AS4C8M16MSA-6BIN
Revision History
128M (8M x 16) /RZ3RZHU6'5$0 AS4C801606$ 54ball FBGA PACKAGE
Revision Details
Date
Rev 1.0
Preliminary datasheet
Dec. 2017
Alliance Memory Inc. 511 Taylor Way, San Carlos, CA 94070 TEL: (650) 610-6800 FAX: (650) 620-9211
Alliance Memory Inc. reserves the right to change products or specification without notice
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128M(8Mx16) Low Power SDRAM
Features
- Functionality
- Standard SDRAM Functionality
- Programmable burst lengths : 1, 2, 4, 8 or full page
- 64ms refresh period (4K cycle)
- JEDEC Compatibility
- Low Power Features
- Auto TCSR(Temperature Compensated Self Refresh)
- Partial Array Self Refresh power-saving mode
- Deep Power Down Mode
- Driver Strength Control
- Operating Temperature Ranges:
- Industrial (-40℃ to +85℃)
- LVCMOS Compatible IO Interface
- 54ball FBGA with 0.8mm ball pitch
- AS4C8M16MSA : Pb-Free & Halogen Free
Functional Description
The AS4C8M16MSA Family is high-performance CMOS
Dynamic RAMs (DRAM) organized as 8M x 16. These
devices feature advanced circuit design to provide low active
current and extremely low standby current.
T he d evi c e i s c om pat i bl e wi t h t h e J E DE C s t a n da rd
LP-SDRAM specifications.
Table I.Ordering Information
Product part No
Org
AS4C8M16MSA-6BIN
8M x 16
Temperature
Max Clock (MHz)
Package
166
54-ball FBGA
Industrial -40°C to 85°C
Table II.Key Specifications
tCK(3)
tAC(3)
tRAS
tRC
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AS4C8M16MSA-6BIN
Clock Cycle time(min.)
Access time from CLK (max.)
Row Active time(min.)
Row Cycle time(min.)
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-6
6ns
5.5ns
48 ns
60ns
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AS4C8M16MSA-6BIN
Logic Block Diagram
CKE
CLK
/CS
/WE
/CAS
/RAS
Control
Logic
Refresh
Counter
Bank 0
Row
Address
Latch/
Decoder
Row
Address
Mux
Mode
Register
Extended
Mode
Register
Bank 3
Bank 2
Bank 1
Bank 0
Memory
Array
LDQM UDQM
Data
Output
Register
8Kx4K
Sense Amp
Bank
Control
Logic
A0-A11
BA0-BA1
Write Drivers
DQM Mask
DQ0 DQ15
Address
Register
Column
Decoder
Data
Input
Register
Column
Address
Latch
Pin Configuration
54 ball 0.8mm pitch FBGA (8mm x 8mm)
Top View
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1
2
3
A
VSS
DQ15
VSSQ
B
DQ14
DQ13
C
DQ12
D
4
5
7
8
9
VDDQ
DQ0
VDD
VDDQ
VSSQ
DQ2
DQ1
DQ11
VSSQ
VDDQ
DQ4
DQ3
DQ10
DQ9
VDDQ
VSSQ
DQ6
DQ5
E
DQ8
NC
VSS
VDD
LDQM
DQ7
F
UDQM
CLK
CKE
/CAS
/RAS
/WE
G
NC
A11
A9
BA0
BA1
/CS
H
A8
A7
A6
A0
A1
A10
J
VSS
A5
A4
A3
A2
VDD
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Pin Description
Symbol
Type
CLK
Input
Clock : CLK is driven by the system clock. All SDRAM input signals are sampled on the positive
edge of CLK. CLK also increments the internal burst counter and controls the output registers.
CKE
Input
Clock Enable: CKE activates(HIGH) and deactivates(LOW) the CLK signal. Deactivating the
clock provides PRECHARGE POWER-DOWN and SELF Refresh operation(all banks idle),
ACTIVE POWER-DOWN(row active in any bank) or CLOCK SUSPEND operation(burst/access
in progress). CKE is synchronous except after the device enters power-down and self refresh
modes, where CKE becomes asynchronous until after exiting the same mode. The input buffers,
including CLK, are disabled during power-down and self refresh modes, providing low standby
power. CKE may be tied HIGH.
/CS
Input
Chip Select: /CS enables (registered LOW) and disables (registered HIGH) the command
decoder. All commands are masked when /CS is registered HIGH. /CS provides for external
bank selection on systems with multiple banks. /CS is considered part of the command code.
/CAS, /RAS, /WE
Input
Command Inputs : /CAS, /RAS, and /WE (along with /CS) define the command being entered.
LDQM, UDQM
Input
Input/Output Mask: L(U)DQM is sampled HIGH and is an input mask signal for write accesses
and an output disable signal for read accesses. Input data is masked during a WRITE cycle. The
output buffers are placed in a High-Z state (two-clock latency) when during a READ cycle.
LDQM corresponds to DQ0 – DQ7 and UDQM corresponds to DQ8–DQ15.
BA0, BA1
Input
Bank Address Input(s): BA0 and BA1 define to which bank the ACTIVE, READ, WRITE or
PRECHARGE command is being applied. These pins also provide the op-code during a LOAD
MODE REGISTER command.
A0-A11
Input
Address Inputs: A0–A11 are sampled during the ACTIVE command (row- address A0–A11)
and READ/WRITE command (column-address A0–A8; with A10 defining auto precharge) to
select one location out of the memory array in the respective bank. A10 is sampled during a
PRECHARGE command to determine if all banks are to be precharged (A10 HIGH) or bank
selected by BA0, BA1 (A10 LOW). The address inputs also provide the op-code during a LOAD
MODE REGISTER command.
DQ
I/O
NC
-
VDDQ
Supply
DQ Power: Provide isolated power to DQs for improved noise immunity.
VSSQ
Supply
DQ Ground: Provide isolated ground to DQs for improved noise immunity.
VDD
Supply
Power Supply: Voltage dependant on option.
VSS
Supply
Ground.
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Description
Data Input/Output : Data bus
No Connect
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FUNCTIONAL DESCRIPTION
Initialization
The Alliance Memory 128Mb SDRAM is a quad-bank
DRAM that operates at 1.8V and includes a
synchronous interface (all signals are registered on the
positive edge of the clock signal, CLK ).
Read and write accesses to the SDRAM are burst oriented;
accesses start at a selected location and continue for
a programmed number of locations in a programmed sequence.
Accesses begin with the registration of an ACTIVE command,
which is then followed by a READ or WRITE command.
The address bits registered coincident with the ACTIVE
command are used to select the bank and row to be
accessed (BA0 and BA1 select the bank, A0-A11 select the
row). The address bits (A0-A8) registered coincident with the
READ or WRITE command are used to select the starting
column location for the burst access. The SDRAM must be initialized prior to normal operation. The following sections provide detailed information regarding device initialization,
register definition, command descriptions and device operation.
SDRAMs must be powered up and initialized in a predefined
manner. Operational procedures other than those specified
may result in undefined operation. Once power is applied to
VDD and VDDQ(simultaneously) and the clock is stable (meets
the clock specifications in the AC characteristics), the SDRAM
requires a 200µs delay prior to issuing any command other than
a COMMAND INHIBIT or NOP. The COMMAND INHIBIT or
NOP should be applied at least once during the 200µs delay.
After the 200µs delay, a PRECHARGE command should be
applied. All banks must then be precharged, thereby placing the
device in the all banks idle state. Once in the idle state, two
AUTO REFRESH cycles must be performed. After the AUTO
REFRESH cycles are complete, the SDRAM is ready for mode
register programming. Because the mode register will power up
in an unknown state, it should be loaded prior to applying any
operational command. Refer Figure 1.
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Figure 1. Initialize and Load Mode Register[1.2.3.]
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLK
CKE
/CS
/RAS
/CAS
Key
ADDR
Key
RA
BA0
BA
BA1
BA
A10/AP
RA
HiZ
DQ
HiZ
/WE
DQM
tRP
Precharge
(All Bank)
tRFC
Auto
Refresh
tRFC
Auto
Refresh
Normal
MRS
Extended
MRS
Row Active
a Bank
Note :
1. The two AUTO REFRESH commands at T4 and T9 may be applied before either LOAD MODE REGISTER (LMR) command.
2. PRE = PRECHARGE command, LMR = LOAD MODE REGISTER command, AR = AUTO REFRESH command, ACT = ACTIVE command, RA = Row Address, BA = Bank
Address
3. The Load Mode Register for both MR/EMR and 2 Auto Refresh commands can be in any order; However, all must occur prior to an Active command.
Register Definition
There are two mode registers which contain settings to achieve
low power consumption. The two registers : Mode Register and
Extended Mode Register are discussed below.
