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ADS1018
SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019
ADS1018 Ultrasmall, Low-Power, SPI™-Compatible, 12-Bit,
Analog-to-Digital Converter With Internal Reference and Temperature Sensor
1 Features
3 Description
•
The ADS1018 is a precision, low-power, 12-bit, noisefree, analog-to-digital converter (ADC) that provides
all features necessary to measure the most common
sensor signals in an ultrasmall, leadless, X2QFN-10
or VSSOP-10 package. The ADS1018 integrates a
programmable gain amplifier (PGA), voltage
reference, oscillator and high-accuracy temperature
sensor. These features, along with a wide powersupply range from 2 V to 5.5 V, make the ADS1018
ideally suited for power- and space-constrained,
sensor-measurement applications.
1
•
•
•
•
•
•
•
•
•
•
•
Ultrasmall X2QFN Package
2 mm × 1.5 mm × 0.4 mm
12-Bit Noise-Free Resolution
Wide Supply Range: 2 V to 5.5 V
Low Current Consumption:
– Continuous Mode: Only 150 μA
– Single-Shot Mode: Automatic Power-Down
Programmable Data Rate: 128 SPS to 3300 SPS
Single-Cycle Settling
Internal Low-Drift Voltage Reference
Internal Temperature Sensor:
2°C (max) Error
Internal Oscillator
Internal PGA
Four Single-Ended or Two Differential Inputs
Specified Temperature: –40°C to +125°C
The ADS1018 performs conversions at data rates up
to 3300 samples per second (SPS). The PGA offers
input ranges from ±256 mV to ±6.144 V, allowing
both large and small signals to be measured with
high resolution. An input multiplexer (mux) allows
measurement of two differential or four single-ended
inputs. The high-accuracy temperature sensor is used
for system-level temperature monitoring, or coldjunction compensation for thermocouples.
The ADS1018 operates either in continuousconversion mode, or in a single-shot mode that
automatically powers down after a conversion.
Single-shot mode significantly reduces current
consumption during idle periods. Data are transferred
through a serial peripheral interface (SPI™).
2 Applications
•
•
•
Temperature Measurement:
– Thermocouple Measurement
– Cold-Junction Compensation
– Thermistor Measurement
Portable Instrumentation
Factory Automation and Process Controls
Device Information(1)
PART NUMBER
ADS1018
PACKAGE
BODY SIZE (NOM)
X2QFN (10)
1.50 mm × 2.00 mm
VSSOP (10)
3.00 mm × 3.00 mm
(1) For all available packages, see the package option addendum
at the end of the data sheet.
K-Type Thermocouple Measurement
Using Integrated Temperature Sensor for Cold-Junction Compensation
3.3 V
3.3 V
0.1 F
AIN0
VDD
Voltage
Reference
AIN1
ADS1018
SCLK
Mux
PGA
3.3 V
12-bit
û
ADC
Digital Filter
and
Interface
CS
DOUT/DRDY
DIN
AIN2
Oscillator
AIN3
Temperature
Sensor
GND
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ADS1018
SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019
www.ti.com
Table of Contents
1
2
3
4
5
6
7
8
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Device Comparison Table.....................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
4
4
5
7.1
7.2
7.3
7.4
7.5
7.6
7.7
7.8
5
5
5
5
6
8
8
9
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Timing Requirements: Serial Interface......................
Switching Characteristics: Serial Interface................
Typical Characteristics ..............................................
Detailed Description ............................................ 10
8.1
8.2
8.3
8.4
Overview .................................................................
Functional Block Diagram .......................................
Feature Description.................................................
Device Functional Modes........................................
10
10
11
15
8.5 Programming........................................................... 16
8.6 Register Maps ......................................................... 19
9
Application and Implementation ........................ 21
9.1 Application Information............................................ 21
9.2 Typical Application ................................................. 26
10 Power Supply Recommendations ..................... 29
10.1 Power-Supply Sequencing.................................... 29
10.2 Power-Supply Decoupling..................................... 29
11 Layout................................................................... 30
11.1 Layout Guidelines ................................................. 30
11.2 Layout Example .................................................... 31
12 Device and Documentation Support ................. 32
12.1
12.2
12.3
12.4
12.5
12.6
Documentation Support ........................................
Receiving Notification of Documentation Updates
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
32
32
32
32
32
32
13 Mechanical, Packaging, and Orderable
Information ........................................................... 32
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision C (November 2015) to Revision D
Page
•
Changed maximum VDD voltage from 5.5 V to 7 V in the Absolute Maximum Ratings table............................................... 5
•
Changed bit description of Config Register bit 0.................................................................................................................. 20
Changes from Revision B (October 2013) to Revision C
Page
•
Added ESD Ratings table, Feature Description section, Noise Performance section, Device Functional Modes
section, Application and Implementation section, Power Supply Recommendations section, Layout section, Device
and Documentation Support section, and Mechanical, Packaging, and Orderable Information section .............................. 1
•
Changed title, Description section, Features section, and block diagram on front page ....................................................... 1
•
Changed title from Product Family to Device Comparison Table and deleted Package Designator column ........................ 4
•
Updated descriptions and changed name of I/O column in Pin Configurations and Functions table .................................... 4
•
Changed digital input voltage range and added minimum specification for TJ in Absolute Maximum Ratings table............. 5
•
Added Differential input impedance specification in Electrical Characteristics ...................................................................... 6
•
Changed Condition statement in Timing Requirements: Serial Interface ............................................................................. 8
•
Moved tCSDOD, tDOPD, and tCSDOZ parameters from Timing Requirements to Switching Characteristics ................................ 8
•
Moved tCSDOD and tCSDOZ values from MIN column to MAX column. ...................................................................................... 8
•
Deleted Figure 7, Noise Plot................................................................................................................................................... 9
•
Updated Overview section and deleted "Gain = 2/3, 1, 2, 4, 8, or 16" from Functional Block Diagram ............................. 10
•
Updated Analog Inputs section............................................................................................................................................. 12
•
Updated Full-Scale Range (FSR) and LSB Size section ..................................................................................................... 13
•
Updated Reset and Power Up section ................................................................................................................................. 15
•
Updated 32-Bit Data Transmission Cycle section ................................................................................................................ 18
•
Updated Register Maps section ........................................................................................................................................... 19
•
Updated Application Information section .............................................................................................................................. 21
2
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SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019
•
Updated Figure 21................................................................................................................................................................ 24
•
Deleted Thermocouple Measurement With Cold Junction Temperature section, and moved Figure 23 to Typical
Application section................................................................................................................................................................ 26
Changes from Revision A (December 2012) to Revision B
Page
•
Deleted device graphic ........................................................................................................................................................... 1
•
Changed bit 1 to NOP0 in Table 5 ....................................................................................................................................... 19
•
Changed NOP bit description in Table 5: changed bits[2:0] to bits [2:1] and changed NOP to NOP[1:0]........................... 20
Changes from Original (November 2012) to Revision A
•
Page
Updated page 1 graphic ......................................................................................................................................................... 1
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ADS1018
SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019
www.ti.com
5 Device Comparison Table
DEVICE
RESOLUTION
(Bits)
MAXIMUM SAMPLE
RATE
(SPS)
INPUT CHANNELS
Differential
(Single-Ended)
PGA
INTERFACE
SPECIAL
FEATURES
ADS1118
16
860
2 (4)
Yes
SPI
Temperature sensor
ADS1018
12
3300
2 (4)
Yes
SPI
Temperature sensor
ADS1115
16
860
2 (4)
Yes
I2C
Comparator
ADS1114
16
860
1 (1)
Yes
I2C
Comparator
ADS1113
16
860
1 (1)
No
I2C
None
2
ADS1015
12
3300
2 (4)
Yes
IC
Comparator
ADS1014
12
3300
1 (1)
Yes
I2C
Comparator
ADS1013
12
3300
1 (1)
No
I2C
None
6 Pin Configuration and Functions
RUG Package
10-Pin X2QFN
Top View
DGS Package
10-Pin VSSOP
Top View
DIN
DIN
10
SCLK
1
9
DOUT/
DRDY
CS
2
8
VDD
GND
3
7
AIN3
AIN0
4
6
AIN2
5
SCLK
1
10 DIN
CS
2
9
DOUT/
DRDY
GND
3
8
VDD
AIN0
4
7
AIN3
AIN1
5
6
AIN2
AIN1
AIN1
Pin Functions
PIN
NO.
