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ADC121S021
Single Channel, 50 to 200 ksps, 12-Bit A/D Converter
General Description
Features
The ADC121S021 is a low-power, single channel CMOS 12bit analog-to-digital converter with a high-speed serial interface. Unlike the conventional practice of specifying performance at a single sample rate only, the ADC121S021 is fully
specified over a sample rate range of 50 ksps to 200 ksps.
The converter is based upon a successive-approximation
register architecture with an internal track-and-hold circuit.
The output serial data is straight binary, and is compatible with
several standards, such as SPI™, QSPI™, MICROWIRE,
and many common DSP serial interfaces.
The ADC121S021 operates with a single supply that can
range from +2.7V to +5.25V. Normal power consumption using a +3.6V or +5.25V supply is 1.5 mW and 7.9 mW, respectively. The power-down feature reduces the power consumption to as low as 2.6 µW using a +5.25V supply.
The ADC121S021 is packaged in 6-lead LLP and SOT-23
packages. Operation over the industrial temperature range of
−40°C to +85°C is guaranteed.
■
■
■
■
■
Specified over a range of sample rates.
6-lead LLP and SOT-23 packages
Variable power management
Single power supply with 2.7V - 5.25V range
SPI™/QSPI™/MICROWIRE/DSP compatible
Key Specifications
■
■
■
■
■
DNL
INL
SNR
Power Consumption
— 3.6V Supply
— 5.25V Supply
+0.45 / -0.25 LSB (typ)
+0.45 / -0.4 LSB (typ)
72.3 dB (typ)
1.5 mW (typ)
7.9 mW (typ)
Applications
■ Portable Systems
■ Remote Data Acquisition
■ Instrumentation and Control Systems
Pin-Compatible Alternatives by Resolution and Speed
All devices are fully pin and function compatible.
Resolution
Specified for Sample Rate Range of:
50 to 200 ksps
200 to 500 ksps
500 ksps to 1 Msps
12-bit
ADC121S021
ADC121S051
ADC121S101
10-bit
ADC101S021
ADC101S051
ADC101S101
8-bit
ADC081S021
ADC081S051
ADC081S101
Connection Diagram
20145105
Ordering Information
Temperature Range
Description
Top Mark
ADC121S021CISD
Order Code
−40°C to +85°C
6-Lead LLP Package
X7C
ADC121S021CISDX
−40°C to +85°C
6-Lead LLP Package, Tape and Reel
X7C
ADC121S021CIMF
−40°C to +85°C
6-Lead SOT-23 Package
X07C
ADC121S021CIMFX
−40°C to +85°C
6-Lead SOT-23 Package, Tape & Reel
X07C
ADC121S021EVAL
SOT-23 Evaluation Board
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
© 2010 National Semiconductor Corporation
201451
www.national.com
ADC121S021 Single Channel, 50 to 200 ksps, 12-Bit A/D Converter
January 13, 2010
ADC121S021
Block Diagram
20145107
Pin Descriptions and Equivalent Circuits
Pin No.
Symbol
Description
ANALOG I/O
VIN
3
Analog input. This signal can range from 0V to VA.
DIGITAL I/O
4
SCLK
Digital clock input. This clock directly controls the conversion and readout processes.
5
SDATA
6
CS
Chip select. On the falling edge of CS, a conversion process begins.
1
VA
Positive supply pin. This pin should be connected to a quiet +2.7V to +5.25V source and bypassed to
GND with a 1 µF capacitor and a 0.1 µF monolithic capacitor located within 1 cm of the power pin.
2
GND
The ground return for the supply and signals.
PAD
GND
For package suffix CISD(X) only, it is recommended that the center pad should be connected to ground.
Digital data output. The output samples are clocked out of this pin on falling edges of the SCLK pin.
