AS6C1008-55SINL

AS6C1008-55SINL

  • 厂商:

    ALSC

  • 封装:

    SOIC32

  • 描述:

    AS6C1008 55SINL

  • 数据手册
  • 价格&库存
AS6C1008-55SINL 数据手册
OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM FEATURES GENERAL DESCRIPTION Fast access time : 35/55ns Low power consumption: Operating current : 12/10/7mA (TYP.) Standby current : 1µA (TYP.) Single 2.7V ~ 5.5V power supply All outputs TTL compatible Fully static operation Tri-state output Data retention voltage : 1.5V (MIN.) Lead free and green package available Package : 32-pin 450 mil SOP 32-pin 600 mil P-DIP 32-pin 8mm x 20mm TSOP-I 32-pin 8mm x 13.4mm STSOP 36-ball 6mm x 8mm TFBGA The AS6C1008 is a 1,048,576-bit low power CMOS static random access memory organized as 131,072 words by 8 bits. It is fabricated using very high performance, high reliability CMOS technology. Its standby current is stable within the range of operating temperature. The AS6C1008 is well designed for very low power system applications, and particularly well suited for battery back-up nonvolatile memory application. The AS6C1008-55 operates from a single power supply of 2.7V ~ 5.5V and all inputs and outputs are fully TTL compatible PRODUCT FAMILY Product Family AS6C1008 Operating Temperature -40 ~ 85℃ FUNCTIONAL BLOCK DIAGRAM Vcc Vss A0-A16 DECODER DQ0-DQ7 I/O DATA CIRCUIT CE# CE2 WE# OE# CONTROL CIRCUIT OCTOBER/2007, V 1.a 128Kx8 MEMORY ARRAY Vcc Range 2.7 ~ 5.5V Speed 35/55ns PIN DESCRIPTION SYMBOL DESCRIPTION A0 - A16 Address Inputs DQ0 – DQ7 Data Inputs/Outputs CE#, CE2 Chip Enable Inputs WE# Write Enable Input OE# Output Enable Input VCC Power Supply VSS Ground NC No Connection COLUMN I/O Alliance Memory Inc. Page 1 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM PIN CONFIGURATION 1 32 Vcc 2 31 A15 A14 3 30 CE2 A12 4 29 WE# A7 5 28 A13 A6 6 27 A8 A5 7 26 A9 A4 8 A3 9 A2 10 A1 11 A0 12 DQ0 AS6C1008 NC A16 25 A11 24 OE# 23 A10 22 CE# 21 DQ7 13 20 DQ6 DQ1 14 19 DQ5 DQ2 15 18 DQ4 Vss 16 17 DQ3 A11 A9 A8 A13 WE# CE2 A15 Vcc NC A16 A14 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 AS6C1008 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 Vss DQ2 DQ1 DQ0 A0 A1 A2 A3 TSOP-I/STSOP SOP/P-DIP A A0 A1 CE2 A3 A6 A8 B DQ4 A2 WE# A4 A7 DQ0 C DQ5 NC A5 D Vss Vcc E Vcc Vss F DQ6 NC NC G DQ7 OE# CE# A16 A15 DQ3 A11 A12 A13 A14 5 6 H A9 A10 1 2 3 4 TFBGA DQ1 DQ2 ABSOLUTE MAXIMUN RATINGS* PARAMETER Terminal Voltage with Respect to VSS Operating Temperature Storage Temperature Power Dissipation DC Output Current Soldering Temperature (under 10 sec) OCTOBER/2007, V 1.a SYMBOL VTERM RATING -0.5 to 7.0 UNIT V TA -40 to 85(I grade) ℃ TSTG PD IOUT -65 to 150 1 50 260 ℃ W mA ℃ TSOLDER Alliance Memory Inc. Page 2 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM *Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability. TRUTH TABLE MODE Standby Output Disable Read Write Note: CE# H X L L L CE2 X L H H H OE# X X H L X WE# X X H H L SUPPLY CURRENT ISB1 ISB1 ICC,ICC1 ICC,ICC1 ICC,ICC1 I/O OPERATION High-Z High-Z High-Z DOUT DIN H = VIH, L = VIL, X = Don't care. DC ELECTRICAL CHARACTERISTICS SYMBOL TEST CONDITION MIN. PARAMETER Supply Voltage VCC 2.7 *1 Input High Voltage VIH 0.7*Vcc *2 Input Low Voltage VIL - 