
Power via USB from 8-Pin DEBUG Connector (P27)............ 6
ADuCM355 System Calibration .................................................. 18
Power via External 5 V Supply to 2-Pin Connector (P37) ..... 6
High Speed TIA Gain Resistor Calibration ............................ 18
Connecting an Electrochemical Sensor ......................................... 7
Low Power TIA0/TIA1 Gain Resistor Calibration ............... 20
Getting Started with the Tool Chain ............................................. 8
Mass Erasing a Device Not Responding to SWD Commands. 22
Downloading the Integrated Development Environment
(IDE) .............................................................................................. 8
Ordering Information.................................................................... 23
Bill of Materials .......................................................................... 23
Installing the ADuCM355 Support Package ............................ 8
REVISION HISTORY
4/2021—Rev. 0 to Rev. A
Changes to Features Section, Equipment Needed Section,
Software Needed Section, and General Description Section ..... 1
Deleted MicroUSB Connector, P4 Setup Section Heading ........ 4
Changes to Power Configurations Section, MicroUSB Direct
Power via P4 and ADP7158 LDO Regulator Section, and
Figure 2 Caption ............................................................................... 4
Changes to Direct 3.3 V Power Via the AVDD and DVDD
Connectors Section, Jumper Setup with Direct 3.3 V Connection
Section, Power via USB from 8-Pin Debug Connector (P27)
Section, Jumper Setup with Power via USB Section, Figure 5
Caption, and Power via External 5 V Supply to 2-Pin Connector
(P37) Section ..................................................................................... 6
Changes to Connecting an Electrochemical Sensor Section ...... 7
Deleted Figure 8; Renumbered Sequentially ................................ 7
Changed Getting Started with the Tool Chain Section to
Getting Started with the Tool Chain Section ............................... 8
Changes to Downloading the Integrated Development
Environment (IDE) Section, Installing the ADuCM355 Support
Package Section, Running a GPIO Example in IAR Embedded
Workbench Section, and Project Folder Structure Section ........ 8
Replaced Figure 9 ............................................................................. 9
Changes to Compiling and Running Firmware Section and
Figure 11 Caption ........................................................................... 10
Replaced Figure 10 and Figure 12 ................................................ 10
Replaced Figure 14 ......................................................................... 11
Added Running a GPIO Example in Keil μVision Section,
Figure 15, and Figure 16; Renumbered Sequentially ................ 11
Deleted Figure 19 ........................................................................... 11
Added Figure 17 to Figure 19 ....................................................... 12
Changes to Application Examples Section, Cyclic Voltammetry
Example Section, and Figure 22 Caption .................................... 13
Added Figure 21 ............................................................................. 13
Changes to Figure 23 Caption, EIS Example Section, and
Chronoamperometry Example Section ...................................... 14
Replaced Figure 23 and Figure 25 ................................................ 14
Added Figure 24 ............................................................................. 14
Replaced Figure 28 and Figure 29 ................................................ 15
Changes to Figure 28 Caption and DC Current
Example Section ............................................................................. 15
Changes to 4-Lead Electrochemical Sensor
Example Section ............................................................................. 16
Added Figure 30 ............................................................................. 16
Moved Connecting an External Gain Resistor Across the High
Speed TIA Section, AFE Watchdog Timer Example Section,
and Figure 32 .................................................................................. 17
Changes to AFE Die Watchdog Timer Example Section ......... 17
Added ADuCM355 System Calibration Section ....................... 18
Moved High Speed TIA Gain Register Calibration Section..... 18
Deleted Figure 29 ........................................................................... 18
Changes to High Speed TIA Gain Resistor
Calibration Section......................................................................... 18
Deleted Figure 33 ........................................................................... 18
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EVAL-ADuCM355QSPZ Evaluation Board
Changes to Figure 33 ......................................................................19
Moved Figure 26 to Figure 28 .......................................................19
Deleted Figure 36 ............................................................................19
Moved Low Power TIA0/TIA1 Gain Resistor Calibration
Section and Figure 36 .....................................................................20
Changes to Low Power TIA0/TIA1 Gain Resistor
Calibration Section .........................................................................20
Moved Figure 37 and Figure 38 ....................................................21
Changes to Mass Erasing a Device Not Responding to
SWD Commands Section ..............................................................22
UG-1308
2/2019—Revision 0: Initial Version
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EVAL-ADuCM355QSPZ Evaluation Board
POWER CONFIGURATIONS
This section describes the four different options to power the
EVAL-ADuCM355QSPZ. The different power options include
the following:
Power via a microUSB connector, P4, and the onboard ADP7158 low dropout (LDO) regulator, which
is the default power option.
Connect 3.3 V to the AVDD and DVDD connectors.
This setup is useful for measuring the current
consumption of the EVAL-ADuCM355QSPZ via the
current meter.
Power via the 8-pin P27 debug header (a different
USB connection option to the PC).
Power via an external 5 V supply to the 2-pin JP37
connector. Optionally, an external 5 V supply can
power the ADP7158 instead of the USB using this
setup.
To power the EVAL-ADuCM355QSPZ via the P4 microUSB
connector, take the following steps:
1.
2.
Ensure that the JP40 and JP42 to JP46 jumpers are
inserted. These jumpers control the features shown in
Table 1.
Remove the JP37 jumper.
Table 1. Jumper Connections
Jumper
JP45 and
JP46
JP40
JP42
JP43 and
JP44
Description
Connect the UART pins from the ADuCM355 to the
UART to USB transceiver chip (U2) (see Figure 3).
Connects the 5 V USB supply to the LDO input (U3)
(see Figure 4).
Connects the 3.3 V LDO output to the EVALADuCM355QSPZ power supply filters (see Figure 4).
Connect the DVDD and AVDD rails to filters for the
DVDD and AVDD analog supplies to the ADuCM355
(see Figure 4).
