71 GHz to 76 GHz,
E-Band Variable Gain Amplifier
HMC8120
Data Sheet
FEATURES
GENERAL DESCRIPTION
Gain: 22 dB typical
Wide gain control range: 15 dB typical
Output third-order intercept (OIP3): 30 dBm typical
Output power for 1 dB compression (P1dB): 21 dBm typical
Saturated output power (PSAT): 22 dBm typical
DC supply: 4 V at 250 mA
No external matching required
Die size: 3.599 mm × 1.369 mm × 0.05 mm
The HMC8120 is an integrated E-band, gallium arsenide (GaAs),
pseudomorphic (pHEMT), monolithic microwave integrated
circuit (MMIC), variable gain amplifier and/or driver amplifier
that operates from 71 GHz to 76 GHz. The HMC8120 provides up
to 22 dB of gain, 21 dBm of output P1dB, 30 dBm of OIP3, and
22 dBm of PSAT while requiring only 250 mA from a 4 V power
supply. Two gain control voltages (VCTL1 and VCTL2) are provided
to allow up to 15 dB of variable gain control. The HMC8120
exhibits excellent linearity and is optimized for E-band
communications and high capacity wireless backhaul radio
systems. All data is taken with the chip in a 50 Ω test fixture
connected via a 3 mil wide × 0.5 mil thick × 7 mil long ribbon
on each port.
APPLICATIONS
E-band communication systems
High capacity wireless backhaul radio systems
Test and measurement
RFIN
FUNCTIONAL BLOCK DIAGRAM
1
2
3
HMC8120
4
5
1.6kΩ
13
12
11
10
9
8
7
13150-001
14
VDET
15
VREF
16
RFOUT
6
VDD6
17
VGG6
18
VDD5
19
VDD4
20
VGG5
21
VGG4
22
VDD3
23
VGG3
24
VCTL2
25
VCTL1
26
ENVDET
27
VDD2
VGG1/VGG2
28
VDD1
1.6kΩ
Figure 1.
Rev. A
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Technical Support
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HMC8120
Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Typical Performance Characteristics ..............................................7
Applications ....................................................................................... 1
Theory of Operation ...................................................................... 12
General Description ......................................................................... 1
Typical Application Circuit ........................................................... 13
Functional Block Diagram .............................................................. 1
Assembly Diagram ..................................................................... 14
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Mounting and Bonding Techniques for Millimeterwave GaAs
MMICs ............................................................................................. 15
Absolute Maximum Ratings ............................................................ 4
Handling Precautions ................................................................ 15
Thermal Resistance ...................................................................... 4
Mounting ..................................................................................... 15
ESD Caution .................................................................................. 4
Wire Bonding .............................................................................. 15
Pin Configuration and Function Descriptions ............................. 5
Outline Dimensions ....................................................................... 16
Interface Schematics..................................................................... 6
Ordering Guide .......................................................................... 16
REVISION HISTORY
2/16—Revision A: Initial Version
Rev. A | Page 2 of 16
Data Sheet
HMC8120
SPECIFICATIONS
TA = 25°C, VDDx = 4 V, VCTLx = −5 V, unless otherwise noted.
Table 1.
Parameter
OPERATING CONDITIONS
RF Frequency Range
PERFORMANCE
Gain
Gain Variation over Temperature
Gain Control Range
Output Power for 1 dB Compression (P1dB)
Saturated Output Power (PSAT)
Output Third-Order Intercept (OIP3) at Maximum Gain 1
Input Return Loss
Output Return Loss
POWER SUPPLY
Total Supply Current (IDD) 2
1
2
Min
Typ
71
19
10
17
Unit
76
GHz
22
0.03
15
21
22
30
10
12
dB
dB/°C
dB
dBm
dBm
dBm
dB
dB
250
mA
Data taken at power input (PIN) = −10 dBm/tone, 1 MHz spacing.
