19-3361; Rev 3; 7/10
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
The MAX3205E/MAX3207E/MAX3208E low-capacitance, ±15kV ESD-protection diode arrays with an integrated transient voltage suppressor (TVS) clamp are
suitable for high-speed and general-signal ESD protection. Low input capacitance makes these devices ideal
for ESD protection of signals in HDTV, PC monitors
(DVI™, HDMI®), PC peripherals (FireWire®, USB 2.0),
server interconnect (PCI Express ® , InfiniBand™),
datacom, and interchassis interconnect. Each channel
consists of a pair of diodes that steer ESD current pulses to VCC or GND.
The MAX3205E/MAX3207E/MAX3208E protect against
ESD pulses up to ±15kV Human Body Model, ±8kV
Contact Discharge, and ±15kV Air-Gap Discharge, as
specified in IEC 61000-4-2. An integrated TVS ensures
that the voltage rise seen on VCC during an ESD event
is clamped to a known voltage. These devices have a
2pF input capacitance per channel, and a channel-tochannel capacitance variation of only 0.05pF, making
them ideal for use on high-speed, single-ended, or differential signals.
The MAX3207E is a two-channel device suitable for
USB 1.1, USB 2.0 (480Mbps), and USB OTG applications. The MAX3208E is a four-channel device for
Ethernet and FireWire applications. The MAX3205E is a
six-channel device for cell phone connectors and
SVGA video connections.
The MAX3205E is available in 9-bump, tiny wafer-level
package (WLP) and 16-pin, 3mm x 3mm, thin QFN
packages. The MAX3207E is available in a small 6-pin
SOT23 package. The MAX3208E is available in 10-pin
µMAX® and 16-pin, 3mm x 3mm TQFN packages. All
devices are specified for the -40°C to +125°C automotive operating temperature range.
Features
♦ Low Input Capacitance of 2pF Typical
♦ Low Channel-to-Channel Variation of 0.05pF
from I/O to I/O
♦ High-Speed Differential or Single-Ended ESD
Protection
±15kV–Human Body Model
±8kV–IEC 61000-4-2, Contact Discharge
±15kV–IEC 61000-4-2, Air-Gap Discharge
♦ Integrated Transient Voltage Suppressor (TVS)
♦ Optimized Pinout for Minimized Stub Inductance
on Controlled-Impedance DifferentialTransmission Line Routing
♦ -40°C to +125°C Automotive Operating
Temperature Range
♦ WLP Packaging Available
Ordering Information
PART
TEMP RANGE
PIN-PACKAGE
MAX3205EAWL+T
-40°C to +125°C
MAX3205EATE+
-40°C to +125°C
16 TQFN-EP*
MAX3207EAUT+T
-40°C to +125°C
6 SOT23
MAX3208EAUB+
-40°C to +125°C
10 μMAX
MAX3208EATE+
-40°C to +125°C
16 TQFN-EP*
9 WLP
+Denotes a lead(Pb)-free/RoHS-compliant package.
T = Tape and reel.
*EP = Exposed pad.
Selector Guide
PART
ESD-PROTECTED
I/O PORTS
MAX3205EAWL+T
6
AIN
MAX3205EATE+
6
ACO
DVI Input/Output Protection
MAX3207EAUT+T
2
ABVG
Set-Top Boxes
MAX3208EAUB+
4
—
MAX3208EATE+
4
ACN
Applications
PDAs/Cell Phones
TOP MARK
Graphics Controller Cards
Displays/Projectors
High-Speed, Full-Speed and Low-Speed USB
Port Protection
FireWire IEEE 1394 Ports
Consumer Equipment
High-Speed Differential Signal Protection
Typical Operating Circuit and Pin Configurations appear at
end of data sheet.
FireWire is a registered trademark of Apple Inc.
PCI Express is a registered service mark of PCI-SIG Corporation.
DVI is a trademark of Digital Display Working Group.
HDMI is a registered trademark and registered service mark of
HDMI Licensing, LCC.
InfiniBand is a trademark and service mark of InfiniBand Trade
Association.
µMAX is a registered trademark of Maxim Integrated Products, Inc.
________________________________________________________________ Maxim Integrated Products
For pricing, delivery, and ordering information, please contact Maxim Direct at 1-888-629-4642,
or visit Maxim’s website at www.maxim-ic.com.