NAME
TYPE
DESCRIPTION
1
SCLK
Digital input
Serial clock input
2
CS
Digital input
Chip select; active low. Connect to GND if not used.
3
GND
Supply
4
AIN0
Analog input
Analog input 0. Leave unconnected or tie to VDD if not used.
5
AIN1
Analog input
Analog input 1. Leave unconnected or tie to VDD if not used.
6
AIN2
Analog input
Analog input 2. Leave unconnected or tie to VDD if not used.
7
AIN3
Analog input
Analog input 3. Leave unconnected or tie to VDD if not used.
8
VDD
Supply
9
DOUT/DRDY
Digital output
10
DIN
Digital input
4
Ground
Power supply. Connect a 0.1-µF power-supply decoupling capacitor to GND.
Serial data output combined with data ready; active low
Serial data input
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SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019
7 Specifications
7.1 Absolute Maximum Ratings
over operating ambient temperature range (unless otherwise noted) (1)
MIN
MAX
UNIT
–0.3
7
V
AIN0, AIN1, AIN2, AIN3
GND – 0.3
VDD + 0.3
V
DIN, DOUT/DRDY, SCLK, CS
GND – 0.3
VDD + 0.3
V
Any pin except power supply pins
–10
10
mA
Junction, TJ
–40
150
Storage, Tstg
–60
150
Power-supply voltage
VDD to GND
Analog input voltage
Digital input voltage
Input current, continuous
Temperature
(1)
°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic
discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±4000
Charged-device model (CDM), per JEDEC specification JESD22-C101 (2)
±1000
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating ambient temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
POWER SUPPLY
VDD
Power supply
VDD to GND
2
5.5
V
GND
VDD
V
GND
VDD
V
–40
125
°C
ANALOG INPUTS (1)
FSR
Full-scale input voltage (2)
V(AINx)
Absolute input voltage
VIN = V(AINP) – V(AINN)
See Table 1
DIGITAL INPUTS
Input voltage
TEMPERATURE
TA
(1)
(2)
Operating ambient temperature
AINP and AINN denote the selected positive and negative inputs. AINx denotes one of the four available analog inputs.
This parameter expresses the full-scale range of the ADC scaling. No more than VDD + 0.3 V or 5.5 V (whichever is smaller) must be
applied to this device.
7.4 Thermal Information
ADS1018
THERMAL METRIC (1)
DGS (VSSOP)
RUG (X2QFN)
10 PINS
10 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
186.8
245.2
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
51.5
69.3
°C/W
RθJB
Junction-to-board thermal resistance
108.4
172
°C/W
ψJT
Junction-to-top characterization parameter
2.7
8.2
°C/W
ψJB
Junction-to-board characterization parameter
106.5
170.8
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019
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7.5 Electrical Characteristics
Maximum and minimum specifications apply from TA = –40°C to +125°C. Typical specifications are at TA = 25°C.
All specifications are at VDD = 3.3 V and FSR = ±2.048 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ANALOG INPUTS
Common-mode input impedance
FSR = ±6.144 V (1)
8
FSR = ±4.096 V (1), FSR = ±2.048 V
6
FSR = ±1.024 V
3
FSR = ±0.512 V, FSR = ±0.256 V
FSR = ±6.144 V
Differential input impedance
MΩ
100
(1)
22
FSR = ±4.096 V (1)
15
FSR = ±2.048 V
4.9
FSR = ±1.024 V
2.4
FSR = ±0.512 V, FSR = ±0.256 V
710
MΩ
kΩ
SYSTEM PERFORMANCE
Resolution (no missing codes)
DR
INL
12
Data rate
Bits
128, 250, 490, 920, 1600, 2400, 3300
Data rate variation
All data rates
Integral nonlinearity
DR = 128 SPS, FSR = ±2.048 V (2)
Offset error
–10%
10%
0.5
FSR = ±2.048 V, differential inputs
0
FSR = ±2.048 V, single-ended inputs
±0.25
Offset drift
FSR = ±2.048 V
0.002
Offset channel match
Match between any two inputs
Gain error (3)
FSR = ±2.048 V, TA = 25°C
Gain drift
(3) (4)
SPS
±0.5
FSR = ±0.256 V
7
FSR = ±2.048 V
5
FSR = ±6.144 V (1)
5
LSB
LSB/°C
0.25
0.05%
LSB
LSB
0.25%
40
Gain match (3)
Match between any two gains
0.02%
0.1%
Gain channel match
Match between any two inputs
0.05%
0.1%
ppm/°C
TEMPERATURE SENSOR
Temperature range
–40
Temperature resolution
TA = 0°C to 70°C
Accuracy
TA = –40°C to +125°C
versus supply
(1)
(2)
(3)
(4)
6
125
0.125
°C
°C/LSB
0.25
±1
0.5
±2
0.125
±1
°C
°C/V
This parameter expresses the full-scale range of the ADC scaling. No more than VDD + 0.3 V or 5.5 V (whichever is smaller) must be
applied to this device.
Best-fit INL; covers 99% of full-scale.
Includes all errors from onboard PGA and voltage reference.
Maximum value specified by characterization.
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Electrical Characteristics (continued)
Maximum and minimum specifications apply from TA = –40°C to +125°C. Typical specifications are at TA = 25°C.
All specifications are at VDD = 3.3 V and FSR = ±2.048 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DIGITAL INPUTS/OUTPUTS
VIH
High-level input voltage
0.7 VDD
VDD
V
VIL
Low-level input voltage
GND
0.2 VDD
V
VOH
High-level output voltage
IOH = 1 mA
0.8 VDD
VOL
Low-level output voltage
IOL = 1 mA
GND
0.2 VDD
V
IH
Input leakage, high
VIH = 5.5 V
–10
10
μA
IL
Input leakage, low
VIL = GND
–10
10
μA
V
POWER SUPPLY
Power-down, TA = 25°C
IVDD
Supply current
0.5
2
150
200
Power-down
Operating, TA = 25°C
5
Operating
PD
Power dissipation
μA
300
VDD = 5 V
0.9
VDD = 3.3 V
0.5
VDD = 2 V
0.3
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SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019
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7.6 Timing Requirements: Serial Interface
over operating ambient temperature range and VDD = 2 V to 5.5 V (unless otherwise noted)
MIN
(1)
MAX
UNIT
tCSSC
Delay time, CS falling edge to first SCLK rising edge
100
ns
tSCCS
Delay time, final SCLK falling edge to CS rising edge
100
ns
tCSH
Pulse duration, CS high
200
ns
tSCLK
SCLK period
250
ns
tSPWH
Pulse duration, SCLK high
100
ns
100
ns
tSPWL
Pulse duration, SCLK low (2)
tDIST
Setup time, DIN valid before SCLK falling edge
50
ns
tDIHD
Hold time, DIN valid after SCLK falling edge
50
ns
tDOHD
Hold time, SCLK rising edge to DOUT invalid
0
ns
(1)
(2)
28
ms
CS can be tied low permanently in case the serial bus is not shared with any other device.
Holding SCLK low longer than 28 ms resets the SPI interface.