Set VCTL1/VCTL2 = −5 V and then adjust VGG1/VGG2, VGG3, VGG4, VGG5, and VGG6 from −2 V to 0 V to achieve a total drain current (IDD) = 250 mA.
Rev. A | Page 3 of 16
Max
HMC8120
Data Sheet
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 2.
Parameter
Drain Bias Voltage (VDD1 to VDD6)
Gate Bias Voltage (VGG1/VGG2, VGG3 to VGG6)
Gain Control Voltage (VCTL1 and VCTL2)
Maximum Junction Temperature (to Maintain
1 Million Hours Mean Time to Failure (MTTF))
Storage Temperature Range
Operating Temperature Range
Table 3. Thermal Resistance
Rating
4.5 V
−3 V to 0 V
−6 V to 0 V
175°C
Package Type
28-Pad Bare Die [CHIP]
1
−65°C to +150°C
−55°C to +85°C
θJC1
72.9
Unit
°C/W
Based on ABLEBOND® 84-1LMIT as die attach epoxy with thermal
conductivity of 3.6 W/mK.
ESD CAUTION
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
Rev. A | Page 4 of 16
Data Sheet
HMC8120
GND
RFIN
GND
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
2
3
HMC8120
4
GND
5
RFOUT
6
GND
VCTL2
VGG3
14
13
12
11
10
9
8
7
13150-002
VCTL1
15
VDET
GND
ENVDET
16
VREF
VDD2
17
GND
VDD1
18
VDD6
GND
19
VGG6
20
VDD5
21
GND
22
VGG5
23
GND
24
VDD4
25
VGG4
26
VDD3
27
GND
28
VGG1/VGG2
TOP VIEW
(Not to Scale)
Figure 2. Pad Configuration
Table 4. Pad Function Descriptions
Pad No.
1, 3, 4, 6, 10, 13, 16,
19, 24, 27
2
5
7
Mnemonic
GND
Description
Ground Connection (See Figure 3).
RFIN
RFOUT
VDET
8
VREF
9, 12, 15, 18, 25, 26
VDD6 to VDD1
11, 14, 17, 20, 28
21, 22
VGG6 to VGG3,
VGG1/VGG2
VCTL2, VCTL1
23
Die Bottom
ENVDET
GND
RF Input. DC couple RFIN and match it to 50 Ω (see Figure 4).
RF Output. DC couple RFOUT and match it to 50 Ω (see Figure 5).
Detector Voltage for the Power Detector (See Figure 6). VDET is the dc voltage representing the RF
output power rectified by the diode, which is biased through an external resistor. Refer to the typical
application circuit for the required external components (see Figure 38).
Reference Voltage for the Power Detector (See Figure 6). VREF is the dc bias of the diode biased through
an external resistor used for the temperature compensation of VDET. Refer to the typical application
circuit for the required external components (see Figure 38).
Drain Bias Voltage for the Variable Gain Amplifier (See Figure 7). For the required external
components, see Figure 38.
Gate Bias Voltage for the Variable Gain Amplifier (See Figure 8). For the required external components,
see Figure 38.
Gain Control Voltage for the Variable Gain Amplifier (See Figure 9). For the required external
components, see Figure 38.
Envelope Detector (See Figure 10). For the required external components, see Figure 38.
Ground. Die bottom must be connected to the RF/dc ground (see Figure 3).