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MicroUSB DIRECT POWER VIA P4 AND ADP7158
LDO REGULATOR
Figure 2. Direct Power via MicroUSB Cable
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EVAL-ADuCM355QSPZ Evaluation Board
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3V3VOUT
5VUSB
C37
C38
0.1µF
0.1µF
DGND
3V3VOUT
1
VCCIO
7
8
USBD–
15
USBD+
14
RI
RTS
DSR
CBUS1
CTS
CBUS2
USBDM
CBUS3
USBDP
CBUS4
DGND
PAD
4
EP
GND
AGND
28
1
30
31
P0.11_SIN
2
DGND
JP46
32
CBUS0
DCD
C40
0.1µF
3V3VOUT
16
22
21
10
11
9
NC
FT232RQ
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DGND
DTR
29
6
TXD
RXD
25
3
JP45
M20-9990245
OSCI
23
2
13
2
5
1
OSCO
12
P0.10_SOUT
3V3OUT
TEST
24
27
RESET
20
26
17
18
U2
19
VCC
DGND
Figure 3. JP45 and JP46 Connect the ADuCM355 UART Pins to the USB Transceiver
1
JP37
2
U3
1
JP6
1µF
1µF
C44
C43
C42
10µF
C41
0.1µF
0
2
9
1
VIN
VOUT
10
2
VIN
VOUT
3
5
EN VOUT_SENSE
4
BYP
8
VREG
7
REF
6
REF_SENSE
EP
PAD
C45
E4
JP43
1
2
JP42
1
2
1
2
DVDD_PREFILTER
C46
10µF
R9
DVDD
2.2Ω
60Ω
AT 100MHz
C47
0.1µF
C54
0.1µF
DGND
DGND
R17
560Ω
DS1
A
C
SML-310MTT86
DGND
1µF
E3
JP44
1
2
1
2
AVDD_PREFILTER
R8
60Ω
AT 100MHz
DGND
AVDD
2.2Ω
C55
0.1µF
AGND
Figure 4. Schematic Section with Key Jumpers Around LDO and Power Supply
Rev. A | Page 5 of 24
C57
10µF
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JP40
1
2
1
5VUSB
JP36
2
ADP7158ACPZ-3.3-R7
DGND
UG-1308
EVAL-ADuCM355QSPZ Evaluation Board
DIRECT 3.3 V POWER VIA THE AVDD AND DVDD
CONNECTORS
To measure the ADuCM355 current consumption (IDD), connect
3.3 V directly to the AVDD and DVDD connectors.
To power the EVAL-ADuCM355QSPZ in this case, apply a
3.3 V supply directly to Pin 1 on the AVDD connector and to
Pin 1 on the DVDD connector.
Jumper Setup with Direct 3.3 V Connection
The jumper settings required when using a 3.3 V connection
are as follows:
1.
2.
Insert JP32, JP34, JP43, and JP44.
Remove JP42.
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For additional information, see Figure 6.
POWER VIA USB FROM 8-PIN DEBUG
CONNECTOR (P27)
Figure 5. Power via 8-Pin P27 Debug Connector
If using the older USB-SWD/UART and debug interface, the
ADuCM355 can also be powered from the USB. The UART to
USB interface is handled by the USB-SWD/UART-EMUZ board.
Jumper Setup with Power via USB
The last power supply option is to connect an external 5 V
supply to the 2-pin P37 connector. This 5 V supply is the input to
the ADP7158 LDO regulator that has a 3.3 V output voltage. Do
not connect the microUSB cable to P4. This option is a debug or
test option only.
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Close JP35, JP40, JP42, JP43, and JP44 when using power via
the USB (see Figure 5).
POWER VIA EXTERNAL 5 V SUPPLY TO 2-PIN
CONNECTOR (P37)
Figure 6. Power DVDD and AVDD Directly via Power Header Blocks
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EVAL-ADuCM355QSPZ Evaluation Board
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CONNECTING AN ELECTROCHEMICAL SENSOR
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The ADuCM355 has two measurement channels (CH0 and CH1)
for electrochemical sensors. A 2-lead, 3-lead, or 4-lead sensor
can be connected to either CH0 or CH1. Figure 7 shows an
electrochemical sensor connected to CH1.
Figure 7. Sensor Connector
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EVAL-ADuCM355QSPZ Evaluation Board
GETTING STARTED WITH THE TOOL CHAIN
DOWNLOADING THE INTEGRATED
DEVELOPMENT ENVIRONMENT (IDE)
RUNNING A GPIO EXAMPLE IN IAR EMBEDDED
WORKBENCH
The ADUCM355 firmware examples use either the IAR
Embedded Workbench® or Keil μVision® IDEs to run the
firmware. Ensure that a full or evaluation version of either
software is downloaded and installed to run the example
applications. IAR Embedded Workbench supports the
ADUCM355 with Version 8.32.1 and later for ARM. Keil μVision
supports Version 5.28 and later.
The ADUCM355 CMSIS pack is not supported for IAR
Embedded Workbench. To use IAR Embedded Workbench,
clone the repository from the GitHub directory, as described in
the Installing the ADuCM355 Support Package section. To run
the general-purpose input/output (GPIO) example, navigate to
examples > DigitalDie > M355_GPIO > iar. Double click the
M355_GPIO.eww file to open the project in the IAR Embedded
Workbench (see Figure 8).
INSTALLING THE ADuCM355 SUPPORT PACKAGE
git clone -recursive https://github.com/analogdevicesin
c/aducm355-examples.git
This command downloads the main repository and the
submodules. If the code from the web browser downloads, the
examples/ad5940lib folder does not download automatically and
compilation errors occur. Download the code manually from
GitHub in the shared library file that contains the ADUCM355
examples and the AD5940 example. Both devices have the same
analog front end.
When using Keil μVision, the ADUCM355 device family pack
can be downloaded as part of a Cortex® microcontroller
software interface standard (CMSIS) pack. Download the pack
from GitHub.
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The ADUCM355 firmware examples are source controlled on
www.GitHub.com. To clone the repository, execute the
following command of the Git command line:
Figure 8. M355_GPIO.eww File Location
Project Folder Structure
The IAR Embedded Workbench project folder structure is
shown to the left of the IAR Embedded Workbench window
(see Figure 9). The app folder contains files specific to the open
application. In Figure 9, M355_GPIO.c is the example shown.
