FINAL
Am7992B
Serial Interface Adapter (SIA)
DISTINCTIVE CHARACTERISTICS
■ Compatible with lEEE 802.3/Ethernet/Cheapernet
specifications
■ Crystal/TTL oscillator-controlled Manchester
encoder
■ Manchester decoder acquires clock and data
within four bit times with an accuracy of ±3 ns
■ Guaranteed carrier and collision detection
squelch threshold limits
— Carrier/collision detected for inputs greater than
–275 mV
— No carrier/collision for inputs less than –175 mV
■ Input signal conditioning rejects transient noise
— Transients |VIDC Max|)
14
tRPWO
Receive ± Input Pulse Width to Turn-On
(|Input| > |VIDC Max|)
15
tRLT
16
tREDH
RENA Hold Time (RCLK ↑ to RENAL)
17
tRPWN
120
ns
20
(Note 4)
45
Decoder Acquisition Time
ns
ns
450
ns
80
ns
Receive ± Input Pulse Width to
Not Turn-Off INTCARR
165
ns
10
ns
40
Collision Specification
14
18
tCPWR
Collision ± Input Pulse Width to Not
Turn-On CLSN (|Input| > |VIDC Min|)
19
tCPWO
Collision ± Input Pulse Width to Turn-On
CLSN (|Input| > |VIDC Max|)
26
ns
160
ns
(Note 4)
20
tCPWE
Collision ± Input Pulse Width to Turn-Off
CLSN (|Input| > |VIDC Max|)
21
tCPWN
Collision ± Input Pulse Width to Not
Turn-Off CLSN (|Input| < |VIDC Max|)
80
ns
22
tCPH
CLSN Turn-On Delay (VIDC Max on
Collision ± to CLSNH)
50
ns
23
tCPO
CLSN Turn-Off Delay (VIDC Max on
Collision ± to CLSNL)
160
ns
Am7992B
AMD
SWITCHING CHARACTERISTICS (continued)
No.
Parameters
Description
Test Conditions
Min
Max
Unit
(Note 11)
45
ns
45
ns
Transmitter Specification
24
tTCL
TCLK LOW Time
25
tTCH
TCLK HIGH Time
26
tTCR
TCLK Rise Time
27
tTCF
TCLK Rise Time
28
tTDS, tTES
TX and TENA Setup Time to TCLK
29
tTDH, tTEH
TX and TENA Hold Time to TCLK
30
tTOCE
31
tOD
TCLK HIGH to Transmit ± Output
32
tTOR
Transmit ± Output Rise Time
33
tTOF
Transmit ± Output Fall Time
34
tXTCH
X1 to TCLK Propagation Delay for HIGH
35
tXTCL
X1 to TCLK Propagation Delay for LOW
36
tEJ1
Clock Acquisition Jitter Tolerance
VCC = 5.0 V (Note 1)
37
tEJ51
Jitter Tolerance After 50 Bit Times
VCC = 5.0 V (Note 1)
19
(Note 1)
Transmit ± Output, (Bit Cell Center to Edge)
8
ns
8
ns
5
ns
5
ns
49.5
50.5
ns
100
ns
4
ns
4
ns
18
ns
5
18
ns
16
21.5
ns
24.4
ns
20% – 80%
5
(Notes 7 & 12)
*Min = 4.5 V, Max = 5.5 V, TOSC = 50 ns; in production test, all differential input test conditions are done single-ended,
non-VIRD levels are forces on DUT for waveform swing (levels chosen are due to tester limitations) and a distortion-free
preamble is applied to Receive± inputs.
Notes:
1. Tested but to values in excess of limits. Test accuracy not sufficient to allow screening guardbands.
2. Correlated to other tested parameter: IOD OFF = VOD OFF/RL.
3. Not tested.
4. Test done by monitoring output functionally.
5. Receive, Collision and Transmit functions are inactive: X1 driven by 20 MHz.
6. Not more than one output should be shorted at a time. Duration of the short circuit test should not exceed one second.
7. TCLK changes state on X1 rising edge, but initial state of TCLK is not defined. When TENA is High, TX data is
Manchester encoded on the falling edge of X1 after the rising edge of TCLK.
