ADC12L080
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SNAS200B – OCTOBER 2004 – REVISED MARCH 2013
ADC12L080 12-Bit, 80 MSPS, 450 MHz Bandwidth A/D Converter with Internal Reference
Check for Samples: ADC12L080
FEATURES
1
•
•
•
•
•
2
•
Single Supply Operation
Low Power Consumption
Power Down Mode
Internal or External Reference
Selectable Offset Binary or 2's Complement
Data Format
Pin-Compatible with ADC12010, ADC12020,
ADC12040, ADC12L063, ADC12L066
APPLICATIONS
•
•
•
•
•
•
•
•
Ultrasound and Imaging
Instrumentation
Cellular Base Stations/Communication
Receivers
Sonar/Radar
xDSL
Wireless Local Loops
Data Acquisition Systems
DSP Front Ends
KEY SPECIFICATIONS
•
•
•
•
•
DESCRIPTION
The ADC12L080 is a monolithic CMOS analog-todigital converter capable of converting analog input
signals into 12-bit digital words at 80 Megasamples
per second (MSPS). This converter uses a
differential, pipeline architecture with digital error
correction and an on-chip sample-and-hold circuit to
minimize die size and power consumption while
providing excellent dynamic performance. The
ADC12L080 can be operated with either the internal
or an external reference. Operating on a single 3.3V
power supply, this device consumes just 425 mW at
80 MSPS, including the reference current. The Power
Down feature reduces power consumption to just 50
mW.
The differential inputs provide a full scale input swing
equal to ±VREF. The buffered, high impedance, singleended external reference input is converted on-chip
to a differential reference for use by the processing
circuitry. Output data format may be selected as
either offset binary or two's complement.
This device is available in the 32-lead LQFP package
and operates over the industrial temperature range of
−40°C to +85°C.
Full Power Bandwidth: 450 MHz
DNL: ±0.4 LSB (typ)
SNR (fIN = 10 MHz): 66 dB (typ)
SFDR (fIN = 10 MHz): 80 dB (typ)
Power Consumption, 80 MHz
– Operating: 425 mW (typ)
– Power Down: 50 mW (typ)
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2013, Texas Instruments Incorporated
ADC12L080
SNAS200B – OCTOBER 2004 – REVISED MARCH 2013
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Connection Diagram
Figure 1. 32-Lead LQFP Package
See Package Number NEY0032A
Block Diagram
2
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Pin Descriptions and Equivalent Circuits
Pin No.
Symbol
Equivalent Circuit
Description
ANALOG I/O
2
3
VIN+
VIN−
1
VREF
31
VRP
32
VRM
30
VRN
Differential analog signal Input pins. With a 1.0V reference voltage
the full-scale differential input signal level is 2.0 VP-P with each input
pin centered on a common mode voltage, VCM. The VIN- pin may be
connected to VCM for single-ended operation, but a differential input
signal is required for best performance.
Reference input. This pin should be connected to VA to use the
internal 1.0V reference. If it is desired to use an external reference
voltage, this pin should be bypassed to AGND with a 0.1 µF low ESL
capacitor. Specified operation is with a VREF of 1.0V, but the device
will function well with a VREF range indicated in the Electrical Tables.
These pins are high impedance reference bypass pins only. Connect
a 0.1 µF capacitor from each of these pins to AGND. Connect a 1.0
µF capacitor from VRP to VRN. DO NOT LOAD these pins.
DIGITAL I/O
10
CLK
Digital clock input. The range of frequencies for this input is 10 MHz
to 80 MHz with guaranteed performance at 80 MHz. The input is
sampled on the rising edge of this input.
11
OF
Output format selection. When this pin is LOW, the output format is
offset binary. When this pin is HIGH the output format is two's
complement. This pin may be changed asynchronously, but such a
change will result in errors for one or two conversions.
8
PD
PD is the Power Down input pin. When high, this input puts the
converter into the power down mode. When this pin is low, the
converter is in the active mode.
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Pin Descriptions and Equivalent Circuits (continued)
Pin No.
Symbol
14–19,
22–27
D0–D11
Equivalent Circuit
Description
Digital data output pins that make up the 12-bit conversion results.
D0 is the LSB, while D11 is the MSB of the output word.
ANALOG POWER
5, 6, 29
VA
4, 7, 28
AGND
Positive analog supply pins. These pins should be connected to a
quiet +3.3V source and bypassed to AGND with 0.1 µF low ESL
capacitors located within 1 cm of these power pins, and with a 10 µF
capacitor.
The ground return for the analog supply.
DIGITAL POWER
13
VD
9, 12
DGND
21
VDR
20
DR GND
Positive digital supply pin. This pin should be connected to the same
quiet +3.3V source as is VA and bypassed to DGND with a 0.1 µF
monolithic capacitor in parallel with a 10 µF capacitor, both located
within 1 cm of the power pin.
The ground return for the digital supply.
Positive digital supply pin for the ADC12L080's output drivers. This
pin should be connected to a voltage source in the range indicated in
the Operating Ratings table and be bypassed to DR GND with a 0.1
µF capacitor. If the supply for this pin is different from the supply
used for VA and VD, it should also be bypassed with a 10 µF
capacitor. The voltage at this pin should never exceed the voltage on
VD by more than 300 mV. All bypass capacitors should be located
within 1 cm of the supply pin.
The ground return for the digital supply for the ADC12L080's output
drivers. This pin should be connected to the system digital ground,
but not be connected in close proximity to the ADC12L080's DGND
or AGND pins. See LAYOUT AND GROUNDING for more details.
