ACS732 and ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
FEATURES AND BENEFITS
DESCRIPTION
•
•
•
•
The ACS732 and ACS733 are a new generation of high
bandwidth current sensor ICs from Allegro™. These devices
provide a compact, fast, and accurate solution for measuring
high-frequency currents in DC/DC converters and other
switching power applications. The ACS732 and ACS733
offer high isolation, high bandwidth Hall-effect-based current
sensing with user-configurable overcurrent fault detection.
These features make them ideally suited for high-frequency
transformer and current transformer replacement in applications
running at high voltages.
•
•
•
•
•
•
•
•
•
•
AEC-Q100 automotive qualified
High bandwidth, 1 MHz analog output
Differential Hall sensing rejects common-mode fields
High-isolation SOIC16 wide body package provides
galvanic isolation for high-voltage applications
Integrated shield virtually eliminates capacitive coupling
from current conductor to die, greatly suppressing output
noise due to high dv/dt transients
Industry-leading noise performance with greatly
improved bandwidth through proprietary amplifier and
filter design
UL60950-1 (ed. 2) certified
□ Dielectric Strength Voltage = 3.6 kVRMS
□ Basic Isolation Working Voltage = 616 VRMS
Fast and externally configurable overcurrent fault
detection
1 mΩ primary conductor resistance for low power loss
and high inrush current withstand capability
Options for 3.3 V and 5 V single supply operation
Output voltage proportional to AC and DC current
Factory-trimmed sensitivity and quiescent output voltage
for improved accuracy
Nearly zero magnetic hysteresis
Ratiometric output from supply voltage
PACKAGE: 16-Pin SOICW (suffix LA)
The ACS732 and ACS733 are suitable for all markets, including
automotive, industrial, commercial, and communications
systems. They may be used in motor control, load detection
and management, switch-mode power supplies, and overcurrent
fault protection applications.
The wide body SOIC-16 package allows for easy
implementation. Applied current flowing through the copper
conduction path generates a magnetic field that is sensed by the
IC and converted to a proportional voltage. Current is sensed
differentially in order to reject external common-mode fields.
Device accuracy is optimized through the close proximity of the
magnetic field to the Hall transducers. A precise, proportional
voltage is provided by the Hall IC, which is factory-programmed
after packaging for high accuracy. The fully integrated package
has an internal copper conductive path with a typical resistance
of 1 mΩ, providing low power loss.
The current-carrying pins (pins 1 through 8) are electrically
isolated from the sensor leads (pins 9 through 16). This allows
the devices to be used in high-side current sensing applications
without the use of high-side differential amplifiers or other
costly isolation techniques.
CB Certificate Number:
US-23711-A2-UL
Continued on next page...
Not to scale
1
2
3
IP
4
5
6
7
8
IP+
IP+
ACS732/
ACS733
VCC
VCC
IP+
VOC
IP+
FAULT
IP–
VIOUT
IP–
PROGRAM
IP–
GND
IP–
GND
CBYPASS
16
15
14
13
12
11
CL
10
9
Figure 1: Typical Application Circuit
ACS732-33-DS, Rev. 19
MCO-0000316
RF(PULLUP)
ACS732/ACS733 outputs
an analog signal, VIOUT, that
changes proportionally with
the bidirectional AC or DC
primary sensed current, IP,
within the specified measurement range.
The overcurrent threshold
may be set with a resistor
divider tied to the VOC pin.
August 3, 2020
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
DESCRIPTION (continued)
The ACS732 and ACS733 are provided in a small, low profile,
surface-mount SOIC-16 wide-body package. The leadframe is plated
with 100% matte tin, which is compatible with standard lead (Pb)
free printed circuit board assembly processes. Internally, the device
is lead-free. These devices are fully calibrated prior to shipment
from the Allegro factory.
SELECTION GUIDE
Part Number
Optimized
Range, IP
(A)
Sensitivity [1],
Sens(Typ)
(mV/A)
ACS732KLATR-20AB-T
±20
100
ACS732KLATR-40AB-T
±40
50
ACS732KLATR-65AB-T
±65
30
ACS732KLATR-65AU-T
65
60
ACS732KLATR-75AB-T
±75
26.6
ACS733KLATR-20AB-T
±20
66
ACS733KLATR-20AB-T-H [3]
±20
66
ACS733KLATR-40AB-T
±40
33
ACS733KLATR-40AU-T
40
66
ACS733KLATR-65AB-T
±65
20
Nominal Supply
Voltage, VCC, (V)
TA
(°C)
Packing [2]
–40 to 125
Tape and reel, 1000 pieces per reel
5.0
3.3
Measured at Nominal Supply Voltage, VCC.
Contact Allegro for additional packing options.
[3] -H denotes 100% cold calibration at the Allegro factory for improved accuracy.
[1]
[2]
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
2
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ABSOLUTE MAXIMUM RATINGS
Characteristic
Symbol
Notes
Rating
Units
Supply Voltage
VCC
6
V
Reverse Supply Voltage
VRCC
–0.1
V
Output Voltage
VIOUT
6
V
Reverse Output Voltage
VRIOUT
–0.1
V
Fault Output Voltage
VFAULT
6
V
Reverse Fault Output Voltage
VRFAULT
–0.1
V
Forward VOC Voltage
VVOC
6
V
Reverse VOC Voltage
VVOC
Output Current
IOUT
Maximum survivable sink or source current on the output
Maximum Continuous Current
ICMAX
TA = 25°C
55
A
TA
Range K
–40 to 125
°C
TJ(max)
165
°C
Tstg
–65 to 170
°C
Nominal Operating Ambient Temperature
Maximum Junction Temperature
Storage Temperature
–0.1
V
15
mA
ESD RATINGS
Value
Unit
Human Body Model
Characteristic
Symbol
VHBM
Per AEC-Q100
Test Conditions
±12
kV
Charged Device Model
VCDM
Per AEC-Q100
±1
kV
ISOLATION CHARACTERISTICS
Characteristic
Symbol
Dielectric Surge Strength Test Voltage
VSURGE
Dielectric Strength Test Voltage
Working Voltage for Basic Isolation
Notes
Value
Units
Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5
1.2 µs (rise) / 50 µs (width).