POWER SUPPLY
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2
(Note 1, Note 2)
Operating Temperature Range
2)
VA Supply Voltage
Digital Input Pins Voltage Range
(regardless of supply voltage)
Analog Input Pins Voltage Range
Clock Frequency
Sample Rate
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Analog Supply Voltage VA
Voltage on Any Digital Pin to GND
Voltage on Any Analog Pin to GND
Input Current at Any Pin (Note 3)
Package Input Current (Note 3)
Power Consumption at TA = 25°C
ESD Susceptibility (Note 5)
Human Body Model
Machine Model
−0.3V to 6.5V
−0.3V to 6.5V
−0.3V to (VA +0.3V)
±10 mA
±20 mA
See (Note 4)
Junction Temperature
Storage Temperature
−40°C ≤ TA ≤ +85°C
+2.7V to +5.25V
−0.3V to +5.25V
0V to VA
25 kHz to 20 MHz
up to 1Msps
Package Thermal Resistance
3500V
300V
+150°C
−65°C to +150°C
Package
θJA
6-lead LLP
6-lead SOT-23
94°C / W
265°C / W
Soldering
process
must
comply
with
National
Semiconductor's Reflow Temperature Profile specifications.
Refer to www.national.com/packaging. (Note 6)
ADC121S021 Converter Electrical Characteristics
(Note 7, Note 9)
The following specifications apply for VA = +2.7V to 5.25V, fSCLK = 1 MHz to 4 MHz, fSAMPLE = 50 ksps to 200 ksps, CL = 15 pF,
unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.
Symbol
Parameter
Conditions
Typical
Limits
(Note 9)
Units
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes
12
VA = +2.7V to +3.6V
INL
Integral Non-Linearity
VA = +4.75v to +5.25V
VA = +2.7V to +3.6V
DNL
Differential Non-Linearity
VA = +4.75v to +5.25V
VOFF
Offset Error
GE
Gain Error
+0.45
−0.40
±1.0
+0.55
Bits
LSB (max)
LSB (min)
LSB (max)
−0.40
LSB (min)
+0.45
+1.0
−0.25
−0.8
LSB (max)
LSB (min)
+0.60
LSB (max)
−0.30
LSB (min)
VA = +2.7v to +3.6V
−0.18
VA = +4.75v to +5.25V
−0.26
VA = +2.7 to +3.6V
−0.75
VA = +4.75v to +5.25V
−1.6
±1.2
±1.5
LSB (max)
LSB (max)
DYNAMIC CONVERTER CHARACTERISTICS
Signal-to-Noise Plus Distortion Ratio
VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS
72
70
dBFS (min)
SNR
Signal-to-Noise Ratio
VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS
72.3
70.8
dBFS (min)
THD
Total Harmonic Distortion
VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS
−83
dBFS
SFDR
Spurious-Free Dynamic Range
VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS
85
dB
ENOB
Effective Number of Bits
VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS
11.7
Intermodulation Distortion, Second
Order Terms
VA = +5.25V
fa = 103.5 kHz, fb = 113.5 kHz
−83
dBFS
Intermodulation Distortion, Third Order VA = +5.25V
Terms
fa = 103.5 kHz, fb = 113.5 kHz
−82
dBFS
SINAD
IMD
3
11.3
Bits (min)
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ADC121S021
Operating Ratings
Absolute Maximum Ratings (Note 1, Note
ADC121S021
Symbol
FPBW
Parameter
-3 dB Full Power Bandwidth
Conditions
Typical
Limits
(Note 9)
Units
VA = +5V
11
MHz
VA = +3V
8
MHz
ANALOG INPUT CHARACTERISTICS
VIN
Input Range
IDCL
DC Leakage Current
CINA
Input Capacitance
0 to VA
V
±1
µA (max)
Track Mode
30
pF
Hold Mode
4
pF
DIGITAL INPUT CHARACTERISTICS
VIH
Input High Voltage
VIL
Input Low Voltage
IIN
Input Current
CIND
VA = +5.25V
2.4
V (min)
VA = +3.6V
2.1
V (min)
VA = +5V
0.8
V (max)
VA = +3V
0.4
V (max)
±0.1
±1
µA (max)
2
4
pF (max)
ISOURCE = 200 µA
VA − 0.07
VA − 0.2
V (min)
ISOURCE = 1 mA
VA − 0.1
ISINK = 200 µA
0.03
0.4
V (max)
ISINK = 1 mA
0.1
VIN = 0V or VA
Digital Input Capacitance
DIGITAL OUTPUT CHARACTERISTICS
VOH
VOL
Output High Voltage
Output Low Voltage
IOZH, IOZL TRI-STATE® Leakage Current
COUT
TRI-STATE® Output Capacitance
V
V
±0.1
±10
µA (max)
2
4
pF (max)
Output Coding
Straight (Natural) Binary
POWER SUPPLY CHARACTERISTICS
VA
Supply Voltage
Supply Current, Normal Mode
(Operational, CS low)
IA
Supply Current, Shutdown (CS high)
Power Consumption, Normal Mode
(Operational, CS low)
PD
