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APS12450LLHALT-0SLA

APS12450LLHALT-0SLA

  • 厂商:

    ALLEGRO(埃戈罗)

  • 封装:

    SOT23W

  • 描述:

    MAGNETIC SWITCH LATCH SOT23W

  • 数据手册
  • 价格&库存
APS12450LLHALT-0SLA 数据手册
APS12450 2 - Three-Wire Hall-Effect Latch with Advanced Diagnostics FEATURES AND BENEFITS • Functional safety □□ Developed in accordance with ISO 26262:2011 to meet ASIL B requirements (pending assessment) □□ Integrated background diagnostics for: ○○ Signal path ○○ Regulator ○○ Hall plate and bias ○○ Overtemperature detection ○○ Nonvolatile memory □□ Defined fault state • Multiple product options □□ Magnetic polarity, switchpoints, and hysteresis □□ Temperature coefficient □□ Output polarity • Reduces module bill-of-materials (BOM) and assembly cost □□ ASIL B sensor can replace redundant sensors □□ Integrated overvoltage clamp and reverse-battery diode Continued on the next page… PACKAGES 3-pin SOT23-W (LH) DESCRIPTION The APS12450 three-wire planar Hall-effect sensor integrated circuits (ICs) were developed in accordance with ISO 26262:2011 as a hardware safety element out of context with ASIL B capability (pending assessment) for use in automotive safetyrelated systems when integrated and used in the manner prescribed in the applicable safety manual and datasheet. The enhanced three-wire interface provides interconnect open/ short diagnostics and a fault state to communicate diagnostic information while maintaining compatibility with legacy three-wire systems. The continuous background diagnostics are transparent to the host system and results in a reduced fault tolerant time. The APS12450 product options include magnetic switchpoints, temperature coefficient, and output polarity. The response can be matched to SmCo, NdFeB, or low-cost ferrite magnets. For situations where a functionally equivalent three-wire switch device is preferred, refer to the APS11450. Continued on the next page… TYPICAL APPLICATIONS 3-pin ultramini SIP (UA) • • • • • • • Not to scale Automotive and industrial safety systems Seat/window motors Sun roof/convertible top/tailgate/liftgate actuation Brake and clutch by wire actuators Engine management actuators Electric power steering (EPS) Transmission shift actuator VCC REGULATOR DYNAMIC OFFSET CANCELLATION To All Subcircuits Low-Pass Filter HALL AMP. SAMPLE, HOLD & AVERAGING Schmitt Output (Internal) VOUT SYSTEM DIAGNOSTICS OUTPUT CONTROL CLOCK LOGIC GND Functional Block Diagram APS12450-DS, Rev. 1 MCO-0000562 April 23, 2019 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics FEATURES AND BENEFITS (continued) DESCRIPTION (continued) • Automotive-grade ruggedness and fault tolerance □□ Extended AEC-Q100 Grade 0 qualification ○○ Operation to 175°C junction temperature □□ 3 to 30 V operating voltage range □□ ±8 kV HBM ESD □□ Overtemperature indication APS12450 sensors are engineered to operate in the harshest environments with minimal external components. They are qualified beyond the requirements of AEC-Q100 Grade 0 and will survive extended operation at 175°C junction temperature. These monolithic ICs include on-chip reverse-battery protection, overvoltage protection (e.g., 40 V load dump), ESD protection, overtemperature detection, and an internal voltage regulator for operation directly from an automotive battery bus. These integrated features reduce the end-product bill-of-materials (BOM) and assembly cost. Package options include industry-standard surface-mount SOT (LH) and through-hole SIP (UA) packages. Both packages are RoHScompliant and lead (Pb) free with 100% matte-tin-plated leadframes. SELECTION GUIDE [1] Part Number Package Packing APS12450LLHALX-0SLA 3-pin SOT23W surface mount 13-in. reel, 10,000 pieces/reel APS12450LLHALT-0SLA 3-pin SOT23W surface mount 7-in. reel, 3000 pieces/reel APS12450LUAA-0SLA 3-pin SIP through-hole bulk, 500 pieces/bag APS12450LLHALX-1SLA 3-pin SOT23W surface mount 13-in. reel, 10,000 pieces/reel APS12450LLHALT-1SLA 3-pin SOT23W surface mount 7-in. reel, 3000 pieces/reel APS12450LUAA-1SLA 3-pin SIP through-hole bulk, 500 pieces/bag APS12450LLHALX-3SLA 3-pin SOT23W surface mount 13-in. reel, 10,000 pieces/reel APS12450LLHALT-3SLA 3-pin SOT23W surface mount 7-in. reel, 3000 pieces/reel APS12450LUAA-3SLA 3-pin SIP through-hole bulk, 500 pieces/bag [1] Contact Allegro Output Polarity (B > BOP) Temperature Coefficient Magnetic Operate Point, BOP (typ) Low 0%/°C 22 G Low 0%/°C 50 G Low 0%/°C 150 G MicroSystems for options not listed in the selection guide. RoHS COMPLIANT Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 2 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics Complete Part Number Format Allegro Iden�fier (Device Family) APS – Digital Posi�on Sensor Configura�on Op�ons APS12450 L L H A L T - 0 S L C Allegro Device Number 12450 – ASIL B Hall-effect Latch Temperature Coefficient