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ADC128S022
SNAS334F – AUGUST 2005 – REVISED NOVEMBER 2015
ADC128S022 8-Channel, 50 kSPS to 200 kSPS, 12-Bit A/D Converter
1 Features
3 Description
•
•
•
•
•
•
•
•
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The ADC128S022 device is a low-power, eightchannel CMOS 12-bit analog-to-digital converter
specified for conversion throughput rates of 50 ksps
to 200 ksps. The converter is based on a successiveapproximation register architecture with an internal
track-and-hold circuit. It can be configured to accept
up to eight input signals at inputs IN0 through IN7.
1
Eight Input Channels
Variable Power Management
Independent Analog and Digital Supplies
SPI™/QSPI™/MICROWIRE/DSP Compatible
Packaged in 16-lead TSSOP
Conversion Rate: 50 ksps to 200ksps
DNL (VA = VD = 5 V): +1 / −0.7 LSB (Maximum)
INL (VA = VD = 5 V): ±1 LSB (Maximum)
Power Consumption
– 3V Supply: 1.2 mW (Typical)
– 5V Supply: 7.5 mW (Typical)
The output serial data is straight binary and is
compatible with several standards, such as SPI,
QSPI, MICROWIRE, and many common DSP serial
interfaces.
The ADC128S022 may be operated with independent
analog and digital supplies. The analog supply (VA)
can range from 2.7 V to 5.25 V, and the digital supply
(VD) can range from 2.7 V to VA. Normal power
consumption using a 3-V or 5-V supply is 1.2 mW
and 7.5 mW, respectively. The power-down feature
reduces the power consumption to 0.06 µW using a
3-V supply and 0.25 µW using a 5-V supply.
2 Applications
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Automotive Navigation
Portable Systems
Medical Instruments
Mobile Communications
Instrumentation and Control Systems
The ADC128S022 is packaged in a 16-lead TSSOP
package. Operation over the extended industrial
temperature range of −40°C to +105°C is ensured.
Device Information(1)
PART NUMBER
ADC128S022
PACKAGE
TSSOP (16)
BODY SIZE (NOM)
4.40 mm × 5.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Typical Application
VA is used as the
³$QDORJ´ 6XSSO\ 5DLO Reference for the ADC
VD can be set
independently of VA
VA
VIN7
³'LJLWDO´ 6XSSO\ 5DLO
VD
IN7
CONTROLLER
IN6
IN5
IN4
VIN3
SAR
ADC
IN3
4-wire SPI
MCU
IN2
IN1
VIN0
IN0
AGND
DGND
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ADC128S022
SNAS334F – AUGUST 2005 – REVISED NOVEMBER 2015
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
4
6.1
6.2
6.3
6.4
6.5
6.6
6.7
4
4
4
5
5
7
9
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Timing Specifications ...............................................
Typical Characteristics ..............................................
Detailed Description ............................................ 14
7.1
7.2
7.3
7.4
Overview .................................................................
Functional Block Diagram .......................................
Feature Description.................................................
Device Functional Modes........................................
14
15
15
16
7.5 Register Maps ......................................................... 17
8
Application and Implementation ........................ 18
8.1 Application Information............................................ 18
8.2 Typical Application .................................................. 18
9
Power Supply Recommendations...................... 20
9.1 Power Supply Sequence......................................... 20
9.2 Power Supply Noise Considerations....................... 20
10 Layout................................................................... 21
10.1 Layout Guidelines ................................................. 21
10.2 Layout Example .................................................... 21
11 Device and Documentation Support ................. 22
11.1
11.2
11.3
11.4
11.5
Device Support......................................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
22
23
23
23
23
12 Mechanical, Packaging, and Orderable
Information ........................................................... 23
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision E (March 2013) to Revision F
•
Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................ 1
Changes from Revision D (March 2013) to Revision E
•
2
Page
Page
Changed layout of National Data Sheet to TI format ........................................................................................................... 21
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5 Pin Configuration and Functions
PW Package
16-Pin TSSOP
Top View
CS
1
16
SCLK
VA
2
15
DOUT
AGND
3
14
DIN
IN0
4
13
VD
ADC128S022
IN1
5
12
DGND
IN2
6
11
IN7
IN3
7
10
IN6
IN4
8
9
IN5
Pin Functions
PIN
NAME
NO.
TYPE
DESCRIPTION
CS
1
Digital I/O
Chip select. On the falling edge of CS, a conversion process begins. Conversions continue
as long as CS is held low.
VA
2
Power
Supply
Positive analog supply pin. This voltage is also used as the reference voltage. This pin
should be connected to a quiet +2.7-V to +5.25-V source and bypassed to GND with 1-µF
and 0.1-µF monolithic ceramic capacitors located within 1 cm of the power pin.
AGND
3
Power
Supply
The ground return for the analog supply and signals.
4-11
Analog I/O
DGND
12
Power
Supply
The ground return for the digital supply and signals.
VD
13
Power
Supply
Positive digital supply pin. This pin should be connected to a +2.7-V to VA supply, and
bypassed to GND with a 0.1-µF monolithic ceramic capacitor located within 1 cm of the
power pin.
