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ADS1262, ADS1263
SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
ADS126x 32-Bit, Precision, 38-kSPS, Analog-to-Digital Converter (ADC)
with Programmable Gain Amplifier (PGA) and Voltage Reference
1 Features
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•
•
•
•
•
1
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•
•
•
•
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3 Description
The ADS1262 and ADS1263 are low-noise, low-drift,
38.4-kSPS, delta-sigma (ΔΣ) ADCs with an integrated
PGA, reference, and internal fault monitors. The
ADS1263 integrates an auxiliary, 24-bit, ΔΣ ADC
intended for background measurements. The sensorready ADCs provide complete, high-accuracy, onechip measurement solutions for the most-demanding
sensor applications, including weigh scales, straingauge sensors, thermocouples, and resistance
temperature devices (RTD).
Precision, 32-bit, ΔΣ ADC
Auxiliary 24-Bit, ΔΣ ADC (ADS1263)
Data Rates: 2.5 SPS to 38400 SPS
Differential Input, CMOS PGA
11 Multifunction Analog Inputs
High-Accuracy Architecture
– Offset Drift: 1 nV/°C
– Gain Drift: 0.5 ppm/°C
– Noise: 7 nVRMS (2.5 SPS, Gain = 32)
– Linearity: 3 ppm
2.5-V Internal Voltage Reference
– Temperature Drift: 2 ppm/°C
50-Hz and 60-Hz Rejection
Single-Cycle Settled Conversions
Dual Sensor Excitation Current Sources
Internal Fault Monitors
Internal ADC Test Signal
8 General-Purpose Input/Outputs
The ADCs are comprised of a low-noise, CMOS PGA
(gains 1 to 32), a ΔΣ modulator, followed by a
programmable digital filter. The flexible analog frontend (AFE) incorporates two sensor-excitation current
sources suitable for direct RTD measurement.
A single-cycle settling digital filter maximizes multipleinput conversion throughput, while providing 130-dB
rejection of 50-Hz and 60-Hz line cycle interference.
The ADS1262 and ADS1263 are pin and functional
compatible. These devices are available in a 28-pin
TSSOP package and are fully specified over the
–40°C to +125°C temperature range.
2 Applications
•
•
•
•
•
Device Information(1)
PART NUMBER
High-Resolution PLCs
Temperature, Pressure Measurement
Weigh Scales and Strain-Gauge Digitizers
Panel Meters, Chart Recorders
Analytical Instrumentation
TSSOP (28)
ADS1263
0.25
+3.3 V
Input Range = r78 mV
0.2 Data Rate = 20 SPS
0.15 Noise = 0.16 PVP-P
DVDD
2.5-V Ref
ADS1262
ADS1263
Ref
Mux
AIN0
+Sig
AIN1
±Sig
AIN2
±Sen
AIN3
Bridge
Dual Sensor
Excitation
Sensor Test
Ref
Alarm
Buf
START
RESET/PWDN
AIN4
AIN5
±Exc
AIN6
AIN7
PGA
AIN8
Pt 100
Input
Mux
AIN9
32-Bit
ûADC
Digital
Filter
Serial
Interface
and
Control
DIN
DOUT/DRDY
SCLK
Signal
Alarm
AINCOM
CS
DRDY
GPIO
PGA
Level Shift
Temp Sensor
24-Bit
ûADC
ADS1263 Only
Test V
AVSS
Digital
Filter
Internal
Oscillator
Clock
Mux
DGND
ADC Output (PV)
+Exc
+Sen
9.70 mm × 4.40 mm
ADC Conversion Noise
+5 V
AVDD
BODY SIZE (NOM)
(1) For all available packages, see the package option addendum
at the end of the data sheet.
Temperature Compensated Bridge Measurement
REFOUT
PACKAGE
ADS1262
0.1
0.05
0
-0.05
-0.1
-0.15
XTAL2
XTAL1/CLKIN
-0.2
-0.25
0
1
2
3
4
5
6
Time (s)
7
8
9
10
D017
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ADS1262, ADS1263
SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Device Comparison ...............................................
Pin Configuration and Functions .........................
Specifications.........................................................
7.1
7.2
7.3
7.4
7.5
7.6
7.7
7.8
8
1
1
1
2
4
4
6
Absolute Maximum Ratings ...................................... 6
ESD Ratings.............................................................. 6
Recommended Operating Conditions....................... 7
Thermal Information .................................................. 7
Electrical Characteristics........................................... 8
Timing Requirements: Serial Interface.................... 11
Switching Characteristics: Serial Interface.............. 12
Typical Characteristics ............................................ 13
Parameter Measurement Information ................ 24
8.1
8.2
8.3
8.4
8.5
8.6
Offset Temperature Drift Measurement .................. 24
Gain Temperature Drift Measurement .................... 24
Common-Mode Rejection Ratio Measurement....... 24
Power-Supply Rejection Ratio Measurement ......... 24
Crosstalk Measurement (ADS1263) ....................... 25
Reference-Voltage Temperature-Drift
Measurement ........................................................... 25
8.7 Reference-Voltage Thermal-Hysteresis
Measurement ........................................................... 25
8.8 Noise Performance ................................................. 26
9
9.1
9.2
9.3
9.4
9.5
9.6
Overview .................................................................
Functional Block Diagram .......................................
Feature Description.................................................
Device Functional Modes.......................................
Programming..........................................................
Register Maps .........................................................
30
31
32
61
85
88
10 Application and Implementation...................... 106
10.1
10.2
10.3
10.4
Application Information........................................
Typical Applications ............................................
Dos and Don'ts....................................................
Initialization Setup ...............................................
107
114
119
120
11 Power-Supply Recommendations ................... 122
11.1 Power-Supply Decoupling................................... 122
11.2 Analog Power-Supply Clamp .............................. 123
11.3 Power-Supply Sequencing.................................. 123
12 Layout................................................................. 124
12.1 Layout Guidelines ............................................... 124
12.2 Layout Example .................................................. 125
13 Device and Documentation Support ............... 126
13.1
13.2
13.3
13.4
13.5
Related Links ......................................................
Community Resources........................................
Trademarks .........................................................
Electrostatic Discharge Caution ..........................
Glossary ..............................................................
126
126
126
126
126
14 Mechanical, Packaging, and Orderable
Information ......................................................... 126
Detailed Description ............................................ 30
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (May 2015) to Revision B
Page
•
Changed ADS1263 from product preview to production data, and added text and specifications throughout data
sheet to include the ADS1263 and ADC2 .............................................................................................................................. 1
•
Changed text throughout data sheet for clarity ...................................................................................................................... 1
•
Added condition line to Absolute Maximum Ratings table ..................................................................................................... 6
•
Added Crosstalk section to Electrical Characteristics table ................................................................................................... 9
•
Added Figure 32 ................................................................................................................................................................... 17
•
Added Figure 36 ................................................................................................................................................................... 18
•
Changed legend in Figure 45 ............................................................................................................................................... 19
•
Added missing gain term in FSR definition of Equation 8 .................................................................................................... 26
•
Changed text in fourth paragraph of Noise Performance section to clarify conditions to achieve maximum ENOB ........... 26
•
Changed bit names from PGAH and PGAL to PGAH_ALM and PGAL_ALM, respectively, in PGA Absolute OutputVoltage Monitor section ........................................................................................................................................................ 40
•
Changed Figure 77 to show correct name of bit 4 ............................................................................................................... 41
•
Changed RMUX to RMUXP in second paragraph of ADC Reference Voltage section ....................................................... 41
•
Changed text in last paragraph of ADC Reference Voltage section to show correct name of bit 4 .................................... 41
•
Changed text in External Reference section to clarify external reference inputs, polarity reversal switch, reference
input current, and external reference buffer ......................................................................................................................... 42
•
Changed text in Power-Supply Reference section to clarify use of power-supply reference in critical applications ........... 42
2
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SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
Revision History (continued)
•
Changed text in last paragraph of Sensor-Excitation Current Sources (IDAC1 and IDAC2) section to clarify settling
time in IDAC rotation mode .................................................................................................................................................. 44
•
Added ADC1 Modulator section ........................................................................................................................................... 45
•
Changed text in General-Purpose Input/Output (GPIO) section regarding GPIO data readback when programmed
as an output.......................................................................................................................................................................... 52
•
Changed Figure 92............................................................................................................................................................... 52
•
Changed TSIGP and TSIGN to TDACP and TDACN, respectively, in the last paragraph of the Test DAC (TDAC)
section .................................................................................................................................................................................. 54
•
Changed text in Test DAC (TDAC) section allowing for any common-mode value instead of 0 V...................................... 54
•
Added note (1) to Figure 95 ................................................................................................................................................ 57
•
Changed th(DRSP) value of 16 from max to min...................................................................................................................... 61
•
Added stop-start sequence text to restart conversions in Continuous Conversion Mode section ....................................... 61
•
Deleted software polling text from Data Ready (DRDY) section.......................................................................................... 67
•
Added Conversion Data Software Polling section................................................................................................................ 67
•
Added text to clarify data reset at conversion restart ........................................................................................................... 68
•
Added text to Read Data Direct (ADC1) section to clarify conversion restart...................................................................... 68
•
Changed Figure 108 to show complete list of CRC bit settings ........................................................................................... 68
•
Changed text in Read Data by Command section to clarify software polling ...................................................................... 69
•
Changed Figure 109 to show complete list of CRC bit settings ........................................................................................... 69
•
Added text to Offset Calibration Registers section regarding offset calibration register disabled in chop mode................. 76
•
Added new step 1 to Calibration Command Procedure section........................................................................................... 79
•
Added text to WREG Command section regarding conversion restart ................................................................................ 87
•
Changed text in 2nd paragraph of Register Map section..................................................................................................... 88
•
Changed Group Update column of Table 38 ...................................................................................................................... 88
•
Added software polling to Figure 159................................................................................................................................. 120
Changes from Original (February 2015) to Revision A
•
Page
Changed ADS1262 from product preview to production data ................................................................................................ 1
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SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
www.ti.com
5 Device Comparison
PRODUCT
INPUTS
ADS1262
11
AUXILIARY 24-BIT ADC
No
ADS1263
11
Yes
6 Pin Configuration and Functions
PW Package
28-Pin TSSOP
Top View (Not To Scale)
4
AIN8
1
28
AIN7
AIN9
2
27
AIN6
AINCOM
3
26
AIN5
CAPP
4
25
AIN4
CAPN
5
24
AIN3
AVDD
6
23
AIN2
AVSS
7
22
AIN1
REFOUT
8
21
AIN0
START
9
20
RESET/PWDN
CS
10
19
DVDD
SCLK
11
18
DGND
DIN
12
17
BYPASS
DOUT/DRDY
13
16
XTAL2
DRDY
14
15
XTAL1/CLKIN
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SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
Pin Functions
PIN
I/O
DESCRIPTION
NO.
NAME
1
AIN8
Analog input/output
Analog input 8, IDAC1, IDAC2, GPIO5
2
AIN9
Analog input/output
Analog input 9, IDAC1, IDAC2, GPIO6
3
AINCOM
Analog input/output
Analog input common, IDAC1, IDAC2, GPIO7, VBIAS
4
CAPP
Analog output
PGA output P: connect a 4.7-nF C0G dielectric capacitor from CAPP to CAPN
5
CAPN
Analog output
PGA output N: connect a 4.7-nF C0G dielectric capacitor from CAPP to CAPN
6
AVDD
Analog
Positive analog power supply
Negative analog power supply
7
AVSS
Analog
8
REFOUT
Analog Output
9
START
Digital Input
Start conversion control
10
CS
Digital Input
Serial interface chip select (active low)
11
SCLK
Digital Input
Serial interface shift clock
12
DIN
Digital Input
Serial interface data input
13
DOUT/DRDY
Digital output
Serial interface data output and data ready indicator (active low)
14
DRDY
Digital output
Data ready indicator (active low)
15
XTAL1/CLKIN
Digital Input
1) Internal oscillator: Connect to DGND
2) External clock: Connect clock input
3) Crystal oscillator: Connect to crystal and crystal load capacitor
16
XTAL2
Digital Input
1) Internal oscillator: No connection (float)
2) External clock: No connection (float)
3) Crystal oscillator: Connect to crystal and crystal load capacitor
17
BYPASS
Analog Output
18
DGND
Digital
Digital ground
19
DVDD
Digital
Digital power supply
20
RESET/PWDN
Digital input
21
AIN0
Analog input/output
Analog input 0, REFP1, IDAC1, IDAC2
22
AIN1
Analog input/output
Analog input 1, REFN1, IDAC1, IDAC2
23
AIN2
Analog input/output
Analog input 2 ,REFP2, IDAC1, IDAC2
24
AIN3
Analog input/output
Analog input 3, REFN2, IDAC1, IDAC2, GPIO0
25
AIN4
Analog input/output
Analog input 4, REFP3, IDAC1, IDAC2, GPIO1
26
AIN5
Analog input/output
Analog input 5, REFN3, IDAC1, IDAC2, GPIO2
27
AIN6
Analog input/output
Analog input 6, IDAC1, IDAC2, GPIO3, TDACP
28
AIN7
Analog input/output
Analog input 7, IDAC1, IDAC2, GPIO4, TDACN
Internal reference voltage output, connect 1-µF capacitor to AVSS
2-V sub-regulator external bypass; connect 1-µF capacitor to DGND
Reset (active low); hold low to power down the ADC
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7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN
MAX
UNIT
–0.3
7
V
AVSS to DGND
–3
0.3
V
DVDD to DGND
–0.3
7
V
Analog input
VAVSS – 0.3
VAVDD + 0.3
V
Digital input
VDGND – 0.3 VDVDD + 0.3
AVDD to AVSS
Voltage
Current
Temperature
(1)
(2)
V
Input current (2)
–10
10
mA
Junction, TJ
–50
150
°C
Storage, Tstg
-60
150
°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Input pins are diode-clamped to the power supply rails. Limit the input current to 10 mA or less if the analog input voltage exceeds
VAVDD + 0.3 V or is below VAVSS – 0.3 V, or if the digital input voltage exceeds VDVDD + 0.3 V or is below VDGND – 0.3 V.
7.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
6
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±2000
Charged-device model (CDM), per JEDEC specification JESD22-C101 (2)
±500
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
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SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
7.3 Recommended Operating Conditions
over operating ambient temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
VAVDD to VAVSS
4.75
5
5.25
V
VAVSS to VDGND
–2.6
0
V
VDVDD to VDGND
2.7
5.25
V
–VREF / Gain
VREF / Gain
V
POWER SUPPLY
Analog power supply
Digital power supply
ADC1 ANALOG INPUTS
FSR
VINP,VINN
Full-scale differential input voltage range (1)
PGA enabled
Absolute input voltage (2)
PGA bypassed
See Equation 12
V
VAVSS – 0.1
VAVDD + 0.1
V
–VREF / Gain
VREF / Gain
V
VAVSS – 0.1
VAVDD + 0.1
V
ADC2 ANALOG INPUTS (ADS1263)
Full-scale differential input voltage range
Gain = 1, 2 and 4
Absolute input voltage
Gain = 8 to 128
See Equation 15
V
VOLTAGE REFERENCE INPUTS
VREF
Differential reference voltage
VREFN
Negative reference voltage
VREFP
Positive reference voltage
VAVDD – VAVSS
+ 0.2
V
VAVSS – 0.1
VREFP – 0.9
V
VREFN + 0.9
VAVDD + 0.1
V
VREF = VREFP – VREFN
0.9
CLOCK INPUT
fCLK
External clock frequency
1
External clock duty cycle
30%
External crystal frequency
1
7.3728
8
MHz
70%
7.3728
8
MHz
GENERAL-PURPOSE INPUT/OUTPUT (GPIO)
Input voltage
VAVSS
VAVDD
V
VDGND
VDVDD
V
–40
125
°C
DIGITAL INPUTS (other than GPIO)
Input voltage
TEMPERATURE
TA
(1)
(2)
Operating ambient temperature
FSR is the ideal full-scale differential input voltage range, excluding noise, offset and gain errors. For ADC1, the maximum FSR is
achieved with VREF = 5 V and the PGA bypassed. If the PGA is enabled and VREF = 5 V, the FSR is limited by the PGA input range. For
ADC2, if VREF = 5 V and gains = 8 to 128 then FSR is limited by the PGA input range.
VINP, VINN = Absolute Input Voltage. VIN = Differential Input Voltage = VINP – VINN.
7.4 Thermal Information
ADS126x
THERMAL METRIC (1)
PW (TSSOP)
UNIT
28 PINS
RθJA
Junction-to-ambient thermal resistance
65.2
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
13.6
°C/W
RθJB
Junction-to-board thermal resistance
23.6
°C/W
ψJT
Junction-to-top characterization parameter
0.5
°C/W
ψJB
Junction-to-board characterization parameter
23.1
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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7.5 Electrical Characteristics
Minimum and maximum specifications apply from TA = –40°C to +125°C. Typical specifications are at TA = 25°C.
All specifications are at VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, fCLK = 7.3728 MHz, ADC1 data rate = 20 SPS
with PGA enabled and gain = 1, and ADC2 data rate = 10 SPS with gain = 1 (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ADC1 ANALOG INPUTS
Absolute input current
Differential input current
Differential input impedance
Channel-to-channel crosstalk
Gain = 32
2
nA
PGA bypassed
150
nA
Gain = 32
0.1
nA
PGA bypassed, VIN = 5 V
150
nA
1
GΩ
PGA enabled
PGA bypassed
40
MΩ
DC, VAVSS ≤ VINX ≤ VAVDD
0.5
µV/V
ADC1 PERFORMANCE
PGA gain
DR
1, 2, 4, 8, 16, 32
Resolution
32
Data rate
2.5
Noise performance
INL
Integral nonlinearity
VOS
Offset voltage
GE
Gain error
Gain drift
NMRR
Normal-mode rejection ratio (2)
CMRR
Common-mode rejection ratio (3)
PSRR
Power-supply rejection ratio (4)
38400
SPS
ppm
See Table 1
Gain = 1 to 32, PGA bypassed
TA = 25°C
3
12
Chop mode off
350 / Gain
800 / Gain
µV
Chop mode on
±0.1 / Gain
±0.5 / Gain
µV
After calibration (1)
Offset voltage drift
V/V
Bits
Noise / 4
Chop mode off
30 / Gain + 10 100 / Gain + 50
Chop mode on
TA = 25°C, gain = 1 to 32
After calibration
(1)
1
5
±50
±300
nV/°C
nV/°C
ppm
Noise / 4
Gain = 1 to 32, and PGA bypassed
0.5
4
ppm/°C
See Table 11
fIN = 60 Hz, data rate = 20 SPS
130
dB
100
120
dB
AVDD and AVSS
80
90
dB
DVDD
80
120
dB
fIN = 60 Hz, data rate = 400 SPS
ADC2 ANALOG INPUTS (ADS1263)
Absolute input current
Gain = 16
2
nA
Differential input current
Gain = 16
0.5
nA
ADC2 PERFORMANCE (ADS1263)
DR
Gain
1, 2, 4, 8, 16, 32, 64, 128
V/V
Resolution
24
Bits
Data rate
10, 100, 400, 800
Noise performance
Gain = 1 to 64
4
20
ppm
Gain = 128
7
30
ppm
±150
±500
µV
30
200
nV/°C
±500
±3000
1
5
INL
Integral nonlinearity
VOS
Offset voltage
TA = 25°C, gain = 1 to 128
Offset voltage drift
Gain = 1 to 128
Gain error
TA = 25°C, gain = 1 to 128
Gain drift
Gain = 1 to 128
GE
NMRR
Normal-mode rejection ratio
CMRR
Common-mode rejection ratio
PSRR
Power-supply rejection ratio
(1)
(2)
(3)
(4)
8
SPS
See Table 3
ppm
ppm/°C
See Table 15
fIN = 60 Hz, DR = 10 SPS
110
dB
fIN = 60 Hz, DR = 400 SPS, gain = 8
75
90
dB
AVDD and AVSS
75
90
dB
Offset and gain calibration accuracy on the order of ADC conversion noise/4. Conversion noise depends on data rate and PGA gain.
Normal-mode rejection ratio depends on the digital filter setting.
Common-mode rejection ratio is specified at date rate 20 SPS and 400 SPS.
Power-supply rejection ratio is specified at dc.
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Electrical Characteristics (continued)
Minimum and maximum specifications apply from TA = –40°C to +125°C. Typical specifications are at TA = 25°C.
All specifications are at VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, fCLK = 7.3728 MHz, ADC1 data rate = 20 SPS
with PGA enabled and gain = 1, and ADC2 data rate = 10 SPS with gain = 1 (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CROSSTALK
Crosstalk
ADC1 to ADC2
20
µV/V
ADC2 to ADC1
1
µV/V
EXTERNAL VOLTAGE REFERENCE INPUTS
Reference input current (5)
ADC1
150
ADC2
1
nA
nA
Input current vs voltage
VREF = 2 V to 4.8 V, ADC1
10
nA/V
Input current drift
ADC1
0.1
nA/°C
Input impedance
Differential, ADC1
50
Low reference monitor
Threshold, ADC1
0.4
MΩ
0.6
V
INTERNAL VOLTAGE REFERENCE
Reference voltage
Initial accuracy
2.5
TA = 25°C
V
±0.1%
±0.2%
TA = 0°C to +85°C
2
6
ppm/°C
TA = –40°C to +105°C
4
12
ppm/°C
Reference voltage long term drift
TA = 85°C, 1st 1000 hr
50
Thermal hysteresis
First 0°C to 85°C cycle
50
Reference voltage temperature drift
Output current
ppm
-10
10
Load regulation
Start-up time
ppm
Settling time to ±0.001% final value
mA
40
µV/mA
50
ms
TEMPERATURE SENSOR
Voltage
TA = 25°C
122.4
Temperature coefficient
mV
420
µV/°C
CURRENT SOURCES (IDAC1, IDAC2)
50, 100, 250, 500, 750,
1000, 1500, 2000, 2500, 3000
Currents
Compliance range
All currents
Absolute error
All currents
±0.7%
±4%
IDAC1 current = IDAC2 current
±0.1%
±1%
IDAC1 current ≠ IDAC2 current
±1%
Match error
Temperature drift
VAVSS
µA
VAVDD – 1.1
Absolute
50
Match
5
V
ppm/°C
20
ppm/°C
LEVEL-SHIFT VOLTAGE
Voltage
(VAVDD + VAVSS) / 2
Output impedance
V
Ω
100
SENSOR BIAS
Currents
±0.5, ±2, ±10, ±50, ±200
µA
10
MΩ
Pull-up/pull-down resistor
TEST DAC (TDAC)
DAC reference voltage
VAVDD – VAVSS
18 binary weighted settings
–4
4
V
Absolute output voltage
To VAVSS
0.5
4.5
V
Accuracy
±0.1%
Output impedance
(5)
V
Differential output voltage
±1.5%
See Table 12
Specified with VAVSS ≤ VREFN and VREFP ≤ VAVDD. For reference input voltage exceeding VAVDD or VAVSS, the ADC1 reference input
current = 10 nA/ mV.