Mode Register
The mode register is used to define the specific mode of
operation of the SDRAM. This definition includes the selection of
a burst length, a burst type, a CAS latency, an operating mode
and a write burst mode, as shown in Table 1. The mode register
is programmed via the LOAD MODE REGIS- TER command
and will retain the stored information until it is programmed again
or the device loses power. Mode Register bits M0-M2 specify the
burst length, M3 specifies the type of
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burst (sequential or interleaved), M4-M6 specify the CAS
latency, M7 and M8 specify the operating mode, M9 specifies
the width burst mode, M10, M11, M12, M13 and M14 should be
set to zero. The mode register must be loaded when all banks
are idle, and the controller must wait the specified time before
initiating the subsequent operation. Violating either of these
requirements will result in unspecified operation.
Burst Length
Read and write accesses to the SDRAM are burst oriented. The
burst length is programmable, as shown in Table 2. The burst
length determines the maximum number of column locations
that can be accessed for a given READ or WRITE command.
Burst lengths of 1,2, 4, or 8 locations are available for both the
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sequential and the interleaved burst types, and a full-page burst
is available for the sequential type. The full-page burst is used
in conjunction with the BURST TERMINATE command to generate arbitrary burst lengths. Reserved states should not be used,
as unknown operation or incompatibility with future versions
may result. When a READ or WRITE command is issued, a
block of columns equal to the burst length is effectively selected.
All accesses for that burst take place within this block, meaning
that the burst will wrap within the block if a boundary is reached.
The block is uniquely selected by A1-A8 when the burst
length is set to two; by A2-A8 when the burst length is set to
four; and by A3-A8 when the burst length is set to eight.
The remaining(least significant) address bit(s) is (are) used
to select the starting location within the block. Full-page
bursts wrap within the page if the boundary is reached.
Burst Type
The burst type can be set to either Sequential or Interleaved
by using the M3 bit in the Mode register. The ordering of
accesses within a burst is determined by the burst length, the
burst type and the starting column address, as shown in
Table 2. [4.5.6.7.8.9.10.]
Table 1. Mode Register Definition.
M13BA1
M12BA0
M11A11
M10A10
M9-A9
Reserved(Set to ‘0’)
WB
M8-A8
M7-A7
M6-A6
Op Mode
M5-A5
M4-A4
CAS Latency
BT
Burst Length
M3
M2 M1 M0
M3=0
M3=1
000
1
1
001
2
2
010
4
4
011
8
8
100
Reserved
Reserved
101
Reserved
Reserved
110
Reserved
Reserved
111
Full Page
Reserved
M3-A3
M2-A2
M1-A1
M0-A0
Burst Length
Burst Type
0
Sequential
1
Interleaved
M9
Write Burst Mode
0
Prog. Burst Length
1
Single Mode Access
M6 M5 M4
CAS Latency
M8
M7
M6-M0
Operating Mode
000
Reserved
0
0
Defined
Standard Operation
001
1
-
-
-
All other states reserved
010
2
011
3
100
Reserved
101
Reserved
110
Reserved
111
Reserved
Note :
4. For full-page accesses: y = 512
5. For a burst length of two, A1-A8 select the block-of-two burst; A0 selects the starting column within the block.
6. For a burst length of four, A2-A8 select the block-of-four burst; A0-A1 select the starting column within the block.
7. For a burst length of eight, A3-A8 select the block-of-eight burst; A0-A2 select the starting column within the block.
8. For a full-page burst, the full row is selected and A0-A8 select the starting column.
9. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block.
10. For a burst length of one, A0-A8 select the unique column to be accessed, and mode register bit M3 is ignored.
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Table 2. Burst Length Definition.
Order of Accesses within a Burst
Burst Length
Starting Column Address
Type=Sequential
Type=Interleaved
0
0-1
0-1
1
1-0
1-0
00
0-1-2-3
0-1-2-3
01
1-2-3-0
1-0-3-2
10
2-3-0-1
2-3-0-1
11
3-0-1-2
3-2-1-0
000
0-1-2-3-4-5-6-7
0-1-2-3-4-5-6-7
001
1-2-3-4-5-6-7-0
1-0-3-2-5-4-7-6
010
2-3-4-5-6-7-0-1
2-3-0-1-6-7-4-5
011
3-4-5-6-7-0-1-2
3-2-1-0-7-6-5-4
100
4-5-6-7-0-1-2-3
4-5-6-7-0-1-2-3
101
5-6-7-0-1-2-3-4
5-4-7-6-1-0-3-2
110
6-7-0-1-2-3-4-5
6-7-4-5-2-3-0-1
111
7-0-1-2-3-4-5-6
7-6-5-4-3-2-1-0
n=A0-A8(location 0-y)
Bn, Bn+1, Bn+2…..Bn,…
Not supported
A0
2
A1 A0
4
A2 A1 A0
8
Full Page(y)
Operating Mode
The normal operating mode is selected by setting M7 and M8
to zero; the other combinations of values for M7 and M8 are
reserved for future use and/or test modes.Test modes
and reserved states should not be used because unknown
operation or incompatibility with future versions may result.
CAS Latency
The CAS latency is the delay, in clock cycles, between the
registration of a READ command and the availability of the
first piece of output data. The latency can be set to one, two,
or three clocks. If a READ command is registered at clock edge
r, and the latency is q clocks, the data will be available by clock
edge r + q. The DQs will start driving as a result of the clock
edge one cycle earlier (r + q- 1), and provided that the relevant
access times are met, the data will be valid by clock edge
r + q.
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For exam ple, assuming that the clock cycle time is
such that all relevant access times are met, if a READ
command is registered at T0 and the latency is programmed
to two clocks, the DQs will start driving after T1 and the data
will be valid by T2, as shown in Figure 2.
Table 3 indicates the operating frequencies at which each CAS
latency setting can be used. Reserved states should not be
used as unknown operation or incompatibility with future
versions may result.
Write Burst Mode
When M9=0, the burst length programmed via M0-M2 applies to
both READ and WRITE bursts; when M9=1, the programmed
burst length applies to READ bursts, but write accesses are
single-location (non-burst) accesses.
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T0
T1
T2
CLK
Command
Read
NOP
tLZ
tOH
DQ
Dout
tAC
CAS Latency=1
T0
T1
T2
T3
Read
NOP
NOP
CLK
Command
tLZ
tOH
Dout
DQ
tAC
CAS Latency=2
T0
T1
T2
T3
T4
CLK
Command
Read
NOP
NOP
NOP
tLZ
tOH
DQ
Dout
tAC
CAS Latency=3
Figure 2. CAS Latency
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Table 3. CAS Latency.
Allowable Operating Frequency (MHz)
Speed
CAS Latency = 1
CAS Latency = 2
CAS Latency = 3
166MHz
50
83
166
100MHz
40
83
100
EXTENDED MODE REGISTER
The Extended Mode Register controls additional functions such
as Partial Array Self Refresh (PASR) and Driver Strength (DS).
The Extended Mode Register is programmed via the Mode
Register Set command (BA1=1, BA0=0) and retains the stored
information until it is programmed again or the device loses
power. The Extended Mode Register must be programmed with
M7 through M12 set to “0”. The Extended Mode Register must
be loaded when all banks are idle and no bursts are in progress,
and the controller must wait the specified time initiating any
subsequent operation. Violating either of these requirements
results in unspecified operation.
PARTIAL ARRAY SELF REFRESH
The Partial Array Self Refresh (PASR) feature allows the controller to select the amount of memory that will be refreshed
during SELF REFRESH. WRITE and READ commands
occur to any bank selected during standard operation,
but only the selected banks in PASR will be refreshed
during SELF REFRESH. The data in the deselected bank will
be lost.
Driver Strength Control
AUTO TEMPERATURE COMPENSATED SELF REFRESH
The driver strength feature allows one to reduce the
drive strength of the I/O’s on the device during low frequency
operation. This allows systems to reduce the noise associated
with the I/O’s switching.
Every cell in the DRAM requires refreshing due to the capacitor
losing its charge over time. The refresh rate is dependent on
temperature. At higher temperatures a capacitor loses charge
quicker than at lower temperatures, requiring the cells to be
refreshed more often. In order to save power consumption,
according to the temperature, Mobile-SDRAM includes the
internal temperature sensor and control units to control the self
refresh cycle automatically.
Table 4. Extended Mode Register Definition
EM13BA1
EM12BA0
1
0
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EM11A11
EM10A10
EM9A9
All must be set to ‘0’
EM8A8
EM7A7
EM6A6
EM5A5
Driver Strength
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EM4A4
EM3A3
0
0
EM2A2
EM1A1
EM0A0
PASR
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Table 5. Extended Mode Register Table[11.12.].
A2
A1
A0
Self Refresh Coverage
A7
A6
A5
Driver Strength
0
0
0
All Banks
0
0
0
100%
0
0
1
Half of Total Bank(BA1=0)
0
0
1
50%
0
1
0
Quarter of Total Bank(BA1=BA0=0)
0
1
0
25%
0
1
1
RFU
0
1
1
12.5%
1
0
0
RFU
1
0
0
75%
1
One Eighth of Total Bank
(BA1=BA0=Row Address MSB=0 )
1
0
1
Reserved
1
1
0
Reserved
1
1
1
Reserved
1
0
1
1
0
One Sixteenth of Total Bank
(BA1=BA0=Row Address MSB=0)
1
1
1
RFU
Note :
11.
