ADC32RF80IRMPR

Product Folder Sample & Buy Support & Community Tools & Software Technical Documents ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 ADC32RF8x Dual-Channel, 3-GSPS Telecom Receiver and Feedback Devices 1 Features 3 Description • • • • • • The ADC32RF8x (ADC32RF80 and ADC32RF83) is a 14-bit, 3-GSPS, dual-channel telecom receiver and feedback device family that supports RF sampling with input frequencies up to 4 GHz and beyond. Designed for high signal-to-noise ratio (SNR), the ADC32RF8x family delivers a noise spectral density of –155 dBFS/Hz as well as dynamic range and channel isolation over a large input frequency range. The buffered analog input with on-chip termination provides uniform input impedance across a wide frequency range and minimizes sample-and-hold glitch energy. • • • • • • • • • • • 14-Bit, Dual-Channel, 3-GSPS ADC Noise Floor: –155 dBFS/Hz RF Input Supports Up to 4.0 GHz Aperture Jitter: 90 fS Channel Isolation: 95 dB at fIN = 1.8 GHz Spectral Performance (fIN = 900 MHz, –2 dBFS): – SNR: 60.1 dBFS – SFDR: 66-dBc HD2, HD3 – SFDR: 76-dBc Worst Spur Spectral Performance (fIN = 1.85 GHz, –2 dBFS): – SNR: 58.9 dBFS – SFDR: 67-dBc HD2, HD3 – SFDR: 76-dBc Worst Spur On-Chip Digital Down-Converters: – Up to 4 DDCs (Dual-Band Mode) – Up to 3 Independent NCOs per DDC On-Chip Input Clamp for Overvoltage Protection Programmable On-Chip Power Detectors with Alarm Pins for AGC Support On-Chip Dither On-Chip Input Termination Input Full-Scale: 1.35 VPP Support for Multi-Chip Synchronization JESD204B Interface: – Subclass 1-Based Deterministic Latency – 4 Lanes Per Channel at 12.5 Gbps Power Dissipation: 3.2 W/Ch at 3.0 GSPS 72-Pin VQFN Package (10 mm × 10 mm) Each channel can be connected to a dual-band, digital down-converter (DDC) with up to three independent, 16-bit numerically-controlled oscillators (NCOs) per DDC for phase-coherent frequency hopping. Additionally, the ADC is equipped with frontend peak and RMS power detectors and alarm functions to support external automatic gain control (AGC) algorithms. The ADC32RF8x supports the JESD204B serial interface with subclass 1-based deterministic latency using data rates up to 12.5 Gbps with up to four lanes per ADC. The device is offered in a 72-pin VQFN package (10 mm × 10 mm) and supports the industrial temperature range (–40°C to +85°C). Device Information(1) PART NUMBER ADC32RF8x Simplified Block Diagram Buffer • • • • N Interleave Correction ADC INAP/M DA[0,1]P/M Digital Block ADC ADC ADC 50 Multi-Carrier GSM Cellular Infrastructure Base Stations Telecommunications Receivers DPD Observation Receivers Backhaul Receivers RF Repeaters and Distributed Antenna Systems BODY SIZE (NOM) 10.00 mm × 10.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. 2 Applications • PACKAGE VQFN (72) FAST DET. DA[2,3]P/M N NCO NCO NCO CTRL GPIO1..4 CLKINP/M PLL JESD204B Interface 1 SYNCBP/M SYSREFP/M NCO FAST DET. Buffer NCO Digital Block ADC ADC ADC ADC INBP/M 0º/180º Clock Interleave Correction N DB[0,1]P/M N DB[2,3]P/M 50 Copyright © 2016, Texas Instruments Incorporated 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 5 6.1 6.2 6.3 6.4 6.5 6.6 Absolute Maximum Ratings ...................................... 5 ESD Ratings.............................................................. 5 Recommended Operating Conditions....................... 5 Thermal Information .................................................. 5 Electrical Characteristics........................................... 6 AC Performance Characteristics: fS = 2949.12 MSPS ......................................................................... 7 6.7 AC Performance Characteristics: fS = 2457.6 MSPS (Performance Optimized for F + A + D Band) ........... 9 6.8 AC Performance Characteristics: fS = 2457.6 MSPS (Performance Optimized for F + A Band) .................. 9 6.9 Digital Requirements............................................... 10 6.10 Timing Requirements ............................................ 11 6.11 Typical Characteristics .......................................... 13 7 Parameter Measurement Information ................ 26 8 Detailed Description ............................................ 27 7.1 Input Clock Diagram ............................................... 26 8.1 8.2 8.3 8.4 8.5 9 Overview ................................................................. Functional Block Diagram ....................................... Feature Description................................................. Device Functional Modes........................................ Register Maps ......................................................... 27 27 28 55 68 Application and Implementation ...................... 119 9.1 Application Information.......................................... 119 9.2 Typical Application ................................................ 126 10 Power Supply Recommendations ................... 128 11 Layout................................................................. 128 11.1 Layout Guidelines ............................................... 128 11.2 Layout Example .................................................. 129 12 Device and Documentation Support ............... 130 12.1 Documentation Support ...................................... 12.2 Related Links ...................................................... 12.3 Receiving Notification of Documentation Updates.................................................................. 12.4 Community Resources........................................ 12.5 Trademarks ......................................................... 12.6 Electrostatic Discharge Caution .......................... 12.7 Glossary .............................................................. 130 130 130 130 130 130 130 13 Mechanical, Packaging, and Orderable Information ......................................................... 130 4 Revision History Changes from Original (May 2016) to Revision A • 2 Page Released to production........................................................................................................................................................... 1 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 5 Pin Configuration and Functions DB2P DB2M DVDD DB1P DB1M GND DB0P DB0M DVDD GPIO4 DA0M DA0P GND DA1M DA1P DVDD DA2M DA2P 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 RMP Package 72-Pin VQFN Top View DB3M 1 54 DA3M DB3P 2 53 DA3P GND 3 52 GND DVDD 4 51 DVDD SDIN 5 50 PDN SCLK 6 49 GND SEN 7 48 RESET DVDD 8 47 DVDD AVDD 9 Thermal 46 AVDD AVDD19 10 Pad 45 AVDD19 SDOUT 11 44 AVDD AVDD 12 43 AVDD 34 35 36 SYNCBP SYNCBM 32 GND 33 31 AVDD19 SYSREFP 30 SYSREFM 29 GND 28 CLKINM AVDD 27 GND CLKINP AVDD 37 26 38 18 25 17 GND GND AVDD AVDD AVDD19 24 39 AVDD19 16 23 AVDD19 GND AVDD 22 40 21 15 CM AVDD GPIO3 INAM 20 INAP 41 GPIO2 42 14 19 13 GPIO1 INBP INBM Not to scale Pin Functions NAME NO. I/O DESCRIPTION INPUT, REFERENCE INAM 41 INAP 42 INBM 14 INBP 13 CM 22 I Differential analog input for channel A I Differential analog input for channel B O Common-mode voltage for analog inputs, 1.2 V Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 3 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Pin Functions (continued) NAME NO. I/O DESCRIPTION CLOCK, SYNC CLKINM 28 CLKINP 27 SYSREFM 34 SYSREFP 33 GPIO1 19 GPIO2 20 GPIO3 21 GPIO4 63 I Differential clock input for the analog-to-digital converter (ADC). This pin has an internal differential 100-Ω termination. I External sync input. This pin has an internal, differential 100-Ω termination and requires external biasing. I/O GPIO control pin; configured through the SPI. This pin can be configured to be either a fast overrange output for channel A and B, a fast detect alarm signal from the peak power detect, or a numerically-controlled oscillator (NCO) control. GPIO 4 (pin 63) can also be configured as a single-ended SYNCB input. CONTROL, SERIAL RESET 48 I Hardware reset; active high. This pin has an internal 20-kΩ pulldown resistor. SCLK 6 I Serial interface clock input. This pin has an internal 20-kΩ pulldown resistor. SDIN 5 I/O Serial interface data input. This pin has an internal 20-kΩ pulldown resistor. SDIN can be data input in 4-wire mode, data input and output in 3 wire-mode. SEN 7 I Serial interface enable. This pin has an internal 20-kΩ pullup resistor to DVDD. SDOUT 11 O Serial interface data output in 4-wire mode PDN 50 I Power down; active high. This pin can be configured through an SPI register setting and can be configured to a fast overrange output channel B through the SPI. This pin has an internal 20-kΩ pulldown resistor. O JESD204B serial data output for channel A O JESD204B serial data output for channel B I Synchronization input for the JESD204B port. This pin has an LVDS or 1.8-V logic input, an optional on-chip 100-Ω termination, and is selectable through the SPI. This pin requires external biasing. DATA INTERFACE DA0M 62 DA0P 61 DA1M 59 DA1P 58 DA2M 56 DA2P 55 DA3M 54 DA3P 53 DB0M 65 DB0P 66 DB1M 68 DB1P 69 DB2M 71 DB2P 72 DB3M 1 DB3P 2 SYNCBM 36 SYNCBP 35 POWER SUPPLY AVDD19 10, 16, 24, 31, 39, 45 I Analog 1.9-V power supply AVDD 9, 12, 15, 17, 25, 30, 38, 40, 43, 44, 46 I Analog 1.15-V power supply DVDD 4, 8, 47, 51, 57, 64, 70 I Digital 1.15 V-power supply, including the JESD204B transmitter 3, 18, 23, 26, 29, 32, 37, 49, 52, 60, 67 I Ground; shorted to thermal pad inside device GND 4 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) Supply voltage range Voltage applied to input pins MIN MAX AVDD19 –0.3 2.1 AVDD –0.3 1.4 DVDD –0.3 1.4 INAP, INAM and INBP, INBM –0.3 AVDD19 + 0.3 CLKINP, CLKINM –0.3 AVDD + 0.6 SYSREFP, SYSREFM, SYNCBP, SYNCBM –0.3 AVDD + 0.6 SCLK, SEN, SDIN, RESET, PDN, GPIO1, GPIO2, GPIO3, GPIO4 –0.2 AVDD19 + 0.2 Voltage applied to output pins Temperature (1) –0.3 2.2 Operating free-air, TA –40 85 Storage, Tstg –65 150 UNIT V V V °C Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 6.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±1000 Charged-device model (CDM), per JEDEC specification JESD22-C101 (2) ±500 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) Supply voltage (1) Temperature (1) (2) MIN NOM MAX AVDD19 1.8 1.9 2.0 AVDD 1.1 1.15 1.25 DVDD 1.1 1.15 1.2 Operating free-air, TA –40 105 (2) 125 Operating junction, TJ UNIT V 85 °C Always power up the DVDD supply (1.15 V) before the AVDD19 (1.9 V) supply. The AVDD (1.15 V) supply can come up in any order. Prolonged use above this junction temperature may increase the device failure-in-time (FIT) rate. 6.4 Thermal Information ADC32RF80 THERMAL METRIC (1) RMP (VQFN) UNIT 72 PINS RθJA Junction-to-ambient thermal resistance 21.8 °C/W RθJC(top) Junction-to-case (top) thermal resistance 4.4 °C/W RθJB Junction-to-board thermal resistance 2.0 °C/W ψJT Junction-to-top characterization parameter 0.1 °C/W ψJB Junction-to-board characterization parameter 2.0 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 0.2 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 5 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 6.5 Electrical Characteristics typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and chip sampling rate = 2949.12 MSPS, 50% clock duty cycle, DDC-bypassed performance, AVDD19 = 1.9 V, AVDD = 1.15 V, DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) PARAMETER POWER CONSUMPTION (1) TEST CONDITIONS MIN TYP MAX UNIT (Dual-Channel Operation, Both Channels A and B are Active; Divide-by-4, Complex Output Mode (2)) IAVDD19 1.9-V analog supply current fS = 2949.12 MSPS 1777 1989 mA IAVDD 1.15-V analog supply current fS = 2949.12 MSPS 970 1103 mA IDVDD 1.15-V digital supply current fS = 2949.12 MSPS 1785 1955 mA PD Power dissipation fS = 2949.12 MSPS 6.54 7.07 W Global power-down power dissipation 360 mW 14 Bits 1.35 VPP ANALOG INPUTS Resolution Differential input full-scale VIC Input common-mode voltage RIN Input resistance Differential resistance at dc CIN Input capacitance Differential capacitance at dc (3) V 65 Ω 2 pF 1.2 V 1.2 VCM common-mode voltage output Analog input bandwidth (–3-dB point) ADC driven with 50-Ω source 3200 MHz ISOLATION Crosstalk isolation between channel A and channel B (4) fIN = 100 MHz 100 fIN = 900 MHz 99 fIN = 1800 MHz 95 fIN = 2700 MHz 86 fIN = 3500 MHz 85 dBc CLOCK INPUT (5) Input clock frequency 1.5 3 Differential (peak-to-peak) input clock amplitude 0.5 1.5 2.5 45% 50% 55% Input clock duty cycle (1) (2) (3) (4) (5) 6 GSPS VPP Internal clock biasing 1.0 V Internal clock termination (differential) 100 Ω See the Power Consumption in Different Modes section for more details. Full-scale signal is applied to the analog inputs of all active channels. When used in dc-coupling mode, the common-mode voltage at the analog inputs should be kept within VCM ±25 mV for best performance. Crosstalk is measured with a –2-dBFS input signal on aggressor channel and no input on the victim channel. See Figure 79. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 6.6 AC Performance Characteristics: fS = 2949.12 MSPS typical values specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and chip sampling rate = 2949.12 MSPS, 50% clock duty cycle, DDC-bypassed performance (1), AVDD19 = 1.9 V, AVDD = 1.15 V, DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) PARAMETER TEST CONDITIONS MIN (2) fIN = 100 MHz, AOUT = –2 dBFS SNR Signal-to-noise ratio 58.2 fIN = 2600 MHz, AOUT = –2 dBFS 56.8 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 54.1 NF (4) SINAD ENOB 152.8 147.1 149.9 fIN = 2600 MHz, AOUT = –2 dBFS 148.5 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 145.8 fIN = 1850 MHz, AOUT = –40 dBFS 63.1 dBFS Noise figure fIN = 1850 MHz, AOUT = –40 dBFS 24.7 dB fIN = 100 MHz, AOUT = –2 dBFS 61.7 fIN = 900 MHz, AOUT = –2 dBFS 60.2 fIN = 1850 MHz, AOUT = –2 dBFS 58.4 fIN = 2100 MHz, AOUT = –2 dBFS 57.6 fIN = 2600 MHz, AOUT = –2 dBFS 54.8 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 53.6 fIN = 100 MHz, AOUT = –2 dBFS 10.0 fIN = 900 MHz, AOUT = –2 dBFS 9.7 fIN = 1850 MHz, AOUT = –2 dBFS 9.4 fIN = 2100 MHz, AOUT = –2 dBFS 9.3 fIN = 2600 MHz, AOUT = –2 dBFS 8.8 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 8.6 Signal-to-noise and distortion ratio Effective number of bits Spurious-free dynamic range fIN = 1850 MHz, AOUT = –2 dBFS (4) (5) Second-order harmonic distortion Bits 66.0 58 67.0 fIN = 2100 MHz, AOUT = –2 dBFS 64.0 fIN = 2600 MHz, AOUT = –2 dBFS 58.0 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 62.0 fIN = 100 MHz, AOUT = –2 dBFS 72.0 fIN = 1850 MHz, AOUT = –2 dBFS dBFS 68.0 fIN = 900 MHz, AOUT = –2 dBFS (1) (2) (3) dBFS/Hz Small-signal SNR fIN = 900 MHz, AOUT = –2 dBFS HD2 (5) 150.6 fIN = 2100 MHz, AOUT = –2 dBFS fIN = 100 MHz, AOUT = –2 dBFS SFDR dBFS 154.3 fIN = 900 MHz, AOUT = –2 dBFS NSD 58.9 fIN = 2100 MHz, AOUT = –2 dBFS fIN = 1850 MHz, AOUT = –2 dBFS UNIT 61.1 55.4 fIN = 100 MHz, AOUT = –2 dBFS Noise spectral density averaged across the Nyquist zone MAX 62.6 fIN = 900 MHz, AOUT = –2 dBFS fIN = 1850 MHz, AOUT = –2 dBFS NOM dBc 73.0 58 67.0 fIN = 2100 MHz, AOUT = –2 dBFS 64.0 fIN = 2700 MHz, AOUT = –2 dBFS 58.0 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 62.0 dBc Performance is shown with DDC bypassed. When DDC is enabled, performance improves by the decimation filtering process. Minimum values are specified at AOUT = –3 dBFS. Output amplitude, AOUT, refers to the signal amplitude in the ADC digital output that is same as the analog input amplitude, AIN, except when the digital gain feature is used. If digital gain is G, then AOUT = G + AIN. The ADC internal resistance = 65 Ω, the driving source resistance = 50 Ω. The minimum value of HD2 is specified by bench characterization. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 7 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com AC Performance Characteristics: fS = 2949.12 MSPS (continued) typical values specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and chip sampling rate = 2949.12 MSPS, 50% clock duty cycle, DDC-bypassed performance(1), AVDD19 = 1.9 V, AVDD = 1.15 V, DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) PARAMETER TEST CONDITIONS MIN (2) fIN = 100 MHz, AOUT = –2 dBFS HD3 Third-order harmonic distortion Fourth- and fifth-order harmonic distortion fIN = 2600 MHz, AOUT = –2 dBFS 72.0 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 65.0 fIN = 100 MHz, AOUT = –2 dBFS 85.0 IL spur 84.0 fIN = 2600 MHz, AOUT = –2 dBFS 80.0 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 87.0 fIN = 100 MHz, AOUT = –2 dBFS 90.0 HD2 IL 76.0 fIN = 2600 MHz, AOUT = –2 dBFS 77.0 fIN = 3500 MHz, AOUT (3) = –3 dBFS with 2-dB gain 77.0 fIN = 100 MHz, AOUT = –2 dBFS 84.0 fIN = 2600 MHz, AOUT = –2 dBFS 65.0 8 = –3 dBFS with 2-dB gain 80.0 fIN = 900 MHz, AOUT = –2 dBFS 76.0 Spurious-free dynamic range (excluding HD2, HD3, fIN = 1850 MHz, AOUT = –2 dBFS HD4, HD5, and interleaving fIN = 2100 MHz, AOUT = –2 dBFS spurs IL and HD2 IL) fIN = 2600 MHz, AOUT = –2 dBFS Two-tone, third-order intermodulation distortion (3) = –3 dBFS with 2-dB gain 64 76.0 75.0 dBc 75.0 71.0 fIN1 = 1770 MHz, fIN2 = 1790 MHz, AOUT = –8 dBFS (each tone) 70 fIN1 = 1800 MHz, fIN2 = 2600 MHz, AOUT = –8 dBFS (each tone) 73 fIN1 = 3490 MHz, fIN2 = 3510 MHz, AOUT = –8 dBFS (each tone) with 2-dB gain 67 Submit Documentation Feedback dBc 77.0 fIN = 100 MHz, AOUT = –2 dBFS fIN = 3500 MHz, AOUT IMD3 80.0 76.0 (3) dBc 82.0 62 fIN = 2100 MHz, AOUT = –2 dBFS fIN = 3500 MHz, AOUT Worst spur 79.0 fIN = 2100 MHz, AOUT = –2 dBFS fIN = 1850 MHz, AOUT = –2 dBFS dBc 77.0 69 fIN = 900 MHz, AOUT = –2 dBFS Interleaving spur for HD2: fS / 2 – HD2 84.0 fIN = 2100 MHz, AOUT = –2 dBFS fIN = 1850 MHz, AOUT = –2 dBFS dBc 81.0 61 fIN = 900 MHz, AOUT = –2 dBFS Interleaving spurs: fS / 2 – fIN, fS / 4 ± fIN 73.0 80.0 fIN = 900 MHz, AOUT = –2 dBFS HD4, HD5 UNIT 66.0 61 fIN = 2100 MHz, AOUT = –2 dBFS fIN = 1850 MHz, AOUT = –2 dBFS MAX 68.0 fIN = 900 MHz, AOUT = –2 dBFS fIN = 1850 MHz, AOUT = –2 dBFS NOM dBFS Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 6.7 AC Performance Characteristics: fS = 2457.6 MSPS (Performance Optimized for F + A + D Band (1)) typical values specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and chip sampling rate = 2949.12 MSPS, 50% clock duty cycle, DDC-bypassed performance, AVDD19 = 1.9 V, AVDD = 1.15 V, DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) PARAMETER TEST CONDITIONS MIN NOM fIN = 1850 MHz, AOUT = –2 dBFS 58.5 fIN = 2600 MHz, AOUT = –2 dBFS 55.8 Spurious-free dynamic range fIN = 1850 MHz, AOUT = –2 dBFS 60.0 fIN = 2600 MHz, AOUT = –2 dBFS 57.0 HD2 Second-order harmonic distortion fIN = 1850 MHz, AOUT = –2 dBFS 59.0 fIN = 2600 MHz, AOUT = –2 dBFS 57.0 HD3 Third-order harmonic distortion fIN = 1850 MHz, AOUT = –2 dBFS 75.0 fIN = 2600 MHz, AOUT = –2 dBFS 65.0 Interleaving spurs: fS / 2 – fIN, fS / 4 ± fIN fIN = 1850 MHz, AOUT = –2 dBFS 84.0 IL spur fIN = 2600 MHz, AOUT = –2 dBFS 76.0 HD2 IL Interleaving spur for HD2: fS / 2 – HD2 fIN = 1850 MHz, AOUT = –2 dBFS 76.0 fIN = 2600 MHz, AOUT = –2 dBFS 67.0 IMD3 Two-tone, third-order intermodulation distortion fIN1 = 1800 MHz, fIN2 = 2600 MHz, AOUT = –8 dBFS (each tone) 67.0 SNR Signal-to-noise ratio SFDR (1) MAX UNIT dBFS dBc dBc dBc dBc dBc dBFS F-band = 1880 MHz to 1920 MHz, A-band = 2010 MHz to 2025 MHz, and D-band = 2570 MHz to 2620 MHz. 6.8 AC Performance Characteristics: fS = 2457.6 MSPS (Performance Optimized for F + A Band (1)) typical values specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and chip sampling rate = 2949.12 MSPS, 50% clock duty cycle, DDC-bypassed performance, AVDD19 = 1.9 V, AVDD = 1.15 V, DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) PARAMETER TEST CONDITIONS MIN NOM fIN = 1850 MHz, AOUT = –2 dBFS 58.7 fIN = 2100 MHz, AOUT = –2 dBFS 57.9 Spurious-free dynamic range fIN = 1850 MHz, AOUT = –2 dBFS 71.0 fIN = 2100 MHz, AOUT = –2 dBFS 69.0 HD2 Second-order harmonic distortion fIN = 1850 MHz, AOUT = –2 dBFS 71.0 fIN = 2100 MHz, AOUT = –2 dBFS 69.0 HD3 Third-order harmonic distortion fIN = 1850 MHz, AOUT = –2 dBFS 75.0 fIN = 2100 MHz, AOUT = –2 dBFS 76.0 Interleaving spurs: fS / 2 – fIN, fS / 4 ± fIN fIN = 1850 MHz, AOUT = –2 dBFS 82.0 IL spur fIN = 2100 MHz, AOUT = –2 dBFS 84.0 HD2 IL Interleaving spur for HD2: fS / 2 – HD2 fIN = 1850 MHz, AOUT = –2 dBFS 80.0 fIN = 2100 MHz, AOUT = –2 dBFS 80.0 SNR Signal-to-noise ratio SFDR (1) MAX UNIT dBFS dBc dBc dBc dBc dBc F-band = 1880 MHz to 1920 MHz, A-band = 2010 MHz to 2025 MHz, and D-band = 2570 MHz to 2620 MHz. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 9 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 6.9 Digital Requirements typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and chip sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = 1.15 V, DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) PARAMETER TEST CONDITIONS MIN NOM MAX UNIT DIGITAL INPUTS (RESET, SCLK, SEN, SDIN, PDN, GPIO1, GPIO2, GPIO3, GPIO4) VIH High-level input voltage VIL Low-level input voltage 0.8 V IIH High-level input current 50 µA IIL Low-level input current –50 µA Ci Input capacitance 4 pF AVDD19 V 0.4 V DIGITAL OUTPUTS (SDOUT, GPIO1, GPIO2, GPIO3, GPIO4) VOH High-level output voltage VOL Low-level output voltage AVDD19 –0.1 0.1 V mVPP DIGITAL INPUTS (SYSREFP and SYSREFM; SYNCBP and SYNCBM; Requires External Biasing) VID Differential input voltage 350 450 800 VCM Input common-mode voltage 1.05 1.2 1.325 V DIGITAL OUTPUTS (JESD204B Interface: DA[3:0], DB[3:0], Meets JESD204B LV-0IF-11G-SR Standard) |VOD| Output differential voltage 700 mVPP |VOCM| Output common-mode voltage 450 mV Transmitter short-circuit current zos Co 10 Transmitter pins shorted to any voltage between –0.25 V and 1.45 V Single-ended output impedance Output capacitance Output capacitance inside the device, from either output to ground Submit Documentation Feedback –100 100 mA 50 Ω 2 pF Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 6.10 Timing Requirements typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and chip sampling rate = 2949.12 MSPS, 50% clock duty cycle, DDC-bypassed performance, AVDD19 = 1.9 V, AVDD = 1.15 V, DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) MIN NOM MAX UNIT 750 ps SAMPLE TIMING Aperture delay 250 Aperture delay matching between two channels on the same device Aperture delay matching between two devices at the same temperature and supply voltage Aperture jitter, clock amplitude = 2 VPP Latency (1) (2) Data latency, ADC sample to digital output DDC block bypassed (3), LMFS = 8224 Fast overrange latency, ADC sample to FOVR indication on GPIO pins SYSREF TIMING ±150 ps 90 fS 424 Input clock cycles 6 ns 140 70 ps 50 20 ps (4) tSU_SYSREF SYSREF setup time: referenced to clock rising edge, 2949.12 MSPS tH_SYSREF ps 70 Propagation delay time: logic gates and output buffer delay (does not change with fS) tPD ±15 SYSREF hold time: referenced to clock rising edge, 2949.12 MSPS Valid transition window sampling period: tSU_SYSREF – tH_SYSREF, 2949.12 MSPS 143 ps JESD OUTPUT INTERFACE TIMING UI Unit interval: 12.5 Gbps 80 100 400 ps Serial output data rate 2.5 10.0 12.5 Gbps Rise, fall times: 1-pF, single-ended load capacitance to ground Total jitter: BER of 1E-15 and lane rate = 12.5 Gbps Random jitter: BER of 1E-15 and lane rate = 12.5 Gbps Deterministic jitter: BER of 1E-15 and lane rate = 12.5 Gbps (1) (2) (3) (4) 60 ps 25 %UI 0.99 %UI, rms 9.1 %UI, pkpk Overall latency = latency + tPD. Latency increases when the DDC modes are used; see Table 5. For latency in different DDC options, see . Common-mode voltage for the SYSREF input is kept at 1.2 V. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 11 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com SYSREFP, SYNCP, DxP VID / 4, VOD / 4 VICM, VOCM(1) VID / 4, VOD / 4 SYSREFM, SYNCM, DxM SYSREF = SYSREFP-SYNCP, SYNC = SYNCP-SYNCM, Dx = DxP-DxM VID or VOD(1) 0V GND VOCM is not the same as VICM. Similarly, VOD is not the same as VID. Figure 1. Logic Levels for Digital Inputs and Outputs Sample N CLKP CLKM tSU_SYSREF tH_SYSREF SYSREFP SYSREFM Valid Transition Window Valid Transition Window Figure 2. SYSREF Timing Diagram 12 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 6.11 Typical Characteristics 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -40 -50 -60 -70 -60 -70 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 0 1500 250 D001 SNR = 62.2 dBFS; SFDR = 68 dBc; HD2 = –68 dBc; HD3 = –73 dBc; non HD2, HD3 = 77 dBc; IL spur = 86 dBc; fIN = 100 MHz Figure 3. FFT for 100-MHz Input Frequency 0 -10 -10 -20 -20 -30 -30 -50 -60 -70 1000 1250 D055 Figure 4. FFT for 100-MHz Input Signal (fS = 2457.6 MSPS) 0 -40 500 750 Input Frequency (MHz) SNR = 62.4 dBFS; SFDR = 71 dBc; HD2 = –71 dBc; HD3 = –83 dBc; non HD2, HD3 = 82 dBc; IL spur = 80 dBc; fIN = 100 MHz Amplitude (dBFS) Amplitude (dBFS) -50 -80 -80 -40 -50 -60 -70 -80 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 0 1500 250 D002 SNR = 61.2 dBFS; SFDR = 66 dBc; HD2 = –77 dBc; HD3 = –66 dBc; non HD2, HD3 = 80 dBc; IL spur = 83 dBc; fIN = 900 MHz Figure 5. FFT for 900-MHz Input Signal 0 -10 -10 -20 -20 -30 -30 -50 -60 -70 1000 1250 D056 Figure 6. FFT for 900-MHz Input Signal (fS = 2457.6 MSPS) 0 -40 500 750 Input Frequency (MHz) SNR = 62.1 dBFS; SFDR = 76 dBc; HD2 = –76 dBc; HD3 = –83 dBc; non HD2, HD3 = 82 dBc; IL spur = 83 dBc; fIN = 900 MHz Amplitude (dBFS) Amplitude (dBFS) -40 -40 -50 -60 -70 -80 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 1500 0 250 D003 SNR = 59.1 dBFS; SFDR = 65 dBc; HD2 = –65 dBc; HD3 = –73 dBc; non HD2, HD3 = 73 dBc; IL spur = 76 dBc; fIN = 1.7 GHz Figure 7. FFT for 1780-MHz Input Signal 500 750 Input Frequency (MHz) 1000 1250 D057 SNR = 58 dBFS; SFDR = 69 dBc; HD2 = –69 dBc; HD3 = –75 dBc; non HD2, HD3 = 74 dBc; IL spur = 78 dBc; fIN = 1.85 GHz Figure 8. FFT for 1850-MHz Input Signal (fS = 2457.6 MSPS) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 13 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Typical Characteristics (continued) 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -40 -50 -60 -70 -70 -90 -100 -100 -110 0 300 600 900 Input Frequency (MHz) 1200 0 1500 250 D004 SNR = 58.2 dBFS; SFDR = 64 dBc; HD2 = –64 dBc; HD3 = –85 dBc; non HD2, HD3 = 73 dBc; IL spur = 74 dBc; fIN = 2.1 GHz Figure 9. FFT for 2100-MHz Input Signal 0 -10 -10 -20 -20 -30 -30 -50 -60 -70 1000 1250 D058 Figure 10. FFT for 2100-MHz Input Signal (fS = 2457.6 MSPS) 0 -40 500 750 Input Frequency (MHz) SNR = 57.5 dBFS; SFDR = 70 dBc; HD2 = –70 dBc; HD3 = –81 dBc; non HD2, HD3 = 75 dBc; IL spur = 77 dBc; fIN = 2.1 GHz Amplitude (dBFS) Amplitude (dBFS) -60 -90 -110 -40 -50 -60 -70 -80 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 0 1500 250 D005 SNR = 56.9 dBFS; SFDR = 62 dBc; HD2 = –62 dBc; HD3 = –72 dBc; non HD2, HD3 = 72 dBc; IL spur = 64 dBc; fIN = 2.6 GHz Figure 11. FFT for 2600-MHz Input Signal 0 -10 -10 -20 -20 -30 -30 -50 -60 -70 1000 1250 D059 Figure 12. FFT for 2600-MHz Input Signal (fS = 2457.6 MSPS) 0 -40 500 750 Input Frequency (MHz) SNR = 55.4 dBFS; SFDR = 60 dBc; HD2 = –60 dBc; HD3 = –67 dBc; non HD2, HD3 = 72 dBc; IL spur = 75 dBc; fIN = 2.6 GHz Amplitude (dBFS) Amplitude (dBFS) -50 -80 -80 -40 -50 -60 -70 -80 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 1500 0 250 D006 SNR = 54.2 dBFS; SFDR = 60 dBc; HD2 = –60 dBc; HD3 = –64 dBc; non HD2, HD3 = 71 dBc; IL spur = 80 dBc; fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB gain Figure 13. FFT for 3500-MHz Input Signal 14 -40 500 750 Input Frequency (MHz) 1000 1250 D060 SNR = 53.6 dBFS; SFDR = 47 dBc; HD2 = –50 dBc; HD3 = –47 dBc; non HD2, HD3 = 70 dBc; IL spur = 67 dBc; fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB gain Figure 14. FFT for 3500-MHz Input Signal (fS = 2457.6 MSPS) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Typical Characteristics (continued) 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -40 -50 -60 -70 -50 -60 -70 -80 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 0 1500 -10 -20 -20 -30 -30 Amplitude (dBFS) 0 -10 -50 -60 -70 1200 1500 D074 Figure 16. FFT for Two-Tone Input Signal (–36 dBFS) 0 -40 600 900 Input Frequency (MHz) fIN1 = 900 MHz, fIN2 = 950 MHz, AIN = –36 dBFS, IMD = 97 dBFS Figure 15. FFT for Two-Tone Input Signal (–8 dBFS) -80 -40 -50 -60 -70 -80 -90 -90 -100 -100 -110 -110 0 250 500 750 Input Frequency (MHz) 1000 1250 0 250 D075 fIN1 = 900 MHz, fIN2 = 950 MHz, AIN = –8 dBFS, IMD = 75 dBFS 500 750 Input Frequency (MHz) 1000 1250 D076 fIN1 = 900 MHz, fIN2 = 950 MHz, AIN = –36 dBFS, IMD = 92 dBFS Figure 18. FFT for Two-Tone Input Signal (–36 dBFS, fS = 2457.6 MSPS) Figure 17. FFT for Two-Tone Input Signal (–8 dBFS, fS = 2457.6 MSPS) 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) 300 D001 fIN1 = 900 MHz, fIN2 = 950 MHz, AIN = –8 dBFS, IMD = 79 dBFS Amplitude (dBFS) -40 -40 -50 -60 -70 -80 -40 -50 -60 -70 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 1500 0 300 D007 fIN1 = 1.77 GHz, fIN2 = 1.79 GHz, AIN = –8 dBFS, IMD = 70 dBFS Figure 19. FFT for Two-Tone Input Signal (–8 dBFS) 600 900 Input Frequency (MHz) 1200 1500 D008 fIN1 = 1.77 GHz, fIN2 = 1.790 GHz, AIN = –36 dBFS, IMD = 97 dBFS Figure 20. FFT for Two-Tone Input Signal (–36 dBFS) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 15 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Typical Characteristics (continued) 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -40 -50 -60 -70 -40 -50 -60 -70 -80 -80 -90 -90 -100 -100 -110 -110 0 250 500 750 Input Frequency (MHz) 1000 0 1250 fIN1 = 1.77 GHz, fIN2 = 1.79 GHz, AIN = –8 dBFS, IMD = 76 dBFS 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) 1000 1250 D062 Figure 22. FFT for Two-Tone Input Signal (–36 dBFS, fS = 2457.6 MSPS) -40 -50 -60 -70 -80 -40 -50 -60 -70 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 1500 0 300 D009 fIN1 = 1.8 MHz, fIN2 = 2.6 GHz, AIN = –8 dBFS, IMD = 71 dBFS -10 -10 -20 -20 -30 -30 Amplitude (dBFS) 0 -50 -60 -70 -80 1200 1500 D010 Figure 24. FFT for Two-Tone Input Signal 0 -40 600 900 Input Frequency (MHz) fIN1 = 1.8 GHz, fIN2 = 2.6 GHz, AIN = –36 dBFS, IMD = 94 dBFS Figure 23. FFT for Two-Tone Input Signal (–8 dBFS) Amplitude (dBFS) 500 750 Input Frequency (MHz) fIN1 = 1.77 GHz, fIN2 = 1.790 GHz, AIN = –36 dBFS, IMD = 96 dBFS Figure 21. FFT for Two-Tone Input Signal (–8 dBFS, fS = 2457.6 MSPS) -40 -50 -60 -70 -80 -90 -90 -100 -100 -110 -110 0 250 500 750 Input Frequency (MHz) 1000 1250 Figure 25. FFT for Two-Tone Input Signal (–8 dBFS, fS = 2457.6 MSPS) 0 250 D063 fIN1 = 2.09 GHz, fIN2 = 2.1 GHz, AIN = –8 dBFS, IMD = 76 dBFS 16 250 D061 500 750 Input Frequency (MHz) 1000 1250 D064 fIN1 = 2.09 MHz, fIN2 = 2.1 GHz, AIN = –36 dBFS, IMD = 94 dBFS Figure 26. FFT for Two-Tone Input Signal (–36 dBFS, fS = 2457.6 MSPS) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Typical Characteristics (continued) 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -40 -50 -60 -70 -50 -60 -70 -80 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 0 1500 600 900 Input Frequency (MHz) 1200 1500 D012 fIN1 = 3.49 GHz, fIN2 = 3.51 GHz, IMD = 92 dBFS, AIN = –3 dBFS with 2-dB gain Figure 27. FFT for Two-Tone Input Signal (–8 dBFS) Figure 28. FFT for Two-Tone Input Signal (–36 dBFS) 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) 0 -40 -50 -60 -70 -80 -40 -50 -60 -70 -80 -90 -90 -100 -100 -110 -110 0 250 500 750 Input Frequency (MHz) 1000 1250 0 500 750 Input Frequency (MHz) 1000 1250 D066 fIN1 = 2.59 GHz, fIN2 = 2.6 GHz, AIN = –36 dBFS, IMD = 92 dBFS Figure 30. FFT for Two-Tone Input Signal (–36 dBFS, fS = 2457.6 MSPS) Figure 29. FFT for Two-Tone Input Signal (–8 dBFS, fS = 2457.6 MSPS) -60 -70 -70 IMD (dBFS) -60 -80 -90 -100 -110 -36 250 D065 fIN1 = 2.59 GHz, fIN2 = 2.6 GHz, AIN = –8 dBFS, IMD = 65 dBFS IMD (dBFS) 300 D011 fIN1 = 3.49 MHz, fIN2 = 3.51 GHz, IMD = 66 dBFS, AIN = –3 dBFS with 2-dB gain Amplitude (dBFS) -40 -80 -90 -100 -32 -28 -24 -20 -16 Each Tone Amplitude (dBFS) -12 -8 -110 -36 -32 D013 fIN1 = 1.77 GHz, fIN2 = 1.79 GHz Figure 31. Intermodulation Distortion vs Input Amplitude (1770 MHz and 1790 MHz) -28 -24 -20 -16 Each Tone Amplitude (dBFS) -12 -8 D067 fIN1 = 1.77 GHz, fIN2 = 1.79 GHz Figure 32. Intermodulation Distortion vs Input Amplitude (1770 MHz and 1790 MHz, fS = 2457.6 MSPS) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 17 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Typical Characteristics (continued) -60 -70 -70 -78 IMD (dBFS) IMD (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -80 -90 -100 -86 -94 -102 -110 -36 -32 -28 -24 -20 -16 Each Tone Amplitude (dBFS) -12 -110 -36 -8 fIN1 = 1.8 GHz, fIN2 = 2.6 GHz, AIN = –36 dBFS -60 -70 -70 IMD (dBFS) IMD (dBFS) -12 -8 D068 Figure 34. Intermodulation Distortion vs Input Amplitude (1800 MHz and 2600 MHz, fS = 2457.6 MSPS) -60 -80 -90 -80 -90 -100 -100 -110 -36 -32 -28 -24 -20 -16 Each Tone Amplitude (dBFS) -12 -110 -36 -8 -32 D015 Figure 35. Intermodulation Distortion vs Input Amplitude (3490 MHz and 3510 MHz) 78 78 SFDR (dBc) 90 54 42 -12 -8 D069 Figure 36. Intermodulation Distortion vs Input Amplitude (3490 MHz and 3510 MHz, fS = 2457.6 MSPS) 90 66 -28 -24 -20 -16 Each Tone Amplitude (dBFS) fIN1 = 2.59GHz, fIN2 = 2.6 GHz fIN1 = 3.49 GHz, fIN2 = 3.51 GHz with 2-dB digital gain SFDR (dBc) -28 -24 -20 -16 Each Tone Amplitude (dBFS) fIN1 = 2.09 GHz, fIN2 = 2.1 GHz Figure 33. Intermodulation Distortion vs Input Amplitude (1800 MHz and 2600 MHz) 66 54 42 30 30 0 500 1000 1500 2000 2500 3000 InputFrequency (MHz) 3500 4000 0 500 D016 AOUT = –2 dBFS with 0-dB gain for fIN less than 3 GHz, AOUT = –3 dBFS with 2-dB gain for fIN more than 3 GHz Figure 37. Spurious-Free Dynamic Range vs Input Frequency 18 -32 D014 1000 1500 2000 2500 InputFrequency (MHz) 3000 3500 D070 AOUT = –2 dBFS with 0-dB gain for fIN less than 3 GHz, AOUT = –3 dBFS with 2-dB gain for fIN more than 3 GHz Figure 38. Spurious-Free Dynamic Range vs Input Frequency (fS = 2457.6 MSPS) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Typical Characteristics (continued) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) 100 105 fIN + fS/4 (dBc) fIN - fS/2 (dBc) fIN - fS/4 (dBc) 90 85 80 75 70 65 95 90 85 80 75 65 0 500 1000 1500 2000 2500 3000 Input Frequency (MHz) 3500 4000 0 500 D017 AOUT = –2 dBFS with 0-dB gain for fIN less than 3 GHz, AOUT = –3 dBFS with 2-dB gain for fIN more than 3 GHz Figure 39. IL Spur vs Input Frequency 1000 1500 2000 2500 Input Frequency (MHz) 3000 3500 D071 AOUT = –2 dBFS with 0-dB gain for fIN less than 3 GHz, AOUT = –3 dBFS with 2-dB gain for fIN more than 3 GHz Figure 40. IL Spur vs Input Frequency (fS = 2457.6 MSPS) 63 63 61 61 SNR (dBFS) SNR (dBFS) 2fIN + fS/4 (dBc) 2fIN - fS/2 (dBc) 2fIN - fS/4 (dBc) 70 60 59 57 55 59 57 55 53 53 0 500 1000 1500 2000 2500 3000 Input Frequency (MHz) 3500 4000 0 500 D018 AOUT = –2 dBFS with 0-dB gain for fIN less than 3 GHz, AOUT = –3 dBFS with 2-dB gain for fIN more than 3 GHz 1000 1500 2000 2500 Input Frequency (MHz) 3000 3500 D072 AOUT = –2 dBFS with 0-dB gain for fIN less than 3 GHz, AOUT = –3 dBFS with 2-dB gain for fIN more than 3 GHz Figure 41. Signal-to-Noise Ratio vs Input Frequency Figure 42. Signal-to-Noise Ratio vs Input Frequency (fS = 2457.6 MSPS) 61 72 AVDD = 1.1 V AVDD = 1.15 V AVDD = 1.2 V AVDD = 1.25 V 59 58 57 56 -40 AVDD = 1.1 V AVDD = 1.15 V AVDD = 1.2 V AVDD = 1.25 V 70 SFDR (dBc) 60 SNR (dBFS) fIN + fS/4 (dBc) fIN - fS/2 (dBc) fIN - fS/4 (dBc) 100 Interleaving Spurs (dBc) Interleaving Spurs (dBc) 95 2fIN + fS/4 (dBc) 2fIN - fS/2 (dBc) 2fIN - fS/4 (dBc) 68 66 64 -15 10 35 Temperature (°C) 60 85 62 -40 -15 D019 fIN = 1.78 GHz, AIN = –2 dBFS Figure 43. Signal-to-Noise Ratio vs AVDD Supply and Temperature 10 35 Temperature (°C) 60 85 D020 fIN = 1.78 GHz, AIN = –2 dBFS Figure 44. Spurious-Free Dynamic Range vs AVDD Supply and Temperature Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 19 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Typical Characteristics (continued) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) 66 57 AVDD = 1.1 V AVDD = 1.15 V AVDD = 1.2 V AVDD = 1.25 V 64 SFDR (dBc) SNR (dBFS) 56 55 54 62 60 58 53 52 -40 -15 10 35 Temperature (°C) 60 56 -40 85 D022 DVDD = 1.1 V DVDD = 1.15 V DVDD = 1.2 V 70 SFDR (dBc) SNR (dBFS) 85 72 DVDD = 1.1 V DVDD = 1.15 V DVDD = 1.2 V 60 59 58 57 68 66 64 -15 10 35 Temperature (°C) 60 62 -40 85 -15 D023 fIN = 1.78 GHz, AIN = –2 dBFS 10 35 Temperature (°C) 60 85 D024 fIN = 1.78 GHz, AIN = –2 dBFS Figure 47. Signal-to-Noise Ratio vs DVDD Supply and Temperature Figure 48. Spurious-Free Dynamic Range vs DVDD Supply and Temperature 57 68 DVDD = 1.1 V DVDD = 1.15 V DVDD = 1.2 V DVDD = 1.1 V DVDD = 1.15 V DVDD = 1.2 V 66 SFDR (dBc) 56 SNR (dBFS) 60 Figure 46. Spurious-Free Dynamic Range vs AVDD Supply and Temperature 61 55 54 53 64 62 60 -15 10 35 Temperature (°C) 60 85 58 -40 -15 D025 fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB digital gain Figure 49. Signal-to-Noise Ratio vs DVDD Supply and Temperature 20 10 35 Temperature (°C) fIN = 3.5GHz, AIN = –3 dBFS with 2-dB digital gain Figure 45. Signal-to-Noise Ratio vs AVDD Supply and Temperature 52 -40 -15 D021 fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB digital gain 56 -40 AVDD = 1.1 V AVDD = 1.15 V AVDD = 1.2 V AVDD = 1 .25 V 10 35 Temperature (°C) 60 85 D026 fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB digital gain Figure 50. Spurious-Free Dynamic Range vs DVDD Supply and Temperature Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Typical Characteristics (continued) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) 72 61 AVDD19 = 1.8 V AVDD19 = 1.85 V AVDD19 = 1.9 V 70 SFDR (dBc) SNR (dBFS) 60 AVDD19 = 1.8 V AVDD19 = 1.85 V AVDD19 = 1.9 V AVDD19 = 1.95 V AVDD19 = 2 V 59 58 68 66 64 57 56 -40 -15 10 35 Temperature (°C) 60 62 -40 85 -15 60 85 D028 fIN = 1.78 GHz, AIN = –2 dBFS Figure 51. Signal-to-Noise Ratio vs AVDD19 Supply and Temperature Figure 52. Spurious-Free Dynamic Range vs AVDD19 Supply and Temperature 57 66 AVDD19 = 1.8 V AVDD19 = 1.85 V AVDD19 = 1.9 V AVDD19 = 1.95 V AVDD19 = 2 V AVDD19 = 1.8 V AVDD19 = 1.85 V AVDD19 = 1.9 V 64 SFDR (dBc) 56 SNR (dBFS) 10 35 Temperature (°C) D027 fIN = 1.78 GHz, AIN = –2 dBFS 55 54 53 AVDD19 = 1.95 V AVDD19 = 2 V 62 60 58 52 -40 -15 10 35 Temperature (°C) 60 56 -40 85 -15 10 35 Temperature (°C) D029 fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB digital gain 60 85 D030 fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB digital gain Figure 53. Signal-to-Noise Ratio vs AVDD19 Supply and Temperature Figure 54. Spurious-Free Dynamic Range vs AVDD19 Supply and Temperature 24 35 Temp = -40°C Temp = 25°C Temp = 85°C 30 Temp = -40°C Temp = 25°C Temp = 85°C 20 25 16 Count (%) Count (%) AVDD19 = 1.95 V AVDD19 = 2 V 20 15 12 8 HD2 (dBFS) D031 HD2 (dBFS) fIN = 1.78 GHz -62 -63 -64 -65 -66 -67 -68 -69 -70 -71 -72 -73 -74 -75 -78 -63 -64 -65 -66 -67 -68 -69 -70 -71 -72 -73 -74 -76 0 -77 0 -78 4 -80 5 -77 10 D032 fIN = 1.78 GHz Figure 55. HD2 Histogram at AVDD19 = 1.8 V Figure 56. HD2 Histogram at AVDD19 = 1.9 V Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 21 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Typical Characteristics (continued) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) Temp = -40°C Temp = 25°C Temp = 85°C 68 66 SNR (dBFS) 15 10 5 0 64 80 62 70 60 60 58 50 56 40 54 30 52 20 50 10 -82 -80 -79 -78 -77 -76 -75 -74 -73 -72 -71 -70 -69 -68 -67 -66 -65 -64 -63 48 -70 HD2 (dBFS) fIN = 1.78 GHz Figure 57. HD2 Histogram at AVDD19 = 2.0 V SNR (dBFS) 66 64 80 62 70 60 60 58 50 56 40 54 30 52 20 50 10 0 -20 -10 67 59 64 58 63 57 62 D035 61 2.5 0.9 1.3 1.7 2.1 Differential Clock Amplitude (Vpp) D036 fIN = 1.78 GHz, AIN = –2 dBFS Figure 60. Performance vs Clock Amplitude 60 64 75 SNR SFDR 62 54 60 53 58 52 56 54 2.5 D037 fIN = 3.5 GHz, AIN = –3 dBFS Figure 61. Performance vs Clock Amplitude SNR (dBFS) 55 SFDR (dBc) SNR SFDR 0.9 1.3 1.7 2.1 Differential Clock Amplitude (Vpp) 66 65 56 0.5 0 56 SNR (dBFS) D034 60 Figure 59. Performance vs Amplitude 22 0 SNR SFDR 61 fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB digital gain 51 0.5 -10 SFDR (dBc) 68 -40 -30 Amplitude (dBFS) -20 62 SNR (dBFS) SNR (dBFS) 110 SFDR (dBFS) 100 SFDR (dBc) 90 SFDR (dBc,dBFS) 70 -50 -40 -30 Amplitude (dBFS) Figure 58. Performance vs Amplitude 120 -60 -50 fIN = 1.78 GHz, AIN = –2 dBFS 72 48 -70 0 -60 D033 59 72.5 58 70 57 67.5 56 65 55 40 45 50 55 Input Clock Duty Cycle (%) SFDR (dBc) Count (%) 20 120 SNR (dBFS) 110 SFDR (dBFS) 100 SFDR (dBc) 90 70 SFDR (dBc,dBFS) 72 25 62.5 60 D039 D038 fIN = 1.78 GHz, AIN = –2 dBFS Figure 62. Performance vs Clock Duty Cycle Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Typical Characteristics (continued) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) 56 0 63 SNR SFDR -10 -20 54 61 53 60 52 59 Amplitude (dBFS) 62 SFDR (dBc) SNR (dBFS) 55 -30 -40 -50 -60 -70 -80 -90 -100 51 40 45 50 55 Input Clock Duty Cycle (%) -110 58 60 0 fIN = 3.5 GHz, AIN = –3 dBFS with 2-dB digital gain 600 900 Input Frequency (MHz) 1200 1500 D040 fIN = 3.5 GHz, AIN = –3 dBFS, PSRR = 37 dB, fPSRR = 3 MHz, APSRR = 50 mVPP, AVDD = 1.9 V Figure 64. Power-Supply Rejection Ratio FFT for Test Signal on AVDD Supply Figure 63. Performance vs Clock Duty Cycle 0 75 PSRR with 50-mVpp Signal on AVDD PSRR with 50-mVpp Signal on AVDD19 65 -10 Amplitude (dBFS) -20 55 PSRR (dB) 300 D039 45 35 -30 -40 -50 -60 -70 -80 -90 25 -100 15 0.02 0.05 -110 0 0.2 0.5 1 2 3 45 7 10 20 50 100 200 500 Frequency of Signal on Supply (MHz) D041 300 600 900 Input Frequency (MHz) 1200 1500 D042 CMRR = 32 dB, fCMRR = 32 dB, APSRR = 50 mVPP Figure 66. Common-Mode Rejection Ratio FFT Figure 65. Power-Supply Rejection Ratio vs Tone Frequency 0 45 -10 40 -20 -30 Amplitude (dBFS) CMRR (dB) 35 30 25 20 -40 -50 -60 -70 -80 -90 -100 15 -110 10 0 50 100 150 200 Frequency of Input Common-Mode Signal (MHz) 250 -120 -375 -225 D043 fIN = 1.8 GHz, AOUT = –2 dBFS Figure 67. Common-Mode Rejection Ratio vs Tone Frequency -75 75 Input Frequency (MHz) 225 375 D044 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 60.6 dBFS, SFDR (includes IL) = 75 dBc Figure 68. FFT in 4X Decimation (Complex Output) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 23 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Typical Characteristics (continued) 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -40 -50 -60 -70 -80 -70 -80 -90 -100 -110 -150 -50 50 Input Frequency (MHz) 150 -120 -187.5 250 -10 -20 -20 -30 -30 Amplitude (dBFS) 0 -10 -50 -60 -70 -80 -60 -70 -80 -90 -100 -110 -110 99.6 -120 -150 166 Figure 71. FFT in 9X Decimation (Complex Output) -20 -20 -30 -30 Amplitude (dBFS) 0 -10 -40 -50 -60 -70 -80 -60 -70 -80 -90 -100 -110 -110 125 -120 -93.75 -56.25 D049 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 63.7 dBFS, SFDR (includes IL) = 83 dBc Figure 73. FFT in 12X Decimation (Complex Output) D048 -50 -100 75 150 -40 -90 -25 25 Input Frequency (MHz) 90 Figure 72. FFT in 10X Decimation (Complex Output) -10 -75 -30 30 Input Frequency (MHz) fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 63.3 dBFS, SFDR (includes IL) = 81 dBc 0 -120 -125 -90 D047 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 63 dBFS, SFDR (includes IL) = 82 dBc D046 -50 -100 -33.2 33.2 Input Frequency (MHz) 187.5 -40 -90 -99.6 112.5 Figure 70. FFT in 8X Decimation (Complex Output) 0 -40 -37.5 37.5 Input Frequency (MHz) fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 62.6 dBFS, SFDR (includes IL) = 86 dBc Figure 69. FFT in 6X Decimation (Complex Output) -120 -166 -112.5 D045 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 61.6 dBFS, SFDR (includes IL) = 82 dBc Amplitude (dBFS) -60 -100 -120 -250 Amplitude (dBFS) -50 -90 -110 24 -40 -18.75 18.75 Input Frequency (MHz) 56.25 93.75 D050 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 63.9 dBFS, SFDR (includes IL) = 83 dBc Figure 74. FFT in 16X Decimation (Complex Output) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Typical Characteristics (continued) 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) typical values are specified at an ambient temperature of 25°C; minimum and maximum values are specified over an ambient temperature range of –40°C to +85°C; and ADC sampling rate = 2949.12 MSPS, DDC bypassed performance, 50% clock duty cycle, AVDD19 = 1.9 V, AVDD = DVDD = 1.15 V, –2-dBFS differential input, and 0-dB digital gain (unless otherwise noted) -40 -50 -60 -70 -80 -50 -60 -70 -80 -90 -90 -100 -100 -110 -110 -120 -83 -49.8 -16.6 16.6 Input Frequency (MHz) 49.8 -120 -75 83 Figure 75. FFT in 18X Decimation (Complex Output) -20 -20 -30 -30 Amplitude (dBFS) 0 -10 -50 -60 -70 -80 -60 -70 -80 -90 -100 -110 -110 37.5 62.5 -120 -46.875 -28.125 D054 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 64.4 dBFS, SFDR (includes IL) = 82 dBc Figure 77. FFT in 24X Decimation (Complex Output) D052 -50 -100 -12.5 12.5 Input Frequency (MHz) 75 -40 -90 -37.5 45 Figure 76. FFT in 20X Decimation (Complex Output) -10 -40 -15 15 Input Frequency (MHz) fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 64.4 dBFS, SFDR (includes IL) = 84 dBc 0 -120 -62.5 -45 D051 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 64 dBFS, SFDR (includes IL) = 83 dBc Amplitude (dBFS) -40 -9.375 9.375 Input Frequency (MHz) 28.125 46.875 D054 fIN = 1.78 GHz, AIN = –2 dBFS, fS = 2949.12 MSPS, SNR = 64.5 dBFS, SFDR (includes IL) = 79 dBc Figure 78. FFT in 32X Decimation (Complex Output) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 25 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 7 Parameter Measurement Information 7.1 Input Clock Diagram Figure 79 shows the input clock diagram. VCLKIN_DIFF = VCLKIN+ - VCLKIN- VCLKIN+ VCLKIN- Figure 79. Input Clock Diagram 26 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8 Detailed Description 8.1 Overview The ADC32RF8x is a dual, 14-bit, 2949.12-MSPS, telecom receiver and feedback device family containing analog-to-digital converters (ADCs) followed by multi-band digital down-converters (DDCs), and a back-end JESD204B digital interface. The ADCs are preceded by input buffers and on-chip termination to provide a uniform input impedance over a large input frequency range. Furthermore, an internal differential clamping circuit provides first-level protection against overvoltage conditions. Each ADC channel is internally interleaved four times and equipped with background, analog and digital, and interleaving correction. The on-chip DDC enables single- or dual-band internal processing to pre-select and filter smaller bands of interest and also reduces the digital output data traffic. Each DDC is equipped with up to three independent, 16-bit numerically-controlled oscillators (NCOs) for phase coherent frequency hopping; the NCOs can be controlled through the SPI or GPIO pins. The ADC32RF8x also provides three different power detectors on-chip with alarm outputs in order to support external automatic gain control (AGC) loops. The processed data are passed into the JESD204B interface where the data are framed, encoded, serialized, and output on one to four lanes per channel, depending on the ADC sampling rate and decimation. The CLKIN, SYSREF, and SYNCB inputs provide the device clock and the SYSREF and SYNCB signals to the JESD204B interface that are used to derive the internal local frame and local multiframe clocks and establish the serial link. All features of the ADC32RF8x are configurable through the SPI. 8.2 Functional Block Diagram Buffer N Interleave Correction FAST DET. DA[2,3]P/M N NCO NCO NCO CTRL GPIO1..4 CLKINP/M PLL JESD204B Interface INAP/M DA[0,1]P/M Digital Block ADC ADC ADC ADC 50 SYNCBP/M SYSREFP/M NCO FAST DET. Buffer NCO Digital Block ADC ADC ADC ADC INBP/M 0º/180º Clock Interleave Correction N DB[0,1]P/M N DB[2,3]P/M 50 Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 27 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.3 Feature Description 8.3.1 Analog Inputs The ADC32RF8x analog signal inputs are designed to be driven differentially. The analog input pins have internal analog buffers that drive the sampling circuit. The ADC32RF8x provides on-chip, differential termination to minimize reflections. The buffer also helps isolate the external driving circuit from the internal switching currents of the sampling circuit, thus resulting in a more constant SFDR performance across input frequencies. The common-mode voltage of the signal inputs is internally biased to CM using the 32.5-Ω termination resistors that allow for ac-coupling of the input drive network. Figure 80 and Figure 81 show SDD11 at the analog inputs from dc to 5 GHz with a 100-Ω reference impedance. INxP TI Device CIN RIN ZIN = RIN || CIN SDD11 = (ZIN ± 100) / (ZIN + 100) INxM Copyright © 2016, Texas Instruments Incorporated Figure 80. Equivalent Input Impedance 28 Figure 81. SDD11 Over the Input Frequency Range Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Feature Description (continued) The input impedance of analog inputs can also be modelled as parallel combination of equivalent resistance and capacitance. Figure 82 and Figure 83 show how equivalent impedance (CIN and RIN) vary over frequency. 0.07 Differential Shunt Resistance (k Ohm) Differential Shunt Capacitance (pF) 3 2 1 0 -1 -2 -3 0.06 0.05 0.04 0.03 0.02 0.01 0 500 1000 1500 2000 Input Frequency (MHz) 2500 3000 0 500 D063 Figure 82. Differential Input Capacitance vs Input Frequency 1000 1500 2000 Input Frequency (MHz) 2500 3000 D064 D001 Figure 83. Differential Input Resistance vs Input Frquency Each input pin (INP, INM) must swing symmetrically between (CM + 0.3375 V) and (CM – 0.3375 V), resulting in a 1.35-VPP (default) differential input swing. The input sampling circuit has a 3-dB bandwidth that extends up to approximately 3.2 GHz, as shown in Figure 84. 