8. Assumes 50 pF capacitance loading on RCLK and RX.
9. Test is done only for last BIT = 1, which is worst case.
10. Test done from 0.8 V of falling to 2.0 V of rising edge.
11. Test correlated to TTCH.
12. Measured from 50% point of X1 driving the input in production test.
Am7992B
15
AMD
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
OUTPUTS
Must be
Steady
Will be
Steady
May
Change
from H to L
Will be
Changing
from H to L
May
Change
from L to H
Will be
Changing
from L to H
Don’t Care,
Any Change
Permitted
Changing,
State
Unknown
Does Not
Apply
Center
Line is HighImpedance
“Off” State
KS000010
16
Am7992B
AMD
SWITCHING WAVEFORMS
Bit Cell 1
1
Receive±
(Measured
Differentially)
Bit Cell 2
0
Bit Cell 3
1
Bit Cell 4
0
Bit Cell 5
1
(Note A) (Note E)
BCC
1
BCB
BCC
0
BCB
BCC
1
BCB BCC
0
BCB
BCC
1
BCB
INTCARR
10
RENA
(Note D)
VCO Enable
VCO
(Note B)
INTRCLK
RCK Enable
RCLK
15
(Note C)
RX
(Note F)
INTPLLCLK
03378I-12
Notes:
A. Minimum Width > 45 ns.
B. RCLK = INTRCLK when TEST LOW.
C. RX undefined until bit time 5 (1st decoded bit).
D. Oscillator Interrupt may occur at 2nd INTRCLK after Bit 2 Clock Transition.
E. Timing Diagram does not include Internal Propagation Delays.
F. First valid data at RX (Bit 5).
Receive Timing – Start of Reception Clock Acquisition
Am7992B
17
AMD
SWITCHING WAVEFORMS
Receive+
(Measured
Differentially)
1
0
Bit (N – 1)
Bit N
(Note B)
BCC
BCB
BCC
BCB
(Note A)
INTCARR
11
12
RENA
17
VCO Enable
VCO
INTRCLK
RCK Enable
RCLK
RX
Bit (N – 1)
Bit N
PLL CLK
03378I-13
Notes:
A. INTCARR deasserts 1.55 bit times after last Receive± Rising Edge.
B. Start of Next Packet.
Receive Timing – End of Reception (Last Bit = 0)
18
Am7992B
AMD
SWITCHING WAVEFORMS
Receive±
(Measured
Differentially)
0
Bit (N – 1)
BCC
1
Bit N
BCB
BCC
INTCARR
(Note A)
17
VCO Enable
VCO
INTRCLK
RCK Enable
RCLK
RX
Bit (N – 1)
Bit N
16
RENA
11
PLL CLK
Note:
A. INTCARR deasserts 1.55 bit times after last Receive± Rising Edge.
03378I-14
Receive Timing – End of Reception (Last Bit = 1)
Am7992B
19
AMD
SWITCHING WAVEFORMS
(Note A)
X1
TCLK
TENA
TX
TSEL
(Note B)
VH
Transmit+
(Note C)
VL
VH
Transmit–
(Note C)
Transmit±
(Measured
Differentially)
VL
1
(Note B)
0
1
31
03378I-15
Notes:
A. X1 20 MHz Sine Wave from Crystal Oscillator or driven with X1 driven from External Source Waveform.
B. TSEL connected as shown in Figure 2B. For Figure 2A, Transmit+ is HIGH when TENA is LOW.
C. When Idle Transmit ± Zero Differential is 1/2 (VH + VL).
Transmit Timing – Start of Packet
20
Am7992B
AMD
SWITCHING WAVEFORMS
X1
TCLK
TENA
29
TSEL
CASE 1
TX (Last Bit = 0)
Transmit+
Transmit–
0.5 VO at 2 µs
VO
30
Transmit±
(Measured Differentially)
30
VO
Bit (N – 2)
BCC
Bit (N – 1)
BCB
BCC
Bit N
BCB
BCC
BCB
CASE 2
TX (Last Bit = 1)
Transmit+
Transmit–
0.5 VO at 2 µs
VO
Transmit±
(Measured Differentially)
VO
03378I-16
Transmit Timing – End of Transmission*
*TSEL Components (see Figure 2B).
See Typical Performance Curve for Response at End of Transmission with Inductive Loads.
