AS6C2008A-55TIN

AS6C2008A-55TIN

  • 厂商:

    ALSC

  • 封装:

    TFSOP32

  • 描述:

    AS6C2008A 55TIN

  • 数据手册
  • 价格&库存
AS6C2008A-55TIN 数据手册
AUGUST 2007 January 2007 AS6C2008A X8 BIT SRAM LOW POWER CMOS SRAM 256K X 8 BIT LOW512K POWER CMOS FEATURES GENERAL DESCRIPTION Fast access time : 55ns Low power consumption: Operating current : 20/18mA (TYP.) Standby current : 2µA (TYP.) Single 2.7V ~ 5.5V power supply All outputs TTL compatible Fully static operation Tri-state output Data retention voltage : 2.0V (MIN.) Lead free and green package available Package : 32-pin 8mm x 20mm TSOP-I 32-pin 8mm x 13.4mm STSOP 32-pin 450 mil SOP 32-pin 600 mil P-DIP 36-ball 6mm x 8mm TFBGA The AS6C2008A is a 2,097,152-bit low power CMOS static random access memory organized as 262,144 words by 8 bits. It is fabricated using very high performance, high reliability CMOS technology. Its standby current is stable within the range of operating temperature. The AS6C2008A is well designed for very low power system applications, and particularly well suited for battery back-up nonvolatile memory application. The AS6C2008A operates from a single power supply of 2.7V ~ 5.5V and all outputs are fully TTL compatible PRODUCT FAMILY Product Family AS6C2008A(LLI) Operating Temperature -40 ~ 85℃ Vcc Range 2.7 ~ 5.5V FUNCTIONAL BLOCK DIAGRAM Vcc Vss A0-A17 DECODER DQ0-DQ7 I/O DATA CIRCUIT CE# CE2 WE# OE# CONTROL CIRCUIT AUGUST/2007, V 1.0 256Kx8 MEMORY ARRAY Speed 55ns Power Dissipation Standby(ISB1,TYP.) Operating(Icc,TYP.) 2µA(LL) 20/18mA PIN DESCRIPTION SYMBOL DESCRIPTION A0 - A17 Address Inputs DQ0 – DQ7 Data Inputs/Outputs CE#, CE2 Chip Enable Inputs WE# Write Enable Input OE# Output Enable Input VCC Power Supply VSS Ground NC No Connection COLUMN I/O Alliance Memory Inc. Page 1 of 15 !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!0).#/.&)'52!4)/. 1 32 Vcc A16 2 31 A15 A14 3 30 CE2 A12 4 29 WE# A7 5 28 A13 A6 6 27 A8 A5 7 26 A9 A4 8 A3 9 A2 10 A1 11 A0 12 DQ0 13 DQ1 DQ2 Vss AS6C2008A A17 25 A11 24 OE# 23 A10 22 CE# 21 DQ7 20 DQ6 14 19 DQ5 15 18 DQ4 16 17 DQ3 A11 A9 A8 A13 WE# CE2 A15 Vcc A17 A16 A14 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 AS6C2008A 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 Vss DQ2 DQ1 DQ0 A0 A1 A2 A3 TSOP-I/STSOP SOP/P-DIP ! ! ! #% ! ! ! " $1 ! 7% ! ! $1 # $1 .# ! $ 6SS 6CC % 6CC 6SS & $1 .# ! ' $1 /% #% ! ! $1 ! ! ! !   ( ! !     