0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
会员中心
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
ADC122S051EVAL

ADC122S051EVAL

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    Module

  • 描述:

    EVAL MODULE FOR ADC122S051

  • 数据手册
  • 价格&库存
ADC122S051EVAL 数据手册
August 2005 Rev - National Semiconductor Evaluation Board User's Guide 12-, 10- and 8-Bit General Purpose Analog-to-Digital Converters with Input Multiplexer ADC122S101 / ADC102S101 / ADC082S101 ADC122S051 / ADC102S051 / ADC082S051 ADC122S021 / ADC102S021 / ADC082S021 ADC124S101 / ADC104S101 / ADC084S101 ADC124S051 / ADC104S051 / ADC084S051 ADC124S021 / ADC104S021 / ADC084S021 © 2005 National Semiconductor Corporation. 1 http://www.national.com Table of Contents 1.0 Introduction.............................................................................................................................3 2.0 Board Assembly .....................................................................................................................3 3.0 Quick Start..............................................................................................................................3 4.0 Functional Description............................................................................................................4 4.1 Input (signal conditioning) circuitry ............................................................................4 4.2 The ADC reference ...................................................................................................4 4.3 ADC clock circuit .......................................................................................................4 4.5 Digital Data Output. ...................................................................................................4 4.6 Power Supply Connections .......................................................................................4 4.7 Power Requirements.................................................................................................5 4.8 Analog Inputs ............................................................................................................5 5.0 Installing and Using the ADCxx1S101 Evaluation Board .......................................................5 5.1 Software Installation ..................................................................................................5 5.2 Setting up the ADCxx1S101 Evaluation Board .........................................................5 5.2.1 Board Set-up .............................................................................................5 5.2.2 Quick Check of Analog Functions .............................................................5 5.2.3 Quick Check of Software and Computer Interface Operation...................5 5.2.4 Getting Consistent Readings.....................................................................6 5.2.5 Troubleshooting.........................................................................................6 6.0 Evaluation Board Specifications .............................................................................................6 7.0 Hardware Schematic ..............................................................................................................7 8.0 ADCxx1S101 Evaluation Board Bill of Materials ....................................................................8 A1 Summary Tables of Test Points and Connectors ...................................................................9 2 http://www.national.com 1.0 Introduction These ADC Design Kits (consisting of one of these evaluation boards: ADC12xS101, ADC10xS101, ADC08xS101, ADC12xS051, ADC10xS051, ADC08xS051, ADC12xS021, ADC10xS021, ADC08xS021 and WaveVision4 hardware, where "x" in the device types here could be a 2 or a 4, indicating the number of multiplexer inputs) is designed to ease evaluation and design-in of these National Semiconductor