12.
EM14 and EM13 (BA1 and BA0) must be “1, 0” to select the Extended Mode Register(vs. the base Mode Register).
RFU: Reserved for Future Use
Table 6. Commands[13.14.15.16.17.18.19.20.] .
CKE
/CS
/RAS
/CAS
/WE
DQM
ADDR
DQ
COMMAND INHIBIT(NOP)
X
H
X
X
X
X
X
X
NO OPERATION(NOP)
H
L
H
H
H
X
X
X
X
Name(Function)
ACTIVE(Select bank and activate row)[14]
H
L
L
H
H
X
Bank/
Row
READ(Select bank and column, and start READ burst)[15]
H
L
H
L
H
L/H[20]
Bank/
Col
X
WRITE(Select bank and column, and start WRITE burst)[15]
H
L
H
L
L
L/H[20]
Bank/
Col
Valid
BURST TERMINATE
H
L
H
H
L
X
X
Active
H
L
L
H
L
X
Code
X
H
L
L
L
H
X
X
X
PRECHARGE(Deactivate row in bank or
banks)[16]
AUTO REFRESH or SELF REFRESH(Enter Self Refresh
LOAD MODE
REGISTER[19]
Mode)[17. 18]
H
L
L
L
L
X
Opcode
X
Write Enable/Output Enable[20]
H
-
-
-
-
L
-
Active
Write Inhibit/Output High-Z[20]
H
-
-
-
-
H
Deep Power Down(Enter DPD Mode)
L
L
H
H
L
X
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High Z
X
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Note :
13. CKE is HIGH for all commands shown except SELF REFRESH and Deep Power Down.
14. A0-A11 provide row address, and BA0, BA1 determine which bank is made active.
15. A0-A8 provide column address; A10 HIGH enables the auto precharge feature (nonpersistent), while A10 LOW disables the auto precharge feature; BA0, BA1 determine which
bank is being read from or written to.
16. A10 LOW: BA0, BA1 determine the bank being precharged. A10 HIGH: All banks precharged and BA0, BA1 are “Don’t Care.”
17. Internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care” except for CKE.
18. This command is AUTO REFRESH if CKE is HIGH, SELF REFRESH if CKE is LOW.
19. A0-A9 define the op-code written to the mode register and BA0, BA1 determine Normal MRS and Extended MRS.
20. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay). LDQM controls DQ0-7 and UDQM controls DQ8-15.
Commands
Table 6. provides a reference of all the commands available
with the state of the control signals for executing a specific
command.
COMMAND INHIBIT
The COMMAND INHIBIT function effectively deselects the
SDRAM by preventing new commands from being executed by
the SDRAM, regardless of whether the CLK signal is enabled.
Operations already in progress are not affected.
NO OPERATION (NOP)
The NO OPERATION (NOP) command is used to perform a
NOP to an SDRAM which is selected (/CS is LOW). This prevents unwanted commands from being registered during idle
or wait states. Operations already in progress are not affected.
LOAD MODE REGISTER
The mode register is loaded via inputs A0-A11, BA0, BA1.
The LOAD MODE REGISTER and LOAD EXTENDED
MODE REGISTER commands can only be issued when all
banks are idle, and a subsequent executable command cannot
be issued until tMRD is met. Table 1, Table 4 And Table 5
provide the definition for the Mode Register and Extended
Mode Register.
ACTIVE
The ACTIVE command is used to activate a row in a particular
bank for a subsequent access. The value on the BA0, BA1
inputs selects the bank, and the address provided on inputs
A0-A11 selects the row. This row remains active for accesses
until a PRECHARGE command is issued to that bank. A
PRECHARGE command must be issued before opening a
different row in the same bank.
READ
READ command is used to initiate a burst read access to an
active row. The value on the BA0, BA1 inputs selects the bank,
and the address provided on inputs A0-A8 selects the starting
column location. The value on input A10 determines whether or
not auto precharge is used. If auto precharge is selected, the
row being accessed will be precharged at the end of the READ
burst. If auto precharge is not selected, the row will remain
open for subsequent accesses. Read data appears on the DQs
subject to the logic level on the DQM inputs two clocks earlier. If
a given DQM signal was registered HIGH, the corresponding
DQs will be High-Z two clocks later; if the DQM signal was
registered LOW, the DQs will provide valid data.
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WRITE
The WRITE command is used to initiate a burst write access
to an active row. The value on the BA0, BA1 inputs selects the
bank, and the address provided on inputs A0-A8 selects the
starting column location. The value on input A10 determines
whether or not auto precharge is used. If auto precharge is
selected, the row being accessed will be precharged at the end
of the WRITE burst. If auto precharge is not selected, the row
will remain open for subsequent accesses. Input data appearing
on the DQs is written to the memory array subject to the DQM
input logic level appearing coincident with the data. If a given
DQM signal is registered LOW, the corresponding data will be
written to memory; if the DQM signal is registered HIGH, the
corresponding data inputs will be ignored, and a WRITE will not
be executed to that byte/column location.
PRECHARGE
The PRECHARGE command is used to deactivate the active
row in a particular bank or the active row in all banks. The
bank(s) will be available for a subsequent row access after a
specified time (tRP) from the issued PRECHARGE command.
Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs BA0, BA1 select the bank. Otherwise BA0,
BA1 are treated as “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to
any READ or WRITE commands being issued to that bank.
AUTO PRECHARGE
AUTO PRECHARGE is accomplished by using A10 to enable
auto precharge in conjunction with a specific READ or WRITE
command. AUTO PRECHARGE thus performs the same
PRECHARGE command described above , without requiring an
explicit command. A PRECHARGE of the bank/row that is
addressed with the READ or WRITE command is automatically
performed upon completion of the READ or WRITE burst.
AUTO PRECHARGE does not apply in the full page mode burst.
Auto precharge is nonpersistent in that it is either enabled or
disabled for each individual READ or WRITE command.
Auto precharge ensures that the precharge is initiated at the
earliest valid stage within a burst. The user must not issue
another command to the same bank until the precharge time
(tRP) is completed.
BURST TERMINATE
The BURST TERMINATE command is used to truncate either
fixed-length or full-page bursts. The most recently registered
READ or WRITE command prior to the BURST TERMINATE
command will be truncated.
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AUTO REFRESH
AUTO REFRESH is used during normal operation of the
SDRAM. This command is nonpersistent, so it must be issued
each time a refresh is required. All active banks must be
PRECHARGED prior to issuing an AUTO REFRESH command.
The AUTO REFRESH command should not be issued until the
minimum tRP has been met after the PRECHARGE command.
The addressing is generated by the internal refresh controller.
The address bits thus are a “Don’t Care” during an AUTO
REFRESH command. The Alliance Memory 128Mb SDRAM
requires 4,096 AUTO REFRESH cycles every 64ms (tREF),
regardless of width option. Providing a distributed AUTO
REFRESH command every 15.625µs will meet the refresh
requirement and ensure that each row is refreshed.
Alternatively, 4,096 AUTO REFRESH commands can be issued
in a burst at the minimum cycle rate (tRFC*2), once every 64ms.
DEEP POWER DOWN
Deep Power Down Mode is an operating mode to achieve extreme
power reduction by cutting the power of the whole memory array of
the device. Data will not be retained once the device enters DPD
Mode. Full initialization is required when the device exits from DPD
Mode. [Figure 29.30]
SELF REFRESH
The SELF REFRESH command can be used to retain data in
the SDRAM( without external clocking), even if the rest of the
system is powered down. The SELF REFRESH command is
initiated like an AUTO REFRESH command except CKE is
disabled (LOW). Once the SELF REFRESH command is registered, all the inputs to the SDRAM become “Don’t Care” with
the exception of CKE, which must remain LOW. Once self
refresh mode is engaged, the SDRAM provides its own internal
clocking, causing it to perform its own AUTO REFRESH cycles.
The SDRAM must remain in self refresh mode for a minimum
period equal to tRAS and may remain in self refresh mode for
an indefinite period beyond that.The procedure for exiting self
refresh requires a sequence of commands. First, CLK must be
stable (meet the clock specifications in the AC characteristics)
prior to CKE going back HIGH. Once CKE is HIGH, the SDRAM
must have NOP commands issued (a minimum of two clocks)
for tXSR because time is required for the completion of any
internal refresh in progress. Upon exiting the self refresh mode,
AUTO REFRESH commands must be issued every 15.625µs or
less as both SELF REFRESH and AUTO REFRESH utilize he
row refresh counter.
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Maximum Ratings
Voltage on VDD/VDDQ Supply
Relative to VSS …….…….………………………...-0.5V to + 3.6V
Voltage on Inputs, NC or I/O Pins
Relative to VSS …….…….…………………….…. –0.5V to +3.6V
Storage Temperature(plastic) ………….………. -55℃ to + 150℃
Power Dissipation ………………………….….………………1W
*Stresses greater than those listed under “Maximum Ratings”
may cause permanent damage to the device.This is a stress
rating only, and functional operation of the device at these or
any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.
