SQRAM
SQR-SD3M-8G1600SNL
Datasheet
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REV 1.3
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Sep. 10, 2014
SQRAM
CONTENTS
1. Description......................................................................................... 4
2. Features ............................................................................................. 4
3. Dimensions (millimeter) ................................................................... 5
4. Pin Identification ............................................................................... 6
5. Pinouts ............................................................................................... 7
6. Parameter & Operating Conditions ................................................. 8
Appendix: Part Number Table ........................................................... 14
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REV 1.3
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SQRAM
Revision History
Rev.
Date
History
st
1.0
2013/4/26
1.
1 release
1.1
2013/6/26
1.
2
1.2
2013/11/12
1.
Correct operation temperature
1.3
2014/9/10
1.
Update Operating Temperature Condition
nd
release
Advantech reserves the right to make changes without further notice to any products or data herein to improve reliability, function, or
design. Information furnished by Advantech is believed to be accurate and reliable. However, Advantech does not assure any liability
arising out of the application or use of this information, nor the application or use of any product or circuit described herein, neither
does it convey any license under its patent rights nor the rights of others.
Copyright © 1983-2014 Advantech Co., Ltd. All rights reserved.
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1.
Description
The SQR-SD3M-8G1600SNL DDR3 Industrial 1.35V SO-DIMM is high-speed, low power memory module
that use 512Mx8bits DDR3 SDRAM in FBGA package and a 2048 bits serial EEPROM on a 204-pin
printed circuit board. DDR3 Industrial 1.35V SO-DIMM is a Dual In-Line Memory Module and is intended
for mounting into 204-pin edge connector sockets.
Synchronous design allows precise cycle control with the use of system clock. Data I/O transactions are
possible on both edges of DQS. Range of operation frequencies, programmable latencies allow the same
device to be useful for a variety of high bandwidth, high performance memory system applications.
2.
Features
Industrial Temperature : -20°C to +85°C
Gold plating of PCB gold finger is 30u”
RoHS compliant products.
JEDEC standard 1.35V (1.28V~1.45V) Power supply
JEDEC standard 1.5V (1.425V~1.575V) Power supply
VDDQ= 1.35V (1.28V~1.45V) & 1.5V (1.425V~1.575V)
Max clock Freq: 800MHZ for 1600Mb/s/Pin.
Programmable CAS Latency: 5, 6, 7, 8, 9, 10, 11
Programmable Additive Latency (Posted /CAS): 0, CL-2 or CL-1 clock
Programmable /CAS Write Latency (CWL) = 8 (DDR3-1600)
8 bit pre-fetch
Burst Length: 4, 8
Bi-directional Differential Data-Strobe
Internal calibration through ZQ pin
On Die Termination with ODT pin
Serial presence detect with EEPROM
Asynchronous reset
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REV 1.3
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SQRAM
3.
Dimensions (millimeter)
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4.
Pin Identification
Symbol
Function
A0~A15, BA0~BA2
Address/Bank input
DQ0~DQ63
Data Input / Output.
DQS0~DQS7
Data strobe
/DQS0~/DQS7
Differential Data strobe
CK0, /CK0 CK1, /CK1
Clock Input. (Differential pair)
CKE0, CKE1
Clock Enable Input.
ODT0, ODT1
On-die termination control line
/CS0, /CS1
DIMM Rank Select Lines.
/RAS
Row Address Strobe
/CAS
Column Address Strobe
/WE
Write Enable
DM0~DM7
VDD
Data masks/high data strobes
Voltage power supply
VDDQ
Voltage Power Supply for DQS
VREF
Power Supply for Reference
VDDSPD
SPD EEPROM Power Supply
SA0~SA2
I2C serial bus address select for EEPROM
SCL
I2C serial bus clock for EEPROM
SDA
I2C serial bus data for EEPROM
VSS
Ground
/RESET
Set DRAMs Known State
VTT
SDRAM I/O termination supply
NC
No Connection
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REV 1.3
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5.
Pinouts
No.
Name
No.
Name
No.
Name
No.
Name
No.
Name
No.
