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74AHCT1G08DCKRG4

74AHCT1G08DCKRG4

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SC-70-5

  • 描述:

    IC GATE AND 1CH 2-INP SC70-5

  • 数据手册
  • 价格&库存
74AHCT1G08DCKRG4 数据手册
Product Folder Sample & Buy Technical Documents Support & Community Tools & Software SN74AHCT1G08 SCLS315Q – MARCH 1996 – REVISED APRIL 2016 SN74AHCT1G08 Single 2-Input Positive-AND Gate 1 Features 3 Description • • • • • • The SN74AHCT1G08 device is a single 2-input positive-AND gate. The device performs the Boolean function Y = A • B or Y = A + B in positive logic. Low ICC current allows this device to be used in powersensitive or battery-powered applications. 1 Operating Range: 4.5 V to 5.5 V Maximum tpd of 7.1 ns at 5 V Low Power Consumption: Maximum ICC of 10-µA ±8-mA Output Drive at 5 V Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Applications • • • • • • • • • • • • TV, Set-Top Box, and Audio Wireless Infrastructure Factory Automation and Control PC and Notebooks Building Automation Grid Infrastructure Medical, Healthcare, and Fitness Printers Test and Measurement EPOS (Electronic Point of Sale) Telecom Infrastructure Projectors Device Information(1) PART NUMBER PACKAGE BODY SIZE (NOM) SN74AHCT1G08DBVR SOT-23 (5) 2.90 mm x 1.60 mm SN74AHCT1G08DCKR SC70 (5) 2.00 mm x 1.25 mm SN74AHCT1G08DRLR SOT (5) 1.60 mm x 1.20 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Logic Diagram A B 1 2 4 Y 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. SN74AHCT1G08 SCLS315Q – MARCH 1996 – REVISED APRIL 2016 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 3 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 3 3 4 4 4 5 5 5 Absolute Maximum Ratings ...................................... ESD Ratings.............................................................. Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Switching Characteristics .......................................... Operating Characteristics.......................................... Typical Characteristics .............................................. Parameter Measurement Information .................. 6 Detailed Description .............................................. 7 8.1 Overview ................................................................... 7 8.2 Functional Block Diagram ......................................... 7 8.3 Feature Description................................................... 7 8.4 Device Functional Modes.......................................... 7 9 Application and Implementation .......................... 8 9.1 Application Information.............................................. 8 9.2 Typical Application .................................................... 8 10 Power Supply Recommendations ....................... 9 11 Layout..................................................................... 9 11.1 Layout Guidelines ................................................... 9 11.2 Layout Example ...................................................... 9 12 Device and Documentation Support ................. 10 12.1 12.2 12.3 12.4 12.5 Documentation Support ........................................ Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 10 10 10 10 10 13 Mechanical, Packaging, and Orderable Information ........................................................... 10 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision P (May 2013) to Revision Q • Added Applications section, Device Information table, Table of Contents, Pin Configuration and Functions section, Specifications section, ESD Ratings table, Thermal Information table, Typical Characteristics section, Detailed Description section, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section ...... 