7.7 Switching Characteristics: Serial Interface
over operating ambient temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
tCSDOD
Propagation delay time,
CS falling edge to DOUT driven
DOUT load = 20 pF || 100 kΩ to GND
tDOPD
Propagation delay time,
SCLK rising edge to valid new DOUT
DOUT load = 20 pF || 100 kΩ to GND
tCSDOZ
Propagation delay time,
CS rising edge to DOUT high impedance
DOUT load = 20 pF || 100 kΩ to GND
TYP
0
MAX
UNIT
100
ns
50
ns
100
ns
tCSH
CS
tSCLK
tCSSC
tSPWH
tSCCS
SCLK
tDIHD
tDIST
tSPWL
tSCSC
DIN
tCSDOD
tDOHD
tDOPD
Hi-Z
tCSDOZ
Hi-Z
DOUT
Figure 1. Serial Interface Timing
8
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7.8 Typical Characteristics
at TA = 25°C, VDD = 3.3 V, and FSR = ±2.048 V (unless otherwise noted)
5
300
4.5
Power-Down Current (mA)
Operating Current (mA)
250
VDD = 5 V
200
150
VDD = 3.3 V
VDD = 2 V
100
50
4
3.5
VDD = 2 V
3
2.5
2
VDD = 3.3 V
1.5
1
0.5
0
-40
-20
0
20
40
60
80
100
120
140
-20
0
20
100
120
140
Figure 3. Power-Down Current vs Temperature
60
FSR = ±4.096 V
FSR = ±2.048 V
(1)
FSR = ±1.024 V
FSR = ±0.512 V
50
VDD = 2 V
40
VDD = 5 V
Offset Voltage (mV)
0
-50
-100
-150
-200
VDD = 5 V
-300
-40
30
VDD = 4 V
20
VDD = 3 V
10
0
VDD = 2 V
-10
-250
-20
-20
0
20
40
60
80
100
120
140
-40
-20
0
20
Temperature (°C)
Figure 4. Single-Ended Offset Voltage vs Temperature
1
80
100
120
140
Average Temperature Error
Average “ 3 sigma
Average “ 6 sigma
Temperature Error (ƒC)
0.8
FSR = ±0.512 V
0.02
0.01
FSR = ±1.024 V, ±2.048 V,
(1)
(1)
±4.096 V , and ±6.144 V
0
60
Figure 5. Differential Offset Voltage vs Temperature
FSR = ±0.256 V
0.04
40
Temperature (°C)
0.05
Gain Error (%)
80
Figure 2. Operating Current vs Temperature
50
-0.01
-0.02
-0.03
0.6
0.4
0.2
0
-0.2
-0.4
-0.6
-0.8
-0.04
-1
-40
-20
0
20
40
60
80
100
120
140
-40
Temperature (°C)
-20
0
20
40
60
80
100
Temperature (ƒC)
Figure 6. Gain Error vs Temperature
(1)
60
Temperature (°C)
100
0.03
40
Temperature (°C)
150
Offset Voltage (mV)
VDD = 5 V
0
-40
120
C001
Figure 7. Temperature Sensor Error vs Temperature
This parameter expresses the full-scale range of the ADC scaling. In no event should more than VDD + 0.3 V be
applied to this device.
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8 Detailed Description
8.1 Overview
The ADS1018 is a very small, low-power, noise-free, 12-bit, delta-sigma (ΔΣ) analog-to-digital converter (ADC).
The ADS1018 consists of a ΔΣ ADC core with adjustable gain, an internal voltage reference, a clock oscillator,
and an SPI. This device is also a highly linear and accurate temperature sensor. All of these features are
intended to reduce required external circuitry and improve performance. The Functional Block Diagram section
shows the ADS1018 functional block diagram.
The ADS1018 ADC core measures a differential signal, VIN, that is the difference of V(AINP) and V(AINN). The
converter core consists of a differential, switched-capacitor ΔΣ modulator followed by a digital filter. This
architecture results in a very strong attenuation in any common-mode signals. Input signals are compared to the
internal voltage reference. The digital filter receives a high-speed bitstream from the modulator and outputs a
code proportional to the input voltage.
The ADS1018 has two available conversion modes: single-shot and continuous-conversion. In single-shot mode,
the ADC performs one conversion of the input signal upon request and stores the value to an internal conversion
register. The device then enters a power-down state. This mode is intended to provide significant power savings
in systems that require only periodic conversions or when there are long idle periods between conversions. In
continuous-conversion mode, the ADC automatically begins a conversion of the input signal as soon as the
previous conversion is completed. The rate of continuous conversion is equal to the programmed data rate. Data
can be read at any time and always reflect the most recently completed conversion.
8.2 Functional Block Diagram
VDD
Device
Voltage
Reference
Mux
CS
AIN0
SCLK
AIN1
PGA
12-Bit ΔΣ
ADC
Serial
Peripheral
Interface
DIN
DOUT/DRDY
AIN2
Oscillator
AIN3
Temperature
Sensor
GND
10
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8.3 Feature Description
8.3.1 Multiplexer
The ADS1018 contains an input multiplexer (mux), as shown in Figure 8. Either four single-ended or two
differential signals can be measured. Additionally, AIN0, AIN1, and AIN2 can be measured differentially to AIN3.
The multiplexer is configured by bits MUX[2:0] in the Config register. When single-ended signals are measured,
the negative input of the ADC is internally connected to GND by a switch within the multiplexer.
VDD
Device
AIN0
VDD
GND
AINP
AIN1
AINN
VDD
GND
AIN2
VDD
GND
AIN3
GND
GND
Figure 8. Input Multiplexer
When measuring single-ended inputs, the device does not output negative codes. These negative codes indicate
negative differential signals; that is, (V(AINP) – V(AINN)) < 0. Electrostatic discharge (ESD) diodes to VDD and GND
protect the ADS1018 inputs. To prevent the ESD diodes from turning on, keep the absolute voltage on any input
within the range given in Equation 1:
GND – 0.3 V < V(AINx) < VDD + 0.3 V
(1)
If the voltages on the input pins can possibly violate these conditions, use external Schottky diodes and series
resistors to limit the input current to safe values (see the Absolute Maximum Ratings table).
Also, overdriving one unused input on the ADS1018 may affect conversions currently taking place on other input
pins. If overdriving unused inputs is possible, clamp the signal with external Schottky diodes.
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Feature Description (continued)
8.3.2 Analog Inputs
The ADS1018 uses a switched-capacitor input stage where capacitors are continuously charged and then
discharged to measure the voltage between AINP and AINN. This frequency at which the input signal is sampled
is called the sampling frequency or the modulator frequency (f(MOD)). The ADS1018 has a 1-MHz internal
oscillator which is further divided by a factor of 4 to generate the modulator frequency at 250 kHz. The capacitors
used in this input stage are small, and to external circuitry, the average loading appears resistive. This structure
is shown in Figure 9. The resistance is set by the capacitor values and the rate at which they are switched.
Figure 10 shows the setting of the switches illustrated in Figure 9. During the sampling phase, switches S1 are
closed. This event charges CA1 to V(AINP), CA2 to V(AINN), and CB to (V(AINP) – V(AINN)). During the discharge phase,
S1 is first opened and then S2 is closed. Both CA1 and CA2 then discharge to approximately 0.7 V and CB
discharges to 0 V. This charging draws a very small transient current from the source driving the ADS1018
analog inputs. The average value of this current can be used to calculate the effective impedance (Zeff), where
Zeff = VIN / IAVERAGE.
0.7 V
CA1
AINP
S1
ZCM
S2
0.7 V
Equivalent
Circuit
AINP
CB
S1
ZDIFF
S2
AINN
AINN
0.7 V
CA2
ZCM
f(MOD) = 250 kHz
0.7 V
Figure 9. Simplified Analog Input Circuit
tSAMPLE
ON
S1
OFF
ON
S2
OFF
Figure 10. S1 and S2 Switch Timing
Common-mode input impedance is measured by applying a common-mode signal to the shorted AINP and AINN
inputs and measuring the average current consumed by each pin. The common-mode input impedance changes
depending on the full-scale range, but is approximately 6 MΩ for the default full-scale range. In Figure 9, the
common-mode input impedance is ZCM.
The differential input impedance is measured by applying a differential signal to AINP and AINN inputs where one
input is held at 0.7 V. The current that flows through the pin connected to 0.7 V is the differential current and
scales with the full-scale range. In Figure 9, the differential input impedance is ZDIFF.
Make sure to consider the typical value of the input impedance. Unless the input source has a low impedance,
the ADS1018 input impedance may affect the measurement accuracy. For sources with high output impedance,
buffering may be necessary. Active buffers introduce noise, and also introduce offset and gain errors. Consider
all of these factors in high-accuracy applications.
The clock oscillator frequency drifts slightly with temperature; therefore, the input impedances also drift. For most
applications, this input impedance drift is negligible, and can be ignored.
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Feature Description (continued)
8.3.3 Full-Scale Range (FSR) and LSB Size
A programmable gain amplifier (PGA) is implemented in front of the ADS1018 ΔΣ ADC core. The full-scale range
is configured by bits PGA[2:0] in the Config register, and can be set to ±6.144 V, ±4.096 V, ±2.048 V, ±1.024 V,
±0.512 V, or ±0.256 V.
Table 1 shows the FSR together with the corresponding LSB size. Calculate the LSB size from the full-scale
voltage by the formula shown in Equation 2. However, make sure that the analog input voltage never exceeds
the analog input voltage range limit given in the Electrical Characteristics. If VDD greater than 4 V is used, the
±6.144-V full-scale range allows input voltages to extend up to the supply. Note though that in this case, or
whenever the supply voltage is less than the full-scale range (for example, VDD = 3.3 V and full-scale range =
±4.096 V), a full-scale ADC output code cannot be obtained. This inability means that some dynamic range is
lost.