Operating Range
Device
AS4C8M16MSA
Range
Ambient Temperature
VDD
VDDQ
Industrial
-40℃ to +85℃
1.7V to 1.95V
1.7V to VDD
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS [21.22.]
Parameter / Condition
Symbol
Min
Max
Units
Supply Voltage
VDD
1.7
1.95
V
I/O Supply Voltage
VDDQ
1.7
VDD
V
VIH
0.8* VDDQ
VDDQ +0.3
V
VIL
-0.3
0.2*VDDQ
V
Data Output High Voltage : Logic 1 : All Inputs(-0.1mA)
VOH
0.9* VDDQ
Data Output Low Voltage : Logic 0 : All Inputs(0.1mA)
VOL
Input High Voltage : Logic 1 All Inputs
Input Low Voltage : Logic 0 All Inputs
[23.]
[23.]
V
0.1*VDDQ
V
Input Leakage Current :
Any Input 0V=VIN=VDD (All other pins not under test=0V)
II
-5
5
㎂
Output Leakage Current : DQs are disabled ; 0V= VOUT=VDDQ
lOZ
-5
5
㎂
Table 7. AC OPERATING CONDITIONS[21.22.23.24.25.26.]
Parameter / Condition
Symbol
Value
Units
Input High Voltage : Logic 1 All Inputs
VIH
0.8* VDDQ
V
Input Low Voltage : Logic 0 All Inputs
VIL
0.2* VDDQ
V
0.5*VDDQ
V
Input and Output Measurement Reference Level
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Table 8. IDD Specifications and Conditions [21.22.26.27.].
Parameter
-6
Units
Operating Current: Active Mode; Burst =2 ; Read or Write ; t RC tRC(min);
CAS Latency =3 [28.29.30.]
50
㎃
IDD2P
Precharge Standby Current in power down mode : CKE VIL(max)
0.2
㎃
IDD2N
Precharge Standby Current in non power down mode : CKE VIH(min),
/CS VIH(min) [28.29.30,31.]
15
㎃
IDD3P
Active Standby Current in power down mode; CKE VIL(max) [28.29,30.31.]
2
㎃
IDD3N
Active Standby Current in non power down mode (One Bank Active);
CKE VIH(min), /CS VIH(min) [28.29,30.31.]
20
㎃
IDD4
Operating Current: Burst Mode: Continuous Burst ; Read or Write : All banks
Active, CAS Latency =3[28.29.30.]
75
㎃
IDD5
Auto Refresh Current : tRFC tRFC(138ns)
100
㎃
Self Refresh Current : CKE 0.2V, 4 Banks, tCLK= ∞, 85°C
250
㎂
Self Refresh Current : CKE 0.2V, 2 Banks , tCLK= ∞, 85°C
200
㎂
Self Refresh Current : CKE 0.2V, 1 Banks, tCLK= ∞, 85°C
180
㎂
Deep power down, tCLK= ∞
10
㎂
IDD1
IDD6
IDD7
Description
Note :
21. The minimum specifications are used only to indicate cycle time at which proper operation over the full temperature range (-40°C ≤ TA ≤ +85°C for IT parts) is ensured.
22. An initial pause of 200µs is required after power-up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (VDD and VDDQ must be
powered up simultaneously. VSS and VSSQ must be at same potential.) The two AUTO REFRESH command wake-ups should be repeated any time the t REF refresh
requirement is exceeded.
23. All states and sequences not shown are illegal or reserved.
24. In addition to meeting the transition rate specification, the clock and CKE must transit between V IH and VIL (or between VIL and VIH) in a monotonic manner.
25. tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to V OH or VOL. The last valid data element will meet t OH before going High-Z.
26. AC timing and IDD tests have VIL and VIH, with timing referenced to VIH/2 = crossover point. If the input transition time is longer than t T (MAX), then the timing is referenced
at VIL (MAX) and VIH (MIN) and no longer at the VIH/2 crossover point.
27. IDD specifications are tested after the device is properly initialized.
28. IDD is dependent on output loading and cycle rates. Specified values are obtained with minimum cycle time and the outputs open.
29. The IDD current will increase or decrease proportionally according to the amount of frequency alteration for the test condition.
30. Input signals are changed one time during 20ns.
31. Unless otherwise note, input swing level is CMOS(VIH/VIL=VDDQ/VSSQ).
32. CKE is HIGH during refresh command period t RFC (MIN) else CKE is LOW. The IDD 6 limit is actually a nominal value and does not result in a fail value
Capacitance[]
Parameter
Description
CIN
Input Capacitance
COUT
Output Capacitance
AC Test Loads
Test Conditions
TA=25℃, f=1Mhz, VDD(typ)
Max
Units
4
pF
6
pF
VDDQ/2
50W
Z0=50W
OUTPUT
30pF
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AC Characteristics
AC Characteristics
Symbol
Parameter
tCLKS3
Clock Period[33.]
-6
Min
Max
6.0
Units
ns
tCLKS2
12
Clock High Time
tCH
2.5
ns
Clock Low Time
tCL
2.5
ns
Address Setup Time to Clock
tCAS
2.0
ns
Address Hold Time to Clock
tCAH
1.0
ns
CKE Setup Time to Clock
tCKS
2.0
ns
CKE Hold Time to Clock
tCKH
1.0
ns
Clock Access Time
[34, 35]
CL=3
tAC(3)
5.5
ns
CL=2
CL=1
tAC(2)
6
ns
tAC(1)
22
ns
Output Hold Time from Clock
tOH
2.5
ns
Data In Setup Time to Clock
tCDS
2.0
ns
Data In Hold Time to Clock
tCDH
1.0
ns
/CS, /RAS, /CAS, /WE, /DQM Setup Time to Clock
tCMS
2.0
ns
/CS, /RAS, /CAS, /WE, /DQM Hold Time to Clock
tCMH
1.0
ns
Data High Impedance
6
ns
100000
ns
Time[25.]
tHZ
Active to Precharge Command
tRAS
48
Active to Active Command Period
tRC
60
Active to Read/Write Delay
tRCD
18
Refresh Period(4096 rows)
tREF
Auto Refresh Period
tRFC
80
ns
Precharge Command Period
tRP
18
ns
Active Bank ‘a’ to Active Bank ’b’ Command
tRRD
12
ns
Transition Time
[36.]
Write Recovery Time[37.]
Exit Self Refresh to Active Command
[38.]
ns
ns
64
tT
0.5
tWR
15
1.2
ms
ns
ns
tXSR
80
ns
READ/WRITE command to READ/WRITE command[39.]
tCCD
1
tCLK
CKE to clock disable or power-down entry mode[40.]
tCKED
1
tCLK
CKE to clock enable or power-down exit setup mode
[40.]
DQM to input data delay[39.]
DQM to data mask during WRITEs
[39.]
DQM to data high-impedance during READs[39.]
WRITE command to input data delay
Data-in to ACTIVE command
[39.]
[41.]
Data-in to PRECHARGE command[42.]
Last data-in to burst STOP command
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[39.]
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tPED
1
tCLK
tDQD
0
tCLK
tDQM
0
tCLK
tDQZ
2
tCLK
tDWD
0
tCLK
tDAL
5
tCLK
tDPL
2
tCLK
tBDL
1
tCLK
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AC Characteristics
AC Characteristics
Symbol
Parameter
-6
Min
Max
Units
Last data-in to new READ/WRITE command[40.]
tCDL
1
tCLK
Last data-in to PRECHARGE command[43.]
tRDL
2
tCLK
command[44.]
tMRD
2
tCLK
CL=3
tROH(3)
3
tCLK
CL=2
tROH(2)
2
tCLK
CL=1
tROH(1)
1
tCLK
LOAD MODE REGISTER command to ACTIVE or REFRESH
Data-out to high-impedance from PRECHARGE
command[40.]
Note :
33. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) during access or precharge states
(READ, WRITE, including tWR, and PRECHARGE commands). CKE may be used to reduce the data rate.
34. tAC for -166Mhz at CL=3 with no load is 5ns and is guaranteed by design.
35. tAC for -166Mhz at CL=3 and VDD of 1.8V is 5.5ns.
36. AC characteristics assume tT = 1ns.
37. Auto precharge mode only. The precharge timing budget (tRP) begins at 3ns for -166Mhz after the first clock delay, after the last WRITE is executed. May not exceed limit
set for precharge mode.
38. CLK must be toggled a minimum of two times during this period.
39. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter.
40. Timing actually specified by tCKS; clock(s) specified as a reference only at minimum cycle rate.
41. Timing actually specified by tWR plus tRP; clock(s) specified as a reference only at minimum cycle rate.
42. Timing actually specified by tWR.
43. JEDEC and PC100 specify three clocks.
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Operation
Figure 3. The starting column and bank addresses are provided
with the READ command, and auto precharge is either enabled
or disabled for that burst access. For the generic READ commands used in the following illustrations, auto precharge is disabled. During READ bursts, the valid data-out element from the
starting column address will be available following the CAS
latency after the READ command. Each subsequent data-out
element will be valid by the next positive clock edge. Figure 2.
shows general timing for each possible CAS latency setting.