DIN
14
Digital I/O
Digital data input. The ADC128S022's Control Register is loaded through this pin on rising
edges of the SCLK pin.
DOUT
15
Digital I/O
Digital data output. The output samples are clocked out of this pin on the falling edges of
the SCLK pin.
SCLK
16
Digital I/O
Digital clock input. The specified performance range of frequencies for this input is 0.8 MHz
to 3.2 MHz. This clock directly controls the conversion and readout processes.
IN0 to IN7
Analog inputs. These signals can range from 0 V to VREF.
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6 Specifications
6.1 Absolute Maximum Ratings
See
(1) (2) (3)
.
MIN
MAX
UNIT
Analog supply voltage VA
–0.3
6.5
V
Digital supply voltage VD
–0.3 to VA + 0.3
6.5
V
–0.3
VA + 0.3
V
±10
mA
±20
mA
150
°C
150
°C
Voltage on any pin to GND
Input current at any pin (4)
Package input current (4)
See (5)
Power dissipation at TA = 25°C
Junction temperature
Storage temperature, Tstg
(1)
(2)
(3)
(4)
(5)
–65
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
For soldering specifications see product folder at www.ti.com and SNOA549
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND or VIN > VA or VD), the current at that pin should be
limited to 10 mA. The 20 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies
with an input current of 10 mA to two.
The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by
TJmax, the junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula
PDMAX = (TJmax − TA)/θJA. In the 16-pin TSSOP, θJA is 96°C/W, so PDMAX = 1,200 mW at 25°C and 625 mW at the maximum
operating ambient temperature of 105°C. Note that the power consumption of this device under normal operation is a maximum of 12
mW. The values for maximum power dissipation listed above will be reached only when the ADC128S022 is operated in a severe fault
condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is reversed).
Obviously, such conditions should always be avoided.
6.2 ESD Ratings
VALUE
Electrostatic
discharge
V(ESD)
(1)
(2)
(3)
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) (2)
±2500
Machine Model (3)
±250
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
Human body model is 100-pF capacitor discharged through a 1.5-kΩ resistor.
Machine model is 220 pF discharged through ZERO ohms
6.3 Recommended Operating Conditions
See
(1)
.
MIN
NOM
Operating temperature
–40
TA
VA supply voltage
2.7
VD supply voltage
2.7
VA
V
Digital input voltage
0
VA
V
Analog input voltage
0
VA
50
1600
Clock frequency
(1)
4
MAX
UNIT
105
°C
5.25
V
V
kHz
All voltages are measured with respect to GND = 0V, unless otherwise specified.
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6.4 Thermal Information
ADC128S022
THERMAL METRIC (1)
PW (TSSOP)
UNIT
16 PINS
RθJA
Junction-to-ambient thermal resistance
110
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
42
°C/W
RθJB
Junction-to-board thermal resistance
56
°C/W
ψJT
Junction-to-top characterization parameter
5
°C/W
ψJB
Junction-to-board characterization parameter
55
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Electrical Characteristics
The following specifications apply for AGND = DGND = 0 V, fSCLK = 0.8 MHz to 3.2 MHz, fSAMPLE = 50 ksps to 200 ksps, CL =
50 pF, unless otherwise noted. Maximum and minimum limits apply for TA = TMIN to TMAX: all other limits TA = 25°C. (1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX (2)
UNIT
STATIC CONVERTER CHARACTERISTICS
Resolution with no missing codes
Integral non-linearity (end-point
method)
INL
VA = VD = 5 V
Offset error
OEM
FSE
Offset error match
Full scale error
FSEM
Full scale error match
LSB
±0.4
±1
LSB
0.3
0.9
LSB
VA = VD = 5 V
Differential non-linearity
VOFF
Bits
±1
±0.3
VA = VD = 3 V
DNL
12
VA = VD = 3 V
−0.7
−0.2
0.5
−0.7
LSB
1
−0.3
LSB
LSB
VA = VD = 3 V
0.8
±2.3
LSB
VA = VD = 5 V
1.2
±2.3
LSB
VA = VD = 3 V
±0.05
±1.5
LSB
VA = VD = 5 V
±0.2
±1.5
LSB
VA = VD = 3 V
0.5
±2
LSB
VA = VD = 5 V
0.3
±2
LSB
VA = VD = 3 V
±0.05
±1.5
LSB
VA = VD = 5 V
±0.2
±1.5
LSB
DYNAMIC CONVERTER CHARACTERISTICS
FPBW
SINAD
SNR
Signal-to-noise plus distortion ratio
Signal-to-noise ratio
THD
Total harmonic distortion
SFDR
ENOB
(1)
(2)
Full power bandwidth (−3 dB)
Spurious-free dynamic range
Effective number of bits
VA = VD = 3 V
8
MHz
VA = VD = 5 V
11
MHz
VA = VD = 3 V,
fIN = 39.9 kHz, −0.02 dBFS
70
73
dB
VA = VD = 5 V,
fIN = 39.9 kHz, −0.02 dBFS
70
73
dB
VA = VD = 3 V,
fIN = 39.9 kHz, −0.02 dBFS
70.8
73
dB
VA = VD = 5 V,
fIN = 39.9 kHz, −0.02 dBFS
70.8
73
dB
VA = VD = 3 V,
fIN = 39.9 kHz, −0.02 dBFS
−89
−74
dB
VA = VD = 5 V,
fIN = 39.9 kHz, −0.02 dBFS
−90
−74
dB
VA = VD = 3 V,
fIN = 39.9 kHz, −0.02 dBFS
75
91
dB
VA = VD = 5 V,
fIN = 39.9 kHz, −0.02 dBFS
75
91
dB
VA = VD = 3 V, fIN = 39.9 kHz
11.3
11.8
Bits
VA = VD = 5 V, fIN = 39.9 kHz, −0.02 dBFS
11.3
11.8
Bits
Data sheet minimum and maximum specification limits are specified by design, test, or statistical analysis.