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Electrical Characteristics (continued)
Minimum and maximum specifications apply from TA = –40°C to +125°C. Typical specifications are at TA = 25°C.
All specifications are at VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, fCLK = 7.3728 MHz, ADC1 data rate = 20 SPS
with PGA enabled and gain = 1, and ADC2 data rate = 10 SPS with gain = 1 (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
PGA OVER-RANGE MONITOR
Differential alarm
Threshold
±105%
Differential alarm accuracy
Absolute alarm thresholds
±1%
FSR
±3%
Low threshold
VAVSS + 0.2
V
High threshold
VAVDD – 0.2
V
ADC CLOCK
fCLK
Internal oscillator frequency
7.3728
Internal oscillator accuracy
±0.5%
External crystal startup time
See Table 25 for recommended crystals
MHz
±2%
20
ms
GENERAL-PURPOSE INPUT/OUTPUTS (GPIO) (6)
VOH
High-level output voltage
IOH = 1 mA
VOL
Low-level output voltage
IOL = –1 mA
VIH
High-level input voltage
VIL
Low-level input voltage
0.8 · VAVDD
V
0.2 · VAVDD
V
0.7 · VAVDD
VAVDD
V
VAVSS
0.3 · VAVDD
V
Input hysteresis
0.5
V
DIGITAL INPUT/OUTPUT (Other Than GPIO)
IOH = 1 mA
0.8 · VDVDD
V
VOH
High-level output voltage
VOL
Low-level output voltage
VIH
High-level input voltage
0.7 · VDVDD
VDVDD
V
VIL
Low-level input voltage
VDGND
0.3 · VDVDD
V
±10
µA
IOH = 8 mA
0.75 · VDVDD
IOL = –1 mA
V
0.2 · VDVDD
IOL = –8 mA
0.2 · VDVDD
Input hysteresis
V
0.1
Input leakage
V
V
POWER SUPPLY
IAVDD
IAVSS
Analog supply current
Active mode,
ADS1262
voltage reference off
4
Active mode,
ADS1262
voltage reference on
4.2
6.5
mA
Active mode,
ADS1263
voltage reference on
4.3
6.5
mA
2
15
µA
1
1.25
mA
Power-down mode
IDVDD
Digital supply current
Active mode
Power-down mode
PD
(6)
(7)
10
Power dissipation
ADS1262
ADS1263
(7)
mA
25
50
µA
Active mode,
ADS1262
voltage reference on
24
37
mW
Active mode,
ADS1263
voltage reference on
25
37
mW
Power-down mode
90
240
µW
GPIO input and output voltages are referenced to VAVSS.
External CLK input stopped. All other digital inputs maintained at VDVDD or VDGND.
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SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
7.6 Timing Requirements: Serial Interface
MIN
MAX
UNIT
td(CSSC)
CS↓ before first SCLK↑: delay time (1)
td(DRSC)
DRDY↓ or DRDY/DOUT↓before first SCLK↑: delay time
tsu(DI)
Valid DIN to SCLK↓: setup time
th(DI)
SCLK↓to valid DIN: hold time
tc(SC)
SCLK period (2)
tw(SCH),tw(SCL)
SCLK high pulse width or SCLK low pulse width
40
ns
td(SCCS)
Last SCLK↓ to CS↑: delay time
40
ns
tw(CSH)
CS high pulse width
30
ns
(1)
(2)
50
ns
0
ns
35
ns
25
ns
106
125
ns
CS can be tied low.
If serial interface time-out mode enabled, minimum SCLK frequency = 1 kHz. If serial interface time-out mode disabled (default), there is
no minimum SCLK frequency.
DRDY
td(DRSC)
tw(CSH)
CS
td(CSSC)
tc(SC)
td(SCCS)
tw(SCH)
SCLK
tsu(DI)
th(DI)
tw(SCL)
DIN
Figure 1. Serial Interface Timing Requirements
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7.7 Switching Characteristics: Serial Interface
over operating the ambient temperature range and DVDD = 2.7 V to 5.25 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
tw(DRH)
DRDY high pulse width
tp(CSDO)
CS↓ to DOUT/DRDY driven:
propagation delay time
DOUT/DRDY load: 20 pF || 100 kΩ to DGND
tp(SCDO)
SCLK↑ to valid DOUT/DRDY:
propagation delay time
DOUT/DRDY load: 20 pF || 100 kΩ to DGND
th(SCDO)
SCLK↑ to invalid DOUT/DRDY:
hold time
DOUT/DRDY load: 20 pF || 100 kΩ to DGND
tp(CSDOZ)
CS↑ to DOUT/DRDY high impedance:
propagation delay time
DOUT/DRDY load: 20 pF || 100 kΩ to DGND
TYP
MAX
16
0
UNIT
1/fCLK
40
ns
60
ns
0
ns
40
ns
tw(DRH)
DRDY
CS
SCLK
tp(CSDOZ)
tp(SCDO)
(A)
DOUT/DRDY
MSB
tp(CSDO)
th(SCDO)
(A): If new ADC data is ready since the last operation, DOUT/DRDY is logic low during this interval.
Otherwise, DOUT/DRDY can be logic high or low depending on the previous state of the pin.
Figure 2. Serial Interface Switching Characteristics
VDVDD
½ V DVDD
50%
VDGND
td, th, tp, tw,tc
Figure 3. Timing Reference
12
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SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
7.8 Typical Characteristics
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
4
0.5
3
0.4
0.3
Offset Voltage (PV)
Offset Voltage (PV)
2
1
0
-1
-2
PGA Bypass
Gain = 1
Gain = 2
Gain = 4
-3
-4
-50
-25
Gain = 8
Gain = 16
Gain = 32
0
25
50
Temperature (qC)
0.2
0.1
0
-0.1
-0.2
PGA Bypass
Gain = 1
Gain = 2
Gain = 4
-0.3
-0.4
75
100
-0.5
-50
125
-25
Gain = 8
Gain = 16
Gain = 32
0
25
50
Temperature (qC)
D028
After offset calibration, shorted inputs
75
100
125
D029
Chop mode on, after offset calibration, shorted inputs
Figure 4. ADC1 Offset Voltage vs Temperature
Figure 5. ADC1 Offset Voltage vs Temperature
100
80
Gain = 1
Gain = 32
70
Gain = 1
Gain = 32
90
80
70
Population (%)
Population (%)
60
50
40
30
60
50
40
30
20
Input Referred Offset Voltage Drift (nV/qC)
2
1.8
1.6
1.4
1.2
1
50
20 SPS, Gain = 1
20 SPS, Gain = 32
400 SPS, Gain = 1
7200 SPS, Gain = 1
38400 SPS, Gain = 1
25
Gain Error (ppm)
Offset Voltage (PV)
0.8
Figure 7. ADC1 Offset Voltage vs Temperature Distribution
400
100
0
-100
0
-25
PGA Bypass
Gain = 1
Gain = 2
Gain = 4
-200
-300
0.5
D072
Chop mode on, shorted inputs, 30 units
Figure 6. ADC1 Offset Voltage vs Temperature Distribution
200
0.6
Input Referred Offset Voltage Drift (nV/qC)
D064
Shorted inputs, 30 units
300
0.4
0
100
90
80
70
60
50
40
30
20
0
10
0
0
10
0.2
20
10
1
1.5
2
2.5
3
3.5
Reference Voltage (V)
4
4.5
5
-50
-50
-25
D054
Shorted inputs
0
25
50
Temperature (qC)
75
Gain = 8
Gain = 16
Gain = 32
100
125
D030
After gain calibration
Figure 8. ADC1 Offset Voltage vs Reference Voltage
Figure 9. ADC1 Gain Error vs Temperature
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
100
60
Gain = 1
Gain = 32
20 SPS, Gain = 1
20 SPS, Gain = 32
400 SPS, Gain = 1
7200 SPS, Gain = 1
38400 SPS, Gain = 1
80
Gain Error (ppm)
Population (%)
40
60
40
20
0
20
0
0
0.5
1
1.5 2
2.5 3
3.5
Gain Drift (ppm/qC)
4
4.5
-20
0.5
5
1
1.5
2
2.5
3
3.5
Reference Voltage (V)
D037
4
4.5
5
D053
30 units
Figure 10. ADC1 Gain vs Temperature Distribution
Figure 11. ADC1 Gain Error vs Reference Voltage
8
Gain = 1
Gain = 2
Gain = 4
Gain = 8
Gain = 16
Gain = 32
0.4
0.3
Gain = 1
Gain = 2
Gain = 4
Gain = 8
Gain = 16
Gain = 32
7
Input Referred Noise (uVRMS)
Input Referred Noise (uVRMS)
0.5
0.2
0.1
6
5
4
3
2
1
-25
0
25
50
Temperature (qC)
75
100
0
-50
125
-25
0
20 SPS, sinc4
200
100
50
70
7200 SPS, Gain = 1
38400 SPS, Gain = 1
2
1
0.5
0.2
0.1
0.05
D027
50
40
30
20
10
2.1
1.8
1.5
1.2
0.9
0.6
0
0.3
5
-0.3
4.5
-0.6
4
-1.2
2
2.5
3
3.5
Reference Voltage (V)
-1.5
1.5
-1.8
0
1
D070
20 SPS, 400 SPS, 7200 SPS = sinc4,
38400 SPS = sinc5
Figure 14. ADC1 Noise vs Reference Voltage
14
125
60
-2.1
0.02
0.01
0.5
100
Figure 13. ADC1 Noise vs Temperature
80
Number of Occurrences
Input Referred Noise (PVRMS)
Figure 12. ADC1 Noise vs Temperature
20 SPS, Gain = 1
20 SPS, Gain = 32
400 SPS, Gain = 1
75
7200 SPS, sinc4
500
20
10
5
25
50
Temperature (qC)
D026
-0.9
0
-50
D055
Output Voltage (PV)
20 SPS, FIR filter, gain = 1, after offset calibration, 256 samples
Figure 15. ADC1 Output Reading Distribution
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
3000
120
2700
Number of Occurrences
Number of Occurrences
100
80
60
40
2400
2100
1800
1500
1200
900
600
20
300
28
24
20
16
8
12
4
0
-4
-8
-12
-16
-20
-28
0.21
0.18
0.15
0.12
0.09
0.06
0
0.03
-0.03
-0.06
-0.09
-0.12
-0.15
-0.18
-0.21
Input Referred Voltage (PV)
D056
Input Referred Voltage (PV)
D057
7200 SPS, sinc4 filter, Gain = 1, after offset calibration,
8192 samples
20 SPS, FIR filter, gain = 32, after offset calibration, 256 samples
Figure 16. ADC1 Output Reading Distribution
Figure 17. ADC1 Output Reading Distribution
0
2100
-20
1800
-40
1500
Amplitude (dB)
Number of Occurrences
-24
0
0
1200
900
-60
-80
-100
-120
600
-140
300
-160
-180
1.6
1.4
1.2
1
0.8
0.6
0.4
0
0.2
-0.2
-0.4
-0.6
-0.8
-1
-1.2
-1.4
-1.6
0
0
1
2
3
D058
Input Referred Voltage (PV)
4
5
6
Frequency (Hz)
7
8
9
10
D059
20 SPS, Gain = 1, 256 points
7200 SPS, sinc4 filter, Gain = 32, after offset calibration,
8192 samples
Figure 19. ADC1 Output Spectrum
Figure 18. ADC1 Output Reading Distribution
0
8
Gain = 1
Gain = 32
-20
6
4
-60
INL (ppm)
Amplitude (dB)
-40
-80
-100
-120
2
0
-2
-4
-140
Gain = 1
Gain = 4
Gain = 16
Gain = 32
-6
-160
-180
0
2
4
6
8
10
12
Frequency (kHz)
14
16
18
20
-8
-100
-80
-60
D060
-40
-20
0
20
VIN (% of FSR)
40
60
80
100
D024
38400 SPS, 8192 points
Figure 20. ADC1 Output Spectrum
Figure 21. ADC1 INL vs VIN
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
6
60
Gain = 1
Gain = 4
Gain = 16
Gain = 32
5
50
40
Population (%)
INL (ppm)
4
3
2
30
20
1
10
0
-50
0
-25
0
25
50
Temperature (qC)
75
100
125
0
1
2
D033
3
4
5
6
INL (ppm)
7
8
9
10
D001
D034
Gain = 32, 30 units
Figure 22. ADC1 INL vs Temperature
Figure 23. ADC1 INL Distribution
180
10
20 SPS, Gain = 1
20 SPS, Gain = 32
20 SPS, Gain = 1
7200 SPS, Gain = 1
38400 SPS, Gain = 1
Differential Input Current (nA)
INL (ppm)
8
150
6
4
2
120
90
60
30
0
-30
-60
-90
T = -40qC
T = 25qC
T = 85qC
T = 125qC
-120
-150
0
0.5
1
1.5
2
2.5
3
3.5
Reference Voltage (V)
4
4.5
5
-180
-5
-4
-3
D052
-2
-1
0
1
2
Differential Input Voltage (V)
3
4
5
D040
PGA bypassed
Figure 24. ADC1 INL vs Reference Voltage
Figure 25. ADC1 Differential Input Current
250
8
Gain = 1, T = -40qC
Gain = 1, T = 25qC
Gain = 1, T = 85qC
Gain = 1, T = 125qC
200
Absolute Input Current (nA)
Absolute Input Current (nA)
7
150
100
T = -40qC
T = 25qC
T = 85qC
T = 125qC
50
6
5
4
3
2
1
0
0
0
0.5
1
1.5
2
2.5
3
3.5
Absolute Input Voltage (V)
4
4.5
5
0
0.5
1
D041
PGA bypassed
1.5
2
2.5
3
3.5
Absolute Input Voltage (V)
4
4.5
5
D042
Gain = 1, 4
Figure 26. ADC1 Absolute Input Current
16
Gain = 4, T = -40qC
Gain = 4, T = 25qC
Gain = 4, T = 85qC
Gain = 4, T = 125qC
Figure 27. ADC1 Absolute Input Current
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
3
8
Absolute Input Current (nA)
7
6
Gain = 32, T = -40qC
Gain = 32, T = 25qC
Gain = 32, T = 85qC
Gain = 32, T = 125qC
Differential Input Current (nA)
Gain = 16, T = -40qC
Gain = 16, T = 25qC
Gain = 16, T = 85qC
Gain = 16, T = 125qC
5
4
3
2
1
0.5
1
1.5
2
2.5
3
3.5
Absolute Input Voltage (V)
4
4.5
5
0
-1
-2
-80
-60 -40 -20
0
20
40
60
Differential Input Voltage (% FSR)
D043
Gain = 16, 32
Figure 28. ADC1 Absolute Input Current
100
D044
Figure 29. ADC1 Differential Input Current
2.502
PGA = 16, T = -40qC
PGA = 16, T = 25qC
PGA = 16, T = 85qC
PGA = 16, T = 125qC
2
PGA = 32, T = -40qC
PGA = 32, T = 25qC
PGA = 32, T = 85qC
PGA = 32, T = 125qC
2.501
Reference Voltage (V)
Differential Input Current (nA)
80
Gain = 1, 4
3
1
0
-1
2.5
2.499
2.498
-2
-3
-100
-80
-60 -40 -20
0
20
40
60
Differential Input Voltage (% FSR)
80
2.497
-50
100
-25
0
25
50
Temperature (qC)
D045
Gain = 16, 32
75
100
125
D035
D030
30 units
Figure 30. ADC1 Differential Input Current
Figure 31. Voltage Reference vs Temperature
80
0.01
Reference Voltage (% final value)
Reference Voltage Stability (ppm)
PGA = 4, T = -40qC
PGA = 4, T = 25qC
PGA = 4, T = 85qC
PGA = 4, T = 125qC
1
-3
-100
0
0
PGA = 1, T = -40qC
PGA = 1, T = 25qC
PGA = 1, T = 85qC
PGA = 1, T = 125qC
2
60
40
20
0
-20
-40
-60
0.008
0.006
0.004
0.002
0
-0.002
-0.004
-0.006
-0.008
-0.01
0
100
200
300
400 500 600
Time (hr)
700
800
900 1000
0
0.5
D086
1
1.5
2
2.5
3
Time (s)
3.5
4
4.5
5
D025
TA = 85°C, 30 units
Figure 32. Voltage Reference Long term Drift
Figure 33. Voltage Reference Start-Up Time
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
140
200
120
150
100
125
CMRR (dB)
Reference Input Current (nA)
175
100
75
50
25
80
60
40
IREFP, T = -40qC
IREFP, T = 25qC
IREFP, T = 85qC
IREFP, T = 125qC
0
-25
-50
0.5
1
1.5
IREFN, T = -40qC
IREFN, T = 25qC
IREFN, T = 85qC
IREFN, T = 125qC
2
2.5
3
3.5
Reference Voltage (V)
20
4
4.5
0
0.001
5
0.01
0.1
D031
1
10
Frequency (kHz)
100
1000
D065
IREFP measured with VREFN = VAVSS, IREFN measured with
VREFP = VAVDD
Figure 35. ADC1 CMRR vs Frequency
140
140
120
120
100
100
CMRR,PSRR (dB)
PSRR (dB)
Figure 34. ADC1 Reference Input Current
80
60
40
20
0.01
0.1
1
10
Frequency (kHz)
100
60
40
CMRR
PSRR (Analog)
PSRR (Digital)
20
Analog Supply
Digital Supply
0
0.001
80
0
-50
1000
Figure 36. ADC1 PSRR vs Frequency
0
75
100
125
D069
0.25
0
Absolute IDAC Error (%)
T = -40qC
T = 25qC
T = 85qC
T = 125qC
-0.25
-0.5
-0.75
-1
0
-0.25
-0.5
T = -40qC
T = 25qC
T = 85qC
T = 125qC
-0.75
-1
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
IDAC Compliance Voltage (VAVDD - VAINX)
5
D046
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
IDAC Compliance Voltage (VAVDD - VAINx)
IIDAC = 250 µA
5
D047
IIDAC = 1000 µA
Figure 38. IDAC Error vs Compliance Voltage
18
25
50
Temperature (qC)
Figure 37. ADC1 CMRR, PSRR vs Temperature
0.25
Absolute IDAC Error (%)
-25
D075
Figure 39. IDAC Error vs Compliance Voltage
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
0.1
T = -40qC
T = 25qC
T = 85qC
T = 125qC
0
IDAC Match Error (%)
-0.25
-0.5
T = -40qC
T = 25qC
T = 85qC
T = 125qC
-0.75
0
-0.1
-0.2
-0.3
-1
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
IDAC Compliance Voltage (VAVDD - VAINX)
0
5
0.5
1
1.5
2
2.5
3
3.5
4
4.5
IDAC Compliance Voltage (VAVDD - VAINX)
D048
IIDAC = 3000 µA
Figure 40. IDAC Error vs Compliance Voltage
D049
Figure 41. IDAC Current Error vs Compliance Voltage
170
50
160
40
150
Population (%)
140
130
120
30
20
110
10
100
D038
124.2
125
123.8
100
123.4
75
123
25
50
Temperature (qC)
122.6
0
122.2
0
-25
121.4
90
-50
121
Temperature Sensor Voltage (mV)
5
IIDAC1= IIDAC2 = 250 µA
121.8
Absolute IDAC Error (%)
0.25
D039
Temperature Sensor Voltage (mV)
30 units
TA = 25°C, 30 units
Figure 43. Temperature Sensor Voltage Distribution
Figure 42. Temperature Sensor Voltage vs Temperature
6
2
IAVDD,IAVSS
IDVDD, 20 SPS
IDVDD, 38400 SPS
5
1
Active Current (mA)
Internal Oscillator Error (%)
1.5
0.5
0
-0.5
4
3
2
-1
1
-1.5
-2
-50
-25
0
25
50
Temperature (qC)
75
100
125
0
-50
-25
D036
0
25
50
Temperature (qC)
75
100
125
D032
30 units
Figure 44. Internal Oscillator Frequency vs Temperature
Figure 45. ADS1262 Active Current vs Temperature
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
0.25
0.24
Low Alarm Threshold Voltage (V)
Differential Alarm Threshold (r% of FSR)
110
108
106
104
102
100
-50
-25
0
25
50
Temperature (qC)
75
100
0.23
0.22
0.21
0.2
0.19
0.18
0.17
0.16
0.15
-50
125
-25
0
D001
30 units
75
100
125
D061
30 units
Figure 46. ADC1 Differential Over-range Alarm Threshold vs
Temperature
Figure 47. ADC1 Absolute Low Alarm Threshold vs
Temperature
4.85
0.14
4.84
TDAC Voltage Absolute Error (%)
High Alarm Threshold Voltage (V)
25
50
Temperature (qC)
4.83
4.82
4.81
4.8
4.79
4.78
4.77
4.76
4.75
-50
-25
0
25
50
Temperature (qC)
75
100
0.5 V
2.25 V
2.484375 V
0.12
2.5 V
2.515625 V
2.75 V
4.5 V
0.1
0.08
0.06
0.04
0.02
0
-50
125
-25
0
D062
25
50
Temperature (qC)
75
100
125
D067
30 units
Figure 48. ADC1 Absolute High Alarm Threshold vs
Temperature
Figure 49. TDAC Error vs Temperature
10
60
8
55
50
45
4
Population (%)
2
0
-2
-4
30
25
20
15
Gain = 1
Gain = 4
Gain = 16
Gain = 64
10
5
D080
20
90
100
Input Referred Offset Voltage Drift (nV/°C)
After offset calibration, shorted input
Figure 50. ADC2 Offset Voltage vs Temperature
80
125
70
100
60
75
50
25
50
Temperature (qC)
40
0
30
0
-25
20
-10
-50
35
10
-8
40
0
Offset Voltage (PV)
6
-6
Gain = 1
Gain = 64
D081
Inputs shorted, 30 units
Figure 51. ADC2 Offset Voltage vs Temperature Distribution
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
100
100
75
80
Population (%)
50
Gain Error (ppm)
Gain = 1
Gain = 64
Gain = 1
Gain = 4
Gain = 16
Gain = 64
25
0
-25
60
40
-50
20
-75
0
-100
-50
-25
0
25
50
Temperature (qC)
75
100
0
125
0.5
1
1.5
D078
After gain calibration
2
2.5 3
3.5
Gain drift (ppm/qC)
4
4.5
5
D079
30 units
Figure 52. ADC2 Gain vs Temperature
Figure 53. ADC2 Gain vs Temperature Distribution
35
50
Number of Occurrences
Number of Occurrences
30
25
20
15
10
40
30
20
10
5
0
0.5
0.4
0.3
0.2
0.1
0
-0.1
-0.2
-0.3
-0.4
Input Referred Voltage (PV)
-0.5
28
24
20
16
8
12
4
0
-4
-8
-12
-16
-20
-24
-28
0
D091
D092
D056
Input Referred Voltage (PV)
Gain = 1, 10 SPS, after offset calibration, 128 samples
Gain = 128, 10 SPS, after offset calibration, 128 samples
