ADVANCED-BQMTESTER

User's Guide SLUU397B – February 2011 – Revised May 2020 Advanced bqMTester EV2300 Texas Instruments SMB I2C ` HDQ FEATURES – Programs and Calibrates Smart Battery Modules Based on the Following Devices: bq306x and bq28xxx, and the Impedance Track™ devices bq20z4x, bq20z6x, bq20z7x, bq20z80, and bq20z9x – Calibrates Coulomb Counter Offset, Voltage, Temperature, and Current – Programs • Serial Number • Date • Pack Lot Code • Other Defaults Obtained from a Golden Image File – Provides Test Software Compatible with Microsoft® Windows® XP and 32-bit Windows 7 – Preserves Calibration Records with its Data Logging Feature USB • PVSS SYS SLP P+ Temp Circuit 1N 1P 2P 3P 4P 5V SDA SCL GND 24VDC/0.5A 5VDC/4A Current Output Control J6 J7 J4 J5 P+ 4P 3P 2P 1P 1N Reference V 4+ Reference V 4 Reference V 3+ Reference V 3 Reference V 2+ Reference V 2 Reference V 1+ Reference V 1 - DMM1 DMM2 DMM3 DMM4 Texas Instruments HPA495 BPDMM5 for Current Ref. It is important to note the Kelvin connection here at 1N on the module Contents 1 Description .................................................................................................................... 3 2 Advanced bqMTester Requirements ...................................................................................... 3 3 Advanced bqMTester Environment ........................................................................................ 4 4 Advanced bqMTester Instructions ......................................................................................... 5 Appendix A Theory of Operation for HPA495 Calibration Board .......................................................... 27 Appendix B HPA495 Schematic ............................................................................................... 29 Appendix C HPA495 Calibration Board Bill of Materials .................................................................... 31 Appendix D HPA495 Board Layout ............................................................................................ 33 Appendix E Error Code Definitions ............................................................................................ 36 Appendix F Using TesterDFReader to Create an Image of the Data Flash ............................................. 41 Appendix G Creating the Golden Image File Without bqEASY ............................................................ 42 SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 1 www.ti.com List of Figures 1 bqMTester Multi-Station Flow .............................................................................................. 5 2 One Testing Station: EV2300/HPA495 Cal Board/Smart Battery Module Connections .......................... 13 3 External Temperature Sensor Connection .............................................................................. 13 4 Station Setup Program .................................................................................................... 14 5 Multi-Station Setup ......................................................................................................... 15 6 Global Configuration Screen .............................................................................................. 17 7 Reference/FSV and K-Factor Fields ..................................................................................... 19 8 Example Targets File ...................................................................................................... 20 9 Multi-Station Tester Window .............................................................................................. 21 10 Update VTI Window........................................................................................................ 22 11 Update VTI .................................................................................................................. 22 12 Update VTI: No Voltage Selected ........................................................................................ 23 13 Global.ini file ................................................................................................................ 25 14 TesterDFReader.exe Software ........................................................................................... 41 15 Cycle Count Modification in GG file using Notepad ................................................................... 43 16 EV Software Pro Screen .................................................................................................. 44 List of Tables 1 HPA495 Calibration Board Bill of Materials ............................................................................. 31 2 Error Code Definitions ..................................................................................................... 36 Trademarks Impedance Track is a trademark of Texas Instruments. Microsoft, Windows are registered trademarks of Microsoft Corporation. All other trademarks are the property of their respective owners. 2 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Description www.ti.com 1 Description 1.1 Introduction The Texas Instruments Advanced bqMTester Multi-Station Test and Program Board is designed to calibrate and program electronic smart battery modules based on the latest Texas Instruments advanced battery gas gauges (bq306x, and bq28xxx, and the Impedance Track™ devices bq20z4x, bq20z6x, bq20z7x, bq20z80, bq20z9x). The bqMTester environment can support—on a single computer—up to a maximum of 12 calibration boards with each connected to an EV2300 communication board. NOTE: For more information on the Advanced bqMTester program board and the Advanced bqMTester Software, go to the following Texas Instruments links: Advanced bqMTester: http://focus.ti.com/docs/toolsw/folders/print/advanced-bqmtester.html NOTE: Do not use Texas Instruments' EVMs for production. http://www.ti.com/legal/terms-of-sale/standard-evaluation-terms.html 1.2 Overview • Programs and calibrates most smart battery modules based on the bq20zxx, bq306x, and bq28xxx. The newer software is compatible with the first generation HPA169 board; however, some devices are not. The table below shows the devices that the HPA169 and HPA495 supports, respectively: Devices Supported • • • • HPA169 HPA495 bq20z4x, bq20z6x, bq20z7x, bq20z80, and bq20z9x All devices supported by the HPA169, bq306x, and bq28xxx Calibrates coulomb counter offset, voltage, temperature, and current Programs serial number, date, pack lot code or manufacturer info block, and other defaults obtained from a Golden Image File Test software that is compatible with Windows XP and 32-bit Windows 7 operating systems Data logging feature preserves statistical records 2 Advanced bqMTester Requirements 2.1 Minimum System Requirements 2.1.1 • • • • • • • • • Advanced bqMTester Multi-Station Tester Computer: PC or compatible Operating System: Windows XP or 32-bit Windows 7 Minimum video resolution is 640 x 480. The recommended video resolution is 800 x 600 or above. One available USB port One EV2300 USB-based PC Interface Board for Battery Fuel Gauge Evaluation from Texas Instruments that includes the USB Tester Ready label. (This must be ordered separately.) The bqMTester software verifies the EV2300 (firmware version 3.1L or greater). For more information, see Section 4.2.2. One Texas Instruments HPA495 Advanced MTester Calibration Board Two SMBus connectors For Multi-Station support: 5 V/4 A and 24 V/0.5 A power supplies with isolated grounds (not included) 10 Mbytes of available hard drive space SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 3 Advanced bqMTester Environment • • • 3 www.ti.com Test software (to be downloaded from http://focus.ti.com/docs/toolsw/folders/print/advancedbqmtester.html) Traceable Digital Multi-Meter (DMM) capable of measuring 2.5 A and 20 V accurate to less than 1 mv and 1 mA Traceable Temperature probe accurate to 0.1°C Advanced bqMTester Environment This is a brief explanation of the Advanced bqMTester software/hardware environment. 3.1 bqMTester: Hardware The Advanced bqMTester requires the following: • An HPA495 Advanced MTester Calibration Board • Two wall DC power supplies (5 V/2.5 A and 24 V/0.5 A—each with isolated grounds, not included) • Two SMBus connectors • A user-supplied Test Head for every test station • An EV2300 board (sold separately) for each station to be tested NOTE: 3.1.1 EV2300 boards prior to version 3.1L are not compatible with bqMTester. StationSetup.exe warns you if your EV2300 board is not compatible. All EV2300-HPA002 and all boards with USB Tester Ready (as shown in TBD, below right) are compatible. bqMTester: Software Environment The bqMTester software is a suite of programs that calibrates and tests modules in the devices listed in Section 1.2. There are four executable files, but only three are user-executable files. Of those three files, only two are needed for most applications: StationSetup.exe and MultiStationTester.exe. • MultiStationTester.exe: The main test program for multi-station testing. This program can only be run after StationSetup.exe has been run. It requires the calibration board (HPA169/HPA495). This program's purpose is to coordinate background bqTester.exe functions and data. It initiates tests, handles priority conflicts, and processes and stores test statistical data received from bqTester.exe. • StationSetup.exe: This is the setup program for MultiStationTester.exe. This program must be run prior to running MultiStationTester.exe. The EV2300/Temperature/Test Limits are configured using this program. TesterDFReader.exe: This program can read the data flash and write a ROM file (data flash image file) to be used by bqMTester software. In most cases, this program will not be used. bqEASY in the bqEVSW will generate the ROM file. If bqEASY is not compatible with the fuel gauge to be tested, refer to Appendix G. (For more information on bqEASY, see http://focus.ti.com/lit/ug/sluu278/sluu278.pdf.) • bqTester.exe: This program is the backbone of the Multi-Station Tester. It performs all of the testing. bqTester.exe is a background object that is not visible when called by MultiStationTester.exe. There is an instance of bqTester.exe running for each EV2300 test station connected to the PC. The bqMTester (MultistationTester.exe) software calls on bqTester.exe to perform all the calibration and testing. All data from this testing is reported back to the Advanced bqMTester where it is displayed and logged. NOTE: Do not run the bqTester.exe as a standalone program. This is not supported and can cause unpredictable results. bqTester.exe executes in the background, supporting MultiStation Tester. 