ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
FEATURES AND BENEFITS
•
•
•
•
•
•
•
•
•
•
•
•
•
•
AEC-Q100 Grade 1 qualified
Typical of 2.5 μs output response time
5 V supply operation
Ultra-low power loss: 100 μΩ internal conductor resistance
Reinforced galvanic isolation allows use in economical,
high-side current sensing in high-voltage systems
4800 Vrms dielectric strength certified under UL60950-1
Industry-leading noise performance with greatly
improved bandwidth through proprietary amplifier and
filter design techniques
Integrated shield greatly reduces capacitive coupling
from current conductor to die due to high dV/dt signals,
and prevents offset drift in high-side, high-voltage
applications
Greatly improved total output error through digitally
programmed and compensated gain and offset over the
full operating temperature range
Small package size, with easy mounting capability
Monolithic Hall IC for high reliability
Output voltage proportional to AC or DC currents
Factory-trimmed for accuracy
Extremely stable output offset voltage
CB Certificate Number:
US-29755-UL
DESCRIPTION
The Allegro™ ACS772 family of current sensor ICs provide
economical and precise solutions for AC or DC current sensing,
ideal for motor control, load detection and management, power
supply and DC-to-DC converter control, and inverter control.
The 2.5 µs response time enables overcurrent fault detection
in safety-critical applications.
The device consists of a precision, low-offset linear Hall
circuit with a copper conduction path located near the die.
Applied current flowing through this copper conduction path
generates a magnetic field which the Hall IC converts into a
proportional voltage. Device accuracy is optimized through the
close proximity of the magnetic signal to the Hall transducer.
A precise, proportional output voltage is provided by the
low-offset, chopper-stabilized BiCMOS Hall IC, which is
programmed for accuracy at the factory. Proprietary digital
temperature compensation technology greatly improves the
IC accuracy and temperature stability.
High-level immunity to current conductor dV/dt and stray
electric fields is offered by Allegro proprietary integrated shield
technology for low output voltage ripple and low offset drift
in high-side, high-voltage applications.
Continued on the next page…
PACKAGE: 5-pin package (suffix CB)
PFF
Leadform
PSF
Leadform
PSS
Leadform
SMT
Leadform
Not to scale
5V
1
CBYP
0.1 µF
Application 1: the ACS772 outputs an analog
signal, VOUT , that varies linearly with the
bidirectional AC or DC primary sensed current, IP , within the range specified. RF and
CF are for optimal noise management, with
values that depend on the application.
2
VCC
IP–
ACS772
IP
GND
CF
VOUT
3
RF
5
VIOUT
IP+
4
Typical Application
ACS772-DS, Rev. 17
MCO-0000363
September 14, 2021
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
DESCRIPTION (continued)
The output of the device increases when an increasing current flows
through the primary copper conduction path (from terminal 4 to terminal
5), which is the path used for current sampling. The internal resistance
of this conductive path is 100 μΩ typical, providing low power loss.
The thickness of the copper conductor allows survival of the device
at high overcurrent conditions. The terminals of the conductive path
are electrically isolated from the signal leads (pins 1 through 3). This
allows the ACS772 family of sensor ICs to be used in applications
requiring electrical isolation without the use of opto-isolators or
other costly isolation techniques.
The device is fully calibrated prior to shipment from the factory.
The ACS772 family is lead (Pb) free. All leads are plated with 100%
matte tin, and there is no Pb inside the package. The heavy gauge
leadframe is made of oxygen-free copper.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
2
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
SELECTION GUIDE
Package
Part Number [1]
ACS772LCB-050U-PFF-T
Sensitivity
Sens (Typ.)
(mV/A) [2]
Terminals
Signal Pins
Primary Sampled
Current , IP
(A)
Formed
Formed
50
80
±50
40
ACS772LCB-050B-PFF-T
Formed
Formed
ACS772LCB-050B-PSF-T
Straight
Formed
ACS772LCB-050B-PSS-T
Straight
Straight
ACS772LCB-050B-SMT-T
Formed
Formed
ACS772LCB-100U-PFF-T
Formed
Formed
ACS772LCB-100B-PFF-T
Formed
Formed
ACS772LCB-100B-SMT-T
Formed
Formed
ACS772KCB-150U-PFF-T
Formed
Formed
ACS772KCB-150U-SMT-T
Formed
Formed
ACS772KCB-150B-PFF-T
Formed
Formed
ACS772KCB-150B-SMT-T
Formed
Formed
ACS772ECB-200U-PFF-T
Formed
Formed
ACS772ECB-200B-PFF-T
Formed
Formed
ACS772ECB-200B-SMT-T
Formed
Formed
ACS772ECB-250U-PFF-T
Formed
Formed
ACS772ECB-250U-PSF-T
Straight
Formed
ACS772ECB-250B-PFF-T
Formed
Formed
ACS772ECB-250B-PSF-T
Straight
Formed
Nominal TA [3]
(°C)
Packing [4]
–40 to 150
100
40
±100
20
150
26.66
–40 to 125
±150
13.33
200
20
±200
10
250
16
34 pieces
per tube
–40 to 85
±250
8
ACS772ECB-300B-PFF-T
Formed
Formed
±300
6.66
ACS772ECB-400U-PSF-T
Straight
Formed
400
10
ACS772ECB-400B-PFF-T
Formed
Formed
±400
5
[1] Additional
leadform and sensitivity options available for qualified volumes.
[2] Measured at V
CC = 5 V.
[3] All ACS772 devices are production tested and guaranteed to T = 150°C, provided the Maximum Junction Temperature, T
A
J(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[4] Contact Allegro for additional packing options.
ACS
772
L
CB
- 050 B - PFF - T
Lead (Pb) Free
Lead Form
Output Directionality:
B – Bidirectional (positive and negative current)
U – Unidirectional (only positive current)
Current Sensing Range (A)
Package Designator
Operating Temperature Range
3 Digit Part Number
Allegro Current Sensor
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
3
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
ABSOLUTE MAXIMUM RATINGS
Characteristic
Symbol
Notes
Rating
Unit
Supply Voltage
VCC
6.5
V
Reverse Supply Voltage
VRCC
–0.5
V
Output Voltage
VIOUT
6.5
V
Reverse Output Voltage
VRIOUT
–0.5
V
Output Source Current
IOUT(Source)
VIOUT to GND
3
mA
Minimum pull-up resistor of 500 Ω from VCC to VIOUT
10
mA
TA = 25°C
250
A
Output Sink Current
IOUT(Sink)
Maximum Continuous Current
Operating Ambient
ICMAX
Temperature [1]
TA
Maximum Junction Temperature
–40 to 150
°C
TJ(max)
165
°C
Tstg
–65 to 165
°C
Storage Temperature
Range E, K, and L
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Thermal
Application section of this datasheet for more information.