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
4
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Absolute Maximum Ratings (1) (2) (3)
VA, VD, VDR
4.2V
≤ 100 mV
|VA–VD|
≤ 300 mV
VDR–VD
−0.3V to VA or (VD + 0.3V)
Voltage on Any Pin
Input Current at Any Pin (4)
±25 mA
Package Input Current (4)
±50 mA
See (5)
Package Dissipation at TA = 25°C
ESD Susceptibility
Human Body Model
(6)
2500V
Machine Model (6)
250V
Soldering Temperature, Infrared, 10 sec. (7)
235°C
−65°C to +150°C
Storage Temperature
(1)
(2)
(3)
(4)
(5)
(6)
(7)
All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified.
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see
the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics
may degrade when the device is not operated under the listed test conditions.
If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications.
When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the
power supplies with an input current of 25 mA to two.
The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by
TJmax, the junction-to-ambient thermal resistance (θJA), and the ambient temperature, (TA), and can be calculated using the formula
PDMAX = (TJmax - TA )/θJA. The values for maximum power dissipation will be reached only when the device is operated in a severe
fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is reversed).
Obviously, such conditions should always be avoided.
Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through 0Ω.
The 235°C reflow temperature refers to infrared reflow. For Vapor Phase Reflow (VPR), the following Conditions apply: Maintain the
temperature at the top of the package body above 183°C for a minimum 60 seconds. The temperature measured on the package body
must not exceed 220°C. Only one excursion above 183°C is allowed per reflow cycle.
Operating Ratings (1) (2)
Operating Temperature
−40°C ≤ TA ≤ +85°C
Supply Voltage (VA, VD)
+3.0V to +3.60V
Output Driver Supply (VDR)
+2.4V to VD
VREF
0.8V to 1.5V
−0.05V to VD + 0.05V
CLK, PD, OF
−0V to (VA − 0.5V)
VIN Input
VCM
0.5V to (VA-1.5V)
|AGND–DGND|
(1)
(2)
0V
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see
the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics
may degrade when the device is not operated under the listed test conditions.
All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified.
Package Thermal Resistances
Package
θJ-A
32-Lead LQFP
79°C / W
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Converter Electrical Characteristics
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR =
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100Ω, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C (1) (2) (3) (4)
Symbol
Parameter
Typical (4)
Conditions
Limits (4)
Units
(Limits)
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes
INL
Integral Non Linearity
DNL
GE
Differential Non Linearity
Best Fit Method
±1.2
No missing codes
±0.4
12
Bits
4.0
LSB (max)
-3.3
LSB (min)
1.5
LSB (max)
-1.0
LSB (min)
%FS (max)
%FS (min)
Positive Error
−0.15
+5.7
-2
Negative Error
+0.4
+5
-3.7
%FS (max)
%FS (min)
+0.2
+1.7
-0.6
%FS (max)
Gain Error
Offset Error (VIN+ = VIN−)
Under Range Output Code
0
0
Over Range Output Code
4095
4095
REFERENCE AND ANALOG INPUT CHARACTERISTICS
VCM
Common Mode Input Voltage
CIN
VIN Input Capacitance
(each pin to GND)
VREF
1.65
VIN = 1.0 Vdc + 1 VP-P
(CLK LOW)
8
(CLK HIGH)
7
Reference Voltage (5) (6)
1.0
0.5
V (min)
2.0
V (max)
pF
pF
0.8
V (min)
1.5
V (max)
(1)
The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited
per(6). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100 mV. As an example,
if VA is 3.3V, the full-scale input voltage must be ≤3.4V to ensure accurate conversions.
(2)
(3)
(4)
To guarantee accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
With the test condition for VREF = +1.0V (2 VP-P differential input), the 12-bit LSB is 488 µV.
Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to TI's AOQL (Average
Outgoing Quality Level).
Optimum dynamic performance will be obtained by keeping the reference input in the 0.8V to 1.5V range. The LM4051CIM3-ADJ or the
LM4051CIM3-1.2 band gap voltage reference is recommended for this application.
When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the
power supplies with an input current of 25 mA to two.