4 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com bqEASY Tester Preparation StationSetup Test Initialization / Test Flow Control Test Initialization / Test Flow Control MultiStationTester Statistical Data bqTester bqTester Test Software bqTester bqTester Statistical Data bqTester bqTester bqTester EV2v00 Controller HPAxxx Calibration Board Module Under Test Figure 1. bqMTester Multi-Station Flow 4 Advanced bqMTester Instructions 4.1 Advanced bqMTester Functional Procedure The Advanced bqMTester functional procedure is as follows: 1. ROM File Generation: Create ROM file using bqEASY in EVSW. If bqEASY is not available for your particular device, follow the procedure detailed in Appendix F to create the ROM file. 2. Software Installation: Install the software and drivers. • NOTE: Do not connect any EV2300s until the software is installed. 3. EV2300 Driver to USB port Association: Associate the EV2300 drivers to each USB port that will be used for the Advanced bqMTester. 4. Station Hardware Connections: Connect all stations (EV2300 and HPA495/HPA169) to the PC. 5. Station Setup (StationSetup.exe): Run the StationSetup.exe file. i. This program first detects all stations and request names for those stations. ii. Next, you will see the Temperature Probe Setup screen to assign individual temperature probes to each station. iii. The program then requests calibration-specific data and the location of the Golden Image File so that data can be installed in all gas gauge modules to be tested. 6. Multi-Station (MultiStationTester.exe): Finally, run the MultiStationTester.exe program. Here you SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 5 Advanced bqMTester Instructions www.ti.com will do the following: i. Select the Update VTI screen to calibrate the HPA495 voltage, current, and temperature sources used to calibrate the modules. ii. Start testing. Log data is displayed on the log screens and stored to a file (as setup in Step 3 of this section). 4.2 Detailed Instructions This section describes the entire process of setting up the bqMTester software and hardware for a single station and a Texas Instruments bq20zxx EVM. It is recommended to start with one station and the Texas Instruments EVM to prevent setup complications. Once the setup for one station and the Texas Instruments EVM is complete, the process can be repeated with your fuel gauge and multiple stations. 4.2.1 Generate ROM File NOTE: The ROM file is programmed into every device that uses the Advanced bqMTester, so it is very important that it is done correctly. Create the ROM file using bqEASY in bqEVSW. If bqEASY is not available for your device, use the flow detailed in Appendix F to create the ROM file. It is recommended to use bqEASY whenever possible to generate the ROM file because it reduces the chances of mistakes in this very critical process. The ROM file is a data flash image file. It has two parts. 1. Header information that includes the fuel gauge type and firmware version. This is used by bqMTester to protect against programming an incompatible data flash image into a fuel gauge, which could permanently damage the fuel gauge. 2. A binary image of the entire data flash. It does not include the firmware image, only the data flash. This cannot be used to reprogram firmware into a fuel gauge. 4.2.2 Software Installation The TIbqMultiStationNB2.00Setup.exe file installs all required software, drivers, and DLL files for proper software operation. To install the software: 1. Do not connect any EV2300s to the PC before installing software. If any are connected, disconnect them now. 2. Download software from the bqMTester page on the www.ti.com web site. 3. Unzip the file downloaded in Step 2. Double-click TIbqMultiStationNMx.xxSetup.exe" ("x.xx" depends on the software version). 4. Click Next at the welcome screen. 6 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com 5. If you agree with the terms, click I Agree; otherwise, click Cancel and exit the installation software. 6. Click Next at the Choose Components screen (there is only one option for the bqMTester installation). 7. Choose the Start Menu Folder where you would like to install the bqMTester associated shortcuts. Texas Instruments shows as the default destination. Click Install. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 7 Advanced bqMTester Instructions www.ti.com NOTE: If at any time you are asked to reboot, click No and continue. 8. When the software installs, click Finish to exit the software installation process. All bqMTester software is now installed on the PC. Now, the EV2300 drivers need to be associated with the USB ports that will be used with bqMTester software, as described in the following section. 4.2.3 EV2300 Driver to USB Port Association There are two drivers associated with the EV2300. An instance of the two drivers must be associated with each EV2300 connected to the bqMTester PC through any USB port. In other words, each USB port that has an EV2300 connected to it must have an additional instance of the two EV2300 drivers. That means for 12 Advanced bqMTester stations, there will be a total of 24 drivers running at the same time. If an EV2300 is connected to the bqMTester PC and the PC detects that it has not had an EV2300 connected to that particular USB port, then the computer requires the following procedure to associate a copy of the drivers for that USB port. To associate an instance of the EV2300 drivers to any given USB port, do the following: 1. Connect an EV2300 to the bqMTester PC. After a few seconds, the Found New Hardware screen appears. Select No, not this time and click Next. If the first screen that appears does not look like this screen, then proceed to the next step. All of the following driver screens will only appear if the EV2300 driver has not been previously installed on the system. Connect an EV2300 to bqMTester PC. The system acknowledges the EV2300 if drivers were previously installed. The Microsoft USB host plug manager announces installation with a tone. 8 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com 2. On the next Found New Hardware screen, select Install the software automatically (Recommended) and click Next for the first of the two drivers (TI USB Firmware Updater) required for this instance of the EV2300. 3. Click Continue Anyway on the Windows Logo Testing notification on the Hardware Installation screen. 4. It is common for the next screen to be the Confirm File Replace screen. Click No to continue. If this screen does not appear, then go to the next step. (This screen only appears if the computer has previously installed the USB driver.) SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 9 Advanced bqMTester Instructions www.ti.com 5. The TI USB Firmware Update driver is now installed for this instance of the EV2300. Click Finish to exit this Found New Hardware Wizard. 6. After a few seconds, another Found New Hardware Wizard screen appears to start the installation of the final driver for this instance of the EV2300. Select No, not this time and click Next. If the screen that appears does not look like this screen, then proceed to the next step. 7. Select Install the software automatically (Recommended) and click Next on the next Found New Hardware Wizard screen for the second of the two drivers (TI USB bq80xx Driver) required for this instance of the EV2300. 10 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com 8. Click Continue Anyway on the Windows Logo Testing notification on the Hardware Installation screen. 9. It is common for the next screen to be the Confirm File Replace screen. Click No to continue. If this screen does not appear, then go to the next step. 10. The TI bq80xx Driver is now installed for this instance of the EV2300. Click Finish to exit this Found New Hardware Wizard. At this point, the installation of one instance of the EV2300 on one USB port is complete. To install more EV2300 boards to the bqMTester PC, repeat the installation process detailed in Step 1 in this section for every instance of each EV2300 board required. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 11 Advanced bqMTester Instructions www.ti.com The driver installation process of each instance of the EV2300 boards should only be done one time. After the initial installation, the only reason it would be required to repeat the process is if the orientation between the USB ports and EV2300 boards changes. This could happen if a USB hub position is changed, a USB hub is installed, or if an additional EV2300 is installed. USB hubs can be used to accommodate stations for the bqMTester. NOTE: It is recommended not to exceed seven EV2300/Test Stations per USB hub, and USB hubs cannot be nested. Stations will not install with nested USB hubs. It is also recommended that the USB hub be USB 2.0-compliant and capable of 1.0 A of output current. Operating power for each EV2300 is supplied by the hub. 4.3 Station Hardware Connections The bqMTester requires that the latest version of the EV2300 interface from Texas Instruments be installed and running properly. These instructions explain connecting an HPA495 bqMTester board. Both SMB and I2C connections are required between the EV2300 and HPA495 for all devices that use SMB protocol (shown in Figure 2). All four pins—VOUT, SDA, SCL, and GND—on the I2C connector of the EV2300 should be connected to the calibration board I2C connector. CAUTION It is very important that the two ground connections connected to 1N of the module under test be connected as close to the BAT– Kelvin connection as possible. This connection is critical to ensure accurate voltage calibration. Connect an isolated 5 V/2.5 A wall DC power supply to the bottom power connector, and an isolated 24 V/0.5 A wall DC power supply to the top power connector. CAUTION It is very important that these power supplies be ground isolated. There should be no ground plug on the wall connection. An example of good supplies are: 24-V supply: CUI Inc model no. EUA-101W-24 5-V supply: CUI Inc model no. EPA-201DA-05 The jumpers on the HPA495 bqMTester board are only for setting up the desired current for the current source. There are three options available: 12 Advanced bqMTester Current (Approximate) Jumpers 0.5 Amps J4, J5, J6, J7 1.0 Amps J4, J6 2.0 Amps None SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com EV2300 USB Texas Instruments SMB I2C ` HDQ While the HPA495 Calibration Board includes an on-board temperature sensor, it is recommended that you use external temperature sensors for the most accurate temperature calibration. For an external temperature sensor, use the TI TMP100 (not supplied) and connect as shown in Figure 3. The software distinguishes between the on-board temperature sensor and any external temperature sensor. PVSS SYS SLP P+ Temp Circuit 1N 1P 2P 3P 4P 5V SDA SCL GND 24VDC/0.5A P+ 4P 3P 2P 1P 1N Reference V 4+ Reference V 4 Reference V 3+ Reference V 3 Reference V 2+ Reference V 2 Reference V 1+ Reference V 1 - 5VDC/4A Current Output Control J6 J7 J4 J5 DMM1 DMM2 DMM3 DMM4 Texas Instruments HPA495 BPDMM5 for Current Ref. It is important to note the Kelvin connection here at 1N on the module Figure 2. One Testing Station: EV2300/HPA495 Cal Board/Smart Battery Module Connections 1 6 5 3 4 +5V GND SDA SCL TMP100 2 Figure 3. External Temperature Sensor Connection SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 13 Advanced bqMTester Instructions 4.4 www.ti.com Station Setup (StationSetup.exe) NOTE: For the first run through the installation procedures, use only one station. You can install up to 12 stations, but ensure the first station is running properly and then repeat the procedures for each subsequent station. When setting up for the first time or adding testing stations to the PC, run the StationSetup.exe program to identify and setup the configurations for all the test stations connected to the PC. Follow these steps to prepare all stations: Figure 4. Station Setup Program NOTE: Do not use two generations of boards at the same time: Use either a new board, HPA495, or an old board, HPA169, in a setup. Do not use the two together. 