2 1 Transfer Function (dB) 0 -1 -2 -3 -4 -5 -6 100 Ohm Source 50 Ohm Source -7 -8 100 200 300 500 700 1000 2000 3000 Input Frequency (MHz) 5000 D062 Figure 84. Input Bandwidth with a 100-Ω Source Resistance Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 29 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Feature Description (continued) 8.3.1.1 Input Clamp Circuit The ADC32RF8x analog inputs include an internal, differential clamp for overvoltage protection. The clamp triggers for any input signals at approximately 600 mV above the input common-mode voltage, effectively limiting the maximum input signal to approximately 2.4 VPP, as shown in Figure 85 and Figure 86. When the clamp circuit conducts, the maximum differential current flowing through the circuit (via input pins) must be limited to 20 mA. ADC32RF80 INxP +600 mV To Analog Buffer +337.5 mV INP RDC / 2 IDIFF Input Vcm 675 mVPP for INP and INM (1.35 VPP Differentially) INM Clamp Circuit ±337.5 mV RDC / 2 VCM ±600 mV To Analog Buffer INxM Copyright © 2016, Texas Instruments Incorporated Figure 85. Clamp Circuit in the ADC32RF8x 30 Figure 86. Clamp Response Timing Diagram Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Feature Description (continued) 8.3.2 Clock Input The ADC32RF8x sampling clock input includes internal 100-Ω differential termination along with on-chip biasing. The clock input is recommended to be ac-coupled externally. The input bandwidth of the clock input is approximately 3 GHz; the clock input impedance is shown with a 100-Ω reference impedance in the smith chart of Figure 87. Figure 87. SDD11 of the Clock Input Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 31 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Feature Description (continued) The analog-to-digital converter (ADC) aperture jitter is a function of the clock amplitude applied to the pins. The equivalent aperture jitter for input frequencies at a 1-GHz and a 2-GHz input is shown in Figure 88. Depending on the clock frequency, a matching circuit can be designed in order to maximize the clock amplitude. 350 fIN = 1 GHz fIN = 2 GHz Aperture Jitter (fS) 300 250 200 150 100 50 0.2 1 Clock Amplitude (vPP) 2 D061 Figure 88. Equivalent Aperture Jitter vs Input Clock Amplitude 8.3.3 SYSREF Input The SYSREF signal is a periodic signal that is sampled by the ADC32RF8x device clock and is used to align the boundary of the local multiframe clock inside the data converter. SYSREF is also used to reset critical blocks [such as the clock divider for the interleaved ADCs, numerically-controlled oscillators (NCOs), decimation filters and so forth]. The SYSREF input requires external biasing. Furthermore, SYSREF must be established before the SPI registers are programmed. A programmable delay on the SYSREF input, as shown in Figure 89, is available to help with skew adjustment when the sampling clock and SYSREF are not provided from the same source. CLKINP 50 VCM 50 CLKINM Delay SYSREFP 100 SYSREF Capture SYSREFM Figure 89. SYSREF Internal Circuit Diagram 32 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Feature Description (continued) 8.3.3.1 Using SYSREF The ADC32RF8x uses SYSREF information to reset the clock divider, the NCO phase, and the LMFC counter of the JESD interface. The device provides flexibility to provide SYSREF information either from dedicated pins or through SPI register bits. SYSREF is asserted by a low-to-high transition on the SYSREF pins or a 0-to-1 change in the ASSERT SYSREF REG bit when using SPI registers, as shown in Figure 90. Input Clock Divider (Divide-by-4) CLKIN (CLKP-CLKM) PDN SYSREF (In Master Page) DLL NCO, JESD Interface (LMFC Counter) MASK CLKDIV SYSREF (In JESD Digital Page) 0 SYSREF (SYSREFP-SYSREFM) 1 ASSERT SYSREF REG (In Master Page) SEL SYSREF REG (In Master Page) MASK NCO SYSREF (In JESD Digital Page) Figure 90. Using SYSREF to Reset the Clock Divider, the NCO, and the LMFC Counter The ADC32RF8x samples the SYSREF signal on the input clock rising edge. Required setup and hold time are listed in the Timing Requirements table. The input clock divider gets reset each time that SYSREF is asserted, whereas the NCO phase and the LMFC counter of the JESD interface are reset on each SYSREF assertion after disregarding the first two assertions, as shown in Table 1. Table 1. Asserting SYSREF SYSREF ASSERTION INDEX ACTION INPUT CLOCK DIVIDER NCO PHASE LMFC COUNTER 1 Gets reset Does not get reset Does not get reset 2 Gets reset Does not get reset Does not get reset 3 Gets reset Gets reset Gets reset 4 and onwards Gets reset Gets reset Gets reset Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 33 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com The SESREF use-cases can be classified broadly into two categories: 1. SYSREF is applied as aperiodic multi-shot pulses. Figure 91 shows a case when only a counted number of pulses are applied as SYSREF to the ADC. CLKIN SYSREF tDLL (Must be Kept > 40 Ps) 1st SYSREF pulse. Only the input clock divider is reset. 2nd SYSREF pulse. If the MASK CLKDIV bit is set, the clock divider ignores this pulse and any subsequent SYSREF pulses. 3rd SYSREF pulse. The NCO phase and LMFC counter are reset. 4th SYSREF pulse (and subsequent pulses). Ignored by the input clock divider, NCO, and the JESD interface. 1 (The input clock divider ignores the SYSREF pulses.) MASK CLKDIV SYSREF Register Bit 0 1 (The NCO and LMFC counter of the JESD interface ignore the SYSREF pulses.) MASK NCO SYSREF Register Bit(1) 0 Alternatively, the SYSREF buffer can be powered down with the PDN SYSREF bit. Figure 91. SYSREF Used as a Periodic, Finite Number of Pulses After the first SYSREF pulse is applied, allow the DLL in the clock path to settle by waiting for the tDLL time (> 40 µs) before applying the second pulse. During this time, mask the SYSREF going to the input clock divider by setting the MASK CLKDIV SYSREF bit so that the divider output phase remains stable. The NCO phase and LMFC counter are reset on the third SYSREF pulse. After the third SYSREF pulse, the SYSREF going to the NCO and JESD block can be disabled by setting the MASK NCO SYSREF bit to avoid any unwanted resets. 34 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 2. SYSREF is applied as a periodic pulse. Figure 92 shows how SYSREF can be applied as a continuous periodic waveform. Mask SYSREF to the NCO after resetting the NCO phase. The NCO phase is reset here for the last time. Then, the NCO mask is set high to ignore further SYSREF pulses. CLKIN SYSREF(1) Time > tDLL + 2 x tSYSREF 1st SYSREF pulse. The input clock divider is reset. 1 (The NCO and LMFC counter of the JESD interface ignore the SYSREF pulses.) MASK NCO SYSREF Register Bit(2) 0 tSYSREF is a period of the SYSREF waveform. Alternatively, the SYSREF buffer can be powered down using the PDN SYSREF bit. Figure 92. SYSREF Used as a Periodic Waveform After applying the SYSREF signal, DLL must be allowed to lock, and the NCO phase and LMFC counter must be allowed to reset by waiting for at least the tDLL (40 µs) + 2 × tSYSREF time. Then, the SYSREF going to the NCO and JESD can be masked by setting the MASK NCO SYSREF register bit. 8.3.3.2 Frequency of the SYSREF Signal When SYSREF is a periodic signal, its frequency is required to be a sub-harmonic of the internal local multiframe clock (LMFC) frequency, as described in Equation 1. The LMFC frequency is determined by the selected decimation, frames per multi-frame setting (K), samples per frame (S), and device input clock frequency. SYSREF = LMFC / N where • N is an integer value (1, 2, 3, and so forth) (1) In order for the interleaving correction engine to synchronize properly, the SYSREF frequency must also be a multiple of fS / 64. Table 2 provides a summary of the valid LMFC clock settings. Table 2. . SYSREF and LMFC Clock Frequency OPERATING MODE LMFS SETTING LMFC CLOCK FREQUENCY SYSREF FRQUENCY Decimation Various fS (1) / (D × S (2) × K (3)) fS / (N × LCM (4) (64, D (5) × S × K)) (1) (2) (3) (4) (5) fS = sampling (device) clock frequency. S = samples per frame. K = number of frames per multi-frame. LCM = least-common multiple. D = decimation ratio. The SYSREF signal is recommended to be a low-frequency signal less than 5 MHz in order to reduce coupling to the signal path both on the printed circuit board (PCB) as well as internal to the device. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 35 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Example: fS = 2949.12 MSPS, Divide-by-4 (LMFS = 8411), K = 16 SYSREF = 2949.12 MSPS / LCM (4 ,64, 16) = 46.08 MHz / N Operate SYSREF at 2.88 MHz (effectively divide-by-1024, N = 16) For proper device operation, disable the SYSREF signal after the JESD synchronization is established. 8.3.4 DDC Block The ADC32RF8x provides a sophisticated on-chip, digital down converter (DDC) block that can be controlled through SPI register settings and the general-purpose input/output (GPIO) pins. The DDC block supports two basic operating modes: receiver (RX) mode with single- or dual-band DDC and wide-bandwidth observation receiver mode. Note that the ADC32RF80 and ADC32RF83 are identical devices except the fact that the ADC32RF83 offers only single-band DDC option whereas the ADC32RF80 offers both single-band and dual-band DDC options, as shown in Table 3. Table 3. DDC Option Availability DDC OPTION AVAILABILITY IN DEVICE Wide-band DDC ADC32RF80, ADC32RF83 Single-band DDC ADC32RF80, ADC32RF83 Dual-band DDC ADC32RF80 only Each ADC channel is followed by two DDC chains consisting of the digital filter along with a complex digital mixer with a 16-bit numerically-controlled oscillator (NCO), as shown in Figure 93. The NCOs allow accurate frequency tuning within the Nyquist zone prior to the digital filtering. One DDC chain is intended for supporting a dual-band DDC configuration in receiver mode and the second DDC chain supports the wide-bandwidth output option for the observation configuration. At any given time, either the single-band DDC, the dual-band DDC, or the wideband DDC can be enabled. Furthermore, three different NCO frequencies can be selected on that path and are quickly switched using the SPI or the GPIO pins to enable wide-bandwidth observation in a multi-band application. fOUT / 4 NCO 1, 16 Bits NCO 2, 16 Bits NCO 3, 16 Bits IQ data Real[ ] GPIO 3 GSPS ADC IQ data, 3 GSPS LPF 2,3 LPF 2 LPF N/2 LPF 2 Wideband IQ Output RX1 IQ Output Real[ ] IQ data Wideband Real Output RX1 Real Output JESD204B fOUT / 4 IQ 3 GSPS LPF NCO 4, 16 Bits N/2 IQ data SYSREF RX2 IQ Output 2 LPF Real[ ] RX2 Real Output fOUT / 4 NOTE: Red traces show SYSREF going to the NCO blocks. Figure 93. DDC Chains Overview (One ADC Channel Shown) 36 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Additionally, the decimation filter block provides the option to convert the complex output back to real format at twice the decimated, complex output rate. The filter response with a real output is identical to a complex output. The band is centered in the middle of the Nyquist zone (mixed with fOUT / 4) based on a final output data rate of fOUT. 8.3.4.1 Operating Mode: Receiver In receiver mode, the DDC block can be configured to single- or dual-band operation, as shown in Figure 94. Both DDC chains use the same decimation filter setting and the available options are discussed in the Decimation Filters section. The decimation filter setting also directly affects the interface rate and number of lanes of the JESD204B interface. fOUT / 4 NCO 1, 16 Bits NCO 2, 16 Bits NCO 3, 16 Bits IQ data Real[ ] GPIO 3 GSPS IQ data, 3 GSPS ADC LPF 2,3 LPF 2 LPF N/2 LPF 2 Wideband IQ Output RX1 IQ Output Real[ ] IQ data Wideband Real Output RX1 Real Output JESD204B fOUT / 4 IQ 3 GSPS LPF NCO 4, 16 Bits N/2 IQ data SYSREF RX2 IQ Output 2 LPF Real[ ] RX2 Real Output fOUT / 4 NOTE: Red traces show SYSREF going to the NCO blocks. Figure 94. Decimation Filter Option for Single- or Dual-Band Operation Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 37 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.3.4.2 Operating Mode: Wide-Bandwidth Observation Receiver This mode is intended for using a DDC with a wide bandwidth output, but for multiple bands. This mode uses a single DDC chain where up to three NCOs can be used to perform wide-bandwidth observation in a multi-band environment, as shown in Figure 95. The three NCOs can be switched dynamically using either the GPIO pins or an SPI command. All three NCOs operate continuously to ensure phase continuity; however, when the NCO is switched, the output data are invalid until the decimation filters are completely flushed with data from the new band. fOUT / 4 NCO 1, 16 Bits NCO 2, 16 Bits NCO 3, 16 Bits IQ data Real[ ] GPIO 3 GSPS ADC IQ data, 3 GSPS LPF 2,3 LPF 2 LPF N/2 LPF 2 Wideband IQ Output RX1 IQ Output Real[ ] IQ data Wideband Real Output RX1 Real Output JESD204B fOUT / 4 IQ 3 GSPS LPF NCO 4, 16 Bits N/2 IQ data SYSREF RX2 IQ Output 2 LPF Real[ ] RX2 Real Output fOUT / 4 NOTE: Red traces show SYSREF going to the NCO blocks. Figure 95. Decimation Filter Implementation for Single-Band and Wide-Bandwidth Mode 38 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.3.4.3 Decimation Filters The stop-band rejection of the decimation filters is approximately 90 dB with a pass-band bandwidth of approximately 80%. Table 4 gives an overview of the pass-band bandwidth depending on decimation filter setting and ADC sampling rate. Table 4. Decimation Filter Summary and Maximum Available Output Bandwidth BANDWIDTH DECIMATION SETTING NO. OF DDCS AVAILABLE PER CHANNEL NOMINAL PASSBAND GAIN 3 dB (%) 1 dB (%) Divide-by-4 complex 1 –0.4 dB 90.9 Divide-by-6 complex 1 –0.65 dB Divide-by-8 complex 2 Divide-by-9 complex ADC SAMPLE RATE = N MSPS ADC SAMPLE RATE = 3 GSPS OUTPUT RATE (MSPS) PER BAND OUTPUT BANDWIDTH (MHz) PER BAND COMPLEX OUTPUT RATE (MSPS) PER BAND OUTPUT BANDWIDTH (MHz) PER BAND 86.8 N / 4 complex 0.4 × N / 2 750 600 90.6 86.1 N / 6 complex 0.4 × N / 3 500 400 –0.27 dB 91.0 86.8 N / 8 complex 0.4 × N / 4 375 300 2 –0.45 dB 90.7 86.3 N / 9 complex 0.4 × N / 4.5 333.3 266.6 Divide-by-10 complex 2 –0.58 dB 90.7 86.3 N / 10 complex 0.4 × N / 5 300 240 Divide-by-12 complex 2 –0.55 dB 90.7 86.4 N / 12 complex 0.4 × N / 6 250 200 Divide-by-16 complex 2 –0.42 dB 90.8 86.4 N / 16 complex 0.4 × N / 8 187.5 150 Divide-by-18 complex 2 –0.83 dB 91.2 87.0 N / 18 complex 0.4 × N / 9 166.6 133 Divide-by-20 complex 2 –0.91 dB 91.2 87.0 N / 20 complex 0.4 × N / 10 150 120 Divide-by-24 complex 2 –0.95 db 91.1 86.9 N / 24 complex 0.4 × N / 12 125 100 Divide-by-32 complex 2 –0.78 dB 91.1 86.8 N / 32 complex 0.4 × N / 16 93.75 75 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 39 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com A dual-band example with a divide-by-8 complex is shown in Figure 96. NCO 1, 16 Bits Band 1 Filter ADC 3 GSPS IQ 3 GSPS IQ 3 GSPS IQ 750 MSPS 8 IQ 750 MSPS 8 IQ Output Band 1 IQ Output Band 2 fS/16 Filter NCO 2, 16 Bits Band 2 Band 2 fS/4 Band 1 fS/16 NCO 2 NCO 1 fS/2 Figure 96. Dual-Band Example The decimation filter responses normalized to the ADC sampling clock are illustrated in Figure 96 to Figure 119 and can be interpreted as follows: Each figure contains the filter pass-band, transition bands, and alias bands, as shown in Figure 97. The x-axis in Figure 97 shows the offset frequency (after the NCO frequency shift) normalized to the ADC sampling clock frequency. For example, in the divide-by-4 complex, the output data rate is an fS / 4 complex with a Nyquist zone of fS / 8 or 0.125 × fS. The transition band is centered around 0.125 × fS and the alias transition band is centered at 0.375 × fS. The alias bands that alias on top of the wanted signal band are centered at 0.25 × fS and 0.5 × fS (and are colored in red). The decimation filters of the ADC32RF8x provide greater than 90-dB attenuation for the alias bands. Band That Folds Back On Top of Transition Band Filter Transition Band Bands That Aliases On Top of Signal Band Figure 97. Interpretation of the Decimation Filter Plots 40 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.3.4.3.1 Divide-by-4 Peak-to-peak pass-band ripple: approximately 0.22 dB 0 0 Passband Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.02 0.04 D023 Figure 98. Divide-by-4 Filter Response 0.06 Frequency 0.08 0.1 0.12 D024 Figure 99. Divide-by-4 Filter Response (Zoomed) 8.3.4.3.2 Divide-by-6 Peak-to-peak pass-band ripple: approximately 0.38 dB 0 0 Pass Band Transition Band Alias Band Attn Spec Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.01 0.02 0.03 D025 Figure 100. Divide-by-6 Filter Response 0.04 0.05 Frequency 0.06 0.07 0.08 D026 Figure 101. Divide-by-6 Filter Response (Zoomed) 8.3.4.3.3 Divide-by-8 Peak-to-peak pass-band ripple: approximately 0.25 dB 0 0 Pass Band Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.01 D027 Figure 102. Divide-by-8 Filter Response 0.02 0.03 Frequency 0.04 0.05 0.06 D028 Figure 103. Divide-by-8 Filter Response (Zoomed) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 41 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.3.4.3.4 Divide-by-9 Peak-to-peak pass-band ripple: approximately 0.39 dB 0 0 Pass Band Transition Band Alias Band Attn Spec Attenuation (dB) -20 Pass Band Transition Band -0.1 -0.2 Attenuation (dB) -40 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.01 0.02 0.03 Frequency D029 Figure 104. Divide-by-9 Filter Response 0.04 0.05 D030 Figure 105. Divide-by-9 Filter Response (Zoomed) 8.3.4.3.5 Divide-by-10 Peak-to-peak pass-band ripple: approximately 0.39 dB 0 0 Pass Band Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.01 D029 Figure 106. Divide-by-10 Filter Response 0.02 0.03 Frequency 0.04 0.05 D032 Figure 107. Divide-by-10 Filter Response (Zoomed) 8.3.4.3.6 Divide-by-12 Peak-to-peak pass-band ripple: approximately 0.36 dB 0 0 Passband Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 Figure 108. Divide-by-12 Filter Response 42 0 0.005 D033 0.01 0.015 0.02 0.025 Frequency 0.03 0.035 0.04 D034 Figure 109. Divide-by-12 Filter Response (Zoomed) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.3.4.3.7 Divide-by-16 Peak-to-peak pass-band ripple: approximately 0.29 dB 0 0 Pass Band Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.005 0.01 D035 Figure 110. Divide-by-16 Filter Response 0.015 0.02 0.025 Frequency 0.03 0.035 0.04 D036 Figure 111. Divide-by-16 Filter Response (Zoomed) 8.3.4.3.8 Divide-by-18 Peak-to-peak pass-band ripple: approximately 0.33 dB 0 0 Pass Band Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.005 D037 Figure 112. Divide-by-18 Filter Response 0.01 0.015 Frequency 0.02 0.025 D038 Figure 113. Divide-by-18 Filter Response (Zoomed) 8.3.4.3.9 Divide-by-20 Peak-to-peak pass-band ripple: approximately 0.32 dB 0 0 Pass Band Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -60 -80 -0.4 -0.6 -0.8 -1 -100 -1.2 -120 -1.4 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.005 D039 Figure 114. Divide-by-20 Filter Response 0.01 0.015 Frequency 0.02 0.025 D040 Figure 115. Divide-by-20 Filter Response (Zoomed) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 43 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.3.4.3.10 Divide-by-24 Peak-to-peak pass-band ripple: approximately 0.30 dB 0 0 Pass Band Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -60 -80 -0.4 -0.6 -0.8 -1 -100 -1.2 -120 -1.4 0 0.1 0.2 0.3 Frequency 0.4 0.5 0 0.005 D041 Figure 116. Divide-by-24 Filter Response 0.01 0.015 Frequency 0.02 0.025 D042 Figure 117. Divide-by-24 Filter Response (Zoomed) 8.3.4.3.11 Divide-by-32 Peak-to-peak pass-band ripple: approximately 0.24 dB 0 0 Pass Band Attn Spec Transition Band Alias Band Pass Band Transition Band -0.2 -40 Attenuation (dB) Attenuation (dB) -20 -0.1 -60 -80 -0.3 -0.4 -0.5 -0.6 -0.7 -0.8 -100 -0.9 -120 -1 0 0.1 0.2 0.3 Frequency 0.4 0.5 Figure 118. Divide-by-32 Filter Response 44 0 D043 0.005 0.01 Frequency 0.015 0.02 D044 Figure 119. Divide-by-32 Filter Response (Zoomed) Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.3.4.3.12 Latency with Decimation Options Device latency in 12-bit bypass mode (with LMFS = 8224) is 424 clock cycles. When the DDC option is used, latency increases as a result of decimation filters, as described in Table 5. Table 5. Latency with different Decimation options DECIMATION OPTION TOTAL LATENCY, DEVICE CLOCK CYCLES Divide-by-4 516 Divide-by-6 746 Divide-by-8 621 Divide-by-9 763.5 Divide-by-10 811 Divide-by-12 897 Divide-by-16 1045 Divide-by-18 1164 Divide-by-20 1256 Divide-by-24 1443 Divide-by-32 1773 8.3.4.4 Digital Multiplexer (MUX) The ADC32RF8x supports a mode where the output data of the ADC channel A can be routed internally to the digital blocks of both channel A and channel B. The ADC channel B can be powered down as shown in Figure 120. In this manner, the ADC32RF8x can be configured as a single-channel ADC with up to four independent DDC chains or two wideband DDC chains. All decimation filters and JESD204B format configurations are identical to the two ADC channel operation. N ADC A To JESD ChA N NCO NCO N ADC B To JESD ChB N NCO NCO Figure 120. Digital Multiplexer Option 8.3.4.5 Numerically-Controlled Oscillators (NCOs) and Mixers The ADC32RF8x is equipped with three independent, complex NCOs per ADC channel. The oscillator generates a complex exponential sequence, as shown in Equation 2. x[n] = e–jωn where • frequency (ω) is specified as a signed number by the 16-bit register setting Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 (2) 45 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com The complex exponential sequence is multiplied by the real input from the ADC to mix the desired carrier down to 0 Hz. Each ADC channel has two DDCs. The first DDC has three NCOs and the second DDC has one NCO. The first DDC can dynamically select one of the three NCOs based on the GPIO pin or SPI selection. In wide-bandwidth mode (lower decimation factors, for example, 4 and 6), there can only be one DDC for each ADC channel. The NCO frequencies can be programmed independently through the DDCx, NCO[4:1], and the MSB and LSB register settings. The NCO frequency setting is set by the 16-bit register value given by Equation 3: DDCxNCOy u fS fNCO 216 where • • x = 0, 1 y = 1 to 4 (3) For example: If fS = 2949.12 MSPS, then the NCO register setting = 38230 (decimal). Thus, fNCO is defined by Equation 4: 2949.12 MSPS fNCO 38230 u 216 1720.35 MHz (4) Any register setting changes that occur after the JESD204B interface is operational results in a non-deterministic NCO phase. If a deterministic phase is required, the JESD204B interface must be reinitialized after changing the register setting. 8.3.5 NCO Switching The first DDC (DDC0) on each ADC channel provides three different NCOs that can be used for phase-coherent frequency hopping. This feature is available in both single-band and dual-band mode, but only affects DDC0. The NCOs can be switched through an SPI control or by using the GPIO pins with the register configurations shown in Table 6 for channel A (50xxh) and channel B (58Xxh). The assignment of which GPIO pin to use for INSEL0 and INSEL1 is done based on Table 7, using registers 5438h and 5C38h. The NCO selection is done based on the logic selection on the GPIO pins; see Table 8 and Figure 121. Table 6. NCO Register Configurations REGISTER ADDRESS DESCRIPTION NCO CONTROL THROUGH GPIO PINS NCO SEL pin 500Fh, 580Fh Selects the NCO control through the SPI (default) or a GPIO pin. INSEL0, INSEL1 5438h, 5C38h Selects which two GPIO pins are used to control the NCO. NCO CONTROL THROUGH SPI CONTROL NCO SEL pin 500Fh, 580Fh Selects the NCO control through the SPI (default) or a GPIO pin. NCO SEL 5010h, 5810h Selects which NCO to use for DDC0. Table 7. GPIO Pin Assignment 46 INSELx[1:0] (Where x = 0 or 1) GPIO PIN SELECTED 00 GPIO4 01 GPIO1 10 GPIO3 11 GPIO2 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Table 8. NCO Selection NCO SEL[1] NCO SEL[0] NCO SELECTED 0 0 NCO1 0 1 NCO2 1 0 NCO3 1 1 n/a GPIO4 0 GPIO1 1 GPIO3 2 GPIO2 3 NCO1 0 NCO2 1 NCO3 2 N/A 3 NCO SEL[1:0] 0 1 INSEL1[1:0] GPIO4 0 GPIO1 1 GPIO3 2 GPIO2 3 NCO for DDC1 of channel x NCO SEL PIN INSEL0[1:0] Figure 121. NCO Switching from GPIO and SPI 8.3.6 SerDes Transmitter Interface Each 12.3-Gbps serializer, deserializer (SerDes) LVDS transmitter output requires ac-coupling between the transmitter and receiver. Terminate the differential pair with 100-Ω resistance (that is, two 50-Ω resistors) as close to the receiving device as possible to avoid unwanted reflections and signal degradation, as shown in Figure 122. 0.1 PF DA[3:0]P, DB[3:0]P R t = ZO Transmission Line, ZO VCM Receiver R t = ZO DA[3:0]M, DB[3:0]M 0.1 PF Figure 122. External Serial JESD204B Interface Connection Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 47 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.3.7 Eye Diagrams Figure 123 and Figure 124 show the serial output eye diagrams of the ADC32RF8x at 5.0 Gbps and 12 Gbps against the JESD204B mask. Figure 123. Data Eye at 5 Gbps Figure 124. Data Eye at 12 Gbps 8.3.8 Alarm Outputs: Power Detectors for AGC Support The GPIO pins can be configured as alarm outputs for channels A and B. The ADC32RF8x supports three different power detectors (an absolute peak power detector, crossing detector, and RMS power detector) as well as fast overrange from the ADC. The power detectors operate off the full-rate ADC output prior to the decimation filters. 