AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
REVISION HISTORY
Revision
Rev. 1.12
Description
Initial Issue
Issue Date
May 15, 2012
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
0
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
FEATURES
GENERAL DESCRIPTION
Fast access time : 55ns
Low power consumption:
Operating current : 30mA (TYP.)
Standby current : 1A (TYP.) SL-version
Single 2.7V ~ 3.6V power supply
All inputs and outputs TTL compatible
Fully static operation
Tri-state output
Data retention voltage : 1.5V (MIN.)
Green package available
Package : 32-pin 450 mil SOP
32-pin 8mm x 20mm TSOP-I
32-pin 8mm x 13.4mm STSOP
36-ball 6mm x 8mm TFBGA
32-pin 600 mil P-DIP
32-pin 400 mil TSOP-II
The AS6C4008A is a 4,194,304-bit low power
CMOS static random access memory organized as
524,288 words by 8 bits. It is fabricated using very
high performance, high reliability CMOS technology.
Its standby current is stable within the range of
operating temperature.
The AS6C4008A is well designed for very low power
system applications, and particularly well suited for
battery back-up nonvolatile memory application.
The AS6C4008A operates from a single power
supply of 2.7V ~ 3.6V and all inputs and outputs are
fully TTL compatible
PRODUCT FAMILY
Product
Family
AS6C4008A
Operating
Temperature
-40 ~ 85℃
Vcc Range
Speed
2.7 ~ 3.6V
55ns
FUNCTIONAL BLOCK DIAGRAM
PIN DESCRIPTION
Vcc
Vss
A0-A18
DECODER
DQ0-DQ7
I/O DATA
CIRCUIT
CE#
WE#
OE#
CONTROL
CIRCUIT
Power Dissipation
Standby(ISB1,TYP.) Operating(Icc,TYP.)
1µA(SL)
30mA
512Kx8
MEMORY ARRAY
COLUMN I/O
PIN CONFIGURATION
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
1
SYMBOL
DESCRIPTION
A0 - A18
Address Inputs
DQ0 – DQ7
Data Inputs/Outputs
CE#
Chip Enable Inputs
WE#
Write Enable Input
OE#
Output Enable Input
VCC
Power Supply
VSS
Ground
NC
No Connection
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
1
32
Vcc
A16
2
31
A15
A14
3
30
A17
A12
4
29
WE#
A7
5
28
A13
A6
6
27
A8
A5
7
A4
8
A3
9
A2
10
A1
11
A0
12
DQ0
DQ1
AS6C4008A
A18
26
A9
25
A11
24
OE#
23
A10
22
CE#
21
DQ7
13
20
DQ6
14
19
DQ5
DQ2
15
18
DQ4
Vss
16
17
DQ3
A11
A9
A8
A13
WE#
A17
A15
Vcc
A18
A16
A14
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
AS6C4008A
OE#
A10
CE#
DQ7
DQ6
DQ5
DQ4
DQ3
Vss
DQ2
DQ1
DQ0
A0
A1
A2
A3
TSOP-I/STSOP
SOP/P-DIP
1
32
VCC
A16
2
31
A15
A14
3
30
A17
A12
4
29
WE#
A7
5
28
A13
A6
6
27
A8
A5
7
26
A9
A4
8
25
A11
DQ1
A3
9
24
OE#
Vcc
A2
10
23
A10
Vss
A1
11
22
CE#
A0
12
21
DQ7
DQ0
13
20
DQ6
DQ1
14
19
DQ5
DQ2
15
18
DQ4
VSS
16
17
DQ3
A
A0
A1
NC
A3
A6
A8
B
DQ4
A2
WE#
A4
A7
DQ0
C
DQ5
NC
A5
D
Vss
E
Vcc
F
DQ6
A17
DQ2
G
DQ7 OE# CE# A16
A15 DQ3
H
A9
1
A18
A10
2
A11
A12
3
4
TFBGA
A13
5
AS6C4008A
A18
A14
6
TSOP-II
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
2
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
ABSOLUTE MAXIMUN RATINGS*
PARAMETER
Voltage on VCC relative to VSS
Voltage on any other pin relative to VSS
Operating Temperature
Storage Temperature
Power Dissipation
DC Output Current
SYMBOL
VT1
VT2
TA
TSTG
PD
IOUT
RATING
-0.5 to 4.6
-0.5 to VCC+0.5
-40 to 85(I grade)
-65 to 150
1
50
UNIT
V
V
℃
℃
W
mA
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
TRUTH TABLE
MODE
Standby
Output Disable
Read
Write
Note:
CE#
H
L
L
L
OE#
X
H
L
X
WE#
X
H
H
L
H = VIH, L = VIL, X = Don't care.