Am7992B
21
AMD
SWITCHING WAVEFORMS
Collision
Presence±
+
0V
VIDC Max
–
VIDC Max
22
CLSN
23
2.0 V
.8 V
03378I-17
Collision Timing
X1
TCLK
2V
2V
TENA
31
80%
80%
Transmit±
(Measured Differentially)
50%
20%
33
20%
32
03378I-18
Transmit Timing (at start of packet)
22
Am7992B
AMD
SWITCHING WAVEFORMS
Receive±
(Measured Differentially)
+1.5 V
VIRVD
VIDC Min
(–175 mV)
0V
0V
0V
VIDC Max
(–275 mV)
VIRVD
14
–1.5 V
17
13
10
2.0 V
RENA
03378I-19
Receive± Input Pulse Width Timing
Collision±
(Measured Differentially)
+1.5 V
VIRVD
VIDC Min
(–175 mV)
VIDC Max
(–275 mV)
0V
0V
0V
VIRVD
19
–1.5 V
20
21
18
22
2.0 V
CLSN
03378I-20
Collision± Input Pulse Width Timing
1
2
3
4
0.2 V
RCLK
0.8 V
9
8
5
2.0 V
RX
0.8 V
6
7
8
03378I-21
RCLK and RX Timing
Am7992B
23
AMD
SWITCHING WAVEFORMS
25
TCLK
24
2.0 V
0.8 V
0.8 V
26
27
28
29
2.0
0.8
TX
0.8 V
2.0
0.8
28
2.0 V
0.8 V
TENA
03378I-22
TCLK and TX Timing
TOSC
X1
Driving
Input
2.0
1.5
1.5
1.5
1.5
0.8
tHIGH*
tLOW*
tR*
tF*
2.0
TCLK
0.8
35
34
‘A’
Transmit+, Transmit–
(Note A)
‘B’
0V
BCC
(Bit Cell Center)
BCB
(Bit Cell Boundary)
Note:
A. Encode Manchester clock transition (BCC) at Point ‘A’ and bit cell edge (BCB) at point ‘B’.
*See Specification for External TTL Level in Functional Description section.
X1 Driven from External Source
24
Am7992B
03378I-23
AMD
SWITCHING WAVEFORMS
1
Bit Number
2
3
4
BCB
INTRCLK
BCC
BCC
BCC
BCC
5
6
7
8
55
56
57
58
BCC
BCC
BCC
BCC
PLL CLK
1/4 Bit Cell
4.5 V
Receive+
Receive–
(Note A)
Receive±
1.5 V
3V
0V
0
+4.5 V
1.5 V
0
–1.5 V
4.5 V
Strobe
RX
tEJI
tEJ51
A
RX
BCB
+3 V
Receive+
0
+4.5 V
Receive–
(Note B)
Receive±
+1.5 V
+1.5 V
0
–1.5 V
–4.5 V
tEJI
tEJ51
B
RX
Strobe
RX
BCB
Receive+
Receive–
(Note C)
Receive±
+3 V
0
+4.5 V
+1.5 V
+1.5 V
0
–1.5 V
tEJI
tEJ51
C
RX
Strobe
RX
Receive+
+4.5 V
+1.5 V
+3 V
Receive–
0
Receive±
+1.5 V
0
–1.5 V
(Note D)
tEJI
tEJ51
D
RX
1/4 Bit Cell
Strobe
RX
Notes:
A. Case 1, 5 Data Bit Pattern 0, 1
Rising clock edge moved toward 1/4 bit cell RCLK data strobe. Case 1 uses bit 5, Case 5 uses bit 55.
03378I-24
B. Case 2, 6 Data Bit Pattern 1, 0
Falling clock edge moved toward 1/4 bit cell RCLK data strobe. Case 2 uses bit 6, Case 6 uses bit 56.
C. Case 3, 7 Data Bit Pattern 1, 1
Falling bit cell edge moved toward 1/4 bit cell RCLK data strobe. Case 3 uses bit 6, Case 7 uses bit 56.
D. Case 4, 8 Data Bit Pattern X, 0
Rising bit cell edge moved toward 1/4 bit cell RCLK data strobe. Case 4 uses bit 5, Case 8 uses bit 55.
Input Jitter Timing
Am7992B
25
AMD
TYPICAL PERFORMANCE CURVE
600
R = 78 Ω*
500
R = 78 Ω 3
L = 95 µH
400
Differential Output
Voltage (VO)
300
(mV)
R = 78 Ω 2
L = 75 µH
200
R = 78 Ω 1
L = 60 µH
100
0
–100
1.0
2.0
3.0
4.0
5.0
Time (µs)
6.0
03378I-25
End of Transmission – Differential Output Voltage*
*Equivalent Load:
L
R
Notes:
60 µH
1. 802.3 Test Load:
L Test
R Test
Am7992B
75 µH NOM.
2. 802.3 10BASE5 Network Connection:
Am7996
75 µH NOM.
AUI
Am7992B
80.4
VO
Am7996
95 µH
3. 802.3 10BASE2 Network Connection:
80.4
VO
03378I-26
26
Am7992B
AMD
SWITCHING TEST CIRCUITS
Transmit+
DUT
RL = 78 Ω
DUT
50 pF
Transmit–
03378I-27
03378I-28
A. Test Load for RX, RENA, RCLK,
TCLK, CLSN
B. Transmit± Output
+
DUT
–
DC Voltage
03378I-29
C. Receive± and Collision± Input
Am7992B
27
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