Rev. A | Page 5 of 16
HMC8120
Data Sheet
INTERFACE SCHEMATICS
VDD6 , VDD5 , VDD4 ,
VDD3 , VDD2 , VDD1
13150-003
13150-007
GND
13150-004
VGG6 TO VGG3,
VGG1/VGG2
Figure 8. VGG6 to VGG3, VGG1/VGG2 Interface
RFOUT
1.6kΩ
13150-005
Figure 4. RFIN Interface
VCTL2 , VCTL1
Figure 9. VCTL2, VCTL1 Interface
13150-006
Figure 5. RFOUT Interface
VDET , VREF
13150-009
1.6kΩ
ENVDET
13150-010
RFIN
13150-008
Figure 7. VDD6 to VDD1 Interface
Figure 3. GND Interface
Figure 10. ENVDET Interface
Figure 6. VDET, VREF Interface
Rev. A | Page 6 of 16
Data Sheet
HMC8120
30
30
25
28
20
26
15
24
GAIN
INPUT RETURN LOSS
OUTPUT RETURN LOSS
5
0
22
20
18
–5
16
–10
14
–15
12
69
70
71
72
73
74
75
76
77
78
FREQUENCY (GHz)
10
71.0
72.5
73.0
73.5
74.0
74.5
75.0
75.5
76.0
Figure 14. Gain vs. Frequency at Various Temperatures,
VCTL1/VCTL2 = −5 V
30
30
25
25
20
20
GAIN (dB)
15
RF
RF
RF
RF
RF
RF
= 71GHz
= 72GHz
= 73GHz
= 74GHz
= 75GHz
= 76GHz
15
10
10
0
71.0
VCTLx
VCTLx
VCTLx
VCTLx
= –5.0V
= –4.0V
= –3.5V
= –3.0V
71.5
72.0
72.5
VCTLx
VCTLx
VCTLx
VCTLx
= –2.6V
= –2.2V
= –2.0V
= –1.5V
73.0
73.5
5
VCTLx = –1.2V
VCTLx = –1.0V
74.0
74.5
75.0
75.5
76.0
FREQUENCY (GHz)
0
–5.0
13150-012
5
0
0
TA = –55°C
TA = +25°C
TA = +85°C
–2
–6
–6
RETURN LOSS (dB)
–4
–8
–10
–12
–14
74.0
FREQUENCY (GHz)
74.5
75.0
75.5
76.0
–20
71.0
13150-013
73.5
–1.5
–1.0
Figure 13. Input Return Loss vs. Frequency at Various Temperatures,
VCTL1/VCTL2 = −5 V
TA = –55°C
TA = +25°C
TA = +85°C
–14
–18
73.0
–2.0
–12
–16
72.5
–2.5
–10
–18
72.0
–3.0
–8
–16
71.5
–3.5
Figure 15. Gain vs. Control Voltage at Various RF Frequencies
–4
–20
71.0
–4.0
CONTROL VOLTAGE (V)
Figure 12. Gain vs. Frequency at Various Control Voltages
–2
–4.5
13150-015
GAIN (dB)
72.0
FREQUENCY (GHz)
Figure 11. Broadband Gain and Return Loss Response vs. Frequency,
VCTL1/VCTL2 = −5 V
RETURN LOSS (dB)
71.5
71.5
72.0
72.5
73.0
73.5
74.0
FREQUENCY (GHz)
74.5
75.0
75.5
76.0
13150-016
–20
TA = –55°C
TA = +25°C
TA = +85°C
13150-014
GAIN (dB)
10
13150-011
RESPONSE (dB)
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 16. Output Return Loss vs. Frequency at Various Temperatures,
VCTL1/VCTL2 = −5 V
Rev. A | Page 7 of 16
HMC8120
= –2.6V
= –2.2V
= –2.0V
= –1.5V
0
VCTLx = –1.2V
VCTLx = –1.0V
–2
–4
RETURN LOSS (dB)
–12
–14
–16
–18
–20
73.0
73.5
74.0
74.5
75.0
75.5
76.0
FREQUENCY (GHz)
Figure 17. Input Return Loss vs. Frequency at Various Control Voltages
–50
–20
71.0
–56
31
–58
30
IP3 (dBm)
32
–66
26
–68
25
72.5
73.0
73.5
74.0
74.5
75.0
75.5
76.0
FREQUENCY (GHz)
24
71.0
25
TA = –55°C
TA = +25°C
TA = +85°C
22
22
21
21
PSAT (dBm)
23
20
19
17
17
16
16
72.5
73.0
73.5
74.0
74.5
75.0
75.5
76.0
