AOT27S60L/AOB27S60L/AOTF27S60L/AOTF27S60
600V 27A α MOS TM Power Transistor
General Description
Product Summary
The AOT27S60L & AOB27S60L & AOTF27S60L &
AOTF27S60 have been fabricated using the advanced
αMOSTM high voltage process that is designed to deliver high
levels of performance and robustness in switching
applications.
By providing low RDS(on), Qg and EOSS along with guaranteed
avalanche capability these parts can be adopted quickly into
new and existing offline power supply designs.
VDS @ Tj,max
700V
IDM
110A
RDS(ON),max
0.16Ω
Qg,typ
26nC
Eoss @ 400V
6µJ
100% UIS Tested
100% Rg Tested
Top View
TO-220
TO-263
D2PAK
TO-220F(3kVAC;1s)
D
D
D
G
S
G
AOT27S60L
D
AOTF27S60(L)
G
D
S
S
Absolute Maximum Ratings TA=25°C unless otherwise noted
AOT27S60L/AOB27S60L
Parameter
Symbol
Drain-Source Voltage
VDS
AOTF27S60
600
Gate-Source Voltage
±30
VGS
TC=25°C
Continuous Drain
Current
Pulsed Drain Current
TC=100°C
C
ID
S
G
AOB27S60L
27
17
AOTF27S60L
Units
V
V
27*
27*
17*
17*
A
110
IDM
Avalanche Current C
IAR
7.5
A
Repetitive avalanche energy C
EAR
110
mJ
Single pulsed avalanche energy G
EAS
TC=25°C
PD
Power Dissipation B Derate above 25oC
MOSFET dv/dt ruggedness
Peak diode recovery dv/dt H
Junction and Storage Temperature Range
TJ, TSTG
Maximum lead temperature for soldering
purpose, 1/8" from case for 5 seconds J
TL
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A,D
Symbol
RθJA
mJ
50
40
W
2.9
0.4
0.3
W/ oC
dv/dt
RθCS
Maximum Case-to-sink A
Maximum Junction-to-Case
RθJC
* Drain current limited by maximum junction temperature.
Rev 7.0: Sepetember 2017
480
357
100
20
V/ns
-55 to 150
°C
300
°C
AOT27S60L/AOB27S60L
AOTF27S60
AOTF27S60L
65
65
65
°C/W
0.5
0.35
-2.5
-3.1
°C/W
°C/W
www.aosmd.com
Units
Page 1 of 7
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
ID=250µA, VGS=0V, TJ=25°C
ID=250µA, VGS=0V, TJ=150°C
Units
600
-
-
650
700
-
V
µA
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
VDS=600V, VGS=0V
-
-
1
VDS=480V, TJ=150°C
-
10
-
IGSS
Gate-Body leakage current
VDS=0V, VGS=±30V
-
-
±100
VGS(th)
Gate Threshold Voltage
VDS=5V,ID=250µA
2.5
3.3
4
nΑ
V
RDS(ON)
Static Drain-Source On-Resistance
VSD
Diode Forward Voltage
IS
ISM
VGS=10V, ID=13.5A, TJ=25°C
-
0.14
0.16
Ω
VGS=10V, ID=13.5A, TJ=150°C
-
0.38
0.44
Ω
IS=13.5A,VGS=0V, TJ=25°C
-
0.85
-
V
Maximum Body-Diode Continuous Current
-
-
27
A
Maximum Body-Diode Pulsed Current
-
-
110
A
-
1294
-
pF
-
80
-
pF
-
69
-
pF
-
221
-
pF
-
2.3
-
pF
2.4
4.7
6.7
Ω
DYNAMIC PARAMETERS
Input Capacitance
Ciss
Coss
Output Capacitance
Co(er)
Effective output capacitance, energy
related H
Crss
Effective output capacitance, time
related I
Reverse Transfer Capacitance
Rg
Gate resistance
Co(tr)
VGS=0V, VDS=100V, f=1MHz
VGS=0V, VDS=0 to 480V, f=1MHz
VGS=0V, VDS=100V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
SWITCHING PARAMETERS
Total Gate Charge
Qg
-
26
-
nC
-
6.2
-
nC
Gate Drain Charge
-
8.8
-
nC
Turn-On DelayTime
-
31
-
ns
-
33
-
ns
-
99
-
ns
-
34
-
ns
Qgs
Gate Source Charge
Qgd
tD(on)
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
trr
Turn-Off Fall Time
VGS=10V, VDS=480V, ID=13.5A
VGS=10V, VDS=400V, ID=13.5A,
RG=25Ω
Body Diode Reverse Recovery Time
Peak Reverse Recovery Current
IF=13.5A,dI/dt=100A/µs,VDS=400V
-
440
-
ns
Irm
IF=13.5A,dI/dt=100A/µs,VDS=400V
-
28
-
Qrr
Body Diode Reverse Recovery Charge IF=13.5A,dI/dt=100A/µs,VDS=400V
-
7.5
-
A
µC
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial
TJ =25°C.
D. The R θJA is the sum of the thermal impedance from junction to case R θJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using