ACS720KLATR-15AB-T

ACS720 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package FEATURES AND BENEFITS DESCRIPTION • Differential current sensing cancels common mode fields, simplifying PCB layout • Two user-settable faults for fast short-circuit protection and slower overcurrent detection • Industry-leading noise performance with greatly improved bandwidth through proprietary amplifier and filter design techniques • Patented integrated digital temperature compensation circuitry allows high accuracy over temperature in an open loop sensor • 1.0 mΩ primary conductor resistance for low power loss and high inrush current-withstanding capability • Small footprint, low-profile SOIC16 package suitable for space-constrained applications • Integrated shield virtually eliminates capacitive coupling from current conductor to die due to high dV/dt voltage transients • 5 V single supply operation with 0-3 V output swing • Output voltage proportional to AC or DC current • Factory-trimmed sensitivity and quiescent output voltage for improved accuracy • 3600 Vrms Dielectric Strength certified under UL60950-1 • High PSRR for noisy environments The ACS720 is a high accuracy Hall-effect-based current sensor IC with multiple programmable fault levels intended for industrial and consumer applications with a focus on motor control and power inverter stage applications. PACKAGE: 16-Pin SOICW (suffix LA) CB Certificate Number: US-23711-A2-UL Not to scale VCC VOC_F One of the key benefits of the ACS720 is to provide high isolation with a reduced bill of materials made possible by the proprietary IC SOIC16W package. The ACS720 works off of a single 5 V supply while maintaining an output voltage swing from 0 to 3 V, with a stable zero current output of 1.5 V. This allows the ACS720 to operate off of a 5 V supply while having an output which is compatible with typical 3.3 V ADCs found on many MCUs. Furthermore, the ACS720’s high PSRR rejects the noise often found on the supplies in the power section of the PCB or system, maintaining high accuracy in noisy environments. The device has dual fault functions that are user configurable. Fast and slow fault output allow for short-circuit and overcurrent fault detection. A user-created resistor divider from the power supply of the ACS720 is used to set the fault level. The fault outputs are open drain, allowing the user to pull them up to a compatible voltage for the MCU. The open-drain outputs also allow for implementing a simple logical OR of multiple sensor fault outputs. The ACS720 also integrates differential current sensing, which rejects external magnetic fields, greatly simplifying board layout in 3-phase motor applications. Continued on the next page… VOC_S Voltage Reference DIGITAL SYSTEM ADC To All Subcircuits Fault Setpoint Control DAC Fast Fault Hall Driver EEPROM & Control Logic FAULT_F Temp. Sensor Programming Control FAULT_S Fault Filter Logic IP+ Slow Fault Dynamic Offset Cancellation Sensitivity Control Offset Control DAC RF(INT) Analog Filters VIOUT IP– GND FILTER Figure 1: Functional Block Diagram ACS720-DS, Rev. 9 MCO-0000183 August 23, 2019 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 DESCRIPTION (continued) Near closed-loop accuracy is achieved in this open-loop sensor due to Allegro’s patented, digital temperature compensation, ultimately offering a smaller and more economical solution for many current sensing applications that traditionally rely on closed-loop core based sensors. The ACS720 is provided in a small surface-mount SOIC16 package. The leadframe is plated with 100% matte tin, which is compatible with standard lead (Pb) free printed circuit board assembly processes. Internally, the device is Pb-free, except for flip-chip high-temperature Pb‑based solder balls, currently exempt from RoHS. The device is fully calibrated prior to shipment from the factory. SELECTION GUIDE Sensing Range, IPR (A) Part Number Sensitivity, Sens (Typ) (mV/A) Fast Fault Mask Time (Typ) (µs) ACS720KLATR-15AB-T ±15 90 0 ACS720KLATR-15AB-T-4 ±15 90 1.5 ACS720KLATR-35AB-T ±35 38.5 0 ACS720KLATR-35AB-T-4 ±35 38.5 1.5 ACS720KLATR-65AB-T ±65 20.5 0 ACS720KLATR-65AB-T-4 ±65 20.5 1.5 ACS720KLATR-80AB-T ±80 16 0 ACS720KLATR-80AB-T-4 ±80 16 1.5 TA (°C) Packing* –40 to 125 Tape and Reel, 1000 pieces per reel *Contact Allegro for packing options. 1 2 3 4 IP 5 6 7 8 IP+ IP+ VOC_S VOC_F IP+ VCC IP+ FAULT_F/ IP- VIOUT IP- FILTER IP- FAULT_S/ IP- GND 16 VOC_S 15 VOC_F 5V 5V 14 13 CB FF VOC_F VOC_S 12 11 10 CF SF 5V 9 CBYPASS 1 2 3 4 IP 5 6 7 8 IP+ VOC_S IP+ VOC_F IP+ VCC IP+ FAULT_F/ IP- VIOUT IP- FILTER IP- FAULT_S/ IP- GND 16 VOC_S 15 VOC_F 3.3 V 5V 14 13 RPU 12 FF 11 10 CF SF MCU RPU CB FF SF 9 3.3 V VCC Digital I/O Digital I/O ADC1 ADC2 ADC3 1 2 3 4 IP 5 6 7 8 IP+ VOC_S IP+ VOC_F IP+ VCC IP+ FAULT_F/ IP- VIOUT IP- FILTER IP- FAULT_S/ IP- GND 16 VOC_S 15 VOC_F 2 3 IP 4 5 6 7 8 ACS720 IP+ VOC_S IP+ VOC_F IP+ VCC IP+ FAULT_F IP– VIOUT IP– FILTER IP– FAULT_S IP– GND 16 3.3 V 15 14 RPU 13 MCU RPU 12 Digital I/O ADC 11 10 VCC CF 9 Digital I/O GND GND 5V 14 13 1 CB FF 12 11 10 SF CF 9 Three Phase Single Phase Figure 2: Typical Applications Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 2 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 ABSOLUTE MAXIMUM RATINGS Characteristic Symbol Notes Rating Units Supply Voltage VCC 6 V Reverse Supply Voltage VRCC –0.5 V VFILTER 25 V Reverse Filter Voltage Filter Voltage VRFILTER –0.5 V Output Voltages VIOUT, VFAULT_S, VFAULT_F VCC + 0.7 V Reverse Output Voltage VRIOUT, VRFAULT_S, VRFAULT_F –0.5 V Input Pin Voltages VOC_S, VOC_F VCC + 0.7 V Reverse Input Pin Voltages VROC_S, VROC_F –0.5 V Maximum Continuous Current Operating Ambient Temperature ICMAX TA = 25°C 55 A TA Range K –40 to 125 °C Junction Temperature TJ(max) 165 °C Storage Temperature Tstg –65 to 170 °C ESD RATINGS Value Unit Human Body Model Characteristic Symbol VHBM Per AEC-Q100 Test Conditions ±7 kV Charged Device Model VCDM Per AEC-Q100 ±1 kV ISOLATION CHARACTERISTICS Characteristic Dielectric Surge Strength Test Voltage Dielectric Strength Test Voltage Working Voltage for Basic Isolation Symbol VSURGE VISO VWVBI Value Units Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5 1.2 µs (rise) / 50 µs (width). Notes 10000 V Agency type-tested for 60 seconds per UL 60950-1 (edition 2). Production tested at 2250 VRMS for 1 second in accordance with UL 60950-1. 