ESD RATINGS
Characteristic
Symbol
Test Conditions
Value
Unit
Human Body Model
VHBM
Per JEDEC JS-001
±6
kV
Charged Device Model
VCDM
Per JEDEC JS-002
±1
kV
ISOLATION CHARACTERISTICS
Characteristic
Symbol
Dielectric Surge Strength Test Voltage
VSURGE
Notes
Rating
Unit
Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5 1.2 µs
(rise) / 50 µs (width)
8000
V
4800
VRMS
1358
VPK or VDC
960
VRMS
Dielectric Strength Test Voltage [2]
VISO
Agency type-tested for 60 seconds per UL standard 60950-1, 2nd
Edition. Tested at 3000 VRMS for 1 second in production.
Working Voltage for Basic Isolation
VWVBI
For basic (single) isolation per UL standard 60950-1, 2nd Edition
Working Voltage for Reinforced Isolation
VWFRI
For reinforced (double) isolation per UL standard 60950-1, 2nd
Edition
672
VPK or VDC
475
VRMS
0.47
mm
400 to 599
V
Distance Through Insulation
DIT
Minimum internal distance through insulation
Comparative Tracking Index
CTI
Material Group II
[2] Allegro
does not conduct 60-second testing. It is done only during the UL certification process.
TYPICAL OVERCURRENT CAPABILITIES [4][5]
Characteristic
Overcurrent
Symbol
IPOC
Notes
Rating
Unit
TA = 25°C; current is on for 1 second and off for 99 seconds, 100 pulses applied
1200
A
TA = 85°C; current is on for 1 second and off for 99 seconds, 100 pulses applied
900
A
TA = 150°C; current is on for 1 second and off for 99 seconds, 100 pulses applied
600
A
[4] Test
was done with Allegro evaluation board. The maximum allowed current is limited by TJ(max) only.
[5] For more overcurrent profiles, please see FAQ on the Allegro website, www.allegromicro.com.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
4
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
IP+
VCC
To all subcircuits
Programming
Control
Charge Pump Pulse
Generator
Temperature
Sensor
EEPROM and
Control Logic
Sensitivity Control
Active Temperature
Compensation
Dynamic Offset
Cancellation
C BYPASS
Undervoltage
Detection
Offset Control
Output Clamps
VIOUT
Signal Recovery
CL
GND
IP–
Functional Block Diagram
THERMAL CHARACTERISTICS: May require derating at maximum conditions
Characteristic
Symbol
Test Conditions [3]
Package Thermal Resistance
[3] Additional
VCC
1
GND
2
VIOUT
3
RθJA
Mounted on the Allegro evaluation board with
(1400 mm2 on component side and 1400 mm2 on opposite
side) of 4 oz. copper connected to the primary leadframe
and with thermal vias connecting the copper layers.
Performance is based on current flowing through the
primary leadframe and includes the power consumed by
the PCB.
Value
Unit
7
°C/W
2800 mm2
thermal information available on the Allegro website.
5 IP–
4 IP+
Pinout Diagram
Terminal List Table
Number
Name
Description
1
VCC
Device power supply terminal
2
GND
Signal ground terminal
3
VIOUT
4
IP+
Analog output signal
Terminal for current being sampled
5
IP–
Terminal for current being sampled
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
5
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
COMMON OPERATING CHARACTERISTICS: Valid at TA = –40°C to 150°C, CBYP = 0.1 µF, and VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
ELECTRICAL CHARACTERISTICS
Supply Voltage
VCC
4.5
5
5.5
V
Supply Current
ICC
VCC = 5 V, no load on output
–
10
15
mA
Power-On Delay
tPOD
TA = 25°C
–
64
–
µs
VUVLOH
VCC rising at 1 V/ms and device functions enabled
–
4
–
V
VUVLOL
VCC falling at 1 V/ms and device functions enabled
–
3.5
–
V
250
–
–
mV
Undervoltage Lockout (UVLO)
Threshold [1]
UVLO Hysteresis
UVLO Enable/Disable Delay
Time [1]
Power-On Reset Voltage
POR Hysteresis
VHYS(UVLO)
tUVLOE
Time measured from falling VCC < VUVLOH to UVLO
enabled
–
64
–
µs
tUVLOD
Time measured from rising VCC > VUVLOH to UVLO
disabled
–
7
–
µs
VPORH
VCC rising at 1 V/ms
–
2.9
–
V
VPORL
VCC falling at 1 V/ms
–
2.5
–
V
250
–
–
mV
tr
TA = 25°C, CL = 0.47 nF
–
2.4
–
µs
tPROP
TA = 25°C, CL = 0.47 nF
–
1.2
–
µs
tRESPONSE
TA = 25°C, CL = 0.47 nF
–
2.5
–
µs
SR
TA = 25°C, CL = 0.47 nF
–
0.67
–
V/µs
Internal Bandwidth
BWi
Small signal –3 dB, CL = 0.47 nF
–
200
–
kHz
DC Output Impedance
ROUT
TA = 25°C
–
3.3
–
Ω
4.7
–
–
kΩ
–
1
10
nF
Rise Time
Propagation Delay Time
Response Time
Output Slew Rate
VHYS(POR)
Output Load Resistance
RLOAD(MIN)
VIOUT to GND, VIOUT to VCC
Output Load Capacitance
CLOAD(MAX)
VIOUT to GND
Primary Conductor Resistance
RPRIMARY
TA = 25°C
VSAT(HIGH)
TA = 25°C, RL(PULLDWN) = 10 kΩ to GND
VSAT(LOW)
QVO Ratiometry Error [2]
Sens Ratiometry Error [2]
Output Saturation Voltage
–
100
–
µΩ
VCC – 0.2
–
–
V
TA = 25°C, RL(PULLUP) = 10 kΩ to VCC
–
–
200
mV
RatERRQVO
VCC = 4.75 to 5.25 V
–
±0.15
–
%
RatERRSens
VCC = 4.75 to 5.25 V
–
±0.3
–
%
Input referenced noise density; TA = 25°C, CL = 1 nF
–
0.15
–
mA / √¯(Hz)
ERROR COMPONENTS
Noise
IN
–
85
–
mARMS
Nonlinearity [2]
ELIN
Input referenced noise at 200 kHz; TA = 25°C, CL = 1 nF
Up to 200 A
–0.9
±0.5
0.9
%
Symmetry [2]
ESYM
Over half-scale IP
–0.8
±0.4
0.8
%
[1] UVLO
[2]
feature is only available on part numbers programmed to work at VCC = 5 V.