1. Once you have connected the first station as described in the previous section, run the StationSetup.exe program. 2. To unlock the StationSetup.exe program, click Unlock Configuration. You will be prompted to input a password. The default password is bq20z80. Click OK next to the password input field after typing the password. When relocking the software, you will be prompted to change the password. 3. Click Search for Connected Boards so the software can detect all the stations you have connected to the PC. The software will detect and display all stations connected to the PC. If a textbox appears with a message saying Detected EV2300 with an old firmware version, update the EV2300 to a version 3.1L or later. If required, contact TI for assistance. 4. Note the asterisk (*) next to the board fields. An asterisk indicates that the board is an HPA495/Advanced board as opposed to the older generation HPA169 board. 5. Type a unique text name in the Station ID field to help identify each station. Use a simple name. 14 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com 6. Select which stations will have their internal or external temperature probes available for use for calibration by clicking the On Board Temp Probe or Ext Temp Probe checkbox. If neither internal nor external temperatures are selected, then that station will be required to either use a temperature probe from another station or manual input of the temperature. NOTE: These selections are not to be confused with the temperature sensors that are part of the fuel gauge module being tested. These are part of the HPA495 test/calibration equipment. 7. Select the Use for Test checkbox to enable a station for use during testing. If the Use for Test is deselected, then that station will be disabled and will not perform testing. A disabled station’s temperature probe will be available to other stations; however, if it is selected from Step 5 in this section. 8. Clicking Flash LED for each station causes the corresponding calibration board to flash its LEDs and enable the current and voltage power supplies. This is useful for testing the power supplies and for identifying the corresponding hardware for each station. 9. Click Save and Proceed. Figure 5. Multi-Station Setup 4.5 Temperature Probe Selection Clicking Save and Proceed brings up the Temperature Probe Selection window. This window is used to configure the temperature probes. For each station, you can select either of the following options: 1. "No Tracking – Use entered value." 2. Any on-board or external temperature probe that is selected at station setup stage (the Use for Test checkbox must be checked for that station, see Figure 4) will be available in the drop-down box menu list. For example: If only one temperature probe is required for all channels, and it is to be an external temperature sensor and not the one installed on the calibration board for a station named Station1, you would do the following: SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 15 Advanced bqMTester Instructions www.ti.com 1. Start the StationSetup.exe program. 2. Unlock and click Search for boards. 3. Name all of the stations using a unique Station ID but name one station Station1 so that it can be referenced in the next couple of steps. 4. Select the Ext. Temp Probe checkbox for Station1. All other stations select On Board Temp Probe. 5. Select the Use for Test checkbox for Station1 and all other stations. 6. Click Save and Proceed. 7. On the Temperature Probe Selection screen, select External Probe: Station1 for all the stations available in the list. 8. Click Next. 9. Configure the global screen as described in Section 4.6. Now all stations will use the probe connected to the External Temperature Probe Terminal Block for the station named Station1. 4.6 Global Configuration Window Clicking the Next button from the Temperature Probe Selection window brings up the Global Configuration window, as shown in Figure 6. Here, all data that is Global to all stations connected to the PC can be configured. All numeric values are specified in signed decimal except for the serial number field, which is unsigned with a max value of 65535. NOTE: If you do not select items such as CC Offset Calibration, Temperature Calibration, Voltage Calibration, or Pack Current Calibration, the respective frames in this window are grayed out for ease of use. 16 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com Figure 6. Global Configuration Screen 4.6.1 Board Offset Calibration Board Offset Calibration is activated depending on which device is selected. Some devices do not support Board Offset Calibration for each module tested. If activated, this option is used to check for board offset values within user configurable limits. The software automatically computes the board offset in microvolts for the cases where it is activated and enabled. You can change these values, if needed. 4.6.2 CC Offset Calibration CC Offset Calibration is the coulomb counter offset. There are no user-definable values in this box. This calibration can be selected by checking the box or deselected by unchecking the box. The default is that the box is checked. NOTE: If this test is disabled, the values from the Golden Image File will be used and not the values currently in the part. 4.6.3 Voltage Calibration Voltage Calibration can be selected by placing a check in its selection box, or deselected by removing the check. The default is checked. The voltage calibration area also has a box to enter the number of series cells being simulated. The default number of cells is four. If this checkbox is not selected, the corresponding voltage frame is grayed out. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 17 Advanced bqMTester Instructions www.ti.com NOTE: If this test is disabled, the values from the Golden Image File will be used and not the values currently in the part. 4.6.4 Temperature Calibration Temperature Calibration can be selected by placing a check in its selection box, or deselected by removing the check. The default is checked. The temperature calibration area also offers three different temperature probe selections or five different temperature probe selections for some devices. The proper selections should be made depending on the application. NOTE: If this test is disabled, the values from the Golden Image File will be used and not the values currently in the part. 4.6.5 Pack Current Calibration Pack Current Calibration can be selected by placing a check in its selection box or deselected by removing the check. The default is for it to be checked. On (External Load) should always be selected (this configuration is the default). Off (Bypassed) should never be selected and is only included for possible future use. NOTE: If this test is disabled, the values from the Golden Image File will be used and not the values currently in the part. 4.6.6 Board Offset Frame This frame will be grayed out if not selected in the Type of calibration to perform frame. Due to simplified single ground circuit design, a separate board offset is required for each device. The board offset calibrates all the errors that the CC Offset does not calibrate out. This includes the board layout, sense resistor, and other offsets that are external to the board. The max offset value is auto-populated by the software and can be changed. The board offset frame value is in µV and defaults to 100 µV for most parts. In the unlikely event that there is a great number of calibration failures due to board offset calibration, you can loosen the constraints for board offset calibration. Contact TI for questions on how to do this, if required. 4.6.7 Current Frame This frame is grayed out if it is not selected in the Type of calibration to perform frame. This frame contains two values: 1. Sense Resistor: Enter the value of the sense resistor used in the gas-gauge–based smart battery pack in the Sense Resistor field. This value is entered in units of mΩ. The sense resistor value can be found from the EVM schematic. 2. % Error: Enter the desired acceptable percent error that the sense resistor can differ from the value listed in the Sense Resistor field in the % Error field. This % Error field is used as a rough test to make sure the sense resistor is mounted correctly and not shorted. After the bqMTester calibrates the Sense Resister gain value, then it compares the new calibration value to what is in the Sense Resistor field. If the percent difference between the two values is more than 25% then it fails the calibration because it assumes something must be grossly wrong to get a value more than 25% from the nominal Sense Resistor Value. This value must be specified as a positive integer value. NOTE: The default value for this field is 25%. The value of 25% may seem like a large number, but this value is not related to the calibration accuracy to which the bqMTester calibrates. That calibration is highly accurate. 18 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com 4.6.8 Voltage Frame This frame will be grayed out if not selected in the Type of calibration to perform frame. This frame contains two values: 1. Reference/FSV: The tester calibrates the voltage gain by manipulating the Full Scale Voltage Reference. Do not change the values in this field. The Voltage frame looks the same for most of the parts, except for the bq306x. For bq306x device-based parts, extra K-factor fields appear. The frame for K-factor–based parts are shown in Figure 7. Figure 7. Reference/FSV and K-Factor Fields 2. % Error: The %Error field is used as a rough test to check the Voltage Measurement Circuitry. After the bqMTester calibrates the voltage gain, then it compares the new calibration value to what is in the Reference/FSV field. 