AOTF10N50FD
500V, 10A N-Channel MOSFET with Fast Recovery Diode
General Description
Product Summary
The AOTF10N50FD has been fabricated using an
advanced high voltage MOSFET process that is
designed to deliver high levels of performance and
robustness in popular AC-DC applications. By providing
low RDS(on), Ciss and Crss along with guaranteed avalanche
capability this part can be adopted quickly into new and
existing offline power supply designs.
VDS
ID (at VGS=10V)
600V@150℃
10A
RDS(ON) (at VGS=10V)
< 0.75W
100% UIS Tested
100% Rg Tested
Top View
TO-220F
D
G
AOTF10N50FD
G
D
S
S
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
Drain-Source Voltage
VDS
Gate-Source Voltage
VGS
TC=25°C
Continuous Drain
Current
Pulsed Drain Current
TC=100°C
C
ID
AOTF10N50FD
500
Units
V
±30
V
10*
6*
A
IDM
33
Avalanche Current C
IAR
3.8
A
Repetitive avalanche energy C
EAR
216
mJ
Single pulsed avalanche energy G
Peak diode recovery dv/dt
TC=25°C
B
Power Dissipation
Derate above 25oC
EAS
dv/dt
433
5
50
mJ
V/ns
W
0.4
-55 to 150
W/ oC
°C
300
°C
AOT10N50FD
65
2.5
Units
°C/W
°C/W
PD
Junction and Storage Temperature Range
TJ, TSTG
Maximum lead temperature for soldering
TL
purpose, 1/8" from case for 5 seconds
Thermal Characteristics
Parameter
Symbol
Maximum Junction-to-Ambient A,D
RqJA
Maximum Junction-to-Case
RqJC
* Drain current limited by maximum junction temperature.
Rev.2.0: January 2021
www.aosmd.com
Page 1 of 6
AOTF10N50FD
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
ID=10mA, VGS=0V, TJ=25°C
500
Typ
Max
Units
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
BVDSS
/∆TJ
Breakdown Voltage Temperature
Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate-Body leakage current
VDS=0V, VGS=±30V
VGS(th)
Gate Threshold Voltage
VDS=5V, ID=250mA
RDS(ON)
Static Drain-Source On-Resistance
gFS
Forward Transconductance
VSD
Diode Forward Voltage
IS
ISM
ID=10mA, VGS=0V, TJ=150°C
600
V
ID=10mA, VGS=0V
0.56
V/ C
o
VDS=500V, VGS=0V
10
VDS=400V, TJ=125°C
100
±100
mA
3.1
4.2
nA
V
VGS=10V, ID=5A
0.6
0.75
W
VDS=40V, ID=5A
10
IS=10A,VGS=0V
0.93
2.5
S
1.6
V
Maximum Body-Diode Continuous Current
10
A
Maximum Body-Diode Pulsed Current
33
A
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
820
1030
1240
pF
VGS=0V, VDS=25V, f=1MHz
75
112
150
pF
5
10
15
pF
VGS=0V, VDS=0V, f=1MHz
1.7
3.4
5.2
W
20
26
35
nC
SWITCHING PARAMETERS
Qg
Total Gate Charge
VGS=10V, VDS=400V, ID=10A
Qgs
Gate Source Charge
4.8
nC
Qgd
Gate Drain Charge
9.5
nC
tD(on)
Turn-On DelayTime
24
ns
tr
Turn-On Rise Time
65
ns
tD(off)
Turn-Off DelayTime
VGS=10V, VDS=250V, ID=10A,
RG=25W
69
ns
tf
trr
Turn-Off Fall Time
IF=10A,dI/dt=100A/ms,VDS=100V
116
190
Qrr
Body Diode Reverse Recovery Charge IF=10A,dI/dt=100A/ms,VDS=100V
0.3
0.6
Body Diode Reverse Recovery Time
50
ns
ns
mC
A. The value of R qJA is measured with the device in a still air environment with T A =25°C.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial
TJ =25°C.
D. The R qJA is the sum of the thermal impedance from junction to case R qJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using
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