1 Changes from Revision O (June 2005) to Revision P • 2 Page Page Extended operating temperature range to 125°C................................................................................................................... 4 Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 SN74AHCT1G08 www.ti.com SCLS315Q – MARCH 1996 – REVISED APRIL 2016 5 Pin Configuration and Functions DBV, DCK, and DRL Packages 5-Pin SOT-23, SC70, and SOT Top View A 1 B 2 GND 3 5 V 4 Y CC   Pin Functions PIN NAME NO. I/O DESCRIPTION A 1 I Input A B 2 I Input B GND 3 — Ground Pin VCC 5 — Supply Pin Y 4 O Output 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted). (1) MIN MAX UNIT Supply voltage –0.5 7 V Input voltage (2) –0.5 7 V Output voltage (2) –0.5 VCC + 0.5 V Input clamp current VI < 0 –20 mA Output clamp current VO < 0 or VO > VCC ±20 mA Continuous output current VO = 0 to VCC ±25 mA Continuous current through VCC or GND ±50 mA Maximum junction temperature, TJ 150 °C 150 °C Storage temperature, Tstg (1) (2) –65 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 6.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2500 Charged-device model (CDM), per JEDEC specification JESD22-C101 (2) ±1000 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 3 SN74AHCT1G08 SCLS315Q – MARCH 1996 – REVISED APRIL 2016 www.ti.com 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) (1) MIN MAX 4.5 5.5 UNIT VCC Supply voltage VIH High-level input voltage VIL Low-level input voltage VI Input voltage VO Output voltage IOH High-level output current –8 mA IOL Low-level output current 8 mA Δt/Δv Input transition rise and fall rate 20 ns/V TA Operating free-air temperature 125 °C (1) 2 V V 0.8 V 0 5.5 V 0 VCC –40 V All unused inputs of the device must be held at VCC or GND to ensure proper device operation. See TI application report, Implications of Slow or Floating CMOS Inputs (SCBA004). 6.4 Thermal Information SN74AHCT1G08 THERMAL METRIC (1) DBV (SOT-23) DCK (SC70) DRL (SOT) 5 PINS 5 PINS 5 PINS UNIT 226 277.5 242.9 °C/W RθJA Junction-to-ambient thermal resistance RθJC(top) Junction-to-case (top) thermal resistance 165 92.9 77.5 °C/W RθJB Junction-to-board thermal resistance 59.1 64.2 77.5 °C/W ψJT Junction-to-top characterization parameter 45.5 1.9 9.6 °C/W ψJB Junction-to-board characterization parameter 58.3 63.5 77.3 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 6.5 Electrical Characteristics over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS IOH = –50 µA, VCC = 4.5 V High-level output voltage VOH IOH = –8 mA, VCC = 4.5 V TA = 25°C TA = –40°C to 125°C TA = 25°C MIN TYP 4.4 4.5 4.4 TA = –40°C to 125°C Low-level output voltage IOL = 8 mA, VCC = 4.5 V 3.8 0.1 TA = 25°C 0.36 TA = –40°C to 125°C 0.44 TA = 25°C ±0.1 II Input current VI = 5.5 V or GND, VCC = 0 V to 5.5 V ICC Supply current VI = VCC or GND, IO = 0, VCC = 5.5 V TA = 25°C ΔICC (1) Change in supply current One input at 3.4 V, Other Inputs at VCC or GND, VCC = 5.5 V TA = 25°C CI Input capacitance VI = VCC or GND, VCC = 5 V (1) 4 UNIT V 3.94 IOL = 50 µA, VCC = 4.5 V VOL MAX TA = –40°C to 125°C ±1 1 TA = –40°C to 125°C 10 1.35 TA = –40°C to 125°C 1.5 4 10 V µA µA mA pF This is the increase in supply current for each input at one of the specified TTL voltage levels, rather than 0 V or VCC. Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 SN74AHCT1G08 www.ti.com SCLS315Q – MARCH 1996 – REVISED APRIL 2016 6.6 Switching Characteristics over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V (unless otherwise noted) (see Figure 2) PARAMETER FROM (INPUT) TO (OUTPUT) OUTPUT CAPACITANCE A or B Y CL = 15 pF TEST CONDITIONS MIN TYP MAX 5 6.2 TA = 25°C tPLH Propagation delay, low to high transition TA = –40°C to 85°C 1 7.1 TA = –40°C to 125°C 1 7.5 TA = 25°C tPHL Propagation delay, high to low transition A or B Y CL = 15 pF 5 1 7.1 TA = –40°C to 125°C 1 7.5 tPLH A or B Y CL = 50 pF 5.5 Propagation delay, high to low transition A or B Y CL = 50 pF 1 9 TA = –40°C to 125°C 1 10 5.5 ns 7.9 Propagation delay, high to low transition TA = 25°C tPHL ns 6.2 TA = –40°C to 85°C TA = 25°C Propagation delay, low to high transition UNIT ns 7.9 TA = –40°C to 85°C 1 9 TA = –40°C to 125°C 1 10 ns 6.7 Operating Characteristics VCC = 5 V, TA = 25°C PARAMETER Cpd TEST CONDITIONS Power dissipation capacitance TYP No load, f = 1 MHz UNIT 18 pF 6.8 Typical Characteristics 8 7.5 7 Tpd (ns) 6.5 6 5.5 5 4.5 Tpd vs. Temp 4 -25 -5 15 35 55 75 95 115 135 Temperature (ƒC) C001 CL = 15 pF Figure 1. Tpd vs Temperature Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 5 SN74AHCT1G08 