The common folder contains the required library files for the
open application. For the GPIO example, the library files are
ad5940.c, ClkLib.c, DioLib.c, IntLib.c, and UrtLib.c. The
startup folder contains start-up files for the microprocessor, and
the Output folder contains the files that are autogenerated by
the IDE. All subsequent firmware examples follow this folder
structure in the IAR Embedded Workbench.
The sample firmware contains the following folders:
The common folder contains all library files common
to all applications.
The examples folder contains specific example
projects. This folder is divided into the following three
subfolders:
The AnalogDie folder contains example projects that
demonstrate how to use specific blocks on the analog die.
The DigitalDie folder contains examples that
demonstrate how to use the digital die and peripherals
such as SPI or I2C.
The ApplicationExamples folder contains application
level examples such as M355_ECSns_DualWE, which
demonstrates how to configure a dual working electrode
sensor and calculate gas parts per million (PPM)
readings.
The inc folder contains files included for the
microprocessor.
Rev. A | Page 8 of 24
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EVAL-ADuCM355QSPZ Evaluation Board
Figure 9. IAR Embedded Workbench
Rev. A | Page 9 of 24
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EVAL-ADuCM355QSPZ Evaluation Board
Compiling and Running Firmware
3.
To compile and run the ADuCM355 firmware, take the
following steps:
In the IAR Embedded Workbench window, navigate to
Project > Rebuild All (see Figure 10).
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1.
To run the firmware on the ADuCM355, ensure that the
EVAL-ADuCM355QSPZ is powered on and the J-Link
debugger is connected to P3 on the EVAL-ADuCM355QSPZ,
then click Download and Debug to load the firmware to
the ADuCM355 and launch the debugger (see Figure 12).
Launching and downloading the debugger can take a few
seconds or more.
Figure 12. Launching the Debugger
Open a terminal program such as RealTerm to view the
UART data from the ADuCM355 (see Figure 13). The
baud rate is 230,400 bps.
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4.
Figure 13. UART Data in RealTerm
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5.
Figure 10. Project > Rebuild All
Click Rebuild All. The IDE begins building the executable
from the source files, which may take a couple of seconds.
The message shown in Figure 11 appears in the Build window
when the build is complete.
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2.
Figure 11. Build Output Window
Rev. A | Page 10 of 24
Figure 14 shows the debug interface. Click the blue arrow
(shown in the red circle) to begin code execution. The UART
prompts the user to press either the S2 or S3 button. The
DS2 LED toggles on and off with each button press.
UG-1308
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EVAL-ADuCM355QSPZ Evaluation Board
Figure 14. Debug Interface
RUNNING A GPIO EXAMPLE IN KEIL μVISION
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To download the ADuCM355 device family pack for Keil μVision,
visit the Keil website and search for MDK5 software packs. Save
the .pack file to a directory on the PC. Double click the file to
install the pack.
Figure 16. Opening Pack Installer in Keil μVision
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On the left side of the pack installer window, click the Devices
tab and select the ADuCM355, as shown in Figure 17. On the
right side of the pack installer window, click the Examples tab
(see Figure 18). All supported example projects for the
ADuCM355 display as shown in Figure 18.
Figure 15. ADuCM355 Pack Installer
Follow the on screen instructions to unzip the contents from
the .pack file, and click Finish when complete. Open Keil μVision,
and open the pack installer, as shown in Figure 16.
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EVAL-ADuCM355QSPZ Evaluation Board
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Find the M355_GPIO (EVAL-ADuCM355QSPZ) example, and
then click the Copy button next to the example to copy the
example project into a local directory and launch the project in
Keil μVision. To compile and build the project, click the Rebuild
icon shown in the blue circle in Figure 19. To load the code
onto the ADuCM355, ensure that the EVAL-ADuCM355QSPZ
is powered on and the mIDAS-Link debugger is connected, and
then click the load icon shown in the red circle in Figure 19.
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Figure 17. Pack Installer Devices
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Figure 19. Build and Load Project
Figure 18. ADuCM355 Examples
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EVAL-ADuCM355QSPZ Evaluation Board
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APPLICATION EXAMPLES
This section describes how to use the ADuCM355 application
examples that are part of the ADuCM355 software development
kit (SDK). The ADuCM355 is a dual-die device that has a
Cortex-M3 digital die and an analog front-end (AFE) die. The
AFE die and the AD5940 are the same except for some differences
in which pins are bonded out, and both devices share a
common library interface to simplify firmware development.
The main library files in the SDK are AD5940.c and AD5940.h.
All functions in this library are compatible with the
ADuCM355, AD5940, and AD5941. All AFE related function
names begin with AD5940_. Some projects in the SDK have files
labeled AD5940Main.c, which contain the upper controllers that
control the AFE die and are mostly common between the
ADuCM355, AD5940, and AD5941.
contains the low level device configuration for the cyclic
voltammetry measurement.
Figure 21 shows the AD5940RampStructInit (void) function
defined in the AD5940Main.c file. Modify the main parameters
for the signal such as ramp start voltage, ramp peak voltage,
and ramp duration for this function within this file.
The Cyclic Voltammetry Example section outlines how to use
the following example projects:
M355_ECSns_CycloVoltammetry
M355_ECSns_EIS
M355_ECSns_CappaTest
M355_ECSns_SingleWE
M355_ECSns_DualWE
M355_AfeWdt
Cyclic voltammetry is a common electrochemical measurement
in which the current on the sense electrode is measured in
response to a ramp like voltage applied on the reference electrode.
Figure 20 shows a typical, stepped differential voltage between
the reference and working electrodes of the sensor where V1 is
the initial voltage on the reference electrode and V2 is the peak
voltage on the reference electrode.
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CYCLIC VOLTAMMETRY EXAMPLE
Figure 21. Cyclic Voltammetry Parameters
To test the firmware, construct a dummy electrochemical cell
using 1 kΩ resistors in a star network (see Figure 22). Connect
each resistor network pin to the CE0, RE0, SE0, and DE0 pins
on the P5 header. Ensure that the configurations are constructed
as shown in Figure 22.
