HSMW-B191

HSMW-B191/C191, HSMW-B197/C197, HSMW-B120/C120, HSMW-C130 and HSMW-B265/C265 Surface Mount LED Indicator Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883. Agilent tests parts at the absolute maximum rated conditions recommended for the device. The actual performance you obtain from Agilent parts depends on the electrical and environmental characteristic of your application but will probably be better than the performance outlined in Table 1. The failure rate of semiconductor devices is determined by the junction temperature of the device. The relationship between ambient temperature and actual junction temperature is given by the following: TJ(°C) = TA(°C) + θJA PAVG Where TA = ambient temperature in (°C) θJA = thermal resistance of junction-to ambient in °C/watt PAVG = average power dissipated in watts The estimated MTBF and failure rate at temperatures lower than the actual stress temperature can be determined by using an e Arrhenius model for temperature acceleration. Results of such calculations are shown on the following page using an activation energy of 0.43eV (reference MIL-HDBK-217) Table 1. Life Tests Demonstrated Performance Point Typical Performance Colors Stress Test Conditions Total Device Hrs. Units Tested Units Failed MTBF Failure Rate (%/1K Hours) White and Bluish white TA = 25°C IF = 20 mA 196,000 392 0 196,000 ≤0.51% White and Bluish white TA = 55°C IF = 20 mA 182,000 364 0 182,000 ≤0.55% White and Bluish white TA = 40°C IF = 20 mA 168,000 336 0 168,000 ≤0.60% Table 2. Failure Rate Prediction ( IF = 20mA) Demonstrated Performance Point Typical Performance in Time [1] (60% Confidence) Ambient Junction Temperature (°C) Temperature (°C) MTBF 85 96 75 Performance in Time [2] (90% Confidence) Failure Rate (%/1K Hours) MTBF [2] Failure Rate (%/1K Hours) 216.700 0.46 86,300 1.16 97 210,500 0.48 83,800 1.19 65 97 204,400 0.49 81,400 1.23 55 98 198,600 0.50 79,000 1.27 [1] 45 88 288,100 0.35 114,700 0.87 35 78 427,000 0.23 170,000 0.59 25 68 647,500 0.15 257,800 0.39 Notes: 1. The point typical MTBF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero failures, one failure is assumed for this calculation. 2. The 90% Confidence MTBF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is commonly used in describing useful life failures. Refer to MIL-STD-690B for details on this methodology. 3. A failure is any LED which does not emit light . Example of Failure Rate Calculation Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is: (8 hours/day) x (5 days/week) / (168 hours/week) = 0.25 The point failure rate per year (8760 hours) at 25o C ambient temperature is: (0.15 % / 1K hours) x 0.25 X (8760 hours/year) = 0.33 % per year Similarly, 90% confidence level failure rate per year at 25o C: (0.39 % / 1K hours) X 0.25 X (8760 hours/year) = 0.85 % per year Table 3. Environmental Tests Units Tested Units Failed -40°C to 85°C, 15 min. dwell 5 min. transfer air to air storage 100 cycles 11,192 0 JESD22-B102 8 hours aging and solder dip at 245°C for 5 seconds 10 0 Low Temperature Storage JESD22-A103 -40°C 1000hrs 364 0 Humidity Storage JESD22-A101 60°C/90% RH, 1000hrs 840 0 Humidity forward bias JESD22-A101 60°C/90% RH, 10 mA 500hrs 56 0 Test Name Reference Test Conditions Temperature Cycle JESD22-A104 Solderability For product information and a complete list of distributors, please go to our web site: www.avagotech.com Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Limited in the United States and other countries. Data subject to change. Copyright © 2006 Avago Technologies Pte. All rights reserved. AV01-0468EN - September 14, 2006