A – Flat B – -0.035 %/°C C – -0.12 %/°C D – -0.2 %/°C Output Polarity for B > BOP H – High (Output Off) L – Low (Output On) Opera�ng Mode S – Unipolar South Sensing N – Unipolar North Sensing Device Switch Threshold Magnitude 0 – 22 G BOP, -22 G BRP (typ.) 1 – 50 G BOP, -50 G BRP (typ.) 3 – 150 G BOP, -150 G BRP (typ.) Instruc�ons (Packing) LT – 7-in. reel, 3,000 pieces/reel (LH Only) LX – 13-in. reel, 10,000 pieces/reel (LH Only) TN – 13-in. reel, 4,000 pieces/reel (UA Only) (no op�on code) – bulk, 500 pieces/bag (UA only) Package Designa�on LHA – 3-pin SOT23W Surface Mount UAA – 3-pin SIP Through-Hole Ambient Opera�ng Temperature Range L – -40°C to +150°C ABSOLUTE MAXIMUM RATINGS Characteristic Supply Symbol Notes Rating Unit Voltage [2] VCC 35 V Reverse Supply Voltage VRCC –30 V Forward Output Voltage VOUT 30 V Reverse Output Voltage VROUT –0.3 V Output Current Sink Maximum Junction Temperature Storage Temperature IOUT(SINK) TJ(MAX) Tstg VCC to VOUT For 500 hours 12 mA 165 °C 175 °C –65 to 170 °C [2] This rating does not apply to extremely short voltage transients such as load dump and/or ESD. Those events have individual ratings specific to the respective transient voltage event. Contact your local field applications engineer for information on EMC test results. Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 3 Three-Wire Hall-Effect Latch with Advanced Diagnostics GND PINOUT DIAGRAMS AND TERMINAL LIST LH Package, 3-Pin SOT23W Pinout 2 3 VOUT 1 GND 2 VCC 1 VOUT 3 VCC APS12450 UA Package, 3-Pin SIP Pinout Terminal List Table Name Pin Number Function LH UA VCC 1 1 Supply voltage VOUT 2 3 Output GND 3 2 Ground Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 4 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics OPERATING CHARACTERISTICS: Valid over full operating voltage and ambient temperature ranges for TJ < TJ(max), unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. [1] Max. Unit SUPPLY AND STARTUP Supply Voltage [2] VCC Supply Current ICC Power-On Time [3] ton Power-On State POS Output Rise Time tRISE Output Fall Time tFALL Output On Voltage VOUT(LOW) Output Off Voltage VOUT(HIGH) Output Off Voltage Overshoot [4] Operating, TJ < 165°C VCC > VCC(min), B < BRP(min) – 10 G, B > BOP(max) + 10 G 3.0 – 30 V – – 4.5 mA – – 150 µs 4 15 µs t < ton(max) VOUT(FAULT) See Applications Circuit, Figure 9; VPU = VCC, RPU = 3 kΩ, COUT = 1 nF, IOUT < 12 mA Output ratiometric to VPU; VPU = VCC, τ < 3 µs [5], IOUT < 12 mA 2 – 2 4 15 µs 10 20 30 % 70 80 90 % VOUT(HIGH)OVER Overshoot percentage relative to VPU (see Figure 8); VPU = VCC, τ < 3 µs [5], IOUT < 12 mA – 2 – % tVOUT(H)OVER Duration of output voltage overshoot (VOUT(HIGH)OVER) – – 5 µs ON-BOARD PROTECTION Fault Reaction Time tDIAG – 25 60 µs Diagnostics Fault Retry Time [6] tDIAGF – 2 – ms VPU – V Fault Mode Output Voltage (Fault State) VOUT(FAULT) Overtemperature Shutdown TSD Overtemperature Hysteresis TJHYS VPU = VCC, τ < 3 µs, IOUT < 12 mA Temperature increasing > VOUT(HIGH) MAX – 205 – °C – 25 – °C [1] Typical data is at TA = 25°C and VCC = 12 V and is for design information only. [2] V CC represents the voltage between the VCC pin and the GND pin. [3] Power-On Time (t ON) is measured from VCC = VCC(min) to 50% of the output transition from VPU to final value. Adding a bypass capacitor will increase Power-On Time. [4] The overshoot specification pertains only to conditions where the overshoot is greater than the V OUT(HIGH)MAX specification. [5] τ is the time constant of the RC circuit; τ = R PU × COUT. [6] The diagnostics fault retry repeats continuously until a fault condition is no longer observed. See Diagnostics Mode Operation section for details. TRANSIENT PROTECTION CHARACTERISTICS: Valid for TA = 25°C and CBYP = 0.1 µF, unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. Max. Unit ICC(max) + 3 mA 35 – – V PROTECTION Forward Supply Zener Clamp Voltage VZ Reverse Supply Zener Clamp Voltage VRCC ICC = –1 mA – – –30 V Reverse Supply Current IRCC VRCC = –30 V – – –5 mA Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 5 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics MAGNETIC CHARACTERISTICS: Valid over full operating voltage and ambient temperature ranges for TJ < TJ(max), unless otherwise specified Characteristics Sensitivity Temperature Coefficient Symbol Test Conditions Relative to sensitivity at 25°C TCSENS Min. Operate Point Release Point Hysteresis BRP BHYS Symmetry BSYM Jitter [3] – Unit [2] – 0 – %/°C (B) SmCo – –0.035 – %/°C (C) NdFeB – –0.12 – %/°C – –0.2 – %/°C – 10 – kHz APS12450–0SxA 5 22 40 G APS12450–1SxA 15 50 90 G f(-3dB) BOP Max. (A) Flat (D) Ferrite Analog Signal Bandwidth Typ. [1] APS12450–3SxA 100 150 180 G APS12450–0SxA –40 –22 –5 G APS12450–1SxA –90 –50 –15 G APS12450–3SxA –180 –150 –100 G APS12450–0SxA 10 45 80 G APS12450–1SxA 30 100 180 G APS12450–3SxA 200 300 360 G BOP + BRP -30 – 30 G – 0.25 – % BOP = 22 G, B = 100 GPK-PK, 1000 Hz Typical data is at TA = 25°C and VCC = 12 V, unless otherwise noted; for design information only. 1 G (gauss) = 0.1 mT (millitesla). [3] Output edge repeatability as a percentage of the period. [1] [2] THERMAL CHARACTERISTICS: May require derating at maximum conditions; see application information Characteristic Package Thermal Resistance Symbol RθJA Test Conditions* Value Unit Package LH, on 1-layer PCB based on JEDEC standard 228 °C/W Package LH, on 2-layer PCB with 0.463 in.2 of copper area each side 110 °C/W Package UA, on 1-layer PCB with copper limited to solder pads 165 °C/W *Additional thermal information available on the Allegro website. Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 6 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics CHARACTERISTIC PERFORMANCE DATA VOUT(HIGH) vs. VCC 90 88 88 86 86 Output Voltage, VOUT(HIGH) (%) Output Voltage, VOUT(HIGH) (%) VOUT(HIGH) vs. TA 90 84 82 80 78 76 V CC (V) 74 3 72 70 -20 10 40 70 100 130 82 80 78 TA (°C) 76 -40 74 25 72 30 -50 84 70 160 150 0 5 10 15 Ambient Temperature, TA (°C) 28 28 26 26 24 22 20 18 16 V CC (V) 14 3 12 -20 10 40 70 100 130 20 18 TA (°C) 16 -40 14 10 160 25 150 0 5 10 100 100 Output Voltage, VOUT(FAULT) (%) Output Voltage, VOUT(FAULT) (%) 102 98 96 94 V CC (V) 3 30 -20 40 70 -40 92 100 130 160 25 150 0 5 10 3.5 Diag Fault Retry Time, tDIAGF (ms) Diag Fault Retry Time, tDIAGF (ms) 3.5 3 2.5 2 1.5 V CC (V) 3 30 -20 10 40 20 25 30 35 tDIAGF vs. VCC 4 -50 15 Supply Voltage, VCC (V) tDIAGF vs. TA 0 35 TA (°C) 94 4 0.5 30 96 Ambient Temperature, TA (°C) 1 25 98 90 10 20 VOUT(FAULT) vs. VCC VOUT(FAULT) vs. TA -50 15 Supply Voltage, VCC (V) 102 90 35 22 Ambient Temperature, TA (°C) 92 30 24 12 30 -50 25 VOUT(LOW) vs. VCC 30 Output Voltage, VOUT(LOW) (%) Output Voltage, VOUT(LOW) (%) VOUT(LOW) vs. TA 30 10 20 Supply Voltage, VCC (V) 70 100 Ambient Temperature, TA (°C) 130 160 3 2.5 2 1.5 TA (°C) 1 -40 25 0.5 0 150 0 5 10 15 20 25 30 35 Supply Voltage, VCC (V) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 7 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics CHARACTERISTIC PERFORMANCE DATA (continued) I CC vs. TA I CC vs. VCC 4.5 4 4 3.5 3.5 Supply Current, I CC (mA) Supply Current, I CC (mA) 4.5 3 2.5 2 V CC (V) 3 1.5 12 1 24 0.5 0 -20 2 TA (°C) 1.5 -40 1 25 0.5 30 -50 3 2.5 10 40 70 100 130 150 0 160 0 5 10 15 Ambient Temperature, TA (°C) 20 25 30 35 Supply Voltage, VCC (V) ton vs. TA tRISE & tFALL vs. TA 150 15 Rise & Fall Time, tRISE & tFALL (µs) 135 Power-on Time, ton (µs) 120 105 90 75 60 45 30 15 0 -50 -20 10 40 70 100 Ambient Temperature, TA (°C) 130 160 12.5 10 7.5 5 2.5 0 Fall Rise -50 -20 10 40 70 100 130 160 Ambient Temperature, TA (°C) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 8 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics CHARACTERISTIC PERFORMANCE DATA APS12450–0SxA BOP(0S_A) vs. VCC 40 35 35 Magnetic Flux Density, BOP (G) Magnetic Flux Density, BOP (G) BOP(0S_A) vs. TA 40 30 25 20 15 V CC (V) 3 10 5 30 -50 -20 10 40 70 100 130 30 25 20 -40 25 10 5 160 TA (°C) 15 150 0 5 10 15 Ambient Temperature, TA (°C) -10 -10 -15 -20 -25 -40 V CC (V) 3 30 -50 -20 10 40 70 100 130 25 150 -20 -25 -30 -35 -40 160 -40 -15 0 5 10 70 70 60 50 40 30 V CC (V) 3 20 30 10 40 70 100 130 -40 25 20 10 160 TA (°C) 30 150 0 5 10 Magnetic Flux Density, BSYM (G) Magnetic Flux Density, BSYM (G) 20 15 10 5 0 -5 -10 V CC (V) -15 3 -20 25 30 35 100 Ambient Temperature, TA (°C) 130 15 10 5 0 -5 TA (°C) -10 -40 -15 25 -20 30 70 20 BSYM(0S_A) vs. VCC 20 40 15 Supply Voltage, VCC (V) 25 10 35 40 BSYM(0S_A) vs. TA -20 30 50 25 -50 25 60 Ambient Temperature, TA (°C) -25 20 BHYS(0S_A) vs. VCC 80 Magnetic Flux Density, BHYS (G) Magnetic Flux Density, BHYS (G) BHYS(0S_A) vs. TA -20 15 Supply Voltage, VCC (V) 80 -50 35 TA (°C) Ambient Temperature, TA (°C) 10 30 BRP(0S_A) vs. VCC -5 Magnetic Flux Density, BRP (G) Magnetic Flux Density, BRP (G) BRP(0S_A) vs. TA -35 25 Supply Voltage, VCC (V) -5 -30 20 160 -25 150 0 5 10 15 20 25 30 35 Supply Voltage, VCC (V) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 9 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics CHARACTERISTIC PERFORMANCE DATA APS12450–1SxA BOP(1S_A) vs. VCC 90 82.5 82.5 75 Magnetic Flux Density, BOP (G) Magnetic Flux Density, BOP (G) BOP(1S_A) vs. TA 90 67.5 60 52.5 45 37.5 V CC (V) 30 3 22.5 15 -20 10 40 70 100 130 60 52.5 45 TA (°C) 37.5 -40 30 25 22.5 30 -50 75 67.5 150 15 160 0 5 10 Ambient Temperature, TA (°C) -22.5 -22.5 -30 -30 -37.5 -45 -52.5 -60 V CC (V) -75 -90 3 -20 -40 25 -37.5 150 -45 -52.5 -60 -67.5 -75 10 40 70 100 130 -90 160 0 5 10 155 155 130 105 80 V CC (V) 55 3 30 10 40 70 100 130 -40 55 30 160 25 150 0 5 10 Magnetic Flux Density, BSYM (G) Magnetic Flux Density, BSYM (G) 20 15 10 5 0 -5 -10 V CC (V) -15 3 -20 25 30 35 100 Ambient Temperature, TA (°C) 130 15 10 5 0 -5 TA (°C) -10 -40 -15 25 -20 30 70 20 BSYM(1S_A) vs. VCC 20 40 15 Supply Voltage, VCC (V) 25 10 35 TA (°C) 80 BSYM(1S_A) vs. TA -20 30 105 25 -50 25 130 Ambient Temperature, TA (°C) -25 20 BHYS(1S_A) vs. VCC 180 Magnetic Flux Density, BHYS (G) Magnetic Flux Density, BHYS (G) BHYS(1S_A) vs. TA -20 15 Supply Voltage, VCC (V) 180 -50 35 TA (°C) Ambient Temperature, TA (°C) 30 30 -82.5 30 -50 25 BRP(1S_A) vs. VCC -15 Magnetic Flux Density, BRP (G) Magnetic Flux Density, BRP (G) BRP(1S_A) vs. TA -82.5 20 Supply Voltage, VCC (V) -15 -67.5 15 160 -25 150 0 5 10 15 20 25 30 35 Supply Voltage, VCC (V) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 10 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics CHARACTERISTIC PERFORMANCE DATA APS12450–3SxA BOP(3S_A) vs. VCC 180 170 170 Magnetic Flux Density, BOP (G) Magnetic Flux Density, BOP (G) BOP(3S_A) vs. TA 180 160 150 140 130 V CC (V) 120 3 110 100 30 -50 -20 10 40 70 100 130 160 150 140 130 TA (°C) 120 -40 100 160 25 110 150 0 5 10 15 Ambient Temperature, TA (°C) -110 -110 -40 -120 25 -120 -130 -140 -150 V CC (V) -160 -180 3 -20 TA (°C) 150 -130 -140 -150 -160 -170 30 -50 10 40 70 100 130 -180 160 0 5 10 Ambient Temperature, TA (°C) BHYS(3S_A) vs. TA 340 Magnetic Flux Density, BHYS (G) 340 320 300 280 260 V CC (V) 240 3 220 30 -20 10 40 70 100 130 260 -40 25 220 200 160 TA (°C) 240 150 0 5 10 Magnetic Flux Density, BSYM (G) 20 15 10 5 0 -5 -10 V CC (V) -15 3 -20 25 30 35 100 Ambient Temperature, TA (°C) 130 15 10 5 0 -5 TA (°C) -10 -40 -15 25 -20 30 70 20 BSYM(3S_A) vs. VCC 20 40 15 Supply Voltage, VCC (V) 25 10 35 280 BSYM(3S_A) vs. TA -20 30 300 25 -50 25 320 Ambient Temperature, TA (°C) -25 20 BHYS(3S_A) vs. VCC 360 -50 15 Supply Voltage, VCC (V) 360 200 35 BRP(3S_A) vs. VCC -100 Magnetic Flux Density, BRP (G) Magnetic Flux Density, BRP (G) 30 -100 -170 Magnetic Flux Density, BHYS (G) 25 Supply Voltage, VCC (V) BRP(3S_A) vs. TA Magnetic Flux Density, BSYM (G) 20 160 -25 150 0 5 10 15 20 25 30 35 Supply Voltage, VCC (V) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 11 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics FUNCTIONAL DESCRIPTION The difference between operate (BOP) and release (BRP) points is the hysteresis (BHYS). Hysteresis allows clean switching of the output even in the presence of external mechanical vibration and electrical noise. The hysteresis is set to double the programmed operating point. Standard Polarity V+ VOUT(HIGH) Figure 1 shows the potential unipolar and omnipolar options and output polarity options of the APS12450 that can be configured. The direction of the applied magnetic field is perpendicular to the branded face of the APS12450 (see Figure 2). V+ Inverted Polarity VOUT(HIGH) Switch to High VOUT Switch to Low Switch to High Note that this device latches; that is, a south pole of sufficient strength towards the branded face of the device turns the device on, and the device remains on with removal of the south pole. Switch to Low The output of these devices switches when a magnetic field perpendicular to the Hall-effect sensor exceeds the operate point threshold (BOP). When the magnetic field is reduced below the release point (BRP), the device output switches to the alternate state. The output state (polarity) and magnetic field polarity depends on the selected device options. The device is a latch, therefore BOP and BRP will be in opposite magnetic field polarities. Figure 1 shows the output switching behavior relative to increasing and decreasing magnetic field. On the horizontal axis, the B+ direction indicates increasing south polarity magnetic field strength. Figure 2 shows the sensing orientation of the magnetic field, relative to the device package. VOUT Operation VOUT(LOW) BOPS B– (north) BHYS 0 BRPS B+ (south) BOPS VOUT(LOW) 0 BRPS B(north) B+ (south) BHYS Figure 1: Hall latch magnetic and output polarity options B- indicates increasing north polarity magnetic field strength, and B+ indicates increasing south polarity magnetic field strength. A Y X Z B Y X Z C Y X Z Figure 2: Magnetic Sensing Orientations APS12450 LH (Panel A), APS12450 UA (Panel B) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 12 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics FUNCTIONAL SAFETY The APS12450 was developed in accordance with ISO 26262:2011 as a hardware safety element out of context with ASIL B capability (pending assessment) for use in automotive safety-related systems when integrated and used in the manner prescribed in the applicable safety manual and datasheet. Diagnostics Mode Operation The APS12450 features a proprietary diagnostics routine that meets ASIL B safety requirements (pending assessment). This internal diagnostics routine continuously runs in the background, monitoring all key subsystems of the IC. These subsystems are shown in Table 1 and