AS7C351232-10BIN

AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM Revision History AS7C351232-10BIN 90ball TFBGA PACKAGE Revision Rev 1.0 Details Initial Issue Date Jan. 2017 Alliance Memory Inc. 511 Taylor Way, San Carlos, CA 94070 TEL: (650) 610-6800 FAX: (650) 620-9211 Alliance Memory Inc. reserves the right to change products or specification without notice Confidential - 1/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM FEATURES GENERAL DESCRIPTION  Fast access time : 10ns  Low power consumption: Operating current : 125mA (TYP.) Standby current : 4mA (TYP.)  Single 3.3V power supply  All inputs and outputs TTL compatible  Fully static operation  Tri-state output  Data byte control : B0# (DQ0 ~ DQ7) B1# (DQ8 ~ DQ15) B2# (DQ16~DQ23) B3# (DQ24~DQ31)  Data retention voltage : 1.5V (MIN.)  ROHS Compliant/Pb & Halogen free  Package : 90-ball 8mm x 13mm TFBGA The AS7C351232-10BIN is a 16M-bit high speed CMOS static random access memory organized as 512K words by 32 bits. It is fabricated using very high performance, high reliability CMOS technology. Its standby current is stable within the range of operating temperature. The AS7C351232-10BIN operates from a single power supply of 3.3V and all inputs and outputs are fully TTL compatible PRODUCT FAMILY Product Family AS7C351232-10BIN Operating Temperature VCC Range Speed -40 ~ 85℃ 2.7 ~ 3.6V 10ns Power Dissipation Standby(ISB1,TYP.) Operating(ICC,TYP.) 4mA 125mA ORDERING INFORMATION Package Type Access Time Temperature (Speed/ns) Range(℃) 10 -40℃~85℃ Packing Type Alliance Part Number Tray AS7C351232-10BIN 90-ball (8mm x 13mm) Tape Reel TFBGA FUNCTIONAL BLOCK DIAGRAM Vcc Vss A0-A18 DECODER 512Kx32 MEMORY ARRAY DQ0-DQ7 DQ8-DQ15 DQ16-DQ23 I/O DATA CIRCUIT COLUMN I/O AS7C351232-10BINTR PIN DESCRIPTION SYMBOL DESCRIPTION A0 - A18 Address Inputs DQ0 - DQ31 Data Inputs/Outputs CE#, CE2 Chip Enable Input WE# Write Enable Input OE# Output Enable Input B0# - B3# Byte Control VCC Power Supply VSS Ground NC No Connection DQ24-DQ31 CE# CE2 WE# OE# B0#-B3# Confidential CONTROL CIRCUIT - 2/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM PIN CONFIGURATION A DQ1 DQ0 Vss Vcc DQ31 DQ30 B DQ2 Vcc C Vss DQ3 DQ4 DQ27 DQ28 Vcc D Vss DQ6 DQ5 DQ26 DQ25 Vcc E Vcc DQ7 NC NC DQ24 Vss F Vss B0# A3 A4 B3# Vcc G A0 A1 A2 A10 A5 A6 H A15 A14 A13 A8 A7 A11 J CE2 A17 A16 A9 A12 CE# K B1# A18 Vcc Vss DQ29 OE# WE# B2# L Vcc DQ8 Vss Vcc DQ23 Vss M Vss DQ9 DQ10 DQ21 DQ22 Vcc N Vss DQ12 DQ11 DQ20 DQ19 Vcc P DQ13 Vcc R DQ14 DQ15 Vss 1 Confidential Vss Vcc AS7C351232-10BIN XXXXXXXX XXXXXXXX NC Vss Vss DQ18 Vcc DQ16 DQ17 2 3 7 8 TFBGA(See through with Top View) 9 TFBGA (Top View) - 3/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM ABSOLUTE MAXIMUM RATINGS* PARAMETER Voltage on VCC relative to VSS Voltage on any other pin relative to VSS SYMBOL VT1 VT2 Operating Temperature TA Storage Temperature Power Dissipation DC Output Current TSTG PD IOUT RATING -0.5 to 4.6 -0.5 to VCC+0.5 UNIT V V -40 to 85(I grade) ℃ -65 to 150 1 50 ℃ W mA *Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability. TRUTH TABLE MODE Standby Output Disable Read Write Note: Confidential CE# CE2 OE# WE# B0# B1# B0# B1# H X L L L L L L L L L L L L X L H H H H H H H H H H H H X X H X L L L L L X X X X X H = VIH, L = VIL, X = Don't care. X X H X H H H H H L L L L L X X X H L H H