FREQUENCY (GHz)
72.0
72.5
73.0
73.5
74.0
74.5
75.0
75.5
76.0
19
18
72.0
71.5
20
18
71.5
76.0
TA = –55°C
TA = +25°C
TA = +85°C
24
23
15
71.0
75.5
Figure 21. Output IP3 vs. Frequency at Various Temperatures,
PIN = −10 dBm/Tone, VCTL1/VCTL2 = −5 V
13150-018
P1dB (dBm)
24
75.0
FREQUENCY (GHz)
Figure 18. Reverse Isolation vs. Frequency at Various Temperatures,
VCTL1/VCTL2 = −5 V
25
74.5
28
27
72.0
74.0
29
–64
71.5
73.5
TA = –55°C
TA = +25°C
TA = +85°C
33
–54
–70
71.0
73.0
Figure 20. Output Return Loss vs. Frequency at Various Control Voltages
34
–62
72.5
FREQUENCY (GHz)
TA = –55°C
TA = +25°C
TA = +85°C
–60
72.0
–14
13150-033
ISOLATION (dB)
–52
71.5
VCTLx = –1.2V
VCTLx = –1.0V
–12
–18
72.5
= –2.6V
= –2.2V
= –2.0V
= –1.5V
–10
–24
72.0
VCTLx
VCTLx
VCTLx
VCTLx
–8
–16
71.5
= –5.0V
= –4.0V
= –3.5V
= –3.0V
–6
–22
–26
71.0
VCTLx
VCTLx
VCTLx
VCTLx
13150-020
VCTLx
VCTLx
VCTLx
VCTLx
13150-017
RETURN LOSS (dB)
–10
= –5.0V
= –4.0V
= –3.5V
= –3.0V
13150-019
–8
VCTLx
VCTLx
VCTLx
VCTLx
15
71.0
71.5
72.0
72.5
73.0
73.5
74.0
74.5
75.0
75.5
FREQUENCY (GHz)
Figure 22. PSAT vs. Frequency at Various Temperatures,
VCTL1/VCTL2 = −5 V
Figure 19. Output P1dB vs. Frequency at Various Temperatures,
VCTL1/VCTL2 = −5 V
Rev. A | Page 8 of 16
76.0
13150-021
–6
Data Sheet
Data Sheet
HMC8120
36
25
GAIN
IIP3
OIP3
32
15
20
16
12
5
0
–5
8
–10
4
–15
0
–5.0
–4.5
–4.0
–3.5
–3.0
–2.5
–2.0
–1.5
–1.0
CONTROL VOTLAGE (V)
–20
250
36
210
190
170
150
130
110
90
Figure 26. Gain and Input/Output IP3 vs. Drain Current,
PIN = −10 dBm/Tone, VCTL1/VCTL2 = −1 V, RF = 71 GHz,
Drain Current = (IDD1/IDD2 Fixed at 50 mA) + (IDD3 to IDD6 Swept)
25
GAIN
IIP3
OIP3
32
230
DRAIN CURRENT (mA)
Figure 23. Gain and Input/Output IP3 vs. Control Voltage,
PIN = −10 dBm/Tone, RF = 71 GHz
GAIN
IIP3
OIP3
20
28
24
20
16
12
10
5
0
–5
8
–10
4
–15
0
–5.0
–4.5
–4.0
–3.5
–3.0
–2.5
–2.0
–1.5
–1.0
CONTROL VOLTAGE (V)
–20
250
190
170
150
130
110
90
Figure 27. Gain and Input/Output IP3 vs. Drain Current,
PIN = −10 dBm/Tone, VCTL1/VCTL2 = −1 V, RF = 73.5 GHz,
Drain Current = (IDD1/IDD2 Fixed at 50 mA) + (IDD3 to IDD6 Swept)
25
GAIN
IIP3
OIP3
32
210
DRAIN CURRENT (mA)
Figure 24. Gain and Input/Output IP3 vs. Control Voltage,
PIN = −10 dBm/Tone, RF = 73.5 GHz
36
230
13150-027
GAIN (dB), IP3 (dBm)
15
13150-023
GAIN
IIP3
OIP3
20
15
GAIN (dB), IP3 (dBm)
28
24
20
16
12
10
5
0
–5
–10
4
–15
0
–5.0
–4.5
–4.0
–3.5
–3.0
–2.5
–2.0
–1.5
–1.0
CONTROL VOLTAGE (V)
13150-026
8
Figure 25. Gain and Input/Output IP3 vs. Control Voltage,
PIN = −10 dBm/Tone, RF = 76 GHz
–20
250
230
210
190
170
150
130
110
90
DRAIN CURRENT (mA)
Figure 28. Gain and Input/Output IP3 vs. Drain Current,