Analog-to-Digital Converters. These evaluation boards allow the desivgner to evaluate product performance in a choice of two ways: in standalone mode with a logic analyzer and appropriate software (including National's WaveVision software), or with a personal computer and WaveVision4 hardware and software. Reference in this Guide to DUT is meant to refer to the particular device for which you have the evaluation board. For operation with a computer system, this evaluation board should be coupled to a WaveVision4 data capture board (National part number WAVEVSN BRD 4.0) using the WaveVision software operating under Microsoft Windows. The analog signal presented to the DUT is captured by the WaveVision4 data capture board, and displayed on the computer screen as a dynamic waveform, FFT, and/or histogram. The software also computes and displays dynamic performance in the form of SNR, SINAD, THD, SFDR, and ENOB. Important Note: The evaluation boards for all of these ADCs look identical. The actual device placed on your evaluation board can be identified by the label on the board and verified by looking at the DUT (Device Under Test) top mark. The devices have the following top marks: Top Mark Device ADC082S101 X22C ADC082S051 X04C ADC082S021 X16C ADC084S101 X25C ADC084S051 X10C ADC084S021 X19C ADC102S101 X23C ADC102S051 X05C ADC102S021 X17C ADC104S101 X26C ADC104S051 X11C ADC104S021 X20C ADC122S101 X24C ADC122S051 X06C ADC122S021 X18C ADC124S101 X27C ADC124S051 X12C ADC124S021 X21C The signal at the Analog Input to the board is digitized and is available at FutureBus connector J2. The board inputs are provided at BNC1 and BNC2. Jumper headers JP1 and JP3 allow these inputs to be either a.c. or d.c. coupled to the DUT. Provision is made to adjust the DUT supply voltage (measured at TP1) with potentiometer VR1. VR2 is used to set the input offset. 2.0 Board Assembly These Evaluation Boards come fully assembled and ready to use. Refer to the Bill of Materials for a description of components, to Figure 1 for major component placement and to Figure 2 for the Evaluation Board schematic. 3.0 Quick Start Refer to Figure 1 for locations of test points and major components. 1. Connect the evaluation board to the Capture Board (order number WAVEVSN BRD 4.0). See the Capture Board Manual for operation of that board. 2. Connect a clean power supply to the terminals of connector P1. Adjust power supply to a voltage of ±5.5V to ±5.7V before connecting it to the board. 3. Connect a voltmeter to TP1 and use VR1 to set the DUT analog supply voltage for the desired value between +2.7V and +5.0V. 4. Set the jumper to short pins 1 and 2 of JP6 and be sure there is a clock oscillator of the appropriate frequency at Y1. 5. Put a jumper between pins 1 and 2 of JP1 and pins 1 and 2 of JP2. 6. Connect a signal, through an appropriate bandpass filter, to BNC1. The peak-to-peak amplitude of this signal at TP6 should be the same as or just under the power supply voltage setting. 7. Connect a USB cable between the WaveVision Capture Board and the PC. 8. Run the WaveVision 4 software and click on Settings, then click on Capture. Under "Board Type" select "WaveVision 4.0 (USB)". 9. Under "Communication" press the "Test" button. If you get a "Communication Failed" message, check all connections and be sure the power supply is on. 10. If the appropriate sample rate (not clock rate) is not reported, check to be sure the clock signal has adequate amplitude and repeat the previous step. 11. Click "Accept" then gather data by pressing F1 on the keyboard. Perform an FFT on the data by clicking on the FFT tab. See the WaveVision Capture Board Manual for complete data gathering instructions. 