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
3
I/O OPERATION
High-Z
High-Z
DOUT
DIN
SUPPLY CURRENT
ISB,ISB1
ICC,ICC1
ICC,ICC1
ICC,ICC1
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
DC ELECTRICAL CHARACTERISTICS
SYMBOL
TEST CONDITION
PARAMETER
Supply Voltage
VCC
*1
Input High Voltage
VIH
*2
Input Low Voltage
VIL
Input Leakage Current
ILI
VCC ≧ VIN ≧ VSS
Output Leakage
VCC ≧ VOUT ≧ VSS,
ILO
Current
Output Disabled
Output High Voltage
VOH IOH = -1mA
Output Low Voltage
VOL
IOL = 2mA
Cycle time = Min.
CE# = VIL and
ICC
- 55
II/O = 0mA
Other pins at VIL or VIH
Average Operating
Power supply Current
Cycle time = 1µs
CE#≦0.2V and
ICC1
II/O = 0mA
Other pins at 0.2V or VCC-0.2V
CE# = VIH or CE2 = VIL,
ISB
other pins at VIL or VIH
Standby Power
Supply Current
ISB1
*5
CE# ≧VCC-0.2V
Others at 0.2V or
VCC - 0.2V
MIN.
2.7
2.2
- 0.2
-1
TYP.
3.0
-
*4
MAX.
3.6
VCC+0.3
0.6
1
UNIT
V
V
V
µA
-1
-
1
µA
2.2
-
2.7
-
0.4
V
V
-
30
40
mA
-
4
5
mA
-
0.3
1.25
mA
25℃
-
1
3
µA
40℃
-
1
3
µA
-
1
12
µA
SLI
SLI
Notes:
1. VIH(max) = VCC + 3.0V for pulse width less than 10ns.
2. VIL(min) = VSS - 3.0V for pulse width less than 10ns.
3. Over/Undershoot specifications are characterized, not 100% tested.
4. Typical values are included for reference only and are not guaranteed or tested.
Typical values are measured at VCC = VCC(TYP.) and TA = 25℃
5. This parameter is measured at VCC = 3.0V
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
4
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
CAPACITANCE (TA = 25℃, f = 1.0MHz)
PARAMETER
Input Capacitance
Input/Output Capacitance
SYMBOL
CIN
CI/O
MIN.
MAX
6
8
-
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Reference Levels
Output Load
0.2V to VCC - 0.2V
3ns
1.5V
CL = 30pF + 1TTL, IOH/IOL = -1mA/2mA
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE
PARAMETER
Read Cycle Time
Address Access Time
Chip Enable Access Time
Output Enable Access Time
Chip Enable to Output in Low-Z
Output Enable to Output in Low-Z
Chip Disable to Output in High-Z
Output Disable to Output in High-Z
Output Hold from Address Change
(2) WRITE CYCLE
PARAMETER
Write Cycle Time
Address Valid to End of Write
Chip Enable to End of Write
Address Set-up Time
Write Pulse Width
Write Recovery Time
Data to Write Time Overlap
Data Hold from End of Write Time
Output Active from End of Write
Write to Output in High-Z
SYM. AS6C4008A-55 UNIT
MIN.
MAX.
tRC
55
ns
tAA
55
ns
tACE
55
ns
tOE
30
ns
tCLZ*
10
ns
tOLZ*
5
ns
tCHZ*
20
ns
tOHZ*
20
ns
tOH
10
ns
SYM. AS6C4008A-55
MIN.
MAX.
tWC
55
tAW
50
tCW
50
tAS
0
tWP
45
tWR
0
tDW
25
tDH
0
tOW *
5
tWHZ*
20
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
*These parameters are guaranteed by device characterization, but not production tested.