VOLTAGE
V2
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TIME
Figure 22. Resistor Star Network Connected to P5 Header
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V1
Figure 20. Typical Cyclic Voltammetry Waveform
In the ADuCM355 firmware package, the M355_ECSns_
CycloVoltammetry project demonstrates how to implement a
cyclic voltammetry measurement on the ADuCM355. There are
two main files within the project, AD5940Main.c and Ramp.c.
The AD5940Main.c file contains the upper controllers that
control the high level application parameters. The Ramp.c file
To begin measuring and gathering data, open a terminal program
such as RealTerm. Configure the baud rate for 230,400 bps.
Compile and build the project in the preferred IDE and load
the code onto the ADuCM355. Run the measurement, and save
the data to a .csv file for processing. If the definition of
OPT_RAMP_MEAS (parameter defined in the Ramp.h file) is
set to 1,the following four measurements are performed:
Rev. A | Page 13 of 24
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EVAL-ADuCM355QSPZ Evaluation Board
In the AD5940Main.c file, there are several configurable
parameters that are shown in Figure 24. To couple the ac excitation
signal on top of a dc bias, set the SensorCH0.SensorBias parameter.
To apply a frequency sweep, modify the SweepCfg parameters.
Current through SE0.
Voltage on SE0.
Voltage on RE0.
Current through SE0 measured a second time.
To plot the current response of the test, open the saved .csv file in
Microsoft® Excel. Figure 23 shows the plotted response current.
600
500
400
CURRENT (µA)
300
200
100
0
–100
–200
–300
–400
–500
INDEX
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1
17
33
49
65
81
97
113
129
145
161
177
193
209
225
241
257
273
289
305
321
337
353
369
385
–600
Figure 23. Example SE0 Channel Current Measurement
EIS is a common electrochemical measurement in which an ac
excitation signal is applied to an electrochemical cell. The response
current is measured, and the impedance is calculated.
On the ADuCM355, the EIS measurement is a three-step process.
The response current in each step is measured using a high
speed transimpedance amplifier (TIA).
The EIS measurement process is as follows:
1.
2.
3.
A signal is applied across RCAL.
A signal is applied across RLOAD.
A signal is applied across ZSENSOR + RLOAD.
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EIS EXAMPLE
Figure 24. EIS Parameters
To run the impedance measurement, take the following steps:
1.
2.
3.
4.
5.
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In each step of the measurement processes, the measured current is
input to the discrete Fourier transform (DFT) hardware accelerator
that calculates the complex number of the current measurement
and provides the real and imaginary parts. RCAL is a precision
resistor connected to the ADuCM355 RCAL0 and RCAL1 pins,
RLOAD is the internal load resistor on the SE0 path, and ZSENSOR is
the impedance under test.
Launch the debugger in the IAR Embedded Workbench.
Open a terminal program with a 230,400 bps baud rate.
Execute the code.
A prompt to press the S2 switch is sent over the UART and
displays in the terminal. Press S2 to begin the impedance test.
When the impedance measurement completes, the results
are sent to the UART (see Figure 25). Save the results in a
Microsoft Excel file for further analysis, if necessary.
Use the following equation to calculate the actual impedance:
Figure 25. Impedance Results
ZSENSOR = (ZSENSOR + RLOAD)− ZRLOAD
where:
ZSENSOR + RLOAD is the impedance of RSENSOR and RLOAD measured
together as a single impedance.
ZRLOAD is the impedance of RLOAD.
Open the M355_ECSns_EIS example project in the preferred
IDE. For the purpose of this initial test, a dummy electrochemical
cell is used. Connect three 1 kΩ resistors in a star network, and
connect the star network to the CE0, RE0, and SE0 pins on P5
of the EVAL-ADuCM355QSPZ (see Figure 22).
CHRONOAMPEROMETRY EXAMPLE
Chronoamperometry is an electrochemical technique in which
the voltage applied to an electrochemical cell is stepped. The
response current on the sense electrode is measured. Figure 26
and Figure 27 show typical chronoamperometric measurement
and sensor responses.
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EVAL-ADuCM355QSPZ Evaluation Board
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EXCITATION WAVEFORM
VOLTAGE
600
500
Figure 26. Typical Chronoamperometric Voltage Stimulus Waveform
RESPONSE WAVEFORM
CURRENT (µA)
TIME
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400
300
200
100
0
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INDEX
1711
1597
1483
1369
1255
1141
913
1027
799
685
571
457
343
229
1
CURRENT
115
–100
Figure 28. Output Data Using the M355_ECSns_Capatest Example with
Three 1 kΩ Resistors
TIME
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DC CURRENT EXAMPLE
Figure 27. Typical Chronoamperometric Current Response Waveform
In the ADuCM355 firmware development package, the M355_
ECSns_CapaTest project implements a chronoamperometric
measurement.
The AD5940Main.c file contains an
AD5940AMPStructInit()function that modifies the main
measurement parameters.
For the following example, only CH0 is used and all default
values are used. The resistor star model is connected to P5, as
per the examples described in the Cyclic Voltammetry Example
section and the EIS Example section.
Load the project in the preferred IDE and open a terminal
program. Compile and build the project and load the code onto
the ADuCM355. Start the code execution and save the UART
data to a .csv file for processing.
The dc current is a standard electrochemical measurement.
Depending on the sensor type, a bias voltage is applied between
the reference and sense electrodes. The current output on the
sense electrode is measured.
In the ADuCM355 firmware package, the M355_ECSns_
SingleWE project implements a dc current measurement on
an electrochemical cell connected to CH0. The measurement
parameters can be configured in the AD5940AMPStructInit()
function in the AD5940Main.c file. For testing purposes, connect
the 1 kΩ resistor star network to P5. Set the Vzero firmware
parameter to 1100 mV, and set the SensorBias firmware
parameter to 500 mV to apply a 500 mV bias across the 1 kΩ
resistor network. Ensure that the EVAL-ADuCM355QSPZ is
powered on and that the debugger is connected to the PC. Then
open the project in the preferred IDE, and compile and run the
example application. Open a terminal program to view the
results. The output is the current measured through the SE0 pin
on P5 of the EVAL-ADuCM355QSPZ (see Figure 29).
