AT60142H-DS15MMQ

Features • Operating Voltage: 3.3V • Access Time: – 15 ns • Very Low Power Consumption • • • • • • • • • – Active: 650 mW (Max) @ 15 ns, 540 mW (Max) @ 25 ns – Standby: 3.3 mW (Typ) Wide Temperature Range: -55 to +125°C TTL-Compatible Inputs and Outputs Asynchronous Designed on 0.25 µm Radiation Hardened Process No Single Event Latch Up below LET Threshold of 80 MeV/mg/cm2@125°C Tested up to a Total Dose of 300 krads (Si) according to MIL-STD-883 Method 1019 500 Mils Wide FP36 Package ESD better than 4000V Quality Grades: – QML-Q or V – ESCC Rad Hard 512K x 8 Very Low Power CMOS SRAM AT60142H Description The AT60142H is a very low power CMOS static RAM organized as 524 288 x 8 bits. Atmel brings the solution to applications where fast computing is as mandatory as low consumption, such as aerospace electronics, portable instruments, or embarked systems. Utilizing an array of six transistors (6T) memory cells, the AT60142H combines an extremely low standby supply current (Typical value = 1 mA) with a fast access time at 15 ns or better over the full military temperature range. The high stability of the 6T cell provides excellent protection against soft errors due to noise. The AT60142H is processed according to the methods of the latest revision of the MIL PRF 38535 or ESCC 9000. It is produced on a radiation hardened 0.25 µm CMOS process. 7834A–AERO–10/09 1 AT60142H Block Diagram Pin Configuration A0 A1 A2 A3 A4 CS I/O1 I/O2 Vcc GND I/O3 I/O4 WE A5 A6 A7 A8 A9 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 NC A18 A17 A16 A15 OE I/O8 I/O7 GND Vcc I/O6 I/O5 A14 A13 A12 A11 A10 NC Note: NC pins are not bonded internally. So, they can be connected to GND or Vcc. 36 - pin -Flatpack - 500 Mils 2 7834A–AERO–10/09 Pin Description Table 1. Pin Names Name A0 - A18 I/O1 - I/O8 CS WE OE Vcc GND Description Address Inputs Data Input/Output Chip Select Write Enable Output Enable Power Supply Ground Table 2. Truth Table(1) CS H L L L Note: WE X H L H OE X L X H Inputs/Outputs Z Data Out Data In Z Mode Deselect / Power Down Read Write Output Disable 1. L=low, H=high, X= L or H, Z=high impedance. 3 AT60142H 7834A–AERO–10/09 AT60142H Electrical Characteristics Absolute Maximum Ratings* Supply Voltage to GND Potential: ....................... -0.5V + 4.6V Voltage range on any input: ...................... GND -0.5V to 4.6V Voltage range on any ouput: ..................... GND -0.5V to 4.6V Storage Temperature: ................................... -65⋅C to + 150⋅C Output Current from Output Pins: ................................ 20 mA Electrostatic Discharge Voltage: ............................... > 4000V (MIL STD 883D Method 3015) *NOTE: Stresses beyond those listed under "Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure between recommended DC operating and absolute maximum rating conditions for extended periods may affect device reliability. Military Operating Range Operating Voltage 3.3 + 0.3V Operating Temperature -55°C to + 125°C Recommended DC Operating Conditions Parameter Vcc GND VIL VIH Description Supply voltage Ground Input low voltage Input high voltage Min 3.0 0.0 GND - 0.3 2.2 Typ 3.3 0.0 0.0 – Max 3.6 0.0 0.8 VCC + 0.3 Unit V V V V Capacitance Parameter Cin(1) Cout(1) Note: Description Input capacitance Output capacitance Min – – Typ – – Max 12 12 Unit pF pF 1. Guaranteed but not tested. 4 7834A–AERO–10/09 DC Parameters DC Test Conditions TA = -55°C to + 125°C; Vss = 0V; VCC = 3.0V to 3.6V Parameter IIX (1) IOZ (1) Description Input leakage current Output leakage current Output low voltage Output high voltage Minimum -1 -1 – 2.4 Typical – – – – Maximum 1 1 0.4 – Unit μA μA V V VOL(2) VOH(3) 1. GND < VIN < VCC, GND < VOUT < VCC Output Disabled. 2. 3. VCC min. IOL = 8 mA VCC min. IOH = -4 mA. Consumption Symbol ICCSB (1) ICCSB1 (2) Description Standby Supply Current Standby Supply Current TAVAV/TAVAW Test Condition – – 15 ns 25 ns 50 ns 1 µs 15 ns 25 ns 50 ns 1 µs AT60142H-15 2.5 2.0 180 150 75 10 150 130 120 100 Unit mA mA Value max max ICCOP(3) Read Dynamic Operating Current mA max ICCOP(4) Write Dynamic Operating Current mA max 1. 2. 3. 4. CS >VIH CS > VCC - 0.3V F = 1/TAVAV, Iout = 0 mA, WE = OE = VIH, VIN = GND/VCC, VCC max. F = 1/TAVAW, Iout = 0 mA, WE = VIL, OE = VIH , VIN = GND/VCC, VCC max. 5 AT60142H 7834A–AERO–10/09 AT60142H Data Retention Mode Atmel CMOS RAM's are designed with battery backup in mind. Data retention voltage and supply current are guaranteed over temperature. The following rules insure data retention: 1. During data retention chip select CS must be held high within VCC to VCC -0.2V. 2. Output Enable (OE) should be held high to keep the RAM outputs high impedance, minimizing power dissipation. 