LSB = FSR / 212
(2)
Table 1. Full-Scale Range and Corresponding LSB Size
(1)
FSR
LSB SIZE
±6.144 V (1)
3 mV
±4.096 V (1)
2 mV
±2.048 V
1 mV
±1.024 V
0.5 mV
±0.512 V
0.25 mV
±0.256 V
0.125 mV
This parameter expresses the full-scale range of the ADC scaling.
Do not apply more than VDD + 0.3 V to this device.
8.3.4 Voltage Reference
The ADS1018 has an integrated voltage reference. An external reference cannot be used with this device. Errors
associated with the initial voltage reference accuracy and the reference drift with temperature are included in the
gain error and gain drift specifications in the Electrical Characteristics.
8.3.5 Oscillator
The ADS1018 has an integrated oscillator running at 1 MHz. No external clock is required to operate the device.
The internal oscillator drifts over temperature and time. The output data rate scales proportionally with the
oscillator frequency.
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8.3.6 Temperature Sensor
The ADS1018 offers an integrated precision temperature sensor. To enable the temperature sensor mode, set bit
TS_MODE = 1 in the Config register. Temperature data are represented as a 12-bit result that is left-justified
within the 16-bit conversion result. Data are output starting with the most significant byte (MSB). When reading
the two data bytes, the first 12 bits are used to indicate the temperature measurement result. One 12-bit LSB
equals 0.125°C. Negative numbers are represented in binary twos complement format, as shown in Table 2.
Table 2. 12-Bit Temperature Data Format
TEMPERATURE (°C)
DIGITAL OUTPUT (BINARY)
128
0 100 0000 0000
HEX
400
127.875
0 011 1111 1111
3FF
100
0 011 0010 0000
320
80
0 010 1000 0000
280
75
0 010 0101 1000
258
50
0 001 1001 0000
190
25
0 000 1100 1000
0C8
0.25
0 000 0000 0010
002
0
0 000 0000 0000
000
–0.25
1 111 1111 1110
FFE
–25
1 111 0011 1000
F38
–40
1 110 1100 0000
EC0
8.3.6.1 Converting from Temperature to Digital Codes
For positive temperatures:
Twos complement is not performed on positive numbers. Therefore, simply convert the number to binary
code in a 12-bit, left justified format with the MSB = 0 to denote the positive sign.
Example: 50°C / (0.125°C/count) = 400 = 190h = 0001 1001 0000
For negative temperatures:
Generate the twos complement of a negative number by complementing the absolute binary number and
adding 1. Then, denote the negative sign with the MSB = 1.
Example: |–25°C| / (0.125/count) = 200 = 0C8h = 0000 1100 1000
Twos complement format: 1111 0011 01111 + 1 = 1111 0011 1000
8.3.6.2 Converting from Digital Codes to Temperature
To convert from digital codes to temperature, first check whether the MSB is a 0 or a 1. If the MSB is a 0,
simply multiply the decimal code by 0.125°C to obtain the result. If the MSB = 1, subtract 1 from the result
and complement all of the bits. Then, multiply the result by –0.125°C.
Example: The device reads back 258h: 258h has an MSB = 0.
258h × 0.125°C = 600 × 0.125°C = +75°C
Example: The device reads back F38h: F38h has an MSB = 1.
Subtract 1 and complement the result: F38h → C8h
C8h × (–0.125°C) = 200 × (–0.125°C) = –25°C
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8.4 Device Functional Modes
8.4.1 Reset and Power-Up
When the ADS1018 powers up, the device resets. As part of the reset process, the ADS1018 sets all bits in the
Config register to the respective default settings. By default, the ADS1018 enters a power-down state at start-up.
The device interface and digital blocks are active, but no data conversions are performed. The initial power-down
state of the ADS1018 relieves systems with tight power-supply requirements from encountering a surge during
power-up.
8.4.2 Operating Modes
The ADS1018 operates in one of two modes: continuous-conversion or single-shot. The MODE bit in the Config
register selects the respective operating mode.
8.4.2.1 Single-Shot Mode and Power-Down
When the MODE bit in the Config register is set to 1, the ADS1018 enters a power-down state, and operates in
single-shot mode. This power-down state is the default state for the ADS1018 when power is first applied.
Although powered down, the device still responds to commands. The ADS1018 remains in this power-down state
until a 1 is written to the single-shot (SS) bit in the Config register. When the SS bit is asserted, the device
powers up, resets the SS bit to 0, and starts a single conversion. When conversion data are ready for retrieval,
the device powers down again. Writing a 1 to the SS bit while a conversion is ongoing has no effect. To switch to
continuous-conversion mode, write a 0 to the MODE bit in the Config register.
8.4.2.2 Continuous-Conversion Mode
In continuous-conversion mode (MODE bit set to 0), the ADS1018 continuously performs conversions. When a
conversion completes, the ADS1018 places the result in the Conversion register and immediately begins another
conversion. To switch to single-shot mode, write a 1 to the MODE bit in the Config register, or reset the device.
8.4.3 Duty Cycling for Low Power
The noise performance of a ΔΣ ADC generally improves when lowering the output data rate because more
samples of the internal modulator are averaged to yield one conversion result. In applications where power
consumption is critical, the improved noise performance at low data rates may not be required. For these
applications, the ADS1018 supports duty cycling that can yield significant power savings by periodically
requesting high data-rate readings at an effectively lower data rate.
For example, an ADS1018 in power-down state with a data rate set to 3300 SPS can be operated by a
microcontroller that instructs a single-shot conversion every 7.8 ms (128 SPS). A conversion at 3300 SPS only
requires approximately 0.3 ms; therefore, the ADS1018 enters power-down state for the remaining 7.5 ms. In this
configuration, the ADS1018 consumes approximately 1/25 the power that is otherwise consumed in continuousconversion mode. The duty cycling rate is completely arbitrary and is defined by the master controller. The
ADS1018 offers lower data rates that do not implement duty cycling and also offers improved noise performance,
if required.
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8.5 Programming
8.5.1 Serial Interface
The SPI-compatible serial interface consists of either four signals (CS, SCLK, DIN, and DOUT/DRDY), or three
signals (SCLK, DIN, and DOUT/DRDY, with CS tied low). The interface is used to read conversion data, read
from and write to registers, and control device operation.
8.5.2 Chip Select (CS)
The chip select pin (CS) selects the ADS1018 for SPI communication. This feature is useful when multiple
devices share the same serial bus. Keep CS low for the duration of the serial communication. When CS is taken
high, the serial interface is reset, SCLK is ignored, and DOUT/DRDY enters a high-impedance state. In this state,
DOUT/DRDY cannot provide data-ready indication. In situations where multiple devices are present and
DOUT/DRDY must be monitored, lower CS periodically. At this point, the DOUT/DRDY pin either immediately
goes high to indicate that no new data are available, or immediately goes low to indicate that new data are
present in the Conversion register and are available for transfer. New data can be transferred at any time without
concern of data corruption. When a transmission starts, the current result is locked into the output shift register
and does not change until the communication completes. This system avoids any possibility of data corruption.
8.5.3 Serial Clock (SCLK)
The serial clock pin (SCLK) features a Schmitt-triggered input and is used to clock data on the DIN and
DOUT/DRDY pins into and out of the ADS1018. Even though the input has hysteresis, keep SCLK as clean as
possible to prevent glitches from accidentally shifting the data. To reset the serial interface, hold SCLK low for 28
ms, and the next SCLK pulse starts a new communication cycle. Use this time-out feature to recover
communication when a serial interface transmission is interrupted. When the serial interface is idle, hold SCLK
low.
8.5.4 Data Input (DIN)
The data input pin (DIN) is used along with SCLK to send data to the ADS1018. The device latches data on DIN
at the SCLK falling edge. The ADS1018 never drives the DIN pin.
8.5.5 Data Output and Data Ready (DOUT/DRDY)
The data output and data ready pin (DOUT/DRDY) is used with SCLK to read conversion and register data from
the ADS1018. Data on DOUT/DRDY are shifted out on the SCLK rising edge. DOUT/DRDY is also used to
indicate that a conversion is complete and new data are available. This pin transitions low when new data are
ready for retrieval. DOUT/DRDY is also able to trigger a microcontroller to start reading data from the ADS1018.