4.6.8.1 Limit to Force the Voltage Calibration If the percent difference between the two values is more than 25%, then it fails the calibration because it assumes something must be grossly wrong to get a value more than 25% from the nominal. As shown in Figure 7, bq306x device-based parts show limits to voltage calibration in ±mV. In this case, if the voltage read by the device is within this limit, no calibration is done. Precious time is saved (~4s) during calibration if voltage calibration can be avoided. In the case where voltage calibration is always needed, a 0 can be entered in this field. 4.6.9 Temperature Frame The Temperature frame will be grayed out if not selected in the Type of calibration to perform frame. This frame contains one value. Enter the maximum absolute value of offset that the bqMTester software will be allowed to put into any of the data flash temperature offset registers for the tested module. This is not an accuracy verification. This is a gross Error detection. The default value of this field is 40, meaning that the calibrated offset put in the data flash cannot exceed positive or negative 4°C. For internal Temperature Sensor calibration, it is recommended to increase this value because the internal temperature sensor offset accuracy commonly exceeds 4°C. 4.6.10 Starting Serial Number Enter the value for the serial number of the first smart battery module to be tested. This number will be incremented by one as each new module is tested. If Skip On Error is checked, the number will not increment in the case of a module that fails the test. The default for this box is 1. This value must be specified as a positive integer value. 4.6.11 Date Enter the value for the desired date to be programmed into the smart battery module. If Use Current Date is checked, the system date from the PC running the bqMTester software will be used. 4.6.12 Log File Name Enter the complete path and file name to be used for the log file. This file contains all relevant test data for each smart battery module tested. If Clear Log button is clicked, the log file contents will be deleted. 4.6.13 Pack Lot Code or Manufacturer Info Enter the value for the Lot Code of the group of smart battery modules currently being tested. This number will not change until it is changed manually and will be programmed into each smart battery module tested. This value must be specified as a positive integer value. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 19 Advanced bqMTester Instructions 4.6.14 www.ti.com Save Clicking Save Configuration and Proceed will cause the current configuration settings to be saved. 4.6.15 Data Flash Image File Input the location of the Golden Image File that will be stored in all parts to be tested when running the bqMTester.exe program. Clicking the browse ( ) button gives the option to browse for the Golden Image File. If the Update Data Flash Image checkbox is not checked, then no data flash image will be installed in any parts. It is always recommended that an Image file be used. 4.6.16 Device and Version Use the select ( ) button to select the proper device and firmware version of the modules to test from the dialog box that appears. If the device or version are not available, check the Texas Instruments web site for an updated version of the bqMTester software on the bqMTester page on www.ti.com. 4.6.16.1 Adding New Parts For special/custom parts, it is possible that the device can be added to the file that holds all allowed parts compatible with bqMTester. Using this option is sometimes tricky. It is recommended that TI be contacted before using this option to ensure that the bqMTester has been tested with the requested device. The file to be edited is called Targets and is located in the directory where bqMTester is installed. If this file is modified, it is advised to thoroughly test it before it is deployed to manufacturing. Figure 8. Example Targets File NOTE: When using this option, carefully verify that some modules are tested and calibrated with bqMTester software for accuracy and DF compatibility. This software is not designed for production. It is the responsibility of the user to make sure that bqMTester is compatible with the custom device. 4.7 Multi-Station (bqMultiStationTester.exe) To start testing modules, run the MultiStationTester.exe file. This brings up the main Multi-Station Tester window. This window keeps track of all tests at each station, then logs and displays the information from the stations that were initialized and setup in Section 3 of this document. When the software opens, the Start button is disabled by default until the voltage, current, and temperature of all the references are verified by clicking on the Configure VTI button. The purpose of this is to secure the configuration via engineering approval prior to testing modules and as a reminder to ensure that the reference data is accurate before allowing testing. 20 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com NOTE: Note that the Configure VTI button is disabled if no VTI items have been enabled in the Station Setup. Figure 9. Multi-Station Tester Window 4.7.1 Verifying the V, T, I Configuration First, click on Configure VTI. The Update VTI window will pop up as shown in Figure 10. If “Allow V, T, I while locked” is not selected then the Unlock Configuration button must be pressed to allow voltage, temperature, and current reference adjustment. If no calibration is selected in the StationSetup.exe program, then this button will not be visible and the software is only a DFI writer. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 21 Advanced bqMTester Instructions www.ti.com Figure 10. Update VTI Window As you can see above, this is the calibration screen for a regular device. Selecting the appropriate control flashes the board in calibration. In this case, Board 0 is calibrating (and should be flashing). The new board HPA495 supports multiple devices, some of them K-factor–based, as described in previous chapters. The calibration for the K-factor–based parts (bq30xx) is done differently and the Update VTI screen looks different, as shown in Figure 11. Figure 11. Update VTI For the K-factor–based parts (bq30xx), the individual voltages must be calibrated. The new HPA495 board has individual voltage outputs based on the selected configuration. The Update VTI screen displays the corresponding controls. Individual control is possible depending on if the K-factor is selected. 22 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com Also, depending on items selected in the StationSetup Program, the Update VTI screen is populated accordingly. As seen in Figure 12, there is only one difference between the previous and following setups. The following setup does not have Voltage selected in the StationSetup Program; thus, the voltage controls are not populated during calibration. Figure 12. Update VTI: No Voltage Selected 4.7.2 Reference Adjustments Once unlocked, the references can be adjusted as required. When any field is selected in a particular station row, the LEDs for that station flash and the voltage and current power sources power up. To calibrate the references, use the following process: 1. Measure the voltage for the first station by connecting a traceable DMM to the Reference V Meter + and Reference V Meter – connections (as shown as DMM1 in Figure 2) to measure the actual voltage of the cell simulation voltage supplied by the calibration board for the first station. Input this voltage in the Voltage column for the first station. Repeat this step for each remaining station. 2. Setup the DMM for current measuring, and connect the DMM to Reference I Meter + and Reference I Meter – (as shown as DMM2 in Figure 2) for the first station being setup. Be sure to disconnect the wire that shorted these two connections so that current flows through the meter. Input the current measured in the Current column for this station. Repeat this step for each remaining station. Re-install the short from the Reference I Meter + to the Reference I Meter –. 3. Place the traceable temperature probe next to the temperature probe being used on the calibration board at the first station with a temperature probe being used for testing. Click Read the Currently Calibrated Temperatures. Compare the temperature from the traceable temperature probe to the calibration board temperature displayed. If the temperatures are different, then type in the temperature from the traceable temperature probe into the corresponding temperature field. Type over the value displayed when Update VTI is selected. Repeat this step for each station that has a temperature probe. 4. In the case of the bq30xx parts, additional voltage controls are populated depending on the number of cells selected. The same procedure of calibration used in Step 1 can be used for the individual voltage controls. 4.7.3 Allow V, T, I While Locked Selection If the software is unlocked, then the Allow V, T, I while locked checkbox is enabled. Otherwise, it is disabled and dimmed. If the checkbox is selected, you can adjust the actual values for voltage, temperature, and current references even though the configuration has been locked. If the checkbox is not selected, you cannot alter these values without unlocking the configuration. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 23 Advanced bqMTester Instructions 4.7.4 www.ti.com Locking and Unlocking the Configuration Once all information is updated as required then click Update V, T, and I and Close. This locks the software and enables the Start button. To unlock the software at any time, click Configure VTI on the main screen and then click Unlock Configuration. A password dialog window displays. Supply the required password and click OK. The default password is bq20z80. This password should be changed after the first use. To change the password, click Lock Configuration. This causes a password dialog window to appear. Enter a password and be sure to record it in a safe location for future reference. Re-enter the password to ensure it was not misspelled. Click OK. The software always locks when Update VTI and Close is clicked. When either Update VTI and Close or Lock Configuration are selected, notice that the Lock Status icon changes from an open lock to a closed lock. 4.8 Testing Modules Once setup is completed, testing can begin. There are multiple indicators on the main screen of the multistation tester program and the Start button. 4.8.1 Progress Textbox The software displays a description of the progress of the test for each station in the textbox in the upper center of the main window (see Figure 9). Only enabled stations show in this window. Next to the Progress textbox is a column of simulated LEDs adjacent to each station progress entry. After a test finishes, this simulated LED turns red or green, depending on a pass or fail. The progress steps are: 1. Verifying Device Version: Powers up the device, waits for parameters to settle, and verifies the version of firmware to be tested. 