Figure 3. The diagnostic scheme runs at high speed and provides minimal impact on device performance. Signal path diagnostics are injected and measured in less than 2 μs, while all other diagnostics are running in real time in the background. The Hall element biasing circuit and voltage regulator are checked for valid operation, and the digital and non‐volatile memory blocks are checked for valid device configuration. The signal path monitoring system verifies two internal state transitions (BOP and BRP within limits) under normal operation. In cases when these output transitions do not occur, or if another internal fault is detected, the output will go to the fault state (see “Three-Wire Diagnostic Output” section). In the event of an internal fault, the device will continuously run the diagnostics routine every 2 ms (tDIAGF). The periodic recovery attempt sequence allows the device to continually check for the presence of a fault and return to normal operation if the fault condition clears. In the case where the fault is no longer present, the output will resume normal operation. However, if the fault is persistent, the device will not exit fault mode and the output voltage will continue to be VOUT(FAULT). When a system rating higher than ASIL B is required, additional external safety measures may be employed (e.g., sensor redundancy and rationality checks, etc.). Refer to the device safety manual for additional details about the diagnostics. Table 1: Diagnostics Coverage Feature Coverage 1 Hall plate Connectivity and biasing of Hall plate 2 Signal path Signal path and Schmitt trigger 3 Voltage regulator Regulator voltage for normal operation 4 Digital subsystem Digital subsystem and non-volatile memory 5 Entire system Overtemperature and redundancies for single point failures 6 Output Output verified through valid regulations states (external monitor) VCC 3 5 REGULATOR DYNAMIC OFFSET CANCELLATION To All Subcircuits 1 Low-Pass Filter 2 HALL AMP. SAMPLE, HOLD & AVERAGING Schmitt Output (Internal) 4 SYSTEM DIAGNOSTICS VOUT 6 OUTPUT CONTROL CLOCK LOGIC GND Figure 3: Diagnostics Coverage Block Diagram Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 13 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics Power-On Behavior Temperature Coefficient and Magnet Selection During Power-on, the output voltage is in the fault state (VOUT(FAULT)), which is the pull-up voltage (VPU), until the device is ready to respond appropriately to the input magnetic field (t > tON). If the device powers-on with the field within the hysteresis band, the output will switch from VOUT(FAULT) to the off state (VOUT(HIGH)) with standard output polarity as shown in Figure 4. For inverted output polarity operation, the output will switch from VOUT(FAULT) to VOUT(LOW) (not shown). The APS12450 allows the user to select the magnetic temperature coefficient to compensate for drifts of SmCo, NdFeB, and ferrite magnets over temperature, as indicated in the Magnetic Characteristics specifications table. This compensation improves the magnetic system performance over the entire temperature range. For example, the magnetic field strength from NdFeB decreases as the temperature increases from 25°C to 150°C. This lower magnetic field strength means that a lower switching threshold is required to maintain switching at the same distance from the magnet to the sensor. Correspondingly, higher switching thresholds are required at cold temperatures, as low as –40°C, due to the higher magnetic field strength from the NdFeB magnet. The APS12450 compensates the switching thresholds over temperature as described above. It is recommended that system designers evaluate their magnetic circuit over the expected operating temperature range to ensure the magnetic switching requirements are met. OUTPUT V POS VOUT(FAULT ) VOUT(HIGH) B < BRP BRP < B < BOP Output Undefined for V CC < VCC(MIN) VOUT(LOW ) B > BOP SUPPLY VOLTAGE t V A sample calculation is provided in the “Applications Information” section. VCC(MIN) 0 tON t Figure 4: Power-On Sequence Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 14 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics Three-Wire Diagnostic Output Three-wire diagnostic output enables the user to identify various fault conditions external to the IC, in addition to the internal fault detection. The output low (VOUT(LOW)) and high (VOUT(HIGH)) states are ratiometric to the pull-up voltage, with low and high states being 20% and 80% respectively. For example, a VCC and VPULL-UP of 5 V, the output state levels will be 1.0 V and 4.0 V ±0.5 V. The output RC time constant (τ) must be less than 3 µs (e.g., RPU = 3 kΩ and COUT = 1 nF), and VPU must be equal to VCC (recommend pulling up VOUT directly to VCC). Under normal operation (Figure 5), the output switches between the VOUT(LOW) (20%) and