Power Consumption, Shutdown (CS
high)
2.7
V (min)
5.25
V (max)
VA = +5.25V,
fSAMPLE = 200 ksps
1.5
2.8
mA (max)
VA = +3.6V,
fSAMPLE = 200 ksps
0.40
1.2
mA (max)
fSCLK = 0 MHz, VA = +5.25V
fSAMPLE = 0 ksps
500
nA
VA = +5.25V, fSCLK = 4 MHz,
fSAMPLE = 0 ksps
60
µA
VA = +5.25V
7.9
14.7
mW (max)
VA = +3.6V
1.5
4.3
mW (max)
fSCLK = 0 MHz, VA = +5.25V
fSAMPLE = 0 ksps
2.6
µW
VA = +5.25V, fSCLK = 4 MHz,
fSAMPLE = 0 ksps
315
µW
AC ELECTRICAL CHARACTERISTICS
fSCLK
Clock Frequency
(Note 8)
Sample Rate
(Note 8)
DC
SCLK Duty Cycle
fSCLK = 4 MHz
tACQ
fS
tQUIET
1.0
MHz (min)
4.0
MHz (max)
50
ksps (min)
200
ksps (max)
40
% (min)
60
% (max)
Minimum Time Required for Acquisition
350
ns (max)
(Note 10)
50
ns (min)
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50
4
Parameter
Conditions
Typical
Limits
(Note 9)
Units
tAD
Aperture Delay
3
ns
tAJ
Aperture Jitter
30
ps
ADC121S021 Timing Specifications
The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 1.0 MHz to 4.0 MHz, CL = 25 pF,
fSAMPLE = 50 ksps to 200 ksps, Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.
Symbol
Parameter
Conditions
Typical
Limits
Units
tCS
Minimum CS Pulse Width
10
ns (min)
tSU
CS to SCLK Setup Time
10
ns (min)
20
ns (max)
40
ns (max)
tEN
Delay from CS Until SDATA
(Note 11)
tACC
Data Access Time after SCLK Falling Edge (Note 12)
tCL
SCLK Low Pulse Width
tCH
SCLK High Pulse Width
tH
tDIS
TRI-STATE®
Disabled
SCLK to Data Valid Hold Time
SCLK Falling Edge to SDATA High Impedance (Note
13)
VA = +2.7V to +3.6V
VA = +4.75V to +5.25V
VA = +2.7V to +3.6V
VA = +4.75V to +5.25V
VA = +2.7V to +3.6V
VA = +4.75V to +5.25V
tPOWER-UP Power-Up Time from Full Power-Down
20
ns (max)
0.4 x tSCLK
ns (min)
0.4 x tSCLK
ns (min)
7
ns (min)
5
ns (min)
25
ns (max)
6
ns (min)
25
ns (max)
5
ns (min)
1
µs
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All voltages are measured with respect to GND = 0V, unless otherwise specified.
Note 3: When the input voltage at any pin exceeds the power supply (that is, VIN < GND or VIN > VA), the current at that pin should be limited to 10 mA. The 20
mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 10 mA to two. The Absolute
Maximum Rating specification does not apply to the VA pin. The current into the VA pin is limited by the Analog Supply Voltage specification.
Note 4: The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by TJmax, the
junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula PDmax = (TJmax − TA) / θJA. The values
for maximum power dissipation listed above will be reached only when the device is operated in a severe fault condition (e.g. when input or output pins are driven
beyond the power supply voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided.
Note 5: Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through zero ohms
Note 6: Reflow temperature profiles are different for lead-free and non-lead-free packages.
Note 7: Tested limits are guaranteed to National's AOQL (Average Outgoing Quality Level).
Note 8: This is the frequency range over which the electrical performance is guaranteed. The device is functional over a wider range which is specified under
Operating Ratings.
Note 9: Data sheet min/max specification limits are guaranteed by design, test, or statistical analysis.
Note 10: Minimum Quiet Time required by bus relinquish and the start of the next conversion.
Note 11: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V.
Note 12: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V or 2.0V.
Note 13: tDIS is derived from the time taken by the outputs to change by 0.5V with the timing test circuit shown in Figure 1. The measured number is then adjusted
to remove the effects of charging or discharging the output capacitance. This means that tDIS is the true bus relinquish time, independent of the bus loading.