Tested limits are specified to Texas Instruments' AOQL (Average Outgoing Quality Level).
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Electrical Characteristics (continued)
The following specifications apply for AGND = DGND = 0 V, fSCLK = 0.8 MHz to 3.2 MHz, fSAMPLE = 50 ksps to 200 ksps, CL =
50 pF, unless otherwise noted. Maximum and minimum limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.(1)
PARAMETER
ISO
Channel-to-channel isolation
Intermodulation distortion, second
order terms
IMD
Intermodulation distortion, third order
terms
TEST CONDITIONS
MIN
TYP
MAX (2)
UNIT
VA = VD = 3 V, fIN = 20 kHz
81
dB
VA = VD = 5 V, fIN = 20 kHz, −0.02 dBFS
80
dB
VA = VD = 3 V,
fa = 19.5 kHz, fb = 20.5 kHz
−97
dB
VA = VD = 5 V,
fa = 19.5 kHz, fb = 20.5 kHz
−94
dB
VA = VD = 3 V,
fa = 19.5 kHz, fb = 20.5 kHz
−88
dB
VA = VD = 5 V,
fa = 19.5 kHz, fb = 20.5 kHz
−88
dB
ANALOG INPUT CHARACTERISTICS
VIN
Rail-to-rail input
IDCL
DC leakage current
CINA
Input capacitance
0
VA
V
±1
µA
Track mode
33
pF
Hold mode
3
pF
DIGITAL INPUT CHARACTERISTICS
VA = VD = 2.7 V to 3.6 V
2.1
VA = VD = 4.75 V to 5.25 V
2.4
VIH
Input high voltage
VIL
Input low voltage
VA = VD = 2.7 V to 5.25 V
IIN
Input current
VIN = 0 V or VD
CIND
Digital input capacitance
V
V
0.8
V
±0.01
±1
µA
2
4
pF
DIGITAL OUTPUT CHARACTERISTICS
VOH
Output high voltage
ISOURCE = 200 µA,
VA = VD = 2.7 V to 5.25 V
VOL
Output low voltage
ISINK = 200 µA to 1 mA,
VA = VD = 2.7 V to 5.25 V
IOZH, IOZL
Hi-impedance output leakage current VA = VD = 2.7 V to 5.25 V
COUT
Hi-impedance output capacitance (1)
VD − 0.5
V
2
Output coding
0.4
V
±1
µA
4
pF
Straight (Natural) Binary
POWER SUPPLY CHARACTERISTICS (CL = 10 pF)
VA, VD
Analog and digital supply voltages
Total supply current
Normal mode ( CS low)
IA + ID
Total supply current
Shutdown mode (CS high)
Power consumption
Normal mode ( CS low)
PC
Power consumption
Shutdown mode (CS high)
6
VA ≥ VD
5.25
V
0.41
1.1
mA
VA = VD = +4.75 V to +5.25 V,
fSAMPLE = 200 ksps, fIN = 39.9 kHz
1.5
2.3
mA
VA = VD = +2.7 V to +3.6 V,
fSCLK = 0 ksps
20
nA
VA = VD = 4.75 V to 5.25 V, fSCLK = 0 ksps
50
nA
VA = VD = 3 V, fSAMPLE = 200 ksps, fIN = 39.9
kHz
1.2
3.3
mW
VA = VD = 5 V, fSAMPLE = 200 ksps, fIN = 39.9
kHz
7.5
11.5
mW
VA = VD = +2.7 V to +3.6 V,
fSAMPLE = 200 ksps, fIN = 39.9 kHz
2.7
VA = VD = 3 V, fSCLK = 0 ksps
0.06
µW
VA = VD = 5 V, fSCLK = 0 ksps
0.25
µW
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Electrical Characteristics (continued)
The following specifications apply for AGND = DGND = 0 V, fSCLK = 0.8 MHz to 3.2 MHz, fSAMPLE = 50 ksps to 200 ksps, CL =
50 pF, unless otherwise noted. Maximum and minimum limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.(1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX (2)
16
3.2
1000
200
ksps
13
SCLK cycles
UNIT
AC ELECTRICAL CHARACTERISTICS
fSCLKMIN
Minimum clock frequency
VA = VD = 2.7 V to 5.25 V
fSCLK
Maximum clock frequency
VA = VD = 2.7 V to 5.25 V
0.8
MHz
50
fS
Sample rate continuous mode
VA = VD = 2.7 V to 5.25 V
tCONVERT
Conversion (hold) time
VA = VD = 2.7 V to 5.25 V
DC
SCLK duty cycle
VA = VD = 2.7 V to 5.25 V
tACQ
Acquisition (track) time
VA = VD = 2.7 V to 5.25 V
Throughput time
Acquisition time + conversion time
VA = VD = 2.7 V to 5.25 V
Aperture delay
VA = VD = 2.7 V to 5.25 V
tAD
MHz
ksps
40%
30%
70%
60%
3
SCLK cycles
16
SCLK cycles
4
ns
6.6 Timing Specifications
The following specifications apply for VA = VD = 2.7 V to 5.25 V, AGND = DGND = 0 V, fSCLK = 0.8 MHz to 3.2 MHz, fSAMPLE =
50 ksps to 200 ksps, and CL = 50 pF. Maximum and minimum limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.