In continuous-conversion mode, DOUT/DRDY transitions high again 8 µs before the next data ready signal
(DOUT/DRDY low) if no data are retrieved from the device. This transition is shown in Figure 11. Complete the
data transfer before DOUT/DRDY returns high.
CS(1)
SCLK
8 µs
Hi-Z
DOUT/DRDY
DIN
(1)
CS can be held low if the ADS1018 does not share the serial bus with another device. If CS is low, DOUT/DRDY
asserts low indicating new data are available.
Figure 11. DOUT/DRDY Behavior Without Data Retrieval in Continuous-Conversion Mode
When CS is high, DOUT/DRDY is configured by default with a weak internal pullup resistor. This feature reduces
the risk of DOUT/DRDY floating near midsupply and causing leakage current in the master device. To disable
this pullup resistor and place the device into a high-impedance state, set the PULL_UP_EN bit to 0 in the Config
register.
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Programming (continued)
8.5.6 Data Format
The ADS1018 provides 12 bits of data in binary twos complement format that is left justified within the 16-bit data
word. A positive full-scale (+FS) input produces an output code of 7FF0h and a negative full-scale (–FS) input
produces an output code of 8000h. The output clips at these codes for signals that exceed full-scale. Table 3
summarizes the ideal output codes for different input signals. Figure 12 shows code transitions versus input
voltage.
Table 3. Input Signal versus Ideal Output Code
(1)
INPUT SIGNAL, VIN
(AINP – AINN)
IDEAL OUTPUT CODE (1)
≥ +FS (211 – 1) / 211
7FF0h
+FS / 211
0010h
0
0
–FS / 211
FFF0h
≤ –FS
8000h
Excludes the effects of noise, INL, offset, and gain errors.
7FF0h
0001h
0000h
FFF0h
¼
Output Code
¼
7FE0h
8010h
8000h
¼
-FS
0
FS
¼
Input Voltage (AINP - AINN)
11
2 -1
-FS
2
11
11
2 -1
FS
2
11
Figure 12. Code Transition Diagram
8.5.7 Data Retrieval
Data is written to and read from the ADS1018 in the same manner for both single-shot and continuous
conversion modes, without having to issue any commands. The operating mode for the ADS1018 is selected by
the MODE bit in the Config register.
Set the MODE bit to 0 to put the device in continuous-conversion mode. In continuous-conversion mode, the
device is constantly starting new conversions even when CS is high.
Set the MODE bit to 1 for single-shot mode. In single-shot mode, a new conversion only starts by writing a 1 to
the SS bit.
The conversion data are always buffered, and retain the current data until replaced by new conversion data.
Therefore, data can be read at any time without concern of data corruption. When DOUT/DRDY asserts low,
indicating that new conversion data are ready, the conversion data are read by shifting the data out on
DOUT/DRDY. The MSB of the data (bit 15) on DOUT/DRDY is clocked out on the first SCLK rising edge. At the
same time that the conversion result is clocked out of DOUT/DRDY, new Config register data are latched on DIN
on the SCLK falling edge.
The ADS1018 also offers the possibility of direct readback of the Config register settings in the same data
transmission cycle. One complete data transmission cycle consists of either 32 bits (when the Config register
data readback is used) or 16 bits (only used when the CS line can be controlled and is not permanently tied low).
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8.5.7.1 32-Bit Data Transmission Cycle
The data in a 32-bit data transmission cycle consist of four bytes: two bytes for the conversion result, and an
additional two bytes for the Config register readback. The device always reads the MSB first.
Write the same Config register setting twice during one transmission cycle as shown in Figure 13. If convenient,
write the Config register setting once during the first half of the transmission cycle, and then hold the DIN pin
either low (as shown in Figure 14) or high during the second half of the cycle. If no update to the Config register
is required, hold the DIN pin either low or high during the entire transmission cycle. The Config register setting
written in the first two bytes of a 32-bit transmission cycle is read back in the last two bytes of the same cycle.
CS(1)
1
9
17
25
SCLK
DOUT/DRDY
Hi-Z
DIN
(1)
DATA MSB
DATA LSB
CONFIG MSB
CONFIG LSB
CONFIG MSB
CONFIG LSB
CONFIG MSB
CONFIG LSB
Next Data Ready
CS can be held low if the ADS1018 does not share the serial bus with another device. If CS is low, DOUT/DRDY
asserts low indicating new data are available.
Figure 13. 32-Bit Data Transmission Cycle With Config Register Readback
CS(1)
1
9
17
25
SCLK
DOUT/DRDY
Hi-Z
DIN
(1)
DATA MSB
DATA LSB
CONFIG MSB
CONFIG LSB
CONFIG MSB
CONFIG LSB
Next Data Ready
CS can be held low if the ADS1018 does not share the serial bus with another device. If CS is low, DOUT/DRDY
asserts low indicating new data are available.
Figure 14. 32-Bit Data Transmission Cycle: DIN Held Low
8.5.7.2 16-Bit Data Transmission Cycle
If Config register data are not required to be read back, the ADS1018 conversion data can be clocked out in a
short 16-bit data transmission cycle, as shown in Figure 15. Take CS high after the 16th SCLK cycle to reset the
SPI interface. The next time CS is taken low, data transmission starts with the currently buffered conversion
result on the first SCLK rising edge. If DOUT/DRDY is low when data retrieval starts, the conversion buffer is
already updated with a new result. Otherwise, if DOUT/DRDY is high, the same result from the previous data
transmission cycle is read.
CS
1
9
1
9
SCLK
DOUT/DRDY
DIN
Hi-Z
DATA MSB
DATA LSB
DATA MSB
DATA LSB
CONFIG MSB
CONFIG LSB
CONFIG MSB
CONFIG LSB
Figure 15. 16-Bit Data Transmission Cycle
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8.6 Register Maps
The ADS1018 has two registers that are accessible through the SPI. The Conversion register contains the result
of the last conversion. The Config register allows the user to change the ADS1018 operating modes and query
the status of the devices.
8.6.1 Conversion Register [reset = 0000h]
The 16-bit Conversion register contains the result of the last conversion in binary twos complement format.
Following power up, the Conversion register is cleared to 0, and remains 0 until the first conversion is complete.
The register format is shown in Figure 16.
Figure 16. Conversion Register
15
D11
R-0h
7
D3
14
D10
R-0h
6
D2
13
D9
R-0h
5
D1
12
D8
R-0h
4
D0
R-0h
R-0h
R-0h
R-0h
11
D7
R-0h
3
10
D6
R-0h
2
9
D5
R-0h
1
8
D4
R-0h
0
Reserved
R-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 4. Conversion Register Field Descriptions
Field
Type
Reset
Description
15:4
Bit
D[11:0]
R
000h
12-bit conversion result
3:0
Reserved
R
0h
Always reads back 0h
8.6.2 Config Register [reset = 058Bh]
The 16-bit Config register can be used to control the ADS1018 operating mode, input selection, data rate, fullscale range, and temperature sensor mode. The register format is shown in Figure 17.
Figure 17. Config Register
15
SS
R/W-0h
7
14
13
MUX[2:0]
R/W-0h
5
6
DR[2:0]
R/W-4h
12
11
4
TS_MODE
R/W-0h
3
PULL_UP_EN
R/W-1h
10
PGA[2:0]
R/W-2h
2
NOP[1:0]
R/W-1h
9
1
8
MODE
R/W-1h
0
Reserved
R-1h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 5. Config Register Field Descriptions
Bit
Field
Type
Reset
Description
Single-shot conversion start
This bit is used to start a single conversion. SS can only be written when in
power-down state and has no effect when a conversion is ongoing.
15
SS
R/W
0h
When writing:
0 = No effect
1 = Start a single conversion (when in power-down state)
Always reads back 0 (default).
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Table 5. Config Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
Input multiplexer configuration
These bits configure the input multiplexer.
14:12
MUX[2:0]
R/W
0h
000 = AINP
001 = AINP
010 = AINP
011 = AINP
100 = AINP
101 = AINP
110 = AINP
111 = AINP
is
is
is
is
is
is
is
is
AIN0
AIN0
AIN1
AIN2
AIN0
AIN1
AIN2
AIN3
and AINN is
and AINN is
and AINN is
and AINN is
and AINN is
and AINN is
and AINN is
and AINN is
AIN1 (default)
AIN3
AIN3
AIN3
GND
GND
GND
GND
Programmable gain amplifier configuration
These bits configure the programmable gain amplifier.