SCLS315Q – MARCH 1996 – REVISED APRIL 2016 www.ti.com 7 Parameter Measurement Information From Output Under Test RL = 1 kΩ From Output Under Test Test Point VCC Open S1 TEST GND CL (see Note A) CL (see Note A) S1 tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open Drain Open VCC GND VCC LOAD CIRCUIT FOR 3-STATE AND OPEN-DRAIN OUTPUTS LOAD CIRCUIT FOR TOTEM-POLE OUTPUTS 3V 1.5 V Timing Input 0V tw 3V 1.5 V Input 1.5 V th tsu 3V 1.5 V Data Input 1.5 V 0V 0V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES VOLTAGE WAVEFORMS PULSE DURATION 3V 1.5 V Input 1.5 V 0V tPHL tPLH In-Phase Output 50% VCC Output Waveform 1 S1 at VCC (see Note B) 50% VCC VOH 50% VCC VOL 1.5 V 1.5 V 0V tPLZ tPZL ≈VCC 50% VCC Output Waveform 2 S1 at GND (see Note B) VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING AND NONINVERTING OUTPUTS VOL + 0.3 V VOL tPHZ tPZH tPLH tPHL Out-of-Phase Output VOH 50% VCC VOL 3V Output Control 50% VCC VOH − 0.3 V VOH ≈0 V VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES LOW- AND HIGH-LEVEL ENABLING CL includes probe and jig capacitance. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns. The outputs are measured one at a time with one input transition per measurement. All parameters and waveforms are not applicable to all devices. Figure 2. Load Circuit and Voltage Waveforms 6 Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 SN74AHCT1G08 www.ti.com SCLS315Q – MARCH 1996 – REVISED APRIL 2016 8 Detailed Description 8.1 Overview The SN74AHCT1G08 device is a single 2-input positive-AND gate. The device performs the Boolean AND function (Y = A • B or Y = A + B) in positive logic. Low ICC current allows this device to be used in powersensitive or battery-powered applications. Robust inputs allow the device to up-translate with a propagation delay of 20 ns. 8.2 Functional Block Diagram A B 1 4 2 Y Figure 3. Logic Diagram (Positive Logic) 8.3 Feature Description The VCC for the device is optimized at 5 V. Up voltage translation from 3.3 V to 5 V is allowed. The inputs accept VIH levels of 2 V. Output ringing is minimized by slow edge rates. Inputs are TTL-Voltage compatible. 8.4 Device Functional Modes Table 1 lists the functional modes of the SN74AHCT1G08. Table 1. Function Table INPUTS OUTPUT A B Y H H H L X L X L L Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 7 SN74AHCT1G08 SCLS315Q – MARCH 1996 – REVISED APRIL 2016 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information The SN74AHCT1G08 device is a single AND gate, which is often used for many common functions like power sequencing or an on LED indicator. Because the device is configured to output LOW unless all inputs are HIGH, an LED tied to the output of the device will only turn HIGH when all systems connected are sending a HIGH, or ready signal. 9.2 Typical Application AND Logic Function Basic LED Driver VCC VCC A– uC or Logic A– uC or Logic Y– uC or Logic B– uC or Logic AHCT1G08 B– uC or Logic AHCT1G08 Copyright © 2016, Texas Instruments Incorporated Figure 4. Typical Application Diagram 9.2.1 Design Requirements This device uses CMOS technology and has balanced output drive. Take care to avoid bus contention because it can drive currents that would exceed maximum limits. The high drive also creates fast edges into light loads, so routing and load conditions must be considered to prevent ringing. 9.2.2 Detailed Design Procedure 1. Recommended Input Conditions – For rise time and fall time specifications, see Δt/ΔV in Recommended Operating Conditions. – For specified high and low levels, see VIH and VIL in Recommended Operating Conditions. – Inputs are overvoltage tolerant allowing them to go as high as 5.5 V at any valid VCC. 2. Recommended Output Conditions – Load currents must not exceed 25 mA per output and 50 mA total for the part. – Outputs must not be pulled above VCC. 8 Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 SN74AHCT1G08 www.ti.com SCLS315Q – MARCH 1996 – REVISED APRIL 2016 Typical Application (continued) 9.2.3 Application Curve 5.5 AHCT1G08 AC HC VI 5 4.5 4 3.5 Voltage (V) 3 2.5 2 1.5 1 0.5 0 –0.5 –1.5 0 2 4 6 8 10 12 14 16 18 20 Time (ns) Load = 50 Ω / 50 pF VCC = 5 V Figure 5. Typical Switching Characteristics 10 Power Supply Recommendations The power supply can be any voltage between the minimum and maximum supply voltage rating located in Recommended Operating Conditions. Each VCC pin must have a good bypass capacitor to prevent power disturbance. TI recommends a 0.1-µF capacitor for devices with a single supply; and a 0.01-µF or 0.022-µF capactor for each power pin if there are multiple VCC pins. It is ok to parallel multiple bypass capacitors to reject different frequencies of noise. 