(5)
(6)
6
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DC and Logic Electrical Characteristics
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR =
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100Ω, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C (1) (2) (3) (4)
Symbol
Parameter
Conditions
Typical (4)
Limits (4)
Units
(Limits)
64
dB (min)
63
dB (min)
63
dB (min)
DYNAMIC CONVERTER CHARACTERISTICS
BW
Full Power Bandwidth
SNR
SINAD
ENOB
THD
2nd
Harm
3rd
Harm
SFDR
IMD
Signal-to-Noise Ratio
Signal-to-Noise & Distortion
Effective Number of Bits
Total Harmonic Distortion
Second Harmonic Distortion
Third Harmonic Distortion
Spurious Free Dynamic Range
Intermodulation Distortion
-0.5 dBFS Input, Output at −3 dB
450
fIN = 10 MHz, Differential VIN = −0.5 dBFS
66
fIN = 40 MHz, Differential VIN = −0.5 dBFS
65
fIN = 70 MHz, Differential VIN = −0.5 dBFS
65
fIN = 150 MHz, Differential VIN = −0.5 dBFS
63
fIN = 10 MHz, Differential VIN = −0.5 dBFS
66
fIN = 40 MHz, Differential VIN = −0.5 dBFS
64.5
fIN = 70 MHz, Differential VIN = −0.5 dBFS
64
fIN = 150 MHz, Differential VIN = −0.5 dBFS
62
fIN = 10 MHz, Differential VIN = −0.5 dBFS
10.7
fIN = 40 MHz, Differential VIN = 0.5 dBFS
10.4
fIN = 70 MHz, Differential VIN = −0.5 dBFS
10.3
fIN = 150 MHz, Differential VIN = −0.5 dBFS
10.0
fIN = 10 MHz, Differential VIN = −0.5 dBFS
−77
fIN = 40 MHz, Differential VIN = −0.5 dBFS
-74
fIN = 70 MHz, Differential VIN = −0.5 dBFS
-71
fIN = 150 MHz, Differential VIN = −0.5 dBFS
-70
fIN = 10 MHz, Differential VIN = −0.5 dBFS
−80
fIN = 40 MHz, Differential VIN = −0.5 dBFS
-80
fIN = 70 MHz, Differential VIN = −0.5 dBFS
-80
MHz
dB
dB
dB
62.7
dB (min)
10.2
Bits (min)
10.1
Bits (min)
-66
dB (max)
-65
dB (max)
dB
Bits
Bits
dB
dB
-68
dB (max)
-65.5
dB (max)
-69
dB (max)
-66
dB (max)
68
dB (min)
dB
fIN = 150 MHz, Differential VIN = −0.5 dBFS
-79
fIN = 10 MHz, Differential VIN = −0.5 dBFS
−84
fIN = 40 MHz, Differential VIN = −0.5 dBFS
-81
fIN = 70 MHz, Differential VIN = −0.5 dBFS
-79
fIN = 150 MHz, Differential VIN = −0.5 dBFS
-78
fIN = 10 MHz, Differential VIN = −0.5 dBFS
80
fIN = 40 MHz, Differential VIN = −0.5 dBFS
77
fIN = 70 MHz, Differential VIN = −0.5 dBFS
74
fIN = 150 MHz, Differential VIN = −0.5 dBFS
73
dB
fIN1 = 19.6MHz, fIN2 = 20.5 MHz,
each = -6.0 dBFS
66
dBFS
dB
dB
dB
dB
-65.5
dB (min)
(1)
The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited
per(6). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100 mV. As an example,
if VA is 3.3V, the full-scale input voltage must be ≤3.4V to ensure accurate conversions.
(2)
(3)
(4)
To guarantee accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
With the test condition for VREF = +1.0V (2 VP-P differential input), the 12-bit LSB is 488 µV.
Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to TI's AOQL (Average
Outgoing Quality Level).
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DC and Logic Electrical Characteristics (continued)
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR =
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100Ω, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C(1)(2)(3)(4)
Symbol
Parameter
Conditions
Typical (4)
Limits (4)
Units
(Limits)
CLK, PD, OF DIGITAL INPUT CHARACTERISTICS
VIN(1)
Logical “1” Input Voltage
VD = 3.3V
2.0
V (min)
VIN(0)
Logical “0” Input Voltage
VD = 3.3V
0.8
V (max)
IIN(1)
Logical “1” Input Current
VIN+, VIN− = 3.3V
10
µA
IIN(0)
Logical “0” Input Current
VIN+, VIN− = 0V
−10
µA
CIN
Digital Input Capacitance
5
pF
D0–D11 DIGITAL OUTPUT CHARACTERISTICS
VOUT(1)
Logical “1” Output Voltage
IOUT = −0.5 mA
VDR − 0.18
V (min)
VOUT(0)
Logical “0” Output Voltage
IOUT = 1.6 mA
+ISC
Output Short Circuit Source Current
VOUT = 0V
−20
0.4
V (max)
mA
−ISC
Output Short Circuit Sink Current
VOUT = 2.5V
20
mA
POWER SUPPLY CHARACTERISTICS
IA
Analog Supply Current
PD Pin = DGND
PD Pin = VDR
120
10
168
mA (max)
mA
ID
Digital Supply Current
PD Pin = DGND
PD Pin = VDR
6
5
11.5
mA (max)
mA
IDR
Digital Output Supply Current
PD Pin = DGND, fin = 0 (5) (6)
PD Pin = VDR
VA, VD or VDR), the current at that pin
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the
power supplies with an input current of 25 mA to two.
Power consumption excludes output driver power. See Note 5.
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AC Electrical Characteristics
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR =
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100Ω, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C (1) (2) (3) (4) (5) (6)
Symbol
Parameter
Conditions
Typical (4)
Maximum Clock Frequency
Limits (4)
Units
(Limits)
80
MHz (min)
Minimum Clock Frequency
10
MHz
Clock Duty Cycle
60
40
% (max)
% (min)
tCH
Clock High Time
5.5
ns (min)
tCL
Clock Low Time
5.5
tCONV
Conversion Latency
tOD
Data Output Delay after Rising CLK Edge
tAD
Aperture Delay
2
ns
tAJ
Aperture Jitter
0.7
ps rms
tPD
Power Down Mode Exit Cycle
1
µs
ns (min)
6
Clock Cycles
VDR = 2.5V
5.2
8.3
ns (max)
VDR = 3.3V
4.8
7.5
ns (max)
0.1 µF on pins 30, 31, 32,
and 1.0 µF from pin 30 to 31
(1)
The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited
per(6). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100 mV. As an example,
if VA is 3.3V, the full-scale input voltage must be ≤3.4V to ensure accurate conversions.
(2)
(3)
(4)
To guarantee accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
With the test condition for VREF = +1.0V (2 VP-P differential input), the 12-bit LSB is 488 µV.
Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to TI's AOQL (Average
Outgoing Quality Level).
Timing specifications are tested at TTL logic levels, VIL = 0.4V for a falling edge and VIH = 2.4V for a rising edge.
When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the
power supplies with an input current of 25 mA to two.
(5)
(6)
Specification Definitions
APERTURE DELAY is the time after the rising edge of the clock to when the input signal is acquired or held for
conversion.
APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample.
Aperture jitter manifests itself as noise in the output.