PARAMETER
TEST CONDITIONS
MIN
NOM
MAX (1)
UNIT
tCSH
CS hold time after SCLK rising edge
10
0
ns
tCSS
CS set-up time prior to SCLK rising edge
10
4.5
ns
tEN
CS falling edge to DOUT enabled
tDACC
DOUT access time after SCLK falling edge
tDHLD
DOUT hold time after SCLK falling edge
tDS
DIN set-up time prior to SCLK rising edge
tDH
DIN hold time after SCLK rising edge
tCH
SCLK high time
0.4 × tSCLK
ns
tCL
SCLK low time
0.4 × tSCLK
ns
tDIS
CS rising Edge to DOUT high-impedance
(1)
5
30
ns
17
27
ns
4
ns
10
3
ns
10
3
ns
DOUT falling
2.4
20
ns
DOUT rising
0.9
20
ns
Data sheet min/max specification limits are specified by design, test, or statistical analysis.
Power
Down
Power Up
Track
Power Up
Hold
Track
Hold
CS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
1
2
3
4
5
6
7
8
SCLK
Control register
DIN
DOUT
ADD2
FOUR ZEROS
ADD1
ADD0
DB11 DB10 DB9
ADD2
DB8
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
FOUR ZEROS
ADD1
ADD0
DB11 DB10 DB9
Figure 1. ADC128S022 Operational Timing Diagram
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CS
tCONVERT
tACQ
tCH
SCLK
1
2
3
4
5
6
7
tCL
tEN
DOUT
8
16
tDACC
DB11
FOUR ZEROS
DB10
tDHLD
DB9
DB8
tDIS
DB1
DB0
tDH
tDS
DIN
DONTC
DONTC
ADD2
ADD1
ADD0
DONTC
DONTC
DONTC
Figure 2. ADC128S022 Serial Timing Diagram
SCLK
tCSS
CS
tCSH
CS
Figure 3. SCLK and CS Timing Parameters
8
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6.7 Typical Characteristics
TA = 25°C, fSAMPLE = 200 ksps, fSCLK = 3.2 MHz, fIN = 39.9 kHz unless otherwise stated.
Figure 4. DNL
Figure 5. DNL
Figure 6. INL
Figure 7. INL
Figure 8. DNL vs Supply
Figure 9. INL vs Supply
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Typical Characteristics (continued)
TA = 25°C, fSAMPLE = 200 ksps, fSCLK = 3.2 MHz, fIN = 39.9 kHz unless otherwise stated.
10
Figure 10. SNR vs Supply
Figure 11. THD vs Supply
Figure 12. ENOB vs Supply
Figure 13. DNL vs VD With VA = 5 V
Figure 14. INL vs VD With VA = 5 V
Figure 15. DNL vs SCLK Duty Cycle
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Typical Characteristics (continued)
TA = 25°C, fSAMPLE = 200 ksps, fSCLK = 3.2 MHz, fIN = 39.9 kHz unless otherwise stated.
Figure 16. INL vs SCLK Duty Cycle
Figure 17. SNR vs SCLK Duty Cycle
Figure 18. THD vs SCLK Duty Cycle
Figure 19. ENOB vs SCLK Duty Cycle
Figure 20. DNL vs SCLK
Figure 21. INL vs SCLK
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Typical Characteristics (continued)
TA = 25°C, fSAMPLE = 200 ksps, fSCLK = 3.2 MHz, fIN = 39.9 kHz unless otherwise stated.
12
Figure 22. SNR vs SCLK
Figure 23. THD vs SCLK
Figure 24. ENOB vs SCLK
Figure 25. DNL vs Temperature
Figure 26. INL vs Temperature
Figure 27. SNR vs Temperature
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Typical Characteristics (continued)
TA = 25°C, fSAMPLE = 200 ksps, fSCLK = 3.2 MHz, fIN = 39.9 kHz unless otherwise stated.
Figure 28. THD vs Temperature
Figure 29. ENOB vs Temperature
Figure 30. SNR vs Input Frequency
Figure 31. THD vs Input Frequency
Figure 32. ENOB vs Input Frequency
Figure 33. Power Consumption vs SCLK
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7 Detailed Description
7.1 Overview
The ADC128S022 is a successive-approximation analog-to-digital converter designed around a chargeredistribution digital-to-analog converter.