See the Nonlinearity Characteristic Definitions section.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
6
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X050U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
0
–
50
A
IPR(min) < IP < IPR(max)
–
80 ×
VCC / 5
–
mV/A
Unidirectional; IP = 0 A
–
VCC / 10
–
V
TA = 25°C, CL = 1 nF
–
20.4
–
mVp-p
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
VIOUT(Q)
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
TA = 25°C, CL = 1 nF
–
3.4
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.7
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.8
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
120
250
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
7
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X050B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
–50
–
50
A
–
mV/A
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
IPR(min) < IP < IPR(max)
–
40 ×
VCC / 5
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
V
TA = 25°C, CL = 1 nF
–
20.4
–
mVp-p
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
TA = 25°C, CL = 1 nF
–
3.4
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.7
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.8
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
210
250
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
8
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X100U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
0
–
100
A
IPR(min) < IP < IPR(max)
–
40 ×
VCC / 5
–
mV/A
Unidirectional; IP = 0 A
–
VCC / 10
–
V
TA = 25°C, CL = 1 nF
–
20.4
–
mVp-p
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
VIOUT(Q)
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
TA = 25°C, CL = 1 nF
–
3.4
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.7
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.8
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
280
400
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
9
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X100B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
–100
–
100
A
–
mV/A
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
IPR(min) < IP < IPR(max)
–
20 ×
VCC / 5
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
V
TA = 25°C, CL = 1 nF
–
20.4
–
mVp-p
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
TA = 25°C, CL = 1 nF
–
3.4
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.7
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.8
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
175
400
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
10
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X150U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
0
–
150
A
IPR(min) < IP < IPR(max)
–
26.66 ×
VCC / 5
–
mV/A
Unidirectional; IP = 0 A
–
VCC / 10
–
V
TA = 25°C, CL = 1 nF
–
20.4
–
mVp-p
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
VIOUT(Q)
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
TA = 25°C, CL = 1 nF
–
3.4
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.7
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.8
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
280
400
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
11
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X150B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
–150
–
150
A
–
mV/A
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
IPR(min) < IP < IPR(max)
–
13.33 ×
VCC / 5
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
V
TA = 25°C, CL = 1 nF
–
7.2
–
mVp-p
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
TA = 25°C, CL = 1 nF
–
1.2
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.7
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.8
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
280
400
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
12
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X200U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
0
–
200
A
IPR(min) < IP < IPR(max)
–
20 ×
VCC / 5
–
mV/A
Unidirectional; IP = 0 A
–
VCC / 10
–
V
TA = 25°C, CL = 1 nF
–
7.2
–
mVp-p
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
VIOUT(Q)
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
TA = 25°C, CL = 1 nF
–
1.2
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.5
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.7
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.5
3.5
%
–8
±4
8
mV
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±6
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
160
400
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
13
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X200B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
–200
–
200
A
–
mV/A
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
IPR(min) < IP < IPR(max)
–
10 ×
VCC / 5
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
V
TA = 25°C, CL = 1 nF
–
5.1
–
mVp-p
TA = 25°C, CL = 1 nF
–
0.85
–
mVRMS
Full scale of IP, TA = 25°C
–1
±0.5
1
%
Full scale of IP, TA = 25°C to 150°C
–1.25
±0.7
1.25
%
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.5
3.5
%
–8
±4
8
mV
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
380
400
mA
ETOT(HT)
Full scale of IP, TA = 25°C to 150°C
–1.5
±0.7
1.5
%
ETOT(LT)
Full scale of IP, TA = –40°C to 25°C
–3.5
±1.5
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
14
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X250U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
0
–
250
A
IPR(min) < IP < IPR(max)
–
16 ×
VCC / 5
–
mV/A
Unidirectional; IP = 0 A
–
VCC / 10
–
V
TA = 25°C, CL = 1 nF
–
5.1
–
mVp-p
TA = 25°C, CL = 1 nF
–
0.85
–
mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
±0.7
1
%
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
±0.8
1.25
%
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
VIOUT(Q)
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
200
400
mA
ETOT(HT)
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
15
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X250B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
–250
–
250
A
–
mV/A
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
IPR(min) < IP < IPR(max)
–
8×
VCC / 5
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
V
TA = 25°C, CL = 1 nF
–
5.1
–
mVp-p
TA = 25°C, CL = 1 nF
–
0.85
–
mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
±0.7
1
%
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
±0.8
1.25
%
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
175
400
mA
ETOT(HT)
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
16
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X300B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
–300
–
300
A
–
mV/A
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
IPR(min) < IP < IPR(max)
–
6.66 ×
VCC / 5
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
V
TA = 25°C, CL = 1 nF
–
5.1
–
mVp-p
TA = 25°C, CL = 1 nF
–
0.85
–
mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
±0.7
1
%
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
±0.8
1.25
%
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
175
400
mA
ETOT(HT)
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
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17
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X400U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
0
–
400
A
IPR(min) < IP < IPR(max)
–
10 ×
VCC / 5
–
mV/A
Unidirectional; IP = 0 A
–
VCC /10
–
V
TA = 25°C, CL = 1 nF
–
5.1
–
mVp-p
TA = 25°C, CL = 1 nF
–
0.85
–
mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
±0.5
1
%
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
±0.7
1.25
%
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.5
3.5
%
–8
±4
8
mV
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
VIOUT(Q)
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
245
400
mA
ETOT(HT)
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.5