The example code sends the following three arrays of results to
the UART at a 230,400 bps baud rate:
The first set of values includes the current
measurement results for the SE0 channel in μA.
The next set of values includes the voltage
measurement results for the SE0 channel in V.
The final set of values includes the voltage
measurement results for the RE0 channel in V.
16887-021
Figure 29. CH0 Output
Rev. A | Page 15 of 24
UG-1308
EVAL-ADuCM355QSPZ Evaluation Board
4-LEAD ELECTROCHEMICAL SENSOR EXAMPLE
Figure 30 shows the configurable parameters located in the
AD5940Main.c file. Modify the value of the correct
LpTiaRtiaSel parameter for each channel based on the
maximum expected current.
Many electrochemical sensors come in 4-lead packages that have a
counter, a reference, and two sensing electrodes. The ADuCM355
supports biasing and measuring of these sensor types.
Figure 31 shows the connection details between the 4-lead
sensor and the ADuCM355.
The M355_ECSns_DualWE example project configures the
low power, potentiostat CH0 channel to bias the sensor. The
current flowing to and from the SE0 pin is measured via the
low power TIA Channel 0 (TIA0). The current flowing from
the SE1 electrode is measured via the low power TIA Channel 1
(TIA1).
The TIA amplifiers convert the current to a voltage that is
measured via the analog-to-digital converter (ADC), and the
source code calculates the current flowing in each electrode.
16887-231
The M355_ECSns_DualWE code example project is located in
the examples folder.
Figure 30. Dual Working Electrode Configuration
VBIAS0
SW13
SW12
CE0
VZERO0
VBIAS
SW2
LPDAC0
PA
100nF
CAP_POT0
VZERO
CE0
SE1
SW3
RE0
VZERO TO LPTIA1+ INPUT
SW14
SE0
LPTIA0
SE0
RLOAD
RTIA
RF
SW0
VZERO
SE1
LPTIA1
ADC
MUX
RLOAD
RTIA
RF
SW0
AIN7_LPF1 AIN4_LPF0
Figure 31. Circuit Setup for 4-Lead, Dual Gas Detection Sensor
Rev. A | Page 16 of 24
16887-136
RE0
EVAL-ADuCM355QSPZ Evaluation Board
UG-1308
CONNECTING AN EXTERNAL GAIN RESISTOR
ACROSS THE HIGH SPEED TIA
AFE DIE WATCHDOG TIMER EXAMPLE
The ADuCM355 supports a watchdog timer on the AFE die.
The watchdog timer clocks via an oscillator that is completely
independent of the clocks in the Cortex-M3 core. Therefore,
the watchdog timer meets the IEC 61508 requirement of an
independent watchdog timer for a microcontroller and eliminates
the need for an external watchdog timer chip.
The internal high speed TIA has a programmable gain resistor
that allows the user to either configure a high speed current
measurement channel for different input current ranges, or to
connect an external gain resistor instead.
The EVAL-ADuCM355QSPZ supports the connection of an
external transimpedance amplifier resistor (RTIA) across the
AIN0 pin and DE0 pin, which is labeled RTIA on the top side
of the printed circuit board (PCB).
The M355_AfeWdt code example project in the examples
folder shows how to configure the windowed watchdog mode.
The WDT_INTERRUPT_EN #define parameter configures the
project to generate either a reset or an interrupt.
The current flows from the AIN0 pin into the high speed TIA
inverting input with the HSTIA connected to the DE0 pin.
The project uses a default timeout period of 16 sec. A minimum
waiting period of 4 sec is required before a watchdog refresh is
allowed. Refreshing the watchdog within 4 sec causes a reset or
interrupt to occur depending on the setting of Bit 1 of the
WDTCON register. If the timeout period elapses, a reset or
interrupt also occurs. To avoid a reset or interrupt generation,
refresh the watchdog timer within the minimum period of 4 sec
and the timeout period of 16 sec.
The ADC selects the HPTIA_P and HPTIA_N input channels to
measure the voltage drop across the external RTIA resistor (see
Figure 32).
When the user populates the external gain resistor, the gain
resistor can be used instead of the internal gain resistor. Figure 32
shows the external resistor connected to AIN0 and DE0. Note
that RLOAD_03 and RTIA2_03 are set to 0 Ω so as not to effect the
measurement.
The watchdog timer refresh is triggered when the ASCII
Character 1 is sent from the PC.
The M355_ExternalRTIA code example project in the examples
folder demonstrates how to set up the high speed TIA for an
external gain resistor.
1.11V REFERENCE
HSTIA
T1
EXTERNAL
RCAL
T10
DE0
RLOAD_03
HPTIA_P
HPTIA_N
RTIA2_03
16887-030
AIN0
Figure 32. ADuCM355 External RTIA Connection to the High Speed TIA
Rev. A | Page 17 of 24
UG-1308
EVAL-ADuCM355QSPZ Evaluation Board
ADUCM355 SYSTEM CALIBRATION
Because of the complexity of the ADuCM355 and the large
number of voltage and current measurement channels on the
device, many calibration routines are implemented to ensure a
high level of measurement accuracy. This section describes the
main calibration functions with links to further online
information.
HIGH SPEED TIA GAIN RESISTOR CALIBRATION
The high speed TIA has three different programmable gain
resistor options.
Adjust the gain resistors to convert the current from the SE0, SE1,
and DE0 inputs or from the DE1 input to a differential voltage
across the RTIA2 resistor, RTIA2_03 resistor, or RTIA2_05 resistor.
The RTIA2, RTIA2_03, and RTIA2_05 resistors have an initial accuracy
range and vary with temperature, as specified in the ADuCM355
data sheet where RTIA2 is the HPTIA RTIA gain resistor on the
SE0 and SE1 inputs, and RTIA_02 and RTIA_05 correspond to the
HPTIA RTIA gain on the DE0 and DE1 inputs.