11:9
8
PGA[2:0]
MODE
R/W
R/W
2h
1h
000 = FSR is ±6.144
001 = FSR is ±4.096
010 = FSR is ±2.048
011 = FSR is ±1.024
100 = FSR is ±0.512
101 = FSR is ±0.256
110 = FSR is ±0.256
111 = FSR is ±0.256
V (1)
V (1)
V (default)
V
V
V
V
V
Device operating mode
This bit controls the ADS1018 operating mode.
0 = Continuous-conversion mode
1 = Power-down and single-shot mode (default)
Data rate
These bits control the data-rate setting.
7:5
4
3
DR[2:0]
TS_MODE
PULL_UP_EN
R/W
R/W
R/W
4h
0h
1h
000 = 128 SPS
001 = 250 SPS
010 = 490 SPS
011 = 920 SPS
100 = 1600 SPS (default)
101 = 2400 SPS
110 = 3300 SPS
111 = Not Used
Temperature sensor mode
This bit configures the ADC to convert temperature or input signals.
0 = ADC mode (default)
1 = Temperature sensor mode
Pullup enable
This bit enables a weak internal pullup resistor on the DOUT/DRDY pin only
when CS is high. When enabled, an internal 400-kΩ resistor connects the bus
line to supply. When disabled, the DOUT/DRDY pin floats.
0 = Pullup resistor disabled on DOUT/DRDY pin
1 = Pullup resistor enabled on DOUT/DRDY pin (default)
2:1
NOP[1:0]
R/W
1h
No operation
The NOP[1:0] bits control whether data are written to the Config register or not.
For data to be written to the Config register, the NOP[1:0] bits must be 01. Any
other value results in a NOP command. DIN can be held high or low during SCLK
pulses without data being written to the Config register.
00
01
10
11
= Invalid data; do not update the contents of the Config register
= Valid data; update the Config register (default)
= Invalid data; do not update the contents of the Config register
= Invalid data; do not update the contents of the Config register
Reserved
0
(1)
20
Reserved
R
1h
Writing either 0 or 1 to this bit has no effect.
Always reads back 1.
This parameter expresses the full-scale range of the ADC scaling. Do not apply more than VDD + 0.3 V to this device.
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The ADS1018 is a precision, 12-bit ΔΣ ADC that offers many integrated features to ease the measurement of the
most common sensor types including various type of temperature and bridge sensors. The following sections
give example circuits and suggestions for using the ADS1018 in various situations.
9.1.1 Serial Interface Connections
The principle serial interface connections for the ADS1018 are shown in Figure 18.
Device
10
DIN
Microcontroller or
Microprocessor
with SPI Port
1
SCLK
2
VDD
DOUT/DRDY
9
CS
VDD
8
3
GND
AIN3
7
4
AIN0
AIN2
6
0.1 µF
AIN1
5
50 W
DOUT
50 W
DIN
50 W
Inputs Selected
from Configuration
Register
CS
50 W
SCLK
Figure 18. Typical Connections
Most microcontroller SPI peripherals operate with the ADS1018. The interface operates in SPI mode 1 where
CPOL = 0 and CPHA = 1, SCLK idles low, and data are launched or changed only on SCLK rising edges; data
are latched or read by the master and slave on SCLK falling edges. Details of the SPI communication protocol
employed by the ADS1018 can be found in the Timing Requirements: Serial Interface section.
It is a good practice to place 50-Ω resistors in the series path to each of the digital pins to provide some shortcircuit protection. Take care to still meet all SPI timing requirements because these additional series resistors
along with the bus parasitic capacitances present on the digital signal lines slews the signals.
The fully-differential input of the ADS1018 is ideal for connecting to differential sources (such as thermocouples
and thermistors) with a moderately low source impedance. Although the ADS1018 can read fully-differential
signals, the device cannot accept negative voltages on either of its inputs because of ESD protection diodes on
each pin. When an input exceeds supply or drops below ground, these diodes turn on to prevent any ESD
damage to the device.
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Application Information (continued)
9.1.2
GPIO Ports for Communication
Most microcontrollers have programmable input/output (I/O) pins that can be set in software to act as inputs or
outputs. If an SPI controller is not available, the ADS1018 can be connected to GPIO pins and the SPI bus
protocol can be simulated. Using GPIO pins to generate the SPI interface requires only that the pins be
configured as push or pull inputs or outputs. Furthermore, if the SCLK line is held low for more than 28 ms,
communication times out. This condition means that the GPIO ports must be capable of providing SCLK pulses
with no more than 28 ms between pulses.
9.1.3 Analog Input Filtering
Analog input filtering serves two purposes: first, to limit the effect of aliasing during the sampling process and
second, to reduce external noise from being a part of the measurement.
As with any sampled system, aliasing can occur if proper antialias filtering is not in place. Aliasing occurs when
frequency components are present in the input signal that are higher than half the sampling frequency of the
ADC (also known as the Nyquist frequency). These frequency components fold back and show up in the actual
frequency band of interest below half the sampling frequency. The filter response of the digital filter repeats at
multiples of the sampling frequency, also known as modulator frequency f(MOD), as shown in Figure 19. Signals or
noise up to a frequency where the filter response repeats are attenuated to a certain amount by the digital filter
depending on the filter architecture. Any frequency components present in the input signal around the modulator
frequency or multiples thereof are not attenuated and alias back into the band of interest, unless attenuated by
an external analog filter.
Magnitude
Sensor
Signal
Unwanted
Signals
Unwanted
Signals
Output
Data Rate
f(MOD)/2
f(MOD)
Frequency
f(MOD)
Frequency
f(MOD)
Frequency
Magnitude
Digital Filter
Aliasing of
Unwanted Signals
Output
Data Rate
f(MOD)/2
Magnitude
External
Antialiasing Filter
Roll-Off
Output
Data Rate
f(MOD)/2
Figure 19. Effect of Aliasing
22
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Application Information (continued)
Many sensor signals are inherently band-limited; for example, the output of a thermocouple has a limited rate of
change. In this case the sensor signal does not alias back into the pass-band when using a ΔΣ ADC. However,
any noise pickup along the sensor wiring or the application circuitry can potentially alias into the pass band.
Power line-cycle frequency and harmonics are one common noise source. External noise can also be generated
from electromagnetic interference (EMI) or radio frequency interference (RFI) sources, such as nearby motors
and cellular phones. Another noise source typically exists on the printed-circuit-board (PCB) itself in the form of
clocks and other digital signals. Analog input filtering helps remove unwanted signals from affecting the
measurement result.
A first-order, resistor-capacitor (RC) filter is, in most cases, sufficient to either totally eliminate aliasing, or to
reduce the effect of aliasing to a level within the noise floor of the sensor. Ideally, any signal beyond f(MOD) / 2 is
attenuated to a level below the noise floor of the ADC. The digital filter of the ADS1018 attenuates signals to a
certain degree. In addition, noise components are usually smaller in magnitude than the actual sensor signal.
Therefore, using a first-order RC filter with a cutoff frequency set at the output data rate or ten times higher is
generally a good starting point for a system design.
9.1.4 Single-Ended Inputs
Although the ADS1018 has two differential inputs, the device can measure four single-ended signals. Figure 20
shows a single-ended connection scheme. The ADS1018 is configured for single-ended measurement by
configuring the mux to measure each channel with respect to ground. Data are then read out of one input based
on the selection in the Config register. The single-ended signal can range from 0 V up to positive supply or +FS,
whichever is lower. Negative voltages cannot be applied to this circuit because the ADS1018 can only accept
positive voltages with respect to ground. The ADS1018 does not lose linearity within the input range.
The ADS1018 offers a differential input voltage range of ±FS. The single-ended circuit shown in Figure 20,
however, only uses the positive half of the ADS1018 FS input voltage range because differentially negative
inputs are not produced. Because only half of the FS range is used, one bit of resolution is lost. For optimal noise
performance, use differential configurations whenever possible. Differential configurations maximize the dynamic
range of the ADC and provide strong attenuation of common-mode noise.
VDD
Device
10
DIN
1
SCLK
DOUT/DRDY
9
2
CS
VDD
8
3
GND
AIN3
7
4
AIN0
AIN2
6
0.1 µF
AIN1
5
Inputs Selected
from Configuration
Register
NOTE: Digital pin connections omitted for clarity.