Figure 55. ADC2 Output Reading Distribution
Figure 54. ADC2 Output Reading Distribution
6
10
Gain = 1
Gain = 4
Gain = 16
Gain = 64
4
Gain = 1
Gain = 4
Gain = 16
Gain = 64
8
INL (ppm)
INL (ppm)
2
0
6
4
-2
2
-4
-6
-100
-80
-60
-40
-20
0
20
VIN (% of FSR)
40
60
80
100
0
-50
-25
D076
Figure 56. ADC2 INL vs VIN
0
25
50
Temperature (qC)
75
100
125
D077
Figure 57. ADC2 INL vs Temperature
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
1000
500
Gain = 1
Gain = 4
Gain = 16
Gain = 64
50
30
20
Input Referred Noise (PVRMS)
Input Referred Noise (uVRMS)
100
10
5
3
2
1
0.5
0.3
0.2
0.1
-50
-25
0
25
50
Temperature (qC)
75
100
10 SPS, Gain = 1
10 SPS, Gain = 4
10 SPS, Gain = 8
200
100
50
20
10
5
2
1
0.5
0.2
0.1
0.5
125
10 SPS, Gain = 16
800 SPS, Gain = 8
1
1.5
D090
2
2.5
3
3.5
Reference Voltage (V)
4
4.5
5
D074
10 SPS
Figure 58. ADC2 Noise vs Temperature
Figure 59. ADC2 Noise vs Reference Voltage
8
Gain = 1, T = -40qC
Gain = 1, T = 25qC
Gain = 1, T = 85qC
Gain = 1, T = 125qC
16
Gain = 4, T = -40qC
Gain = 4, T = 25qC
Gain = 4, T = 85qC
Gain = 4, T = 125qC
Gain = 16, T = -40qC
Gain = 16, T = 25qC
Gain = 16, T = 85qC
Gain = 16, T = 125qC
7
Absolute Input Current (nA)
Absolute Input Current (nA)
20
12
8
4
6
Gain = 64, T = -40qC
Gain = 64, T = 25qC
Gain = 64, T = 85qC
Gain = 64, T = 125qC
5
4
3
2
1
0
0
0
0.5
1
1.5
2
2.5
3
3.5
Absolute Input Voltage (V)
4
4.5
0
5
0.5
1
D082
Gain = 1, 4
20
4
15
10
5
0
-5
-10
-20
-25
-100 -80
5
D043
PGA = 4, T = -40qC
PGA = 4, T = 25qC
PGA = 4, T = 85qC
PGA = 4, T = 125qC
-60 -40 -20
0
20
40
60
Differential Input Voltage (% FSR)
80
3
2
1
0
-1
-2
-3
-4
100
D084
-5
-100
PGA = 16, T = -40qC
PGA = 16, T = 25qC
PGA = 16, T = 85qC
PGA = 16, T = 125qC
-80
PGA = 64, T = -40qC
PGA = 64, T = 25qC
PGA = 64, T = 85qC
PGA = 64, T = 125qC
-60 -40 -20
0
20
40
60
Differential Input Voltage (% FSR)
Gain = 1, 4
80
100
D085
Gain = 16, 64
Figure 62. ADC2 Differential Input Current
22
4.5
Figure 61. ADC2 Absolute Input Current
5
Differential Input Current (nA)
Differential Input Current (nA)
Figure 60. ADC2 Absolute Input Current
PGA = 1, T = -40qC
PGA = 1, T = 25qC
PGA = 1, T = 85qC
PGA = 1, T = 125qC
4
Gain = 16, 64
25
-15
1.5
2
2.5
3
3.5
Absolute Input Voltage (V)
Figure 63. ADC2 Differential Input Current
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Typical Characteristics (continued)
at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VDVDD = 3.3 V, VREF = 2.5 V, and fCLK = 7.3728 MHz (unless otherwise noted); typical
ADC1 characteristics at data rate = 20 SPS and gain = 1; typical ADC2 characteristics at data rate = 10 SPS and gain = 1
16
120
14
Reference Input Current (nA)
100
CMRR (dB)
80
60
40
20
12
10
IREFP, T = -40qC
IREFP, T = 25qC
IREFP, T = 85qC
IREFP, T = 125qC
IREFN, T = -40qC
IREFN, T = 25qC
IREFN, T = 85qC
IREFN, T = 125qC
8
6
4
2
0
-2
-4
0
0.001
0.01
0.1
1
10
Frequency (kHz)
100
1000
-6
0.5
1
D073
1.5
2
2.5
3
3.5
Reference Voltage (V)
4
4.5
5
D031
IREFP measured with VREFN = VAVSS, IREFN measured with
VREFP = VAVDD
Figure 64. ADC2 CMRR vs Frequency
Figure 65. ADC2 Reference Input Current
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8 Parameter Measurement Information
8.1 Offset Temperature Drift Measurement
Offset temperature drift is defined as the maximum change of offset voltage measured over the specified
temperature range. The offset voltage drift is input referred and is calculated using the box method, as described
by Equation 1:
Offset Voltage Drift = (VOSMAX – VOSMIN) / (TMAX – TMIN)
where
•
•
VOSMAX and VOSMIN are the maximum and minimum offset voltages, respectively
TMAX and TMIN are the maximum and minimum temperatures, respectively, over the specified temperature
range
(1)
8.2 Gain Temperature Drift Measurement
Gain temperature drift is defined as the maximum change of gain error measured over the specified temperature
range. The gain error drift is calculated using the box method, as described by Equation 2:
Gain Error Drift = (GEMAX – GEMIN) / (TMAX – TMIN)
where
•
•
GEMAX and GEMIN are the maximum and minimum gain errors, respectively
TMAX and TMIN are the maximum and minimum temperatures, respectively, over the specified temperature
range
(2)
8.3 Common-Mode Rejection Ratio Measurement
Common-mode rejection ratio (CMRR) is defined as the rejection of the ADC output to an applied common-mode
input voltage. The common-mode input is 60 Hz with a peak-to-peak amplitude equal to the specified absolute
input voltage range. The standard deviation (RMS) value of the ADC output is calculated and scaled to volts. In
order to measure CMRR, record two ADC readings. The first reading (VA) is with no common-mode input signal.
The first reading represents the baseline ADC noise. The second reading (VB) is with the common-mode input
applied. The second reading represents the combination of the ADC baseline noise plus the increased RMS
noise caused by the common-mode input. The ADC baseline noise is extracted from the combined noise to yield
the noise induced by the common-mode input voltage. The CMRR measurement is described by Equation 3:
CMRR = 20 · Log (VIC / VOC)
where
•
•
•
•
VIC = RMS value of the input common-mode voltage = 1.56 VRMS
VOC = Calculated RMS value of output voltage = (VB2 – VA2 )0.5
VA = RMS output voltage with no common-mode input
VB = RMS output voltage with common-mode input
(3)
For gains > 1, add 6 dB of compensation value for each binary increase of gain.
8.4 Power-Supply Rejection Ratio Measurement
Power-supply rejection ratio (PSRR) is defined as the rejection of the ADC output to the DC change of the power
supply voltage referred to the input range. PSRR is calculated using two ADC mean-value readings with inputs
shorted, scaled to volts. The first ADC reading (VOA) is acquired at one power-supply voltage, and the second
ADC reading (VOB) is acquired after changing the power-supply voltage by 0.5 V. The PSRR calculation is
described by Equation 4:
PSRR = 20 · Log |(VPSA– VPSB )/ (VOA – VOB)| – 20 dB
where
•
•
•
VPSA– VPSB = power-supply DC voltage change = 0.5 V
VOA – VOB = ADC DC output voltage change (V)
Range compensation factor = 20 · log (0.5 V / 5 V) = –20 dB for gain = 1
(4)
For gains > 1, add an additional 6 dB of compensation value for each binary increase of gain.
24
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8.5 Crosstalk Measurement (ADS1263)
Crosstalk is defined as the unintended coupling of signals between ADC1 and ADC2. Measure crosstalk by
changing the dc input voltage of one ADC and measuring the rejection of the other ADC. The dc input voltage
change is 0.3 V, and the gain of the affected ADC is 16. Acquire two mean-value readings of the affected ADC
with inputs shorted. Take the first ADC reading (VOA) with VIN = 0 V, and take the second ADC reading (VOB)
after changing the input voltage by 0.3 V. The crosstalk calculation is described by Equation 5:
Crosstalk = |(VOA – VOB) / (VINA – VINB)| · 106 (µV/V)
where
•
•
VOA – VOB = DC output voltage change of the affected ADC
VINA – VINB = DC input voltage change of the driven ADC = 0.3 V
(5)
8.6 Reference-Voltage Temperature-Drift Measurement
Internal reference-voltage temperature drift is defined as the maximum change in reference voltage measured
over the specified temperature range. The reference voltage drift is calculated using the box method, as
described by Equation 6:
Reference Drift = (VREFMAX – VREFMIN) / (VREFNOM · (TMAX – TMIN) ) · 106 (ppm)
where
•
•
VREFMAX, VREFMIN and VREFNOM are the maximum, minimum and nominal (TA = 25°C) reference voltages,
respectively
TMAX and TMIN are the maximum and minimum temperatures, respectively, over the specified temperature
range
(6)
8.7 Reference-Voltage Thermal-Hysteresis Measurement
Internal reference-voltage thermal hysteresis is defined as the change in reference voltage after operating the
device at TA = 25°C, cycling the device through the TA = 0°C to 85°C temperature range for ten minutes at each
temperature and returning to TA = 25°C. The internal reference thermal hysteresis is defined in Equation 7:
Reference Thermal Hysteresis = |VREFPRE – VREFPOST| / VREFPRE · 106 (ppm)
where
•
VREFPRE and VREFPOST are the reference voltages before and after the temperature cycle, respectively
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8.8 Noise Performance
The ADC noise performance depends on the following ADC settings: PGA gain, data rate, digital filter mode, and
chop mode. Generally, the lowest input-referred noise is achieved using the highest gain possible, consistent
with the input signal range. Do not set the gain too high or the result is ADC overrange. Noise also depends on
the output data rate and mode of the digital filter. As the data rate reduces, the ADC bandwidth correspondingly
reduces. As the order of the digital filter mode increases, the ADC bandwidth also reduces. This reduction in total
bandwidth results in lower overall noise. The ADC noise is reduced by a factor of 1.4 with chop mode enabled.
Table 1 shows ADC1 noise performance in units of µVRMS (RMS = root mean square) under the conditions
shown. The values in parenthesis are peak-to-peak values. Table 2 shows the noise performance in effective
number of bits (ENOB) with an external 5-V reference voltage. The values shown in parenthesis are noise-free
bits. The definition of noise-free bits is the resolution of the ADC with no code flicker. The noise-free bits data are
based on the µVPP values. Note that for data rate = 38400 SPS, noise scales with increased reference voltage.
For all other data rates, noise does not scale with reference voltage.
Table 3 shows the noise performance of ADC2 (ADS1263) in units of µVRMS and (µVP–P). The values in
parenthesis are peak-to-peak values. Table 4 shows the ENOB and noise-free bits of ADC2.
The ENOB and noise-free bits shown in the tables are calculated using Equation 8:
ENOB = ln (FSR / VNRMS) / ln (2)
where
•
•
FSR = full scale range = 2 · VREF/Gain
VNRMS = Input referred noise voltage
(8)
Achieve maximum ENOB with maximum FSR. For ADC1, achieve maximum FSR with VREF = 5 V and the PGA
bypassed. If the PGA is enabled, the FSR is limited by the PGA input range (see the Electrical Characteristics
table.) For ADC2, achieve maximum FSR with VREF = 5 V and gains = 1, 2, or 4. If gain = 8 to 128, then FSR is
limited by the PGA input range (see the Electrical Characteristics table).
For ADC1 operation, if the reference voltage is equal to 5 V and the PGA is enabled, the available FSR is
restricted because of the limited PGA range specification. For ADC2 operation, if the reference voltage is equal
to 5 V, The FSR is reduced for ADC2 gains equal to or greater than eight because of the limited PGA range.
The data shown in the noise performance tables represent typical ADC performance at TA = 25°C. The noiseperformance data are the standard deviation and peak-to-peak computations of the ADC data. Because of the
statistical nature of noise, repeated noise measurements may yield higher or lower noise results. The noise data
are acquired with inputs shorted, from consecutive ADC readings for a period of ten seconds or 8192 data
points, whichever occurs first.
Table 1. ADC1 Noise in µVRMS (µVPP) at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VREF = 2.5 V
DATA RATE
GAIN
FILTER MODE
1
2
4
8
16
32
2.5 SPS
FIR
0.145 (0.637)
0.071 (0.279)
0.038 (0.149)
0.023 (0.089)
0.014 (0.064)
0.011 (0.051)
2.5 SPS
Sinc1
0.121 (0.510)
0.058 (0.249)
0.033 (0.143)
0.018 (0.073)
0.012 (0.054)
0.008 (0.037)
2.5 SPS
Sinc2
0.101 (0.437)
0.055 (0.225)
0.025 (0.104)
0.015 (0.064)
0.010 (0.043)
0.007 (0.031)
2.5 SPS
Sinc3
0.080 (0.307)
0.046 (0.195)
0.026 (0.116)
0.013 (0.052)
0.008 (0.034)
0.006 (0.023)
2.5 SPS
Sinc4
0.080 (0.308)
0.043 (0.180)
0.020 (0.078)
0.013 (0.049)
0.008 (0.031)
0.007 (0.027)
5 SPS
FIR
0.206 (1.007)
0.098 (0.448)
0.054 (0.252)
0.028 (0.123)
0.020 (0.098)
0.015 (0.073)
5 SPS
Sinc1
0.161 (0.726)
0.090 (0.432)
0.047 (0.246)
0.026 (0.120)
0.017 (0.083)
0.012 (0.057)
5 SPS
Sinc2
0.146 (0.661)
0.069 (0.308)
0.038 (0.195)
0.021 (0.100)
0.013 (0.061)
0.011 (0.050)
5 SPS
Sinc3
0.128 (0.611)
0.067 (0.325)
0.033 (0.153)
0.019 (0.095)
0.012 (0.054)
0.010 (0.046)
5 SPS
Sinc4
0.122 (0.587)
0.063 (0.269)
0.030 (0.144)
0.017 (0.076)
0.011 (0.048)
0.008 (0.039)
10 SPS
FIR
0.284 (1.418)
0.142 (0.753)
0.077 (0.379)
0.041 (0.197)
0.027 (0.156)
0.023 (0.118)
10 SPS
Sinc1
0.229 (1.220)
0.123 (0.662)
0.060 (0.322)
0.035 (0.177)
0.023 (0.118)
0.018 (0.103)
10 SPS
Sinc2
0.193 (1.019)
0.093 (0.488)
0.048 (0.254)
0.028 (0.149)
0.019 (0.099)
0.016 (0.079)
10 SPS
Sinc3
0.176 (0.896)
0.088 (0.452)
0.043 (0.217)
0.028 (0.137)
0.018 (0.091)
0.014 (0.067)
10 SPS
Sinc4
0.164 (0.788)
0.076 (0.389)
0.040 (0.200)
0.024 (0.119)
0.016 (0.081)
0.013 (0.065)
26
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Noise Performance (continued)
Table 1. ADC1 Noise in µVRMS (µVPP) at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VREF = 2.5 V (continued)
DATA RATE
FILTER MODE
GAIN
1
2
4
8
16
32
16.6 SPS
Sinc1
0.306 (1.708)
0.147 (0.810)
0.077 (0.436)
0.044 (0.250)
0.030 (0.176)
0.024 (0.138)
16.6 SPS
Sinc2
0.248 (1.401)
0.122 (0.729)
0.068 (0.403)
0.037 (0.213)
0.024 (0.136)
0.020 (0.111)
16.6 SPS
Sinc3
0.216 (1.221)
0.120 (0.667)
0.060 (0.332)
0.033 (0.197)
0.022 (0.130)
0.017 (0.095)
16.6 SPS
Sinc4
0.214 (1.169)
0.101 (0.544)
0.054 (0.302)
0.031 (0.175)
0.022 (0.129)
0.016 (0.092)
20 SPS
FIR
0.393 (2.467)
0.191 (1.102)
0.104 (0.603)
0.057 (0.353)
0.039 (0.222)
0.030 (0.167)
20 SPS
Sinc1
0.336 (1.861)
0.167 (0.964)
0.085 (0.486)
0.049 (0.266)
0.033 (0.191)
0.026 (0.138)
20 SPS
Sinc2
0.270 (1.560)
0.136 (0.745)
0.070 (0.376)
0.039 (0.231)
0.028 (0.149)
0.021 (0.111)
20 SPS
Sinc3
0.237 (1.415)
0.124 (0.701)
0.067 (0.399)
0.035 (0.192)
0.024 (0.130)
0.020 (0.109)
20 SPS
Sinc4
0.229 (1.285)
0.113 (0.612)
0.060 (0.325)
0.034 (0.193)
0.022 (0.123)
0.017 (0.098)
50 SPS
Sinc1
0.514 (2.925)
0.255 (1.584)
0.140 (0.940)
0.077 (0.457)
0.051 (0.315)
0.042 (0.264)
50 SPS
Sinc2
0.426 (2.400)
0.209 (1.217)
0.108 (0.666)
0.064 (0.381)
0.042 (0.265)
0.033 (0.200)
50 SPS
Sinc3
0.389 (2.324)
0.196 (1.185)
0.104 (0.624)
0.057 (0.367)
0.038 (0.228)
0.030 (0.179)
50 SPS
Sinc4
0.358 (2.319)
0.175 (1.023)
0.096 (0.597)
0.055 (0.319)
0.036 (0.217)
0.028 (0.176)
60 SPS
Sinc1
0.558 (3.574)
0.285 (1.703)
0.151 (0.913)
0.085 (0.515)
0.055 (0.335)
0.045 (0.271)
60 SPS
Sinc2
0.465 (2.753)
0.235 (1.424)
0.121 (0.760)
0.068 (0.417)
0.046 (0.276)
0.036 (0.208)
60 SPS
Sinc3
0.414 (2.704)
0.208 (1.187)
0.112 (0.655)
0.064 (0.396)
0.042 (0.276)
0.034 (0.197)
60 SPS
Sinc4
0.383 (2.288)
0.195 (1.174)
0.105 (0.623)
0.059 (0.347)
0.040 (0.242)
0.031 (0.188)
100 SPS
Sinc1
0.734 (4.715)
0.361 (2.276)
0.192 (1.209)
0.108 (0.679)
0.071 (0.473)
0.058 (0.362)
100 SPS
Sinc2
0.604 (3.662)
0.305 (1.934)
0.156 (1.072)
0.088 (0.579)
0.059 (0.371)
0.048 (0.321)
100 SPS
Sinc3
0.531 (3.431)
0.277 (1.780)
0.143 (0.935)
0.081 (0.545)
0.054 (0.343)
0.043 (0.288)
100 SPS
Sinc4
0.511 (3.340)
0.255 (1.632)
0.134 (0.861)
0.076 (0.479)
0.050 (0.322)
0.041 (0.271)
400 SPS
Sinc1
1.438 (10.374)
0.734 (5.410)
0.380 (2.657)
0.215 (1.469)
0.143 (1.066)
0.116 (0.843)
400 SPS
Sinc2
1.186 (8.523)
0.607 (4.333)
0.313 (2.280)
0.178 (1.313)
0.119 (0.884)
0.095 (0.676)
400 SPS
Sinc3
1.072 (7.923)
0.550 (3.999)
0.285 (1.991)
0.161 (1.132)
0.107 (0.781)
0.087 (0.630)
400 SPS
Sinc4
0.995 (7.107)
0.508 (3.664)
0.266 (1.947)
0.151 (1.061)
0.101 (0.708)
0.081 (0.583)
1200 SPS
Sinc1
2.451 (17.755)
1.254 (9.305)
0.651 (5.044)
0.368 (2.807)
0.244 (1.846)
0.197 (1.519)
1200 SPS
Sinc2
2.038 (15.480)
1.037 (8.128)
0.545 (4.107)
0.309 (2.315)
0.205 (1.586)
0.165 (1.283)
1200 SPS
Sinc3
1.858 (14.005)
0.960 (7.223)
0.494 (3.833)
0.281 (2.145)
0.186 (1.374)
0.148 (1.094)
1200 SPS
Sinc4
1.743 (13.428)
0.890 (6.585)
0.459 (3.405)
0.261 (2.018)
0.174 (1.337)
0.139 (1.032)
2400 SPS
Sinc1
3.411 (26.095)
1.724 (13.528)
0.903 (6.609)
0.510 (3.920)
0.335 (2.626)
0.270 (2.107)
2400 SPS
Sinc2
2.870 (21.677)
1.468 (11.032)
0.770 (5.932)
0.435 (3.379)
0.286 (2.123)
0.230 (1.758)
2400 SPS
Sinc3
2.656 (20.100)
1.337 (9.936)