2. Writing Data Image: Writes the Golden Image File to the data flash of the device under test 3. Calibrating: Calibrates voltage, temperature, and current 4. Verifying Calibration Limits: Verifies the calibrated gain and offset values did not go out of the ranges selected in the Tester Setup program 5. Writing Manufacturer Data: Writes Pack Lot Code and Date, etc., as required 6. Writing Serial Number: Writes serial number 7. Pass or Error Code = XXXXX: If the test failed, then an error code is reported. The error code displayed with a failed device in the Progress textbox will be a more detailed code than the error code reported in the Statistics Log textbox. 4.8.2 Statistics Log Textbox The Statistics Log textbox is located under the Progress textbox. It shows the entire past statistical test data from all stations installed and selected. This data is also logged in a log file with the name entered in the Log File Name field on the Global Configuration screen of the Station Setup program. When more tests are performed than can fit in the Statistics Log textbox, a scroll bar appears on the right side of the box and only the most recent tests will be displayed. Past data can be seen by adjusting the scroll bar. Error codes reported here are of a more generic nature than the ones reported in the Progress testbox, as described above. Both error codes will be logged if a log file is open. 4.8.3 Test# Test# is the number of tests since the software was opened. 4.8.4 StationID StationID is the name given to the station when the Station Setup software was run. 24 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester Instructions www.ti.com 4.8.5 Date/Time Date and Time shows the date and time the tests were performed. 4.8.6 Serial# Serial Number is the serial number given to the device. The serial number increments depending on the progress of the tests for each station. No two stations can have the same serial number even if they start at the same time because the software assigns serial numbers in such a way to prevent this. If Skip on Error is selected in the Station Setup software, a failed device will not be assigned a new serial number to help preserve serial numbers for parts that pass. 4.8.7 Pass/Fail Error Code This is a more generic error code than the one in the Progress textbox. The error code given here tells what test failed. The two error codes can be used together to give a better understanding of what caused the error. If the test passed, then this will be 0. 4.8.8 Filter Results Pull-Down Menu This menu gives the option to filter the data shown in the Statistics Log textbox to only show data for a specific station or for all stations at one time. It will list the stations by their Station ID. 4.8.9 Next Calibration Due The Next Calibration Due Indicator indicates when the Multi-Station software requires a calibration of the Voltage, Current, and Temperature references due to timeout of an adjustable software timer in the global.ini file as shown in Figure 13. There are three adjustable values of interest in this file under the [CalRemind] Header: 1. REM_Timed_CalInterval: This is the period in minutes between forced calibrations. 2. REM_SnoozeInterval: This is the approximate time between reminders. 3. REM_SnoozeCount: This is the number of reminders that will occur prior to forced calibration. Default settings are shown in Figure 13. With these settings the interval time is 70 minutes. There will be two reminders prior to the 70-minute expiration. Each of these reminders will be 5 minutes apart so one will be at 60 minutes and the next would be at 65. Then at 70 minutes, the Start button will be disabled until VTI Calibration Verification is performed. Adjustments can be made to this file to modify these settings. Caution should be taken when modifying the global.ini file. This only changes the numbers next to the values. Any other changes could cause unpredictable results. Figure 13. Global.ini file 4.8.10 Allow Testing Button Click on Allow Testing to continue testing if a forced calibration reminder expires (as described in Next Calibration Due above). SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Advanced bqMTester 25 Advanced bqMTester Instructions 4.8.11 www.ti.com Real Time Statistics The Statistics data displayed on the lower right corner of the main window displays real time test statistics for all stations combined. 4.8.12 Number Tested This textbox displays the total number of devices that have been tested on all test stations. 4.8.13 Number Passed This textbox displays the total number of devices that have passed the test on all test stations. 4.8.14 Number Failed This textbox displays the total number of devices that have failed the test on all test stations. 4.8.15 Passed per Hour This textbox displays the number of devices that have passed the test on average per hour. 4.8.16 Rows to Show on Screen The system only remembers the statistical data from the number of tests that are selected in the Rows to show on screen pull-down menu. 4.8.17 Start Button The Start button is disabled every time the Multi-Station software is executed. VTI configuration must be verified to enable the Start button. Once this button is enabled, clicking it initiates testing at each of the installed stations that were setup and initialized with the Station Setup software. Each station performs its test independently of the others. The software tracks the test progress from each station. 26 Advanced bqMTester SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix A SLUU397B – February 2011 – Revised May 2020 Theory of Operation for HPA495 Calibration Board The HPA495 multi-station tester board consists of three sections: a communication, control, and temperature section, a voltage supply section, and a current supply section. The board is designed to be temperature-independent. The board can be controlled through an SMBus via an EV2300 interface, or through a user-designed custom interface supporting I2C. For the schematic, see Appendix B. For cell voltage references, see TBD. The communication, control, and temperature section consists of two ICs, a TMP100NA Digital Temperature Sensor with I2C interface, and a TPIC2810D 8-bit LED Driver with I2C interface. The TMP100NA is used to report the board temperature through SMBus or I2C. The TPIC2810D is used not only to control board status LEDs, but also to enable and disable the voltage and current sections by controlling two optoisolators. Power for these two devices (5 VDC) is supplied from the EV2300 or custom user interface from the computers USB port. Headers have been provided on the board for the addition of an external I2C temperature sensor, an additional I2C communication port, and external status LEDs. The voltage supply section consists of a TL317 100 mA Adjustable Positive Voltage Regulator set to supply 20 VDC, a REF5050 +5V Precision Voltage Reference, a H11A1SM optoisolator, a 2N7002 Nchannel FET, two OPA4244 quad op amps, four FMMT491A general purpose NPN transistors, and various capacitors, and resistors. Power is supplied to the voltage supply section with a 24V, 500mA wall mounted power supply. When power is supplied to the voltage supply section, the Voltage Supply LED will light, the TL317 will supply 20 V, and the REF5050 will supply a 5 V reference. The REF5050 is a high precision reference with very low temperature drift. The voltage divider formed by R11, R10, and R18 will cause 3.7 V to appear on the positive input of the OPA4244 error amps. R11 is a high precision 0.5% 10 PPM resistor. R10 and R18 are high precision 0.1% 25 PPM resistors. These values are critical to ensure 3.7 V is supplied to the positive input of the error amps. Four of the eight error amps in the two OPA4244 ICs are utilized to create four different voltages representing the four voltages in a 4s battery stack. For example, R33 and R34 are used in a non-inverting configuration with the error amp to produce a 7.4 V output. The four networks produce 3.7 V, 7.4 V, 11.1 V, and 14.8 V. The FMMT491A transistors provide current boost. The H11A1SM optoisolator and 2N7002 FET are used to enable or disable the voltage supply. An enable or disable command is sent via SMBus from the EV2300 or user-supplied I2C controller to the TPIC2810D LED driver which then enables or disables the appropriate output pin which is connected to the H11A1SM optoisolator. This causes the optoisolator to turn on or turn off the 2N7002 FET which in turn will ground or unground the positive input of the OPA4244 error amp. Grounding the input will cause the output of the error amp to go to 0 V, which will disable the voltage supply. The transition of the TPIC2810D output pin will also cause the Voltage On LED to turn on or off. The current supply section consists of a REF3133 +3.3 V Precision Voltage Reference, a H11A1SM optoisolator, a 2N7002 N-channel FET, a OPA2335 dual op amp, a IRF3709 FET, a 20-mΩ sense resistor, two 1-Ω 2-W resistors, and various capacitors and resistors. Power is supplied to the current supply section with a 5-V, 3-A wall mounted power supply. When power is supplied to the current supply section, the Current Supply LED will light. Current flows from the power supply, through the IRF3709 FET, through the 20-mΩ sense resistor, through the two parallel 1-Ω, 2-W heat dissipating resistors, through a user-supplied reference meter, through the sense resistor in the unit under test, and back to the wall mounted power supply. This current induces a voltage across the 20-mΩ sense resistor, which is then amplified by the differential amplifier (U7:B). The voltage from the differential amplifier is then fed back into the error amp (U7:A). The error amp gets its reference voltage from the REF3133 +3.3-V voltage reference. The REF 3133 is a high precision reference with very low temperature drift. The output of the error amp drives the gate of the IRF3709 FET. This feedback arrangement ensures that the current in the current loop remains exactly the configured value, regardless of the temperature. The current setting can be configured for three different settings of 0.5 A, 1 A, or 2 A, depending on the setting of jumpers J4, J5, J6, and J7. These jumpers control the input resistance to U7:B; thus, adjusting the feedback gain of the SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Theory of Operation for HPA495 Calibration Board Copyright © 2011–2020, Texas Instruments Incorporated 27 Appendix A www.ti.com amplifier. The H11A1SM optoisolator and 2N7002 FET are used to enable or disable the current supply. An enable or disable command is sent via the SMBus from the EV2300 or user-supplied I2C controller to the TPIC2810D LED driver which then enables or disables the appropriate output pin which is connected to the H11A1SM optoisolator. This causes the optoisolator to turn on or turn off the 2N7002 FET which in turn will ground or unground the gate of the IRF3709 FET. Grounding the gate will turn off the FET