H L L H H H L X X X H H L H H L H L H H L X X X H H H L H L H H L H L X X X H H H H L L H H H L L - 4/12 - I/O OPERATION SUPPLY DQ0-7 DQ8-15 DQ16-23 DQ24-31 CURRENT High-Z High-Z High-Z High-Z DOUT High-Z High-Z High-Z DOUT DIN High-Z High-Z High-Z DIN High-Z High-Z High-Z High-Z High-Z DOUT High-Z High-Z DOUT High-Z DIN High-Z High-Z DIN High-Z High-Z High-Z High-Z High-Z High-Z DOUT High-Z DOUT High-Z High-Z DIN High-Z DIN High-Z High-Z High-Z High-Z High-Z High-Z High-Z DOUT DOUT High-Z High-Z High-Z DIN DIN ISB1 ICC ICC ICC Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM DC ELECTRICAL CHARACTERISTICS PARAMETER Supply Voltage Input High Voltage Input Low Voltage Input Leakage Current Output Leakage Current Output High Voltage Output Low Voltage Average Operating Power supply Current Standby Power Supply Current SYM. TEST CONDITION VCC VIH*1 VIL*2 ILI VCC ≧ VIN ≧ VSS VCC ≧ VOUT ≧ VSS, ILO Output Disabled VOH IOH = -4mA VOL IOL = 8mA CE# ≦ 0.2V and CE2 ≧ VCC-0.2V, ICC other pins at 0.2V or VCC-0.2V, II/O = 0mA; f=max. CE# ≧ VCC - 0.2V; ISB1 other pins at 0.2V or VCC-0.2V. MIN. 2.7 2.2 - 0.3 -1 -10 TYP. *4 MAX. UNIT 3.3 3.6 V VCC+0.3 V 0.8 V 1 µA -1 - 1 µA 2.4 - - 0.4 V V - 125 180 mA - 4 40 mA Notes: 1. VIH(MAX.) = VCC + 2.0V for pulse width less than 6ns. 2. VIL(MIN.) = VSS - 2.0V for pulse width less than 6ns. 3. Over/Undershoot specifications are characterized on engineering evaluation stage, not for mass production test. 4. Typical values are included for reference only and are not guaranteed or tested. Typical valued are measured at VCC = VCC(TYP.) and TA = 25℃ CAPACITANCE (TA = 25℃, f = 1.0MHz) PARAMETER Input Capacitance Input/Output Capacitance SYMBOL CIN CI/O MIN. - MAX. 8 10 UNIT pF pF Note : These parameters are guaranteed by device characterization, but not production tested. AC TEST CONDITIONS Speed Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Levels Output Load Confidential 10 ns 0.2V to VCC-0.2V 3ns VCC/2 CL = 30pF + 1TTL, IOH/IOL = -4mA/8mA - 5/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM AC ELECTRICAL CHARACTERISTICS (1) READ CYCLE PARAMETER Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time Chip Enable to Output in Low-Z Output Enable to Output in Low-Z Chip Disable to Output in High-Z Output Disable to Output in High-Z Output Hold from Address Change Byte Control Access Time Byte Control to High-Z Output Byte Control to Low-Z Output AS7C351232-10BIN MIN. MAX. 10 10 10 4.5 2 0 4 4 2 4.5 4 0 - SYM. tRC tAA tACE tOE tCLZ* tOLZ* tCHZ* tOHZ* tOH tBA tBHZ* tBLZ* UNIT ns ns ns ns ns ns ns ns ns ns ns ns (2) WRITE CYCLE PARAMETER Write Cycle Time Address Valid to End of Write Chip Enable to End of Write Address Set-up Time Write Pulse Width Write Recovery Time Data to Write Time Overlap Data Hold from End of Write Time Output Active from End of Write Write to Output in High-Z Byte Control Valid to End of Write AS7C351232-10BIN MIN. MAX. 10 8 8 0 8 0 6 0 2 4 8 - SYM. tWC tAW tCW tAS tWP tWR tDW tDH tOW * tWHZ* tBW UNIT ns ns ns ns ns ns ns ns ns ns ns *These parameters are guaranteed by device characterization, but not production tested. Confidential - 6/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM TIMING WAVEFORMS READ CYCLE 1 (Address Controlled) (1,2) tRC Address tAA Dout tOH Previous Data Valid Data Valid READ CYCLE 2 (CE# and CE2 and OE# Controlled) (1,3,4,5) tRC Address tAA CE# tACE CE2 B0#-B3# tBA OE# tBLZ tCLZ Dout tOLZ tOE tOH tOHZ tBHZ tCHZ High-Z Data Valid High-Z Notes : 1.WE# is high for read cycle. 