PIN = −10 dBm/Tone, VCTL1/VCTL2 = −1 V, RF = 76 GHz,
Drain Current = (IDD1/IDD2 Fixed at 50 mA) + (IDD3 to IDD6 Swept)
Rev. A | Page 9 of 16
13150-025
GAIN (dB), IP3 (dBm)
10
13150-024
GAIN (dB), IP3 (dBm)
24
13150-022
GAIN (dB), IP3 (dBm)
28
GAIN (dB), IP3 (dBm)
GAIN
IIP3
OIP3
20
= 110mA
= 100mA
= 90mA
= 80mA
GAIN (dB)
10
5
0
–5
–10
28
320
24
310
20
300
16
290
12
280
8
270
POUT
GAIN
PAE
IDD
4
71.5
72.0
72.5
73.0
73.5
74.0
74.5
75.0
75.5
76.0
FREQUENCY (GHz)
0
–15
13150-028
–15
71.0
–13
–9
–7
–5
–3
–1
1
260
3
250
INPUT POWER (dBm)
Figure 29. Gain vs. Frequency at Various Drain Currents,
PIN = −10 dBm/Tone, VCTL1/VCTL2 = −1 V,
Drain Current = (IDD1/IDD2 Fixed at 50 mA) + (IDD3 to IDD6 Swept)
Figure 32. POUT, Gain, PAE, and IDD vs. Input Power,
VCTL1/VCTL2 = −5 V, RF = 71 GHz
320
28
320
24
310
24
310
20
300
20
300
16
290
16
290
12
280
12
280
8
270
0
–15
–13
–11
–9
–7
–5
–3
–1
1
3
270
8
260
4
250
0
–15
13150-032
POUT
GAIN
PAE
IDD
4
POUT (dBm), GAIN (dB), PAE (%)
28
IDD (mA)
POUT (dBm), GAIN (dB), PAE (%)
–11
INPUT POWER (dBm)
–13
0.40
PEAK-TO-PEAK OUTPUT VOLTAGE (V)
RF = 71.0GHz
RF = 73.5GHz
RF = 76.0GHz
VREF – VDET (V)
0.1
4
8
12
OUTPUT POWER (dBm)
16
20
Figure 31. Detector Output Voltage (VREF – VDET) vs. Output Power at Various
RF Frequencies, VCTL1/VCTL2 = −5 V
0.35
–7
–5
–3
–1
100MHz
300MHz
500MHz
750MHz
TONE SPACING
TONE SPACING
TONE SPACING
TONE SPACING
0.30
0.25
0.20
0.15
0.10
0.05
0
–20
13150-031
0.01
0
–9
Figure 33. POUT, Gain, PAE, and IDD vs. Input Power,
VCTL1/VCTL2 = −5 V, RF = 76 GHz
1
0.001
–4
–11
POUT
GAIN 260
PAE
IDD
250
1
3
INPUT POWER (dBm)
Figure 30. POUT, Gain, PAE, and IDD vs. Input Power,
VCTL1/VCTL2 = −5 V, RF = 73.5 GHz
10
IDD (mA)
IDD
IDD
IDD
IDD
IDD (mA)
= 150mA
= 140mA
= 130mA
= 120mA
13150-030
15
IDD
IDD
IDD
IDD
= 250mA
= 225mA
= 200mA
= 175mA
–18
–16
–14
–12
–10
–8
TOTAL INPUT POWER (dBm)
–6
–4
13150-134
IDD
IDD
IDD
IDD
POUT (dBm), GAIN (dB), PAE (%)
20
Data Sheet
13150-029
HMC8120
Figure 34. Envelope Detector Peak-to-Peak Output Voltage vs. Total Input
Power at Various Tone Spacings, RF = 71 GHz, VCTL1/VCTL2 = −5 V,
VDET = 4 V with 150 Ω Load Impedance at ENVDET
Rev. A | Page 10 of 16
Data Sheet
0.40
0.30
0.25
0.20
0.15
0.10
0.05
0
–20
–18
–16
–14
–12
–10
–8
TOTAL INPUT POWER (dBm)
–6
–4
Figure 35. Envelope Detector Peak-to-Peak Output Voltage vs. Total Input
Power at Various Tone Spacings, RF = 73.5 GHz, VCTL1/VCTL2 = −5 V,
VDET = 4 V with 150 Ω Load Impedance at ENVDET
0.35
100MHz
300MHz
500MHz
750MHz
TONE SPACING
TONE SPACING
TONE SPACING
TONE SPACING
0.30
0.25
0.20
0.15
0.10
0.05
0
–20
–18
–16
–14
–12
–10
–8