3 http://www.national.com JP2 Input 1 Chan Select VR2 Offset Adjust TP6 INPUT 1 Test Point VR1 VA Supply Adjust TP8 +5.5V Input Test Point TP2, TP3, TP4, TP5 Serial Lines Test Points JP1 INPUT 1 AC/DC Couple POWER VR2 +5.5V IN 1 P1 TP8 VR1 BNC1 INPUT 1 Connection TPG2 GND TPG1 INPUT 1 L2 TP6 GND J2 Input1 TP7 INPUT 2 Test Point BNC1 +V JP1 LA1 JP2 TP7 U2, U3, U4 JP4 GND Input2 BNC2 TPG4 TPG3 BNC2 BNC2 INPUT 2 Connection TP2 TP5 TP4 TP3 TP1 BNC1 JP3 Y1 GND INPUT 2 JP6 CLK INPUT BNC3 L1 JP5 National Semiconductor BNC3 JP6 Clock Select G/P ADC, MSOP, Evaluation Board Rev. 1.1 JP3 INPUT 2 AC/DC Couple JP2 Input 1 Chan Select JP6 Clock Select BNC3 Ext. Clock Connection Figure 1. Major Components and Test Points of the Evaluation Board 4.0 Functional Description The Evaluation Board component locations are shown in Figure 1. The board schematic is shown in Figure 2. 4.1 Input (signal conditioning) circuitry The input signal to be digitized should be applied to BNC connector BNC1 or to BNC2, or to both through (an) appropriate filter(s). These 50 Ohm inputs are intended to accept a low-noise sine wave signal of peak-to-peak amplitude up to the power supply level. To accurately evaluate the ADC dynamic performance, the input test signal should be a single frequency passed through a high-quality band pass filter as described in Section 5.0. The input signal may be either a.c. or d.c. coupled to the DUT with the setting of jumpers on J1 and JP3. See schematic Figure 2. 4.2 The ADC reference The reference voltage for the DUT is the device supply voltage. Therefore, adjusting this voltage will change the full scale range of the DUT. Since the operational supply voltage range of the these ADCs is 2.7V to 5.25V, this is also the range of the reference voltage. 4.3 ADC Input Bias To maximize ADC performance it is necessary that the input signal swing cover nearly the entire ADC input range. If the input biasing is not at the center of the signal swing, it will not be possible to get maximum signal swing without clipping of the signal, at which point there will be excessive distortion. VR2 is provided to allow adjustment of the input bias point when a.c. input coupling is used. VR2 should be adjusted to provide a d.c. voltage at TP6 and TP7 that are one half the DUT supply voltage at TP1. 4.4 ADC clock circuit The clock signal applied to the ADC can come from BNC3 or from an on-board oscillator at position Y1 or Y2. Y1 is for a through-hole TTL oscillator, while Y2 is for a surface mounted TTL oscillator. Only one oscillator should be mounted at a time and either an oscillator or an external generator should be connected. JP6 is used to select the oscillator source. Shorting pins 1 and 2 of JP6 selects the on-board oscillator, while shorting pins 2 and 3 selects the oscillator signal at BNC3. 4 http://www.national.com 4.5 Digital Data Output. The digital output data from the DUT is available at Header LA1 for connection to a logic analyzer. Data is transferred over FutureBus J5 for use with the WaveVision4 data capture board. 4.6 Power Supply Connections Power to this board is supplied through power connector J6. The only Voltage needed for the evaluation board is a single +5.5V to +5.7V supply. When using this evaluation Board with the WaveVision4 Capture Board, the +5V logic power supply for that Capture board and the +5V of the DUT evaluation board are connected together through pins A1, B1, A2 and B2 of J2. Diode D1 between P1 and the WaveVision4 board is meant to prevent the higher voltage at DUT board P1 from getting to the WaveVision4 board. Providing the +5.5V to +5.7V to the DUT board will provide +5V to the WaveVision4 board through D1 and the WaveVision4 board pins A1, B1, A2 and B2 of J2. 4.7 Power Requirements Voltage and current requirements for the DUT Evaluation Board are • • Pin 1 of P1: +5.5V to 5.7V at 50 mA Pin 2 of P1: Ground 4.8 Analog Inputs The evaluation board input channel is composed of termination components and a user choice of a.c. or d.c. signal coupling to the DUT, as well as a choice of DUT multiplexer inputs that are connected to inputs BNC1 and BNC2. Short together pins 1 and 2 of JP1 and JP3 to a.c. couple the input signals. Short pins 5 and 6 of JP1 and JP3 to d.c. couple the input signal to the DUT. Shorting together pins 3 and 4 of JP1 or JP3 will ground the corresponding ADC input. JP2 and JP4 determine which BNC connector is connected to which ADC input. See Figure 2 for the device schematic. Caution: Be sure that the input signals to the DUT do not go more negative than -0.3V or more than 0.3V above the DUT power supply. 