10000
V
VISO
Agency type-tested for 60 seconds per UL 60950-1 (edition 2).
Production Tested at 2250 VRMS per UL 60950-1.
3600
VRMS
VWVBI
Maximum approved working voltage for basic (single) isolation
according to UL 60950-1 (edition 2).
870
VPK or VDC
616
VRMS
Clearance
DCL
Minimum distance through air from IP leads to signal leads.
7.5
mm
Creepage
DCR
Minimum distance along package body from IP leads to signal leads.
7.5
mm
Distance Through Insulation
DTI
Minimum internal distance through insulation
38
μm
Comparative Tracking Index
CTI
Material Group II
400 to 599
V
THERMAL CHARACTERISTICS [1]
Characteristic
Symbol
Test Conditions
Value
Unit
Junction-to-Ambient Thermal Resistance
RθJA
Mounted on the Allegro ASEK732/3 evaluation board. Performance
values include the power consumed by the PCB. [2]
17
°C/W
Junction-to-Lead Thermal Resistance
RθJL
Mounted on the Allegro ASEK732/3 evaluation board. [2]
5
°C/W
[1]
[2]
Refer to the die temperature curves versus DC current plot (p. 29). Additional thermal information is available on the Allegro website.
The Allegro evaluation board has 1500 mm2 of 2 oz. copper on each side, connected to pins 1 through 4 and pins 5 through 8, with thermal vias
connecting the layers. Performance values include the power consumed by the PCB. Further details on the board are available from the Frequently
Asked Questions document on our website. Further information about board design and thermal performance also can be found in the Applications
Information section of this datasheet.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
3
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
PINOUT DIAGRAM AND TERMINAL LIST TABLE
IP+ 1
16 VCC
IP+ 2
15 VCC
IP+ 3
14 VOC
IP+ 4
13 FAULT
IP– 5
12 VIOUT
IP– 6
11 PROGRAM
IP– 7
10 GND
IP– 8
9 GND
Package LA, 16-Pin
SOICW Pinout Diagram
Terminal List Table
Number
Name
1,2,3,4
IP+
Positive terminals for current being sensed; fused internally.
Description
5,6,7,8
IP–
Negative terminals for current being sensed; fused internally.
9,10
GND
11
PROGRAM
12
VIOUT
Analog output signal.
13
FAULT
Overcurrent Fault output. Open drain.
14
VOC
Set the overcurrent fault threshold via external resistor divider
on this pin.
15,16
VCC
Device power supply terminal.
Device ground terminal.
Programming input pin for factory calibration. Connect to
ground for best ESD performance.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
4
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
FUNCTIONAL BLOCK DIAGRAM
VCC
VCC
DIGITAL SYSTEM
POR
To All
Subcircuits
Dynamic Trim
Compensation
Logic
Temperature
Sensor
EEPROM and
Control Logic
PROGRAM
Programming
Control
FAULT
Fault Filtering
Logic
Hall
Driver
Fault Trim
VOC
IP+
Hall Sensor Array
Offset
Trim
Sensitivity
Trim
Analog
Filters
VIOUT
IP–
GND
GND
Figure 2: Functional Block Diagram
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
5
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
COMMON ELECTRICAL CHARACTERISTICS: Over full range of TA, over supply voltage range VCC(MIN) through VCC(MAX) of a
sensor variant, CBYPASS = 0.1 µF, unless otherwise specified
Characteristic
Symbol
Supply Voltage
VCC
Supply Current
ICC
Bypass
Capacitor [2]
CBYPASS
Test Conditions
Min.
Typ. [1]
Max.
Unit
ACS732
4.75
5.0
5.25
V
ACS733
3.14
3.3
3.46
V
ACS732; VCC = 5.0 V
–
24
35
mA
ACS733; VCC = 3.3 V
–
20
35
mA
0.1
–
–
µF
Output Capacitance Load
CL
VIOUT to GND
–
–
220
pF
Output Resistive Load
RL
VIOUT to GND
VSAT(HIGH)
Output Saturation Voltage
VSAT(LOW)
Primary Conductor Resistance
Primary Hall Coupling Factor
Secondary Hall Coupling Factor
VCC to GND
50
–
–
kΩ
VCC = 5.0 V, TA = 25°C,
RL(PULLDOWN) = 50 kΩ to GND
VCC – 0.3
–
–
V
VCC = 3.3 V, TA = 25°C,
RL(PULLDOWN) = 50 kΩ to GND
VCC – 0.3
–
–
V
VCC = 5.0 V, TA = 25°C,
RL(PULLDOWN) = 50 kΩ to VCC
–
–
0.5
V
VCC = 3.3 V, TA = 25°C,
RL(PULLDOWN) = 50 kΩ to VCC
–
–
0.3
V
RIP
TA = 25°C
–
1
–
mΩ
CF(P)
TA = 25°C
–
10.8
–
G/A
G/A
CF(s)
TA = 25°C
–
2.4
–
Sensmatch
TA = 25°C
–
1
–
%
Power On Delay Time
tPOD
TA = 25°C
–
180
–
µs
Internal Bandwidth
BW
Hall Plate Sensitivity Matching
Rise Time [3]
Response
Time [3]
Small signal –3 dB; CL = 220 pF
–
1
–
MHz
tr
TA = 25°C, CL = 0.22 nF
–
0.7
–
μs
tRESPONSE
TA = 25°C, CL = 0.22 nF
–
0.2
–
μs
Propagation Delay Time [3]
tpd
TA = 25°C, CL = 0.22 nF
–
0.14
–
µs
Output Slew Rate
SR
TA = 25°C, CL = 0.22 nF
Zero Current Output Ratiometry Error
Sensitivity Ratiometry Error
Ratiometry Bandwidth
Noise Density
–
3.2
–
V/µs
ERAT(Q)
TA = 25°C, VCC = ±5 % variation of nominal
supply voltage
–12
±10
12
mV
ERAT(SENS)
TA = 25°C, VCC = ±5 % variation of nominal
supply voltage
–2
±1.72
2
%
±100 mV on VCC
–
10
–
kHz
VCC = 5.0 V, TA = 25°C, CL = 220 pF;
input referred
–
55
–
µA/√Hz
VCC = 3.3 V, TA = 25°C, CL = 220 pF;
input referred
–
80
–
µA/√Hz
BWRAT
IND
Continued on next page...