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
5
UNIT
pF
pF
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
TIMING WAVEFORMS
READ CYCLE 1 (Address Controlled) (1,2)
tRC
Address
tAA
Dout
tOH
Previous Data Valid
Data Valid
READ CYCLE 2 (CE# and OE# Controlled) (1,3,4,5)
tRC
Address
tAA
CE#
tACE
OE#
tOE
tOH
tOHZ
tCHZ
tOLZ
tCLZ
Dout
High-Z
Data Valid
Notes :
1.WE# is high for read cycle.
2.Device is continuously selected OE# = low, CE# = low.
3.Address must be valid prior to or coincident with CE# = low,; otherwise tAA is the limiting parameter.
4.tCLZ, tOLZ, tCHZ and tOHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state.
5.At any given temperature and voltage condition, tCHZ is less than tCLZ , tOHZ is less than tOLZ.
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
6
High-Z
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
WRITE CYCLE 1 (WE# Controlled) (1,2,3,5,6)
tWC
Address
tAW
CE#
tCW
tAS
tWP
tWR
WE#
tWHZ
Dout
TOW
High-Z
(4)
tDW
Din
(4)
tDH
Data Valid
WRITE CYCLE 2 (CE# Controlled) (1,2,5,6)
tWC
Address
tAW
CE#
tAS
tWR
tCW
tWP
WE#
tWHZ
Dout
High-Z
(4)
tDW
Din
tDH
Data Valid
Notes :
1.WE#, CE# must be high during all address transitions.
2.A write occurs during the overlap of a low CE#, low WE#.
3.During a WE# controlled write cycle with OE# low, tWP must be greater than tWHZ + tDW to allow the drivers to turn off and data to be
placed on the bus.
4.During this period, I/O pins are in the output state, and input signals must not be applied.
5.If the CE# low transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance state.
6.tOW and tWHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state.
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
7
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
DATA RETENTION CHARACTERISTICS
PARAMETER
VCC for Data Retention
SYMBOL
TEST CONDITION
VDR
CE# ≧ VCC - 0.2V
25℃
Data Retention Current
IDR
Chip Disable to Data
Retention Time
Recovery Time
tRC* = Read Cycle Time
tCDR
VCC = 1.5V
SLI
CE# ≧ VCC - 0.2V
40℃
Other pins at 0.2V or VCC-0.2V
SLI
See Data Retention
Waveforms (below)
tR
DATA RETENTION WAVEFORM
VDR ≧ 1.5V
Vcc
Vcc(min.)
Vcc(min.)
tCDR
CE#
VIH
tR
CE# ≦ Vcc-0.2V
VIH
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
8
MIN.
1.5
TYP.
-
MAX.
3.6
UNIT
V
-
0.5
2.5
µA
-
0.5
2.5
µA
-
0.5
10
µA
0
-
-
ns
tRC*
-
-
ns
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
PACKAGE OUTLINE DIMENSION
32 pin 450 mil SOP Package Outline Dimension
UNIT
SYM.
A
A1
A2
b
c
D
E
E1
e
L
L1
S
y
Θ
INCH.(BASE)
0.120(MAX)
0.004(MIN)
0.116(MAX)
0.016(TYP)
0.008(TYP)
0.817(MAX)
0.445±0.006
0.555±0.025
0.050(TYP)
0.033±0.017
0.055±0.008
0.026(MAX)
0.004(MAX)
o
o
0 -10
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
9
MM(REF)
3.048(MAX)
0.102(MIN)
2.946(MAX)
0.406(TYP)
0.203(TYP)
20.75(MAX)
11.303±0.152
14.097±0.635
1.270(TYP)
0.838±0.432
1.397±0.203
0.660(MAX)
0.101(MAX)
o
o
0 -10
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
32 pin 8mm x 20mm TSOP-I Package Outline Dimension
UNIT
SYM.