8.3.8.1 Absolute Peak Power Detector In this detector mode, the peak is computed over eight samples of the ADC output. Next, the peak for a block of N samples (N × S`) is computed over a programmable block length and then compared against a threshold to either set or reset the peak detector output (Figure 125 and Figure 126). There are two sets of thresholds and each set has two thresholds for hysteresis. The programmable DWELL-time counter is used for clearing the block detector alarm output. BLKTHHH, BLKTHHL, BLKTHLH, BLKTHLL BLKPKDET N = [1..216] Output of ADC fS Peak over 8 Samples S` fS / 8 Block: Peak over N Samples (S`) fS / (8N) >THHigh >THLow Hysteresis and DWELL BLKPKDETH >TLHigh >TLLow Hysteresis and DWELL BLKPKDETL DWELL Figure 125. Peak Power Detector Implementation 48 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 DWELL Time THHH THHL BLKPKDET Figure 126. Peak Power Detector Timing Diagram Table 9 shows the register configurations required to set up the absolute peak power detector. The detector operates in the fS / 8 clock domain; one peak sample is calculated over eight actual samples. The automatic gain control (AGC) modes can be configured separately for channel A (54xxh) and channel B (5Cxxh), although some registers are common in 54xxh (such as the GPIO pin selection). Table 9. Registers Required for the Peak Power Detector REGISTER ADDRESS PKDET EN 5400, 5C00h BLKPKDET 5401h, 5402h, 5403h, 5C01h, 5C02h, 5C03h Sets the block length N of number of samples (S`). Number of actual ADC samples is 8X this value: N is 17 bits: 1 to 216. BLKTHHH, BLKTHHL, BLKTHLH, BLKTHLL 5407h, 5408h, 5409h, 540Ah, 5C07h, 5C08h, 5C09h, 5C0Ah Sets the different thresholds for the hysteresis function values from 0 to 256 (where 256 is equivalent to the peak amplitude). For example: if BLKTHHH is to –2 dBFS from peak, 10(–2 / 20) × 256 = 203, then set 5407h and 5C07h = CBh. DWELL 540Bh, 540Ch, 5C0Bh, 5C0Ch When the computed block peak crosses the upper thresholds BLKTHHH or BLKTHLH, the peak detector output flags are set. In order to be reset, the computed block peak must remain continuously lower than the lower threshold (BLKTHHL or BLKTHLL) for the period specified by the DWELL value. This threshold is 16 bits and is specified in terms of fS / 8 clock cycles. OUTSEL GPIO[4:1] 5432h, 5433h, 5434h, 5435h Connects the BLKPKDETH, BLKPKDETL alarms to the GPIO pins; common register. IODIR 5437h RESET AGC 542Bh, 5C2Bh DESCRIPTION Enables peak detector Selects the direction for the four GPIO pins; common register. After configuration, reset the AGC module to start operation. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 49 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.3.8.2 Crossing Detector In this detector mode the peak is computed over eight samples of the ADC output. Next, the peak for a block of N samples (N × S`) is computed over a programmable block length and then the peak is compared against two sets of programmable thresholds (with hysteresis). The crossing detector counts how many fS / 8 clock cycles that the block detector outputs are set high over a programmable time period and compares the counter value against the programmable thresholds. The alarm outputs are updated at the end of the time period, routed to the GPIO pins, and held in that state through the next cycle, as shown in Figure 127 and Figure 128. Alternatively, a 2-bit format can be used but (because the ADC32RF8x has four GPIO pins available) this feature uses all four pins for a single channel. BLKPKDET N = [1..216] ADC Output fS Peak Over 8 Samples S` fS/8 Block: Peak Over N Samples (S`) BLKTHHH, BLKTHHL, BLKTHLH, BLKTHLL >THHigh >THLow Hysteresis fS/(8N) and DWELL >TLHigh >TLLow Hysteresis and DWELL DWELL FILT0LP SEL Time Constant 1 or 2-Bit Mode 2-Bit Mode 10: High 00: Mid 01: Low IIR LPF >FIL0THH >FIL0THL IIR PK DET0 IIR LPF >FIL1THH >FIL1THL IIR PK DET1 Time Constant 1 or 2-Bit Mode 1-Bit Mode With Hysteresis and Dwell 1: High 0: Low BLKPKDETH Combine 2-Bit Mode BLKPKDETHL BLKPKDETL Figure 127. Crossing Detector Implementation Crossing Detector Time Period THHH THHL BLKPKDET Crossing Detector Counter Threshold Crossing Detector Counter IIR PK DET Figure 128. Crossing Detector Timing Diagram 50 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Table 10 shows the register configurations required to set up the crossing detector. The detector operates in the fS / 8 clock domain. The AGC modes can be configured separately for channel A (54xxh) and channel B (5Cxxh), although some registers are common in 54xxh (such as the GPIO pin selection). Table 10. Registers Required for the Crossing Detector Operation REGISTER ADDRESS PKDET EN 5400h, 5C00h BLKPKDET 5401h, 5402h, 5403h, 5C01h, 5C02h, 5C03h Sets the block length N of number of samples (S`). Number of actual ADC samples is 8X this value: N is 17 bits: 1 to 216. BLKTHHH, BLKTHHL, BLKTHLH, BLKTHLL 5407h, 5408h, 5409h, 540Ah, 5C07h, 5C08h, 5C09h, 5C0Ah Sets the different thresholds for the hysteresis function values from 0 to 256 (where 256 is equivalent to the peak amplitude). For example: if BLKTHHH is to –2 dBFS from peak, 10(–2 / 20) × 256 = 203, then set 5407h and 5C07h = CBh. FILT0LPSEL 540Dh, 5C0Dh Select block detector output or 2-bit output mode as the input to the interrupt identification register (IIR) filter. TIMECONST 540Eh, 540Fh, 5C0Eh, 5C0Fh Sets the crossing detector time period for N = 0 to 15 as 2N × fS / 8 clock cycles. The maximum time period is 32768 × fS / 8 clock cycles (approximately 87 µs at 3 GSPS). FIL0THH, FIL0THL, FIL1THH, FIL1THL 540Fh-5412h, 5C0Fh5C12h, 5416h-5419h, 5C16h-5C19h Comparison thresholds for the crossing detector counter. These thresholds are 16bit thresholds in 2.14-signed notation. A value of 1 (4000h) corresponds to 100% crossings, a value of 0.125 (0800h) corresponds to 12.5% crossings. DWELLIIR 541Dh, 541Eh, 5C1Dh, 5C1Eh DWELL counter for the IIR filter hysteresis. IIR0 2BIT EN, IIR1 2BIT EN 5413h, 54114h, 5C13h, 5C114h OUTSEL GPIO[4:1] 5432h, 5433h, 5434h, 5435h IODIR 5437h RESET AGC 542Bh, 5C2Bh DESCRIPTION Enables peak detector Enables 2-bit output format for the crossing detector. Connects the IIRPKDET0, IIRPKDET1 alarms to the GPIO pins; common register. Selects the direction for the four GPIO pins; common register. After configuration, reset the AGC module to start operation. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 51 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.3.8.3 RMS Power Detector In this detector mode the peak power is computed for a block of N samples over a programmable block length and then compared against two sets of programmable thresholds (with hysteresis). The RMS power detector circuit provides configuration options, as shown in Figure 129. The RMS power value (1 or 2 bit) can be output onto the GPIO pins. In 2-bit output mode, two different thresholds are used whereas the 1-bit output provides one threshold together with hysteresis. M = [1..216] 2-Bit Mode 10: High 00: Mid 01: Low 2-M Output of ADC fS Randomly Pick 1 Out of 8 Samples fS/8 ^2 Accumulate Over 2^M Inputs >THHigh >THLow Hysteresis 1 or 2-Bit Mode PWR DET 1-Bit Mode With Hysteresis 1: High 0: Low Figure 129. RMS Power Detector Implementation Table 11 shows the register configurations required to set up the RMS power detector. The detector operates in the fS / 8 clock domain. The AGC modes can be configured separately for channel A (54xxh) and channel B (5Cxxh), although some registers are common in 54xxh (such as the GPIO pin selection). Table 11. Registers Required for Using the RMS Power Detector Feature 52 REGISTER ADDRESS RMSDET EN 5420h, 5C20h Enables RMS detector DESCRIPTION PWRDETACCU 5421h, 5C21h Programs the block length to be used for RMS power computation. The block length is defined in terms of fS / 8 clocks. The block length can be programmed as 2M with M = 0 to 16. PWRDETH, PWRDETL 5422h, 5423h, 5424h, 5425h, 5C22h, 5C23h, 5C24h, 5C25h RMS2BIT EN 5427h, 5C27h Enables 2-bit output format for the RMS detector output. OUTSEL GPIO[4:1] 5432h, 5433h, 5434h, 5435h Connects the PWRDET alarms to the GPIO pins; common register. IODIR 5437h RESET AGC 542Bh, 5C2Bh The computed average power is compared against these high and low thresholds. One LSB of the thresholds represents 1 / 216. For example: is PWRDETH is set to –14 dBFS from peak, [10(–14 / 20)]2 × 216 = 2609, then set 5422h, 5423h, 5C22h, 5C23h = 0A31h. Selects the direction for the four GPIO pins; common register. After configuration, reset the AGC module to start operation. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.3.8.4 GPIO AGC MUX The GPIO pins can be used to control the NCO in wideband DDC mode or as alarm outputs for channel A and B. The GPIO pins can be configured through the SPI control to output the alarm from the peak power (1 bit), crossing detector (1 or 2 bit), faster overrange, or the RMS power output, as shown in Figure 130. The programmable output MUX allows connecting any signal (including the NCO control) to any of the four GPIO pins. These pins can be configured as outputs (AGC alarm) or inputs (NCO control) through SPI programming. IIR PK DET0 [2] IIR PK DET1 [2] BLKPKDETH [1] To GPIO AGC Pins BLKPKDETL [1] FOVR PWR DET [2] OUTSEL GPIO[4:1] Figure 130. GPIO Output MUX Implementation 8.3.9 Power-Down Mode The ADC32RF8x provides a lot of configurability for the power-down mode. Power-down can be enabled using the PDN pin or the SPI register writes. 8.3.10 ADC Test Pattern The ADC32RF8x provides several different options to output test patterns instead of the actual output data of the ADC in order to simplify the serial interface and system debug of the JESD204B digital interface link. The output data path is shown in Figure 131. Digital Block ADC Section ADC Interleaving Engine Transport Layer DDC Decimation Filter Block 12-bit RAMP PHY Layer Data Mapping Frame Construction Scrambler 1 + x14 + x15 JESD204B Long Transport Layer Test Pattern Test Patterns Link Layer 8b, 10b Encoding Serializer JESD204B Link Layer Test Pattern Figure 131. Test Pattern Generator Implementation 8.3.10.1 Digital Block The ADC test pattern replaces the actual output data of the ADC. The test patterns listed in Table 12 are available when the DDC is enabled and located in register 37h of the decimation filter page. When programmed, the test patterns are output for each converter (M) stream. The number of converter streams per channel increases by 2 when complex (I, Q) output or dual-band DDC is selected. The test patterns can be synchronized for both ADC channels using the SYSREF signal. Additionally, a 12-bit test pattern is also available. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 53 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com NOTE The number of converters increases in dual-band DDC mode and with a complex output. Table 12. Test Pattern Options (Register 37h and 38h in Decimation Filter Page) BIT Address 37h, 38h (bits 7-0) NAME TEST PATTERN DATA, TEST PATTERN DATA, TEST PATTERN DATA, TEST PATTERN DATA, DEFAULT DESCRIPTION 0000 Test pattern outputs onI and Q stream of channel A and B when DDC option is chosen. 0000 = Normal operation using ADC output data 0001 = Outputs all 0s 0010 = Outputs all 1s 0011 = Outputs toggle pattern: output data are an alternating sequence of 10101010101010 and 01010101010101 0100 = Output digital ramp: output data increment by one LSB every clock cycle from code 0 to 65535 0110 = Single pattern: output data are a custom pattern 1 (75h and 76h) 0111 Double pattern: output data alternate between custom pattern 1 and custom pattern 2 1000 = Deskew pattern: output data are AAAAh 1001 = SYNC pattern: output data are FFFFh DDC1 IDDC1 QDDC2 IDDC2 Q- 8.3.10.2 Transport Layer The transport layer maps the ADC output data into 8-bit octets and constructs the JESD204B frames using the LMFS parameters. Tail bits or 0's are added when needed. Alternatively, the JESD204B long transport layer test pattern can be substituted instead of the ADC data with the JESD frame, as shown in Table 13. Table 13. Transport Layer Test Mode EN (Register 01h) BIT 4 NAME TESTMODE EN DEFAULT DESCRIPTION 0 Generates long transport layer test pattern mode according to section 5.1.6.3 of the JESD204B specification. 0 = Test mode disabled 1 = Test mode disabled 8.3.10.3 Link Layer The link layer contains the scrambler and the 8b, 10b encoding of any data passed on from the transport layer. Additionally, the link layer also handles the initial lane alignment sequence that can be manually restarted. The link layer test patterns are intended for testing the quality of the link (jitter testing and so forth). The test patterns do not pass through the 8b, 10b encoder and contain the options listed in Table 14. Table 14. Link Layer Test Mode (Register 03h) BIT 7-5 NAME LINK LAYER TESTMODE DEFAULT DESCRIPTION 000 Generates a pattern according to section 5.3.3.8.2 of the JESD204B document. 000 = Normal ADC data 001 = D21.5 (high-frequency jitter pattern) 010 = K28.5 (mixed-frequency jitter pattern) 011 = Repeat the initial lane alignment (generates a K28.5 character and repeats lane alignment sequences continuously) 100 = 12-octet random pattern (RPAT) jitter pattern Furthermore, a 215 pseudo-random binary sequence (PRBS) can be enabled by setting up a custom test pattern (AAAAh) in the ADC section and running AAAAh through the 8b, 10b encoder with scrambling enabled. 54 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.4 Device Functional Modes 8.4.1 Device Configuration The ADC32RF8x can be configured using a serial programming interface, as described in the Serial Interface section. In addition, the device has one dedicated parallel pin (PDN) for controlling the power-down modes. 8.4.2 JESD204B Interface The ADC32RF8x supports device subclass 1 with a maximum output data rate of 12.5 Gbps for each serial transmitter. An external SYSREF signal is used to align all internal clock phases and the local multiframe clock to a specific sampling clock edge. This alignment allows synchronization of multiple devices in a system and minimizes timing and alignment uncertainty. The SYNCB input is used to control the JESD204B SerDes blocks, as shown in Figure 132. Depending on the ADC sampling rate, the JESD204B output interface can be operated with one, two, or four lanes per ADC channel. The JESD204B setup and configuration of the frame assembly parameters is controlled through the SPI interface. SysRef SYNCB INA JESD 204B JESD204B D[3:0] INB JESD 204B JESD204B D[3:0] Sample Clock Copyright © 2016, Texas Instruments Incorporated Figure 132. JESD Signal Overview The JESD204B transmitter block consists of the transport layer, the data scrambler, and the link layer, as shown in Figure 133. The transport layer maps the ADC output data into the selected JESD204B frame data format and manages if the ADC output data or test patterns are transmitted. The link layer performs the 8b, 10b data encoding as well as the synchronization and initial lane alignment using the SYNC input signal. Optionally, data from the transport layer can be scrambled. JESD204B Block Transport Layer Link Layer Frame Data Mapping Scrambler 1+x14+x15 Test Patterns 8b, 10b Encoding Comma Characters Initial Lane Alignment D[3:0] SYNCB Copyright © 2016, Texas Instruments Incorporated Figure 133. JESD Digital Block Implementation Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 55 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Device Functional Modes (continued) 8.4.2.1 JESD204B Initial Lane Alignment (ILA) The receiving device starts the initial lane alignment process by deasserting the SYNCB signal. The SYNCB signal can be issued using the SYNCB input pins or by setting the proper SPI bits. When a logic low is detected on the SYNCB input, the ADC32RF8x starts transmitting comma (K28.5) characters to establish the code group synchronization, as shown in Figure 134. When synchronization completes, the receiving device reasserts the SYNCB signal and the ADC32RF8x starts the initial lane alignment sequence with the next local multiframe clock boundary. The ADC32RF8x transmits four multiframes, each containing K frames (K is SPI programmable). Each of the multiframes contains the frame start and end symbols. The second multiframe also contains the JESD204 link configuration data. SYSREF LMFC Clock LMFC Boundary Multi Frame SYNCb Transmit Data xxx K28.5 Code Group Synchronization K28.5 ILA ILA Initial Lane Alignment DATA DATA Data Transmission Figure 134. JESD Internal Timing Information 8.4.2.2 JESD204B Frame Assembly The JESD204B standard defines the following parameters: • F is the number of octets per frame clock period • L is the number of lanes per link • M is the number of converters for the device • S is the number of samples per frame 56 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Device Functional Modes (continued) 8.4.2.3 JESD204B Frame Assembly with Decimation (Single-Band DDC): Complex Output Table 15 lists the available JESD204B interface formats and valid ranges for the ADC32RF8x with decimation (single-band DDC) when using a complex output format. The ranges are limited by the SerDes line rate and the maximum ADC sample frequency. The sample alignment on the different lanes is shown in Table 16. Table 15. JESD Mode Options: Single-Band Complex Output DECIMATION SETTING (Complex) Divide-by-4 Divide-by-6 Divide-by-8 Divide-by-9 Divide-by-10 Divide-by-12 Divide-by-16 Divide-by-18 NUMBER OF ACTIVE DDCS 1 per channel 1 per channel 1 per channel 1 per channel 1 per channel 1 per channel 1 per channel 1 per channel RATIO [fSerDes / fCLK (Gbps / GSPS)] L M F S PLL MODE JESD MODE0 JESD MODE1 JESD MODE2 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 4 4 2 1 20X 1 0 0 2 4 4 1 40X 2 0 0 5 4 4 2 1 20X 1 0 0 2.22 2 4 4 1 40X 2 0 0 4.44 4 4 2 1 20X 1 0 0 2 2 4 4 1 40X 2 0 0 4 4 4 2 1 20X 1 0 0 1.67 2 4 4 1 40X 2 0 0 3.33 4 4 2 1 20X 1 0 0 1.25 2 4 4 1 40X 2 0 0 2.5 4 4 2 1 20X 1 0 0 1.11 2 4 4 1 40X 2 0 0 2.22 4 4 2 1 20X 1 0 0 1 2 4 4 1 40X 2 0 0 2 2.5 5 1.67 3.33 2.5 Divide-by-20 1 per channel Divide-by-24 1 per channel 2 4 4 1 20X 1 0 0 1.67 Divide-by-32 1 per channel 2 4 4 1 40X 2 0 0 1.25 Table 16. JESD Sample Lane Alignments: Single-Band Complex Output OUTPUT LANE LMFS = 8411 DA0 AI0 [15:8] AI0 [15:8] AI0 [7:0] AI0 [15:8] AI0 [7:0] DA1 AI0 [7:0] AI1 [15:8] AI1 [7:0] AQ0 [15:8] AQ0 [7:0] DA2 AQ0 [15:8] AQ0 [15:8] AQ0 [7:0] DA3 AQ0 [7:0] AQ1 [15:8] AQ1 [7:0] DB0 BI0 [15:8] BI0 [15:8] BI0 [7:0] BI0 [15:8] BI0 [7:0] DB1 BI0 [7:0] BI1 [15:8] BI1 [7:0] BQ0 [15:8] BQ0 [7:0] DB2 BQ0 [15:8] BQ0 [15:8 BQ0 [7:0] DB3 BQ0 [7:0] BQ1 [15:8] BQ1 [7:0] LMFS = 8422 LMFS = 4421 20X LMFS = 4421 40X LMFS = 4442 LMFS = 2441 AI0 [15:8] AI0 [7:0] AI0 [15:8] AI0 [7:0] AI1 [15:8] AI1 [7:0] AQ0 [15:8] AQ0 [7:0] AQ0 [15:8] AQ0 [7:0] AQ1 [15:8] AQ1 [7:0] BI0 [15:8] BI0 [7:0] BI0 [15:8] BI0 [7:0] BI1 [15:8] BI1 [7:0] BQ0 [15:8] BQ0 [7:0] BQ0 [15:8] BQ0 [7:0] BQ1 [15:8] BQ1 [7:0] AI0 [15:8] AI0 [7:0] AQ0 [15:8] AQ0 [7:0] BI0 [15:8] BI0 [7:0] BQ0 [15:8] BQ0 [7:0] Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 57 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.4.2.4 JESD204B Frame Assembly with Decimation (Single-Band DDC): Real Output Table 17 lists the available JESD204B formats and valid ranges for the ADC32RF8x with decimation (singleband DDC) when using real output format. The ranges are limited by the SerDes line rate and the maximum ADC sample frequency. The sample alignment on the different lanes is shown in Table 18. Table 17. JESD Mode Options: Single-Band Real Output (Wide Bandwidth) DECIMATION SETTING (Complex) NUMBER OF ACTIVE DDCS Divide-by-4 (Divide-by-2 real) 1 per channel Divide-by-6 (Divide-by-3 real) 1 per channel L M F S PLL MODE JESD MODE0 JESD MODE1 JESD MODE2 RATIO [fSerDes / fCLK (Gbps / GSPS)] 8 2 2 4 20X 1 0 0 2.5 4 2 4 4 40X 2 0 0 4 2 1 1 40X 0 0 1 8 2 2 4 20X 1 0 0 4 2 4 4 40X 2 0 0 4 2 1 1 40X 0 0 1 5 1.67 3.33 Table 18. JESD Sample Lane Alignment: Single-Band Real Output (Wide Bandwidth) OUTPUT LANE 58 LMFS = 8224 LMFS = 4244 LMFS = 4211 DA0 A0[15:8] A0[7:0] DA1 A1[15:8] A1[7:0] A0[15:8] A0[7:0] A1[15:8] A1[7:0] A0[15:8] DA2 A2[15:8] A2[7:0] A2[15:8] A2[7:0] A3[15:8] A3[7:0] A0[7:0] DA3 A3[15:8] A3[7:0] DB0 B0[15:8] B0[7:0] DB1 B1[15:8] B1[7:0] B0[15:8] B0[7:0] B1[15:8] B1[7:0] B0[15:8] DB2 B2[15:8] B2[7:0] B0[15:8] B2[7:0] B3[15:8] B3[7:0] B0[7:0] DB3 B3[15:8] B3[7:0] Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.4.2.5 JESD204B Frame Assembly with Decimation (Single-Band DDC): Real Output Table 19 lists the available JESD204B formats and valid ranges for the ADC32RF8x with decimation (dual-band DDC) when using a complex output format. The sample alignment on the different lanes is shown in Table 20. Table 19. JESD Mode Options: Single-Band Real Output DECIMATION SETTING (Complex) NUMBER OF ACTIVE DDCS Divide-by-8 (Divide-by-4 real) 1 per channel Divide-by-9 (Divide-by-4.5 real) Divide-by-10 (Divide-by-5 real) 1 per channel 1 per channel Divide-by-12 (Divide-by-6 real) 1 per channel Divide-by-16 (Divide-by-8 real) 1 per channel Divide-by-18 (Divide-by-9 real) 1 per channel Divide-by-20 (Divide-by-10 real) 1 per channel Divide-by-24 (Divide-by-12 real) 1 per channel Divide-by-32 (Divide-by-16 real) 1 per channel L M F S PLL MODE JESD MODE0 JESD MODE1 JESD MODE2 4 2 1 1 20X 1 1 0 4 2 2 2 20X 1 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 4 2 1 1 20X 1 1 0 4 2 2 2 20X 1 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 4 2 1 1 20X 1 1 0 4 2 2 2 20X 1 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 4 2 1 1 20X 1 1 0 4 2 2 2 20X 1 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 4 2 1 1 20X 1 1 0 4 2 2 2 20X 1 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 4 2 1 1 20X 1 1 0 4 2 2 2 20X 1 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 4 2 1 1 20X 1 1 0 4 2 2 2 20X 1 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 2 2 2 1 40X 0 0 1 2 2 4 2 40X 2 0 0 RATIO [fSerDes / fCLK (Gbps / GSPS)] 2.5 5 2.22 4.44 2 4 1.67 3.33 1.25 2.5 1.11 2.22 1 2 1.67 1.25 Table 20. JESD Sample Lane Assignment: Single-Band Real Output OUTPUT LANE LMFS = 4211 DA0 A0[15:8] A0[15:8] A0[7:0] DA1 A0[7:0] A1[15:8] A1[7:0] DB0 B0[15:8] B0[15:8] B0[7:0] DB1 B0[7:0] B1[15:8] B1[7:0] LMFS = 4222 LMFS = 2221 LMFS = 2242 A0 [15:8] A0[7:0] A0[15:8] A0[7:0] A1[15:8] A1[7:0] B0[15:8] B0[7:0] B0[15:8] B0[7:0] B1[15:8] B1[7:0] Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 59 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.4.2.6 JESD204B Frame Assembly with Decimation (Dual-Band DDC): Complex Output Table 21 lists the available JESD204B formats and valid ranges for the ADC32RF8x with decimation (dual-band DDC) when using a complex output format. The ranges are limited by the SerDes line rate and the maximum ADC sample frequency. The sample alignment on the different lanes is shown in Table 22. Table 21. JESD Mode Options: Dual-Band Complex Output DECIMATION SETTING (Complex) NUMBER OF ACTIVE DDCS Divide-by-8 2 per channel Divide-by-9 2 per channel Divide-by-10 2 per channel Divide-by-12 2 per channel Divide-by-16 Divide-by-18 2 per channel 2 per channel L M F S PLL MODE JESD MODE0 JESD MODE1 JESD MODE2 RATIO [fSerDes / fCLK (Gbps / GSPS)] 8 8 2 1 20X 1 0 0 2.5 4 8 4 1 40X 2 0 0 5 8 8 2 1 20X 1 0 0 2.22 4 8 4 1 40X 2 0 0 4.44 8 8 2 1 20X 1 0 0 2 4 8 4 1 40X 2 0 0 4 8 8 2 1 20X 1 0 0 1.67 4 8 4 1 40X 2 0 0 3.33 8 8 2 1 20X 1 0 0 1.25 4 8 4 1 40X 2 0 0 2.5 8 8 2 1 20X 1 0 0 1.11 4 8 4 1 40X 2 0 0 2.22 8 8 2 1 20X 1 0 0 1 4 8 4 1 40X 2 0 0 2 Divide-by-20 2 per channel Divide-by-24 2 per channel 4 8 4 1 40X 2 0 0 1.67 Divide-by-32 2 per channel 4 8 4 1 40X 2 0 0 1.25 Table 22. JESD Sample Lane Assignment: Dual-Band Complex Output (1) OUTPUT LANE (1) 60 LMFS = 8821 LMFS = 4841 DA0 A10[15:8] A10[7:0] DA1 A1Q0[15:8] A1Q0[7:0] A1I0[15:8] A1I0[7:0] A1Q0[15:8] A1Q0[7:0] DA2 A2I0[15:8] A2I0[7:0] A2I0[15:8] A2I0[7:0] A2Q0[15:8] A2Q0[7:0] DA3 A2Q0[15:8] A2Q0[7:0] DB0 B1I0[15:8] B1I0[7:0] DB1 B1Q0[15:8] B1Q0[7:0] B1I0[15:8] B1I0[7:0] B1Q0[15:8] B1Q0[7:0] DB2 B2I0[15:8] B2I0[7:0] B2I0[15:8] B2I0[7:0] B2Q0[15:8] B2Q0[7:0] DB3 B2Q0[15:8] B2Q0[7:0] Blue and green shading indicates the two bands for channel A; yellow and orange shading indicates the two bands for channel B. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.4.2.7 JESD204B Frame Assembly with Decimation (Dual-Band DDC): Real Output Table 23 lists the available JESD204B formats and valid ranges for the ADC32RF8x with decimation (dual-band DDC) when using real output format. The ranges are limited by the SerDes line rate and the maximum ADC sample frequency. The sample alignment on the different lanes is shown in Table 24. Table 23. JESD Mode Options: Dual-Band Real Output DECIMATION SETTING (Complex) NUMBER OF ACTIVE DDCS Divide-by-8 (Divide-by-4 real) 2 per channel Divide-by-9 (Divide-by-4.5 real) Divide-by-10 (Divide-by-5 real) 2 per channel 2 per channel Divide-by-12 (Divide-by-6 real) 2 per channel Divide-by-16 (Divide-by-8 real) 2 per channel Divide-by-18 (Divide-by-9 real) 2 per channel Divide-by-20 (Divide-by-10 real) 2 per channel Divide-by-24 (Divide-by-12 real) 2 per channel Divide-by-32 (Divide-by-16 real) 2 per channel L M F S PLL MODE JESD MODE0 JESD MODE1 JESD MODE2 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 8 4 1 1 20X 1 1 0 8 4 2 2 20X 1 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 4 4 2 1 40X 0 0 1 4 4 4 2 40X 2 0 0 RATIO [fSerDes / fCLK (Gbps / GSPS)] 2.5 5 2.22 4.44 2 4 1.67 3.33 1.25 2.5 1.11 2.22 1 2 1.67 1.25 Table 24. JESD Sample Lane Assignment: Dual-Band Complex Output (1) (1) OUTPUT LANE LMFS = 8411 DA0 A10[15:8] A10[15:8] A10[7:0] DA1 A10[7:0] A11[15:8] A11[7:0] A10[15:8] A10[7:0] A10[15:8] A10[7:0] A11[15:8] A11[7:0] DA2 A20[15:8] A20[15:8] A20[7:0] A20[15:8] A20[7:0] A20[15:8] A20[7:0] A21[15:8] A21[7:0] DA3 A20[7:0] A21[15:8] A21[7:0] DB0 B10[15:8] B10[15:8] B10[7:0] DB1 B10[7:0] B11[15:8] B11[7:0] B10[15:8] B10[7:0] B10[15:8] B10[7:0] B11[15:8] B11[7:0] DB2 B20[15:8] B20[15:8] B20[7:0] B20[15:8] B20[7:0] B20[15:8] B20[7:0] B21[15:8] B21[7:0] DB3 B20[7:0] B21[15:8] B21[7:0] LMFS = 8422 LMFS = 4421 LMFS = 4442 Blue and green shading indicates the two bands for channel A; yellow and orange shading indicates the two bands for channel B. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 61 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.4.3 Serial Interface The ADC has a set of internal registers that can be accessed by the serial interface formed by the SEN (serial interface enable), SCLK (serial interface clock), and SDIN (serial interface data) pins. Serially shifting bits into the device is enabled when SEN is low. SDIN serial data are latched at every SCLK rising edge when SEN is active (low), as shown in Figure 135. The interface can function with SCLK frequencies from 20 MHz down to low speeds (of a few hertz) and also with a non-50% SCLK duty cycle, as shown in Table 25. The SPI access uses 24 bits consisting of eight register data bits, 12 register address bits, and four special bits to distinguish between read/write, page and register, and individual channel access, as described in Table 26. Register Address [11:0] SDIN R/W M P CH A11 A10 A9 A8 A7 A6 A5 A4 Register Data [7:0] A3 A2 A1 A0 D7 D6 tSCLK D5 D4 D3 D2 D1 D0 tDH tDSU SCLK tSLOADH tSLOADS SEN RESET Figure 135. SPI Timing Diagram Table 25. SPI Timing Information MIN TYP UNIT 20 MHz fSCLK SCLK frequency (equal to 1 / tSCLK) tSLOADS SEN to SCLK setup time 50 ns tSLOADH SCLK to SEN hold time 50 ns tDSU SDIN setup time 10 ns tDH SDIN hold time 10 tSDOUT Delay between SCLK falling edge to SDOUT 62 1 MAX Submit Documentation Feedback ns 10 ns Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Table 26. SPI Input Description SPI BIT DESCRIPTION OPTIONS R/W bit Read/write bit 0 = SPI write 1 = SPI read back M bit SPI bank access 0 = Analog SPI bank (master) 1 = All digital SPI banks (main digital, interleaving, decimation filter, JESD digital, and so forth) P bit JESD page selection bit 0 = Page access 1 = Register access CH bit SPI access for a specific channel of the JESD SPI bank 0 = Channel A 1 = Channel B ADDR[11:0] SPI address bits — DATA[7:0] SPI data bits — Figure 136 shows the SDOUT timing when data are read back from a register. Data are placed on the SDOUT bus at the SCLK falling edge so that the data can be latched at the SCLK rising edge by the external receiver. SCLK tSDOUT SDOUT Figure 136. SDOUT Timing Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 63 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.4.3.1 Serial Register Write: Analog Bank The internal register of the ADC32RF8x analog bank (Figure 137) can be programmed by: 1. Driving the SEN pin low. 2. Initiating a serial interface cycle selecting the page address of the register whose content must be written. To select the master page: write address 0012h with 04h. To select the ADC page: write address 0011h with FFh. 3. Writing the register content. When a page is selected, multiple registers located in the same page can be programmed. SDIN 0 0 0 R/W M P Register Address [11:0] 0 CH A11 A10 A9 A8 A7 A6 A5 A4 Register Data [7:0] A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 SCLK SEN RESET Figure 137. SPI Write Timing Diagram for the Analog Bank 8.4.3.2 Serial Register Readout: Analog Bank Contents of the registers located in the two pages of the analog bank (Figure 138) can be readback by: 1. Driving the SEN pin low. 2. Selecting the page address of the register whose content must be read. Master page: write address 0012h with 04h. ADC page: write address 0011h with FFh. 3. Setting the R/W bit to 1 and writing the address to be read back. 4. Reading back the register content on the SDOUT pin. When a page is selected, the contents of multiple registers located in same page can be readback. SDIN 1 0 0 R/W M P Register Address [11:0] 0 CH A11 A10 A9 A8 A7 A6 A5 A4 Register Data [7:0] = XX A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 D4 D3 D2 D1 D0 SCLK SEN RESET SDOUT D7 D6 D5 SDOUT [7:0] Figure 138. SPI Read Timing Diagram for the Analog Bank 64 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.4.3.3 Serial Register Write: Digital Bank The digital bank contains seven pages (Offset Corrector Page for channel A and B; Digital Gain Page for channel A and B; Main digital Page for channel A and B; and JESD Digital Page). The timing for the individual page selection is shown in Figure 139. The registers located in the pages of the digital bank can be programmed by: 1. Driving the SEN pin low. 2. Setting the M bit to 1 and specifying the page with with the desired register. There are seven pages in Digital Bank. These pages can be selected by appropriately programming register bits DIGITAL BANK PAGE SEL, located in addresses 002h, 003h, and 004h, using three consecutive SPI cycles. Addressing in a SPI cycle begins with 4xxx when selecting a page from digital bank because the M bit must be set to 1. – To select the offset corrector page channel A: write address 4004h with 61h, 4003h with 00h, and 4002h with 00h. – To select the offset corrector page channel B: write address 4004h with 61h, 4003h with 01h, and 4002h with 00h. – To select the digital gain page channel A: write address 4004h with 61h, 4003h with 00h, and 4002h with 05h. – To select the digital gain page channel B: write address 4004h with 61h, 4003h with 01h, and 4002h with 05h. – To select the main digital page channel A: write address 4004h with 68h, 4003h with 00h, and 4002h with 00h. – To select the main digital page channel B: write address 4004h with 68h, 4003h with 01h, and 4002h with 00h. – To select the JESD digital page: write address 4004h with 69h, 4003h with 00h, and 4002h with 00h. SDIN 0 1 0 R/W M P Register Address [11:0] 0 CH A11 A10 A9 A8 A7 A6 A5 A4 Register Data [7:0] A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 SCLK SEN RESET Figure 139. SPI Write Timing Diagram for Digital Bank Page Selection Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 65 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 3. Writing into the desired register by setting both the M bit and P bit to 1. Write register content. When a page is selected, multiple writes into the same page can be done. Addressing in an SPI cycle begins with 6xxx when selecting a page from the digital bank because the M bit must be set to 1, as shown in Figure 140. Note that the JESD digital page is common for both channels. The CH bit can be used to distinguish between two channels when programming registers in the JESD digital page. When CH = 0, registers are programmed for channel B; when CH = 1, registers are programmed for channel A. Thus, an SPI cycle to program registers for channel B begins with 6xxx and channel A begins with 7xxx. Register Address [11:0] SDIN 0 1 1 0 R/W M P CH A11 A10 A9 A8 A7 A6 A5 A4 Register Data [7:0] A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 SCLK SEN RESET Figure 140. SPI Write Timing Diagram for Digital Bank Register Write 66 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.4.3.4 Serial Register Readout: Digital Bank Readback of the register in one of the digital banks (as shown in Figure 141) can be accomplished by: 1. Driving the SEN pin low. 2. Selecting the page in the digital page: follow step 2 in the Serial Register Write: Digital Bank section. 3. Set the R/W, M, and P bits to 1, select channel A or channel B, and write the address to be read back. – JESD digital page: use the CH bit to select channel B (CH = 0) or channel A (CH = 1). 4. Read back the register content on the SDOUT pin. When a page is selected, multiple read backs from the same page can be done. SDIN 1 1 1 0 R/W M P CH Register Address [11:0] A11 A10 A9 A8 A7 A6 A5 Register Data [7:0] = XX A4 A3 A2 A1 A0 D7 D6 D5 D7 D6 D5 D4 D3 D2 D1 D0 D4 D3 D2 D1 D0 SCLK SEN RESET SDOUT SDOUT [7:0] Figure 141. SPI Read Timing Diagram for the Digital Bank 8.4.3.5 Serial Register Write: Decimation Filter and Power Detector Pages The decimation filter and power detector pages are special pages that accept direct addressing. The sampling clock and SYSREF signal are required to properly configure the decimation settings. Registers located in these pages can be programmed in one SPI cycle (Figure 142). 1. Drive the SEN pin low. 2. Directly write to the decimation filter or power detector pages. To program registers in these pages, set M = 1 and CH = 1. Additionally, address bit A[10] selects the decimation filter page (A[10] = 0) or the power detector page (A[10] = 1). Address bit A[11] selects channel A (A[11] = 0) or channel B (A[11] = 1). – Decimation filter page: write address 50xxh for channel A or 58xxh for channel B. – Power detector page: write address 54xxh for channel A or 5Cxxh for channel B. Example: Writing address 5001h with 02h selects the decimation filter page for channel A and programs decimation factor of divide-by-8 (complex output). SDIN 0 1 0 1 R/W M P CH 0/1 0/1 A11 A10 0 0 A9 A8 Register Address [7:0] A7 A6 A5 A4 A3 A2 A1 Register Data [7:0] A0 D7 D6 D5 D4 D3 D2 D1 D0 SCLK SEN RESET Figure 142. SPI Write Timing Diagram for the Decimation and Power Detector Pages Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 67 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5 Register Maps The ADC32RF8x contains two main SPI banks. The analog SPI bank provides access to the ADC core and the digital SPI bank controls the digital blocks (including the serial JESD interface). Figure 143 and Figure 144 provide a conceptual view of the SPI registers inside the ADC32RF8x. The analog SPI bank contains the master and ADC pages. The digital SPI bank is divided into multiple pages (the main digital, digital gain, decimation filter, JESD digital, and power detector pages). Register Address[11:0] SDIN R/W M P CH A11 A10 A9 A8 A7 A6 A5 A4 Register Data[7:0] A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 SPI Cycle SCLK SEN Initiate an SPI Cycle(1) R/W, M, P, CH, Bits Decoder M=0 Analog Bank(3) 1st SPI Cycle: Page Selection General Register (Address 00h, Keep M, P = 0) (Global Reset) Select Master Page (Address 12h, value 04h, Keep M, P = 0) Value 04h 2nd SPI Cycle: Page Programing M=1 Digital Bank Master Page (PDN, DC Coupling, SYSREF Delay, JESD Swing, initialization Registers) Keep M, P, R/W = 0 when writing to this page, and keep these bits = 1 when reading from this page Select ADC Page (Address 11h, Value FFh, Keep M, P = 0) General Register (Address 05h, Keep M = 1, P = 0) Select DIGITAL Bank Page (Address 04h, Address 03h, and Address 02h bits DIGITAL BANK PAGE SEL[23:0], Keep M = 1, P = 0) Value FFh ADC Page (Slow Speed Enable, Initialization Registers) Keep M, P, R/W = 0 when writing to this page, and keep these bits = 1 when reading from this page Value 610000h Value 610100h Offset Corr Page ChA (Offset Corr) Offset Corr Page ChB (Offset Corr) Keep M, P, CH bits = (1, 1, 0). R/W = 0 when writing to this page, and = 1 when reading from this page Keep M, P, CH bits = (1, 1, 0). R/W = 0 when writing to this page, and = 1 when reading from this page Value 610005h Value 610105h Digital Gain Page ChA (Digital Gain) Digital Gain Page ChB (Digital Gain) Keep M, P, CH bits = (1, 1, 0). R/W = 0 when writing to this page, and = 1 when reading from this page Keep M, P, CH bits = (1, 1, 0). R/W = 0 when writing to this page, and = 1 when reading from this page Value 680000h Value 680100h Value 690000h Main Digital Page for ChA Main Digital Page for ChB JESD Digital Page (JESD Configuration) (Nyquist Zone) (Nyquist Zone) Keep M, P, CH bits = (1, 1, 0). R/W = 0 when writing to this page, and = 1 when reading from this page Keep M, P, CH bits = (1, 1, 0). R/W = 0 when writing to this page, and = 1 when reading from this page Keep M, P = 1, CH = 0 for ChB, CH = 1 for ChA SPI cycle: These Pages are directly programmed in one SPI cycle. Direct Addressing Pages: DDC and Power Detector(2) Keep R/W = 0 when writing to this page, and = 1 when reading from this page (1) In general, SPI writes are completed in two steps. The first step is to access the necessary page. The second step is to program the desired register in that page. When a page is accessed, the registers in that page can be programmed multiple times. (2) Registers in the decimation filter page and the power detector page can be directly programmed in one SPI cycle. (3) The CH bit is a don't care bit and is recommended to be kept at 0. Figure 143. SPI Registers, Two-Step Addressing 68 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Register Maps (continued) Register Address[11:0] SDIN R/W M P CH A11 A10 A9 A8 A7 A6 A5 A4 Register Data[7:0] A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 SPI Cycle SCLK SEN Initiate an SPI Cycle R/W, M, P, CH, Bits Decoder M=0 Analog Bank 1st SPI Cycle: Page Selection Direct Addressing Pages M=1 Digital Bank M=1,P=0, CH=1, A11=1, A10=0 M=1,P=0, CH=1, A11=0, A10=0 SPI cycle(1): These pages are directly programmed in one SPI cycle. Addr 00h(3) Program Decimation Filter Page for ChA(2) (DDC modes) nd 2 SPI Cycle: Page Programing Addr 3Ah Addr 00h(3) Addr 00h(3) Program Decimation Filter Page for ChB(2) (DDC modes) Addr 3Ah M=1,P=0, CH=1, A11=1, A10=1 M=1,P=0, CH=1, A11=0, A10=1 Addr 00h(3) Program Power Detector Page for ChA(3) Addr 25h Program Power Detector Page for ChB(3) Addr 25h (1) Registers in the decimation filter page and the power detector page can be directly programmed in one SPI cycle. (2) To program registers in the decimation filter page, aet M = 1, CH = 1, A[10] = 0, and A[11] = 0 or 1 for channel A or B. Addressing begins at 50xx for channel A and 58xx for channel B. (3) To program registers in power detector page, set M = 1, CH = 1, A[10] = 1, and A[11] = 0 or 1 for channel A or B. Addressing begins at 54xx for channel A and 5Cxx for channel B. Figure 144. SPI Registers: Direct Addressing Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 69 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Register Maps (continued) Table 27 lists the register map for the ADC32RF8x. Table 27. Register Map REGISTER ADDRESS A[11:0] (Hex) REGISTER DATA 7 6 5 RESET 0 0 4 3 2 1 0 0 0 0 0 RESET 0 0 0 3 or 4 WIRE GENERAL REGISTERS 000 002 DIGITAL BANK PAGE SEL[7:0] 003 DIGITAL BANK PAGE SEL[15:8] 004 DIGITAL BANK PAGE SEL[23:16] 010 0 0 0 0 011 ADC PAGE SEL 0 0 0 0 0 MASTER PAGE SEL 0 0 020 0 0 0 PDN SYSREF 0 0 PDN CHB GLOBAL PDN 032 0 0 INCR CM IMPEDANCE 0 0 0 0 0 039 0 ALWAYS WRITE 1 0 ALWAYS WRITE 1 0 0 PDN CHB EN SYNC TERM DIS 03C 0 SYSREF DEL EN 0 0 0 0 03D 0 0 0 0 0 012 MASTER PAGE (M = 0) 05A SYSREF DEL[2:0] SYSREF DEL[4:3] JESD OUTPUT SWING 0 0 0 0 0 0 0 0 057 0 0 0 SEL SYSREF REG ASSERT SYSREF REG 058 0 0 SYNCB POL 0 0 0 0 0 03F 0 0 0 0 0 SLOW SP EN1 0 0 042 0 0 0 SLOW SP EN2 0 0 0 0 0 ALWAYS WRITE 1 0 0 DIS OFFSET CORR ALWAYS WRITE 1 0 0 ALWAYS WRITE 1 0 0 DIS OFFSET CORR ALWAYS WRITE 1 0 0 0 0 ADC PAGE (FFh, M = 0) Offset Corr Page Channel A (610000h, M = 1) 68 FREEZE OFFSET CORR Offset Corr Page Channel B (610100h, M = 1) 68 FREEZE OFFSET CORR Digital Gain Page Channel A (610005, M = 1) 0A6 70 0 Submit Documentation Feedback DIGITAL GAIN Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Register Maps (continued) Table 27. Register Map (continued) REGISTER ADDRESS A[11:0] (Hex) REGISTER DATA 7 6 5 4 0 0 0 3 2 1 0 0 DIG CORE RESET GBL Digital Gain Page Channel B (610105, M = 1) 0A6 0 DIGITAL GAIN Main Digital Page Channel A (680000h, M = 1) 000 0 0 0 0 0 0 0A2 0 0 0 0 NQ ZONE EN NYQUIST ZONE Main Digital Page Channel B (680001h, M = 1) 000 0 0 0 0 0 0A2 0 0 0 0 NQ ZONE EN 0 0 0 0 NYQUIST ZONE JESD DIGITAL PAGE (690000h, M = 1) 001 CTRL K 0 0 TESTMODE EN 002 SYNC REG SYNC REG EN 0 0 003 LINK LAYER TESTMODE LANE ALIGN LINK LAY RPAT LMFC MASK RESET JESD MODE1 0 0 0 0 0 0 006 SCRAMBLE EN 0 0 0 0 0 007 0 0 016 0 0 0 0 TX LINK DIS JESD MODE0 004 017 FRAME ALIGN 12BIT MODE JESD MODE2 RAMP 12BIT REL ILA SEQ 0 0 FRAMES PER MULTIFRAME (K) 40X MODE 0 0 0 0 0 LANE0 POL LANE1 POL LANE2 POL LANE3 POL 0 032 SEL EMP LANE 0 0 0 033 SEL EMP LANE 1 0 0 034 SEL EMP LANE 2 0 0 0 0 035 SEL EMP LANE 3 036 0 CMOS SYNCB 0 0 0 0 037 0 0 0 0 0 0 03C 0 0 0 0 0 0 0 EN CMOS SYNCB 0 MASK CLKDIV SYSREF MASK NCO SYSREF 0 0 0 0 0 03E 0 0 PLL MODE Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 71 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Register Maps (continued) Table 27. Register Map (continued) REGISTER ADDRESS A[11:0] (Hex) REGISTER DATA 7 6 5 4 3 2 1 0 0 0 0 DDC EN DECIMATION FILTER PAGE (Direct Addressing, 16-Bit Address, 5000h for Channel A and 5800h for Channel B) 72 000 0 0 0 0 001 0 0 0 0 002 0 0 0 0 0 0 0 DUAL BAND EN 005 0 0 0 0 0 0 0 REAL OUT EN 006 0 0 0 0 0 0 0 DDC MUX 0 NCO SEL PIN DECIM FACTOR 007 DDC0 NCO1 LSB 008 DDC0 NCO1 MSB 009 DDC0 NCO2 LSB 00A DDC0 NCO2 MSB 00B DDC0 NCO3 LSB 00C DDC0 NCO3 MSB 00D DDC1 NCO4 LSB 00E DDC1 NCO4 MSB 00F 0 0 0 0 0 0 010 0 0 0 0 0 0 NCO SEL 011 0 0 0 0 0 0 LMFC RESET MODE 014 0 0 0 0 0 0 0 DDC0 6DB GAIN 016 0 0 0 0 0 0 0 DDC1 6DB GAIN 01E 0 0 0 0 0 01F 0 0 0 0 WBF 6DB GAIN DDC DET LAT 0 0 0 033 CUSTOM PATTERN1[7:0] 034 CUSTOM PATTERN1[15:8] 035 CUSTOM PATTERN2[7:0] 036 CUSTOM PATTERN2[15:8] 037 TEST PATTERN DDC1 Q-DATA TEST PATTERN DDC1 I-DATA 038 TEST PATTERN DDC2 Q-DATA TEST PATTERN DDC2 I -DATA 039 0 0 0 0 0 0 0 USE COMMON TEST PATTERN 03A 0 0 0 0 0 0 TEST PAT RES TP RES EN Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Register Maps (continued) Table 27. Register Map (continued) REGISTER ADDRESS A[11:0] (Hex) REGISTER DATA 7 6 5 4 3 2 1 0 0 0 0 PKDET EN 0 0 0 BLKPKDET [16] 0 0 0 FILT0LPSEL POWER DETECTOR PAGE (Direct Addressing, 16-Bit Address, 5400h for Channel A and 5C00h for Channel B) 000 0 0 0 0 001 BLKPKDET [7:0] 002 BLKPKDET [15:8] 003 0 0 0 0 007 BLKTHHH 008 BLKTHHL 009 BLKTHLH 00A BLKTHLL 00B DWELL[7:0] 00C DWELL[15:8] 00D 0 0 0 0 00E 0 0 0 0 TIMECONST 00F FIL0THH[7:0] 010 FIL0THH[15:8] 011 FIL0THL[7:0] 012 FIL0THL[15:8] 013 0 0 0 0 016 FIL1THH[7:0] 017 FIL1THH[15:8] 018 FIL1THL[7:0] 019 FIL1THL[15:8] 01A 0 0 0 0 01D DWELLIIR[7:0] 01E DWELLIIR[15:8] 020 0 0 0 021 0 0 0 0 0 0 0 IIR0 2BIT EN 0 0 0 IIR1 2BIT EN 0 0 IIR0 2BIT EN 0 PWRDETACCU 022 PWRDETH[7:0] 023 PWRDETH[15:8] 024 PWRDETL[7:0] 025 PWRDETL[15:8] Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 73 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com Register Maps (continued) Table 27. Register Map (continued) REGISTER ADDRESS A[11:0] (Hex) REGISTER DATA 7 6 5 4 3 2 1 0 0 0 0 RMS 2BIT EN 0 0 0 0 IODIR GPIO4 IODIR GPIO3 IODIR GPIO2 0 0 POWER DETECTOR PAGE (continued) 027 0 0 0 0 02B 0 0 0 RESET AGC 032 OUTSEL GPIO1 033 OUTSEL GPIO2 034 OUTSEL GPIO3 035 74 OUTSEL GPIO4 037 0 0 038 0 0 0 0 INSEL1 Submit Documentation Feedback IODIR GPIO1 INSEL0 Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.1 Example Register Writes This section provides three different example register writes. Table 28 describes a global power-down register write, Table 29 describes the register writes when the scrambler is enabled, and Table 30 describes the register writes for 8X decimation for channels A and B (complex output, 1 DDC mode) with the NCO set to 1.8 GHz (fS = 3 GSPS) and the JESD format configured to LMFS = 4421. Table 28. Global Power-Down ADDRESS DATA 12h 04h Set the master page COMMENT 20h 01h Set the global power-down Table 29. Scrambler Enable ADDRESS DATA 4004h 69h COMMENT 4003h 00h 6006h 80h Scrambler enable, channel A 7006h 80h Scrambler enable, channel B Select the digital JESD page Table 30. 8X Decimation for Channel A and B ADDRESS DATA COMMENT 4004h 68h 4003h 00h 6000h 01h Issue a digital reset for channel A 6000h 00h Clear the digital for reset channel A 4003h 01h Select the main digital page for channel B 6000h 01h Issue a digital reset for channel B 6000h 00h Clear the digital reset for channel B 4004h 69h 4003h 00h 6002h 01h Set JESD MODE0 = 1, channel A 7002h 01h Set JESD MODE0 = 1, channel B 5000h 01h Enable the DDC, channel A 5001h 02h Set decimation to 8X complex 5007h 9Ah Set the LSB of DDC0, NCO1 to 9Ah (fNCO = 1.8 GHz, fS = 3 GSPS) 5008h 99h Set the MSB of DDC0, NCO1 to 99h (fNCO = 1.8 GHz, fS = 3 GSPS) 5014h 01h Enable the 6-dB digital gain of DDC0 5801h 02h Set decimation to 8X complex 5807h 9Ah Set the LSB of DDC0, NCO1 to 9Ah (fNCO = 1.8 GHz, fS = 3 GSPS) 5808h 99h Set the MSB of DDC0, NCO1 to 99h (fNCO = 1.8 GHz, fS = 3 GSPS) 5814h 01h Enable the 6-dB digital gain of DDC0 Select the main digital page for channel A Select the digital JESD page Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 75 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.2 Register Descriptions 8.5.2.1 General Registers 8.5.2.1.1 Register 000h (address = 000h), General Registers Figure 145. Register 000h 7 RESET R/W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 RESET R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 31. Register 000h Field Descriptions Bit 7 6-1 0 (1) Field Type Reset Description RESET R/W 0h 0 = Normal operation 1 = Internal software reset, clears back to 0 0 W 0h Must write 0 RESET R/W 0h 0 = Normal operation (1) 1 = Internal software reset, clears back to 0 Both bits (7, 0) must be set simultaneously to perform a reset. 8.5.2.1.2 Register 002h (address = 002h), General Registers Figure 146. Register 002h 7 6 5 4 3 DIGITAL BANK PAGE SEL[7:0] R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 32. Register 002h Field Descriptions 76 Bit Field Type Reset Description 7-0 DIGITAL BANK PAGE SEL[7:0] R/W 0h Program the JESD BANK PAGE SEL[23:0] bits to access the desired page in the JESD bank. 680000h = Main digital page CHA selected 680100h = Main digital page CHB selected 610000h = Digital function page CHA selected 610100h = Digital function page CHB selected 690000h = JESD digital page selected Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.2.1.3 Register 003h (address = 003h), General Registers Figure 147. Register 003h 7 6 5 4 3 DIGITAL BANK PAGE SEL[15:8] R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 33. Register 003h Field Descriptions Bit Field Type Reset Description 7-0 DIGITAL BANK PAGE SEL[15:8] R/W 0h Program the JESD BANK PAGE SEL[23:0] bits to access the desired page in the JESD bank. 680000h = Main digital page CHA selected 680100h = Main digital page CHB selected 610000h = Digital function page CHA selected 610100h = Digital function page CHB selected 690000h = JESD digital page selected 8.5.2.1.4 Register 004h (address = 004h), General Registers Figure 148. Register 004h 7 6 5 4 3 DIGITAL BANK PAGE SEL[23:16] R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 34. Register 004h Field Descriptions Bit Field Type Reset Description 7-0 DIGITAL BANK PAGE SEL[23:16] R/W 0h Program the JESD BANK PAGE SEL[23:0] bits to access the desired page in the JESD bank. 680000h = Main digital page CHA selected 680100h = Main digital page CHB selected 610000h = Digital function page CHA selected 610100h = Digital function page CHB selected 690000h = JESD digital page selected 8.5.2.1.5 Register 010h (address = 010h), General Registers Figure 149. Register 010h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 3 or 4 WIRE R/W-0h LEGEND: R/W = Read/Write; W = Write; -n = value after reset Table 35. Register 010h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 3 or 4 WIRE R/W 0h 0 = 4-wire SPI (default) 1 = 3-wire SPI where SDIN become input or output 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 77 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.2.1.6 Register 011h (address = 011h), General Registers Figure 150. Register 011h 7 6 5 4 3 ADC PAGE SEL R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 36. Register 011h Field Descriptions Bit Field Type Reset Description 7-0 ADC PAGE SEL R/W 0h 00000000 = Normal operation, ADC page is not selected 11111111 = ADC page is selected; MASTER PAGE SEL must be set to 0 8.5.2.1.7 Register 012h (address = 012h), General Registers Figure 151. Register 012h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 MASTER PAGE SEL R/W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 37. Register 012h Field Descriptions Bit Field Type Reset Description 7-3 0 W 0h Must write 0 MASTER PAGE SEL R/W 0h 0 = Normal operation 1 = Selects the master page address; ADC PAGE must be set to 0 0 W 0h Must write 0 2 1-0 78 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.3 Master Page (M = 0) 8.5.3.1 Register 020h (address = 020h), Master Page Figure 152. Register 020h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 PDN SYSREF R/W-0h 3 0 W-0h 2 0 R/W-0h 1 PDN CHB R/W-0h 0 GLOBAL PDN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 38. Register 020h Field Descriptions Bit Field Type Reset Description 7-5 0 W 0h Must write 0 PDN SYSREF R/W 0h This bit powers down the SYSREF input buffer. 