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ACT-E128K32N-200P7T

ACT-E128K32N-200P7T

  • 厂商:

    AEROFLEX

  • 封装:

  • 描述:

    ACT-E128K32N-200P7T - ACT-E128K32 High Speed 4 Megabit EEPROM Multichip Module - Aeroflex Circuit Te...

  • 数据手册
  • 价格&库存
ACT-E128K32N-200P7T 数据手册
ACT–E128K32 High Speed 4 Megabit EEPROM Multichip Module Features Package ■ Organized as 128K x 32 ● User CIRCUIT TECHNOLOGY www.aeroflex.com ■ 4 Low Power 128K x 8 EEPROM Die in One MCM ■ Packaging – Hermetic Ceramic Configurable to 256K x 16 or 512K x 8 ■ CMOS and TTL Compatible Inputs and Outputs ■ Access Times of 120,140,150, 200, 250& 300ns ■ +5V ±10% Supply ■ Automatic Page Write Operation ■ Page Write Cycle Time: 10ms Max ■ Data Retention Ten Years Minimum ■ Low Power CMOS ■ Data Polling for End of Write Detection ■ Industry Standard Pinouts 66 Pin, 1.08" x 1.08" x .160" PGA Type, No Shoulder, Aeroflex code# "P3" ● 66 Pin, 1.08" x 1.08" x .185" PGA Type, With Shoulder, Aeroflex code# "P7" ● 68 Lead, .88" x .88" x .200" Dual-Cavity Small Outline Gull Wing, Aeroflex code# "F2" (Drops into the 68 Lead JEDEC .99"SQ CQFJ footprint) ● ■ MIL-PRF-38534 Compliant MCMs Available ■ Hardware and Software Data Protection ■ Internal Decoupling Capacitors for Low Noise Operation ■ Commercial, Industrial and Military Temperature Ranges ■ SMD# 5962–94585 Released (P7 & F2) General Description Block Diagram – PGA Type Package (P3,P7) & CQFP (F2) The ACT–E128K32 is a high speed, 4 megabit, CMOS EEPROM multichip module (MCM) designed for full temperature range military, space, or high reliability applications. The MCM can be organized as a 256K x 16 bits or 512K x 8 bits device and is input and output CMOS and TTL compatible. Writing is executed when the write enable (WE) and chip enable (CE) inputs are low and output enable (OE) is high. Reading is accomplished when WE is high and CE and OE are both low. Access times grades of 120, 140, 150, 200, 250 & 300ns are standard. The ACT–E128K32 is packaged in a choice of hermetically sealed co-fired ceramic packages, a 66 pin, 1.08" sq PGA or a 68 lead, .88" sq gullwing CQFP. The device operates over the temperature range of -55°C to +125°C and military environment. WE1 CE1 WE2 CE2 WE3 CE3 WE4 CE4 A0 – A16 OE 128Kx8 128Kx8 128Kx8 128Kx8 8 8 8 8 I/O0-7 I/O8-15 I/O16-23 I/O 24-31 Pin Description I/O0-31 Data I/O A0–16 Address Inputs WE1-4 Write Enables OE CE1-4 VCC GND Output Enable Chip Enables Power Supply Ground eroflex Circuit Technology - Advanced Multichip Modules © SCD1662 REV B 9/5/01 Absolute Maximum Ratings Parameter Operating Temperature Storage Temperature Range All Input Voltages with respect to Ground All Output Voltages with respect to Ground Voltage on OE and A9 with respect to Ground Symbol TC TSTG VG Range -55 to +125 -65 to +150 -0.6 to +6.25 -0.6 to VCC+0.6 -0.6 to +13.5 Units °C °C V V V NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Recommended Operating Conditions Symbol VCC VIH VIL TC Parameter Power Supply Voltage Input High Voltage Input Low Voltage Case Operating Temperature (Military) Minimum +4.5 +2.0 -0.5 -55 Maximum +5.5 VCC + 0.3 +0.8 +125 Units V V V °C A Capacitance (VIN = 0V, f = 1MHz, TC = 25°C) Symbol CAD COE CWE(1-4) CCE(1-4) CI/O Parameter A0 – A16 Capacitance Output Enable Capacitance Write Enable Capacitance Chip Enable Capacitance I/O0 – I/O31 Capacitance Maximum 50 50 20 20 20 Units pF pF pF pF pF DC Characteristics (Vcc = 5.0V, Vss = 0V, TC = -55°C to +125°C, unless otherwise specified) Parameter Input Leakage Current Output Leakage Current Operating Supply Current x 32 Mode Operating Supply Current Output Low Voltage Output High Voltage Sym ILI Conditions VCC = 5.5V, VIN = GND to VCC Minimum Maximum 10 10 250 5 0.45 Units µA µA mA mA V V ILOX32 CE = OE = VIH, VOUT = GND to VCC ICC X32 CE = VIL, OE = VIH, f = 5Mhz ISB VOL VOH CE = VIH, OE = VIH, f = 5Mhz IOL = +2.1mA, VCC = 4.5V IOH = –400µA, VCC = 4.5V 2.4 Truth Table CE H L L X X X OE X L H H X L WE X H L X H X Mode Standby Read Write Out Disable Write Inhibit Data I/O High Z Data Out Data In High Z - Aeroflex Circuit Technology 2 SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700 AC Write Characteristics (VCC = 5V, VSS = 0V, TC = -55°C to +125°C) Parameter Write Cycle Time Address Set-up Time Write Pulse Width (WE or CE) Chip Enable Set-up Time Address Hold Time Data Hold Time Chip Enable Hold Time Data Set-up Time Output Enable Set-up Time Output Enable Hold Time Symbol tWC tAS tWP tCE tAH tDH tCEH tDS tOES tOEH Min 10 150 0 100 10 0 100 10 10 Max 10 Units ms ns ns ns ns ns ns ns ns ns A AC Read Characteristics (VCC = 5V, VSS = 0V, TC = -55°C to +125°C) Read Cycle Parameter Read Cycle Time Address Access Time Chip Enable Access Time Output Hold From Address Change, OE or CE Output Enable to Output Valid Chip Enable or OE to High Z Output Symbol tRC tACC tACE tOH tOE tDF –120 Min 120 120 120 0 0 55 70 0 0 –140 140 140 140 0 55 70 0 –150 150 150 150 0 55 70 0 –200 200 200 200 0 55 70 0 –250 250 250 250 0 85 70 0 –300 Max 300 300 300 Max Min Max Min Max Min Max Min Max Min Units ns ns ns ns 85 70 ns ns Page Write Characteristics (VCC = 5V, VSS = 0V, TC = -55°C to +125°C) Parameter Write Cycle Time Address Set-up Time Address Hold Time , See Note 1 Data Set-up Time Data Hold Time Write Pulse Width Byte Load