Upon completion of a burst, assuming no other commands
have been initiated, the DQs will go High-Z. A full-page burst
will continue until terminated. (The burst will wrap around at the
end of the page). A continuous flow of data can be maintained
by having additional Read Burst or single Read Command. The
first data element from the new burst follows either the last
element of a completed burst or the last desired data element of
a longer burst that is being truncated.
The new READ command should be issued x cycles before the
clock edge at which the last desired data element is valid,
where x equals the CAS latency minus one.
This is shown in Figure 4. for CAS latencies of one, two and
three; data element n + 3 is either the last of a burst of four or
the last desired of a longer burst. Full-speed random read
accesses can be performed to the same bank, as shown in
Figure 5. , or each subsequent READ may be performed to a
different bank.
BANK / ROW ACTIVATION
Before any READ or WRITE commands can be issued to a
bank within the SDRAM, a row in that bank must be “opened”
(activated). This is accomplished via the ACTIVE command,
which selects both the bank and the row to be activated. A
READ or WRITE command may then be issued to that row,
subject to the tRCD specification. tRCD (MIN) should be divided
by the clock period and rounded up to the next whole number to
determine the earliest clock edge after the ACTIVE command
on which a READ or WRITE command can be entered. For
example, a t RCD specification of 18ns with a 166MHz clock
(6ns period) results in 3 clocks. (The same procedure is used to
convert other specification limits from time units to clock cycles.)
A subsequent ACTIVE command to a different row in the same
bank can only be issued after the previous active row has been
“closed” (precharged). The minimum time interval between
successive ACTIVE commands to the same bank is defined by
tRC. A subsequent ACTIVE command to another bank can be
issued while the first bank is being accessed, which results in a
reduction of total row-access overhead. The minimum time
interval between successive ACTIVE commands to different
banks is defined by tRRD.
READs
READ bursts are initiated with a READ command, as shown in
Read Command
CLK
CKE
High
/CS
/RAS
/CAS
/WE
A0-A8
Column
Address
A9, A11
Enable Auto Precharge
A10
Disable Auto Precharge
BA0, 1
Bank
Address
Don’t Care
Figure 3. Read Command
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T0
T1
T2
Read
NOP
NOP
T3
T4
T5
Read
NOP
CLK
Command
NOP
X=0cycles
Bank
Col n
Address
Bank
Col b
Dout
n
DQ
Dout
n+1
Dout
n+2
Dout
n+3
Dout
b
CAS Latency=1
T0
T1
T2
T3
CLK
T5
T6
X=1cycles
Command
Read
Address
Bank
Col n
NOP
NOP
NOP
Read
NOP
NOP
Bank
Col b
Dout
n
DQ
T4
Dout
n+1
Dout
n+2
Dout
n+3
Dout
b
CAS Latency=2
Figure 4. Consecutive Burst Reads -Transition from Burst of 4 Read to a Single read for CAS Latency 1,2,3
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T0
T1
T2
Read
NOP
T3
T4
T5
T6
T7
CLK
Command
NOP
NOP
Read
NOP
NOP
NOP
X=2cycles
Bank
Col n
Address
Bank
Col b
Dout
n
DQ
Dout
n+1
Dout
n+2
Dout
n+3
Dout
b
CAS Latency=3
Figure 4. Consecutive Burst Reads -Transition from Burst of 4 Read to a Single read for CAS Latency 1,2,3
T0
T1
T2
T3
Command
Read
Read
Read
Read
Address
Bank
Col n
Bank
Col a
Bank
Col x
Bank
Col m
T4
CLK
DQ
Dout
n
Dout
a
Dout
x
NOP
Dout
m
CAS Latency=1
Figure 5. Random Read Accesses for CAS Latency =1,2,3
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T0
T1
T2
T3
Command
Read
Read
Read
Read
Address
Bank
Col n
Bank
Col a
Bank
Col x
Bank
Col m
T4
T5
CLK
Dout
n
DQ
NOP
Dout
a
NOP
Dout
x
Dout
m
CAS Latency=2
T0
T1
T2
T3
Command
Read
Read
Read
Read
Address
Bank
Col n
Bank
Col a
Bank
Col x
Bank
Col m
T4
T5
T6
CLK
Dout
n
DQ
NOP
Dout
a
NOP
Dout
x
NOP
Dout
m
CAS Latency=3
Figure 5. Random Read Accesses for CAS Latency =1,2,3
A Read Burst can be terminated by a subsequent Write command, and data from a fixed length READ burst may be
immediately followed by data from a WRITE command (subject
to bus turnaround limitations). The WRITE burst may be
initiated on the clock edge immediately following the last (or last
desired) data element from the READ burst, provided that I/O
contention can be avoided. In a given system design, there may
be a possibility that the device driving the input data will go
Low-Z before the SDRAM DQs go High-Z. In this case, at least
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a single-cycle delay should occur between the last read data
and the WRITE command. The DQM input is used to avoid I/O
contention, as shown in Figure 6. and Figure 7. . The DQM
signal must be asserted (HIGH) at least two clocks prior to the
WRITE command (DQM latency is two clocks for output buffers)
to suppress data-out from the READ. Once the WRITE command is registered, the DQs will go High-Z (or remain High-Z),
regardless of the state of the DQM signal, provided the DQM
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was active on the clock just prior to the WRITE command that
truncated the READ command. The DQM signal must be asserted prior to the WRITE command (DQM latency is zero
clocks for input buffers) to ensure that the written data is not
masked. Figure 6. shows the case where the clock frequency
T0
T1
allows for bus contention to be avoided without adding a NOP
cycle, and Figure 7. shows the case with the additional NOP
cycle.
T2
T3
T4
CLK
DQM
tCLK
Command
Read
Address
Bank
Col n
NOP
NOP
NOP
Write
Bank
Col b
tHZ
Dout
n
DQ
CAS Latency=3
Din
b
tDS
Figure 6. Read to Write
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T0
T2
T1
T3
T4
T5
CLK
DQM
tCLK
Command
Read
Address
Bank
Col n
NOP
NOP
NOP
NOP
Write
Bank
Col b
tHZ
Dout
n
DQ
Din
b
CAS Latency=3
tDS
Figure 7. Read to Write with extra clock cycle
T0
T1
T2
T3
T4
T5
T6
T7
T8
CLK
CMD
Read
Write
Read masked by write
DQM
Din
n
DQ
CMD
Din
n+1
Read
Din
n+2
Write
Din
n+3
Read masked by DQM
DQM
Din
n
DQ
CMD
Read
Din
n+2
Din
n+3
Din
n+1
Din
n+2
Write
Read CAS=2
DQM
DQ
Din
n+1
Dout
n
Din
n
Din
n+3
Figure 8. Read Interrupted by Write with DQM ; CAS Latency =2
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A fixed-length READ burst or a full-page burst may be followed by, or truncated with, a PRECHARGE command to the
same bank. The PRECHARGE command should be issued x
cycles before the clock edge at which the last desired data
element is valid, where x equals the CAS latency minus one. This
is shown in Figure 9. for each possible CAS latency; data element
n + 3 is either the last of a burst of four or the last desired of a
longer burst. Following the PRECHARGE command,
T0
T2
T1
a subsequent command to the same bank cannot be issued
until tRP is met. Note that part of the row precharge time is
hidden during the access of the last data element(s). The
BURST TERMINATE command should be issued x cycles
before the clock edge at which the last desired data element is
valid, where x equals the CAS latency minus one. This is
shown in Figure 10. for each possible CAS latency; data
element n + 3 is the last desired data element of a longer burst.
T3
T4
T5
CLK
Command
T6
T7
tRP
Read
NOP
NOP
NOP
Precharge
NOP
NOP
Active
X=0cycles
Address
Bank a
Col n
Bank
(a or all)
Dout
n
DQ
Dout
n+1
Dout
n+2
Dout
n+3
T3
T4
Bank a
Row
CAS Latency=1
T0
T2
T1
T5
CLK
Command
T6
T7
tRP
Read
NOP
NOP
NOP
Precharge
NOP
NOP
Active
X=1cycles
Address
Bank a
Col n
Bank
(a or all)
Dout
n
DQ
Dout
n+1
Dout
n+2
Bank a
Row
Dout
n+3
CAS Latency=2
Figure 9. Read to Precharge
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T0
T1
T2
T3
T4
T5
CLK
Command
T6
T7
tRP
Read
NOP
NOP
NOP
Precharge
NOP
NOP
Active
X=2cycles
Address
Bank a
Col n
Bank
(a or all)
Dout
n
DQ
Dout
n+1
Bank a
Row
Dout
n+2
Dout
n+3
T5
T6
CAS Latency=3
Figure 9. Read to Precharge
T0
T1
Read
NOP
T2
T3
T4
T7
CLK
Command
NOP
NOP
Burst
Terminate
NOP
NOP
NOP
X=0cycles
Address
DQ
Bank a
Col n
Dout
n
Dout
n+1
Dout
n+2
Dout
n+3
CAS Latency=1
Figure 10. Terminating a Read Burst
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T0
T1
Read
NOP
T2
T3
T4
T5
T6
T7
CLK
Command
NOP
NOP
Burst
Terminate
NOP
NOP
NOP
X=1cycles
Address
Bank a
Col n
Dout
n
DQ
Dout
n+1
Dout
n+2
Dout
n+3
T3
T4
T5
CAS Latency=2
T0
T1
Read
NOP
T2
T6
T7
CLK
Command
NOP
NOP
Burst
Terminate
NOP
NOP
NOP
X=2cycles
Address
DQ
Bank a
Col n
Dout
n
Dout
n+1
Dout
n+2
Dout
n+3
CAS Latency=3
Figure 10. Terminating a Read Burst
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0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
HIGH
*note 45.
tRC
/CS
tRP
tRCD
/RAS
*note 46.