4&"'! $1 $1 !5'534 6 !LLIANCE-EMORY)NC 0AGEOF AUGUST 2007 January 2007 AS6C2008A X8 BIT SRAM LOW POWER CMOS SRAM 256K X 8 BIT LOW512K POWER CMOS ABSOLUTE MAXIMUN RATINGS* PARAMETER Voltage on VCC relative to VSS Voltage on any other pin relative to VSS SYMBOL VT1 VT2 RATING -0.5 to 6.5 -0.5 to VCC+0.5 UNIT V V TA -40 to 85(I grade) ℃ TSTG PD IOUT -65 to 150 1 50 260 ℃ Operating Temperature Storage Temperature Power Dissipation DC Output Current Soldering Temperature (under 10 sec) TSOLDER W mA ℃ *Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability. TRUTH TABLE MODE Standby Output Disable Read Write Note: CE# CE2 OE# WE# H X L L L X L H H H X X H L X X X H H L I/O OPERATION High-Z High-Z High-Z DOUT DIN SUPPLY CURRENT ISB1 ISB1 ICC,ICC1 ICC,ICC1 ICC,ICC1 H = VIH, L = VIL, X = Don't care. AUGUST/2007, V 1.0 Alliance Memory Inc. Page 3 of 15 !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!$#%,%#42)#!,#(!2!#4%2)34)#3 39-"/, 4%34#/.$)4)/. 0!2!-%4%2 Supply Voltage VCC *1 Input High Voltage VIH *2 Input Low Voltage VIL Input Leakage Current ILI VCC ≧ VIN ≧ VSS Output Leakage VCC ≧ VOUT ≧ VSS, ILO Output Disabled Current Output High Voltage VOH IOH = -1mA Output Low Voltage VOL IOL = 2mA Cycle time = Min., II/O = 0mA - 55 ICC CE# =0.2V and CE2=VCC-0.2V other pins at 0.2V or VCC-0.2V - 70 Average Operating Power supply Current Cycle time = 1µs, II/O = 0mA ICC1 CE#≦0.2V and CE2≧VCC-0.2V, other pins at 0.2V or VCC-0.2V CE# ≧VCC-0.2V Standby Power ISB1 or CE2≦0.2V Supply Current other pins at 0.2V or VCC-0.2V *4 -). 490 -!8 2.7 3.0 5.5 0.7* VCC VCC+0.3 - 0.2 0.6 -1 1 5.)4 V V V µA -1 - 1 µA 2.4 - 2.7 - 0.4 V V - 20 60 mA - 18 50 mA - 4 10 mA - 2 50 µA Notes: 1. VIH(max) = VCC + 3.0V for pulse width less than 10ns. 2. VIL(min) = VSS - 3.0V for pulse width less than 10ns. 3. Over/Undershoot specifications are characterized, not 100% tested. 4. Typical values are included for reference only and are not guaranteed or tested. Typical valued are measured at VCC = VCC(TYP.) and TA = 25℃ #!0!#)4!.#% 4!O#F-(Z 0!2!-%4%2 Input Capacitance Input/Output Capacitance 39-"/, CIN CI/O -). - -!8 6 8 5.)4 pF pF Note : These parameters are guaranteed by device characterization, but not production tested. !#4%34#/.$)4)/.3 Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Levels Output Load !5'534 6 0.2V to VCC - 0.2V 3ns 1.5V CL = 30pF + 1TTL, IOH/IOL = -2mA/4mA !LLIANCE-EMORY)NC 0AGEOF AUGUST 2007 January 2007 AS6C2008A X8 BIT SRAM LOW POWER CMOS SRAM 256K X 8 BIT LOW512K POWER CMOS AC ELECTRICAL CHARACTERISTICS (1) READ CYCLE PARAMETER Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time Chip Enable to Output in Low-Z Output Enable to Output in Low-Z Chip Disable to Output in High-Z Output Disable to Output in High-Z Output Hold from Address Change (2) WRITE CYCLE PARAMETER Write Cycle Time Address Valid to End of Write Chip Enable to End of Write Address Set-up Time Write Pulse Width Write Recovery Time Data to Write Time Overlap Data Hold from End of Write Time Output Active from End of Write Write to Output in High-Z SYM. AS6C2008A-55 UNIT SYM. AS6C2008A-55 UNIT tRC tAA tACE tOE tCLZ tOLZ tCHZ tOHZ tOH tWC tAW tCW tAS tWP tWR tDW tDH tOW tWHZ *These parameters are guaranteed by device characterization, but not production tested. AUGUST/2007, V 1.0 Alliance Memory Inc. Page 5 of 15 !