3600 VRMS Maximum approved working voltage for basic (single) isolation according to UL 60950-1 (edition 2). 870 VPK or VDC 616 VRMS Clearance Dcl Minimum distance through air from IP leads to signal leads. 7.5 mm Creepage Dcr Minimum distance along package body from IP leads to signal leads. 7.5 mm Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 3 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 THERMAL CHARACTERISTICS [1] Characteristic Symbol Test Conditions Value Unit Junction-to-Ambient Thermal Resistance RθJA Mounted on the Allegro ASEK732/3 evaluation board. Performance values include the power consumed by the PCB. [2] 17 °C/W Junction-to-Lead Thermal Resistance RθJL Mounted on the Allegro ASEK732/3 evaluation board. [2] 5 °C/W [1] [2] Refer to the die temperature curves versus DC current plot (p. 29). Additional thermal information is available on the Allegro website. The Allegro evaluation board has 1500 mm2 of 2 oz. copper on each side, connected to pins 1 through 4 and pins 5 through 8, with thermal vias connecting the layers. Performance values include the power consumed by the PCB. Further details on the board are available from the Frequently Asked Questions document on our website. Further information about board design and thermal performance also can be found in the Applications Information section of this datasheet. PINOUT DIAGRAM AND TERMINAL LIST TABLE TERMINAL LIST TABLE IP+ 1 16 VOC_S Number Name IP+ 2 15 VOC_F IP+ 3 14 VCC 1 through 4 IP+ IP+ 4 13 FAULT_F 5 through 8 IP– IP– 5 GND Description Terminals for current being sensed; fused internally Terminals for current being sensed; fused internally 12 VIOUT 9 IP– 6 11 FILTER 10 FAULT_S IP– 7 10 FAULT_S IP– 8 9 GND 11 FILTER Add capacitor to set output filter pole location 12 VIOUT Analog output signal 13 FAULT_F Package LA, 16-Pin SOICW Pinout Diagram Signal ground terminal Open drain slow fault output (low true) Open drain fast fault output (low true) 14 VCC 15 VOC_F Sets the trip current level for the fast fault Device power supply terminal 16 VOC_S Sets the trip current level for the slow fault Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 4 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 COMMON OPERATING CHARACTERISTICS [1]: Over full range of TA, and VCC = 5 V, unless otherwise specified  Characteristic Symbol Test Conditions Min. Typ. Max. Units 4.5 5.0 5.5 V ELECTRICAL CHARACTERISTICS Supply Voltage Supply Current Filter Resistance Primary Conductor Resistance Power-On Time Fault Power-On Time [2] VCC VCC = 5.0 V, output open – 13 16 mA RF(INT) TA = 25°C – 1.7 – kΩ RIP TA = 25°C – 1.0 – mΩ tPO Time from when VCC > VCC(min) to when the output reaches 90% of its steady-state level; TA = 25°C – 70 – μs tPO(FAULT) Time from when VCC > VCC(min) to when FAULT_S and FAULT_F will react to an overcurrent event – 270 – μs tR TA = 25°C, CL = 1 nF, 1 V step on output – 3 – μs ICC OUTPUT SIGNAL CHARACTERISTICS Rise Time tRESPONSE TA = 25°C, CL = 1 nF, 1 V step on output – 4 – μs Propagation Delay tPD TA = 25°C, CL = 1 nF, 1 V step on output – 1 – μs Internal Bandwidth BW Small signal –3 dB; CL = 1 nF – 120 – kHz Output Capacitance Load CL VIOUT to GND – – 10 nF Response Time Output Resistive Load RL VIOUT to GND, VIOUT to VCC 10 – – kΩ Output Source Current IOUT(SRC) VIOUT shorted to GND – 3 – mA Output Sink Current IOUT(SNK) VIOUT shorted to VCC – 30 – mA Saturation Voltage Clamp Voltage [4] Noise Density Noise Nonlinearity VOL RL = 10 kΩ (VIOUT to VCC) – – 150 mV 3.0 3.25 3.5 V Input-referenced noise density; TA = 25°C, CL = 4.7 nF – 220 – µA /√(Hz) Input referenced noise at 120 kHz bandwidth; TA = 25°C; CL = 1 nF; CF = 0 nF – 100 – mArms Input referenced noise at 20 kHz bandwidth; TA = 25°C; CL = 1 nF; CF = 4.7 nF – 31 – mArms – ±0.75 – % VCLAMP IND IN ELIN Power Supply Rejection Ratio PSRR Common Mode Field Rejection Ratio CMFR DC to 1 kHz – 40 – dB 1 kHz to 20 kHz – 30 – dB Magnetic field perpendicular to Hall plates – –45 – dB Continued on the next page… Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 5 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 COMMON OPERATING CHARACTERISTICS [1] (continued): Over full range of TA, and VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. Max. Units – 6 – µs FAULT CHARACTERISTICS Fault Clear Time tC(F) Time from IP falling below IFAULT – IHYS to when VFAULT is pulled above VFAULTL; RPU = 10 kΩ, 100 pF from FAULT to ground Fast Fault Hysteresis [3] IHYS(FF) – 0.06 × IPR – A Slow Fault Hysteresis [3] IHYS(SF) – 0.05 × IPR – A Fault Output Low Voltage VFAULTL – – 0.4 V RPU = 10 kΩ, under fault condition, FAULT_S and FAULT_F pins 4.7 – 500 kΩ 1.0 × IPR – 2.25 × IPR A Absolute value of IP 0.5 × IPR – 1.25 × IPR A VOC_S, VOC_F 0.3 × VCC – 0.7 × VCC V IIN VOC_S, VOC_F – 100 – nA VOC Sample Rate fs(VOC) VOC_S, VOC_F – 62.5 – kHz VOC Update Rate fupdate(VOC) 8 samples averaged per update – 7.8 – kHz Fault Pull-Up Resistance RPU Fast Fault Range IFAULT(F) Absolute value of IP Slow Fault Range IFAULT(S) VOC Input Range VVOC High Impedance Pin Input Current [1] Device may be operated at higher primary current levels, IP, ambient TA, and internal leadframe temperature, provided that the Maximum Junction Temperature, TJ(max), is not exceeded. [2] When V CC < VCC (min), the faults remain in the no-fault state. [3] After the absolute value of I goes above I P FAULT(F) or IFAULT(S), tripping the internal fault comparator, IP must go below IFAULT(F) – IHYS(FF) or IFAULT(S) – IHYS(SF), before the internal fault comparator will reset. [4] Clamp Voltage applies only to VIOUT pin. Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 6 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x15AB PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –15 – 15 A Sens – 90 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 33.8 – A IFF(LOW) VOC_F = 0.54 × VCC – 26.3 – A ISF(HIGH) VOC_S = 0.7 × VCC – 18.8 – A ISF(LOW) VOC_S = 0.3 × VCC – 7.5 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.8 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.6 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.6 4 % IP = 0 A, TA = 25°C to 125°C –10 ±4 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –15 ±5 15 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error VOC_F = 0.7 × VCC, Negative IP, TA = 25°C –12 ±6 12 % VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C –30 ±20 30 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±35 – % VOC_F = 0.54 × VCC, Positive IP, TA = 25°C –10 ±7 10 % VOC_F = 0.54 × VCC, Positive IP, TA = 25°C to 125°C –15 ±10 15 % VOC_F = 0.54 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.54 × VCC, Negative IP, TA = 25°C –15 ±7 15 % VOC_F = 0.54 × VCC, Negative IP, TA = 25°C to 125°C –40 ±25 40 % VOC_F = 0.54 × VCC, Negative IP, TA = –40°C to 25°C – ±45 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –6 ±3 6 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –12 ±5 12 % Fast Fault Delay Code – 0 – Slow Fault Delay Code – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground – 1.5 2 μs Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 7 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x15AB-4 PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –15 – 15 A Sens – 90 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 33.8 – A IFF(LOW) VOC_F = 0.54 × VCC – 26.3 – A ISF(HIGH) VOC_S = 0.7 × VCC – 18.8 – A ISF(LOW) VOC_S = 0.3 × VCC – 7.5 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.8 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.6 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.6 4 % IP = 0 A, TA = 25°C to 125°C –10 ±4 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –15 ±5 15 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error –12 ±6 12 % –30 ±20 30 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±35 – % VOC_F = 0.54 × VCC, Positive IP, TA = 25°C –10 ±7 10 % VOC_F = 0.54 × VCC, Positive IP, TA = 25°C to 125°C –15 ±10 15 % VOC_F = 0.54 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.54 × VCC, Negative IP, TA = 25°C –15 ±7 15 % VOC_F = 0.54 × VCC, Negative IP, TA = 25°C to 125°C –40 ±25 40 % VOC_F = 0.54 × VCC, Negative IP, TA = –40°C to 25°C – ±45 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –6 ±3 6 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –12 ±5 12 % – 1.5 – µs Fast Fault Delay Code – Fast Fault Mask Time tm(ff) Slow Fault Delay Code VOC_F = 0.7 × VCC, Negative IP, TA = 25°C VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C 4 – – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground – 3.5 – μs Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 8 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x35AB PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –35 – 35 A Sens – 38.5 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 78.8 – A IFF(LOW) VOC_F = 0.38 × VCC – 43.8 – A ISF(HIGH) VOC_S = 0.7 × VCC – 43.8 – A ISF(LOW) VOC_S = 0.3 × VCC – 17.5 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = 0 A, TA = 25°C to 125°C –10 ±3.5 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±15 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error VOC_F = 0.7 × VCC, Negative IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C –15 ±10 15 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±20 – % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C –20 ±12 20 % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C to 125°C –20 ±12 20 % VOC_F = 0.38 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C –20 ±12 20 % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C to 125°C –30 ±18 30 % VOC_F = 0.38 × VCC, Negative IP, TA = –40°C to 25°C – ±32 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –6 ±3 6 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –10 ±5 10 % Fast Fault Delay Code – 0 – Slow Fault Delay Code – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 1.5 2 μs – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 9 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x35AB-4 PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –35 – 35 A Sens – 38.5 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 78.8 – A IFF(LOW) VOC_F = 0.38 × VCC – 43.8 – A ISF(HIGH) VOC_S = 0.7 × VCC – 43.8 – A ISF(LOW) VOC_S = 0.3 × VCC – 17.5 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = 0 A, TA = 25°C to 125°C –10 ±3.5 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±15 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error –10 ±5 10 % –15 ±10 15 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±20 – % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C –20 ±12 20 % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C to 125°C –20 ±12 20 % VOC_F = 0.38 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C –20 ±12 20 % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C to 125°C –30 ±18 30 % VOC_F = 0.38 × VCC, Negative IP, TA = –40°C to 25°C – ±32 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –6 ±3 6 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –10 ±5 10 % – 1.5 – µs Fast Fault Delay Code – Fast Fault Mask Time tm(ff) Slow Fault Delay Code VOC_F = 0.7 × VCC, Negative IP, TA = 25°C VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C 4 – – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground – 3.5 – μs Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 10 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x65AB PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –65 – 65 A Sens – 20.5 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 146.3 – A IFF(LOW) VOC_F = 0.38 × VCC – 81.3 – A ISF(HIGH) VOC_S = 0.7 × VCC – 81.3 – A ISF(LOW) VOC_S = 0.3 × VCC – 32.5 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.5 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = 0 A, TA = 25°C to 125°C –10 ±3.5 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±15 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error VOC_F = 0.7 × VCC, Negative IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±15 – % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = –40°C to 25°C – ±30 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –6 ±3 6 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –10 ±5 10 % Fast Fault Delay Code – 0 – Slow Fault Delay Code – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 1.5 2 μs – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 11 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x65AB-4 PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –65 – 65 A Sens – 20.5 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 146.3 – A IFF(LOW) VOC_F = 0.38 × VCC – 81.3 – A ISF(HIGH) VOC_S = 0.7 × VCC – 81.3 – A ISF(LOW) VOC_S = 0.3 × VCC – 32.5 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.5 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = 0 A, TA = 25°C to 125°C –10 ±3.5 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±15 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error –10 ±5 10 % –10 ±5 10 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±15 – % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = –40°C to 25°C – ±30 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –6 ±3 6 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –10 ±5 10 % – 1.5 – µs Fast Fault Delay Code – Fast Fault Mask Time tm(ff) Slow Fault Delay Code VOC_F = 0.7 × VCC, Negative IP, TA = 25°C VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C 4 – – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground – 3.5 – μs Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 12 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x80AB PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –80 – 80 A Sens – 16 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 180 – A IFF(LOW) VOC_F = 0.38 × VCC – 100 – A ISF(HIGH) VOC_S = 0.7 × VCC – 100 – A ISF(LOW) VOC_S = 0.3 × VCC – 40 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.5 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = 0 A, TA = 25°C to 125°C –10 ±3.5 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±15 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error VOC_F = 0.7 × VCC, Negative IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±15 – % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = –40°C to 25°C – ±30 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –8 ±4 8 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –10 ±5 10 % Fast Fault Delay Code – 0 – Slow Fault Delay Code – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 1.5 2 μs – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 13 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 x80AB-4 PERFORMANCE CHARACTERISTICS: Valid at TA = – 40°C to 125°C, VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit NOMINAL PERFORMANCE Optimized Accuracy Range Sensitivity Zero-Current Output Voltage Fast Fault Trip Level Slow Fault Trip Level IPR –80 – 80 A Sens – 16 – mV/A VIOUT(Q) IP = 0 A – 1.5 – V IFF(HIGH) VOC_F = 0.7 × VCC – 180 – A IFF(LOW) VOC_F = 0.38 × VCC – 100 – A ISF(HIGH) VOC_S = 0.7 × VCC – 100 – A ISF(LOW) VOC_S = 0.3 × VCC – 40 – A TOTAL OUTPUT ERROR COMPONENTS [2] Total Output Error [3] ETOT Sensitivity Error ESENS Offset Voltage VOE ETOT(IP) = {[VIOUT_ideal(IP) – VIOUT(IP)] / [Sensideal(IP) × IP]} × 100 (%) IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.6 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = IPR(max), TA = 25°C to 125°C –1.5 ±0.5 1.5 % IP = IPR(max), TA = –40°C to 25°C –4 ±1.5 4 % IP = 0 A, TA = 25°C to 125°C –10 ±3.5 10 mV IP = 0 A, TA = –40°C to 25°C –30 ±9 30 mV VOC_F = 0.7 × VCC, Positive IP, TA = 25°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = 25°C to 125°C –10 ±5 10 % VOC_F = 0.7 × VCC, Positive IP, TA = –40°C to 25°C – ±15 – % OVERCURRENT FAULT PERFORMANCE EFF(HIGH)+ EFF(HIGH)– Fast Fault Error EFF(LOW)+ EFF(LOW)- Slow Fault Error –10 ±5 10 % –10 ±5 10 % VOC_F = 0.7 × VCC, Negative IP, TA = –40°C to 25°C – ±15 – % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Positive IP, TA = –40°C to 25°C – ±25 – % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = 25°C to 125°C –20 ±15 20 % VOC_F = 0.38 × VCC, Negative IP, TA = –40°C to 25°C – ±30 – % ESF(HIGH) VOC_S = 0.7 × VCC, IP rising –8 ±4 8 % ESF(LOW) VOC_S = 0.3 × VCC, IP rising –10 ±5 10 % – 1.5 – µs Fast Fault Delay Code – Fast Fault Mask Time tm(ff) Slow Fault Delay Code VOC_F = 0.7 × VCC, Negative IP, TA = 25°C VOC_F = 0.7 × VCC, Negative IP, TA = 25°C to 125°C 4 – – 4 – FAULT CHARACTERISTICS Fast Fault Response Time tR(FF) Time from IP rising above IFF until VFAULT_F < VFAULTL for a current step from 0 to 1.2 × IFAULT(FAST); RPU = 10 kΩ, 100 pF from FAULT_F to ground – 3.5 – μs Slow Fault Response Time tR(SF) Time from IP rising above ISF until VFAULT_S < VFAULTL for a current step from 0 to 1.2 × IFAULT(SLOW); RPU = 10 kΩ, 100 pF from FAULT_S to ground – 13 – μs [1] Typical values with +/- are 3 sigma values. part will not have both the maximum/minimum sensitivity error and maximum/minimum offset voltage, as that would violate the maximum/minimum total output error specification. Also, 3 sigma distribution values are combined by taking the square root of the sum of the squares. [3] Percentage of I , with I = I P  P PR(max). [2] A single Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 14 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-15AB-T Offset Voltage versus Temperature Sensitivity Error (%) 0 -5 -10 -40 -20 0 20 40 60 Sensitivity Error versus Temperature 1.5 5 80 100 1 0.5 0 -0.5 -1 -1.5 -40 120 -20 0 Temperature (°C) Average 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma ± 3 Sigma Total Output Error versus Temperature 1.5 Total Output Error (%) Offset Voltage (mV) 10 1 0.5 0 -0.5 -1 -1.5 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 15 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-15AB-T Negative Slow Fault Error at VOC = 0.3*VCC versus Temperature 8 6 6 Slow Fault Error (%) Slow Fault Error (%) Positive Slow Fault Error at VOC = 0.3*VCC versus Temperature 8 4 2 0 -2 -4 -6 -8 -40 -20 0 20 40 60 80 100 4 2 0 -2 -4 -6 -8 -40 120 -20 0 Average 6 6 4 2 0 -2 -4 -6 0 20 40 60 Temperature (°C) Average ± 3 Sigma 60 80 100 120 80 100 ± 3 Sigma Negative Slow Fault Error at VOC = 0.7*VCC versus Temperature 8 Slow Fault Error (%) Slow Fault Error (%) Positive Slow Fault Error at VOC = 0.7*VCC versus Temperature -20 40 Average ± 3 Sigma 8 -8 -40 20 Temperature (°C) Temperature (°C) 120 4 2 0 -2 -4 -6 -8 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 16 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-15AB-T Negative Fast Fault Error at VOC = 0.54*VCC versus Temperature 50 40 40 30 30 Fast Fault Error (%) Fast Fault Error (%) Positive Fast Fault Error at VOC = 0.54*VCC versus Temperature 50 20 10 0 -10 -20 -30 -40 -50 -40 20 10 0 -10 -20 -30 -40 -20 0 20 40 60 80 100 -50 -40 120 -20 0 Temperature (°C) Average Positive Fast Fault Error at VOC = 0.7*VCC versus Temperature 60 80 100 120 ± 3 Sigma Negative Fast Fault Error at VOC = 0.7*VCC versus Temperature 50 40 40 30 30 Fast Fault Error (%) Fast Fault Error (%) 40 Average ± 3 Sigma 50 20 10 0 -10 -20 -30 -40 -50 -40 20 Temperature (°C) 20 10 0 -10 -20 -30 -40 -20 0 20 40 60 Temperature (°C) Average ± 3 Sigma 80 100 120 -50 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 17 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-35AB-T Offset Voltage versus Temperture 8 Sensitivity Error (%) 4 2 0 -2 -4 -6 -20 0 20 40 60 80 100 1 0.5 0 -0.5 -1 -1.5 -40 120 -20 0 Average 20 40 60 80 100 120 Temperature (°C) Temperature (°C) Average ± 3 Sigma ± 3 Sigma Total Output Error versus Temperature 1.5 Total Output Error (%) Offset Voltage (mV) 6 -8 -40 Sensitivity Error versus Temperature 1.5 1 0.5 0 -0.5 -1 -1.5 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 18 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-35AB-T Negative Slow Fault Error at VOC = 0.3*VCC versus Temperature 8 6 6 Slow Fault Error (%) Slow Fault Error (%) Positive Slow Fault Error at VOC = 0.3*VCC versus Temperature 8 4 2 0 -2 -4 -6 -8 -40 -20 0 20 40 60 80 100 4 2 0 -2 -4 -6 -8 -40 120 -20 0 Temperature (°C) Average Average ± 3 Sigma 6 6 4 2 0 -2 -4 -6 0 20 40 60 80 100 -4 -6 -20 0 Fast Fault Error (%) Fast Fault Error (%) 10 0 -10 -20 -30 Temperature (°C) Average ± 3 Sigma 60 80 100 120 80 100 ± 3 Sigma Negative Fast Fault Error at VOC = 0.3*VCC versus Temperature 20 60 40 Average ± 3 Sigma 30 40 20 Temperature (°C) 30 20 ± 3 Sigma -2 40 0 120 0 -8 -40 120 Positive Fast Fault Error at VOC = 0.3*VCC versus Temperature -20 100 2 40 -40 -40 80 4 Temperature (°C) Average 60 Negative Slow Fault Error at VOC = 0.7*VCC versus Temperature 8 Slow Fault Error (%) Slow Fault Error (%) Positive Slow Fault Error at VOC = 0.7*VCC versus Temperature -20 40 Temperature (°C) 8 -8 -40 20 120 20 10 0 -10 -20 -30 -40 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 19 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-35AB-T Negative Fast Fault Error at VOC = 0.38*VCC versus Temperature 40 30 30 Fast Fault Error (%) Fast Fault Error (%) Positive Fast Fault Error at VOC = 0.38*VCC versus Temperature 40 20 10 0 -10 -20 -30 -40 -40 -20 0 20 40 60 80 100 20 10 0 -10 -20 -30 -40 -40 120 -20 0 Temperature (°C) Average Average ± 3 Sigma 30 30 20 10 0 -10 -20 -30 0 20 40 60 80 100 -20 -30 -20 0 Fast Fault Error (%) Fast Fault Error (%) 10 0 -10 -20 -30 Temperature (°C) Average ± 3 Sigma 60 80 100 120 80 100 ± 3 Sigma Negative Fast Fault Error at VOC = 0.7*VCC versus Temperature 20 60 40 Average ± 3 Sigma 30 40 20 Temperature (°C) 30 20 ± 3 Sigma -10 40 0 120 0 -40 -40 120 Positive Fast Fault Error at VOC = 0.7*VCC versus Temperature -20 100 10 40 -40 -40 80 20 Temperature (°C) Average 60 Negative Fast Fault Error at VOC = 0.54*VCC versus Temperature 40 Fast Fault Error (%) Fast Fault Error (%) Positive Fast Fault Error at VOC = 0.54*VCC versus Temperature -20 40 Temperature (°C) 40 -40 -40 20 120 20 10 0 -10 -20 -30 -40 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 20 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-65AB-T Offset Voltage versus Temperature 8 Sensitivity Error (%) 4 2 0 -2 -4 -6 -20 0 20 40 60 80 100 1 0.5 0 -0.5 -1 -1.5 -40 120 -20 0 Temperature (°C) Average 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma ± 3 Sigma Total Output Error versus Temperature 1.5 Total Output Error (%) Offset Voltage (mV) 6 -8 -40 Sensitivity Error versus Temperature 1.5 1 0.5 0 -0.5 -1 -1.5 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 21 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-65AB-T Negative Slow Fault Error at VOC = 0.3*VCC versus Temperature 8 6 6 Slow Fault Error (%) Slow Fault Error (%) Positive Slow Fault Error at VOC = 0.3*VCC versus Temperature 8 4 2 0 -2 -4 -6 -8 -40 -20 0 20 40 60 80 100 4 2 0 -2 -4 -6 -8 -40 120 -20 0 Temperature (°C) Average Average ± 3 Sigma Positive Slow Fault Error at VOC = 0.7*VCC versus Temperature 100 120 ± 3 Sigma 6 4 Slow Fault Error (%) Slow Fault Error (%) 80 Negative Slow Fault Error at VOC = 0.7*VCC versus Temperature 2 0 -2 -4 -6 -20 0 20 40 60 80 100 Average 4 2 0 -2 -4 -6 -8 -40 120 Temperature (°C) Fast Fault Error (%) 20 10 0 -10 -20 40 60 Temperature (°C) Average ± 3 Sigma 40 60 80 100 120 80 100 ± 3 Sigma Negative Fast Fault Error at VOC = 0.3*VCC versus Temperature 20 20 20 Average 30 0 0 ± 3 Sigma 30 -20 -20 Temperature (°C) Positive Fast Fault Error at VOC = 0.3*VCC versus Temperature Fast Fault Error (%) 60 8 6 -30 -40 40 Temperature (°C) 8 -8 -40 20 120 10 0 -10 -20 -30 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 22 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-65AB-T Negative Fast Fault Error at VOC = 0.38*VCC versus Temperature 30 20 20 Fast Fault Error (%) Fast Fault Error (%) Positive Fast Fault Error at VOC = 0.38*VCC versus Temperature 30 10 0 -10 -20 -30 -40 -20 0 20 40 60 80 100 10 0 -10 -20 -30 -40 120 -20 0 Temperature (°C) Average Average ± 3 Sigma 20 20 10 0 -10 -20 0 20 40 60 80 100 -20 0 Fast Fault Error (%) Fast fault Error (%) 0 -10 -20 Temperature (°C) Average ± 3 Sigma 60 80 100 120 80 100 ± 3 Sigma Negative Fast Fault Error at VOC = 0.7*VCC versus Temperature 10 60 40 Average ± 3 Sigma 20 40 20 Temperature (°C) 20 20 ± 3 Sigma -20 30 0 120 -10 -30 -40 120 Positive Fast Fault Error at VOC = 0.7*VCC versus Temperature -20 100 0 30 -30 -40 80 10 Temperature (°C) Average 60 Negative Fast Fault Error at VOC = 0.54*VCC versus Temperature 30 Fast Fault Error (%) Fast Fault Error (%) Positive Fast Fault Error at VOC = 0.54*VCC versus Temperature -20 40 Temperature (°C) 30 -30 -40 20 120 10 0 -10 -20 -30 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average ± 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 23 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-80AB-T Offset Voltage versus Temperature Sensitivity Error versus Temperature 1.5 Sensitivity Error (%) 1 5 0 -5 -10 -40 -20 0 20 40 60 80 100 0.5 0 -0.5 -1 -1.5 -40 120 -20 0 Temperature (°C) Average 20 40 60 80 100 120 Temperature (°C) Average 3 Sigma 3 Sigma Total Output Error versus Temperature 1.5 Total Output Error (%) Offset