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
6
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
COMMON ELECTRICAL CHARACTERISTICS (continued): Over full range of TA, over supply voltage range VCC(MIN) through
VCC(MAX) of a sensor variant, CBYPASS = 0.1 µF, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
Time from IP > IFAULT to when FAULT pin is
pulled below VFAULT; input current step from 0
to 1.2 × IFAULT
0.2
0.5
0.75
μs
tC(F)
Time from IP falling below IFAULT – IHYS to
when VFAULT is pulled above VFAULTL;
100 pF from FAULT to ground
0.1
–
0.45
µs
FAULT Range
IFAULT
Relative to the full scale of IPR; set via the
VOC pin
0.5 × IPR
–
2 × IPR
A
FAULT Output Low Voltage
VFAULT
In fault condition; RF(PULLUP) = 10 kΩ
–
–
0.4
V
OVERCURRENT FAULT CHARACTERISTICS
FAULT Response Time [4]
FAULT Release Time [4]
FAULT Pull-Up Resistance
FAULT Leakage Current
FAULT
Hysteresis [5]
FAULT Error [6]
tRESPONSE(F)
RF(PULLUP)
10
–
500
kΩ
IFAULT(LEAKAGE)
–
±2
–
nA
–
0.05 × IPR
–
A
–
±5
–
%
IHYST
EFAULT
Tested at VVOC = 0.2 × VCC (IFAULT threshold
= 100% × IPR)
VOC Input Range
VVOC
0.1 × VCC
–
0.4 × VCC
V
VOC Input Current
IVOC
–
10
100
nA
[1] Typical
values are mean ± 3 sigma values.
of a bypass capacitor is required to increase output stability.
[3] See definitions of Dynamic Response Characteristics section of this datasheet.
[4] Guaranteed by design.
[5] After I goes above I
P
FAULT, tripping the internal comparator, IP must fall below IFAULT – IHYST, before the internal comparator will reset.
[6] Fault error is defined as the value at which a fault is reported relative to the desired threshold for I
FAULT.
[2] Use
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
7
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS732KLATR-20AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 5 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
–20
–
20
A
Sens
–
100
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–2.5
±1.6
2.5
%
IP = IPR(max), TA = 125°C
–3
±2
3
%
IP = IPR(max), TA = 25°C to 125°C
–
±2.6
–
%
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
Sensitivity Error
ESENS
Voltage Offset Error
VOE
IP = IPR(max), TA = –40°C
–7.5
±4.5
7.5
%
IP = IPR(max) / 2, TA = 25°C
–1.5
±0.75
1.5
%
IP = IPR(max) / 2, TA = 125°C
–1.5
±1.25
1.5
%
IP = IPR(max) / 2, TA = –40°C
–3
±2
3
%
IP = 0 A, TA = 25°C
–55
±30
55
mV
IP = 0 A, TA = 125°C
–25
±18
25
mV
IP = 0 A, TA = 25°C to 125°C
–
±50
–
mV
–120
±100
120
mV
TA = 25°C, up to full-scale IP
–1
±0.2
1
%
TA = 125°C, up to full-scale IP
–
±0.3
–
%
TA = –40°C, up to full-scale IP
–
±0.5
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±11.5
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±11.5
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±220
–
mV
TA = –40°C, 25°C
–
±220
–
mV
IP = 0 A, TA = –40°C
Linearity
Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
8
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS732KLATR-40AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 5 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
–40
–
40
A
Sens
–
50
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–2.5
±2
2.5
%
IP = IPR(max), TA = 125°C
–2.5
±1.6
2.5
%
–
±2.6
–
%
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
IP = IPR(max), TA = 25°C to 125°C
IP = IPR(max), TA = –40°C
Sensitivity Error
ESENS
Voltage Offset Error
Linearity
VOE
Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
–6.5
±4.5
6.5
%
IP = IPR(max) / 2, TA = 25°C
–2
±0.8
2
%
IP = IPR(max) / 2, TA = 125°C
–2
±1.2
2
%
IP = IPR(max) / 2, TA = –40°C
–4
±1.8
4
%
IP = 0 A, TA = 25°C
–45
±40
45
mV
IP = 0 A, TA = 125°C
–25
±20
25
mV
IP = 0 A, TA = 25°C to 125°C
–
±45
–
mV
IP = 0 A, TA = –40°C
–95
±90
95
mV
TA = 25°C, up to full-scale IP
–1.2
±0.8
1.2
%
TA = 125°C, up to full-scale IP
–
±0.33
–
%
TA = –40°C, up to full-scale IP
–
±2.5
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±6.3
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±6.3
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±110
–
mV
TA = –40°C, 25°C
–
±110
–
mV
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
9
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS732KLATR-65AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 5 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
–65
–
65
A
Sens
–
30
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–2.5
±1.6
2.5
%
IP = IPR(max), TA = 125°C
–2.5
±1
2.5
%
–
±2.6
–
%
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
IP = IPR(max), TA = 25°C to 125°C
IP = IPR(max), TA = –40°C
Sensitivity Error
ESENS
Voltage Offset Error
Linearity
VOE
Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
–6.5
±3.4
6.5
%
IP = IPR(max) / 2, TA = 25°C
–2
±1.5
2
%
IP = IPR(max) / 2, TA = 125°C
–2
±0.9
2
%
IP = IPR(max) / 2, TA = –40°C
–4
±2.7
4
%
IP = 0 A, TA = 25°C
–45
±27
45
mV
IP = 0 A, TA = 125°C
–25
±8
25
mV
IP = 0A, TA = 25°C to 125°C
–
±45
–
mV
IP = 0 A, TA = –40°C
–95
±58
95
mV
TA = 25°C, up to full-scale IP
–2.4
±1.7
2.4
%
TA = 125°C, up to full-scale IP
–
±0.6
–
%
TA = –40°C, up to full-scale IP
–
±5.8
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±4.7
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±4.7
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±66
–
mV