/CAS
ADDR
RAa
CAa
RAb
CAb
BA0
BA1
A10/AP
RAa
RAb
tOH
CL=2
Qa0
Qa1
Qa2
Qa3
Qb0
Qb1
Qb2
Qb3
tRAC
tAC
*note 47.
DQ
tHZ
*note 48.
tWR
tOH
Qa0
CL=3
Qa1
Qa2
Qa3
Qb0
Qb1
Qb2
Qb3
tRAC
*note 47.
tAC
tHZ
*note 48.
tWR
/WE
DQM
Row Active
(A-Bank)
Read
(A-Bank)
Precharge
(A-Bank)
Row Active
(A-Bank)
Write
(A-Bank)
Precharge
(A-Bank)
Don’t Care
Note :
45. Minimum row cycle times is required to complete internal DRAM operation.
46. Row precharge can interrupt burst on any cycle.[CAS Latency -1] number of valid output data is available after Row precharge. Last valid output will be Hi-Z(t SHZ) after
the clock.
47. Access time from Row active command. t CLK *(tRCD + CAS latency - 1) + tAC
48. Out put will be Hi-Z after the end of burst. (1,2,3,8 & Full page bit burst)
Figure 11. Read & Write Cycle at Same Bank @Burst Length=4
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0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
HIGH
*note 45.
tRC
/CS
tRCD
tRP
/RAS
*note 46.
/CAS
ADDR
RAa
CAa
RAb
CAb
BA0
BA1
A10/AP
RAa
RAb
tOH
CL=2
Qa0
Qa1
Qa2
Qa3
Qb0
Qb1
Qb2
Qb3
tRAC
tAC
*note 47.
DQ
tHZ
*note 48.
tWR
tOH
Qa0
CL=3
Qa1
Qa2
Qa3
Qb0
Qb1
Qb2
Qb3
tRAC
*note 47.
tAC
tHZ
*note 48.
tWR
/WE
DQM
Row Active
(A-Bank)
Read
(A-Bank)
Precharge
(A-Bank)
Row Active
(A-Bank)
Write
(A-Bank)
Don’t Care
Figure 12. Read & Write Cycle at Same Bank @Burst Length=4
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0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
CLOCK
CKE
HIGH
/CS
/RAS
*note 49.
/CAS
ADDR
RAa
RBb CAa
RCc CBb
RDd CCc
RAa
RBb
RCc
RDd
CDd
BA0
BA1
A10/AP
CL=2
QAa0 QAa1
QAa2 QBb0
QBb1 QBb2
QCc0 QCc1
QCc2 QDd0 QDd1 QDd2
DQ
CL=3
QAa0 QAa1
QAa2 QBb0
QBb1 QBb2
QCc0 QCc1
QCc2 QDd0 QDd1 QDd2
/WE
DQM
Row Active
(A-Bank)
Read
(A-Bank)
Row Active
(B-Bank)
Read
(B-Bank)
Read
(C-Bank)
Read
(D-Bank)
Precharge
(D-Bank)
Precharge
(C-Bank)
Row Active
(C-Bank)
Precharge
(A-Bank)
Precharge
(B-Bank)
Don’t Care
Note :
49. Row precharge will interrupt writing. Last data input, t WR before Row precharge, will be written.
Figure 13. Page Read Cycle at Same Bank @ Burst Length=4
WRITE
WRITE bursts are initiated with a WRITE command,as shown
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in Figure 14. The starting column and bank addresses are
provided with the WRITE command, and auto precharge is
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either enabled or disabled for that access. If auto precharge is
enabled, the row being accessed is precharged at the completion of the burst. During WRITE bursts, the first valid data-in
element will be registered coincident with the WRITE command.
Subsequent data elements will be registered on each
successive positive clock edge. Upon completion of a fixedlength burst, assuming no other commands have been initiated,
the DQs will remain High-Z and any additional input data will be
ignored (see Figure 15.). A full-page burst will continue until
terminated. (wrap around at the end of the page) An example is
shown in Figure 16. . Data n + 1 is either the last of a burst of
two or the last desired of a longer burst.
A WRITE command can be initiated on any clock cycle following a previous WRITE command. Full-speed random write
accesses within a page can be performed to the same bank,
as shown in Figure 17. , or each subsequent WRITE may be
performed to a different bank.
Write Command
CLK
CKE
High
/CS
/RAS
/CAS
/WE
A0-A8
Column
Address
A9, A11
Enable Auto Precharge
A10
Disable Auto Precharge
BA0, 1
Bank
Address
Don’t Care
Figure 14. Write Command
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T0
T1
T2
Command
Write
NOP
NOP
Address
Bank
Col n
T3
CLK
Din
n
DQ
NOP
Din
n+1
Figure 15. Write Burst - Burst length of 2
T0
T1
T2
Command
Write
NOP
Write
Address
Bank
Col n
CLK
DQ
Bank
Col b
Din
n
Din
n+1
Din
b
Figure 16. Write to Write - Transition from a burst of 2 to a single write
Data for a fixed-length WRITE burst a full-page WRITE burst
may be followed by, or truncated with, a PRECHARGE command to the same bank.The PRECHARGE command should
be issued tWR after the clock edge at which the last desired
input data element is registered. The auto precharge mode
requires a tWR. In addition, when truncating a WRITE burst, the
DQM signal must be used to mask input data for the clock edge
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prior to, and the clock edge coincident with, the PRECHARGE
command. An example is shown in Figure 19.
Data n + 1 is either the last of a burst of two or the last desired
of a longer burst. Following the PRECHARGE command, a
subsequent command to the same bank cannot be issued until
tRP is met.
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T0
T1
T2
T3
Command
Write
Write
Write
Write
Address
Bank
Col n
Bank
Col a
Bank
Col x
Bank
Col m
Din
n
Din
a
Din
x
Din
m
CLK
DQ
Figure 17. Random Write Cycles
T0
T1
T2
NOP
Read
T3
T4
T5
CLK
Command
Write
Address
Bank
Col n
DQ
Din
n
NOP
NOP
NOP
Bank
Col b
Din
n+1
Dout
b
Dout
b+1
Figure 18. Write to Read Burst of 2 Write and Read(CAS Latency =2)
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T0
CLK
T2
T1
T3
T4
T5
Active
NOP
NOP
NOP
Active
T6
tWR @ tCLK >=15ns
DQM
tRP
Command
Write
Address
Bank
Col n
NOP
Precharge
NOP
Bank
(a or all)
Bank a
Row
tWR
DQ
DQM
Din
n+1
Din
n
tWR @ tCLK =tCKS
tCKS
CKE
NOP
Command
All banks Idle
NOP
tRCD
tRAS
tRC
Input buffers gated off
Enter Power Down Mode
Active
Exit Power Down Mode
Figure 22. Power Down
CLOCK SUSPEND
The clock suspend mode occurs when a column access/
burst is in progress and CKE is registered LOW. In the clock
suspend mode, the internal clock is deactivated, “freezing”
the synchronous logic. For each positive clock edge on which
CKE is sampled LOW, the next internal positive clock edge is
suspended. Any command or data present on the input pins
at the time of a suspended internal clock edge is ignored; any
data present on the DQ pins remains driven; and burstcounters are not incremented, as long as the clock is suspended. (See examples in Figure 23. and Figure 24. .) Clock
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suspend mode is exited by registering CKE HIGH; the internal
clock and related operation will resume on the subsequent
positive clock edge.
BURST READ/SINGLE WRITE
In this mode, all WRITE commands result in the access of a
single column location (burst of one), regardless of the programmed burst length. The burst read/single write mode is entered
by programming the write burst mode bit (M9) in the mode
register to a logic 1. READ commands access columns
according to the programmed burst length and sequence.
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T0
T1
T2
T3
T4
T5
CLK
CKE
Internal
CLK
Command
NOP
Write
Address
Bank
Col n
DQ
Din
n
NOP
NOP
Din
n+1
Din
n+2
Figure 23. Clock Suspend During Write Burst
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T0
T1
T2
T3
T4
T5
T6
CLK
CKE
Internal
CLK
Command
Read
Address
Bank
Col n
NOP
NOP
NOP
Dout
n
DQ
Dout
n+1
NOP
Dout
n+2
NOP
Dout
n+3
Figure 24. Clock Suspend During Read Burst - Burst of 4 (CAS latency =2)
Concurrent Auto Precharge
If an access command with Auto Precharge is being executed ;
an access command (either a Read or Write ) is not allowed by
SDRAM’s. If this feature is allowed then the SDRAM supports
Concurrent Auto Precharge.
