AX52HSL

Specification Type : Parameter Frequency range Crystal cut Frequnecy vs.Overtone Issue: 01 Date: 2003-12-22 AX52HSL Quartz Crystal Unit in Hyper Slim-Line (HSL) package min. 20 AT 20 MHz ~ 40 MHz 50 MHz ~ 120 MHz 80 MHz ~ 200 MHz 120 MHz ~ 230 MHz ±5 ~ ±50 10 pF ~ 100 pF, Series ±5 ppm ±10 ppm 0°~+50°C -10°~+60°C ±5 35 Ω 30 Ω 70 Ω 150 Ω 7 100 typ. max. Unit 230 MHz Condition Optimized for turn-over temperature of 25° Adjustment tolerance @ 25°C Load capacitance CL Frequency stability vs. temperature long term (aging) Resonance resistance Rr (typical values) FUND 3rd OT 5th OT 7th OT ppm see Ordering Code 1 see Ordering Code 2 see Ordering Code 3 ppm FUND 3rd OT 5th OT 7th OT pF µW per year @ +55°C Shunt capacitance C0 Drive level Drive level dependence (DLD) Unwanted responses IEC 60444-6 > 2·Rr ≤ 100 MHz >1.5·Rr > 100 MHz 500 -40 +85 -55 +105 HC-52/HSL 1.5 max. 4.8 max. Frequency (MHz) bulk 100 V DC Insulation resistance MΩ °C Operable temperature range °C Storage temperature range IEC 60122-3 or 61837 Enclosure (see drawing) mm Flange width mm Can height Side 1 marking IEC 60286-3 Packing Notes: 1. Terminology and test conditions are according to IEC standard IEC60122-1, unless otherwise stated 2. Measurement technique according to IEC 60444-5 or equivalent Ordering Code: Adjustment Load Frequency stability vs. Frequency tolerance capacitance temperature ppm Code pF Code ppm range Code in MHz AX52HSL ±5 05 10 10 ±5 0°~+50°C 05 any ±10 10 20 20 ±10 -10~+60°C 10 ±25 25 30 30 ±15 -20~+70°C 15 ±50 50 50 50 100 100 S* S *Series resonance: “S” Example: AX52HSL 05-30-10-52,500 MHz Model (Specification) GmbH & Co. KG Buchfinkenweg 8 D-74931 Lobbach Germany page 1(2) wwwAXTAL.com fon: +49 (6226) 9719689 fax: +49 (6226) 970133 E-mail: info@axtal.com Enclosure drawing (in mm) Environmental conditions Test Visual inspection, dimensions Sealing tests Solderability Resistance to soldering heat Shock Free fall Vibration, sinusoidal Endurance tests - ageing - extended aging IEC 60068 Part ... 2-17 2-20 2-27 2-32 2-6 IEC 61178-1 clause ... 4.5 4.6 4.8.2 4.8.3 4.8.8 4.8.9 4.8.7 4.9.1 4.9.2 Test conditions Enclosure styles as in IEC 60122-3, if applicable Gross leak: Test Qc, Fine leak: Test Qk Test Ta (235 ± 5)°C Method 1 Test Tb Method 1A, 5s Test Ea, test conditions on request Test Ed procedure 1, test conditions on request Test Fc, test conditions on request 30 days @ 85°C 1000h, 2000h, 8000h @85°C GmbH & Co. KG Buchfinkenweg 8 D-74931 Lobbach Germany page 2(2) wwwAXTAL.com fon: +49 (6226) 9719689 fax: +49 (6226) 970133 E-mail: info@axtal.com