±0.8
1.5
%
ETOT(LT)
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±2.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values. Typical values may be revaluated once the specific part number is released to production.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
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18
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
X400B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
–400
–
400
A
NOMINAL PERFORMANCE
Current Sensing Range
Sensitivity
Zero Current Output Voltage
IPR
Sens
IPR(min) < IP < IPR(max)
–
5×
VCC / 5
–
mV/A
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
V
TA = 25°C, CL = 1 nF
–
5.1
–
mVp-p
TA = 25°C, CL = 1 nF
–
0.85
–
mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
±0.7
1
%
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
±0.8
1.25
%
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
–8
±4
8
mV
ACCURACY PERFORMANCE
Noise
Sensitivity Error
VN
ESens
VOE(TA)
Electrical Offset Error
Magnetic Offset Error
Total Output Error
IP = 0 A, TA = 25°C
VOE(TA)HT
IP = 0 A, TA = 25°C to 150°C
–8
±4
8
mV
VOE(TA)LT
IP = 0 A, TA = –40°C to 25°C
–20
±6
20
mV
IERROM
IP = 0 A, TA = 25°C, after excursion of IPR(max)
–
175
400
mA
ETOT(HT)
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.5
±0.9
1.5
%
ETOT(LT)
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
–3.5
±1.7
3.5
%
ESens(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.6
2.1
%
ESens(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.5
3.5
%
ETOT(LIFE)(HT)
TA = 25°C to 150°C
–2.1
±1.7
2.1
%
LIFETIME ACCURACY CHARACTERISTICS [3]
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(LT)
TA = –40°C to 25°C
–3.5
±2.6
3.5
%
EOFF(LIFE)(HT)
TA = 25°C to 150°C
–10
±7
10
mV
EOFF(LIFE)(LT)
TA = –40°C to 25°C
–20
±8.9
20
mV
[1] All ACS772
devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
Allegro MicroSystems
955 Perimeter Road
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19
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-050U-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
10
82
8
81.5
6
81
Sens(mV/A)
Voe(mV)
4
2
0
-2
-4
80.5
80
79.5
-6
79
-8
-10
-50
-25
0
25
50
75
100
125
78.5
150
-50
-25
0
25
0.6
2
0.5
1.5
0.4
1
Error(%)
2.5
0.3
0.2
0.1
100
125
150
125
150
Avg-3σ
Avg
Avg+3σ
0.5
0
-0.5
0
-1
-0.1
-1.5
-50
-25
0
25
50
75
100
125
-2
150
Ta(℃)
-50
-25
0
25
50
75
100
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
180
160
140
Ierrom(mA)
Elin(%)
75
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
0.7
-0.2
50
Ta(℃)
Ta(℃)
120
100
80
60
Avg-3σ
40
Avg
20
0
Avg+3σ
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
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20
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-050B-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
8
40.6
6
40.4
Sens(mV/A)
Voe(mV)
4
2
0
-2
40
39.8
39.6
-4
-6
40.2
39.4
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
125
150
Ta(℃)
Ta(℃)
Nonlinearity versus Ambient Temperature
Total Output Error versus Ambient Temperature
0.8
1.5
0.7
1
0.6
0.5
Error(%)
0.4
0.3
0
-0.5
0.2
-1
0.1
0
-50
-25
0
25
50
75
100
125
-1.5
150
Ta(℃)
-50
-25
0
25
50
75
100
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
180
160
140
Ierrom(mA)
Elin(%)
0.5
120
100
80
60
40
20
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
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21
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-100U-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
10
40.6
8
40.4
Sens(mV/A)
Voe(mV)
6
4
2
0
40
39.8
39.6
-2
-4
40.2
-50
-25
0
25
50
75
100
125
39.4
150
-50
-25
0
25
Ta(℃)
2.5
0.6
2
Error(%)
0.3
Avg-3σ
Avg
-25
150
125
150
Avg-3σ
Avg+3σ
1
0.5
0
-1
Avg+3σ
-50
125
-0.5
-1.5
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
250
200
Ierrom(mA)
Elin(%)
0.4
0.1
100
Avg
1.5
0.5
0.2
75
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
0.7
0
50
Ta(℃)
150
100
Avg-3σ
50
Avg
Avg+3σ
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
22
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-100B-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
20.5
6
20.4
4
20.3
Sens(mV/A)
Voe(mV)
2
0
-2
20.1
20
19.9
19.8
-4
-6
20.2
19.7
19.6
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
100
125
150
125
150
2.5
2
0.7
1.5
0.6
1
Error(%)
0.5
0.4
0.3
0.5
0
-0.5
0.2
-1
0.1
-1.5
-2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
300
250
Ierrom(mA)
Elin(%)
75
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
0.8
0
50
Ta(℃)
Ta(℃)
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
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23
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772KCB-150U-PFF-T
Sensitivity versus Ambient Temperature
27.2
5
27.1
4
27
3
26.9
Sens(mV/A)
Voe(mV)
Electrical Offset Voltage versus Ambient Temperature
6
2
1
0
26.8
26.7
26.6
-1
26.5
-2
26.4
-3
26.3
-4
26.2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
2.5
0.6
2
0.5
1.5
Error(%)
0.3
0.2
1
0.5
0
-0.5
0.1
0
-1
-1.5
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
300
250
Ierrom(mA)
Elin(%)
0.4
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
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24
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772KCB-150B-PFF-T
Sensitivity versus Ambient Temperature
13.7
6
13.6
4
13.5
Sens(mV/A)
Voe(mV)
Electrical Offset Voltage versus Ambient Temperature
8
2
0
13.3
13.2
-2
-4
13.4
13.1
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
100
125
150
3
2.5
0.6
2
1.5
Error(%)
0.5
0.4
0.3
1
0.5
0
-0.5
0.2
-1
0.1
-1.5
-2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
350
300
250
Ierrom(mA)
Elin(%)
75
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
0.7
0
50
Ta(℃)
Ta(℃)
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
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25
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-200U-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
8
20.5
20.4
6
20.3
20.2
Sens(mV/A)
Voe(mV)
4
2
0
-2
20
19.9
19.8
19.7
19.6
-4
-6
20.1
19.5
-50
-25
0
25
50
75
100
125
19.4
150
Ta(℃)
-50
-25
0
25
50
75
100
125
150
125
150
Ta(℃)
Nonlinearity versus Ambient Temperature
Total Output Error versus Ambient Temperature
0.4
3
0.35
2
0.3
1
Error(%)
0.2
0.15
-2
0.05
0
0
-1
0.1
-50
-25
0
25
50
75
100
125
-3
150
Ta(℃)
-50
-25
0
25
50
75
100
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
250
200
Ierrom(mA)
Elin(%)
0.25
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
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26
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-200B-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
10.15
5
4
10.1
3
10.05
1
Sens(mV/A)
Voe(mV)
2
0
-1
-2
9.9
-3
-4
9.85
-5
-6
10
9.95
9.8
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
125
150
Ta(℃)
Ta(℃)
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
2
0.6
1.5
0.5
1
Error(%)
0.3
0.2
0.5
0
-0.5
-1
0.1
0
-1.5
-2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
350
300
250
Ierrom(mA)
Elin(%)
0.4
200
150
100
Avg-3σ
Avg
50
0
Avg+3σ
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
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27
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-250U-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
16.25
12
16.2
10
16.15
16.1
Sens(mV/A)
Voe(mV)
8
6
4
2
16
15.95
15.9
15.85
0
15.8
-2
-4
16.05
15.75
15.7
-50
-25
0
25
50
75
100
125
-50
150
-25
0
25
Nonlinearity versus Ambient Temperature[1]
100
125
150
125
150
2
0.45
1.5
0.4
1
0.35
0.3
Error(%)
Elin(%)
75
Total Output Error versus Ambient Temperature
0.5
0.25
0.2
0.15
0.5
0
-0.5
-1
0.1
-1.5
0.05
0
50
Ta(℃)
Ta(℃)
-50
-25
0
25
50
75
100
125
-2
150
-50
-25
0
25
Ta(℃)
50
75
100
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
300
Ierrom(mA)
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
[1] Nonlinearity
versus Ambient Temperature Performance Plot is valid for applied currents less than 200 A.