0 = Normal operation 1 = SYSREF input capture buffer is powered down and further SYSREF input pulses are ignored 4 3-2 0 W 0h Must write 0 1 PDN CHB R/W 0h This bit powers down channel B. 0 = Normal operation 1 = Channel B is powered down 0 GLOBAL PDN R/W 0h This bit enables the global power-down. 0 = Normal operation 1 = Global power-down enabled 8.5.3.2 Register 032h (address = 032h), Master Page Figure 153. Register 032h 7 6 0 0 W-0h W-0h 5 INCR CM IMPEDANCE R/W-0h 4 3 2 1 0 0 0 0 0 0 W-0h W-0h W-0h W-0h W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 39. Register 032h Field Descriptions Bit Field Type Reset Description 7-6 0 W 0h Must write 0 INCR CM IMPEDANCE R/W 0h Only use this bit when analog inputs are dc-coupled to the driver. 0 = VCM buffer directly drives the common point of biasing resistors. 1 = VCM buffer drives the common point of biasing resistors with > 5 kΩ 0 W 0h Must write 0 5 4-0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 79 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.3.3 Register 039h (address = 039h), Master Page Figure 154. Register 039h 7 6 ALWAYS WRITE 1 W-0h 0 W-0h 5 0 W-0h 4 ALWAYS WRITE 1 W-0h 3 2 1 0 0 0 PDN CHB EN SYNC TERM DIS W-0h R/W-0h R/W-0h R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 40. Register 039h Field Descriptions Bit Field Type Reset Description 7 0 W 0h Must write 0 6 ALWAYS WRITE 1 W 0h Always set this bit to 1 5 0 W 0h Must write 0 4 ALWAYS WRITE 1 W 0h Always set this bit to 1 3-2 0 W 0h Must write 0 1 PDN CHB EN R/W 0h This bit enables the power-down control of channel B through the SPI in register 20h. 0 = PDN control disabled 1 = PDN control enabled 0 SYNC TERM DIS R/W 0h This bit disables the on-chip, 100-Ω termination resistors on the SYNCB input. 0 = On-chip, 100-Ω termination enabled 1 = On-chip, 100-Ω termination disabled 8.5.3.4 Register 03Ch (address = 03Ch), Master Page Figure 155. Register 03Ch 7 0 W-0h 6 SYSREF DEL EN R/W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 SYSREF DEL[4:3] R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 41. Register 03Ch Field Descriptions Bit 80 Field Type Reset Description 7 0 W 0h Must write 0 6 SYSREF DEL EN R/W 0h This bit allows an internal delay to be added to the SYSREF input. 0 = SYSREF delay disabled 1 = SYSREF delay enabled through register settings [3Ch (bits 1-0), 5Ah (bits 7-5)] 5-2 0 W 0h Must write 0 1-0 SYSREF DEL[4:3] R/W 0h When the SYSREF delay feature is enabled (3Ch, bit 6) the delay can be adjusted in 25-ps steps; the first step is 175 ps. The PVT variation of each 25-ps step is ±10 ps. The 175-ps step is ±50 ps; see Table 43. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.3.5 Register 05Ah (address = 05Ah), Master Page Figure 156. Register 05Ah 7 6 SYSREF DEL[2:0] R/W-0h W-0h 5 4 0 W-0h W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 42. Register 05Ah Field Descriptions Bit Field Type Reset Description 7 SYSREF DEL2 W 0h 6 SYSREF DEL1 R/W 5 SYSREF DEL0 W When the SYSREF delay feature is enabled (3Ch, bit 6) the delay can be adjusted in 25-ps steps; the first step is 175 ps. The PVT variation of each 25-ps step is ±10 ps. The 175-ps step is ±50 ps; see Table 43. 0 W 0h Must write 0 4-0 Table 43. SYSREF DEL[2:0] Bit Settings STEP SETTING STEP (NOM) TOTAL DELAY (NOM) 1 01000 175 ps 175 ps 2 00111 25 ps 200 ps 3 00110 25 ps 225 ps 4 00101 25 ps 250 ps 5 00100 25 ps 275 ps 6 00011 25 ps 300 ps 8.5.3.6 Register 03Dh (address = 3Dh), Master Page Figure 157. Register 03Dh 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 1 JESD OUTPUT SWING R/W-0h 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 44. Register 03Dh Field Descriptions Bit Field Type Reset Description 7-3 0 W 0h Must write 0 2-0 JESD OUTPUT SWING R/W 0h These bits select the output amplitude, VOD (mVPP), of the JESD transmitter for all lanes. 0 = 860 mVPP 1= 810 mVPP 2 = 770 mVPP 3 = 745 mVPP 4 = 960 mVPP 5 = 930 mVPP 6 = 905 mVPP 7 = 880 mVPP Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 81 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.3.7 Register 057h (address = 057h), Master Page Figure 158. Register 057h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 SEL SYSREF REG R/W-0h 3 ASSERT SYSREF REG R/W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 45. Register 057h Field Descriptions Bit Field Type Reset Description 7-5 0 W 0h Must write 0 4 SEL SYSREF REG R/W 0h SYSREF can be asserted using this bit. Ensure that the SEL SYSREF REG register bit is set high before using this bit; see Using SYSREF . 0 = SYSREF is logic low 1 = SYSREF is logic high 3 ASSERT SYSREF REG R/W 0h Set this bit to use the SPI register to assert SYSREF. 0 = SYSREF is asserted by device pins 1 = SYSREF can be asserted by the ASSERT SYSREF REG register bit Other bits = 0 0 W 0h Must write 0 2-0 8.5.3.8 Register 058h (address = 058h), Master Page Figure 159. Register 058h 7 0 W-0h 6 0 W-0h 5 SYNCB POL R/W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 46. Register 058h Field Descriptions Bit Field Type Reset Description 7-6 0 W 0h Must write 0 SYNCB POL R/W 0h This bit inverts the SYNCB polarity. 0 = Polarity is not inverted; this setting matches the timing diagrams in this document and is the proper setting to use 1 = Polarity is inverted 0 W 0h Must write 0 5 4-0 82 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.4 ADC Page (FFh, M = 0) 8.5.4.1 Register 03Fh (address = 03Fh), ADC Page Figure 160. Register 03Fh 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 SLOW SP EN1 R/W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; R = Read only; -n = value after reset Table 47. Register 03Fh Field Descriptions Bit Field Type Reset Description 7-3 0 W 0h Must write 0 SLOW SP EN1 R/W 0h This bit must be enabled for clock rates below 2.5 GSPS. 0 = ADC sampling rates are faster than 2.5 GSPS 1 = ADC sampling rates are slower than 2.5 GSPS 0 W 0h Must write 0 2 1-0 8.5.4.2 Register 042h (address = 042h), ADC Page Figure 161. Register 042h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 SLOW SP EN2 R/W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 48. Register 042h Field Descriptions Bit Field Type Reset Description 7-5 0 W 0h Must write 0 SLOW SP EN2 R/W 0h This bit must be enabled for clock rates below 2.5 GSPS. 0 = ADC sampling rates are faster than 2.5 GSPS 1 = ADC sampling rates are slower than 2.5 GSPS 0 W 0h Must write 0 4 3-0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 83 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.5 Digital Function Page (610000h, M = 1 for Channel A and 610100h, M = 1 for Channel B) 8.5.5.1 Register A6h (address = 0A6h), Digital Function Page Figure 162. Register 0A6h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 2 1 0 DIG GAIN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 49. Register 0A6h Field Descriptions Bit Field Type Reset Description 7-4 0 W 0h Must write 0 3-0 DIG GAIN R/W 0h These bits set the digital gain of the ADC output data prior to decimation up to 11 dB; see Table 50. Table 50. DIG GAIN Bit Settings SETTING DIGITAL GAIN 0000 0 dB 0001 1 dB 0010 2 dB … … 1010 10 dB 1011 11 dB 8.5.6 Offset Corr Page Channel A (610000h, M = 1) 8.5.6.1 Register 034h (address = 034h), Offset Corr Page Channel A Figure 163. Register 034h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 SEL EXT EST R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 51. Register 034h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 SEL EXT EST R/W 0h This bit selects the external estimate for the offset correction block; see the Using DC Coupling in the ADC32RF8x section. 0 84 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.6.2 Register 068h (address = 068h), Offset Corr Page Channel A Figure 164. Register 068h 7 6 5 4 3 FREEZE OFFSET CORR 0 ALWAYS WRITE 1 0 0 R/W-0h W-0h R/W-0h W-0h W-0h 2 DIS OFFSET CORR R/W-0h 1 0 ALWAYS WRITE 1 0 R/W-0h R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 52. Register 068h Field Descriptions Bit Field Type Reset Description 7 FREEZE OFFSET CORR R/W 0h Use this bit and bits 5 and 1 to freeze the offset estimation process of the offset corrector; see the Using DC Coupling in the ADC32RF8x section. 011 = Apply this setting after powering up the device 111 = Offset corrector is frozen, does not estimate offset anymore, and applies the last computed value. Others = Do not use 6 0 W 0h Must write 0 5 ALWAYS WRITE 1 R/W 0h Always write this bit as 1 for the offset correction block to work properly. 0 W 0h Must write 0 2 DIS OFFSET CORR R/W 0h 0 = Offset correction block works and removes fS / 8, fS / 4, 3fS / 8, and fS / 2 spurs 1 = Offset correction block is disabled 1 ALWAYS WRITE 1 R/W 0h Always write this bit as 1 for the offset correction block to work properly. 0 0 W 0h Must write 0 4-3 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 85 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.7 Offset Corr Page Channel B (610000h, M = 1) 8.5.7.1 Register 068h (address = 068h), Offset Corr Page Channel B Figure 165. Register 068h 7 6 5 4 3 FREEZE OFFSET CORR 0 ALWAYS WRITE 1 0 0 R/W-0h W-0h R/W-0h W-0h W-0h 2 DIS OFFSET CORR R/W-0h 1 0 ALWAYS WRITE 1 0 R/W-0h R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 53. Register 068h Field Descriptions Bit Field Type Reset Description FREEZE OFFSET CORR R/W 0h Use this bit and bits 5 and 1 to freeze the offset estimation process of the offset corrector; see the Using DC Coupling in the ADC32RF8x section. 011 = Apply this setting after powering up the device 111 = Offset corrector is frozen, does not estimate offset anymore, and applies the last computed value. Others = Do not use 6 0 W 0h Must write 0 5 ALWAYS WRITE 1 R/W 0h Always write this bit as 1 for the offset correction block to work properly. 7,5,1 4-3 86 0 W 0h Must write 0 2 DIS OFFSET CORR R/W 0h 0 = Offset correction block works and removes fS / 8, fS / 4, 3fS / 8, and fS / 2 spurs 1 = Offset correction block is disabled 1 ALWAYS WRITE 1 R/W 0h Always write this bit as 1 for the offset correction block to work properly. 0 0 W 0h Must write 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.8 Digital Gain Page (610005h, M = 1 for Channel A and 610105h, M = 1 for Channel B) 8.5.8.1 Register 0A6h (address = 0A6h), Digital Gain Page Figure 166. Register 0A6h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 2 1 0 DIGITAL GAIN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 54. Register 0A6h Field Descriptions Bit Field Type Reset Description 7-4 0 W 0h Must write 0 3-0 DIGITAL GAIN R/W 0h These bits apply a digital gain to the ADC data (before the DDC) up to 11 dB. 0000 = Default 0001 = 1 dB 1011 = 11 dB Others = Do not use 8.5.9 Main Digital Page Channel A (680000h, M = 1) 8.5.9.1 Register 000h (address = 000h), Main Digital Page Channel A Figure 167. Register 000h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 DIG CORE RESET GBL R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 55. Register 000h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 DIG CORE RESET GBL R/W 0h Pulse this bit (0 →1 →0) to reset the digital core (applies to both channel A and B). All Nyquist zone settings take effect when this bit is pulsed. 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 87 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.9.2 Register 0A2h (address = 0A2h), Main Digital Page Channel A Figure 168. Register 0A2h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 NQ ZONE EN R/W-0h 2 1 NYQUIST ZONE R/W-0h 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 56. Register 0A2h Field Descriptions Bit Field Type Reset Description 7-4 0 W 0h Must write 0 NQ ZONE EN R/W 0h This bit allows for specification of the operating Nyquist zone. 0 = Nyquist zone specification disabled 1 = Nyquist zone specification enabled NYQUIST ZONE R/W 0h These bits specify the operating Nyquist zone for the analog correction loop. Set the NQ ZONE EN bit before programming these bits. For example, at s 3-GSPS chip clock, the first Nyquist zone is from dc to 1.5 GHz, the second Nyquist zone is from 1.5 GHz to 3 GHz, and so on. 000 = First Nyquist zone (dc – fS / 2) 001 = Second Nyquist zone (fS / 2 – fS) 010 = Third Nyquist zone 011 = Fourth Nyquist zone 3 2-0 8.5.10 Main Digital Page Channel B (680001h, M = 1) 8.5.10.1 Register 000h (address = 000h), Main Digital Page Channel B Figure 169. Register 000h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 DIG CORE RESET GBL R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 57. Register 000h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 DIG CORE RESET GBL R/W 0h Pulse this bit (0 →1 →0) to reset the digital core (applies to both channel A and B). All Nyquist zone settings take effect when this bit is pulsed. 0 88 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.10.2 Register 0A2h (address = 0A2h), Main Digital Page Channel B Figure 170. Register 0A2h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 NQ ZONE EN R/W-0h 2 1 NYQUIST ZONE R/W-0h 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 58. Register 0A2h Field Descriptions Bit Field Type Reset Description 7-4 0 W 0h Must write 0 NQ ZONE EN R/W 0h This bit allows for specification of the operating Nyquist zone. 0 = Nyquist zone specification disabled 1 = Nyquist zone specification enabled NYQUIST ZONE R/W 0h These bits specify the operating Nyquist zone for the analog correction loop. Set the NQ ZONE EN bit before programming these bits. For example, at a 3-GSPS chip clock, first Nyquist zone is from dc to 1.5 GHz, the second Nyquist zone is from 1.5 GHz to 3 GHz, and so on. 000 = First Nyquist zone (dc – fS / 2) 001 = Second Nyquist zone (fS / 2 – fS) 010 = Third Nyquist zone 011 = Fourth Nyquist zone 3 2-0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 89 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.11 JESD Digital Page (6900h, M = 1) 8.5.11.1 Register 001h (address = 001h), JESD Digital Page Figure 171. Register 001h 7 CTRL K R/W-0h 6 0 W-0h 5 0 W-0h 4 TESTMODE EN R/W-0h 3 0 W-0h 2 LANE ALIGN R/W-0h 1 FRAME ALIGN R/W-0h 0 TX LINK DIS R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 59. Register 001h Field Descriptions Bit 7 6-5 90 Field Type Reset Description CTRL K R/W 0h This bit is the enable bit for the number of frames per multiframe. 0 = Default is five frames per multiframe 1 = Frames per multiframe can be set in register 06h 0 R/W 0h Must write 0 0 This bit generates a long transport layer test pattern mode according to section 5.1.6.3 of the JESD204B specification. 0 = Test mode disabled 1 = Test mode enabled 4 TESTMODE EN 3 0 W 0h Must write 0 2 LANE ALIGN R/W 0h This bit inserts a lane alignment character (K28.3) for the receiver to align to the lane boundary per section 5.3.3.5 of the JESD204B specification. 0 = Normal operation 1 = Inserts lane alignment characters 1 FRAME ALIGN R/W 0h This bit inserts a frame alignment character (K28.7) for the receiver to align to the frame boundary per section 5.3.35 of the JESD204B specification. 0 = Normal operation 1 = Inserts frame alignment characters 0 TX LINK DIS R/W 0h This bit disables sending the initial link alignment (ILA) sequence when SYNC is deasserted. 0 = Normal operation 1 = ILA disabled Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.11.2 Register 002h (address = 002h ), JESD Digital Page Figure 172. Register 002h 7 SYNC REG R/W-0h 6 SYNC REG EN R/W-0h 5 0 W-0h 4 0 W-0h 3 2 12BIT MODE R/W-0h 1 0 JESD MODE0 R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 60. Register 002h Field Descriptions Bit Field Type Reset Description 7 SYNC REG R/W 0h This bit provides SYNC control through the SPI. 0 = Normal operation 1 = ADC output data are replaced with K28.5 characters 6 SYNC REG EN R/W 0h This bit is the enable bit for SYNC control through the SPI. 0 = Normal operation 1 = SYNC control through the SPI is enabled (ignores the SYNCB input pins) 5-4 0 W 0h Must write 0 3-2 12BIT MODE R/W 0h This bit enables the 12-bit output mode for more efficient data packing. 00 = Normal operation, 14-bit output 01, 10 = Unused 11 = High-efficient data packing enabled 1-0 JESD MODE0 R/W 0h These bits select the configuration register to configure the correct LMFS frame assemblies for different decimation settings; see the JESD frame assembly tables in the JESD204B Frame Assembly section. 00 = 0 01 = 1 10 = 2 11 = 3 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 91 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.11.3 Register 003h (address = 003h), JESD Digital Page Figure 173. Register 003h 7 6 5 4 LINK LAYER TESTMODE LINK LAY RPAT R/W-0h R/W-0h 3 LMFC MASK RESET R/W-0h 2 1 0 JESD MODE1 JESD MODE2 RAMP 12BIT R/W-1h R/W-0h R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 61. Register 003h Field Descriptions Bit Field Type Reset Description 7-5 LINK LAYER TESTMODE R/W 0h These bits generate a pattern according to section 5.3.3.8.2 of the JESD204B document. 000 = Normal ADC data 001 = D21.5 (high-frequency jitter pattern) 010 = K28.5 (mixed-frequency jitter pattern) 011 = Repeat initial lane alignment (generates a K28.5 character and repeats lane alignment sequences continuously) 100 = 12-octet RPAT jitter pattern 4 LINK LAY RPAT R/W 0h This bit changes the running disparity in a modified RPAT pattern test mode (only when link layer test mode = 100). 0 = Normal operation 1 = Changes disparity 3 LMFC MASK RESET R/W 0h 0 = Normal operation 2 JESD MODE1 R/W 1h These bits select the configuration register to configure the correct LMFS frame assemblies for different decimation settings; see the JESD frame assembly tables in the JESD204B Frame Assembly section 1 JESD MODE2 R/W 0h These bits select the configuration register to configure the correct LMFS frame assemblies for different decimation settings; see the JESD frame assembly tables in the JESD204B Frame Assembly section 0 RAMP 12BIT R/W 0h 12-bit RAMP test pattern. 0 = Normal data output 1 = Digital output is the RAMP pattern 8.5.11.4 Register 004h (address = 004h), JESD Digital Page Figure 174. Register 004h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 REL ILA SEQ R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 62. Register 004h Field Descriptions 92 Bit Field Type Reset Description 7-2 0 W 0h Must write 0 1-0 REL ILA SEQ R/W 0h These bits delay the generation of the lane alignment sequence by 0, 1, 2, or 3 multiframes after the code group synchronization. 00 = 0 multiframe delays 01 = 1 multiframe delay 10 = 2 multiframe delays 11 = 3 multiframe delays Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.11.5 Register 006h (address = 006h), JESD Digital Page Figure 175. Register 006h 7 SCRAMBLE EN R/W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 63. Register 006h Field Descriptions Bit 7 6-0 Field Type Reset Description SCRAMBLE EN R/W 0h This bit is the scramble enable bit in the JESD204B interface. 0 = Scrambling disabled 1 = Scrambling enabled 0 W 0h Must write 0 8.5.11.6 Register 007h (address = 007h), JESD Digital Page Figure 176. Register 007h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 3 2 1 FRAMES PER MULTIFRAME (K) R/W-0h 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 64. Register 007h Field Descriptions Bit Field Type Reset Description 7-5 0 W 0h Must write 0 4-0 FRAMES PER MULTIFRAME (K) R/W 0h These bits set the number of multiframes. Actual K is the value in hex + 1 (that is, 0Fh is K = 16). 8.5.11.7 Register 016h (address = 016h), JESD Digital Page Figure 177. Register 016h 7 0 W-0h 6 5 40x MODE R/W-0h 4 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 65. Register 016h Field Descriptions Bit Field Type Reset Description 0 W 0h Must write 0 6-4 40x MODE R/W 0h This register must be set for 40X mode operation. 000 = Register is set for 20X and 80X mode 111 = Register must be set for 40X mode 3-0 0 W 0h Must write 0 7 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 93 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.11.8 Register 017h (address = 017h), JESD Digital Page Figure 178. Register 017h 7 6 5 4 0 0 0 0 W-0h R/W-0h R/W-0h R/W-0h 3 Lane0 POL W-0h 2 Lane1 POL W-0h 1 Lane2 POL W-0h 0 Lane3 POL W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 66. Register 017h Field Descriptions Bit Field Type Reset Description 7 0 W 0h Must write 0 6-4 0 R/W 0h Must write 0 3-0 Lane[3:0] POL W 0h These bits set the polarity of the individual JESD output lanes. 0 = Polarity as given in the pinout (noninverted) 1 = Inverts polarity (positive, P, or negative, M) 8.5.11.9 Register 032h-035h (address = 032h-035h), JESD Digital Page Figure 179. Register 032h 7 6 5 4 SEL EMP LANE 0 R/W-0h 3 2 1 0 W-0h 0 0 W-0h 2 1 0 W-0h 0 0 W-0h 2 1 0 W-0h 0 0 W-0h 2 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Figure 180. Register 033h 7 6 5 4 SEL EMP LANE 1 R/W-0h 3 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Figure 181. Register 034h 7 6 5 4 SEL EMP LANE 2 R/W-0h 3 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Figure 182. Register 035h 7 6 5 4 SEL EMP LANE 3 R/W-0h 3 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset 94 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Table 67. Register 032h-035h Field Descriptions Bit Field Type Reset Description 7-2 SEL EMP LANE R/W 0h These bits select the amount of de-emphasis for the JESD output transmitter. The de-emphasis value in dB is measured as the ratio between the peak value after the signal transition to the settled value of the voltage in one bit period. 0 = 0 dB 1 = –1 dB 3 = –2 dB 7 = –4.1 dB 15 = –6.2 dB 31 = –8.2 dB 63 = –11.5 dB 1-0 0 W 0h Must write 0 8.5.11.10 Register 036h (address = 036h), JESD Digital Page Figure 183. Register 036h 7 0 W-0h 6 CMOS SYNCB R/W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 68. Register 036h Field Descriptions Bit Field Type Reset Description 7 0 W 0h Must write 0 6 CMOS SYNCB R/W 0h This bit enables single-ended control of SYNCB using the GPIO4 pin (pin 63). The differential SYNCB input is ignored. Set the EN CMOS SYNCB bit and keep the CH bit high to make this bit effective. 0 = Differential SYNCB input 1 = Single-ended SYNCB input using pin 63 0 W 0h Must write 0 5-0 8.5.11.11 Register 037h (address = 037h), JESD Digital Page Figure 184. Register 037h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 PLL MODE R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 69. Register 037h Field Descriptions Bit Field Type Reset Description 7-2 0 W 0h Must write 0 1-0 PLL MODE R/W 0h These bits select the PLL multiplication factor; see the JESD tables in the JESD204B Frame Assembly section for settings. 00 = 20X mode 01 = 16X mode 10 = 40x mode (the 40x MODE bit in register 16h must also be set) 11 = 80x mode Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 95 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.11.12 Register 03Ch (address = 03Ch), JESD Digital Page Figure 185. Register 03Ch 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 EN CMOS SYNCB R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 70. Register 03Ch Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 EN CMOS SYNCB R/W 0h Set this bit and the CMOS SYNCB bit high to provide a singleended SYNC input to the device instead of differential. Also, keep the CH bit high. Thus: 1. Select the JESD digital page. 2. Write address 7036h with value 40h. 3. Write address 703Ch with value 01h. 0 96 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.11.13 Register 03Eh (address = 03Eh), JESD Digital Page Figure 186. Register 03Eh 7 0 W-0h 6 MASK CLKDIV SYSREF R/W-0h 5 MASK NCO SYSREF R/W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 71. Register 03Eh Field Descriptions Bit Field Type Reset Description 7 0 W 0h Must write 0 6 MASK CLKDIV SYSREF R/W 0h Use this bit to mask the SYSREF going to the input clock divider. 0 = Input clock divider is reset when SYSREF is asserted (that is, when SYSREF transitions from low to high) 1 = Input clock divider ignores SYSREF assertions 5 MASK NCO SYSREF R/W 0h Use this bit to mask the SYSREF going to the NCO in the DDC block and LMFC counter of the JESD interface. 