If the high speed TIA is uncalibrated for the selected gain resistor
and the ADC programmable gain amplifier (PGA) setting, an error
is present when measuring an absolute input current.
To generate a precision calibration current, use the high speed
DAC to create a differential voltage across an external precision
RCAL resistor that is connected to the ADuCM355 RCAL0 pin
and RCAL1 pin. The precision calibration current can be
routed through any of the three high speed TIA gain resistors.
Because the calibration current value is known and the ADC
can measure the voltage drop across the RTIA2, RTIA2_03, and RTIA2_05
resistors, the exact RTIA resistor value can be determined.
Figure 33 to Figure 35 show the setup and switch settings that
connect the high speed DAC output to the external RCAL
resistor so that the current flows into the high speed TIA and
RTIA2, RTIA2_03, and RTIA2_05 gain resistors, respectively.
The AD5940.c file has a function that calibrates each gain
resistor for the HSTIA. For further details on how to use this
function, visit https://wiki.analog.com/resources/eval/userguides/eval-ad5940/calibration_routines/hstia_cal?doc=EVALADuCM355QSPZ-UG-1308.PDF.
Rev. A | Page 18 of 24
EVAL-ADuCM355QSPZ Evaluation Board
PR0
RCAL0
P_NODE
P
DR0
HSDAC
N
EXCITATION
AMPLIFIER
NR1
EXTERNAL
RCAL
UG-1308
P_NODE
N_NODE
N_NODE
RCAL1
CALIBRATION
CURRENT
1.11V (HSTIACON[1:0] = 00b]
T9
ADC
INPUT
MUX
PGA
ADC
HPTIA_P
HPTIA_P
HPTIA_N
TR1
16887-023
RTIA2
HPTIA_N
Figure 33. High Speed DAC, High Speed TIA, and Switch Matrix Settings for RTIA2 Calibration
PR0
RCAL0
P_NODE
P
DR0
HSDAC
EXCITATION
AMPLIFIER
NR1
EXTERNAL
RCAL
N
P_NODE
N_NODE
N_NODE
RCAL1
ADC
INPUT
MUX
CALIBRATION
CURRENT
PGA
ADC
HPTIA_P
HPTIA_N
TR1
1.11V (HSTIACON[1:0] = 00b]
DE0
T6
HPTIA_P
T10
R LOAD_03
16887-024
RTIA2_03
HPTIA_N
Figure 34. High Speed DAC, High Speed TIA, and Switch Matrix Settings for RTIA2_03 Calibration
PR0
RCAL0
P_NODE
P
DR0
HSDAC
EXCITATION
AMPLIFIER
NR1
EXTERNAL
RCAL
N
P_NODE
N_NODE
N_NODE
RCAL1
ADC
INPUT
MUX
CALIBRATION
CURRENT
PGA
ADC
HPTIA_P
HPTIA_N
TR1
1.11V (HSTIACON[1:0] = 00b]
DE1
T8
HPTIA_P
RTIA2_05
HPTIA_N
Figure 35. High Speed DAC, High Speed TIA, and Switch Matrix Settings for RTIA2_05 Calibration
Rev. A | Page 19 of 24
16887-025
T10
R LOAD_05
UG-1308
EVAL-ADuCM355QSPZ Evaluation Board
LOW POWER TIA0/TIA1 GAIN RESISTOR
CALIBRATION
RCAL resistor that is connected to the ADuCM355 RCAL0 pin
and RCAL1 pin. The precision calibration current is routed
through either the low power TIA0 gain resistor or the low
power TIA1 gain resistor.
The ADuCM355 contains two independent, low power
TIA channels.
Because the calibration current value is known and the ADC
can measure the voltage drop across each RTIA resistor, the exact
RTIA resistor value can be determined.
Each TIA has an independent, programmable gain resistor to
scale the input current from the SE0 pin and the SE1 pin to a
voltage that the ADC can measure.
Figure 37 and Figure 38 show the setup and switch settings
used to connect the low power DAC outputs to the external
RCAL resistor so that the current flows into the LPTIAx gain
resistors, LPRTIAx.
Figure 36 shows the gain resistor for the low power TIA0. A
similar diagram is valid to use for the low power TIA1.
Similar to the example described in the High Speed TIA Gain
Resistor Calibration section, adjust the gain resistor to convert
the current from the SE0 input pin and the SE1 input pin to a
differential voltage across the RTIA resistors.
Several example projects in the ADuCM355 SDK implement a
function to calibrate the gain resistor. For further details on
how to use this function, visit
https://wiki.analog.com/resources/eval/user-guides/evalad5940/calibration_routines/lptia_cal?doc=EVALADuCM355QSPZ-UG-1308.PDF.
These resistors have an initial accuracy range and vary with
temperature, as specified in the ADuCM355 data sheet.
When these resistors are uncalibrated, an error is present when
measuring an absolute input current.