0.1-μF and 1-μF capacitors are commonly used in parallel. The bypass capacitor must be installed as close to the power pin as possible for best results. 11 Layout 11.1 Layout Guidelines When using multiple bit logic devices inputs must not ever float. In many cases, functions or parts of functions of digital logic devices are unused; for example, when only two inputs of a triple-input AND gate are used or only 3 of the 4 buffer gates are used. Such input pins must not be left unconnected because the undefined voltages at the outside connections result in undefined operational states. Observe the following rules under all circumstances. • All unused inputs of digital logic devices must be connected to a high or low bias to prevent them from floating. • The logic level that must be applied to any particular unused input depends on the function of the device. Generally they will be tied to GND or VCC, whichever make more sense or is more convenient. 11.2 Layout Example VCC Unused Input Input Output Unused Input Output Input Figure 6. Layout Diagram Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 9 SN74AHCT1G08 SCLS315Q – MARCH 1996 – REVISED APRIL 2016 www.ti.com 12 Device and Documentation Support 12.1 Documentation Support 12.1.1 Related Documentation For related documentation, see the following: Implications of Slow or Floating CMOS Inputs, SCBA004 12.2 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.3 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.4 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.5 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical packaging and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser based versions of this data sheet, refer to the left hand navigation. 10 Submit Documentation Feedback Copyright © 1996–2016, Texas Instruments Incorporated Product Folder Links: SN74AHCT1G08 PACKAGE OPTION ADDENDUM www.ti.com 14-Oct-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) Samples (4/5) (6) 74AHCT1G08DBVRG4 ACTIVE SOT-23 DBV 5 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 B08G Samples 74AHCT1G08DCKRE4 ACTIVE SC70 DCK 5 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 (BE3, BEG, BEJ, BE L, BES) Samples 74AHCT1G08DCKRG4 ACTIVE SC70 DCK 5 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 (BE3, BEG, BEJ, BE L, BES) Samples 74AHCT1G08DCKTG4 ACTIVE SC70 DCK 5 250 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 (BE3, BEG, BEL, BE S) Samples 74AHCT1G08DRLRG4 ACTIVE SOT-5X3 DRL 5 4000 RoHS & Green NIPDAUAG Level-1-260C-UNLIM -40 to 125 (BEB, BES) Samples SN74AHCT1G08DBV3 ACTIVE SOT-23 DBV 5 3000 RoHS & Non-Green SNBI Level-1-260C-UNLIM -40 to 125 B08Y Samples SN74AHCT1G08DBVR ACTIVE SOT-23 DBV 5 3000 RoHS & Green NIPDAU | SN Level-1-260C-UNLIM -40 to 125 (B083, B08G, B08J, B08L, B08S) Samples SN74AHCT1G08DBVT ACTIVE SOT-23 DBV 5 250 RoHS & Green NIPDAU | SN Level-1-260C-UNLIM -40 to 125 (B083, B08G, B08J, B08L, B08S) Samples SN74AHCT1G08DCK3 ACTIVE SC70 DCK 5 3000 RoHS & Non-Green SNBI Level-1-260C-UNLIM -40 to 125 BEY Samples SN74AHCT1G08DCKR ACTIVE SC70 DCK 5 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 (BE3, BEG, BEJ, BE L, BES) Samples SN74AHCT1G08DCKT ACTIVE SC70 DCK 5 250 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 (BE3, BEG, BEL, BE S) Samples SN74AHCT1G08DRLR ACTIVE SOT-5X3 DRL 5 4000 RoHS & Green NIPDAU | NIPDAUAG Level-1-260C-UNLIM -40 to 125 (BEB, BES) Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Addendum-Page 1 PACKAGE OPTION ADDENDUM www.ti.com 14-Oct-2022 Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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