5.0 Installing and Using the ADCxx1S101 Evaluation Board The evaluation board requires a power supply as described in Section 4.7. An appropriate signal generator with 50 Ohm source impedance should be connected to the Analog Input BNC1 and/or BNC2. A bandpass filter should be inserted between the generator output and the input to the evaluation board when evaluating sinusoidal signals to be sure there are no unwanted frequencies (harmonics and noise) presented to the ADC. It is important to realize that no frequency generator or synthesizer produces a pure enough sine wave to evaluate an A/D Converter without the use of a good filter. If the WaveVison4 capture board is used, a USB cable must be connected between the WaveVision4 Capture Board and the host computer. See the WaveVision4 Capture Board User's Guide for details. 5.1 Software Installation The WaveVision4 software provided requires about 6 Megabytes of hard drive space, including the Java files, and runs under Windows. See the WaveVision4 Capture Board Users' Guide for WaveVision4 software installation instructions. 5.2 Setting up the Evaluation Board This evaluation package was designed to be easy and simple to use, and to provide a quick and simple way to evaluate the DUT. The procedures given here will help you to properly set up the board. 5.2.1 Board Set-up Refer to Figure 1 for locations of the major components on the board. 1. Connect The evaluation board to a WaveVision4 Capture Board, WAVEVSN BRD 4.0. 2. Connect the desired jumper to JP1, JP2, JP3 and JP4. (See Section 4.8). 3. Connect power to the board per requirements of paragraph 4.7. 4. Connect a USB cable between the WaveVision4 Capture Board and a USB port on your computer. 5. Connect a clean power supply to the terminals of connector P1. Adjust power supply to a voltage of ±5.5V to ±5.7V before connecting it to the board. Apply power to the WaveVision4 Capture Board. 6. Connect an appropriate test signal source to connector BNC1 and/or BNC2 of the evaluation board through (an) appropriate filter(s). 5.2.2 Quick Check of Analog Functions Refer to Figure 1 for locations of major components on the board. If at any time the expected response is not obtained, see section 5.2.5 on Troubleshooting. 1. 2. 3. 4. Perform steps 1 through 6 of Section 5.2.1. Adjust VR1 for the desired DUT supply voltage at TP1. Adjust VR2 for a voltage at TP6 and TP7 that are 1/2 that at TP1. Apply a signal to BNC1 and scope TP6 to be sure the input signal is present. 5. Apply a signal to BNC2 and scope TP7 to be sure the input signal is present. 5 http://www.national.com This completes the testing of the analog portion of the evaluation board. 5.2.3 Quick Check of Software and Computer Interface Operation 1. 2. Perform the steps of Paragraph 5.2.2, above. Put a jumper between pins 1 and 2 of JP1 and between pins 1 and 2 of JP2. 3. Apply a signal to BNC1. Adjust the signal source at Analog Input BNC1 for a peak-to-peak signal amplitude at TP6 that is very slightly below the value of the d.c. voltage at TP1. Be sure there is an interconnecting cable between the Capture Board and your computer USB port. Run the WaveVision4 program and click on Settings, then click on Capture. Under "Board Type" select "WaveVision 4.0 (USB)". 4. 5. 6. Under "Communication" press the "Test" button. If you get a "Communication Failed" message, test all connections and be sure the power supply to the boards is turned on. Click on "Accept". 7. Acquire data by pressing the computer F1 key. Data transfer can take a few seconds. 