To generate a precision calibration current, use the low power
DAC to create a differential voltage across an external precision
VBIAS0
RE0
SW12
VZERO0
VREF2V5
SW13
AIN4/LPF0
ULPBUF
SW15
CE0
LPDAC0
PA
SW3
SW2
CAP_POT0
SW8
SW14
SW10
RE0
10kΩ
10kΩ
TO
CHANNEL 1
ULPREF
SW6
SW4
SW11
SE0
LPTIACON0
[12:10]
RLPF
ULPTIACON0
[15:13]
LPTIA
RLOAD
SW7
SW9
PROGRAMMABLE
GAIN RESISTOR
RTIA
SW1
LPTIA0_P_LPF0
ADC
MUX
LPTIACON0
FORCE/SENSE
[9:5]
RC0_0
SW0
SW5
16887-027
RC0_1
Figure 36. LPTIA0 Gain Calibration Resistor
Rev. A | Page 20 of 24
EVAL-ADuCM355QSPZ Evaluation Board
UG-1308
VBIAS0
VZERO0
SW12
SW13
VZERO0
LPDAC0
RCAL1
TR1
VBIAS0
HSTIA
T9
VZERO0
VBIAS0
EXTERNAL
RCAL
NR1
N_NODE
PR0
P_NODE
RCAL0
DR0
P_NODE
N_NODE
ADC
INPUT
MUX
CALIBRATION
CURRENT
SE0
PGA
ADC
LPTIA0_P
LPTIA0_N
D7
SW5
LPTIA0
RLOAD
LPTIA0_P
16887-129
LPRTIA0
LPTIA0_N
Figure 37. High Speed TIA, Low Power TIA0, and Switch Matrix Settings for LPRTIA0 Resistor Calibration
VBIAS1
VZERO1
SW12
SW13
VZERO1
LPDAC1
RCAL1
TR1
VBIAS1
HSTIA
T9
VZERO1
NR1
PR0
RCAL0
DR0
N_NODE
P_NODE
N_NODE
P_NODE
ADC
INPUT
MUX
CALIBRATION
CURRENT
SE1
PGA
ADC
LPTIA1_P
LPTIA1_N
D8
LPTIA1
SW5
RLOAD
LPTIA1_P
LPRTIA1
LPTIA1_N
Figure 38. High Speed TIA, Low Power TIA0, and Switch Matrix Settings for LPRTIA1 Resistor Calibration
Rev. A | Page 21 of 24
16887-130
VBIAS1
EXTERNAL
RCAL
UG-1308
EVAL-ADuCM355QSPZ Evaluation Board
MASS ERASING A DEVICE NOT RESPONDING TO SWD COMMANDS
To mass erase the user flash, take the following steps:
The SWD debug tools can only communicate with the
microcontroller when the device is in active mode.
Similarly, watchdog or software resets that occur when a debug
session starts cause the debug session to end with errors.
To recover a device that is locked in this way, mass erase the
user flash.
1.
2.
3.
16887-031
4.
Hold the S3 button down to place the device in boot mode.
While holding the S3 button down, press and release the
reset button (S1) to lock the device in a loop in the kernel
space so that the device does not execute user code.
In the IAR Embedded Workbench, navigate to Project >
Download > Erase memory (see Figure 39).
The window shown in Figure 40 opens. Click OK.
16887-032
Figure 39. IAR Embedded Workbench Erase Flash Memory Option
Figure 40. Erase All Flash Memory
Rev. A | Page 22 of 24
EVAL-ADuCM355QSPZ Evaluation Board
UG-1308
ORDERING INFORMATION
To view the complete EVAL-ADuCM355QSPZ schematic, visit https://www.analog.com/media/en/technical-documentation/evaluationdocumentation/EVAL-ADuCM355-RevBSchematic.pdf.
To view the PCB layout, visit https://www.analog.com/media/en/technical-documentation/evaluation-documentation/EVALADuCM355-EvalBrd_Layout.pdf.
BILL OF MATERIALS
Table 2.
Name
AVDD, DVDD
Value
25.195.0253.0
Part Description
Connector PCB terminal block 3.5 mm
C1, C2, C14,
C34, C35, C36
C9 to C12, C17
to C21, C28,
C29
C13
C23, C25 to
C27, C30, C31
C24
C32, C33
C37 to C41,
C47, C49, C53
to C55
C42, C46, C48,
C52, C57
C43 to C45
CH0, CH1
C_LPF0, C_LPF1
DS1
DS2
E1, E2
0.1 μF
Ceramic capacitor, X7R
0.1 μF
E3, E4
JP4, JP5, JP7 to
JP20
JP25 to JP36,
JP38 to JP46
JP6
P1
P14, P26
P2
Manufacturer
Wieland Electric
GMBH
Wurth Elektronik
Part No.
25.195.0253.0
Ceramic capacitor, X5R, ultrabroadband
American Technical
Ceramics
545L104KT10C
220 pF
0.47 μF
Ceramic capacitor, X7R
Ceramic capacitor, X5R, 0402
Kemet
Taiyo Yuden
C0402C221J5RACTU
LMK105BJ474KV-F
4.7 μF
7 pF
0.1 μF
Ceramic capacitor, X6S, general-purpose
Ceramic capacitor NP0 (C0G), high frequency, high-Q
Ceramic chip capacitor, X8R
Murata
Murata
TDK
GRM185C81A475KE11D
GJM1555C1H7R0CB01D
C1608X8R1E104K080AA
10 μF
60 Ω at 100 MHz
0
Inductor chip ferrite, 0.02 Ω dc resistance, 3.5 A
Resistance jumper
Johanson
Dielectrics
Yageo
Alphasense
Taiyo Yuden
ROHM
Panasonic
Murata
Manufacturing
Murata
Panasonic
250R18X106KV4E
1 μF
CO-A4
4.7 μF
SML-310MTT86
LNJ926W8CRA
80 Ω at 100 MHz
Tanceram® chip capacitor, X5R, low equivalent series
resistance (ESR)
Ceramic capacitor, Y5V
4-lead electrochemical sensor socket
Ceramic capacitor, 0805, X5R
LED, green surface mount
LED, blue surface mount
Ferrite bead, 0.1 Ω maximum dc resistance, 1 A
M20-9990245
Connector PCB, straight male jumper, 2-position,
M020779
Use existing E004447
Connector PCB, straight header 10-position
Connector PCB, dual straight header, 2-position
Connector PCB, 20-position, unshrouded male
header, 0.64 mm square post, 2.5 4 mm pitch, 5.84
mm post height, 2.54 mm solder tail
Connector PCB header, 2.54 mm square post, dual
row, right angle
Connector PCB header, straight male, 20-position
Connector PCB microUSB receptacle
Connector PCB, 18-position, female header,
shrouded dual row, straight, 2.54 mm solder tail, 2.54
mm pitch
Precision channel junction field effect transistor
(JFET) switch
Precision thick film chip resistor, R0603
Thick film chip resistor
Thick film chip resistor
0
TSW-110-08-G-S
TSW-101-07-G-D
TSW-120-07-S-S
P3
P4
P5
TSW-104-25-F-DRA
2520-6002-UB
47346-0001
IPS1-109-01-L-D
Q1, Q2
MMBFJ177
R1, R2
R10, R17
R14
150 kΩ
560 Ω
0Ω
P27
Rev. A | Page 23 of 24
8.85012E+11
CC0603ZRY5V6BB105
CO-A4
EMK212BJ475KG-T
SML-310MTT86