Figure 20. Measuring Single-Ended Inputs
The ADS1018 also allows AIN3 to serve as a common point for measurements by adjusting the mux
configuration. AIN0, AIN1, and AIN2 can all be measured with respect to AIN3. In this configuration, the
ADS1018 operates with inputs where AIN3 serves as the common point. This ability improves the usable range
over the single-ended configuration because negative differential voltages are allowed when GND < V(AIN3) <
VDD; however, common-mode noise attenuation is not offered.
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Application Information (continued)
9.1.5 Connecting Multiple Devices
When connecting multiple ADS1018 devices to a single SPI bus, SCLK, DIN, and DOUT/DRDY can be safely
shared by using a dedicated chip-select (CS) for each SPI-enabled device. By default, when CS goes high for
the ADS1018, DOUT/DRDY is pulled up to VDD by a weak pullup resistor. This feature prevents DOUT/DRDY
from floating near midrail and causing excess current leakage on a microcontroller input. If the PULL_UP_EN bit
in the Config register is set to 0, the DOUT/DRDY pin enters a 3-state mode when CS transitions high. The
ADS1018 cannot issue a data-ready pulse on DOUT/DRDY when CS is high. To evaluate when a new
conversion is ready from the ADS1018 when using multiple devices, the master can periodically drop CS to the
ADS1018. When CS goes low, the DOUT/DRDY pin immediately drives either high or low. If the DOUT/DRDY
line drives low on a low CS, new data are currently available for clocking out at any time. If the DOUT/DRDY line
drives high, no new data are available and the ADS1018 returns the last read conversion result. Valid data can
be retrieved from the ADS1018 at anytime without concern of data corruption. If a new conversion becomes
available during data transmission, that conversion is not available for readback until a new SPI transmission is
initiated.
Microcontroller or
Microprocessor
Device
10
50 W
SCLK
DIN
50 W
CS1
CS2
1
SCLK DOUT/DRDY
9
2
CS
VDD
8
3
GND
AIN3
7
4
AIN0
AIN2
6
50 W
DOUT
50 W
DIN
AIN1
5
50 W
Device
10
DIN
DOUT/DRDY 9
1
SCLK
2
CS
VDD
8
3
GND
AIN3
7
4
AIN0
AIN2
6
AIN1
5
NOTE: Power and input connections omitted for clarity.
Figure 21. Connecting Multiple ADS1018s
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Application Information (continued)
9.1.6 Pseudo Code Example
The flow chart in Figure 22 shows a pseudo-code sequence with the required steps to set up communication
between the device and a microcontroller to take subsequent readings from the ADS1018. As an example, the
default Config register settings are changed to set up the device for FSR = ±0.512 V, continuous-conversion
mode, and a 920-SPS data rate.
INITIALIZE
DATA CAPTURE
Power-up; Wait for supplies to settle to
nominal to ensure power-up reset is complete;
Wait for 50 µs
POWER DOWN
Take CS low
Wait for DOUT/
DRDY to transition
low
NO
YES
Configure microcontroller SPI interface to SPI
mode 1 (CPOL = 0, CPHA = 1);
Delay for minimum td(CSSC)
Take CS low
If the CS pin is not tied low permanently,
configure the microcontroller GPIO connected
to CS as an output;
Configure the microcontroller GPIO connected
to the DRDY pin as a falling edge triggered
interrupt input;
Set MODE bit in config register to '1'
to enter power-down and single-shot
mode
Delay for minimum td(CSSC)
Clear CS to high
Read out conversion result
and clear CS to high before
DOUT/DRDY goes low again
Set CS to the device low;
Delay for minimum td(CSSC)
Write the config register to set the device to
FSR = ±0.512 V, continuous conversion
mode, data rate = 920 SPS
Clear CS to high to reset the serial interface
Figure 22. Pseudo-Code Example Flowchart
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9.2 Typical Application
Figure 23 shows the basic connections for an independent, two-channel thermocouple measurement system
when using the internal high-precision temperature sensor for cold-junction compensation. Apart from the
thermocouples, the only external circuitry required are biasing resistors; first-order, low-pass, antialiasing filters;
and a power-supply decoupling capacitor.
3.3 V
GND
3.3 V
RPU
1M
0.1 F
CCMA
0.1 F
RDIFFA
500
AIN0
VDD
ADS1018
1 F
Voltage Reference
AIN1
RDIFFB
500
RPD
1M
GND
CCMB
0.1 F
±256-mV FSR
SCLK
GND
Mux
GND
3.3 V
RPU
1M
Digital Filter
and
Interface
12-bit
û ADC
PGA
AIN2
1 F
Oscillator
AIN3
RPD
1M
DOUT/DRDY
DIN
CCMA
0.1 F
RDIFFA
500
CS
RDIFFB
500
Temperature
Sensor
GND
CCMB
0.1 F
Figure 23. Two-Channel Thermocouple Measurement System
9.2.1 Design Requirements
Table 6 lists the design parameters for this application.
Table 6. Design Parameters
DESIGN PARAMETER
(1)
VALUE
Supply voltage
3.3 V
Full-scale range
±0.256 V
Update rate
≥ 100 readings per second
Thermocouple type
K
Temperature measurement range
–200°C to +1250°C
Measurement accuracy at TA = 25°C (1)
±2.7°C
With offset calibration, and no gain calibration. Measurement does not account for thermocouple
inaccuracy.
9.2.2 Detailed Design Procedure
The biasing resistors (RPU and RPD) serve two purposes. The first purpose is to set the common-mode voltage of
the thermocouple to within the specified voltage range of the device. The second purpose is to offer a weak
pullup and pulldown to detect an open thermocouple lead. When one of the thermocouple leads fails open, the
positive input is pulled to VDD and the negative input is pulled to GND. The ADC consequently reads a full-scale
value that is outside the normal measurement range of the thermocouple voltage to indicate this failure condition.
When choosing the values of the biasing resistors, take care so that the biasing current does not degrade
measurement accuracy. The biasing current flows through the thermocouple and can cause self-heating and
additional voltage drops across the thermocouple leads. Typical values for the biasing resistors range from 1 MΩ
to 50 MΩ.
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Although the device digital filter attenuates high-frequency components of noise, provide a first-order, passive RC
filter at the inputs to further improve performance. The differential RC filter formed by RDIFFA, RDIFFB, and the
differential capacitor CDIFF offers a cutoff frequency that is calculated using Equation 3. While the digital filter of
the ADS1018 strongly attenuates high-frequency components of noise, provide a first-order, passive RC filter to
further suppress high-frequency noise and avoid aliasing. Care must be taken when choosing the filter resistor
values because the input currents flowing into and out of the device cause a voltage drop across the resistors.
This voltage drop shows up as an additional offset error at the ADC inputs. Limit the filter resistor values to below
1 kΩ for best performance.
fC = 1 / [2π × (RDIFFA + RDIFFB) × CDIFF]
(3)
Two common-mode filter capacitors (CCMA and CCMB) are also added to offer attenuation of high-frequency,
common-mode noise components. Differential capacitor CDIFF must be at least an order of magnitude (10x)
larger than these common-mode capacitors because mismatches in the common-mode capacitors can convert
common-mode noise into differential noise.
The highest measurement resolution is achieved when the largest potential input signal is slightly lower than the
FSR of the ADC. From the design requirement, the maximum thermocouple voltage (VTC) occurs at a
thermocouple temperature (TTC) of 1250°C. At this temperature, VTC = 50.644 mV, as defined in the tables
published by the National Institute of Standards and Technology (NIST) using a cold-junction temperature (TCJ)
of 0°C. A thermocouple produces an output voltage that is proportional to the temperature difference between the
thermocouple tip and the cold junction. If the cold junction is at a temperature below 0°C, the thermocouple
produces a voltage larger than 50.644 mV. The isothermal block area is constrained by the operating
temperature range of the device. Therefore, the isothermal block temperature is limited to –40°C. A K-type
thermocouple at TTC = 1250°C produces an output voltage of VTC = 50.644 mV – (–1.527 mV) = 52.171 mV
when referenced to a cold-junction temperature of TCJ = –40°C. The device offers a full-scale range of ±0.256 V
and that is what is used in this application example.
The device integrates a high-precision temperature sensor that can be used to measure the temperature of the
cold junction. The temperature sensor mode is enabled by setting bit TS_MODE = 1 in the Config register. The
accuracy of the overall temperature sensor depends on how accurately the ADS1018 can measure the cold
junction, and hence, careful component placement and PCB layout considerations must be employed for
designing an accurate thermocouple system. The ADS1118 Evaluation Module provides a good starting point
and offers an example to achieve good cold-junction compensation performance. The ADS1118 Evaluation
Module uses the same schematic as shown in Figure 23, except with only one thermocouple channel connected.
