AEDR-8400-140

AEDR-8400-140 and AEDR-8400-142 Reflective Surface Mount Optical Encoder Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia in accordance with the latest revisions of JEDEC Standard. Avago tests parts at the absolute maximum rated conditions recommended for the device. The actual performance you obtain from Avago parts depends on the electrical and environmental characteristics of your application but will probably be better than the performance outlined in Table 1. Failure Rate Prediction The failure rate of semiconductor devices is determined by the junction temperature of the device. The relationship between ambient given by the following: TJ(°C) = TA(°C) + qJAPAVG Where, TA = ambient temperature in °C qJA = thermal resistance of junction-to-ambient in °C/ Watt PAVG = average power dissipated in Watt The estimated MTTF and failure rate at temperatures lower than the actual stress temperature can be determined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table below using an activation energy of 0.43eV (reference MIL-HDBK-217). Table 1. Life Tests Demonstrated Performance Point Typical Performance Test Name High Temperature Operating Life Stress Test Conditions VCC=3.0V, TA=85°C, 1500hours Total Device Hours 45,000 Units Tested 30 Total Failed 0 MTTF 49,180 Failure Rate (% /1 K Hours) 2.03 Table 2. Ambient Temperature (°C) 85 75 65 55 45 35 25 Junction Temperature (°C) 89.7 79.7 69.7 59.7 49.7 39.7 29.7 Point Typical Performance [1] in Time MTTF [1] 49,180 72,640 109,800 170,000 270,700 443,800 751,900 Failure Rate (% / 1K Hours) 2.03 1.38 0.91 0.59 0.37 0.23 0.13 Performance in Time [2] (90% Confidence) MTTF [2] 19,520 28,840 43,580 67,500 107,400 176,200 298,500 Failure Rate (% /1K Hours) 5.12 3.47 2.29 1.48 0.93 0.57 0.34 Notes: 1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero failures, one failure is assumed for this calculation. 2. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is commonly used in describing useful life failures. 3. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures are failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors. Example of Failure Rate Calculation Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is: (8 hours/day) x (5 days/week) / (168 hours/week) = 0.25 The point failure rate per year (8760 hours) at 55°C ambient temperature is: (0.59% / 1K hours) x 0.25 X (8760 hours/year) = 1.29% per year Similarly, 90% confidence level failure rate per year at 55°C: (1.48% / 1K hours) X 0.25 X (8760 hours/year) = 3.24% per year Table 3. Environmental Tests Test Name Temperature Cycle Wet High Temperature Storage life Test Conditions -40°C to 85°C, 15min dwell time, 5 min transfer, 1000 cycles TA=85°C, RH=85%, 1000 hours Units Tested 30 30 Units Failed 0 0 Table 4. Electrical Tests Test Name ESD- Human Body Model ESD- Machine Model Reference HBM-JESD22-A114D MM-JESD22-A115-A Test Conditions Up to 4kV applied to all pins versus ground Up to 300V applied to all pins versus ground Units Tested 9 9 Units Failed 0 0 Table 5. Mechanical and Vibration shock Test Name Mechanical Shock Vibration Shock Test Conditions 15,20,30g 11ms, 5 successive shocks in each direction of 3 perpendicular axes of units 15,25,30g 20-2kHz, 10 cycles for ach g level. Units Tested 15 15 Units Failed Pass Pass For product information and a complete list of distributors, please go to our web site: www.avagotech.com Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Limited in the United States and other countries. Data subject to change. Copyright © 2007 Avago Technologies Limited. All rights reserved. AV02-0370EN - April 27, 2007