Cycle Time Write Pulse Width High Note 1 – Page Address must remain valid for duration of write cycle. Symbol tWC tAS tAH tDS tDH tWP tBLC tWPH Minimum 10 100 100 10 150 Maximum 10 Units ms ns ns ns ns ns 150 50 µs ns Aeroflex Circuit Technology 3 SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700 Device Operation The ACT-E128K32 is a high-performance Electrically Erasable and Programmable Read Only Memory. It is composed of four 1 megabit memory chips and is organized as 131,072 by 32 bits. The device offers access times of 120 to 300ns with power dissipation of 1.375W. When the device is deselected, the CMOS standby current is less than 5 mA. The ACT-E128K32 is accessed like a Static RAM for the read or write cycle without the need for external components. The device contains a 128-byte page register to allow writing of up to 128 bytes simultaneously. During a write cycle, the address and 1 to 128 bytes of data are internally latched, freeing the address and data bus for other operations. Following the initiation of a write cycle, the device will automatically write the latched data using an internal control timer. The end of a write cycle can be detected by DATA polling of I/O7. Once the end of a write cycle has been detected a new access for a read or write can begin. Aeroflex’s ACT-E128K32 has additional features to ensure high quality and manufacturability. The device utilizes internal error correction for extended endurance and improved data retention characteristics. An optional software data protection mechanism is available to guard against inadvertent writes. consists of setting the WE line low. The write cycle begins when the last of either CE or WE goes low. The WE line transition from high to low also initiates an internal delay timer to permit page mode operation. Each subsequent WE transition from high to low that occurs before the completion of the tBLC time out will restart the timer from zero. The operation of the timer is the same as a retriggable one-shot. READ The ACT-E128K32 stores data at the memory location determined by the address pins. When CE and OE are low and WE is high, this data is present on the outputs. When CE and OE are high, the outputs are in a high impedance state. This two line control prevents bus contention. A DATA POLLING The ACT-E128K32 offers a data polling feature which allows a faster method of writing to the device. Figure 5 shows the timing diagram for this function. During a byte or page write cycle, an attempted read of the last byte written will result in the complement of the written data on I/O7 (For each Chip). Once the write cycle has been completed, true data is valid on all outputs and the next cycle may begin. Data polling may begin at any time during the write cycle. WRITE A write cycle is initiated when OE is high and a low pulse is on WE or CE with CE or WE low. The address is latched on the falling edge of CE or WE whichever occurs last. The data is latched by the rising edge of CE or WE, whichever occurs first. A byte write operation will automatically continue to completion. PAGE WRITE OPERATION The ACT-E128K32 has a page write operation that allows one to 128 bytes of data to be written into the device and consecutively loads during the internal programming period. Successive bytes may be loaded in the same manner after the first data byte has been loaded. An internal timer begins a time out operation at each write cycle. If another write cycle is completed within tBLC or less, a new time out period begins. Each write cycle restarts the delay period. The write cycles can be continued as long as the interval is less than the time out period. WRITE CYCLE TIMING Figures 2 and 3 show the write cycle timing relationships. A write cycle begins with address application, write enable and chip enable. Chip enable is accomplished by placing the CE line low. Write enable Aeroflex Circuit Technology 4 SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700 The usual procedure is to increment the least significant address lines from A0 through A6 at each write cycle. In this manner a page of up to 128 bytes can be loaded in to the EEPROM in a burst mode before beginning the relatively long interval programming cycle. After the tBLC time out is completed, the EEPROM begins an internal write cycle. During this cycle the entire page will be written at the same time. The internal programming cycle is the same regardless of the number of bytes accessed. byte write sequence of specific data to specific locations. Power transitions will not reset the software write protection. Each 128K byte block of the EEPROM has independent write protection. One or more blocks may be enabled and the rest disabled in any combination. The software write protection guards against inadvertent writes during power transitions, or unauthorized modification using a PROM programmer. HARDWARE DATA PROTECTION These features protect against inadvertent writes to the ACT-E128K32. These are included to improve reliability during normal operation: A) Vcc Sense While below 3.8V typical write cycles are inhibited. B) Write inhibiting Holding OE low and either CE or WE high inhibits write cycles. C) Noise filter Pulses of
ACT-E128K32N-200P7T 价格&库存

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