0 = NCO phase and LMFC counter are reset when SYSREF is asserted (that is, when SYSREF transitions from low to high) 1 = NCO and LMFC counter ignore SYSREF assertions 0 W 0h Must write 0 4-0 8.5.12 Decimation Filter Page Direct Addressing, 16-Bit Address, 5000h for Channel A, 5800h for Channel B 8.5.12.1 Register 000h (address = 000h), Decimation Filter Page Figure 187. Register 000h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 DDC EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 72. Register 000h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 DDC EN R/W 0h This bit enables the decimation filter and disables the bypass mode. 0 = Do not use 1 = Decimation filter enabled 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 97 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.12.2 Register 001h (address = 001h), Decimation Filter Page Figure 188. Register 001h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 2 1 DECIM FACTOR R/W-0h 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 73. Register 001h Field Descriptions Bit Field Type Reset Description 7-4 0 W 0h Must write 0 3-0 DECIM FACTOR R/W 0h These bits configure the decimation filter setting. 0000 = Divide-by-4 complex 0001 = Divide-by-6 complex 0010 = Divide-by-8 complex 0011 = Divide-by-9 complex 0100 = Divide-by-10 complex 0101 = Divide-by-12 complex 0110 = Not used 0111 = Divide-by-16 complex 1000 = Divide-by-18 complex 1001 = Divide-by-20 complex 1010 = Divide-by-24 complex 1011 = Not used 1100 = Divide-by-32 complex 8.5.12.3 Register 002h (address = 2h), Decimation Filter Page Figure 189. Register 002h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 DUAL BAND EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 74. Register 002h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 DUAL BAND EN R/W 0h This bit enables the dual-band DDC filter for the corresponding channel. 0 = Single-band DDC; available in both ADC32RF80 and ADC32RF83 1 = Dual-band DDC; available in ADC32RF80 only 0 98 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.12.4 Register 005h (address = 005h), Decimation Filter Page Figure 190. Register 005h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 REAL OUT EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 75. Register 005h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 REAL OUT EN R/W 0h This bit converts the complex output to real output at 2x the output rate. 0 = Complex output format 1 = Real output format 0 8.5.12.5 Register 006h (address = 006h), Decimation Filter Page Figure 191. Register 006h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 DDC MUX R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 76. Register 006h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 DDC MUX R/W 0h This bit connects the DDC to the alternate channel ADC to enable up to four DDCs with one ADC and completely turn off the other ADC channel. 0 = Normal operation 1 = DDC block takes input from the alternate ADC 0 8.5.12.6 Register 007h (address = 007h), Decimation Filter Page Figure 192. Register 007h 7 6 5 4 3 DDC0 NCO1 LSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 77. Register 007h Field Descriptions Bit Field Type Reset Description 7-0 DDC0 NCO1 LSB R/W 0h These bits are the LSB of the NCO frequency word for NCO1 of DDC0 (band 1). The LSB represents fS / (216), where fS is the ADC sampling frequency. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 99 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.12.7 Register 008h (address = 008h), Decimation Filter Page Figure 193. Register 008h 7 6 5 4 3 DDC0 NCO1 MSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 78. Register 008h Field Descriptions Bit Field Type Reset Description 7-0 DDC0 NCO1 MSB R/W 0h These bits are the MSB of the NCO frequency word for NCO1 of DDC0 (band 1). The LSB represents fS / (216), where fS is the ADC sampling frequency. 8.5.12.8 Register 009h (address = 009h), Decimation Filter Page Figure 194. Register 009h 7 6 5 4 3 DDC0 NCO2 LSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 79. Register 009h Field Descriptions Bit Field Type Reset Description 7-0 DDC0 NCO2 MSB R/W 0h These bits are the LSB of the NCO frequency word for NCO2 of DDC0 (band 1). The LSB represents fS / (216), where fS is the ADC sampling frequency. 8.5.12.9 Register 00Ah (address = 00Ah), Decimation Filter Page Figure 195. Register 00Ah 7 6 5 4 3 DDC0 NCO2 MSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 80. Register 00Ah Field Descriptions 100 Bit Field Type Reset Description 7-0 DDC0 NCO2 MSB R/W 0h These bits are the MSB of the NCO frequency word for NCO2 of DDC0 (band 1). The LSB represents fS / (216), where fS is the ADC sampling frequency. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.12.10 Register 00Bh (address = 00Bh), Decimation Filter Page Figure 196. Register 00Bh 7 6 5 4 3 DDC0 NCO3 LSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 81. Register 00Bh Field Descriptions Bit Field Type Reset Description 7-0 DDC0 NCO3 LSB R/W 0h These bits are the LSB of the NCO frequency word for NCO3 of DDC0 (band 1). The LSB represents fS / (216), where fS is the ADC sampling frequency. 8.5.12.11 Register 00Ch (address = 00Ch), Decimation Filter Page Figure 197. Register 00Ch 7 6 5 4 3 DDC0 NCO3 MSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 82. Register 00Ch Field Descriptions Bit Field Type Reset Description 7-0 DDC0 NCO3 MSB R/W 0h These bits are the MSB of the NCO frequency word for NCO3 of DDC0 (band 1). The LSB represents fS / (216), where fS is the ADC sampling frequency. 8.5.12.12 Register 00Dh (address = 00Dh), Decimation Filter Page Figure 198. Register 00Dh 7 6 5 4 3 DDC1 NCO4 LSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 83. Register 00Dh Field Descriptions Bit Field Type Reset Description 7-0 DDC1 NCO4 LSB R/W 0h These bits are the LSB of the NCO frequency word for NCO4 of DDC1 (band 2, only when dual-band mode is enabled). The LSB represents fS / (216), where fS is the ADC sampling frequency. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 101 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.12.13 Register 00Eh (address = 00Eh), Decimation Filter Page Figure 199. Register 00Eh 7 6 5 4 3 DDC1 NCO4 MSB R/W-0h 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Table 84. Register 00Eh Field Descriptions Bit Field Type Reset Description 7-0 DDC1 NCO4 MSB R/W 0h These bits are the MSB of the NCO frequency word for NCO4 of DDC1 (band 2, only when dual-band mode is enabled). The LSB represents fS / (216), where fS is the ADC sampling frequency. 8.5.12.14 Register 00Fh (address = 00Fh), Decimation Filter Page Figure 200. Register 00Fh 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 NCO SEL PIN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 85. Register 00Fh Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 NCO SEL PIN R/W 0h This bit enables NCO selection through the GPIO pins. 0 = NCO selection through SPI (see address 0h10) 1 = NCO selection through GPIO pins 0 8.5.12.15 Register 010h (address = 010h), Decimation Filter Page Figure 201. Register 010h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 NCO SEL R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 86. Register 010h Field Descriptions 102 Bit Field Type Reset Description 7-2 0 W 0h Must write 0 1-0 NCO SEL R/W 0h These bits enable NCO selection through register setting. 00 = NCO1 selected for DDC 1 01 = NCO2 selected for DDC 1 10 = NCO3 selected for DDC 1 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.12.16 Register 011h (address = 011h), Decimation Filter Page Figure 202. Register 011h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 LMFC RESET MODE R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 87. Register 011h Field Descriptions Bit Field Type Reset Description 7-2 0 W 0h Must write 0 1-0 LMFC RESET MODE R/W 0h These bits reset the configuration for all DDCs and NCOs. 00 = All DDCs and NCOs are reset with every LMFC RESET 01 = Reset with first LMFC RESET after DDC start. Afterwards, reset only when analog clock dividers are resynchronized. 10 = Reset with first LMFC RESET after DDC start. Afterwards, whenever analog clock dividers are resynchronized, use two LMFC resets. 11 = Do not use an LMFC reset at all. Reset the DDCs only when a DDC start is asserted and afterwards continue normal operation. Deterministic latency is not ensured. 8.5.12.17 Register 014h (address = 014h), Decimation Filter Page Figure 203. Register 014h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 DDC0 6DB GAIN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 88. Register 014h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 DDC0 6DB GAIN R/W 0h This bit scales the output of DDC0 by 2 (6 dB) to compensate for real-to-complex conversion and image suppression. This scaling does not apply to the high-bandwidth filter path (divideby-4 and -6); see register 1Fh. 0 = Normal operation 1 = 6-dB digital gain is added 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 103 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.12.18 Register 016h (address = 016h), Decimation Filter Page Figure 204. Register 016h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 DDC1 6DB GAIN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 89. Register 016h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 DDC1 6DB GAIN R/W 0h This bit scales the output of DDC1 by 2 (6 dB) to compensate for real-to-complex conversion and image suppression. This scaling does not apply to the high-bandwidth filter path (divideby-4 and -6); see register 1Fh. 0 = Normal operation 1 = 6-dB digital gain is added 0 8.5.12.19 Register 01Eh (address = 01Eh), Decimation Filter Page Figure 205. Register 01Eh 7 0 W-0h 6 5 DDC DET LAT R/W-0h 4 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 90. Register 01Eh Field Descriptions Bit Field Type Reset Description 0 W 0h Must write 0 6-4 DDC DET LAT R/W 0h These bits ensure deterministic latency depending on the decimation setting used; see Table 91. 3-0 0 W 0h Must write 0 7 Table 91. DDC DET LAT Bit Settings SETTING 104 COMPLEX DECIMATION SETTING 10h Divide-by-24, -32 complex 20h Divide-by-16, -18, -20 complex 40h Divide-by-by 6, -12 complex 50h Divide-by-4, -8, -9, -10 complex Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.12.20 Register 01Fh (address = 01Fh), Decimation Filter Page Figure 206. Register 01Fh 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 WBF 6DB GAIN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 92. Register 01Fh Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 WBF 6DB GAIN R/W 0h This bit scales the output of the wide bandwidth DDC filter by 2 (6 dB) to compensate for real-to-complex conversion and image suppression. This setting only applies to the high-bandwidth filter path (divide-by-4 and -6). 0 = Normal operation 1 = 6-dB digital gain is added 0 8.5.12.21 Register 033h-036h (address = 033h-036h), Decimation Filter Page Figure 207. Register 033h 7 6 5 4 3 CUSTOM PATTERN1[7:0] R/W-0h 2 1 0 2 1 0 2 1 0 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Figure 208. Register 034h 7 6 5 4 3 CUSTOM PATTERN1[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 209. Register 035h 7 6 5 4 3 CUSTOM PATTERN2[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 210. Register 036h 7 6 5 4 3 CUSTOM PATTERN2[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 93. Register 033h-036h Field Descriptions Bit Field Type Reset Description 7-0 CUSTOM PATTERN R/W 0h These bits set the custom test pattern in address 33h, 34h, 35h, or 36h. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 105 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.12.22 Register 037h (address = 037h), Decimation Filter Page Figure 211. Register 037h 7 6 5 TEST PATTERN DDC1 Q-DATA W-0h W-0h W-0h 4 3 W-0h 2 1 TEST PATTERN DDC1 I-DATA R/W-0h 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 94. Register 037h Field Descriptions 106 Bit Field Type Reset Description 7-4 TEST PATTERN DDC1 Q-DATA W 0h These bits select the test patten for the Q stream of the DDC1. 0000 = Normal operation using ADC output data 0001 = Outputs all 0s 0010 = Outputs all 1s 0011 = Outputs toggle pattern: output data are an alternating sequence of 10101010101010 and 01010101010101 0100 = Output digital ramp: output data increment by one LSB every clock cycle from code 0 to 65535 0110 = Single pattern: output data are a custom pattern 1 (75h and 76h) 0111 Double pattern: output data alternate between custom pattern 1 and custom pattern 2 1000 = Deskew pattern: output data are AAAAh 1001 = SYNC pattern: output data are FFFFh 3-0 TEST PATTERN DDC1 I-DATA R/W 0h These bits select the test patten for the I stream of the DDC1. 0000 = Normal operation using ADC output data 0001 = Outputs all 0s 0010 = Outputs all 1s 0011 = Outputs toggle pattern: output data are an alternating sequence of 10101010101010 and 01010101010101 0100 = Output digital ramp: output data increment by one LSB every clock cycle from code 0 to 65535 0110 = Single pattern: output data are a custom pattern 1 (75h and 76h) 0111 Double pattern: output data alternate between custom pattern 1 and custom pattern 2 1000 = Deskew pattern: output data are AAAAh 1001 = SYNC pattern: output data are FFFFh Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.12.22.1 Register 038h (address = 038h), Decimation Filter Page Figure 212. Register 038h 7 6 5 TEST PATTERN DDC2 Q-DATA R/W-0h 4 3 2 1 TEST PATTERN DDC2 I -DATA R/W-0h 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 95. Register 038h Field Descriptions Bit Field Type Reset Description 7-4 TEST PATTERN DDC2 Q-DATA W 0h These bits select the test patten for the Q stream of the DDC2. 0000 = Normal operation using ADC output data 0001 = Outputs all 0s 0010 = Outputs all 1s 0011 = Outputs toggle pattern: output data are an alternating sequence of 10101010101010 and 01010101010101 0100 = Output digital ramp: output data increment by one LSB every clock cycle from code 0 to 65535 0110 = Single pattern: output data are a custom pattern 1 (75h and 76h) 0111 Double pattern: output data alternate between custom pattern 1 and custom pattern 2 1000 = Deskew pattern: output data are AAAAh 1001 = SYNC pattern: output data are FFFFh 3-0 TEST PATTERN DDC2 I -DATA R/W 0h These bits select the test patten for the I stream of the DDC2. 0000 = Normal operation using ADC output data 0001 = Outputs all 0s 0010 = Outputs all 1s 0011 = Outputs toggle pattern: output data are an alternating sequence of 10101010101010 and 01010101010101 0100 = Output digital ramp: output data increment by one LSB every clock cycle from code 0 to 65535 0110 = Single pattern: output data are a custom pattern 1 (75h and 76h) 0111 Double pattern: output data alternate between custom pattern 1 and custom pattern 2 1000 = Deskew pattern: output data are AAAAh 1001 = SYNC pattern: output data are FFFFh 8.5.12.22.2 Register 039h (address = 039h), Decimation Filter Page Figure 213. Register 039h 7 6 5 4 3 2 1 0 0 0 0 0 0 0 W-0h W-0h W-0h W-0h W-0h W-0h W-0h 0 USE COMMON TEST PATTERN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 96. Register 039h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 USE COMMON TEST PATTERN R/W 0h 0 = Each data stream sends test patterns programmed by bits[3:0] of register 37h. 1 = Test patterns are individually programmed for the I and Q stream of each DDC using the TEST PATTERN DDCx y-DATA register bits (where x = 1 or 2 and y = I or Q). 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 107 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.12.23 Register 03Ah (address = 03Ah), Decimation Filter Page Figure 214. Register 03Ah 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 TEST PAT RES R/W-0h 0 TP RES EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 97. Register 03Ah Field Descriptions 108 Bit Field Type Reset Description 7-2 0 W 0h Must write 0 1 TEST PAT RES R/W 0h Pulsing this bit resets the test pattern. The test pattern reset must be enabled first (bit D0). 0 = Normal operation 1 = Reset the test pattern 0 TP RES EN R/W 0h This bit enables the test pattern reset. 0 = Reset disabled 1 = Reset enabled Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.13 Power Detector Page 8.5.13.1 Register 000h (address = 000h), Power Detector Page Figure 215. Register 000h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 PKDET EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 98. Register 000h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 PKDET EN R/W 0h This bit enables the peak power and crossing detector. 0 = Power detector disabled 1 = Power detector enabled 0 8.5.13.2 Register 001h-002h (address = 001h-002h), Power Detector Page Figure 216. Register 001h 7 6 5 4 3 BLKPKDET [7:0] R/W-0h 2 1 0 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Figure 217. Register 002h 7 6 5 4 3 BLKPKDET [15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 99. Register 001h-002h Field Descriptions Bit Field Type Reset Description 7-0 BLKPKDET R/W 0h This register specifies the block length in terms of number of samples (S`) used for peak power computation. Each sample S` is a peak of 8 actual ADC samples. This parameter is a 17-bit value directly in linear scale. In decimation mode, the block length must be a multiple of a divide-by-4 or -6 complex: length = 5 × decimation factor. The divide-by-8 to -32 complex: length = 10 × decimation factor. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 109 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.13.3 Register 003h (address = 003h), Power Detector Page Figure 218. Register 003h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 BLKPKDET[16] R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 100. Register 003h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 BLKPKDET[16] R/W 0h This register specifies the block length in terms of number of samples (S`) used for peak power computation. Each sample S` is a peak of 8 actual ADC samples. This parameter is a 17-bit value directly in linear scale. In decimation mode, the block length must be a multiple of a divide-by-4 or -6 complex: length = 5 × decimation factor. The divide-by-8 to -32 complex: length = 10 × decimation factor. 0 8.5.13.4 Register 007h-00Ah (address = 007h-00Ah), Power Detector Page Figure 219. Register 007h 7 6 5 4 3 2 1 0 2 1 0 2 1 0 2 1 0 BLKTHHH R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 220. Register 008h 7 6 5 4 3 BLKTHHL R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 221. Register 009h 7 6 5 4 3 BLKTHLH R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 222. Register 00Ah 7 6 5 4 3 BLKTHLL R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 101. Register 007h-00Ah Field Descriptions 110 Bit Field Type Reset Description 7-0 BLKTHHH BLKTHHL BLKTHLH BLKTHLL R/W 0h These registers set the four different thresholds for the hysteresis function threshold values from 0 to 256 (2TH), where 256 is equivalent to the peak amplitude. Example: BLKTHHH is set to –2 dBFS from peak: 10(-2 / 20) × 256 = 203, then set 5407h, 5C07h = CBh. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.13.5 Register 00Bh-00Ch (address = 00Bh-00Ch), Power Detector Page Figure 223. Register 00Bh 7 6 5 4 3 2 1 0 2 1 0 DWELL[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 224. Register 00Ch 7 6 5 4 3 DWELL[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 102. Register 00Bh-00Ch Field Descriptions Bit Field Type Reset Description 7-0 DWELL R/W 0h DWELL time counter. When the computed block peak crosses the upper thresholds BLKTHHH or BLKTHLH, the peak detector output flags are set. In order to be reset, the computed block peak must remain continuously lower than the lower threshold (BLKTHHL or BLKTHLL) for the period specified by the DWELL value. This threshold is 16 bits, is specified in terms of fS / 8 clock cycles, and must be set to 0 for the crossing detector. Example: if fS = 3 GSPS, fS / 8 = 375 MHz, and DWELL = 0100h then the DWELL time = 29 / 375 MHz = 1.36 µs. 8.5.13.6 Register 00Dh (address = 00Dh), Power Detector Page Figure 225. Register 00Dh 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 FILT0LPSEL R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 103. Register 00Dh Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 FILT0LPSEL R/W 0h This bit selects either the block detector output or 2-bit output as the input to the IIR filter. 0 = Use the output of the high comparators (HH and HL) as the input of the IIR filter 1 = Combine the output of the high (HH and HL) and low (LH and LL) comparators to generate a 3-level input to the IIR filter (–1, 0, 1) 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 111 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.13.7 Register 00Eh (address = 00Eh), Power Detector Page Figure 226. Register 00Eh 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 2 1 0 TIMECONST R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 104. Register 00Eh Field Descriptions Bit Field Type Reset Description 7-4 0 W 0h Must write 0 3-0 TIMECONST R/W 0h These bits set the crossing detector time period for N = 0 to 15 as 2N × fS / 8 clock cycles. The maximum time period is 32768 × fS / 8 clock cycles (approximately 87 µs at 3 GSPS). 8.5.13.8 Register 00Fh, 010h-012h, and 016h-019h (address = 00Fh, 010h-012h, and 016h-019h), Power Detector Page Figure 227. Register 00Fh 7 6 5 4 3 2 1 0 2 1 0 2 1 0 2 1 0 2 1 0 FIL0THH[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 228. Register 010h 7 6 5 4 3 FIL0THH[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 229. Register 011h 7 6 5 4 3 FIL0THL[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 230. Register 012h 7 6 5 4 3 FIL0THL[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 231. Register 016h 7 6 5 4 3 FIL1THH[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset 112 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Figure 232. Register 017h 7 6 5 4 3 2 1 0 2 1 0 2 1 0 FIL1THH[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 233. Register 018h 7 6 5 4 3 FIL1THL[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 234. Register 019h 7 6 5 4 3 FIL1THL[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 105. Register 00Fh, 010h, 011h, 012h, 016h, 017h, 018h, and 019h Field Descriptions Bit Field Type Reset Description 7-0 FIL0THH FIL0THL FIL1THH FIL1THL R/W 0h Comparison thresholds for the crossing detector counter. This threshold is 16 bits in 2.14 signed notation. A value of 1 (4000h) corresponds to 100% crossings, a value of 0.125 (0800h) corresponds to 12.5% crossings. 8.5.13.9 Register 013h-01Ah (address = 013h-01Ah), Power Detector Page Figure 235. Register 013h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 IIR0 2BIT EN R/W-0h 2 0 W-0h 1 0 W-0h 0 IIR1 2BIT EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Figure 236. Register 01Ah 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 106. Register 013h and 01Ah Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 IIR0 2BIT EN IIR1 2BIT EN R/W 0h This bit enables 2-bit output format of the IIR0 and IIR1 output comparators. 0 = Selects 1-bit output format 1 = Selects 2-bit output format 0 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 113 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.13.10 Register 01Dh-01Eh (address = 01Dh-01Eh), Power Detector Page Figure 237. Register 01Dh 7 6 5 4 3 2 1 0 2 1 0 DWELLIIR[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 238. Register 01Eh 7 6 5 4 3 DWELLIIR[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 107. Register 01Dh-01Eh Field Descriptions Bit Field Type Reset Description 7-0 DWELLIIR R/W 0h DWELL time counter for the IIR output comparators. When the IIR filter output crosses the upper thresholds FIL0THH or FIL1THH, the IIR peak detector output flags are set. In order to be reset, the output of the IIR filter must remain continuously lower than the lower threshold (FIL0THL or FIL1THL) for the period specified by the DWELLIIR value. This threshold is 16 bits and is specified in terms of fS / 8 clock cycles. Example: if fS = 3 GSPS, fS / 8 = 375 MHz, and DWELLIIR = 0100h, then the DWELL time = 29 / 375 MHz = 1.36 µs. 8.5.13.11 Register 020h (address = 020h), Power Detector Page Figure 239. Register 020h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 RMSDET EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 108. Register 020h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 RMSDET EN R/W 0h This bit enables the RMS power detector. 0 = Power detector disabled 1 = Power detector enabled 0 114 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.13.12 Register 021h (address = 021h), Power Detector Page Figure 240. Register 021h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 3 2 PWRDETACCU R/W-0h 1 0 LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 109. Register 021h Field Descriptions Bit Field Type Reset Description 7-5 0 W 0h Must write 0 4-0 PWRDETACCU R/W 0h These bits program the block length to be used for RMS power computation. The block length is defined in terms of fS / 8 clocks and can be programmed as 2M, where M = 0 to 16. 