VOUT(HIGH) (80%) states. VOUT(FAULT ) (VPU ) CBYPASS VOUT(HIGH ) (80%) RPULL-UP VCC VOUT Normal Operation VOUT(LOW) (20%) GND COUT GND Figure 5: The APS12450 diagnostic output under normal operation (no fault detected) With various opens and shorts on any of the IC pins, the output will no longer be controlled by the IC. The output itself may continue to switch, depending on the external connectivity fault; however, the output level(s) observed will deviate from the 20% and 80% (of VPU) output levels. If an internal fault is detected via diagnostics monitoring, the output will be set to the fault state, VOUT(FAULT), which is equal to the pull-up voltage, VPU. +V VPU = VCC VOUT(FAULT ) Fault State VOUT(HIGH) (max) Range for valid VOUT(HIGH) VOUT(HIGH) (min) External Fault VOUT(LOW) (max) Range for valid VOUT(LOW) VOUT(LOW) (min) 0 External Fault 90% VPU 70% VPU 30% VPU 10% VPU Any output voltage levels outside of the valid VOUT(HIGH) and VOUT(LOW) ranges indicates a fault as shown in Figure 6. The observed voltage on VOUT relative to potential fault conditions are summarized in Table 2. The output relative to the fault condition is summarized in Table 2 below. Table 2: Fault Conditions and Resulting Output Level Fault Output Level No Fault 20% or 80% of VPU, respectively Short, VCC-VOUT VCC Short, VOUT-GND GND Short, VCC-GND VPU Open, VCC VPU Open, VOUT VPU Open, GND VPU Internal Fault VPU Note: VOUT(FAULT) ≤ VPULL-UP and VPULL-UP = VCC. Figure 6: APS12450 valid (normal) and fault condition output levels Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 15 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics Fault Detection and Retry DIAG CHECK OUTPUT The fault detection diagnostics runs continuously in the background during normal operation after the device has powered-on. In the event a fault is detected, the output will immediately change to the VOUT(FAULT) state. The diagnostics will continue to retry the diagnostics approximately every 2 ms. If the fault recovers, the output will return to normal operation. See Figure 7. VOUT(FAULT ) VOUT(HIGH) Output switches according to external magne�c field Output switches according to external magne�c field VOUT(LOW ) t Background Diagnos�cs* 2 ms Background Diagnos�cs* 2 ms t Failure Detected Device Recovers Diag Retry** * 4x Diagnos�c Cycles completed every 0.025 ms (nom.) ** Diagnos�c Fault Retry Time interval is 2 ms (nom.) Figure 7: Fault Detection and Retry Output Overshoot When the output switches from VOUT(LOW) to VOUT(HIGH), depending upon the RC circuit, a small overshoot can occur (VOUT(H)OVER). VOUT(H)OVER is specified as a percentage of VPULL-UP (and/or VCC, which need to be the same). Therefore with an RC Time Constant (τ) of 3 µs (see the “Applications Information” section), a nominal overshoot of 2% is possible. With VPULL-UP at 5.0 V, the output may overshoot by 0.1 V, for less than 5 µs (tVOUT(H)OVER). Figure 7 demonstrates output edge profile. For example, with a 5 V pull-up, if VOUT(HIGH) is at the upper limit (90%), VOUT(HIGH) will be 4.5 V. With a τ of 3 µs at room temperature, the output can briefly reach 4.6 V until it settles to 4.5 V. Since VOUT(HIGH) is valid between 70% and 90%, or 3.5 and 4.5 V, this condition is not out of specification. The Output Off Voltage Overshoot specification pertains only to conditions where the overshoot is greater than the VOUT(HIGH)MAX specification. Figure 8: Output Overshoot Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 16 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics APPLICATIONS INFORMATION Typical Applications Temperature Compensation For the LH and UA packages, an external bypass capacitor, CBYP, should be connected (in close proximity to the Hall sensor) between the supply and ground of the device to reduce both external noise and noise generated by the chopper stabilization technique. As is shown in Figure 9, a 0.1 µF bypass capacitor is typical, with an optional output capacitor, COUT (recommended 1 nF). To calculate the typical effect of the TCSENS on BOP (or BRP), simply multiply the BOP at the starting temperature by TCSENS and the change in temperature. The time constant of the RC circuit (τ) on output must be less than 3 µs, where: = 3 kΩ × 1 nF = 3 µs ΔTA = 150°C – 25°C = 125°C BOP(150C) = BOP(25C) + (BOP(25C) × TC × ΔTA ) τ = RPULLUP × COUT Sample BOP calculation for TCSENS compensation from 25°C to 150°C, for TCSENS = –0.12%/°C, and BOP(25C) = 180 G: = 180 G + (180 G × –0.12%/°C × 125°C) = 180 G + (–27 G) = 153 G The resistor, RPULLUP, must be between 2 and 30 kΩ. VPULL-UP VCC Diagnostic Output* RSERIES (optional) VCC RPULL-UP VCC ECU VOUT CBYPASS 0.1 µF ADC VPU VCC CBYP 0.1 µF COUT τRC < 3 µs RPU IOUT < 12 mA τRC < 3 µs 2 kΩ < R < 30 kΩ RS 100 Ω* GPIO GND COUT (optional) IC Output: Diagnostic Output switching between VOUT(LOW) and VOUT(HIGH ) Figure 9: Typical Applications Circuits Diagnostic Output 3 to 30 V * The following application circuit conditions are required • The τ of the RC on output must be < 3 µs. • 2 kΩ < RPU < 30 kΩ. • VPU = VCC (recommend pulling VOUT up to VCC). Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 17 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics Extensive applications information on magnets and Hall-effect sensors is available in: • Hall-Effect IC Applications Guide, AN27701 • Guidelines For Designing Subassemblies Using Hall-Effect Devices, AN27703.1 • Soldering Methods for Allegro’s Products – SMT and ThroughHole, AN26009 • Functional Safety Challenges to the Automotive Supply Chain (https://www.allegromicro.com/en/Design-Center/TechnicalDocuments/General-Semiconductor-Information/FunctionalSafety-Challenges-Automotive-Supply-Chain.aspx) All are provided on the Allegro website: www.allegromicro.com Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 18 Three-Wire Hall-Effect Latch with Advanced Diagnostics Chopper Stabilization Technique A limiting factor for switchpoint accuracy when using Halleffect technology is the small-signal voltage developed across the Hall plate. This voltage is proportionally small relative to the offset that can be produced at the output of the Hall sensor. This makes it difficult to process the signal and maintain an accurate, reliable output over the specified temperature and voltage range. Chopper stabilization is a proven approach used to minimize Hall offset. The technique, dynamic quadrature offset cancellation, removes key sources of the output drift induced by temperature and package stress. This offset reduction technique is based on a signal modulation-demodulation process. “Figure 10: Model of Chopper Stabilization Circuit (Dynamic Offset Cancellation)” illustrates how it is implemented. The undesired offset signal is separated from the magnetically induced signal in the frequency domain through modulation. The subsequent demodulation acts as a modulation process for the offset causing the magnetically induced signal to recover its original spectrum at baseband while the DC offset becomes a highfrequency signal. Then, using a low-pass filter, the signal passes while the modulated DC offset is suppressed. Allegro’s innovative chopper-stabilization technique uses a high-frequency clock. The high-frequency operation allows a greater sampling rate that produces higher accuracy, reduced jitter, and faster signal processing. Additionally, filtering is more effective and results in a lower noise analog signal at the sensor output. Devices such as the APS12450 that use this approach have an extremely stable quiescent Hall output voltage, are immune to thermal stress, and have precise recoverability after temperature cycling. This technique is made possible through the use of a BiCMOS process which allows the use of low offset and low noise amplifiers in combination with high-density logic and sample-and-hold circuits. Regulator Clock/Logic Hall Element Amp Sample and Hold APS12450 Low-Pass Filter Figure 10: Model of Chopper Stabilization Circuit (Dynamic Offset Cancellation) Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 19 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics POWER DERATING The device must be operated below the maximum junction temperature, TJ (max). Reliable operation may require derating supplied power and/or improving the heat dissipation properties of the application. Thermal Resistance (junction to ambient), RθJA, is a figure of merit summarizing the ability of the application and the device to dissipate heat from the junction (die), through all paths to ambient air. RθJA is dominated by the Effective Thermal Conductivity, K, of the printed circuit board which includes adjacent devices and board layout. Thermal resistance from the die junction to case, RθJC, is a relatively small component of RθJA. Ambient air temperature, TA, and air motion are significant external factors in determining a reliable thermal operating point. The following three equations can be used to determine operation points for given power and thermal conditions. Finally, using equation 1, solve for maximum allowable VCC for the given conditions: VCC (est) = PD (max) ÷ ICC (max) = 91 mW ÷ 4 mA = 22.8 V The result indicates that, at TA, the application and device can dissipate adequate amounts of heat at voltages ≤ VCC (est). If the application requires VCC > VCC(est) then RθJA must by improved. This can be accomplished by adjusting the layout, PCB materials, or by controlling the ambient temperature. Determining Maximum TA In cases where the VCC (max) level is known, and the system designer would like to determine the maximum allowable ambient temperature TA (max), for example, in a worst-case scenario with conditions VCC (max) = 40 V, ICC (max) = 