1
MAX3205E/MAX3207E/MAX3208E
General Description
MAX3205E/MAX3207E/MAX3208E
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
ABSOLUTE MAXIMUM RATINGS
VCC to GND ...........................................................-0.3V to +6.0V
I/O_ to GND ................................................-0.3V to (VCC + 0.3V)
Continuous Power Dissipation (TA = +70°C)
6-Pin SOT23 (derate 8.7mW/°C above +70°C)............696mW
9-Bump WLP (derate 14.1mW/°C above +70°C).............0mW
10-Pin µMAX (derate 5.6mW/°C above +70°C) ...........444mW
16-Pin TQFN (derate 20.8mW/°C above +70°C) .......1667mW
Operating Temperature Range .........................-40°C to +125°C
Storage Temperature Range .............................-65°C to +150°C
Junction Temperature .....................................................+150°C
Lead Temperature (excluding WLP; soldering, 10s) .......+300°C
Soldering Temperature (reflow) .......................................+260°C
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(VCC = +5V, TA = TMIN to TMAX, unless otherwise noted. Typical values are at VCC = +5V and TA = +25°C.) (Note 1)
PARAMETER
SYMBOL
Supply Voltage
VCC
Supply Current
ICC
Diode Forward Voltage
VF
CONDITIONS
VC
1
IF = 10mA
0.65
Positive transients
V
100
nA
0.95
V
Negative transients
-25
VCC + 60
TA = +25°C, ±15kV Air-Gap Positive transients
Discharge (IEC 61000-4-2),
Negative transients
IF = 45A
VCC + 100
VCC = +3.3V, bias of VCC / 2
CIN
UNITS
5.5
VCC + 25
-60
+0.1
MAX3205EAWL+T
MAX3207EAUT+T
2.5
3
MAX3205EATE+
MAX3208EATE+
2.7
3.2
MAX3208EAUB+
2.6
3.1
VCC = +3.3V, bias of VCC / 2, C I/O_ to GND
V
-100
-0.1
Channel I/O Capacitance
MAX
TA = +25°C, ±8kV Contact Positive transients
Discharge (IEC 61000-4-2),
Negative transients
IF = 24A
Channel Leakage Current
Channel I/O to I/O
Variation in Capacitance
TYP
0.9
TA = +25°C, ±15kV Human
Body Model, IF = 10A
Channel Clamp Voltage
(Note 2)
MIN
μA
pF
±0.05
pF
10
pF
9
V
TRANSIENT SUPPRESSOR
VCC Capacitance to GND
ESD Trigger Voltage
dV/dt 1V/ns (Note 3)
Note 1: Parameters are 100% production tested at +25°C. Limits over temperature are guaranteed by design only.
Note 2: Idealized clamp voltages. See the Applications Information section for more information.
Note 3: Guaranteed by design, not production tested.
2
_______________________________________________________________________________________
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
CLAMP VOLTAGE
vs. DC CURRENT
I/O_ TO VCC
0.9
0.7
GND TO I/O_
1000
100
10
MAX3205E toc03
4
INPUT CAPACITANCE (pF)
LEAKAGE CURRENT (pA)
CLAMP VOLTAGE (V)
1.3
10,000
MAX3205E toc02
MAX3205E toc01
1.5
1.1
INPUT CAPACITANCE
vs. INPUT VOLTAGE
LEAKAGE CURRENT
vs. TEMPERATURE
3
2
1
0.5
0
1
0.3
10
30
50
70
90
110
130
-40
150
0
40
80
120
0
1
2
3
4
5
INPUT VOLTAGE (V)
TEMPERATURE (°C)
DC CURRENT (mA)
Pin Description
PIN
MAX3205E
MAX3207E
NAME
MAX3208E
FUNCTION
TQFN-EP
WLP
SOT23
μMAX
TQFN-EP
4, 5, 7,
12, 13, 15
A2, A3, B1,
B3, C1, C2
1, 4
1, 4, 6, 9
4, 7, 12, 15
I/O_
ESD-Protected Channel
1, 3, 6, 8,
9, 11, 14,
16
—
3, 6
2, 5, 7, 10
1, 3, 5, 6,
8, 9, 11,
13, 14, 16
N.C.
No Connection. Not internally connected.
—
B2
—
—
—
N.C.
No Connection. The solder sphere is omitted from
this location (see the Package Information section).
2
A1
2
3
2
GND
Ground. Connect GND with a low-impedance
connection to the ground plane.