8. When transfer is complete, the data window should show many sine waves. The display may show a nearly solid area of red, which is O.K. 9. With the mouse, you may click on the magnifying glass, then and drag (top left to bottom right) to select a portion of the displayed waveform for better examination. 10. Click on the FFT tab to compute the FFT and display a frequency domain plot. The FFT data will provide a measurement of SINAD, SNR, THD SFDR and ENOB, simplifying the performance verification of the DUT. Note: Be sure to use a band pass filter between the signal source and this board for accurate dynamic performance measurement. To change the selected input channel, click on the "Settings" pull-down, then on "Product Board Settings" and choose the selected channel. Choosing "GND" will internally ground the ADC input. It is necessary to select the mainWaveVision4 window before capturing data. 5.2.4 Getting Consistent Readings Artifacts can result when we perform an FFT on a digitized waveform, producing inconsistent results when testing repeatedly. The presence of these artifacts means that the ADC under test may perform better than our measurements would indicate. Windowing is a common method of improving FFT results of finite data. We can eliminate the need for windowing and get more consistent results if we observe the proper ratios between the input and sampling frequencies, forcing the data to cleanly "wrap around" itself, providing coherent sampling. This eliminates the distortion that would otherwise be present in an FFT and greatly increases its spectral resolution. This, in turn, allows us to more accurately evaluate the spectral response of the A/D converter. When we do this, however, we must be sure that the input signal has high spectral purity and stability and that the sampling clock signal is extremely stable with minimal jitter. Coherent sampling of a periodic waveform occurs when an integer number of cycles exists in the sample window. The relationship between the number of cycles sampled (CY), the number of samples taken (SS), the signal input frequency (fin) and the sample rate (fs), for coherent sampling, is CY fin SS = fs CY, the number of cycles in the data record, must be a prime integer number and SS, the number of samples in the record, must be a power of 2 integer. Further, fin (signal input frequency) and fs (sampling rate) should be locked to each other. Then, if they come from the same generator, whatever frequency instability (jitter) is present in the two signals will cancel each other. Windowing (an FFT Option under WaveVision) should not be used for coherent sampling. 5.2.5 Troubleshooting Nothing happens when F1 is pressed: Select Settings, then Capture Board Settings and look at the top for "Board Properties" If you see "No WaveVision hardware is present", be sure that the WaveVision Capture Board is connected to an USB port and has power, that the evaluation board has power and is properly connected to and seated with the WaveVision4 Capture Board. There is no output from the DUT: perform the following: • • • • • Be sure the appropriate input channel is selected through the WaveVision4 software. Be sure that a shorting jumper is appropriately placed on JP1 through JP4. Be sure that the proper voltage and polarity is present at Power Connector J6. Check to see that the DUT input signal does not go below ground or above the DUT supply voltage. Be sure there is a clock signal is present at TP5. The PC displayed waveform appears to be noisy, or the FFT plot shows nothing but noise with no apparent signal: • • 6 Be sure the appropriate input channel is selected through the WaveVision4 software. Be sure shorting jumpers are appropriately on JP1 through JP4. http://www.national.com • • • Check to see that the DUT input signal does not go below ground or above the DUT analog supply voltage. Be sure that a minimum of +2.7V is at pin 1 of TP1. Be sure that only one clock source (oscillator at Y1 or signal at BNC3) is active on the board. 