3. During power-up and power-down transitions CS and OE must be kept between VCC + 0.3V and 70% of VCC. 4. The RAM can begin operation > tR ns after VCC reaches the minimum operation voltages (3V). Figure 1. Data Retention Timing Data Retention Characteristics Parameter VCCDR tCDR tR ICCDR (2) 1. 2. Description VCC for data retention Chip deselect to data retention time Operation recovery time Data retention current TAVAV = Read cycle time. CS = VCC, VIN = GND/VCC. Min 2.0 0.0 tAVAV – (1) Typ TA = 25⋅C – – – 0.700 Max – – – 1.5 Unit V ns ns mA 6 7834A–AERO–10/09 AC Characteristics Temperature Range:....................................................................................-55 +125°C Supply Voltage:...............................................................................................3.3 +0.3V Input Pulse Levels: ....................................................................................GND to 3.0V Input Rise and Fall Times:..................................................................... 3ns (10 - 90%) Input and Output Timing Reference Levels: ...........................................................1.5V Output Loading IOL/IOH:............................................................................. See Figure 2 Figure 2. AC Test Loads Waveforms Write Cycle Symbol TAVAW TAVWL TAVWH TDVWH TELWH TWLQZ TWLWH TWHAX TWHDX TWHQX Parameter Write cycle time Address set-up time Address valid to end of write Data set-up time CS low to write end Write low to high Z(1) Write pulse width Address hold from end of write Data hold time Write high to low Z(1) AT60142H-15 15 0 8 7 12 6 8 0 0 3 Unit ns ns ns ns ns ns ns ns ns ns Value min min min min min max min min min min Notes: 1. Parameters guaranteed, not tested, with output loading 5 pF. (See “AC Test Loads Waveforms” on page 7.) 7 AT60142H 7834A–AERO–10/09 AT60142H Write Cycle 1 WE Controlled, OE High During Write E Write Cycle 2 WE Controlled, OE Low E Write Cycle 3 CS Controlled(1) E Note: The internal write time of the memory is defined by the overlap of CS Low and W LOW. Both signals must be activated to initiate a write and either signal can terminate a write by going in active mode. The data input setup and hold timing should be referenced to the active edge of the signal that terminates the write. Data out is high impedance if OE= VIH. 8 7834A–AERO–10/09 Read Cycle Symbol TAVAV TAVQV TAVQX TELQV TELQX TEHQZ TGLQV TGLQX TGHQZ Note: Parameter Read cycle time Address access time Address valid to low Z Chip-select access time CS low to low Z(1) CS high to high Z(1) Output Enable access time OE low to low Z(1) OE high to high Z (1) AT60142H-15 15 15 5 15 5 6 6 2 5 Unit ns ns ns ns ns ns ns ns ns Value min max min max min max max min max 1. Parameters guaranteed, not tested, with output loading 5 pF. (See “AC Test Loads Waveforms” on page 7.) Read Cycle 1 Address Controlled (CS = OE = VIL, WE = VIH) Read Cycle 2 Chip Select Controlled (WE = VIH) 9 AT60142H 7834A–AERO–10/09 AT60142H Ordering Information Part Number AT60142H-DS15M-E AT60142H-DS15MMQ(2) AT60142H-DS15MSV (2) (2) (3) Temperature Range 25⋅C -55⋅ to +125⋅C -55⋅ to +125⋅C -55⋅ to +125⋅C -55⋅ to +125⋅C 25⋅C -55⋅ to +125⋅C Speed 15 ns/3.3V 15 ns/3.3V 15 ns/3.3V 15 ns/3.3V 15 ns/3.3V 15 ns/3.3V 15 ns/3.3V Package FP36.5 grounded lid FP36.5 grounded lid FP36.5 grounded lid FP36.5 grounded lid FP36.5 grounded lid Die Die Flow Engineering Samples Mil Level B Space Level B Space Level B RHA ESCC Engineering Samples Space Level B AT60142H-DS15MSR AT60142H-DS15-SCC AT60142H-DD15M-E(1) AT60142H-DD15MSV Note: (1) 1. Contact Atmel for availability 2. Will be replaced by SMD part number when available. 3. Will be replaced by ESCC part number when available. 10 7834A–AERO–10/09 Package Drawing 36-lead Flat Pack (500 Mils) Document Revision History Creation from AT60142F with the following changes : • • Package DC removed Update of parameters ICCSB, ICCSB1, ICCDR 11 AT60142H 7834A–AERO–10/09 Headquarters Atmel Corporation 2325 Orchard Parkway San Jose, CA 95131 USA Tel: 1(408) 441-0311 Fax: 1(408) 487-2600 International Atmel Asia Room 1219 Chinachem Golden Plaza 77 Mody Road Tsimshatsui East Kowloon Hong Kong Tel: (852) 2721-9778 Fax: (852) 2722-1369 Atmel Europe Le Krebs 8, Rue Jean-Pierre Timbaud BP 309 78054 Saint-Quentin-enYvelines Cedex France Tel: (33) 1-30-60-70-00 Fax: (33) 1-30-60-71-11 Atmel Japan 9F, Tonetsu Shinkawa Bldg. 1-24-8 Shinkawa Chuo-ku, Tokyo 104-0033 Japan Tel: (81) 3-3523-3551 Fax: (81) 3-3523-7581 Product Contact Web Site www.atmel.com Technical Support Enter Product Line E-mail Sales Contact www.atmel.com/contacts Literature Requests www.atmel.com/literature Disclaimer: T he information in this document is provided in connection with Atmel products. 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