TA = –40°C, 25°C
–
±66
–
mV
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
10
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS732KLATR-65AU PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 5 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
0
–
65
A
Sens
–
60
–
mV/A
–
0.1 × VCC
–
V
IP = IPR(max), TA = 25°C
–2.5
±1.8
2.5
%
IP = IPR(max), TA = 125°C
–3
±2
3
%
IP = IPR(max), TA = 25°C to 125°C
–
±2.9
–
%
VIOUT(Q)
Unidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
IP = IPR(max), TA = –40°C
Sensitivity Error
ESENS
Voltage Offset Error
Linearity
VOE
Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
–8
±4.5
8
%
IP = IPR(max) / 2, TA = 25°C
–1.5
±0.75
1.5
%
IP = IPR(max) / 2, TA = 125°C
–1.5
±1.25
1.5
%
IP = IPR(max) / 2, TA = –40°C
–4
±2
4
%
IP = 0 A, TA = 25°C
–55
±30
55
mV
IP = 0 A, TA = 125°C
–25
±18
25
mV
IP = 0A, TA = 25°C to 125°C
–
±50
–
mV
IP = 0 A, TA = –40°C
–120
±100
120
mV
TA = 25°C, up to full-scale IP
–2.5
±1.8
2.5
%
TA = 125°C, up to full-scale IP
–
±0.7
–
%
TA = –40°C, up to full-scale IP
–
±4.2
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±7.4
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±7.4
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±132
–
mV
TA = –40°C, 25°C
–
±132
–
mV
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
11
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS732KLATR-75AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 5 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range [2]
Sensitivity
Zero Current Output Voltage
IPR
–75
–
75
A
Sens
–
26.6
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–2.5
±1.6
2.5
%
IP = IPR(max), TA = 125°C
–2.5
±1
2.5
%
–
±2.6
–
%
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [3] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [4]
ETOT
IP = IPR(max), TA = 25°C to 125°C
IP = IPR(max), TA = –40°C
Sensitivity Error
ESENS
Voltage Offset Error
Linearity
VOE
Error [5]
LIFETIME DRIFT CHARACTERISTICS
ELIN
–6.5
±3.4
6.5
%
IP = IPR(max) / 2, TA = 25°C
–2
±1.5
2
%
IP = IPR(max) / 2, TA = 125°C
–2
±0.9
2
%
IP = IPR(max) / 2, TA = –40°C
–4
±2.7
4
%
IP = 0 A, TA = 25°C
–45
±27
45
mV
IP = 0 A, TA = 125°C
–25
±8
25
mV
IP = 0 A, TA = 25°C to 125°C
–
±45
–
mV
IP = 0 A, TA = –40°C
–95
±58
95
mV
TA = 25°C, up to full-scale IP
–2.9
±2.3
2.9
%
TA = 125°C, up to full-scale IP
–
±1
–
%
TA = –40°C, up to full-scale IP
–
±8.1
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±4.4
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±4.4
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±59
–
mV
TA = –40°C, 25°C
–
±59
–
mV
[6]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
Devices trimmed at half-scale IP. Operating above this limit may result in decreased accuracy.
[3] A single part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[4] Percentage of I , with I = I
P
P
PR(MAX) / 2.
[5] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[6] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2]
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
12
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS733KLATR-20AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 3.3 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
–20
–
20
A
Sens
–
66
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–4.5
±1.7
4.5
%
IP = IPR(max), TA = 125°C
–3
±1.25
3
%
IP = IPR(max), TA = 25°C to 125°C
–
±2.8
–
%
IP = IPR(max), TA = –40°C
–10
±5
10
%
IP = IPR(max) / 2, TA = 25°C
–1.5
±1
1.5
%
IP = IPR(max) / 2, TA = 125°C
–1.5
±0.8
1.5
%
IP = IPR(max) / 2, TA = –40°C
–3
±2
3
%
IP = 0 A, TA = 25°C
–55
±21
55
mV
IP = 0 A, TA = 125°C
–25
±10
25
mV
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
Sensitivity Error
ESENS
Voltage Offset Error
VOE
IP = 0 A, TA = 25°C to 125°C
–
±35
–
mV
–120
±80
120
mV
TA = 25°C, up to full-scale IP
–1
±0.3
1
%
TA = 125°C, up to full-scale IP
–
±0.4
–
%
TA = –40°C, up to full-scale IP
–
±0.4
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±9.8
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±9.8
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±145
–
mV
TA = –40°C, 25°C
–
±145
–
mV
IP = 0 A, TA = –40°C
Linearity
Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
13
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS733KLATR-20AB-H PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 3.3 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
–20
–
20
A
Sens
–
66
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–4.5
±1.7
4.5
%
IP = IPR(max), TA = 125°C
–3
±1.25
3
%
IP = IPR(max), TA = 25°C to 125°C
–
±2.8
–
%
IP = IPR(max), TA = –40°C
–4.5
±1.7
4.5
%
IP = IPR(max) / 2, TA = 25°C
–1.5
±1
1.5
%
IP = IPR(max) / 2, TA = 125°C
–1.5
±0.8
1.5
%
IP = IPR(max) / 2, TA = –40°C
–1.5
±1
1.5
%
IP = 0 A, TA = 25°C
–55
±21
55
mV
IP = 0 A, TA = 125°C
–25
±10
25
mV
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
Sensitivity Error
ESENS
Voltage Offset Error
Linearity
VOE
Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
IP = 0 A, TA = 25°C to 125°C
–
±35
–
mV
IP = 0 A, TA = –40°C
–55
±21
55
mV
TA = 25°C, up to full-scale IP
–1
±0.3
1
%
TA = 125°C, up to full-scale IP
–
±0.4
–
%
TA = –40°C, up to full-scale IP
–
±0.4
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±9.8