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ADC121S021
Symbol
ADC121S021
Timing Diagrams
20145108
FIGURE 1. Timing Test Circuit
20145106
FIGURE 2. ADC121S021 Serial Timing Diagram
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6
ACQUISITION TIME is the time required to acquire the input
voltage. That is, it is time required for the hold capacitor to
charge up to the input voltage. Acquisition time is measured
backwards from the falling edge of CS when the signal is
sampled and the part moves from track to hold. The start of
the time interval that contains TACQ is the 13th rising edge of
SCLK of the previous conversion when the part moves from
hold to track. The user must ensure that the time between the
13th rising edge of SCLK and the falling edge of the next
CS is not less than TACQ to meet performance specifications.
APERTURE DELAY is the time after the falling edge of CS
to when the input signal is acquired or held for conversion.
APERTURE JITTER (APERTURE UNCERTAINTY) is the
variation in aperture delay from sample to sample. Aperture
jitter manifests itself as noise in the output.
CONVERSION TIME is the time required, after the input voltage is acquired, for the ADC to convert the input voltage to a
digital word. This is from the falling edge of CS when the input
signal is sampled to the 16th falling edge of SCLK when the
SDATA output goes into TRI-STATE.
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
DUTY CYCLE is the ratio of the time that a repetitive digital
waveform is high to the total time of one period. The specification here refers to the SCLK.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE
BITS) is another method of specifying Signal-to-Noise and
Distortion
or
SINAD.
ENOB
is
defined
as
(SINAD − 1.76) / 6.02 and says that the converter is equivalent to a perfect ADC of this (ENOB) number of bits.
FULL POWER BANDWIDTH is a measure of the frequency
at which the reconstructed output fundamental drops 3 dB
below its low frequency value for a full scale input.
GAIN ERROR is the deviation of the last code transition
(111...110) to (111...111) from the ideal (VREF − 1.5 LSB), after adjusting for offset error.
INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from negative
full scale (½ LSB below the first code transition) through positive full scale (½ LSB above the last code transition). The
deviation of any given code from this straight line is measured
from the center of that code value.
where Af1 is the RMS power of the input frequency at the output and Af2 through Af6 are the RMS power in the first 5
harmonic frequencies.
THROUGHPUT TIME is the minimum time required between
the start of two successive conversion. It is the acquisition
time plus the conversion time.
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ADC121S021
INTERMODULATION DISTORTION (IMD) is the creation of
additional spectral components as a result of two sinusoidal
frequencies being applied to the ADC input at the same time.
It is defined as the ratio of the power in the second and third
order intermodulation products to the sum of the power in both
of the original frequencies. IMD is usually expressed in dB.
MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC121S021 is guaranteed not
to have any missing codes.
OFFSET ERROR is the deviation of the first code transition
(000...000) to (000...001) from the ideal (i.e. GND + 0.5 LSB).
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in
dB, of the rms value of the input signal to the rms value of the
sum of all other spectral components below one-half the sampling frequency, not including harmonics or d.c.
SIGNAL TO NOISE PLUS DISTORTION (S/N+D or
SINAD) Is the ratio, expressed in dB, of the rms value of the
input signal to the rms value of all of the other spectral components below half the clock frequency, including harmonics
but excluding d.c.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the desired signal amplitude
to the amplitude of the peak spurious spectral component,
where a spurious spectral component is any signal present in
the output spectrum that is not present at the input and may
or may not be a harmonic.
TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dB or dBc, of the rms total of the first five harmonic
components at the output to the rms level of the input signal
frequency as seen at the output. THD is calculated as
Specification Definitions
ADC121S021
Typical Performance Characteristics
TA = +25°C, fSAMPLE = 50 ksps to 200 ksps,
fSCLK = 1 MHz to 4 MHz, fIN = 100 kHz unless otherwise stated.
