BS62LV8005EC

BSI FEATURES Very Low Power/Voltage CMOS SRAM 1M X 8 bit GENERAL DESCRIPTION BS62LV8005 • Wide Vcc operation voltage : 4.5V ~ 5.5V • Very low power consumption : Vcc = 5V C-grade: 45mA (Max.) operation current I -grade: 50mA (Max.) operating current 3uA (Typ.) CMOS standby current • High speed access time : -55 55ns (Max) at Vcc = 5V -70 70ns (Max) at Vcc = 5V • Automatic power down when chip is deselected • Three state outputs and TTL compatible • Fully static operation • Data retention supply voltage as low as 1.5V • Easy expansion with CE1, CE2 and OE options The BS62LV8005 is a high performance, very low power CMOS Static Random Access Memory organized as 1,048,576 words by 8 bits and operates from a wide range of 4.5V to 5.5V supply voltage. Advanced CMOS technology and circuit techniques provide both high speed and low power features with a typical CMOS standby current of 3uA and maximum access time of 55ns in 5V operation. Easy memory expansion is provided by an active LOW chip enable (CE1), an active HIGH chip enable(CE2) and active LOW output enable (OE) and three-state output drivers. The BS62LV8005 has an automatic power down feature, reducing the power consumption significantly when chip is deselected. The BS62LV8005 is available in 44 pin TSOP2 and 48-pin BGA type. PRODUCT FAMILY PRODUCT FAMILY BS62LV8005EC BS62LV8005BC BS62LV8005EI BS62LV8005BI OPERATING TEMPERATURE +0 O C to +70O C -40 O C to +85O C Vcc RANGE 4.5V ~ 5.5V 4.5V ~ 5.5V SPEED ( ns ) Vcc=5V ( I CCSB1, Max ) POWER DISSIPATION STANDBY Operating ( I CC , Max ) PKG TYPE TSOP2-44 BGA-48-0810 TSOP2-44 BGA-48-0810 Vcc=5V Vcc=5V 55 / 70 55 / 70 30uA 50uA 45mA 50mA PIN CONFIGURATIONS A4 A3 A2 A1 A0 CE1 NC NC DQ0 DQ1 VCC GND DQ2 DQ3 NC NC WE A19 A18 A17 A16 A15 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 1 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 5 6 A5 A6 A7 OE CE2 A8 NC NC DQ7 DQ6 GND VCC DQ5 DQ4 NC NC A9 A10 A11 A12 A13 A14 FUNCTIONAL BLOCK DIAGRAM BS62LV8005EC BS62LV8005EI A13 A17 A15 A18 A16 A14 A12 A7 A6 A5 A4 Address Input Buffer 22 Row Decoder 2048 Memory Array 2048 X 4096 4096 DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 CE1 CE2 WE OE Vdd Gnd 8 Data Input Buffer 8 Column I/O Write Driver Sense Amp 512 Column Decoder 18 Control Address Input Buffer 2 3 4 A NC OE A0 A1 A2 CE2 8 Data Output Buffer 8 B NC NC A3 A4 CE1 NC C D0 NC A5 A6 NC D4 D VSS D1 A17 A7 D5 VCC E VCC D2 VCC A16 D6 VSS A11A9 A8 A3 A2 A1 A0A10 A19 F D3 NC A14 A15 NC D7 G NC NC A12 A13 WE NC H A18 A8 A9 A10 A11 A19 Brilliance Semiconductor Inc. reserves the right to modify document contents without notice. R0201-BS62LV8005 48-Ball CSP top View 1 Revision 2.4 April 2002 BSI PIN DESCRIPTIONS BS62LV8005 Function These 20 address inputs select one of the 1,048,576 x 8-bit words in the RAM CE1 is active LOW and CE2 is active HIGH. Both chip enables must be active when data read from or write to the device. If either chip enable is not active, the