8.5.13.13 Register 022h-025h (address = 022h-025h), Power Detector Page Figure 241. Register 022h 7 6 5 4 3 2 1 0 2 1 0 2 1 0 2 1 0 PWRDETH[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 242. Register 023h 7 6 5 4 3 PWRDETH[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 243. Register 024h 7 6 5 4 3 PWRDETL[7:0] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 244. Register 025h 7 6 5 4 3 PWRDETL[15:8] R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 110. Register 022h-025h Field Descriptions Bit Field Type Reset Description 7-0 PWRDETH[15:0] PWRDETL[15:0] R/W 0h The computed average power is compared against these high and low thresholds. One LSB of the thresholds represents 1 / 216. Example: if PWRDETH is set to –14 dBFS from peak, (10(–14 / 20))2 × 216 = 2609, then set 5422h, 5423h, 5C22h, 5C23h = 0A31h. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 115 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.13.14 Register 027h (address = 027h), Power Detector Page Figure 245. Register 027h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 RMS 2BIT EN R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 111. Register 027h Field Descriptions Bit Field Type Reset Description 7-1 0 W 0h Must write 0 RMS 2BIT EN R/W 0h This bit enables 2-bit output format on the RMS output comparators. 0 = Selects 1-bit output format 1 = Selects 2-bit output format 0 8.5.13.15 Register 02Bh (address = 02Bh), Power Detector Page Figure 246. Register 02Bh 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 RESET AGC R/W-0h 3 0 W-0h 2 0 W-0h 1 0 W-0h 0 0 W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 112. Register 02Bh Field Descriptions Bit Field Type Reset Description 7-5 0 W 0h Must write 0 RESET AGC R/W 0h After configuration, the AGC module must be reset and then brought out of reset to start operation. 0 = Clear AGC reset 1 = Set AGC reset Example: set 542Bh to 10h and then to 00h. 0 W 0h Must write 0 4 3-0 116 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 8.5.13.16 Register 032h-035h (address = 032h-035h), Power Detector Page Figure 247. Register 032h 7 6 5 4 3 OUTSEL GPIO1 R/W-0h 2 1 0 2 1 0 2 1 0 2 1 0 LEGEND: R/W = Read/Write; -n = value after reset Figure 248. Register 033h 7 6 5 4 3 OUTSEL GPIO2 R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 249. Register 034h 7 6 5 4 3 OUTSEL GPIO3 R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Figure 250. Register 035h 7 6 5 4 3 OUTSEL GPIO4 R/W-0h LEGEND: R/W = Read/Write; -n = value after reset Table 113. Register 032h-035h Field Descriptions Bit Field 7-0 OUTSEL OUTSEL OUTSEL OUTSEL GPIO1 GPIO2 GPIO3 GPIO4 Type Reset Description R/W 0h These bits set the function or signal for each GPIO pin. 0 = IIR PK DET0[0] of channel A 1 = IIR PK DET0[1] of channel A (2-bit mode) 2 = IIR PK DET1[0] of channel A 3 = IIR PK DET1[1] of channel A (2-bit mode) 4 = BLKPKDETH of channel A 5 = BLKPKDETL of channel A 6 = PWR Det[0] of channel A 7 = PWR Det[1] of channel A (2-bit mode) 8 = FOVR of channel A 9-17 = Repeat outputs 0-8 but for channel B instead Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 117 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 8.5.13.17 Register 037h (address = 037h), Power Detector Page Figure 251. Register 037h 7 0 W-0h 6 0 W-0h 5 0 W-0h 4 0 W-0h 3 IODIR GPIO4 R/W-0h 2 IODIR GPIO3 R/W-0h 1 IODIR GPIO2 R/W-0h 0 IODIR GPIO1 R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 114. Register 037h Field Descriptions Bit Field Type Reset Description 7-4 0 W 0h Must write 0 3-0 IODIRGPIO[4:1] R/W 0h These bits select the output direction for the GPIO[4:1] pins. 0 = Input (for the NCO control) 1 = Output (for the AGC alarm function) 8.5.13.18 Register 038h (address = 038h), Power Detector Page Figure 252. Register 038h 7 0 W-0h 6 0 W-0h 5 4 3 0 R/W-0h INSEL1 R/W-0h 2 0 R/W-0h 1 0 INSEL0 R/W-0h LEGEND: R/W = Read/Write; W = Write only; -n = value after reset Table 115. Register 038h Field Descriptions Bit Field Type Reset Description 7-6 0 W 0h Must write 0 5-4 INSEL1 R/W 0h These bits select which GPIO pin is used for the INSEL1 bit. 00 = GPIO4 01 = GPIO1 10 = GPIO3 11 = GPIO2 Table 116 lists the NCO selection, based on the bit settings of the INSEL pins. 3-2 0 W 0h Must write 0 1-0 INSEL0 R/W 0h These bits select which GPIO pin is used for the INSEL0 bit. 00 = GPIO4 01 = GPIO1 10 = GPIO3 11 = GPIO2 Table 116 lists the NCO selection, based on the bit settings of the INSEL pins. Table 116. INSEL Bit Settings 118 INSEL1 INSEL2 NCO SELECTED 0 0 NCO1 0 1 NCO2 1 0 NCO3 1 1 n/a Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information 9.1.1 Start-Up Sequence The steps in Table 117 are recommended as the power-up sequence when the ADC32RF8x is in the decimationby-4 complex output mode. Table 117. Initialization Sequence STEP DESCRIPTION PAGE, REGISTER ADDRESS AND DATA COMMENT 1 Supply all supply voltages. There is no required power-supply sequence for the 1.15 V, 1.2 V, and 1.9 V supplies, and can be supplied in any order. — — 2 Provide the SYSREF signal. — — 3 Pulse a hardware reset (low-to-high-to-low) on pins 33 and 34. — — 4 Write the register addresses described in the PowerUpConfig file. See the files located in SBAA226 The Power-up config file contains analog trim registers that are required for best performance of the ADC. Write these registers every time after power up. 5 Write the register addresses mentioned in the ILConfigNyqX_ChA file, where X is the Nyquist zone. See the files located in SBAA226 Based on the signal band of interest, provide the Nyquist zone information to the device. 6 Write the register addresses mentioned in the ILConfigNyqX_ChB file, where X is the Nyquist zone. See the files located in SBAA226 This step optimizes device’ performance by reducing interleaving mismatch errors. 6.1 Wait for 50 ms for the device to estimate the interleaving errors. — — 7 Depending upon the Nyquist band of operation, choose and write the registers from the appropriate file, NLConfigNyqX_ChA, where X is the Nyquist zone. See the files located in SBAA226 Third-order nonlinearity of the device is optimized by this step for channel A. 7.1 Depending upon the Nyquist band of operation, choose and write the registers from the appropriate file, NLConfigNyqX_ChB, where X is the Nyquist zone. See the files located in SBAA226 Third-order nonlinearity of the device is optimized by this step for channel B. Configure the JESD interface and DDC block by writing the registers mentioned in the DDC Config file. See the files located in SBAA226 Determine the DDC and JESD interface LMFS options. Program these options in this step. 8 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 119 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 9.1.2 Hardware Reset Timing information for the hardware reset is shown in Figure 253 and Table 118. Power Supplies t1 RESET t2 t3 SEN Figure 253. Hardware Reset Timing Diagram Table 118. Hardware Reset Timing Information MIN TYP MAX UNIT t1 Power-on delay from power-up to active high RESET pulse 1 ms t2 Reset pulse duration: active high RESET pulse duration 1 µs t3 Register write delay from RESET disable to SEN active 100 ns 120 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 9.1.3 SNR and Clock Jitter The signal-to-noise ratio (SNR) of the ADC is limited by three different factors: quantization noise, thermal noise, and jitter, as shown in Equation 5. The quantization noise is typically not noticeable in pipeline converters and is 84 dB for a 14-bit ADC. The thermal noise limits the SNR at low input frequencies and the clock jitter sets the SNR for higher input frequencies. SNRADC ¬ªdBc ¼º § 20log ¨ 10 ¨ © SNRQuantization Noise 20 · ¸ ¸ ¹ 2 § ¨ 10 ¨ © SNRThermal Noise 20 · ¸ ¸ ¹ 2 § ¨10 ¨ © SNRJitter 20 · ¸ ¸ ¹ 2 (5) The SNR limitation resulting from sample clock jitter can be calculated by Equation 6: 20log 2S u fIN u t Jitter SNRJitter ª¬dBc º¼ (6) The total clock jitter (TJitter) has two components: the internal aperture jitter (90 fS) is set by the noise of the clock input buffer and the external clock jitter. TJitter can be calculated by Equation 7: t Jitter t Jitter , 2 Ext _ Clock _ Input t Aperture_ ADC 2 (7) External clock jitter can be minimized by using high-quality clock sources and jitter cleaners as well as band-pass filters at the clock input. A faster clock slew rate also improves the ADC aperture jitter. The ADC32RF8x has a thermal noise of approximately 63 dBFS and an internal aperture jitter of 90 fS. The SNR, depending on the amount of external jitter for different input frequencies, is shown in Figure 254. 63 62 61 SNR (dBFS) 60 59 58 57 35 fs 50 fs 100 fs 150 fs 200 fs 56 55 54 53 52 10 100 1000 Input Frequency (MHz) 5000 D048 Figure 254. ADC SNR vs Input Frequency and External Clock Jitter Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 121 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 9.1.3.1 External Clock Phase Noise Consideration External clock jitter can be calculated by integrating the phase noise of the clock source out to approximately two times of the ADC sampling rate (2 × fS), as shown in Figure 255. In order to maximize the ADC SNR, an external band-pass filter is recommended to be used on the clock input. This filter reduces the jitter contribution from the broadband clock phase noise floor by effectively reducing the integration bandwidth to the pass band of the band-pass filter. This method is suitable when estimating the overall ADC SNR resulting from clock jitter at a certain input frequency. Clock Phase Noise Integration Bandwidth Frequency Offset fmin 2 u fS Figure 255. Integration Bandwidth for Extracting Jitter from Clock Phase Noise However, when estimating the affect of a nearby blocker (such as a strong in-band interferer to the sensitivity, the phase noise information can be used directly to estimate the noise budget contribution at a certain offset frequency, as shown in Figure 256. Inband Blocker Clock Phase Noise Modulated Onto the Blocker ADC Noise Floor Wanted Signal Figure 256. Small Wanted Signal in Presence of Interferer At the sampling instant, the phase noise profile of the clock source convolves with the input signal (for example, the small wanted signal and the strong interferer merge together). If the power of the clock phase noise in the signal band of interest is too large, the wanted signal cannot not be recovered. The resulting equivalent phase noise at the ADC input is also dependent on the sampling rate of the ADC and frequency of the input signal. The ADC sampling rate scales the clock phase noise, as shown in Equation 8. ADCNSD dBc / Hz PNCLK dBc / Hz §f · 20 u log ¨ S ¸ © fIN ¹ (8) Using this information, the noise contribution resulting from the phase noise profile of the ADC sampling clock can be calculated. 122 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 9.1.4 Power Consumption in Different Modes The ADC32RF8x consumes approximately 6.6 W of power when both channels are active with a divide-by-4 complex output. When different DDC options are used, the power consumption on the DVDD supply changes by a small amount but remains unaffected on other supplies. In the applications requiring just one channel to be active, channel A must be chosen as the active channel and channel B can be powered down. Power consumption reduces to approximately 4 W in single-channel operation with a divide-by-4 option at a 2949.12MSPS device clock rate. Table 119 shows power consumption in different DDC modes for dual-channel and single-channel operation. Table 119. Power Consumption in Different DDC Modes (Sampling Clock Frequency, f S = 3 GSPS) DECIMATION OPTION ACTIVE CHANNEL ACTIVE DDC AVDD19 (mA) AVDD (mA) DVDD (mA) TOTAL POWER (mW) Divide-by-4 Channels A, B Single 1777 970 1785 6545 Divide-by-8 Channels A, B Dual 1777 973 1960 6749 Divide-by-8 Channels A, B Single 1777 973 1730 6485 Divide-by-16 Channels A, B Dual 1777 972 1971 6761 Divide-by-16 Channels A, B Single 1777 972 1705 6455 Divide-by-24 Channels A, B Dual 1771 975 1938 6715 Divide-by-24 Channels A, B Single 1771 972 1667 6400 Divide-by-32 Channels A, B Dual 1768 972 1835 6587 Divide-by-32 Channels A, B Single 1768 970 1574 6285 Divide-by-4 Channel A Single 961 796 1096 4002 Divide-by-8 Channel A Dual 961 790 1168 4078 Divide-by-8 Channel A Single 961 786 1047 3934 Divide-by-16 Channel A Dual 961 789 1172 4081 Divide-by-16 Channel A Single 961 786 1045 3932 Divide-by-24 Channel A Dual 958 785 1155 4051 Divide-by-24 Channel A Single 958 787 1016 3894 Divide-by-32 Channel A Dual 956 788 1104 3992 Divide-by-32 Channel A Single 956 786 978 3845 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 123 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 9.1.5 Using DC Coupling in the ADC32RF8x The ADC32RF8x can be used in dc-coupling applications. However, the following points must be considered when designing the system: 1. Ensure that the correct common-mode voltage is used at the ADC analog inputs. The analog inputs are internally self-biased to VCM through approximately a 33-Ω resistor. The internal biasing resistors also function as a termination resistor. However, if a different termination is required, the external resistor RTERM can be differentially placed between the analog inputs, as shown in Figure 257. The amplifier VOCM pin is recommended to be driven from the CM pin of the ADC to help the amplifier output common-mode voltage track the required common-mode voltage of the ADC. ADC32RF80 ADC Digital INxP OUTP RS / 2 RDC/2(2) Low-Pass Filter Driving Amp RTERM RDC / 2 RCM(1) VCM Offset Corrector Interleaving Engine DDC Block JESD 204B Interface Digital Ouput RS / 2 OUTM INxM VOCM CM Copyright © 2016, Texas Instruments Incorporated (1) Set the INCR CM IMPEDANCE bit to increase the RCM from 0 Ω to > 5000 Ω. (2) RDC is approximately 65 Ω. Figure 257. The ADC32RF8x in a DC-Coupling Application 2. Ensure that the correct SPI settings are written to the ADC. As shown in Figure 258, the ADC32RF8x has a digital block that estimates and corrects the offset mismatch among four interleaving ADC cores for a given channel. Offset Corrector + Data In Freeze Correction Data Out + ± Disable Correction Estimator Figure 258. Offset Corrector in the ADC32RF8x The offset corrector block nullifies dc, fS / 8, fS / 4, 3 fS / 8, and fS / 2. The resulting spectrum becomes free from static spurs at these frequencies. The corrector continuously processes the data coming from the interleaving ADC cores and cannot distinguish if the tone at these frequencies is part of signal or if the tone originated from a mismatch among the interleaving ADC cores. Thus, in applications where the signal is present at these frequencies, the offset corrector block can be bypassed. 124 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 9.1.5.1 Bypassing the Offset Corrector Block When the offset corrector is bypassed, offset mismatch among interleaving ADC cores appears in the ADC output spectrum. To correct the effects of mismatch, place the ADC in an idle channel state (no signal at the ADC inputs) and the corrector must be allowed to run for some time to estimate the mismatch, then the corrector is frozen so that the last estimated value is held. Required register writes are provided in Table 120. Table 120. Freezing and Bypassing the Offset Corrector Block STEP REGISTER WRITE COMMENT STEPS FOR FREEZING THE CORRECTOR BLOCK 1 — Signal source is turned off. The device detects an idle channel at its input. 2 — Wait for at least 0.4 ms for the corrector to estimate the internal offset Address 4001h, value 00h Address 4002h, value 00h Address 4003h, value 00h 3 Select Offset Corr Page Channel A Address 4004h, value 61h 4 Address 6068h, value C2h Freeze the corrector for channel A Address 4003h, value 01h Select Offset Corr Page Channel B Address 6068h, value C2h Freeze the corrector for channel B — Signal source can now be turned on STEPS FOR BYPASSING THE CORRECTOR BLOCK Address 4001h, value 00h Address 4002h, value 00h — Address 4003h, value 00h 1 Address 4004h, value 61h Select Offset Corr Page Channel A Address 6068h, value 46h Disable the corrector for channel A Address 4003h, value 01h Select Offset Corr Page Channel B Address 6068h, value 46h Disable the corrector for channel B 9.1.5.1.1 Effect of Temperature Figure 259 and Figure 260 show the behavior of nfS / 8 tones with respect to temperature when the offset corrector block is frozen or disabled. -40 -20 Average of fS/8 Average of 3fS/8 Average of fS/4 -50 Average of fS/4 Average of fS/8 Average of 3fS/8 -30 Spurs (dBFS) Spurs (dBFS) -40 -60 -70 -80 -50 -60 -70 -80 -90 -100 -40 -90 -15 10 35 Temperature (°C) 60 85 Figure 259. Offset Corrector Block Frozen at Room Temperature -100 -40 -15 10 35 Temperature (°C) 60 85 Figure 260. Offset Corrector Block Disabled Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 125 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 9.2 Typical Application The ADC32RF8x is designed for wideband receiver applications demanding high dynamic range over a large input frequency range. A typical schematic for an ac-coupled receiver is shown in Figure 261. Decoupling capacitors with low ESL are recommended to be placed as close as possible at the pins indicated in Figure 261. Additional capacitors can be placed on the remaining power pins. DVDD Matching Network 10 k 0.1 F Driver SPI Master GND 0.1 F 0.1 F SYSREFP SYSREFM SYNCBP SYNCBM 2 100- 10 nF 72 20 71 21 70 22 69 23 68 24 67 25 66 26 65 27 64 ADC32RF80 28 63 GND PAD (backside) 29 62 30 61 31 60 32 59 33 58 34 57 35 56 36 55 38 39 40 42 43 44 45 46 47 48 49 50 51 52 53 DB2P DB2M DVDD DB1P DVDD 10 nF GND 10 nF DB1M GND 10 nF DB0P DB0M DVDD GPIO4 DVDD 0.1 F GND DA0M DA0P GND 10 nF DA1M FPGA DA1P DVDD DA2M DVDD 10 nF 10 nF GND DA2P 10 nF 54 DA3M DA3P GND DVDD PDN GND RESET DVDD AVDD AVDD19 AVDD AVDD INAP INAM AVDD AVDD19 AVDD GND AVDD19 AVDD 41 Differential 1 19 37 100- Differential 10 nF DVDD AVDD AVDD19 0.1 F 0.1 F GND Driver 3 DB3M GND 4 DB3P AVDD19 5 GND AVDD19 0.1 F AVDD 6 DVDD 0.1 F Low Jitter Clock Generator 7 SDIN GND 8 SCLK 10 nF 9 SEN CLKINM DVDD CLKINP 10 AVDD GND 11 DVDD AVDD19 AVDD 0.1 F AVDD 12 SDOUT Matching Network AVDD19 13 AVDD 0.1 F AVDD19 14 INBP GND 15 INBM 0.1 F 16 AVDD VCM AVDD19 GND GPIO2 GPIO3 AVDD GPIO1 17 10 nF 0.1 F AVDD AVDD19 18 DVDD 0.1 F AVDD19 AVDD 0.1 F DVDD 0.1 F Matching Network Copyright © 2016, Texas Instruments Incorporated Figure 261. Typical Application Implementation Diagram 126 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 Typical Application (continued) 9.2.1 Design Requirements 9.2.1.1 Transformer-Coupled Circuits Typical applications involving transformer-coupled circuits are discussed in this section. To ensure good amplitude and phase balance at the analog inputs, transformers (such as TC1-1-13 and TC1-1-43) can be used from the dc to 1000-MHz range and from the 1000-MHz to 4-GHz range of input frequencies, respectively. When designing the driving circuits, the ADC input impedance (or SDD11) must be considered. By using the simple drive circuit of Figure 262, uniform performance can be obtained over a wide frequency range. The buffers present at the analog inputs of the device help isolate the external drive source from the switching currents of the sampling circuit. 0.1 F T2 T1 5 (Optional) 0.1 F CHx_INP RIN 5 (Optional) 0.1 F 1:1 CIN CHx_INM 1:1 TI Device Copyright © 2016, Texas Instruments Incorporated Figure 262. Input Drive Circuit 9.2.2 Detailed Design Procedure For optimum performance, the analog inputs must be driven differentially. This architecture improves commonmode noise immunity and even-order harmonic rejection. A small resistor (5 Ω to 10 Ω) in series with each input pin is recommended to damp out ringing caused by package parasitics, as shown in Figure 262. 9.2.3 Application Curves 0 0 -10 -10 -20 -20 -30 -30 Amplitude (dBFS) Amplitude (dBFS) Figure 263 and Figure 264 show the typical performance at 100 MHz and 1780 MHz, respectively. -40 -50 -60 -70 -80 -40 -50 -60 -70 -80 -90 -90 -100 -100 -110 -110 0 300 600 900 Input Frequency (MHz) 1200 1500 0 300 D001 600 900 Input Frequency (MHz) 1200 1500 D003 SNR = 61.8 dBFS, SINAD = 61.2 dBFS, HD2 = 71 dBc, HD3 = 75 dBc, SFDR = 71 dBc, THD = 68 dBc, IL spur = 77 dBc, worst spur = 73 dBc SNR = 57.9 dBFS, SINAD = 57.1 dBFS, HD2 = 63 dBc, HD3 = 66 dBc, SFDR = 63 dBc, THD = 60 dBc, IL spur = 79 dBc, worst spur = 77 dBc Figure 263. FFT for 100-MHz Input Frequency Figure 264. FFT for 1780-MHz Input Frequency Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 127 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 10 Power Supply Recommendations The DVDD power supply (1.15 V) must be stable before ramping up the AVDD19 supply (1.9 V), as shown in Figure 265. The AVDD supply (1.15 V) can come up in any order during the power sequence. The power supplies can ramp up at any rate and there is no hard requirement for the time delay between DVDD (1.15 V) ramping up to AVDD (1.9 V) ramping up (which can be in orders of microseconds but is recommended to be a few milliseconds). AVDD (1.15 V) DVDD (1.15 V) AVDD19 (1.9 V) Figure 265. Power Sequencing for the ADC32RF8x Family of devices 11 Layout 11.1 Layout Guidelines The device evaluation module (EVM) layout can be used as a reference layout to obtain the best performance. A layout diagram of the EVM top layer is provided in Figure 266. The ADC32RF45/RF80 EVM Quick Startup Guide provides a complete layout of the EVM. Some important points to remember during board layout are: • Analog inputs are located on opposite sides of the device pinout to ensure minimum crosstalk on the package level. To minimize crosstalk onboard, the analog inputs must exit the pinout in opposite directions, as shown in the reference layout of Figure 266 as much as possible. • In the device pinout, the sampling clock is located on a side perpendicular to the analog inputs in order to minimize coupling. This configuration is also maintained on the reference layout of Figure 266 as much as possible. • Keep digital outputs away from the analog inputs. When these digital outputs exit the pinout, the digital output traces must not be kept parallel to the analog input traces because this configuration can result in coupling from the digital outputs to the analog inputs and degrade performance. All digital output traces to the receiver [such as field-programmable gate arrays (FPGAs) or application-specific integrated circuits (ASICs)] must be matched in length to avoid skew among outputs. • At each power-supply pin (AVDD, DVDD, or AVDD19), keep a 0.1-µF decoupling capacitor close to the device. A separate decoupling capacitor group consisting of a parallel combination of 10-µF, 1-µF, and 0.1-µF capacitors can be kept close to the supply source. 128 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 ADC32RF80, ADC32RF83 www.ti.com SBAS774A – MAY 2016 – REVISED DECEMBER 2016 11.2 Layout Example Figure 266. ADC32RF8xEVM Layout Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 129 ADC32RF80, ADC32RF83 SBAS774A – MAY 2016 – REVISED DECEMBER 2016 www.ti.com 12 Device and Documentation Support 12.1 Documentation Support 12.1.1 Related Documentation For related documentation see the following: • ADC32RF45/RF80 EVM Quick Startup Guide (SLAU620) • Configuration Files for the ADC32RF45 (SBAA226) 12.2 Related Links The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy. Table 121. Related Links PARTS PRODUCT FOLDER SAMPLE & BUY TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY ADC32RF80 Click here Click here Click here Click here Click here ADC32RF83 Click here Click here Click here Click here Click here 12.3 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.4 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.5 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.7 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 130 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: ADC32RF80 ADC32RF83 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) ADC32RF80IRMPR ACTIVE VQFN RMP 72 1500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF80 ADC32RF80IRMPT ACTIVE VQFN RMP 72 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF80 ADC32RF80IRRHR PREVIEW VQFN RRH 72 1500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF80 ADC32RF80IRRHT PREVIEW VQFN RRH 72 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF80 ADC32RF83IRMPR ACTIVE VQFN RMP 72 1500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF83 ADC32RF83IRMPT ACTIVE VQFN RMP 72 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF83 ADC32RF83IRRHR PREVIEW VQFN RRH 72 1500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF83 ADC32RF83IRRHT PREVIEW VQFN RRH 72 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 AZ32RF83 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of