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!4)-).'7!6%&/2-3 2%!$#9#,%(Address Controlled) (1,2) T2# !DDRESS T!! $OUT T/( 0REVIOUS$ATA6ALID $ATA6ALID 2%!$#9#,%(CE# and CE2 and OE# Controlled) (1,3,4,5) tRC Address tAA CE# tACE CE2 OE# tOE tOH tOHZ tCHZ tOLZ tCLZ Dout High-Z Data Valid High-Z Notes : 1.WE# is high for read cycle. 2.Device is continuously selected OE# = low, CE# = low., CE2 = high. 3.Address must be valid prior to or coincident with CE# = low, CE2 = high; otherwise tAA is the limiting parameter. 4.tCLZ, tOLZ, tCHZ and tOHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. 5.At any given temperature and voltage condition, tCHZ is less than tCLZ , tOHZ is less than tOLZ. !5'534 6 !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!72)4%#9#,% (WE# Controlled) (1,2,3,5,6) T7# !DDRESS T!7 #% T#7 #% T!3 T70 T72 7% T7(: $OUT 4 /7 (IGH :   T$7 $IN T$( $ATA6ALID 72)4%#9#,% (CE# and CE2 Controlled) (1,2,5,6) T7# !DDRESS T!7 #% T!3 T72 T#7 #% T70 7% T7(: $OUT  (IGH : T$7 $IN T$( $ATA6ALID Notes : 1.WE#, CE# must be high or CE2 must be low during all address transitions. 2.A write occurs during the overlap of a low CE#, high CE2, low WE#. 3.During a WE#controlled write cycle with OE# low, tWP must be greater than tWHZ + tDW to allow the drivers to turn off and data to be placed on the bus. 4.During this period, I/O pins are in the output state, and input signals must not be applied. 5.If the CE#low transition and CE2 high transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance state. 6.tOW and tWHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. !5'534 6 !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!$!4!2%4%.4)/.#(!2!#4%2)34)#3 0!2!-%4%2 39-"/, 4%34#/.$)4)/. CE# VCC - 0.2V VDR or CE2 0.2V VCC = 2.0V CE# VCC - 0.2V IDR or CE2 0.2V other pins at 0.2V or VCC-0.2V See Data Retention tCDR Waveforms (below) tR VCC for Data Retention Data Retention Current Chip Disable to Data Retention Time Recovery Time tRC* = Read Cycle Time -). 490 -!8 5.)4 2.0 - 5.5 V - 0.5 20 µA 0 - - ns tRC* - - ns $!4!2%4%.4)/.7!6%&/2- ,OW6CC$ATA2ETENTION7AVEFORM (CE# controlled) VDR Vcc 2.0V Vcc(min.) Vcc(min.) tCDR CE# VIH tR CE# Vcc-0.2V VIH ,OW6CC$ATA2ETENTION7AVEFORM (CE2 controlled) VDR Vcc 2.0V Vcc(min.) Vcc(min.) tCDR CE2 tR CE2 0.2V VIL !5'534 6 VIL !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!0!#+!'%/54,).