0.705 (5.355)
0.395 (3.035)
0.262 (1.951)
0.211 (1.533)
2400 SPS
Sinc4
2.475 (19.447)
1.262 (9.452)
0.657 (4.966)
0.371 (2.869)
0.245 (1.885)
0.198 (1.576)
4800 SPS
Sinc1
4.590 (34.155)
2.329 (17.298)
1.221 (8.943)
0.682 (5.252)
0.446 (3.239)
0.361 (2.957)
4800 SPS
Sinc2
4.091 (30.903)
2.070 (15.168)
1.077 (8.141)
0.606 (4.777)
0.398 (2.986)
0.321 (2.397)
4800 SPS
Sinc3
3.720 (28.423)
1.894 (14.842)
0.998 (7.626)
0.560 (4.176)
0.367 (2.890)
0.297 (2.211)
4800 SPS
Sinc4
3.535 (27.437)
1.784 (13.760)
0.926 (7.273)
0.527 (4.004)
0.349 (2.626)
0.277 (2.184)
7200 SPS
Sinc1
5.326 (42.076)
2.709 (19.749)
1.407 (11.126)
0.792 (5.784)
0.516 (3.881)
0.409 (3.189)
7200 SPS
Sinc2
4.867 (36.820)
2.467 (18.627)
1.280 (9.874)
0.726 (5.612)
0.472 (3.531)
0.379 (2.792)
7200 SPS
Sinc3
4.567 (35.194)
2.310 (17.516)
1.209 (9.036)
0.682 (5.181)
0.445 (3.590)
0.359 (2.666)
7200 SPS
Sinc4
4.365 (34.008)
2.211 (17.432)
1.143 (8.804)
0.642 (5.075)
0.426 (3.261)
0.341 (2.467)
14400 SPS
Sinc5
6.377 (48.242)
3.235 (25.178)
1.675 (12.508)
0.929 (7.280)
0.596 (4.430)
0.466 (3.524)
19200 SPS
Sinc5
8.720 (65.389)
4.432 (32.931)
2.285 (17.055)
1.227 (9.870)
0.747 (5.725)
0.555 (4.058)
38400 SPS
Sinc5
103.55 (759.91) 51.76 (371.46)
25.95 (192.20)
13.02 (99.09)
6.493 (46.060)
3.276 (24.435)
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27
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SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
www.ti.com
Table 2. ADC1 ENOB (Noise Free Bits) at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VREF = 5 V
DATA RATE
FILTER MODE
GAIN
1 (BYPASS)
2
4
8
16
32
2.5 SPS
FIR
26.0 (23.9)
25.9 (23.9)
25.8 (23.8)
25.5 (23.6)
25.4 (23.0)
24.6 (22.4)
2.5 SPS
Sinc1
26.3 (24.2)
26.2 (24.1)
26.0 (23.9)
25.9 (23.8)
25.6 (23.3)
25.0 (22.8)
2.5 SPS
Sinc2
26.6 (24.4)
26.3 (24.2)
26.4 (24.3)
26.1 (24.0)
25.8 (23.6)
25.2 (23.1)
2.5 SPS
Sinc3
26.9 (25.0)
26.5 (24.4)
26.3 (24.2)
26.3 (24.3)
26.1 (23.9)
25.6 (23.5)
2.5 SPS
Sinc4
26.9 (25.0)
26.6 (24.5)
26.7 (24.7)
26.3 (24.4)
26.2 (24.1)
25.2 (23.3)
5 SPS
FIR
25.5 (23.2)
25.4 (23.2)
25.3 (23.1)
25.2 (23.1)
24.8 (22.4)
24.1 (21.9)
5 SPS
Sinc1
25.9 (23.7)
25.5 (23.3)
25.5 (23.1)
25.4 (23.1)
25.0 (22.7)
24.4 (22.2)
5 SPS
Sinc2
26.0 (23.9)
25.9 (23.8)
25.8 (23.4)
25.7 (23.4)
25.4 (23.1)
24.6 (22.4)
5 SPS
Sinc3
26.2 (24.0)
26.0 (23.7)
26.0 (23.8)
25.8 (23.5)
25.6 (23.3)
24.7 (22.5)
5 SPS
Sinc4
26.3 (24.0)
26.1 (24.0)
26.1 (23.9)
25.9 (23.8)
25.7 (23.5)
25.0 (22.8)
10 SPS
FIR
25.1 (22.7)
24.9 (22.5)
24.8 (22.5)
24.7 (22.4)
24.4 (21.8)
23.5 (21.2)
10 SPS
Sinc1
25.4 (23.0)
25.1 (22.7)
25.1 (22.7)
24.9 (22.6)
24.6 (22.2)
23.8 (21.4)
10 SPS
Sinc2
25.6 (23.2)
25.5 (23.1)
25.4 (23.0)
25.2 (22.8)
24.9 (22.4)
24.1 (21.7)
10 SPS
Sinc3
25.8 (23.4)
25.6 (23.2)
25.6 (23.3)
25.2 (22.9)
25.0 (22.5)
24.2 (22.0)
10 SPS
Sinc4
25.9 (23.6)
25.8 (23.4)
25.7 (23.4)
25.5 (23.1)
25.1 (22.7)
24.4 (22.0)
16.6 SPS
Sinc1
25.0 (22.5)
24.8 (22.4)
24.8 (22.3)
24.6 (22.1)
24.2 (21.6)
23.5 (20.9)
16.6 SPS
Sinc2
25.3 (22.8)
25.1 (22.5)
24.9 (22.4)
24.8 (22.3)
24.6 (21.9)
23.7 (21.2)
16.6 SPS
Sinc3
25.5 (23.0)
25.1 (22.7)
25.1 (22.7)
25.0 (22.4)
24.6 (22.0)
23.9 (21.5)
16.6 SPS
Sinc4
25.5 (23.0)
25.4 (22.9)
25.3 (22.8)
25.1 (22.6)
24.7 (22.0)
24.0 (21.5)
20 SPS
FIR
24.6 (22.0)
24.5 (21.9)
24.3 (21.8)
24.2 (21.6)
23.9 (21.2)
23.1 (20.7)
20 SPS
Sinc1
24.8 (22.4)
24.7 (22.1)
24.6 (22.1)
24.4 (22.0)
24.1 (21.5)
23.3 (20.9)
20 SPS
Sinc2
25.1 (22.6)
24.9 (22.5)
24.9 (22.5)
24.7 (22.2)
24.3 (21.8)
23.6 (21.2)
20 SPS
Sinc3
25.3 (22.8)
25.1 (22.6)
25.0 (22.4)
24.9 (22.4)
24.5 (22.0)
23.7 (21.3)
20 SPS
Sinc4
25.4 (22.9)
25.2 (22.8)
25.1 (22.7)
25.0 (22.4)
24.6 (22.1)
23.9 (21.4)
50 SPS
Sinc1
24.2 (21.7)
24.0 (21.4)
23.9 (21.2)
23.8 (21.2)
23.5 (20.7)
22.6 (20.0)
50 SPS
Sinc2
24.5 (22.0)
24.3 (21.8)
24.3 (21.7)
24.0 (21.5)
23.7 (21.0)
23.0 (20.4)
50 SPS
Sinc3
24.6 (22.0)
24.4 (21.8)
24.3 (21.8)
24.2 (21.5)
23.9 (21.2)
23.1 (20.6)
50 SPS
Sinc4
24.7 (22.0)
24.6 (22.0)
24.4 (21.8)
24.3 (21.7)
24.0 (21.3)
23.2 (20.6)
60 SPS
Sinc1
24.1 (21.4)
23.9 (21.3)
23.8 (21.2)
23.6 (21.0)
23.4 (20.6)
22.5 (20.0)
60 SPS
Sinc2
24.4 (21.8)
24.2 (21.6)
24.1 (21.5)
24.0 (21.3)
23.6 (20.9)
22.9 (20.3)
60 SPS
Sinc3
24.5 (21.8)
24.3 (21.8)
24.2 (21.7)
24.0 (21.4)
23.7 (20.9)
23.0 (20.4)
60 SPS
Sinc4
24.6 (22.1)
24.4 (21.8)
24.3 (21.8)
24.1 (21.6)
23.8 (21.1)
23.1 (20.5)
100 SPS
Sinc1
23.7 (21.0)
23.5 (20.9)
23.5 (20.8)
23.3 (20.6)
23.0 (20.1)
22.2 (19.5)
100 SPS
Sinc2
24.0 (21.4)
23.8 (21.1)
23.8 (21.0)
23.6 (20.9)
23.2 (20.5)
22.4 (19.7)
100 SPS
Sinc3
24.2 (21.5)
23.9 (21.2)
23.9 (21.2)
23.7 (20.9)
23.4 (20.6)
22.6 (19.9)
100 SPS
Sinc4
24.2 (21.5)
24.0 (21.4)
24.0 (21.3)
23.8 (21.1)
23.5 (20.7)
22.7 (20.0)
400 SPS
Sinc1
22.7 (19.9)
22.5 (19.6)
22.5 (19.7)
22.3 (19.5)
22.0 (19.0)
21.2 (18.3)
400 SPS
Sinc2
23.0 (20.2)
22.8 (20.0)
22.7 (19.9)
22.6 (19.7)
22.2 (19.2)
21.5 (18.6)
400 SPS
Sinc3
23.2 (20.3)
22.9 (20.1)
22.9 (20.1)
22.7 (19.9)
22.4 (19.4)
21.6 (18.7)
400 SPS
Sinc4
23.3 (20.4)
23.0 (20.2)
23.0 (20.1)
22.8 (20.0)
22.5 (19.6)
21.7 (18.8)
1200 SPS
Sinc1
22.0 (19.1)
21.7 (18.9)
21.7 (18.7)
21.5 (18.6)
21.2 (18.2)
20.4 (17.5)
1200 SPS
Sinc2
22.2 (19.3)
22.0 (19.0)
21.9 (19.0)
21.8 (18.9)
21.5 (18.4)
20.7 (17.7)
1200 SPS
Sinc3
22.4 (19.4)
22.1 (19.2)
22.1 (19.1)
21.9 (19.0)
21.6 (18.6)
20.8 (17.9)
1200 SPS
Sinc4
22.5 (19.5)
22.2 (19.3)
22.2 (19.3)
22.0 (19.1)
21.7 (18.6)
20.9 (18.0)
28
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Copyright © 2015, Texas Instruments Incorporated
Product Folder Links: ADS1262 ADS1263
ADS1262, ADS1263
www.ti.com
SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
Table 2. ADC1 ENOB (Noise Free Bits) at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VREF = 5 V (continued)
DATA RATE
FILTER MODE
GAIN
1 (BYPASS)
2
4
8
16
32
2400 SPS
Sinc1
21.5 (18.5)
21.3 (18.3)
21.2 (18.3)
21.0 (18.1)
20.7 (17.7)
20.0 (17.0)
2400 SPS
Sinc2
21.7 (18.8)
21.5 (18.6)
21.4 (18.5)
21.3 (18.3)
21.0 (18.0)
20.2 (17.3)
2400 SPS
Sinc3
21.8 (18.9)
21.7 (18.8)
21.6 (18.6)
21.4 (18.5)
21.1 (18.1)
20.3 (17.5)
2400 SPS
Sinc4
21.9 (19.0)
21.7 (18.8)
21.7 (18.8)
21.5 (18.5)
21.2 (18.2)
20.4 (17.4)
4800 SPS
Sinc1
21.1 (18.2)
20.8 (18.0)
20.8 (17.9)
20.6 (17.7)
20.3 (17.4)
19.5 (16.5)
4800 SPS
Sinc2
21.2 (18.3)
21.0 (18.1)
21.0 (18.0)
20.8 (17.8)
20.5 (17.5)
19.7 (16.8)
4800 SPS
Sinc3
21.4 (18.4)
21.1 (18.2)
21.1 (18.1)
20.9 (18.0)
20.6 (17.5)
19.8 (16.9)
4800 SPS
Sinc4
21.4 (18.5)
21.2 (18.3)
21.2 (18.2)
21.0 (18.1)
20.7 (17.7)
19.9 (16.9)
7200 SPS
Sinc1
20.8 (17.9)
20.6 (17.8)
20.6 (17.6)
20.4 (17.5)
20.1 (17.1)
19.4 (16.4)
7200 SPS
Sinc2
21.0 (18.1)
20.8 (17.8)
20.7 (17.8)
20.5 (17.6)
20.2 (17.2)
19.5 (16.6)
7200 SPS
Sinc3
21.1 (18.1)
20.9 (17.9)
20.8 (17.9)
20.6 (17.7)
20.3 (17.2)
19.5 (16.7)
7200 SPS
Sinc4
21.1 (18.2)
20.9 (17.9)
20.9 (17.9)
20.7 (17.7)
20.4 (17.4)
19.6 (16.8)
14400 SPS
Sinc5
20.6 (17.7)
20.4 (17.4)
20.3 (17.4)
20.2 (17.2)
19.9 (16.9)
19.2 (16.3)
19200 SPS
Sinc5
20.1 (17.2)
19.9 (17.0)
19.9 (17.0)
19.8 (16.8)
19.6 (16.6)
18.9 (16.0)
38400 SPS
Sinc5
15.6 (12.6)
15.4 (12.6)
15.4 (12.5)
15.3 (12.5)
15.5 (12.6)
15.4 (12.5)
Table 3. ADC2 (ADS1263) Noise in µVRMS (µVPP) at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VREF = 2.5 V
DATA
RATE
FILTER
GAIN
1
2
4
8
16
32
64
128
10 SPS
Sinc1
7.34 (32.6)
3.54 (16.5)
1.52 (7.57)
0.87 (4.22)
0.47 (2.42)
0.28 (1.43)
0.20 (1.08)
0.14 (0.70)
100 SPS
Sinc3
10.3 (65.2)
5.58 (36.0)
3.13 (20.4)
1.80 (11.5)
0.96 (6.30)
0.62 (4.03)
0.48 (3.08)
0.32 (2.04)
400 SPS
Sinc3
56.8 (827)
29.2 (345)
15.3 (158)
7.88 (76.9)
4.02 (36.2)
2.18 (17.9)
1.32 (9.94)
0.80 (5.56)
800 SPS
Sinc3
299 (3195)
151 (1756)
76.8 (875)
38.9 (417)
19.8 (199)
10.0 (90.0)
5.21 (43.6)
2.71 (21.9)
Table 4. ADC2 (ADS1263) ENOB (Noise Free Bits) at TA = 25°C, VAVDD = 5 V, VAVSS = 0 V, VREF = 5 V
DATA
RATE
FILTER
10 SPS
100 SPS
GAIN
1
2
4
8
16
32
64
128
Sinc1
21.4 (18.8)
21.3 (18.8)
21.1 (18.6)
20.6 (18.2)
20.6 (18.1)
20.2 (17.8)
19.4 (17.0)
19.1 (16.7)
Sinc3
20.3 (17.5)
20.1 (17.3)
19.8 (17.2)
19.4 (16.7)
19.3 (16.5)
18.9 (16.2)
18.2 (15.6)
17.8 (15.0)
400 SPS
Sinc3
16.5 (12.5)
16.5 (12.5)
16.4 (12.7)
16.2 (12.8)
16.2 (12.6)
16.2 (13.0)
16.1 (13.0)
15.9 (13.0)
800 SPS
Sinc3
14.0 (10.7)
14.0 (10.7)
14.0 (10.4)
13.8 (10.4)
13.8 (10.4)
13.8 (10.4)
13.7 (10.6)
13.7 (10.7)
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9 Detailed Description
9.1 Overview
The ADS1262 and ADS1263 are precision 32-bit, delta-sigma (ΔΣ) ADCs with an integrated analog front end
(AFE) to simplify connection to sensors. A 32-bit ADC (ADC1) provides output data rates from 2.5 SPS to 38400
SPS for flexibility in resolution and data rates over a wide range of applications. The ADC low noise and low drift
architecture make these devices suitable for precise digitization of low-level transducers, such as load cell
bridges and temperature sensors. The ADS1263 includes an auxiliary 24-bit delta-sigma ADC (ADC2).
The ADS1262 and the ADS1263 incorporate several functions that provide increased utility. The key integrated
functions include:
• Low-drift voltage reference
• Dual, matched, sensor-excitation current sources (IDAC)
• Input-level-shift voltage
• Eight GPIOs
• Dual-sensor, bias current sources
• Low-noise, CMOS PGA with integrated signal fault detection
• Internal test signal source (TDAC)
• Temperature sensor
• Internal oscillator
• Three sets of buffered external reference inputs with low reference voltage alarm
As seen in the Functional Block Diagram, these devices feature 11 analog inputs that are configurable as either
ten single-ended inputs, five differential inputs, or any combination, to either ADC1 or ADC2. Many of the analog
inputs are multifunction as programmed by the user. The analog inputs can be programmed to the following
extended functions:
• Three external reference inputs: pins AIN0, AIN1, AIN2, AIN3, AIN4 and AIN5
• Two sensor excitation current source: all analog input pins
• Level shift (VBIAS): AINCOM pin
• Eight GPIO: pins AIN3, AIN4, AIN5, AIN6, AIN7, AIN8, AIN9, AINCOM
• Sensor break current source: all analog input pins
• Two test signal output: pins AIN6, AIN7
Following the input multiplexer (mux), ADC1 features a high-impedance, CMOS, programmable gain amplifier
(PGA). The PGA provides very low voltage and current noise, enabling direct connection to low-level
transducers, and in many cases, eliminating the need for an external amplifier. The PGA gain is programmable
from 1 V/V to 32 V/V in binary steps. The PGA can be bypassed to allow the input range to extend below ground.
The PGA has voltage overrange monitors to improve the integrity of the conversion result. The PGA overrange
alarm is latched during the conversion phase and appended to the conversion data. The programmable sensor
bias uses a test current to help detect a failed sensor or sensor connection.
An inherently stable delta-sigma modulator measures the ratio of the input voltage to the reference voltage to
provide the ADC result. The ADC operates with the internal 2.5-V reference, or with up to three external
reference inputs. The external reference inputs are continuously monitored for low (or missing) voltage. The
reference alarm status is latched during the conversion phase and appended to the conversion data. The
REFOUT pin is the buffered 2.5-V internal voltage reference output.
Dual excitation current sources (IDAC) provide bias to resistance sensors (such as 3-wire RTD). The ADC
integrates several system monitors for readback, such as temperature sensor and supply monitor. The ADC
features an internal test signal voltage (TDAC) that is used to verify the ADC operation across all gains. The
TDAC has two outputs to provide test voltages for single-ended and differential input configurations. Eight GPIO
ports are available on the analog input pins.
The digital filter provides two functional modes, sinc and FIR, allowing optimization of settling time and line-cycle
rejection. The sinx/x (sinc) filter is programmable to sinc orders one through four to tradeoff filter settling time and
50-Hz and 60-Hz line-cycle rejection. The finite impulse response (FIR) filter mode provides single-cycle settled
data with 50-Hz and 60-Hz line cycle rejection at data rates up to 20 SPS.
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Overview (continued)
The ADS1263 includes an auxiliary 24-bit delta-sigma ADC (ADC2) featuring buffered PGA inputs, gains from 1
V/V to 128 V/V, and data rates up to 800 SPS. All analog inputs and reference inputs are available to ADC2.
ADC2 can be used to provide redundant measurements or system measurements such as sensor temperature
compensation and thermocouple cold junction compensation (CJC). The ADS1263 is pin and functionally
compatible to the ADS1262.
The SPI™-compatible serial interface is used to read the conversion data and also to configure and control the
ADC. The serial interface consists of four signals: CS, SCLK, DIN and DOUT/DRDY. The conversion data are
provided with a CRC code for improved data integrity. The dual function DOUT/DRDY output indicates when
conversion data are ready and also provides the data output. The serial interface can be implemented with as
little as three connections by tying CS low.
The ADC has three clock options: internal oscillator, external crystal, and external clock. The ADC detects the
clock mode automatically. The nominal clock frequency is 7.3728 MHz.
ADC conversions are started by a control pin or by commands. The ADC can be programmed to free-run mode
or perform one-shot conversions. The DRDY and DOUT/DRDY pins are driven low when the conversion data are
ready. The RESET/PWDN digital input resets the ADC when momentarily pulsed low, and when held low,
enables the ADC power-down mode.
The ADC operates with bipolar (± 2.5 V) supplies, or with a single 5-V supply. For single-supply operation, use
the internal level-shift voltage to level-shift isolated (floating) sensors The digital power-supply range is 2.7 V to
5.25 V. The BYPASS pin is the subregulator output (2 V) that is used for internal digital supply.
9.2 Functional Block Diagram
AVDD AVSS
CAPP CAPN
2-V Digital
Supply
Ref
Mux
ADC1
2.5 V Ref
REFOUT
Sensor
Bias
8
Level Shift
Temp Sensor
32-bit
û
ADC1
Signal
Level
Alarm
GPIO
Sensor
Bias
PGA
DRDY
Buf
PGA
ADS1263 Only
Input
Mux
ADC2
Low Ref
Alarm
Dual
Sensor
Excitation
Input
Mux
ADC1
Power Supplies
RESET/PWDN
Control
AIN0
AIN1
AIN2
AIN7
AIN8
AIN9
AINCOM
LDO
START
Ref
Mux
ADC2
AIN3
AIN4
AIN5
AIN6
DVDD
BYPASS
Buf
24-bit
û
ADC2
Digital
Filter
CS
Serial
Interface
SCLK
DOUT/DRDY
DIN
Internal
Oscillator
Digital
Filter
XTAL1
Clock
Mux
XTAL2/CLKIN
Test DAC
DGND
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9.3 Feature Description
9.3.1 Multifunction Analog Inputs
The ADS1262 and ADS1263 have 11 multifunction analog inputs configurable in a variety of extended functions.
Figure 66 shows the internal analog signal routing to the circuit blocks. Table 5 summarizes the input pin
functions. The devices have two cross-point multiplexers; one multiplexer for ADC1, and one multiplexer for
ADC2. The multiplexers select any analog input for the positive PGA input and any input for the negative PGA
input. The ADCs are also configurable for a number of internal monitor functions. The internal monitors are
temperature sensor, TDAC test voltage, analog power-supply voltage, and digital power-supply voltage. The dual
excitation-current sources (IDAC1 and IDAC2) are independently connected to any analog input pin. Eight analog
inputs are configurable as GPIO. The GPIOs are programmable as inputs or outputs, and are referenced to the
analog power-supply voltages (VAVDD and VAVSS). The level-shift function (VBIAS) is available on AINCOM and is
used to provide an input level-shift voltage for isolated sensors. The internal TDAC test voltage is available on
output pins AIN6 and AIN7. The ADC has two voltage-reference multiplexers; one reference multiplexer for
ADC1, and one reference multiplexer for ADC2. Through the reference multiplexers, select the internal reference,
three external reference sources, or the analog power-supply voltage (VAVDD – VAVSS).