TOTAL INPUT POWER (dBm)
–6
–4
13150-136
TONE SPACING
TONE SPACING
TONE SPACING
TONE SPACING
PEAK-TO-PEAK OUTPUT VOLTAGE (V)
0.35
100MHz
300MHz
500MHz
750MHz
13150-135
PEAK-TO-PEAK OUTPUT VOLTAGE (V)
0.40
HMC8120
Figure 36. Envelope Detector Peak-to-Peak Output Voltage vs. Total Input
Power at Various Tone Spacings, RF = 76 GHz, VCTL1/VCTL2 = −5 V,
VDET = 4 V with 150 Ω Load Impedance at ENVDET
Rev. A | Page 11 of 16
HMC8120
Data Sheet
THEORY OF OPERATION
The circuit architecture of the HMC8120 variable gain amplifier
is shown in Figure 37. The HMC8120 uses multiple gain stages
and staggered voltage variable attenuation stages to form a low
noise, high linearity variable gain amplifier with a gain range of
~15 dB. The first stage is a low noise preamp, which is followed
by the first voltage variable attenuator in the signal path. A
portion of the signal is coupled away and further amplified
before driving an on-chip envelope detector. The envelope
detector provides an output that is proportional to the peak
envelope power of the incoming signal. After the first
attenuator, a second stage amplifier provides additional gain
and isolation before driving the second variable attenuator
block. Three cascaded gain stages follow the second variable
attenuator. At the output of the last stage, another coupler taps
off a small portion of the output signal. The coupled signal is
presented to an on-chip diode detector for external monitoring
of the output power. A matched reference diode is included to
help correct for detector temperature dependencies. See the
application circuit in Figure 38 for further details on biasing the
different blocks and utilizing the detector features.
RFIN
RFOUT
ENVDET
VCTL1
VCTL2
VREF VDET
Figure 37. Variable Gain Amplifier Circuit Architecture
Rev. A | Page 12 of 16
13150-034
ENV
DET
Data Sheet
HMC8120
TYPICAL APPLICATION CIRCUIT
The HMC8120 uses several amplifier, detector, and attenuator
stages. All stages use depletion mode pHEMT transistors. It is
important to follow the following power-up bias sequence to
ensure transistor damage does not occur.
A typical application circuit for the HMC8120 is provided in
Figure 38. For typical operation, drive the attenuator control
pads from a single control voltage. It is important to bypass all
the supply connections and attenuator control pads with adequate
bypassing capacitors. Use single-layer chip capacitors with very
high self-resonant frequency close to the HMC8120 die, bypassing
each supply or control pad. Typically, 120 pF chip capacitors are
used, followed by 0.01 μF and 4.7 μF surface-mount capacitors.