Name
1
VREFDQ
69
DQ27
137
DQS4
2
VSS
70
DQ31
138
VSS
3
VSS
71
VSS
139
VSS
4
DQ4
72
VSS
140
DQ38
5
DQ0
73
CKE0
141
DQ34
6
DQ5
74
CKE1
142
DQ39
7
DQ1
75
VDD
143
DQ35
8
VSS
76
VDD
144
VSS
9
VSS
77
NC
145
VSS
10
DQS0
78
A15
146
DQ44
11
DM0
79
BA2
147
DQ40
12
/ DQS0
80
A14
148
DQ45
13
VSS
81
VDD
149
DQ41
14
VSS
82
VDD
150
VSS
15
DQ2
83
A12
151
VSS
16
DQ6
84
A11
152
/DQS5
17
DQ3
85
A9
153
DM5
18
DQ7
86
A7
154
DQS5
19
VSS
87
VDD
155
VSS
20
VSS
88
VDD
156
VSS
21
DQ8
89
A8
157
DQ42
22
DQ12
90
A6
158
DQ46
23
DQ9
91
A5
159
DQ43
24
DQ13
92
A4
160
DQ47
25
VSS
93
VDD
161
VSS
26
VSS
94
VDD
162
VSS
27
/DQS1
95
A3
163
DQ48
28
DM1
96
A2
164
DQ52
29
DQS1
97
A1
165
DQ49
30
/RESET
98
A0
166
DQ53
31
VSS
99
VDD
167
VSS
32
VSS
100
VDD
168
VSS
33
DQ10
101
CK0
169
/DQS6
34
DQ14
102
CK1
170
DM6
35
DQ11
103
/CK0
171
DQS6
36
DQ15
104
/CK1
172
VSS
37
VSS
105
VDD
173
VSS
38
VSS
106
VDD
174
DQ54
39
DQ16
107
A10/AP
175
DQ50
40
DQ20
108
BA1
176
DQ55
41
DQ17
109
BA0
177
DQ51
42
DQ21
110
/RAS
178
VSS
43
VSS
111
VDD
179
VSS
44
VSS
112
VDD
180
DQ60
45
/DQS2
113
/WE
181
DQ56
46
DM2
114
/CS0
182
DQ61
47
DQS2
115
/CAS
183
DQ57
48
VSS
116
ODT0
184
VSS
49
VSS
117
VDD
185
VSS
50
DQ22
118
VDD
186
/DQS7
51
DQ18
119
A13
187
DM7
52
DQ23
120
ODT1
188
DQS7
53
DQ19
121
/CS1
189
VSS
54
VSS
122
NC
190
VSS
55
VSS
123
VDD
191
DQ58
56
DQ28
124
VDD
192
DQ62
57
DQ24
125
TEST
193
DQ59
58
DQ29
126
VREFCA
194
DQ63
59
DQ25
127
VSS
195
VSS
60
VSS
128
VSS
196
VSS
61
VSS
129
DQ32
197
SA0
62
/DQS3
130
DQ36
198
/EVENT
63
DM3
131
DQ33
199
VDDSPD
64
DQS3
132
DQ37
200
SDA
65
VSS
133
VSS
201
SA1
66
VSS
134
VSS
202
SCL
67
DQ26
135
/DQS4
203
Vtt
68
DQ30
136
DM4
204
Vtt
* Please refer Block Diagram
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REV 1.3
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SQRAM
6.
Parameter & Operating Conditions
Operating Temperature Condition
Parameter
Symbol
Rating
Unit
Notes
Operating Temperature
TOPER
-20 to 85
C
1,2
Note:
1. Operating Temperature is the case surface temperature on the center/top side of the DRAM. For the
measurement conditions, please refer to JESD51-2 standard.
2. At -20 - 85C, operation temperature range are the temperature which all DRAM specification will be supported.
Absolute Maximum DC Ratings
Parameter
Symbol
Value
Unit
Notes
VDD
-0.4 ~ 1.975
V
1
VDDQ
-0.4 ~ 1.975
V
1
VIN, VOUT
-0.4 ~ 1.975
V
1
TSTG
-55~+100
°C
1,2
Voltage on VDD relative to Vss
Voltage on VDDQ pin relative to Vss
Voltage on any pin relative to Vss
Storage temperature
Note:
1. Stress greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the stress
rating only and functional operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement
conditions, please refer to JESD51-2 standard.
AC & DC Operating Conditions
Recommended DC operating conditions (SSTL –1.5)
Parameter
Supply voltage
Supply voltage for Output
Symbol
VDD
VDDQ
I/O Reference voltage
(DQ)
VREFDQ(DC)
I/O Reference voltage
(CMD/ADD)
VREFCA(DC)
AC Input logic high
VIH(AC)
AC Input logic low
VIL(AC)
DC Input logic high
VIH(DC)
DC Input logic low
VIL(DC)
Note:
Rating
Voltage
Unit
Notes
V
1,2
V
1,2
0.51*VDDQ
V
3
0.51*VDDQ
V
3
Min
Typ.