A
A1
A2
b
c
D
E
e
HD
L
L1
y
Θ
INCH(BASE)
0.047 (MAX)
0.004 ±0.002
0.039 ±0.002
0.009 ±0.002
0.006 ±0.002
0.724 ±0.008
0.315 ±0.008
0.020 (TYP)
0.787 ±0.008
0.024 ±0.004
0.0315 ±0.004
0.003 (MAX)
o
o
0 ~5
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
10
MM(REF)
1.20 (MAX)
0.10 ±0.05
1.00 ±0.05
0.22 ±0.05
0.155 ±0.055
18.40 ±0.20
8.00 ±0.20
0.50 (TYP)
20.00 ±0.20
0.60 ±0.10
0.08 ±0.10
0.08 (MAX)
o
o
0 ~5
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
32 pin 8mm x 13.4mm STSOP Package Outline Dimension
UNIT
SYM.
A
A1
A2
b
c
D
E
e
HD
L
L1
y
Θ
INCH(BASE)
0.049 (MAX)
0.004 ±0.002
0.039 ±0.002
0.009 ±0.002
0.006 ±0.002
0.465 ±0.008
0.315 ±0.008
0.020 (TYP)
0.528±0.008
0.02 ±0.008
0.031 ±0.005
0.003 (MAX)
o
o
0 ~5
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
11
MM(REF)
1.25 (MAX)
0.10 ±0.05
1.00 ±0.05
0.22 ±0.05
0.155 ±0.055
11.80 ±0.20
8.00 ±0.20
0.50 (TYP)
13.40 ±0.20.
0.50 ±0.20
0.8 ±0.125
0.076 (MAX)
o
o
0 ~5
AS6C4008A
Rev. 1.12
512K X 8 BIT LOW POWER CMOS SRAM
36 ball 6mm × 8mm TFBGA Package Outline Dimension
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
12
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
32 pin 600 mil P-DIP Package Outline Dimension
UNIT
SYM.
A1
A2
B
D
E
E1
e
eB
L
S
Q1
INCH(BASE)
MM(REF)
0.015(MIN)
0.155±0.005
0.018±0.005
1.650±0.01
0.600±0.010
0.545±0.005
0.100(TYP)
0.650±0.020
0.158±0.043
0.075±0.010
0.070±0.005
0.381(MIN)
3.937±0.127
0.457±0.127
41.910±0.254
15.240±0.254
13.843±0.127
2.540(TYP)
16.510±0.508.
4.013±1.092
1.905±0.254
1.778±0.127
Note : D/E1/S dimension do not include mold flash.
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
13
AS6C4008A
Rev. 1.12
512K X 8 BIT LOW POWER CMOS SRAM
32-pin 400mil TSOP-Ⅱ Package Outline Dimension
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
14
AS6C4008A
512K X 8 BIT LOW POWER CMOS SRAM
Rev. 1.12
ORDERING INFORMATION
Operating
Temp
Package
Speed
ns
Alliance
Organization
VCC
AS6C4008A-55PCN
512k x 8
3V
32pin 600mil DIP
Commercial 0°C to 70°C
55
AS6C4008A-55SIN
512k x 8
3V
32pin 450mil SOP
Industrial -40°C to 85°C
55
AS6C4008A-55TIN
512k x 8
3V
32pin TSOP 1 (8 x 20 mm)
Industrial -40°C to 85°C
55
AS6C4008A-55STIN
512k x 8
3V
32pin sTSOP (8 x 13.4 mm)
Industrial -40°C to 85°C
55
AS6C4008A-55BIN
512k x 8
3V
36pin TFBGA (6mm x 8mm)
Industrial -40°C to 85°C
55
AS6C4008A-55ZIN
512k x 8
3V
32pin 400mil TSOP 11
Industrial -40°C to 85°C
55
PART NUMBERING SYSTEM
AS6C
4008
-55
X
X
Low
power
SRAM
prefix
Device
Number
40 = 4M
08 = by 8
Access
Time
Package Options:
P = 32 pin 600 mil P-DIP
S = 32 pin 450 mil SOP
T = 32 pin TSOP 1 (8mm x 20mm)
Z = 32 pin 400 mil TSOP 11
ST = 32 pin sTSOP (8mm x 13.4mm)
B = 36 pin TFBGA (6mm x 8mm)
Alliance Memory, Inc.
551 Taylor Way, Suite #1, San Carlos, CA 94070
Phone: 650-610-6800
15
Temperature Range:
C = Commercial
(0°C to +70°C)
I = Industrial
(-40°C to +85°C)
N
N = Lead
Free ROHS
Compliant
Part