%$)-%.3)/. PINMMXMM43/0 )0ACKAGE/UTLINE$IMENSION UNIT SYM. A A1 A2 b c D E e HD L L1 y / !5'534 6 INCH(BASE) MM(REF) 0.047 (MAX) 0.004 ±0.002 0.039 ±0.002 0.008 + 0.002 - 0.001 0.005 (TYP) 0.724 ±0.004 0.315 ±0.004 0.020 (TYP) 0.787 ±0.008 0.0197 ±0.004 0.0315 ±0.004 0.003 (MAX) o o 0 ~5 1.20 (MAX) 0.10 ±0.05 1.00 ±0.05 0.20 + 0.05 -0.03 0.127 (TYP) 18.40 ±0.10 8.00 ±0.10 0.50 (TYP) 20.00 ±0.20 0.50 ±0.10 0.08 ±0.10 0.076 (MAX) o o 0 ~5 !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!PINMMXMM343/00ACKAGE/UTLINE$IMENSION HD cL 12° (2x) 32 16 17 12° (2x) b E e 1 "A" Seating Plane D y 12° (2X) 16 17 0.254 A2 c A GAUGE PLANE A1 0 SEATING PLANE "A" DATAIL VIEW 1 L 12° (2X) L1 32 UNIT SYM. A A1 A2 b c D E e HD L L1 y O AUGUST 6 INCH(BASE) MM(REF) 0.049 (MAX) 0.005 ±0.002 0.039 ±0.002 0.008 ±0.01 0.005 (TYP) 0.465 ±0.004 0.315 ±0.004 0.020 (TYP) 0.528±0.008 0.0197 ±0.004 0.0315 ±0.004 0.003 (MAX) o o 0 ~5 1.25 (MAX) 0.130 ±0.05 1.00 ±0.05 0.20±0.025 0.127 (TYP) 11.80 ±0.10 8.00 ±0.10 0.50 (TYP) 13.40 ±0.20. 0.50 ±0.10 0.8 ±0.10 0.076 (MAX) o o 0 ~5 !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!PINMIL3/00ACKAGE/UTLINE$IMENSION UNIT SYM. A A1 A2 b c D E E1 e L L1 S y / !5'534 6 INCH.(BASE) MM(REF) 0.118 (MAX) 0.004(MIN) 0.111(MAX) 0.016(TYP) 0.008(TYP) 0.817(MAX) 0.445 ±0.005 0.555 ±0.012 0.050(TYP) 0.0347 ±0.008 0.055 ±0.008 0.026(MAX) 0.004(MAX) o o 0 -10 2.997 (MAX) 0.102(MIN) 2.82(MAX) 0.406(TYP) 0.203(TYP) 20.75(MAX) 11.303 ±0.127 14.097 ±0.305 1.270(TYP) 0.881 ±0.203 1.397 ±0.203 0.660 (MAX) 0.101(MAX) o o 0 -10 !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!PINMIL0 $)00ACKAGE/UTLINE$IMENSION UNIT SYM. A1 A2 B D E E1 e eB L S Q1 INCH(BASE) MM(REF) 0.001 (MIN) 0.150 ± 0.005 0.018 ± 0.005 1.650 ± 0.005 0.600 ± 0.010 0.544 ± 0.004 0.100 (TYP) 0.640 ± 0.020 0.130 ± 0.010 0.075 ± 0.010 0.070 ± 0.005 0.254 (MIN) 3.810 ± 0.127 0.457 ± 0.127 41.910 ± 0.127 15.240 ± 0.254 13.818 ± 0.102 2.540 (TYP) 16.256 ± 0.508. 3.302 ± 0.254 1.905 ± 0.254 1.778 ± 0.127 Note : D/E1/S dimension do not include mold flash. AUGUST 6 !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ") 4 ,/7 0/7%2 +8")4,/70/7%2#-/332!- #-/3 32!- BALLMM§MM4&"'!0ACKAGE/UTLINE$IMENSION !5'534 6 !LLIANCE-EMORY)NC 0AGEOF !5'534 *ANUARY !3#! + 8  ") 4 ,/7 0/7%2 +8")4,/70/7%2#-/332!- #-/3 32!- /2$%2).').&/2-!4)/. 0!24.5-"%2).'3934%- AS6C 2008 -55 Device Number low power SRAM prefix 20 = 2M 08 = x8 !5'534 6 Access Time X X Package Option S = 32pin 450 mil SOP Temperature Range ST = 32pin sTSOP(8 x 13.4) I = Industrial T = 32pin TSOP - 1(8 x 20mm) (-40 to + 85 C) !LLIANCE-EMORY)NC N N = Lead Free RoHS compliant part 0AGEOF !5'534 *ANUARY !3#! + 8  ")4 ,/7 0/7%2 #-/3 32!+8")4,/70/7%2#-/332!- ¸ Alliance Memory, Inc 511 Taylor Way, San Carlos, CA 94070, USA Phone: 650-610-6800 Fax: 650-620-9211 #OPYRIGHT¹!LLIANCE-EMORY !LL2IGHTS2ESERVED www.alliancememory.com ./6%-"%2 6 !LLIANCE-EMORY)NC 0AGEOF
AS6C2008A-55TIN 价格&库存

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