Voltage (mV) 10 1 0.5 0 -0.5 -1 -1.5 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 24 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-80AB-T 8 Positive Fast Fault Error at VOC = 0.7*VCC versus Temperature 10 Negative Fast Fault Error at VOC = 0.7*VCC versus Temperature Fast Fault Error (%) Fast Fault Error (%) 6 4 2 0 -2 -4 -6 -40 -20 0 20 40 60 80 100 5 0 -5 -10 -40 120 -20 0 Temperature (°C) Average Positive Fast Fault Error at VOC = 0.54*VCC versus Temperature 10 5 0 -5 -10 -40 -20 0 20 40 60 80 100 20 -10 -20 20 40 60 Temperature (°C) Average 3 Sigma 3 Sigma -5 -20 0 20 40 Average 0 0 120 0 3 Sigma 10 -20 100 60 80 100 120 Temperature (°C) Positive Fast Fault Error at VOC = 0.38*VCC versus Temperature -30 -40 80 5 -10 -40 120 Fast Fault Error (%), Fast Fault Error (%) 20 60 Negative Fast Fault Error at VOC = 0.54*VCC versus Temperature Temperature (°C) Average 40 Average 3 Sigma Fast Fault Error (%) Fast Fault Error (%) 10 20 Temperature (°C) 80 100 120 3 Sigma Negative Fast Fault Error at VOC = 0.38*VCC versus Temperature 10 0 -10 -20 -30 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 25 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 CHARACTERIZATION DATA ACS720KLATR-80AB-T Positive Slow Fault Error at VOC = 0.30*VCC versus Temperature Negative Slow Fault Error at VOC = 0.30*VCC versus Temperature 10 Slow Fault Error (%) Slow Fault Error (%) 10 5 0 -5 -10 -40 -20 0 20 40 60 80 100 120 5 0 -5 -10 -40 -20 0 Temperature (°C) Average 10 60 80 100 120 3 Sigma Negative Slow Fault Error at VOC = 0.70*VCC versus Temperature 10 8 Slow Fault Error (%) 8 Slow Fault Error (%) 40 Average 3 Sigma Positive Slow Fault Error at VOC = 0.70*VCC versus Temperature 6 4 2 0 -2 -40 20 Temperature (°C) 6 4 2 0 -2 -20 0 20 40 60 Temperature (°C) Average 3 Sigma 80 100 120 -40 -20 0 20 40 60 80 100 120 Temperature (°C) Average 3 Sigma Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 26 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 APPLICATION INFORMATION Fault Overview The ACS720 has two customer-settable overcurrent fault comparators which trip when the absolute value of the input current, IP, goes above the set threshold. The fast fault and slow fault are both active low outputs. The Fast Fault, FAULT_F, operates early in the signal path, allowing for ultrafast response times with reduced accuracy. The Slow Fault, FAULT_S, operates later in the conditioned section of the signal path, resulting in higher accuracy. The Fast Fault feature is well suited for detecting gross short-circuit events, while the slow fault may be used to detect overload conditions, such as those found in motor applications. The accuracy and response times for FAULT_F and FAULT_S may be found in the device performance tables of this datasheet. This may be inverted to solve for the VOC_S voltage relating to the desired fault threshold: VOC(S) = (IFAULT(S) – 0.5 × IPR) × 0.4 × VCC + (0.3 × VCC) 0.75 × IPR (2) The resulting equation for the fast fault threshold is: IFAULT(F) = VOC(F) – 0.3 × VCC × (1.25 × IPR) + 1.0 × IPR 0.4 × VCC (3) This may be inverted to solve for the VOC_F voltage relating to the desired fault threshold: VOC(F) = (IFAULT(F) – 1.0 × IPR) × 0.4 × VCC + (0.3 × VCC) 1.25 × IPR (4) Setting Fast and Slow Fault Thresholds The fault thresholds are user-settable, using the VOC_F and VOC_S pins for the fast and slow fault trip points, respectively. The fault thresholds may be set using a resistor divider on the VOC_F and VOC_S pins. The VOC_F and VOC_S pins are ratiometric to VCC and have an acceptable input range of 0.3 × VCC to 0.7 × VCC. Figure 3 illustrates the linear relationship between IFAULT and the VOC voltages. Refer to the performance characteristics tables for factory-tested fault trip points. The VCC voltage serves as a reference to VOC pins making the adjustable fault threshold immune to changes in VCC. The VOC pins are sampled at 62.5 kHz; therefore, it is best practice to filter the input to VOC pins below 31 kHz to avoid aliasing. The application schematic for the VOC pins and anti-aliasing capacitor is shown in Figure 4. 5V IFAULT(MAX) R1 VOC_S IFAULT (A) R2 C IFAULT(MIN) 0.3 × VCC IFAULT(MIN) VOC (V) 0.7 × VCC The capacitor, C, may be sized using the following equation: Figure 3: IFAULT versus VOC f= The resulting equation for the slow fault threshold is: IFAULT(S) = VOC(S) – 0.3 × VCC × (0.75 × IPR) + 0.5 × IPR 0.4 × VCC Figure 4: Resistor Divider (1) 1 1 = 2π × (R1||R2) × C 2π × R1 × R2 × C R1 + R2 ( ) (5) The VOC update rate is 7.8 kHz, allowing for eight samples to be averaged each update. Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 27 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package Fault Response Time and Hysteresis The Fault Response Time, tR(F), is defined from IP rising above the fault threshold, IFAULT, until the fault pin voltage falls below VFAULTL, and is based on an input current step from 0 A to 1.2 × IFAULT. This definition is applicable to both fast and slow fault circuits. When the current through IP crosses the IFAULT threshold, the fault comparator will trip, and after tR(F), the fault pin will assert. When the input current level drops below IFAULT – IHYS, the fault comparator will clear, and after tC(F), the fault pin will clear, as indicated in Figure 5. Conversely, other ACS720 part numbers are factory-programmed with a mask time, tMASK, which enables the device to ignore nuisance current pulses in application. This behavior is illustrated in Figure 7, where the width of the first pulse is less than tMASK and the fault is not reported. Note that response and clear times, tR(F) and tC(F), still apply. tMASK tMASK IP ACS720 IFAULT IP IHYS IFAULT tC(F) V FAULTL FAULT tR(F) FAULT IHYS Figure 7: Masked Nuisance Timing Diagram V FAULTL Figure 5: Fault Response Timing Diagram Fault Masking and Nuisance Pulses Due to the chopped and sampled nature of the ACS720 system, it is possible for repetitive high-frequency nuisance pulses to be interpreted as a single continuous overcurrent event. If the blank time, tB, between pulses is < 4 µs, this may occur. tMASK IFAULT IHYS IP Certain ACS720 part numbers are programmed to report overcurrent events immediately and are factory-programmed with an ultrafast response time. This behavior is illustrated in the timing diagram in Figure 6. Note that fault response and fault clear times, tR(F) and tC(F), still apply. 