and disable the current supply. The transition of the TPIC2810D output pin will also cause the Current On LED to turn on or off. 28 Theory of Operation for HPA495 Calibration Board SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix B SLUU397B – February 2011 – Revised May 2020 HPA495 Schematic + SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated HPA495 Schematic 29 Appendix B 30 HPA495 Schematic www.ti.com SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix C SLUU397B – February 2011 – Revised May 2020 HPA495 Calibration Board Bill of Materials Table 1. HPA495 Calibration Board Bill of Materials Coun RefDes t Value Description Size Device Number MFR 2 C1, C6 1 µF 50V Capacitor, Ceramic, 50 V, X7R, 10% 1206 STD Any 4 C13, C16, C18, C21 4.7 µF Capacitor, Ceramic, 25 V, X7R, 10% 1206 STD Any 1 C2 100 µF Capacitor, Aluminum, 10 V, 20% 0.177 x 0.177 EEE-1AA101WR Panasonic 8 C3, C4, C5, 0.1 µF C7, C10, C12, C14, C19 Capacitor, Ceramic, 50 V, X7R, 10% 0603 STD Any 1 C8 Capacitor, Ceramic, 50 V, X7R, 10% 0603 STD Any 5 C9, C11, C15, 0.01 µF C17, C20 Capacitor, Ceramic, 25 V, X7R, 10% 0603 STD Any 3 D1, D2, D7 LTST-S320KGKT Diode, LED Green Side Lumination, 75 mW, 30 mA 0.126 x 0.087 inch LTST-S320KGKT LiteOn 1 D13 1N5340BG Diode, Zener Voltage Regulator, 5 Watts, 6 V, 0.79 A DO-41 1N5340BG On Semi 3 D3, D5, D6 LTST-S320KRKT Diode, LED Red Side Lumination, 75 mW, 30 mA 0.126 x 0.087 inch LTST-S320KRKT LiteOn 4 D4, D10, D11, AZ23C22-V-G D12 Diode, Dual, Zener, 22 V, 300 mW SOT23 AZ23C22-V-G Diodes 1 D8 LTST-S320KSKT Diode, LED Yellow Side Lumination, 120 mW, 20 mA 0.126 x 0.087 inch LTST-S320KSKT LiteOn 1 D9 LTST-S320TBKT Diode, LED Blue Side Lumination, 120 mW, 20 0.126 x 0.087 inch mA LTST-S320TBKT LiteOn 1 HS1 6298B Heatsink, TO-220, Vertical-mount, 3.9°C/W 1.67 x 1.00 6298B Thermalloy 4 J1, J8, J9, J10 22-05-3041 Header, Friction Lock Ass'y, 4-pin Right Angle, 0.400 x 0.500 22-05-3041 Molex 1 J2 24 VDC 500 mA Connector, 2.1 mm, DC Jack w/Switch, TH 0.57 x 0.35 RAPC 722X Switchcraft 1 J3 5 VDC 3000 mA Connector, 2.1 mm, DC Jack w/Switch, TH 0.57 x 0.35 RAPC 722X Switchcraft 4 J4, J5, J6, J7 Header, 2-pin, 100mil spacing 0.100 inch x 2 PEC02SAAN Sullins 2 Q1, Q2 2N7002 MOSFET, N-ch, 60 V, 115mA, 1.2-Ω SOT23 2N7002DICT Vishay-Liteon 4 Q3, Q5, Q6, Q7 FMMT491A Transistor, NPN, High-Performance, 500 mA SOT23 FMMT491A Zetex 1 Q4 IRF3709 MOSFET, N-ch, 30 V, 90 A, 9 mΩ TO-220AB IRF3709 IR 4 R1, R36, R37, 470 R38 Resistor, Chip, 1/16W, 5% 0603 STD Any 1 R11 Resistor, Chip, 1/10W, 0.5%, 10 ppm 0805 RG2012N-102-D-T5 Susumu Co Ltd 0 R13 Resistor, Chip, 1/10W, 0.5%, 10 ppm 0805 STD Any 2 R15, R20 16.5K Resistor, Chip, 1/10W, 0.1%, 25 ppm 0603 RG1608P-1652-B-T5 Susumu Co Ltd 1 R16 100 Resistor, Chip, 1/16W, 5% 0603 STD Any 1 R17 0 Resistor, Chip, 1/16W, 5% 0603 STD Any 1 R2 15K Resistor, Chip, 1/16W, 5% 0603 STD Any 2 R21, R22 100 Resistor, Chip, 1/10W, 0.1%, 25 ppm 0603 ERA-3AEB101V Panasonic-ECG 2 R23, R27 1K Resistor, Chip, 1/16W, 5% 0603 STD Any 4 R24, R32, R35, R43 3.9K Resistor, Chip, 1/16W, 5% 0603 STD Any 1 R25 0.02 Resistor, Chip, 1W, 1%, 75ppm 2512 WSL2512R0200FEA Vishay Dale 0.047 µF 1.00K SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback HPA495 Calibration Board Bill of Materials Copyright © 2011–2020, Texas Instruments Incorporated 31 Appendix C www.ti.com Table 1. HPA495 Calibration Board Bill of Materials (continued) Coun RefDes t Value Description Size Device Number MFR 1 R26 330 Resistor, Chip, 1/16W, 5% 0603 STD Any 2 R28, R29 1 Ω, 2W Resistor, Metal Strip, 2W, 1% 0.49 x 0.10 inch WSR21R000FEA Vishay Dale 1 R3 3.3K Resistor, Chip, 1/16W, 5% 0603 STD Any 2 R39, R40 4.7K Resistor, Chip, 1/16W, 5% 0603 STD Any 1 R4 1.2K Resistor, Chip, 1/16W, 5% 0603 STD Any 4 R42, R44, R45, R46 50 Resistor, Chip, 1/8W, 0.1%, 25 ppm 0603 FC0603E50R0BTBST 1 Vishay/Thin Film 1 R47 1.00M Resistor, Chip, 1/8W, 0.1%, 25 ppm 0805 ERA-6AEB105V Panasonic - ECG 2 R5, R6 390 Resistor, Chip, 1/16W, 5% 0603 STD Any 2 R7, R12 10K Resistor, Chip, 1/16W, 5% 0603 STD Any 10 R8, R10, R14, 10K R19, R30, R31, R33, R34, R41, R48 Resistor, Chip, 1/8W, 0.05%, 10 ppm 0805 RG2012N-103-W-T1 Susumu Co Ltd 2 R9, R18 Resistor, Chip, 1/8W, 0.1%, 25 ppm 0805 ERA-6YEB562V Panasonic-ECG 9 TB1, TB2, TB5–TB8, TB11– TB13 Terminal Block, 2-pin, 6A, 3.5 mm 0.27 x 0.25 inch ED555/2DS OST 1 TB10 Terminal Block, 4-pin, 6A, 3.5 mm 0.55 x 0.25 inch ED555/4DS OST 3 TB3, TB4, TB9 Terminal Block, 3-pin, 6A, 3.5 mm 0.41 x 0.25 inch ED555/3DS OST 1 U1 TL317 IC, 3-Terminal Adjustable Regulator S08 TL317CD TI 1 U2 TMP100NA IC, Digital Temperature Sensor With I2C Interface SOT23-6 TMP100NA TI 1 U3 REF5050AID IC, Precision Voltage Reference, 5 V, 8 ppm SO-8 REF5050AID TI 2 U4, U5 H11A1SM IC, Optoisolator, NPN Transistor w/base SOP-6 H11A1SM Fairchild 1 U6 REF3133 IC, Voltage Reference, 15 ppm/°C Max, 100 µA SOT23 REF3133AIDBZ TI 1 U7 OPA2335 IC, Single Supply CMOS Op Amp, Dual, 0.05 V/°C max, MSOP-8 OPA2335AIDGK TI 2 U8, U10 OPA4244EA IC, Micro Power, Single Supply Op-Amp TSSOP-14 OPA4244EA TI 1 U9 TPIC2810D IC, 8-Bit Led Drive With I²C Interface SO16 TPIC2810D TI 4 Shunt, 100-mil, Black 0.100 929950-00 3M 6 Bumpers, Clear, Polyurethane SDM 2566 SPC Technology HPA495 Any 1 32 — 5.60K PCB HPA495 Calibration Board Bill of Materials SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix D SLUU397B – February 2011 – Revised May 2020 HPA495 Board Layout SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated HPA495 Board Layout 33 Appendix D 34 HPA495 Board Layout www.ti.com SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix D www.ti.com SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated HPA495 Board Layout 35 Appendix E SLUU397B – February 2011 – Revised May 2020 Error Code Definitions Table 2. Error Code Definitions Error Code Error # Description Most Probable Cause Possible Action EV2300 lost synchronization EV2300 has outdated firmware or drivers are outdated. Contact TI to get EV2300 with latest firmware. Ensure latest drivers for EV2300 installed. 2 USB Connection Missing. No EV2300 is connected. Close program, reboot, and connect EV2300 first. BAD_PEC 3 Bad PEC on SMBus Possible Bad hardware. Replace EV2300 / target board WRONG_NUM_BYTES 5 Unexpected number of bytes sent/received Unexpected hardware behavior. May need assistance from TI T2H_UNKNOWN 6 SMBus communication terminated unexpectedly / timed out or the bus was busy. Wrong kind of target connected or target timing is off Trim oscillator make sure that the target mode accepts the SMB command being sent INCORRECT_PARAM 7 Invalid parameter type passed to function especially Variant argument. Incorrect parameter in call to function. Software Bug or overflow Contact TI TIMEOUT_ERROR 8 USB Timeout No response on USB EV2300 or driver problems or software is not supposed to wait for a response. INVALID_DATA 9 AssemblePacket could not build a valid packet Bad data / bad packet. Software found problem with data Possible version incompatibility between BqTester and Module under test. ERR_UNSOLICITED_PKT 10 Found an unsolicited nonerror packet when looking for error packets Unexpected packet received. The packet may be a response from a previous transaction that failed or that did not check the response. Make corrections to software COMPARE_DIFFERENT 11 Comparison failed and data read is different from srec Flash comparison results in mismatch. Possible Flash failure or SMBus failure. Module under test Flash failure BQ80XRW_OCX_INTERNAL_ERROR 12 Problems with pointers being NULL etc. Possible software bug or overflow. Contact TI USER_CANCELLED_OPERATION 34 User clicked on cancel button on progress bar dialog DF_CHECKSUM_MISMATCH 51 Data Flash checksum mismatch Flash comparison results in mismatch. Possible Flash failure or SMBus failure. Module under test Flash failure IF_CHECKSUM_MISMATCH 52 Instruction Flash checksum mismatch Flash comparison results in mismatch. Possible Flash failure or SMBus failure. Module under test Flash failure OPERATION_UNSUPPORTED 53 Unsupported type Software problem Check that Module under test and bqTester versions are compatible. Then contact TI ERR_TOO_MANY_QUERIES 81 Not used ERR_BAD_QUERY_ID 82 Not used BAD_CRC 83 Packet was corrupted during USB communication ERR_TOO_MANY_RESPONSES 84 Not used NO_ERROR 0 Successful (No errors) LOST_SYNC 1 NO_USB 36 Error Code Definitions Too much noise or bad connection SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix E www.ti.com Table 2. Error Code Definitions (continued) Error Code Error # Description Most Probable Cause Possible Action SMBus communication terminated unexpectedly / timed out or the bus was busy. Wrong kind of target connected or target timing is off Trim oscillator make sure that the target mode accepts the SMB command being sent 94 SMBus communication terminated unexpectedly / timed out or the bus was busy. Wrong kind of target connected or target timing is off Trim oscillator make sure that the target mode accepts the SMB command being sent T2H_ERR_BAD_SIZE 95 SMBus communication terminated unexpectedly / timed out or the bus was busy. Wrong kind of target connected or target timing is off Trim oscillator make sure that the target mode accepts the SMB command being sent ERR_BAD_PAYLOAD_LEN 97 Packet was corrupted Bad USB connection during USB communication or software sent in a bad packet ERR_TMMT_LIST_FULL 98 Not used ERR_TMMT_BAD_SELECTION 99 Not used UNKNOWN 100 Unexpected/unknown error UNEXPECTED_ERROR 110 Should not happen OUT_OF_MEMORY 111 Not enough memory on PC SREC_OPEN_FAIL 221 Srec specified does not exist or cannot be opened SREC targets a different device than the one detected on the SMBus ' Ensure version compatibility between bqMTester software and Module under Test. SREC_BAD_START_RECORD 222 Srec not in expected format SREC targets a different device than the one detected on the SMBus ' Ensure version compatibility between bqMTester softare and Module under Test. SREC_UNKNOWN_TYPE 223 Srec not in expected format SREC targets a different device than the one detected on the SMBus ' Ensure version compatibility between bqMTester softare and Module under Test. SREC_BAD_CHECKSUM 224 Srec not in expected format SREC targets a different device than the one detected on the SMBus ' Ensure version compatibility between bqMTester softare and Module under Test. SREC_BAD_RECORD_COUNT 225 Srec not in expected format SREC targets a different device than the one detected on the SMBus ' Ensure version compatibility between bqMTester softare and Module under Test. SREC_DEV_MISMATCH 226 SREC targets a different device than the one detected on the SMBus ' Ensure version compatibility between bqMTester softare and Module under Test. CONFIG_OPEN_FAIL 227 Config file not found / cannot be opened Redo StationSetup.exe configuration CONFIG_UNEXPECTED_EOF 228 Config file not found / cannot be opened Redo StationSetup.exe configuration CONFIG_BAD_FORMAT 229 Config file