LNJ926W8CRA
BLM41PF800SN1L
BLM21PG600SN1D
ERJ-6GEY0R00V
Harwin
M20-9990245
Panasonic
Samtec
Samtec
Samtec
ERJ-3GSYJ0.0
TSW-110-08-G-S
TSW-101-07-G-D
TSW-120-07-S-S
Samtec
TSW-104-25-F-D-RA
3M
Molex
Samtec
2520-6002UB
47346-0001
IPS1-109-01-L-D
Fairchild
Semiconductor
Panasonic
Multicomp (SPC)
Multicomp (SPC)
MMBFJ177
ERJ-3EKF1503V
MC0063W06031560R
MC00625W040210R
UG-1308
Name
R15, R16
R3, R4
R5, R6, R7
R8, R9
RCAL
S1, S2, S3
TP3, TP4
U1
U2
U3
U4
Y1
EVAL-ADuCM355QSPZ Evaluation Board
Value
100 kΩ
100 kΩ
1 kΩ
2.2 Ω
200 Ω
B3S-1000
31022-00-21-0000-08-0
ADUCM355BCCZ
FT232RQ
ADP7158ACPZ-3.3R7
ADT7420UCPZ-RL7
32 MHz
Part Description
General-purpose chip resistor
Precision thick film chip resistor
Precision thick film chip resistor
Thick film chip resistor
Precision, ultrathin film chip resistor
Surface-mount mechanical key switch
Connector PCB pin receptacle
Manufacturer
Yageo
Panasonic
Panasonic
Vishay
Susumu Co, LTD
OMRON
Mill-Max
Part No.
RC0603JR-07100KL
ERJ-6ENF1003V
ERJ-6ENF1001V
CRCW08052R20FKEAHP
RG1608N-201-W-T1
B3S1000
3102-2-00-21-00-00-08-0
IC precision, analog and electrochemical sensor
microcontroller
IC USB serial UART
IC, 2 A, ultralow noise, high power supply rejection
ratio (PSRR), RF linear regulator, 3.3 V VOUT
IC, 16-bit, digital I2C temperature sensor
IC, crystal, ultramini size, low profile, 8 pF
Analog Devices, Inc.
ADuCM355BCCZ
FTDI Chip
Analog Devices
FT232RQ
ADP7158ACPZ-3.3-R7
Analog Devices
Epson Toyocom
ADT7420UCPZ-RL7
FA-128, 32MHZ, 10PPM,
8PF
I2C refers to a communications protocol originally developed by Philips Semiconductors (now NXP Semiconductors).
ESD Caution
ESD (electrostatic discharge) sensitive device. Charged devices and circuit boards can discharge without detection. Although this product features patented or proprietary protection
circuitry, damage may occur on devices subjected to high energy ESD. Therefore, proper ESD precautions should be taken to avoid performance degradation or loss of functionality.
Legal Terms and Conditions
By using the evaluation board discussed herein (together with any tools, components documentation or support materials, the “Evaluation Board”), you are agreeing to be bound by the terms and conditions set
forth below (“Agreement”) unless you have purchased the Evaluation Board, in which case the Analog Devices Standard Terms and Conditions of Sale shall govern. Do not use the Evaluation Board until you have
read and agreed to the Agreement. Your use of the Evaluation Board shall signify your acceptance of the Agreement. This Agreement is made by and between you (“Customer”) and Analog Devices, Inc. (“ADI”),
with its principal place of business at One Technology Way, Norwood, MA 02062, USA. Subject to the terms and conditions of the Agreement, ADI hereby grants to Customer a free, limited, personal, temporary,
non-exclusive, non-sublicensable, non-transferable license to use the Evaluation Board FOR EVALUATION PURPOSES ONLY. Customer understands and agrees that the Evaluation Board is provided for the sole
and exclusive purpose referenced above, and agrees not to use the Evaluation Board for any other purpose. Furthermore, the license granted is expressly made subject to the following additional limitations:
Customer shall not (i) rent, lease, display, sell, transfer, assign, sublicense, or distribute the Evaluation Board; and (ii) permit any Third Party to access the Evaluation Board. As used herein, the term “Third Party”
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to return to ADI the Evaluation Board at that time. LIMITATION OF LIABILITY. THE EVALUATION BOARD PROVIDED HEREUNDER IS PROVIDED “AS IS” AND ADI MAKES NO WARRANTIES OR REPRESENTATIONS OF
ANY KIND WITH RESPECT TO IT. ADI SPECIFICALLY DISCLAIMS ANY REPRESENTATIONS, ENDORSEMENTS, GUARANTEES, OR WARRANTIES, EXPRESS OR IMPLIED, RELATED TO THE EVALUATION BOARD
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, TITLE, FITNESS FOR A PARTICULAR PURPOSE OR NONINFRINGEMENT OF INTELLECTUAL PROPERTY RIGHTS. IN NO EVENT WILL
ADI AND ITS LICENSORS BE LIABLE FOR ANY INCIDENTAL, SPECIAL, INDIRECT, OR CONSEQUENTIAL DAMAGES RESULTING FROM CUSTOMER’S POSSESSION OR USE OF THE EVALUATION BOARD, INCLUDING BUT
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($100.00). EXPORT. Customer agrees that it will not directly or indirectly export the Evaluation Board to another country, and that it will comply with all applicable United States federal laws and regulations
relating to exports. GOVERNING LAW. This Agreement shall be governed by and construed in accordance with the substantive laws of the Commonwealth of Massachusetts (excluding conflict of law rules). Any
legal action regarding this Agreement will be heard in the state or federal courts having jurisdiction in Suffolk County, Massachusetts, and Customer hereby submits to the personal jurisdiction and venue of such
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registered trademarks are the property of their respective owners.
UG16887-4/21(A)
Rev. A | Page 24 of 24
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