CX5032GA08000H0PST02 数据手册
Specifications
Drawing No.
UKY1C-H1-16227-00[40] 1/9
Issued Date.
Mar. 2,2016
TO: Digi-Key
Note:In case of specification change, KYOCERA Part Number also will be changed.
Product Name
Quartz Crystal
Product Model
CX5032GA
Frequency
8000kHz
Customer Part Number
-
Customer Specification Number
-
KYOCERA Part Number
CX5032GA08000H0PST02
Remarks
RoHS Compliant、MSL 1
AEC-Q200 conformity
Customer Acceptance
Accept Signature
Approved Date
Department
Person in charge
Seller
KYOCERA Crystal Device Corporation
Manufacturer
(Sales Division)
6 Takeda Tobadono-cho, Fushimi-ku, Kyoto
612-8501 Japan
TEL. No. 075-604-3500
FAX. No. 075-604-3501
Crystal Units Division
5850, Higashine-Koh, Higashine-Shi, Yamagata
999-3701 Japan
TEL. No. 0237-43-5611
FAX. No. 0237-43-5615
Design Department
Quality Assurance
Approved by
Examination by
Issued by
KYOCERA Crystal Device Corporation
Crystal Units Engineering Section
T. Noritake
H. Shoji
A.Ito
M.Hashimoto
Crystal Units Division
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 2/9
Revision History
Rev.No.
1
Description of revise
First Edition
Date
Approved by
Examination by
Issued by
Mar. 2,2016
H. Shoji
A.Ito
M.Hashimoto
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 3/9
1. APPLICATION
This specification sheet is applied to quartz crystal “CX5032GA08000H0PST02”
2. KYOCERA PART NUMBER
CX5032GA08000H0PST02
3. RATINGS
Items
SYMB.
Rating
Unit
Operating Temperature
Topr
-40 to +125
°C
Storage Temperature Range
Tstg
-40 to +150
°C
Remarks
4. CHARACTERISTICS
ELECTRICAL CHARACTERISTICS
Items
SYMB.
Electrical Specification
Min.
Typ.
Max.
Fundamental
Unit
F0
8
MHz
TNOM
+25
°C
CL
12.0
pF
Mode of Vibration
Nominal
Frequency
Nominal
Temperature
Load Capacitance
Frequency
Tolerance
Frequency
Temperature
Characteristics
Frequency Aging
Rate
Equivalent Series
Resistance
Drive Level
Insulation
Resistance
Test Condition
df/F
-50.0
+50.0
+25±3°C
df/F
-100.0
+100.0
-40 to +125°C
Remarks
PPM
-5.0
ESR
Pd
0.01
IR
500
1st year
+5.0
200
Ω
500
µW
MΩ
+25±3°C
100V(DC)
5. Measurement Condition
5.1 Frequency measurement
Measuring instrument
: PI-Network Test Fixture
Load Capacitance
: 12.0pF
Drive Level
: 10µW
5.2 Equivalent series resistance (ESR) measurement
Measuring instrument
: PI-Network Test Fixture
Load Capacitance
: Series
Drive Level
: 10µW
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 4/9
6. APPEARANCES, PHYSICAL DIMENSION
OUTLINE DIMENSION (not to scale)
(Top View)
②
φ0.60
8000
①
KSS 601Y
④
③
Ⓑ
5.0±0.2
Ⓓ
0.3±0.1
1.3±0.2
0.05
3.6±0.2
(Side View)
1.0±0.2
(Bottom View)
Ⓒ
3.2±0.2
2.0±0.2
1.0±0.2
Ⓐ
4‐R0.15
4-R0.2
Unit : mm
2.4±0.2
Ⓐ
Terminal
W-Ni-Au(Pb-Free)
Ⓑ
CAP
CERAMICS(BLACK)
Ⓒ
BASE
CERAMICS(BLACK)
Ⓓ
GLASS
LOW TEMPERATURE GLASS
MARKING
NOTE
①
NOMINAL FREQUENCY
(5 DIGITS MAX) UNIT: kHz
②
IDENTIFICATION
③
DATE CODE
④
MANUFACTURING
LOCATION
-
YEAR ‥‥ LAST 1 DIGIT of YEAR AND WEEK
EXAMPLE ‥‥Jan. 1,2016 → 601
Y:Japan (Yamagata)
T:Thailand
* The font of marking is reference.
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 5/9
7. RECOMMENDED LAND PATTERN (not to scale)
1.9
2.4
+
1.9
Unit:mm
4.1
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 6/9
8. TAPING & REEL
8.1 Carry tape dimension
4.0±0.1
φ1.55±0.05
Unreeling direction
2.0±0.1
3.6±0.1
5.4±0.1
1.75±0.10
5.5 ±0.1
12.0±0.3
φ1.55±0.05
Unit : mm
1.7±0.1
0.30±0.05
8.0±0.1
8.2 Leader and trailer tape
Empty compartment
SMD parts taped area
Empty compartment
END
START
160 mm min.
400 mm min.
8.3 Taping specification
1. Material of the carrier tape shall be A-PET or PS (ESD)
2. The seal tape shall not cover the sprocket holes. And not protrude from the carrier tape.
3. Tensile strength of the tape : 10N or more.
4. The number of lack is 0.1% of 1 reel total part number (the number of the table letters) or the part following whose 1
either is big. (But, the thing which lack of the continuance is not in.)
