CX2016DB25000H0FLJC1

Specifications Drawing No. USY1M-H1-16426-00 Apr,20,2016 Issued Date. 1 / 11 Messrs: KED USA Note: Part Number will be revised in case of specification change. Product Type Quartz Crystal Series CX2016DB Frequency Refer to Doc No.USY1M-H1-16426-00 Page 3/11 Customer Part Number - Customer Specification Number - KYOCERA Part Number Refer to Doc No.USY1M-H1-16426-00 Page 3/11 Remarks Pb-Free, RoHS Compliant, MSL 1 Customer Approval Approval Signature Approved Date Department Person in charge Seller KYOCERA Crystal Device Corporation (Sales Division) 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 Manufacturer KYOCERA Crystal Device Corporation Crystal Units Division 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Design Department Quality Assurance Approved by Checked by Issued by KYOCERA Crystal Device Corporation Crystal Unit Application Engineering Section Crystal Units Division S.Itoh T.Soda A.Muraoka Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 2 / 11 Revision History Rev.No. 00 Description of revise First Edition Date Apr,20,2016 Approved by T.Soda Checked by A.Muraoka Issued by Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 3 / 11 [Parts Number list] Nominal Frequency (MHz) 16.000 19.200 20.000 24.000 24.576 25.000 26.000 27.000 30.000 32.000 38.400 40.000 48.000 KYOCERA Part Number CX2016DB16000H0FLJC1 CX2016DB19200H0FLJC2 CX2016DB20000H0FLJC1 CX2016DB24000H0FLJC4 CX2016DB24576H0FLJC1 CX2016DB25000H0FLJC1 CX2016DB26000H0FLJC2 CX2016DB27000H0FLJC1 CX2016DB30000H0FLJC1 CX2016DB32000H0FLJC1 CX2016DB38400H0FLJC1 CX2016DB40000H0FLJC1 CX2016DB48000H0FLJC1 ESR () Nominal Frequency Code 200 150 150 150 150 150 60 60 60 60 40 40 40 16000 19200 20000 24000 24576 25000 26000 27000 30000 32000 38400 40000 48000 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 4 / 11 1. APPLICATION The purpose of this document is applied to CX2016DB quartz crystal. 2. KYOCERA PART NUMBER Refer to Doc No.USY1M-H1-16426-00 Page 3/11 3. RATINGS Items SYMB. Rating Unit Operating Temperature range Topr -30~+85 deg. C Storage Temperature range Tstg -40~+85 deg. C Remarks 4. CHARACTERISTICS 4-1 ELECTRICAL CHARACTERISTICS SYMB. Electrical Specification Min Typ. Max Fundamental Unit Nominal Frequency F0 (*1) MHz Nominal Temperature TNOM +25 °C Load Capacitance CL 12.0 pF Frequency Tolerance df/F -10.0 +10.0 Frequency Temperature characteristics df/F -15.0 +15.0 -1.0 +1.0 Items Mode of Vibration Frequency Ageing Rate Equivalent Series Resistance ESR Drive Level Pd 0.01 Insulation Resistance IR 500 Test Condition Remarks +25±3°C PPM -30°C ~+85°C ST 1 year +25±3°C Ω (*2) 100 μW MΩ 100V(DC) Measurement Condition Frequency measurement Measuring instrument : IEC PI-Network Test Fixture IEC 60444-8 STD (Pi circuit 41901A) Equivalent series resistance (ESR) measurement Measuring instrument : IEC PI-Network Test Fixture Load Capacitance : Series *1 *2 Refer to Doc No.USY1M-H1-16426-00 Page 3/11 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 5 / 11 5. APPEARANCES, PHYSICAL DIMENSION OUTLINE DIMENSION (not to scale) 1 (Top View) (TOP VIEW) (Connection) 2.00±0.10 #4 #4 GND #3 #3 HOT 1.60±0.10 GND (NC) K601 Z GND #2 4-R0.10 3 0.40±0.05 2 4 (Side View) #1 HOT #2 GND PIN NO. #1 #2 #3 #4 0.15±0.025 #1 PIN Layout HOT GND HOT GND(NC) 4-0.10 4-0.57±0.10 #1 #2 4-0.49±0.10 4-0.08 (Bottom View) C 0.20 UNIT: mm #4 #3 MARKING 1 Nominal Frequency First 5digit of the frequency is indicated. *3 2 Identification [K] is to indicate 1Pin direction. 3 Date Code Last 1 Digit of YEAR and WEEK (Ex) 2016,Jan,01  601 4 Manufacturing Location YJapan (Yamagata ) ZJapan (Shiga Yohkaichi ) TThailand *The font of marking is for reference only. *3 Refer to Doc No.USY1M-H1-16426-00 Page 3/11 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 6 / 11 6. RECOMMENDED LAND PATTERN (not to scale) 0.5 0.9 0.8 1.1 0.3 0.8 0.9 1.4 UNIT: mm KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 7 / 11 7. TAPING & REEL 7-1.Dimensions 4.0±0.1 1.5 +0.1 -0 Unreeling direction 1.75±0.1 2.0±0.05 2.30±0.05 3.5±0.05 8.0±0.2 1.05±0.05 4.0±0.1 0.7±0.05 0.2±0.05 1.90±0.1 7-2.Leader and Carrier tape Empty compartment Empty compartment Component END Leader START 100~200mm 160mm or more 400~560mm 7-3.Direction (Orientation shall be checked from the top cover tape side) 12345 K123 Z 12345 K123 Z 12345 K123 Z 12345 K123 Z Unreeling direction 7-4.Specification 1. Material of the carrier tape is either polystyrene or A-PET (ESD). 