Simplified schematics of the ADC128S022 in both track and hold operation are shown in Figure 34 and Figure 35
respectively. In Figure 34, the ADC128S022 is in track mode: switch SW1 connects the sampling capacitor to
one of eight analog input channels through the multiplexer, and SW2 balances the comparator inputs. The
ADC128S022 is in this state for the first three SCLK cycles after CS is brought low.
Figure 35 shows the ADC128S022 in hold mode: switch SW1 connects the sampling capacitor to ground,
maintaining the sampled voltage, and switch SW2 unbalances the comparator. The control logic then instructs
the charge-redistribution DAC to add or subtract fixed amounts of charge to or from the sampling capacitor until
the comparator is balanced. When the comparator is balanced, the digital word supplied to the DAC is the digital
representation of the analog input voltage. The ADC128S022 is in this state for the last thirteen SCLK cycles
after CS is brought low.
IN0
CHARGE
REDISTRIBUTION
DAC
MUX
SAMPLING
CAPACITOR
SW1
IN7
SW2
+
-
CONTRO
L
LOGI
C
AGND
VA /2
Figure 34. ADC128S022 in Track Mode
IN0
CHARGE
REDISTRIBUTION
DAC
MUX
IN7
SAMPLING
CAPACITOR
+
SW1
SW2
CONTROL
LOGIC
-
AGND
VA /2
Figure 35. ADC128S022 in Hold Mode
14
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7.2 Functional Block Diagram
IN0
.
.
.
MUX
T/H
12-BIT
SUCCESSIVE
APPROXIMATION
ADC
VA
AGND
AGND
IN7
VD
SCLK
ADC128S022
CONTROL
LOGIC
CS
DIN
DOUT
DGND
7.3 Feature Description
7.3.1 Serial Interface
An operational timing diagram and a serial interface timing diagram for the ADC128S022 are shown in the
Specifications section. CS, chip select, initiates conversions and frames the serial data transfers. SCLK (serial
clock) controls both the conversion process and the timing of serial data. DOUT is the serial data output pin,
where a conversion result is sent as a serial data stream, MSB first. Data to be written to the ADC128S022's
Control Register is placed on DIN, the serial data input pin. New data is written to DIN with each conversion.
A serial frame is initiated on the falling edge of CS and ends on the rising edge of CS. Each frame must contain
an integer multiple of 16 rising SCLK edges. The ADC's DOUT pin is in a high impedance state when CS is high
and is active when CS is low. Thus, CS acts as an output enable. Similarly, SCLK is internally gated off when CS
is brought high.
During the first 3 cycles of SCLK, the ADC is in the track mode, acquiring the input voltage. For the next 13
SCLK cycles the conversion is accomplished and the data is clocked out. SCLK falling edges 1 through 4 clock
out leading zeros while falling edges 5 through 16 clock out the conversion result, MSB first. If there is more than
one conversion in a frame (continuous conversion mode), the ADC will re-enter the track mode on the falling
edge of SCLK after the N*16th rising edge of SCLK and re-enter the hold/convert mode on the N*16+4th falling
edge of SCLK. "N" is an integer value.
The ADC128S022 enters track mode under three different conditions. In Figure 1, CS goes low with SCLK high
and the ADC enters track mode on the first falling edge of SCLK. In the second condition, CS goes low with
SCLK low. Under this condition, the ADC automatically enters track mode and the falling edge of CS is seen as
the first falling edge of SCLK. In the third condition, CS and SCLK go low simultaneously and the ADC enters
track mode. While there is no timing restriction with respect to the rising edges of CS and SCLK, see Figure 3 for
set-up and hold time requirements for the falling edge of CS with respect to the rising edge of SCLK.
While a conversion is in progress, the address of the next input for conversion is clocked into a control register
through the DIN pin on the first 8 rising edges of SCLK after the fall of CS. See Table 1, Table 2, and Table 3.
There is no need to incorporate a power-up delay or dummy conversion as the ADC128S022 is able to acquire
the input signal to full resolution in the first conversion immediately following power up. The first conversion result
after power up will be that of IN0.
7.3.2 ADC128S022 Transfer Function
The output format of the ADC128S022 is straight binary. Code transitions occur midway between successive
integer LSB values. The LSB width for the ADC128S022 is VA / 4096. The ideal transfer characteristic is shown
in Figure 36. The transition from an output code of 0000 0000 0000 to a code of 0000 0000 0001 is at 1/2 LSB,
or a voltage of VA / 8192. Other code transitions occur at steps of one LSB.
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Feature Description (continued)
111...111
111...000
|
|
ADC CODE
111...110
1LSB = VA/4096
011...111
000...010
|
000...001
000...000
0V
0.5LSB
ANALOG INPUT
+VA - 1.5LSB
Figure 36. Ideal Transfer Characteristic
7.3.3 Analog Inputs
An equivalent circuit for one of the input channels of the ADC128S022 is shown in Figure 37. Diodes D1 and D2
provide ESD protection for the analog inputs. The operating range for the analog inputs is 0 V to VA. Going
beyond this range will cause the ESD diodes to conduct and result in erratic operation.