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±9.8
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±145
–
mV
TA = –40°C, 25°C
–
±145
–
mV
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
14
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS733KLATR-40AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 3.3 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
–40
–
40
A
Sens
–
33
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–3
±1.4
3
%
IP = IPR(max), TA = 125°C
–2
±1.25
2
%
IP = IPR(max), TA = 25°C to 125°C
–
±2.3
–
%
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
Sensitivity Error
ESENS
Voltage Offset Error
VOE
Linearity Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
IP = IPR(max), TA = –40°C
–6.5
±3
6.5
%
IP = IPR(max) / 2, TA = 25°C
–1.5
±1.3
1.5
%
IP = IPR(max) / 2, TA = 125°C
–2
±1
2
%
IP = IPR(max) / 2, TA = –40°C
–4.5
±2.2
4.5
%
IP = 0 A, TA = 25°C
–40
±9
40
mV
IP = 0 A, TA = 125°C
–40
±7
40
mV
IP = 0 A, TA = 25°C to 125°C
–
±15
–
mV
IP = 0 A, TA = –40°C
–75
±35
75
mV
TA = 25°C, up to full-scale IP
–1
±0.5
1
%
TA = 125°C, up to full-scale IP
–
±0.3
–
%
TA = –40°C, up to full-scale IP
–
±1.3
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±4.9
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±4.9
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±73
–
mV
TA = –40°C, 25°C
–
±73
–
mV
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
15
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS733KLATR-40AU PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 3.3 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
0
–
40
A
Sens
–
66
–
mV/A
–
0.1 × VCC
–
V
IP = IPR(max), TA = 25°C
–2.5
±1
2.5
%
IP = IPR(max), TA = 125°C
– 2.5
±1
2.5
%
–
±1.6
–
%
IP = IPR(max), TA = –40°C
–6.5
±3.3
6.5
%
IP = IPR(max) / 2, TA = 25°C
–1.5
±0.9
1.5
%
IP = IPR(max) / 2, TA = 125°C
–1.5
±0.9
1.5
%
IP = IPR(max) / 2, TA = –40°C
–4
±2.7
4
%
IP = 0 A, TA = 25°C
–30
±17
30
mV
IP = 0 A, TA = 125°C
–25
±12
25
mV
VIOUT(Q)
Unidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
Sensitivity Error
ESENS
Voltage Offset Error
VOE
IP = IPR(max), TA = 25°C to 125°C
IP = 0 A, TA = 25°C to 125°C
–
±28
–
mV
–110
±70
110
mV
TA = 25°C, up to full-scale IP
–1
±0.4
1
%
TA = 125°C, up to full-scale IP
–
±0.3
–
%
TA = –40°C, up to full-scale IP
–
±1.3
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±8
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±8
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±145
–
mV
TA = –40°C, 25°C
–
±145
–
mV
IP = 0 A, TA = –40°C
Linearity
Error [4]
LIFETIME DRIFT CHARACTERISTICS
ELIN
[5]
Total Output Error Including Lifetime Drift
Sensitivity Error Including Lifetime Drift
Offset Voltage Error Including Lifetime Drift
ETOT(DRIFT)
ESENS(DRIFT)
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
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16
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
ACS733KLATR-65AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC = 3.3 V, CBYPASS = 0.1 µF,
unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [1]
Max.
Unit
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
–65
–
65
A
Sens
–
20
–
mV/A
–
0.5 × VCC
–
V
IP = IPR(max), TA = 25°C
–3.5
±1.8
3.5
%
IP = IPR(max), TA = 125°C
–3
±1.4
3
%
IP = IPR(max), TA = 25°C to 125°C
–
±2.9
–
%
VIOUT(Q)
Bidirectional, IP = 0 A
TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)
Total Output Error [3]
ETOT
IP = IPR(max), TA = –40°C
Sensitivity Error
Voltage Offset Error
Linearity Error [4]
ESENS
VOE
ELIN
–6
±4
6
%
IP = IPR(max) / 2, TA = 25°C
–2.5
±1.6
2.5
%
IP = IPR(max) / 2, TA = 125°C
–2.5
±1.6
2.5
%
IP = IPR(max) / 2, TA = –40°C
–4.5
±3.1
4.5
%
IP = 0 A, TA = 25°C
–30
±17
30
mV
IP = 0 A, TA = 125°C
–25
±7
25
mV
IP = 0 A, TA = 25°C to 125°C
–
±28
–
mV
IP = 0 A, TA = –40°C
–70
±31
70
mV
TA = 25°C, up to full-scale IP
–1.7
±1.1
1.7
%
TA = 125°C, up to full-scale IP
–
±0.5
–
%
TA = –40°C, up to full-scale IP
–
±2.8
–
%
IP = IPR(max), TA = 25°C, 125°C
–
±4
–
%
IP = IPR(max), TA = –40°C, 25°C
–
±4
–
%
IP = IPR(max) / 2, TA = 25°C, 125°C
–
±2.2
–
%
IP = IPR(max) / 2, TA = –40°C, 25°C
–
±3.3
–
%
TA = 25°C, 125°C
–
±44
–
mV
TA = –40°C, 25°C
–
±44
–
mV
LIFETIME DRIFT CHARACTERISTICS [5]
Total Output Error Including Lifetime Drift
ETOT(DRIFT)
Sensitivity Error Including Lifetime Drift
ESENS(DRIFT)
Offset Voltage Error Including Lifetime Drift
VOE(DRIFT)
Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualification.
part will not have both the maximum sensitivity error and the maximum offset voltage, as that would violate the maximum/minimum total output error
specification. For total error, 3 sigma distribution values for offset and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic
performance data plots for temperature drift performance.
[3] Percentage of I , with I = I
P
P
PR(MAX).
[4] The sensor will continue to respond to current beyond the range of I
PR until the high or low output saturation voltage. However, the nonlinearity in this region may be
worse than the nominal operating range.
[5] Lifetime drift characteristics are based on AEC-Q100 qualification results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer
application conditions. Contact Allegro MicroSystems for further information.