Allegro MicroSystems
955 Perimeter Road
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28
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-250B-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
8.15
4
8.1
2
8.05
Sens(mV/A)
Voe(mV)
6
0
-2
7.95
7.9
-4
-6
8
7.85
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
Nonlinearity versus Ambient Temperature [1]
2
0.5
1.5
100
125
150
125
150
1
Error(%)
0.4
Elin(%)
75
Total Output Error versus Ambient Temperature
0.6
0.3
0.2
0.5
0
-0.5
0.1
0
50
Ta(℃)
Ta(℃)
-1
-50
-25
0
25
50
75
100
125
-1.5
150
Ta(℃)
-50
-25
0
25
50
75
100
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
350
300
Ierrom(mA)
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
[1] Nonlinearity
versus Ambient Temperature Performance Plot is valid for applied currents less than 200 A.
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-400B-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
6
5.12
Avg-3σ
4
5.08
Avg+3σ
5.06
Sens(mV/A)
Voe(mV)
2
5.1
Avg
0
-2
Avg-3σ
Avg
Avg+3σ
5.04
5.02
5
4.98
4.96
-4
4.94
4.92
-6
-50
-25
0
25
50
75
100
125
4.9
150
Ta(℃)
-50
25
50
75
100
125
150
Total Output Error versus Ambient Temperature
3
0.8
Avg-3σ
2.5
0.7
Avg
2
0.6
Avg+3σ
1.5
0.5
Error(%)
Elin(%)
0
Ta(℃)
Nonlinearity versus Ambient Temperature [1]
0.4
0.3
1
0.5
0
-0.5
0.2
Avg-3σ
0.1
Avg
0
-25
-1
-1.5
Avg+3σ
-50
-25
-2
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
350
300
Ierrom(mA)
250
200
150
100
Avg-3σ
Avg
50
0
Avg+3σ
-50
-25
0
25
50
75
100
125
150
Ta(℃)
[1] Nonlinearity
versus Ambient Temperature Performance Plot is valid for applied currents less than 200 A.
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ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
CHARACTERISTIC PERFORMANCE DATA
Response Time (tRESPONSE)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
Propagation Delay (tPROP)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
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ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
Rise Time (tR)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
Allegro MicroSystems
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32
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
UVLO Enable Time (tUVLOE)
VCC 5 V to 3 V fall time = 1.5 µs, CL = 1 nF
UVLO Disble Time (tUVLOD)
VCC 3 V to 5 V recovery time = 1.5 µs, CL = 1 nF
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC DEFINITIONS
Definitions of Accuracy Characteristics
SENSITIVITY (Sens)
The change in sensor IC output in response to a 1 A change
through the primary conductor. The sensitivity is the product
of the magnetic circuit sensitivity (G / A; 1 G = 0.1 mT) and the
linear IC amplifier gain (mV/G). The linear IC amplifier gain is
programmed at the factory to optimize the sensitivity (mV/A) for
the full-scale current of the device.
SENSITIVITY ERROR (ESens)
The sensitivity error is the percent difference between the measured sensitivity and the ideal sensitivity. For example, in the case
of VCC = 5 V:
ESens =
SensMeas(5V) – SensIdeal(5V)
SensIDEAL(5V)
× 100 (%)
NOISE (V N)
The noise floor is derived from the thermal and shot noise
observed in Hall elements. Dividing the noise (mV) by the sensitivity (mV/A) provides the smallest current that the device is able
to resolve.
NONLINEARITY (E LIN)
The ACS772 is designed to provide a linear output in response
to a ramping current. Consider two current levels: I1 and I2. Ideally, the sensitivity of a device is the same for both currents, for
a given supply voltage and temperature. Nonlinearity is present
when there is a difference between the sensitivities measured at
I1 and I2. Nonlinearity is calculated separately for the positive
(ELINpos ) and negative (ELINneg ) applied currents as follows:
Due to core saturation, the nonlinearity error will increase when
applied current exceeds 200 A. Refer to the Sensitivity Error vs.
Applied Current plots below.
SYMMETRY (E SYM)
The degree to which the absolute voltage output from the IC varies in proportion to either a positive or negative half-scale primary
current. The following equation is used to derive symmetry:
100 ×
(
VIOUT_+half-scale amperes – VIOUT(Q)
VIOUT(Q) – VIOUT_–half-scale amperes
)
RATIOMETRY ERROR
The device features a ratiometric output. This means that the
quiescent voltage output, VIOUTQ, and the magnetic sensitivity,
Sens, are proportional to the supply voltage, VCC.The ratiometric
change (%) in the quiescent voltage output is defined as:
RatErrQVO =
[
1–
(VIOUTQ(VCC) / VIOUTQ(5V))
VCC / 5 V
]
× 100%
and the ratiometric change (%) in sensitivity is defined as:
[
RatErrSens = 1 –
(Sens(VCC) / Sense(5V))
VCC / 5 V
]
× 100%
ZERO CURRENT OUTPUT VOLTAGE (VIOUT(Q))
where:
The output of the sensor when the primary current is zero. It
nominally remains at 0.5 × VCC for a bidirectional device and 0.1
× VCC for a unidirectional device. For example, in the case of a
bidirectional output device, VCC = 5 V translates into VIOUT(Q) =
2.5 V. Variation in VIOUT(Q) can be attributed to the resolution of
the Allegro linear IC quiescent voltage trim and thermal drift.