Combine supply lines as shown in the application circuit schematic
to minimize external component count and simplify power
supply routing (see Figure 38). Pad 25 and Pad 26 are internally
connected. Therefore, use either pad to connect the external
bypass components of VDD1/VDD2.
1.
2.
3.
4.
Apply a −5 V bias to the VCTL1 and VCTL2 pads.
Apply a −2 V bias to the VGG3 to VGG6 and VGG1/VGG2 pads.
Apply 4 V to the VDD1 to VDD6 pads.
Adjust VGG1/VGG2 and VGG3 to VGG6 between −2 V and 0 V
to achieve a total amplifier drain current of 250 mA.
After bias is established, adjust the VCTL1 = VCTL2 bias between
−5 V and 0 V to achieve the desired gain.
To power down the HMC8120, follow the reverse procedure.
RFIN
For additional guidance on general bias sequencing, see the
MMIC Amplifier Biasing Procedure application note.
1
2
3
HMC8120
4
5
1.6kΩ
120pF
120pF
13
12
11
10
120pF
120pF
120pF
120pF
120pF
120pF
120pF
120pF
120pF
0.01µF
0.01µF
0.01µF
0.01µF
0.01µF
0.01µF
0.01µF
4.7µF
4.7µF
4.7µF
4.7µF
4.7µF
4.7µF
4.7µF
VGG1/VGG2
VDD1 , VDD2
VCTL1 , VCTL2 VGG3, VGG4
VDD3 , VDD4 , VDD5
9
VGG5, VGG6
8
VDD6
VREF
100kΩ
10kΩ
3.5kΩ
ENVDET +4V
VDET
+5V
+5V
1000pF
150Ω
7
VDET
14
VDD6
15
VGG6
16
VDD5
17
VGG5
18
100kΩ
10kΩ
VOUT = VREF – VDET
10kΩ
–5V
10kΩ
SUGGESTED CIRCUIT
Figure 38. Typical Application Circuit
Rev. A | Page 13 of 16
13150-035
120pF
19
VDD4
20
VGG4
21
VDD3
22
VGG3
23
VCTL2
24
VCTL1
25
ENVDET
VDD1
26
VDD2
27
VGG1/VGG2
28
RFOUT
6
VREF
1.6kΩ
HMC8120
Data Sheet
ASSEMBLY DIAGRAM
50Ω
TRANSMISSION
LINE
3mil WIDE
GOLD RIBBON
(WEDGE BOND)
2
3
HMC8120
RFIN
1
3mil
NOMINAL
GAP
4
RFOUT
5
1.6kΩ
1.6kΩ
6
13
12
11
10
9
8
7
VDET
14
VDD6
15
VDD5
16
VGG6
17
VGG5
18
VDD4
19
VDD3
20
VGG4
21
VGG3
22
VCTL2
23
VCTL1
24
ENV DET
25
VDD2
26
VDD1
27
VGG1/VGG2
28
VREF
3mil WIDE
GOLD RIBBON
(WEDGE BOND)
120pF
0.01µF
4.7µF
4.7µF
VGG1/VGG2
VDD1 , VDD2
VCTL1 , VCTL2
4.7µF
4.7µF
4.7µF
VGG3, VGG4 VDD3 , VDD4 , VDD5 VGG5, VGG6
Figure 39. Assembly Diagram
Rev. A | Page 14 of 16
4.7µF
VDD6
13150-036
4.7µF
Data Sheet
HMC8120
MOUNTING AND BONDING TECHNIQUES FOR MILLIMETERWAVE GaAs MMICS
Attach the die directly to the ground plane eutectically or with
conductive epoxy.
To bring RF to and from the chip, use 50 Ω microstrip transmission lines on 0.127 mm (5 mil) thick alumina thin film
substrates (see Figure 40).