The capacitor C1 in Figure 37 has a typical value of 3 pF and is mainly the package pin capacitance. Resistor R1
is the ON-resistance of the multiplexer and track / hold switch and is typically 500 Ω. Capacitor C2 is the
ADC128S022 sampling capacitor, and is typically 30 pF. The ADC128S022 will deliver best performance when
driven by a low-impedance source (less than 100 Ω). This is especially important when using the ADC128S022
to sample dynamic signals. Also important when sampling dynamic signals is a bandpass or lowpass filter which
reduces harmonics and noise in the input. These filters are often referred to as anti-aliasing filters.
VA
D1
R1
C2
30 pF
VIN
C1
3 pF
D2
Conversion Phase - Switch Open
Track Phase - Switch Closed
Figure 37. Equivalent Input Circuit
7.3.4 Digital Inputs and Outputs
The digital inputs of the ADC128S022 (SCLK, CS, and DIN) have an operating range of –0.3 V to VA. They are
not prone to latch-up and may be asserted before the digital supply (VD) without any risk. The digital output
(DOUT) operating range is controlled by VD. The output high voltage is VD – 0.5V (minimum) while the output low
voltage is 0.4 V (maximum).
7.4 Device Functional Modes
The ADC128S022 is fully powered-up whenever CS is low and fully powered-down whenever CS is high, with
one exception. If operating in continuous conversion mode, the ADC128S022 automatically enters power-down
mode between SCLK's 16th falling edge of a conversion and SCLK's 1st falling edge of the subsequent
conversion (see Figure 1).
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Device Functional Modes (continued)
In continuous conversion mode, the ADC128S022 can perform multiple conversions back to back. Each
conversion requires 16 SCLK cycles and the ADC128S022 will perform conversions continuously as long as CS
is held low. Continuous mode offers maximum throughput.
In burst mode, the user may trade off throughput for power consumption by performing fewer conversions per
unit time. This means spending more time in power-down mode and less time in normal mode. By using this
technique, the user can achieve very low sample rates while still using an SCLK frequency within the electrical
specifications. The Power Consumption vs SCLK curve in the Typical Characteristics section shows the typical
power consumption of the ADC128S022. To calculate the power consumption (PC), simply multiply the fraction of
time spent in the normal mode (tN) by the normal mode power consumption (PN), and add the fraction of time
spent in shutdown mode (tS) multiplied by the shutdown mode power consumption (PS) as shown in Equation 1.
tS
tN
x PN +
x PS
tN + t S
tN + t S
PC =
(1)
7.5 Register Maps
Table 1. Control Register Bits
Bit 7 (MSB)
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
DONTC
DONTC
ADD2
ADD1
ADD0
DONTC
DONTC
DONTC
Table 2. Control Register Bit Descriptions
BIT #:
SYMBOL:
DESCRIPTION
7, 6, 2, 1, 0
DONTC
Don't care. The values of these bits do not affect the device.
5
ADD2
4
ADD1
3
ADD0
These three bits determine which input channel will be sampled and converted at the next
conversion cycle. The mapping between codes and channels is shown in Table 3.
Table 3. Input Channel Selection
ADD2
ADD1
ADD0
INPUT CHANNEL
0
0
0
IN0 (Default)
0
0
1
IN1
0
1
0
IN2
0
1
1
IN3
1
0
0
IN4
1
0
1
IN5
1
1
0
IN6
1
1
1
IN7
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8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
The ADC128S022 is a successive-approximation analog-to-digital converter designed around a chargeredistribution digital-to-analog converter. Because the ADC128S022 integrates an 8 to 1 MUX on the front end,
the device is typically used in applications where multiple voltages need to be monitored. In addition to having 8
input channels, the ADC128S022 can operate at sampling rates up to 200 kSPS. As a result, the ADC128S022
is typically run in burst fashion where a voltage is sampled for several times and then the ADC128S022 can be
powered down. This is a common technique for applications that are power limited. Due to the high bandwidth
and sampling rate, the ADC128S022 is suitable for monitoring AC waveforms as well as DC inputs. The following
example shows a common configuration for monitoring AC inputs.
8.2 Typical Application
The following sections outline the design principles of data acquisition system based on the ADC128S022.
A typical application is shown in Figure 38. The analog supply is bypassed with a capacitor network located close
to the ADC128S022. The ADC128S022 uses the analog supply (VA) as its reference voltage, so it is very
important that VA be kept as clean as possible. Due to the low power requirements of the ADC128S022, it is also
possible to use a precision reference as a power supply.
5V
3.3V
1uF
High
Impedance
Source
+
LMV612
0.1uF
100
IN7
0.1uF 1uF
V
A
VD
VDD
100
GPIOa
SCLK
100
33n
GPIOb
CS
MCU
100
Low
Impedance
Source
Schottky
Diode
(optional)
100
IN3
ADC128S022
DOUT
100
DIN
GPIOd
GND
IN0
33n
GPIOc
AGN
D
DGN
D
Figure 38. Typical Application Circuit
8.2.1 Design Requirements
A positive supply only data acquisition system capable of digitizing signals ranging 0 to 5 V, BW = 10 kHz, and a
throughput of 125 kSPS.