COMMON MODE VOLTAGE (VCM) is the d.c. potential present at both signal inputs to the ADC.
CONVERSION LATENCY See PIPELINE DELAY.
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1
LSB.
DUTY CYCLE is the ratio of the time that a repetitive digital waveform is high to the total time of one period. The
specification here refers to the ADC clock input signal.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise
and Distortion or SINAD. ENOB is defined as (SINAD - 1.76) / 6.02 and says that the converter is equivalent to a
perfect ADC of this (ENOB) number of bits.
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FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental
drops 3 dB below its low frequency value for a full scale input.
GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated as:
Gain Error = Positive Full Scale Error − Offset Error
(1)
INTEGRAL NON LINEARITY (INL) is a measure of the deviation of each individual code from a best fit straight
line. The deviation of any given code from this straight line is measured from the center of that code value.
INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two
sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the power in
the second and third order intermodulation products to the power in one of the original frequencies. IMD is
usually expressed in dBFS.
MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC12L080 is
guaranteed not to have any missing codes.
NEGATIVE FULL SCALE ERROR is the difference between the input voltage (VIN+ − VIN−) just causing a
transition from negative full scale to the first code and its ideal value of 0/5 LSB.
OFFSET ERROR is the input voltage that will cause a transition from a code of 01 1111 1111 to a code of 10
0000 0000/
OUTPUT DELAY is the time delay after the rising edge of the clock before the data update is presented at the
output pins.
PIPELINE DELAY (LATENCY) is the number of clock cycles between initiation of conversion and when that data
is presented to the output driver stage. Data for any given sample is available at the output pins the Pipeline
Delay plus the Output Delay after the sample is taken. New data is available at every clock cycle, but the data
lags the conversion by the pipeline delay.
POSITIVE FULL SCALE ERROR is the difference between the actual last code transition and its ideal value of
1½ LSB below positive full scale.
POWER SUPPLY REJECTION RATIO (PSRR) is a measure of how well the ADC rejects a change in the power
supply voltage. PSRR1 is the ratio of the change in Full-Scale Gain Error that results from a change in the d.c.
power supply voltage, expressed in dB. PSRR2 is a measure of how well an a.c. signal riding upon the power
supply is rejected at the output.
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal to the rms
value of the sum of all other spectral components below one-half the sampling frequency, not including
harmonics or d.c.
SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of the
input signal to the rms value of all of the other spectral components below half the clock frequency, including
harmonics but excluding d.c.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the
input signal and the peak spurious signal, where a spurious signal is any signal present in the output spectrum
that is not present at the input.
TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dBc, of the rms total of the first nine
harmonic levels at the output to the level of the fundamental at the output. THD is calculated as
THD = 20 x log
A 2 +... +A 2
f2
f10
A f12
(2)
where Af1 is the RMS power of the fundamental (output) frequency and Af2 through Af10 are the RMS power in
the first 9 harmonic frequencies.
Second Harmonic Distortion (2nd Harm) is the difference expressed in dB, between the RMS power in the
input frequency at the output and the power in its 2nd harmonic level at the output.
Third Harmonic Distortion (3rd Harm) is the difference, expressed in dB, between the RMS power in the input
frequency at the output and the power in its 3rd harmonic level at the output.
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Timing Diagram
Sample N + 6
Sample N + 7
Sample N + 8
|
Sample N + 5
Sample N
Sample N + 9
VIN
tAD
Clock N
Clock N + 6
1
fCLK
90%
90%
CLK
|
10%
tCH
tCL
tr
10%
tf
tOD
| |
D0 - D11
Data N - 1
Data N
Data N + 1
Data N + 2
Latency
Figure 2. Output Timing
Transfer Characteristic
Figure 3. Transfer Characteristic
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Typical Performance Characteristics DNL, INL
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 0, unless otherwise stated.
12
DNL
INL
Figure 4.
Figure 5.
DNL vs. fCLK
INL vs. fCLK
Figure 6.
Figure 7.
DNL vs. Clock Duty Cycle
INL vs. Clock Duty Cycle
Figure 8.
Figure 9.
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Typical Performance Characteristics DNL, INL (continued)
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 0, unless otherwise stated.
DNL vs. Temperature
INL vs. Temperature
Figure 10.
Figure 11.
DNL vs. VDR
INL vs. VDR
Figure 12.
Figure 13.
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Typical Performance Characteristics
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.
14
SNR,SINAD,SFDR vs. VA
Distortion vs. VA
Figure 14.
Figure 15.
SNR,SINAD,SFDR vs. VDR
Distortion vs. VDR
Figure 16.
Figure 17.
SNR,SINAD,SFDR vs. VCM
Distortion vs. VCM
Figure 18.
Figure 19.
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Typical Performance Characteristics (continued)
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.
SNR,SINAD,SFDR vs. fCLK
Distortion vs. fCLK
Figure 20.
Figure 21.
SNR,SINAD,SFDR vs. Clock Duty Cycle
Distortion vs. Clock Duty Cycle
Figure 22.
Figure 23.
SNR,SINAD,SFDR vs. VREF
Distortion vs. VREF
Figure 24.
Figure 25.
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Typical Performance Characteristics (continued)
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.
16
SNR,SINAD,SFDR vs. fIN
Distortion vs. fIN
Figure 26.
Figure 27.
SNR,SINAD,SFDR vs. Temperature
Distortion vs. Temperature
Figure 28.
Figure 29.
tOD vs. VDR
Spectral Response @ 10 MHz Input
Figure 30.
Figure 31.
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Typical Performance Characteristics (continued)
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.