10
C3
5
8
10
VCC
Power-Supply Input. Bypass VCC to GND with a
0.1μF ceramic capacitor as close to the device as
possible.
—
—
—
—
—
EP
Exposed Pad (TQFN Only). Connect EP to GND.
_______________________________________________________________________________________
3
MAX3205E/MAX3207E/MAX3208E
Typical Operating Characteristics
(VCC = +5V, TA = +25°C, unless otherwise noted.)
MAX3205E/MAX3207E/MAX3208E
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
Detailed Description
The MAX3205E/MAX3207E/MAX3208E low-capacitance,
±15kV ESD-protection diode arrays with an integrated
transient voltage suppressor (TVS) clamp are suitable for
high-speed and general-signal ESD protection. Low
input capacitance makes these devices ideal for ESD
protection of signals in HDTV, PC monitors (DVI, HDMI),
PC peripherals (FireWire, USB 2.0), server interconnect
(PCI Express, InfiniBand), datacom, and interchassis
interconnect. Each channel consists of a pair of diodes
that steer ESD current pulses to V CC or GND. The
MAX3207E, MAX3208E, and MAX3205E are two, four,
and six channels (see the Functional Diagram).
The MAX3205E/MAX3207E/MAX3208E are designed to
work in conjunction with a device’s intrinsic ESD protection. The MAX3205E/MAX3207E/MAX3208E limit the
excursion of the ESD event to below ±25V peak voltage
when subjected to the Human Body Model waveform.
When subjected to the IEC 61000-4-2 waveform and
Contact Discharge, the peak voltage is limited to ±60V.
The peak voltage is limited to ±100V when subjected to
Air-Gap Discharge. The device protected by the
MAX3205E/MAX3207E/MAX3208E must be able to
withstand these peak voltages, plus any additional voltage generated by the parasitic of the board.
A TVS is integrated into the MAX3205E/MAX3207E/
MAX3208E to help clamp ESD to a known voltage. This
helps reduce the effects of parasitic inductance on the
VCC rail by clamping VCC to a known voltage during an
ESD event. For the lowest possible clamp voltage during an ESD event, placing a 0.1µF capacitor as close to
VCC as possible is recommended.
Functional Diagram
MAX3207E
MAX3208E
MAX3205E
VCC
VCC
VCC
I/O1
I/O2
GND
4
I/O1
I/O3
I/O2
GND
I/O4
I/O1
I/O2
I/O4
I/O3
GND
_______________________________________________________________________________________
I/O5
I/O6
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
Design Considerations
Maximum protection against ESD damage results from
proper board layout (see the Layout Recommendations
section). A good layout reduces the parasitic series
inductance on the ground line, supply line, and protected signal lines. The MAX3205E/MAX3207E/MAX3208E
ESD diodes clamp the voltage on the protected lines
during an ESD event and shunt the current to GND or
VCC. In an ideal circuit, the clamping voltage (VC) is
defined as the forward voltage drop (VF) of the protection diode, plus any supply voltage present on the cathode.
For positive ESD pulses:
VC = VCC + VF
For negative ESD pulses:
VC = -VF
The effect of the parasitic series inductance on the
lines must also be considered (Figure 1).
For positive ESD pulses:
d(IESD ) ⎞ ⎛
d(IESD ) ⎞
⎛
VC = VCC + VF(D1) + ⎜ L1 x
⎟
⎟ + ⎜ L2 x
⎝
dt ⎠ ⎝
dt ⎠
For negative ESD pulses:
⎛
d(IESD ) ⎞ ⎛
d(IESD ) ⎞ ⎞
⎛
VC = − ⎜ VF(D2 ) + ⎜ L1 x
⎟ + ⎜ L3 x
⎟
⎝
⎠
⎝
dt
dt ⎠ ⎟⎠
⎝
During an ESD event, the current pulse rises from zero
to peak value in nanoseconds (Figure 2). For example,
in a 15kV IEC 61000 Air-Gap Discharge ESD event, the
pulse current rises to approximately 45A in 1ns (di/dt =
45 x 109). An inductance of only 10nH adds an additional 450V to the clamp voltage and represents
approximately 0.5in of board trace. Regardless of the
device’s specified diode clamp voltage, a poor layout
with parasitic inductance significantly increases the
effective clamp voltage at the protected signal line.
Minimize the effects of parasitic inductance by placing
the MAX3205E/MAX3207E/MAX3208E as close to the
connector (or ESD contact point) as possible.