Alliance Memory SDRAMs support Concurrent Auto Precharge.
Four cases where Concurrent Auto Precharge occurs are defined below.
Read With Auto Precharge
1. Interrupted by a Read(with or without auto precharge): A
read to bank m will interrupt a Read on bank n, CAS latency
later. The precharge to bank n will begin when the Read to
bank m is registered. (Figure 25. )
2. Interrupted by a Write(with or without auto precharge): A
Write to bank m will interrupt a Read on bank n when registered.
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DQM should be used two clocks prior to the Write command to
prevent bus contention. The Precharge to bank n will begin
when the write to bank m is registered. (Figure 26. )
Write with Auto Precharge
3. Interrupted by a Read(with or without auto precharge): A
Read to bank m will interrupt a Write on bank n when registered , with the data-out appearing CAS latency later. The Precharge to bank n will begin after tWR is met, where tWR begins
when the Read to bank m is registered. The last valid Write to
bank n will be data-in registered one clock prior to the Read to
bank m.(Figure 27. )
4. Interrupted by a Write ( with or without auto Precharge): A
Write to bank m will interrupt a Write on bank n when registered.
The Precharge to bank n will begin after tWR is met ,where tWR
begins when the Write to bank m is registered. The latest valid
data Write to bank n will be data registered one clock prior to a
Write to bank m.( Figure 28. )
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T0
T1
T2
Read-AP
Bank n
NOP
T3
T4
T5
T6
NOP
NOP
NOP
T7
CLK
Command
NOP
Read-AP
Bank m
Internal States
NOP
tRP - Bank m
tRP - Bank n
Bank n
Page
Active
Bank m
Page Active
Read with a Burst of 4
Idle
Read with Burst of 4
Bank n
Col a
Address
Interrupt Burst, Precharge
Precharge
Bank m
Col d
Dout
a
DQ
Dout
a+1
Dout
d
Dout
d+1
CAS Latency=3(Bank n)
CAS Latency=3(Bank m)
Figure 25. Read with Auto Precharge Interrupted by a Read(CAS Latency =3)
T0
T1
T2
Read-AP
Bank n
NOP
NOP
T3
T4
T5
T6
T7
CLK
Command
NOP
Write-AP
Bank m
NOP
NOP
tRP - Bank n
Internal States
Bank n
Page
Active
Bank m
Page Active
Address
NOP
Read with a Burst of 4
tWR - Bank m
Interrupt Burst, Precharge
Idle
Write with Burst of 4
Write-Bank m
Bank m
Col d
Bank n
Col a
DQM
Dout
a
DQ
Din
d
Din
d+1
Din
d+2
Din
d+3
CAS Latency=3(Bank n)
Figure 26. Read With Auto Precharge Interrupted by a Write(Read CAS Latency =3)
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T0
T1
T2
Write-AP
Bank n
NOP
T3
T4
T5
T6
NOP
NOP
NOP
T7
CLK
Command
NOP
Internal States
Bank n
Read-AP
Bank m
NOP
tRP - Bank m
tWR- Bank n
Page
Active
Write with a Burst of 4
Interrupt Burst, Write-Bank
Precharge
tRP - Bank n
Bank m
Page Active
Read with Burst of 4
Bank n
Col a
Address
Din
a
DQ
Precharge
Bank m
Col d
Din
a+1
Dout
d
Dout
d+1
CAS Latency=3(Bank m)
Figure 27. Write with Auto Precharge Interrupted by a Read(CAS Latency =3)
T0
T1
T2
Write-AP
Bank n
NOP
T3
T4
T5
T6
NOP
NOP
T7
CLK
Command
NOP
NOP
Internal States
Bank n
Write-AP
Bank m
tWR -Bank n
Page
Active
Write with a Burst of 4
NOP
tRP -Bank n
Interrupt Burst, Write-Bank
Precharge
tWR - Bank m
Bank m
Address
DQ
Page Active
Write with Burst of 4
Bank n
Col a
Din
a
Write-Bank m
Bank m
Col d
Din
a+1
Din
a+2
Din
d
Din
d+1
Din
d+2
Din
d+2
Figure 28. Write with Auto Precharge Interrupted by a Write
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DEEP POWER DOWN MODE ENTRY
The Deep Power Down Mode is entered by having burst termination command, while CKE is low. The Deep Power Down
Mode has to be maintained for a minimum of 200us.
The following diagram illustrates Deep Power Down mode entry.
CLK
CKE
tRP
Command
NOP
Precharge
All Bank
NOP
Burst
Terminate
NOP
Precharge
If needed
Deep Power Down
Entry
Figure 29. Deep Power Down Mode Entry
DEEP POWER DOWN MODE EXIT SEQUENCE
The Deep Power Down Mode is exited by asserting CKE high.
After the exit, the following sequence is needed to enter a new command
1. Maintain NOP input conditions for a minimum of 200us
2. Issue precharge commands for all banks of the device
3. Issue 2 or more auto refresh commands
4. Issue a mode register set command to initialize the mode register
5. Issue a extended mode register set command to initialize the extended mode register
The following timing diagram illustrates deep power down exit sequence
CLK
CKE
Precharge
All Bank
Command
Address
NOP
AREF
A10
NOP EMRS NOP Active
Key
Key
Bank a
Row
Normal
MRS
Extended
MRS
Row Active
A Bank
tRP
200 us
Deep Power Down
Exit
MRS
Precharge
All Bank
Figure 30. Deep Power Down Mode Exit
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Table 9. CKE[50.51.52.53.] .
CKEn-1
CKEn
L
L
L
H
H
L
H
H
Current State
Commandn
Actionn
Power Down
X
Maintain Power Down
Self Refresh
X
Maintain Self Refresh
Clock Suspend
X
Maintain Clock Suspend
Power Down[54.]
Self Refresh[55.]
Command Inhibit or NOP
Command Inhibit or NOP
Exit Power Down
Exit Self Refresh
Clock Suspend[56.]
X
Exit Clock Suspend
All Banks Idle
Command Inhibit or NOP
Power Down Entry
All Banks Idle
Reading or Writing
Auto Refresh
Valid
Self Refresh Entry
Clock Suspend Entry
See Table 10.
Note :
50.
51.
52.
53.
54.
55.
CKEn is the logic state of CKE at clock edge n; CKEn-1 was the state of CKE at the previous clock edge.
Current State is the state of the SDRAM immediately prior to the clock edge n.
Commandn is the command registered at clock edge n , and Action n is a result of Commandn.
All states and sequences not shown are illegal or reserved.
Exiting power down at clock edge n will put the device in all the banks idle state in time for clock edge n+1(provided the tCKS is met)
Exiting self refresh at clock edge n will put the device in all the banks idle state once t XSR is met. Command Inhibit or NOP commands should be issued on any clock edges
occuring during the tXSR period. A minimum of two NOP commands must be provided during the t XSR period.
56. After exiting clock suspend at clock edge n, the device will resume operation and recognize the next command at clock edge n+1.
Table 10. Current State Bank n, Command to Bank n[57.58.59.60.61.62.] .
Current State
Any
Idle
CS#
RAS#
CAS#
WE#
Command(Action)
H
X
X
X
COMMAND INHIBIT (NOP/Continue previous operation)
L
H
H
H
NO OPERATION (NOP/Continue previous operation)
L
L
H
H
ACTIVE (Select and activate row)
L
L
L
H
AUTO REFRESH[63.]
L
L
L
L
LOAD MODE REGISTER [63.]
L
L
H
L
PRECHARGE [67.]
Note :
57. This table applies when CKEn-1 was HIGH and CKEn is HIGH (see Table 9. ) and after tXSR has been met (if the previous state was self refresh).
58. This table is bank-specific, except where noted; i.e., the current state is for a specific bank and the commands shown are those allowed to be issued to that bank when in that
state. Exceptions are covered in the notes below.
59. Current state definitions: Idle: The bank has been precharged, and t RP has been met. Row Active: A row in the bank has been activated, and t RCD has been met. No data
bursts/accesses and no register accesses are in progress. Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
60. The following states must not be interrupted by a command issued to the same bank. COMMAND INHIBIT or NOP commands, or allowable commands to the other bank
should be issued on any clock edge occurring during these states. Allowable commands to the other bank are determined by its current state and Table 10. and according to
Table 11. . Precharging: Starts with registration of a PRECHARGE command and ends when t RP is met. Once tRP is met, the bank will be in the idle state. Row Activating:
Starts with registration of an ACTIVE command and ends when t RCD is met. Once tRCD is met, the bank will be in the row active state. Read w/Auto Precharge Enabled:
Starts with registration of a READ command with auto precharge enabled and ends when t RP has been met. Once tRP is met, the bank will be in the idle state. Write w/Auto
Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled and ends when t RP has been met. Once tRP is met, the bank will be in the idle
state.