[1]
[2] A single
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
17
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
2.6
100
2.58
80
2.56
60
Voltage Offset Error (mV)
Zero Current Output Voltage (V)
CHARACTERISTIC PERFORMANCE
ACS732KLATR-40AB-T (5V)
for ~150 parts
2.54
2.52
2.5
2.48
2.46
40
20
0
-20
-40
2.44
-60
2.42
-80
2.4
-100
-40
-20
0
20
40
60
80
100
120
140
-40
-20
0
20
Temperature (°C)
80
100
120
140
80
100
120
140
80
100
120
140
2.0%
50.8
1.5%
Sensi ti vi ty Error (%)
Sensi ti vi ty (mV/A)
60
2.5%
51.2
50.4
50
49.6
1.0%
0.5%
0.0%
-0.5%
-1.0%
-1.5%
49.2
48.8
40
Temperature (°C)
-2.0%
-2.5%
-40
-20
0
20
40
60
80
100
120
140
-40
-20
0
20
40
60
Temperature (°C)
Temperature (°C )
3.0%
5.0%
4.0%
Total Output Error (%)
3.0%
1.0%
0.0%
-1.0%
-2.0%
-3.0%
-40
-20
0
20
52
51.6
51.2
50.8
50.4
50
49.6
49.2
40
60 48.8 80
Temperature48.4
(°C)
48
-40
Sensitvity (mV/A)
Li neari ty Error (%)
2.0%
2.0%
1.0%
0.0%
-1.0%
-2.0%
-3.0%
-4.0%
100
120
-5.0%
140
-40
-20
0
20
40
60
Temperature (°C)
-20
0
40
20
60
80
100
120
140
Temperature [°C ]
µ
µ ± 3σ
Allegro MicroSystems
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18
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
CHARACTERISTIC PERFORMANCE
ACS732 AND ACS733 TYPICAL FREQUENCY RESPONSE
ACS732 and ACS733 Frequency Response
Magnitude [dB]
5
0
-3dB ≈ 1.8 MHz
-5
-10
10 1
10 2
10 3
10 4
Frequency [Hz]
10 5
10 6
50
Phase [°]
0
-50
-100
-150
10 1
10 2
10 3
10 4
Frequency [Hz]
10 5
10 6
For information regarding bandwidth characterization methods used for the ACS732 and ACS733, see the “Characterizing System
Bandwidth” application note (https://allegromicro.com/en/insights-and-innovations/technical-documents/hall-effect-sensor-ic-publications/an296169-acs720-bandwidth-testing) on the Allegro website.
Allegro MicroSystems
955 Perimeter Road
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19
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
RESPONSE CHARACTERISTICS DEFINITIONS AND PERFORMANCE DATA
Response Time (tRESPONSE)
Rise Time (tr)
The time interval between a) when the sensed input current
reaches 90% of its final value, and b) when the sensor output
reaches 90% of its full-scale value.
The time interval between a) when the sensor reaches 10% of
its full-scale value, and b) when it reaches 90% of its full-scale
value.
The time interval between a) when the sensed input current
reaches 20% of its full-scale value, and b) when the sensor output
reaches 20% of its full-scale value.
The rate of change [V/µs] in the output voltage from a) when the
sensor reaches 10% of its full-scale value, and b) when it reaches
90% of its full-scale value.
Propagation Delay (tpd)
Output Slew Rate (SR)
Response Time, Propagation Delay, Rise Time, and Output Slew Rate (ACS732-5V)
Applied current step with 10%-90% rise time = 1 μs
Test Conditions: TA = 25°C, CBYPASS = 0.1 µF, CL = 0 F
tRESPONSE
SR [V/μs]
tpd
tr
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20
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
OVERCURRENT FAULT
Overcurrent Fault
FAULT Pin Output
The ACS732 and ACS733 have fast and accurate overcurrent
fault detection circuitry. The overcurrent fault threshold (IFAULT)
is user-configurable via an external resistor divider and supports a
range of 50% to 200% of the full-scale primary input (IPR(MAX)).
Fault response and the overcurrent fault thresholds are described
in the following sections.
Fault Response
The high bandwidth of the ACS732 and ACS733 devices allow
for extremely fast and accurate overcurrent fault detection. An
overcurrent event occurs when the magnitude of the input current
(IP) exceeds the user-set threshold (IFAULT). Fault response time
(tRESPONSE(F)) is defined from the time IP goes above IFAULT to
the time the FAULT pin goes below VFAULT. Overcurrent fault
response is illustrated in Figure 3. When IP goes below IFAULT –
IHYST, the FAULT pin will be released. The rise time of VFAULT
will depend on the value of the resistor RF(PULLUP) and the
capacitance on the pin.
Setting the Overcurrent Fault Threshold
The overcurrent fault threshold (IFAULT) is set via a resistor
divider from VCC to ground on the VOC pin. The voltage on the
VOC pin, VVOC, may range from 0.1 × VCC to 0.4 × VCC. IFAULT
may be set anywhere from 50% to 200% IPR(MAX).
Primary Current (IP)
t2
IFAULT
tRESPONSE(F)
t1
t1 = Time at which input current
surpasses IFAULT threshold
t2 = Time at which output of
FAULT pin is < VFAULT
VFAULT
t
Figure 3: Overcurrent Fault Response
IFAULT
±2 × I PR(max)
Overcurrent fault threshold versus VVOC is shown in Figure 4.
The equation for calculating the trip current is shown below.
For bidirectional devices, the fault will trip for both positive and
negative currents.
IFAULT = IPR(MAX)
{
5×
VVOC
VCC
}
This may be rearranged to solve for the appropriate VVOC value
based on a desired over current fault threshold, shown by the
equation:
VCC
IFAULT
VVOC =
×
5
IPR(MAX)
By setting VVOC with a resistor divider from VCC, the ratio of
VVOC / VCC will remain constant with changes to VCC. In this
regard, the fault trip point will remain constant even as the supply
voltage varies.
±0.5 × IPR(max)
0.1 × VCC
0.4 × VCC
VVOC
Figure 4: Fault Threshold vs. VVOC
It is best practice to use resistor values < 10 kΩ for setting VVOC.
With larger resistor values, the leakage current on VOC may
result in errors in the trip point.
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21
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
DEFINITIONS OF ACCURACY CHARACTERISTICS
Sensitivity (Sens). The change in sensor IC output in response to
a 1 A change through the primary conductor. The sensitivity is the
product of the magnetic circuit sensitivity (G / A) (1 G = 0.1 mT)
and the linear IC amplifier gain (mV/G). The linear IC amplifier gain is programmed at the factory to optimize the sensitivity
(mV/A) for the full-scale current of the device.
Increasing
VIOUT (V)
{ [
ELIN = 1 –
VIOUT (IPR(max)) – VIOUT(Q)
2 × VIOUT (IPR(max)/2) – VIOUT(Q)
]}
Accuracy at
25°C Only
IPR(min)
–IP (A)
Full Scale IP
ETOT (IP) =
VIOUTideal(IP) – VIOUT(IP)
Sensideal(IP)× IP
IPR(max)
0A
Accuracy at
25°C Only
Decreasing
VIOUT (V)
Accuracy Across
Temperature
Figure 5: Output Voltage versus Sensed Current
+ETOT
Voltage Offset Error (VOE). The deviation of the device output
from its ideal quiescent value of 0.5 × VCC (bidirectional) or 0.1
× VCC (unidirectional) due to nonmagnetic causes. To convert
this voltage to amperes, divide by the device sensitivity, Sens.