0.2 VCC ≧ VIN ≧VSS Input Leakage Current ILI -1 Output Leakage VCC ≧ VOUT ≧ VSS, -1 ILO Output Disabled Current Output High Voltage VOH IOH = -1mA 2.2 Output Low Voltage VOL IOL = 2mA Cycle time = Min. - 35 CE# = VIL and CE2 = VIH, - 55 ICC II/O = 0mA Average Operating Cycle time = 1µs Power supply Current CE#≦0.2V and CE2≧VCC-0.2V, ICC1 II/O = 0mA other pins at 0.2V or VCC-0.2V -SL CE# ≧VCC-0.2V or CE2≦0.2V -SLE/-SLI Standby Power ISB1 Other pins at 0.2V Supply Current -LL or Vcc-0.2V -LLE/-LLI - TYP. 3.0 - *4 MAX. 5.5 VCC+0.3 0.6 1 UNIT V V V µA - 1 µA 2.7 12 10 0.4 80 60 V V mA mA 1 10 mA 1 1 1 1 10 10 20 50 µA µA µA µA Notes: 1. VIH(max) = VCC + 3.0V for pulse width less than 10ns. 2. VIL(min) = VSS - 3.0V for pulse width less than 10ns. 3. Over/Undershoot specifications are characterized, not 100% tested. 4. Typical values are included for reference only and are not guaranteed or tested. Typical valued are measured at VCC = VCC(TYP.) and TA = 25℃ OCTOBER/2007, V 1.a Alliance Memory Inc. Page 3 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM CAPACITANCE (TA = 25 C, f = 1.0MHz) O PARAMETER Input Capacitance Input/Output Capacitance SYMBOL CIN CI/O MIN. MAX 6 8 - UNIT pF pF Note : These parameters are guaranteed by device characterization, but not production tested. AC TEST CONDITIONS Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Levels Output Load 0.2V to VCC - 0.2V 3ns 1.5V CL = 50pF + 1TTL, IOH/IOL = -1mA/2mA AC ELECTRICAL CHARACTERISTICS (1) READ CYCLE PARAMETER Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time Chip Enable to Output in Low-Z Output Enable to Output in Low-Z Chip Disable to Output in High-Z Output Disable to Output in High-Z Output Hold from Address Change (2) WRITE CYCLE PARAMETER Write Cycle Time Address Valid to End of Write Chip Enable to End of Write Address Set-up Time Write Pulse Width Write Recovery Time Data to Write Time Overlap Data Hold from End of Write Time Output Active from End of Write Write to Output in High-Z SYM. tRC tAA tACE tOE tCLZ* tOLZ* tCHZ* tOHZ* tOH SYM. tWC tAW tCW tAS tWP tWR tDW tDH tOW* tWHZ* AS6C1008 MIN. MAX. 35 35 35 25 10 5 15 15 10 - UNIT AS6C1008 MIN. MAX. 35 30 30 0 25 0 20 0 5 15 UNIT ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns *These parameters are guaranteed by device characterization, but not production tested. OCTOBER/2007, V 1.a Alliance Memory Inc. Page 4 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM TIMING WAVEFORMS READ CYCLE 1 (Address Controlled) (1,2) tRC Address tAA Dout tOH Previous Data Valid Data Valid READ CYCLE 2 (CE# and CE2 and OE# Controlled) (1,3,4,5) tRC Address tAA CE# tACE CE2 OE# tOE tOH tOHZ tCHZ tOLZ tCLZ Dout High-Z Data Valid High-Z Notes : 1.WE# is high for read cycle. 2.Device is continuously selected OE# = low, CE# = low., CE2 = high. 3.Address must be valid prior to or coincident with CE# = low, CE2 = high; otherwise tAA is the limiting parameter. 4.tCLZ, tOLZ, tCHZ and tOHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. 