6
AIN0-AIN5
INT REF
Sensor
Excitation
AIN0 - AINCOM
ADC1
Input
Mux
Test DAC
GPIO[7:0]
AIN1
VREFP
VREFN
Analog Supply
11
AIN0
ADC1
Reference
Mux
TEMP Sensor
8
VAINP
VAINN
AIN2
Analog Supply
Monitor
Digital Supply
Monitor
AIN3
AIN4
AIN5
AIN6
ADS1263 Only
AIN7
AIN0 - AIN5
AIN8
INT REF
2.5 V Reference
AIN9
ADC2
Reference
Mux
VREFP_2
VREFN_2
Analog Supply
AINCOM
VBIAS
Temperature
Sensor
AIN0 - AINCOM
2
ADC2
Input
Mux
Test DAC
TEMP Sensor
Test DAC
VAINP_2
VAINN_2
Analog Supply
Monitor
Digital Supply
Monitor
Figure 66. Analog Input Routing Overview
Table 5. Analog Input Pin Functions
(1)
32
PIN
ADC1
INPUT
ADC2
INPUT
ADC2 REF INPUT
IDAC1 OUTPUT
IDAC2 OUTPUT
GPIO
TDAC OUTPUT
LEVEL
SHIFT
OUTPUT
AIN0
Yes
Yes
REFP1, REFN1
REFP1
Yes
Yes
—
—
—
AIN1
Yes
Yes
REFP1, REFN1
REFN1
Yes
Yes
—
—
—
AIN2
Yes
Yes
REFP2, REFN2
REFP2
Yes
Yes
—
—
—
AIN3
Yes
Yes
REFP2, REFN2
REFN2
Yes
Yes
GPIO[0]
—
—
AIN4
Yes
Yes
REFP3, REFN3
REFP3
Yes
Yes
GPIO[1]
—
—
AIN5
Yes
Yes
REFP3, REFN3
REFN3
Yes
Yes
GPIO[2]
—
—
AIN6
Yes
Yes
—
—
Yes
Yes
GPIO[3]
TDACP
—
AIN7
Yes
Yes
—
—
Yes
Yes
GPIO[4]
TDACN
—
AIN8
Yes
Yes
—
—
Yes
Yes
GPIO[5]
—
—
AIN9
Yes
Yes
—
—
Yes
Yes
GPIO[6]
—
—
AINCOM
Yes
Yes
—
—
Yes
Yes
GPIO[7]
—
Yes
ADC1 REF INPUT
(1)
The reference voltage of ADC1 can be either polarity and reversed by programming.
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9.3.2 Analog Input Description
As shown in Figure 67, the analog inputs of the device consist of ESD protection diodes, an ADC1 and ADC2
cross-point input multiplexer, the sensor bias circuit, and individual PGAs for each ADC. The ADC has 11
external inputs, four internal monitor signals, and one no-connection (float). Note that in figures throughout this
document, italic text shows the associated register and register settings.
AVDD
ESD Diodes
AIN0
AIN0
0000
AIN1
0001
AIN2
0010
AIN3
0011
AIN4
0100
AIN5
0101
AIN6
0110
AIN7
0111
AIN8
1000
AIN9
1001
AINCOM
1010
TEMP Sensor P
Analog Supply Mon P
1011
1100
1101
Digital Supply Mon P
AIN1
TDAC P
AIN2
Float
ADC1 Positive Multiplexer
MUXP[3:0] bits 7:4 of INPMUX
(register address = 06h)
ADC2 Positive Multiplexer
MUXP2[3:0] bits 7:4 ADC2MUX
(register address = 16h)
1110
1111
VAINP1
VAINN1
AIN3
Sensor
Bias
PGA1
Sensor
Bias
PGA2
AIN4
AIN5
AIN6
VAINP2
AIN7
AIN8
AIN9
AINCOM
ESD Diodes
AIN0
0000
AIN1
0001
AIN2
0010
AIN3
0011
AIN4
0100
AIN5
0101
AIN6
0110
AIN7
0111
AIN8
1000
AIN9
1001
AINCOM
1010
TEMP Sensor N
Analog Supply Mon N
Digital Supply Mon N
TDAC N
Float
VAINN2
(ADS1263)
ADC1 Negative Multiplexer
MUXN[3:0] bits 3:0 of INPMUX
(register address = 06h)
ADC2 Negative Multiplexer
MUXN2[3:0] bits 3:0 of ADC2MUX
(register address = 16h)
1011
1100
1101
1110
1111
AVSS
Figure 67. ADC1 and ADC2 Input Block Diagram
9.3.2.1 ESD Diode
The analog inputs have internal ESD diodes that are connected to the analog supplies (AVDD and AVSS). The
function of the diodes is to protect the ADC inputs from ESD events. If the input signal exceeds VAVDD by more
than 0.3 V or goes below VAVSS by more than –0.3 V, the diodes may conduct. When the diodes conduct, input
current flows into the analog inputs through the AVDD or AVSS pins. If an input overvoltage is possible, limit the
input current to less than |±10 mA|. In many applications, a resistor in series with the input is sufficient to limit the
current. Depending on the application requirements, be aware of the thermal noise of the current limit resistor.
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9.3.2.2 Input Multiplexer
Use the dual, cross-point input multiplexers to select from one of the 11 external inputs, one of the four internal
monitors, and a floating connection, in any combination, to either ADC. One input is selected by the positive
multiplexer, and one input is selected by the negative multiplexer. The ADC1 positive and negative multiplexers
are programmed by bits MUXP[3:0] and bits MUXN[3:0] in the INPMUX register (address = 06h). The ADC2
positive and negative multiplexers have identical functionality and are programmed by bits MUXP2[3:0] bits and
bits MUXN2[3:0] in the ADC2MUX register (address = 16h).
9.3.3 Sensor Bias
The ADC incorporates a sensor bias current source that can be used to apply a small test current to diagnose
broken sensor leads or problems existing in the sensor. Figure 68 shows the sensor bias block diagram. The
sensor bias circuit consists of programmable current sources and bias resistors. The sensor bias circuit connects
to the outputs of either the ADC1 or ADC2 multiplexers. Program the sensor bias to either pull-up or pull-down
mode. In pull-up mode, the current flows into the positive input and flows out of the negative input. In pull-down
mode, the polarities are reversed. Configure the sensor bias either to a 10-MΩ bias resistor, or to current with
magnitudes of ±0.5, ±2, ±10, ±50, or ±200 µA.
AVDD
AVSS
10 M
SBMAG[2:0] bits 2:0 of MODE1
(register address = 04h)
10 M
000 = off
001 = 0.5 uA
010 = 2 uA
011 = 10 uA
100 = 50 uA
101 = 200 uA
110 = 10 0(shown)
ADC1
INPUT
MUX
SBPOL bit 3 of MODE1
(register address = 04h)
0 = Pull-up mode (shown)
1 = Pull-down Mode
SBADC bit 4 MODE1
(register address = 04h)
0 = ADC1 Connection (shown)
1 = ADC2 Connection
VAINP1
VAINN1
PGA1
VAINP2
ADC2
INPUT
MUX
VAINN2 PGA2
Figure 68. Sensor Bias Block Diagram
In pull-up mode, an open sensor results in the positive input pulled to VAVDD, and the negative input pulled to
VAVSS. An open sensor in pull-up mode results in a positive full-scale reading. A full-scale reading can also be an
indication of sensor overload or that the reference voltage is lower than expected. The sensor bias can remain
on while actively converting, or pulsed on periodically to test the sensor. When pulsed on, allow time for settling
because external capacitance loads the sensor bias when first enabled. Be aware of offset error as a result of
sensor bias current flowing through the multiplexer switch resistance.
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9.3.4 Temperature Sensor
The ADC incorporates an integrated temperature sensor. The temperature sensor is comprised of two internal
diodes with one diode having 16 times the current density of the other, as shown in Figure 69. The difference in
current density of the diodes yields a differential output voltage that is proportional to absolute temperature.
Measure the temperature sensor voltage with either ADC1 or ADC2. For ADC1 measurement, set the INPMUX
register (address 06h) to BBh. For ADC2 measurement, set the ADC2MUX register (address 16h) to BBh.
Equation 9 shows how to convert the temperature sensor reading to degrees Celcius (˚C):
Temperature (°C) = [(Temperature Reading (µV) – 122,400) / 420 µV/°C] + 25°C
where
•
Temperature reading units are in µV
(9)
Before temperature sensor measurement, enable the PGA, set gain = 1, disable chop mode, and make sure the
internal voltage reference is powered on. As a result of the low package-to-PCB thermal resistance, the internal
device temperature closely tracks the PCB temperature. Note that ADC self-heating results in an increase of
0.7°C relative to the temperature of the surrounding PCB.
AVDD
ADC1 MUX P
1x
2x
TEMP Sensor P
ADC1 MUX N
TEMP Sensor N
ADC2 MUX P
1x
8x
ADC2 MUX N
AVSS
Figure 69. Temperature Sensor
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9.3.5 Power-Supply Monitor
To internally monitor the ADC power supplies, use either ADC1 or ADC2. As shown in Figure 70, the power
supply voltages are divided by a resistor network to reduce the voltages within the ADC input range. The
reduced power-supply voltage is routed to the ADC input multiplexers. The analog (VANLMON) and digital
(VDIGMON) power supply readings are scaled by Equation 10 and Equation 11, respectively:
VANLMON = (VAVDD – VAVSS) / 4
VDIGMON = (VDVDD – VDGND) / 4
(10)
(11)
Measure the supply monitor readings using either the internal or an external reference. For an external
reference, the minimum reference voltage is 1.5 V.
Before measurement, enable the PGA, set gain = 1, and disable chop mode.
For analog supply monitor ADC1 measurement, set the INPMUX register (address 06h) to CCh.
For digital supply monitor ADC1 measurement, set the INPMUX register to DDh.
For analog supply monitor ADC2 measurement, set the ADC2MUX register (address 16h) to CCh.
For digital supply monitor ADC2 measurement, set the ADC2MUX register to DDh.
AVDD
Analog Supply Monitor
Digital Supply Monitor
DVDD
ADC1 MUX P
1.5 R
ADC1 MUX P
2.5 R
VANLMON_ P
VDIGMON_ P
ADC1 MUX N
R
ADC1 MUX N
R
VANLMON_ N
VDIGMON_ N
ADC2 MUX P
ADC2 MUX P
0.5 R
1.5 R
ADC2 MUX N
AVSS
ADC2 MUX N
DGND
Figure 70. Power-Supply Monitors
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9.3.6 PGA
The ADC1 PGA is a low-noise, programmable gain, CMOS differential-input, differential-output amplifier. The
PGA extends the ADC dynamic range of sensors with low input-signal levels. The PGA provides gains of 1, 2, 4,
8 ,16, and 32. Bypass the PGA to extend the analog input range to below ground (if the AVSS pin is grounded).
Figure 71 shows the PGA block diagram. The PGA consists of two chopper-stabilized amplifiers (A1 and A2),
and a resistor network that is programmed to set the PGA gain. The PGA input is equipped with a highfrequency, electromagnetic-interference (EMI) input filter consisting of two 350-Ω input resistors, and several filter
capacitors, as shown in the figure. Bypass the PGA to directly connect the inputs to the ADC. The PGA output is
monitored by an overrange voltage monitor. The voltage monitor triggers an alarm when the absolute or
differential PGA output voltage exceeds the linear range of operation. Pins CAPP and CAPN are the PGA
positive and negative outputs, respectively. Connect a 4.7-nF (C0G) capacitor as shown in the figure. The
capacitor provides an analog antialias filter, as well as the deglitch filter for the modulator sample pulses. Place
the capacitor close to the pins using short, direct traces. Avoid running clock traces or other digital traces close to
the pins.
BYPASS bit 7 of MODE2
(register address = 05h)
280
350
VAINP
0 = PGA active (shown)
1 = PGA bypass
CAPP
+
A1
±
8 pF
12 pF
GAIN[2:0] bits 6:4 of MODE2
(register address = 05h)
000: 1
001: 2
010: 4
011: 8
100: 16
101: 32
PGA1
Over-range
Detection
12 pF
12 pF
±
A2
+
350
VAINN
4.7 nF
C0G
ADC1
280
CAPN
8 pF
Figure 71. ADC1 PGA Block Diagram
The ADC1 full-scale voltage range is determined by the reference voltage and the PGA gain. Table 6 shows the
full-scale voltage range verses gain for reference voltage = 2.5 V. The full-scale voltage range scales with the
reference voltage and is increased or decreased by changing the reference voltage.
Table 6. ADC1 Full-Scale Voltage Range
GAIN[2:0] BITS OF REGISTER
MODE2
GAIN (V/V)
FULL SCALE RANGE (V) (1)
000
1
±2.500 V
001
2
±1.250 V
010
4
±0.625 V
011
8
±0.312 V
100
16
±0.156 V
101
32
±0.078 V
(1)
VREF = 2.5 V. The full scale input range is proportional to VREF
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As with many amplifiers, the PGA has an absolute input voltage range requirement that cannot be exceeded.
The maximum and minimum absolute input voltages are limited by the voltage swing capability of the PGA
output. The specified minimum and maximum absolute input voltages (VINP and VINN) depend on the PGA gain,
the input differential voltage (VIN), and the tolerance of the analog power-supply voltages (VAVDD and VAVSS). The
absolute positive and negative input voltages must be within the specified range, as shown in Equation 12:
VAVSS + 0.3 + |VIN| · (Gain – 1) / 2 · < VINP and VINN < VAVDD – 0.3 – |VIN| · (Gain – 1) / 2
where
•
•
VINP, VINN = absolute input voltage
VIN = differential input voltage = VINP - VINN
(12)
The relationship between the PGA input to the PGA output is shown graphically in Figure 72. The PGA output
voltages (VOUTP, VOUTN) depend on the PGA gain and the input voltage magnitudes. For linear operation, the
PGA output voltages must not exceed VAVDD – 0.3 or VAVSS + 0.3. Note the diagram depicts a positive differential
input voltage that results in a positive differential output voltage.
PGA Input
PGA Output
VAVDD
VAVDD ± 0.3 V
VOUTP = VINP + VIN Â(Gain ± 1) / 2
VINP
VIN = VINP Â9INN
VINN
VOUTN = VINN ± VIN Â(Gain ± 1) / 2
VAVSS + 0.3 V
VAVSS
Figure 72. PGA Input/Output Range
If the PGA is bypassed, the ADC absolute input voltage range extends beyond the VAVDD and VAVSS power
supplies allowing input voltages at or below ground. The absolute input voltage range when the PGA is bypassed
is shown in Equation 13:
VAVSS – 0.1 < VINP and VINN < VAVDD + 0.1
(13)
9.3.7 PGA Voltage Overrange Monitors
ADC1 incorporates two PGA output-voltage monitors. The monitors trigger an alarm if the PGA output is driven
into overrange. The corresponding bits are set (= 1) in the data output status byte when an alarm is triggered.
The PGA output voltage is monitored in two ways:
1) Differential: If the PGA differential output voltage exceeds either +105% or –105% FSR.
2) Absolute: If either PGA absolute output voltage is higher than VAVDD – 0.2 V or lower than VAVSS + 0.2 V.
The alarms automatically reset when the PGA is no longer in voltage overload. The monitors are fast-responding,
analog, voltage-level comparators. Therefore, these monitors detect short-duration voltage overrange events that
are not necessarily evident in the output as clipped codes because of averaging of the digital filter that may span
one or more conversion cycles. Use the monitor function to detect certain type of faults (such as signal
overranges, incorrect gain settings, sensor faults, input miswiring, and so on) without the need to change input
configuration or interrupt readings.
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9.3.7.1 PGA Differential Output Monitor
ADC1 incorporates a differential PGA output voltage monitor. This voltage monitor triggers an alarm when the
magnitude of the differential PGA output voltage is more positive than +105% or more negative than –105% of
full scale, but only during a conversion cycle. The alarm event, corresponding to the conversion cycle when the
alarm occurred, is set in the status byte (PGAD_ALM). For the next conversion, the alarm resets. If the
magnitude of differential output voltage is within the range of ±105% of full-scale range, the alarm remains reset.
The PGA differential monitor block diagram is shown in Figure 73.
Data Bytes
VOUTP
VOUTN
Digital
Filter
ADC
PGA
ADC
STATUS
VREF Comparators
+105% VREF
DATA 2
DATA 3
DATA 4
CRC/CHK
PGAD_ALM
Bit 1 of STATUS byte
±
+
DATA 1
Latch
+
S
Q
R
Q
±
±
PGA Output
difference amplifier
-105% VREF
Conversion
Start Reset
+
Figure 73. PGA Differential Overload Monitor
PGA Differential Output (FSR)
Figure 74 shows an example of the differential overrange monitor event.
+ 105%
- 105%
Alarms latched during
conversion cycle
Conversions (DRDY)
PGAD_ALM bit
Figure 74. PGA Differential Alarm
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9.3.7.2 PGA Absolute Output-Voltage Monitor
ADC1 contains an integrated a PGA absolute output-voltage monitor. If the absolute level of the PGA positive or
negative output exceeds VAVDD – 0.2 V, the PGA high alarm triggers (PGAH_ALM). If the absolute level of the
PGA positive or negative output voltage is less than VAVSS + 0.2 V, the PGA low alarm triggers (PGAL_ALM).
The alarms are set in the status byte corresponding to the conversion cycle when the alarms occurred. For the
next conversion cycle, the alarms reset. If the magnitude of PGA output voltages remains within the range
(VAVDD – 0.2 V and VAVSS + 0.2 V), the alarms remain reset. The PGA absolute output-voltage monitor block
diagram is shown in Figure 75.
Data Bytes
VOUTP
VOUTN
Digital
Filter
ADC
PGA
ADC
VAVDD ± 0.2 V
±
STATUS
DATA 1
DATA 2
DATA 3
DATA 4
CRC/CHK
PGAH_ALM
Bit 2 of STATUS byte
+
S
Q
R
Q
Latch
±
+
±
Supply Rail
Comparators
PGAL_ALM
Bit 3 of STATUS byte
+
S
Q
R
Q
Latch
±
+
VAVSS + 0.2 V
Conversion
Start Reset
Figure 75. PGA Absolute Output-Voltage Monitor
Figure 76 shows an example of the PGA absolute output-voltage monitor overrange event.
VOUTP or VOUTN
PGA Absolute Output (V)
VAVDD - 0.2
VAVSS + 0.2
Alarms latched during
conversion cycle
Conversions (DRDY)
PGAH_ALM bit
PGAL_ALM bit
Figure 76. PGA Absolute Alarm
40
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9.3.8 ADC Reference Voltage
These devices require a reference voltage for operation. Both ADCs default to the same internal reference,
however, the reference voltage of ADC1 is independent of the ADC2 reference voltage. The reference voltage is
provided internally by the internal 2.5-V reference, or externally, by one of the three external reference inputs.
The specified external reference voltage range is 0.9 V to 5 V. The reference voltage is defined as VREF =
VREFP – VREFN, where VREFP and VREFN are the absolute positive and absolute negative reference voltages,
respectively. The polarity of the reference voltage internal to the ADC must be always positive. The magnitude of
the reference voltage together with the PGA gain establishes the ADC full-scale differential input range as
defined by VIN = ±VREF / gain. Figure 77 shows the block diagram of the ADC1 reference multiplexer. Use the
reference multiplexer to select the internal reference, one of three external reference inputs, or the analog power
supply.
INTREF bit 0 of POWER
(register address = 01h)
AVDD
REFOUT
AIN0
1 PF
(1)
AIN2
AIN4
+2.5 V
Reference
0 = reference off
1 = reference on
RMUXP[2:0] bits 5:3 of REFMUX
(register address = 0Fh)
REFREV bit 7 of MODE0
(register address = 03h)
000
001
REF_MUXP
010
0 = normal
1 = reverse
REF_ALM bit of status byte
(bit 4)
Low Reference
Monitor
011
VVREFP
+
+
±
VVREFN
±
AIN3
AIN5
S Q
R Q
000
AIN1
0 = no alarm
1 = alarm
+0.4 V
100
001
Start Conversion Reset
010
011
REF_MUXN
100
ADC1
AVSS
RMUXN[2:0] bits 2:0 of REFMUX
(register address = 0Fh)
(1)
The internal reference requires a 1-µF capacitor connected to pins REFOUT and AVSS.
Figure 77. ADC1 Reference Multiplexer Block Diagram
The ADC1 reference multiplexer consists of a positive multiplexer and a negative multiplexer. The positive and
negative multiplexers are programmed by the RMUXP[2:0] and RMUXN[2:0] bits, respectively, of the REFMUX
register. The positive reference input is either internal (2.5 V), external (pins AIN0, AIN2, AIN4), or the analog
power-supply voltage (VAVDD). The negative reference input is either internal (2.5 V), external (pins AIN1, AIN3,
AIN5), or the analog power-supply voltage (VAVSS). A reference polarity-reversal switch changes the reference
polarity from negative to positive. The polarity switch allows either positive or negative external reference polarity.
Set the reversal switch to the normal position (REFREV = 0) when using the internal reference or analog power
supplies.
The ADC also contains and integrated low-reference voltage monitor. This monitor provides continuous detection
of a low or missing reference during the conversion cycle. The low reference alarm is appended to the data
output status byte (REF_ALM, bit 4 of the status byte).
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9.3.8.1 Internal Reference
The ADC incorporates an integrated, precision, 2.5-V reference featuring very low drift. The internal reference is
enabled by setting INTREF equal to 1 (default is on). To select the internal reference for use with ADC1, set the
RMUXP and RMUXN bits of register REFMUX to 0h. The REFOUT pin provides a buffered reference output
voltage. The negative reference (return) is the AVSS pin, as shown in Figure 77. Be careful when laying out the
REFOUT return to the AVSS pin. Connect a 1-uF capacitor from the REFOUT pin to the AVSS pin. The
capacitor is not required if the internal reference is not used. The internal reference must be powered if using the
IDACs or the internal temperature sensor. After internal reference start-up, the reference requires start-up time
before beginning the first conversion; see Figure 33.