SensIx = (VIOUT(Ix) – VIOUT(Q))/ Ix
ELECTRICAL OFFSET VOLTAGE (VOE)
ELINpos = 100 (%) × {1 – (SensIPOS2 / SensIPOS1 ) }
ELINneg = 100 (%) × {1 – (SensINEG2 / SensINEG1 )}
and IPOSx and INEGx are positive and negative currents and IPOS2
= 2 × IPOS1 and INEG2 = 2 × INEG1.
Then:
ELIN = max( ELINpos , ELINneg )
The deviation of the device output from its ideal quiescent value
of 0.5 × VCC (bidirectional) or 0.1 × VCC (unidirectional) due to
nonmagnetic causes. To convert this voltage to amperes, divide by
the device sensitivity, Sens.
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ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
MAGNETIC OFFSET ERROR (I ERROM)
The magnetic offset is due to the residual magnetism (remnant
field) of the core material. The magnetic offset error is highest
when the magnetic circuit has been saturated, usually when the
device has been subjected to a full-scale or high-current overload
condition. The magnetic offset is largely dependent on the material used as a flux concentrator. The larger magnetic offsets are
observed at the lower operating temperatures.
TOTAL OUTPUT ERROR (E TOT)
The difference between the current measurement from the sensor
IC and the actual current (IP), relative to the actual current. This
is equivalent to the difference between the ideal output voltage
and the actual output voltage, divided by the ideal sensitivity,
relative to the current flowing through the primary conduction
path:
Figure 1: Sensitivity Error (relative to ideal 5 mV/A) in
Amps vs. Applied Current
ETOT(IP) =
VIOUT(IP) – VIOUT(ideal)(IP)
Sensideal × IP
× 100(%)
where
VIOUT(ideal)(IP) = VIOUT(Q) + (SensIDEAL × IP )
The Total Output Error incorporates all sources of error and is a
function of IP.
At relatively high currents, ETOT will be mostly due to sensitivity error, and at relatively low currents, ETOT will be mostly due
to Offset Voltage (VOE). In fact, as IP approaches zero, ETOT
approaches infinity due to the offset voltage. This is illustrated
in Figure 3 and Figure 4. Figure 3 shows a distribution of output
voltages versus IP at 25°C and across temperature. Figure 4
shows the corresponding ETOT versus IP.
Figure 2: Sensitivity Error in Percent of
Full-Scale Current vs. Applied Current
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
Increasing
VIOUT (V)
Accuracy Across
Temperature
Accuracy at
25°C Only
+ETOT
Ideal VIOUT
Accuracy Across
Temperature
Accuracy at
25°C Only
Across Temperature
IPR(min)
VIOUT(Q)
25°C Only
+IP (A)
–IP (A)
–IP
Full Scale IP
+IP
IPR(max)
0A
Accuracy at
25°C Only
Accuracy Across
Temperature
Decreasing
VIOUT (V)
Figure 3: Output Voltage versus Sensed Current
–ETOT
Figure 4: Total Output Error versus Sensed Current
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ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
Definitions of Dynamic Response Characteristics
POWER-ON DELAY (tPOD)
When the supply is ramped to its operating voltage, the device
requires a finite time to power its internal components before
responding to an input magnetic field. Power-On Delay, tPOD, is
defined as the time it takes for the output voltage to settle within
±10% of its steady-state value under an applied magnetic field,
after the power supply has reached its minimum specified operating voltage, VCC(min), as shown in the chart at right.
V
VCC
VCC(typ)
VIOUT
90% VIOUT
VCC(min)
t1
RISE TIME (tr)
The time interval between a) when the sensor reaches 10% of
its full-scale value, and b) when it reaches 90% of its full-scale
value.
t2= time at which output voltage settles
within ±10% of its steady-state value
under an applied magnetic field
The time interval between a) when the sensed current reaches
20% of its full-scale value, and b) when the sensor output reaches
20% of its full-scale value.
The time interval between a) when the applied current reaches
90% of its final value, and b) when the sensor reaches 90% of its
output corresponding to the applied current.
tPOD
t1= time at which power supply reaches
minimum specified operating voltage
PROPAGATION DELAY (tPROP)
RESPONSE TIME (tRESPONSE)
t2
0
+t
Figure 5: Power-On Delay (tPOD)
(%)
90
Primary Current
VIOUT
Rise Time, tr
20
10
0
Propagation Delay, tPROP
t
Figure 6: Rise Time (tr) and Propagation Delay (tPROP)
(%)
90
Primary Current
VIOUT
Response Time, tRESPONSE
0
t
Figure 7: Response Time (tRESPONSE)
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ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
FUNCTIONAL DESCRIPTION
Power-On Reset (POR) and Undervoltage
Lockout (UVLO) Operation
The descriptions in this section assume: temperature = 25°C, no
output load (RL, CL), and no significant magnetic field is present.
Power-Up
At power-up, as VCC ramps up, the output is in a high-impedance
state. When VCC crosses VPORH (location [1] in Figure 8 and [ 1′ ]
in Figure 9), the POR Release counter starts counting for tPORR .
At this point, if VCC exceeds VUVLOH [ 2′ ], the output will go to
VCC / 2 after tUVLOD [ 3′ ] .
If VCC does not exceed VUVLOH [2], the output will stay in the
high-impedance state until VCC reaches VUVLOH [3] and then will
go to VCC / 2 after tUVLOD [ 4 ].
VCC drops below VCC(min) = 4.5 V
If VCC drops below VUVLOL [ 4′, 5 ] , the UVLO Enable Counter
starts counting. If VCC is still below VUVLOL when the counter
reaches tUVLOE , the UVLO function will be enabled and the
ouput will be pulled near GND [ 6 ] . If VCC exceeds VUVLOL
before the UVLO Enable Counter reaches tUVLOE [ 5′ ] , the output
will continue to be VCC / 2.
Coming Out of UVLO
While UVLO is enabled [ 6 ] , if VCC exceeds VUVLOH [ 7 ] ,
UVLO will be disabled after tUVLOD , and the output will be
VCC / 2 [ 8 ] .
Power-Down
As VCC ramps down below VUVLOL [ 6′, 9 ] , the UVLO Enable
Counter will start counting. If VCC is higher than VPORL when
the counter reaches tUVLOE , the UVLO function will be enabled
and the output will be pulled near GND [ 10 ] . The output will
enter a high-impedance state as VCC goes below VPORL [ 11 ] . If
VCC falls below VPORL before the UVLO Enable Counter reaches
tUVLOE , the output will transition directly into a high-impedance
state [ 7′ ].