Max
1.35V
1.283
1.35
1.45
1.5V
1.425
1.5
1.575
1.35V
1.283
1.35
1.45
1.5V
1.425
1.5
1.575
0.49*VDDQ
0.50*VDDQ
0.49*VDDQ
0.50*VDDQ
VREF+0.160
VREF+0.175
-
1.35V
1.5V
1.35V
1.5V
1.35V
1.5V
1.35V
1.5V
1.35V
1.5V
1.35V
1.5V
VREF+0.09
VREF+0.1
-
VSS
VSS
-
V
VREF-0.160
VREF-0.175
V
VDD
VDD
VREF-0.09
VREF-0.1
V
V
There is no specific device VDD supply voltage requirement for SSTL-1.5 compliance.
1. Under all conditions VDDQ must be less than or equal to VDD.
2. VDDQ tracks with VDD, AC parameters are measured with VDD and VDDQ tied together.
3. Peak to peak AC noise on VREF may not allow deviate from VREF(DC) by more than +/-1% VDD.
Specifications subject to change without notice, contact your sales representatives for the most update information.
REV 1.3
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SQRAM
IDD Specification parameters Definition
IDD values are for full operating range of voltage and Temperature
Parameter
Symbol
Max.
Unit
Operating One bank Active-Precharge current; tCK = tCK(IDD), tRC = tRC(IDD),
tRAS = tRASmin(IDD); CKE is HIGH, CS\ is HIGH between valid commands; Address
IDD0
760
mA
bus inputs are SWITCHING; Data bus inputs are SWITCHING
Operating One bank Active-read-Precharge current; IOUT = 0mA; BL = 4, CL =
CL(IDD), AL = 0; tCK = tCK(IDD), tRC = tRC (IDD), tRAS = tRASmin(IDD), tRCD =
IDD1
856
mA
tRCD(IDD); CKE is HIGH, CS\ is HIGH between valid commands; Address bus inputs
are SWITCHING; Data pattern is same as IDD4W
Precharge power-down current; All banks idle; tCK = tCK(IDD); CKE is LOW; Other
IDD2P
592
mA
control and address bus inputs are STABLE; Data bus inputs are FLOATING
Precharge quiet standby current; All banks idle; tCK = tCK(IDD); CKE is HIGH, CS\
is HIGH; Other control and address bus inputs are STABLE; Data bus inputs are
IDD2Q
752
mA
FLOATING
Precharge standby current; All banks idle; tCK = tCK(IDD); CKE is HIGH, CS\ is
HIGH; Other control and address bus inputs are SWITCHING; Data bus inputs are
IDD2N
800
mA
SWITCHING
Active power - down current; All banks open; tCK = tCK(IDD); CKE is LOW; Other
IDD3P
1008
mA
control and address bus inputs are STABLE; Data bus inputs are FLOATING
Active standby current; All banks open; tCK = tCK(IDD), tRAS = tRASmax(IDD),
tRP = tRP(IDD); CKE is HIGH, CS\ is HIGH between valid commands; Other control
IDD3N
992
mA
and address bus inputs are SWITCHING; Data bus inputs are SWITCHING
Operating burst read current; All banks open, Continuous burst reads, IOUT = 0mA;
BL = 4, CL = CL(IDD), AL = 0; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP =
IDD4R
1,656
mA
tRP(IDD); CKE is HIGH, CS\ is HIGH between valid commands; Address bus inputs
are SWITCHING; Data pattern is same as IDD4W
Operating burst write current; All banks open, Continuous burst writes; BL = 4, CL =
CL(IDD), AL = 0; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP = tRP(IDD); CKE is
IDD4W
1,480
mA
HIGH, CS\ is HIGH between valid commands; Address bus inputs are SWITCHING;
Data bus inputs are SWITCHING IDD4R
Burst refresh current; tCK = tCK(IDD); Refresh command at every tRFC(IDD)
interval; CKE is HIGH, CS\ is HIGH between valid commands; Other control and
IDD5
1,920
mA
address bus inputs are SWITCHING; Data bus inputs are SWITCHING
Self refresh current; CK and CK\ at 0V; CKE ≒ 0.2V; Other control and address
IDD6
352
mA
bus inputs are FLOATING; Data bus inputs are FLOATING
Operating bank interleave read current; All bank interleaving reads, IOUT = 0mA;
BL = 4, CL = CL(IDD), AL = tRCD(IDD)-1*tCK(IDD); tCK =tCK(IDD), tRC = tRC(IDD),
tRRD = tRRD(IDD), tRCD = 1*tCK(IDD); CKE is HIGH, CS\ is HIGH between valid
IDD7
2,480
mA
commands; Address bus inputs are STABLE during Deselects; Data pattern is same
as IDD4R; Refer to the following page for detailed timing conditions
1. Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ
Note:
loading capacitor.
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REV 1.3
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SQRAM
Timing Parameters & Specifications
Parameter
Symbol
Min
Max
Unit
Average Clock Period, CL=7
tCK
1.25