AO4946L

AOS Semiconductor Product Reliability Report AO4946/AO4946L, Plastic Encapsulated Device rev A ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com Apr 12, 2007 1 This AOS product reliability report summarizes the qualification result for AO4946. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AO4946 passes AOS quality and reliability requirements. The released product will be categorized by the process family and be monitored on a quarterly basis for continuously improving the product quality. Table of Contents: I. II. III. IV. V. Product Description Package and Die information Environmental Stress Test Summary and Result Reliability Evaluation Quality Assurance Information I. Product Description: The AO4946 uses advanced trench technology with a monolithically integrated Schottky diode to provide excellent RDS(ON) and low gate charge. This device is suitable for use as a low and high side switch in SMPS and general purpose applications. Standard product AO4946 is Pb-free (meets ROHS & Sony 259 specifications). Absolute Maximum Ratings TA=25°C unless otherwise noted Parameter Symbol Maximum Drain-Source Voltage Gate-Source Voltage Continuous Drain Current Pulsed Drain Current Avalanche Current Repetitive avalanche energy L=0.3mH Units V V A A mJ W °C VDS VGS TA=25°C TA=70°C IDSM IDM IAR EAR PDSM TJ, TSTG 30 ±12 8.6 6.9 40 16 38 2.0 1.3 -55 to 150 TA=25°C Power Dissipation TA=70°C Junction and Storage Temperature Range Thermal Characteristics FET1 and FET 2 Parameter Symbol Maximum Junction-toT ≤ 10s Ambient RθJA Maximum Junction-toSteadyAmbient State SteadyMaximum Junction-to-Lead State RθJL Typ 48 74 32 Max 62.5 90 40 Units °C/W °C/W °C/W 2 II. Die / Package Information: Process Package Type Lead Frame Die Attach Bond wire Mold Material Filler % (Spherical/Flake) Flammability Rating Backside Metallization Moisture Level AO4946 Standard sub-micron low voltage N channel process 8 leads SOIC Copper with Ag spot Ag epoxy S：2mils Cu; G: 1.3mils Au Epoxy resin with silica filler 90/10 UL-94 V-0 Ti / Ni / Ag Up to Level 1 * AO4946L (Green Compound) Standard sub-micron low voltage N channel process 8 leads SOIC Copper with Ag spot Ag epoxy S：2mils Cu; G: 1.3mils Au Epoxy resin with silica filler 100/0 UL-94 V-0 Ti / Ni / Ag Up to Level 1* Note * based on info provided by assembler and mold compound supplier III. Result of Reliability Stress for AO4946 (Standard) & AO4946L (Green) Test Item Test Condition Time Point 0hr Lot Attribution Total Sample size 17380 pcs Number of Failures 0 Solder Reflow Precondition HTGB Standard: 1hr PCT+3 cycle reflow@260°c Green: 168hr 85°c /85%RH +3 cycle reflow@260°c Temp = 150°c , Vgs=100% of Vgsmax Standard: 83 lots Green: 29 lots 168 / 500 hrs 1000 hrs 1 lot 82 pcs 77+5 pcs / lot 82 pcs 77+5 pcs / lot 5335 pcs 50+5 pcs / lot 5665 pcs 50+5 pcs / lot 6380 pcs 50+5 pcs / lot 0 (Note A*) 1 lot HTRB Temp = 150°c , Vds=80% of Vdsmax 168 / 500 hrs 1000 hrs 0 (Note A*) Standard: 81 lots Green: 16 lots (Note B**) Standard: 83 lots Green: 20 lots (Note B**) Standard: 87 lots Green: 29 lots (Note B**) HAST 130 +/- 2°c , 85%RH, 33.3 psi, Vgs = 80% of Vgs max 121°c , 29.7 psi , 100%RH 100 hrs 0 Pressure Pot 96 hrs 0 Temperature Cycle -65°c to 150°c , air to air 250 / 500 cycles 0 3 III. Result of Reliability Stress for AO4946 (Standard) & AO4946L (Green) Continues DPA Internal Vision Cross-section X-ray NA 5 5 5 5 40 40 40 15 5 5 5 5 40 wires 40 wires 40 wires 15 leads 0 CSAM Bond Integrity Room Temp 150°c bake 150°c bake 245°c NA 0hr 250hr 500hr 5 sec 0 0 Solderability Die shear 0 150°c 0hr 10 10 0 Note A: The HTGB and HTRB reliability data presents total of available AO4946 and AO4946L burn-in data up to the published date. Note B: The pressure pot, temperature cycle and HAST reliability data for AO4946 and AO4946L comes from the AOS generic package qualification data. IV. Reliability Evaluation FIT rate (per billion): 128 MTTF =891 years In general, 500 hrs of HTGB, 150 deg C accelerated stress testing is equivalent to 15 years of lifetime at 55 deg C operating conditions (by applying the Arrhenius equation with an activation energy of 0.7eV and 60% of upper confidence level on the failure rate calculation). AOS reliability group also routinely monitors the product reliability up to 1000 hr at and performs the necessary failure analysis on the units failed for reliability test(s). The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the selected product (AO4946). Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours. Failure Rate = Chi2 x 109 / [2 (N) (H) (Af)] = 1.83 x 109 / [2 (164) (168) (258)] = 128 MTTF = 109 / FIT =7.81 x 106hrs = 891 years Chi² = Chi Squared Distribution, determined by the number of failures and confidence interval N = Total Number of units from HTRB and HTGB tests H = Duration of HTRB/HTGB testing Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C) Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)] Acceleration Factor ratio list: 55 deg C 70 deg C 85 deg C 100 deg C 115 deg C 130 deg C 150 deg C Af 258 87 32 13 5.64 2.59 1 Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16 Tj u =The use junction temperature in degree (Kelvin), K = C+273.16 k = Boltzmann’s constant, 8.617164 X 10-5eV / K 4 V. Quality Assurance Information Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed Outgoing Defect Rate: < 25 ppm Quality Sample Plan: conform to Mil-Std-105D 5