5.At any given temperature and voltage condition, tCHZ is less than tCLZ , tOHZ is less than tOLZ. OCTOBER/2007, V 1.a Alliance Memory Inc. Page 5 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM WRITE CYCLE 1 (WE# Controlled) (1,2,3,5,6) tWC Address tAW CE# tCW CE2 tAS tWP tWR WE# tWHZ Dout T OW High-Z (4) (4) tDW tDH Data Valid Din WRITE CYCLE 2 (CE# and CE2 Controlled) (1,2,5,6) tWC Address tAW CE# tAS tWR tCW CE2 tWP WE# tWHZ Dout (4) High-Z tDW Din tDH Data Valid Notes : 1.WE#, CE# must be high or CE2 must be low during all address transitions. 2.A write occurs during the overlap of a low CE#, high CE2, low WE#. 3.During a WE#controlled write cycle with OE# low, tWP must be greater than tWHZ + tDW to allow the drivers to turn off and data to be placed on the bus. 4.During this period, I/O pins are in the output state, and input signals must not be applied. 5.If the CE#low transition and CE2 high transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance state. 6.tOW and tWHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. OCTOBER/2007, V 1.a Alliance Memory Inc. Page 6 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM DATA RETENTION CHARACTERISTICS PARAMETER SYMBOL VCC for Data Retention VDR Data Retention Current IDR Chip Disable to Data Retention Time Recovery Time tRC* = Read Cycle Time tCDR TEST CONDITION CE# ≧ VCC - 0.2V or CE2 ≧ 0.2V -SL VCC = 1.5V -SLE/-SLI CE# ≧ VCC - 0.2V or CE2 ≧ 0.2V -LL others at 0.2V or Vcc-0.2V -LLE/-LLI See Data Retention Waveforms (below) MIN. TYP. MAX. UNIT 1.5 - 5.5 V - 0.5 0.5 0.5 0.5 8 8 12 30 µA µA µA µA 0 - - ns tRC* - - ns tR DATA RETENTION WAVEFORM Low Vcc Data Retention Waveform (1) (CE# controlled) V DR ≧ 1.5V Vcc Vcc(min.) Vcc(min.) tCDR CE# V IH tR CE# ≧ V cc-0.2V V IH Low Vcc Data Retention Waveform (2) (CE2 controlled) V DR ≧ 1.5V Vcc Vcc(min.) Vcc(min.) tCDR CE2 tR CE2 ≦ 0.2V V IL OCTOBER/2007, V 1.a V IL Alliance Memory Inc. Page 7 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM PACKAGE OUTLINE DIMENSION 32 pin 450 mil SOP Package Outline Dimension UNIT SYM. A A1 A2 b c D E E1 e L L1 S y ? OCTOBER/2007, V 1.a INCH.(BASE) MM(REF) 0.118 (MAX) 0.004(MIN) 0.111(MAX) 0.016(TYP) 0.008(TYP) 0.817(MAX) 0.445 ±0.005 0.555 ±0.012 0.050(TYP) 0.0347 ±0.008 0.055 ±0.008 0.026(MAX) 0.004(MAX) o o 0 -10 2.997 (MAX) 0.102(MIN) 2.82(MAX) 0.406(TYP) 0.203(TYP) 20.75(MAX) 11.303 ±0.127 14.097 ±0.305 1.270(TYP) 0.881 ±0.203 1.397 ±0.203 0.660 (MAX) 0.101(MAX) o o 0 -10 Alliance Memory Inc. Page 8 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM 32 pin 600 mil P-DIP Package Outline Dimension UNIT SYM. A1 A2 B D E E1 e eB L S Q1 INCH(BASE) MM(REF) 0.001 (MIN) 0.150 ± 0.005 0.018 ± 0.005 1.650 ± 0.005 0.600 ± 0.010 0.544 ± 0.004 0.100 (TYP) 0.640 ± 0.020 0.130 ± 0.010 0.075 ± 0.010 0.070 ± 0.005 0.254 (MIN) 3.810 ± 0.127 0.457 ± 0.127 41.910 ± 0.127 15.240 ± 0.254 13.818 ± 0.102 2.540 (TYP) 16.256 ± 0.508. 