Spectral Response @ 40 MHz Input
Spectral Response @ 70 MHz Input
Figure 32.
Figure 33.
Spectral Response @ 150 MHz Input
Intermodulation Distortion, fIN1= 19.6 MHz, fIN2 = 20.5 MHz
Figure 34.
Figure 35.
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FUNCTIONAL DESCRIPTION
Operating on a single +3.3V supply, the ADC12L080 uses a pipeline architecture with error correction circuitry to
help ensure maximum performance.
Differential analog input signals are digitized to 12 bits. Each analog input signal should have a peak-to-peak
voltage equal to the input reference voltage, VREF, be centered around VREF and be 180° out of phase with each
other. Table 1 and Table 2 indicate the input to output relationship of the ADC12L080. Although a differential
input signal is required for rated operation, single-ended operation is possible with reduced performance if one
input is biased to VREF and the other input is driven. If the driven input is presented with its full range signal, there
will be a 6 dB reduction of the output range, limiting it to the range of ¼ to ¾ of the minimum output range
obtainable if both inputs were driven with complimentary signals. Signal Inputs explains how to avoid this signal
reduction.
Table 1. Input to Output Relationship—Differential Input
VIN+
VIN−
Output
VCM − VREF
VCM + VREF
0000 0000 0000
VCM −0.5 * VREF
VCM +0.5 * VREF
0100 0000 0000
VCM
VCM
1000 0000 0000
VCM +0.5 * VREF
VCM −0.5 * VREF
1100 0000 0000
VCM + VREF
VCM − VREF
1111 1111 1111
Table 2. Input to Output Relationship—Single-Ended Input
VIN
VIN−
Output
VCM − 2 * VREF
VCM
0000 0000 0000
VCM − VREF
VCM
0100 0000 0000
VCM
VCM
1000 0000 0000
VCM + VREF
VCM
1100 0000 0000
VCM + 2 * VREF
VCM
1111 1111 1111
+
The output word rate is the same as the clock frequency, which may be in within the range indicated in the
Electrical Tables. The analog input voltage is acquired at the rising edge of the clock and the digital data for that
sample is delayed by the pipeline for 6 clock cycles.
A logic high on the power down (PD) pin reduces the converter power consumption to 50 mW.
Applications Information
OPERATING CONDITIONS
We recommend that the conditions in the Operating Table be observed for operation of the ADC12L080.
ANALOG INPUTS
The ADC12L080 has two analog signal inputs, VIN+ and VIN−, which form a differential input pair. There is one
reference input pin, VREF.
Reference Pins
The ADC12L080 can be used with the internal 1.0V reference or with an external reference. While designed and
specified to operate with a 1.0V reference, the ADC12L080 performs well with reference voltages in the range of
indicated in the Operating Ratings table. Lower reference voltages will decrease the signal-to-noise ratio (SNR)
of the ADC12L080. Higher reference voltages (and input signal swing) will degrade THD performance for a fullscale input.
An input voltage below 2.0V at pin 1 (VREF) is interpreted to be an external reference and is used as such.
Connecting this pin to the analog supply (VA) will force the use of the internal 1.0V reference.
It is very important that all grounds associated with the reference voltage and the input signal make connection to
the analog ground plane at a single, quiet point to minimize the effects of noise currents in the ground path.
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The reference input pin serves two functions. When the input at this pin at or below 2V, this voltage is accepted
as the reference for the converter. When this voltage is connected to VA, then internal 1.0V reference is used.
Functionality is undefined with voltages at this pin between 2V and VA.
The three Reference Bypass Pins (VRP, VRM and VRN) are made available for bypass purposes only. These pins
should each be bypassed to ground with a 0.1 µF capacitor, and a 1.0 µF should be connected from VRP to VRN.
Higher capacitances will result in a longer power down exit cycle. Lower capacitances may result in degraded
dynamic performance. DO NOT LOAD these pins.
Signal Inputs
The signal inputs are VIN+ and VIN−. The input signal, VIN, is defined as
VIN = (VIN+) – (VIN−)
(3)
Figure 36 shows the expected input signal range. Note that the nominal input common mode voltage, VCM, is
VA/2 and the nominal input signals each run between the limits of AGND and VREF. The Peaks of the input
signals should never exceed the voltage described as
Peak Input Voltage = VA − 0.5V
(4)
to maintain dynamic performance.
VREF
VIN-
VREF/2
0V
VIN+
(a) Differential Input
2VREF
VIN+
VREF
0V
(b) Single-Ended Input
Figure 36. Expected Input Signal Range
The ADC12L080 performs best with a differential input, each of which should be centered around a common
mode voltage, VCM. The peak-to-peak voltage swing at both VIN+ and VIN− should not exceed the value of the
reference voltage or the output data will be clipped. The two input signals should be exactly 180° out of phase
from each other and of the same amplitude. For single frequency inputs, angular errors result in a reduction of
the effective full scale input. For a complex waveform, however, angular errors will result in distortion.
The full scale error in LSB for a sine wave input can be described as approximately
EFS = 4096 ( 1 - sin (90° + dev))
(5)
Where dev is the angular difference between the two signals having a 180° relative phase relationship to each
other (see Figure 37). Drive the analog inputs with a source impedance less than 100Ω.
Figure 37. Angular Errors Between the Two Input Signals Will Reduce the Output Level or Cause
Distortion
For differential operation, each analog input signal should have a peak-to-peak voltage equal to the input
reference voltage, VREF, and be centered around VCM. For single-ended operation (which will result in reduced
performance), one of the analog inputs should be connected to the d.c. common mode voltage of the driven
input. The peak-to-peak differential input signal should be twice the reference voltage to maximize SNR and
SINAD performance (Figure 36b). For example, set VREF to 1.0V, bias VIN− to 1.0V and drive VIN+ with a signal
range of 0V to 2.0V.