0 IHYS IFAULT tB IFAULT IHYS FAULT IP tB V FAULTL FAULT Figure 8: Nuisance Pulse Train Resulting in Fault Assertion V FAULTL Figure 6: Non-Masked Nuisance Timing Diagram Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 28 ACS720 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package Thermal Rise vs. Primary Current Self-heating due to the flow of current should be considered during the design of any current sensing system. The sensor, printed circuit board (PCB), and contacts to the PCB will generate heat as current moves through the system. The thermal response is highly dependent on PCB layout, copper thickness, cooling techniques, and the profile of the injected current. The current profile includes peak current, current “on-time”, and duty cycle. While the data presented in this section was collected with direct current (DC), these numbers may be used to approximate thermal response for both AC signals and current pulses. The plot in Figure 9 shows the measured rise in steady-state die temperature of the ACS720 versus continuous current at an ambient temperature, TA, of 25 °C. The thermal offset curves may be directly applied to other values of TA. Conversely, Figure 10 shows the maximum continuous current at a given TA. Surges beyond the maximum current listed in Figure 10 are allowed given the maximum junction temperature, TJ(MAX) (165℃), is not exceeded. The thermal capacity of the ACS720 should be verified by the end user in the application’s specific conditions. The maximum junction temperature, TJ(MAX) (165°C), should not be exceeded. Further information on this application testing is available in the DC and Transient Current Capability application note on the Allegro website. ASEK720 Evaluation Board Layout Thermal data shown in Figure 9 was collected using the ASEK720 Evaluation Board (TED-85-0702-002). This board includes 1500 mm2 of 2 oz. copper (0.0694 mm) connected to pins 1 through 4, and to pins 5 through 8, on 4 layers with thermal vias connecting the layers. Top and bottom layers of the PCB are shown below in Figure 11. Figure 9: Self Heating in the LA Package Due to Current Flow Figure 11: Top and Bottom Layers for ASEK720 Evaluation Board Gerber files for the ASEK720 evaluation board are available for download from the Allegro website. See the technical documents section of the ACS720 device webpage. Figure 10: Maximum Continuous Current at a Given TA Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 29 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 DEFINITIONS OF ACCURACY CHARACTERISTICS Sensitivity (Sens). The change in sensor IC output in response to a 1 A change through the primary conductor. The sensitivity is the product of the magnetic circuit sensitivity (G / A) (1 G = 0.1 mT) and the linear IC amplifier gain (mV/G). The linear IC amplifier gain is programmed at the factory to optimize the sensitivity (mV/A) for the full-scale current of the device. Nonlinearity (ELIN). The nonlinearity is a measure of how linear the output of the sensor IC is over the full current measurement range. The nonlinearity is calculated as: VIOUT (IPR(max) ) – VIOUT(Q ) (6) ELIN = 1– ×100(%) 2×VIOUT (IPR(max) /2) – VIOUT(Q ) Increasing VIOUT (V) Accuracy at 25°C Only IPR(min) Full Scale IP Accuracy at 25°C Only Decreasing VIOUT (V) Accuracy Across Temperature Figure 12: Output Voltage versus Sensed Current +ETOT Across Temperature 25°C Only (7) The Total Output Error incorporates all sources of error and is a function of IP . At relatively high currents, ETOT will be mostly due to sensitivity error, and at relatively low currents, ETOT will be mostly due to Offset Voltage (VOE ). In fact, at IP = 0, ETOT approaches infinity due to the offset. This is illustrated in Figure 12 and Figure 13. Figure 12 shows a distribution of output voltages versus IP at 25°C and across temperature. Figure 13 shows the corresponding ETOT versus IP . IPR(max) 0A Total Output Error (ETOT). The difference between the current measurement from the sensor IC and the actual current (IP), relative to the actual current. This is equivalent to the difference between the ideal output voltage and the actual output voltage, divided by the ideal sensitivity, relative to the current flowing through the primary conduction path: VIOUT_ideal(IP) – VIOUT (IP) × 100 (%) Sensideal(IP )× IP +IP (A) VIOUT(Q) –IP (A) Zero-Current Output Voltage (VIOUT(Q)). The output of the sensor when the primary current is zero. VIOUT(Q) is nominally 1.5 V. Variation in VIOUT(Q) can be attributed to the resolution of the Allegro linear IC quiescent voltage trim and thermal drift. ETOT (IP) = Accuracy at 25°C Only Ideal VIOUT Accuracy Across Temperature where VIOUT(IPR(max)) is the output of the sensor IC with the maximum measurement current flowing through it and VIOUT(IPR(max) / 2) is the output of the sensor IC with half of the maximum measurement current flowing through it. Offset Voltage (VOE). The deviation of the device output from its ideal quiescent value of 1.5 V due to nonmagnetic causes. To convert this voltage to amperes, divide by the device sensitivity, Sens. Accuracy Across Temperature –IP +IP –ETOT Figure 13: Total Output Error versus Sensed Current Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 30 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 Common Mode Field Rejection Power Supply Rejection Ratio Common Mode Field Rejection (CMFR) measures the ability of the device to reject common-mode magnetic signals. It is defined as the ratio between the voltage swing due to a magnetic field divided by the magnetic field and the gain of the sensor in dB. Sensitivity Power Supply Rejection Ratio (PSRRS). CMFR = 20 log10 ACM Sens/CF where ACM is the gain measured due to an external field in mV/G and CF is the coupling factor of the integrated current loop. For a sensitivity (Sens) of 50 mV/A, a coupling factor or 12 G/A, a CMFR of –40 dB and a 1 G external field, the output will swing 6 mV. The ratio of the percent change in sensitivity from the sensitivity at nominal supply voltage (VCCN) to the percent change in VCC in dB. PSRRS = 20 log10 [SensVccn × (VCC – VCCN)] [(SensVcc – SensVccn) × VCCN A PSRRS value of 40 dB means that a 5% change in VCC (going from 5 to 5.25 V, for example) results in around a 0.05% change in sensitivity. Quiescent Voltage Power Supply Rejection Ratio (PSRRQ). The ratio of the change in quiescent voltage to the change in VCC in dB. PSRRQ = 20 log10 (ΔVCC) (ΔVIOUT(Q)) A PSRRQ value of 40 dB means a 250 mV change in VCC (going from 5 to 5.25 V, for example) results in a 2.5 mV change in quiescent voltage. Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 31 ACS720 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package DEFINITIONS OF DYNAMIC RESPONSE CHARACTERISTICS Power-On Time (tPO). When the supply is ramped to its operating voltage, the device requires a finite time to power its internal components before responding to an input magnetic field. Power-On Time, tPO , is defined as the time it takes for the output voltage to settle within ±10% of its steady-state value under an applied magnetic field, after the power supply has reached its minimum specified operating voltage, VCC(min), as shown in the chart at right. V VCC VCC(typ.) VIOUT 90% VIOUT VCC(min.) t1 t2 tPO t1= time at which power supply reaches minimum specified operating voltage t2= time at which output voltage settles within ±10% of its steady state value under an applied magnetic field 0 Rise Time (tr). The time interval between a) when the sensor IC reaches 10% of its full-scale value, and b) when it reaches 90% of its full-scale value. The rise time to a step response is used to derive the bandwidth of the current sensor IC, in which ƒ(–3 dB) = 0.35 / tr. Both tr and tRESPONSE are detrimentally affected by eddy-current losses observed in the conductive IC ground plane. Propagation Delay (tpd ). The propagation delay is measured as the time interval a) when the primary current signal reaches 20% of its final value, and b) when the device reaches 20% of its output corresponding to the applied current. (%) 90 Figure 14: Power-On Time (tPO) t Primary Current VIOUT Rise Time, tr 20 10 0 Propagation Delay, tpd t Figure 15: Rise Time (tr) and Propagation Delay (tpd) Response Time (tRESPONSE). The time interval between a) when the primary current signal reaches 90% of its final value, and b) when the device reaches 90% of its output corresponding to the applied current. Fault Response Time (tRFF, tRSF). The time interval between a) when the primary current signal reaches the fault threshold, and b) when the device fault pin reacts to the current event. A current of 20% above the fault trip level should be used to guarantee fault timing. (%) 90 Primary Current VIOUT Response Time, tRESPONSE 0 Figure 16: Response Time (tRESPONSE) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com t 32 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 RECOMMENDED PCB LAYOUT NOT TO SCALE All dimensions in millimeters. 15.75 9.54 0.65 1.27 Package Outline 2.25 7.25 3.56 17.27 Current Out Current In 21.51 Perimeter holes for stitching to the other, matching current trace design, layers of the PCB for enhanced thermal capability. Figure 17: High Isolation PCB Layout For additional information on layout, see: http://www.allegromicro.com/en/Design-Center/Technical-Documents/Hall-Effect-Sensor-IC-Publications/Techniques-Minimize-Common-Mode-FieldInterference.aspx Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 33 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 10.30 ±0.20 8° 0° 16 0.33 0.20 D D2 0.65 16 1.27 2.25 D D1 7.50 ±0.10 10.30 ±0.33 9.50 A D 3.30 1.40 REF 1 2 1.27 0.40 0.69 D Branded Face 16X SEATING PLANE 0.10 C 0.51 0.31 1.27 BSC 1 2 0.25 BSC C SEATING PLANE GAUGE PLANE C PCB Layout Reference View 2.65 MAX 0.30 0.10 For Reference Only; not for tooling use (reference MS-013AA) Dimensions in millimeters Dimensions exclusive of mold flash, gate burrs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown XXXXXXXXXXX Lot Number 1 B Standard Branding Reference View A Terminal #1 mark area B Branding scale and appearance at supplier discretion C Reference land pattern layout (reference IPC7351 SOIC127P600X175-8M); all pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary to meet application process requirements and PCB layout tolerances D Hall elements (D1, D2); not to scale Lines 1, 2 = Max 11 characters per line Line 1: Part Number Line 2: First 9 characters of Assembly Lot Number Figure 18: Package LA, 16-pin SOICW Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 34 High Accuracy, Dual Fault, Galvanically Isolated Current Sensor in SOIC16 Wide-Body Package ACS720 Revision History Number Date Description – August 30, 2017 1 November 13, 2017 Initial release Corrected typo in Dielectric Surge Strength Test Voltage notes of Isolation Characteristics table (p. 3) 2 December 12, 2017 Corrected branding information (p. 25) 3 April 2, 2018 Added ACS720KLATR-80AB-T part variant. 4 May 3, 2018 Moved Fault Timing Characteristics from Common Operating Characteristics table to Performance Characteristics tables (page 5-9); Updated Fault Application Information (pages 10-11) 5 June 20, 2018 6 July 3, 2018 7 November 16, 2018 Added -4 part variants (pages 2, 8, 10, 12, 14). 8 December 7, 2018 Updated UL certificate number 9 August 23, 2019 Added Common Mode Field Rejection Ratio characteristic to Common Operating Characteristics table (page 4) Added “Thermal Rise vs. Primary Current” and “ASEK720 Evaluation Board Layout” to the Applications Information section (page 25); minor editorial updates. Added Maximum Continuous Current to Absolute Maximum Ratings table (page 3), ESD ratings table (page 3), and updated thermal data section (page 29) Copyright 2019, Allegro MicroSystems. Allegro MicroSystems reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the information being relied upon is current. Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of Allegro’s product can reasonably be expected to cause bodily harm. The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems assumes no responsibility for its use; nor for any infringement of patents or other rights of third parties which may result from its use. Copies of this document are considered uncontrolled documents. For the latest version of this document, visit our website: www.allegromicro.com Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 35