3.302 ± 0.254 1.905 ± 0.254 1.778 ± 0.127 Note : D/E1/S dimension do not include mold flash. OCTOBER/2007, V 1.a Alliance Memory Inc. Page 9 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM 32 pin 8mm x 20mm TSOP-I Package Outline Dimension UNIT SYM. A A1 A2 b c D E e HD L L1 y O OCTOBER/2007, V 1.a INCH(BASE) MM(REF) 0.047 (MAX) 0.004 ±0.002 0.039 ±0.002 0.008 + 0.002 - 0.001 0.005 (TYP) 0.724 ±0.004 0.315 ±0.004 0.020 (TYP) 0.787 ±0.008 0.0197 ±0.004 0.0315 ±0.004 0.003 (MAX) o o 0 ~5 1.20 (MAX) 0.10 ±0.05 1.00 ±0.05 0.20 + 0.05 -0.03 0.127 (TYP) 18.40 ±0.10 8.00 ±0.10 0.50 (TYP) 20.00 ±0.20 0.50 ±0.10 0.08 ±0.10 0.076 (MAX) o o 0 ~5 Alliance Memory Inc. Page 10 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM 32 pin 8mm x 13.4mm STSOP Package Outline Dimension HD cL 12° (2x) 32 16 17 12° (2x) b E e 1 "A" Seating Plane D y 12° (2X) 16 17 0.254 A2 c A GAUGE PLANE A1 0 SEATING PLANE "A" DATAIL VIEW 1 L 12° (2X) L1 32 UNIT SYM. A A1 A2 b c D E e HD L L1 y O OCTOBER/2007, V 1.a INCH(BASE) MM(REF) 0.049 (MAX) 0.005 ±0.002 0.039 ±0.002 0.008 ±0.01 0.005 (TYP) 0.465 ±0.004 0.315 ±0.004 0.020 (TYP) 0.528±0.008 0.0197 ±0.004 0.0315 ±0.004 0.003 (MAX) o o 0 ~5 1.25 (MAX) 0.130 ±0.05 1.00 ±0.05 0.20±0.025 0.127 (TYP) 11.80 ±0.10 8.00 ±0.10 0.50 (TYP) 13.40 ±0.20. 0.50 ±0.10 0.8 ±0.10 0.076 (MAX) o o 0 ~5 Alliance Memory Inc. Page 11 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM 36 ball 6mm × 8mm TFBGA Package Outline Dimension OCTOBER/2007, V 1.a Alliance Memory Inc. Page 12 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM ORDERING INFORMATION Alliance Organization VCC Range AS6C1008-55SIN 128K x 8 2.7 - 5.5V 32 pin 450mil SOP Industrial ~ -40 C - 85 C 55 AS6C1008-55TIN 128K x 8 2.7 - 5.5V 32 pin TSOP-1(8x20mm) Industrial ~ -40 C - 85 C 55 AS6C1008-55STIN 128K x 8 2.7 - 5.5V 32 pin stSOP (8x13.3mm) Industrial ~ -40 C - 85 C 55 Package Speed ns Operating Temp PART NUMBERING SYSTEM AS6C SRAM prefix 1008 Device Number 10 = 1M 08 = x8 OCTOBER/2007, V 1.a -55 Access Time X Package Option 32 pin 450mil SOP 32 pin TSOP-1(8x20mm) 32 pin stSOP (8x13.3mm) Alliance Memory Inc. X Temperature Range I = Industrial (-40 to + 85 C) N L N = Lead Free RoHS compliant part super low power Page 13 of 14 OCTOBER 2007 January 2007 AS6C1008 X 8 BIT LOW POWER CMOS SRAM 128K X 8 BIT SUPER512K LOW POWER CMOS SRAM ® Alliance Memory, Inc 511 Taylor Way, San Carlos, CA 94070, USA Phone: 650-610-6800 Fax: 650-620-9211 Copyright © Alliance Memory All Rights Reserved www.alliancememory.com © Copyright 2007 Alliance Memory, Inc. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks ofAlliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to thisdocument and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The datacontained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at anytime, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information inthis product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide,any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of anyproduct described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including liability orwarranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to inAlliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance'sTerms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights; mask works rights,trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components inlife-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion ofAlliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against allclaims arising from such use. OCTOBER/2007, V 1.a Alliance Memory Inc. Page 14 of 14
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