format incorrect Redo StationSetup.exe configuration PCFG_DEVVER_MISMATCH 231 Config file device version not compatible Ensure version compatibility between bqMTester softare and Module under Test. PCFG_DEV_MISMATCH 232 Config file device not compatible Ensure version compatibility between bqMTester softare and Module under Test. PCFG_SRECDEVVER_MISMATCH 233 Srec not compatible with current hardware device Ensure version compatibility between bqMTester softare and Module under Test. PCFG_SRECDEV_MISMATCH 234 Srec not compatible with current hardware device Ensure version compatibility between bqMTester softare and Module under Test. ERR_NO_QUERIES_TO_DELETE 85 Not used ERR_QUERY_UNAVAILABLE 86 Not used ERR_NO_RESPONSES_TO_DELETE 87 Not used ERR_RESPONSE_UNAVAILABLE 88 Not used ERR_TMMT_NO_RESPONSE 90 Not used T2H_ERR_TIMEOUT 92 BUS_BUSY Check Version Compatibility and USB cable Outdated software Contact TI Unexpected error Hardware not expected to respond to this error Install more memory SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Error Code Definitions 37 Appendix E www.ti.com Table 2. Error Code Definitions (continued) Error Code Error # Description Most Probable Cause Possible Action BCFG_DEVVER_MISMATCH 235 Srec not compatible with current hardware device Ensure version compatibility between bqMTester softare and Module under Test. BCFG_DEV_MISMATCH 236 Srec not compatible with current hardware device Ensure version compatibility between bqMTester softare and Module under Test. SMBC_LOCKED 260 Unused but reserved for backward compatibility 516 Unused but reserved for backward compatibility T2H_NACK 772 No response from target SMBD_LOW 1028 Unused but reserved for backward compatibility SMB_LOCKED 1284 Unused but reserved for backward compatibility ERR_NOTHINGTODO 5001 Calling the function with specified values resulted in nothing being done ERR_VOLTAGE_LESSTHANZERO 5002 Specified Voltage must be greater than 0 ERR_TEMPERATURE_LESSTHANZERO 5003 Specified temperature must be greater than 0 ERR_CURRENT_EQUALSZERO 5004 Specified current cannot be 0 ERR_NOT_IN_CAL_MODE 5010 Gas gauge was not in Calibration mode/ could not be put in calibration mode ERR_CALIBRATION_IN_FIRMWARE_FLASHWRITE 5020 Error writing flash in calibration mode ERR_CALIBRATION_IN_FIRMWARE_AFE 5021 Error in AFE calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_PACKV 5022 Error in Pack voltage calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_PACKG 5023 Error in Pack gain calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_VGAIN 5024 Error in Voltage gain calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_CCIGAIN 5025 Error in Current gain calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_TMPOFFEXT1 5026 Error in external temperature 1 offset calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_TMPOFFEXT2 5027 Error in external temperature 2 offset calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_TMPOFFINT 5028 Error in internal temperature offset calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_ADCOFF 5029 Error in ADC offset calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_BRDOFF 5030 Error in Board offset calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_CCIOFF 5031 Error in CC offset calibration Value too large (Overflow) in firmware ERR_CALIBRATION_IN_FIRMWARE_RDRAWCALD ATA 5032 Error in reading raw calibration data ERR_CALIBRATION_IN_FIRMWARE_RSVD1 5033 Reserved for future use ERR_CALIBRATION_IN_FIRMWARE_RSVD2 5034 Reserved for future use ERR_CALIBRATION_IN_FIRMWARE_RSVD3 5035 Reserved for future use ERR_CALIBRATION_IN_FIRMWARE_RSVD4 5036 Reserved for future use ERR_CALIBRATION_IN_FIRMWARE_RSVD5 5037 Reserved for future use 38 Error Code Definitions Target not connected/not powered Connect target and check is correct power is applied SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix E www.ti.com Table 2. Error Code Definitions (continued) Error Code Error # Description Most Probable Cause Possible Action ERR_CALIBRATION_IN_FIRMWARE_RSVD6 5038 Reserved for future use ERR_CALIBRATION_IN_FIRMWARE_UNDEFINED 5039 Unknown error code returned by hardware ERR_DF_RD_REQ_B4_WR 5041 Data flash cannot be written before reading the remaining values in a given class ERR_INVALID_DATA_ENTERED 5042 Invalid data entered on screen ERR_USB_ACQUIRE 5043 EV2300 is locked by another thread NVALID_FILENAME 65537 DEVICE_VERSION_MISMATCH 65538 Incompatible device/version RETURN_TO_ROM_FAILED 65539 Gas gauge could not be put in Rom mode Hardware incompatibility Check Connections. Verify version compatibility between bqMTester software and Module under Test. RUNGG_FAILED 65541 Gas gauge could not exit ROM mode Hardware incompatibility Check Connections. Verify version compatibility between bqMTester software and Module under Test. WRITEFLASH_GG_FAILED 65542 Writing to flash failed Data Flash Failure Module Repair CALIBRATE_FAILED 65543 Calibration failed Module hardware failure or Configuration failure Module Repair or Check Testing Configuration Settings POST_CAL_CHECKS_FAILED 65544 Post calibration checks failed Module hardware failure or Configuration failure Module Repair or Check Testing Configuration Settings WRITESERIAL_FAILED 65545 Write serial number failed Data Flash Failure Module Repair/Retry Test WRITECAL2DF_FAILED 65547 Fail to write the calibration result to data flash Data Flash Failure Possible Module Repair/Retry Test ERR_UNEXPECTED 65552 Unexpected value/response Software does not know how to handle this ERR_FILE 65553 Error opening/processing File Wrong File location settings. ERR_NOT_IN_ROM 65554 GG not in ROM mode when expected communication failure? Gas gauge could not be put in Check Connections. Verify ROM version compatibility between bqMTester softare and Module under Test. ERR_ENTER_CALMODE 65555 Cannot put GG in Cal mode Gas gauge could not be put in Check Connections. Verify Calibration mode version compatibility between bqMTester softare and Module under Test. ERR_CUSTOM_FUNC 65556 User defined function returned error BAD_FILE_FORMAT 65557 Header bad or format bad Bad image file format ERR_WRITE_MFG_DATA 65558 Failed to write manufacturer data Data Flash Failure Module Repair/Retry Test ERR_READ_DEV_VER 65559 Communication error reading device version Hardware incompatibility Check Connections. Verify version compatibility between bqMTester softare and Module under Test. CAL_VOLT_LESSTHANZERO 65600 Calibration voltage must be greater than 0 On screen values incorrect Verify VTI and Configuration Settings CAL_TEMP_LESSTHANZERO 65601 Calibration current must be On screen values incorrect greater than 0 Verify VTI and Configuration Settings CAL_CURR_LESSTHANZERO 65602 Calibration current must be On screen values incorrect greater than 0 Verify VTI and Configuration Settings Software is obsolete Attempting to do multiple transactions possibly from different windows in background at the same time. Could also be a software problem. Stop scanning in SBS. Check File Name for Rom File and Log File Check Connections. Verify version compatibility between bqMTester software and Module under Test. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Check all File location settings in bqMTester Software Error Code Definitions 39 Appendix E www.ti.com Table 2. Error Code Definitions (continued) Error Code Error # Description WRITEFLASH_ROM_FAILED 65560 Failed to write flash while in ROM mode Most Probable Cause Possible Action SENSE_RES_CAL_HIGH 65570 Sense resistor value too high in post cal checks Sensor Resistor Hardware Failure, Connection Problem, Setting Problem, or HPA169 Power Supply Problem Verify Sense Resistor Value, check current supply connections, and verify VTI and Configuration Settings. Try increasing tolerances if possible SENSE_RES_CAL_LOW 65571 Sense resistor value too low in post cal checks Sensor Resistor Hardware Failure, Connection Problem, Setting Problem, or HPA169 Power Supply Problem Verify Sense Resistor Value, check current supply connections, and verify VTI and Configuration Settings. Try increasing tolerances if possible VOLT_CAL_HIGH 65580 Voltage value too high in post cal checks Module hardware failure, HPA169 Voltage power supply problem or Configuration failure Verify Voltage circuit, voltage power supply, VTI, and Configuration Settings. Try increasing tolerances if possible VOLT_CAL_LOW 65581 Voltage value too low in post cal checks Module hardware failure, HPA169 Voltage power supply problem or Configuration failure Verify Voltage circuit, voltage power supply, VTI, and Configuration Settings. Try increasing tolerances if possible TEMP_CAL_HIGH 65590 Temperature value too high in post cal checks Module hardware failure, HPA169 Temperature sensor Failure Verify VTI settings, and Temperature sensor location TEMP_CAL_LOW 65591 Temperature value too low in post cal checks Module hardware failure, HPA169 Temperature sensor Failure Verify VTI settings, and Temperature sensor location SEAL_CMD_FAILED 65610 Seal command failed Communication Failure Check Connections. Verify version compatibility between bqMTester softare and Module under Test. ERR_READ_CB_INT_TEMP_SENSOR 65611 Error reading internal temperature sensor on HPA169 calibration board Temperature sensor failure Verify HPA169 calibration board temperature sensor connections or replace sensor ERR_READ_CB_EXT_TEMP_SENSOR 65612 Error reading external temperature sensor on HPA169 calibration board Temperature sensor failure Verify HPA169 calibration board temperature sensor connections or replace sensor ERR_CALIBRATION_OUTOFSPEC 65613 Time to recalibrate HPA169 calibration board VTI calibration Timer expired. Calibrate VTI settings ERR_TEST_ROUTINE 65614 Reserved ERR_WRITEDATE_FAILED 65546 Failed to write date Data Flash Failure Module Repair/Retry Test ERR_WORKAROUND_ROUTINE 65614 GG mode work around failure Board offset has too much variance. Calibrate board offset ERR_BOARD_OFFSET_LIMIT 65615 Board offset outside of limits Board offset has too much variance. Calibrate board offset ERR_BOARD_OFFSET_TIMEOUT 65616 40 Error Code Definitions SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Appendix F SLUU397B – February 2011 – Revised May 2020 Using TesterDFReader to Create an Image of the Data Flash 1. To run the data flash that reads the software in the bqMTester suite, double-click the TesterDFReader.exe file in the directory where the software was installed. Figure 14. TesterDFReader.exe Software 2. Select the device type from the Device pulldown menu. 3. Type in a complete path and file name with a .rom extension in the dialog box or click Browse ( ). 