DNL
fSCLK = 1 MHz
INL
fSCLK = 1 MHz
20145120
20145121
DNL
fSCLK = 4 MHz
INL
fSCLK = 4 MHz
20145160
20145161
DNL vs. Clock Frequency
INL vs. Clock Frequency
20145165
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20145166
8
ADC121S021
SNR vs. Clock Frequency
SINAD vs. Clock Frequency
20145163
20145164
SFDR vs. Clock Frequency
THD vs. Clock Frequency
20145167
20145168
Spectral Response, VA = 5.25 V
fSCLK = 4 MHz
Power Consumption vs. Throughput,
fSCLK = 4 MHz
20145155
20145170
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ADC121S021
Figure 4 shows the device in hold mode: switch SW1 connects the sampling capacitor to ground, maintaining the sampled voltage, and switch SW2 unbalances the comparator.
The control logic then instructs the charge-redistribution DAC
to add or subtract fixed amounts of charge from the sampling
capacitor until the comparator is balanced. When the comparator is balanced, the digital word supplied to the DAC is
the digital representation of the analog input voltage. The device moves from hold mode to track mode on the 13th rising
edge of SCLK.
Applications Information
1.0 ADC121S021 OPERATION
The ADC121S021 is a successive-approximation analog-todigital converter designed around a charge-redistribution digital-to-analog converter core. Simplified schematics of the
ADC121S021 in both track and hold modes are shown in
Figure 3 and Figure 4, respectively. In Figure 3, the device is
in track mode: switch SW1 connects the sampling capacitor
to the input, and SW2 balances the comparator inputs. The
device is in this state until CS is brought low, at which point
the device moves to the hold mode.
20145109
FIGURE 3. ADC121S021 in Track Mode
20145110
FIGURE 4. ADC121S021 in Hold Mode
edge and the next falling edge of SCLK. The SDATA pin will
be placed back into TRI-STATE after the 16th falling edge of
SCLK, or at the rising edge of CS, whichever occurs first. After
a conversion is completed, the quiet time (tQUIET) must be
satisfied before bringing CS low again to begin another conversion.
Sixteen SCLK cycles are required to read a complete sample
from the ADC. The sample bits (including leading zeroes) are
clocked out on falling edges of SCLK, and are intended to be
clocked in by a receiver on subsequent rising edges of SCLK.
The ADC will produce three leading zero bits on SDATA, followed by twelve data bits, most significant first.
If CS goes low before the rising edge of SCLK, an additional
(fourth) zero bit may be captured by the next falling edge of
SCLK.
2.0 USING THE ADC121S021
The serial interface timing diagram for the ADC is shown in
Figure 2. CS is chip select, which initiates conversions on the
ADC and frames the serial data transfers. SCLK (serial clock)
controls both the conversion process and the timing of serial
data. SDATA is the serial data out pin, where a conversion
result is found as a serial data stream.
Basic operation of the ADC begins with CS going low, which
initiates a conversion process and data transfer. Subsequent
rising and falling edges of SCLK will be labelled with reference
to the falling edge of CS; for example, "the third falling edge
of SCLK" shall refer to the third falling edge of SCLK after
CS goes low.
At the fall of CS, the SDATA pin comes out of TRI-STATE,
and the converter moves from track mode to hold mode. The
input signal is sampled and held for conversion on the falling
edge of CS. The converter moves from hold mode to track
mode on the 13th rising edge of SCLK (see Figure 2). It is at
this point that the interval for the TACQ specification begins. In
the worst case, 350ns must pass between the 13th rising
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2.1 Determining Throughput
Throughput depends on the frequency of SCLK and how
much time is allowed to elapse between the end of one conversion and the start of another. At the maximum specified
10
It is possible, however, to use fewer than 20 clock cycles provided the timing parameters are met. With a 1MHz SCLK,
there are 2500ns in 2.5 SCLK cycles, which is greater than
tACQ. After the last data bit has come out, the clock will need
one full cycle to return to a falling edge. Thus the total time
between falling edges of CS is 12.5*1μs +2.5*1μs
+1*1μs=16μs which is a throughput of 62.5KSPS.
3.0 ADC121S021 TRANSFER FUNCTION
The output format of the ADC is straight binary. Code transitions occur midway between successive integer LSB values.
The LSB width for the ADC is VA/4096. The ideal transfer
characteristic is shown in Figure 5. The transition from an
output code of 0000 0000 0000 to a code of 0000 0000 0001
is at 1/2 LSB, or a voltage of VA/8192. Other code transitions
occur at steps of one LSB.
12.5*50ns + 350ns + 0.5*50ns = 1000ns
(12.5 SCLKs + tACQ + 1/2 SCLK) which corresponds to a
maximum throughput of 1MSPS. At the slowest rate for this
family, SCLK is 1MHz. Using a 20 cycle conversion frame as
shown in Figure 2 yields a 20μs time between CS falling
edges for a throughput of 50KSPS.
