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AO4264E

AO4264E

  • 厂商:

    AOSMD(美国万代)

  • 封装:

    SOIC8_150MIL

  • 描述:

    表面贴装型 N 通道 60 V 13.5A(Ta) 3.1W(Ta) SOIC8

  • 数据手册
  • 价格&库存
AO4264E 数据手册
AO4264E 60V N-Channel AlphaSGT TM General Description Product Summary VDS • Trench Power AlphaSGTTM technology • Low RDS(ON) • Low Gate Charge • ESD protected Applications ID (at VGS=10V) 60V 13.5A RDS(ON) (at VGS=10V) < 9.8mΩ RDS(ON) (at VGS=4.5V) < 13.5mΩ Typical ESD protection HBM Class 2 100% UIS Tested 100% Rg Tested • High efficiency power supply • Secondary synchronus rectifier SOIC-8 Top View D D D Bottom View D D G G PIN1 S S S S PIN1 Orderable Part Number Package Type Form Minimum Order Quantity AO4264E SO-8 Tape & Reel 3000 Absolute Maximum Ratings TA=25°C unless otherwise noted Parameter Drain-Source Voltage Symbol VDS Gate-Source Voltage VGS TA=25°C Continuous Drain Current Pulsed Drain Current C Avalanche energy VDS Spike G Power Dissipation B L=0.3mH C 10µs TA=25°C Thermal Characteristics Parameter Maximum Junction-to-Ambient A Maximum Junction-to-Ambient A D Maximum Junction-to-Lead Rev.1.0: May 2016 17 A EAS 43 mJ 72 V 3.1 Steady-State Steady-State W 2.0 TJ, TSTG Symbol t ≤ 10s A IAS PD Junction and Storage Temperature Range V 54 VSPIKE TA=70°C ±20 10.5 IDM Avalanche Current C Units V 13.5 ID TA=70°C Maximum 60 RθJA RθJL -55 to 150 Typ 31 59 16 www.aosmd.com °C Max 40 75 24 Units °C/W °C/W °C/W Page 1 of 5 AO4264E Electrical Characteristics (TJ=25°C unless otherwise noted) Symbol Parameter STATIC PARAMETERS BVDSS Drain-Source Breakdown Voltage Conditions Min ID=250µA, VGS=0V Zero Gate Voltage Drain Current IGSS VGS(th) Gate-Body leakage current VDS=0V, VGS=±20V Gate Threshold Voltage VDS=VGS, ID=250µA VGS=10V, ID=13.5A Static Drain-Source On-Resistance gFS Forward Transconductance VDS=5V, ID=13.5A VSD Diode Forward Voltage IS=1A, VGS=0V IS Maximum Body-Diode Continuous Current TJ=125°C VGS=4.5V, ID=11.5A Crss Reverse Transfer Capacitance Rg Gate resistance f=1MHz µA 2.4 V 8 9.8 12.5 15.0 10.5 13.5 0.72 VGS=0V, VDS=30V, f=1MHz SWITCHING PARAMETERS Total Gate Charge Qg(10V) ±10 1.8 48 DYNAMIC PARAMETERS Input Capacitance Ciss Output Capacitance µA 5 1.4 0.6 Units V 1 TJ=55°C RDS(ON) Max 60 VDS=60V, VGS=0V IDSS Coss Typ mΩ mΩ S 1 V 4 A 1100 pF 300 pF 28 pF 1.2 2.0 Ω 14.5 25 nC 7 13 nC Qg(4.5V) Total Gate Charge Qgs Gate Source Charge 2.5 nC Qgd Gate Drain Charge 3.5 nC tD(on) Turn-On DelayTime 6.5 ns tr Turn-On Rise Time tD(off) Turn-Off DelayTime tf trr Turn-Off Fall Time Qrr Body Diode Reverse Recovery Charge IF=13.5A, di/dt=500A/µs Body Diode Reverse Recovery Time VGS=10V, VDS=30V, ID=13.5A VGS=10V, VDS=30V, RL=2.2Ω, RGEN=3Ω 3.5 ns 22 ns 3 ns IF=13.5A, di/dt=500A/µs 18.5 ns nC 59 A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The value in any given application depends on the user's specific board design. B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance. C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep initialTJ=25°C. D. The RθJA is the sum of the thermal impedance from junction to lead RθJL and lead to ambient. E. The static characteristics in Figures 1 to 6 are obtained using or equal to 4.5V Figure 9: Maximum Forward Biased Safe Operating Area (Note F) ZθJA Normalized Transient Thermal Resistance 10 D=Ton/T TJ,PK=TA+PDM.ZθJA.RθJA 1 In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse RθJA=75°C/W 0.1 PDM 0.01 Single Pulse Ton T 0.001 1E-05 0.0001 0.001 0.01 0.1 1 10 100 Pulse Width (s) Figure 11: Normalized Maximum Transient Thermal Impedance (Note F) Rev.10.: May 2016 www.aosmd.com Page 4 of 5 AO4264E Figure A: Charge Gate Charge Test Circuit & Waveforms Gate Test Circuit & Waveform Vgs Qg 10V + + Vds VDC - Qgs Qgd VDC - DUT Vgs Ig Charge Figure B:Resistive ResistiveSwitching Switching Test Test Circuit Circuit&&Waveforms Waveforms RL Vds Vds Vgs 90% + Vdd DUT VDC - Rg 10% Vgs Vgs td(on) tr td(off) ton tf toff Figure C: UnclampedInductive InductiveSwitching Switching (UIS) Test Unclamped TestCircuit Circuit&&Waveforms Waveforms L 2 EAR= 1/2 LIAR Vds BVDSS Vds Id + Vdd Vgs Vgs I AR VDC - Rg Id DUT Vgs Vgs Figure D: Recovery Diode Recovery Test Circuit & Waveforms Diode Test Circuit & Waveforms Q rr = - Idt Vds + DUT Vds - Isd Vgs Ig Rev.10.: May 2016 Vgs L Isd + Vdd t rr dI/dt I RM Vdd VDC - IF Vds www.aosmd.com Page 5 of 5
AO4264E 价格&库存

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AO4264E
  •  国内价格
  • 1+1.04905
  • 10+0.96645
  • 30+0.94993
  • 100+0.90036

库存:1246

AO4264E
  •  国内价格
  • 1+5.96504
  • 5+3.97670
  • 25+2.79447
  • 54+2.00871
  • 147+1.89971

库存:2732

AO4264E
    •  国内价格
    • 1+1.50680

    库存:60

    AO4264E
    •  国内价格
    • 100+2.31910
    • 1000+1.58130
    • 3000+1.05410

    库存:1500

    AO4264E
      •  国内价格
      • 5+0.56733
      • 50+0.55340
      • 150+0.54400
      • 500+0.53471

      库存:4456

      AO4264E
      •  国内价格
      • 1+1.11100
      • 200+0.85910
      • 1500+0.74580
      • 3000+0.64900

      库存:1432