The ADC128S022 has to interface to an MCU whose supply is set at 3.3 V.
8.2.2 Detailed Design Procedure
The signal range requirement forces the design to use 5-V analog supply at VA, analog supply. This follows from
the fact that VA is also a reference potential for the ADC.
The requirement of interfacing to the MCU which is powered by 3.3-V supply, forces the choice of 3.3-V as a VD
supply.
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Typical Application (continued)
Sampling is in fact a modulation process which may result in aliasing of the input signal, if the input signal is not
adequately band limited. The maximum sampling rate of the ADC128S022 when all channels are enabled is, Fs
is calculated by Equation 2:
FSCLK
Fs =
16 ´ 8
(2)
Note that faster sampling rates can be achieved when fewer channels are sampled. Single channel can be
sampled at the maximum rate of Equation 3:
FSCLK
Fs _ sin gle =
16
(3)
In order to avoid the aliasing, the Nyquist criterion has to be met by Equation 4:
Fs
BW signal £
2
(4)
Therefore it is necessary to place anti-aliasing filters at all inputs of the ADC. These filters may be single-pole
lowpass filters whose pole location has to satisfy, assuming all channels sampled in sequence of Equation 5 and
Equation 6:
1
FSCLK
£
p ´ R ´ C 16 ´ 8
(5)
128
R´C ³
p ´ FSCLK
(6)
With Fsclk = 16 MHz, a good choice for the single-pole filter is:
• R = 100
• C = 33 nF
This reduces the input BWsignal = 48 kHz. The capacitor at the INx input of the device provides not only the
filtering of the input signal, but it also absorbs the charge kick-back from the ADC. The kick-back is the result of
the internal switches opening at the end of the acquisition period.
The VA and VD sources are already separated in this example, due to the design requirements. This also
benefits the overall performance of the ADC, as the potentially noisy VD supply does not contaminate the VA. In
the same vain, further consideration could be given to the SPI interface, especially when the master MCU is
capable of producing fast rising edges on the digital bus signals. Inserting small resistances in the digital signal
path may help in reducing the ground bounce, and thus improve the overall noise performance of the system.
Take care when the signal source is capable of producing voltages beyond VA. In such instances the internal
ESD diodes may start conducting. The ESD diodes are not intended as input signal clamps. To provide the
desired clamping action use Schottky diodes as shown in Figure 38.
8.2.3 Application Curve
Figure 39. Typical Performance
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9 Power Supply Recommendations
There are three major power supply concerns with this product: power supply sequencing, power management,
and the effect of digital supply noise on the analog supply.
9.1 Power Supply Sequence
The ADC128S022 is a dual-supply device. The two supply pins share ESD resources, so take care to ensure
that the power is applied in the correct sequence. To avoid turning on the ESD diodes, the digital supply (VD)
cannot exceed the analog supply (VA) by more than 300 mV, not even on a transient basis. Therefore, VA must
ramp up before or concurrently with VD.
9.2 Power Supply Noise Considerations
The charging of any output load capacitance requires current from the digital supply, VD. The current pulses
required from the supply to charge the output capacitance will cause voltage variations on the digital supply. If
these variations are large enough, they could degrade SNR and SINAD performance of the ADC. Furthermore, if
the analog and digital supplies are tied directly together, the noise on the digital supply will be coupled directly
into the analog supply, causing greater performance degradation than would noise on the digital supply alone.
Similarly, discharging the output capacitance when the digital output goes from a logic high to a logic low will
dump current into the die substrate, which is resistive. Load discharge currents will cause ground bounce noise
in the substrate that will degrade noise performance if that current is large enough. The larger the output
capacitance, the more current flows through the die substrate and the greater the noise coupled into the analog
channel.
The first solution to keeping digital noise out of the analog supply is to decouple the analog and digital supplies
from each other or use separate supplies for them. To keep noise out of the digital supply, keep the output load
capacitance as small as practical. If the load capacitance is greater than 50 pF, use a 100-Ω series resistor at
the ADC output, located as close to the ADC output pin as practical. This will limit the charge and discharge
current of the output capacitance and improve noise performance. Because the series resistor and the load
capacitor form a low-frequency pole, verify the signal integrity once the series resistor has been added.
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10 Layout
10.1 Layout Guidelines
Capacitive coupling between the noisy digital circuitry and the sensitive analog circuitry can lead to poor
performance. The solution is to keep the analog circuitry separated from the digital circuitry and the clock line as
short as possible.
Digital circuits create substantial supply and ground current transients. The logic noise generated could have
significant impact upon system noise performance. To avoid performance degradation of the ADC128S022 due
to supply noise, do not use the same supply for the ADC128S022 that is used for digital logic.
Generally, analog and digital lines should cross each other at 90° to avoid crosstalk. However, to maximize
accuracy in high resolution systems, avoid crossing analog and digital lines altogether. It is important to keep
clock lines as short as possible and isolated from ALL other lines, including other digital lines. In addition, the
clock line should also be treated as a transmission line and be properly terminated.