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Because very large input signal swings can degrade distortion performance, better performance with a singleended input can be obtained by reducing the reference voltage while maintaining a full-range output. Table 1 and
Table 2 indicate the input to output relationship of the ADC12L080.
The VIN+ and the VIN− inputs of the ADC12L080 consist of an analog switch followed by a switched-capacitor
amplifier. The internal switching action at the analog inputs causes energy to be output from the input pins. As
the driving source tries to compensate for this, it adds noise to the signal. To minimize this, use 33Ω series
resistors at each of the signal inputs with a 51 pF capacitor to ground, as can be seen in Figure 39 and
Figure 40. These components should be placed close to the ADC because the input pins of the ADC is the most
sensitive part of the system and this is the last opportunity to filter the input. The 51 pF capacitor value is for
Nyquist applications and should be replaced with a smaller capacitor for undersampling applications. The
resulting pole should be at 1.7 to 2.0 times the highest input frequency. When determining this capacitor value,
take into consideration the 8 pF ADC input capacitance.
Table 3 gives component values for Figure 39 to convert a signals to a range 1.0V ±0.5V at each of the
differential input pins of the ADC12L080.
Table 3. Resistor values for Circuit of Figure 39
SIGNAL RANGE
R1
R2
R3
R4
R5, R6
0 - 0.25V
0Ω
open
200Ω
1780Ω
1000Ω
0 - 0.5V
0Ω
open
249Ω
1400Ω
499Ω
±0.5V
100Ω
1210Ω
100Ω
1210Ω
499Ω
DIGITAL INPUTS
Digital inputs consist of CLK, OF and PD. All digital inputs are 3V CMOS compatible.
CLK
The CLK signal controls the timing of the sampling process. Drive the clock input with a stable, low jitter clock
signal in the range indicated in the Electrical Table with rise and fall times of less than 2 ns. The trace carrying
the clock signal should be as short as possible and should not cross any other signal line, analog or digital, not
even at 90°.
The CLK signal also drives an internal state machine. If the CLK is interrupted, or its frequency is too low, the
charge on internal capacitors can dissipate to the point where the accuracy of the output data will degrade. This
is what limits the minimum sample rate.
The duty cycle of the clock signal can affect the performance of any A/D Converter. Because achieving a precise
duty cycle is difficult, the ADC12L080 is designed to maintain performance over a range of duty cycles. While it is
specified and performance is guaranteed with a 50% clock duty cycle, performance is typically maintained over a
clock duty cycle range indicated in the Electrical Table.
The clock line should be terminated at its source in the characteristic impedance of that line. Take care to
maintain a constant clock line impedance throughout the length of the line. Refer to Application Note AN-905 for
information on setting characteristic impedance.
It is highly desirable that the the source driving the ADC CLK pin only drive that pin. However, if that source is
used to drive other things, each driven pin should be a.c. terminated with a series RC to ground, as shown in
Figure 38, such that the resistor value is equal to the characteristic impedance of the clock line and the capacitor
value is
(6)
where tPD is the signal propagation rate down the clock line, "L" is the line length and ZO is the characteristic
impedance of the clock line. This termination should be as close as possible to the ADC clock pin but beyond it
as seen from the clock source. Typical tPD is about 150 ps/inch (60 ps/cm) on FR-4 board material. The units of
"L" and tPD should be the same (inches or centimeters).
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OF
The OF pin is used to determine the digital data output format. When this pin is high, the output formant is two's
complement. When this pin is low the output format is offset binary. Changing this pin while the device is
operating will result in uncertainty of the data for a few conversion cycles.
PD
The PD pin, when high, holds the ADC12L080 in a power-down mode to conserve power when the converter is
not being used. The power consumption in this state is 50 mW and is not affected by the clock frequency, or by
whether there is a clock signal present. The output data pins are undefined and the data in the pipeline is
corrupted while in the power down mode.
The Power Down Mode Exit Cycle time is determined by the value of the capacitors on pins 30, 31 and 32.
These capacitors loose their charge in the Power Down mode and must be recharged by on-chip circuitry before
conversions can be accurate. See Reference Pins.
OUTPUTS
The ADC12L080 has 12 TTL/CMOS compatible Data Output pins. The output data is present at these outputs
while the PD pin is low. While the tOD time provides information about output timing, a simple way to capture a
valid output is to latch the data on the rising edge of the conversion clock (pin 10).
Be very careful when driving a high capacitance bus. The more capacitance the output drivers must charge for
each conversion, the more instantaneous digital current flows through VDR and DR GND. These large charging
current spikes can cause on-chip noise and couple into the analog circuitry, degrading dynamic performance.
Adequate bypassing, limiting output capacitance and careful attention to the ground plane will reduce this
problem. Additionally, bus capacitance beyond the specified 15 pF/pin will cause tOD to increase, making it
difficult to properly latch the ADC output data. The result could be an apparent reduction in dynamic
performance.
To minimize noise due to output switching, minimize the load currents at the digital outputs. This can be done by
connecting buffers between the ADC outputs and any other circuitry (74ACQ541, for example). Only one driven
input should be connected to each output pin. Additionally, inserting series 100Ω resistors at the digital outputs,
close to the ADC pins, will isolate the outputs from trace and other circuit capacitances and limit the output
currents, which could otherwise result in performance degradation. See Figure 38.
While the ADC12L080 will operate with VDR voltages down to 1.8V, tOD increases with reduced VDR. Be careful of
external timing when using reduced VDR.
