ST2012SB32768Z0HPWB4

Specifications Drawing No. USY1N-H1-14105-00 Issued Date. 1/6 Apr,15,2014 Messrs: Digi-Key Note: In case of specification change, KYOCERA Part Number also will be changed. Product Name Tuning Fork Crystal Product Model ST2012SB Frequency 32.768 kHz Customer Part Number - Customer Specification Number - KYOCERA Part Number ST2012SB32768Z0HPWB4 Remarks Pb-Free, RoHS Compliant, MSL 1 Customer Acceptance Accept Signature Approved Date Department Person in charge Manufacturer Seller KYOCERA Crystal Device Corporation (Crystal products Sales Division) 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 Design Department Crystal Units Division 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Quality Assurance KYOCERA Crystal Device Corporation Crystal Unit Application Engineering Section Crystal Units Division F.Mukae Approved by T.Soda Checked by A.Muraoka Issued by Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14105-00 2/6 Revision History Rev.No. 0 Description of revise First Edition Date Approved by Checked by Issued by Apr,15,2014 T.Soda A.Muraoka Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14105-00 3/6 1. APPLICATION This specification sheet is applied to tuning fork crystal “ST2012SB”. 2. PART NUMBER ST2012SB32768Z0HPWB4 3. RATINGS Items SYMB. Rating Unit Operating Temperature Topr -40~+85 deg. C Storage Temperature range Tstg -40~+85 deg. C 4. CHARACTERISTICS 4-1 ELECTRICAL CHARACTERISTICS Electrical Specification Item Symbol Condition Min Nominal Frequency fo Ta = 25 deg. C Frequency Tolerance df/fo Ta = 25 deg.C Load Capacitance CL Equivalent series resistance R1 Q-Value Q 9000 Motional capacitance C1 Shunt capacitance Turning point Secondary temperature Coefficient 32.768 -20 Unit kHz 20 4.0 ppm pF kΩ 4.8 6.8 fF Co 0.9 1.7 pF Tp 20 30 deg. C K -4.0 df/F Drive level DL (between electrodes) Max 75 Aging Insulation resistance Typ. Ta = 25 deg. C -8 10 /°C2 -3 0.1 IR 500 3 ppm/year 0.5 µW MΩ 4-2 MOISTURE SENSITIVITY LEVEL Level 1 KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14105-00 4/6 5. APPEARANCES, PHYSICAL DIMENSION OUTLINE DIMENSION CONNECTION (TOP VIEW) (1) 6-(0.1) (2) 0.6MAX K2254 K825AB 4-(0.215) 1.2± 0.1 2.0±0.1 (3) C0.20 4-(R0.1) UNIT : mm 0.80 MARKING 1. 2. 3. Identification Date Code (3 Digits) Load Capacitance K Last 1 digit of year and week Code. (Example) 4.0pF  4 *The font of marking above is for reference purpose. 6. RECOMMENDED LAND PATTERN 0.7 1.4 0.7 1.5 UNIT : mm KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14105-00 5/6 7. RELIABILITY Frequency Stability, and ESR Stability, After stressing. TEST ITEM Frequency Stability ESR Stability Remarks ± 5 kΩ Max or ± 30% Ta=25 deg. C (ppm) 7.1 High temp. use/storage 7.2 Low temp. use/storage 7.3 Shock 7.4 Vibration 7.5 Soldering Heat Resistance reflow 7.6 High temp. With humidity 7.7 Temperature cycle ± 10 ± 10 ± 20 ± 10 ± 10 ± 10 ± 10 8. REFLOW PROFILE Pb-free reflow requirements for soldering heat resistance KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14105-00 6/6 9. Cautions for use (1) Soldering in mounting In case of Solder paste and conductive glue contact product lid or product side face exception for product terminal it’s possible to influence product characteristics. Please be careful above contents. (2) Automatic mounting machine use Please use after affirmation that select the mounting machine model with a shock small if possible in the case of use of an automatic mounting machine, and it does not have breakage. There is a risk of a crystal oscillating child's breakage occurring and not functioning normally by too much shock etc. (3) Conformity of a circuit In case of use of an oscillation circuit, please insert in a crystal oscillating child in series resistance 3 times as many as the standard value of equivalent in-series resistance, and confirm oscillating. Please remove resistance which inserted after the notes above-mentioned examination in the crystal oscillating child in series, and use it. 10. Storage conditions Storage at prolonged high temperature or low temperature and the storage by high humidity cause degradation of frequency accuracy, and degradation of soldering nature. Storage is performed at the temperature of +18 to +30°C, and the humidity of 20 to 70 % in the state of packing, and a term is 6 months. 11. Manufacturing location Kyocera Crystal Device Corporation Shiga Yohkaichi Plant Kyocera Crystal Device (Thailand) Co., Ltd 12. Quality Assurance Kyocera Crystal Device Quality Assurance Division 13. Quality guarantee When the failure by the responsibility of our company occurs clearly after delivery within 1 year, a substitute article etc. is appropriated gratuitously and this is guaranteed. However, when passing 1 year after delivery, there is a case where I am allowed to consider as onerous repair after both consultation. 14. Others When any questions and opinions are in the written matter of these delivery specifications, I will ask connection of you from the company issue day within 45 days. In a connection no case, a written matter is consented to it and employed within a term. KYOCERA Crystal Device Corporation KBS-5079F