9.3.8.2 External Reference
The ADC provides three external reference inputs. The reference inputs are differential with independent positive
and negative inputs. The reference inputs are the analog pins, AIN0 to AIN5. Typically, the positive reference is
applied to pin AIN0, AIN2, or AIN4, and the negative reference is applied to pin AIN1, AIN2, or AIN3. The
reference polarity can be negative, but the ADC requires a positive voltage reference. In this case, reverse the
polarity using the internal polarity-reversal switch (ADC1 reference only). The reference polarity-reversal switch
changes the reference polarity from negative to positive, and is controlled by REFREV (bit 7 of MODE0).
The reference inputs are high impedance. A reference input current flowing through a reference-voltage source
impedance leads to possible loading errors (see Figure 34). To reduce the input current, use an external
reference buffer; however, in most applications, an external reference buffer is not necessary.
Connect a 100-nF bypass capacitor across the external reference input pins. Follow the specified absolute and
differential reference voltage requirements.
9.3.8.3 Power-Supply Reference
A third option for ADC reference is the internal analog power supply. However, an increase of linearity error
results with this connection, and therefore, use this option only for less-critical applications, such as ADC selfdiagnostics.
For critical applications, do not not use power-supply reference option. For applications that use the powersupply voitage as the reference voltage, connect the power-supply voltage to the external reference inputs, and
select the appropriate external reference bits in the REFMUX register. For example, to measure a 6-wire loadcell, connect the bridge excitation voltages to the external reference inputs, and select the appropriate REFMUX
bits.
9.3.8.4 Low-Reference Monitor
ADC1 incorporates a low-reference monitor to detect a low or missing reference. If the differential reference
voltage (VREF = VREFP – VREFN) falls below 0.4 V (typical), the low reference alarm triggers (REF_ALM). The lowreference monitor sets the corresponding alarm bit in the conversion data status byte. The alarm resets at the
start of each new conversion. Use the low-reference monitor to detect a missing or failed reference voltage
connection. Connect a 100-kΩ resistor across the reference inputs to provide the necessary bias. If either
reference input is missing or unconnected, this external resistor biases the reference inputs to each other. The
low-reference monitor is a fast-responding analog comparator; therefore, transients in the reference voltage may
trigger the alarm.
42
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9.3.8.5 Sensor-Excitation Current Sources (IDAC1 and IDAC2)
The ADS1262 and ADS1263 incorporate two, integrated, matched current sources (IDAC1, IDAC2). The current
sources provide excitation current to resistive temperature devices (RTDs), thermistors, diodes, and other
sensors that require constant current biasing. These devices also contain an internal IDAC multiplexer that
provides connection of IDAC1 or IDAC2 to one of the 11 analog pins (AIN0 to AINCOM). The IDACs can be
programmed over these current ranges: 50 µA, 100 µA, 250 µA, 500 µA, 750 µA, 1000 µA, 1500 µA, 2000 µA,
and 3000 µA. Figure 78 details the IDAC connection. The IDAC switches shown in the diagram are used in the
IDAC rotation mode.
MUX1[3:0] bits 3:0 of IDACMUX
(register address = 0Dh)
IDAC Modes
CHOP[1:0] bits 5:4 of register MODE0
(register address = 03h)
AIN0
AIN0
0000
AIN1
0001
AIN2
0010
AIN3
0011
AIN4
0100
AIN5
0101
AIN6
0110
AIN7
AIN8
0111
1000
AIN9
1001
AINCOM
1010
No Connection
1011
AIN0
0000
AIN1
0001
AIN2
0010
AIN3
0011
VAVDD
IDAC1
MUX
00: Normal (shown)
01: Chop on (see Chop section)
10: IDAC rotation (automated)
11: Chop on and IDAC rotation
MAG1[3:0] bits 3:0 of IDACMAG
(register address = 0Eh)
IDAC1
0000: off
0001: 50 µA
0010: 100 µA
0011: 250 µA
0100: 500 µA
0101: 750 µA
0110: 1000 µA
0111: 1500 µA
1000: 2000 µA
1001: 3000 µA
AIN1
AIN2
AIN4
`
AIN3
AIN5
AIN6
AIN7
AIN8
AIN9
AINCOM
AIN4
0100
AIN5
0101
AIN6
0110
AIN7
0111
AIN8
1000
AIN9
1001
AINCOM
No Connection
VAVDD
IDAC2
MUX
1010
1011
MAG2[3:0] bits 7:4 of IDACMAG
(register address = 0Eh)
IDAC2
0000: off
0001: 50 µA
0010: 100 µA
0011: 250 µA
0100: 500 µA
0101: 750 µA
0110: 1000 µA
0111: 1500 µA
1000: 2000 µA
1001: 3000 µA
MUX2[3:0] bits 7:4 of IDACMUX
(register address = 0Dh)
Figure 78. IDAC Block Diagram
The internal reference must be enabled for IDAC operation. Take care not to exceed the compliance voltage of
the IDACs. In other words, the voltage on the input pin must not exceed VAVDD – 1.1 V; otherwise, the specified
accuracy of the IDAC current is not met.
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The IDAC currents track the internal reference voltage. As a result of using the same reference voltage for
IDAC1 and IDAC2, the current sources are matched. Matched performance is important for applications such as
hardware compensated, 3-wire RTDs. IDAC to IDAC mismatch can be improved further by use of the IDAC
rotation mode. The rotation mode automatically swaps the IDAC1 and IDAC2 connections of alternate
conversions. The ADC averages the alternate conversions to eliminate IDAC mismatch. IDAC rotation can be
performed manually by the user (by alternating the IDAC pin connections) or by the IDAC automatic rotation
mode. The IDAC rotation sequence is shown as follows:
• Conversion 1: IDAC1, IDAC2 normal → first output result withheld
• Conversion 2: IDAC1, IDAC2 rotated positions → Output result 1 = (Conversion 1 + Conversion 2) / 2
• Conversion 3: IDAC1, IDAC2 normal → Output result 2 = (Conversion 3 + Conversion 2) / 2
• Conversion 4: IDAC1, IDAC2 rotated positions → Output result 3 = (Conversion 4 + Conversion 3) / 2
The sequence repeats for all succeeding conversions.
In rotation mode, the ADC provides a time delay to allow for settling after the IDAC pin connections are
alternated. Note IDAC switching transients may interact with external components that may require additional
time to settle. Additional settling time are provided by bits DELAY[3:0] in the MODE0 register. The total delay
time results in a reduction of the nominal data rate (See Conversion Latency). Nevertheless, the existing
frequency response nulls provided by the digital filter remain unchanged.
9.3.8.6 Level-Shift Voltage
The ADC integrates an optional level-shift voltage on the AINCOM pin. As shown in Figure 79, the level-shift
voltage is the midvoltage of the analog power supply. The level-shift voltage shifts floating sensors (that is,
sensors isolated from the ADC ground) to within the ADC specified input range. Thermocouple and 4-mA to 20mA transmitters (isolated supply) are examples of floating signals.
AVDD
INPUT
MUX
AINCOM
R
100
VBIAS = (VAVDD + VAVSS) /2
R
VBIAS bit 1 of POWER
(register address = 01h)
0 = off
1 = on
AVSS
Figure 79. Level-Shift Voltage Diagram
When operating the ADC with ±2.5-V analog supplies, either ground the AINCOM pin or use the level-shift
voltage. Level shift other inputs by connecting the input pins to the REFOUT pin (2.5 V). The turn-on time of the
level-shift voltage depends on the pin load capacitance. The total capacitance includes those connected to
AVDD, AVSS and ground. Table 7 lists the level-shift voltage settling times for various external load
capacitances. Be certain the level-shift voltage is fully settled before starting a conversion.
Table 7. Level-Shift Enable Time
44
LOAD CAPACITANCE
LEVEL-SHIFT VOLTAGE SETTLING TIME
0.1 µF
0.22 ms
1 µF
2.2 ms
10 µF
22 ms
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9.3.9 ADC1 Modulator
The ADC1 modulator is an inherently stable, fourth-order, 2 + 2 pipelined ΔΣ modulator. The modulator samples
the analog input voltage at a high sample rate (fMOD = fCLK / 8 = 921.6 kHz) and converts the analog input to a
ones density bit stream. The digital filter receives the ones density bit stream output, and then filters and
decimates the data to yield the final conversion result.
9.3.10 Digital Filter
The digital filter of ADC1 receives the modulator output data and produces a high-resolution conversion result.
The digital filter low-pass filters and decimates the modulator data (rate reduction), yielding the final data output.
By adjusting the type of filtering, tradeoffs are made between resolution, data rate, line cycle rejection, and
conversion latency.
The digital filter has two selectable modes: sin (x) / x (sinc) mode and finite impulse response (FIR) mode (see
Figure 80). The sinc mode provides data rates of 2.5 SPS though 38400 SPS with selectable sinc orders of 1
through 5. The FIR filter provides simultaneous rejection of 50-Hz and 60-Hz power-line frequencies with data
rates 2.5 SPS through 20 SPS with single-cycle settled conversions.
fCLK: 7.3728 MHz
38400 SPS
19200 SPS
14400 SPS
fCLK/8
fMOD: 921.6 kHz
Modulator
921.6 kHz
1st Stage
Sinc5 Filter
14400 SPS
Decimation A
(24, 48, 64)
2.5 SPS...7200 SPS
2nd Stage
SincN Filter
Filter Output
FIR Filter Section
Decimation B
(2...5760)
20 SPS
600 SPS
FIR
DR[3:0] bits 3:0 of MODE2
(register address = 05h)
0000 = 2.5 SPS
0001 = 5 SPS
0010 = 10 SPS
0011 = 16.6 SPS
0100 = 20 SPS
0101 = 50 SPS
0110 = 60 SPS
0111 = 100 SPS
1000 = 400 SPS
1001 = 1200 SPS
1010 = 2400 SPS
1011 = 4800 SPS
1100 = 7200 SPS
1101 = 14400 SPS
1110 = 19200 SPS
1111 = 38400 SPS
FILTER[2:0] bits 7:5 of MODE1
(register address = 04h)
Decimation
(30)
Averager
Average
(2,4,8)
10 SPS
5 SPS
2.5 SPS
000 = sinc1
001 = sinc2
010 = sinc3
011 = sinc4
100 = FIR
Figure 80. Digital Filter Block Diagram
9.3.10.1 Sinc Filter Mode
The sinc filter consists of two stages: a variable-decimation, fixed-order sinc5 filter, followed by a variabledecimation, variable-order sinc filter. The first-stage filter is sinc5. The sinc5 stage filters and down-samples the
modulator data (fCLK / 8 = 921.6 kHz) to 38400 SPS, 19200 SPS, and 14400 SPS by decimating to 24, 48, and
64, respectively. These data rates bypass the second filter stage and as a result have a sinc5 frequency
response profile. The second filter stage receives the data from the first stage at 14400 SPS. The second stage
reduces the data rate to produce output data of 7200 SPS to 2.5 SPS. The second stage is a variable-order sinc
filter that is programmable.
The combined decimation ratio of the first and second stages determine the output data rate as follows: data rate
= 921.6 kHz / (A · B). The filter order of the second stage affects the 50-Hz and 60-Hz rejection together with
conversion latency. The high-order sinc filter yields the widest 50-Hz and 60-Hz response null widths, but
correspondingly increases the conversion latency. The sinc order is programmed by the FILTER[2:0] bits of
register MODE1. Table 8 lists the decimation ratio corresponding to the first and second filter stages (A and B,
respectively) for each data rate. The data rate is programmed by the DR[3:0] bits of register MODE2.
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Table 8. Sinc Filter Mode Data Rates and Decimation Ratio
DATA RATE
(SPS) (1)
DR[3:0] BITS OF
REGISTER MODE2
FIRST-STAGE
DECIMATION RATIO A
SECOND-STAGE
DECIMATION RATIO B
2.5
0000
64
5760
(1)
5
0001
64
2880
10
0010
64
1440
16.6
0011
64
864
20
0100
64
720
50
0101
64
288
60
0110
64
240
100
0111
64
144
400
1000
64
36
1200
1001
64
12
2400
1010
64
6
4800
1011
64
3
7200
1100
64
2
14400
1101
64
1
19200
1110
48
1
38400
1111
24
1
fCLK = 7.3728 MHz. Data rate scales with fCLK
9.3.10.1.1 Sinc Filter Frequency Response
The low-pass filtering effect of the sinc filter sets the overall frequency response of the ADC. The frequency
response of data rates 14400 SPS, 19200 SPS and 38400 SPS is that of the first filter stage. The frequency
response of data rates 2.5 SPS ranging to 7200 SPS is the product of the first and second stage individual
frequency responses. The overall filter response is given in Equation 14:
5
H sinc5 f u H sincN f
H f
ª 512I B º
ª 8IA º
sin «
sin «
»
»
f CLK ¼
¬
¬ f CLK ¼
u
ª 512I º
ª 8f º
A u sin «
B u sin «
»
»
¬ f CLK ¼
¬ f CLK ¼
N
where
•
•
•
•
•
f = signal frequency
fCLK = ADC clock frequency
A = First-stage decimation ratio (see Table 8)
B = Second-stage decimation ratio (see Table 8)
N = Second-stage filter order where N = 1 (sinc1), 2 (sinc2), 3 (sinc3), or 4 (sinc4)
(14)
The digital filter attenuates out-of-band noise that is present in the signal, and noise within the PGA and ADC
modulator. Adjusting the filter by changing the decimation ratio and sinc order changes the filter bandwidth.
Tradeoffs are made between signal bandwidth, noise, and filter latency.
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0
0
-20
-20
-40
-40
Amplitude (dB)
Amplitude (dB)
As shown in Figure 81 and Figure 82, the first-stage sinc5 filter has frequency response nulls occurring at the
data rate (fMOD / A) and at data rate multiples. At the null frequencies, the filter has zero gain.
-60
-80
-100
-60
-80
-100
-120
-120
-140
-140
-160
-160
0
10
20
30
40
50 60 70 80
Frequency (kHz)
0
90 100 110 120
10
20
30
40
D001
Figure 81. Sinc Frequency Response (38400 SPS)
50 60 70 80
Frequency (kHz)
90 100 110 120
D002
Figure 82. Sinc Frequency Response (14400 SPS)
The second stage superimposes new nulls in the frequency response over the nulls produced by the first stage.
The first of the superimposed frequency response nulls occur at the output data rate, followed by nulls occurring
at data rate multiples.
Figure 83 illustrates the frequency response of data rate 2400 SPS produced by the combined filter stages. This
data rate has five equally-spaced nulls between the larger nulls produced by the first stage. The frequency
response is also characteristic of data rates 2.5 SPS to 7200 SPS that are also produced by the second-stage
filter. Figure 84 shows the frequency response nulls for 10 SPS.
0
0
sinc1
sinc2
sinc3
sinc4
-20
-40
Amplitude (dB)
Amplitude (dB)
-40
sinc1
sinc2
sinc3
sinc4
-20
-60
-80
-100
-60
-80
-100
-120
-120
-140
-140
-160
-160
0
5
10
15
20
25
30
Frequency (kHz)
35
40
45
0
10
20
D003
Figure 83. Sinc Frequency Response (2400 SPS)
30
40
50 60 70 80
Frequency (Hz)
90 100 110 120
D004
Figure 84. Sinc Frequency Response (10 SPS)
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Figure 85 and Figure 86 illustrate the frequency response of data rates 50 SPS and 60 SPS. The frequency
response is plotted out to the 50-Hz 12th harmonic (10th harmonic for 60 Hz). The 50-Hz or 60-Hz fundamental
frequency and harmonics are suppressed by increasing the second-stage filter order, as shown in the figures.
0
0
sinc1
sinc2
sinc3
sinc4
-20
-40
Amplitude (dB)
Amplitude (dB)
-40
sinc1
sinc2
sinc3
sinc4
-20
-60
-80
-100
-60
-80
-100
-120
-120
-140
-140
-160
-160
0
50 100 150 200 250 300 350 400 450 500 550 600
Frequency (Hz)
D005
0
Figure 85. Sinc Frequency Response (50 SPS)
60
120
180
240 300 360
Frequency (Hz)
420
480
540
600
D006
Figure 86. Sinc Frequency Response (60 SPS)
Figure 87 and Figure 88 plot the detailed frequency response of 50-SPS and 60-SPS data rates of different sincfilter orders. Note that the high-order sinc filter increases the width of the null and improves line cycle rejection.
The high-order filter decreases the sensitivity of the ratio tolerance between the ADC clock frequency and the
line frequency that can otherwise degrade line cycle rejection. As shown in the plots, the best 50-Hz or 60-Hz
rejection is provided by the sinc4 order, but has longer filter latency compared to the sinc1 order.
0
0
sinc1
sinc2
sinc3
sinc4
-20
-40
Ampliude (dB)
Amplitude (dB)
-40
-60
-80
-100
-80
-100
-120
-140
-140
46
47
48
49
50
51
Frequency (Hz)
52
53
54
55
-160
55
56
D009
Figure 87. Sinc Frequency Response Zoom (50 SPS)
48
-60
-120
-160
45
sinc1
sinc2
sinc3
sinc4
-20
57
58
59
60
61
Frequency (Hz)
62
63
64
65
D010
Figure 88. Sinc Frequency Response Zoom (60 SPS)
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The overall sinc filter frequency has a low-pass response that rolls off high-frequency components in the signal.
The signal bandwidth depends on the output data rate and the order of the sinc filter. Note the overall system
bandwidth is the combination of the digital filter, the antialias filter, and external filter components. Table 9 lists
the –3-dB filter bandwidth of the sinc filter. Note the bandwidth reduction of the higher-order sinc filters.
Table 9. Sinc Filter Bandwidth
-3-dB BANDWIDTH (Hz)
DATA RATE (SPS)
SINC1
SINC2
SINC3
SINC4
SINC5
2.5
1.10
0.80
0.65
0.58
—
5
2.23
1.60
1.33
1.15
—
10
4.43
3.20
2.62
2.28
—
16.6
7.38
5.33
4.37
3.80
—
20
8.85
6.38
5.25
4.63
—
50
22.1
16.0
13.1
11.4
—
60
26.6
19.1
15.7
13.7
—
100
44.3
31.9
26.2
22.8
—
400
177
128
105
91.0
—
1200
525
381
314
273
—
2400
1015
751
623
544
—
4800
1798
1421
1214
1077
—
7200
2310
1972
1750
1590
—
14400
—
—
—
—
2940
19200
—
—
—
—
3920
38400
—
—
—
—
7740
9.3.10.2 FIR Filter
The finite impulse response (FIR) filter of ADC1 is a coefficient based filter that provides simultaneous rejection
of 50-Hz and 60-Hz line cycle frequencies and harmonics. The FIR filter data rates are 2.5, 5, 10 and 20 SPS. All
of the FIR data rates settle within a single conversion cycle. As shown in Figure 80, the FIR filter section receives
data from the second-stage sinc filter at 600 Hz. The FIR filter section decimates by 30 to yield the output data
rate of 20 SPS. A first-order averager (sinc1) with variable decimation provides the data rates of 10 SPS, 5 SPS,
and 2.5 SPS.
0
0
-20
-20
-40
-40
Amplitude (dB)
Amplitude (dB)
As shown in Figure 89 and Figure 90, the FIR filter frequency response has a series of response nulls close to
50 Hz and 60 Hz. The response nulls repeat close to the 50-Hz and 60-Hz harmonics. The FIR frequency
response superimposes with the response of the 600-SPS pre-stage filter.
-60
-80
-100
-60
-80
-100
-120
-120
-140
-140
-160
0
30
60
90
120 150 180
Frequency (Hz)
210
240
270
300
-160
40
45
D011
Figure 89. FIR Frequency Response (20 SPS)
50
55
60
Frequency (Hz)
65
70
D012
Figure 90. FIR Frequency Response Detail (20 SPS)
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Figure 91 is the FIR filter response at 10 SPS. As a result of the sinc1 averager in the FIR filter block, new
frequency-response nulls are superimposed to the response shown in Figure 89. The first of the added response
nulls occur at 10 Hz. Additional nulls occur at folded frequencies around 20-Hz multiples. These additional nulls
are seen at 10 Hz and 30 Hz.
0
-20
Amplitude (dB)
-40
-60
-80
-100
-120
-140
-160
0
30
60
90
120 150 180
Frequency (Hz)
210
240
270
300
D013
Figure 91. FIR Frequency Response (10 SPS)
Similar to the response of the sinc filter, the overall FIR filter frequency has a low-pass response that rolls off
high frequencies of the signal. The response is such that the FIR filter limits the bandwidth of the input signal.
The FIR filter signal bandwidth depends on the output data rate. Table 10 lists the –3-dB filter bandwidth of the
FIR filter. The total system bandwidth is the combined individual responses of the digital filter, the ADC antialias
filter, and external filter components.
Table 10. FIR Filter Bandwidth
50
DATA RATE (SPS)
–3-dB BANDWIDTH (Hz)
2.5
1.2
5
2.4
10
4.7
20
13
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9.3.10.3 50-Hz and 60-Hz Line Cycle Rejection
If the ADC connection leads are in close proximity to industrial motors and conductors, coupling of 50-Hz and 60Hz power line frequencies can occur. The coupled noise interferes with the signal voltage, and may lead to
inaccurate or unstable conversions. The digital filter provides enhanced rejection of power-line coupled noise for
data rates of 60 SPS and less. Program the filter to tradeoff data rate and conversion latency versus the desired
level of line cycle rejection. Table 11 summarizes the ADC1 50-Hz and 60-Hz line-cycle rejection based on 2%
and 6% ratio tolerance of power-line to ADC clock frequency. Best possible power line rejection is provided by
the high-order sinc filter and by using an accurate ADC clock.