Transients
Suppress instrument and bias supply transients while bias is
applied. To minimize inductive pickup, use shielded signal and
bias cables.
General Handling
Handle the chip on the edges only using a vacuum collet or with
a sharp pair of bent tweezers. Because the surface of the chip
has fragile air bridges, never touch the surface of the chip with
a vacuum collet, tweezers, or fingers.
0.05mm (0.002") THICK GaAs MMIC
RIBBON BOND
0.076mm
(0.003")
MOUNTING
The chip is back metallized and can be die mounted with gold/tin
(AuSn) eutectic preforms or with electrically conductive epoxy.
The mounting surface must be clean and flat.
RF GROUND PLANE
13150-037
Eutectic Die Attach
0.127mm (0.005") THICK ALUMINA
THIN FILM SUBSTRATE
Figure 40. Routing RF Signals
To minimize bond wire length, place microstrip substrates as
close to the die as possible. Typical die to substrate spacing is
0.076 mm to 0.152 mm (3 mil to 6 mil).
HANDLING PRECAUTIONS
To avoid permanent damage, adhere to the following
precautions.
Storage
All bare die ship in either waffle or gel-based ESD protective
containers, sealed in an ESD protective bag. After opening the
sealed ESD protective bag, all die must be stored in a dry nitrogen
environment.
Cleanliness
Handle the chips in a clean environment. Never use liquid
cleaning systems to clean the chip.
Static Sensitivity
Follow ESD precautions to protect against ESD strikes.
It is best to use an 80% gold/20% tin preform with a work surface
temperature of 255°C and a tool temperature of 265°C. When
hot 90% nitrogen/10% hydrogen gas is applied, maintain tool
tip temperature at 290°C. Do not expose the chip to a temperature
greater than 320°C for more than 20 sec. No more than 3 sec of
scrubbing is required for attachment.
Epoxy Die Attach
ABLEBOND 84-1LMIT is recommended for die attachment.
Apply a minimum amount of epoxy to the mounting surface so
that a thin epoxy fillet is observed around the perimeter of the
chip after placing it into position. Cure the epoxy per the schedule
provided by the manufacturer.
WIRE BONDING
RF bonds made with 0.003 in. × 0.0005 in. gold ribbon are recommended for the RF ports. These bonds must be thermosonically
bonded with a force of 40 g to 60 g. DC bonds of 0.001 in.
(0.025 mm) diameter, thermosonically bonded, are recommended.
Create ball bonds with a force of 40 g to 50 g and wedge bonds
with a force of 18 g to 22 g. Create all bonds with a nominal
stage temperature of 150°C. Apply a minimum amount of
ultrasonic energy to achieve reliable bonds. Keep all bonds
as short as possible, less than 12 mil (0.31 mm).
Rev. A | Page 15 of 16
HMC8120
Data Sheet
OUTLINE DIMENSIONS
3.599
0.05
0.085
0.125
0.125
0.216
TOP VIEW
(CIRCUIT SIDE)
1
2
0.225
3
4
5
6
1.200
0.125
0.125
1.369
0.682
27
26
25
24
23
22
21
0.073
0.15 0.15 0.15 0.15 0.15 0.15 0.15
20
0.30
19
18
17
16
15
14
13
12
11
10
9
8
7
0.085
SIDE VIEW
0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15 0.15
01-26-2016-A
28
0.081
Figure 41. 28-Pad Bare Die [CHIP]
(C-28-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model1
HMC8120
HMC8120-SX
1
2
Temperature Range
−55°C to +85°C
−55°C to +85°C
Package Description
28-Pad Bare Die [CHIP]
28-Pad Bare Die [CHIP]
The HMC8120-SX is two pairs of the die in a gel pack for the sample orders.
This is a waffle pack option; contact Analog Devices, Inc., sales representatives for additional packaging options.
©2016 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D13150-0-2/16(A)
Rev. A | Page 16 of 16
Package Option2
C-28-1
C-28-1
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