A low-ESR 0.1µF capacitor is recommended between
VCC and GND in order to get the maximum ESD protection possible. This bypass capacitor absorbs the
charge transferred by a positive ESD event. Ideally, the
supply rail (VCC) would absorb the charge caused by a
positive ESD strike without changing its regulated
value. All power supplies have an effective output
impedance on their positive rails. If a power supply’s
effective output impedance is 1Ω, then by using V = I x
R, the clamping voltage of VC increases by the equation VC = IESD x ROUT. A +8kV IEC 61000-4-2 ESD
event generates a current spike of 24A. The clamping
voltage increases by VC = 24A x 1Ω, or VC = 24V.
Again, a poor layout without proper bypassing increases the clamping voltage. A ceramic chip capacitor
mounted as close as possible to the MAX3205E/
MAX3207E/MAX3208E VCC pin is the best choice for
this application. A bypass capacitor should also be
placed as close to the protected device as possible.
where IESD is the ESD current pulse.
POSITIVE SUPPLY RAIL
I
100%
90%
D1
L1
IPEAK
L2
I/O_
PROTECTED
LINE
D2
10%
tR = 0.7ns to 1ns
L3
t
30ns
60ns
GROUND RAIL
Figure 1. Parasitic Series Inductance
Figure 2. IEC 61000-4-2 ESD Generator Current Waveform
_______________________________________________________________________________________
5
MAX3205E/MAX3207E/MAX3208E
Applications Information
MAX3205E/MAX3207E/MAX3208E
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
±15kV ESD Protection
ESD protection can be tested in various ways. The
MAX3205E/MAX3207E/MAX3208E are characterized
for protection to the following limits:
• ±15kV using the Human Body Model
• ±8kV using the Contact Discharge Method specified
in IEC 61000-4-2
• ±15kV using the IEC 61000-4-2 Air-Gap Discharge
Method
ESD Test Conditions
ESD performance depends on a number of conditions.
Contact Maxim for a reliability report that documents
test setup, methodology, and results.
Human Body Model
Figure 3 shows the Human Body Model, and Figure 4
shows the current waveform it generates when discharged into a low impedance. This model consists of
a 100pF capacitor charged to the ESD voltage of interest, which is then discharged into the device through a
1.5kΩ resistor.
IEC 61000-4-2
The IEC 61000-4-2 standard covers ESD testing and
performance of finished equipment. The MAX3205E/
MAX3207E/MAX3208E help users design equipment
that meets Level 4 of IEC 61000-4-2. The main difference between tests done using the Human Body Model
RC
1MΩ
CHARGE-CURRENTLIMIT RESISTOR
HIGHVOLTAGE
DC
SOURCE
Cs
100pF
IP 100%
90%
10%
0
0
tRL
TIME
tDL
CURRENT WAVEFORM
Figure 4. Human Body Model Current Waveform
RC
50MΩ TO 100MΩ
CHARGE-CURRENTLIMIT RESISTOR
DEVICE
UNDER
TEST
PEAK-TO-PEAK RINGING
(NOT DRAWN TO SCALE)
36.8%
DISCHARGE
RESISTANCE
STORAGE
CAPACITOR
Ir
AMPERES
RD
1.5kΩ
Figure 3. Human Body ESD Test Model
6
and IEC 61000-4-2 is higher peak current in IEC 610004-2. Because series resistance is lower in the IEC
61000-4-2 ESD test model (Figure 5), the ESDwithstand voltage measured to this standard is generally lower than that measured using the Human Body
Model. Figure 2 shows the current waveform for the
±8kV, IEC 61000-4-2 Level 4, ESD Contact Discharge
test. The Air-Gap Discharge test involves approaching
the device with a charged probe. The Contact
Discharge method connects the probe to the device
before the probe is energized.
HIGHVOLTAGE
DC
SOURCE
Cs
150pF
RD
330Ω
DISCHARGE
RESISTANCE
STORAGE
CAPACITOR
Figure 5. IEC 61000-4-2 ESD Test Model
_______________________________________________________________________________________
DEVICE
UNDER
TEST
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
2) Use separate planes for power and ground to reduce
parasitic inductance and to reduce the impedance to
the power rails for shunted ESD current.
3) Ensure short low-inductance ESD transient return
paths to GND and VCC.
4) Minimize conductive power and ground loops.