20145111
FIGURE 5. Ideal Transfer Characteristic
formance. To keep noise off the supply, use a dedicated linear
regulator for this device, or provide sufficient decoupling from
other circuitry to keep noise off the ADC supply pin. Because
of the ADC's low power requirements, it is also possible to
use a precision reference as a power supply to maximize performance. The three-wire interface is shown connected to a
microprocessor or DSP.
4.0 TYPICAL APPLICATION CIRCUIT
A typical application of the ADC is shown in Figure 6. Power
is provided in this example by the National Semiconductor
LP2950 low-dropout voltage regulator, available in a variety
of fixed and adjustable output voltages. The power supply pin
is bypassed with a capacitor network located close to the
ADC. Because the reference for the ADC is the supply voltage, any noise on the supply will degrade device noise per-
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ADC121S021
SCLK frequency, the maximum guaranteed throughput is obtained by using a 20 SCLK frame. As shown in Figure 2, the
minimum allowed time between CS falling edges is determined by 1) 12.5 SCLKs for Hold mode, 2) the larger of two
quantities: either the minimum required time for Track mode
(tACQ) or 2.5 SCLKs to finish reading the result and 3) 0, 1/2
or 1 SCLK padding to ensure an even number of SCLK cycles
so there is a falling SCLK edge when CS next falls. For example, at the fastest rate for this family of parts, SCLK is
20MHz and 2.5 SCLKs are 125ns, so the minimum time between CS falling edges is calculated by
ADC121S021
20145113
FIGURE 6. Typical Application Circuit
conversion process is begun) when CS is pulled low. The device will enter shutdown mode if CS is pulled high before the
tenth falling edge of SCLK after CS is pulled low, or will stay
in normal mode if CS remains low. Once in shutdown mode,
the device will stay there until CS is brought low again. By
varying the ratio of time spent in the normal and shutdown
modes, a system may trade-off throughput for power consumption, with a sample rate as low as zero.
5.0 ANALOG INPUTS
An equivalent circuit for the ADC's input is shown in Figure
7. Diodes D1 and D2 provide ESD protection for the analog
inputs. At no time should the analog input go beyond (VA +
300 mV) or (GND − 300 mV), as these ESD diodes will begin
to conduct, which could result in erratic operation. For this
reason, the ESD diodes should not be used to clamp the input
signal.
The capacitor C1 in Figure 7 has a typical value of 4 pF, and
is mainly the package pin capacitance. Resistor R1 is the on
resistance of the track / hold switch, and is typically 500Ω.
Capacitor C2 is the ADC sampling capacitor and is typically
26 pF. The ADC will deliver best performance when driven by
a low-impedance source to eliminate distortion caused by the
charging of the sampling capacitance. This is especially important when using the ADC to sample AC signals. Also
important when sampling dynamic signals is an anti-aliasing
filter.
7.1 Normal Mode
The fastest possible throughput is obtained by leaving the
ADC in normal mode at all times, so there are no power-up
delays. To keep the device in normal mode continuously,
CS must be kept low until after the 10th falling edge of SCLK
after the start of a conversion (remember that a conversion is
initiated by bringing CS low).
If CS is brought high after the 10th falling edge, but before the
16th falling edge, the device will remain in normal mode, but
the current conversion will be aborted, and SDATA will return
to TRI-STATE (truncating the output word).
Sixteen SCLK cycles are required to read all of a conversion
word from the device. After sixteen SCLK cycles have
elapsed, CS may be idled either high or low until the next
conversion. If CS is idled low, it must be brought high again
before the start of the next conversion, which begins when
CS is again brought low.
After sixteen SCLK cycles, SDATA returns to TRI-STATE.
Another conversion may be started, after tQUIET has elapsed,
by bringing CS low again.
20145114
7.2 Shutdown Mode
Shutdown mode is appropriate for applications that either do
not sample continuously, or it is acceptable to trade throughput for power consumption. When the ADC is in shutdown
mode, all of the analog circuitry is turned off.