Total Output Error (ETOT). The difference between the current measurement from the sensor IC and the actual current (IP),
relative to the actual current. This is equivalent to the difference
between the ideal output voltage and the actual output voltage,
divided by the ideal sensitivity, relative to the current flowing
through the primary conduction path:
+IP (A)
VIOUT(Q)
where VIOUT(IPR(max)) is the output of the sensor IC with the
maximum measurement current flowing through it and
VIOUT(IPR(max)/2) is the output of the sensor IC with half of the
maximum measurement current flowing through it.
Zero Current Output Voltage (VIOUT(Q)). The output of the
sensor when the primary current is zero. For a unipolar supply
voltage, it nominally remains at 0.5 × VCC for a bidirectional
device and 0.1 × VCC for a unidirectional device. For example, in
the case of a bidirectional output device, VCC = 3.3 V translates
into VIOUT(Q) = 1.65 V. Variation in VIOUT(Q) can be attributed to
the resolution of the Allegro linear IC quiescent voltage trim and
thermal drift.
Accuracy at
25°C Only
Ideal VIOUT
Accuracy Across
Temperature
Nonlinearity (ELIN). The nonlinearity is a measure of how linear
the output of the sensor IC is over the full current measurement
range. The nonlinearity is calculated as:
Accuracy Across
Temperature
Across Temperature
25°C Only
–IP
+IP
× 100 (%)
The Total Output Error incorporates all sources of error and is a
function of IP. At relatively high currents, ETOT will be mostly
due to sensitivity error, and at relatively low currents, ETOT will
be mostly due to Voltage Offset Error (VOE). As IP approaches
zero, ETOT approaches infinity due to the offset voltage. This is
illustrated in Figure 5 and Figure 6. Figure 5 shows a distribution of output voltages versus IP at 25°C and across temperature.
Figure 6 shows the corresponding ETOT versus IP.
–ETOT
Figure 6: Total Output Error versus Sensed Current
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22
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
APPLICATION INFORMATION
Ratiometry
The ACS732 and ACS733 are both ratiometric sensors. This
means that for a given change in supply voltage, the device’s zero
current output voltage and sensitivity will scale proportionally.
Sensitivity Ratiometry
Ideally, a 5% increase in VCC will result in a 5% increase in
sensitivity. However, the ratiometric response of any sensor is not
ideal. Ratiometric Sensitivity Error ERAT(SENS) is specified by the
equation:
SensitivityVCC VCC(N)
F2
ERAT(SENS) = 100% × (1 – <
SensitivityVCC(N) × VCC
where VCC(N) is equal to the nominal VCC (3.3 V, or 5.0 V) and
SensitivityVCC(N) is the measured sensitivity at nominal VCC for a
particular device. The symbol VCC is the measured VCC value in
application and SensitivityVCC is the measured sensitivity at that
VCC level for a particular device.
Zero Current Offset Ratiometry
Ratiometric error for Zero Current Offset may be calculated using
the following equation:
V
ERAT(Q) = VIOUT(Q)VCC – VIOUT(Q)VCC(N) × V CC
CC(N)
Where VCC(N) is equal to the nominal VCC (3.3 V, or 5.0 V) and
VIOUT(Q)VCC(N) is the measured Zero Current Offset voltage at
nominal VCC for a particular device. The symbol VCC is the measured VCC value in application and VIOUT(Q)VCC is the measured
zero current offset voltage for a particular device.
If there is an average sensitivity error or average offset voltage,
then the average Total Error is estimated as:
ETOTAVG (IP) = ESENSAVG +
100 × VOEAVG
Sens × IP
Layout Guidelines
There are a few considerations during PCB layout that will
help to maintain high accuracy when using Allegro’s integrated
current sensors. Below is a list of common layout mistakes that
should be avoided:
• Extending current carrying traces too far beneath the IC, or
injecting current from the side of the IC
• Placing secondary current phase traces too close to or below
the IC
Extending the Current Traces
The length of copper trace beneath the IC may impact the path of
current flowing through the IP bus. This may cause variation in
the coupling factor from the primary current loop of the package to the IC, and may reduce the overall creepage distance in
application.
It is best practice for the current to approach the IC parallel to the
current-carrying pins, and for the current-carrying trace to not
creep towards the center of the package. Refer to Figure 7.
DO
DO NOT
Estimating Total Error vs. Sensed Current
The performance characteristics tables give distribution
(±3 sigma) values for Total Error at IPR(MAX); however, one may
be interested in the expected error at a particular current. This
error may be estimated using the distribution data for the components of Total Error, Sensitivity Error, and Offset Voltage. The
±3 sigma value for Total Error (ETOT) as a function if the sensed
current is estimated as:
2
ETOT (IP) = ESENS +
(
100 × VOE
Sens × IP
2
)
where ESENS and VOE are the ±3 sigma values for those error
terms.
Figure 7: Best Practice Layout Techniques
for Current Traces
If current must approach the package from the side, it is recommended to reduce the angle as much as possible. For more
information on best current sensor layout practices refer to the
application note “Techniques to Minimize Common-Mode Field
Interference When Using Allegro Current Sensor ICs” on the
Allegro website.
Allegro MicroSystems
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23
ACS732 and
ACS733
Thermal Rise vs. Primary Current
Self-heating due to the flow-off current should be considered during the design of any current sensing system. The sensor, printed
circuit board (PCB), and contacts to the PCB will generate heat
as current moves through the system.
The thermal response is highly dependent on PCB layout, copper
thickness, cooling techniques, and the profile of the injected current.
The current profile includes peak current, current “on-time”, and
duty cycle. While the data presented in this section was collected
with direct current (DC), these numbers may be used to approximate
thermal response for both AC signals and current pulses.