4. Click the Read Data Flash Image button. This causes the software to read the data flash information from the smart battery module and store it in this file. This .rom file is created to be the Golden Image File that is used to program all other smart battery modules. SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Using TesterDFReader to Create an Image of the Data Flash Copyright © 2011–2020, Texas Instruments Incorporated 41 Appendix G SLUU397B – February 2011 – Revised May 2020 Creating the Golden Image File Without bqEASY NOTE: bqEASY only supports catalog, not custom, parts. After engineering development is completed, a Golden Image File must be made from an Engineering Perfect module. Flash constants in smart battery modules that use this Golden Image File are used as a default to program the Static Data Flash constants in all the smart battery modules that use the bqMTester. It is very important that this process is completed. If it is not, then the Impedance Track algorithm may not function correctly. NOTE: The bq3060 and bq28400 devices use Compensated End-of-Discharge Voltage (CEDV) technology. The remainder of this section applies only to Impedance Track technology. To create a Golden Image File (Data Flash) for CEDV devices, refer to the bq3060 and bq28400 device documentation found on www.ti.com. This chapter assumes familiarity with Texas Instruments evaluation software for the bq20zxx modules since it was most likely used during the engineering development phase of this project. If not familiar with the TI evaluation software, refer to the bq20z80-001 EVM tool folder that includes an EVM user guide, application notes, and the latest EV software: http://focus.ti.com/docs/toolsw/folders/print/bq20z80evm-001.html All the functions described below are supported by bqEASY. It is recommended that bqEASY be used for all of the procedures unless there are some parameters that bqEASY does not support. Alternatively, if a device being characterized is a custom spin device and not a catalog device, bqEASY may not work correctly with this device. bqEASY only supports catalog parts. In such cases, use TesterDFReader.exe software, which is accompanied with bqMTester. Information regarding how to use TesterDFReader is detailed in Appendix F. G.1 Creating the Engineering Perfect Battery Pack Static Data examples: Static data examples are Charging Voltage, Impedance Track resistance tables, and QMAX settings. Examples of non-static data include serial number, date, and calibration data. It is also assumed that this Engineering Perfect battery pack was created using the correct chemistry support SENC file. Chemistry tables are programmed into a device with either bqEASY or bqCHEM (included with bqEVSW). For more information, refer to the Multi-Chemistry Support application note: Support of Multiple Li-Ion Chemistries w/Impedance Track(TM) Gas Gauge at: http://focus.ti.com/general/docs/litabsmultiplefilelist.tsp?literatureNumber=slua372r. Now the Impedance Track data must be verified. This data must be updated and accurate so that all battery packs produced have accurate Impedance Track tables in the data flash right out of the box. To ensure that the Impedance Track tables are optimized, complete the following steps: 1. For Impedance Track devices only: Using an EV2300 and the EV software appropriate for the device being used in this application (for example: bnq20z70, bq20z80, or bq20z90), ensure that the data flash locations Qmax Cell 0–Qmax Cell 3, and Qmax Pack have good estimates in them for the battery pack capacity. This information can be derived from the battery cell manufacturer data sheet. Also note that if more than one cell is connected in parallel, then the capacity increments by one cell capacity for every cell in parallel. For example, if a single-cell data-sheet capacity is 2400 mAh, and 3 parallel cells are used, set each value to 2400 × 3 = 7200 mAh. 42 Creating the Golden Image File Without bqEASY SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Creating Golden GG File from the Engineering Perfect Battery Pack www.ti.com 2. Charge the pack to full. If it does not charge, then ensure that Impedance Track is enabled by sending data 0x0021 to SMBus command 0x00 (Manufacturer Access). 3. When the pack is full, remove the charger and let the pack relax for two hours. 4. Discharge the pack to minimal device acceptable voltage (also set as Term Voltage flash constant) at a typical rate for the target application. The exact rate is not critical. 5. Let the pack relax for at least five hours. 6. Repeat Steps 2 through 5 for maximum accuracy. 7. Connect the pack to the EV software, go to the data flash screen, and ensure that Update Status is 0x06. 8. The battery pack is now Engineering Perfect. G.2 Creating Golden GG File from the Engineering Perfect Battery Pack Create a GG file with all of the data from the Engineering Perfect battery pack to create the Golden Image File. The purpose of this GG file is to get all the non-reserved data saved to install it back into the module after the battery pack is put back into the original state with a new SENC file (see Section G.3). Also, change usage data to the original values so all programmed battery packs do not report that they have been used. Use bqEASY to configure the parameters. Alternatively, use the procedures below. 1. Ensure that the Engineering Perfect battery pack is still connected to the EV2300 and that the EV software for the applicable device is open. 2. Go to the Data Flash screen in the EV software and click Read All. 3. Select the File pulldown menu, click Export, and chose a (*.gg) file name for saving the pre-learned defaults (example: optimized.gg). 4. In a text editor such as Notepad, open the saved GG file. Change the value of Update Status from 06 to 02, which indicates that the parameters are learned but the Impedance Track feature is disabled (as should be the case for a new pack prior to calibration). Figure 15. Cycle Count Modification in GG file using Notepad 5. Reset the Cycle Count field to "0," as shown in Figure 15. 6. Save the file. Use this file as detailed below. G.3 Installing the Original SENC File with Correct Chemistry Support It is assumed that the proper chemistry-supported SENC file has been determined for this application during the Engineering and Development Phase of this project. For most applications (LiCoO2/graphitized carbon chemistry), the default SENC file for the applicable device (ex: bq20z80, bq20z90, or bq20z70) is used. For more information on multi-chemistry support, refer to the Multi-Chemistry Support application note: Support of Multiple Li-Ion Chemistries w/Impedance Track(TM) Gas Gauge . The following instructions explain how to install the original chemistry-supported SENC file into the Engineering Perfect battery pack. Do not worry about losing all the static data from this pack, because it was stored, as detailed in the previous chapter. 1. Go to the product folder for the device in use in this application. Some Examples: a. For the bq20z70: go to bq20z70 Tools and Software Section b. For the bq20z80, go to bq20z80 Tools and Software Section SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Creating the Golden Image File Without bqEASY Copyright © 2011–2020, Texas Instruments Incorporated 43 Installing the Original SENC File with Correct Chemistry Support www.ti.com c. For the bq20z90, go to bq20z90 Tools and Software Section 2. Click on the Multi-Chemistry Support Software zip file pertaining to the device being used: Some Examples: a. For the bq20z70: go to bq20z70-V101 Multiple Li-Ion Chemistries Software b. For the bq20z80: go to bq20z80-V102 Multiple Li-Ion Chemistries Software c. For the bq20z90: go to bq20z90-V102 Multiple Li-Ion Chemistries Software 3. Download the applicable zip file and extract to a temporary directory. An example would be C:\Temp\sluc058.zip. 4. Ensure that the Engineering Perfect battery pack is still connected to the EV2300, and that the EV software for the applicable device is open. 5. Go to the Pro screen in the EV software. Used Command 0 x 08 to put bq 20 zXX back into Gas Gauge Mode from ROM mode Write 0 x 0 F 00 to SMBus command 0 x 00 to put bq 20 zXX into ROM mode for SENC file creation Load the SENC file Figure 16. EV Software Pro Screen 6. Ensure that Write SMB Word frame has the SMBus Command set to 0x00, and the SMBus Word set to 0x0F00.If they are not, then change them. 7. Click Write. This puts the bq20zxx module into ROM mode to prepare for writing the SENC file created (as detailed in the section above). 8. Write the SENC file to the Engineering Perfect pack by clicking the browse ( ) button in the Srec programming frame. 9. In the file manager that pops up, locate and select the previously saved SENC file created (detailed in the above section). 10. Click Program. The software indicates when it is finished. 11. After it finishes writing, ensure that the SMB Command is 0x08 in the Send SMB Command frame. If it is not, change it to 0x08. 12. Click Send. This puts the bq20zxx back into Gas Gauge mode. Your factory default SENC file is now loaded. 44 Creating the Golden Image File Without bqEASY SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Creating the Golden Image File: www.ti.com G.4 Creating the Golden Image File: The final step in this process is creating the Golden Image File. This file will include all the static data in the data flash that is constant from one smart battery module to the next. It also has all the reserved data and usage data set to default states to ensure that all programmed packs start out in a new state. This process is mandatory for new designs and is required for using Multi-Station Testing (MultiStationTester.exe). Without this process the Impedance Track Algorithm may not function properly. Follow these steps to create this file: 1. Ensure that the Engineering Perfect battery pack is still connected to the EV2300 and that the EV software for the applicable device is open. Go to the Data Flash screen and open the File pulldown menu. Select Import. 2. In the file manager that pops up, locate and select the Golden GG file created (as detailed in the above section). Click Write All. 3. The Engineering Perfect battery pack now has all Golden data in it. The next step is to retrieve that data into a Golden Image File. 4. Go to Appendix F to read the DFI file from a golden pack. Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from A Revision (May 2011) to B Revision ...................................................................................................... Page • Updated the user's guide to align with TI EVM terms of sale and removed obsolete items. .................................... 3 SLUU397B – February 2011 – Revised May 2020 Submit Documentation Feedback Copyright © 2011–2020, Texas Instruments Incorporated Revision History 45 IMPORTANT NOTICE AND DISCLAIMER TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS” AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD PARTY INTELLECTUAL PROPERTY RIGHTS. These resources are intended for skilled developers designing with TI products. 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