device deselected and is in a standby power mode. The DQ pins will be in the high impedance state when the device is deselected. is Name A0-A19 Address Input CE1 Chip Enable 1 Input CE2 Chip Enable 2 Input WE Write Enable Input The write enable input is active LOW and controls read and write operations. With the chip selected, when WE is HIGH and OE is LOW, output data will be present on the DQ pins; when WE is LOW, the data present on the DQ pins will be written into the selected memory location. OE Output Enable Input The output enable input is active LOW. If the output enable is active while the chip is selected and the write enable is inactive, data will be present on the DQ pins and they will be enabled. The DQ pins will be in the high impedance state when OE is inactive. DQ0-DQ7 Data Input/Output Ports Vcc Gnd These 8 bi-directional ports are used to read data from or write data into the RAM. Power Supply Ground TRUTH TABLE MODE Not selected (Power Down) Output Disabled Read Write WE X X H H L CE1 H X L L L CE2 X L H H H OE X X H L X I/O OPERATION High Z High Z D OUT D IN Vcc CURRENT ICCSB, ICCSB1 ICC ICC ICC ABSOLUTE MAXIMUM RATINGS(1) SYMBOL VTERM TBIAS TSTG PT IOUT PARAMETER Terminal Voltage Respect to GND with OPERATING RANGE UNITS V O RATING -0.5 to Vcc+0.5 -40 to +125 -60 to +150 1.0 20 RANGE Commercial Industrial AMBIENT TEMPERATURE 0 O C to +70 O C -40 C to +85 C O O Vcc 4.5V ~ 5.5V 4.5V ~ 5.5V Temperature Under Bias Storage Temperature Power Dissipation DC Output Current C C O W mA CAPACITANCE (1) (TA = 25oC, f = 1.0 MHz) SYMBOL 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. CIN CDQ PARAMETER Input Capacitance Input/Output Capacitance CONDITIONS MAX. UNIT VIN=0V VI/O=0V 10 12 pF pF 1. This parameter is guaranteed and not tested. R0201-BS62LV8005 2 Revision 2.4 April 2002 BSI DC ELECTRICAL CHARACTERISTICS ( TA = 0oC to + 70oC ) PARAMETER NAME VIL VIH IIL IOL VOL VOH ICC ICCSB ICCSB1 BS62LV8005 TEST CONDITIONS Vcc=5V PARAMETER Guaranteed Input Low (2) Voltage Guaranteed Input High (2) Voltage Input Leakage Current Output Leakage Current Output Low Voltage Output High Voltage Operating Power Supply Current Standby Current-TTL Standby Current-CMOS MIN. -0.5 2.2 ---2.4 ---- TYP. (1) --------3 MAX. 0.8 Vcc+0.2 1 1 0.4 -45 2 30 UNITS V V uA uA V V mA mA uA Vcc=5V Vcc = Max, VIN = 0V to Vcc Vcc = Max, CE1 = VIH or CE2 = VIL or OE = VIH, VI/O = 0V to Vcc Vcc = Max, IOL = 2mA Vcc = Min, IOH = -1mA CE1= VIL, CE2= VIH, IDQ = 0mA, (3) F = Fmax CE1 = VIH, CE2= VIL, IDQ = 0mA CE1 Vcc-0.2V, CE2 0.2V VIN Vcc - 0.2V or VIN 0.2V Vcc=5V Vcc=5V Vcc=5V Vcc=5V Vcc=5V 1. Typical characteristics are at TA = 25oC. 2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included. 