AON2810
30V Dual N-Channel AlphaMOS
General Description
Product Summary
• Latest Trench Power AlphaMOS (αMOS LV) technology
• Very Low RDS(ON) at 2.5V VGS
• Low Gate Charge
• ESD protection
• RoHS and Halogen-Free Compliant
VDS
ID (at VGS=10V)
30V
2A
RDS(ON) (at VGS=10V)
< 44 mΩ
RDS(ON) (at VGS=4.5V)
< 52 mΩ
RDS(ON) (at VGS=2.5V)
< 74 mΩ
Typical ESD protection
HBM Class 3A
Application
• DC/DC Converters
DFN 2x2A
Top View
D2
Pin 1
G1
S1
G2
G1
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
VDS
Drain-Source Voltage
Gate-Source Voltage
Pulsed Drain Current
VDS Spike
Power Dissipation B
VGS
TA=25°C
Rev.1.0: August 2013
Steady-State
A
36
V
W
1.6
TJ, TSTG
Symbol
t ≤ 10s
V
2.5
PD
Junction and Storage Temperature Range
±12
8
VSPIKE
TA=70°C
Units
V
1.6
IDM
100ns
TA=25°C
Maximum
30
2
ID
TA=70°C
C
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
S2
S1
Pin 1
Continuous Drain
Current G
D2
D1
Bottom View
D1
S2
G2
D1
D2
RθJA
-55 to 150
Typ
40
65
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°C
Max
50
80
Units
°C/W
°C/W
Page 1 of 5
AON2810
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
Drain-Source Breakdown Voltage
BVDSS
IDSS
Zero Gate Voltage Drain Current
Conditions
Min
ID=250µA, VGS=0V
Gate-Body leakage current
VDS=0V, VGS=±10V
Gate Threshold Voltage
VDS=VGS,ID=250µA
VGS=10V, ID=2A
Static Drain-Source On-Resistance
1
44
41
52
VGS=2.5V, ID=1A
56
74
VGS=4.5V, ID=1A
9.5
VSD
Diode Forward Voltage
IS=1A,VGS=0V
0.75
IS
Maximum Body-Diode Continuous CurrentG
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Reverse Transfer Capacitance
Rg
Gate resistance
V
61
VDS=5V, ID=2A
Crss
µA
1.4
36
Forward Transconductance
Output Capacitance
±10
50
TJ=125°C
gFS
Coss
µA
5
0.6
VGS=0V, VDS=15V, f=1MHz
S
V
2
A
235
pF
75
pF
pF
Ω
8
12
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
4.5
10
nC
Qg(4.5V) Total Gate Charge
2.2
6
nC
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
trr
Body Diode Reverse Recovery Time
Qrr
VGS=10V, VDS=15V, ID=2A
4
mΩ
1
15
f=1MHz
Units
V
1
TJ=55°C
VGS(th)
Max
30
VDS=30V, VGS=0V
IGSS
RDS(ON)
Typ
0.3
nC
0.7
nC
3
ns
3
ns
24
ns
6
ns
7.2
ns
nC
VGS=10V, VDS=15V, RL=7.5Ω,
RGEN=3Ω
IF=2A, dI/dt=100A/µs
Body Diode Reverse Recovery Charge IF=2A, dI/dt=100A/µs
1.3
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C.
B. The Power dissipation PD is based on R θJA t ≤ 10s value and the maximum allowed junction temperature of 150°C. The value in any given
application depends on the user's specific board design.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initial TJ =25°C.
D. The RθJA is the sum of the thermal impedance from junction to case RθJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using or equal to 2.5V
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
Zθ JA Normalized Transient
Thermal Resistance
10
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
RθJA=80°C/W
0.1
PD
0.01
Single Pulse
Ton
0.001
1E-05
0.0001
0.001
0.01
0.1
1
10
T
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Rev.1.0: August 2013
www.aosmd.com
Page 4 of 5
AON2810
Gate Charge Test Circuit & Waveform
Vgs
Qg
10V
+
+ Vds
VDC
-
Qgs
Qgd
VDC
DUT
-
Vgs
Ig
Charge
R es istiv e S w itch ing T e st C ircu it & W a ve fo rm s
RL
V ds
Vds
DUT
Vgs
90 %
+
Vdd
VDC
-
Rg
1 0%
Vgs
V gs
t d (o n )
tr
t d (o ff)
to n
tf
t o ff
D iode R ecovery T est C ircuit & W aveform s
Q rr = -
V ds +
Idt
DUT
V gs
V ds -
Isd
V gs
Ig
Rev.1.0: August 2013
L
Isd
+
VD C
-
IF
t rr
dI/dt
I RM
V dd
V dd
V ds
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Page 5 of 5
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