5. The R of the corner without designation is 0.3R MAX.
6. Misalignment between centers of the cavity and sprocket hole shall be 0.05mm or less.
7. Peeling force of the seal tape (Peeling speed 300mm/min.): 0.1 to 1.0N.
8. Cumulative pitch error of feed hole : 50 pitch→±0.3mm
9. The marking on parts is not fixed its direction, its electrical characteristic is equal.
165°~180°
Seal tape
Carrier tape
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 7/9
8.4 Reel specifications
W
C
D
E
B
Material :PS
A
φ180 Reel (1,000 pcs. Max.)
Symbol
A
Dimension
Symbol
Dimension
B
C
D
φ180
φ60
φ13
φ21
E
W
2.0
13.0
(Unit : mm)
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 8/9
9.Enviromental requirements
(Reference: AEC-Q200 Rev. D. The solder used by examination is hereafter set to Sn-3Ag-0.5Cu.)
After following test, Frequency applies to each item and CI, ±20% or 5Ω of large value.
No
9.1
Stress
High Temperature Exposure
(Storage)
Reference
MIL-STD-202
Method 108
9.2
Temperature Cycling
JESD22
Method JA-104
9.3
Biased Humidity
MIL-STD- 202
Method 103
9.4
Operational Life
MIL-STD- 202
Method 108
9.5
Terminal Strength (Leaded)
9.6
Resistance to Solvents
9.7
Mechanical Shock
9.8
Vibration
MIL-STD- 202
Method 211
MIL-STD- 202
Method 215
MIL-STD-202
Method 213
MIL-STD-202
Method 204
9.9
Resistance to
Soldering Heat
MIL-STD-202
Method 210
9.10
Solder ability
J-STD-002
9.11
9.12
9.13
Flammability
Board Flex
Terminal Strength(SMD)
UL-94
AEC Q200-005
AEC Q200-006
Additional Requirements
1000 hrs. at rated operating temperature (e.g. 85°C
part can be stored for 1000 hrs at 85°C. Same applies
for 125°C). Unpowered.
Measurement at 24±4 hours after test conclusion.
1000 cycles (-40°C to 125°C) Note: If 85°C part the
1000 cycles will be at that temperature rating.
Measurement at 24±4 hours after test conclusion.
30min maximum dwell time at each temperature
extreme. 1 min. maximum transition time.
1000 hours 85°C/85%RH. Rated VDD applied with 1
MW and inverter in parallel, 2X crystal CL capacitors
between each crystal leg and GND.
Measurement at 24±4 hours after test conclusion.
Note: 1000 hrs @ 125°C. If 85°C part will be tested at
that temperature. Rated VDD applied with 1 MW and
inverter in parallel, 2X crystal CL capacitors between
each crystal leg and GND.
Measurement at 24±4 hours after test conclusion.
Test leaded device lead integrity only. Conditions: A
(227 g), C (227 g).
Note: Also aqueous wash chemical - OKEM clean or
equivalent. Do not use banned solvents.
Figure 1 of Method 213. Condition C
5g's for 20 minutes 12 cycles each of 3 orientations.
Note: Use 8"X5" PCB .031" thick with 7 secure points
on one 8" side and 2 secure points on corners of
opposite sides. Parts mounted within 2" from any
secure point. Test from 10-2000 Hz.
Condition B No pre-heat of samples. Note: Single
Wave solder - Procedure 1 with solder within 1.5 mm of
device body for Leaded. Procedure 1 except 230°C
and immerse only to level to cover terminals for SMD.
For both Leaded & SMD. Electrical Test not required.
Magnification 50 X. Conditions:
Leaded: Method A @ 235°C, category 3.
SMD: a) Method B, 4 hrs @ 155°C dry heat @ 235°C
b) Method B @ 215°C category 3.
c) Method D category 3 @ 260°C.
V-0 or V-1 Acceptable
60 sec minimum holding time.
-
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-16227-00[40] 9/9
10.Cautions for use
(1)Soldering upon mounting
There is a possibility to influence product characteristics when Solder paste or conductive glue comes in
contact with product lid or surface.
(2)When using mounting machine
Please minimize the shock when using mounting machine to avoid any excess stress to the product.
(3)Conformity of a circuit
We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 10 times the
ESR (Equivalent Series Resistance) of crystal unit.
(4)After making the Quartz Crystal mount on a printed circuit board ,if it is required to devide the printed circuit
board into another one, use it with attentive confirmation so that a warp cased by this dividing might not
affect any damage. When designing a printed circuit board as well as handling the mounting As much as
possible. The quartz crystal shall be passed through the reflow furnace. Then it shall be subjected to
standard atmospheric conditions, after which cleaning shall be made.
11.Storage conditions
Please store product in below conditions, and use within 6 months.
Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition.
12. Manufacturing location
Kyocera Crystal Device Corporation / Japan(Yamagata)
Kyocera Crystal Device (Thailand) Co., Ltd / Thailand(Lamphun)
13. Quality Assurance
Kyocera Crystal Device Quality Assurance Division
14. Quality guarantee
In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery,
substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is
waivered.
15.Others
In case of any questions or opinions regarding the Specification, please have it in written manner
within 45 days after issued date.
KYOCERA Crystal Device Corporation
KBS-5079G
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