3. Fmax = 1/tRC . DATA RETENTION CHARACTERISTICS ( TA = 0 to + 70oC ) SYMBOL VDR PARAMETER Vcc for Data Retention TEST CONDITIONS CE1 Vcc - 0.2V or CE2 VIN Vcc - 0.2V or VIN CE1 VIN 0.2V or 0.2V MIN. 1.5 TYP. (1) -- MAX. -- UNITS V ICCDR tCDR tR Data Retention Current Chip Deselect to Data Retention Time Operation Recovery Time Vcc - 0.2V or CE2 0.2V Vcc - 0.2V or VIN 0.2V -0 0.4 --- 2.5 --- uA ns ns See Retention Waveform TRC (2) 1. Vcc = 1.5V, TA = + 25OC 2. tRC = Read Cycle Time LOW VCC DATA RETENTION WAVEFORM (1) ( CE1 Controlled ) Data Retention Mode VDR ≥ 1.5V Vcc VIH Vcc Vcc t CDR CE1 ≥ Vcc - 0.2V tR VIH CE1 LOW VCC DATA RETENTION WAVEFORM (2) ( CE2 Controlled ) Data Retention Mode Vcc Vcc VDR 1.5V Vcc t CDR tR CE2 0.2V CE2 VIL VIL R0201-BS62LV8005 3 Revision 2.4 April 2002 BSI AC TEST CONDITIONS Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Level Vcc/0 5ns 0.5Vcc WAVEFORM INPUTS BS62LV8005 KEY TO SWITCHING WAVEFORMS OUTPUTS MUST BE STEADY WILL BE CHANGE FROM H TO L WILL BE CHANGE FROM L TO H CHANGE : STATE UNKNOWN CENTER LINE IS HIGH IMPEDANCE ”OFF ”STATE MUST BE STEADY MAY CHANGE FROM H TO L MAY CHANGE FROM L TO H DON T CARE: ANY CHANGE PERMITTED DOES NOT APPLY AC TEST LOADS AND WAVEFORMS 5.0V 1928 Ω 5.0V OUTPUT 1928 Ω , 100PF INCLUDING JIG AND SCOPE 5PF 1020 Ω INCLUDING JIG AND SCOPE 1020 Ω FIGURE 1A THEVENIN EQUIVALENT 667 Ω FIGURE 1B OUTPUT 1.73V ALL INPUT PULSES Vcc GND 10% 90% 90% 10% → ← → ← 5ns FIGURE 2 AC ELECTRICAL CHARACTERISTICS ( TA = 0oC to + 70oC , Vcc = 5V ) READ CYCLE JEDEC PARAMETER PARAMETER NAME NAME DESCRIPTION Read Cycle Time Address Access Time Chip Select Access Time Chip Select Access Time Output Enable to Output Valid Chip Select to Output Low Z Output Enable to Output in Low Z Chip Deselect to Output in High Z Output Disable to Output in High Z Output Disable to Output Address Change BS62LV8005- 70 MIN. TYP. MAX. BS62LV8005- 55 MIN. TYP. MAX. UNIT ns ns ns ns ns ns ns ns ns ns t AVAX t AVQV t E1LQV t E2LQV t GLQV t ELQX t GLQX t EHQZ t GHQZ t AXOX t RC t AA t ACS1 t ACS2 t OE t CLZ t OLZ t CHZ t OHZ t OH 70 -(CE1) (CE2) ----------- -70 70 70 35 --35 30 -- 55 ----10 10 0 0 10 ----------- -55 55 55 30 --30 25 -- ---10 10 0 0 10 R0201-BS62LV8005 4 Revision 2.4 April 2002 BSI SWITCHING WAVEFORMS (READ CYCLE) READ CYCLE1 (1,2,4) BS62LV8005 t RC ADDRESS t D OUT t OH AA t OH READ CYCLE2 (1,3,4) CE2 t t ACS2 ACS1 CE1 t D OUT (5) CLZ t CHZ (5) READ CYCLE3 (1,4) ADDRESS t RC t OE AA t CE2 OE t OH t t t t (5) CLZ ACS2 CE1 OLZ ACS1 t t OHZ CHZ (5) (1,5) D OUT NOTES: 1. WE is high in read Cycle. 2. Device is continuously selected when CE1 = VIL and CE2 = VIH. 3. Address valid prior to or coincident with CE1 transition low and CE2 transition high. 4. OE = VIL . 5. Transition is measured ± 500mV from steady state with CL = 5pF as shown in Figure 1B. The parameter is guaranteed but not 100% tested. R0201-BS62LV8005 5 Revision 2.4 April 2002 BSI AC ELECTRICAL CHARACTERISTICS ( TA = 0oC to + 70oC , Vcc = 5.0V ) WRITE CYCLE JEDEC PARAMETER PARAMETER NAME NAME DESCRIPTION Write Cycle Time Chip Select to End of Write Address Set up Time Address Valid to End of Write Write Pulse Width Write Recovery Time Write to Output in High Z Data to Write Time Overlap