6.0 Evaluation Board Specifications Board Size: Power Requirements: Clock Frequency Range: Analog Input Nominal Voltage: Impedance: 3.1" x 3.8" (8.0 cm x 9.6 cm) + 5.5V to 5.7 @ 15 mA 1 MHz to 20 MHz Supply peak-to-peak Voltage 50 Ohms 7 http://www.national.com CLK INPUT_1 2 1 BNC3 R2 51.1 4 VDD GND OE Y2 8 MHz OSC (SMT) 1 INPUT_1 1 BNC1 D1 1N4001 C19 10uF , 6.3V C16 0.1uF R18 5.1K R17 5.1K C13 0.1uF R15 5.1K R14 5.1K A.C. COUP.1 3 5 D.C. COUP. C18 0.1 uF TP7 Inp ut_2 A.C. COUP.1 3 5 D.C. COUP. + + + 2 4 6 + + + 2 4 6 IN2_SEL + + + JP3 IN1_SEL + + + JP1 R8 no t used 2N3904 Q2 Y1 8 MHz OSC (THROUGH-HOLE) TP6 Inp ut_1 CLK_ENABLE TPG3 GND R19 51 14 VDD GND 7 JP5 1 INPUT2 +5p5V R7 1k 2 4 6 8 1 3 5 7 2 4 6 8 JP4 IN2_CH_SEL 1 3 5 7 R5 1.8k VR1 1k TPG2 GND LM4041D IZ-1.2 U1 +1p2V VR2 1k INPUT_OFFSET JP2 IN2_CH_SEL C9 0.1 uF +3P3V C6 10uF , 6.3V INPUT1 1 R4 0 +5p5V ADC_CSb AIN1 AIN2 AIN3 AIN4 R6 1k C4 0.1 uF 1 7 6 5 4 AIN2 AIN3 AIN4 +V AIN4 AIN3 AIN2 AIN1 +5V AIN1 C5 10uF , 6.3V Q1 2N3904 D2 1N4148 SCLK DOUT DIN CS# U4 ADC_DIN ADC_DOUT ADC_SCLK 8 9 10 ADC_CSb 4 5 AIN2 AIN1 C8 0.1 uF 1 MSOP10-1 AIN2 AIN1 C7 1uF TP1 +V DIN CS# SCLK DOUT AIN1 ADC_DIN ADC_SCLK 7 8 ADC_CSb ADC_DOUT 6 N/C AIN2 1 4 5 AIN2 U3 6 AIN1 MSOP8-1 R13 100 0.1 uF C10 ADC_CSb ADC_DIN ADC_DOUT ADC_SCLK 1 8 9 10 TPG4 GND SCLK DOUT DIN CS# MSOP10-2 U2 +5V R9 100 J2 FUTUREBUS_96 R10 100 TP3 ADC_DIN TP2 ADC_CS# 7 6 EEPROM_Power 1 2 3 R12 100 EEPROM_SCL R11 100 TP4 TP5 ADC_DOUT ADC_SCLK Figure 2. ADC12xSxx1 / ADC10xSxx1 / ADC08xSxx1 Evaluation Board Schematic INPUT_2 1 BNC2 C14 C15 0.1uF 10uF, 6 .3V R16 51 C11 0.1 uF C12 10uF, 6 .3V L2 100 uH Choke HEADER 3X1 1 2 3 JP6 2 TP8 +5.5V_IN EXT INT +5p5V_IN POWER_IN 1 2 P1 R3 51.1 SCLK_SEND 2 OUT 1 OE 3 2 3 2 2 2 3 OUT 1 ADC_DIN 3 2 SCLK_SEND C3 0.1uF 8 ADC_SCLK 1 1 1 1 1 2 VA GND 3 2 VA GND 3 7 VD 2 VA GND 3 +5p5V ADC_DOUT EEPROM_Power EEPROM_SCL EEPROM_SDA 1 L1 1 100 uH Choke 1 1 C2 68uF ADC_SCLK 1 D24 C24 B24 A24 D23 C23 B23 A23 D22 C22 B22 A22 D21 C21 B21 A21 D20 C20 B20 A20 D19 C19 B19 A19 D18 C18 B18 A18 D17 C17 B17 A17 D16 C16 B16 A16 D15 C15 B15 A15 D14 C14 B14 A14 D13 C13 B13 A13 D12 C12 B12 A12 D11 C11 B11 A11 D10 C10 B10 A10 D9 C9 B9 A9 D8 C8 B8 A8 D7 C7 B7 A7 D6 C6 B6 A6 D5 C5 B5 A5 D4 C4 B4 A4 D3 C3 B3 A3 D2 C2 B2 A2 D1 C1 B1 A1 D24 C24 B24 A24 D23 C23 B23 A23 D22 C22 B22 A22 D21 C21 B21 A21 D20 C20 B20 A20 D19 C19 B19 A19 D18 C18 B18 A18 D17 C17 B17 A17 D16 C16 B16 A16 D15 C15 B15 A15 D14 C14 B14 A14 D13 C13 B13 A13 D12 C12 B12 A12 D11 C11 B11 A11 D10 C10 B10 A10 D9 C9 B9 A9 D8 C8 B8 A8 D7 C7 B7 A7 D6 C6 B6 A6 D5 C5 B5 A5 D4 C4 B4 A4 D3 C3 B3 A3 D2 C2 B2 A2 D1 C1 B1 A1 A0 A1 A2 WP SCL SDA ADC_DIN ADC_SCLK ADC_CSb ADC_DOUT TPG1 GND 1 EEPROM_Power 8 VCC GND 8 4 C1 0.1uF EEPROM_SDA 24C02/SO8 U5 5 C17 0.1uF Logic Analyze r Header 9 10 7 8 5 6 3 4 1 2 LA1 7.0 Hardware Schematic http://www.national.com 8.0 ADC12/10/08xSxx1 Evaluation Board Bill of Materials Item Qty Reference Part Source 0.1uF Type 0805 1 12 C1, C3, C4, C8, C9, C10, C11, C13, C14, C16, C17, C18 2 1 C2 68uF Type 7343 3 5 C5, C6, C12, C15, C19 10uF, 6.3V Type 3216 4 1 C7 1uF, 6.3V or 10V Type 3216 5 3 BNC1, BNC2, BNC3 BNC Connector DigiKey # ARF1177-ND 6 1 D1 1N4001 - DO-41 Pkg Various 7 1 JP1, JP3 3x2 Pin Post Header DigiKey # 22-28-4065-ND 8 2 JP2, JP4 2x2 Pin Post Header [2 input] 2x4 Pin Post Header [4 input] DigiKey # 10-89-9047-ND DigiKey # 22-28-4085-ND n/a 9 0 JP5 not used 10 1 JP6 3-pin Post Header DigiKey # A19351-ND 11 1 J2 FUTUREBUS Connector AMP/Tyco 536501-1 12 1 LA1 2 x 10 pin Post Header DigiKey # 10-89-2101-ND 13 2 L1, L2 100uH Inductor DigiKey # 445-1152-1-ND 14 1 P1 2-Pin Terminal Block DigiKey # ED1609-ND 15 2 Q1, Q2 MMBTN3904 (SOT-23) Various 16 2 R2, R3 51.1, 1%, 1/8 Watt Size 0603 17 1 R4 0 Size 0603 18 1 R5 1.8k, 5%, 1/10 W Size 0603 19 2 R6, R7 1k, 5%, 1/10 W Size 0603 20 2 VR1, VR2 1k DigiKey # 3386F-102-ND 21 0 R8 not used