The analog input should be isolated from noisy signal traces to avoid coupling of spurious signals into the input.
Any external component (for example, a filter capacitor) connected between the input pins and ground of the
converter or to the reference input pin and ground should be connected to a very clean point in the ground plane.
TI recommends the use of a single, uniform ground plane and the use of split power planes. The power planes
should be located within the same board layer. All analog circuitry (input amplifiers, filters, reference
components, and so forth) should be placed over the analog power plane. All digital circuitry and I/O lines should
be placed over the digital power plane. Furthermore, all components in the reference circuitry and the input
signal chain that are connected to ground should be connected together with short traces and enter the analog
ground plane at a single, quiet point.
10.2 Layout Example
ANALOG
SUPPLY
RAIL
to analog
signal sources
CS
SCLK
VA
DOUT
AGND
DIN
IN0
VD
IN1
DGND
IN2
IN7
IN3
IN6
IN4
IN5
toMCU
“DIGITAL” SUPPLY RAIL
VIA to GROUND PLANE
GROUND PLANE
Figure 40. Layout Schematic
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11 Device and Documentation Support
11.1 Device Support
11.1.1 Device Nomenclature
11.1.1.1 Specification Definitions
ACQUISITION TIME is the time required for the ADC to acquire the input voltage. During this time, the hold
capacitor is charged by the input voltage.
APERTURE DELAY is the time between the fourth falling edge of SCLK and the time when the input signal is
internally acquired or held for conversion.
CONVERSION TIME is the time required, after the input voltage is acquired, for the ADC to convert the input
voltage to a digital word.
CHANNEL-TO-CHANNEL ISOLATION is resistance to coupling of energy from one channel into another
channel
CROSSTALK is the coupling of energy from one channel into another channel. This is similar to Channel-toChannel Isolation, except for the sign of the data.
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1
LSB.
DUTY CYCLE is the ratio of the time that a repetitive digital waveform is high to the total time of one period. The
specification here refers to the SCLK.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise
and Distortion or SINAD. ENOB is defined as (SINAD - 1.76) / 6.02 and says that the converter is equivalent to a
perfect ADC of this (ENOB) number of bits.
FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental
drops 3 dB below its low frequency value for a full scale input.
FULL SCALE ERROR (FSE) is a measure of how far the last code transition is from the ideal 1½ LSB below
VREF+ and is defined as:
VFSE = Vmax + 1.5 LSB – VREF+
(7)
where Vmax is the voltage at which the transition to the maximum code occurs. FSE can be expressed in Volts,
LSB or percent of full scale range.
GAIN ERROR is the deviation of the last code transition (111...110) to (111...111) from the ideal (VREF - 1.5
LSB), after adjusting for offset error.
INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from
negative full scale (½ LSB below the first code transition) through positive full scale (½ LSB above the last code
transition). The deviation of any given code from this straight line is measured from the center of that code value.
INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two
sinusoidal frequencies being applied to an individual ADC input at the same time. It is defined as the ratio of the
power in both the second and the third order intermodulation products to the power in one of the original
frequencies. Second order products are fa ± fb, where fa and fb are the two sine wave input frequencies. Third
order products are (2fa ± fb ) and (fa ± 2fb). IMD is usually expressed in dB.
MISSING CODES are those output codes that will never appear at the ADC outputs. These codes cannot be
reached with any input value. The ADC128S022 is ensured not to have any missing codes.
OFFSET ERROR is the deviation of the first code transition (000...000) to (000...001) from the ideal (i.e. GND +
0.5 LSB).
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal to the rms
value of the sum of all other spectral components below one-half the sampling frequency, not including d.c. or
the harmonics included in THD.
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Device Support (continued)
SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of the
input signal to the rms value of all of the other spectral components below half the clock frequency, including
harmonics but excluding d.c.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the desired signal
amplitude to the amplitude of the peak spurious spectral component, where a spurious spectral component is
any signal present in the output spectrum that is not present at the input and may or may not be a harmonic.
TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dBc, of the rms total of the first five harmonic
components at the output to the rms level of the input signal frequency as seen at the output. THD is calculated
as
THD = 20 ‡ log 10
A f22 +
+ A f10 2
A f12
(8)
where Af1 is the RMS power of the input frequency at the output and Af2 through Af10 are the RMS power in the
first 9 harmonic frequencies.
THROUGHPUT TIME is the minimum time required between the start of two successive conversions. It is the
acquisition time plus the conversion and read out times. In the case of the ADC128S022, this is 16 SCLK
periods.
11.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
11.3 Trademarks
E2E is a trademark of Texas Instruments.
SPI, QSPI are trademarks of Motorola, Inc..
All other trademarks are the property of their respective owners.
11.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
11.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
ADC128S022CIMT/NOPB
ACTIVE
TSSOP
PW
16
92
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 105
128S022
CIMT
ADC128S022CIMTX/NOPB
ACTIVE
TSSOP
PW
16
2500
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 105
128S022
CIMT
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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