2. Material of the cover tape is polyester (ESD). 3. The seal tape shall not cover the sprocket holes and not protrude from the carrier tape. 4. Tensile strength of carrier tape: 10N or more. 5. The R of the corner of each cavity is 0.2RMAX. 6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less. 7. The orientation shall be checked from the top cover tape side as shown in 7-3. 8. Peeling force of cover tape: 0.1 to 1.0N. 9. The component will fall out naturally when cover tape is removed and set upside down. 165°~180° Cover tape Carrier tape KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 8 / 11 7-5.Reel Specification W R S U Q P 330 Reel (15,000 pcs Max.) Symbol Dimension Symbol Dimension P Q R 330±2.0 100±1.0 13±0.2 S U W 21±0.8 2.0±0.5 9.4±1.0 (Unit: mm) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 9 / 11 8. Enviromental requirements After conducting the following tests, component needs to meet below conditions. Frequency: Fluctuation within +/-10 x 10-6 CI: Fluctuation within +/-20% or 5 whichever is larger 8.1 Resistance to Shock Drop Test - test conditions Part is mounted to 200g fixture and dropped from a height of 150cm to a cement floor. The drop must be conducted on all 6 mutually perpendicular axes. Mechanical Shock Rating Peak Value 100g 6ms Half-Sine 8.2 Resistance to Vibration 8.3 Resistance to Heat Test condition frequency : 10 - 55 - 10 Hz Amplitude : 1.5mm Cycle time : 15 minutes Direction : X,Y,Z (3direction),2h each. Test condition The quartz crystal unit shall be stored at a temperature of +852°C for 500h and subjected to room temperature for 1h before measurement. 8.4 Resistance to Cold Test condition The quartz crystal unit shall be stored at a temperature of -402°C for 500h and subjected to room temperature for 1h before measurement. 8.5 Thermal Shock Test condition The quartz crystal unit shall be subjected to 500 temperature cycles shown in table below,Then it shall be subjected to room temperature for 1h before mesurement. Cycle :-402°C (30min.)+252°C(5min.)  +852°C(30min.) +252°C(5min.) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. 8.6 Resistance to Moisture 8.7 Soldering condition USY1M-H1-16426-00 10 / 11 Test condition The quartz crystal unit shall be stored at a temperature of +602°C with relative humidity of 90% to 95% for 240 h. Then it shall be subjected to room temperature for 1h before measurement. 1.) Type of solder Material  lead free solder paste Melting point  +2205°C 2.) Reflow temp.profile Temp [°C] Time[sec] Preheating +150 to +180 150 (typ.) Peak 10 (max.) +2605 Total 300 (max.) Frequency shift : 2ppm 3.) Hand Soldering +350°C 3 sec max 4.) Reflow Times 2 times in below Reflow temp. profile Reflow temp.profile 8.8 Bending Strength Solder this product in center of the circuit board (40mm X 100mm), and add deflection of 3mm. Test board : t=1.6mm 20 PUSH 1.6 Board 10 R5 Product 45 45 R230 press jig UNIT: mm KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16426-00 11 / 11 9. Cautions for use (1) Soldering upon mounting There is a possibility to influence product characteristics when Solder paste or conductive glue comes in contact with product lid or surface. (2) When using mounting machine Please minimize the shock when using mounting machine to avoid any excess stress to the product. (3) Conformity of a circuit We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 3 times the ESR (Equivalent Series Resistance) of crystal unit. 10. Storage conditions Please store product in below conditions, and use within 6 months. Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition. 11. Manufacturing location Kyocera Crystal Device Corporation Yamagata Plant Kyocera Crystal Device Corporation Shiga Yohkaichi Plant Kyocera Crystal Device (Thailand) Co., Ltd 12. Quality Assurance To be guaranteed by Kyocera Crystal Device Quality Assurance Division 13. Quality guarantee In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery, substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is waivered. 14. Others In case of any questions or opinions regarding the Specification, please have it in written manner within 45 days after issued date. KYOCERA Crystal Device Corporation KBS-5079G