n/a 22 5 R9, R10, R11, R12, R13 100, 5%, 1/10 W Size 0603 23 4 R14, R15, R17, R18 5.11K, 1%, 1/10 W Size 0603 24 2 R16, R19 51, 5%, 1/8 W Size 0603 25 1 TP1, TP2, TP3, TP4, TP5 ,TP6, TP7, TP8, TPG1, TPG2, TPG3, TPG4 Breakable Header DigiKey # S1012-36-ND 26 1 U1 LM4041DIZ-1.2 National Semiconductor 27 0 U2 not used n/a 28 1 U3 ADCxx2Sxx1 National Semiconductor 29 0 U4 ADCxx4Sxx1 National Semiconductor 30 1 U5 24C02/SO8 Various 31 1 Y1 4 MHz OSC fo 50 ksps 20 MHz OSC for 200 ksps 20 MHz OSC for 1 Msps DigiKey # CTX107-ND DigiKey # CTX114-ND DigiKey # CTX119-ND 32 0 Y2 - optional, not provided not used n/a 33 1 OSC Socket For Y1 DigiKey # A400-ND 34 5 Shorting Jumpers For JP1, JP2, JP3, JP4, JP6 DigiKey #S9601-ND 9 http://www.national.com APPENDIX A1 Summary Tables of Test Points and Connectors P1 Connector - Power Supply Connections Pin P1-1 P1-2 Iput Voltage +5.5V to +5.7V GND Function Positive Power Supply Power Supply Ground LA1 - Logic Analyzer Header Pin 1 3 5 7 9 2 4 6 8 10 Function Ground ADC Serial Data Output ADC Chip Select (active low) ADC serial Clock ADC Serial Data Input Ground Ground Ground Ground Ground JP1 - Input 1 Select Jumper none 1-2 3-4 5-6 Function Input 1 not connected to DUT Input 1 a.c. coupled Input 1 path grounded Input 1 d.c. coupled JP2 - Input 1 Channel Select Jumper none 1-2 3-4 5-6 7-8 Function Input 1 NOT connected to DUT Input 1 connected to IN1 Input 1 connected to IN2 Input 1 connected to IN3 (ADCxx4Sxx1 only) Input 1 connected to IN4 (ADCxx4Sxx1 only) JP3 - Input 2 Select Jumper none 1-2 3-4 5-6 Function Input 2 not connected to DUT Input 2 a.c. coupled Input 2 path grounded Input 2 d.c. coupled 10 http://www.national.com JP4 - Input 2 Channel Select Jumper none 1-2 3-4 5-6 7-8 Function Input 2 NOT connected to DUT Input 2 connected to IN1 Input 2 connected to IN2 Input 2 connected to IN3 (ADCxx4Sxx1 only) Input 2 connected to IN4 (ADCxx4Sxx1 only) JP5 - Clock Enable Jumper none 1-2 Function Clock at Y1 or Y2 is disabled if oscillator has enable input Clock at Y1 or Y2 is enabled Test Points on the Evaluation Board Test Point Function TP 1 DUT supply voltage TP 2 ADC CSb TP 3 ADC DIN TP 4 ADC DOUT TP 5 SCLK TP 6 INPUT1 Signal input to DUT TP 7 INPUT2 Signal input to DUT TP 8 Board +5.5V Supply Input voltage TPG1 thru TPG4 Ground J10 - FutureBus Connector Pin(s) A1, B1, A2, B2 D2 B3 C3 D3 A4 D17 D18 D19 D20 A23, B23, A24, B24 All Others Function +5V from WaveVision4 Capture Board ADC Serial Clock EEPROM SDA (Data) EEPROM SCL (Clock) EEPROM Power ADC Data Output SCLK SEND ADC SCLK ADC CS# ADC Data Input +3.3V from WaveVision4 Capture Board Ground 11 http://www.national.com These Evaluation Boards are intended for product evaluation purposes only and are not intended for resale to end consumers, is not authorized for such use and is not designed for compliance with European EMC Directive 89/336/EEC. National does not assume any responsibility for use of any circuitry or software supplied or described. No circuit patent licenses are implied. LIFE SUPPORT POLICY NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation Americas Tel: 1-800-272-9959 Fax: 1-800-737-7018 Email: support@nsc.com 2. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Europe Fax: +49 (0) 1 80-530 85 86 Email: europe.support@nsc.com Deutsch Tel: +49 (0) 1 80-530 85 85 English Tel: +49 (0) 1 80 532 78 32 Français Tel: +49 (0) 1 80 532 93 58 Italiano Tel: +49 (0) 1 80 534 16 8 National Semiconductor Asia Pacific Customer Response Group Tel: 65-2544466 Fax: 65-2504466 Email: sea.support@nsc.com National Semiconductor Japan Ltd. Tel: 81-3-5620-6175 Fax: 81-3-5620-6179 www.national.com National does not assume any responsibility for any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications. 