The plot in Figure 8 shows the measured rise in steady-state die
temperature of the ACS732/3 versus continuous current at an ambient temperature, TA, of 25 °C. The thermal offset curves may be
directly applied to other values of TA. Conversely, Figure 9 shows
the maximum continuous current at a given TA. Surges beyond the
maximum current listed in Figure 9 are allowed given the maximum junction temperature, TJ(MAX) (165℃), is not exceeded.
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
The thermal capacity of the ACS732/3 should be verified by the
end user in the application’s specific conditions. The maximum
junction temperature, TJ(MAX) (165°C), should not be exceeded.
Further information on this application testing is available in
the DC and Transient Current Capability application note on the
Allegro website.
ASEK73x Evaluation Board Layout
Thermal data shown in Figure 8 was collected using the
ASEK73x Evaluation Board (TED-0001795). This board
includes 1500 mm2 of 2 oz. (0.0694 mm) copper connected to
pins 1 through 4 and pins 5 through 8, with thermal vias connecting the layers. Top and bottom layers of the PCB are shown
below in Figure 10.
Figure 8: Self Heating in the LA Package
Due to Current Flow
Figure 10: Top and Bottom Layers
for ASEK73x Evaluation Board
Figure 9: Maximum Continuous Current
at a Given TA
Gerber files for the ASEK73x evaluation board are available for
download from the Allegro website. See the technical documents
section of the ACS732 and ACS733 device webpage.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
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24
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
NOT TO SCALE
All dimensions in millimeters.
9.54
1.27
0.65
Package Outline
2.25
7.25
17.27
Current
Out
Current
In
21.51
Perimeter holes for stitching to the other,
matching current trace design, layers of
the PCB for enhanced thermal capability.
Figure 11: High-Isolation PCB Layout
Allegro MicroSystems
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25
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
PACKAGE OUTLINE DRAWING
10.30 ±0.20
D
8°
0°
16
D2
D1
0.33
0.20
7.50 ±0.10
1.728 1.040
D
10.30 ±0.33
A
D
1.40 REF
1
2
1.27
0.40
Branded Face
16×
SEATING
PLANE
0.10 C
0.51
0.31
1.27 BSC
0.25 BSC
SEATING PLANE
GAUGE PLANE
C
2.65 MAX
0.30
0.10
For Reference Only; not for tooling use (reference MS-013AA)
Dimensions in millimeters
Dimensions exclusive of mold flash, gate burrs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
A Terminal #1 mark area
ACS732 (5 V)
ACS733 (3.3 V)
ACS732
Lot Number
ACS733
Lot Number
1
1
B Standard Branding Reference View
B Branding scale and appearance at supplier discretion
C
Line 1: Part Number
Line 2: First 9 characters of Assembly Lot Number
Reference land pattern layout (reference IPC7351
SOIC127P600X175-8M); all pads a minimum of 0.20 mm from all
adjacent pads; adjust as necessary to meet application process
requirements and PCB layout tolerances
D Hall elements (D1, D2); not to scale
0.65
16
1.27
1.27
0.65
16
1.65
2.25
9.75
9.50
1
1
2
C
PCB Layout Reference View
2
High-Isolation PCB Layout Reference View
Figure 12: Package LA, 16-Pin SOICW
Allegro MicroSystems
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26
ACS732 and
ACS733
1 MHz Bandwidth, Galvanically Isolated
Current Sensor IC in SOIC-16 Package
Revision History
Number
Date
Description
–
September 20, 2017
Initial release
1
January 8, 2018
2
March 8, 2018
Added ACS732KLATR-20AB-T part option
3
June 20, 2018
Updated Working Voltage for Basic Isolation units (page 4); added Fault Response Time and Fault
Release Time characteristics (page 6)
4
July 2, 2018
5
October 1, 2018
6
November 13, 2018
Added ACS732KLATR-65AU-T part option (page 2 and 10)
Added ACS732KLATR-75AB-T characteristic performance plots (page 18)
7
November 16, 2018
Added ACS732KLATR-65AB-T part option (page 2, 10, and 19)
8
December 10, 2018
Updated UL certificate number
9
February 26, 2019
10
May 23, 2019
11
August 22, 2019
12
September 10, 2019
Added Hall plate dimensions (page 36)
13
September 26, 2019
Added Hall element positions to package outline drawings (page 36)
Updated Rise Time, Response Time, and Propagation Delay Time (page 5)
Added “Thermal Rise vs. Primary Current” and “ASEK73x Evaluation Board Layout” to the Applications
Information section (page 28)
Added ACS732KLATR-75AB-T variant (pages 2 and 9)
Updated Secondary Hall Coupling Factor value (page 5)
Added Dielectric Surge Strength Test Voltage to Isolation Characteristics table (page 3)
Updated Sensitivity Error (pages 10-11) and Total Output Error (page 11)
Added Maximum Continuous Current to Absolute Maximum Ratings table (page 3),
ESD ratings table (page 3), and updated thermal data section (page 34)
January 17, 2020
Corrected Reverse VOC Voltage value (page 3); added Distance Through Insulation and Comparative
Tracking Index to Isolation Characteristics table (page 3); updated Rise Time, Response Time, Propagation
Delay, and Output Slew Rate test conditions, and added Output Slew Rate (page 6); removed Characteristic
Performance plots (pages 17-24); updated Typical Frequency Response plots (page 17)
15
May 8, 2020
Removed Linearity Error from Common Electrical Characteristics table and added Linearity Error to
Performance Characteristics Tables (pages 8-16); corrected Sensitivity Error test conditions (pages 8-16);
corrected Lifetime Drift Characteristics numbers (pages 8-16); added ACS732KLATR-40AB-T multitemperature characteristic performance plots (page 17); updated Typical Frequency Response plots (page
18); added Response Characteristics Definitions and Performance Data application page (page 19)
16
May 28, 2020
Updated Hall placement (p. 25)
17
June 9, 2020
Added ACS733KLATR-20AB-H part option (page 2, 14); updated Features and Benefits
18
June 29, 2020
Added minimum and maximum values to Linearity Error at TA = 25°C (pages 8-17)
19
August 3, 2020
Corrected ACS732KLATR-40AB Total Output Error, Sensitivity Error, and Voltage Offset Error numbers;
corrected ACS733KLATR-20AB and -20AB-H Total Output Error Including Lifetime Drift numbers
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