4 mA, and RθJA = 228°C/W for the LH package using equation 1, the largest possible amount of dissipated power is: PD = VIN × IIN (1) ∆T = PD × RθJA (2) PD = VIN × IIN TJ = TA + ∆T (3) PD = 40 V × 4 mA = 160 mW For example, given common conditions: TA = 25°C, VCC = 12 V, ICC = 4 mA, and RθJA = 110°C/W for the LH package, then: PD = VCC × ICC = 12 V × 4 mA = 48 mW ∆T = PD × RθJA = 48 mW × 110°C/W = 5.28°C TJ = TA + ∆T = 25°C + 5.28°C = 31.28°C Determining Maximum VCC For a given ambient temperature, TA, the maximum allowable power dissipation as a function of VCC can be calculated. PD (max) represents the maximum allowable power level without exceeding TJ (max) at a selected RθJA and TA. Then, by rearranging equation 3 and substituting with equation 2: TA (max) = TJ (max) – ΔT TA (max) = 165°C – (160 mW × 228°C/W) TA (max) = 165°C – 36.5°C = 128.5°C In another example, the maximum supply voltage is equal to VCC (min). Therefore, VCC (max) = 3 V and ICC (max) = 4 mA. By using equation 1 the largest possible amount of dissipated power is: PD = VIN × IIN PD = 3 V × 4 mA = 12 mW Example: VCC at TA = 150°C, package UA, using low-K PCB. Using the worst-case ratings for the device, specifically: RθJA = 165°C/W, TJ (max) = 165°C, VCC (max) = 24 V, and ICC (max) = 4 mA, calculate the maximum allowable power level, PD (max). First, using equation 3: Then, by rearranging equation 3 and substituting with equation 2: ∆T (max) = TJ (max) – TA = 165°C – 150°C = 15°C TA (max) = 165°C – 11.6°C = 162.3°C This provides the allowable increase to TJ resulting from internal power dissipation. Then, from equation 2: PD (max) = ∆T (max) ÷ RθJA = 15°C ÷ 165°C/W = 91 mW TA (max) = TJ (max) – ΔT TA (max) = 165°C – (12 mW × 228°C/W) The example above indicates that at VCC = 3 V and ICC = 4 mA, the TA (max) can be as high as 162.3°C without exceeding TJ (max). However the TA (max) rating of the device is 150°C; the device performance is not guaranteed above TA = 150°C. Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 20 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics Package LH, 3-Pin SOT23W +0.125 2.975 –0.75 1.49 D 4°±4° 3 A +0.020 0.180–0.053 0.96 D +0.10 2.90 –0.20 +0.19 1.91 –0.06 2.40 0.70 D 0.25 MIN 1.00 2 1 0.55 REF 0.25 BSC 0.95 Seating Plane Gauge Plane 8× 10° ±5° B PCB Layout Reference View Branded Face 1.00 ±0.13 0.95 BSC +0.10 0.05 –0.05 0.40 ±0.10 XXX 1 C Standard Branding Reference View Line 1 = Three digit assigned brand number For reference only; not for tooling use (reference DWG-0000628, Rev. 1). Dimensions in millimeters. Dimensions exclusive of mold flash, gate burrs, and dambar protrusions. Exact case and lead configuration at supplier discretion within limits shown. A Active Area Depth, 0.28 ±0.04 mm B Reference land pattern layout All pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary to meet application process requirements and PCB layout tolerances C Branding scale and appearance at supplier discretion D Hall element, not to scale Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 21 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics Package UA, 3-Pin SIP, Matrix HD Style +0.08 4.09 –0.05 45° B C E +0.08 3.02 –0.05 2.04 NOM 1.52 ±0.05 1.44 NOM E 10° Mold Ejector Pin Indent E Branded Face A 1.02 MAX 45° XXX 0.79 REF 1 D Standard Branding Reference View 1 2 Line 1: Logo A Line 2: Three digit assigned brand number 3 +0.03 0.41 –0.06 14.99 ±0.25 +0.05 0.43 –0.07 For reference only; not for tooling use (reference DWG-0000404, Rev. 1). Dimensions in millimeters. Dimensions exclusive of mold flash, gate burrs, and dambar protrusions. Exact case and lead configuration at supplier discretion within limits shown. A Dambar removal protrusion (6×) B Gate and tie bar burr area C Active Area Depth, 0.50 ±0.08 mm D Branding scale and appearance at supplier discretion E Hall element (not to scale) 1.27 NOM Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 22 APS12450 Three-Wire Hall-Effect Latch with Advanced Diagnostics REVISION HISTORY Number Date Description – January 31, 2019 Initial release 1 April 23, 2019 Updated ASIL status Copyright 2019, Allegro MicroSystems. Allegro MicroSystems reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the information being relied upon is current. Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of Allegro’s product can reasonably be expected to cause bodily harm. The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems assumes no responsibility for its use; nor for any infringement of patents or other rights of third parties which may result from its use. Copies of this document are considered uncontrolled documents. For the latest version of this document, visit our website: www.allegromicro.com Allegro MicroSystems 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 23
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