12 http://www.national.com IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where mandated by government requirements, testing of all parameters of each product is not necessarily performed. TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and applications using TI components. To minimize the risks associated with customer products and applications, customers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right, copyright, mask work right, or other TI intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information published by TI regarding third-party products or services does not constitute a license from TI to use such products or services or a warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. Reproduction of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. Reproduction of this information with alteration is an unfair and deceptive business practice. TI is not responsible or liable for such altered documentation. Information of third parties may be subject to additional restrictions. Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or service voids all express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice. TI is not responsible or liable for any such statements. TI products are not authorized for use in safety-critical applications (such as life support) where a failure of the TI product would reasonably be expected to cause severe personal injury or death, unless officers of the parties have executed an agreement specifically governing such use. Buyers represent that they have all necessary expertise in the safety and regulatory ramifications of their applications, and acknowledge and agree that they are solely responsible for all legal, regulatory and safety-related requirements concerning their products and any use of TI products in such safety-critical applications, notwithstanding any applications-related information or support that may be provided by TI. Further, Buyers must fully indemnify TI and its representatives against any damages arising out of the use of TI products in such safety-critical applications. TI products are neither designed nor intended for use in military/aerospace applications or environments unless the TI products are specifically designated by TI as military-grade or "enhanced plastic." Only products designated by TI as military-grade meet military specifications. Buyers acknowledge and agree that any such use of TI products which TI has not designated as military-grade is solely at the Buyer's risk, and that they are solely responsible for compliance with all legal and regulatory requirements in connection with such use. TI products are neither designed nor intended for use in automotive applications or environments unless the specific TI products are designated by TI as compliant with ISO/TS 16949 requirements. Buyers acknowledge and agree that, if they use any non-designated products in automotive applications, TI will not be responsible for any failure to meet such requirements. Following are URLs where you can obtain information on other Texas Instruments products and application solutions: Products Applications Audio www.ti.com/audio Automotive and Transportation www.ti.com/automotive Amplifiers amplifier.ti.com Communications and Telecom www.ti.com/communications Data Converters dataconverter.ti.com Computers and Peripherals www.ti.com/computers DLP® Products www.dlp.com Consumer Electronics www.ti.com/consumer-apps DSP dsp.ti.com Energy and Lighting www.ti.com/energy Clocks and Timers www.ti.com/clocks Industrial www.ti.com/industrial Interface interface.ti.com Medical www.ti.com/medical Logic logic.ti.com Security www.ti.com/security Power Mgmt power.ti.com Space, Avionics and Defense www.ti.com/space-avionics-defense Microcontrollers microcontroller.ti.com Video and Imaging www.ti.com/video RFID www.ti-rfid.com OMAP Mobile Processors www.ti.com/omap Wireless Connectivity www.ti.com/wirelessconnectivity TI E2E Community Home Page e2e.ti.com Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2012, Texas Instruments Incorporated
ADC122S051EVAL 价格&库存

很抱歉,暂时无法提供与“ADC122S051EVAL”相匹配的价格&库存,您可以联系我们找货

免费人工找货