Table 11. 50-Hz and 60-Hz Line Cycle Rejection
DIGITAL FILTER Response (dB)
DATA RATE (SPS)
FILTER TYPE
50 Hz ±2%
60 Hz ±2%
50 Hz ±6%
60 Hz ±6%
2.5
FIR
–113
–99
–88
–80
2.5
Sinc1
–36
–37
–40
–37
2.5
Sinc2
–72
–74
–80
–74
2.5
Sinc3
–108
–111
–120
–111
2.5
Sinc4
–144
–148
–160
–148
5
FIR
–111
–95
–77
–76
5
Sinc1
–34
–34
–30
–30
5
Sinc2
–68
–68
–60
–60
5
Sinc3
–102
–102
–90
–90
5
Sinc4
–136
–136
–120
–120
10
FIR
–111
–94
–73
–68
10
Sinc1
–34
–34
–25
–25
10
Sinc2
–68
–68
–50
–50
10
Sinc3
–102
–102
–75
–75
10
Sinc4
–136
–136
–100
–100
16.6
Sinc1
–34
–21
–24
–21
16.6
Sinc2
–68
–42
–48
–42
16.6
Sinc3
–102
–63
–72
–63
16.6
Sinc4
–136
–84
–96
–84
20
FIR
–95
–94
–66
–66
20
Sinc1
–18
–34
–18
–24
20
Sinc2
–36
–68
–36
–48
20
Sinc3
–54
–102
–54
–72
20
Sinc4
–72
–136
–72
–96
50
Sinc1
–34
–15
–24
–15
50
Sinc2
–68
–30
–48
–30
50
Sinc3
–102
–45
–72
–45
50
Sinc4
–136
–60
–96
–60
60
Sinc1
–13
–34
–12
–24
60
Sinc2
–27
–68
–24
–48
60
Sinc3
–40
–102
–36
–72
60
Sinc4
–53
–136
–48
–96
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9.3.11 General-Purpose Input/Output (GPIO)
Eight analog inputs can be programmed as GPIO functions (GPIO[0] through GPIO[7]). The GPIO function is a
digital input/output with a logic value that is read and written by the GPIODAT data register. The GPIO voltage
levels are referenced to the ADC analog power supply voltages, VAVDD and VAVSS. The GPIO input voltage
threshold for logic 1 is (VAVDD + VAVSS) / 2. As shown in Figure 92, analog inputs, AIN3 through AINCOM, can be
programmed for GPIO function. Register GPIOCON programs the GPIO connection for each pin (1 = connect).
Register GPIODIR programs the direction of each pin, either as input or output (0 = output). Register GPIODAT
is the GPIO data value register. Note if a GPIO pin is programmed as an output, the readback data value of the
corresponding GPIODAT register bit is zero.
AVDD
CON[7:0] bits 7:0 of GPIOCON 0 = no connect
(register address = 12h)
1 = connect
DAT[7:0] bits 7:0 of GPIODAT
(register address = 14h)
AIN3
AIN4
0 = VGPIO < (VAVDD+ VAVSS) /2
1 = VGPIO > (VAVDD+ VAVSS) /2
GPIO[0]
GPIO[1]
GPIO
1 of 8
Write
Read
GPIO[2]
AIN5
0
0
GPIO[3]
AIN6
AIN7
AIN8
AIN9
AINCOM
1
GPIO[4]
GPIO[5]
+
GPIO[6]
±
GPIO[7]
VAVDD + VAVSS
2
GPIO Read Select
DIR[7:0] bits 7:0 of GPIODIR
(register address = 13h)
0 = Output
1 = Input
AVSS
Figure 92. GPIO Block Diagram
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9.3.12 Test DAC (TDAC)
The ADC includes a test voltage digital-to-analog converter (TDAC) intended for ADC self-testing and
verification. The TDAC is capable of providing single-ended, differential and common mode test voltages. The
voltages are suitable to test the ADCs under all gains and input configurations.
As shown in Figure 93, the TDAC consists of two independent DACs, TDACP, and TDACN. The DACs have
independent control registers to program the output voltage. TDACP is programmed by register TDACP and
TDACN is programmed by register TDACN. The TDACP output connects to the ADC1 and ADC2 positive input
multiplexer input and TDACN connects to the ADC1 and ADC2 negative input multiplexer. The OUT1 and OUT2
bits can be programmed to connect the TDAC outputs to pins AIN6 and AIN7. The TDAC outputs are unbuffered
and should not be loaded. The TDAC reference voltage is the analog supply (VAVDD – VAVSS); therefore, the
output levels refer to, and scale with, the analog power supply. Note that chop mode must be disabled to test the
ADC with the TDAC.
AVDD
MAGP[4:0] bits 4:0 of TDACP
(register address = 10h)
AVSS
TDACP
ADC
VTDACP
ADC1 Input
MUX
MAGN[4:0] bits 4:0 of TDACN
(register address = 11h)
TDACN
ADC
VTDACN
>0000h: > Mid-supply
00000: = Mid-supply
VAVSS – 0.3 V under the expected minimum and maximum
input conditions, respectively.
The input range requirement of ADC2 is verified in the same way as ADC1. See Equation 15 for the ADC2 input
range requirements.
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Application Information (continued)
10.1.5 Input Filtering
Analog input filtering serves two purposes: first, to limit the effect of aliasing during the sampling process; and
second, to reduce external noise that affects the measurement.
10.1.5.1 Aliasing
As with all ADCs, out-of-band input signals can fold back or alias if not band-limited. Aliasing describes the effect
of input frequencies greater than ½ the sample rate folding back to the bandwidth of interest. An antialias filter
placed at the ADC inputs reduces the magnitude of the aliased frequencies. The ADS1262 and ADS1263
incorporate analog and digital antialiasing filters to attenuate the aliased frequencies. There are two ranges of
aliased frequencies: frequencies greater than ½ of the down-sampled output data rate (Nyquist frequency) and
frequencies occurring at multiples of the modulator sample rate.
Aliasing can occur at frequencies greater than ½ the ADC output data rate. For example, at data rate of 50 SPS,
aliasing occurs at frequencies greater than 25 Hz. The ADC digital filter rejects the aliased frequencies as input
frequency increases. The amount of aliased frequency rejection is given by the filter type and order. Figure 150
shows the frequency response of the sinc filter. Note the sinc4 filter provides the best rejection of aliased
frequencies.
0
sinc1
sinc2
sinc3
sinc4
-20
Amplitude (dB)
-40
-60
-80
-100
-120
-140
-160
0
50 100 150 200 250 300 350 400 450 500 550 600
Frequency (Hz)
D005
Figure 150. Frequency Response (50 SPS)
0
0
-20
-20
-40
-40
Amplitude (dB)
Amplitude (dB)
The second band of aliased frequencies occur at the ADC modulator sample rate multiples (fMOD = fCLK / 8 =
921.6 kHz, multiples = 1843.2 kHz and so on). Figure 151 shows the 38400 SPS frequency response plotted to
1.2 MHz. The response near dc is the signal bandwidth of interest. Observe how the digital filter response
repeats on the sides of the modulator sample rate (921.6 kHz). Figure 152 shows the repeated response at the
modulator frequency multiples = N · fMOD ± fDR, where N = multiples of fMOD starting at 1, and fDR = data rate
frequency. The digital filter attenuates signal or noise up to where the response repeats. However, signal or
noise occurring at the modulator sample rate is not attenuated by the digital filter and therefore, is aliased to the
passband.
-60
-80
-100
-80
-100
-120
-120
-140
-140
-160
-160
0
200
400
600
800
Frequency (kHz)
1000
1200
0
1
D014
Figure 151. Frequency Response to 1.2 MHz (38400 SPS)
110
-60
2
3
4
5
Frequency (MHz)
6
7
8
D015
Figure 152. Frequency Response to 8 MHz (38400 SPS)
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Application Information (continued)
Figure 153 illustrates how the frequencies alias near the modulator sample rate frequency. The final figure shows
the aliased frequency rejection provided by an antialias filter. The ADC incorporates an analog antialias filter with
a cutoff frequency of 60 kHz that rejects the aliased frequencies.
Magnitude
Sensor
Signal
Unwanted
Signals
Unwanted
Signals
Output
Data Rate
fMOD / 2
fMOD
Frequency
fMOD
Frequency
fMOD
Frequency
Magnitude
Digital Filter
Aliasing of Unwanted
Signals
Output
Data Rate
fMOD / 2
Magnitude
External
Antialiasing Filter
Roll-Off
Output
Data Rate
fMOD / 2
Figure 153. Alias Effect
Many sensor signals are inherently band-limited; for example, the output of a thermocouple has a limited rate of
change. In this case, the sensor signal does not alias back into the pass band when using a ΔΣ ADC. However,
any noise picked up along the sensor wiring or the application circuitry can potentially alias into the pass band.
Power line-cycle frequency and harmonics are one common noise source. External noise is also generated from
electromagnetic interference (EMI) or radio frequency interference (RFI) sources, such as nearby motors and
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Application Information (continued)
cellular phones. Another noise source exists on the printed circuit board (PCB) in the form of clocks and other
digital signals. Analog input filtering helps remove unwanted signals from affecting the measurement result. The
ADC incorporates an low-pass, antialias filter with a corner frequency of 60 kHz to reduce the aliased
frequencies. The filter consists of the external 4.7-nF PGA output capacitor (CAPP and CAPN pins) and internal
280-Ω resistors.
Use an input filter to provide increased rejection of aliased noise frequencies and further attenuate possible
strong high-frequency interference signals. For best performance, filter strong interference frequencies at the
ADC inputs. Ideally, select a low-pass corner frequency that allows frequencies within the desired bandwidth and
attenuates those frequencies outside the desired bandwidth. As a result of the stable and linear dielectric
characteristics, use C0G-type MLCC capacitors in analog signal filters. In applications where high energy
transients can be generated, such as caused by inductive load switching, transient voltage suppressor (TVS)
diodes or external ESD diodes should be used to protect the ADC inputs.
10.1.6 Input Overload
Follow the input overvoltage precautions as outlined in the ESD Diode section. Despite external current limit
provided for the input pins, if an overvoltage condition occurs on an unused channel, the overvoltage channel
may crosstalk to the measurement channel. One solution is to externally clamp the inputs with low-forward
voltage diodes as shown in Figure 154. The external diodes shunt the overvoltage fault current around the ADC
inputs. Be aware of the reverse leakage current in the external clamp diodes in the application.
IFAULT
Schottky
Diode
RI-LIM
+5 V
AVDD
AINx
ADC
VIN-FAULT > VAVDD + 0.3 V
VIN-FAULT < VAVSS + 0.3 V
Schottky
Diode
AVSS
IFAULT
Figure 154. External Diode Voltage Clamp
10.1.7 Unused Inputs and Outputs
To minimize input leakage of the measurement channel, tie the unused input channels to midsupply (VAVDD +
VAVSS) / 2. Use the 2.5-V reference output voltage for this purpose if operating with single 5-V supply. Do not
float unused digital inputs. Tie all unused digital inputs to the appropriate levels, VDVDD or VDGND, including when
in power-down mode. Do not float (3-state) the digital inputs to the ADC or excessive power-supply leakage
current can result. If the DRDY output is unused, leave the pin unconnected or connect to an external circuit.
10.1.8 Voltage Reference
For nonratiometric (absolute) measurements where the input signal is not derived from the voltage reference,
either use the internal precision voltage reference, or use an external precision reference. Examples of these
types of measurements come from sensors such as thermocouples, 20-mA transmitters, and accelerometers.
For ratiometric measurements, where the input signal is derived from the voltage reference, reference noise and
drift are cancelled by the same ratio of noise and drift within the signal. Ratiometric operation is common with
many types of bridge and RTD measurements. For best noise performance, match the reference filter and input
filter time constants (see the 3-Wire RTD Measurement with Lead-Wire Compensation section for more
information). In general, achieve the best ADC signal-to-noise ratio by using large amplitude signals, a large
reference voltage, and the highest gain setting possible.
112
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Application Information (continued)
10.1.9 Serial Interface Connections
After power up, take the CS input high to reset the ADC serial interface. CS high resets the serial interface in the
event an unintentional SCLK glitch has occurred during power-on initialization. If CS is tied low, glitches at SCLK
power on can interrupt synchronization to the serial interface and must be avoided. In this case, reset the ADC
using the PWDN/RESET input. The SCLK input is edge sensitive, and therefore must be free of noise, glitches,
and overshoot. Use a terminating resistor located at the SCLK buffer to smooth the edges and reduce overshoot.
Most microcontroller SPI peripherals can operate with the ADC. The interface operates in SPI mode 1, where
CPOL = 0 and CPHA = 1. In SPI mode 1, SCLK idles low and data are updated or changed on SCLK rising
edges; data are latched or read by the master and slave on SCLK falling edges. Details of the SPI
communication protocol employed by the device is found in the Timing Requirements: Serial Interface table.
Place a 47-Ω resistor in series with all digital input and output pins (CS, SCLK, DIN, DOUT/DRDY, and DRDY).
The resistors match the characteristic impedance of the PCB trace by source termination, helping reduce
overshoot and ringing.
1
AIN8
AIN7
28
2
AIN9
AIN6
27
3
AINCOM
AIN5
26
4
CAPP
AIN4
25
5
CAPN
AIN3
24
6
AVDD
AIN2
23
7
AVSS
AIN1
22
8
REFOUT
AIN0
21
9
START
RESET/PWDN
20
10
CS
DVDD
19
11
SCLK
DGND
18
12
DIN
BYPASS
17
13
DOUT/DRDY
XTAL2
16
14
DRDY
XTAL1/CLKIN
15
4.7 nF
5V
1 F
0.1 F
3.3 V
Device
1 F
10 k
47
GPIO
GPIO
3.3 V
47
GPIO
0.1 F
Microcontroller with SPI
47
SCLK
1 F
47
MOSI
47
MISO
1 F
47
GPIO/IRQ
3.3 V
DVDD
0.1 F
DGND
Figure 155. Serial Interface Connections
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10.2 Typical Applications
10.2.1 3-Wire RTD Measurement with Lead-Wire Compensation
Figure 156 is a fault-protected, filtered, 3-wire RTD application circuit with hardware-based, lead-wire
compensation. Two IDAC current sources provide the lead-wire compensation. One IDAC current source
(IDAC1) provides excitation to the RTD element. The ADC reference voltage input (pins AIN2 and AIN3) is
derived from the same current by resistor RREF, providing ratiometric cancellation of current-source drift. The
other current source (IDAC2) has the same current setting, providing cancellation of lead-wire resistance by
generating a voltage drop across lead-wire resistance RLEAD2 equal to the voltage drop of RLEAD1. Because the
RRTD voltage is measured differentially at ADC pins AIN4 and AIN5, the voltages across the lead wire resistance
cancel. Resister RBIAS level-shifts the RTD signal to within the ADC specified input range. The current sources
are provided by two additional pins (AIN1 and AIN6) that connect to the RTD through blocking diodes. The
additional pins are used to route the RTD excitation currents around the input resistors, avoiding the voltage drop
otherwise caused by the filter resistors RF1 and RF4. The diodes protect the ADC inputs in the event of a
miswired connection. The input filter resistors limit the input fault currents flowing into the ADC.
5V
3.3 V
0.1 PF
0.1 PF
IIDAC1
IDAC1
AIN1
(IDAC1)
AVDD
AVDD
DVDD
Device
500 A
CCM4
RF4
AIN2
(REFP)
RREF
Reference
Mux
CDIF2
RF3
Internal
Reference
REFOUT
AIN3
(REFN)
CCM3
Ref
Alarm
Buf
3-Wire RTD
RLEAD1
CCM2
RF2
AIN4
(AINP)
CDIF1
RRTD
RLEAD2
RF1
Input
MUX
32-bit
ûADC
PGA
AIN5
Digital
Filter
Serial
Interface
and
Control
Internal
Oscillator
Clock
Mux
(AINN)
CCM1
IIDAC2
IDAC2
AIN6
(IDAC2)
Signal
Alarm
AVDD
500 A
AVSS
RLEAD3
START
RESET/PWDN
CS
DIN
DOUT/DRDY
SCLK
DRDY
XTAL2
XTAL1
DGND
IIDAC1 + IIDAC2
RBIAS
Figure 156. 3-Wire RTD Application
10.2.1.1 Design Requirements
Table 60 shows the design requirements of the 3-wire RTD application.
Table 60. Design Requirements
DESIGN PARAMETER
VALUE
ADC supply voltage
4.75 V (minimum)
RTD sensor type
3-wire Pt100
RTD resistance range
20 Ω to 400 Ω
RTD lead resistance range
0 Ω to 10 Ω
RTD self heating
Accuracy
(1)
114
(1)
1 mW
±0.02 Ω
TA = 25°C. After offset and full-scale calibration.
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10.2.1.2 Detailed Design Procedure
The key considerations In the design of a 3-wire RTD circuit are the accuracy, the lead wire compensation, and
the sensor self-heating. As the design values of Table 61 illustrate, several values of excitation currents are
available. The resolution is expressed in units of noise-free bits (NFR). Noise-free resolution is resolution with no
code flicker. The selection of excitation currents trades off resolution against sensor self-heating. In general,
measurement resolution improves with increasing excitation current. Increasing the excitation current beyond
1000 µA results in no further improvement in resolution. The design procedure is based on 500-µA excitation
current, because this level of current results in very low sensor self-heating (0.4 mW).
Table 61. RTD Circuit Design Parameters
Gain
(V/V)
VREFMIN (3)
(V)
VREF (4)
(V)
0.02
32
0.64
0.04
32
1.28
0.025
0.10
16
19.1
0.100
0.20
750
18.9
0.225
1000
19.3
1500
2000
IIDAC
(µA)
RREF (5)
(kΩ)
VINNLIM (6)
(V)
VINPLIM (7)
(V)
RBIAS (8)
(kΩ)
VRTDN (9)
(V)
VRTDP (10)
(V)
VIDAC1 (11)
(V)
0.90
18
0.6
4.1
7.10
0.7
0.7
1.9
1.41
14.1
0.9
3.8
5.10
1.0
1.1
2.8
1.60
1.76
7.04
1.1
3.7
2.30
1.2
1.3
3.3
8
1.60
1.76
3.52
1.0
3.8
1.10
1.1
1.3
3.4
0.30
4
1.20
1.32
1.76
0.8
4.0
0.57
0.9
1.2
2.8
0.400
0.40
4
1.60
1.76
1.76
0.9
3.9
0.50
1.0
1.4
3.5
19.1
0.900
0.60
2
1.20
1.32
0.88
0.6
4.2
0.23
0.7
1.3
3.0
18.3
1.600
0.80
1
0.80
0..90
0.45
0.3
4.5
0.10
0.4
1.2
2.4
NFR
(bits)
PRTD
(mW)
50
16.8
0.001
100
17.8
0.004
250
18.8
500
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
(1)
VRTD
(V)
(2)
VRTD is the RTD input voltage.
Gain is the ADC gain
VREFMIN is the minimum reference voltage required by the design.
VREF is the design target reference voltage allowing for 10 % over-range or the minimum 0.9 V reference voltage requirement.
RREF is the resistor that senses the IDAC current to generate VREF.
VINNLIM is the absolute minimum input voltage required by the ADC.
VINPLIM is the absolute maximum input voltage required by the ADC.
RBIAS establishes the level-shift voltage.
VRTDN is the design target negative input voltage.
VRTDP is the design target positive input voltage.
VIDAC1 is the design target IDAC1 loop voltage.
Initially, RLEAD1 and RLEAD2 are considered to be 0 Ω. Route the IDAC1 current through the external reference
resistor, RREF. IDAC1 generates the ADC reference voltage, VREF, across the reference resistor. This voltage is
defined by Equation 24:
VREF = IIDAC1 · RREF
(24)
Route the second current (IDAC2) to the second RTD lead.
Program both IDAC1 and IDAC2 to the same value by using the IDACMAG register; however, only the IDAC1
current flows through the reference resistor and RTD. The IDAC1 current excites the RTD to produce a voltage
proportional to the RTD resistance. The RTD voltage is defined by Equation 25:
VRTD = RRTD · IIDAC1
(25)
The ADC amplifies the RTD signal voltage (VRTD) and measures the resulting voltage against the reference
voltage to produce a proportional digital output code, as shown in Equation 26 through Equation 28.
Code ∝ VRTD · Gain / VREF
Code ∝ (RRTD · IIDAC1) · Gain / (IIDAC1 · RREF)
Code ∝ (RRTD · Gain) / RREF
(26)
(27)
(28)
As shown in Equation 28, the RTD measurement depends on the value of the RTD, the PGA gain, and the
reference resistor RREF, but not on the IDAC1 value. Therefore, the absolute accuracy and temperature drift of
the excitation current does not matter.
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The second excitation current (IDAC2) provides a second voltage drop across the second RTD lead resistance,
RLEAD2. The second voltage drop compensates the voltage drop caused by IDAC1 and RLEAD1. The leads of a 3wire RTD typically have the same length; therefore, the lead resistance is typically identical. Taking the lead
resistance into account (RLEADx ≠ 0), the differential voltage (VIN) across ADC inputs AIN4 and AIN5 is shown in
Equation 29:
VIN = IIDAC1 · (RRTD + RLEAD1) – IIDAC2 · RLEAD2
(29)
If RLEAD1 = RLEAD2 and IIDAC1 = IIDAC2, the expression for VIN reduces to Equation 30:
VIN = IIDAC1 · RRTD
(30)
In other words, the measurement error resulting from the voltage drop across the RTD lead resistance is
compensated, as long as the lead resistance values and the IDAC values are matched.
Using Equation 25, the value of RTD resistance (400 Ω, maximum) and the excitation current (500 µA) yields an
RTD voltage of VRTD = 500 µA · 400 Ω = 0.2 V. Use the maximum gain of 8 V/V in order to limit the reference
voltage requirement as well as the corresponding loop voltage of IDAC1. The total loop voltage must not exceed
the maximum IDAC voltage compliance specification. Gain = 8 requires a minimum reference voltage VREFMIN =
0.2 V · 4 = 1.6 V. To provide a margin for the ADC operating range, increase the target reference voltage by
10% (VREF = 1.6 V · 1.1 = 1.76 V). Calculate the value of the reference resistor, as shown in Equation 31:
RREF = VREF / IIDAC1 = 1.76 V / 500 µA = 3.52 kΩ
(31)
For best results, use a precision reference resistor RREF with a low temperature drift (< 10 ppm/°C).
The next step in the design is determining the value of the RBIAS resistor, in order to level shift the RTD voltage to
meet the ADC absolute input-voltage specification. The required level-shift voltage is determined by calculating
the minimum absolute voltage (VINNLIM) as shown in Equation 32:
VAVSS + 0.3 + VRTD · (Gain – 1) / 2 ≤ VINNLIM
where
•
•
•
VRTD = maximum differential RTD voltage = 0.2 V
Gain = 8
VAVSS = 0 V
(32)
The result of the equation requires a minimum absolute input voltage (VRTDN) > 1.0 V. Therefore, the RTD
voltage must be level shifted a minimum of 1.0 V. To meet this requirement, a target level-shift value of 1.1 V is
chosen to provide 0.1 V margin. Calculate the value of RBIAS as shown in Equation 33:
RBIAS= VINN / (IIDAC1+ IIDAC2) = 1.1 V / ( 2 · 500 µA) = 1.1 kΩ.