EEPROM Error Checking And Correction
Hamming code methodology is implemented for EEPROM
checking and correction. The device has ECC enabled after
power-up. If an uncorrectable error has occurred, the VOUT pin
will go to high impedance and the device will not respond to
applied magnetic field.
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
VCC
1
2
3
5.0
5
4
VUVLOH
VUVLOL
VPORH
VPORL
6
7
9
8
10 11
tUVLOE
tUVLOE
GND
VOUT
Time
Slope =
VCC / 2
2.5
tPORR
tUVLOD
GND
tUVLOD
High Impedance
High Impedance
Time
Figure 8: POR and UVLO Operation: Slow Rise Time Case
VCC
5.0
VUVLOH
VUVLOL
VPORH
VPORL
1’
2’
3’
4’ 5’
6’ 7’
< tUVLOE
GND
VOUT
Time
tPORR
2.5
Slope =
VCC / 2
< tUVLOE
Slope =
VCC / 2
tUVLOD
GND
High Impedance
Time
High Impedance
Figure 9: POR and UVLO Operation: Fast Rise Time Case
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39
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
Chopper Stabilization Technique
When using Hall-effect technology, a limiting factor for
switchpoint accuracy is the small signal voltage developed across
the Hall element. This voltage is disproportionally small relative to
the offset that can be produced at the output of the Hall sensor IC.
This makes it difficult to process the signal while maintaining an
accurate, reliable output over the specified operating temperature
and voltage ranges.
Chopper stabilization is a unique approach used to minimize
Hall offset on the chip. Allegro employs a technique to remove
key sources of the output drift induced by thermal and mechanical stresses. This offset reduction technique is based on a signal
modulation-demodulation process. The undesired offset signal is
separated from the magnetic field-induced signal in the frequency
domain, through modulation. The subsequent demodulation acts
as a modulation process for the offset, causing the magnetic fieldinduced signal to recover its original spectrum at baseband, while
the DC offset becomes a high-frequency signal. The magnetic-
sourced signal then can pass through a low-pass filter, while the
modulated DC offset is suppressed.
In addition to the removal of the thermal and stress related offset,
this novel technique also reduces the amount of thermal noise
in the Hall sensor IC while completely removing the modulated
residue resulting from the chopper operation. The chopper stabilization technique uses a high-frequency sampling clock. For
demodulation process, a sample-and-hold technique is used. This
high-frequency operation allows a greater sampling rate, which
results in higher accuracy and faster signal-processing capability.
This approach desensitizes the chip to the effects of thermal and
mechanical stresses, and produces devices that have extremely
stable quiescent Hall output voltages and precise recoverability after temperature cycling. This technique is made possible
through the use of a BiCMOS process, which allows the use of
low-offset, low-noise amplifiers in combination with high-density
logic integration and sample-and-hold circuits.
Regulator
Clock/Logic
Hall Element
Amp
Anti-Aliasing
LP Filter
Tuned
Filter
Figure 10: Concept of Chopper Stabilization Technique
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ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
APPLICATION INFORMATION
Thermal Rise vs. Primary Current
Self-heating due to the flow of current should be considered during the design of any current sensing system. The sensor, printed
circuit board (PCB), and contacts to the PCB will generate heat
as current moves through the system.
The thermal response is highly dependent on PCB layout, copper
thickness, cooling techniques, and the profile of the injected current.
The current profile includes peak current, current “on-time”, and
duty cycle. While the data presented in this section was collected
with direct current (DC), these numbers may be used to approximate
thermal response for both AC signals and current pulses.
The plot in Figure 11 shows the measured rise in steady-state die
temperature of the ACS772 versus continuous current at an ambient temperature, TA, of 25°C. The thermal offset curves may be
directly applied to other values of TA. Conversely, Figure 12 shows
the maximum continuous current at a given TA. Surges beyond the
maximum current listed in Figure 12 are allowed given the maximum junction temperature, TJ(MAX) (165℃), is not exceeded.
The thermal capacity of the ACS772 should be verified by the
end user in the application’s specific conditions. The maximum
junction temperature, TJ(MAX) (165℃), should not be exceeded.
Further information on this application testing is available in
the DC and Transient Current Capability application note on the
Allegro website.
ASEK772 Evaluation Board Layout
Thermal data shown in Figure 11 was collected using the
ASEK772 Evaluation Board (TED-85-0385-001). This board
includes 2664 mm2 of 4 oz. copper (0.1388 mm) connected to
pins 4 and 5 with thermal vias connecting the layers. Top and bottom layers of the PCB are shown below in Figure 13.
Figure 11: Self-Heating in the CB Package
Due to Current Flow
Figure 13: Top and Bottom Layers
for ASEK772 Evaluation Board
Gerber files for the ASEK772 evaluation board are available for
download from the Allegro website. See the technical documents
section of the ACS772 device webpage.
Figure 12: Maximum Continuous Current at a Given TA
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41
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
PACKAGE OUTLINE DRAWING
For Reference Only – Not for Tooling Use
(Reference DWG-9111 & DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
14.0 ±0.2
3.5 ±0.2
4.0 ±0.2
3.0 ±0.2
1° ±2°
1.50 ±0.10
5
0.5
R1 = 1.0
R2 = 2.05
R3 = 3.0
4
A
Ø 0.5 B
3
17.5 ±0.2
4
21.4
13.00 ±0.10
Branded
Face
4.40 ±0.10
Ø 0.8
1.9 ±0.2
1
2
Ø 1.5
2.9 ±0.2
0.51 ±0.10
3
0.381
10.00 ±0.10
+0.060
–0.030
1.91
5° ±5°
B
3.5 ±0.2
PCB Layout Reference View
7.00 ±0.10
XXXXXXX
XXX-XXX
XXXXXXX
XXXX
A Dambar removal intrusion
B Perimeter through-holes recommended
C Branding scale and appearance at supplier discretion
1
C
Standard Branding Reference View
Lines 1, 2, 3, 4 = 7 characters.
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
Creepage distance, current terminals to signal pins: 7.25 mm
Clearance distance, current terminals to signal pins: 7.25 mm
Package mass: 4.63 g typical
Figure 14: Package CB, 5-Pin, Leadform PFF
Allegro MicroSystems
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42
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
For Reference Only – Not for Tooling Use
(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
14.0 ±0.2
4.0 ±0.2
3.0 ±0.2
∅ 0.8
5
4
∅ 1.5
1.50 ±0.10
1.91
B
2.75 ±0.10
A
PCB Layout Reference View
23.50 ±0.5
XXXXXXX
XXX-XXX
13.00 ±0.10
4.40 ±0.10
Branded
Face
XXXXXXX
XXXX
1.9 ±0.2
2.9 ±0.2
0.51 ±0.10
1
2
3
0.381
+0.060
–0.030
1
C
Lines 1, 2, 3, 4 = 7 characters.
