APM3009NU
N-Channel Enhancement Mode MOSFET
Features
•
30V/50A, RDS(ON)=7mΩ (typ.) @ VGS=10V RDS(ON)=11mΩ (typ.) @ VGS=4.5V
Pin Description
G
D S
• • •
Super High Dense Cell Design Reliable and Rugged Lead Free Available (RoHS Compliant)
Top View of TO-252
D
Applications
•
Power Management in Desktop Computer or DC/DC Converters
G
S
N-Channel MOSFET
Ordering and Marking Information
APM3009N Lead Free Code Handling Code Temp. Range Package Code Package Code U : TO-252 Operating Junction Temp. Range C : -55 to 150 ° C Handling Code TU : Tube TR : Tape & Reel Lead Free Code L : Lead Free Device Blank : Original Device XXXXX - Date Code
APM3009N U :
APM3009N XXXXX
Note: ANPEC lead-free products contain molding compounds and 100% matte tin plate termination finish; which are fully compliant with RoHS and compatible with both SnPb and lead-free soldiering operations. ANPEC lead-free products meet or exceed the lead-free requirements of IPC/JEDEC J STD-020C for MSL classification at lead-free peak reflow temperature.
ANPEC reserves the right to make changes to improve reliability or manufacturability without notice, and advise customers to obtain the latest version of relevant information to verify before placing orders. Copyright © ANPEC Electronics Corp. Rev. B.2 - Oct., 2005 1 www.anpec.com.tw
APM3009NU
Absolute Maximum Ratings
Symbol Parameter Rating 30 ±20 150 -55 to 150 TC=25°C TC=25°C TC=100°C TC=25°C TC=100°C TC=25°C TC=100°C 11 100 75 50* 30 50 20 2.5 W °C/W V °C °C A Unit
Common Ratings (TA=25°C Unless Otherwise Noted) VDSS VGSS TJ TSTG IS Drain-Source Voltage Gate-Source Voltage Maximum Junction Temperature Storage Temperature Range Diode Continuous Forward Current
Mounted on Large Heat Sink IDP ID PD RθJC 300µs Pulse Drain Current Tested Continuous Drain Current Maximum Power Dissipation Thermal Resistance-Junction to Case
2
A A
Mounted on PCB of 1in Pad Area IDP ID PD RθJA 300µs Pulse Drain Current Tested Continuous Drain Current Maximum Power Dissipation Thermal Resistance-Junction to Ambient TA=25°C TA=100°C TA=25°C TA=100°C TA=25°C TA=100°C TA=25°C TA=100°C TA=25°C TA=100°C TA=25°C TA=100°C 100 75 14 9 2.5 1 50 100 75 11 7 1.6 0.6 75 W °C/W W °C/W A A
Mounted on PCB of Minimum Footprint IDP ID PD RθJA
Note: * Current limited by bond wire.
300µs Pulse Drain Current Tested Continuous Drain Current Maximum Power Dissipation Thermal Resistance-Junction to Ambient
A A
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APM3009NU
Electrical Characteristics
Symbol Parameter
(TA = 25°C unless otherwise noted)
APM3009NU Min. Typ. Max.
Test Condition
Unit
Drain-Source Avalanche Ratings EAS Avalanche Energy, Single Pulsed ID=11A, VDD=15V VGS=0V, IDS=250µA VDS=24V, VGS=0V TJ=85°C VDS=VGS, IDS=250µA VGS=±20V, VDS=0V VGS=10V, IDS=35A VGS=4.5V, IDS=20A ISD=20A, VGS=0V VGS=0V,VDS=0V,F=1MHz VGS=0V, VDS=25V, Frequency=1.0MHz VDD=15V, RL=15Ω, IDS=1A, VGEN=10V, RG=6Ω
b
30
mJ
Static Characteristics BVDSS Drain-Source Breakdown Voltage IDSS VGS(th) IGSS RDS(ON)
a
30 1 30 1 1.5 7 11 2 ±100 9 15
V µA V nA mΩ
Zero Gate Voltage Drain Current Gate Threshold Voltage Gate Leakage Current Drain-Source On-state Resistance
Diode Characteristics VSDa RG Ciss Coss Crss td(ON) Tr td(OFF) Tf Qg Qgs Qgd
Notes:
Diode Forward Voltage
0.7
1.3
V Ω pF
Dynamic Characteristics b Gate Resistance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Turn-on Rise Time Turn-off Delay Time Turn-off Fall Time 1.2 1710 465 300 10 7 35 10 15 13 50 20 ns
Gate Charge Characteristics Total Gate Charge Gate-Source Charge Gate-Drain Charge
40 VDS=15V, VGS=10V, IDS=35A 4.8 8.4
52 nC
a : Pulse test ; pulse width≤300µs, duty cycle≤2%. b : Guaranteed by design, not subject to production testing.