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+1.8V to 3.6V
+3.3V
10 PF
470
200
1%
MF
VREF
0.1 PF
5
1.00k
1%
MF
*
LM4150-1.2
*
* Ground for the 1.00k resistor, the
0.1 PF bypass capacitor, the ground
pin for the LM4050-2.5, the bypass
capacitors on pins 30, 31 and 32 of
the ADC12L080 and pin 28 of the
ADC12L080 should be connected to
a common point in the analog
ground plane.
0.1 PF
0.1 PF
29
0.1 PF
0.1 PF
13
21
*
1
PD
VREF
D11 (MSB)
VRP
D10
1 PF
30 V
RN
*
D9
D8
32 V
RM
0.1 PF
D7
*
D6
ADC12L080
VCM
D5
2
D4
VIN+
SIGNAL
INPUT
Differential
Drive
See Fig 5
D3
D2
D1
3
VIN-
10
CLOCK
INPUT
Power
Down
VDR
VD
VA
1 PF
31
*
6
10 PF
10 PF
D0 (LSB)
OF
CLK
8
27
12 x 47W
26
25
24
74ACQ541
23
22
19
CLK
17
16
15
14
11
74ACQ541
47
see
text
AGND
4
7
DGND
28
9 12
12 BIT
DATA
OUTPUT
18
DRGND
20
See
Text
1/4
74ACQ04
47
CLK
*
LE
Figure 38. Simple Application Circuit with Single-Ended to Differential Buffer
Figure 39. Differential Drive Circuit of Figure 38
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+1.8V to +3.6V
+3.3V
10 PF
470
200
1%
MF
VREF
0.1 PF
5
1.00k
1%
MF
LM4140-1.2
*
1k
0.1 PF *
0.1 PF
13
21
VD
VDR
1
PD
VREF
31
*
D11 (MSB)
VRP
D10
1 PF
30
0.1 PF
*
D9
VRN
D8
32
0.1 PF
29
VA
*
0.1 PF
6
10 PF
1 PF
*
* Ground for the 1.00k resistor, the
1 PF bypass capacitor, the ground
pin for the LM4040-2.5, the bypass
capacitors on pins 30, 31 and 32 of
the ADC12L080 and pin 28 of the
ADC12L080 should be connected to
a common point in the ground plane.
10 PF
*
D7
VRM
D6
ADC12L080
VCM
33
2
D5
D4
VIN+
D3
51 pF
0.1 PF
SIGNAL
INPUT
D2
D1
3
MiniCircuits
T4-6T
CLOCK
INPUT
# The 51 pF capacitors at
pins 2 and 3 are for
oversampling applications.
See text for
undersampling applications.
33
VIN-
D0 (LSB)
CLK
OF
8
Power Down
27
26
25
24
23
22
19
Output
Word
18
17
16
15
14
51 pF
10
11
47
see
text
AGND
4
DGND
7 28
9 12
DRGND
20
*
Figure 40. Driving the Signal Inputs with a Transformer
POWER SUPPLY CONSIDERATIONS
The power supply pins should be bypassed with a 10 µF capacitor and with a 0.1 µF low ESL ceramic chip
capacitor within 3 millimeters of each power pin.
As is the case with all high-speed converters, the ADC12L080 is sensitive to power supply noise. Accordingly,
the noise on the analog supply pin should be kept below 100 mVP-P.
No pin should ever have a voltage on it that is in excess of the supply voltages, not even on a transient basis. Be
especially careful of this during turn on and turn off of power.
The VDR pin provides power for the output drivers and may be operated from a supply in the range of 1.8V to VD.
This can simplify interfacing to devices and systems operating with supplies less than VD. DO NOT operate the
VDR pin at a voltage higher than VD.
LAYOUT AND GROUNDING
Proper grounding and proper routing of all signals are essential to ensure accurate conversion. Maintaining
separate analog and digital areas of the board, with the ADC12L080 between these areas, is required to achieve
specified performance.
The ground return for the data outputs (DR GND) carries the ground current for the output drivers. The output
current can exhibit high transients that could add noise to the conversion process. To prevent this from
happening, the DR GND pins should NOT be connected to system ground in close proximity to any of the
ADC12L080's other ground pins.
Capacitive coupling between the typically noisy digital circuitry and the sensitive analog circuitry can lead to poor
performance. The solution is to keep the analog circuitry separated from the digital circuitry, and to keep the
clock line as short as possible.
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Digital circuits create substantial supply and ground current transients. The logic noise thus generated could
have significant impact upon system noise performance. The best logic family to use in systems with A/D
converters is one which employs non-saturating transistor designs, or has low noise characteristics, such as the
74LS, 74HC(T) and 74AC(T)Q families. The worst noise generators are logic families that draw the largest
supply current transients during clock or signal edges, like the 74F and the 74AC(T) families.
The effects of the noise generated from the ADC output switching can be minimized through the use of 100Ω
resistors in series with each data output line. Locate these resistors as close to the ADC output pins as possible.
Since digital switching transients are composed largely of high frequency components, total ground plane copper
weight will have little effect upon the logic-generated noise. This is because of the skin effect. Total surface area
is more important than is total ground plane volume.
Generally, analog and digital lines should cross each other at 90° to avoid crosstalk. To maximize accuracy in
high speed, high resolution systems, however, avoid crossing analog and digital lines altogether. It is important to
keep clock lines as short as possible and isolated from ALL other lines, including other digital lines. Even the
generally accepted 90° crossing should be avoided with the clock line as even a little coupling can cause
problems at high frequencies. This is because other lines can introduce jitter into the clock line, which can lead to
degradation of SNR. Also, the high speed clock can introduce noise into the analog chain.