5º±5°
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
3.5 ±0.2
10.00 ±0.10
7.00 ±0.10
Standard Branding Reference View
A Dambar removal intrusion
B Perimeter through-holes recommended
C Branding scale and appearance at supplier discretion
Figure 15: Package CB, 5-Pin, Leadform PSF
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
43
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
For Reference Only – Not for Tooling Use
(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
14.0 ±0.2
∅ 0.8
4.0 ±0.2
∅ 1.5
3.0 ±0.2
5
4
1.91
1.50 ±0.10
A
B
PCB Layout Reference View
2.75 ±0.10
XXXXXXX
XXX-XXX
23.50 ±0.5
XXXXXXX
XXXX
13.00 ±0.10
4.40 ±0.10
1
Branded
Face
1
2
C
3
Lines 1, 2, 3, 4 = 7 characters.
3.18 ±0.10
1.9 ±0.2
11.0 ±0.05
Standard Branding Reference View
0.51 ±0.10
+0.060
0.381
–0.030
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
10.00 ±0.10
7.00 ±0.10
A Dambar removal intrusion
B Perimeter through-holes recommended
C Branding scale and appearance at supplier discretion
Figure 16: Package CB, 5-Pin, Leadform PSS
Allegro MicroSystems
955 Perimeter Road
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www.allegromicro.com
44
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
For Reference Only – Not for Tooling Use
(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
14.0 ±0.2
4.0 ±0.2
3.0 ±0.2
2.4 ±0.5
5
4
6.01
1.50 ±0.10
2.6 MIN
4.40
60°
9.6 ±0.5
0°-8°
16.0
3.3 ±0.5
A
0.56 REF
to pin tip
13.00 ±0.10
33.27
4.40 ±0.10
Branded
Face
1
2
3
3.7 ±0.5
1.9 ±0.2
9.5 ±0.5
0.50 REF
to pin tip
0.51 ±0.10
45°
137.0°
+0.060
0.381
–0.030
1.27
0°-8°
3.8 ±0.5
5.03
PCB Layout Reference View
10.00 ±0.10
7.00 ±0.10
XXXXXXX
XXX-XXX
XXXXXXX
XXXX
A Dambar removal intrusion
B Branding scale and appearance at supplier discretion
1
B
Standard Branding Reference View
Lines 1, 2, 3, 4 = 7 characters.
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
Figure 17: Package CB, 5-Pin, Leadform SMT
Note: The SMT leadform package variant is considered
Advance Information, and is subject to change without notice.
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
45
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
Revision History
Number
Date
Description
–
December 12, 2017
Initial release
1
January 30, 2018
2
May 14, 2018
3
September 24, 2018
Added -PSF leadform option; updated Magnetic Offset Error value (page 13) and Characteristic
Performance Data charts (pages 26 to 28)
4
November 12, 2018
Added -300B part option (page 2 and 16); added -PSS leadform option (pages 1, 2, and 39) and
Applications Information section (page 36); updated Typical Application (page 1), pinout diagram
(page 4), and TOP to TA (pages 2 and 5-15)
5
December 13, 2018
Added UL certificate; updated package outline drawing PCB layouts and branding (pages 37-39)
Added Dielectric Surge Strength Test Voltage characteristic (page 3) and EEPROM Error Checking
and Correction section (page 16)
Added -050U, -100B, -150U, -200U, -250U, and -250B part options
6
January 7, 2019
Corrected Sensitivity Error values for -200U part option (page 12)
7
January 24, 2019
Added -400B part option (page 2 and 17)
8
March 14, 2019
Updated package branding (pages 38-40) and Temperature ratings (pages 2-3, 6-17)
9
June 27, 2019
Corrected EVB copper thickness (page 37)
10
August 1, 2019
Added -400B Characteristic Performance Data charts (page 28)
11
August 28, 2019
Added Maximum Continuous Current to Absolute Maximum Ratings table (page 3),
ESD ratings table (page 3), and updated thermal data section (page 38)
12
November 6, 2019
Added SMT leadform package variant (pages 1, 3, 43) and Isolation Characteristics Pending
Certification (page 4)
13
December 10, 2019
Added PCB Layout Reference View to SMT leadform package drawings (page 43)
14
December 20, 2019
Removed Advance Information status from SMT leadform package variant (pages 1, 3); updated
Working Voltage for Basic Isolation and Working Voltage for Reinforced Isolation (page 4), Rise Time,
Response Time, Propagation Delay, and Output Slew Rate test conditions, and Output Slew Rate value
(page 6)
15
September 30, 2020
Added -150U-SMT and -400U part option (page 3, 17, 19); updated ESD Ratings Test Conditions (page
4); updated Isolation Characteristics table (page 4); corrected Electrical Offset Error (page 13)
16
January 20, 2021
Added ACS772LCB-050B-PSF-T and -200B-SMT part options to Selection Guide (page 3)
17
September 14, 2021
Corrected Nonlinearity Test Conditions (page 6); added footnote [1] (page 28-30); updated
Nonlinearity Characteristic Definition (page 34-35)
Copyright 2021, Allegro MicroSystems.
Allegro MicroSystems reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit
improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the
information being relied upon is current.
Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of
Allegro’s product can reasonably be expected to cause bodily harm.
The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems assumes no responsibility for its use; nor
for any infringement of patents or other rights of third parties which may result from its use.
Copies of this document are considered uncontrolled documents.
For the latest version of this document, visit our website:
www.allegromicro.com
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
46
Mouser Electronics
Authorized Distributor
Click to View Pricing, Inventory, Delivery & Lifecycle Information:
Allegro MicroSystems:
ACS772ECB-200B-PFF-T ACS772ECB-400B-PFF-T ACS772ECBTV-250B-PFF-T ACS772KCB-150B-PFF-T
ACS772KCB-150B-SMT-T ACS772LCB-050B-PFF-T ACS772LCB-050B-SMT-T ACS772LCB-100B-SMT-T
ACS772LCB-100U-PFF-T ACS773KCB-150B-SMT-T ACS772ECB-250B-PFF-T
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