2.Device is continuously selected OE# = low, CE# = low, CE2 = high, and B0#, B1#, B2# or B3# = low. 3.Address must be valid prior to or coincident with CE# = low, CE2 = high, and B0#, B1#, B2# or B3# = low transition; otherwise tAA is the limiting parameter. 4.tCLZ, tBLZ, tOLZ, tCHZ, tBHZ and tOHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. 5.At any given temperature and voltage condition, tCHZ is less than tCLZ , tBHZ is less than tBLZ, tOHZ is less than tOLZ. Confidential - 7/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM WRITE CYCLE 1 (WE# Controlled) (1,2,4,5) tWC Address tAW CE# tCW CE2 tBW B0#-B3# tAS tWP tWR WE# tWHZ Dout tOW High-Z (4) (4) tDW tDH Data Valid Din WRITE CYCLE 2 (CE# and CE2 Controlled) (1,4,5) tWC Address tAW CE# tAS tWR tCW CE2 tBW B0#-B3# tWP WE# tWHZ Dout High-Z (4) tDW Data Valid Din Confidential tDH - 8/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM WRITE CYCLE 3 (B0# ~ B3# Controlled) (1,4,5) tWC Address tAW tWR CE# tAS tCW CE2 tBW B0#-B3# tWP WE# tWHZ Dout High-Z (4) tDW tDH Data Valid Din Notes : 1.A write occurs during the overlap of a low CE#, high CE2, low WE#, and B0#, B1#, B2# or B3# = low. 2.During a WE# controlled write cycle with OE# low, tWP must be greater than tWHZ + tDW to allow the drivers to turn off and data to be placed on the bus. 3.During this period, I/O pins are in the output state, and input signals must not be applied. 4.If the CE#, B0# ~ B3# low transition and CE2 high transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance state. 5.tOW and tWHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. Confidential - 9/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM DATA RETENTION CHARACTERISTICS PARAMETER VCC for Data Retention SYMBOL TEST CONDITION VDR CE# ≧ VCC - 0.2V or CE2 ≦ 0.2V VCC = 1.5V Data Retention Current IDR CE# ≧ VCC - 0.2V or CE2 ≦ 0.2V Other pins at 0.2V or VCC-0.2V Chip Disable to Data tCDR See Data Retention Waveforms (below) Retention Time Recovery Time tR tRC* = Read Cycle Time MIN. 1.5 TYP. - MAX. 3.6 UNIT V - 4 40 mA 0 - - ns tRC* - - ns DATA RETENTION WAVEFORM Low VCC Data Retention Waveform (1) (CE# controlled) VDR ≧ 1.5V Vcc Vcc(min.) Vcc(min.) tCDR CE# VIH tR CE# ≧ Vcc-0.2V VIH Low VCC Data Retention Waveform (2) (CE2 controlled) VDR ≧ 1.5V Vcc Vcc(min.) Vcc(min.) tCDR CE2 Confidential tR CE2 ≦ 0.2V VIL VIL - 10/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM PACKAGE OUTLINE DIMENSION 90-ball 8mm × 13mm TFBGA Package Outline Dimension Confidential - 11/12 - Rev.1.0 Jan. 2017 AS7C351232-10BIN 512K X 32 BIT HIGH SPEED CMOS SRAM PART NUMBERING SYSTEM AS7C 351232 SRAM 3=3.3v 51232=512K x 32 10 10=10 ns B B = TFBGA I I=Industrial (-40° C~+85° C) N Indicates Pb and Halogen Free Alliance Memory, Inc. 511 Taylor Way, San Carlos, CA 94070 Tel: 650-610-6800 Fax: 650-620-9211 www.alliancememory.com Copyright © Alliance Memory All Rights Reserved © Copyright 2007 Alliance Memory, Inc. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to in Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights; mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use. Confidential - 12/12 - Rev.1.0 Jan. 2017