To enter shutdown mode, a conversion must be interrupted
by bringing CS high anytime between the second and tenth
falling edges of SCLK, as shown in Figure 8. Once CS has
been brought high in this manner, the device will enter shutdown mode; the current conversion will be aborted and SDATA will enter TRI-STATE. If CS is brought high before the
second falling edge of SCLK, the device will not change
mode; this is to avoid accidentally changing mode as a result
of noise on the CS line.
FIGURE 7. Equivalent Input Circuit
6.0 DIGITAL INPUTS AND OUTPUTS
The ADC digital inputs (SCLK and CS) are not limited by the
same maximum ratings as the analog inputs. The digital input
pins are instead limited to +5.25V with respect to GND, regardless of VA, the supply voltage. This allows the ADC to be
interfaced with a wide range of logic levels, independent of
the supply voltage.
7.0 MODES OF OPERATION
The ADC has two possible modes of operation: normal mode,
and shutdown mode. The ADC enters normal mode (and a
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12
ADC121S021
20145116
FIGURE 8. Entering Shutdown Mode
20145117
FIGURE 9. Entering Normal Mode
To exit shutdown mode, bring CS back low. Upon bringing
CS low, the ADC will begin powering up (power-up time is
specified in the Timing Specifications table). This power-up
delay results in the first conversion result being unusable. The
second conversion performed after power-up, however, is
valid, as shown in Figure 9.
If CS is brought back high before the 10th falling edge of
SCLK, the device will return to shutdown mode. This is done
to avoid accidentally entering normal mode as a result of
noise on the CS line. To exit shutdown mode and remain in
normal mode, CS must be kept low until after the 10th falling
edge of SCLK. The ADC will be fully powered-up after 16
SCLK cycles.
CS line after the 10th and before the 15th fall of SCLK of each
conversion. A plot of typical power consumption versus
throughput is shown in the Typical Performance Curves section. To calculate the power consumption for a given throughput, multiply the fraction of time spent in the normal mode by
the normal mode power consumption and add the fraction of
time spent in shutdown mode multiplied by the shutdown
mode power consumption. Note that the curve of power consumption vs. throughput is essentially linear. This is because
the power consumption in the shutdown mode is so small that
it can be ignored for all practical purposes.
9.0 POWER SUPPLY NOISE CONSIDERATIONS
The charging of any output load capacitance requires current
from the power supply, VA. The current pulses required from
the supply to charge the output capacitance will cause voltage
variations on the supply. If these variations are large enough,
they could degrade SNR and SINAD performance of the ADC.
Furthermore, discharging the output capacitance when the
digital output goes from a logic high to a logic low will dump
current into the die substrate, which is resistive. Load discharge currents will cause "ground bounce" noise in the substrate that will degrade noise performance if that current is
large enough. The larger the output capacitance, the more
current flows through the die substrate and the greater is the
noise coupled into the analog channel, degrading noise performance.
To keep noise out of the power supply, keep the output load
capacitance as small as practical. It is good practice to use a
100 Ω series resistor at the ADC output, located as close to
the ADC output pin as practical. This will limit the charge and
discharge current of the output capacitance and improve
noise performance.
8.0 POWER MANAGEMENT
The ADC takes time to power-up, either after first applying
VA, or after returning to normal mode from shutdown mode.
This corresponds to one "dummy" conversion for any SCLK
frequency within the specifications in this document. After this
first dummy conversion, the ADC will perform conversions
properly. Note that the tQUIET time must still be included between the first dummy conversion and the second valid conversion.
When the VA supply is first applied, the ADC may power up
in either of the two modes: normal or shutdown. As such, one
dummy conversion should be performed after start-up, as described in the previous paragraph. The part may then be
placed into either normal mode or the shutdown mode, as
described in Sections 7.1 and 7.2.
When the ADC is operated continuously in normal mode, the
maximum guaranteed throughput is FSCLK/20 at the maximum
specified FSCLK. Throughput may be traded for power consumption by running fSCLK at its maximum specified rate and
performing fewer conversions per unit time, raising the ADC
13
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ADC121S021
Physical Dimensions inches (millimeters) unless otherwise noted
6-Lead LLP
Order Number ADC121S021CISD or ADC121S021CISDX
NS Package Number SDB06A
6-Lead SOT-23
Order Number ADC121S021CIMF, ADC121S021CIMFX
NS Package Number MF06A
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14
ADC121S021
Notes
15
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ADC121S021 Single Channel, 50 to 200 ksps, 12-Bit A/D Converter
Notes
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