Best performance at high frequencies and at high resolution is obtained with a straight signal path. That is, the
signal path through all components should form a straight line wherever possible.
Be especially careful with the layout of inductors. Mutual inductance can change the characteristics of the circuit
in which they are used. Inductors should not be placed side by side, even with just a small part of their bodies
beside each other.
Figure 41. Example of a Suitable Layout
The analog input should be isolated from noisy signal traces to avoid coupling of spurious signals into the input.
Any external component (e.g., a filter capacitor) connected between the converter's input pins and ground or to
the reference input pin and ground should be connected to a very clean point in the ground plane.
Figure 41 gives an example of a suitable layout. All analog circuitry (input amplifiers, filters, reference
components, etc.) should be placed in the analog area of the board. All digital circuitry and I/O lines should be
placed in the digital area of the board. Furthermore, all components in the reference circuitry and the input signal
chain that are connected to ground should be connected together with short traces and enter the ground plane at
a single point. All ground connections should have a low inductance path to ground.
Best performance will be obtained with a single ground plane and separate analog and digital power planes. The
power planes define analog and digital board areas of the board. Analog and digital components and signal lines
should be kept within their own areas.
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DYNAMIC PERFORMANCE
To achieve the best dynamic performance, the clock source driving the CLK input must be free of jitter. The
maximum allowable jitter to avoid the addition of noise to the conversion process is
Max Jitter = 1 / (2n+1 × π × fIN)
(7)
Isolate the ADC clock from any digital circuitry with buffers, as with the clock tree shown in Figure 42. To avoid
adding jitter to the clock signal, the elements of Figure 42 should be capable of toggling at a up to ten times the
frequency used.
As mentioned in LAYOUT AND GROUNDING, it is good practice to keep the ADC clock line as short as possible
and to keep it well away from any other signals. Other signals can introduce jitter into the clock signal, which can
lead to reduced SNR performance, and the clock can introduce noise into other lines. Even lines with 90°
crossings have capacitive coupling, so try to avoid even these 90° crossings of the clock line.
Figure 42. Isolating the ADC Clock from other Circuitry with a Clock Tree
COMMON APPLICATION PITFALLS
Driving the inputs (analog or digital) beyond the power supply rails. For proper operation, all inputs should
not go more than 100 mV beyond the supply rails (more than 100 mV below the ground pins or 100 mV above
the supply pins). Exceeding these limits on even a transient basis may cause faulty or erratic operation. It is not
uncommon for high speed digital components (e.g., 74F and 74AC devices) to exhibit overshoot or undershoot
that goes above the power supply or below ground. A resistor of about 50Ω to 100Ω in series with any offending
digital input, close to the signal source, will eliminate the problem.
Do not allow input voltages to exceed the supply voltage, even on a transient basis. Not even during power up or
power down.
Be careful not to overdrive the inputs of the ADC12L080 with a device that is powered from supplies outside the
range of the ADC12L080 supply. Such practice may lead to conversion inaccuracies and even to device
damage.
Attempting to drive a high capacitance digital data bus. The more capacitance the output drivers must
charge for each conversion, the more instantaneous digital current flows through VDR and DR GND. These large
charging current spikes can couple into the analog circuitry, degrading dynamic performance. Adequate
bypassing and maintaining separate analog and digital areas on the PC board will reduce this problem.
Additionally, bus capacitance beyond the specified 15 pF/pin will cause tOD to increase, making it difficult to
properly latch the ADC output data. The result could, again, be an apparent reduction in dynamic performance.
The digital data outputs should be buffered (with 74ACQ541, for example). Dynamic performance can also be
improved by adding series resistors at each digital output, close to the ADC12L080, which reduces the energy
coupled back into the converter output pins by limiting the output current. A reasonable value for these resistors
is 100Ω.
Using an inadequate amplifier to drive the analog input. As explained in Signal Inputs, the sampling input is
difficult to drive without degrading dynamic performance.
If the amplifier exhibits overshoot, ringing, or any evidence of instability, even at a very low level, it will degrade
performance. A small series resistor at each amplifier output and a capacitor at each of the ADC analog inputs to
ground (as shown in Figure 39 and Figure 40) will improve performance. The LMH6702, LMH6628, LMH6622
and LMH6655 have been successfully used to drive the analog inputs of the ADC12L080.
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ADC12L080
SNAS200B – OCTOBER 2004 – REVISED MARCH 2013
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Also, it is important that the signals at the two inputs have exactly the same amplitude and be exactly 180º out of
phase with each other. Board layout, including equality of the length of the two traces to the input pins, will affect
the effective phase between these two signals. Remember that an operational amplifier operated in the noninverting configuration will exhibit more time delay than will the same device operating in the inverting
configuration.
Operating with the reference pins outside of the specified range. As mentioned in Reference Pins, VREF
should be in the range specified in the Operating Ratings table. Operating outside of these limits could lead to
performance degradation.
Using a clock source with excessive jitter, using excessively long clock signal trace, or having other
signals coupled to the clock signal trace. This will cause the sampling interval to vary, causing excessive
output noise and a reduction in SNR and SINAD performance.
26
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Product Folder Links: ADC12L080
ADC12L080
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SNAS200B – OCTOBER 2004 – REVISED MARCH 2013
REVISION HISTORY
Changes from Revision A (March 2013) to Revision B
•
Page
Changed layout of National Data Sheet to TI format .......................................................................................................... 26
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27
PACKAGE OPTION ADDENDUM
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10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
ADC12L080CIVY/NOPB
ACTIVE
LQFP
NEY
32
250
RoHS & Green
SN
Level-3-260C-168 HR
-40 to 85
ADC12L0
80CIVY
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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