61. The following states must not be interrupted by any executable command; COMMAND INHIBIT or NOP commands must be applied on each positive clock edge during these
states. Refreshing: Starts with registration of an AUTO REFRESH command and ends when t RC is met. Once tRC is met, the SDRAM will be in the all banks idle state. Accessing
Mode Register: Starts with registration of a LOAD MODE REGISTER command and ends when t MRD has been met. Once tMRD is met, the SDRAM will be in the all banks idle
state. Precharging All: Starts with registration of a PRECHARGE ALL command and ends when t RP is met. Once tRP is met, all banks will be in the idle state.
62. All states and sequences not shown are illegal or reserved.
63. Not bank-specific; requires that all banks are idle.
64. May or may not be bank-specific; if all banks are to be precharged, all must be in a valid state for precharging.
65. Not bank-specific; BURST TERMINATE affects the most recent READ or WRITE burst, regardless of bank.
66. READs or WRITEs listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or W RITEs with auto precharge disabled.
67. Does not affect the state of the bank and acts as a NOP to that bank.
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Table 10. Current State Bank n, Command to Bank n[57.58.59.60.61.62.] .
Current State
Row
Active
Read(Auto
Precharge
Disabled)
Write
(Auto
Precharge
Disabled)
CS#
RAS#
CAS#
WE#
Command(Action)
L
H
L
H
READ (Select column and start READ burst)[66.]
L
H
L
L
WRITE (Select column and start WRITE burst)[66.]
L
L
H
L
PRECHARGE (Deactivate row in bank or banks)[64.]
L
H
L
H
READ (Select column and start new READ burst)[66.]
L
H
L
L
WRITE (Select column and start WRITE burst)[66.]
L
L
H
L
PRECHARGE (Truncate READ burst, start RECHARGE)[64.]
L
H
H
L
BURST TERMINATE[65.]
L
H
L
H
READ (Select column and start READ burst)[66.]
L
H
L
L
WRITE (Select column and start new WRITE burst)[66.]
L
L
H
L
PRECHARGE (Truncate WRITE burst, start PRECHARGE)[64.]
L
H
H
L
BURST TERMINATE[65.]
Table 11. Current State Bank n, Command to Bank m[68.69.70.71.72.73.] .
Current State
Any
Idle
Row Activating,
Active, or
Precharging
Read(Auto
Precharge
Disabled)
Write(Auto
Precharge
Disabled)
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CS#
RAS#
CAS#
WE#
H
X
X
X
COMMAND INHIBIT (NOP/Continue previous operation)
L
H
H
H
NO OPERATION (NOP/Continue previous operation)
X
X
X
X
Any Command Otherwise Allowed to Bank m
L
L
H
H
ACTIVE (Select and activate row)
L
H
L
H
READ (Select column and start READ burst)[74.]
L
H
L
L
WRITE (Select column and start WRITE burst)[74.]
L
L
H
L
PRECHARGE
L
L
H
H
ACTIVE (Select and activate row)
L
H
L
H
READ (Select column and start new READ burst)[74.78.]
L
H
L
L
WRITE (Select column and start WRITE burst)[74.79.]
L
L
H
L
PRECHARGE[76.]
L
L
H
H
ACTIVE (Select and activate row)
L
H
L
H
READ (Select column and start READ burst)[74.79.]
L
H
L
L
WRITE (Select column and start new WRITE burst)[76.80.]
L
L
H
L
PRECHARGE[76.]
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AS4C8M16MSA-6BIN
Table 11. Current State Bank n, Command to Bank m[68.69.70.71.72.73.] .
Current State
Read
(With Auto
Precharge)
Write
(With Auto
Precharge)
CS#
RAS#
CAS#
WE#
Command(Action)
L
L
H
L
ACTIVE (Select and activate row)
L
H
L
H
READ (Select column and start new READ burst)[74.75.81.]
L
H
L
L
WRITE (Select column and start WRITE burst)[74.75.82.]
L
L
H
L
PRECHARGE[76.]
L
L
H
H
ACTIVE (Select and activate row)
L
H
L
H
READ (Select column and start READ burst)[74.75.83.]
L
H
L
L
WRITE (Select column and start new WRITE burst)[74.75.84.]
L
L
H
L
PRECHARGE[76.]
Note :
68. This table applies when CKEn-1 was HIGH and CKEn is HIGH and after tXSR has been met (if the previous state was self refresh).
69. This table describes alternate bank operation, except where noted; i.e., the current state is for bank n and the commands shown are those allowed to be issued to bank m
(assuming that bank m is in such a state that the given command is allowable). Exceptions are covered in the notes below.
70. Current state definitions: Idle: The bank has been precharged, and t RP has been met. Row Active: A row in the bank has been activated, and t RCD has been met. No data
bursts/accesses and no register accesses are in progress. Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Read w/Auto Precharge Enabled: Starts with registration of a READ command with auto precharge enabled, and ends when tRP has been met. Once tRP is met, the bank will be in
the idle state. Write w/Auto Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabl ed, and ends when tRP has been met. Once tRP is met, the
bank will be in the idle state.
71. AUTO REFRESH, SELF REFRESH and LOAD MODE REGISTER commands may only be issued when all banks are idle.
72. A BURST TERMINATE command cannot be issued to another bank; it applies to the bank represented by the current state only.
73. All states and sequences not shown are illegal or reserved.
74. READs or WRITEs to bank m listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or WRITEs with auto precharge disabled.
75. CONCURRENT AUTO PRECHARGE: Bank n will initiate the auto precharge command when its burst has been interrupted by bank m’s burst.
76. Burst in bank n continues as initiated.
77. For a READ without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency later.
78. For a READ without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered.
DQM should be used twwo clock prior to the WRITE command to prevent bus contention.
79. For a WRITE without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when registered,
with the data-out appearing CAS latency later. The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m.
80. For a WRITE without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when registered.
The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m.
81. For a READ with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency later.
The PRECHARGE to bank n will begin when the READ to bank m is registered (Figure 25.) .
82. For a READ with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered. DQM should be
used two clocks prior to the WRITE command to prevent bus contention. The PRECHARGE to bank n will begin when the WRITE to bank m is registered (Figure 26. ).
83. For a WRITE with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when registered, with the data-out
appearing CAS latency later. The PRECHARGE to bank n will begin after tWR is met, where tWR begins when the READ to bank m is registered. The last valid WRITE to bank n will
be data-in registered one clock prior to the READ to bank m(Figure 27. ).
84. For a WRITE with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when registered.
The PRECHARGE to bank n will begin after tWR is met, where tWR begins when the WRITE to bank m is registered. The last valid WRITE to bank n will be data registered one
clock prior to the WRITE to bank m (Figure 28. ).
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Rev.1.0 Dec. 2017
AS4C8M16MSA-6BIN
PACKAGE DIMENSION
Unit : millimeters
54 BALL FINE PITCH BGA
Top View
Bottom View
E
1
#A1
2
3
4
5
A1 INDEX MARK
E1
6
7
8
9
9
A
A
B
B
C
C
D
D
D1
D
E
8
7
6
5
4
3
2
1
e
E
F
F
G
G
H
H
J
J
D/2
e
E/2
Side View
A1
z
b
A
E
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A
A1
E
E1
D
D1
e
b
z
Min
0.20
0.30
-
Typ
0.25
8.00
6.40
8.00
6.40
0.80
0.35
-
Unit : mm
Max
1.00
0.30
0.40
0.10
Rev.1.0 Dec. 2017
AS4C8M16MSA-6BIN
PART NUMBERING SYSTEM
AS4C
8M16MSA
DRAM
8M16=8Mx16
MS=Mobile SDRAM
A=A Die Rev.
6
6=166MHz
B
B = FBGA
I
N
I=Industrial Indicates Pb and
(-40° C~+85° C) Halogen Free
XX
Packing Type
None:Tray
TR:Reel
Alliance Memory, Inc.
511 Taylor Way,
San Carlos, CA 94070
Tel: 650-610-6800
Fax: 650-620-9211
www.alliancememory.com
Copyright © Alliance Memory
All Rights Reserved
© Copyright 2007 Alliance Memory, Inc. All rights reserved. Our three-point logo, our name and Intelliwatt are
trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their
respective companies. Alliance reserves the right to make changes to this document and its products at any time
without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data
contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right
to change or correct this data at any time, without notice. If the product described herein is under development,
significant changes to these specifications are possible. The information in this product data sheet is intended to be
general descriptive information for potential customers and users, and is not intended to operate as, or provide, any
guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of
the application or use of any product described herein, and disclaims any express or implied warranties related to the
sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose,
merchantability, or infringement of any intellectual property rights, except as express agreed to in Alliance's Terms
and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively
according to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not convey a
license under any patent rights, copyrights; mask works rights, trademarks, or any other intellectual property rights of
Alliance or third parties. Alliance does not authorize its products for use as critical components in life-supporting
systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the
inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such
use and agrees to indemnify Alliance against all claims arising from such use.
Confidential
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Rev.1.0 Dec. 2017