6) Bypass VCC to GND with a low-ESR ceramic capacitor as close to VCC as possible.
7) Bypass the supply of the protected device to GND
with a low-ESR ceramic capacitor as close to the
supply pin as possible.
WLP Applications Information
For the latest application details on WLP construction,
dimensions, tape carrier information, printed circuit
board techniques, bump-pad layout, and recommended reflow temperature profile, as well as the latest information on reliability testing results, refer to Application
Note 1891: Wafer-Level Packaging (WLP) and Its
Applications.
Chip Information
PROCESS: BiCMOS
5) Do not place critical signals near the edge of the PC
board.
Typical Operating Circuit
L2
VCC
L1
I/0
I/0 LINE
I/0_
PROTECTED LINE
VCC
VCC
NEGATIVE ESDCURRENT
PULSE
PATH TO
GROUND
0.1μF
0.1μF
D1
VC
I/O_
D2
PROTECTED
CIRCUIT
PROTECTED
CIRCUIT
MAX3205E
MAX3207E
MAX3208E
L3
GND
Figure 6. Layout Considerations
_______________________________________________________________________________________
7
MAX3205E/MAX3207E/MAX3208E
Layout Recommendations
Proper circuit-board layout is critical to suppress ESDinduced line transients (See Figure 6). The MAX3205E/
MAX3207E/MAX3208E clamp to 100V; however, with
improper layout, the voltage spike at the device can be
much higher. A lead inductance of 10nH with a 45A
current spike results in an additional 450V spike on the
protected line. It is essential that the layout of the PC
board follows these guidelines:
1) Minimize trace length between the connector or
input terminal, I/O_, and the protected signal line.
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
MAX3205E/MAX3207E/MAX3208E
Pin Configurations
MAX3205E
C1
I/O2
I/O4
B3
C2
I/O2
15
14
13
N.C.
1
12
I/O3
GND
2
11
N.C.
N.C.
3
10
VCC
I/O6
4
9
N.C.
MAX3205E
*EP
VCC
C3
5
I/O5
I/O3
WLP
(BUMPS ON BOTTOM)
I/O1
N.C.
N.C.
15
14
13
VCC
4
I/O2
SOT23
N.C.
1
12
I/O2
2
11
N.C.
10
VCC
9
N.C.
7
N.C.
N.C.
3
5
6
I/O3
I/O4
4
μMAX
MAX3208E
*EP
5
6
7
8
N.C.
4
I/O3
I/O4
VCC
N.C.
16
N.C.
9
MAX3208E
8
I/O2
N.C. 3
5
8
N.C.
+
GND
3
MAX3207E
N.C.
10 N.C.
2
GND
7
N.C.
N.C.
6
GND 2
6
TQFN
+
I/O1 1
+
I/O1 1
N.C.
B1
16
I/O5
A3
I/O4
I/O1
A2
N.C.
A1
N.C.
+
GND
I/O1
I/O6
N.C.
TOP VIEW
TQFN
*CONNECT EP TO GND.
Package Information
For the latest package outline information and land patterns, go to www.maxim-ic.com/packages. Note that a “+”, “#”, or “-” in
the package code indicates RoHS status only. Package drawings may show a different suffix character, but the drawing pertains to
the package regardless of RoHS status.
8
PACKAGE TYPE
PACKAGE CODE
OUTLINE NO.
LAND PATTERN NO.
9 WLP
W91B1+5
21-0067
—
16 TQFN-EP
T1633+4
21-0136
90-0031
6 SOT23
U6+1
21-0058
90-0175
10 µMAX
U10+2
21-0061
90-0330
_______________________________________________________________________________________
Dual, Quad, and Hex High-Speed
Differential ESD-Protection ICs
REVISION
NUMBER
3
REVISION
DATE
7/10
DESCRIPTION
Changed the 9 UCSP package to a 9 WLP package in the Ordering Information table,
Absolute Maximum Ratings, Pin Description table, and the Pin Configurations;
changed leaded packages to lead-free packages in the Ordering Information table;
changed the MAX3205EAWL+T part number and its top mark in the Selector Guide;
deleted all information in the Chip Information section except “Process: BiCMOS”
PAGES
CHANGED
1, 2, 3, 7, 8
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600 _____________________ 9
© 2010 Maxim Integrated Products
Maxim is a registered trademark of Maxim Integrated Products, Inc.
MAX3205E/MAX3207E/MAX3208E
Revision History