(33)
After the level-shift voltage is determined, verify that the positive RTD voltage (VRTDP) is less than the maximum
absolute input voltage (VINPLIM), as shown in Equation 34:
VINPLIM ≤ VAVDD – 0.3 – VRTD · (Gain – 1) / 2
where
•
•
•
VRTD = maximum differential RTD voltage = 0.2 V
Gain = 8
VAVDD = 4.75 V (minimum)
(34)
Solving Equation 34 results in a required VRTDP of less than 3.8 V. Calculate the VRTDP input voltage by
Equation 35:
VINP = VRTDN + IIDAC1 · ( RRTD + RLEAD1) = 1.1 V + 500 µA · (400 Ω + 10 Ω) = 1.3 V
(35)
Because 1.3 V is less than the 3.8-V maximum input voltage limit, the absolute positive and negative RTD
voltages are within the ADC specified input range.
116
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The next step in the design is to verify that the loop voltage of the excitation current is less than the specified
IDAC compliance voltage. The IDAC compliance voltage is the maximum voltage drop developed across each
IDAC current path to AVSS. In this circuit, IDAC1 has the largest voltage drop developed across its current path.
The IDAC1 calculation is sufficient to satisfy IDAC2 because the IDAC2 voltage drop is always less than IDAC1
voltage drop. The sum of voltages in the IDAC1 loop is shown in Equation 36:
VIDAC1 = [(IIDAC1 + IIDAC2) · (RLEAD3 + RBIAS)] + [IIDAC1 · (RRTD + RLEAD1 + RREF)] + VD
where
•
VD = external blocking diode voltage.
(36)
The equation results in a loop voltage of VIDAC1= 3.4 V. The worst-case current source compliance voltage is:
(VAVDD – 1.1 V) = (4.75 V – 1.1 V) = 3.64 V. The VIDAC1 loop voltage is less than the specified current source
compliance voltage (3.4 V < 3.64 V).
Many applications benefit from using an analog filter at the inputs to remove noise and interference from the
signal. Filter components are placed on the ADC inputs (RF1, RF2, CDIF1, CCM1, and CCM2), as well as on the
reference inputs (RF3, RF4, CDIF2, CCM3, and CCM4). The filters remove both differential and common-mode noise.
The application shows a differential input noise filter formed by RF1, RF2 and CDIF, with additional differential
mode capacitance provided by the common-mode filter capacitors, CM1 and CM2. Calculate the differential cutoff
frequency as shown in Equation 37:
fDIF = 1 / [2π · (RF1 + RF2) · (CDIF1 + CM1|| CM2)]
(37)
The common-mode noise filter is formed by components RF1, RF2, CM1 and CM2. Calculate the common-mode
signal cutoff frequency as shown in Equation 38:
fCM = 1 / (2π · RF1 · CM1) = 1 / (2π · RF2 · CM2)
(38)
Mismatches in the common-mode filter components convert common-mode noise into differential noise. To
reduce the effect of mismatch, use a differential mode filter with a corner frequency that is 10 times lower than
the common-mode filter corner frequency. The low-frequency differential filter removes the common-mode
converted noise. The filter resistors (RFx) also serve as current-limiting resistors. These resistors limit the current
into the analog inputs (AINx) of the device to safe levels when an overvoltage occurs on the inputs.
Filter resistors lead to an offset voltage error due to the dc input current leakage flowing into and out of the
device. Remove this voltage error by system offset calibration. Resistor values that are too large generate
excess thermal noise and degrade the overall noise performance. The recommended range of the filter resistor
values is 2 kΩ to 10 kΩ. The properties of the capacitors are important because the capacitors are connected to
the signal; use high-quality C0G ceramics or film-type capacitors.
For consistent noise performance across the full range of RTD measurements, match the corner frequencies of
the input and reference filter. Detailed information on matching the input and reference filter is found in
Application Report SBAA201, RTD Ratiometric Measurements and Filtering Using the ADS1148 and ADS1248.
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10.2.1.3 Application Curve
Figure 157 shows the resistance measurement results. The measurements are taken at TA = 25°C. A system
offset calibration is performed using shorted inputs. A system gain calibration is performed using a 390-Ω
precision resistor. The data are taken using a precision resistor simulator with a 3-wire connection in place of a
3-wire RTD. Note that the measurement data are in ohms and do not include the error of the RTD sensor itself.
The measured resistance error is < ±0.02 Ω over the 20-Ω to 400-Ω range.
Measurement Error (:)
0.1
0.05
0
-0.05
-0.1
0
50
100
150
200
250
300
350
400
RTD Value (:)
Figure 157. Resistance Measurement Error
118
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10.3 Dos and Don'ts
•
•
•
•
•
•
•
•
•
•
•
Do partition the analog, digital, and power supply circuitry into separate sections on the PCB.
Do use a single ground plane for analog and digital grounds.
Do place the analog components close to the ADC pins using short, direct connections.
Do keep the SCLK pin free of glitches and noise.
Do verify that the analog input voltages are within the specified PGA input voltage range under all input
conditions.
Do tie unused analog input pins to midsupply to minimize input leakage current.
Do provide current limiting to the analog inputs in case overvoltage faults occur.
Do use an LDO regulator to reduce ripple voltage generated by switch-mode power supplies.
Don't route digital clock traces in the vicinity of the CAPP and CAPN pins.
Don't cross digital signals over analog signals.
Don't allow the analog and digital power supply voltages to exceed 7 V under all conditions, including during
power-up and power-down.
Figure 158 shows Do's and Don'ts of ADC circuit connections.
CORRECT
INCORRECT
5V
5V
AVDD
AVDD
Device
Device
AINP
AINP
32-bit
ûADC
PGA
AINN
AVSS
0V
32-bit
ûADC
PGA
AINN
AVSS
0V
0V
0V
Single-ended input, PGA enabled
Single-ended input, PGA bypassed
CORRECT
CORRECT
2.5 V
5V
AVDD
AVDD
Device
Device
AINP
AINP
32-bit
ûADC
PGA
2.5 V
AINN
PGA
AVSS
-2.5 V
0V
Single-ended input, PGA enabled
INCORRECT
AVDD
32-bit
ûADC
AVSS
0V
Single-ended input, PGA enabled
5V
PGA enabled
AINN
3.3 V
5V
INCORRECT
3.3 V
DVDD
AVDD
PGA
32-bit
ûADC
PGA
32-bit
ûADC
AVSS
DGND
AVSS
DGND
Device
Inductive supply or ground connections
5V
CORRECT
AVDD
3.3 V
Device
DVDD
AGND/DGND isolation
2.5 V
CORRECT
3.3 V
DVDD
AVDD
PGA
32-bit
ûADC
PGA
32-bit
ûADC
AVSS
DGND
AVSS
DGND
Device
Device
DVDD
-2.5 V
Low impedance AGND/DGND connection
Low impedance AGND/DGND connection
Figure 158. Dos and Don'ts Circuit Connections
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10.4 Initialization Setup
Figure 159 is a general procedure that shows a typical ADS1262 configuration and measurement sequence.
Apply Power
Set RESET/PWDN High
/* This pin must be high for operation
Y
/* ADC automatically detects external clock
(external clock can be applied at power-on)
External clock?
Apply clock to XTAL1
N
Wait 216 clock cycles
/* The ADC is internally held in reset for 216 clocks after power-on
Y
/* If START pin is high, conversions are free-running
If START pin is low, conversions are stopped
START High?
DRDY pulses at 20 Hz
N
Set START low or
STOP1 command
/* For simplicity, stop conversions before register configuration
DRDY not pulsing
Issue Write Register
command to configure the
ADC
/* Readings are suspended until Write Register command completes
(If conversions are active, changes to certain registers result in ADC restart)
Issue Read Register
command to verify registers
/* Readings are suspended until Read Register command completes
Wait for reference
voltage to settle
/* The internal reference require time to settle after power-on
Set START pin high
or START1 command
/* Start or restart new ADC conversion
N
Read Data using
RDATA1 command
Hardware DRDY?
/* Read data at a rate faster than
the data rate to avoid dropping data
Y
N
N
ADC1 Status bit = 1 ?
DRDY low ?
Y
Y
/* By Direct or
Command method
Read Data
N
New ADC1 data
Change ADC
Settings ?
Y
Figure 159. ADS1262 Configuration and Measurement Procedure
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Initialization Setup (continued)
Figure 160 illustrates a general procedure to read concurrent ADC1 and ADC2 data of the ADS1263. The
conversion time of ADC1 can be faster or slower than ADC2. If the conversion time of ADC1 is less than or equal
to that of ADC2, and if the ADC2 status bit is equal to 1, then when ADC1 data are ready, ADC2 data are also
ready. The ADC2 data can then be read by the RDATA2 command. Similarly, if the conversion time of ADC2 is
less than that of ADC1, and if the ADC1 status bit is equal to 1, then when ADC2 data are ready. ADC1 data are
also ready, The ADC1 data can then be read by the RDATA1 command. It is important to note an exception to
the conversion time related to the data rate: the time of the first conversion is not always the same as (1 / data
rate) because of digital filter latency. Therefore, it is possible that although the data rate of ADC1 can be faster
than ADC2, the time required for the first conversion of ADC1 can be greater than ADC2 depending on the digital
filter setting and chop mode. When checking the ADC2 status by reading ADC1 data, use the RDATA1
command.
Begin
Stop Conversions
ADC1: START pin low; or
STOP1 command
ADC2: STOP2 command
/* For simplicity, stop conversions before ADC configuration
Configure ADC1
Configure ADC2
/* Configure the ADCs
Start Conversions
ADC1: START pin high; or
START1 command
ADC2: START2 command
/* Start conversions
/* Read data at a rate faster than
the data rate to avoid dropping data
N
ADC1 conversion
WLPH$'&2 ?
Read ADC2 data
using RDATA2 command
Y
N
N
ADC2 Status bit = 1 ?
Read ADC1 data
using RDATA1 command
Hardware DRDY?
Y
Y
New ADC2 data
N
ADC1 Status bit = 1 ?
N
DRDY low ?
Y
N
Y
ADC1 Status bit =1 ?
New ADC1 data
Read ADC1 data
using RDATA1 command
Y
Read ADC1 data using
RDATA1 command
N
ADC2 Status bit =1 ?
Y
Read ADC2 data
using RDATA2 command
N
Change ADC
configuration ?
Y
Figure 160. ADS1263 Concurrent Read of ADC1 and ADC2 Data
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11 Power-Supply Recommendations
The ADS1262 and ADS1263 require an analog power supply (VAVDD, VAVSS) and digital power supply (VDVDD).
The analog power supply can be bipolar (for example, VAVDD = +2.5 V, VAVSS = –2.5 V) or unipolar (for example,
VAVDD = 5 V, VAVSS = 0 V). The digital supply (VDVDD) range is 2.7 V to 5.25 V. The digital supply voltage
determines the digital I/O logic levels. Keep in mind that the GPIO logic levels (AIN3-AINCOM) are referenced to
the analog supply voltage and may be different from the digital I/O logic level. The analog and digital sections of
the ADC are not internally isolated and the grounds for analog and digital must be connected together. Output
voltage ripple produced by switch-mode power supplies may interfere with the ADC resulting in reduced
performance. Use low-dropout regulators (LDOs) to reduce the power-supply ripple voltage produced by switchmode power supplies.
11.1 Power-Supply Decoupling
Good power-supply decoupling is important in order to achieve optimum performance. Power supplies VAVDD,
VAVSS and VDVDD must be decoupled to a common ground potential. For proper power-supply decoupling, place a
0.1-µF capacitor as close as possible to the supply with an additional 1-µF bulk capacitor placed nearby.
Figure 161 shows decoupling for bipolar-supply (left figure) and single-supply (right figure) operation. When using
bipolar supplies, bypass both AVDD and AVSS to ground separately, and include a bypass capacitor between
AVDD and AVSS. Use a multilayer ceramic chip capacitors (MLCCs) that offers low equivalent series resistance
(ESR) and equivalent series inductance (ESL) characteristics for power-supply decoupling purposes. The
BYPASS pin is the bypass output of an internal 2-V regulator. The 2-V regulator powers the digital circuitry.
Connect a ceramic or tantalum 1-µF capacitor from this pin to DGND. Do not load this voltage by external
circuits.
1
AIN8
AIN7
28
1
AIN8
AIN7
28
2
AIN9
AIN6
27
2
AIN9
AIN6
27
3
AINCOM
AIN5
26
3
AINCOM
AIN5
26
4
CAPP
AIN4
25
4
CAPP
AIN4
25
5
CAPN
AIN3
24
6
AVDD
AIN2
23
7
AVSS
AIN1
22
AIN0
21
RESET/PWDN
20
4.7 nF
4.7 nF
5
CAPN
AIN3
24
6
AVDD
AIN2
23
5V
+2.5 V
1 PF
0.1 PF
1 PF
1 PF
1 PF
7
±2.5 V
±2.5 V
AVSS
AIN1
0.1 PF
22
ADS1262
ADS1263
8
REFOUT
9
START
10
CS
AIN0
21
RESET/PWDN
20
DVDD
19
SCLK
12
DIN
13
DOUT/DRDY
14
DRDY
8
REFOUT
9
START
10
CS
DVDD
19
DGND
18
BYPASS
17
XTAL2
16
XTAL1/CLKIN
15
3.3 V
0.1 PF
11
ADS1262
ADS1263
1 PF
0.1 PF
1 PF
DGND
18
11
SCLK
BYPASS
17
12
DIN
XTAL2
16
13
DOUT/DRDY
XTAL1/CLKIN
15
14
DRDY
1 PF
3.3 V
1 PF
1 PF
Figure 161. Power-Supply Decoupling for Bipolar (left) and Single-Supply (right) Operation
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11.2 Analog Power-Supply Clamp
It is important to evaluate circumstances when an input signal is present while the ADC is powered and
unpowered. When the input signal exceeds the power-supply voltage, it is possible to back drive the analog
power-supply voltage with the input signal through a conduction path of the internal ESD diodes. Back driving the
ADC power supply can also occur when the power-supply voltage is on. The back-drive, fault-current path is
illustrated in the Figure 162. Depending on the external power-supply components, it is possible that the
maximum rating of the ADC power-supply voltage can be exceeded if back-driven. ADC power supply
overvoltage must be prevented in all cases. One solution is to clamp the AVDD to AVSS voltage with an external
6-V Zener diode.
ADC supply On or Off
IFAULT
+V
+5 V Reg
AVDD
RLIMIT
AINx
Input Voltage
+
±
ESD Diode
ADC
Optional
6-V Zener Diode
AINx
ESD Diode
IFAULT
IFAULT
AVSS
Figure 162. Analog Power-Supply Clamp
11.3 Power-Supply Sequencing
Sequence the power supplies in any order, but never allow and analog or digital inputs to exceed the respective
analog or digital power-supplies without limiting the input fault current. The ADC remains in reset until both
analog and digital power supplies exceed the respective power-on reset (POR) thresholds. Figure 117 shows the
power-on reset sequence. After the power supplies have crossed the reset levels (including the internal 2-V
LDO), the ADC resets (POR) and is ready for communication 65536 clock periods later (nominally 9 ms).
Delay communication for 50 ms after the power supplies have stabilized within the specified range to make sure
the ADC is operational. In addition to POR, make sure that the reference voltage has fully settled before starting
the conversions. When using a 1-µF reference capacitor allow a minimum of 50 ms for the internal reference to
settle. External references may require additional settling time.
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12 Layout
Good layout practices are crucial to realize the full-performance of the ADS1262 and ADS1263. Poor grounding
can quickly degrade the noise performance of the main 32-bit ADC and auxiliary 24-bit ADC. The following layout
recommendations are given to help provide best results.
12.1 Layout Guidelines
Ground must be a low impedance connection for return currents to flow undisturbed back to their respective
sources. Keep connections to the ground plane as short and direct as possible. When using vias to connect to
the ground layer, use multiple vias in parallel to reduce impedance to ground.
A mixed-signal layout sometimes incorporates separate analog and digital ground planes that are tied together at
one location; however, separating the ground planes is not necessary when analog, digital, and power supply
components are properly placed. Proper placement of components partitions the analog, digital, and power
supply circuitry into different PCB regions to prevent digital return currents from coupling into sensitive analog
circuitry.
For best performance, dedicate an entire PCB layer to a ground plane and do not route any other signal traces
on this layer. However, depending on restrictions imposed by specific form factors, single ground planes may not
be possible. If ground plane separation is necessary, then make the connection at the ADC. Do not connect
individual ground planes at multiple locations because this configuration creates ground loops. A single plane for
analog and digital ground avoids ground loops.
If isolation is required in the application, isolate the digital signals between the ADC and controller, or provide the
isolation from the controller to the remaining system. if an external crystal is used to provide the ADC clock,
place the crystal and load capacitors directly to the ADC pins using short direct traces. See the Crystal Oscillator
section for more details.
Supply pins must be bypassed with a low-ESR ceramic capacitor. Place the bypass capacitors as close as
possible to the supply pins using short, direct traces. For optimum performance, use low-impedance connections
on the the ground-side connections of the bypass capacitors. Flow the supply current through the bypass
capacitor pin first and then to the supply pin to make the bypassing most effective (also known as a Kelvin
connection). If multiple ADCs are on the same PCB, use wide power supply traces or dedicated power-supply
planes to minimize the potential of crosstalk between ADCs.
If external filtering is used for the analog inputs, use C0G-type ceramic capacitors when possible. C0G
capacitors have stable properties and low-noise characteristics. Ideally, route the differential signals as pairs in
order to minimize the loop area between the traces. For the ADC CAPP and CAPN pins, place the 4.7-nF C0G
capacitor close to the pins using short direct traces. Route digital circuit traces (such as clock signals) away from
all analog pins. Note the internal reference output return shares the same pin as the AVSS power supply. To
minimize coupling between the power-supply trace and reference-return trace, route the two traces separately;
ideally, as a star connection at the AVSS pin.
It is important the SCLK input of the serial interface is free from noise and glitches. Even with relatively slow
SCLK frequencies, short digital-signal rise and fall times may cause excessive ringing and noise. For best
performance, keep the digital signal traces short, use termination resistors as needed, and ensure all digital
signals are routed directly above the ground plane with minimal use of vias.
Signal
Conditioning
(RC filters
and
amplifiers)
Supply
Generation
Interface
Tranceiver
Microcontroller
Optional: Split
Ground Cut
Device
Ground Fill or
Ground Plane
Ground Fill or
Ground Plane
Optional: Split
Ground Cut
Ground Fill or
Ground Plane
Connector
or Antenna
Ground Fill or
Ground Plane
Figure 163. System Component Placement
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12.2 Layout Example
Figure 164 is an example layout of the ADS1262 and ADS1263, requiring a minimum of three PCB layers. The
example circuit is shown for a single analog supply (5 V) connection and an external crystal oscillator. In this
example, an inner layer is dedicated to the ground plane and the outer layers are used for signal and power
traces. If a four-layer PCB is used, dedicate the additional inner layers to route power traces. The ADC
orientation is shown left to right to minimize crossover of the analog and digital signal traces. The PCB is
partitioned with analog signals routed from the left, digital signals routed to the lower-right, and power routed
from the upper-right. Analog supply bypass capacitors are placed opposite to the ADC on the bottom layer to
allow the reference and PGA output capacitors to be placed closer to the ADC.
Internal plane connected to GND (DGND = AVSS)
IN1
RTD input
IN2
6V Zener Diode
(OPTIONAL)
AVDD
IN6
DVDD
Differential input
External Crystal
(OPTIONAL)
IN7
15: XTAL1
16: XTAL2
17: BYPASS
18: DGND
19: DVDD
20: /RST/PD
21: AIN0
22: AIN1
23: AIN2
24: AIN3
25: AIN4
26: AIN5
Differential input
27: AIN6
28: AIN7
IN6
(TO XTAL1)
(TO XTAL2)
ADS126x
IN7
COM
/RESET/PWDN
START
/CS
14: /DRDY
13: DOUT
12: DIN
11: SCLK
10: /CS
9: START
8: REFOUT
7: AVSS
6: AVDD
5: CAPN
4: CAPP
2: AIN9
1: AIN8
IN9
3: AINCOM
/DRDY
Thermocouple/single-ended input
DOUT
DIN
SCLK
(REFP OUT)
(REFN OUT)
Tie unused inputs to REFOUT
for lowest leakage current
Figure 164. PCB Layout Example
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Product Folder Links: ADS1262 ADS1263
125
ADS1262, ADS1263
SBAS661B – FEBRUARY 2015 – REVISED JULY 2015
www.ti.com
13 Device and Documentation Support
13.1 Related Links
Table 62 lists quick access links. Categories include technical documents, support and community resources,
tools and software, and quick access to sample or buy.
Table 62. Related Links
PARTS
PRODUCT FOLDER
SAMPLE & BUY
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
ADS1262
Click here
Click here
Click here
Click here
Click here
ADS1263
Click here
Click here
Click here
Click here
Click here
13.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
13.3 Trademarks
E2E is a trademark of Texas Instruments.
SPI is a trademark of Motorola Inc.
All other trademarks are the property of their respective owners.
13.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
13.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
14 Mechanical, Packaging, and Orderable Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
126
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Copyright © 2015, Texas Instruments Incorporated
Product Folder Links: ADS1262 ADS1263
PACKAGE OPTION ADDENDUM
www.ti.com
22-Mar-2017
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
ADS1262IPW
ACTIVE
TSSOP
PW
28
50
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
1262
ADS1262IPWR
ACTIVE
TSSOP
PW
28
2000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
1262
ADS1263IPW
ACTIVE
TSSOP
PW
28
50
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
1263
ADS1263IPWR
ACTIVE
TSSOP
PW
28
2000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
1263
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
22-Mar-2017
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
23-Mar-2017
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
ADS1262IPWR
TSSOP
PW
28
2000
330.0
16.4
6.9
10.2
1.8
12.0
16.0
Q1
ADS1263IPWR
TSSOP
PW
28
2000
330.0
16.4
6.9
10.2
1.8
12.0
16.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
23-Mar-2017
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
ADS1262IPWR
TSSOP
PW
28
2000
367.0
367.0
38.0
ADS1263IPWR
TSSOP
PW
28
2000
367.0
367.0
38.0
Pack Materials-Page 2
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