AOSD21307
30V Dual P-Channel MOSFET
General Description
Product Summary
• Latest Advanced Trench Technology
• Low RDS(ON)
• High Current Capability
• RoHS and Halogen-Free Compliant
ID (at VGS=-10V)
-30V
-9A
RDS(ON) (at VGS=-10V)
< 16mΩ
RDS(ON) (at VGS=-4.5V)
< 28mΩ
VDS
Applications
100% UIS Tested
100% Rg Tested
• Notebook AC-in Load Switch
• Battery Protection Charge/Discharge
SOIC-8
Top View
D1
Bottom View
D2
Top View
S2
G2
S1
G1
1
2
3
4
8
7
6
5
D2
D2
D1
D1
G2
G1
S2
S1
Pin1
Pin1
Orderable Part Number
Package Type
Form
Minimum Order Quantity
AOSD21307
SO-8
Tape & Reel
3000
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Drain-Source Voltage
Symbol
VDS
Gate-Source Voltage
VGS
TA=25°C
Continuous Drain
Current
Pulsed Drain Current C
Avalanche Current C
Avalanche energy
Power Dissipation B
L=0.1mH
TA=25°C
C
Junction and Storage Temperature Range
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
Maximum Junction-to-Lead
Rev.1.0: November 2018
Steady-State
Steady-State
V
A
-7
-36
IAS
33
A
EAS
54
mJ
2.0
W
1.2
TJ, TSTG
Symbol
t ≤ 10s
±25
IDM
PD
TA=70°C
Units
V
-9
ID
TA=70°C
Maximum
-30
RqJA
RqJL
-55 to 150
Typ
50
74
32
www.aosmd.com
°C
Max
62.5
90
40
Units
°C/W
°C/W
°C/W
Page 1 of 5
AOSD21307
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
• Latest
advanced Gate-Body leakage current
VGS(th)
Gate Threshold Voltage
Conditions
Min
ID=-250mA, VGS=0V
-30
Typ
-1
TJ=55°C
VDS=0V, VGS=±25V
VDS=VGS, ID=-250mA
-1.3
±100
nA
-1.8
-2.3
V
12
16
17
23
28
mΩ
S
-1
V
-3
A
Static Drain-Source On-Resistance
VGS=-4.5V, ID=-7A
19
gFS
Forward Transconductance
VDS=-5V, ID=-9A
25
VSD
Diode Forward Voltage
IS=-1A, VGS=0V
-0.7
IS
Maximum Body-Diode Continuous Current
TJ=125°C
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
VGS=0V, VDS=-15V, f=1MHz
f=1MHz
SWITCHING PARAMETERS
Qg(10V)
Total Gate Charge
Qg(4.5V)
Total Gate Charge
Qgs
Gate Source Charge
Qgd
VGS=-10V, VDS=-15V, ID=-9A
μA
-5
RDS(ON)
Output Capacitance
Units
V
VDS=-30V, VGS=0V
VGS=-10V, ID=-9A
Coss
Max
mΩ
1995
pF
300
pF
260
pF
4.5
9
Ω
36.5
51
nC
17
24
nC
7
nC
Gate Drain Charge
9
nC
tD(on)
Turn-On DelayTime
12.5
ns
tr
Turn-On Rise Time
15
ns
tD(off)
Turn-Off DelayTime
43
ns
tf
trr
Turn-Off Fall Time
19.5
ns
IF=-9A, di/dt=500A/ms
13.5
Qrr
Body Diode Reverse Recovery Charge IF=-9A, di/dt=500A/ms
21.5
ns
nC
Body Diode Reverse Recovery Time
VGS=-10V, VDS=-15V, RL=1.67W,
RGEN=3W
A. The value of RqJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
value in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initialTJ=25°C.
D. The RqJA is the sum of the thermal impedance from junction to lead RqJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using or equal to -4.5V
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
1
1E-05
100
0.001
0.1
10
1000
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-toAmbient (Note F)
D=Ton/T
TJ,PK=TA+PDM.ZqJA.RqJA
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RqJA=90°C/W
0.1
PDM
0.01
0.001
1E-05
Single Pulse
Ton
0.0001
0.001
0.01
0.1
1
10
T
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Rev.1.0: November 2018
www.aosmd.com
Page 4 of 5
AOSD21307
Gate Charge Test Circuit & Waveform
Vgs
Qg
-10V
-
-
VDC
+
VDC
Qgd
+
DUT
Qgs
Vds
Vgs
Ig
Charge
Resistive Switching Test Circuit & Waveforms
RL
Vds
toff
ton
td(on)
Vgs
-
DUT
Vgs
VDC
td(off)
tr
tf
90%
Vdd
+
Rg
Vgs
10%
Vds
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
2
L
EAR= 1/2 LIAR
Vds
Vds
Id
-
Vgs
Vgs
VDC
BVDSS
Vdd
+
Rg
Id
I AR
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q rr = - Idt
Vds +
DUT
Vgs
Vds Isd
Vgs
Ig
Rev.1.0: November 2018
L
-Isd
+ Vdd
t rr
dI/dt
-I RM
Vdd
VDC
-
-I F
-Vds
www.aosmd.com
Page 5 of 5
很抱歉,暂时无法提供与“AOSD21307”相匹配的价格&库存,您可以联系我们找货
免费人工找货