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APM3009NU
Typical Characteristics
Power Dissipation
60
Drain Current
60
50
50
40
ID - Drain Current (A)
Ptot - Power (W)
40
30
30
20
20
10 TA=25 C 0 20 40 60 80 100 120 140 160 180
o
10 TC=25 C,VG=10V 0 0 20 40 60 80 100 120 140 160 180
o
0
Tj - Junction Temperature (°C)
Tj - Junction Temperature (°C)
Safe Operation Area Normalized Transient Thermal Resistance
300 100
2 1
Thermal Transient Impedance
ID - Drain Current (A)
it Lim n) s(o Rd
Duty = 0.5
10ms 100ms 1s DC
0.2 0.1 0.1 0.05 0.02 0.01 0.01 1E-4 Single Pulse 1E-3 0.01 0.1
10
1
0.1 0.1
Tc=25 C
o
Mounted on 1in pad o RθJA :50 C/W
2
1
10
80
1
10
100
VDS - Drain - Source Voltage (V)
Square Wave Pulse Duration (sec)
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APM3009NU
Typical Characteristics (Cont.)
Output Characteristics
100 90 80 VGS=4,5,6,7,8,9,10V
14 16
Drain-Source On Resistance
RDS(ON) - On - Resistance (mΩ)
12 VGS=4.5V 10 8 6 4 2 0 VGS=10V
ID - Drain Current (A)
70 60 50 40 30 20 10 0 0.0 0.4 0.8 1.2 1.6 2.0 3V
0
20
40
60
80
100
VDS - Drain-Source Voltage (V)
ID - Drain Current (A)
Transfer Characteristics
100 90 80
Gate Threshold Voltage
1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 -50 -25 IDS =250µA
70 60 50 40 30 20 10 0 0 1 2 3 4 5 6 Tj=125 C Tj=25 C
o o
Tj=-55 C
o
Normalized Threshold Vlotage
ID - Drain Current (A)
0
25
50
75 100 125 150
VGS - Gate - Source Voltage (V)
Tj - Junction Temperature (°C)
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APM3009NU
Typical Characteristics (Cont.)
Drain-Source On Resistance
2.0 1.8 VGS = 10V IDS = 35A
Source-Drain Diode Forward
100
Normalized On Resistance
1.6
IS - Source Current (A)
1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 -50 -25 0 25 RON@Tj=25 C: 7mΩ 50 75 100 125 150
o
10
Tj=150 C Tj=25 C
o
o
1
0.1 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
Tj - Junction Temperature (°C)
VSD - Source-Drain Voltage (V)
Capacitance
3000 Frequency=1MHz
Gate Charge
10 9 VDS=15V ID =35A
VGS - Gate-source Voltage (V)
30
2500
8 7 6 5 4 3 2 1
C - Capacitance (pF)
2000 Ciss 1500
1000 Coss Crss 0 0 5 10 15 20 25
500
0
0
5
10
15
20
25
30
35
40
VDS - Drain - Source Voltage (V)
QG - Gate Charge (nC)
Copyright © ANPEC Electronics Corp. Rev. B.2 - Oct., 2005
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APM3009NU
Avalanche Test Circuit and Waveforms
V DS L DUT
tp
V DSX(SUS) V DS
IA S
RG V DD
tp
IL 0.01 Ω
V DD EA S
tA V
Switching Time Test Circuit and Waveforms
V DS RD DUT V GS RG V DD
10%
tp
V DS
90%
V GS t d (on) t r t d (off) t f
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APM3009NU
Package Information
TO-252 (Reference JEDEC Registration TO-252)
E b2 L2 A C1
D H
L1 L b e1 D1 C A1
E1
Dim A A1 b b2 C C1 D D1 E E1 e1 H L L1 L2
Millimeters Min. 2.18 0.89 0.508 5.207 0.46 0.46 5.334 5.2 REF 6.35 5.3 REF 3.96 9.398 0.51 0.64 0.89 1.02 2.032
8
Inches Max. 2.39 1.27 0.89 5.461 0.58 0.58 6.22 6.73 5.18 10.41 Min. 0.086 0.035 0.020 0.205 0.018 0.018 0.210 0.205 REF 0.250 0.209 REF 0.156 0.370 0.020 0.025 0.035 0.040 0.080
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Max. 0.094 0.050 0.035 0.215 0.023 0.023 0.245 0.265 0.204 0.410
Copyright © ANPEC Electronics Corp. Rev. B.2 - Oct., 2005
APM3009NU
Physical Specifications
Terminal Material Lead Solderability Solder-Plated Copper (Solder Material : 90/10 or 63/37 SnPb), 100%Sn Meets EIA Specification RSI86-91, ANSI/J-STD-002 Category 3.