Refer to the application note, Precision Thermocouple Measurement With the ADS1118, SBAA189, for details on
how to optimize your component placement and layout to achieve good cold-junction compensation performance.
The calculation procedure to achieve cold-junction compensation can be done in several ways. A typical way is
to interleave readings between the thermocouple inputs and the temperature sensor. That is, acquire one on-chip
temperature result, TCJ, for every thermocouple ADC voltage measured, VTC. To account for the cold junction,
first convert the temperature sensor reading within the ADS1018 to a voltage (VCJ) that is proportional to the
thermocouple currently being used. This process is generally accomplished by performing a reverse lookup on
the table used for the thermocouple voltage-to-temperature conversion. Adding these two voltages yields the
thermocouple-compensated voltage (VActual), where VActual = VCJ + VTC. Then, VActual is converted to a
temperature (TActual) using the same NIST lookup table. A block diagram showing this process is given in
Figure 24. Refer to application note SBAA189 for a detailed explanation of this method.
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Device
MCU
Thermocouple
Voltage
VTC
TActual
On-chip
Temperature
TCJ
TÆV
VCJ
VActual
VÆT
Result
Figure 24. Software-Flow Block Diagram
Figure 25 and Figure 26 show the expected measurement results. A system offset calibration is performed at TTC
= 25°C that equates to VTC = 0 V when TCJ = 25°C. The dashed blue lines in Figure 25 show the maximum error
guard band due to ADC gain and nonlinearity error. The dashed blue lines in Figure 26 show the corresponding
temperature measurement error guard band calculated from the data in Figure 25 using the NIST tables. The
dashed red lines in Figure 26 include the guard band for the temperature sensor inaccuracy (±1°C), in addition to
the device gain and nonlinearity error. Note that the results in Figure 25 and Figure 26 do not account for the
thermocouple inaccuracy that must also be considered while designing a thermocouple measurement system.
9.2.3 Application Curves
4
0.15
3
Measurement Error (qC)
Measurement Error (mV)
0.1
0.05
0
-0.05
-0.1
-0.15
-10
1
0
-1
-2
-3
0
10
20
30
40
Thermocouple Voltage (mV)
50
Figure 25. Voltage Measurement Error vs VTC
28
2
60
-4
-200
0
200
400
600
800
Temperature (qC)
1000
1200
1400
Figure 26. Temperature Measurement Error vs TTC
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10 Power Supply Recommendations
The device requires a single power supply, VDD, to power both the analog and digital circuitry of the device.
10.1 Power-Supply Sequencing
Wait approximately 50 µs after VDD is stabilized before communicating with the device to allow the power-up
reset process to complete.
10.2 Power-Supply Decoupling
Good power-supply decoupling is important to achieve optimum performance. VDD must be decoupled with at
least a 0.1-µF capacitor, as shown in Figure 27. The 0.1-μF bypass capacitor supplies the momentary bursts of
extra current required from the supply when the ADS1018 is converting. Place the bypass capacitor as close to
the power-supply pin of the device as possible using low-impedance connections. For best performance, use
multilayer ceramic chip capacitors (MLCCs) that offer low equivalent series resistance (ESR) and inductance
(ESL) characteristics for power-supply decoupling purposes. For very sensitive systems, or for systems in harsh
noise environments, avoiding the use of vias for connecting the capacitors to the device pins may offer superior
noise immunity. The use of multiple vias in parallel lowers the overall inductance and is beneficial for connections
to ground planes.
VDD
Device
10
DIN
1
SCLK
DOUT/DRDY
9
2
CS
VDD
8
3
GND
AIN3
7
4
AIN0
AIN2
6
0.1 µF
AIN1
5
Figure 27. Power-Supply Decoupling
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11 Layout
11.1 Layout Guidelines
Use best design practices when laying out a printed-circuit-board (PCB) for both analog and digital components.
This recommendation generally means that the layout separates analog components [such as ADCs, amplifiers,
references, digital-to-analog converters (DACs), and analog muxes] from digital components [such as
microcontrollers, complex programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), radio
frequency (RF) transceivers, universal serial bus (USB) transceivers, and switching regulators]. An example of
good component placement is shown in Figure 28. Although Figure 28 provides a good example of component
placement, the best placement for each application is unique to the geometries, components, and PCB
fabrication capabilities employed. That is, there is no single layout that is perfect for every design and careful
consideration must always be used when designing with any analog component.
Microcontroller
Device
Ground Fill or
Ground Plane
Supply
Generation
Optional: Split
Ground Cut
Signal
Conditioning
(RC Filters
and
Amplifiers)
Ground Fill or
Ground Plane
Optional: Split
Ground Cut
Ground Fill or
Ground Plane
Interface
Transceiver
Connector
or Antenna
Ground Fill or
Ground Plane
Figure 28. System Component Placement
The use of split analog and digital ground planes is not necessary for improved noise performance (although for
thermal isolation this option is a worthwhile consideration). However, the use of a solid ground plane or ground
fill in PCB areas with no components is essential for optimum performance. If the system being used employs a
split digital and analog ground plane, TI generally recommends that the ground planes be connected together as
close to the device as possible. A two-layer board is possible using common grounds for both analog and digital
grounds. Additional layers can be added to simplify PCB trace routing. Ground fill may also reduce EMI and RFI
issues.
For best system performance, keep digital components, especially RF portions, as far as practically possible
from analog circuitry in a given system. Additionally, minimize the distance that digital control traces run through
analog areas and avoid placing these traces near sensitive analog components. Digital return currents usually
flow through a ground path that is as close to the digital path as possible. If a solid ground connection to a plane
is not available, these currents may find paths back to the source that interfere with analog performance. The
implications that layout has on the temperature-sensing functions are much more significant than for ADC
functions.
Bypass supply pins to ground with a low-ESR ceramic capacitor. The optimum placement of the bypass
capacitors is as close as possible to the supply pins. The ground-side connections of the bypass capacitors must
be low-impedance connections for optimum performance. The supply current flows through the bypass capacitor
terminal first and then to the supply pin to make the bypassing most effective.
Analog inputs with differential connections must have a capacitor placed differentially across the inputs. Use
high-quality differential capacitors. The best ceramic-chip capacitors are C0G (NPO), with stable properties and
low-noise characteristics. Thermally isolate a copper region around the thermocouple input connections to create
a thermally-stable cold junction. Obtaining acceptable performance with alternate layout schemes is possible as
long as the above guidelines are followed.
See Figure 29 and Figure 30 for layout examples of the X2QFN and VSSOP packages.
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DOUT/DRDY
DIN
11.2 Layout Example
Vias connect to either the bottom layer or
an internal plane. The bottom layer or
internal plane are dedicated GND planes
VDD
10
SCLK
CS
1
SCLK
2
CS
DIN
DOUT/
DRDY
9
VDD
8
Device
3
GND
AIN3
7
4
AIN0
AIN2
6
AIN1
AIN3
AIN2
AIN1
AIN0
5
DOUT/DRDY
DIN
Figure 29. X2QFN Package
SCLK
VDD
CS
AIN0
1
SCLK
2
CS
3
GND
4
5
Device
DIN
10
DOUT/
DRDY
9
VDD
8
AIN0
AIN3
7
AIN1
AIN2
6
AIN3
AIN2
AIN1
Figure 30. VSSOP Package
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
• Texas Instruments, Precision Thermocouple Measurement with the ADS1118 application reports
• Texas Instruments, ADS1118EVM User Guide and Software Tutorial user guide
• Texas Instruments, 430BOOST-ADS1118 BoosterPack user guide
• Texas Instruments, ADS1118 Boosterpack quick start
• Texas Instruments, A Glossary of Analog-to-Digital Specifications and Performance Characteristics
application report
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.3 Community Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
SPI is a trademark of Motorola.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
ADS1018IDGSR
ACTIVE
VSSOP
DGS
10
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
BTNQ
ADS1018IDGST
ACTIVE
VSSOP
DGS
10
250
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
BTNQ
ADS1018IRUGR
ACTIVE
X2QFN
RUG
10
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
SDZ
ADS1018IRUGT
ACTIVE
X2QFN
RUG
10
250
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
SDZ
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
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RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of