Data Hold from Write Time Output Disable to Output in High Z End ot Write to Output Active (CE2,CE1 , WE) BS62LV8005-70 MIN. TYP. MAX. BS62LV8005 BS62LV8005-55 MIN. TYP. MAX. UNIT ns ns ns ns ns ns ns ns ns ns ns tAVAX tE1LWH tAVWL tAVWH tWLWH tWHAX tWLOZ tDVWH tWHDX tGHOZ tWHQX t WC t CW t AS t AW t WP t WR t WHZ t DW t DH t OHZ t OW 70 70 0 70 35 0 0 30 0 0 5 ------------ ------30 --30 -- 55 55 0 55 30 0 0 25 0 0 5 ------------ ------25 --25 -- SWITCHING WAVEFORMS (WRITE CYCLE) WRITE CYCLE1 (1) ADDRESS t WC t WR OE (3) CE2 (5) t CW CE1 (5) (11) t AW WE (3) t AS (4,10) t WP (2) t OHZ D OUT t DH t DW D IN R0201-BS62LV8005 6 Revision 2.4 April 2002 BSI WRITE CYCLE2 (1,6) BS62LV8005 t WC ADDRESS CE2 (11) CE1 (5) t CW t WE AW t WP t WR (3) (2) t AS (4,10) t DH (7) (8) t WHZ D OUT t DW t DH (8,9) D IN NOTES: 1. WE must be high during address transitions. 2. The internal write time of the memory is defined by the overlap of CE2, CE1 and WE low. All signals must be active to initiate a write and any one signal can terminate a write by going inactive. The data input setup and hold timing should be referenced to the second transition edge of the signal that terminates the write. 3. TWR is measured from the earlier of CE2 going low, or CE1 or WE going high at the end of write cycle. 4. During this period, DQ pins are in the output state so that the input signals of opposite phase to the outputs must not be applied. 5. If the CE2 high transition or CE1 low transition occurs simultaneously with the WE low transitions or after the WE transition, output remain in a high impedance state. 6. OE is continuously low (OE = VIL ). 7. DOUT is the same phase of write data of this write cycle. 8. DOUT is the read data of next address. 9. If CE2 is high or CE1 is low during this period, DQ pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them. 10. Transition is measured ± 500mV from steady state with CL = 5pF as shown in Figure 1B. The parameter is guaranteed but not 100% tested. 11. TCW is measured from the later of CE2 going high or CE1 going low to the end of write. R0201-BS62LV8005 7 Revision 2.4 April 2002 BSI ORDERING INFORMATION BS62LV8005 BS62LV8005 XX YY SPEED 55: 55ns 70: 70ns GRADE C: +0oC ~ +70oC I: -40oC ~ +85oC PACKAGE E: TSOP2-44 B: BGA-48-0810 PACKAGE DIMENSIONS TSOP2-44 R0201-BS62LV8005 8 Revision 2.4 April 2002 BSI PACKAGE DIMENSIONS (continued) 0.05 NOTES: BS62LV8005 0.25 1: CONTROLLING DIMENSIONS ARE IN MILLIMETERS. 2: PIN#1 DOT MARKING BY LASER OR PAD PRINT. 3: SYMBOL "N" IS THE NUMBER OF SOLDER BALLS. 1.4 Max. SIDE VIEW D 0.1 D1 N 48 D 10.0 E 8.0 D1 5.25 E1 3.75 e 0.75 SOLDER BALL 0.35 0.05 e E1 VIEW A 48 mini-BGA (8 x 10mm) E 0.1 R0201-BS62LV8005 9 Revision 2.4 April 2002 BSI REVISION HISTORY Revision 2.2 2.3 2.4 BS62LV8005 Description 2001 Data Sheet release Date Apr. 15, 2001 Note Modify Standby Current (Typ. and Jun. 29, 2001 Max.) Modify some AC parameters. April,11,2002 R0201-BS62LV8005 10 Revision 2.4 April 2002