Reflow Condition
TP
(IR/Convection or VPR Reflow)
tp Critical Zone T L to T P
Ramp-up
Temperature
TL Tsmax
tL
Tsmin Ramp-down ts Preheat
25
t 25 °C to Peak
Time
Classification Reflow Profiles
Profile Feature Sn-Pb Eutectic Assembly Pb-Free Assembly Average ramp-up rate 3°C/second max. 3°C/second max. (TL to TP) Preheat 100°C 150°C - Temperature Min (Tsmin) 150°C 200°C - Temperature Max (Tsmax) 60-120 seconds 60-180 seconds - Time (min to max) (ts) Time maintained above: 183°C 217°C - Temperature (T L) 60-150 seconds 60-150 seconds - Time (tL) Peak/Classificatioon Temperature (Tp) See table 1 See table 2 Time within 5°C of actual 10-30 seconds 20-40 seconds Peak Temperature (tp) Ramp-down Rate 6°C/second max. 6°C/second max. 6 minutes max. 8 minutes max. Time 25°C to Peak Temperature Notes: All temperatures refer to topside of the package .Measured on the body surface.
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APM3009NU
Classification Reflow Profiles(Cont.)
T able 1. SnPb Entectic Process – Package Peak Reflow Temperature s P ackage Thickness Volume mm 3 Volume mm 3 < 350 ≥ 350 < 2.5 mm 240 +0/-5 ° C 225 +0/-5 ° C ≥ 2.5 mm 225 +0/-5 ° C 225 +0/-5 ° C
Table 2. Pb-free Process – Package Classification Reflow Temperatures P ackage Thickness Volume mm 3 Volume mm 3 Volume mm 3 < 350 3 50-2000 > 2000 < 1.6 mm 260 +0 ° C* 260 +0 ° C* 260 +0 ° C* 1 .6 mm – 2.5 mm 260 +0 ° C* 250 +0 ° C* 245 +0 ° C* ≥ 2.5 mm 250 +0 ° C* 245 +0 ° C* 245 +0 ° C* * Tolerance: The device manufacturer/supplier s hall a ssure process compatibility up to and including the stated classification temperature (this means Peak reflow temperature +0 ° C. For example 260 ° C+0 ° C) at the rated MSL level.
Reliability Test Program
Test item SOLDERABILITY HOLT PCT TST Method MIL-STD-883D-2003 MIL-STD 883D-1005.7 JESD-22-B, A102 MIL-STD 883D-1011.9 Description 245°C,5 SEC 1000 Hrs Bias @ 125°C 168 Hrs, 100% RH, 121°C -65°C ~ 150°C, 200 Cycles
Carrier Tape & Reel Dimensions
t E Po P P1 D
F W
Bo
Ao
D1
Ko
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APM3009NU
Carrier Tape & Reel Dimensions(Cont.)
T2
J C A B
T1
Application
A 330 ±3
B 100 ± 2 D 1.5 +0.1
C 13 ± 0. 5 D1
J 2 ± 0.5 Po
T1 T2 16.4 + 0.3 2.5± 0.5 -0.2 P1 2.0 ± 0.1 Ao
W 16+ 0.3 - 0.1 Bo
P 8 ± 0.1 Ko 2.5± 0.1
E 1.75± 0.1 t 0.3±0.05
TO-252
F 7.5 ± 0.1
1.5± 0.25 4.0 ± 0.1
6.8 ± 0.1 10.4± 0.1
(mm)
Cover Tape Dimensions
Application TO- 252 Carrier Width 16 Cover Tape Width 13.3 Devices Per Reel 2500
Customer Service
Anpec Electronics Corp. Head Office : No.6, Dusing 1st Road, SBIP, Hsin-Chu, Taiwan, R.O.C. Tel : 886-3-5642000 Fax : 886-3-5642050 Taipei Branch : 7F, No. 137, Lane 235, Pac Chiao Rd., Hsin Tien City, Taipei Hsien, Taiwan, R. O. C. Tel : 886-2-89191368 Fax : 886-2-89191369
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